TW202410212A - Bending correction system and manufacturing system - Google Patents

Bending correction system and manufacturing system Download PDF

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TW202410212A
TW202410212A TW112122328A TW112122328A TW202410212A TW 202410212 A TW202410212 A TW 202410212A TW 112122328 A TW112122328 A TW 112122328A TW 112122328 A TW112122328 A TW 112122328A TW 202410212 A TW202410212 A TW 202410212A
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substrate
formed substrate
processing device
bend
aforementioned
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早川海斗茂
渡邊創
吉岡翔
坂上雄哉
細見隆也
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日商Towa股份有限公司
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Abstract

本發明的問題是要提供一種彎曲矯正系統及包含該彎曲矯正系統的製造系統,該彎曲矯正系統包含自加工裝置獨立的彎曲矯正裝置,且易於將成形完畢基板自彎曲矯正裝置搬送至加工裝置。本發明的解決手段的彎曲矯正系統具備:彎曲矯正裝置與中繼部。彎曲矯正裝置,矯正第一成形完畢基板的彎曲,並製造第二成形完畢基板。中繼部,被配置在彎曲矯正裝置的外部的加工裝置與彎曲矯正裝置之間。加工裝置,進行第二成形完畢基板的加工。中繼部包含:第一搬送機構,其自彎曲矯正裝置接收第二成形完畢基板,並將第二成形完畢基板搬送至加工裝置。The problem of the present invention is to provide a bend correction system and a manufacturing system including the bend correction system. The bend correction system includes a bend correction device independent from the processing device, and it is easy to transport the formed substrate from the bend correction device to the processing device. A curve correction system according to the solution of the present invention includes a curve correction device and a relay unit. The bend correction device corrects the bend of the first formed substrate and manufactures the second formed substrate. The relay unit is disposed between the external processing device of the bend correction device and the bend correction device. The processing device processes the second formed substrate. The relay unit includes a first transport mechanism that receives the second formed substrate from the bend correction device and transports the second formed substrate to the processing device.

Description

彎曲矯正系統及製造系統Bending correction system and manufacturing system

本發明關於彎曲矯正系統及製造系統。The present invention relates to a bend correction system and a manufacturing system.

日本特開2014-192434號公報(專利文獻1)揭示一種標記裝置。該標記裝置包含:液滴吐出裝置、基板彎曲矯正裝置。該標記裝置中,藉由基板彎曲矯正裝置矯正基板的彎曲後,藉由液滴吐出裝置對基板施加標記(參照專利文獻1)。Japanese Patent Application Publication No. 2014-192434 (Patent Document 1) discloses a marking device. The marking device includes a droplet ejection device and a substrate bend correction device. In this marking device, after the bend of the substrate is corrected by the substrate bend correction device, the substrate is marked by the droplet ejection device (see Patent Document 1).

[先前技術文獻] (專利文獻) 專利文獻1:日本特開2014-192434號公報 [Prior technical literature] (patent document) Patent Document 1: Japanese Patent Application Publication No. 2014-192434

(發明所欲解決的問題) 對成形完畢基板的彎曲加以矯正的彎曲矯正裝置與對彎曲已被矯正過的成形完畢基板施加加工的加工裝置,有時不是一體成型的構成。在這樣的情況中,例如是以手動方式,將彎曲已被矯正過的成形完畢基板自彎曲矯正裝置搬送至加工裝置。然而,以手動方式搬送成形完畢基板不一定有效率。在彎曲矯正裝置自加工裝置獨立的情況中所產生的這種問題之解決手段,在上述專利文獻1並未揭示。 (The problem that the invention aims to solve) The bend correction device that corrects the bend of the molded substrate and the processing device that processes the molded substrate whose bend has been corrected may not be integrally formed. In such a case, the molded substrate whose bend has been corrected is transported from the bend correction device to the processing device manually, for example. However, manually transporting the molded substrate is not necessarily efficient. The above-mentioned Patent Document 1 does not disclose a solution to the problem that occurs when the bend correction device is independent from the processing device.

本發明是為了解決這樣的問題而完成,其目的是要提供一種彎曲矯正系統及包含該彎曲矯正系統的製造系統,該彎曲矯正系統包含自加工裝置獨立的彎曲矯正裝置,且易於將成形完畢基板自彎曲矯正裝置搬送至加工裝置。The present invention was made to solve such problems, and its purpose is to provide a bend correction system and a manufacturing system including the bend correction system. The bend correction system includes a bend correction device independent of the processing device, and is easy to mold the substrate. Transported from the bend correction device to the processing device.

(用於解決問題的手段) 遵照本發明的一面向的彎曲矯正系統具備:彎曲矯正裝置與中繼部。彎曲矯正裝置,矯正第一成形完畢基板的彎曲,並製造第二成形完畢基板。中繼部,被配置在彎曲矯正裝置的外部的加工裝置與彎曲矯正裝置之間。加工裝置,進行第二成形完畢基板的加工。中繼部包含:第一搬送機構,其自彎曲矯正裝置接收第二成形完畢基板,並將第二成形完畢基板搬送至加工裝置。 (means used to solve problems) A curve correction system according to one aspect of the present invention includes a curve correction device and a relay unit. The bend correction device corrects the bend of the first formed substrate and manufactures the second formed substrate. The relay unit is disposed between the external processing device of the bend correction device and the bend correction device. The processing device processes the second formed substrate. The relay unit includes a first transport mechanism that receives the second formed substrate from the bend correction device and transports the second formed substrate to the processing device.

遵照本發明本發明的另一面向的製造系統具備:上述彎曲矯正系統與上述加工裝置。加工裝置包含:收容部與控制部。收容部,收容第二成形完畢基板。藉由第一搬送機構搬送的第二成形完畢基板被收容於收容部。控制部對應於收容部中的第二成形完畢基板的收容狀態,判定是否可接收第二成形完畢基板。A manufacturing system according to another aspect of the present invention includes the above-mentioned bend correction system and the above-mentioned processing device. The processing device includes: a containment part and a control part. The accommodating part accommodates the second molded substrate. The second molded substrate transported by the first transport mechanism is accommodated in the accommodating portion. The control unit determines whether the second molded substrate can be received depending on the storage state of the second molded substrate in the storage unit.

(發明的功效) 根據本發明,能夠提供一種彎曲矯正系統及包含該彎曲矯正系統的製造系統,該彎曲矯正系統包含自加工裝置獨立的彎曲矯正裝置,且易於將成形完畢基板自彎曲矯正裝置搬送至加工裝置。 (The effect of the invention) According to the present invention, it is possible to provide a bend correction system including a bend correction device independent from a processing device, and a manufacturing system including the bend correction system, in which a molded substrate can be easily transported from the bend correction device to the processing device.

以下針對本發明的一面向之實施型態(以下亦稱為「本實施型態」),使用圖式詳細加以說明。此外,針對圖中相同或相當的部分附加上相同符號,不重複其說明。又,各圖式為了易於理解,會示意性地適當省略或誇飾對象。The following is a detailed description of an embodiment of one aspect of the present invention (hereinafter also referred to as "this embodiment") using drawings. In addition, the same symbols are added to the same or corresponding parts in the drawings, and their descriptions are not repeated. In addition, in order to facilitate understanding, each drawing will schematically omit or exaggerate objects appropriately.

[1.構成] <1-1. 製造系統的構成> 第1圖是示意性表示包含遵照本實施型態之彎曲矯正系統5的製造系統1的正面圖。此外,本說明書所說明的各圖式中,X軸及Y軸的各者表示共通的方向。 [1.Composition] <1-1. Manufacturing system configuration> FIG. 1 is a front view schematically showing a manufacturing system 1 including a bend correction system 5 according to this embodiment. In addition, in each drawing described in this specification, each of the X axis and the Y axis represents a common direction.

