TW388086B - A new temperature compensation method for semiconductor wafers in rapid thermal processor using separated heat conducting rings as susceptors - Google Patents
A new temperature compensation method for semiconductor wafers in rapid thermal processor using separated heat conducting rings as susceptors Download PDFInfo
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A7 B7 修正 五、發明説明(1 ) 發明之胡域 本刺作係有關一種適用於不均勻派度分佈之快速熱處 理系统之溢皮捕償法,其方法簡革而贫立,並JL能有效的 5 改善+ 快速熱處理系統溢度分佈不均勻之間趙。 發明之背景 政著歡電子故術之發展,半導趙元件之尺寸越敗越小 1〇 ’現爲發展超·大塑積禮電路(ULSI,U It r a Large Sea led Integrated Circuit)之次微米无件故術-金氣半場效電 晶趙M0SFET之閘極氣化層厚度亦朝向50 Λ之超薄厚度發 展。若以傳統之高溢爐成長,無法得到高品質之超薄氣化 層。爲了能得到高品質之超薄氣化層,其關鍵故術便是使 15 用短時間高温之快速熱處理系統(Rap id. Thermal Processing * RTP) ° 傳統之快速熱處理系統,加熱方式倮由系统上方一組 平行之鹵素燈管加熱,每支燈管以同後之輸出功率加熱其 20 下方之待處理晶片,其爲一單面加熱系統。然而,溫度不 均勻之問趙是傅統快速熱處理系統之致命傷。此溫度不均 句之問趙主要是由下列所數原因所造成:一、晶片周圓所 敉發出之熱福射較多。二、快逢熱處理系统中冷空氣之對 24 洗使得晶片周圍之淡度較低。三、鹵素燈管之擺置位置使 3 本紙張尺度適用中國國家標準(CNS ) Α4規格(2丨〇><297公嫠) ---------C裝— (請先閲讀背面之注$項再填寫本頁) 、ΤΓ 經濟部中央標準局貝工消费合作社印製 A7 B7 修正 五、發明説明(1 ) 發明之胡域 本刺作係有關一種適用於不均勻派度分佈之快速熱處 理系统之溢皮捕償法,其方法簡革而贫立,並JL能有效的 5 改善+ 快速熱處理系統溢度分佈不均勻之間趙。 發明之背景 政著歡電子故術之發展,半導趙元件之尺寸越敗越小 1〇 ’現爲發展超·大塑積禮電路(ULSI,U It r a Large Sea led Integrated Circuit)之次微米无件故術-金氣半場效電 晶趙M0SFET之閘極氣化層厚度亦朝向50 Λ之超薄厚度發 展。若以傳統之高溢爐成長,無法得到高品質之超薄氣化 層。爲了能得到高品質之超薄氣化層,其關鍵故術便是使 15 用短時間高温之快速熱處理系統(Rap id. Thermal Processing * RTP) ° 傳統之快速熱處理系統,加熱方式倮由系统上方一組 平行之鹵素燈管加熱,每支燈管以同後之輸出功率加熱其 20 下方之待處理晶片,其爲一單面加熱系統。然而,溫度不 均勻之問趙是傅統快速熱處理系統之致命傷。此溫度不均 句之問趙主要是由下列所數原因所造成:一、晶片周圓所 敉發出之熱福射較多。二、快逢熱處理系统中冷空氣之對 24 洗使得晶片周圍之淡度較低。三、鹵素燈管之擺置位置使 3 本紙張尺度適用中國國家標準(CNS ) Α4規格(2丨〇><297公嫠) ---------C裝— (請先閲讀背面之注$項再填寫本頁) 、ΤΓ 經濟部中央標準局貝工消费合作社印製A7 B7 Amendment V. Description of the invention (1) The invention of the Hu Yuben spine is related to a spillover compensation method applicable to a rapid heat treatment system with an uneven distribution, the method is simple and lean, and JL can be effective 5 Improving + unevenness of the rapid distribution of the rapid heat treatment system between Zhao. Background of the invention The development of the electronic technology of Huanhuan Electronic Co., Ltd., the size of the semi-conducting Zhao element is getting smaller and smaller. It is now the sub-micron for the development of U It ra Large Sea led Integrated Circuit (ULSI). Nothing is wrong-the gate gasification layer thickness of Zhao M0SFET, a half gas field effect transistor of gold gas, is also developing towards an ultra-thin thickness of 50 Λ. If grown with a traditional high-overflow furnace, a high-quality ultra-thin gasification layer cannot be obtained. In order to obtain a high-quality ultra-thin gasification layer, the key technique is to use a rapid thermal processing system (Rap id. Thermal Processing * RTP) for 15 minutes. ° The traditional rapid thermal processing system, the heating method is from the top of the system. A set of parallel halogen lamps are heated, and each lamp heats the wafer to be processed below 20 with the same output power. It is a single-sided heating system. However, the problem of uneven temperature is the fatal injury of Fu Tong's rapid heat treatment system. The problem of this temperature unevenness is mainly caused by the following reasons: First, the heat emitted by the wafer circle is more hot. Second, the cold air pair 24 in the heat treatment system will make the lightness around the wafer lower. Third, the placement of halogen lamps makes 3 paper sizes applicable to Chinese National Standards (CNS) Α4 specifications (2 丨 〇 > < 297 meters) --------- C equipment-(please first Read the note on the back of the page and fill in this page.) △ Printed by the Central Standards Bureau of the Ministry of Economic Affairs and printed by the Shellfish Consumer Cooperative A7. B7. V. Invention Description (1) The invention of the Hubei thorn is related to a kind of non-uniform distribution. The method of catching and compensating for the distributed rapid heat treatment system is simple and lean, and JL can effectively improve 5 + uneven distribution of rapidity of the rapid heat treatment system. Background of the invention The development of the electronic technology of Huanhuan Electronic Co., Ltd., the size of the semi-conducting Zhao element is getting smaller and