TW336277B - A method of and an apparatus for nondestructive workpiece testing - Google Patents
A method of and an apparatus for nondestructive workpiece testingInfo
- Publication number
- TW336277B TW336277B TW085115648A TW85115648A TW336277B TW 336277 B TW336277 B TW 336277B TW 085115648 A TW085115648 A TW 085115648A TW 85115648 A TW85115648 A TW 85115648A TW 336277 B TW336277 B TW 336277B
- Authority
- TW
- Taiwan
- Prior art keywords
- nondestructive
- testing
- workpiece testing
- workpiece
- testing points
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0658—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of emissivity or reradiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
- G01B21/085—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness using thermal means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19548036A DE19548036C2 (de) | 1995-12-21 | 1995-12-21 | Verfahren und Vorrichtung zum zerstörungsfreien Prüfen von Werkstücken |
Publications (1)
Publication Number | Publication Date |
---|---|
TW336277B true TW336277B (en) | 1998-07-11 |
Family
ID=7780950
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW085115648A TW336277B (en) | 1995-12-21 | 1996-12-18 | A method of and an apparatus for nondestructive workpiece testing |
Country Status (7)
Country | Link |
---|---|
US (1) | US5841138A (zh) |
EP (1) | EP0780682B1 (zh) |
JP (1) | JPH09189660A (zh) |
CN (1) | CN1159579A (zh) |
AT (1) | ATE225035T1 (zh) |
DE (2) | DE19548036C2 (zh) |
TW (1) | TW336277B (zh) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19928171B4 (de) * | 1999-06-19 | 2011-01-05 | Leybold Optics Gmbh | Verfahren zur kontinuierlichen Bestimmung der optischen Schichtdicke von Beschichtungen |
DE10013172C2 (de) * | 2000-03-17 | 2002-05-16 | Wagner Internat Ag Altstaetten | Verfahren und Vorrichtung zur photothermischen Analyse einer Materialschicht, insbesondere zur Schichtdickenmessung |
DE10013173C2 (de) * | 2000-03-17 | 2002-02-28 | Wagner Internat Ag Altstaetten | Verfahren und Vorrichtung zur photothermischen Analyse einer Materialschicht, insbesondere zur Schichtdickenmessung |
US7401976B1 (en) * | 2000-08-25 | 2008-07-22 | Art Advanced Research Technologies Inc. | Detection of defects by thermographic analysis |
WO2005015142A2 (de) * | 2003-08-06 | 2005-02-17 | Testo Ag | Radiometer, visiereinrichtung für ein ir-gerät sowie verfahren |
DE10336097B3 (de) | 2003-08-06 | 2005-03-10 | Testo Ag | Visiereinrichtung für ein Radiometer sowie Verfahren |
CN100585826C (zh) | 2005-03-11 | 2010-01-27 | 株式会社瑞萨科技 | 半导体集成电路器件的制造方法 |
CN103052875B (zh) * | 2010-05-03 | 2016-04-27 | 奥罗拉控制技术有限公司 | 测量半导体层掺杂剂含量的非接触系统 |
FR3007831B1 (fr) * | 2013-07-01 | 2015-06-19 | Enovasense | Procede de mesure de l'epaisseur d'une couche d'un materiau, procede de galvanisation et dispositif de mesure associes |
CN109059776B (zh) * | 2018-07-05 | 2023-05-12 | 江西飞达电气设备有限公司 | 一种多功能限位器行程误差测试设备 |
US11950677B2 (en) | 2019-02-28 | 2024-04-09 | L'oreal | Devices and methods for electrostatic application of cosmetics |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE228916C (zh) * | ||||
US3569696A (en) * | 1968-10-08 | 1971-03-09 | Pollution Control Ind Inc | Method and apparatus for measuring simultaneously a plurality of components of a test sample |
JPS5248031B2 (zh) * | 1974-05-13 | 1977-12-07 | ||
DE3234534C2 (de) * | 1982-09-17 | 1986-09-11 | Kievskoe naučno-proizvodstvennoe obiedinenie "Analitpribor", Kiev | Anordnung zum Aufstäuben von optischen Filmschichten |
FR2555308B1 (fr) * | 1983-11-21 | 1986-12-05 | Cit Alcatel | Tete photometrique et applications a des dispositifs de controle de l'epaisseur d'une couche mince |
DE3631652C2 (de) * | 1986-09-17 | 1994-05-19 | Siemens Ag | Meßanordnung zur berührungslosen Dickenbestimmung |
EP0458601B1 (en) * | 1990-05-22 | 1996-08-28 | Research Development Corporation Of Japan | Method of and apparatus for measuring spectral absorption in opaque specimens and method of and apparatus for measuring microscopic absorption distribution |
DE4223337C2 (de) * | 1992-07-16 | 1996-02-22 | Jenoptik Jena Gmbh | Verfahren und Anordnung zur photothermischen Spektroskopie |
AT399592B (de) * | 1993-01-26 | 1995-06-26 | Hoerbiger & Co | Verfahren und einrichtung zur messung der porosität von reibbelägen |
-
1995
- 1995-12-21 DE DE19548036A patent/DE19548036C2/de not_active Expired - Fee Related
-
1996
- 1996-10-30 EP EP96117416A patent/EP0780682B1/de not_active Expired - Lifetime
- 1996-10-30 AT AT96117416T patent/ATE225035T1/de not_active IP Right Cessation
- 1996-10-30 DE DE59609723T patent/DE59609723D1/de not_active Expired - Fee Related
- 1996-12-10 US US08/763,245 patent/US5841138A/en not_active Expired - Fee Related
- 1996-12-16 CN CN96121565A patent/CN1159579A/zh active Pending
- 1996-12-18 TW TW085115648A patent/TW336277B/zh active
- 1996-12-24 JP JP8343839A patent/JPH09189660A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
CN1159579A (zh) | 1997-09-17 |
EP0780682B1 (de) | 2002-09-25 |
DE19548036A1 (de) | 1997-06-26 |
JPH09189660A (ja) | 1997-07-22 |
US5841138A (en) | 1998-11-24 |
ATE225035T1 (de) | 2002-10-15 |
EP0780682A1 (de) | 1997-06-25 |
DE59609723D1 (de) | 2002-10-31 |
DE19548036C2 (de) | 1999-09-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
GD4A | Issue of patent certificate for granted invention patent |