TW202532B - Testing apparatus - Google Patents

Testing apparatus Download PDF

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Publication number
TW202532B
TW202532B TW081102514A TW81102514A TW202532B TW 202532 B TW202532 B TW 202532B TW 081102514 A TW081102514 A TW 081102514A TW 81102514 A TW81102514 A TW 81102514A TW 202532 B TW202532 B TW 202532B
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Taiwan
Prior art keywords
test
circuit board
item
test device
cylinder
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TW081102514A
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Chinese (zh)
Inventor
Tze Tsun Chan
Wai Keung Lam
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Centalic Tech Dev Ltd
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06705Apparatus for holding or moving single probes

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  • Engineering & Computer Science (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

Testing apparatus comprises means to effect an isolation test on a circuit board, the isolation test means being also used to effect a continuity test on the same circuit board in combination with other means.

Description

經濟部屮央標準沿A工消作合作杜印32. UKfiJ Λ 6 _Ιί_6__ 五、發明説明(1 ) 本發明僳閎於用於電路板單元,例如:印刷電路板( P C B )之測試糸統。 本發明的一個目的在提供,較某些傳统式測試条統, 要高之對PC B s之测試速率。 依照本發明之測試裝置包括:對電路板,實施單獨試 驗之設備,該單獨試驗設備亦連同其他設備,被使用來對 相同m路板,實施通路测試。 適當地,單獨試驗設備是接觸電路板上,某一點之一 支探針,藉核對電路板中之任何短路。 有利地,為了檔接電路板上之兩點,除去連同單獨試 驗設備而實施通路測試以外,該設備是支持至少一條片之 導電橡膠之構件,藉以核對霣路板中之任何線路斷裂。 該支持構件宜經由圓柱形工具,向著及遠離電路板而移 動。 當與較早技藝相比較時,本發明減少測試過程中所耗 之時間。而且,亦減少了固定物和維護之成本。 每一測試裝置適當使用一具小型氣動式汽缸,它通過 一具經由完全計算機化条統予以控制之一具旁通閥予以促 動。 該支持構件,適當包括經安裝在一個金屬平台上之溝 槽中的導電材料。將部份的導電材料曝露在平台表面上方 ,β便與電路板相接觸。圓筒工具的作用是將導電材料壓 在電路板上,以便:可以實現電路板的通路測試。 該裝置提供:具有SΜΤ (表面安裝工藝學)之所有 本紙張尺度边用中Β明家樣準(CNS)T4規格(210X297公*) 81. 2· 20,000 (請先閲讀背而之注意事項#艰寫4^0 裝- 線. 一 3 — hi 02532 五、發明説明(2 ) 稠密且高密度裸板之精確試驗。該裝置特別連同「自動導 電橡膠試驗」(ACRT)糸統而使用。 龙發明之儸點 1. 經由減少目前糸統的測試週期數目,而增加製造 生産量。 2. 經由導電材料代替探針,減少了關於探針之成本 及維護成本。此亦具有一個另外優點,因為:某些SMT 墊片之密度是太高,以致甚致細節距探針不能應用。 3. 經由容許對試驗中之單元的圔型移位之較大容限 ,而提供流暢試驗操作。 4. 於試驗高密度SMT (表面安裝工藉學)填襯板 時之較高之準確性。 5. 因為導電材料並不佔據任何引線源,所以可以增 加該糸統的測試引線之數目。 6. 減少導電材料糸統之維護過程,因此,減少維護 之費用及時間。 本發明現在參照附隨之圖式,經由實例予以敘述,在 圖式中: 圖1是依照本發明之測試裝置的側截面圖(呈其單獨 試驗狀況); 圖2是圖1裝置的側截面圖,(呈其通路測試狀況) ;及 圖3是裸板的示意圖。 本紙5IL尺度边用中a Β家猱毕(CHS) «Μ規格(210X297公龙) (請先閲請背而之注意事項#蜞寫4|,, 裝- -線· 經濟部屮央榀準而员工消费合作杜印製 81. 2. 20,000 -4 - Λ ·' C ο <3 經濟部屮央榣準沁Α工消伢合作杜印3i \Jf ~ ~ - 五、發明説明(3 ) 在圖1及圖2中,顯示測試裝置10,造成單獨試驗 和通路測試在一片印刷電路板1 2上。 尤其,該裝置包括形式為探針14之一値單獨試驗構 件,此探針可上下而移動來接觸印刷電路板上之某些點( 參閲:圖1 )。 在圖2中,顯示相同裝置來從事通路测試在印刷電路 板上。 尤其,該單獨探針連同支持由導電橡膠所造成之掩蔽 18之一個構件16 (此掩蔽可檔接印刷電路板上之兩點 )共同作用而産生通路測試特徴。 該裝置包括:一種圓筒形機構20,用以上下移動支 持構件16向著及遠離印刷電路板。 該項設備,經由一種糸統控制器予以控制,其細節如 下: 备統捽制器 該条統控制器單元辯識:是否使用人選擇係由核對一 個次操作表v産物组態〃中之一値參數a ACRT狀態" 而選擇測試功能。 如果將* A C R T狀態〃設定在 ''開〃,則該糸統控 制器會測試並學習具有A C R T功能之P C B。 使用ACRT, PCB將以兩種不同過程予以學習。 尤其,具有ACRT功能之PCB的資料檔包括兩不同组 的數據。首先學習數據(數據1),在導電橡膠18與受 (請先閲讀背而之注意事項#项寫4,丨 裝. 線. 本紙張尺度边用中as家楳毕(CHS)T4規格(2丨0X297公;¢) 81. 2. 20,000 -5 - Γν Λ β Β6 五、發明説明(4 ) 試驗之板1 2間無接觸,然後學習數據(數據2),使導 電橡膠與受試驗之板間相接觸。 於試驗時,根據兩不同組的數據,將PCB使用兩種 不同過程予以試驗。首先,使導電橡膠與受試驗之板相接 觸,並根據數據2的資訊,開始測試。然後,使導電橡膠 不與受試驗之板接觸,並根據數據1,開始測試。 該条統控制器控制裝置中之圓筒的形態。如果須要導 電橡膠18,與受試驗之板12相接觸,則控制器會發出 一痼信號,使圓筒向上移動,在其他情況,控制器會發出 另外信號,使圓筒向下移動。 氣動之汽缸(圓筒)20 (使用它來啓動平台16之 作用)傜在計算機的全控制下。此構造使測試操作能在多 適應試驗之一個周期中最適化。 述及圔3,顯示部份的PCB12在試驗中。尤其, 顯示PCB上之兩接鄰SMT墊片22和24,具有其相 對應之終端或分支終端,經由試驗探針26與28相接觭 。採用特別導電材料30充作兩個SMT墊片22和24 間之'N導電檔接/短路〃。 學習和試驗歴程包括兩種狀態。在第一階段中,導電 材料30像與每一個SMT墊片(即22和24)相接觭 ,以便將短路徑提供在每一 S Μ T墊片間。將在每支測試 探針上之'''開/短路"讀數處理成為第一組的數據(即: 通路測試)。在第二階段中,將特殊導電材料3 0與每一 個SMT墊片(即:22和24)相隔離。將在每支測試 (請先閲讀背而之注意事項#埸寫4, 裝- -線· 經濟部屮央榀準而β工消奸合作社印3i 本紙张尺度边用中困國家梂準(CNS) T4規格(210X297公*) 81. 2. 20,000 03533 五、發明説明(5) 探針上之另外''開/短路〃謓數處理成為第二組之數據( 即:單獨試驗)。 試驗程序將採用此等兩组的數據作為基準,來與經由 在兩階段中,受試驗之單元所産生之數據相比較。然而, 上述之所有測試階段並不需要移去受試驗之單元,或移動 裝置(圓筒汽缸除外)。所設置之該機構,在僅一個周期 中,完成測驗。 操作 1.學習具有ACRT功能之測試程式: a .選擇''条統組態〃和''産物組態"的正確參 數。在次操作表 > 産物组態"中,應將NN ACRT狀態〃 設定為&開〃。 b .選擇次操作表 ''測試/學習"。 c .選擇a開始學習"項目。 d. 嵌入一片 ''已知良好〃PCB在裝置上。 e. 使圓筒按壓導電橡膠,與PCB相緊貼。 f. 當完成學習時,機器會顯示:PCB的短路 點數目及開點數目,又如有短路點存在,則核對總誤差。 g. 儲存測試圔型。 2.測試具有ACRT功能之PCB : a.負載受試驗之板的資料檔,如果它已被儲存在磁 碟上。否則,在測試前,學習該板。 本紙張尺度逍用中a國家楳毕(CNS)T4規格(210><297公釐) 81. 2. 20,000 一 7 - (請先閲-ift背而之注意事項#堝寫4Wr 裝. 線. 經濟部屮央榀準:5Α工消费合作社印^ 經濟部屮央榀準·知β工消作合作杜印奴 五、發明説明(6 ) b .選擇"条统组態〃和"産物组態"的正確參數。 保證:將次操作表> 産物组態"中之> ACRT狀態〃設 定為a開"。 c .選擇次操作表 ''測試/學習〃。 d .選擇 > 開始測試〃項目。 e. 嵌一片PCB在裝置上。 f. 使圓筒按壓導電橡膠,與PCB相緊貼。 g. 當測試结束時,汽缸(圓筒)會向上,而機器會 顯示:是否該板通過測試或未通過。 該機器的優點可以經由下列各點見到: 1. 節省了細節距探針,以致減少了測試探針及其維 護之成本。 2. 構造該裝置甚少困難,尤其關於容限度之控制, 它暗示成本節約。 3 .因為導電材料並不佔據任何引線源.所以可以實 際上,增加該糸統的測試引線數目。 4. 因為ACRT接受試驗中之單元的圖型移位之大 容限,所以可以放釋:容限中,緊密生産管制的壓力以及 大為減少錯誤退貨之良好板的實例。 5. 容易維護(僅置換導電材料)暗示:流暢之生産 作業進行及減少維護成本。 ACRT是一種優良工具用來測試臭有SMT (表面 安裝工藝學)之PCB,連合在單面,雙面和多層電路板 上之晶片(C Ο B )。 本紙張尺度边用中明國家楳毕(CNS)T4規怙(210X297公及) 81. 2. 20,000The Ministry of Economic Affairs and the National Standards cooperated with A to produce 32. UKfiJ Λ 6 _Ιί_6__ V. Description of the invention (1) The invention is applied to the test system of circuit board units, such as printed circuit boards (PCB). An object of the present invention is to provide a higher test rate for PC B s than some traditional test systems. The test device according to the present invention includes: a device that performs a separate test on a circuit board. The separate test device is also used in conjunction with other devices to perform a path test on the same m-way board. Suitably, the individual test equipment is to touch a probe at a certain point on the circuit board, by checking for any short circuit in the circuit board. Advantageously, in order to connect the two points on the circuit board, the device is a member that supports at least one piece of conductive rubber except for conducting the path test in conjunction with a separate test device to check for any wire breakage in the board. The support member is preferably moved toward and away from the circuit board via a cylindrical tool. When compared to earlier techniques, the invention reduces the time spent in the testing process. Moreover, it also reduces the cost of fixtures and maintenance. Each test device suitably uses a small pneumatic cylinder, which is actuated by a bypass valve controlled by a fully computerized system. The support member suitably includes conductive material installed in a groove on a metal platform. Exposing part of the conductive material above the surface of the platform, β comes into contact with the circuit board. The role of the cylindrical tool is to press the conductive material against the circuit board, so that: the circuit board can be tested. The device provides: All the paper standard SMB (Surface Mounting Technology) with the standard B Mingjia sample standard (CNS) T4 specifications (210X297 public *) 81. 2 · 20,000 (please read the notes beforehand # Hard to write 4 ^ 0 pack-line. One 3 — hi 02532 5. Description of the invention (2) Accurate test of dense and high-density bare board. This device is especially used in conjunction with the “Automatic Conductive Rubber Test” (ACRT) system. Long Point of the invention 1. Increase the manufacturing throughput by reducing the number of current test cycles of the system. 2. Replacing the probe with conductive materials reduces the cost and maintenance cost of the probe. This also has an additional advantage because : The density of some SMT gaskets is too high, so that even fine-pitch probes cannot be applied. 3. Provide a smooth test operation by allowing a large tolerance for the sigmoidal displacement of the unit under test. 4. High accuracy when testing high-density SMT (Surface Mounter Learning) filling liners. 5. Because conductive materials do not occupy any lead source, the number of test leads for this system can be increased. 6. Reduce Dimension of conductive materials The maintenance process, therefore, reduces the cost and time of maintenance. The present invention will now be described by way of example with reference to the accompanying drawings. In the drawings: FIG. 1 is a side cross-sectional view of the test device according to the present invention (in its separate test Status); Figure 2 is a side cross-sectional view of the device of Figure 1, (in its path test status); and Figure 3 is a schematic diagram of the bare board. The paper is used in 5IL scale side a Β 家 熱 比 (CHS) «Μ specification (210X297 Gonglong) (please read the notes before you go back # 蜞 写 4 | ,, outfitting--line · Ministry of Economic Affairs, Jiyang, and employee consumption cooperation du printing 81. 2. 20,000 -4-Λ · 'C ο < 3 The Ministry of Economic Affairs, the central government, and the Qin Qin A industrial consumer cooperation Du Yin 3i \ Jf ~ ~-V. Description of the invention (3) In FIGS. 1 and 2, the test device 10 is shown, resulting in separate tests and access tests On a printed circuit board 12. In particular, the device includes a single test member in the form of a probe 14 that can move up and down to contact certain points on the printed circuit board (see: Figure 1) In Figure 2, the same device is shown to perform the path test on the printed circuit board. In particular, the separate probe Together with a member 16 (this mask can be connected to two points on the printed circuit board) of the mask 18 caused by the conductive rubber, the passage test feature is produced. The device includes: a cylindrical mechanism 20 for up and down The moving support member 16 is directed toward and away from the printed circuit board. The device is controlled by a controller, the details are as follows: Standby controller The controller unit is identified: Whether the user chooses is checked by one One of the values in the secondary operation table v product configuration 〃 a ACRT status " and select the test function. If the * ACRT state is set to "ON", the controller will test and learn the PCB with ACRT function. With ACRT, PCB will learn in two different processes. In particular, the data file of the PCB with ACRT function includes two different sets of data. First learn the data (Data 1), in the conductive rubber 18 and receive (please read back to the precautions #Item write 4, 丨 installed. Line. This paper scale is used in the middle of the home (CHS) T4 specification (2丨 0X297 public; ¢) 81. 2. 20,000 -5-Γν Λ β Β6 5. Description of the invention (4) There is no contact between the test board 1 and 2 and then learn the data (data 2) to make the conductive rubber and the tested board During the test, according to two different sets of data, the PCB is tested using two different processes. First, the conductive rubber is brought into contact with the tested board, and the test is started according to the information in data 2. Then, Keep the conductive rubber out of contact with the tested board and start the test according to data 1. The controller controls the shape of the cylinder in the device. If conductive rubber 18 is required to contact the tested board 12, control The device will send a signal to move the cylinder upwards, in other cases, the controller will send another signal to move the cylinder downwards. Pneumatic cylinder (cylinder) 20 (Use it to start the role of platform 16) Under the full control of the computer. The operation can be optimized in one cycle of the multi-adaptation test. As mentioned in Fig. 3, the PCB 12 of the display part is in the test. In particular, the two adjacent PCB SMT pads 22 and 24 on the display have their corresponding terminals or The branch terminal is connected to each other via the test probes 26 and 28. The special conductive material 30 is used as the 'N conductive stop / short circuit' between the two SMT pads 22 and 24. The learning and test process includes two states. In the first stage, the conductive material 30 is connected to each SMT pad (that is, 22 and 24) in order to provide a short path between each S M T pad. ”Open / Short” readings are processed into the first set of data (ie: via test). In the second stage, the special conductive material 30 is isolated from each SMT pad (ie: 22 and 24). It will be tested in each branch (please read the back-end notes first # 埸 写 4, install--line · The Ministry of Economic Affairs is accurate and the β 工 殺 榮 合 社 cooperative prints 3i. This paper scale is used in the trapped countries (CNS ) T4 specification (210X297 g *) 81. 