TW255845B - Process of detecting surface defects for the target element and its device - Google Patents

Process of detecting surface defects for the target element and its device

Info

Publication number
TW255845B
TW255845B TW83110452A TW83110452A TW255845B TW 255845 B TW255845 B TW 255845B TW 83110452 A TW83110452 A TW 83110452A TW 83110452 A TW83110452 A TW 83110452A TW 255845 B TW255845 B TW 255845B
Authority
TW
Taiwan
Prior art keywords
target element
detecting
surface defects
detecting surface
powder
Prior art date
Application number
TW83110452A
Other languages
Chinese (zh)
Inventor
Toshio Endo
Tomiichi Yagi
Ryuzo Yamada
Nobuo Ishikawa
Taizo Yano
Original Assignee
Daido Steel Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP12302094A external-priority patent/JP3353459B2/en
Application filed by Daido Steel Co Ltd filed Critical Daido Steel Co Ltd
Application granted granted Critical
Publication of TW255845B publication Critical patent/TW255845B/en

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  • Investigating Or Analyzing Materials Using Thermal Means (AREA)

Abstract

A process of detecting surface defects for the target element, which comprises the following steps: (1) coating a layer of powder on the target element (e.g., through electrostatic attraction force); (2) locally heating the surface of the target element through high frequency induction heating; (3) detecting the surface temperature distribution of the target element which has been covered by the powder through measuring the energy emitted by the surface of the target element by using a radiation thermometer; and (4) detecting the defect of the element from the surface temperature distribution.
TW83110452A 1994-05-11 1994-11-11 Process of detecting surface defects for the target element and its device TW255845B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12302094A JP3353459B2 (en) 1993-05-17 1994-05-11 Inspection method and apparatus

Publications (1)

Publication Number Publication Date
TW255845B true TW255845B (en) 1995-09-01

Family

ID=14850244

Family Applications (1)

Application Number Title Priority Date Filing Date
TW83110452A TW255845B (en) 1994-05-11 1994-11-11 Process of detecting surface defects for the target element and its device

Country Status (2)

Country Link
CN (1) CN1100259C (en)
TW (1) TW255845B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7214941B2 (en) * 2004-12-16 2007-05-08 The Gillette Company Crack detection in razor blades
JP4991893B2 (en) * 2010-03-16 2012-08-01 常陽機械株式会社 Method and apparatus for determining pass / fail of minute diameter wire bonding
EP2375243B1 (en) * 2010-04-08 2023-06-07 Institut Dr. Foerster Gmbh & Co. Kg Thermographic testing method and device for carrying out the testing method
JP5751998B2 (en) * 2010-09-29 2015-07-22 ユニ・チャーム株式会社 State quantity distribution measuring apparatus and method for measuring state quantity distribution of sample

Also Published As

Publication number Publication date
CN1100259C (en) 2003-01-29
CN1123912A (en) 1996-06-05

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