TW222032B - - Google Patents
Info
- Publication number
- TW222032B TW222032B TW081104225A TW81104225A TW222032B TW 222032 B TW222032 B TW 222032B TW 081104225 A TW081104225 A TW 081104225A TW 81104225 A TW81104225 A TW 81104225A TW 222032 B TW222032 B TW 222032B
- Authority
- TW
- Taiwan
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Tests Of Electronic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Logic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3254801A JP2827062B2 (ja) | 1991-09-04 | 1991-09-04 | 集積回路 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW222032B true TW222032B (US20090192370A1-20090730-C00001.png) | 1994-04-01 |
Family
ID=17270084
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW081104225A TW222032B (US20090192370A1-20090730-C00001.png) | 1991-09-04 | 1992-05-29 |
Country Status (6)
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5644251A (en) * | 1993-04-22 | 1997-07-01 | Lsi Logic Corporation | Switchable pull-ups and pull-downs for IDDQ testing of integrated circuits |
| JP3415347B2 (ja) * | 1995-10-25 | 2003-06-09 | Ｎｅｃエレクトロニクス株式会社 | マイクロコンピュータの動作モード設定用入力回路 |
| US5787096A (en) * | 1996-04-23 | 1998-07-28 | Micron Technology, Inc. | Circuit and method for testing an integrated circuit |
| US5870408A (en) * | 1996-04-30 | 1999-02-09 | Sun Microsystems, Inc. | Method and apparatus for on die testing |
| US5727001A (en) * | 1996-08-14 | 1998-03-10 | Micron Technology, Inc. | Circuit and method for testing an integrated circuit |
| US5754559A (en) * | 1996-08-26 | 1998-05-19 | Micron Technology, Inc. | Method and apparatus for testing integrated circuits |
| FR2787912B1 (fr) * | 1998-12-23 | 2001-03-02 | St Microelectronics Sa | Circuit electronique configurable |
| DE10064478B4 (de) * | 2000-12-22 | 2005-02-24 | Atmel Germany Gmbh | Verfahren zur Prüfung einer integrierten Schaltung und Schaltungsanordnung |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5578355A (en) * | 1978-12-08 | 1980-06-12 | Nec Corp | Semiconductor integrated circuit |
| US4424460A (en) * | 1981-07-14 | 1984-01-03 | Rockwell International Corporation | Apparatus and method for providing a logical exclusive OR/exclusive NOR function |
| JPS5899033A (ja) * | 1981-12-09 | 1983-06-13 | Nec Corp | 集積回路装置 |
| JPS59200456A (ja) * | 1983-04-27 | 1984-11-13 | Hitachi Ltd | 半導体集積回路装置 |
| JPS61208315A (ja) * | 1985-03-12 | 1986-09-16 | Mitsubishi Electric Corp | 半導体集積回路装置 |
| JPS6337268A (ja) * | 1986-07-31 | 1988-02-17 | Fujitsu Ltd | 半導体装置の試験装置 |
| JPH01280923A (ja) * | 1988-05-07 | 1989-11-13 | Mitsubishi Electric Corp | 半導体集積回路装置 |
| JPH02278171A (ja) * | 1989-04-19 | 1990-11-14 | Seiko Epson Corp | 半導体装置 |
| JP2832994B2 (ja) * | 1989-04-21 | 1998-12-09 | 日本電気株式会社 | 半導体集積回路 |
| JPH0328781A (ja) * | 1989-06-27 | 1991-02-06 | Mitsubishi Electric Corp | 半導体集積回路 |
-
1991
- 1991-09-04 JP JP3254801A patent/JP2827062B2/ja not_active Expired - Lifetime
-
1992
- 1992-05-28 KR KR1019920009119A patent/KR970001839B1/ko not_active IP Right Cessation
- 1992-05-29 EP EP92304959A patent/EP0535776B1/en not_active Expired - Lifetime
- 1992-05-29 TW TW081104225A patent/TW222032B/zh not_active IP Right Cessation
- 1992-05-29 DE DE69215184T patent/DE69215184T2/de not_active Expired - Lifetime
-
1994
- 1994-06-23 US US08/264,770 patent/US5475330A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JP2827062B2 (ja) | 1998-11-18 |
| JPH0560845A (ja) | 1993-03-12 |
| US5475330A (en) | 1995-12-12 |
| DE69215184T2 (de) | 1997-04-03 |
| KR970001839B1 (ko) | 1997-02-17 |
| EP0535776A1 (en) | 1993-04-07 |
| DE69215184D1 (de) | 1996-12-19 |
| KR930006875A (ko) | 1993-04-22 |
| EP0535776B1 (en) | 1996-11-13 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MK4A | Expiration of patent term of an invention patent |