TW523886B - Cavity down ball grid array carry plate structure by laser drill to enhance heat dissipation chip embedment and its manufacturing method - Google Patents

Cavity down ball grid array carry plate structure by laser drill to enhance heat dissipation chip embedment and its manufacturing method Download PDF

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Publication number
TW523886B
TW523886B TW089128354A TW89128354A TW523886B TW 523886 B TW523886 B TW 523886B TW 089128354 A TW089128354 A TW 089128354A TW 89128354 A TW89128354 A TW 89128354A TW 523886 B TW523886 B TW 523886B
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metal layer
substrate
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item
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TW089128354A
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Chinese (zh)
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Chian-Wei Jang
Sheng-Chuan Huang
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Kinsus Interconnect Tech Corp
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Abstract

A kind of cavity down ball grid array carrier structure for heat dissipation enhanced chip and its manufacturing method based on the metal stiffener in multi-layer are disclosed in the invention. In the invention, the application of metal stiffener to match IC package requirement is obtained, and the metal stiffener thickness can be flexibly adjusted to provide the design applications of supporting plat bending, plate warping and increasing heat dissipated power. In addition, the invented structure design can use surface finishing process of electroplated nickel/gold such that it is capable of using full body gold process without the need of electroplating wire-deposition design to perform the processing technique of surface finishing process of electroplated nickel/gold. Additionally, by using laser to drill micro-hole for increased layer to manufacture through holes, wire disposition space of electroplated conduction wire harness is decreased such that the increased space is capable of increasing the other I/O layout application requirement. Furthermore, the application of micro through-hole layout can be varied and can be completely symmetrical, or stacked, or layer-by-layer increasing type.

Description

523886 五、發明說明(1) 【發明領域 本發明係有關一種使用於半導體封裝製程中以雷射鑽 =加強散熱式晶片嵌入朝下球形陣列載板結構及製造方 /,可解決I c封裝之散熱降溫、電鍍導線末端訊號回溯產 生干擾雜訊與增加其它丨/O佈局需求的問題。 【發明背景】 多,::t It^薄短小之趨勢,加上功能之不斷增 中,!=0數二產品之功能也不斷增力”使得電子產品 不斷更新以因應實際需要,所此以其相對的封編也必須 技術之覆晶封裝(FUp Chip)的配合現今在咼階產品最新 球格陣列剩成為現今封裝製;J,而二得高】/〇密度的 功率ic也利用球格陣列侧封口主::】此許多高 (BGA)的1/0封裝密度的較其它封V方%’:疋你其球格陣列 功率1C的長時間使用下, 得在許多高 設計散熱降溫結構,才可唯^ 、里之…、Ϊ,必須另外 才了捕^力率1G之功能正常運作。 習知改善高功率1C散熱之作法 (Ceramic 0r Plastic BGA)晶片=二,二有機載板 之散熱座,也可另提供—些具散埶: 外附著鰭片型 但由於這些習知的 ,、、、效f之封裝結 白而夕-道製作程序,使得該封523886 V. Description of the Invention (1) [Field of the Invention The present invention relates to a structure and a manufacturing method of laser array = enhanced heat dissipation chip embedded downward spherical array carrier board used in semiconductor packaging process, which can solve the problem of I c package. The problems of heat dissipation, temperature reduction, and trace back of the end of the plated wire cause interference noise and increase other I / O layout requirements. [Background of the Invention]: The trend of thinner and thinner: t It ^, coupled with the increasing number of functions,! = 0 the number of products also continues to increase the function of the "products are constantly updated to respond to actual needs, so Its relative closure must also be compatible with the technology of FUp Chip. Today, the latest ball grid arrays in the tier-tier products are now the current packaging system; J, and the second highest] power density ic also uses ball grids. Array side sealing master ::] This many (BGA) 1/0 package density is lower than other sealing V% ': 疋 Your ball grid array power is 1C for a long time use, you have to have a lot of high design cooling structure In order to be able to use only ^, ri ..., Ϊ, it is necessary to have the function of capturing 1G to operate normally. Know how to improve high-power 1C heat dissipation (Ceramic 0r Plastic BGA) chip = two, two organic carrier boards Heat sinks can also be provided in addition-some with loose: externally attached fin type, but because of these conventional ,,, and effective packaging, the production process makes the seal

523886 五、發明說明(2) ~" 裝之成本增加,且晶片未能直接和散熱鰭片接觸,以致使 得散熱的效果不佳。此外,世界第一大封裝廠Amk〇r/Anam 所推出SuperBGA及德州儀器公司(ΤΙ)的uStarBG,也類似 以Heat Sink配合嵌入朝下方式設計試圖增強其散熱效 果,其基本上為以BT材料的PBGA,並以機械鑽孔作導通孔 (孔徑Φ 2 50ιιπι),並需拉電鍍鎳/金導電線方式,但仍無法 達到本發明所能提供之以雷射鑽微小導通孔(孔徑φ 5 〇〜 〇 1 50um)的能力。523886 V. Description of the invention (2) ~ " The cost of mounting is increased, and the chip cannot directly contact the heat dissipation fins, so that the heat dissipation effect is not good. In addition, the world ’s largest packaging company Amk〇r / Anam launched SuperBGA and Texas Instruments ’(Star) uStarBG, similarly designed with Heat Sink and embedded downward to try to enhance its heat dissipation effect, which is basically based on BT material. PBGA, and mechanical drilling as a via (aperture Φ 2 50 ιιιι), and electroplated nickel / gold conductive wire method is needed, but it still cannot reach the micro via (aperture φ 5 with laser drilling) provided by the present invention. 〇 ~ 〇1 50um).

