TW582090B - Structure with tapered landing and method of fabrication - Google Patents
Structure with tapered landing and method of fabrication Download PDFInfo
- Publication number
- TW582090B TW582090B TW090121454A TW90121454A TW582090B TW 582090 B TW582090 B TW 582090B TW 090121454 A TW090121454 A TW 090121454A TW 90121454 A TW90121454 A TW 90121454A TW 582090 B TW582090 B TW 582090B
- Authority
- TW
- Taiwan
- Prior art keywords
- layer
- region
- conductive
- patent application
- thick portion
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D1/00—Resistors, capacitors or inductors
- H10D1/60—Capacitors
- H10D1/68—Capacitors having no potential barriers
- H10D1/692—Electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/5222—Capacitive arrangements or effects of, or between wiring layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/5222—Capacitive arrangements or effects of, or between wiring layers
- H01L23/5223—Capacitor integral with wiring layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US65349200A | 2000-08-31 | 2000-08-31 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW582090B true TW582090B (en) | 2004-04-01 |
Family
ID=24621097
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW090121454A TW582090B (en) | 2000-08-31 | 2001-08-30 | Structure with tapered landing and method of fabrication |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP2002124576A (enrdf_load_html_response) |
| KR (1) | KR20020018606A (enrdf_load_html_response) |
| GB (1) | GB2371408B (enrdf_load_html_response) |
| TW (1) | TW582090B (enrdf_load_html_response) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4949656B2 (ja) * | 2005-08-12 | 2012-06-13 | ルネサスエレクトロニクス株式会社 | 半導体装置およびその製造方法 |
| US11869725B2 (en) | 2021-11-30 | 2024-01-09 | Texas Instruments Incorporated | Multi-stacked capacitor |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5838605A (en) * | 1996-03-20 | 1998-11-17 | Ramtron International Corporation | Iridium oxide local interconnect |
| US6114766A (en) * | 1997-12-18 | 2000-09-05 | Advanced Micro Devices, Inc. | Integrated circuit with metal features presenting a larger landing area for vias |
-
2001
- 2001-08-30 TW TW090121454A patent/TW582090B/zh not_active IP Right Cessation
- 2001-08-31 JP JP2001262668A patent/JP2002124576A/ja not_active Abandoned
- 2001-08-31 KR KR1020010053303A patent/KR20020018606A/ko not_active Withdrawn
- 2001-08-31 GB GB0121205A patent/GB2371408B/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| GB2371408B (en) | 2004-12-22 |
| GB2371408A (en) | 2002-07-24 |
| GB0121205D0 (en) | 2001-10-24 |
| KR20020018606A (ko) | 2002-03-08 |
| JP2002124576A (ja) | 2002-04-26 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6259128B1 (en) | Metal-insulator-metal capacitor for copper damascene process and method of forming the same | |
| US7179706B2 (en) | Permeable capacitor electrode | |
| TW558822B (en) | Process for making a MIM capacitor | |
| US6344964B1 (en) | Capacitor having sidewall spacer protecting the dielectric layer | |
| TWI338322B (en) | Integrated circuit devices and fabrication method thereof, and methods for forming metal-insulator-metal capacitors | |
| TW507323B (en) | Metal interconnect layer of semiconductor device and method for forming a metal interconnect layer | |
| TW508808B (en) | Stacked type capacitor structure and its manufacturing method | |
| JP2000124426A (ja) | 半導体装置のキャパシタ及びその製造方法 | |
| TW477002B (en) | A capacitor for integration with copper damascene processes and a method of manufacture therefore | |
| JP2002319551A (ja) | 半導体装置およびその製造方法 | |
| TW463304B (en) | Damascene capacitors for integrated circuits | |
| US6483142B1 (en) | Dual damascene structure having capacitors | |
| TW380316B (en) | Manufacturing method for fin-trench-structure capacitor of DRAM | |
| TW582090B (en) | Structure with tapered landing and method of fabrication | |
| US6512260B2 (en) | Metal capacitor in damascene structures | |
| TW479310B (en) | Capacitor structure and method of making same | |
| KR100438781B1 (ko) | 금속-절연체-금속 캐패시터 및 그 제조방법 | |
| US6894364B2 (en) | Capacitor in an interconnect system and method of manufacturing thereof | |
| TW380307B (en) | Manufacturing method of interconnection layer for semiconductor | |
| CN112259520B (zh) | Mim电容的形成方法 | |
| JP2003031665A (ja) | 半導体装置の製造方法 | |
| TW200824096A (en) | Method of fabricating capacitor and electrode thereof | |
| TW383479B (en) | Manufacturing method for interconnect of DRAM | |
| KR100955836B1 (ko) | 반도체 소자의 커패시터 제조 방법 | |
| TW543175B (en) | Method for integrating MIM copper capacitor device, inductance device, and copper wire |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |