TW375554B - Wafer holder for chemical and mechanical planarization machines - Google Patents
Wafer holder for chemical and mechanical planarization machinesInfo
- Publication number
- TW375554B TW375554B TW087109223A TW87109223A TW375554B TW 375554 B TW375554 B TW 375554B TW 087109223 A TW087109223 A TW 087109223A TW 87109223 A TW87109223 A TW 87109223A TW 375554 B TW375554 B TW 375554B
- Authority
- TW
- Taiwan
- Prior art keywords
- wafer
- chemical
- wafer holder
- mechanical planarization
- retainer
- Prior art date
Links
- 238000000034 method Methods 0.000 abstract 1
- 238000005498 polishing Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
- B24B37/32—Retaining rings
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019980016207A KR100306824B1 (ko) | 1998-05-06 | 1998-05-06 | 화학적기계적평탄화기계를위한웨이퍼홀더 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW375554B true TW375554B (en) | 1999-12-01 |
Family
ID=19537076
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW087109223A TW375554B (en) | 1998-05-06 | 1998-06-10 | Wafer holder for chemical and mechanical planarization machines |
Country Status (4)
Country | Link |
---|---|
US (1) | US6146256A (zh) |
JP (1) | JP3834444B2 (zh) |
KR (1) | KR100306824B1 (zh) |
TW (1) | TW375554B (zh) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6436228B1 (en) * | 1998-05-15 | 2002-08-20 | Applied Materials, Inc. | Substrate retainer |
KR100513419B1 (ko) * | 1998-11-07 | 2005-11-25 | 삼성전자주식회사 | 웨이퍼 폴리싱장치 |
US6726537B1 (en) * | 2000-04-21 | 2004-04-27 | Agere Systems Inc. | Polishing carrier head |
US6454637B1 (en) * | 2000-09-26 | 2002-09-24 | Lam Research Corporation | Edge instability suppressing device and system |
US6949158B2 (en) * | 2001-05-14 | 2005-09-27 | Micron Technology, Inc. | Using backgrind wafer tape to enable wafer mounting of bumped wafers |
US6776693B2 (en) * | 2001-12-19 | 2004-08-17 | Applied Materials Inc. | Method and apparatus for face-up substrate polishing |
KR100587057B1 (ko) * | 2002-12-03 | 2006-06-07 | 주식회사 하이닉스반도체 | 화학적기계연마 장치 |
KR100649007B1 (ko) * | 2004-12-30 | 2006-11-27 | 동부일렉트로닉스 주식회사 | 화학 기계적 연마 장치 및 이를 만드는 방법 |
US7198548B1 (en) * | 2005-09-30 | 2007-04-03 | Applied Materials, Inc. | Polishing apparatus and method with direct load platen |
US7696770B2 (en) * | 2007-01-26 | 2010-04-13 | International Business Machines Corportion | Self-centering nest for electronics testing |
US8144309B2 (en) * | 2007-09-05 | 2012-03-27 | Asml Netherlands B.V. | Imprint lithography |
JP5615589B2 (ja) * | 2010-05-07 | 2014-10-29 | 富士紡ホールディングス株式会社 | 枠材および枠材を有する保持具 |
US20130316627A1 (en) * | 2012-05-14 | 2013-11-28 | Edmond Arzuman Abrahamians | Wafer carrier for batch wafer polishing in wafer polishing machines |
KR102150409B1 (ko) * | 2013-11-26 | 2020-09-01 | 주식회사 케이씨텍 | 화학 기계적 연마 장치의 캐리어 헤드 |
KR102257450B1 (ko) * | 2014-11-03 | 2021-05-31 | 주식회사 케이씨텍 | 화학 기계적 연마 장치용 캐리어 헤드 |
JP6403015B2 (ja) * | 2015-07-21 | 2018-10-10 | 東芝メモリ株式会社 | 研磨装置および半導体製造方法 |
KR102644392B1 (ko) * | 2018-05-15 | 2024-03-08 | 주식회사 케이씨텍 | 기판 캐리어 및 이를 포함하는 기판 연마 장치 |
CN110802507A (zh) * | 2019-11-11 | 2020-02-18 | 上海华力微电子有限公司 | 研磨头和化学机械研磨设备 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01168021A (ja) * | 1987-12-23 | 1989-07-03 | Furukawa Electric Co Ltd:The | アウターワークホルダー |
US5095661A (en) * | 1988-06-20 | 1992-03-17 | Westech Systems, Inc. | Apparatus for transporting wafer to and from polishing head |
US5549502A (en) * | 1992-12-04 | 1996-08-27 | Fujikoshi Machinery Corp. | Polishing apparatus |
US5605487A (en) * | 1994-05-13 | 1997-02-25 | Memc Electric Materials, Inc. | Semiconductor wafer polishing appartus and method |
US5597346A (en) * | 1995-03-09 | 1997-01-28 | Texas Instruments Incorporated | Method and apparatus for holding a semiconductor wafer during a chemical mechanical polish (CMP) process |
JP3129172B2 (ja) * | 1995-11-14 | 2001-01-29 | 日本電気株式会社 | 研磨装置及び研磨方法 |
US5702292A (en) * | 1996-10-31 | 1997-12-30 | Micron Technology, Inc. | Apparatus and method for loading and unloading substrates to a chemical-mechanical planarization machine |
-
1998
- 1998-05-06 KR KR1019980016207A patent/KR100306824B1/ko not_active IP Right Cessation
- 1998-06-10 TW TW087109223A patent/TW375554B/zh not_active IP Right Cessation
-
1999
- 1999-05-06 US US09/306,234 patent/US6146256A/en not_active Expired - Lifetime
- 1999-05-06 JP JP12643699A patent/JP3834444B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR100306824B1 (ko) | 2001-11-30 |
JPH11333714A (ja) | 1999-12-07 |
KR19990084451A (ko) | 1999-12-06 |
JP3834444B2 (ja) | 2006-10-18 |
US6146256A (en) | 2000-11-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |