mrnmm (發明^明驗日月·翻臟之麵領域、先纖術、內容、麵方式及圖式酵酬) 一、發明所屬之技術領域 本發明係關於一種顯示裝置之檢測系統與方法。 二、先前技術 隨著科技的進步，顯示器製造科技愈趨精密，往越 來越咼的解析度邁進。然而也因此在顯示器製造過程中 可能發生的瑕疵情形越來越難偵測。一般顯示器瑕疵檢 測多以人眼做為判讀工具，然而每一個品管人員*的視覺 判靖差異往往會產生爭議，且無法做為品管上絕對量化 的管理。 、以自動光學檢測（AOI )方式取代人眼作瑕疵檢測應 為可行之辦法。其步驟約略為以多線或陣列結構的光電 感測元件配上成像鏡頭，將顯示器點亮時之影像擷取下 來’再經由影像處理即可分析待測顯示器的瑕疵。 目前一般顯示器廠商要求需檢視到次像素 jsub__pixel)的瑕疵，亦即每一像素點上之紅色、綠色、 藍色三個次像素瑕疵均需檢測。而對AOI方式而言，當空 間解析度要提高時，必須將放大倍率提高，然而對於較 =尺寸且像素尺寸（Pixel size )較大的顯示器，則相對 而搭配一定像素的多線式或陣列式結構的光電感測元mrnmm (invention ^ sun and moon, turn over the dirty surface area, fibrillation, content, surface mode and graphical fermentation) I. Field of the Invention The present invention relates to a detection system and method for a display device. 2. Prior Technology With the advancement of science and technology, the display manufacturing technology has become more and more sophisticated, and the resolutions are getting worse. However, it is becoming more and more difficult to detect possible defects in the display manufacturing process. Generally, the human eye is used as the inspection tool for display defect detection. However, the difference in the visual judgment of each quality control officer * often causes controversy and cannot be used as an absolute quantitative management on quality control. 2. It should be feasible to replace the human eye for defect detection with automatic optical inspection (AOI). The steps are roughly using multi-line or array-type photoelectric sensing elements with imaging lenses, capturing the image when the display is lit, and then analyzing the defects of the display under test by image processing. At present, general display manufacturers require that sub-pixel jsub__pixel) defects be inspected, that is, three sub-pixel defects of red, green, and blue at each pixel point need to be detected. For the AOI method, when the spatial resolution is to be improved, the magnification must be increased. However, for a display with a larger pixel size and a larger pixel size, a multi-line or array with a certain number of pixels is relatively used. Structure photodetector
AtL, Ί 則由於放大倍率的提高會使得感測元件的可視範 ，σ〇ν)變小，而必須改採以多個感測元件組合對應不同 =不=的部份，或是以x_y平移台以將感測元件依序移 不同時間量測不同顯示器的區@，方能檢測整個顯示 =示區域’此種方法不但耗時，同時額外之檢測機台 支出亦會增加顯示器之製造成本。 習知利用以細裝置來達成瑕疫檢測之目的。但是這 些方法都有個極大的缺點，那就是耗時及昂責；之前涵 有提議液晶顯示器檢測方法係以複數個影像感測榻取i 置同時檢測-個螢幕上的複數個區域，此種方&雖缺快 速’卻將會大幅提高設備成本；另外也有研究提到二種 搭配-圖形促動器’將顯示器之解析度降低，以搭配較 低像素之影像感測擷取裝置，然而僅能檢測像素之瑕 症’而無法檢測顯示器之亮度、色度或輻射強度不均， 並且只能檢測到像素層次的瑕疵，而無法檢測到次像素 (R/G/B)之瑕疵。 彳豕京 三、發明内容 本么月之主要目的係在提供—種顯示裝置之檢測系 統及檢測方法，俾能達·速而精確至次像素層級之檢 則，σ果p牛低檢測設備成本，節省檢測時間， 測步驟。 本毛明之另—目的係在提供-種顯示裝置之檢測系 、”充及k測方法’俾能檢測顯示裝置之亮度、色度以及輻 射強度不均等瑕疵。 為達成上述目的，本發明提供一種顯示器之檢測系 統，係搭配-顯示器使用，丨中此顯示器包括有複數個 像素(pixel) I每—像素具有複數個次像素㈣卜pixe^， 而此/則系統主要包括··—圖形㈣恤)產生裝置，此 1220689AtL, Ί As the increase of the magnification will make the visible range of the sensing element (σ〇ν) smaller, you must use a combination of multiple sensing elements to correspond to different = not = parts, or translate by x_y In order to measure the area of different displays by sequentially shifting the sensing elements at different times, the method can not only detect the entire display = display area '. This method is not only time-consuming, but additional inspection equipment expenditure will also increase the manufacturing cost of the display. It is common practice to use fine devices to achieve the purpose of detecting blemish. However, these methods have a great disadvantage, that is, time consuming and heavy duty. Previously, it was suggested that the liquid crystal display detection method uses a plurality of image sensing devices to simultaneously detect a plurality of areas on a screen. Although Fang & lacks fast, it will greatly increase the cost of the equipment. In addition, there are also studies that mention two types of matching-graphics actuators, to reduce the resolution of the display to match the lower pixel image sensing capture device. However, Can only detect pixel defects', but cannot detect uneven brightness, chrominance or radiation intensity of the display, and can only detect defects at the pixel level, but cannot detect defects at the sub-pixel (R / G / B). Jing Jing III. Summary of the Invention The main purpose of this month is to provide a detection system and detection method for display devices, which can quickly and accurately measure to the sub-pixel level, and reduce the cost of detection equipment. Save test time and test steps. The other purpose of the present invention is to provide a detection system of a display device and a "charge and k test method" capable of detecting defects such as uneven brightness, chromaticity, and radiation intensity of the display device. In order to achieve the above object, the present invention provides a The detection system of the display is used in conjunction with a display. The display includes a plurality of pixels. Each pixel has a plurality of sub-pixels, pixe ^, and this / the system mainly includes a graphic shirt. ) Generating device, this 1220689
器。該顯示器包括，但不限於，液晶顯示器L C DDevice. The display includes, but is not limited to, a liquid crystal display L C D
(Liquid crystal display)、場發射顯示器 FED (Field Emission Display)或電漿顯示器 PDP(Plasma Display Panel)等顯示器；或是以 LCOS(Liquid crystal on silicon) 、 有機 EL(OLED)、無機EL或發光二極體LED等技術或 元件製作之顯示器或是液晶投影機（LCD Projector)或是以 LCOS 或 DMD(digital micro-mirror device)等技術或元件製作之投影 ® 顯示器。本發明顯示器檢測系統中所使用之光電减 測影像擷取裝置包括一成像元件，一單線式、多線 式或陣列式光電感測元件以及一影像擷取輸出裝 置，其中該光電感測元件可為習知適用之光電感測 元件，較佳為電荷耦合元件（CCD)，互補金氧半導 體（CMOS)或光二極體陣列（ph〇t〇di〇de array);本發 明顯示器檢測系統及方法可檢測之瑕疵不限，較佳 可檢測單點像素瑕疵、多點像素瑕疵等局部瑕疵， φ 並可杬測如色度不均、凴度不均、輻射強度不均等 較大範圍瑕疵。 為此讓貝審查委員能更瞭解本發明之技術内容，特 舉二較佳具體實施例說明如下。 實施例―、像素子群組包括四個像素 ，參見圖2a至2d，此四圖為本實施例之像素點亮順 不思圖’在本實施例中顯示器㈣，而光電感測 9 1220689 5V像操取裝置為_CCD數位相機。而當圖形料為子群 ^2像㈣，每次僅點亮每個子群財其中—個像素之 顏色之-人像素’因此檢測某_顏色的:域素瑕疯需 U亮四個不同之晝面並且分次量測。在圖h中以每 相鄰之四個像素51，52,53,54做為—像素子群組，而每一 像素之中各包含紅色次像素511、綠色次像素512、藍色 次像素513°因此在每一像素子群組中僅點亮其中一像素 51之-次像素512。接著請參見圖㉛，此為接續圖2a所產 生之圖形，此時子群財像素51已關，而改為像的 · 之綠色次像素532點亮。圖2c與2(3則展示所依序點亮之像 素52,54藉由本方法可將光電感測影像操取裝置3之解析 度降到顯不器1之一半，例如若待測1^〇之解析度為 1024x768,則CCD數位相機之實際像素僅需要， 512x384,亦即實際像素僅需約二十萬像素之數位相機即 可滿足需求。 實施例二、像素子群組包括八個像素 馨 請參見圖3a至3h，此八圖為本實施例之像素點亮順 序示意圖。本實施例所使用之顯示器為 — LCD，而光電 感測影像擷取裝置為一 CCD數位相機。請先參見圖3a， 如圖所示，本實施例係以一六邊形的相鄰八個像素為一 像素子群組。每一像素子群組中之各像素點亮順序依序 如圖3a至3h所顯示。如本實施例所示之方法，則可更進 一步降低光電感測影像擷取裝置之解析度。 