TW452954B - Manufacturing method of multi-chip module - Google Patents

Manufacturing method of multi-chip module Download PDF

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TW452954B
TW452954B TW089110207A TW89110207A TW452954B TW 452954 B TW452954 B TW 452954B TW 089110207 A TW089110207 A TW 089110207A TW 89110207 A TW89110207 A TW 89110207A TW 452954 B TW452954 B TW 452954B
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Taiwan
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wafer
bonding
chip
conductive bump
pad
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TW089110207A
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English (en)
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Ching-Huei Su
Kuo-Pin Yang
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Advanced Semiconductor Eng
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
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    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48135Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/48145Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
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    • H01L2224/42Wire connectors; Manufacturing methods related thereto
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    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48465Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
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    • H01L2224/484Connecting portions
    • H01L2224/4847Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond
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    • H01L2224/42Wire connectors; Manufacturing methods related thereto
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    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48475Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball
    • H01L2224/48476Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area
    • H01L2224/48477Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area being a pre-ball (i.e. a ball formed by capillary bonding)
    • H01L2224/48478Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area being a pre-ball (i.e. a ball formed by capillary bonding) the connecting portion being a wedge bond, i.e. wedge on pre-ball
    • H01L2224/48479Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area being a pre-ball (i.e. a ball formed by capillary bonding) the connecting portion being a wedge bond, i.e. wedge on pre-ball on the semiconductor or solid-state body
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    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48475Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball
    • H01L2224/48476Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area
    • H01L2224/48477Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area being a pre-ball (i.e. a ball formed by capillary bonding)
    • H01L2224/48478Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area being a pre-ball (i.e. a ball formed by capillary bonding) the connecting portion being a wedge bond, i.e. wedge on pre-ball
    • H01L2224/4848Connecting portions connected to auxiliary connecting means on the bonding areas, e.g. pre-ball, wedge-on-ball, ball-on-ball between the wire connector and the bonding area being a pre-ball (i.e. a ball formed by capillary bonding) the connecting portion being a wedge bond, i.e. wedge on pre-ball outside the semiconductor or solid-state body
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    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/494Connecting portions
    • H01L2224/4941Connecting portions the connecting portions being stacked
    • H01L2224/49429Wedge and ball bonds
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    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
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    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

Description

4 5 2 9 5 4___ 五、發明說明(1) 發明領域: 本發明係有關於一種多晶片封裝構造(mul t i - chip module, MCM)製造方法,特別有關於一種晶片堆叠式多晶 片封裝構造製造方法。 先前技術: 由於電子產品越來越輕薄短小,使得用以保護半導體晶 片以及提供外部電路連接的封裝構造也同樣需要輕薄短小 化。 隨著微小化以及高運作速度需求的增加,多晶片封裝構 造在許多電子裝置越來越吸引人。多晶片封裝構造可藉由 將兩個或兩個以上之晶月組合在單一封裝構造中,來使系 統運作速度之限制最小化。此外,多晶片封裝構造可減少 晶片間銲線路之長度而降低訊號延遲以及存取時間。 最常見的多晶片封裝構造為並排式(side-by-side)多晶 片封裝構造,其係將兩個以上之晶片彼此並排地安裝於一 共同基板之主要安裝面。晶片與共同基板上導電線路間之 連接一般係藉由線銲法(wire bonding)達成。然而排 式多晶片封裝構造之缺點為封裝效率太低,因為該共一同基 板之面積會隨著晶#數目的增加而增加。 因此,半導體封裝業界發展出堆疊晶片封裝構造100, 其包含兩個彼此堆疊之晶片110、130 (如第一圖所示)。 該晶片110係利用一膠層112固著於一基板150之上表面。 該晶片1 1 0、1 3 0間設有一膠層1 3 2。該晶片1 1 0、1 3 0分別 利用銲線(b ο n d i n g w i r e ) 11 4、1 3 4電性連接至該基板〗5 0
C:\ 二蟓條 4 說明書\POO-OW. ptd 第5頁 4 5 2 9 5 4 五、發明說明(2) 上表面之複數個晶片連接墊152。該基板丨50之下表面設有, 複數個錫球銲塾1 54 ’其係電性連接至該基板丨5〇之上表面 之複數個晶片連接墊152。該每一錫球銲墊丨54設有一錫球-156用以與外界電性溝通。該晶片11{}、13〇,銲線114、 134以及該基板150上表面之一部分係為一封膠體16〇包 覆。該膠層112、132 —般係以熱固性環氧材料 (thermosetting epoxy material)製成。 習知在晶片銲墊與基板銲墊間形成銲線連接(wire interconnection)之打線技術一般係包含(a)球接合(baH bond)於晶片銲墊,(b )形成線弧於晶片銲墊與基板銲墊 間以及(c)壓印接合(stitch bond)至基板銲墊而完成該 銲線連接。請參照第二圖以及第十二圖,美國專利第 5735030號揭示另一打線方法其包含一開始先形成一突起 (pr〇tuberanCe) 2 0 0於晶片銲墊210上,其係藉由先球銲 (ball bond)導電銲線之一端於於該晶片銲墊2丨〇上然後 在緊接該銲球端之位置’壓印(stitch bond)該銲線於該 球銲端使得該球銲部以及壓印部一起形成該突起2 〇 〇 ^ 第十二圖所示)。然後,使用球銲工具(bal i fc〇ndini^: tool)將銲線22Q之一端以球接合方式銲接於基板銲墊 230,然後以壓印接合方式將另一端銲接至晶片銲墊21〇 的導電突起20ϋ (如第二圖所示)。 t 係 一般而言’晶片1 1 〇、1 3 0上真有相同功能之銲墊較佳 電性連接至同一基板銲墊’以減少基板所需之銲墊數量 藉此降低基板線路佈局之複雜度。 ~
C Λ二緣條磷说_書\卩〇〇“〇玆.ptd 第6頁 4 日修正/更正/補充 _案號891丨ΠΡΠ7 a 五、發明耽明(3) 美國專利第5328079號揭示一用以形成晶片至晶片連接 (die-to-die connection)之打線技術。如第三圖所示, 其係先使用球銲工具(未示於圓中)形成一突起2〇〇於晶 片銲墊l〗0a »之後,使用同一工具,將銲線17〇之一端球 接合至晶片銲墊130a,再將其另一端壓印接合至該突起 200。其中該突起2〇〇係有助於防止晶片丨1〇被球銲工具損 傷。然而當銲線170之一端壓印接合至晶片銲墊丨1〇a上的 導電突起200後’其所形成之連接構造係大致呈水平狀, 因此不管是使用前述之習用打線技術或美國專利第 5 73 5030號揭示之打線方法來連接晶片銲墊11〇3以及基板 輝墊152 ’其所使用之球銲工具必然會影響該銲線ί7〇之線 弧,甚至導致其扭曲移位而影響最後製得封裝構造之可靠 發明概要: 因此,本發明之主要目的係提供一種多晶片封裝構造 造方法’其可將兩個分別位於兩堆疊晶片上功能相同之 墊’利用習用之球銲工具將其電性連接至同—基板鲜塾 (contact pad),而不會降低該多晶片封跋構造之可靠u 根據本發明第一較佳實施例之多晶片封裴構造製造方 法’其包含下列步驟:(a)固定一第一晶片至—用以 晶片之裝置表面,該用以承載晶片之裝置具有一用以$ ‘界形成電性連接之構造;(b)固定一第二晶片至該第」曰 片之正面;(c)形成至少一個導電凸塊,其具有基部以^ P00-052.ptc 第7頁 45295 4 五、發明說明(4) 柱狀突出部,該凸塊以其基部接合於第一晶片之複數個晶 片銲墊之一;(d) 以球接合方式連接一第一銲線之一端於 該第二晶片之複數個晶片銲墊之一,然後以壓印接合方式 連接其另一端至第一晶片銲墊上導電凸塊之基部,其中該 導電凸塊之柱狀突出部係仍大致保持完整;及(e ) 連接一 第二銲線至該第一晶片銲墊上之導電凸塊以及該用以與外 界形成電性連接之構造。在步驟(d)中,當該第一銲線之 —端壓印接合至該第一晶片銲墊上導電凸塊之基部後,其 所形成之連接構造係具有一柱狀突出部。