一般BGA載板之設計因考慮到散熱效率對晶片的影 ,番通常會將接地層(GND-Ground_大面積金屬層)設計放 之最底層,其以三層板(3 Layers)為例,其三層未 為Layer ! - Layer 2為訊號層,_"為接地層 ίΐΚΓίΪ使用在高速邏輯線路時,由於密集佈線』 過近的原因,造成會有串訊(“Μ"干擾,因 此本發明之結構上已由多片 絕佳散熱效率,所以設計時可 tlffener)提供 而使用 Uyer 1&Uyer ft 移至2, 問題解決。 乍為線路訊號層,如此可將串荀 再加上本發明所揭露 右佑雄宓许古 匕他 ^無電鍵導線的佈線設言_ ’可具 構與 / c , . , , 、 ?及使用多片金屬補強> (SUffener)補強結構等 ^ ^ 甘制、土七α 占’所以本發明之設計 其製造方法可完全改盖前、+、π + k η I 0别述習知方式之缺點。Generally, the design of BGA carrier board takes into consideration the influence of heat dissipation efficiency on the chip. Generally, the ground layer (GND-Ground_large area metal layer) is designed as the bottom layer. It takes three layers as an example. Its three layers are not Layer!-Layer 2 is the signal layer, and _ " is the ground layer. When used in high-speed logic circuits, there will be crosstalk ("M " interference because of dense wiring" too close), so the present invention The structure has been provided with multiple pieces of excellent heat dissipation efficiency, so when designing, it can be provided by tlffener) and use Uyer 1 & Uyer ft to move to 2. The problem is solved. At first, it is the line signal layer, so the string can be added to the invention. Revealing the wiring instructions of You Youxiong and Xu Gujian ^ keyless wires _ 'can be structured with / c,.,,,? And using multiple pieces of metal reinforcement> (SUffener) reinforcement structure, etc. ^ The soil seven alpha accounted for 'so the manufacturing method of the design of the present invention can completely cover the disadvantages of the conventional method before the +, π + k η I 0.

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五、發明說明(3) 【發明目的】 之散熱功能有限、製造 缺點,作一完整解決方 本發明之目的係將習知技藝中 程序複雜成本高昂與佈線密度低等 案(T 〇 t a 1 S ο 1 u t i 〇 η) 〇 因此為達到以上目的,士 1 w 44曰η山X 4 的本發明k供一種雷射鑽孔加強 ^熱式日日片肷入朝下球形陣列載板結構及製造方法,包 括· •提供一第一基板,該 第二金屬層與一第三金屬層 膜影像轉移之方式,餘刻該 線路’並開雷射光罩於該第 雷射光罩開口; 第一基板上下表面預先形成一 ’以形成内層線路;再以一乾 第二金屬層形成一第二金屬層 三金屬層上形成一複數個第三 •壓合一第二基板,於該第二金屬層線路表面上壓合 —第二基板,並於該第二基板上形成一第一金屬層,以形 成外層線路; 一 •雷射鑽孔形成第三通孔,係以雷射鑽孔方式於該第 二金屬層至該第二金屬層間形成一複數個第三通孔,或於 該第三金屬層至該第一金屬層間形成一複數個第三通孔; 並於該第三通孔中鍍金屬材料後,接著以一乾膜影像轉移 之方式蝕刻該第三金屬層形成一第三金屬層線路; •壓合一第二基板,於該第三金屬層線路表面壓合一V. Description of the invention (3) [Objective of the invention] The heat dissipation function is limited and the manufacturing disadvantages are a complete solution. The purpose of the present invention is to combine the complicated procedures in the conventional technology with high cost and low wiring density (T ota 1 S). ο 1 uti 〇η) 〇 Therefore, in order to achieve the above purpose, the present invention of 山 1 × 44, η 山 X 4 is provided for laser drilling to strengthen the structure and manufacture of a hot-type solar panel inserted into a downward-shaped spherical array carrier board. The method includes: • providing a first substrate, the second metal layer and a third metal layer film image transfer mode, leaving the line 'and opening a laser mask in the opening of the first laser mask; A '' is formed on the surface in advance to form an inner layer circuit; a second metal layer is used to form a second metal layer; a third metal layer is formed on the third metal layer to form a plurality of third substrates; a second substrate is laminated on the surface of the second metal layer circuit; Lamination—a second substrate, and a first metal layer is formed on the second substrate to form an outer circuit; a laser drilled hole forms a third through hole, which is laser-drilled to the second metal Layer to the second metal A plurality of third through holes are formed between the layers, or a plurality of third through holes are formed between the third metal layer and the first metal layer; a metal material is plated in the third through holes, and then a dry film image is formed. The third metal layer is etched in a transfer manner to form a third metal layer circuit. • A second substrate is pressed and bonded to a surface of the third metal layer circuit.

523886 五、發明說明(4) 第一基板’且該第二基板中係具有一金屬補強片 (su f f ener)構造;再以一乾膜影像轉移之方式開雷射光 罩於該第一金屬層上形成一複數個第一雷射光罩開口; •雷射鑽孔形成第一通孔,係以雷射鑽孔方式於該第 一金屬層至該第二金屬層間形成一複數個第一通孔,並於 該第一通孔中鍍金屬材料後,接著以—乾膜影像轉移之方 式於該第一金屬層上電鍍鎳金,接著對該第—金屬層進行 線路蝕刻,形成一第一金屬層線路; 曰 •印刷防焊阻劑於該第一金屬層線路表面,且將該第 一、第二與第三基板切孔形成一晶片嵌入區域,並壓^ 一 散熱片(Heat Sink)於該苐二基板之一側,作為丑欠熱之" 【本發明實施例之詳細說明】 本發明提供一種雷射鑽孔加強散熱式晶片嵌入朝下球 形陣列載板之製造方法,如第一(A)圖〜第一(了)圖所示: 包括下列步驟·· ’ 提供一第一基板步驟,該第一基板101上下车 /、 卜表面預先 形成一第二金屬層102與一第三金屬層103,如第一(A)圖 所示,以形成内層線路,其中該第一基板1 〇 1材料,係可 為一Bismaleimide Triazine(BT)介電材料或為其它之有 機材料甚至可為無機之陶瓷材料,厚度約為6 〇〜3 " m,523886 V. Description of the invention (4) The first substrate 'and the second substrate has a metal reinforcement structure; and a laser mask is opened on the first metal layer by a dry film image transfer method. Forming a plurality of first laser reticle openings; • laser drilling to form a first through hole, forming a plurality of first through holes between the first metal layer and the second metal layer by laser drilling, After plating a metal material in the first through hole, nickel-gold plating is performed on the first metal layer in a dry film image transfer manner, and then the first metal layer is line-etched to form a first metal layer. Circuitry; • A solder resist is printed on the surface of the first metal layer circuit, and the first, second, and third substrates are cut through to form a wafer embedding area, and a heat sink (Heat Sink) is pressed on the circuit. One side of the second substrate is ugly and underheated. [Detailed description of the embodiment of the present invention] The present invention provides a method for manufacturing a laser drilled hole-enhanced heat-dissipating chip embedded downward spherical array carrier board, such as the first ( A) Picture ~ shown in the first (up) picture: Including the following steps ... 'Provide a first substrate step, the first substrate 101 gets on and off the vehicle, and a second metal layer 102 and a third metal layer 103 are formed on the surface in advance, as shown in the first (A) diagram, In order to form an inner layer circuit, the material of the first substrate 101 may be a Bissaleimide Triazine (BT) dielectric material or other organic materials or even an inorganic ceramic material, and the thickness is about 60%. m,

第8頁 523886Page 8 523886

且該第一金屬層l〇2與該第三金声i〇3姑 (Cu),厚度約為12 。飩 : 枓可為銅 m—Fi 1層2與該第三金屬層103作-薄化處理,如第-(B)圖所示,薄化之厚声 处 如弟 移之方彳,‘馇一 π、又为為9 Am,再以一乾膜104影像轉 一 ’ )圖所示,蝕刻該第二金屬層形成一 二金屬層線路102a ’丨中形成該第二金屬層線路i〇2a U再加入一黑氧化步驟’將該第二金屬層線路102&表 面黑乳化(Black Oxide),形成一第二黑氧化層。並開雷 射光罩105於該第三金屬層1〇3上,如第一(D)圖所示,形 成一複數個第三雷射光罩丨0 5開口。 壓合一第二基板106步驟,於該第二金屬層線路1〇2& 表面上利用熱壓合方式結合一第二基板1〇6及金屬層1〇7, =第一(E)圖所示,其中該第二基板1〇6可為一樹脂曰層,其 厚度約為5 0〜1 0 0 //m,利用金屬層丨〇 7以形成外層線S路/、 其中該第二基板106上之該第一金屬層1〇7材料可為銅 (Cu),厚度約為9 //m。 雷射鑽孔形成第三通孔步驟,係以雷射鑽孔方式,如 第一(F)圖所示,於該第三金屬層1〇3至該第二金屬層1〇2 間形成一複數個第三通孔1 0 8 a,或於該第三金屬層丨〇 3至 該第一金屬層107間形成一複數個第三通孔i〇8b;並於該 第三通孔108a、108b中鍍金屬材料1〇9後,如第一(G)圖所 示,其中該第三通孔中鍍金屬材料可為銅(Cu),厚度約為In addition, the first metal layer 102 and the third golden sound 103 (Cu) have a thickness of about 12.饨: 枓 can be -thinning the copper m-Fi 1 layer 2 and the third metal layer 103, as shown in Figure-(B), the thick and thin place of thinning is like a square move, "弟A π, again 9 Am, and then using a dry film 104 image to turn a ') picture, the second metal layer is etched to form a two metal layer circuit 102a' 丨 and the second metal layer circuit i〇2a U is formed. A black oxidation step is further added to 'emulsify the second metal layer circuit 102 & surface black (Black Oxide) to form a second black oxide layer. The laser mask 105 is opened on the third metal layer 103, and a plurality of third laser masks are formed as shown in the first (D) diagram. A step of pressing a second substrate 106, combining a second substrate 106 and a metal layer 107 with a thermal compression bonding method on the surface of the second metal layer circuit 102 and the first (E) diagram The second substrate 106 may be a resin layer having a thickness of about 50 ~ 100 0 // m. A metal layer is used to form an outer layer line S /. The material of the first metal layer 107 on 106 may be copper (Cu), and the thickness is about 9 // m. The step of forming a third through hole by laser drilling is performed by laser drilling. As shown in the first (F) diagram, a step is formed between the third metal layer 103 and the second metal layer 102. A plurality of third through holes 108a, or a plurality of third through holes 108a formed between the third metal layer 107 and the first metal layer 107; and the third through holes 108a, After the metal plating material 108b in 108b is shown in the first (G) diagram, the metal plating material in the third through hole may be copper (Cu), and the thickness is about

第9頁 523886Page 9 523886

1 5 // in,接著、 所示;然後叙tr u〇影像轉移之方式,如第一(H)圖 10 3a,如第該第'金屬層103形成一第三金屬層線路 ma後,剝;示’其中形成該第-金屬層線路 氧化層7、、、表面黑氧化(Black Oxide),形成一第一黑 壓合 一 ^-«-1111 . 弟二基板111步驟,於該第三金屬層線路I 0 3a 二第三基板m,如第一(J)圖所示,其中該第三1 5 // in, then, shown; then tr u〇 image transfer method, such as the first (H) Figure 10 3a, as the third metal layer 103 forms a third metal layer line ma, peel ; Shows' wherein the first metal layer circuit oxide layer 7, and, the surface of the black oxide (Black Oxide), forming a first black pressed one ^-«-1111. Brother II substrate 111 step, in the third metal Layer line I 0 3a two third substrates m, as shown in the first (J) diagram, wherein the third

二、、 料,係以一Bismaleimide Triazine(BT)介電材 料或為其它之有機熱壓黏合材料,以結合該第三基板丨工1 :具有之一個或一個以上之金屬補強片(Stiffener)構 ^ /、中之忒金屬補強片材料可為一銅(Cu)、I呂(A1)或其 匕6金以提供支撐板彎’板赵及提高散熱功率的設計運 用;再以一乾膜112影像轉移之方式,如第一(κ)圖所示, 開雷射光罩113於該第一金屬層1〇7上形成一複數個第一雷 射光罩開口,如第一(L)圖所示;2. The material is made of a Bisaleimide Triazine (BT) dielectric material or other organic thermocompression bonding material to combine the third substrate. Work 1: It has one or more metal stiffener structures. ^ /, The material of the metal reinforcement sheet in Zhongzhi can be a copper (Cu), I Lu (A1) or its dagger 6 gold to provide design support for the bending of the plate and increase the heat dissipation power; and then use a dry film 112 image In the transfer method, as shown in the first (κ) diagram, the laser mask 113 is opened to form a plurality of first laser mask openings on the first metal layer 107, as shown in the first (L) diagram;

雷射鑽孔形成第一通孔步驟,係以雷射鑽孔方式於該 第一金屬層1 〇 7至該第二金屬層丨0 2間形成一複數個第一通 孔114 ’如第一(μ)圖所示,並於該第一通孔丨丨4中鍍金屬 材料115後,如第一(N)圖所示其中該第一通孔114中鍍金 屬材料11 5可為銅(Cu),厚度約為1 5 // m ;接著以一乾膜 11 6影像轉移之方式,如第一(〇)圖所示;再於該第一金屬The step of forming a first through hole by laser drilling is to form a plurality of first through holes 114 ′ between the first metal layer 107 and the second metal layer 丨 2 by laser drilling. (Μ), and after the first through hole 丨 4 is plated with a metal material 115, as shown in the first (N) diagram, the first plated through hole 114 may be copper ( Cu), with a thickness of about 1 5 // m; and then transfer the image of a dry film 116 as shown in the first (0) figure; and then the first metal

第10頁 523886 五、發明說明(7) 層上電鍍鎳金117,如第一(p)圖所示;接著對該第一金屬 層1 〇 7進行線路蝕刻,如第一(q )圖所示,形成一第一金屬 層線路107a ; 形成一防焊阻劑步驟,係以印刷噴塗(SprayPage 10 523886 V. Description of the invention (7) Electroplated nickel-gold 117 on the layer, as shown in the first (p) diagram; then, the first metal layer 107 is line-etched, as shown in the first (q) diagram. As shown, a first metal layer circuit 107a is formed; a step of forming a solder resist is performed by printing and spraying (Spray

Coat ing)或滾輪塗佈(R〇ner coat ing)等方式將防焊阻劑 118形成於該第一金屬層線路i〇7a表面,且以曝光顯影製 程开/成圖樣(Pattern),如第一(R)圖所示,之後將該第一 基板101、第二基板1〇6與第三基板1U切孔,如第一(s)圖 所示’形成一晶片喪入區域Η 9,並壓合一散熱片 UtKHeat Sink),如第一(τ)圖所示,於該第三基板之 一側,作為散熱之用。 而且本發明經由以上之製造方法所形成之結構 如圖 一所示,包括: 居一第一基板2〇1,該第一基板上下表面具有一第二金 屬層士路202與一第三金屬層線路2〇3,以形成内層線路; 一第二基板2 06,該第二基板2 〇6形成 線路m表面,並於該第二基板20 6上形:一 路207,以形成外層線路; $ t屬層線 -複數個第三通孔2G8,係'以雷射鑽孔方式 金屬層線路m至Μ二金屬層絲2 三金屬層線路m至該第—金屬層線路2形 三通孔20δ中鍍金屬材料2〇9 ·, Χ 丑第Coat ing) or roller coating (Roner coat ing) and other methods to form a solder resist 118 on the surface of the first metal layer circuit 107a, and open / pattern (Pattern) by the exposure and development process, as described in As shown in FIG. 1 (R), the first substrate 101, the second substrate 106, and the third substrate 1U are cut into holes, as shown in FIG. 1 (s), to form a wafer sinking area Η 9, and A heat sink UtKHeat Sink is pressed, as shown in the first (τ) diagram, on one side of the third substrate for heat dissipation. Moreover, the structure formed by the above manufacturing method according to the present invention is shown in FIG. 1 and includes: a first substrate 201, the upper and lower surfaces of the first substrate having a second metal layer 202 and a third metal layer Circuit 203 to form an inner-layer circuit; a second substrate 206, which forms the surface of the circuit m, and is formed on the second substrate 206: a road 207 to form an outer-layer circuit; $ t Layer line-a plurality of third through holes 2G8, which are formed by laser drilling of metal layer lines m to M, two metal layer wires 2, three metal layer lines m to the first metal layer line 2 shaped three through holes 20δ Metal-plated material 209 ·, ▶

第11頁 523886 五、發明說明(8) -- 一第三基板211,該第三基板211形成於該第三金屬層 線路203表面,且該第三基板211中係具有一個或一個以上 之金屬補強片(Stiffener)構造; 一複數個第一通孔2 1 4,係以雷射鑽孔方式於該第一 金屬層線路207至該第二金屬層線路202間形成,且該第一 通孔214中鍍金屬材料215,該第一金屬層線路上電^錄金 217 ; 、又、、、’Page 11 523886 V. Description of the invention (8)-A third substrate 211 is formed on the surface of the third metal layer circuit 203, and the third substrate 211 has one or more metals in it Stiffener structure; a plurality of first through holes 2 1 4 are formed by laser drilling between the first metal layer line 207 to the second metal layer line 202, and the first through hole 214 中 plated metal material 215, the first metal layer circuit is electrically recorded with gold 217; ,,,,,, '

