TW574539B - Raster defect correction method for liquid crystal display device and raster defect correction device for the same - Google Patents

Raster defect correction method for liquid crystal display device and raster defect correction device for the same Download PDF

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Publication number
TW574539B
TW574539B TW91120460A TW91120460A TW574539B TW 574539 B TW574539 B TW 574539B TW 91120460 A TW91120460 A TW 91120460A TW 91120460 A TW91120460 A TW 91120460A TW 574539 B TW574539 B TW 574539B
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Taiwan
Prior art keywords
alignment layer
laser beam
liquid crystal
groove
light field
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TW91120460A
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Chinese (zh)
Inventor
Koji Wakabayashi
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Nippon Electric Co
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    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70383Direct write, i.e. pattern is written directly without the use of a mask by one or multiple beams
    • G03F7/704Scanned exposure beam, e.g. raster-, rotary- and vector scanning
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/06Shaping the laser beam, e.g. by masks or multi-focusing
    • B23K26/062Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2201/00Constructional arrangements not provided for in groups G02F1/00 - G02F7/00
    • G02F2201/50Protective arrangements
    • G02F2201/506Repairing, e.g. with redundant arrangement against defective part

Description

574539574539

、發明說明(1) 【發明所屬之技術領域】 本發明是有關於一種光域缺陷修 修補裝置用來修補液晶g f 法及先域缺陷之 } 日日』不展置之先域缺陷(發光點缺 【先前技術】 一種在發展中矩陣型液晶顯示裝置首創包含一第一玻 璃基板、一第二玻璃基板、一液晶介於第一玻璃基板與第 一玻璃基板之間。一對準層(alignment layer)形成於每 一玻璃基板之一表面(表面正對液晶),一偏光板位於另一 表面。第一玻璃基板為一陣列基板,個別線(s丨i e 1 ines)及掃描線以矩陣形成在第一玻璃基板之表面與液晶 相對。在每一個別線及掃描線之交叉點具有一映像點電極 及一薄膜電晶體做充電及放電。第二玻璃基板為一彩色過 濾器、一彩色層(colored layer)、一保護鑛層 (protective coat)以及一透明的導體薄膜(conductive f i 1 m)形成在第二玻璃基板之表面並與液晶相對。導體薄 膜在液晶顯示裝置中為一常見之電極,覆蓋在整個第二玻 璃基板之表面。 對準層在每一個第一玻璃基板及第二玻璃基板直接接 觸到液晶顯示裝置之液晶以將其旋轉9 〇度,對準層為一薄 透明的薄膜。對準層材質為一聚亞醯胺樹脂 (polyimide),對準層有精巧地V形溝槽(對準槽),平行 的位於整個表面。第一玻璃基板及第二玻璃基板之對準層 形成之交叉點為9 0度,也就是說,形成於一對準層之V形 溝槽與形成於另一對準層之V形溝槽成90度交叉。90度交1. Description of the invention (1) [Technical field to which the invention belongs] The present invention relates to a light-domain defect repairing device for repairing liquid crystal gf method and prior-domain defects. [Previous technology] A matrix liquid crystal display device under development includes a first glass substrate, a second glass substrate, and a liquid crystal interposed between the first glass substrate and the first glass substrate. An alignment layer layer) is formed on one surface of each glass substrate (the surface is facing the liquid crystal), and a polarizing plate is on the other surface. The first glass substrate is an array substrate, and individual lines (scanning lines) and scanning lines are formed in a matrix. The surface of the first glass substrate is opposite to the liquid crystal. At the intersection of each individual line and scanning line, there is an image point electrode and a thin film transistor for charging and discharging. The second glass substrate is a color filter and a color layer A colored layer, a protective coat, and a transparent conductive film (conductive fi 1 m) are formed on the surface of the second glass substrate and oppose the liquid crystal. The conductor The thin film is a common electrode in the liquid crystal display device, covering the entire surface of the second glass substrate. The alignment layer directly contacts the liquid crystal of the liquid crystal display device in each of the first glass substrate and the second glass substrate to rotate it 9 〇 degrees, the alignment layer is a thin transparent film. The material of the alignment layer is a polyimide. The alignment layer has a delicate V-shaped groove (alignment groove), which is parallel to the entire surface. The crossing point formed by the alignment layers of the first glass substrate and the second glass substrate is 90 degrees, that is, a V-shaped groove formed in one alignment layer and a V-shaped groove formed in another alignment layer. Cross at 90 degrees. Cross at 90 degrees

2140-5175-PFl(N).ptc 第5頁 574539 五、發明說明(2) 般的主動矩陣驅2140-5175-PFl (N) .ptc Page 5 574539 V. Description of the invention (2) Active matrix driver

又表示一對準層為45度其他為135度 動式液晶顯示裝置形成上述之角度C 當一電壓應用在液晶介於陣列基板與彩色過濾器 間,該液晶會垂直於該基板。因此,來自背光的^ ^ 士入 =位:液晶顯示器最高及最低部分的偏光板遮斷,而2: j不旦面呈現黑色。換言之,當沒有電壓應用於液晶介於 ,,列基板與彩色過遽器之間’該液晶會沿著每—對準層之 广以::偏列弁。4來自背光之白光的極光經由液晶被旋轉曰9° =乂通過偏先板。極光經過彩色過濾器而產生RGB三 色,因此液晶顯示器整體呈現白色晝面。平行及垂直同 1不:m外部訊號產生器傳到薄膜電晶 曰日顯不裔顯示多樣圖案。 ^牡狀 主動矩陣驅動式液晶顯示裝置在大量生產製 生不良品,原因在於TFT造成操作上之故障或映 广及對準層*正常地形成。映像點不再遮/光 現7仏補先域方法,如揭露在日本專利It also shows that an alignment layer is 45 degrees and the other is 135 degrees. The liquid crystal display device forms the above-mentioned angle C. When a voltage is applied between the liquid crystal between the array substrate and the color filter, the liquid crystal is perpendicular to the substrate. Therefore, the backlight from the backlight ^ ^ = position: the polarizers at the highest and lowest parts of the LCD display are blocked, while the 2: j face is black. In other words, when no voltage is applied between the liquid crystal and the column substrate and the color filter, the liquid crystal will be along the width of each of the alignment layers :: partial column. 4 The aurora from the backlight's white light is rotated through the liquid crystal by 9 ° = 乂 through the front panel. The aurora passes through a color filter to produce three RGB colors, so the entire LCD display appears white. Parallel and vertical are the same: 1: m External signal generators pass to the thin-film transistor. The display shows various patterns. ^ Active matrix-driven liquid crystal display devices produce defective products in mass production because TFTs cause operational failures or the imaging and alignment layers * are formed normally. The image points are no longer covered / lighted.

