TWD180901S - A part of probe pin for ic socket - Google Patents

A part of probe pin for ic socket

Info

Publication number
TWD180901S
TWD180901S TW104302991F TW104302991F TWD180901S TW D180901 S TWD180901 S TW D180901S TW 104302991 F TW104302991 F TW 104302991F TW 104302991 F TW104302991 F TW 104302991F TW D180901 S TWD180901 S TW D180901S
Authority
TW
Taiwan
Prior art keywords
design
case
integrated circuit
chain line
probe pins
Prior art date
Application number
TW104302991F
Other languages
Chinese (zh)
Inventor
Hirotada Teranishi
Takahiro Sakai
Original Assignee
歐姆龍股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 歐姆龍股份有限公司 filed Critical 歐姆龍股份有限公司
Publication of TWD180901S publication Critical patent/TWD180901S/en

Links

Abstract

【物品用途】;本案設計之物品係積體電路插座用探針引腳。;【設計說明】;圖式所揭露之實線部分為本案主張設計之部分。圖式所揭露之虛線部分為本案不主張設計之部分。圖式中一點鏈線係表示本案所欲主張設計之部分與不主張設計之部分的邊界,該一點鏈線本身為本案不主張設計之部分。;本案設計係新穎獨特之樣式,藉由獨特地設計積體電路插座用探針引腳,可顯現出先前技藝所未有之視覺效果。[Use of item]; The items designed in this case are probe pins for integrated circuit sockets. ;[Design Description];The solid line portion disclosed in the drawing is the proposed design part of this case. The dotted lines revealed in the diagram are the parts that are not designed in this case. The one-point chain line in the diagram represents the boundary between the part for which design is claimed and the part for which design is not claimed. The one-point chain line itself is the part for which design is not claimed for this case. ;The design of this case is a novel and unique style. By uniquely designing the probe pins for integrated circuit sockets, it can show visual effects that were unprecedented in previous techniques.

TW104302991F 2014-12-04 2015-06-03 A part of probe pin for ic socket TWD180901S (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2014-27122F JP1529604S (en) 2014-12-04 2014-12-04

Publications (1)

Publication Number Publication Date
TWD180901S true TWD180901S (en) 2017-01-21

Family

ID=53764631

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104302991F TWD180901S (en) 2014-12-04 2015-06-03 A part of probe pin for ic socket

Country Status (3)

Country Link
US (1) USD764332S1 (en)
JP (1) JP1529604S (en)
TW (1) TWD180901S (en)

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD325564S (en) * 1989-10-11 1992-04-21 Lemke Irvin A Retainer for securing electrical plugs to an outlet
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
KR100701498B1 (en) 2006-02-20 2007-03-29 주식회사 새한마이크로텍 Probe pin assembly for testing semiconductor and method for manufacturing the same
WO2011036800A1 (en) * 2009-09-28 2011-03-31 株式会社日本マイクロニクス Contactor and electrical connection device
KR101058146B1 (en) * 2009-11-11 2011-08-24 하이콘 주식회사 Spring contacts and sockets with spring contacts
USD662895S1 (en) * 2010-01-27 2012-07-03 Kabushiki Kaisha Nihon Micronics Electric contact
TWM390564U (en) * 2010-03-18 2010-10-11 Hon Hai Prec Ind Co Ltd Electrical contact
JP4998838B2 (en) * 2010-04-09 2012-08-15 山一電機株式会社 Probe pin and IC socket having the same
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
JP5708430B2 (en) * 2011-10-14 2015-04-30 オムロン株式会社 Contact
JP5699899B2 (en) * 2011-10-14 2015-04-15 オムロン株式会社 Contact
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead

Also Published As

Publication number Publication date
JP1529604S (en) 2015-07-27
USD764332S1 (en) 2016-08-23

Similar Documents

Publication Publication Date Title
TWD173715S (en) Probe pin for ic socket
TWD177828S (en) Probe pin for ic socket
TWD173713S (en) Probe pin for ic socket
TWD177826S (en) Probe pin for ic socket
TWD174971S (en) Portion of a shoe upper (6)
TWD182124S (en) Electrical connector
TWD173510S (en) Portion of a dock
TWD188953S (en) Dental appliance
TWD176094S (en) Portion of usb memory
TWD174970S (en) Portion of a shoe upper (5)
TWD176090S (en) Portion of usb memory
TWD176089S (en) Portion of usb memory
TWD176088S (en) Portion of usb memory
TWD177827S (en) A part of probe pin for ic socket
TWD177829S (en) A part of probe pin for ic socket
TWD173714S (en) A part of probe pin for ic socket
TWD175553S (en) A part of probe pin for ic socket
TWD179291S (en) Part of the coordinate input device
TWD180087S (en) Probe pin for continuity test
TWD173048S (en) Probe pin for ic socket
TWD173049S (en) Probe pin for ic socket
TWD184714S (en) Controller for electronic device
TWD180901S (en) A part of probe pin for ic socket
TWD175504S (en) A part of probe pin for ic socket
TWD175505S (en) A part of probe pin for ic socket