TW360822B - Method of making a memory fault-tolerant using a variable size redundancy replacement configuration - Google Patents

Method of making a memory fault-tolerant using a variable size redundancy replacement configuration

Info

Publication number
TW360822B
TW360822B TW086119034A TW86119034A TW360822B TW 360822 B TW360822 B TW 360822B TW 086119034 A TW086119034 A TW 086119034A TW 86119034 A TW86119034 A TW 86119034A TW 360822 B TW360822 B TW 360822B
Authority
TW
Taiwan
Prior art keywords
redundancy
variable size
memory
tolerant
elements
Prior art date
Application number
TW086119034A
Other languages
English (en)
Inventor
Kirihata Toshiaki
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US08/825,948 external-priority patent/US5831913A/en
Priority claimed from US08/825,949 external-priority patent/US5831914A/en
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of TW360822B publication Critical patent/TW360822B/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
    • G11C29/804—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout to prevent clustered faults
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/10—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
    • G11C29/808—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout using a flexible replacement scheme

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Dram (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
TW086119034A 1997-03-31 1997-12-17 Method of making a memory fault-tolerant using a variable size redundancy replacement configuration TW360822B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/825,948 US5831913A (en) 1997-03-31 1997-03-31 Method of making a memory fault-tolerant using a variable size redundancy replacement configuration
US08/825,949 US5831914A (en) 1997-03-31 1997-03-31 Variable size redundancy replacement architecture to make a memory fault-tolerant

Publications (1)

Publication Number Publication Date
TW360822B true TW360822B (en) 1999-06-11

Family

ID=27124960

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086119034A TW360822B (en) 1997-03-31 1997-12-17 Method of making a memory fault-tolerant using a variable size redundancy replacement configuration

Country Status (4)

Country Link
EP (1) EP0869440B1 (zh)
KR (1) KR100295928B1 (zh)
DE (1) DE69811421T2 (zh)
TW (1) TW360822B (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009505171A (ja) * 2005-06-27 2009-02-05 イコア コーポレイション ステートフルなトランザクション指向のシステムを指定する方法、及び半導体デバイスの構造的に構成可能なイン・メモリ処理へ柔軟にマッピングする装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4639897A (en) * 1983-08-31 1987-01-27 Rca Corporation Priority encoded spare element decoder
EP0465808B1 (en) * 1990-06-19 1998-07-29 Texas Instruments Incorporated Variable size set associative DRAM redundancy scheme
EP0529330A3 (en) * 1991-07-31 1993-09-29 Texas Instruments Incorporated System with laser link decoder for dram redundancy scheme

Also Published As

Publication number Publication date
EP0869440A1 (en) 1998-10-07
DE69811421D1 (de) 2003-03-27
KR19980079738A (ko) 1998-11-25
DE69811421T2 (de) 2003-10-23
KR100295928B1 (ko) 2001-08-07
EP0869440B1 (en) 2003-02-19

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees