TW425657B - Method for fabricating a semiconductor device - Google Patents
Method for fabricating a semiconductor device Download PDFInfo
- Publication number
- TW425657B TW425657B TW088113790A TW88113790A TW425657B TW 425657 B TW425657 B TW 425657B TW 088113790 A TW088113790 A TW 088113790A TW 88113790 A TW88113790 A TW 88113790A TW 425657 B TW425657 B TW 425657B
- Authority
- TW
- Taiwan
- Prior art keywords
- layer
- gas
- patent application
- item
- scope
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D1/00—Resistors, capacitors or inductors
- H10D1/60—Capacitors
- H10D1/68—Capacitors having no potential barriers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6326—Deposition processes
- H10P14/6328—Deposition from the gas or vapour phase
- H10P14/6334—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/65—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials
- H10P14/6502—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed before formation of the materials
- H10P14/6504—In-situ cleaning
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
- H10P14/6938—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses the material containing at least one metal element, e.g. metal oxides, metal oxynitrides or metal oxycarbides
- H10P14/6939—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses the material containing at least one metal element, e.g. metal oxides, metal oxynitrides or metal oxycarbides characterised by the metal
- H10P14/69393—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses the material containing at least one metal element, e.g. metal oxides, metal oxynitrides or metal oxycarbides characterised by the metal the material containing tantalum, e.g. Ta2O5
Landscapes
- Semiconductor Memories (AREA)
- Electrodes Of Semiconductors (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019980032106A KR100292088B1 (ko) | 1998-08-07 | 1998-08-07 | 반도체소자 제조방법 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW425657B true TW425657B (en) | 2001-03-11 |
Family
ID=19546649
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW088113790A TW425657B (en) | 1998-08-07 | 1999-08-12 | Method for fabricating a semiconductor device |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP2000100806A (https=) |
| KR (1) | KR100292088B1 (https=) |
| TW (1) | TW425657B (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20020051062A (ko) * | 2000-12-22 | 2002-06-28 | 박종섭 | 탄탈륨 옥시 나이트라이드 캐퍼시터의 형성 방법 |
| KR100428655B1 (ko) * | 2002-07-19 | 2004-04-28 | 주식회사 하이닉스반도체 | 캐패시터의 제조 방법 |
-
1998
- 1998-08-07 KR KR1019980032106A patent/KR100292088B1/ko not_active Expired - Fee Related
-
1999
- 1999-08-09 JP JP11224828A patent/JP2000100806A/ja active Pending
- 1999-08-12 TW TW088113790A patent/TW425657B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| JP2000100806A (ja) | 2000-04-07 |
| KR20000013319A (ko) | 2000-03-06 |
| KR100292088B1 (ko) | 2001-07-12 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GD4A | Issue of patent certificate for granted invention patent |