該專利之方法,薄膜電晶 根J 射光束連接。一耽 及及極電極以一雷 點之電極,因此映像點降員不-有缺陷的映像 糊。液晶顯示器中的離“ U以缺陷變得模 由於DC電壓瘅用扃-:集中在電極修復的部分之-側, 少。 μ用在映像點電極而造成液晶顯示裝置壽命減 像點電極之Ϊ : : ί補之:法不需要應用任何Dc電壓在映 曰。卩刀。根據上述方法,液晶顯示裝置對準 574539 五、發明說明(3) _ 7被雷射光束輻射照射至部分排除 :除對準層"形溝槽,因此缺陷映像點曰之在透像光 對準層或消除對準層中 揭露,日本專利號8_ 1 566G以及8_2Gi8i3。^之 补之特彳政在於產生氣泡在液晶以、^ ^ ^ 對準=露在日本專利號9_咖4及2__56283之方法排除 比映像專利號8—i 566G以及8-2Gi813,對準層運用 程。雷射光束在掃描時如。“ 2間在製造過 補。 新溝槽所以雷射缺陷無法完全修 【發明内容】 有鐘於此,本發明的主i 修補之方法及一種光域缺陷;尤光域缺陷 在液晶顯示裝置之對準層中移除方=到快迷、有效地 依據本發明之第一樣態,一 修補光域缺陷,藉由移除、夜曰先域缺陷修補方法運用在 一對準層的溝槽方位而修補光 \ ^曰層接觸之 光束形式的縱長方向與該對準』:二而該雷射光束之 式縱長方向 ㈢之,冓槽方向成正交光束形 依據本發明之第二樣態,一 在修補光域缺陷,藉由移除液晶修補方法運用 之一對準層的溝槽方位而修補中與一液晶層接觸 晶顯示敦置之—彩色濾、光器其中移除在該液 二掃描該對準層,該溝槽係利用 -二---束之光束形式的 2140-5175-PFl(N).ptc $ 7頁 曰 -ES^9H20460 五、發明說明(4) 縱長方向與該對準層 一' — 層為中介而與該彩:曰::成正交,而移除以該液 光束之縱向光束形式以;;束ΐ描該對準層,該雷; 形式縱長方向光束形式縱長=之溝槽方向成正交。光束 依據本發明之第二 〜 在修補光域缺陷,藉:移;液光域缺陷修補裝置運用 -U方位而修補光域缺陷,包括觸 一先束形式控制裝置, 伯I括· 光束之縱向光束形式與該對準声之束,該雷射 -掃描裝置,利用該雷;=槽::;正交;以及 依據本發明之第四樣=射先束知描對準層。 在修補光域缺陷,藉由移;:3先域缺陷修補裝置運用 陷,包括: 皁層的溝槽方位而修補光域缺 光束形式控制裝置,產 射光束,㈣一雷射光雷射光束以及-第 準層中溝槽方向成正交:形J的縱長方向與第 縱長方向與第二對準層中二射光束之光束形 屢槽方向成正夺· 一掃瞄裝置,利用該第一雷 ’ 以兮筐-+射氺占 > 雷射先束知瞄該第一對準 以該第一辑射先束知瞄該第二對準声。 :排:對準層中溝槽1用一雷射;束掃描對準層, 束形式之縱長方向與溝样古 ^ 曰 層溝槽之規則性。 a之方向正父,能有效破壞在 ΐ射光i±光束形準層中溝槽正交形 聊蕭 " --------- 二雷 一對 式的 層 且光 對準 2140-5175-PFl(N).ptc 第8頁 574539 修正 _案號 9ii?〇4ftn 五、發明說明(5) 成二液日日顯不裝置中一液晶層接觸,及^ ^ ^ ^ ^ ^ ^ 二對2來排除一對準層中溝槽。更包括在;:=描 方向】束之光束形式縱長方向與該對準層中之溝槽的 中溝槽。父’利用雷射光束掃描其他對準層以移除對準層 135产溝开槽/:對準層中以45度形成’但在另-對準層中以 束掃〜的:一雷射光束長度方向的尺寸係依據雷射光 仃進而控制,,因此能有效破壞對準層中的溝 ΊΘ 〇 二控制雷射光束之尺寸的同時,雷射光束能量被控 2。因此能有效破壞在對準層之規則影 其他液晶組織(Cells)。 π々…里,IV響到 2讓J發明之上述和其他目的、特徵、和優點 顯易懂,下文特舉出較佳實施例,並 細說明如下: Μ ^忭砰 【實施方式】 依據本發明之實施W,第J圖係、顯示一 之一,域缺陷之修補裝置之系統架構之示意圖。 弟圖,一Q開關脈動雷射振盪器2(Qswitchpulse 一 Q開關脈動雷射,^>益+、仓 35 51 Η声展乃進古 田射進入一擴展器3(expander)。擴展 二^ ,直入射雷射光束。雷射從擴展器3射出進入一 2 ’山=& JenUat〇r)4以調整光束之強度。雷射從衰減哭4 = 縫5(optical slit)。光學狹縫5使入 ---_飞马縱向的或k向的。雷射光束經過光學In the method of the patent, a thin film transistor is connected with a J-ray beam. One touch electrode is a lightning point electrode, so the image point is not reduced-the defective image is blurred. In the liquid crystal display, the "U" becomes a defect due to the DC voltage. It is concentrated on the-side of the electrode repair part, and is less. Μ It is used in the image point electrode and the life of the liquid crystal display device is reduced. :: ί Supplement: The method does not need to apply any Dc voltage in Ying Yue. According to the above method, the liquid crystal display device is aligned with 574539 V. Description of the invention (3) _ 7 Excluded by laser beam radiation to partially exclude: except Alignment layer " -shaped groove, so the defect image point is exposed in the light-transmitting light alignment layer or the elimination alignment layer. Japanese Patent Nos. 8_ 1 566G and 8_2Gi8i3. The supplementary feature of ^ lies in the generation of air bubbles in the The liquid crystal is aligned with ^ ^ ^ = exposed in Japanese Patent Nos. 9_Ca 4 and 2__56283. Excluding the imaging patent Nos. 8-i 566G and 8-2Gi813, the alignment layer is applied. The laser beam is as scanning. "2 have been making up. Laser grooves cannot be completely repaired due to new grooves [Content of the invention] There is a point here, the method for repairing the main i of the present invention and a light field defect; especially the light field defect is removed in the alignment layer of the liquid crystal display device = To the fans, effectively according to the first state of the present invention, a patch of light domain defects is repaired, and the light is repaired by removing and applying the first-domain defect repair method to the orientation of the grooves of an alignment layer. The lengthwise direction of the beam form in contact with the alignment ": Second, the lengthwise direction of the laser beam type is different, and the groove direction is orthogonal beam shape. According to the second aspect of the present invention, one is in the repair light field Defects, by removing the liquid crystal repair method using the orientation of the grooves of one of the alignment layers and repairing the crystal display in contact with a liquid crystal layer during the repair—color filters, optical filters are removed, and the alignment layer is scanned during the liquid two The groove uses 2140-5175-PFl (N) .ptc in the form of a two-beam beam. Page 7 -ES ^ 9H20460 5. Description of the invention (4) The longitudinal direction is aligned with the alignment layer. '— The layer is an intermediary and orthogonal to the color: said :: orthogonal, and removes the longitudinal light with the liquid beam The beam form is :; the beam traces the alignment layer, the thunder; the form lengthwise direction; the beam direction is equal to the groove direction; According to the second aspect of the present invention, the light beam is used to repair defects in the light field by: shifting; the liquid light field defect repair device uses the -U orientation to repair light field defects, including touching a pre-beam form control device, including the longitudinal direction of the beam. The beam form is aligned with the beam of the alignment sound, and the laser-scanning device uses the laser; = slot ::; orthogonal; and a fourth type according to the present invention = shoots the beam to describe the alignment layer. In repairing defects in the optical domain, by shifting: 3 The first domain defect repairing device uses traps, including: the groove orientation of the soap layer to repair the lack of light beam form control devices, generating beams, first laser beams, and -The direction of the grooves in the quasi-layer is orthogonal: the lengthwise direction of the shape J and the beam-shaped groove direction of the two beams in the second alignment layer are positive. A scanning device uses the first mine. 'Yi Xi basket-+ shooter account > laser first beam aiming at the first alignment with the first series of laser beam aiming at the second alignment sound. : Row: A laser is used for the trench 1 in the alignment layer; the beam scans the alignment layer, the longitudinal direction of the beam form and the regularity of the trench-like layer. The positive father of the direction a can effectively destroy the groove orthogonal shape in the quasi-layer of the radiated light i ± beam. "--------- Two Thunder-type layers and light alignment 2140-5175 -PFl (N) .ptc Page 8 574539 Amendment_Case No. 9ii? 〇4ftn V. Description of the Invention (5) A liquid crystal layer in a two-liquid daily display device is not in contact with the liquid crystal layer, and two pairs 2 to exclude a trench in an alignment layer. It is further included in :: = tracing direction] the longitudinal direction of the beam form of the beam and the middle groove of the groove in the alignment layer. The parent 'uses the laser beam to scan other alignment layers to remove the alignment layer 135 grooves / grooves /: formed at 45 degrees in the alignment layer' but in the other-alignment layer with a beam scan ~: a laser The size of the beam length is controlled based on the laser beam, so it can effectively destroy the grooves in the alignment layer Θ. The laser beam energy is controlled while controlling the size of the laser beam2. Therefore, it can effectively destroy the regular shadow of other liquid crystal structures (Cells) in the alignment layer. In π々…, IV sounds 2 so that the above and other objects, features, and advantages of J ’s invention are easy to understand. The preferred embodiments are listed below and explained in detail as follows: Μ ^ Implementation of the invention W, FIG. J is a schematic diagram showing the system architecture of one of the domain defect repairing devices. Brother figure, a Q-switched pulsed laser oscillator 2 (Qswitchpulse, a Q-switched pulsed laser, ^ > 益 +, Cang 35 51 Η Sound exhibition is into Gutian shot into an expander 3 (expander). Expansion two ^, Directly incident into the laser beam. The laser exits from the expander 3 and enters a 2 'mount = JenUat) 4 to adjust the intensity of the beam. The laser cries from attenuation 4 = optical slit. The optical slit 5 is made into the ---_ Pegasus longitudinal or k-direction. Laser beam passes through optics

