TW305064B - - Google Patents
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- Publication number
- TW305064B TW305064B TW085103216A TW85103216A TW305064B TW 305064 B TW305064 B TW 305064B TW 085103216 A TW085103216 A TW 085103216A TW 85103216 A TW85103216 A TW 85103216A TW 305064 B TW305064 B TW 305064B
- Authority
- TW
- Taiwan
- Prior art keywords
- nitrogen
- layer
- doped
- gap
- epitaxial
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/8215—Bodies characterised by crystalline imperfections, e.g. dislocations; characterised by the distribution of dopants, e.g. delta-doping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02387—Group 13/15 materials
- H01L21/02392—Phosphides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
- H01L21/0254—Nitrides
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
- H01L21/02543—Phosphides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/0257—Doping during depositing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02623—Liquid deposition
- H01L21/02625—Liquid deposition using melted materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02623—Liquid deposition
- H01L21/02628—Liquid deposition using solutions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/013—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
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- H10P14/263—
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- H10P14/265—
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- H10P14/2909—
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- H10P14/3416—
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- H10P14/3418—
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- H10P14/3438—
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Led Devices (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6777895A JP3104218B2 (ja) | 1995-03-27 | 1995-03-27 | 窒素ドープGaPエピタキシャル層の成長方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW305064B true TW305064B (enExample) | 1997-05-11 |
Family
ID=13354761
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW085103216A TW305064B (enExample) | 1995-03-27 | 1996-03-18 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US5985023A (enExample) |
| EP (1) | EP0735599A3 (enExample) |
| JP (1) | JP3104218B2 (enExample) |
| TW (1) | TW305064B (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103173715B (zh) * | 2012-12-19 | 2014-10-29 | 常州星海电子有限公司 | 一种制备GaP薄膜材料的方法 |
| US11056338B2 (en) * | 2018-10-10 | 2021-07-06 | The Johns Hopkins University | Method for printing wide bandgap semiconductor materials |
| US11823900B2 (en) | 2018-10-10 | 2023-11-21 | The Johns Hopkins University | Method for printing wide bandgap semiconductor materials |
| CN114420801A (zh) * | 2021-12-20 | 2022-04-29 | 江西兆驰半导体有限公司 | 一种发光二极管外延片制备方法及外延片 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3964940A (en) * | 1971-09-10 | 1976-06-22 | Plessey Handel Und Investments A.G. | Methods of producing gallium phosphide yellow light emitting diodes |
| US4001056A (en) * | 1972-12-08 | 1977-01-04 | Monsanto Company | Epitaxial deposition of iii-v compounds containing isoelectronic impurities |
| US3931631A (en) * | 1973-07-23 | 1976-01-06 | Monsanto Company | Gallium phosphide light-emitting diodes |
| CA1019827A (en) * | 1973-10-26 | 1977-10-25 | Tatsuro Beppu | Method of manufacturing a gallium phosphide light-emitting device |
| US4101920A (en) * | 1975-01-29 | 1978-07-18 | Sony Corporation | Green light emitting diode |
| JP3042566B2 (ja) * | 1992-08-19 | 2000-05-15 | 信越半導体株式会社 | GaP系発光素子基板の製造方法 |
| JP3324102B2 (ja) * | 1993-11-22 | 2002-09-17 | 信越半導体株式会社 | エピタキシャルウェーハの製造方法 |
| JP3163217B2 (ja) * | 1994-05-31 | 2001-05-08 | シャープ株式会社 | 発光ダイオード及びその製造方法 |
-
1995
- 1995-03-27 JP JP6777895A patent/JP3104218B2/ja not_active Expired - Fee Related
-
1996
- 1996-03-18 TW TW085103216A patent/TW305064B/zh active
- 1996-03-20 EP EP96104395A patent/EP0735599A3/en not_active Withdrawn
- 1996-03-22 US US08/620,158 patent/US5985023A/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH08264467A (ja) | 1996-10-11 |
| EP0735599A3 (en) | 1999-05-12 |
| EP0735599A2 (en) | 1996-10-02 |
| JP3104218B2 (ja) | 2000-10-30 |
| US5985023A (en) | 1999-11-16 |
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