因此,在步驛 (e) 中,當該第二銲線連接至該第一晶片銲墊上之導電凸 塊時,該柱狀突出部係可有效降低所使用之球銲工具對該 第一銲線線弧之影響。 根據本發明第二較佳實施例之多晶片封裝構造製造方 法,其包含下列步驟:(a)固定一第一晶片至一用以承載 晶片之裝置表面,該用以承載晶片之裝置具有一用以與外 界形成電性連接之構造;(b )固定一第二晶片至該第p畢 片之正面;(c)形成至少一個導電凸塊,其具有基部$及 柱狀突出部,該凸塊以其基部接合於第一晶片之複數’個晶 片銲墊之一;(d)形成至少一個導電突起於該第二晶片之 複數個晶片銲墊之一;(e) 以球接合方式連接一第一銲線 之一端於該用以與外界形成電性連接之構造,然後以壓印 接合方式連接其另一端至第一晶片銲墊上導電凸塊之基 部,其中該導電凸塊之柱狀突出部係仍大致保持完整;及 (f) 在形成該第一銲線之後,以球接合方式連接一第二鮮
C: \二雏條瑪坑明書\POO-OK. Ptd 第8頁 45 295 4 五、發明說明(5) 線之一端於該第一晶片銲墊上之導電凸塊’然後以壓印接 合方式連接其另一端至該第二晶片銲墊上之導電突起。在 旁驟(f)中,當該第二銲線連接至該第一晶片銲墊上之導-電凸塊時,該柱狀突出部係可有效降低所使用之球鲜工具 對該第一銲線線弧之影響《此外,根據本發明第二較佳^ 施例之方法製得之封裝構造,由於其第二銲線具有極低之 弧高(約2密爾)’因此允許較低之封襞構造厚度,藉此 提昇封裝效率。 發明說明: 第四圖至第七圖揭示根據本發明第一較佳實施例之多晶 片封裝構造製造方法。 第四圖揭示晶片310利用一膠層312固著於一基板330之 表面。該膠層312係先以點膠的方式塗佈在該基板330之表 面,然後該晶片3 1 0再以習用之自動貼晶片製程(ch i ρ attachment )貼上。在加熱硬化該膠層31 2後,將晶片320 利用一膠層322固著於一該晶片310之正面,其詳細_大 致類同於前。可以理解的,該膠層312亦可先加熱使 足以固定該晶片310但不變硬(cured)。然後,該膠層 312、322再一起加熱硬化。 然後利用習用之球銲工具(ba 1丨.bon.d _i ng too Π形成複 數個導電凸塊3 5 0於晶片310之晶片銲墊310a。該導電凸塊 3 50之特徵在於其具有基部350a以及柱狀突出部350b並且 該凸塊350係以其基部350a接合於晶片銲墊310a。有關於 該凸塊之形成技術細節請參照民國八十八年六月三十日申
第9頁 45295 4 五、發明說明(6) 請之中華民國第8 8 1 1 1 2 28號專利申請案。 可以理解的是,該兩個分別位於兩堆疊晶片上功能相同 之銲墊310a、320a可以是兩接地墊(ground pad)或是兩相' 同電壓之電源塾(power pad)。 根據本發明之基板3 3 0具有一用以與外界形成電性連接 之構造,其一般包、含複數條導電線'路(c ο n d u c t i v e t r a c e)
3 3 0a。該基板330可由玻璃纖雉強化BT (bismaleimide-triazine)樹脂,或FR-4玻璃纖維強化環 氧樹脂(fiberglass rein forced epoxy res i n )製成之蕊 層(core layer)形成。此外,該基板330亦可以是一陶-亮 基板(ceramic substrate)。可以理解的是該基板330亦可 以一導線架(lead fra me)取代。該導線架一般係包含複數 條導線且具有内腳部分(inner lead portion)以及外腳部 分(outer lead portion),其中該内腳部分係用以電性連 接至一晶片,該外腳部分係用以與外界電性連接。該膠層 312、322 —般係以.熱固性環氧材料^thermosetting epQ_xy material)製成例如環氧樹脂(epoxy resin)、碎;: (silicone)或聚醯胺(polyamide)。 、 請參照第五圖,該銲線3 6 0之一端係利用球銲工具以球 接合方式銲接於該晶片320之晶片銲垫320a,其另一端係 以壓印接合方式銲接至晶片銲墊3 1 0 a上導電凸塊3 5 0之基 部350a。值得注意的是,該導電凸塊350之柱狀突出部 350b係仍大致保持完整(參見第十一圖)。 第六圖以及第七圖係用以說明在導電凸塊350與導電引