2140-5175-PFl(N).ptc 第9頁 574539 曰 修正 i號 911204fin 五、發明說明(6) =5,由重放透鏡6(replay lens) 7(objective lens)進入一液晶柘 被雷射光束照射。光學狹縫5使光二^準f在液晶板8 由不穩定矩形狹縫所組成,控制χγ角 ^犬夕樣化’其 機械結構幫助光學狹縫5自由旋轉。又 寸,及例如一 ,^8™- Ϊ :9 c st"ge! " J ^ ^ ^ 動。如果一光域缺陷(發光點缺陷置^制其移 像點’設定這一點為光域缺陷修補點同n二:: 以任意方向錢晶板8域㈣。 =使—=先束 位於液晶板8之下方。 一月光11 光束經由一光束分裂器12 一 14(camera)接收,影 :偏先板11經由相機 螢幕22。影像處理;=傳达到—影像處理裝置15及一 缺陷,即要求光域缺Ϊ修:自㈣測雷射 外,一使用去环奸山烛"補的”占並告知控制裝置1 0另 陷修補點而控制i制裝^貞測要求光域缺陷修補的光域缺 板8上Ϊ二偏於光背 =、13以90度互相交又,位於w 整液晶細胞。@時光域相機14之間,不需要經常調 之光傳送並經由使用二機::補與具有降低有缺陷映像點 像處理以判定光Ϊ: ::14或經由影像處理裝置15進行影 液晶板8有偏光t 修補好或壞。偏光板1〇、13不必如 掃描-對準m層巾=γ ®# n濾光器’解釋 二----胃度(90度)形成在彩色濾光器 第10頁 2140-5175>PFl(N).ptc ^/45392140-5175-PFl (N) .ptc page 9 574539 said to amend i No. 911204fin 5. Description of the invention (6) = 5, the replay lens 6 (replay lens) 7 (objective lens) enters a liquid crystal and is laser Beam shines. The optical slit 5 allows the light quasi-f to be composed of an unstable rectangular slit on the liquid crystal panel 8 and controls the χγ angle ^ Inu-like pattern. Its mechanical structure helps the optical slit 5 to rotate freely. In inches, and for example, ^ 8 ™-Ϊ: 9 c st " ge! &Quot; J ^ ^ ^ action. If a light-domain defect (the light-emitting point defect is controlled by its image shift point), set this point as the light-domain defect repair point as n. Below 8. The moonlight 11 beam is received through a beam splitter 12-14 (camera), and the shadow: the front panel 11 passes through the camera screen 22. Image processing; = conveyed to-image processing device 15 and a defect, which requires light Field defect repair: In addition to self-testing lasers, once the "defective ring candle" is used, the control device is notified and the control device 10 is trapped at another repair point to control the i system. The upper part of the field missing plate 8 is biased toward the light back =, 13 intersects with each other at 90 degrees, and is located at the entire liquid crystal cell of w. @ 时光 域 camera 14 does not require frequent dimming of light transmission and through the use of two machines :: complement Defective point image processing to determine the optical frame: :: 14 or the shadow liquid crystal panel 8 through the image processing device 15 has the polarized light t repaired or not. The polarizing plates 10 and 13 do not need to be aligned with the m-layer towel = γ ® # n filter 'Explanation 2 ---- stomach degree (90 degrees) is formed in the color filter on page 10 2140- 5175 > PFl (N) .ptc ^ / 4539

五、發明說明(7) =射Λ束槽之二 槽成正交之雷射光X °^束縱長方向與對準層中V型溝 以垂直方式掃長:=,Λ用雷射光束B1 縱長方向相當於映像中ί:2平圖寬度雷射光束…^ 對準ΪΓ—圖ν型ϊίΐ8之正面為-陣列基板,解釋掃描-之關係。在第3圖;度= :基板與雷射光束 型溝槽為—水平長===== = = ί:2寬圖度。雷射光⑽之尺寸在經度相當於映 像點實施例’雷射光束從振盤器2依據映 方向成=交。=之縱長方向與對準層怜型溝槽的 t冓槽角度以排除對準層巾規則之v型溝槽。 中V. Description of the invention (7) = Laser beam X which is orthogonal to the two grooves of the beam Λ beam X ° ^ The length of the beam is perpendicular to the V-shaped groove in the alignment layer: =, Λ uses the laser beam B1 The lengthwise direction is equivalent to the laser beam with a flat width of 2: 2 in the image ... ^ Alignment ΪΓ—Figure v type 图 ΐ 8 The front side is an array substrate to explain the scanning-relationship. In Figure 3; degree =: substrate and laser beam type groove is-horizontal length ====== = ί: 2 wide picture. The size of the laser beam is equivalent to the pixel point in the longitude embodiment. The laser beam from the vibrator 2 is made to intersect according to the reflection direction. = The length of the longitudinal direction and the t-groove angle of the p-type groove of the alignment layer to exclude the regular v-shaped groove of the alignment layer. in

映像Π/、第2圖及第3,,薄膜電晶體之映像點(缺P 、… 光域缺陷出現在啟動時。使用螢幕22經相嬙 立刻作汰今 A Vf 子目機可 缺陷修補6 :、論降低多少缺陷映像點光傳送為利用光域 理梦署1 ^本黑點顯示或使其較為容易運用在影傻Ϊ "1 5 Μ萃取出點加以修補。在第2、3圖 处 2= 象點圍繞缺陷映像點,嶋膜電晶體同匕: 疋在士域缺陷修補沒有異常出現在RGB顯示彩色。吁马確 溝槽度為9〇度或0度’在第2、3圖,同時v型 曰月度為U5廑成45唐。Image Π /, Figure 2 and Figure 3. Image points of thin-film transistors (lack of P, ... Light field defects appear at start-up. Use screen 22 to repair immediately A Vf sub-camera defect repair 6 :, On how much to reduce the defect image point light transmission for the use of light domain dream department 1 ^ this black spot display or make it easier to use in shadow silly quot 1 5 Μ extracted points for repair. Figures 2 and 3 Department 2 = The pixel points around the defect image point, and the membrane transistor is the same as the dagger: 疋 There is no abnormality in the Shi domain defect repair appears in RGB display color. Yu Ma Que groove degree is 90 degrees or 0 degrees' in the second and third degrees At the same time, the monthly V-shape is 45 U Tang.

214〇.5175-PFl(N).ptc 第11頁 574539 _案號 91120460 A_ 修正 曰 五、發明說明(8) 一# 圖,在液晶板之正面8有一彩色濾光器,解釋掃描 ί 2層中一 V型溝槽角度(丨35度)形成在彩色濾光器與光 击 ^關係。在第4圖,雷射光束之光束為一傾斜長光 ’了縱長方向與對準層中v型溝槽成正交,利用雷射 M + v Γ、垂直方式掃描對準層。利用雷射光束83掃描對準 二#/溝槽/度如第4圖顯示。雷射光束Β3之長度依據掃 : 之改變’其設定為一較長掃描位置如ρ 1、p 2、Ρ 3。 /岡)=之長度根據控制裝置1 (第1圖)來控制光學狹縫5 (第 1圖)來改變。 準> ^ 5_圖,液晶板8之正面為一陣列基板,解釋掃描一對 Γ ^ : —V型溝槽角度(45度)形成在陣列基板與雷射光束 縱县在第5圖,雷射光束為一傾斜長光束Β2,其光束 t,對準層中V型溝槽成正交,利用雷射光束Β2以 ^掃描對準層。利用雷射光束184掃描對準層中v型 声^播二如第5圖顯示。如雷射光束β3,雷射光束Μ之長 又1知描位置之改變,其設定為一較長掃描位置。 π处圖,掃描在對準層中ν型溝槽之角度。另外, 到映傻靈I描角度垂直或只是橫的(一端指定映像點之角度) 的刭^ ^。第6圖顯示光束掃描角度如在第5圖為垂直或橫 Ψ *而ο 點。掃描角度如在第2圖至第6圖利用控制裝置1 τ $面9控制動作。 置,t 2 :中對準溝槽以45度或135度形成在液晶顯示裝 望4、=同Γ束掃描角度以消除對準溝槽為135度或45度(如 # m μ 1 另外,傾斜長雷射光束之長度在經度角度在 ---:-、縱向的長(寬1〇〇 X長300 "m)或橫向長 第12頁 2140-5175-PF1(N) .ptc 574539214〇.5175-PFl (N) .ptc Page 11 574539 _Case No. 91120460 A_ Amendment V. Description of the Invention (8) A # picture, there is a color filter on the front of the LCD panel 8 to explain scanning 2 layers The middle one V-shaped groove angle (35 degrees) is formed in the relationship between the color filter and the light strike ^. In Fig. 4, the beam of the laser beam is an oblique long light ′ whose longitudinal direction is orthogonal to the v-shaped groove in the alignment layer, and the alignment layer is scanned vertically using laser M + v Γ. The laser beam 83 is used to scan and align the two # / grooves / degrees as shown in FIG. 4. The length of the laser beam B3 is changed according to the scan: it is set to a longer scan position such as ρ 1, p 2, P 3. / Gang) = The length is changed according to the control device 1 (Fig. 1) to control the optical slit 5 (Fig. 1). Figure ^ 5_, the front face of the liquid crystal panel 8 is an array substrate, explaining scanning a pair of Γ ^: —V-shaped groove angle (45 degrees) is formed on the array substrate and the laser beam is longitudinally shown in Figure 5, The laser beam is an oblique long beam B2, whose beam t is orthogonal to the V-shaped groove in the alignment layer, and the laser beam B2 is used to scan the alignment layer. The laser beam 184 is used to scan the v-shaped sound in the alignment layer as shown in FIG. For example, the laser beam β3, the length of the laser beam M and the change of the scanning position are set to a longer scanning position. At π, the angle of the v-shaped groove in the alignment layer is scanned. In addition, the angle of reflection of the idiot spirit I is vertical or only horizontal (the angle at which one end specifies the mapping point). Figure 6 shows the beam scanning angle as shown in Figure 5 as vertical or horizontal Ψ * and ο points. The scanning angle is controlled by the control device 1 τ $ plane 9 as shown in FIGS. 2 to 6. T 2: The middle alignment groove is formed at 45 ° or 135 ° on the LCD display. 4 == the same Γ beam scanning angle to eliminate the alignment groove is 135 ° or 45 ° (such as # m μ 1 In addition, The length of the oblique long laser beam is in longitude angle at ---:-, longitudinal length (100 × width 300 " m) or horizontal length. Page 12 2140-5175-PF1 (N) .ptc 574539

--案號 91120460 五、發明說明(9) (寬3 00/zmx長!!)!)#!!!)映像點根據掃描位置被掃描、控 制展開或縮小。在掃描對準層時控制雷射光束脈動能量依 據改變雷射光束之長度,能達到令人滿意之效果,特別是 利用較長之雷射光束,較低的能量及較短的高能量,減少 在液晶板中熱量影響來自雷射光束之放射線,原因為能量 對較長雷射高於叫短雷射。脈衝能量就熱量影響而言,係 經由一線性函數及更嚴格地經一第三函數做校正。° '、 中V型溝槽方向成正交, 消0 …依據本發明之第一實施例,對準層被放射線照射及脈 動雷射放射來自Q開關脈動雷射振動器2,同時利用脈動雷 射來自振動器2造成放射掃描對整層,並可能造成它們重 疊,以及掃描對對準槽因此對準層之區域被放射線照射及 氏動雷射放射來自振動器2尤其重疊區域放射及脈動雷射 ==振動器2。在正常情況下,如果利用雷射光束照 射對準層以排除角度在對準層中對準溝槽,雷射光束殘留 ^追蹤及提供新角度至對準層因此減少雷射光束修補之效 依據本毛明第1貫施例雷射光束殘留之追蹤與對準層 因此對準層之角度能更有效取 第7圖為示意圖顯示依據本發明之第2實-Case No. 91120460 V. Description of the invention (9) (width 3 00 / zmx length !!)!) # !!!) The image point is scanned, controlled to expand or shrink according to the scanning position. Controlling the pulse energy of the laser beam when scanning the alignment layer can achieve satisfactory results by changing the length of the laser beam, especially using a longer laser beam, lower energy and shorter high energy, reducing In the liquid crystal panel, heat affects the radiation from the laser beam because the energy is higher for longer lasers than for short lasers. In terms of thermal effects, the pulse energy is corrected by a linear function and more strictly by a third function. ° ', the direction of the middle V-shaped groove is orthogonal, and 0 is eliminated. According to the first embodiment of the present invention, the alignment layer is irradiated with radiation and the pulsating laser radiation comes from the Q-switching pulsating laser vibrator 2 while using the pulsating laser The radiation from the vibrator 2 causes the radiation to scan the entire layer and may cause them to overlap, and the scanning alignment grooves so that the area of the alignment layer is irradiated with radiation and the kinematic laser. Shooting == Vibrator 2. Under normal circumstances, if the laser beam is used to irradiate the alignment layer to eliminate the angle of aligning the grooves in the alignment layer, the laser beam remains tracked and a new angle is provided to the alignment layer, thereby reducing the effectiveness of laser beam repair. In the first embodiment of the Maoming, the tracking and alignment layer of the laser beam remains. Therefore, the angle of the alignment layer can be more effectively taken. FIG. 7 is a schematic view showing a second embodiment according to the present invention.

‘本發明之第2實施例,為一種 部分元件有相同符號在第1 i經无束分裂器1 6分離至光 鏡面17。雷射光束從光學 574539 j號 911204fm 五、發明說明(l〇) 狹縫5進入液晶板8經由光束分裂器12、重放透鏡6 (re lay lenaS)、物鏡7( object ive lens)及利用雷射光束照射上面 ^曰曰板8中對應層。雷射光束從光學狹縫丨8進入液晶板8經 過一鏡面19、重放透鏡2〇重放透鏡2〇、物鏡21及利用雷射 光束照射下方液晶板8中對應層。 y f上方對準層中V型溝槽及下方對準層為直角相互關 係’雷射光束形成為利用光學狹縫5、丨8有一直角相互關 係,如其中一光束81如第2圖,另一光束B2如第3圖,另一 光束B3如第4圖,另一光束B4如第5圖。 對準層中V型溝槽角度在彩色濾光器及在陣列基板1 3 :、、1 35度及45度’如第4、5圖雷射光束Β3、β4形成經光學 狹縫5 18,光束B3、B4在經度角度之尺寸控制為依據掃 描之位置。光束B3、B4掃描角度如第4、5、6圖。 另外針/對以雷射光束掃瞄方式做修補内如做說明。 一第8圖係_針對雷射加工痕跡做說明的圖式。如第8圖所 =’液晶顯示器之薄膜3〇為圓形之雷射光束掃瞄時,在薄 郫梭^ f生雷射加工痕(beat ) 31在該雷射加工痕31中所 j接的略成圓形之凹部33之間,存在凸部32。此雷射加工 n t係為與液晶顯示器具有同樣之薄膜構造的太陽電 / = I* 、 scribing)加工中,亦顯著地出現之雷射加工 之特有現象而為公知。 第9圖(a)係表示於縱方向形成v形槽之對準層4〇,第9 上其a剖面圖。又第10圖(〇表示以縱方向之雷射光 ί在檢方向做掃目苗後之對準層40。第10®⑷為其剖面 圖0‘A second embodiment of the present invention is a type in which some elements have the same symbol and are separated by a beamless splitter 16 to a light mirror surface 17 at the first i. Laser beam from optics 574539 j No. 911204fm 5. Description of the invention (10) The slit 5 enters the liquid crystal panel 8 via the beam splitter 12, replay lens 6 (relay lenaS), objective lens 7 (object ive lens) and the use of lasers The radiation beam irradiates the corresponding layer in the upper plate 8. The laser beam enters the liquid crystal panel 8 from the optical slit 8 through a mirror 19, a playback lens 20, a playback lens 20, an objective lens 21, and a corresponding layer in the lower liquid crystal panel 8 is irradiated with the laser beam. The Y-shaped groove in the upper alignment layer of yf and the lower alignment layer have a right angle relationship. The laser beam is formed by using optical slits 5 and 8 to have a right angle relationship. For example, one of the light beams 81 is shown in FIG. 2 and the other The light beam B2 is shown in FIG. 3, the other light beam B3 is shown in FIG. 4, and the other light beam B4 is shown in FIG. 5. The angles of the V-shaped grooves in the alignment layer are formed on the color filters and on the array substrates 13 :, 1, 35, and 45 degrees as shown in Figures 4 and 5. The laser beams B3 and β4 are formed by optical slits 5 18, The size of the beams B3 and B4 in the longitude angle is controlled based on the scanning position. The scanning angles of the beams B3 and B4 are as shown in Figs. 4, 5, and 6. In addition, the needle / pair is explained in the laser beam scanning method. A 8th figure is a diagram for explaining laser processing marks. As shown in FIG. 8 = 'When the thin film of the liquid crystal display 30 is a circular laser beam scanning, the laser processing mark (beat) 31 is connected to the laser processing mark 31. Between the slightly circular concave portions 33, there are convex portions 32. This laser processing n t is well-known as a characteristic phenomenon of laser processing that also appears prominently in the photovoltaic (= I *, scribing) processing having the same thin film structure as the liquid crystal display. Fig. 9 (a) shows the alignment layer 40 in which a V-shaped groove is formed in the longitudinal direction. Fig. 10 (0 means laser light in the longitudinal direction ί aligning layer 40 after scanning the seedling in the inspection direction. Section 10®⑷ is its section. Fig. 0

574539 案號 91120460 —年 月 曰 修正 五、發明說明(11) 表示於第9圖之對準層40以縱方向之雷射光束在橫方 向做掃瞄時,對準層4 0形成如圖第1 〇圖(a )及第1 〇圖圖 (b)。參照第1〇圖(a)及第1〇圖(b),在對準層40上 縱向形成凸部3 2 ’,相當於第8圖所示之凸部3 2。比較第9 圖B (b)與第1〇圖(b),對準層40縱向之雷射光束做掃 目苗的方法可對圖B所示之溝槽做完全之破壞。 第11圖(a )表示以橫方向之雷射光束在縱方向做掃 瞄後之對準層40,相當於本案之第2圖。 與第2圖所示之方法相同的對準層4〇做掃瞄時,即對 準層40以橫向之雷射光束在縱方向做掃瞄時,對準層4〇形 成如第11圖(a)及第11圖(b)之樣態。參照第丨丨圖u )及第11圖(b),在對準層40橫向形成凸部32,,相當於 如圖A所示之凸部32。但是,第1〇圖所示之凸部32,並未形 成於第11圖所示之對準層4()上。因&,用橫向雷射 π槽正交之形狀的雷射光束)對對準層4〇做掃晦之 方法(本毛明的方法),可對v形槽做完全的破壞。 X,在習知中,用圓形雷射光束掃瞄對準層是 的0第1 2圖為用圓形之雷身+本击 吊 箆彳?冃%— 田射先束做知目田後之對準層4〇。如 :12,所不,fi]形之雷射光束掃 中’各光束間會有間隙。因:=¾知的方法 法完全地被破壞。 、法中’ v形槽無 依據本發明雷射光束形 度,雷射光束之縱長方As像畎像點形成有一長 π反万向與對準層中滏播 以雷射光束掃描對準声纟t古 、、i /冓槽成正父,如 v型溝槽,更包括太;^ b ^ 迅速破壞規則性對準層中 一錢t包括2明液晶顯示裝置之I竹姑 --------------域缺陷修補與 第15頁 J9 Λ 修正 曰 號;91190460 五、發明說明(12) 習知=缺陷修補方法比較更具有效率。 基板=(外薄膜依電據曰本二明雷射光束通過彩色滤光器端及陣列 對準居,过批,日日體Thln Fllm Transistor,TFT)照射在 器“:ί此晶層為中介而與上述之彩色濾光 猎此先域缺陷修補更有效率。 如在掃描之行進而控制雷射光束,例 修補光域^陷。度,其他為135度,以高速度來 控制ΐ ί:ϊ雷ΐ ϊ ί之能量利用控制裝置在掃描進行時 他液晶細胞。’间、又來修補光域缺陷,避免熱量影響其 因此以雷射光束已連續而重疊的方式掃描對準芦, 因此對準層能有效被刪除。 >F细耵早層, 雖然本發明已以較佳實施例 限定本發明,任何熟習此技蓺 ::並非用以 範圍當:後:與潤飾’因此本發明之保護 1交r仃ι τ明寻利乾圍所界定者為準。 麵 2l40-5l75-PFl(N).ptc 第16頁 574539574539 Case No. 91120460 —Year and Month Amendment V. Description of the Invention (11) When the alignment layer 40 shown in FIG. 9 is scanned with the laser beam in the vertical direction in the horizontal direction, the alignment layer 40 is formed as shown in FIG. Figure 10 (a) and Figure 10 (b). Referring to Fig. 10 (a) and Fig. 10 (b), a convex portion 3 2 'is formed on the alignment layer 40 in the longitudinal direction, which corresponds to the convex portion 32 shown in Fig. 8. Comparing Figure 9B (b) and Figure 10 (b), the method of sweeping the laser beam in the longitudinal direction of the alignment layer 40 can completely destroy the groove shown in Figure B. Fig. 11 (a) shows the alignment layer 40 after scanning with the laser beam in the horizontal direction in the vertical direction, which is equivalent to the second image in this case. When the alignment layer 40 is scanned in the same manner as shown in FIG. 2, that is, when the alignment layer 40 is scanned in the longitudinal direction with a horizontal laser beam, the alignment layer 40 is formed as shown in FIG. 11 ( a) and Figure 11 (b). Referring to Fig. U) and Fig. 11 (b), a convex portion 32 is formed in the lateral direction of the alignment layer 40, which is equivalent to the convex portion 32 shown in Fig. A. However, the convex portion 32 shown in Fig. 10 is not formed on the alignment layer 4 () shown in Fig. 11. Because of & the method of sweeping the alignment layer 40 (the method of Ben Maoming) by using the transverse beam (the orthogonal beam of the π-slot laser) can completely destroy the v-shaped groove. X, in the prior art, a circular laser beam is used to scan the alignment layer. 0 1 2 The picture shows a circular laser body + this strike. 箆 彳?冃%-Tian She first aligns the layer after Chimeda 40. Such as: 12, no, there is a gap between each beam in the fi] -shaped laser beam sweep. Cause: = Known method The method was completely destroyed. In the method, the v-shaped groove has no shape of the laser beam according to the present invention. The longitudinal As image of the laser beam is formed with a long π inverse universal alignment with the laser beam scanning and alignment in the alignment layer. Acoustic sound t, i / 冓 groove becomes a positive father, such as a v-shaped groove, but also includes too; ^ b ^ Quickly destroy the regular alignment layer, a money t including 2 bright LCD display device I Zhugu --- ----------- Domain defect repair and J9 Λ correction code on page 15; 91190460 V. Description of the invention (12) Known = Defect repair methods are more efficient. Substrate = (outer film according to the data, the laser beam is aligned through the end of the color filter and the array, and it is approved, and the Thln Fllm Transistor (TFT) is irradiated on the device ": This crystal layer is used as an intermediary And the above-mentioned color filter hunting this field defect repair is more efficient. For example, when scanning and then controlling the laser beam, for example, repair the light field ^. Degree, the other is 135 degrees, control at high speed ΐ: ϊ 雷 ΐ ϊ The energy utilization control device is used to scan the liquid crystal cells of the control device during the scanning process. In addition, the light field defects are repaired to prevent heat from affecting them. Therefore, the laser beams are scanned and aligned in a continuous and overlapping manner. The quasi-layer can be effectively deleted. ≫ F fine early layer, although the present invention has been limited to the preferred embodiment of the present invention, anyone familiar with this technique :: not for the scope when: after: and retouching ' The protection is limited to those defined by Mingqiunqianwei. Face 2l40-5l75-PFl (N) .ptc Page 16 574539

第1圖為示意圖係顯示依據本發明第一實施例之一種 光域缺陷之修補裝置之系統架構; 第2圖為一液晶壁板8為一彩色濾光器之上視圖係顯示 一對準層形成在彩色濾光器之一 V形溝槽角度(g 〇度)與利 用雷射光束掃描之間的關係; 、第3圖為一液晶壁板8為一陣列基板之上視圖係顯示一 對準層形成在陣列基板之一 V形溝槽角度(9 〇度)與利用雷 射光束掃描之間的關係; 第4圖為一液晶壁板8為一彩色濾光器之上視圖係顯示 一對準層形成在彩色濾光器之一v形溝槽角度(135度)與利 用雷射光束掃描之間的關係; 第5圖為一液晶板8為一陣列基板之上視圖係顯示一對 準層形成在陣列基板之一v形溝槽角度(45度)與利用雷射 光束掃描之間的關係; ^ 第6圖為示意圖顯示一雷射光束掃描角度B4及顯示在 第5圖映像點為縱向或橫向。 第7圖為示意圖顯示依據本發明之第2實施例,為一 光域缺陷修補裝置之架構。 第8圖為本發明之雷射加工痕跡之示意圖。 第9 (a)圖表示表示於縱方向形成v形槽之對準層 40 ° 第9 (b)圖為第9 (a)圖之剖面圖。 第1 〇 ( a )圖表示以縱方向之雷射光束在橫方向做掃 瞄之對準層40。Fig. 1 is a schematic diagram showing a system architecture of a device for repairing a light field defect according to a first embodiment of the present invention; Fig. 2 is a liquid crystal panel 8 showing a color filter. An upper view shows an alignment layer The relationship between the V-shaped groove angle (g °) formed in one of the color filters and scanning with a laser beam; Figure 3 shows a liquid crystal panel 8 and an array substrate. The top view shows a pair The quasi-layer is formed between a V-shaped groove angle (90 degrees) of one of the array substrates and scanning with a laser beam; FIG. 4 shows a liquid crystal panel 8 and a color filter. The alignment layer is formed between the v-groove angle (135 degrees) of one of the color filters and the scanning with a laser beam; FIG. 5 shows a liquid crystal panel 8 and an array substrate top view showing a pair The quasi-layer is formed between the v-groove angle (45 degrees) of one of the array substrates and the scanning with the laser beam; ^ Figure 6 is a schematic diagram showing a laser beam scanning angle B4 and the image point shown in Figure 5 For portrait or landscape. FIG. 7 is a schematic diagram showing a structure of an optical domain defect repairing device according to a second embodiment of the present invention. FIG. 8 is a schematic diagram of a laser processing trace of the present invention. Fig. 9 (a) shows an alignment layer in which a V-shaped groove is formed in the longitudinal direction. 40 ° Fig. 9 (b) is a sectional view of Fig. 9 (a). Fig. 10 (a) shows the alignment layer 40 which is scanned in the horizontal direction with the laser beam in the vertical direction.

574539 曰 修正 案號 91120460 圖式簡單說明 第11 (a)圖表示對準層40以橫向之雷射光束在縱方 向做掃瞄。 第11 (b)圖為第11 (a)圖之剖面圖。 第1 2圖為用圓形之雷射光束做掃瞄後之 符號說明 』干增w 1〜控制器 3〜擴展器 5〜光學狹縫 7〜接物透鏡 9〜臺面 11〜背光 13〜偏光板 15〜影像處理裝置 1 7〜鏡面 1 9〜鏡面 2 1〜物鏡 3 〇〜薄膜 3 2 ’〜凸部 32〜凸部 4 0〜對準層 B1、Β2、Β3、Β4〜斜長雷射光束 PI、Ρ2、Ρ3〜掃目苗方向 2〜Q開關脈動鐺射振盪器 4〜衰減器 ^ 6〜重放透鏡 8〜液晶板 1 〇〜偏光板 1 2〜光束分裂器 14〜相機 1 6〜光束分裂器 1 8〜光學狹缝 20〜重放透鏡 Μ〜螢幕 31〜雷射加工痕跡 3 2 ’ ’〜凸部 3 3〜凹部574539 Amendment No. 91120460 Brief Description of Drawings Figure 11 (a) shows that the alignment layer 40 scans in the vertical direction with a horizontal laser beam. Fig. 11 (b) is a sectional view of Fig. 11 (a). Figure 12 shows the symbol description after scanning with a circular laser beam. "Dry increase w 1 ~ controller 3 ~ expander 5 ~ optical slit 7 ~ objective lens 9 ~ table 11 ~ backlight 13 ~ polarized light Plate 15 to image processing device 1 7 to mirror surface 1 9 to mirror surface 2 1 to objective lens 3 〇 to film 3 2 ′ ~ convex portion 32 to convex portion 4 0 to alignment layer B1, B2, B3, B4 to obliquely long laser Beams PI, P2, P3 ~ Scanning seedling direction 2 ~ Q switch pulsating clang oscillator 4 ~ Attenuator ^ 6 ~ Playback lens 8 ~ LCD panel 1 0 ~ Polarizer 1 2 ~ Beam splitter 14 ~ Camera 1 6 ~ Beam Splitter 1 8 ~ Optical Slit 20 ~ Replay Lens M ~ Screen 31 ~ Laser Processing Trace 3 2 '' ~ Convex 3 3 ~ Concave

Claims (1)

574539 告索务1 丨1120460574539 Request 1 丨 1120460 1· 一種光域缺陷修補方法’藉由移除液晶顯示器中盥 一液晶層接觸之一對準層的溝槽方位而修補光域缺\^ 中移除該對準層中溝槽係利用一雷射光束掃描該對^層了 而該雷射光束之光束形式的縱長方向與該對準層之溝^方 2· —種光域缺陷修補方法’藉由移除液晶顯示器中與 一液晶層接觸之一對準層的溝槽方位而修補光域缺^ 中移除在該液晶顯示裝置之一彩色濾光器端之該對準層的 該溝槽係利用一第一雷射光束掃描該對準層,該雷射&束 之光束形式的縱長方向與該對準層之溝槽方向成I交光束 形式縱長方向,而移除以該液晶層為中介而與該彩色淚光 器相向設置一玻璃基板之該對準層的該溝槽係利用一 g ^ 雷射光束掃描該對準層,該雷射光束之縱向光: 對準層之溝槽方向成正交。 ^ 该 3·如申請專利範圍第1項所述之光域缺陷修補方法, 其中該雷射光束之光束形式係依據掃描之行進而控制,’ 此狀態下該對準層中該溝槽角度為4 5度或丨3 5度。 4·如申請專利範圍第2項所述之光域缺陷修補方法, 其中該第一雷射光束及該第二雷射光束之光束形伤’ 掃描之行進而控制,此時接觸於液晶層之一對準;中^ 角度為45度,而另一對準層之溝槽角度為135度。曰/槽 5 ·如申請專利範圍第3項及第4項所述之光域缺、 方法,其中雷射光束之能量係根據掃描的行進來控^ :補 6 ·如申請專利範圍第丨項及第2項所述之光 研1曰修補1. A light field defect repair method 'repairing the light field defect by removing the orientation of the grooves of an alignment layer in contact with a liquid crystal layer in the liquid crystal display The beam scans the pair of layers and the lengthwise direction of the beam form of the laser beam and the groove of the alignment layer are square. 2-A method for repairing defects in the light field by removing a liquid crystal layer from a liquid crystal display. The grooves of an alignment layer are contacted to repair the light field defect. The grooves of the alignment layer removed at a color filter end of the liquid crystal display device are scanned by a first laser beam. Alignment layer, the longitudinal direction of the beam form of the laser & beam forms the longitudinal direction of the cross-beam form with the groove direction of the alignment layer, and the color tear is removed with the liquid crystal layer as an intermediary The groove of the alignment layer opposite to the glass substrate is scanned with a g ^ laser beam, and the longitudinal beam of the laser beam is orthogonal to the groove direction of the alignment layer. ^ The 3. The method for repairing a light field defect as described in item 1 of the scope of the patent application, wherein the beam form of the laser beam is controlled according to the scanning line, 'In this state, the angle of the groove in the alignment layer is 4 5 degrees or 3 5 degrees. 4. The light field defect repair method as described in item 2 of the scope of the patent application, wherein the beams of the first laser beam and the second laser beam are scanned for scanning and then controlled, at this time contacting the liquid crystal layer One alignment; the middle angle is 45 degrees, and the groove angle of the other alignment layer is 135 degrees. / Slot 5 · As described in item 3 and item 4 of the scope of the patent application, the method of the light field is missing, in which the energy of the laser beam is controlled according to the travel of the scan ^: Supplement 6 And Light Research 1 mentioned in Item 2 2140-5175-PFl(N).ptc 第19頁 574539 案號 91120460 六、申請專利範圍 方法,其中利用雷射光束掃描對準層連續重疊放 7·如申請專利範圍第1項所述之光域缺陷修 其中該雷射光束之掃描方向為該對準層之溝槽方向/ 8·如申請專利範圍第1項所述之一種光域缺P 法,其中該雷射光束之掃描方向為在液晶顯示裝^> ;?一 像點之一側的方向,此時該對準層中之該溝、 或135度。 〜万向為45度 9. 一種光域缺陷修補裝置,藉由移除液晶顯示哭 二液晶層接觸之-對準層的溝槽方位而修補光域缺^,包 -光束形式控制装置,用於產生一雷射光束 形式與該對準層之溝槽方向成正交;以及 Τ描裝置’利用該雷射光束掃描對準層。 宜中^光如專^彳範^第9項所述之光域•陷修補裝置, 二束的'縱㈡置係依據雷射光束掃描 度。 尺寸此時對準層中溝槽角度為45度或135 詈,1^申請專利範圍第1 0項所述之光域缺陷修補裝 據該雷射dt巧置用來控制該雷射光束之能量,其依 12 _ ^ ~目田行進來控制該雷射光束之能量。 與-液晶—層種接光觸域Λ?補裝置,藉由移除液晶顯示器中 位而修補光域缺陷,包:對準層及一第二對準層的溝槽方 、束形式控制裝置,產生一第一雷射光束以及一第 2140-5175-PFl(N).ptc 第20頁 574539 _案號91120460_年月曰 修正_ 六、申請專利範圍 二雷射光束,該第一雷射光束之光束形式的縱長方向與第 一對準層中溝槽方向成正交,而該第二雷射光束之光束形 式的縱長方向與第二對準層中溝槽方向成正交;以及 一掃瞄裝置,利用該第一雷射光束掃瞄該第一對準 層,以該第二雷射光束掃瞄該第二對準層。2140-5175-PFl (N) .ptc Page 19 574539 Case No. 91120460 6. Method of applying for patent scope, in which the alignment layer is continuously overlapped by using laser beam scanning 7. The light field as described in item 1 of the scope of patent application Defect repair where the scanning direction of the laser beam is the groove direction of the alignment layer / 8. A P-deficient optical method as described in item 1 of the patent application scope, wherein the scanning direction of the laser beam is in the liquid crystal Display device ^ &?; The direction of one side of an image point, at this time, the groove in the alignment layer, or 135 degrees. ~ Universal is 45 degrees 9. A light field defect repairing device, which repairs the light field defect by removing the orientation of the groove of the alignment layer of the liquid crystal display and the alignment layer ^, a package-beam form control device, Generating a laser beam form orthogonal to the groove direction of the alignment layer; and the T-scan device 'uses the laser beam to scan the alignment layer. The light field and depression repairing device described in Item 9 of Yizhong ^ Light as described in Special ^ 彳 Fan ^ is based on the scanning degree of the laser beam. The size of the groove angle in the alignment layer at this time is 45 degrees or 135 °, and the light field defect repair device described in item 10 of the scope of the 1 ^ patent application is used to control the energy of the laser beam according to the laser dt. It travels in 12_ ^ ~ Mada to control the energy of the laser beam. And-liquid crystal-layer type light contact field Λ? Compensation device, repairing light field defects by removing the center of the liquid crystal display, including: alignment layer and a second alignment layer of the trench square and beam form control device To generate a first laser beam and a 2140-5175-PFl (N) .ptc page 20 574539 _ case number 91120460_ year month and month amendment _ 6, the scope of the patent application for the second laser beam, the first laser The longitudinal direction of the beam form of the light beam is orthogonal to the groove direction in the first alignment layer, and the longitudinal direction of the beam form of the second laser beam is orthogonal to the groove direction in the second alignment layer; The pointing device scans the first alignment layer with the first laser beam, and scans the second alignment layer with the second laser beam. 2140-5175-PFl(N).ptc 第21頁2140-5175-PFl (N) .ptc Page 21
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