2. 20,000 03533 V. Description of the invention (5) Another '' open / short circuit '' on the probe Processed into the second set of data (ie: separate test). The test program will use the data of these two sets as a benchmark to compare with the data generated by the unit under test in two stages. However, the above It is not necessary to remove the tested unit or mobile device (except the cylinder) in all test stages. The set-up mechanism completes the test in only one cycle. Operation 1. Learn the test program with ACRT function: a .Choose the correct parameters of "Configuration" and "Product Configuration". In the sub-operation table > product configuration ", the NN ACRT status should be set to & on. b. Select the sub-operation table "Test / Learn". c. Choose a to start learning " project. d. Embed a '' known good '' PCB on the device. e. Press the cylinder against the conductive rubber to closely adhere to the PCB. f. When the learning is completed, the machine will display: the number of short-circuit points and the number of open points of the PCB, and if there are short-circuit points, check the total error. g. Store the test pattern. 2. Test the PCB with ACRT function: a. Load the data file of the tested board, if it has been stored on the disk. Otherwise, learn the board before testing. The size of this paper is easy to use in China National Standards (CNS) T4 specification (210 > < 297mm) 81. 2. 20,000 a 7-(please read the -ift back to the precautions # 锅 写 4Wr 装. 线. The Ministry of Economic Affairs 'quasi-preparation: 5Α 工 consumer cooperative cooperative seal ^ The Ministry of Economic Affairs' quasi-professional · know β work elimination cooperation Duinu V. Invention description (6) b. Choose " Regular configuration〃 and " The correct parameters of the product configuration " Guarantee: Set the secondary operation table > product configuration " of the > ACRT status 〃 set to a open ". c. Select the secondary operation table `` test / learning ''. D .Select > Start the test 〃 item. E. Embed a piece of PCB on the device. F. Press the cylinder against the conductive rubber to fit closely with the PCB. G. When the test is over, the cylinder (cylinder) will be up and the machine It will show: whether the board passed the test or failed. The advantages of the machine can be seen through the following points: 1. The detail distance probe is saved, so that the cost of the test probe and its maintenance is reduced. 2. Construct the device Very few difficulties, especially with regard to the control of tolerance, which implies cost savings. 3. Because conductive materials do not occupy He lead source. So you can actually increase the number of test leads for this system. 4. Because ACRT accepts the large tolerance of the pattern shift of the unit under test, it can be released: within the tolerance, tight production control Examples of pressure and a good board that greatly reduces false returns. 5. Easy maintenance (replacement of conductive materials only) implies: smooth production operations and reduced maintenance costs. ACRT is an excellent tool for testing stinky SMT (surface mounting process) PCB) connected to single-sided, double-sided and multi-layer circuit boards (C Ο B). This paper scale is based on the Zhongming National Science and Technology (CNS) T4 regulations (210X297) and 81. 2. 20,000

Claims (1)

?________.....---------..一,…一A7 L b3 ; 方^Y'.t" λ ’a i C7 __丨:航 1_1_ D7_ 六、申請專利範圍 第8 1 1 025 14號專利申請案 中文申請專利範圍修正本 民國81年11月修正 1· 一種測試裝置包括:在電路板上,實施單獨試驗 之設備,該單獨試驗設備亦連同其他設備,被使用來對相 同電路板,實施通路测試, 單獨試驗設備是接觴電路板上之某一黏的一支探針, 除去連同單獨設試驗設備而實施通路測試以外,該設 備是支持至少一條片的導電橡膠之構件,它在一起來接觸 電路板上之兩點。 2. 如申請專利範圍第1項之測試裝置,其中,支持 構件像經由圓筒(或汽缸)設備,向著及遠離電路板而移 動。 3. 如申請專利範圍第2項之测試裝置,其中,圓筒 設備是一具氣動式汽缸,它通過一具經由完全計算機化条 统予以控制之一具旁通閥予以促動。 經濟部中央標準局员工消費合作社印製 4. 如申請專利範圍第1項之测試裝置,其中,該支 持構件適當包括:經安裝在一具金屬平台上之各槽中之導 電材料。 5. 如申請專利範圍第4項之測試裝置,其中,將部 份的導電材料曝露在平台的表面上方,以便與受試驗之電 路板相接觸。 6. 如申請專利範圍或第4或第5項之測試裝置,其 中,圓筒設備按壓導電材料在欲予試驗之電路板上。 81,9.10,000 (請先閲讀背面之注意事项再填窝本頁) 本紙張尺度適用中國國家標準(CNS)甲4規格(210 X 297公釐)? ________.....--------- .. one, ... one A7 L b3; Fang ^ Y'.t " λ 'ai C7 __ 丨: 航 1_1_ D7_ 8 1 1 025 Patent Application No. 14 Chinese Application for Amendment of Patent Scope Amended in November 1981 1. A test device includes: a device that performs a separate test on a circuit board, the separate test device is also used along with other devices To perform path testing on the same circuit board, the separate test equipment is a sticky probe that is attached to a certain circuit board. Except for performing the path test together with the separate test equipment, the device supports at least one chip. The conductive rubber component, which comes together to contact two points on the circuit board. 2. The test device as claimed in item 1 of the patent scope, in which the supporting member moves toward and away from the circuit board like a cylinder (or cylinder) device. 3. The test device as claimed in item 2 of the patent scope, in which the cylinder device is a pneumatic cylinder, which is actuated by a bypass valve controlled by a fully computerized system. Printed by the Employee Consumer Cooperative of the Central Bureau of Standards of the Ministry of Economic Affairs 4. For example, the test device of patent application scope item 1, where the supporting member suitably includes: conductive materials installed in grooves on a metal platform. 5. A test device as claimed in item 4 of the patent application, in which part of the conductive material is exposed above the surface of the platform so as to be in contact with the circuit board under test. 6. For example, the scope of patent application or the test device of item 4 or 5, in which the cylindrical device presses the conductive material on the circuit board to be tested. 81,9.10,000 (Please read the precautions on the back before filling the nest page) This paper size is applicable to China National Standard (CNS) A 4 specifications (210 X 297 mm)
TW081102514A 1992-03-20 1992-03-31 Testing apparatus TW202532B (en)

