JPH0496081U - - Google Patents
Info
- Publication number
- JPH0496081U JPH0496081U JP83191U JP83191U JPH0496081U JP H0496081 U JPH0496081 U JP H0496081U JP 83191 U JP83191 U JP 83191U JP 83191 U JP83191 U JP 83191U JP H0496081 U JPH0496081 U JP H0496081U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP83191U JPH0496081U (en) | 1991-01-16 | 1991-01-16 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP83191U JPH0496081U (en) | 1991-01-16 | 1991-01-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0496081U true JPH0496081U (en) | 1992-08-20 |
Family
ID=31727804
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP83191U Pending JPH0496081U (en) | 1991-01-16 | 1991-01-16 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0496081U (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04289467A (en) * | 1991-02-04 | 1992-10-14 | Hitachi Electron Eng Co Ltd | Apparatus for measuring electrical characteristics of ic device |
WO1999042851A1 (en) * | 1998-02-20 | 1999-08-26 | Advantest Corporation | Structure of test fixture interface |
JP2015034795A (en) * | 2013-08-09 | 2015-02-19 | 東洋電子技研株式会社 | Test device, contact device forming the same, and relay part for every kind forming the test device |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61201451A (en) * | 1985-03-04 | 1986-09-06 | Hitachi Electronics Eng Co Ltd | Support structure of ic socket |
JPH01163683A (en) * | 1987-12-21 | 1989-06-27 | Mitsubishi Electric Corp | Semiconductor testing device |
-
1991
- 1991-01-16 JP JP83191U patent/JPH0496081U/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61201451A (en) * | 1985-03-04 | 1986-09-06 | Hitachi Electronics Eng Co Ltd | Support structure of ic socket |
JPH01163683A (en) * | 1987-12-21 | 1989-06-27 | Mitsubishi Electric Corp | Semiconductor testing device |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04289467A (en) * | 1991-02-04 | 1992-10-14 | Hitachi Electron Eng Co Ltd | Apparatus for measuring electrical characteristics of ic device |
WO1999042851A1 (en) * | 1998-02-20 | 1999-08-26 | Advantest Corporation | Structure of test fixture interface |
JP2015034795A (en) * | 2013-08-09 | 2015-02-19 | 東洋電子技研株式会社 | Test device, contact device forming the same, and relay part for every kind forming the test device |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 19970805 |