TW474851B - Optimal slurry injecting device and method of chemical mechanical polishing - Google Patents
Optimal slurry injecting device and method of chemical mechanical polishing Download PDFInfo
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- TW474851B TW474851B TW89121361A TW89121361A TW474851B TW 474851 B TW474851 B TW 474851B TW 89121361 A TW89121361 A TW 89121361A TW 89121361 A TW89121361 A TW 89121361A TW 474851 B TW474851 B TW 474851B
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-:—--- 五、發明說明(!) 發明領域 本案係為一種研磨、凉、卞λ田 尤指一種化與嬙ρ 液/主入取佳化實施設備及其方法’ 備及其方法。 衣中之研磨液注入最佳化實施設 發明背景 二學行機:發研且磨已簡大稱二1 ^ ^ ^ 里使用的技術,因為可提供所謂的總 p十坦化而非現存 W坦化’尤其在半導;::(Spin 〇“lass)的局 大,線寬愈來愈小,又?=面,晶圓尺寸愈來愈 . ^ 又疋多層内連線(multi level = ) ’因此對於平坦化的需求或要求是愈 來愈嚴可了。而且以往常用的一些局部平坦化(l〇cai-: ---- 5. Description of the invention (!) Field of the invention The present invention relates to a grinding, cooling, and lambda field, and more particularly to a method for implementing and optimizing liquid / mainstream optimization, and a method therefor. . The implementation of the grinding fluid injection in clothing is optimized. Background of the Invention: The machine used in research and development has been briefly referred to as 2 1 ^ ^ ^, because it can provide the so-called total p ten tanization instead of the existing W "Frankization" is especially in semiconducting; :: (Spin 〇 "lass", the line width is getting smaller and smaller, again? = Surface, the wafer size is getting more and more. ^ Also multi-layer interconnect (multi level = ) 'Therefore, the requirements or requirements for flattening are becoming more and more stringent. And some local flattening (l0cai) commonly used in the past
PlanariZat,1〇n)_的技術也已不足以應付了。 依,…目4半導體業界之生產情況言,其化學機械研磨 (CMP )製程參數之没定多僅能參照原機械生產製造商所 提供之參考數據進行生纟;但是諸多製程參數(如晶圓的 尺寸、研磨塾轉速、研磨液注入位置、研磨液注入速率、 >研磨液性質及研磨墊性質等等〕皆有可能改變,若是仍逕 行依原機械生產製造商所提供之參考數據進行生產,則將 導致研磨速率下降、非均勻性提高、及研磨液與研磨墊耗 損增加,進而影響晶圓不良率增加,無形中造成技術提昇 及成本降低之瓶頸。 然而,化學機械研磨(CMP )製程所牽涉的流場相當複PlanariZat, 10n) technology is no longer sufficient. According to the production conditions of the 4th semiconductor industry, the chemical mechanical polishing (CMP) process parameters can only be determined by referring to the reference data provided by the original machine manufacturer; however, many process parameters (such as wafers) Dimensions, grinding wheel speed, polishing liquid injection position, polishing liquid injection rate, > polishing liquid properties, polishing pad properties, etc.] may be changed. If it is still produced according to the reference data provided by the original machine manufacturer , It will lead to a decrease in polishing rate, an increase in non-uniformity, and an increase in the consumption of polishing liquids and polishing pads, which will affect the increase in wafer defect rate, which will cause the bottleneck of technological improvement and cost reduction. However, the chemical mechanical polishing (CMP) process The flow field involved is quite complex
PD1914-- CMP.ptdPD1914-- CMP.ptd
五 說明(2) 發明 亲食,而 ^ 場了解=前業界對最簡化之兩偏心旋轉平面圓盤内之流 不多’更何况有研磨液流體特性及化學特性, 王衣面开:^a 起,再 ,史开晶圓表面形狀等諸多效應混合在一 機械研磨,^口機械研磨(CMP)實驗必須購買昂貴的化學 圓且不县)機台,除此之外亦需準備價值不菲的晶 的量训彳盖獲付。且所分析的研磨速率及均勻性,需要精密 僅價佶ί :如掃瞄式電子顯微鏡(SEM )及橢偏儀,不 貝值/p貴且使用上耗時不便。 驗與職研是,故*,申請人鑑於習知技術之缺失,乃經悉心試 學機w九,:,一本鍥而不捨之精神,終研發出本案之『化 及其方:: 研磨液注入最佳化實施設備 發明簡述 注量本下案上主 y要々目的係為以視流來觀測不同喷注位置和喷 二研磨塾上分佈的暫態變化,並找出較佳喷 材ίΐί ::不Π化ί”研磨(CMP)製程所需耗 磨連率及研磨灼勹:使用彳貝值卬貴的量測儀器即可求得研 !逑旱及研磨均勻性的變化趨勢。 ^ 本案之另一目的為提供一種卟 tr, 化學機械w磨製a中之研磨速率^求仔一半導體工業 勢,進而找出最佳之研磨均勾性的變化趨 里及〉主入點,其包括:一旋 PD19I4“ CMP.ptd 第5頁 '五、發明說明(3) 轉機台,甘 化學掬《 Γ上下叙轉之轉速係為可程式控制,用以進行一 磨製程之機台…影像拮取單元,可於該化學 機ί研磨製程之研磨過程中、拮取該研磨液之研磨影像; :衫像紀錄單元,係m錄並儲存該景彡像括取單元所拮 取之影像資料,並能輸出該影像資料;以及一數據處理單 Γ =分析由該影像紀錄單元所輸入之影像資 枓俾彳于一隶‘之研磨液注入量與注入點。 根據本案之構想,該旋鏟嫱A > + , ρι己人—亦與尺"|7紅夕乂電月包數值控制做位置控制,並 盤間不同間隙做準確之調整。 轉機台之大小轉 根據本案之構想,該旋轉機台之上下 拆換,且其迴轉轉速亦可藉由盔段 <尺寸可自由 根據本案之構想,該影像拮取單元係調整。 置,而該取像裝置係為一電子數位照相機括一取像裝 根據本案之構想,該影像拮取單元又 使影像清晰可見,其中該光源以一汞弧燈括:光源,以 根據本案之構想’該影像紀錄單元包枯、仏 # 一影像介面卡,該影像紀錄器用以 〜影像紀錄器 拮取單元所拮取之該影像資料,再透過i t儲存之該影像 該影像資料至該數據分析單元。 Μ衫像介面卡輸出 根據本案之構想,該數據處理單元係 軟體,用以分析該影像紀錄單元所輸入影像括;影像分析 的分佈,以利一電腦裝置之數據分析。 貝料之灰階度Five explanations (2) Invented pro-food, and ^ field understanding = the industry has not much flow in the most simplified two eccentric rotating plane discs, not to mention the fluid and chemical characteristics of abrasive fluids, Wang Yi noodles open: ^ a From then on, many effects such as the surface shape of Shi Kai wafers are mixed in a mechanical polishing, CMP mechanical polishing (CMP) experiment must purchase an expensive chemical circle and not count), in addition to the preparation of valuable crystals The amount of training cover was paid. And the analysis of the grinding rate and uniformity needs to be precise. Only price: such as scanning electron microscope (SEM) and ellipsometer, it is expensive, and it is time-consuming and inconvenient to use. The inspection and vocational research is, therefore *, in view of the lack of know-how, the applicant has carefully studied the machine w9 :, a spirit of perseverance, and finally developed the "chemical and its method of this case :: injection of abrasive fluid A brief description of the optimization of the implementation of the invention. The main purpose of this case is to observe the transient changes of the different injection positions and the distribution on the second grinding mill with the visual flow, and find out the better spray material. :: Do not use the "CMP" grinding process (CMP) process required wear rate and grinding burns: the use of expensive measuring equipment can be measured! Drought and grinding uniformity trends. ^ Another purpose of this case is to provide a grinding rate in the grinding of Tr, CMP, and a. ^ Find the potential of the semiconductor industry, and then find the best change in grinding uniformity and the main point of entry, which Including: one spin PD19I4 "CMP.ptd page 5 '5. Description of the invention (3) Rotary machine, Gan chemical 掬" Γ The rotation speed of up and down rotation is programmable and used for a grinding machine ... image The trapping unit can trap the polishing liquid during the grinding process of the chemical machine grinding process Grinding image;: shirt image recording unit, which records and stores the image data captured by the scene image capturing unit, and can output the image data; and a data processing sheet Γ = analysis by the image recording unit The input image data is used for the injection volume and injection point of a slurry. According to the concept of this case, the rotary shovel 嫱 A > +, ρι self-also-also with the scale " | 7 Hongxi 乂 electric monthly bag numerical control for position control, and different gaps between the discs to make accurate adjustments. The size of the turntable is changed according to the idea of this case, and the rotation speed of the turntable can be changed up and down, and