c:\工雎條磷《蜱 «ΛΡ00-052. ptd 第10頁 452954_ 五、發明說明(7) 線330a間形成錄線連接(wire interconnection)的兩種不. 同方式。 請參照第六圓’該銲線3 7 0之一端係利用球銲工具以球. 接合方式鲜接於該晶片銲墊310a上之導電凸塊350,其另 一端係以壓印接合方式辞接至基板330之導電引線330a。 在此實施例中’該球銲工具係先接觸該導電凸塊3 5 〇之柱 狀突出部3 5 0 b (參照第九圖),然後造行球接合,藉此可 有效降低該球銲工具對銲線3 6 〇線弧之影響。值得注意的 是’該銲線3 7 0必須在銲線3 6 〇之後形成。 請參照第七圖,該銲線3 8 〇之一端係利用球銲工具以球 接合方式銲接於基板33〇之導電引線33 〇a,其另一端係以 Λ接^ f式銲接至該晶片銲塾3 1〇a上導電凸塊350之基 邛3 5 a。在此實施例中,該導電凸塊3 5 〇之柱狀突出部 ^ Z b可^在μ·球銲工具進行壓印接合時保護已形成之銲線 3 6 0,藉此可有效降低該球銲工具對銲線36〇線弧之影響。 Π::。是’該銲線380亦可在銲線360之前形成。此 外,該知線380較佳係彎曲而大致形成一直角。 十圖揭示根據本發明第二較佳實施例智多晶 月封瑕構造製造方法。 β 1 參^第》八圖,該晶片3 1 〇 ' 3 2 〇係以堆疊方式設於該基 ,該^電凸塊35()係以其基部35〇3接合於晶片銲墊 法亦3同^詳細製裎大致類同於前述。該銲線380之形成方 第九囷揭不—導電突起(Protuberance)390形成於該晶
45295 4 五、發明說明(8)^ " " "*— ------ 片3 2 0之晶片銲墊32〇a。該導電突起可利用美國專利第 5735030號揭示之打線方法形成。此外,該導電突起3 9()亦 可為一導電凸塊取代,該導電凸塊可利用民國八十八年六 月三十日申請之中華民國第8 8 1 1 1 228號專利申請案,或民 國=十八t十一月九日申請之中華民國第881〗9267號專利 申清案揭示之技術形成》可以理解的是,該導電突起 亦可與該導電凸塊3 5 0於同·-步驟中形成。 請參照第十圖,該銲線4〇〇之一端係利用球銲工具以球 接合方式銲接於晶片銲墊31〇a上之導電凸塊,其另一 端係以壓印接合方式銲接至晶片銲墊32〇 &上之導電突起 3 9 0。在此實施例中,該球銲工具係先接觸該導電凸塊3 5 〇 之柱狀突出部3 5 0 b (參照第九圖),然後進行球接合,藉 此可有效降低該球銲工具對銲線38〇線弧之影響。值得注 意的是,該銲線400必須在銲線38〇之後形成。 低之封裝構造厚度,藉此提昇封裝效率 可以理解的是,該兩堆疊晶片上之其他銲墊(例如輸入 /輸出墊v i〇 p a d))写以利用習用之打線技街分別連接至 基扳之導電線路。此外,第六圖、第七圈或第十囷之裝置 (assembly)較佳係以適當之封勝材料密封。該封膠製程一 般係利用習知的鑄模方法,例如轉注成形法(t r a n s f e『 molding);其係藉由將第六圖、第七圖或第十圖之裝置置 於一模具之膜穴内,然後將封膠塑料填滿該膜穴而達成。 根據本發明第二較佳實施例之方法製得之封裝構造,由 於其第線具有極低之弧高(約2密爾),因此允許較匿
C Λ A鳞條磷扰明書\P00-O52. ptd 第12頁 4 5 2 9 5 4 五、發明說明(9) 請參照第十一圖以及第十二圖,根據美國專利第5 73 5 0 3 0 號揭示之打線方法,當銲線220之一端壓印接合至晶片銲 墊2 10上的導電突起2 00後,其所形成之連接構造係大致呈 水平狀,因而銲線2 2 0之線弧易受打線工具之影響。相對 地,根據本赛明,當銲線360芝二端壓印接合至晶片銲墊 310上的導電凸塊350後,其所形成之連接構造具有一柱狀 突出部3 5 0 b,藉此提供打線工具所需之緩衝墊 (cushion)。 综上所述,根據本發明之多晶月封裝構造製造方法,其 可將兩個分別位於兩堆疊晶片上功能相同之銲墊,利用習 用之球銲工具將其電性連接至同一基板銲墊(contact pad ),而不會降低該多晶片封裝構造之可靠性。 雖然本發明已以前述較佳實施例揭示,然其並非用以限 定本發明,任何熟習此技藝者,在不脫離本發明之精神和 範圍内,當可作各種之更動與修改》因此本發明之保護範 圍當視後附之申請專利範圍所界定者為準。
〇\二濰條碘耽明書\PG0-052. ptd 第13頁 4 5 2 9 5 4_______ 圊式簡單說明 圖示說明: 為了讓本發明之上述和其他目的、特徵、和優點能更明 顯,下文特舉本發明較佳實施例,並配合所附圖示,作詳 細說明如下。 第1圖:習知多晶片封裝構造之剖面圖; 第2圖:其係用以說明美國專利第5 7 3 5 0 3 0號揭示之打 線方法; 第3圖:其係用以說明美國專利第5328079號揭示之用 以形成晶>5至晶片連接之打線技術。; 第4圖至第7圖:其係用以說明根據本發明第一較佳實 施例之多晶片封裝構造製造方法: 第8圖至第10圖:其係用以說明根據本發明第二較佳 實施例之多晶片封裝構造製造方法; 第1 1圖:其係為一放大立體圖用以說明根據本發明之 導電凸塊,以及一銲線以一端壓印接合於另一凸塊;及 第1 2圊:其係為一放大立體圖用以說明根據美國專利 第5735030號揭示之導電突起,以及一銲線以一端壓印接 合於另一突起。 圖號說明: 100 堆 疊 晶 片 封 裝構造 110 晶 片 1 10a 晶 片 銲 塾 112 膠 層 114 銲 線 I 30 晶 Ά i 3 ua 晶 片 132 膠 層 134 銲 線 150 基 板 152 晶 片 連 接 墊 154 錫 球 銲 墊 156 錫 球
