TW392847U - Semiconductor element testing device - Google Patents

Semiconductor element testing device

Info

Publication number
TW392847U
TW392847U TW088207324U TW88207324U TW392847U TW 392847 U TW392847 U TW 392847U TW 088207324 U TW088207324 U TW 088207324U TW 88207324 U TW88207324 U TW 88207324U TW 392847 U TW392847 U TW 392847U
Authority
TW
Taiwan
Prior art keywords
semiconductor element
testing device
element testing
semiconductor
testing
Prior art date
Application number
TW088207324U
Other languages
English (en)
Inventor
Hiroto Satoh
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW392847U publication Critical patent/TW392847U/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW088207324U 1996-11-08 1997-11-06 Semiconductor element testing device TW392847U (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8296741A JPH10142290A (ja) 1996-11-08 1996-11-08 Ｉｃ試験装置

Publications (1)

Publication Number Publication Date
TW392847U true TW392847U (en) 2000-06-01

Family

ID=17837514

Family Applications (1)

Application Number Title Priority Date Filing Date
TW088207324U TW392847U (en) 1996-11-08 1997-11-06 Semiconductor element testing device

Country Status (5)

Country Link
JP (1) JPH10142290A (zh)
KR (1) KR19980042221A (zh)
CN (1) CN1185586A (zh)
DE (1) DE19749663A1 (zh)
TW (1) TW392847U (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI728477B (zh) * 2018-09-27 2021-05-21 日商精工愛普生股份有限公司 電子零件搬送裝置及電子零件檢查裝置

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100699459B1 (ko) * 2000-02-19 2007-03-26 삼성전자주식회사 모듈 테스트 핸들러
JP4145293B2 (ja) * 2004-12-28 2008-09-03 株式会社ルネサステクノロジ 半導体検査装置および半導体装置の製造方法
WO2006132064A1 (ja) * 2005-06-07 2006-12-14 Advantest Corporation アダプタ、該アダプタを備えたインタフェース装置及び電子部品試験装置
CN105487576A (zh) * 2016-01-04 2016-04-13 中国电子信息产业集团有限公司第六研究所 一种具有温控系统的恒温油槽装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI728477B (zh) * 2018-09-27 2021-05-21 日商精工愛普生股份有限公司 電子零件搬送裝置及電子零件檢查裝置

Also Published As

Publication number Publication date
KR19980042221A (ko) 1998-08-17
JPH10142290A (ja) 1998-05-29
CN1185586A (zh) 1998-06-24
DE19749663A1 (de) 1998-05-20

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Legal Events

Date Code Title Description
GD4K Issue of patent certificate for granted utility model filed before june 30, 2004
MM4K Annulment or lapse of a utility model due to non-payment of fees