TW360894B - Power-microscopy-probe - Google Patents
Power-microscopy-probeInfo
- Publication number
- TW360894B TW360894B TW086113010A TW86113010A TW360894B TW 360894 B TW360894 B TW 360894B TW 086113010 A TW086113010 A TW 086113010A TW 86113010 A TW86113010 A TW 86113010A TW 360894 B TW360894 B TW 360894B
- Authority
- TW
- Taiwan
- Prior art keywords
- probe
- microscopy
- power
- bar
- spring
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
- G01Q60/40—Conductive probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
- G01Q70/02—Probe holders
- G01Q70/04—Probe holders with compensation for temperature or vibration induced errors
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19638977A DE19638977A1 (de) | 1996-09-23 | 1996-09-23 | Kraftmikroskopiesonde |
Publications (1)
Publication Number | Publication Date |
---|---|
TW360894B true TW360894B (en) | 1999-06-11 |
Family
ID=7806603
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW086113010A TW360894B (en) | 1996-09-23 | 1997-09-09 | Power-microscopy-probe |
Country Status (3)
Country | Link |
---|---|
DE (1) | DE19638977A1 (fr) |
TW (1) | TW360894B (fr) |
WO (1) | WO1998013663A1 (fr) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1244817C (zh) * | 1998-11-06 | 2006-03-08 | 特瑞克股份有限公司 | 带悬臂与屏蔽的静电力显微镜以及确定静电力、膜厚度的方法 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0483104A (ja) * | 1990-07-26 | 1992-03-17 | Olympus Optical Co Ltd | 走査型トンネル顕微鏡 |
JP2741629B2 (ja) * | 1990-10-09 | 1998-04-22 | キヤノン株式会社 | カンチレバー型プローブ、それを用いた走査型トンネル顕微鏡及び情報処理装置 |
US5444244A (en) * | 1993-06-03 | 1995-08-22 | Park Scientific Instruments Corporation | Piezoresistive cantilever with integral tip for scanning probe microscope |
US5450746A (en) * | 1993-10-12 | 1995-09-19 | The University Of North Carolina | Constant force stylus profiling apparatus and method |
JPH0850872A (ja) * | 1994-08-08 | 1996-02-20 | Canon Inc | 試料表面の観察方法、原子間力顕微鏡、微細加工方法および微細加工装置 |
JP3576644B2 (ja) * | 1995-06-19 | 2004-10-13 | キヤノン株式会社 | 情報記録装置のプローブ及び記録媒体、並びにこれらを用いた情報記録方法 |
-
1996
- 1996-09-23 DE DE19638977A patent/DE19638977A1/de not_active Ceased
-
1997
- 1997-09-05 WO PCT/EP1997/004840 patent/WO1998013663A1/fr active Application Filing
- 1997-09-09 TW TW086113010A patent/TW360894B/zh active
Also Published As
Publication number | Publication date |
---|---|
DE19638977A1 (de) | 1998-03-26 |
WO1998013663A1 (fr) | 1998-04-02 |
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