TW586988B - Retaining ring for chemical-mechanical polishing - Google Patents

Retaining ring for chemical-mechanical polishing Download PDF

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Publication number
TW586988B
TW586988B TW90116795A TW90116795A TW586988B TW 586988 B TW586988 B TW 586988B TW 90116795 A TW90116795 A TW 90116795A TW 90116795 A TW90116795 A TW 90116795A TW 586988 B TW586988 B TW 586988B
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Taiwan
Prior art keywords
ring
wear
grinding
restraint
restraint ring
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TW90116795A
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Chinese (zh)
Inventor
David Tu
Ting-Chang Kuo
Kuo-Ming Lin
Jerry Chen
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Duratek Inc
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Priority to TW90116795A priority Critical patent/TW586988B/en
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Publication of TW586988B publication Critical patent/TW586988B/en

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Abstract

A retaining ring for chemical-mechanical polishing includes: an inner surface, an outer surface, and a wearing surface between the inner surface and the outer surface. The wearing surface is perpendicular to the inner surface and embeds a plurality of abrasive posts. During a long time CMP polishing, the abrasive posts protrude lightly from the wearing surface. So that the retaining ring is durable and is used for slurry flowing and conditioning a polishing pad.

Description

586988 五、發明說明G) 【發明領域586988 V. Description of invention G) [Field of invention

本發明係有關於一種化學機械研磨之拘束環,特別是 有關於一種嵌設有耐磨柱而適用於化學機械研磨的耐用 拘束環。 【先前技術】The present invention relates to a restraint ring for chemical mechanical polishing, and more particularly to a durable restraint ring embedded with a wear-resistant column and suitable for chemical mechanical polishing. [Prior art]

, 隨著積體電路之微細化、高密度化及複雜多層化,在 f導體製程中需要有高度的表面平坦度,其中較為可行的 平坦化處理方法即化學機械研磨〔Chefflical MechanicalWith the miniaturization, high density, and complex multilayering of integrated circuits, a high degree of surface flatness is required in the f-conductor process. One of the more feasible planarization methods is chemical mechanical polishing [Chefflical Mechanical

Polishing,CMP〕,以機械作用及化學作用去除積體電蜂 表面之凹凸處而得到適用之鏡面。 在美國專利第6, 068, 548號「適用於化學機械研磨之 穩定結合之拘束環」中揭示一種習知化學機械研磨設備, 如第1圖所示,該化學機械研磨設備係包含一研磨頭丨〇 〇 〔carrier head〕,用以夾固一晶圓1〇2,該研磨頭1〇〇之Polishing, CMP], to remove the unevenness on the surface of the integrated electric bee by mechanical action and chemical action to obtain a suitable mirror surface. A conventional chemical mechanical polishing device is disclosed in U.S. Patent No. 6,068,548, "Stable ring for chemical mechanical polishing." As shown in Fig. 1, the chemical mechanical polishing device includes a polishing head.丨 〇〇 [carrier head], used to clamp a wafer 102, the grinding head 100

本體係為一種硬質之金屬板丨14,其裝設於一可旋轉的轉 軸105,在金屬板114之下表面具有一彈性墊112,以壓迫 晶圓102背面,而在金屬板114之周邊裝設一可拆卸之拘束 環11 7,該拘束環11 7係為一種如聚來化伸苯 〔polyphenylene· suifide,pps〕之塑膠材質,以夾固晶 圓1 02 ’防止晶圓橫向滑動,此一研磨頭1〇〇夾固晶圓1〇2 於研磨墊106上方,在導入研磨漿1〇8時轉軸1〇5與承載研 磨塾1 0 6之疑轉台1 〇 4相互反向旋轉,以進行研磨,然而拘 束環11 7在研磨晶圓丨02時同時被快速磨耗,必須經常更 換,同時不具有調控研磨漿1〇8〔 slurry〕之功效,也就This system is a rigid metal plate 14 which is mounted on a rotatable rotating shaft 105. An elastic pad 112 is provided on the lower surface of the metal plate 114 to press the back of the wafer 102, and the periphery of the metal plate 114 is installed. A detachable restraint ring 11 7 is provided. The restraint ring 11 7 is a plastic material such as polyphenylene suifide (pps), and is used to clamp the wafer 102 to prevent the wafer from sliding laterally. A polishing head 100 clamps the wafer 102 above the polishing pad 106, and when the polishing slurry 108 is introduced, the rotating shaft 105 and the suspect turntable 10 carrying the polishing pad 106 rotate in opposite directions to each other to Grinding, however, the restraint ring 11 7 is rapidly worn at the same time when the wafer is polished, and it must be replaced frequently. At the same time, it does not have the effect of regulating the slurry 108.

第4頁 586988 五、發明說明(2) 是必須另外在研磨墊丨〇 6上裝設一具粗糙面之整理器 〔condi ti〇ner〕,用以去除阻塞於研磨墊1〇6細孔之殘留 屑。 在美國專利第6, 004, 1 93號「雙重目的拘束環及研磨 塾調控器」中提出一種具有雙重功效之拘束環 〔retaining ring〕,如第2圖所示,該拘束環64具有一 内表面6 4a及一外表面64b,内表面6 4a形成之開口,可安 置一晶圓載具66〔 wafer carrier〕及一晶圓40,當氣壓 70由晶圓載具66之背面導入,使得晶圓載具66可作升降移 動68,且利用真空壓力之吸引,晶圓載具66之通氣孔76可 吸附一晶圓4 0,在内表面6 4 a與外表面6 4 b之間具有一粗糙 面54 ’例如具有碳化矽〔si 1 ic〇I1 carbide〕或鑽石顆粒 〔diamond stud〕之突起物,當化學機械研磨一晶圓4〇 時,拘束% 6 4係固定晶圓4 〇於一在可旋轉平台7 4之研磨墊 42上方,同時注入適當之研磨漿34,由於拘束環64之粗糙 面54在研磨晶圓40之同時可移除阻塞於研磨墊42細孔之殘 留屑,即調控研磨漿34之狀態,使得拘束環64具有固定晶 圓及調控研磨漿之雙重功效,然而此一拘束環64並無分Z 式之設計,一旦粗糙面54磨耗殆盡,即需要將近乎整個研 磨頭更換,不具有耐用性,且拆卸更換也不方便。 【發明目的及概要】Page 4 586988 V. Description of the invention (2) It is necessary to additionally install a finishing device [condi tiοner] with a rough surface on the polishing pad 丨 〇6 to remove the blockage of the pores in the polishing pad 106. Residues. In US Patent No. 6,004, 193, a "dual purpose restraint ring and a grindstone regulator", a retaining ring having a dual function is proposed. As shown in Fig. 2, the restraint ring 64 has an inner ring. The surface 6 4a and an outer surface 64b, and the opening formed by the inner surface 64a, can be placed with a wafer carrier 66 [wafer carrier] and a wafer 40. When the air pressure 70 is introduced from the back of the wafer carrier 66, the wafer carrier 66 can be moved up and down 68, and using the suction of vacuum pressure, the ventilation hole 76 of the wafer carrier 66 can adsorb a wafer 40, with a rough surface 54 'between the inner surface 6 4 a and the outer surface 6 4 b For example, protrusions with silicon carbide (si 1 ic〇I1 carbide) or diamond particles (diamond stud), when chemical mechanical polishing of a wafer 40, restraint% 64 series of fixed wafers 40 on a rotatable platform Above the polishing pad 42 of 7.4, an appropriate polishing slurry 34 is injected at the same time. Because the rough surface 54 of the restraint ring 64 can polish the wafer 40, the remaining debris blocking the pores of the polishing pad 42 can be removed, that is, the polishing slurry 34 is regulated. State, so that the restraint ring 64 has a fixed wafer Double effect regulation of the polishing slurry, but this is not a binding ring 64 of the sub-formula Z design, once rough surface 54 wear away, the need to replace nearly the entire grinding RESEARCH, having no durability, and is not easy removal replacement. [Objective and Summary of the Invention]

本發明之主要目的在於提供一種化學機械研磨之拘束 環,利用複數個耐磨柱嵌設於拘束環之磨耗面,在長時間 研磨過程中耐磨柱係略凸出於磨耗面,仍能保持高低面Y ΐϋΜΐιη 第5頁 586988 五 '發明說明(3) 使得該可移除式組裝之拘束環具有高度耐用度,不需經常 更換,同時具有調整研磨墊狀況之功效。 本發明之化學機械研磨之拘束環係包含有·· 一内表面,用以束缚一晶圓; 一外表面; 一磨耗面,在内表面與外表面之間並與内表面呈垂 直,其具有複數個孔洞;及 複數個耐磨柱,嵌設於上述磨耗面之孔洞。 【發明詳細說明】 請參閱所附圖式,本發明將列舉以下之實施例說明: 在本發明之第一具體實施例中列舉一種化學機械研磨 之拘束環200,第3圖為該拘束環2〇〇之立體分解圖,第4圖 為該拘束環200之頂視圖,第5圖為該拘束環2〇〇沿第4圖 5:5線之截面圖,第6圖為該拘束環2〇〇在使用狀態之局部 截面圖。 拘束環2 0 0係為一種可移除與組設於化學機械研磨設 備之研磨頭,係為一種半導體製程消耗品,其具有一内表 面201 一外表面202以及一在内表面2〇1與外表面2〇2之間 ,朝向研磨墊42之磨耗面2G3,其内表_2係用以束缚一 =40並與磨耗面203呈垂直〔如第6圖所示〕,在本實施 2〇V山拘束環200係為雙件式,如第3及5圖所示,拘束環 之材質為不銹鋼304、鈦、鋁合金或工細柳 之材質則較為軟質,如選自聚硫化戈伸工笨'塑#7環削 π 本〔polyphenyleneThe main purpose of the present invention is to provide a restraint ring for chemical mechanical grinding. A plurality of wear-resistant columns are embedded in the wear surface of the restraint ring. The wear-resistant columns are slightly protruding from the wear surface during a long-term grinding process and can still be maintained. High and low side Y ΐϋΜΐιη Page 5 586988 Five 'invention description (3) Makes the removable assembly restraint ring highly durable, does not need to be replaced frequently, and has the effect of adjusting the condition of the polishing pad. The restraint ring of the chemical mechanical polishing of the present invention includes an inner surface for restraining a wafer; an outer surface; an abrasion surface between the inner surface and the outer surface and perpendicular to the inner surface. A plurality of holes; and a plurality of wear-resistant columns, which are embedded in the holes of the abrasion surface. [Detailed description of the invention] Please refer to the drawings. The present invention will enumerate the following embodiments: In the first embodiment of the present invention, a chemical mechanical polishing restraint ring 200 is listed. The third figure is the restraint ring 2 The exploded perspective view of 〇〇, Figure 4 is a top view of the restraint ring 200, Figure 5 is a cross-sectional view of the restraint ring 200 along the 5: 5 line of Figure 4, and Figure 6 is the restraint ring 2〇 〇 Partial cross-sectional view in use. The restraint ring 2 0 0 is a grinding head which can be removed and assembled in a chemical mechanical polishing device, and is a semiconductor process consumable, which has an inner surface 201, an outer surface 202, and an inner surface 201 and Between the outer surface 202 and the wear surface 2G3 facing the polishing pad 42, the inner surface _2 is used to bind a = 40 and perpendicular to the wear surface 203 [as shown in FIG. 6]. The V mountain restraint ring 200 is a two-piece type. As shown in Figures 3 and 5, the material of the restraint ring is stainless steel 304, titanium, aluminum alloy or fine willow. The material is softer. 'Plastic # 7 ring cut π [polyphenylene

586988 五、發明說明(4) sulf ide,PPS〕、聚醚乙醚 _〔 p〇lyetheretherket〇ne, PEEK〕、聚氧化乙烯對苯二酸〔p〇lyethylene terephthalate,PET〕或聚丁烯對苯二醋〔p〇lybutylene terephthalate,PBT〕等塑膠,在由下環體23()形成之磨 耗面203具有複數個孔洞,並嵌設有耐磨柱21〇於上述之孔 洞,耐磨柱210之材質係選自於石英、氧化鋁、碳化鎢或 陶瓷,甚至疋具有鑽石顆粒之耐磨物質,在本實施例中, 耐磨柱21 0係呈圓柱狀並呈雙圓環交錯排列〔如第4及5圖 所示〕,較佳地,在上環體220與下環體23〇之間可包含一 具有定位孔如不銹鋼410材質之定位板24〇 ,穿套耐磨柱 2 1 0,以增進耐磨柱2 1 〇之定位效果。 由於拘束環200在軟質之下環體23〇嵌設有硬質之耐磨 = 210,如第6圖所示,為了使晶圓4〇之表面平坦化,拘束 環200係裝設於一研磨頭,以夾束該晶圓4〇,在長時間或 多次重複之化學機械研磨該晶圓4〇過程中,拘束環2〇〇亦 沿磨耗面2 0 3隨之磨耗,然而一致性之耐磨柱2丨〇卻能持續 ,持著略凸出於下環體230之磨耗面203之型態,而維持著 高低不水平面,增加拘束環2〇〇之使用時間,反觀,若只 是表面粗糙化則不具有長時間之耐用性,使得該可移除式 組裝之拘束環2 0 0具有高度耐用度,不需經常更換,同'時 由耐磨柱210在磨耗面203形成之凹凸面具有供研磨漿流佈 及調整研磨墊狀況之功效,故拘束環2〇〇具有耐用性及 用性等多重功效。586988 V. Description of the invention (4) sulf ide (PPS), polyether ether [PE] [polyoletherketone, PEEK], polyethylene terephthalate (PET) or polybutylene terephthalate Plastics such as vinegar [p〇lybutylene terephthalate, PBT], have a plurality of holes in the wear surface 203 formed by the lower ring body 23 (), and are embedded with a wear-resistant column 21. The above-mentioned hole, the material of the wear-resistant column 210 It is selected from quartz, alumina, tungsten carbide or ceramics, or even abrasion-resistant materials with diamond particles. In this embodiment, the wear-resistant columns 21 0 are cylindrical and arranged in a double-ring staggered arrangement [such as the fourth And Figure 5], preferably, between the upper ring body 220 and the lower ring body 230, a positioning plate 24o with positioning holes such as stainless steel 410 material, and a wear-resistant wear column 2 1 0 can be included to improve Positioning effect of wear-resistant column 2 10. Since the restraint ring 200 is embedded with a hard abrasion resistance = 210 under the soft ring body 230, as shown in FIG. 6, in order to flatten the surface of the wafer 40, the restraint ring 200 is installed on a polishing head. In order to bundle the wafer 40, during the long or repeated repeated chemical mechanical polishing of the wafer 40, the restraint ring 200 also wears along the wear surface 2 0 3, but the consistency of resistance The grinding column 2 can continue, holding the shape slightly protruding from the wearing surface 203 of the lower ring 230, while maintaining the level of the surface, increasing the use time of the binding ring 200. In contrast, if the surface is only rough It does not have long-term durability, which makes the removable assembled restraint ring 2000 highly durable and does not need to be replaced frequently. At the same time, the uneven surface formed by the wear-resistant column 210 on the wear surface 203 has For the function of polishing slurry flow and adjusting the condition of the polishing pad, the restraint ring 200 has multiple functions such as durability and usability.

在本發明之第二具體實施例中,則例舉一低成本之拘In the second embodiment of the present invention, a low-cost constraint is exemplified.

第7頁 586988Page 7 586988

五、發明說明(5) 束環300,第7圖為該拘束環300之頂視圖,第8圖為$拘 環30 0之單側截面圖,拘束環300係為單件式,椋失二二_ 、 丨尔碍甶聚硫 化伸苯〔polyphenylene sulfide,PPS〕、聚鱗乙 〔polyetheretherketone,PEEK〕、聚氧化乙稀對笨一酉分 〔polyethylene terephthalate,PET〕或聚丁婦對苯— 醋〔polybutylene terephthalate,PBT〕等塑膠形成之 一環體,其具有一用以束缚晶圓之内表面3〇1、表面 302及一在内表面301與外表面3〇2之間的磨耗面3〇3,其中 磨耗面303係與内表面301呈垂直,磨耗面303具有複數;^ 孔洞並嵌設有複數個研磨柱3 1 0,而研磨柱3 1 〇係呈一圓環 排列,故拘束環300除了具備上述與第一具體實施例相同衣 的耐用性與實用性之功效外,更具有低製造成本。 故本發明之保護範圍當視後附之申請專利範圍所界定 ^為準’任何熟知此項技藝者,在不脫離本發明之精神和 範圍内所作之任何變化與修改,均屬於本發明之保護範 586988 圖式簡單說明 【圖式說 第1圖: 第2 圖: 第3圖: 第4 圖: 第5 圖: 第6 圖: 弟ί 圃· 第8 圖: 【圖號說 34 研磨 54 粗縫 64 拘束 66 晶圓 74 平台 100研磨 明 在 磨 設 在 研 依 解 依 圖 沿 依 態 依 及 依 面 明 漿 面 環 載 頭 美國專利第6, 068, 548號1 之穩定結合之拘束環」中 備之截面圖; 美國專利第6, 004, 1 93號1 磨墊調控器」中,其拘束 本發明之第一具體實施例 圖; _適用於化學機械研 ’習知化學機械研磨 雙重目的拘束環及 環之戴面圖; ’一拘束環之立體分 本發明之第一具體實施例,—拘束環之頂視 第4圖5-5線之截面圖; 本發明之第一具體實施例 之局部截面圖; 本發明之第二具體實施例 本發明之第二具體實施例 圖。 拘束環在研磨 狀 ’拘束環之頂視圖; 拘束環之單 側截 40 曰曰 圓 具 64a内表 68 上下 76 通氣孔 1 〇 2晶圓 面 移動 42 研磨墊 64b外表面 氣壓 1 0 4旋轉台 586988 圖式簡單說明 105 轉軸 106 研磨塾 108 研磨漿 112 彈性墊 114 金屬板 117 拘束壞 200 拘束環 201 内表面 202 外表面 203 磨耗面 210 财磨柱 220 上環體 230 下環體 240 定位板 300 拘束環 301 内表面 302 外表面 303 磨耗面 310 耐磨柱V. Description of the invention (5) Bundle ring 300, Figure 7 is a top view of the restraint ring 300, and Figure 8 is a single cross-sectional view of the $ 300 ring 300. The restraint ring 300 is a single piece. _, 丨, polyphenylene sulfide (PPS), polyetheretherketone (PEEK), polyethylene terephthalate (PET) or polybutylene terephthalate-vinegar [Polybutylene terephthalate, PBT] and other plastics form a ring body, which has an inner surface 301, a surface 302, and an abrasion surface 301 between the inner surface 301 and the outer surface 302. Among them, the abrasion surface 303 is perpendicular to the inner surface 301, and the abrasion surface 303 has a plurality of numbers; ^ The holes are embedded with a plurality of grinding columns 3 1 0, and the grinding columns 3 1 0 are arranged in a ring, so the ring 300 is restrained. In addition to having the above-mentioned durability and practicality of the same clothing as the first embodiment, it also has a low manufacturing cost. Therefore, the scope of protection of the present invention shall be defined by the scope of the appended patent application ^ shall prevail. Any changes and modifications made by those skilled in the art without departing from the spirit and scope of the present invention shall be protected by the present invention. Fan 586988 Schematic description [Schematic diagram 1: Picture 2: Picture 3: Picture 4: Picture 5: Picture 6: Brother Garden · Picture 8: [Picture No. 34 Grinding 54 Coarse Seam 64 Restraint 66 Wafer 74 Platform 100 Grinding is being ground in research and solution according to the figure, along the state, and according to the surface of the slurry surface ring carrier U.S. Patent No. 6, 068, 548 No. 1 stable binding restraint ring " Sectional view of Zhongbei; U.S. Patent No. 6,004, 1 No. 93, "Grinding pad regulator", which is a diagram of the first embodiment of the present invention; _ Suitable for the dual purpose of CMP The restraint ring and the wearing view of the ring; 'a three-dimensional view of a restraint ring is a first specific embodiment of the present invention, a cross-sectional view of the top view of the restraint ring is shown in FIG. 5-5 line 4; the first specific embodiment of the present invention A partial cross-sectional view; a second embodiment of the present invention The second embodiment of FIG particular embodiment of the present invention. Top view of the restraint ring in a grinding shape; the restraint ring is cut on one side of the ring 40, the circular shape 64a, the inner surface 68, the upper and lower 76 ventilation holes 1 〇2 wafer surface movement 42 polishing pad 64b outer surface pressure 1 0 4 rotary table 586988 Brief description of the diagram 105 Rotary shaft 106 Grinding 塾 108 Grinding slurry 112 Elastic pad 114 Metal plate 117 Restrained 200 Restrained ring 201 Inner surface 202 Outer surface 203 Abrasion surface 210 Wealth column 220 Upper ring body 230 Lower ring body 240 Positioning plate 300 constraint Ring 301 inner surface 302 outer surface 303 wear surface 310 wear-resistant column

第ίο頁Page ίο

Claims (1)

586988586988 j號 90116795 、申請專利範圍 環’其中該些对磨权係呈圚 Q . . 191 ^ 排列。 8、 如申請專利範圍第1項所述之化A 環,其中該些耐磨柱係呈雙圓環交ς排=研磨之拘束 9、 如申請專利範圍第1項所述之化學'機械研磨之拘束 環,其中該些耐磨柱之材質係選自於石英、氧化鋁、碳 化鶴或陶篆。 1 0、如申請專利範圍第1項所述之化學機械研磨之拘束 環,其中該些耐磨柱内係包含有鑽石顆粒。j number 90116795, patent application range ring ′, where these pairs of grinding weights are arranged in a Q… 191 ^ arrangement. 8. The A ring as described in item 1 of the scope of patent application, wherein the wear-resistant columns are in the form of a double-circle intersection = constraint of grinding 9. The chemical 'mechanical grinding' as described in item 1 of the scope of patent application The restraint ring, wherein the material of the wear-resistant columns is selected from the group consisting of quartz, alumina, carbonized crane, and pottery. 10. The restraint ring of chemical mechanical grinding as described in item 1 of the scope of patent application, wherein the wear-resistant columns contain diamond particles. 第12頁Page 12
TW90116795A 2001-07-06 2001-07-06 Retaining ring for chemical-mechanical polishing TW586988B (en)

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