smaller. It is now the sub-micron for the development of U It ra Large Sea led Integrated Circuit (ULSI). Nothing is wrong-the gate gasification layer thickness of Zhao M0SFET, a half gas field effect transistor of gold gas, is also developing towards an ultra-thin thickness of 50 Λ. If grown with a traditional high-overflow furnace, a high-quality ultra-thin gasification layer cannot be obtained. In order to obtain a high-quality ultra-thin gasification layer, the key technique is to use a rapid thermal processing system (Rap id. Thermal Processing * RTP) for 15 minutes. ° The traditional rapid thermal processing system, the heating method is from the top of the system. A set of parallel halogen lamps are heated, and each lamp heats the wafer to be processed below 20 with the same output power. It is a single-sided heating system. However, the problem of uneven temperature is the fatal injury of Fu Tong's rapid heat treatment system. The problem of this temperature unevenness is mainly caused by the following reasons: First, the heat emitted by the wafer circle is more hot. Second, the cold air pair 24 in the heat treatment system will make the lightness around the wafer lower. Third, the placement of halogen lamps makes 3 paper sizes applicable to Chinese National Standards (CNS) Α4 specifications (2 丨 〇 > < 297 meters) --------- C equipment-(please first Read the note on the back and fill in this page), printed by Shelley Consumer Cooperative, Central Standards Bureau, Ministry of Economic Affairs
A7 B7 五、發明说明() 本發明尚有一目的,係揭示一組分離之同心圓導熱圓 環之設計,其俾將這些圓瓖以適當之組合置於石英晶片或 5矽晶片上作為基台。將待熱處理之晶片置於此基台上,可 依調變不同半徑之導熱圓環之組合,而使原本溫度分佈不 均勻之系統,達到均勻之溫度分佈。 凡是熟悉該技藝的人士在閲讀下列經由不同圖解所展 10示之較佳實施例詳細說明後,無疑地將非常清楚本發明所 揭示之目的和優點。 附圓之簡單說明 15 第一圖為本發明在傳統快速熱處理系統中之位置配置 示意圖 1…氣流量控制閥 2...由素燈 3...·水冷管 4.·..氣冷管 5....喷氣口 6...·至抽氣幫浦 7…至溫度控制器8...·熱電偶 9...·晶片支撐基板 2〇 11...·氮氣 12....笑氣 13.....氨氣 第二圏為本發明較佳實施之說明圖 9... ·晶片支撐基板 91... · 3吋矽晶片 92…發圓環 6 (請先η讀背面之注項再填寫本頁) 訂 經濟部中央揉率局負工消费合作社印«. 本紙張尺度逋用中Η國家揉率(CNS ) A4規格(210 X 297公釐) 83. 3.10,000 A7A7 B7 V. Description of the invention () The invention has another purpose, which is to reveal the design of a set of separated concentric circular heat-conducting rings, which are placed on a quartz wafer or 5 silicon wafer as a base in a suitable combination. . The wafer to be heat-treated is placed on this base, and the combination of thermally conductive rings of different radii can be adjusted, so that the original uneven temperature distribution system can achieve a uniform temperature distribution. Those skilled in the art will undoubtedly know the objects and advantages disclosed by the present invention after reading the following detailed description of the preferred embodiments shown in different diagrams. Brief description with circle 15 The first picture is a schematic diagram of the position configuration of the present invention in a conventional rapid heat treatment system 1 ... air flow control valve 2 ... by plain lamp 3 ... · water-cooled pipe 4 ... air-cooled pipe 5 .... air outlet 6 ... · to pumping pump 7 ... to temperature controller 8 ... · thermocouple 9 ... · wafer support substrate 2〇11 ... · nitrogen 12 ... .Laugh gas 13 ..... Ammonia gas is the second preferred embodiment of the present invention. Figure 9 ... · Wafer support substrate 91 ... · 3-inch silicon wafer 92 ... Send ring 6 (please first η Read the note on the back and fill in this page again.) Order the print from the Central Government Bureau of the Ministry of Economic Affairs and the Consumer Cooperatives of the Ministry of Economic Affairs. «This paper size is based on the Chinese government's National Union (CNS) A4 size (210 X 297 mm). 83. 3.10, 000 A7
五、發明説明(2 ) 1 得晶片中W部份所接收到之光能比晶片之邊緣部价所接收 到之光能多。因此晶片之中間浪皮比逢緣溫度高。在實除 的案例中,晶片中間與邊緣之溢差可高達以上。 5 爲改善上迷問趙,1989年R. Singh編著International 經濟部中央標準局貝工消费合作社印装V. Description of the invention (2) 1 The light energy received by the W portion of the wafer is greater than the light energy received by the edge portion of the wafer. Therefore, the middle wave of the wafer is higher than the edge temperature. In actual cases, the difference between the center and edge of the wafer can be as high as above. 5 In order to improve the fans, Zhao, edited by R. Singh in 1989.
Society for Optical Engineering 於其中第41夷提出一^ 種仏單之溫度補償法,是利用一環大於晶片之矽圓環來吸 收光能而械償晶片逢緣之溢度,但是此種溢度捕償只能到 某一租度,晶片中間之溢度仍會大於邊緣之溢度15¾以上 10 σ b-J Cho 等人於 1994 年 IEEE Trans, on Semicond. Manuf.,第7卷第3期第345¾洗出以特殊設计之光學反射 幾何禮使得晶片之周两能被反射光所加熱*以此來降低晶 片温度分佈不均句之問題,然而,對於某特定温度所設计 好之反射幾何嫂對另一操敗溫度不見得適用。B-J Cho等 15 人於 1994 年 IEEE Trans, on Semicond.Manuf.,第7 卷 第3期第345頁以及其後1995年K.C.Saraswat等人於 Mat.Res.Symp.Proc♦第 387 期第35K亦找:出調整鹵素 燈管之位置及燈管動態輪出功率,以此來降低晶片溫度分 伸不均句之問趙,然而上迷之方法較複雜而筇贵,並且此 20 方法需將快速熱處理系統完全改襄,莓有之快速熱處理系 统便要因此而報麻,對於擁有舊型快速熱處理系统的人而 言是一資源浪費。除此之外,依照p.Y.W〇ng等人於Mat, Res. Symp. Proc.第387期第15 S之研究,若是晶片表面 24 已有成長其他材料並已烛刻出不同的佈局(pattern),晶 4 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐)Society for Optical Engineering proposed a temperature compensation method in 4141 of this article, which uses a ring of silicon larger than the silicon ring of the chip to absorb light and mechanically compensate for the overflow of the wafer. However, this overflow captures the compensation. It can only reach a certain degree of rent, and the overflow in the middle of the chip will still be greater than the overflow of the edge. 15¾ or more 10 σ bJ Cho et al., 1994 IEEE Trans, on Semicond. Manuf., Volume 7, Issue 3, No. 345¾ wash out The specially designed optical reflection geometry allows the wafer to be heated by the reflected light on both sides of the wafer * to reduce the problem of uneven temperature distribution of the wafer. However, the reflection geometry designed for a specific temperature does not affect the other. A failure temperature may not apply. BJ Cho et al. 15 persons in 1994 IEEE Trans, on Semicond. Manuf., Vol. 7, No. 3, p. 345, and in 1995 KCSaraswat et al., Mat. Res. Symp. Proc 387, No. 35K also Find: Adjust the position of the halogen lamp and the dynamic output power of the lamp to reduce the problem of uneven temperature distribution of the wafer. However, the method of addiction is more complicated and expensive, and the 20 methods need to be fast The heat treatment system is completely changed, and the rapid heat treatment system of Berry has to be reported as a result. It is a waste of resources for those who have the old type of rapid heat treatment system. In addition, according to pYWng et al.'S research in Mat, Res. Symp. Proc. No. 387 No. 15S, if the wafer surface 24 has grown other materials and candle-shaped different patterns, Crystal 4 This paper size is applicable to China National Standard (CNS) A4 specification (210X297 mm)
經濟部中央橾準局篇工消費合作社印製 五、發明説明(5 ) 第三圖為本發明置於石英基板上以不同矽圓環之組合 對於成長超薄矽氧化層厚度分佈之影響圓 第三圖(a)石英基板(30 sec) 5 第三圖(b)矽圓環1,3,4置於石英基板 第三圖(c)矽圓環5, 6, 7置於石英基板 第四圓為本發明置於梦基板上以不同矽圓環之組合對 於成長超薄矽氧化層厚度分佈之影響圓 第四圖(a)石英基板(30 sec) ίο 第四囷矽圓環1,3,4置於石英基板 第四圖(c)矽圓環5, 6,7置於石英基板 現以具本發明結構之溫度補償法之較佳實施例來說 明本發明之構成與可達之效果。 15 製作本發明之設備,係運用如第一圖所示傳統快速熱 處理系統,本發明『分離之同心圓導熱圓環』乃置於快速 熱處理系統之下方部份,使上方画素燈管進行晶片之單面 加熱。 20 本發明之技術「一種適用於快速熱處理系統之溫度補 償法」,係利用熱傳導或熱輻射之方法,使受熱物所承受 較高之熱能藉由墊物之引導而傳送至承受熱能較低處,經 由墊物適當之幾何形狀及組合排列,而達到均勻溫度補償 (請先閱讀背面之注意事項再填寫本頁)Printed by the Central Economic and Technical Bureau of the Ministry of Economic Affairs and Consumer Cooperatives. 5. Description of the Invention (5) The third picture shows the effect of the combination of different silicon rings on the quartz substrate on the growth of the ultra-thin silicon oxide thickness distribution. Three pictures (a) Quartz substrate (30 sec) 5 Third picture (b) Silicon rings 1, 3, 4 placed on quartz substrate Third picture (c) Silicon rings 5, 6, 7 placed on quartz substrate Fourth The circle is the influence of the combination of different silicon rings on the dream substrate of the present invention on the growth of the thickness distribution of the ultra-thin silicon oxide layer. The fourth figure (a) quartz substrate (30 sec) ίο the fourth silicon ring 1,3 4 is placed on the quartz substrate. (C) Silicon ring 5, 6, 7 is placed on the quartz substrate. The preferred embodiment of the temperature compensation method with the structure of the present invention is used to illustrate the composition and reachable effect of the present invention. . 15 The equipment of the present invention is manufactured by using the traditional rapid heat treatment system as shown in the first figure. The "separated concentric heat conducting ring" of the present invention is placed on the lower part of the rapid heat treatment system, so that the upper pixel lamp tube is used for wafer processing. Single-sided heating. 20 The technology of the present invention "a temperature compensation method suitable for rapid heat treatment systems" is a method that uses heat conduction or heat radiation to make the higher heat energy received by the heated object be guided to the lower heat energy by the guidance of the mat. , Through the appropriate geometric shape and combination of the mat to achieve uniform temperature compensation (please read the precautions on the back before filling this page)
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A7 B7 經濟部中央揉準局貝工消費合作社印裝 五、發明説明(3) 1 片本身亦會因不同材料不同之热相射性質.使得晶片即使 置於加熱均句的系统中,其表面溢度依然是不均勻的,而 此種由佈馬(pattern)所洗成溢度不均句之間趙,目前爲 止尚無人從出有效之對策。 5 是以,爲能更有故率的解決傳統快速熱處理系统涨度 不均句之問题,以使每一.决速熱處理系統都能發揮其最大 效能,以及改善由佈局(Pattern)所造成溢度不均勻之問 趙,發明人等遂運用其對傳統快速熱處理系统獨特之了解 10 及對熱傳導之專業知城,經不斷的實驗驗迸後,而發明此 一簡單、經濟而有故率之溫度捕偾法。 發明之簡單説明 15 本發明之主要S的,係利用於傳統之快速熱處理系統 中,因其爲單面晶片加熱系統,則於另一面表受加熱之基 台必爲較冷之部分。今設计一種適當之熱傳導或熱輕射路 徑,使其中晶片較熱部价之熱能被引導至下方較冷之處’ 20 經熱能適當之疏導,而使上方被加熱之晶片達成溢度捕償 之效策。 本發明之另一目的,係以·一極簡單而經濟之潘·度捕償 24 法,大幅改善一般快造“處理系統溫度不均勻之問趙。 5 V 請先閱讀背面之注意事項再填寫本頁)A7 B7 Printed by the Central Government Bureau of the Ministry of Economic Affairs, Shellfish Consumer Cooperative, Co., Ltd. 5. Description of the invention (3) The film itself will also have different thermal radiation properties due to different materials. Even if the wafer is placed in a heating system, its surface Spillage is still uneven, and so far there is no effective countermeasure for this kind of unevenness washed out by pattern. 5 Therefore, in order to solve the problem of unevenness of the traditional rapid heat treatment system more reasonably, so that each speed-determination heat treatment system can exert its maximum efficiency, and improve the overflow caused by the pattern. He asked Zhao, the inventors and others to use his unique knowledge of traditional rapid heat treatment systems10 and his professional knowledge of heat transfer. After continuous experimentation, he discovered that this was simple, economical, and well-informed. Temperature trapping method. Brief description of the invention 15 The main feature of the present invention is that it is used in the traditional rapid heat treatment system. Because it is a single-sided wafer heating system, the base that is heated on the other surface must be the colder part. Now design a proper heat conduction or light emission path, so that the heat energy of the hot part of the wafer is guided to the colder place below. 20 The heat energy is appropriately channeled, so that the heated wafer above reaches the overflow compensation. Effect. Another object of the present invention is to use a very simple and economical Pan-Catch-24 method to greatly improve the general quick-fabrication. "The temperature of the processing system is not uniform. Zhao 5 V Please read the notes on the back before filling (This page)
VT Γ -¾ 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐)VT Γ -¾ This paper size applies to China National Standard (CNS) A4 (210X 297 mm)
A7 B7 五、發明说明() 本發明尚有一目的,係揭示一組分離之同心圓導熱圓 環之設計,其俾將這些圓瓖以適當之組合置於石英晶片或 5矽晶片上作為基台。將待熱處理之晶片置於此基台上,可 依調變不同半徑之導熱圓環之組合,而使原本溫度分佈不 均勻之系統,達到均勻之溫度分佈。 凡是熟悉該技藝的人士在閲讀下列經由不同圖解所展 10示之較佳實施例詳細說明後,無疑地將非常清楚本發明所 揭示之目的和優點。 附圓之簡單說明 15 第一圖為本發明在傳統快速熱處理系統中之位置配置 示意圖 1…氣流量控制閥 2...由素燈 3...·水冷管 4.·..氣冷管 5....喷氣口 6...·至抽氣幫浦 7…至溫度控制器8...·熱電偶 9...·晶片支撐基板 2〇 11...·氮氣 12....笑氣 13.....氨氣 第二圏為本發明較佳實施之說明圖 9... ·晶片支撐基板 91... · 3吋矽晶片 92…發圓環 6 (請先η讀背面之注項再填寫本頁) 訂 經濟部中央揉率局負工消费合作社印«. 本紙張尺度逋用中Η國家揉率(CNS ) A4規格(210 X 297公釐) 83. 