its rotation speed can also be freely adjusted by the size of the helmet section. According to the idea of this case, the image capture unit is adjusted. The image capturing device is an electronic digital camera including an image capturing device. According to the idea of the present case, the image capturing unit makes the image clearly visible, wherein the light source is enclosed by a mercury arc lamp: Conceived that the image recording unit includes Ku, 卡 # an image interface card, the image recorder is used to ~ the image data captured by the image recorder capture unit, and then the image data stored by it to the data analysis unit. M-shirt image interface card output According to the idea of the present case, the data processing unit is software for analyzing the input image of the image recording unit, including the distribution of image analysis, to facilitate data analysis of a computer device. Gray scale
PD1914-- CMP.ptd 第6頁 474851 五、發明說明(4) 根據本案之構想,藉由胃 一晶圓與該旋轉機台上之研磨墊二的刀佈兩低可估算出 知該研磨速率。 S之研磨液的量,進而得 本案之又一目的A担/4+ m a w- ^ au 、 ’、 種化學機械研磨|ι』未口 + 磨液庄入最佳化方法,係 π说i耘中之 研磨製程中之一目標化學機械研::::=化學機械 及注入量最佳化方法,其步 σ研磨液注入位置 液注入參數,· (b)決定該複數“ 數個研磨 體計算出平均灰階度及:;::===由分析軟 械反應狀況係設定盥該目 :=位,該旋轉機台之機 狀況相同,且化學機械研磨(CMP)機台之 同於該目桿化戽嫱幵讲府,研磨液、及壤境因素皆 轉該化學機械研磨(CMP)機台者;⑷旋 之設定進行研磨作業;(e)待研磨作束1二二,參數 分析該研磨作章· m ^传研磨作業結束,硯察亚記錄 狀能資祖 業, 記錄之每一變因所對應之研磨 :最佳研磨狀態所制之變因“最佳之 g 多數,及(g)將該最佳之研磨液注入參數於該 目^機台上應用。 彖η本案之才冓想,㈣(a)戶斤14之複數個研磨液注入 入付番匕括一玻璃圓盤轉速、一研磨墊轉速、一研磨液注 置及一研磨液之注入量。 據本案之構想,步驟(b)所述之平均灰階度的高低可PD1914-- CMP.ptd Page 6 474851 V. Description of the invention (4) According to the concept of the case, the polishing rate can be estimated by the low of the knife cloth of the stomach one wafer and the polishing pad two of the rotary table. . The amount of the polishing liquid of S, thus obtaining another object of the present case, A load / 4 + ma w- ^ au, ', a kind of chemical mechanical polishing | ι 』口 + polishing liquid optimization method, π said i One of the objectives in the grinding process of Yunzhong Chemical Machinery Research ::: == Chemical machinery and injection volume optimization method, its step σ grinding fluid injection position fluid injection parameters, (b) determine the plurality of "a plurality of grinding bodies Calculate the average gray scale and:; :: === Set the item by analyzing the soft-mechanical reaction status: = bit, the machine condition of the rotary machine is the same, and the chemical mechanical polishing (CMP) machine is the same as The eyepiece is made into a lecture hall, and the grinding fluid and soil factors are all transferred to the chemical mechanical polishing (CMP) machine; the setting of the mediation is used to perform the grinding operation; (e) the to-be-milled bundle is 122, parameters Analyze the grinding chapter. After the grinding operation is completed, the Zhaya records can be used to support the ancestral industry. Each recorded change corresponds to the grinding: the factors produced by the best grinding state "the best g majority, and (G) Apply the optimal polishing liquid injection parameters on the machine.彖 η In the case of this case, (a) Injecting a plurality of grinding fluids into the household weight 14 includes a glass disc rotation speed, a grinding pad rotation speed, a grinding fluid injection, and a grinding fluid injection amount. According to the idea of this case, the average gray level described in step (b) may be high or low.
PD1914-- 第7頁 474851 五、發明說明(5) ‘估算出一晶圓與該研磨墊間之研磨液的量,進而得知研磨 速率。 根據本案之構想,步驟(e)所述係包括提供一光源,以 -使影像清晰可見,其中該光源以/汞弧燈為佳。 根據本案之構想,步驟(e)所述之方法又包括提供一取 像裝置進行該晶圓表面之研磨觀察益記錄分析。 根據本案之構想,該取像裝置為一電子數位照相機。 根據本案之構想,該取像裝置係以連續多次拮取研磨 液移動之影像。 根據本案之構想,為使該取像裝置所拮取之影像資料 更具可分析性,該取像裝置再以一影像紀錄單元高速紀錄 並儲存所拮取之影像資料、再以一較低速度輸出該影像資 料。 根據本案之構想,輸出該影像資料係由影像分析軟體 加以分析。 選取1 據個本/ %構Λ,該影像分析軟體係將輪出影像資料 個點,计异出此48個點的灰 k點的平均灰階值及非均勻性。進而求出此48個 本案得猎由下列阁- — 的瞭 解: 固不及貫施例說明,俾得一更深入 圖示說明PD1914-page 7 474851 V. Description of the invention (5) ‘Estimate the amount of polishing liquid between a wafer and the polishing pad, and then know the polishing rate. According to the idea of the present case, the step (e) includes providing a light source to make the image clearly visible, wherein the light source is preferably a mercury arc lamp. According to the idea of the present case, the method described in step (e) further includes providing an imaging device to perform a grinding observation record analysis of the wafer surface. According to the idea of the present case, the image capturing device is an electronic digital camera. According to the concept of the present case, the image capturing device captures images of the movement of the polishing liquid in multiple consecutive times. According to the idea of this case, in order to make the image data captured by the imaging device more analyzable, the image capturing device records and stores the captured image data at a high speed with an image recording unit, and then at a lower speed. Output the image data. According to the idea of this case, the output of the image data is analyzed by image analysis software. Selecting 1 basis /% structure Λ, the image analysis software system will round out the image data points, and calculate the average grayscale value and non-uniformity of the gray k points of these 48 points. Further to find the 48 cases, this case can be understood by the following cabinets-: Insufficient to implement the description of the examples, I got a deeper illustration
II
主入表佳化貫施設備示意圖。 ,亡圖:係為圓盤旋轉機台上之頂視圖。 第三圖:係為非均勻性隨晶圓旋轉速度變化關係圖。 圖號說明 11 :旋轉機台 I 1 2 :研磨墊 II 4 :定位控制平台 1 2 2 :取像裝置 1 4 :研磨液供給桶 111 :伺服馬達 11 3 :破璃圓盤 1 2 1 :光源 1 3 :電腦控制系統 1 41 :研磨液 實施列說明 °月《閱第圖。本案最佳實施例之化學機械研磨製程 中之=磨液注入最佳化實施設備示意圖。由第一圖可知本 案之最佳化實施設備包含一旋轉機台π、一影像拮取單元 (121、2 2 )、一影像紀錄單元與一數據處理單元,用以 求得一半導體工業化學機械研磨製程中之研磨速率及研磨 均勻性的變化趨勢,進而找出最佳之研磨液注入量及注入 點。旋轉機台1 1包括一伺服馬達丨丨i、一研磨墊J丨2、一玻 碑圓盤113與一定位控制平台114。該玻璃圓盤n3之上下 圓班尺寸可自由拆換,且其迴轉轉速亦可藉由無段變速自 SI系;= 用㈣服馬達⑴配合 电細數值控制做位置控制,並配合一精密光 474851 五、發明說明(7) 學尺監測Z軸之位置’以對該旋轉機台之大小轉盤間不同 間隙做準確之調整。而影像拮取單元(1 2 1、1 2 2 )包含一 光源1 2 1及一取像裝置1 2 2。該光源1 2 1係為一1. 5安培之汞 弧燈用於使影像清晰可見。該取像裝置1 2 2為一電子數位 照相機’用以擷取一整個晶圓表面之影像。該影像紀錄單 元,係用以紀錄並储存該電子數位照相機所拮取之影像資 料,並能輸出該影像資料,其包括一影像紀錄器及一影像 介面卡,該影像紀錄器用以紀錄並儲存該影像拮取單元所 丨取之該影像資料’再透過該影像介面卡輪出該影像資料 至該數據分析單元。該數據處理單元係包括一影像分析軟 體Op t i mas ’用以分析該影像紀錄單元所輸入影像資料之 灰階度的分佈,以利一電腦裝置1 3分析所輸入之影像資 料’進而獲得最佳之研磨液注入量與注入點。其中藉由該 灰階度的分佈高低可估算出該晶圓與該旋轉機台丨丨I之研 磨墊11 2間之研磨液的量,進而得知該研磨速率。 本案之化學機械研磨(CMP )製程中之研磨液注入最佳 化方法其步,如下所述。首先選定複數個研磨液注入參 進而決疋該複數個研磨液注入參數變化範圍,並於該 :注入參數變化範圍内由分析軟體〇州·計 以】=及非均性,利用該平均灰階值的高低估算 =曰曰=研磨塾112間之研磨液的量,進而 速革:將該破螭圓盤113置於該旋轉機台"之位置中 立方疋轉5亥方疋轉機台11,並依該複數個研磨、夜、主入失齡 設定進行研磨祚普丄 ^ π W及主入參數之 業。在研磨作業進行中,利用該1 · 5安培The main input table optimizes the schematic diagram of the equipment. , Dead picture: It is the top view on the disc rotating machine. The third figure: the relationship between non-uniformity and wafer rotation speed. Description of drawing number 11: Rotary table I 1 2: Polishing pad II 4: Positioning control platform 1 2 2: Imaging device 1 4: Polishing liquid supply barrel 111: Servo motor 11 3: Glass break disc 1 2 1: Light source 1 3: Computer control system 1 41: Description of the implementation list of polishing liquid ° Monthly "See the figure. In the chemical mechanical polishing process of the preferred embodiment of this case, the schematic diagram of the equipment for optimizing the grinding liquid injection is implemented. It can be seen from the first figure that the optimization implementation equipment of this case includes a rotating machine π, an image capturing unit (121, 2 2), an image recording unit, and a data processing unit for obtaining a semiconductor industry chemical machinery. The changing trend of the polishing rate and polishing uniformity during the polishing process, and then find the optimal injection volume and injection point of the polishing liquid. The rotating machine 11 includes a servo motor 丨 丨 i, a polishing pad J 丨 2, a glass tablet disc 113, and a positioning control platform 114. The size of the upper and lower shifts of the glass disc n3 can be changed freely, and its rotation speed can also be adjusted from the SI system by stepless speed change. = Position control is performed by using a servo motor and electric fine numerical control, and a precision light 474851 V. Description of the invention (7) The school scale monitors the position of the Z-axis' to accurately adjust the different gaps between the rotary tables and the rotary tables. The image capturing unit (1 2 1, 1 2 2) includes a light source 1 2 1 and an image capturing device 1 2 2. The light source 1 2 1 is a 1.5 amp mercury arc lamp used to make the image clearly visible. The image capturing device 12 is an electronic digital camera 'for capturing an image of the entire wafer surface. The image recording unit is used to record and store image data captured by the electronic digital camera and can output the image data. The image recording unit includes an image recorder and an image interface card. The image recorder is used to record and store the image data. The image data obtained by the image capturing unit is used to output the image data to the data analysis unit through the image interface card. The data processing unit includes an image analysis software Op ti mas 'for analyzing the distribution of the gray level of the image data input by the image recording unit, so that a computer device 13 can analyze the input image data' to obtain the best The amount of polishing liquid and the injection point. The amount of polishing liquid between the wafer and the polishing pad 112 of the rotating machine 丨 I can be estimated by the distribution of the gray level, and the polishing rate can be obtained. The steps of the polishing liquid injection optimization method in the chemical mechanical polishing (CMP) process of this case are as follows. First, select a plurality of polishing liquid injection parameters and then determine the variation range of the plurality of polishing liquid injection parameters, and within the range of the injection parameter changes, the analysis software 0 state and count] = and non-uniformity, using the average gray scale Estimation of the value of the value = said = the amount of the grinding liquid between the grinding machine 112, and then speed up: the breaking disk 113 is placed on the rotary machine " , And according to the multiple settings of grinding, night, and main entry age, grinding 祚 祚 π π W and main entry parameters. During the grinding operation, use this 1.5 amps
4/4851 五、發明說明(8) 之呆弧燈1 21照射於該 使該電子數位照相機^ 22 ^盤11 3表面使影像清晰可見。 研磨液移動之影像,、績多次揭取該玻璃圓盤〗1 3表面 所拮取之影像資料、 ^。亥衫像紀錄單元高速紀錄並錯存 由一影像分析軟髀蔣於lx—較低速度輸出該影像資料,經 48個點的灰階值,谁^ 影像資料選取48個點,計算出此 勻性。依所記錚十一=出此48個點的平均灰階值及非均 一最佳研磨狀離::變因所對應之研磨狀態資料,選定 數。並將該最:之研因組為最佳之研磨液注入參 直中兮福/: / 入參數於該目標機台上應用。 研磨墊轉速、一研麻、、± 马破璃圓盤轉速、一 ,研廇液主入位置與一研磨液之注入量。至 μ化子機械研磨(CMP )裝置在嗜韓般卜可日μ L々 =:磨墊η2而研磨液採用市售的隨心可貼上各 機,…視圖,玻璃圓盤用二晶圓: 干之卜5位“ 方肖),而注入位置如第二圖所4/4851 V. Description of the invention (8): The arc lamp 1 21 illuminates the surface of the electronic digital camera ^ 22 ^ disc 11 3 so that the image is clearly visible. The image of the polishing liquid is moved to extract the image data of the glass disc for several times. The high-speed recording unit of the Haishan image records and strays it. An image analysis software, Jiang Yulx, outputs the image data at a lower speed. After 48 points of grayscale value, who ^ selects 48 points from the image data and calculates the uniformity. Sex. According to the record 铮 11 = the average gray scale value and the non-uniformity of the optimal grinding state of the 48 points :: select the number of the grinding state data corresponding to the variable. And inject the best grinding solution of the best research group into the parameters of the straightforward Xifu /: / and apply the parameters on the target machine. Rotating speed of polishing pad, one grinding hemp, ± rotation speed of Ma Poli disc, one main position of grinding liquid, and one injection amount of grinding liquid. The μ CMP mechanical polishing (CMP) device is in a Korean-like manner, and it can be used for μ L々 =: grinding pad η2 and the polishing liquid is commercially available and can be attached to each machine, ... view, two wafers for glass discs: The 5th position of the "God of Confucius", and the injection position is as shown in the second picture
^丄5位置上。並利用該電荷藕合裝置122 (CCD ”:位為整個晶圓表面)’並配合該影像拮取單元將以 ===驗影像傳送至營光幕上以作監測,使實驗進 狀 悲能夠快速且正確掌握,並且藉由該影像處理單一^ 丄 5 position. And use the charge coupling device 122 (CCD ": located on the entire wafer surface) 'and cooperate with the image capture unit to send the === inspection image to the camp light curtain for monitoring, so that the experiment can be carried out. Quick and correct grasp, and with this image processing unit