一防焊阻劑218,係以噴塗(Spray Coating)或滾輪塗 佈(Roller Coating)等印刷方式形成,且防焊阻劑係形成 於該第一金屬層線路2 07表面,並且該第一基板201、第二 基板206與第三基板211切孔形成一晶片嵌入區域219,且 具有一散熱片220 (Heat Sink)於該第三基板211之一側。 由習知技藝中為降低晶片溫度,增強散熱效果,皆以 PBGA載板上之晶片背面,另附著鰭片型散熱座的方式增強 散熱功率,且減低晶片溫度,習知雙面板之丨c熱阻抗 (Thermal Resistance)約為 2.4DC/Watts,4層板之熱阻A solder resist 218 is formed by printing methods such as spray coating or roller coating, and the solder resist is formed on the surface of the first metal layer line 207, and the first substrate 201, the second substrate 206 and the third substrate 211 are perforated to form a wafer embedding region 219, and a heat sink 220 (Heat Sink) is provided on one side of the third substrate 211. In order to reduce the temperature of the chip and enhance the heat dissipation effect in the conventional technology, the back of the chip on the PBGA carrier board and the fin-type heat sink are attached to increase the heat dissipation power and reduce the temperature of the chip. Resistance (Thermal Resistance) is about 2.4DC / Watts, the thermal resistance of the 4-layer board

抗(Thermal Resistance)約為 i· 8 t/WaUs,而本發明之 以上實施例以一個或一個以上的金屬補強片(stif fener) 作為散熱片(Heat Sink)時,其晶片直接以嵌入朝下 (Cavity Down)的結構黏著接觸該散熱片,因此其熱阻抗 (Thermal Resistance)可大幅降為約 13〇c/Watts,如第 三圖所示,將可增強散熱功率,並提供功率至5 watts以 上的I C使用。The Thermal Resistance is about i · 8 t / WaUs. When the above embodiments of the present invention use one or more metal stiffeners as heat sinks, the chip is directly embedded downward. The structure of (Cavity Down) sticks to the heat sink, so its Thermal Resistance can be greatly reduced to about 13c / Watts. As shown in the third figure, it will enhance the heat dissipation power and provide power to 5 watts. The above IC is used.

第12頁 523886Page 12 523886

本發明之另一實施例 (Bussless)設計,因此電 雜訊的PrS *1旨*5Γ知、丨Another embodiment of the present invention (Bussless) design, so PrS * 1 purpose * 5Γ of electrical noise, 丨

一貫施例為線路佈局係以無電鍍導線 因此電鍍導線末端訊號回溯,所產生干 … —減少電鍍導線的佈線空間,該多 它I/O佈局需求的應用,可在不改變載板 面積下增加佈線密度,以大幅降低成本,至少包括下列步 提供一基板,該基板3 01上下預先形成一第一金屬層 302與第一金屬層303 ; 鑽孔與鑛金屬於孔中步驟,係於該基板3 〇1、第一金 屬層302與該第二金屬層303以雷射的方式鑽通孔304,並 於該通孔中鍍金屬層3〇5; 鑛鎳金層形成步驟,係先形成一乾膜3〇6,且以影像 轉移方式於該第一金屬層3〇2與第二金屬層3〇3上之鍍金屬 層305表面形成一鍍鎳金層3〇7 ; 钱刻形成金屬線路步驟,係先形成一乾膜3〇8,钱刻 緣鑛金屬層305、第一金屬層302與第二金屬層303,形成 金屬線路; 印刷防焊阻劑3 〇 9步驟。 因為一般BGA板設計考慮到散熱效率通常會將接地屏 (GND-Ground-大面積金屬層)放在最底層其以三層板(3 Layers)為例結構為Layer 1 - Layer 2為訊號層,Uyer 3為接地層,這種設計在高速邏輯線路由於密集佈線且訊 523886It is a common practice for the circuit layout to use non-plated wires, so the signal at the end of the plated wires is traced back. The resulting dry ... — Reduces the wiring space of plated wires. Applications that require more I / O layout can be increased without changing the area of the carrier board. Wiring density to greatly reduce costs, including at least the following steps to provide a substrate, the substrate 3 01 is formed in advance a first metal layer 302 and a first metal layer 303; drilling and mineral metal in the hole steps, tied to the substrate 301. The first metal layer 302 and the second metal layer 303 are drilled through holes 304 in a laser manner, and a metal layer is plated in the through holes. The step of forming a nickel-gold layer is to first form a dry layer. Film 306, and a nickel-plated gold layer 3007 is formed on the surface of the metallized layer 305 on the first metal layer 302 and the second metal layer 3 by image transfer; a step of forming a metal circuit by money The first step is to form a dry film 308, the engraved edge ore metal layer 305, the first metal layer 302, and the second metal layer 303 to form a metal circuit; and print a solder resist step 309. Because the general BGA board design considers the heat dissipation efficiency, the ground screen (GND-Ground-large area metal layer) is usually placed at the bottom. The three-layer board is used as an example. The structure is Layer 1-Layer 2 is the signal layer. Uyer 3 is the ground plane. This design is used in high-speed logic circuits due to dense wiring and communication 523886.

號層迻近έ有串成(crossTaik)干擾。因此本發明由結構 i = f 4 ί或個以上的金屬補強片(St i f f ener)提供絕 佳散…、$率,所以設計將接地層移至Uyer 2,j及The layer moved closer and there was crossTaik interference. Therefore, in the present invention, the structure i = f 4 ί or more metal stiffeners (St i f f ener) provides excellent dispersion ..., $ rate, so the design moves the ground layer to Uyer 2, j and