C:\二鎿條磷說《書、Ρ00-052. ptd 第14頁 45295 4 圊式簡單說明 160 封膠體 170 銲線 200 突起 210 晶片銲墊 220 銲 線 230 基板銲墊 310 晶片 310a 晶 片 銲 墊 312 膠層 320 晶片 3 2 0 a 晶 片 銲 墊 322 膠層 330 基板 33 0a 導 電 引 線 350 導電凸塊 3 5 0 a 基部 3 5 0 b 柱 狀 突 出部 360 銲線 370 銲線 380 銲 線 390 導電突起 400 銲線
C:\二蠘嫌嶙优明ί\Ρ00-052. ptd 第15頁

Claims (1)

  1. 45295 4 六、申請專利範圍 1 、一種多晶片封裝構造製造方法,其包含下列步驟: 固定一第一晶片至一用以承載晶片之裝置表面,該第 一晶片具有複數個晶片銲墊設於其正面,該用以承載晶片― 之裝置具有一用以與外界肜成電性連接之構造;固定一第 二晶片至該第一晶片之正面,該第二晶片具有複數個晶片 銲墊設於其正面; 形成至少一個導電凸塊,其具有基部以及柱狀突出 部,該凸塊以其基部接合於第一晶片之複數個晶片銲墊之 —; 以球接合方式連接一第一銲線之一端於該第二晶片之 複數個晶片銲墊之一,然後以壓印接合方式連接其另一端 至第一晶片銲墊上導電凸塊之基部,其中該導電凸塊之柱 狀突出部係仍大致保持完整;及 連接一第二銲線至該第一晶片銲墊上之導電凸塊以及 該用以與外界形成電性連接之構造。 2、 依申請專利範圍第1項之多晶片封裝構造製造方法,其 中,在形成該第一銲線之後,該第二銲線之一端係以球接μ _ 舍方式連接於該第一晶片銲垫上之導電凸塊,然後其另一 端係以壓印接合方式連接於該用以與外界形成電性連接之 構造。 3、 依申諳專利範圍第1項之多晶片封裝構造製造方法,其 中該第二銲線之一端係以球接合方式連接於該用以與外界 形成電性連接之構造,然後其另一端係以壓印接合方式連
    C: \二離條嶋珑明書\FOO-052. pt<J 第16頁 45 295 4 六、申請專利範圍 接於該第一晶片銲墊上導電凸塊之基部。 4、 依申請專利範圍第1項、第2項或第3項之多晶片封裝構 造製造方法,其另包含包覆該第一、第二晶片,該第一、 第二銲線以及該用以承載晶片之裝置表面的一部分於一封 膠體内之步驟。 5、 依申請專利範圍第1項、第2項或第3項之多晶片封裝構 造製造方法,其中該用以承載晶片之裝置係為一基板或一 導線架。 6、 一種多晶片封裝構造奴造万法,其包含下列步驟: 固定一第一晶片至一用以承載晶片之裝置表面,該第 一晶片具有複數個晶片銲墊設於其正面,該用以承載晶片 之裝置具有一用以與外界形成電性連接之構造: 固定一第二晶片至該第一晶片之正面,該第二晶片具 有複數個晶片銲墊設於其正面;
    形成至少一個導電凸塊,其具有基部以及柱狀突出 部,該凸塊以其基部接合於第一晶片之複數個晶只銲墊之 形成至少一個導電突起於該第二晶片之複數個晶片銲 墊之一; 以球接合方式連接一第一銲線之一端於該用以與外界 形成電性連接之構造,然後以壓印接合方式連接其另一端 至第一晶片銲墊上導電凸塊之基部,其中該導電凸塊之柱
    CA二鎿條磉优明書\POO-OH. ptd 第17頁 45 295 4 六、申請專利範圍 狀突出部係仍大致保持完整;及 在形成該第一銲線之後,以球接合方式連接一第二銲 線之一端於該第一晶片銲墊上之導電凸塊,然後以壓印接' 合方式連接其另一端至該第二晶片銲墊上之導電突起。 7、 依申請專利範圍第6項之多晶片封裝構造製造方法,其 另包含包覆該第一 '第二晶片,該第一、第二銲線以及該 用以承載晶片之裝置表面的一部分於一封膠體内之步驟。 8、 依申請專利範圍第7項之多晶片封裝構造製造方法,其 中該用以承載晶片之裝置係為一基板或一導線架。
    CA 二拳條碘珑明 t\P0O-052.ptd 第18頁
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8134240B2 (en) 2006-07-27 2012-03-13 Fujitsu Semiconductor Limited Semiconductor device and manufacturing method for the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8134240B2 (en) 2006-07-27 2012-03-13 Fujitsu Semiconductor Limited Semiconductor device and manufacturing method for the same

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