流場觀測。其中該化學機械研磨(CMP )裝置之機σ JT 狀況設定與—目標化學機械研磨(CMp )機台之狀=心 同’且其使用之研磨液141、研磨墊112及環境因素兄比^目斑目 標化學機械研磨(CMP )機台之實際運用狀況相同、。白” 474851 五、發明說明(9) 為了由該電荷藕合裝置丨22 (CCD )影像圖得到半量化 (semi-quantitative)的結果,而採用灰階度(GrayObservation of the flow field. The σ JT condition setting of the chemical mechanical polishing (CMP) device is the same as the shape of the target chemical mechanical polishing (CMp) machine = the same heart, and the polishing liquid 141, polishing pad 112, and environmental factors used by it are compared. Spot target chemical mechanical polishing (CMP) machine has the same actual application status. White "474851 V. Description of the invention (9) In order to obtain a semi-quantitative result from the image of the charge coupling device 22 (CCD), a gray scale (Gray
Scale )方法,即將該電荷藕合裝置122 (CCD )影像圖由 該影像擷取軟體Opt imas處理,將圖形予以灰階化後便可 計算出該研磨液141在該研磨墊112與該晶圓間隙内之灰階 度的分佈圖,進而計算出其平均值,由於該研磨液141含 粒子經由該影像擷取軟體Opt imas處理後粒子可視為流體 f點而流體粒子多募可反應出灰階度,灰階度的高低可估 彳j算出為進入晶圓與研磨墊間之研磨液的量,由於研磨液含 研磨粒子所以進入晶圓與研磨墊間之研磨液的量與研磨 速率有關,而灰階度的高低即與研磨速率的高低有關示代 表研磨結果之非均勻性。而本文分析之化學機械研磨 (CMP)裝置有四個不同輸入因素分別為研磨墊轉速 (PS)、研磨液注入位置(1?)、晶圓轉速(ws)、研磨 量流率(M F )。 、 所謂灰階度方法即數位影像處理(Dlgital Image Pj 〇 c e s s i n g),數位影像處理乃經由該取像裝置1 2 2 (電荷 』:扁置(CCD )) ’將圖片影像傳至該影像介面卡,該影 "面卡再將所取之影像,依明暗程度之不同,加以數位 =由數位化之影像乃由許多不同明暗程度之亮點所組 ,為像素(pixel),每一像素均有其固定的座標位 俞多(灰)度值(Gray Scale)。在同一晝面上的像素 二 /、解析度就愈高。8位元灰度(8-bit Gray )影像 焭度值的範圍為〇至25 5 ’ 〇表示最暗,2 5 5表示最亮,共有Scale) method, that is, the image of the charge coupling device 122 (CCD) is processed by the image capturing software Opt imas, and the graphics can be gray-scaled to calculate the polishing liquid 141 on the polishing pad 112 and the wafer. The distribution map of the gray level in the gap, and then calculate the average value. Because the grinding fluid 141 contains particles processed by the image capture software Opt imas, the particles can be regarded as fluid f points, and the fluid particles can be collected to reflect the gray level. Can be estimated as the amount of polishing liquid entering between the wafer and the polishing pad. Since the polishing liquid contains abrasive particles, the amount of polishing liquid entering between the wafer and the polishing pad is related to the polishing rate. The gray level is related to the grinding rate, which indicates the non-uniformity of the grinding results. The chemical mechanical polishing (CMP) device analyzed in this paper has four different input factors: polishing pad rotation speed (PS), polishing liquid injection position (1?), Wafer rotation speed (ws), and polishing volume flow rate (M F). The so-called gray-scale method is digital image processing (Dlgital Image Pjoccessing). The digital image processing is through the imaging device 1 2 2 (charge): flat (CCD)) 'to transfer the image image to the image interface card. The video " face card will then digitize the images taken according to the difference in lightness and darkness = the digitized image is composed of many bright points of different lightness and darkness, and each pixel has a pixel Its fixed coordinate position is Gray scale. The higher the resolution of the pixels on the same day, the higher the resolution. 8-bit Gray (8-bit Gray) image The range of the luminance value is 0 to 25 5 ’〇 means the darkest, 2 5 5 means the brightest, total
PD1914-- CMP.ptd 第12頁 474851 五、發明說明(10) 2 5 6種表示不同深淺亮度的亮度值。最後將上述已經數位 化的影像數據送至電腦由該影像擷取軟體Op t i mas處理加 以分析、運算及處理。 數位化後的影像,可由該影像擷取軟體〇pt imas依其像 素的明暗程度,作亮度分析統計圖(Image Histogram), 由統计圖上灰階(明亮度)的分析,然後選取整個晶圓表面 所,^階的範圍(Thresh〇ld) ’使整個晶圓表面的影像與 其背景呈現強烈的對比,再選取晶圓上欲分析位置的點, 作進一步的分析、運算及處理。請參閱第三圖,即為依上 述1法分析所得晶圓轉速與非均勻度關係之具體實施例。 綜合上述圖解及說明’吾人可發現,本案藉由一低成 本之流場模擬實驗裝置’模擬化學機械研磨(CMp )之物 理特性進而提供一種化學機械研磨( CMp )研磨液注入之 最佳方法及設備,為前所未有之創作,是故具新穎性。此 外,本案提出之設備技術特徵在於應用視流觀測研磨液之 分佈變化,並利用影像處理技術能真實反應研磨移除率與 非均勻度之特性,找出較佳喷注位置及喷注量並可提高研 =率:均勾'味,是故具進步性。在則,本案提出之方法 可用於半導體晶圓研磨,是故具產業利隸。♦符合 專㈣定’爰依法提出申請’謹請γ局惠 於核准。 本案得由熟悉本技藝之人士任施 然皆不脫如附申請專利範圍所欲保護者。·、'、=身又修PD1914-- CMP.ptd Page 12 474851 V. Description of the invention (10) 2 5 6 kinds of brightness values representing different shades. Finally, the digitized image data is sent to a computer for processing, analysis, calculation, and processing by the image acquisition software Op t mas. The digitized image can be obtained by the image capture software 〇pt imas according to the lightness and darkness of its pixels to make a brightness analysis statistical image (Image Histogram), and analyze the gray scale (brightness) on the statistical image, and then select the entire crystal The surface of the round surface, ^ order range (Thresh〇ld) 'makes the entire wafer surface image and its background show a strong contrast, and then select the point on the wafer to analyze the position for further analysis, calculation and processing. Please refer to the third figure, which is a specific example of the relationship between the wafer rotation speed and the non-uniformity obtained according to the method 1 described above. Based on the above illustrations and explanations, “I can find that this case uses a low-cost flow field simulation experimental device” to simulate the physical characteristics of chemical mechanical polishing (CMp) and then provide an optimal method for chemical mechanical polishing (CMp) polishing solution injection and The equipment is an unprecedented creation and is therefore novel. In addition, the technical features of the equipment proposed in this case are to observe the changes in the distribution of the grinding fluid using visual flow, and use the image processing technology to truly reflect the characteristics of the removal rate and non-uniformity of the grinding, to find the better injection location and injection volume. Can improve the research = rate: uniform taste, is therefore progressive. In this case, the method proposed in this case can be used for polishing semiconductor wafers, and is therefore an industry leader. ♦ Conform to the specific decision ‘Issue an application according to law’ and I would like to ask the Bureau to approve it. Any person familiar with the art can use this case as a matter of course. ·, ', = Body and practice
PD1914-- CMP.ptd 第13頁PD1914-- CMP.ptd Page 13
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