Layer 3放線路訊號層,可將串訊問題解決。 而且本發明更揭露一種子使用金屬補強片 (Stiffener)為基礎,並配合以雷射鑽微小孔製作導通孔 :$連接夕層板載板結構間之電路,且配合全板鍍金製程 (Full Body Gold Process),製作無導電線的電鍍鎳/金 表面處理線路的多層板載板結構和形成該結構之製造方 法,其中本發明之一種線路佈局係以無電鍍導線 (B = sless)設計製作導通孔之佈局方式,可為完全對稱, 堆璺性式二逐層增設式等變化運用,如第五(人)圖〜第五 本發明與「現有技術」比較本發明之優點在於: I·以金屬補強片(stlffener)作為散熱片(Heat Sink)之 =,_晶片直接黏著接觸其熱阻抗(Thermal Resistane^ 幅降為約1.3t:/WattS,將可提供功率至5 WaUs [C使用。 工的 2 ·線路佈 號回溯產 局無電錄導線(Bussless)設計,電鍍導線末端 生干擾雜訊的問題可解決,減少電鍍導線的佈°Layer 3 puts the line signal layer to solve the problem of crosstalk. In addition, the present invention further discloses a method using a metal stiffener as a basis, and a via hole made with a laser drill to make a via hole: $ Connect the circuit between the structure of the on-board board and the full-body gold plating process. Gold Process), a multi-layer on-board board structure for producing electroless nickel / gold surface-treated circuits without conductive wires, and a manufacturing method for forming the structure, wherein a circuit layout of the present invention is designed and manufactured with electroless wires (B = sless) The layout of the holes can be used in different ways, such as complete symmetry, stacking type, and two layer-by-layer additions. For example, the fifth (person) diagram ~ the fifth invention compares the "existing technology" with the advantages of the invention: Metal stiffeners are used as heat sinks, and the chip directly adheres to its thermal resistance (Thermal Resistane ^ The drop is about 1.3t: / WattS, which will provide power to 5 WaUs [C use. 2 · Bussless design of trace line production line back to the production bureau, the problem of interference noise at the end of the plated wire can be solved, reducing the layout of the plated wire °

523886 五、發明說明(11) 線,可多出空間增加其它1/0佈局需求的應用,可在不改 載板面積下增加佈線密度大幅降低成本。 ’ 3:=板鍍鎳/金製程及雷射微小孔導通孔製程 杈本發明結構載板的製作。 知a 了支 朝下:^陆本發明之『一種雷射鑽孔加強散熱式晶片爭入 藝ί =列載板結構及製造方法』,確能藉所 运步性盘】目的與功效,符合發明專利之新藉性, 兴產業利用性之要件。 积|王 惟 、 施例而已以=揭露之圖式及說明,僅為本發明之較佳實 藏 匕非為用以限定本發明之每浐| η气 穴其所依本發明之精神,所=變=悉該項技 息在以下本案之申請專利範圍内斤作之…修飾,皆應 523886 圖式簡單說明 【圖式簡單說明】 第一(A)圖〜第一(τ)圖為本發明提供之一種雷射鑽孔加強 散熱式晶片嵌入朝下球形陣列載板之製造方法示意圖 第二圖為本發明提供之一種雷射鑽孔加強散熱式晶片嵌入 朝下球形陣列載板結構示意圖 第三圖為習知雙面板之1(:熱阻抗(Thermal Resistance)與 本發明實施例之比較示意圖 η 以無電鍍導線 第四圖為本發明提供之一種線路佈局係 (Bussless)設計之製造方法 第五(A)圖〜第五(D)圖為本發明之一 鍍導線(Buss less)設計製作導通孔之月局係以無電 對稱,堆疊性式,逐層增設式等變化運意g,可為完全 【圖號說明】 第一基板 101 第二金屬層 102 第二金屬層線路 102a 第三金屬層 103523886 V. Description of the invention (11) The line can provide more space to increase other 1/0 layout requirements. It can increase the wiring density without changing the area of the carrier board and greatly reduce the cost. ’3: = The process of plated nickel / gold plating and the process of laser micro-hole vias are used to manufacture the structure carrier of the present invention. I know that the support is facing downwards: ^ "The invention of a laser drilled hole to strengthen the heat sinking chip technology = = column carrier board structure and manufacturing method", can indeed be carried by the pace disk] the purpose and efficacy, in line with The new borrowing of invention patents and the requirements of industrial utilization. Ji | Wang Wei, the examples are only the figures and descriptions of the disclosure, which are only the best examples of the present invention. They are not used to define each of the present invention. = Change = It is understood that the technical information is within the scope of the patent application of the following case ... Modifications should be 523886 Simple illustration [Schematic illustration] The first (A) ~ the first (τ) Schematic diagram of a method for manufacturing a laser drilling-enhanced heat-dissipating wafer embedded downward-shaped spherical array carrier board provided by the invention The second figure is a schematic diagram of a laser drilling-enhanced heat-dissipating wafer embedded downward-shaped spherical array carrier board The third figure is a schematic diagram of the comparison between the conventional double-sided panel 1 (Thermal Resistance) and the embodiment of the present invention. Η The electroless plated wire. The fourth figure is a manufacturing method of a bussless design provided by the present invention. The fifth (A) to fifth (D) pictures are one of the inventions. The lunar plate of the vias designed for the manufacture of the vias is made of non-electrical symmetry, stacked, layer-by-layer, and other changes. For complete [illustration of number] A substrate 101, a second metal layer 102, a second metal layer circuit 102a, and a third metal layer 103

第16頁 523886 圖式簡單說明 乾 膜 104 雷 射 光 罩 105 第 二 基 板 106 第 金 屬 層 107 第 一 金 屬 層 線路 107a 第 二 通 孔 108a 第 二 通 孔 108b 鍍 金 屬 材 料 109 乾 膜 110 第 二 基 板 111 乾 膜 112 雷 射 光 罩 113 第 一 通 孔 114 鍍 金 屬 材 料 115 乾 膜 116 電 鍍 鎳 金 117 防 焊 阻 劑 118 晶 片 入 區 域 119 散 熱 片 120 第 _ — 基 板 201 第 二 金 屬 層 線路 202 第 三 金 屬 層 線路 203 第 基 板 206Page 16 523886 Schematic illustration of dry film 104 laser reticle 105 second substrate 106 first metal layer 107 first metal layer circuit 107a second through hole 108a second through hole 108b metal plating material 109 dry film 110 second substrate 111 Dry film 112 Laser mask 113 First through hole 114 Metal plated material 115 Dry film 116 Electroplated nickel gold 117 Solder resist 118 Wafer entry area 119 Heat sink 120 First — substrate 201 Second metal layer circuit 202 Third metal layer Circuit 203 first substrate 206

第17頁Page 17

523886 圖式簡單說明 第 一 金 屬 層 線路 207 第 二 通 孔 208 鍍 金 屬 材 料 209 第 二 基 板 211 第 一 通 孔 214 鍍 金 屬 材 料 215 電 鍍 鎳 金 217 防 焊 阻 劑 218 晶 片 欲 入 區 域 219 散 熱 片 220 基 板 301 第 一 金 屬 層 302 第 二 金 屬 層 303 雷 射 的 方 式 鑽通孔 304 通 孔 中 鍍 金 屬層 305 乾 膜 306 鍍 鎳 金 層 307 乾 膜 308 印 刷 防 焊 阻 劑 309523886 The diagram briefly illustrates the first metal layer circuit 207 the second through hole 208 metal plated material 209 the second substrate 211 the first through hole 214 metal plated material 215 electroplated nickel gold 217 solder resist 218 chip desired area 219 heat sink 220 Substrate 301 First metal layer 302 Second metal layer 303 Laser drilling through holes 304 Metal plating 305 dry film 306 through hole nickel-plated gold layer 307 dry film 308 printing solder resist 309

第18頁Page 18

Claims (1)

523886 六、申請專利範圍 式於該第一金屬層上電鍍錄金,接著對該第一金屬層進行 線路#刻,形成一第一金屬層線路; •形成一防焊阻劑,係以一印刷喷塗(Spray Coating)或滚輪塗佈(Roller Coating)等方式,將該防焊 阻劑形成於該第一金屬層線路表面,且將該第一、第二與 第三基板切孔形成一晶片嵌入區域,並壓合一散熱片 (Heat Sink)於該第三基板之一側,作為散熱之用。 2.如申請專利範圍第1項所述之製造方法,其’中該第一基 板材料,係可為一 Bismaleimide Triazine(BT)介電材料 或為其它之有機材料甚至可為無機之陶瓷材料,厚度約為 6 ◦〜300// m,且該第二金屬層與該第三金屬層之材料可為 銅(Cu),厚度約為12// m。 3 .如申請專利範圍第1項所述之製造方法,其中蝕刻該第 二金屬層前,可將該第二金屬層與該第三金屬層作一薄化 處理,薄化之厚度約為9 // m。 4. 如申請專利範圍第1項所述之製造方法,其中形成該第 二金屬層線路後,可再加入一黑氧化步驟,將該第二金屬 層線路表面黑氧化(B 1 a c k 0 X i d e ),形成一第二黑氧化 層。 5. 如申請專利範圍第1項所述之製造方法,其中該第二基523886 6. The scope of the patent application is to electroplat gold on the first metal layer, and then perform line # engraving on the first metal layer to form a first metal layer circuit. • Form a solder resist, which is printed by a Spray coating or roller coating, etc., forming the solder resist on the surface of the first metal layer circuit, and cutting the first, second and third substrates to form a wafer The heat sink is embedded in the area, and a heat sink is pressed on one side of the third substrate for heat dissipation. 2. The manufacturing method as described in item 1 of the scope of patent application, wherein the first substrate material may be a Bismaleimide Triazine (BT) dielectric material or other organic materials or even inorganic ceramic materials. The thickness is about 6 ◦ to 300 // m, and the material of the second metal layer and the third metal layer may be copper (Cu), and the thickness is about 12 // m. 3. The manufacturing method according to item 1 of the scope of patent application, wherein before the second metal layer is etched, the second metal layer and the third metal layer can be thinned, and the thinned thickness is about 9 // m. 4. The manufacturing method according to item 1 of the scope of patent application, wherein after forming the second metal layer circuit, a black oxidation step may be added to black oxidize the surface of the second metal layer circuit (B 1 ack 0 X ide ) To form a second black oxide layer. 5. The manufacturing method as described in item 1 of the scope of patent application, wherein the second base 第20頁 523886 六、申請專利範圍 板可為一樹脂層,其厚度約為5 0〜1 0 0 // m。 6 .如申請專利範圍第1項所述之製造方法,其中該第二基 板上之該第一金屬層材料可為銅(Cu),厚度約為9// m。 7 .如申請專利範圍第1項所述之製造方法,其中該第三通 孔與該第一通孔中鍍金屬材料可為銅(Cu),厚度約為1 5// m ° 8.如申請專利範圍第1項所述之製造方法,其中形成該第 一金屬層線路後,可再施予一黑氧化步驟,將該第一金屬 層線路表面黑氧化(B 1 a c k Ο X i d e ),形成一第一黑氧化 〇 9 .如申請專利範圍第1項所述之製造方法,其中該第三基 板材料,係可為一 Bismaleimide Triazine(BT)介電材料 或為其它之有機熱壓黏合材料。 1 0. —種雷射鑽孔加強散熱式晶片嵌入朝下球形陣列載板 結構,包括: •一第一基板,該第一基板上下表面具有一第二金屬 層線路與一第三金屬層線路,以形成内層線路; •一第二基板,該第二基板形成於該第二金屬層線路Page 20 523886 6. Scope of patent application The board can be a resin layer with a thickness of about 50 ~ 100 0 // m. 6. The manufacturing method according to item 1 of the scope of patent application, wherein the material of the first metal layer on the second substrate may be copper (Cu), and the thickness is about 9 // m. 7. The manufacturing method according to item 1 of the scope of patent application, wherein the third through hole and the first through hole can be plated with copper (Cu) and the thickness is about 15 // m ° 8. The manufacturing method described in the first item of the patent application, wherein after forming the first metal layer circuit, a black oxidation step may be further performed to black oxidize the surface of the first metal layer circuit (B 1 ack OX X ide), A first black oxide is formed. The manufacturing method as described in item 1 of the scope of patent application, wherein the third substrate material may be a Bisaleimide Triazine (BT) dielectric material or other organic thermocompression bonding material . 1 0. A laser drilling enhanced heat sinking chip embedded downward-shaped spherical array carrier board structure includes: a first substrate having a second metal layer circuit and a third metal layer circuit on the upper and lower surfaces of the first substrate; To form an inner layer circuit; a second substrate formed on the second metal layer circuit 第21頁 523886 六、申請專利範圍 表面,並於該第二基板上形成一第一金屬層線路,以形成 外層線路; •一複數個第三通孔,係以雷射鑽孔方式於該第三金 屬層線路至該第二金屬層線路間形成,或於該第三金屬層 線路至該第一金屬層線路間形成;且該第三通孔中鍍金屬 材料, • 一第三基板,該第三基板形成於該第三金屬層線路 表面,且該第三基板中係具有一個或一個以上之金屬補強 片(St i f fen er)構造,其中該金屬補強片材料可為一銅 (Cu)、鋁(A1 )或其它合金,以提供支撐板彎,板翹及提高 散熱功率的設計運用; •一複數個第一通孔,係以雷射鑽孔方式於該第一金 屬層線路至該第二金屬層線路間形成,且該第一通孔中鍍 金屬材料,該第一金屬層線路上電鍍鎳金; • 一防焊阻劑,該防焊阻劑係以印刷喷塗(Spray Coating)或滾輪塗佈(Roller Coating)方式,形成於該第 一金屬層線路表面,並且該第一、第二與第三基板切孔形 成一晶片嵌入區域,且具有一散熱片(Heat Sink)於該第 三基板之一侧。 11.如申請專利範圍第1 0項所述之結構,其中該第一基板 材料,係可為一 Bismaleimide Triazine(BT)介電材料或 為其它之有機材料甚至可為無機之陶兗材料,厚度約為6 0 〜300“ m,且該第二金屬層與該第三金屬層之材料可為銅Page 21 523886 6. The surface of the patent application, and a first metal layer circuit is formed on the second substrate to form an outer layer circuit. • A plurality of third through holes are laser-drilled on the first substrate. Formed between a three metal layer circuit and the second metal layer circuit, or between the third metal layer circuit and the first metal layer circuit; and a metal material is plated in the third through hole, a third substrate, the A third substrate is formed on the surface of the third metal layer circuit, and the third substrate has one or more metal stiffener structures, wherein the metal stiffener material may be copper (Cu). , Aluminum (A1) or other alloys to provide design and application of supporting plate bending, plate warping and improving heat dissipation power; • A plurality of first through holes are laser-drilled in the first metal layer line to the The second metal layer is formed between the lines, and the first through hole is plated with a metal material, and the first metal layer line is plated with nickel gold; a solder resist, which is spray-printed (Spray Coating) ) Or roller coating (Roller Co In an ating method, the first metal layer circuit surface is formed, and the first, second and third substrate cut holes form a wafer embedding area, and a heat sink is provided on one side of the third substrate. . 11. The structure described in item 10 of the scope of patent application, wherein the first substrate material can be a Bisaleimide Triazine (BT) dielectric material or other organic materials or even an inorganic ceramic material, thickness About 60 ~ 300 "m, and the material of the second metal layer and the third metal layer may be copper 第22頁 523886 六、申請專利範圍 (Cu),厚度約為12// m。 1 2 .如申請專利範圍第1 1項所述之結構,其中可將該第二 金屬層與該第三金屬層作一薄化處理,薄化之厚度約為9 β m。 1 3 .如申請專利範圍第1 0項所述之結構,其中該第一金屬 層與該第二金屬層線路表面可形成一第二黑氧化層,係利 用一黑氧化步驟,將該第二金屬層線路表面黑氧化(B 1 a c k 〇x i d e ),形成一第二黑氧化層。 1 4 .如申請專利範圍第1 0項所述之結構,其中該第二基板 可為一樹脂層,其厚度約為5 0〜1 0 0// m。 1 5 .如申請專利範圍第1 0項所述之結構,其中該第二基板 上之該第一金屬層材料可為銅(Cu),厚度約為9// m。 1 6 .如申請專利範圍第1 0項所述之結構,其中該第三通孔 與該第一通孔中鍍金屬材料可為銅(Cu),厚度約為1 5// 1 7.申請專利範圍第1 0項所述之結構,其中該第三基板材 料,係可為一 Bismaleimide Triazine(BT)介電材料或為 其它之有機熱壓黏合材料。Page 22 523886 6. Patent application scope (Cu), thickness is about 12 // m. 12. The structure according to item 11 of the scope of patent application, wherein the second metal layer and the third metal layer can be thinned to a thickness of about 9 β m. 13. The structure as described in item 10 of the scope of patent application, wherein a second black oxide layer can be formed on the circuit surfaces of the first metal layer and the second metal layer, and the second black oxide layer is formed by using a black oxidation step. The surface of the metal layer circuit is black oxidized (B 1 ack oxide) to form a second black oxide layer. 14. The structure as described in item 10 of the scope of patent application, wherein the second substrate may be a resin layer having a thickness of about 50 to 100 / m. 15. The structure described in item 10 of the scope of patent application, wherein the material of the first metal layer on the second substrate may be copper (Cu), and the thickness is about 9 // m. 16. The structure as described in item 10 of the scope of patent application, wherein the third through hole and the first through hole can be plated with copper (Cu) and the thickness is about 1 5 // 1 7. Application The structure described in item 10 of the patent scope, wherein the third substrate material may be a Bisaleimide Triazine (BT) dielectric material or other organic thermocompression bonding material. 第23頁Page 23
TW089128354A 2000-12-29 2000-12-29 Cavity down ball grid array carry plate structure by laser drill to enhance heat dissipation chip embedment and its manufacturing method TW523886B (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104332414A (en) * 2014-04-09 2015-02-04 珠海越亚封装基板技术股份有限公司 Embedded chip manufacture method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104332414A (en) * 2014-04-09 2015-02-04 珠海越亚封装基板技术股份有限公司 Embedded chip manufacture method
CN104332414B (en) * 2014-04-09 2017-08-29 珠海越亚封装基板技术股份有限公司 The manufacture method of embedded chip

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