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GB9206068A GB2265224B (en) 1992-03-20 1992-03-20 Testing apparatus

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GB (1) GB2265224B (en)
HK (1) HK141396A (en)
TW (1) TW202532B (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2278965B (en) * 1993-06-07 1997-08-27 Centalic Tech Dev Ltd Testing Apparatus
GB2311175A (en) * 1996-03-15 1997-09-17 Everett Charles Tech PCB / test circuitry connection interface with short circuiting means
JPH11214450A (en) * 1997-11-18 1999-08-06 Matsushita Electric Ind Co Ltd Electronic part mounting body, electronic apparatus using the same and method for manufacturing electronic part mounting body
EP0989409A1 (en) * 1998-09-23 2000-03-29 Delaware Capital Formation, Inc. Scan test machine for densely spaced test sites
US6268719B1 (en) 1998-09-23 2001-07-31 Delaware Capital Formation, Inc. Printed circuit board test apparatus
JP2000346895A (en) * 1999-06-01 2000-12-15 Shin Etsu Polymer Co Ltd Inspection jig for electronic circuit board
US6788078B2 (en) 2001-11-16 2004-09-07 Delaware Capital Formation, Inc. Apparatus for scan testing printed circuit boards

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4012693A (en) * 1975-07-16 1977-03-15 Sullivan Donald F Printed circuit board testing
US4056773A (en) * 1976-08-25 1977-11-01 Sullivan Donald F Printed circuit board open circuit tester
US4571542A (en) * 1982-06-30 1986-02-18 Japan Synthetic Rubber Co., Ltd. Method and unit for inspecting printed wiring boards
GB2156532B (en) * 1984-03-24 1988-07-20 Plessey Co Plc Apparatus for testing a printed circuit board
ATE56280T1 (en) * 1986-06-25 1990-09-15 Mania Gmbh METHOD AND DEVICE FOR ELECTRICAL TESTING OF CIRCUIT BOARDS.
FR2617977B1 (en) * 1987-07-08 1990-01-05 Centre Nat Rech Scient PRINTED CIRCUIT TEST APPARATUS
GB2215064B (en) * 1988-01-30 1992-06-10 Gen Electric Co Plc Testing printed circuit boards

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KR100320075B1 (en) 2002-03-20
HK141396A (en) 1996-08-09
GB2265224B (en) 1996-04-10
GB9206068D0 (en) 1992-05-06
CN1042673C (en) 1999-03-24
KR930021047A (en) 1993-10-20
GB2265224A (en) 1993-09-22
CN1076785A (en) 1993-09-29

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