10(Liquid crystal display), field emission display FED (Field Emission Display) or plasma display PDP (Plasma Display Panel) and other displays; or LCOS (Liquid crystal on silicon), organic EL (OLED), inorganic EL or light-emitting two A display made with technologies or components such as polar LEDs or a LCD Projector or a projection® display made with technologies or components such as LCOS or DMD (digital micro-mirror device). The photoelectric subtraction detection image capture device used in the display detection system of the present invention includes an imaging element, a single-line, multi-line, or array-type photo-sensing element and an image-capturing output device, wherein the photo-sensing element can be In order to be familiar with applicable photo-inductive sensing elements, preferably a charge-coupled element (CCD), a complementary metal-oxide-semiconductor (CMOS), or a photodiode array; a display detection system and method of the present invention The detectable defects are not limited. It is better to detect local defects such as single-point pixel defects and multi-point pixel defects. Φ can also detect a large range of defects such as uneven chromaticity, uneven chromaticity, and uneven radiation intensity. For this reason, the panel reviewer can better understand the technical content of the present invention. The second preferred embodiment is described below. Example ― The pixel sub-group includes four pixels, see FIGS. 2a to 2d. These four images are the pixels of this embodiment lit up. ”In this embodiment, the display is ㈣, and the photodetector measures 9 1220689 5V. The image manipulation device is a _CCD digital camera. And when the graphic material is a subgroup ^ 2 image, only one of each subgroup's color will be lit-human pixels'. Therefore, to detect a certain color: the domain element defect must be bright. Daytime and divided measurements. In Figure h, each adjacent four pixels 51, 52, 53, 54 are used as a pixel sub-group, and each pixel includes a red sub-pixel 511, a green sub-pixel 512, and a blue sub-pixel 513. ° Therefore, in each pixel subgroup, only one of the pixels 51 to 512 is lit. Please refer to Figure ㉛. This is the figure generated from the continuation of Figure 2a. At this time, the sub-group pixel 51 is turned off, and the green sub-pixel 532, which looks like the image, is on. Figures 2c and 2 (3 show the pixels 52,54 sequentially lit. By this method, the resolution of the photo-sensing image manipulation device 3 can be reduced to one and a half of the display 1, for example, if it is to be tested 1 ^ 〇 With a resolution of 1024x768, the actual pixels of a CCD digital camera only need to be 512x384, which means that the actual pixel only needs a digital camera of about 200,000 pixels to meet the needs. Embodiment Two, the pixel subgroup includes eight pixels Please refer to FIGS. 3a to 3h. These eight figures are schematic diagrams of the pixel lighting sequence of this embodiment. The display used in this embodiment is an LCD, and the photo-sensing image capture device is a CCD digital camera. Please refer to the figures first 3a. As shown in the figure, this embodiment uses a hexagonal eight adjacent pixels as a pixel subgroup. The lighting order of each pixel in each pixel subgroup is as shown in Figs. 3a to 3h. Display. The method shown in this embodiment can further reduce the resolution of the photo-sensing image capture device. 10