GB2348967B - Semiconductor testing device and semiconductor device - Google Patents

Semiconductor testing device and semiconductor device

Info

Publication number
GB2348967B
GB2348967B GB0013798A GB0013798A GB2348967B GB 2348967 B GB2348967 B GB 2348967B GB 0013798 A GB0013798 A GB 0013798A GB 0013798 A GB0013798 A GB 0013798A GB 2348967 B GB2348967 B GB 2348967B
Authority
GB
United Kingdom
Prior art keywords
semiconductor
testing device
testing
semiconductor testing
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB0013798A
Other versions
GB2348967A (en
GB0013798D0 (en
Inventor
Yasuo Furukawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP21823599A external-priority patent/JP4105831B2/en
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of GB0013798D0 publication Critical patent/GB0013798D0/en
Publication of GB2348967A publication Critical patent/GB2348967A/en
Application granted granted Critical
Publication of GB2348967B publication Critical patent/GB2348967B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31928—Formatter
GB0013798A 1998-09-11 1999-09-09 Semiconductor testing device and semiconductor device Expired - Fee Related GB2348967B (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP25821998 1998-09-11
JP21823599A JP4105831B2 (en) 1998-09-11 1999-07-30 Waveform generator, semiconductor test apparatus, and semiconductor device
GB9921359A GB2341501B (en) 1998-09-11 1999-09-09 Waveform generation circuit

Publications (3)

Publication Number Publication Date
GB0013798D0 GB0013798D0 (en) 2000-07-26
GB2348967A GB2348967A (en) 2000-10-18
GB2348967B true GB2348967B (en) 2000-12-27

Family

ID=27269795

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0013798A Expired - Fee Related GB2348967B (en) 1998-09-11 1999-09-09 Semiconductor testing device and semiconductor device

Country Status (1)

Country Link
GB (1) GB2348967B (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB895201A (en) * 1957-08-03 1962-05-02 Emi Ltd Improvements relating to electrical function generators
US5144255A (en) * 1991-10-28 1992-09-01 Allied-Signal Inc. Multiple synchronized agile pulse generator

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB895201A (en) * 1957-08-03 1962-05-02 Emi Ltd Improvements relating to electrical function generators
US5144255A (en) * 1991-10-28 1992-09-01 Allied-Signal Inc. Multiple synchronized agile pulse generator

Also Published As

Publication number Publication date
GB2348967A (en) 2000-10-18
GB0013798D0 (en) 2000-07-26

Similar Documents

Publication Publication Date Title
GB2325358B (en) Semiconductor device testing apparatus
EP1134811A4 (en) Transistor and semiconductor device
SG55316A1 (en) Semiconductor device and structure including semiconductor device
SG74115A1 (en) Semiconductor device and its manufacturing method
IL139532A0 (en) Semiconductor device
EP1143536A4 (en) Semiconductor device
SG92663A1 (en) Device handler
SG81289A1 (en) Semiconductor device
GB2344464B (en) Semiconductor device and manufacturing method thereof
TW406860U (en) Wafer testing system and its probe device
GB9916835D0 (en) IC testing device
GB2338344B (en) Semiconductor device
EP1130639A4 (en) Semiconductor device and manufacture thereof
GB2318187B (en) IC Testing Device
GB9820192D0 (en) Semiconductor device
GB9820567D0 (en) Semiconductor device
GB2335280B (en) Ic testing method and ic testing device using the same
EP1039547A4 (en) Semiconductor device
EP1030375A4 (en) Semiconductor device and its manufacturing method
GB2336717B (en) Semiconductor device and method of making the same
GB2348061B (en) Delay device, semiconductor testing device, semiconductor device, and oscilloscope
TW392847U (en) Semiconductor element testing device
GB2348967B (en) Semiconductor testing device and semiconductor device
GB9813926D0 (en) Semiconductor device
SG79963A1 (en) Semiconductor device testing and burn-in methodology

Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20080909