3.10,000A7 B7 V. Description of the invention () The invention has another purpose, which is to reveal the design of a set of separated concentric circular heat-conducting rings, which are placed on a quartz wafer or 5 silicon wafer as a base in a suitable combination. . The wafer to be heat-treated is placed on this base, and the combination of thermally conductive rings of different radii can be adjusted, so that the original uneven temperature distribution system can achieve a uniform temperature distribution. Those skilled in the art will undoubtedly know the objects and advantages disclosed by the present invention after reading the following detailed description of the preferred embodiments shown in different diagrams. Brief description with circle 15 The first picture is a schematic diagram of the position configuration of the present invention in a conventional rapid heat treatment system 1 ... air flow control valve 2 ... by plain lamp 3 ... · water-cooled pipe 4 ... air-cooled pipe 5 .... air outlet 6 ... · to pumping pump 7 ... to temperature controller 8 ... · thermocouple 9 ... · wafer support substrate 2〇11 ... · nitrogen 12 ... .Laugh gas 13 ..... Ammonia gas is the second preferred embodiment of the present invention. Figure 9 ... · Wafer support substrate 91 ... · 3-inch silicon wafer 92 ... Send ring 6 (please first η Read the note on the back and fill in this page again.) Order the print from the Central Government Bureau of the Ministry of Economic Affairs and the Consumer Cooperatives of the Ministry of Economic Affairs. «This paper size is based on the Chinese government's National Union (CNS) A4 size (210 X 297 mm). 83. 3.10, 000
經濟部中央橾準局篇工消費合作社印製 五、發明説明(5 ) 第三圖為本發明置於石英基板上以不同矽圓環之組合 對於成長超薄矽氧化層厚度分佈之影響圓 第三圖(a)石英基板(30 sec) 5 第三圖(b)矽圓環1,3,4置於石英基板 第三圖(c)矽圓環5, 6, 7置於石英基板 第四圓為本發明置於梦基板上以不同矽圓環之組合對 於成長超薄矽氧化層厚度分佈之影響圓 第四圖(a)石英基板(30 sec) ίο 第四囷矽圓環1,3,4置於石英基板 第四圖(c)矽圓環5, 6,7置於石英基板 現以具本發明結構之溫度補償法之較佳實施例來說 明本發明之構成與可達之效果。 15 製作本發明之設備,係運用如第一圖所示傳統快速熱 處理系統,本發明『分離之同心圓導熱圓環』乃置於快速 熱處理系統之下方部份,使上方画素燈管進行晶片之單面 加熱。 20 本發明之技術「一種適用於快速熱處理系統之溫度補 償法」,係利用熱傳導或熱輻射之方法,使受熱物所承受 較高之熱能藉由墊物之引導而傳送至承受熱能較低處,經 由墊物適當之幾何形狀及組合排列,而達到均勻溫度補償 (請先閱讀背面之注意事項再填寫本頁)Printed by the Central Economic and Technical Bureau of the Ministry of Economic Affairs and Consumer Cooperatives. 5. Description of the Invention (5) The third picture shows the effect of the combination of different silicon rings on the quartz substrate on the growth of the ultra-thin silicon oxide thickness distribution. Three pictures (a) Quartz substrate (30 sec) 5 Third picture (b) Silicon rings 1, 3, 4 placed on quartz substrate Third picture (c) Silicon rings 5, 6, 7 placed on quartz substrate Fourth The circle is the influence of the combination of different silicon rings on the dream substrate of the present invention on the growth of the thickness distribution of the ultra-thin silicon oxide layer. The fourth figure (a) quartz substrate (30 sec) ίο the fourth silicon ring 1,3 4 is placed on the quartz substrate. (C) Silicon ring 5, 6, 7 is placed on the quartz substrate. The preferred embodiment of the temperature compensation method with the structure of the present invention is used to illustrate the composition and reachable effect of the present invention. . 15 The equipment of the present invention is manufactured by using the traditional rapid heat treatment system as shown in the first figure. The "separated concentric heat conducting ring" of the present invention is placed on the lower part of the rapid heat treatment system, so that the upper pixel lamp tube is used for wafer processing. Single-sided heating. 20 The technology of the present invention "a temperature compensation method suitable for rapid heat treatment systems" is a method that uses heat conduction or heat radiation to make the higher heat energy received by the heated object be guided to the lower heat energy by the guidance of the mat. , Through the appropriate geometric shape and combination of the mat to achieve uniform temperature compensation (please read the precautions on the back before filling this page)
,1T m·, 1T m ·
A7 B7 五、發明説明(6 ) 1 之故策。對於某些參物需要特殊巡度補償條件,T於製作 時將整•物與基板二者予以一嫌化〇 本發明之故,椒「一種適用於怏速熱處理系統之激度梢 5 偾法J,亦可將具備溢度捕償能力之參物,加長其厚度, 並於其下方加襄自勤升降之装置,由電腦進行熱傳導棋擬 分析及控制,配合自勤控制之設施;不僅測知面環、贴矩 陣之某些點受熱程度,且與蛘傳導或熱輻射系統合併運作 ,使其中較高熱能傳送至熱能較低處,達到溫度捕償系統 10 之自勛化。 適用於本發明技術Γ —種適用於快速熱處埋系統之 度捕償法」之整物,其形狀可爲圆形、二維空間點矩睐, 或是其符合觉子系統需求之任意幾何形狀,例如長條形、 15 三角形、四角形、五角形、六角形等。其欠小亦政電子系 统之需求而定’並不供限尺寸。而有關餐物與基板之材質 ,可選用石英、碳化矽(Sic)等或其他具佛耐高溫性質之 材質。 經濟部中央標準局貝工消费合作社印製 20 如第二圖所示,本發明係將矽晶片以化學铖刻之方式 製成一環一環之同心圓,每一矽圓環厚3〇〇 um,究4酿成 9臟,環間距爲lmm。捋此等矽圓環標以編號由1至7如第 二圖所示加以樣註,以適當之組合將此些硬圓環置於石英 24 基板或矽基板上,再將待處理之晶片置於矽圊環上,由上 8 本紙張尺度適用中國國家標隼(CNS ) A4規格(210Χ:297公釐) A7 B7 經濟部中央搮準局負工消費合作社印製 五、發明说明(7 ) 1 方之庳素进管單面加熱晶片。當基故爲石英基枝時•由於 石英爲绝熱材料,無法經由熱傳導方式將發晶片下方之熱 能散失,因此热能之散失方式爲熱輕射方式進行散失。此 縳,梦两環之功能便是限擋熱輕射,有硬圓環之部分其熱 5 能較不易散失。當基板爲矽基板時,在晶片下方之矽基板 ,因表受光能直接加热,其溢度比上面之發品片低。如此 *經由硬圆碟之傳導,熱能將由較熱之硬晶片傳導至較冷 之梦基权上。而珍晶片本身亦會經由本身熱傳導之特性而 使其自身之溢度重新分配。因此,若能適當的調配妙面環 1〇 之位置,使得原表中間較熱之部份·亦有較多之熱能被傳導 成福射至下方,再加上珍晶片本身之熱傳導特質,便可使 梦晶片中間與邊緣之溢度誤差補償至5¾以内甚至更小, 然而這便要矽圆環视調變:之精度而定。 15 如第三®及第四围所示,使用不同排列方式之碎圓環 置於石英基板及矽基板上,其對成長超薄梦氧化層厚度分 佈之影響不同,珍固環之排列編號如第三躕及第四圖所示 。第三圈及第四圖之梦氣化層,其氣化之條件爲使用3叶 P型(100)之梦晶片,於960 C、500torr之氧氣恩力下 20 成長30秒,成長時基台無旋轉。由第三圖及第四圖可知 ,不論是使用石英基板或矽基板來成長,適當之矽硪組合 均可欠幅改善成長氧化層厚度之均勻分佈,而其中較值之 圓環組合是如第三圖(c)及第四圖(c)所示,所使用之 24 碎®環組合的編號爲5、6、7之三環。此外,使用珍基板 9 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐) (請先閱讀背面之注意事項再填寫本頁) Γ •裳. -訂 經濟部中央樣準局貝工消费合作杜印製 A7 B7 五、發明説明(8 ) 1 能得較厚反較均句之氧化廣,此是因梦基板阻播了梦晶片 下方之熱輻射的原因,而且梦基拓~之邊緣亦受到光能加熱 使得梦Λ片之邊緣亦受到較多之熱能。對石英基板而官, 石英基粗·因其爲透明的而不易爲光能所加熱’ 射能 5 從矽晶片之下方散出。此外*珍A片之邊緣亦無受到熱能 加熱,因此使用梦基板所長出氧化凊之厚度及均勻度都比 使用石英基板的爲佳。 以此新武之溫皮械償法,不論妙圆環之厚度爲何,不 10 論系统原始之溢度分佈如何,以及不輪基板之材質爲石英 或矽晶片,只要能適當的調變矽®環之組合,均可使待處 理之晶片能獲得一均勻之溫度分佈,若是能再配合旋轉成 長,則溢皮之均勻度會更佳。 15 此温度捕償法以極簡便之方式,欠幅改善了傳統快速 熱處理系统溢度分佈不均句之問題,對於由佈局(Pattern )所造成溫度不均句之題,亦可以此方法而得到改善, 其新顧性及實用性極具工業及商業價值。 20 碎圓環亦可以其他材料取代之,如使用石英或是碳化 妙(SiC)均可。此外,圓壤組合之選擇,若設计成只要接 按·紐便可自動選取之系統,則使用起來捋會更方便。 24 由上迷所揭示内容,可明瞭本發明實具下列之俊點: _ 10 本紙張尺度適用中國國家標牟(CNS ) A4规格(210X297公釐) (請先閲讀背面之注意事項再填寫本頁) 裝·A7 B7 V. Explanation of Invention (6) 1 For some parameters, special patrol compensation conditions are required. T will treat both the whole body and the substrate when making it. For the reason of the present invention, "a kind of excitable tip suitable for rapid heat treatment system" J. It is also possible to lengthen the thickness of the ginseng which has the ability to catch the overflow, and add a device for self-service lifting below it. The computer conducts thermal conduction chess analysis and control, and cooperates with facilities for self-service control. Know the degree of heating of some points of the surface ring and the matrix, and operate in combination with the tritium conduction or heat radiation system, so that the higher heat energy is transmitted to the lower heat energy, and the temperature compensation system 10 can be self-honored. Inventive technology Γ—A kind of whole object suitable for rapid thermal processing buried system ”, its shape can be circular, two-dimensional space point moments, or any geometric shape that meets the needs of the conscious subsystem, such as long Bar, 15 triangle, quadrilateral, pentagon, hexagon, etc. Its size is also small due to the needs of the government's electronic system 'and is not limited in size. As for the material of the meal and the substrate, quartz, silicon carbide (Sic), or other materials with high temperature resistance properties can be selected. Printed by the Central Standards Bureau of the Ministry of Economic Affairs, Shelley Consumer Cooperatives. As shown in the second figure, the present invention is a silicon wafer made of concentric circles by chemical engraving. Each silicon ring is 300um thick. Study 4 made 9 dirty, the ring spacing was lmm.矽 These silicon rings are labeled with numbers from 1 to 7 and sampled as shown in the second figure. These hard rings are placed on a quartz 24 substrate or a silicon substrate in an appropriate combination, and the wafers to be processed are placed. On the silicon ring, the size of the 8 papers is applicable to the Chinese National Standard (CNS) A4 specification (210 ×: 297 mm) A7 B7 Printed by the Central Consumers ’Bureau of the Ministry of Economic Affairs and Consumer Cooperatives V. Invention Description (7) 1 Fang Zhisu enters the tube to heat the wafer on one side. When the base is a quartz base branch • Since quartz is a heat-insulating material, it is not possible to dissipate the thermal energy under the hair chip through thermal conduction. Therefore, the thermal energy is dissipated by means of thermal light emission. With this binding, the function of the two rings of the dream is to limit heat and light, and the heat energy of the part with a hard ring is less likely to be lost. When the substrate is a silicon substrate, the silicon substrate under the wafer can be directly heated by the light, and its overflow is lower than that of the hair piece above. So * Through the conduction of the hard disk, thermal energy will be conducted from the hotter hard chip to the cooler dream base. And the precious chip itself will redistribute its own spillage through its own heat conduction characteristics. Therefore, if the position of the wonderful face ring 10 can be adjusted appropriately, so that the hotter part in the middle of the original watch also has more thermal energy transmitted into the blessing to the bottom, plus the heat conduction characteristics of the precious chip itself, then The error between the middle and the edge of the dream chip can be compensated to within 5¾ or even smaller, but this depends on the accuracy of the silicon ring: 15 As shown in the third and fourth figures, broken rings with different arrangements are placed on the quartz substrate and silicon substrate, which have different effects on the thickness distribution of the growth of ultra-thin dream oxide layers. The third frame and the fourth image are shown. The gasification layer of the dream in the third circle and the fourth picture, the gasification condition is the use of a 3-leaf P-type (100) dream wafer, growing at 960 C and 500torr for 20 seconds for 30 seconds. No rotation. As can be seen from the third and fourth figures, whether using a quartz substrate or a silicon substrate for growth, an appropriate silicon-silicon combination can improve the uniform distribution of the thickness of the oxide layer, and the value of the ring combination is as shown in the figure. As shown in Figure 3 (c) and Figure 4 (c), the 24 pieces of the ring combination used are numbered 5, 6, and 7. In addition, 9 paper sheets are used for the standard of Chinese National Standard (CNS) A4 (210X297 mm). (Please read the precautions on the back before filling this page.) Γ • Shang. Consumption cooperation Du printed A7 B7 V. Description of the invention (8) 1 It can get thicker and more oxidized. This is because the dream substrate blocks the heat radiation under the dream chip, and the dream base is ~ The edges are also heated by light energy so that the edges of the Dream Λ film are also subjected to more heat energy. For a quartz substrate, the quartz substrate is rough. Because it is transparent, it is not easily heated by light energy. The radiation energy 5 is emitted from under the silicon wafer. In addition, the edge of * Jin A is not heated by thermal energy. Therefore, the thickness and uniformity of hafnium oxide grown using the dream substrate are better than those using the quartz substrate. With this new method of warm leather weaponry, regardless of the thickness of the wonderful ring, no matter how the original overflow distribution of the system is, and the material of the non-round substrate is quartz or silicon wafer, as long as the silicon® ring can be properly adjusted. The combination can make the wafer to be processed have a uniform temperature distribution. If it can be grown with rotation, the uniformity of the overflow skin will be better. 15 This temperature compensation method improves the problem of uneven distribution of the overflow distribution in the traditional rapid heat treatment system in a simple and convenient manner. The problem of the uneven distribution of temperature caused by the pattern can also be improved by this method. Its new nature and practicality are of great industrial and commercial value. 20 Broken rings can also be replaced by other materials, such as quartz or SiC. In addition, the choice of round soil combination is more convenient if it is designed as a system that can be automatically selected by simply pressing the button. 24 According to the content disclosed by the above fans, it is clear that the present invention has the following advantages: _ 10 This paper size is applicable to China National Standards (CNS) A4 specifications (210X297 mm) (Please read the precautions on the back before filling in this Page)
