TW420304U - Construction of interface division in test fixture - Google Patents

Construction of interface division in test fixture

Info

Publication number
TW420304U
TW420304U TW088203902U TW88203902U TW420304U TW 420304 U TW420304 U TW 420304U TW 088203902 U TW088203902 U TW 088203902U TW 88203902 U TW88203902 U TW 88203902U TW 420304 U TW420304 U TW 420304U
Authority
TW
Taiwan
Prior art keywords
construction
test fixture
interface division
division
interface
Prior art date
Application number
TW088203902U
Other languages
Chinese (zh)
Inventor
Takashi Sekizuka
Susumu Kondo
Hiroto Satoh
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW420304U publication Critical patent/TW420304U/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
TW088203902U 1998-02-20 1999-02-04 Construction of interface division in test fixture TW420304U (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10038631A JPH11237439A (en) 1998-02-20 1998-02-20 Test fixture

Publications (1)

Publication Number Publication Date
TW420304U true TW420304U (en) 2001-01-21

Family

ID=12530598

Family Applications (1)

Application Number Title Priority Date Filing Date
TW088203902U TW420304U (en) 1998-02-20 1999-02-04 Construction of interface division in test fixture

Country Status (4)

Country Link
JP (1) JPH11237439A (en)
KR (1) KR20010006422A (en)
TW (1) TW420304U (en)
WO (1) WO1999042851A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7218095B2 (en) * 2004-07-30 2007-05-15 Verigy (Singapore) Pte. Ltd. Method and apparatus for electromagnetic interference shielding in an automated test system
WO2006134644A1 (en) * 2005-06-14 2006-12-21 Advantest Corporation Coaxial cable unit, device interface apparatus and electronic component testing apparatus
KR100881939B1 (en) * 2006-11-15 2009-02-16 주식회사 아이티엔티 Semiconductor device test system
WO2009034620A1 (en) * 2007-09-11 2009-03-19 Advantest Corporation Connector, conductive member, its manufacturing method, performance board, and testing device

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6387790U (en) * 1986-11-27 1988-06-08
JPH0231081U (en) * 1988-08-22 1990-02-27
JP2537892Y2 (en) * 1990-06-08 1997-06-04 株式会社アドバンテスト IC test equipment
JPH0496081U (en) * 1991-01-16 1992-08-20
JP2705332B2 (en) * 1991-02-04 1998-01-28 日立電子エンジニアリング株式会社 IC device electrical characteristics measurement device
JPH04304646A (en) * 1991-04-02 1992-10-28 Fujitsu Ltd Rubber conductor and method for testing semiconductor device
JPH08201476A (en) * 1995-01-30 1996-08-09 Nec Kyushu Ltd Test board for semiconductor device

Also Published As

Publication number Publication date
WO1999042851A1 (en) 1999-08-26
KR20010006422A (en) 2001-01-26
JPH11237439A (en) 1999-08-31

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Legal Events

Date Code Title Description
GD4K Issue of patent certificate for granted utility model filed before june 30, 2004
MM4K Annulment or lapse of a utility model due to non-payment of fees