,1T A7 B7 五、發明説明(9 ) 1 1、本發明係利用熱傳導及熱輻射原理,以簡易之方法 改善傳统块速熱處理系統溢度分佈不均句之問通,此 對於超大型猜技霓路製租之關键技街-快速熱處理系 统’提·供了一有效而經濟之潘度均勻分佈枝術。, 5 2、本發明之理念,可適用於任何溢度分佈不均句之系 统。以適當之組合使用溢度捕償®環,配合基台之旋 轉,便能得到極均句之溫度分佈。對於非旋轉之加熱 系統,亦可以二維點姐陣方式之溫度補償點來敗全面 式之溢度補償〇 10 3、本發明能配合自動控制之設施,將此些溢度捕償之 面環或麻姐陣,加長其厚度使其由300um變成50 cm,並於其下方加襄自動升降之裝置,由電腦敗熱傳 棋擬分析及控制,可知道並且控制那些圓環或點矩陣 之點該與晶片接鵷,以此方式便能將此混度械償系统 15 自勤化〇 4、本發明所使用之材料,除了碎材質之外,亦可使用 石英或是碳化矽(SiC)等成其他能耐高溢達1000 p 以上之材質。 請 先 閲 讀 背 面 之 注 意 事 項』 裝 訂 經濟部中央搮準局貝工消费合作社印笨 20 综上所述,僅爲本發明之例示性實例而已,並非用以 限定本發明之可實施絶围,其他未_脱離本發明所揭示之精 神與原理下所完成之等效改變,均應仍包含在下述之專利 iL® 内。 24 11 本紙張尺度適用中國國家標準(CNS ) A4規格(210X297公釐)1T A7 B7 V. Explanation of the invention (9) 1 1. The present invention uses the principle of heat conduction and heat radiation to improve the problem of the uneven distribution of the overflow distribution of the traditional block heat treatment system in a simple way. This is a very large guessing technique. The key technology street of Nilu renting-rapid heat treatment system'provides an effective and economical uniformity distribution technique. 5 2. The idea of the present invention can be applied to any system with uneven distribution of degree of overflow. Using the Proprietary Compensation® ring in an appropriate combination, in conjunction with the rotation of the abutment, the temperature distribution of the homogeneous sentence can be obtained. For non-rotating heating systems, you can also use the two-dimensional dot matrix array temperature compensation point to defeat the full-scale overflow compensation. 10 3. The present invention can cooperate with automatic control facilities to capture these overflows. Or Ma Jiezhen, lengthen its thickness from 300um to 50 cm, and add an automatic lifting device below it, which is analyzed and controlled by computer defeated chess, and can know and control the points of the circle or point matrix By connecting with the wafer, the mixing mechanism compensation system 15 can be self-serviced in this way. In addition to the broken material, the material used in the present invention can also use quartz or silicon carbide (SiC). Made of other materials that can withstand high spillages above 1000 p. Please read the precautions on the back first. ”The bookbinding and consumer co-op of the Central Bureau of Standards, the Ministry of Economic Affairs, Yinben 20 In summary, these are only illustrative examples of the present invention, and are not intended to limit the implementation of the present invention. Others Equivalent changes made without departing from the spirit and principles disclosed in the present invention should still be included in the patent iL® described below. 24 11 This paper size applies to China National Standard (CNS) A4 (210X297 mm)
Claims (1)
Priority Applications (1)
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TW86105515A TW388086B (en) | 1997-04-28 | 1997-04-28 | A new temperature compensation method for semiconductor wafers in rapid thermal processor using separated heat conducting rings as susceptors |
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TW86105515A TW388086B (en) | 1997-04-28 | 1997-04-28 | A new temperature compensation method for semiconductor wafers in rapid thermal processor using separated heat conducting rings as susceptors |
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TW388086B true TW388086B (en) | 2000-04-21 |
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TW86105515A TW388086B (en) | 1997-04-28 | 1997-04-28 | A new temperature compensation method for semiconductor wafers in rapid thermal processor using separated heat conducting rings as susceptors |
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1997
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