如第1圖所示,製造系統1包含:彎曲矯正系統5、切斷裝置20。在製造系統1中,成形完畢基板的彎曲被加以矯正,且藉由切斷彎曲已被矯正後的成形完畢基板來製造複數個電子零件。As shown in FIG. 1 , the manufacturing system 1 includes a bend correction system 5 and a cutting device 20 . In the manufacturing system 1, the curvature of the molded substrate is corrected, and a plurality of electronic components are manufactured by cutting the molded substrate with the curvature corrected.

在成形完畢基板中,例如以樹脂密封有被固定於金屬框架上的半導體晶片。在這樣的成形完畢基板中,例如可能會因金屬框架的熱收縮率與樹脂的熱收縮率不同而產生彎曲。在彎曲矯正系統5中,成形完畢基板的彎曲被加以矯正。本說明書中,亦將彎曲被矯正前的成形完畢基板稱為「第一成形完畢基板」,並將彎曲已被矯正後的成形完畢基板稱為「第二成形完畢基板」。In the molded substrate, a semiconductor wafer fixed to a metal frame is sealed with resin, for example. In such a molded substrate, warping may occur because, for example, the thermal shrinkage rate of the metal frame is different from the thermal shrinkage rate of the resin. In the bend correction system 5, the bend of the formed substrate is corrected. In this specification, the molded substrate before the bend is corrected is also called the "first molded substrate", and the molded substrate after the bend is corrected is called the "second molded substrate".

作為成形完畢基板的一例,可舉出固定有半導體晶片的基板或引線框架被樹脂密封後的基板,及電容器、電阻器等被樹脂密封後的基板。作為成形完畢基板的一例,可舉出:BGA(Ball Grid Array,球柵陣列)封裝基板、LGA(Land Grid Array,平面網格陣列)封裝基板,CSP(Chip Size Package,晶片尺寸封裝)封裝基板、LED(Light Emitting Diode,發光二極體)封裝基板及QFN(Quad Flat No-leaded,四方平面無引腳)封裝基板。Examples of molded substrates include a substrate on which a semiconductor wafer is fixed, a substrate on which a lead frame is sealed with resin, and a substrate on which capacitors, resistors, etc. are sealed with resin. Examples of molded substrates include: BGA (Ball Grid Array, ball grid array) packaging substrate, LGA (Land Grid Array, plane grid array) packaging substrate, CSP (Chip Size Package, chip size package) packaging substrate , LED (Light Emitting Diode, light-emitting diode) packaging substrate and QFN (Quad Flat No-leaded, quad flat no-lead) packaging substrate.

彎曲矯正系統5包含:彎曲矯正裝置10、中繼部30。彎曲矯正裝置10被構成為,將第一成形完畢基板S1的彎曲加以矯正,以製造第二成形完畢基板S2。中繼部30,被固定於彎曲矯正裝置10,且具備第一搬送機構300與治具350。經由治具350,來進行彎曲矯正裝置10相對於切斷裝置20的定位。第一搬送機構300被構成為,自彎曲矯正裝置10接收第二成形完畢基板S2,並將接收到的第二成形完畢基板S2搬送至切斷裝置20。The curve correction system 5 includes a curve correction device 10 and a relay unit 30 . The bend correction device 10 is configured to correct the bend of the first molded substrate S1 to produce the second molded substrate S2. The relay unit 30 is fixed to the curve correction device 10 and includes a first conveyance mechanism 300 and a jig 350 . The bend correction device 10 is positioned relative to the cutting device 20 via the jig 350 . The first transport mechanism 300 is configured to receive the second formed substrate S2 from the bend correction device 10 and transport the received second formed substrate S2 to the cutting device 20 .

亦即,彎曲矯正系統5被構成為,矯正第一成形完畢基板S1的彎曲以製造第二成形完畢基板S2,並將第二成形完畢基板S2搬送至切斷裝置20。被搬送至切斷裝置20的第二成形完畢基板S2,被收容於切斷裝置20的第二收容部210所含的基板匣中。關於彎曲矯正裝置10及中繼部30的各者,在之後詳細加以說明。That is, the bend correction system 5 is configured to correct the bend of the first molded substrate S1 to produce the second molded substrate S2 and transport the second molded substrate S2 to the cutting device 20 . The second molded substrate S2 transported to the cutting device 20 is accommodated in the substrate cassette included in the second accommodating portion 210 of the cutting device 20 . Each of the curve correction device 10 and the relay unit 30 will be described in detail later.

切斷裝置20被構成為,藉由切斷第二成形完畢基板S2,將第二成形完畢基板S2單片化成複數個電子零件。在切斷裝置20中,例如藉由旋轉刀片(未圖示)來切斷被載置於切斷平台(未圖示)上的第二成形完畢基板S2。藉此,製造出複數個電子零件(切斷品)。The cutting device 20 is configured to separate the second formed completed substrate S2 into a plurality of electronic components by cutting the second formed completed substrate S2. In the cutting device 20, for example, a rotating blade (not shown) is used to cut the second formed completed substrate S2 placed on a cutting platform (not shown). In this way, a plurality of electronic components (cut products) are manufactured.

假設中繼部30未固定於彎曲矯正裝置10。在此情況下,不存在將由彎曲矯正裝置10製造出的第二成形完畢基板S2向切斷裝置20搬送的機構。在這樣的情況下,第二成形完畢基板S2例如是以手動方式自彎曲矯正裝置10搬送至切斷裝置20。然而,第二成形完畢基板S2的手動搬送不一定有效率。It is assumed that the relay portion 30 is not fixed to the curve correction device 10 . In this case, there is no mechanism for conveying the second molded substrate S2 produced by the bend correction device 10 to the cutting device 20 . In this case, the second molded substrate S2 is transported from the bend correction device 10 to the cutting device 20 manually, for example. However, manual transportation of the second molded substrate S2 is not necessarily efficient.

在製造系統1所含的彎曲矯正系統5中,中繼部30所含的第一搬送機構300自彎曲矯正裝置10接收第二成形完畢基板S2,並將接收到的第二成形完畢基板S2搬送至切斷裝置20。因此,根據彎曲矯正系統5,由於是藉由第一搬送機構300將第二成形完畢基板S2自彎曲矯正裝置10搬送至切斷裝置20,所以即便彎曲矯正裝置10自切斷裝置20獨立,也能夠容易地將第二成形完畢基板S2搬送至切斷裝置20。In the bend correction system 5 included in the manufacturing system 1, the first conveying mechanism 300 included in the relay section 30 receives the second formed substrate S2 from the bend correction device 10, and conveys the received second formed substrate S2 to the cutting device 20. Therefore, according to the bend correction system 5, since the second formed substrate S2 is conveyed from the bend correction device 10 to the cutting device 20 by the first conveying mechanism 300, even if the bend correction device 10 is independent of the cutting device 20, the second formed substrate S2 can be easily conveyed to the cutting device 20.

彎曲矯正裝置10包含:第一控制裝置160。第一控制裝置160包含:第一通訊部161、第一控制部162。The curve correction device 10 includes a first control device 160 . The first control device 160 includes: a first communication unit 161 and a first control unit 162 .

第一通訊部161例如被構成為,經由通訊線L1與切斷裝置20所含的第二通訊部201(後述)通訊。此外,第一通訊部161並不一定要經由通訊線L1與第二通訊部201通訊,亦可藉由無線通訊與第二通訊部201通訊。又,在第一通訊部161與第二通訊部201之間通訊的資訊不僅有後述的訊號,亦可包含以下的至少一部分:彎曲矯正裝置10或切斷裝置20中的錯誤資訊、被輸入至彎曲矯正裝置10的對象物(第一成形完畢基板S1)的尺寸資訊、彎曲矯正裝置10中的加熱時間及冷卻時間等的條件資訊、被輸入至切斷裝置20的切斷對象物(第二成形完畢基板S2)的尺寸資訊、以及切斷裝置20中的切斷條件等的加工條件資訊等。The first communication unit 161 is configured to communicate with the second communication unit 201 (described later) included in the cutting device 20 via the communication line L1, for example. In addition, the first communication unit 161 does not necessarily need to communicate with the second communication unit 201 through the communication line L1, but may also communicate with the second communication unit 201 through wireless communication. In addition, the information communicated between the first communication unit 161 and the second communication unit 201 may include not only the signals described below, but also at least part of the following: error information in the bend correction device 10 or the cutting device 20, information input to The dimensional information of the object (first molded substrate S1 ) of the bend correction device 10 , the condition information such as heating time and cooling time in the bend correction device 10 , and the cutting object (second molded substrate S1 ) input to the cutting device 20 Dimensional information of the formed substrate S2), processing condition information such as cutting conditions in the cutting device 20, and the like.

第一控制部162例如包含:CPU(Central Processing Unit,中央處理單元)、RAM(Random Access Memory,隨機存取記憶體)及ROM(Read Only Memory,唯讀記憶體)。第一控制部162被構成為,對應資訊處理而控制彎曲矯正裝置10及中繼部30內的各構成要素。第一控制部162,例如基於第一通訊部161所取得的資訊來控制第一搬送機構300。The first control unit 162 includes, for example, a CPU (Central Processing Unit), a RAM (Random Access Memory), and a ROM (Read Only Memory). The first control unit 162 is configured to control the various components in the bending correction device 10 and the relay unit 30 in response to information processing. The first control unit 162 controls the first conveying mechanism 300 based on the information obtained by the first communication unit 161, for example.

切斷裝置20包含:第二控制裝置200。第二控制裝置200包含:第二通訊部201、第二控制部202。The cutting device 20 includes a second control device 200 . The second control device 200 includes a second communication unit 201 and a second control unit 202 .

第二通訊部201例如被構成為,經由通訊線L1與彎曲矯正裝置10所含的第一通訊部161通訊。此外,第二通訊部201並不一定要經由通訊線L1與第一通訊部161通訊,亦可藉由無線通訊與第一通訊部161通訊。The second communication unit 201 is configured to communicate with the first communication unit 161 included in the bending correction device 10 via the communication line L1. In addition, the second communication unit 201 does not necessarily have to communicate with the first communication unit 161 via the communication line L1, and can also communicate with the first communication unit 161 via wireless communication.

第二控制部202例如包含:CPU、RAM及ROM。第二控制部202被構成為,對應資訊處理而控制切斷裝置20內的各構成要素。第二控制部202,例如控制第二通訊部201以向彎曲矯正裝置10發送資訊。The second control unit 202 includes, for example, a CPU, RAM, and ROM. The second control unit 202 is configured to control each component in the cutting device 20 in response to information processing. The second control unit 202 , for example, controls the second communication unit 201 to send information to the curve correction device 10 .

在彎曲矯正系統5中,若對切斷裝置20的第二成形完畢基板S2的搬送準備結束,便將要求接收第二成形完畢基板S2之訊號(以下亦稱為「接收要求訊號」)自第一通訊部161發送至第二通訊部201。在第二收容部210所含的基板匣具有充分空位空間的情況下,將表示能夠接收第二成形完畢基板S2的訊號(以下亦稱為「接收可能訊號」)自第二通訊部201發送至第一通訊部161。響應於藉由第一通訊部161接收到接收可能訊號,第一搬送機構300將第二成形完畢基板S2搬送至切斷裝置20。In the bending correction system 5, when the conveyance preparation of the second formed substrate S2 to the cutting device 20 is completed, a signal requesting to receive the second formed substrate S2 (hereinafter also referred to as a "receiving request signal") is sent from the first communication unit 161 to the second communication unit 201. When the substrate box contained in the second storage unit 210 has sufficient empty space, a signal indicating that the second formed substrate S2 can be received (hereinafter also referred to as a "receiving signal") is sent from the second communication unit 201 to the first communication unit 161. In response to receiving the receiving signal through the first communication unit 161, the first conveying mechanism 300 conveys the second formed substrate S2 to the cutting device 20.

如此,在製造系統1中,自彎曲矯正裝置10向切斷裝置20搬送第二成形完畢基板S2是考慮第二收容部210所含的基板匣中的空位空間來進行。因此,根據製造系統1,能夠在適當的時機將第二成形完畢基板S2自彎曲矯正裝置10搬送至切斷裝置20。關於自彎曲矯正裝置至切斷裝置20的第二成形完畢基板S2的搬送動作,在之後詳細加以說明。As described above, in the manufacturing system 1 , the transfer of the second molded substrate S2 from the bend correction device 10 to the cutting device 20 is performed taking into account the empty space in the substrate cassette included in the second accommodating part 210 . Therefore, according to the manufacturing system 1, the second molded substrate S2 can be transported from the bend correction device 10 to the cutting device 20 at an appropriate timing. The transfer operation of the second molded substrate S2 from the bend correction device to the cutting device 20 will be described in detail later.

<1-2. 彎曲矯正裝置的構成> 第2圖是示意性表示遵照本實施型態的彎曲矯正裝置10的斜視圖。第3圖是示意性表示彎曲矯正裝置10的俯視圖。參照第2圖及第3圖,彎曲矯正裝置10被構成為,將第一成形完畢基板S1的彎曲加以矯正,以製造第二成形完畢基板S2。 <1-2. Composition of the bend correction device> FIG. 2 is a perspective view schematically showing the curve correction device 10 according to this embodiment. FIG. 3 is a plan view schematically showing the curvature correction device 10 . Referring to FIGS. 2 and 3 , the bend correction device 10 is configured to correct the bend of the first molded substrate S1 to produce the second molded substrate S2.

彎曲矯正裝置10包含:第一收容部100、搬入側軌道部110、加熱部120、冷卻部130、搬出側軌道部140、第二搬送機構150。第二搬送機構150包含:搬送機構151、154、157。此外,本實施型態中是採用在加熱部120及冷卻部130的各者中一次進行複數個(具體而言是二片)第一成形完畢基板S1的處理之構成,但亦可採用在加熱部120及冷卻部130的各者中一次進行一片的第一成形完畢基板S1或三片以上的第一成形完畢基板S1的處理之構成。此外,第2圖中,省略了第二搬送機構150。The bend correction device 10 includes a first accommodation part 100, a carry-in side rail part 110, a heating part 120, a cooling part 130, a carry-out side rail part 140, and a second conveyance mechanism 150. The second transport mechanism 150 includes transport mechanisms 151, 154, and 157. In addition, in this embodiment, the heating unit 120 and the cooling unit 130 are configured to process a plurality (specifically, two pieces) of the first molded substrates S1 at one time, but the heating unit 120 and the cooling unit 130 may also be used. Each of the unit 120 and the cooling unit 130 is configured to process one first formed substrate S1 or three or more first formed substrates S1 at a time. In addition, in FIG. 2, the second conveyance mechanism 150 is omitted.

第一收容部100,例如包含複數個基板匣101。基板匣101,收容複數個第一成形完畢基板S1。收容於基板匣101的第一成形完畢基板S1,被供給至搬入側軌道部110。The first accommodating part 100 includes, for example, a plurality of substrate cassettes 101 . The substrate cassette 101 accommodates a plurality of first molded substrates S1. The first molded substrate S1 accommodated in the substrate cassette 101 is supplied to the carry-in side rail portion 110 .

被供給至搬入側軌道部110的第一成形完畢基板S1,藉由搬送機構151而被自搬入側軌道部110搬送至加熱部120。搬送機構151,例如包含複數(例如二個)個吸附部152。各吸附部152,藉由吸附一片第一成形完畢基板S1來保持第一成形完畢基板S1。搬送機構151,例如藉由依序吸附被依序供給至搬入側軌道部110的第一成形完畢基板S1,來保持複數個第一成形完畢基板S1。The first formed substrate S1 supplied to the loading side rail section 110 is transported from the loading side rail section 110 to the heating section 120 by the transport mechanism 151. The transport mechanism 151, for example, includes a plurality of (for example, two) adsorption sections 152. Each adsorption section 152 holds the first formed substrate S1 by adsorbing one of the first formed substrates S1. The transport mechanism 151 holds a plurality of first formed substrates S1 by, for example, sequentially adsorbing the first formed substrates S1 sequentially supplied to the loading side rail section 110.

加熱部120包含:下構件121與上構件122。下構件121及上構件122的各者,包含加熱器。下構件121與上構件122在上下方向中彼此對向。在下構件121上配置有複數個(例如二個)第一成形完畢基板S1。下構件121被構成為會上昇及下降。藉由下構件121上昇,下構件121的上表面的一部分(具體而言是外周上表面)與下構件122的下表面接觸,且下構件121及上構件122重疊。The heating unit 120 includes a lower member 121 and an upper member 122 . Each of the lower member 121 and the upper member 122 includes a heater. The lower member 121 and the upper member 122 face each other in the up-down direction. A plurality of (for example, two) first molded substrates S1 are arranged on the lower member 121 . The lower member 121 is configured to rise and fall. As the lower member 121 rises, a part of the upper surface of the lower member 121 (specifically, the outer peripheral upper surface) comes into contact with the lower surface of the lower member 122, and the lower member 121 and the upper member 122 overlap.

第4圖是示意性表示下構件121及上構件122閉合狀態中的剖面的圖。如第4圖所示,下構件121的各凹部C1成為由上構件122所封閉的狀態,藉此在加熱部120內形成複數個(二個)長方體狀的內部空間V1。各內部空間V1,例如是封閉空間。此處,所謂封閉空間是指被密閉的空間。此外,內部空間V1並不一定要是被密閉的空間。內部空間V1只要是例如由凹部與蓋部圍繞的空間即可,該凹部可收容第一成形完畢基板S1,且該蓋部覆蓋該凹部的至少一部分。FIG. 4 is a diagram schematically showing a cross-section of the lower member 121 and the upper member 122 in a closed state. As shown in FIG. 4 , each recessed portion C1 of the lower member 121 is closed by the upper member 122 , thereby forming a plurality (two) rectangular parallelepiped-shaped internal spaces V1 in the heating unit 120 . Each internal space V1 is, for example, a closed space. Here, the so-called closed space refers to a sealed space. In addition, the internal space V1 does not necessarily need to be a sealed space. The internal space V1 suffices, for example, as long as it is a space surrounded by a recess and a cover. The recess can accommodate the first formed substrate S1 and the cover covers at least a part of the recess.

在複數個內部空間V1的各者中,配置有第一成形完畢基板S1。此外,本實施型態中,在內部空間V1中是以樹脂部分(第4圖的黑色部分)位於下側的方式(基板部分位於上側的方式)來配置第一成形完畢基板S1,但亦能夠以樹脂部分位於上側的方式(基板部分位於下側的方式)來配置第一成形完畢基板S1。各內部空間V1的高度H1,例如比沒有彎曲狀態的第一成形完畢基板S1的厚度更長。第一成形完畢基板S1,除了產生過度的彎曲的情況等以外,不會接觸上構件122,而不會被上構件122施加壓力。因此,在下構件121及上構件122閉合的狀態下,不會對第一成形完畢基板S1施加必要以上的力。A first formed substrate S1 is disposed in each of the plurality of internal spaces V1. In addition, in the present embodiment, the first formed substrate S1 is disposed in the internal space V1 in such a manner that the resin portion (the black portion in FIG. 4) is located at the lower side (the substrate portion is located at the upper side), but the first formed substrate S1 may also be disposed in such a manner that the resin portion is located at the upper side (the substrate portion is located at the lower side). The height H1 of each internal space V1 is, for example, longer than the thickness of the first formed substrate S1 in an unbent state. The first formed substrate S1 does not contact the upper component 122, and is not subjected to pressure by the upper component 122, except in the case of excessive bending. Therefore, when the lower component 121 and the upper component 122 are closed, no more force than necessary is applied to the first formed substrate S1.

在下構件121及上構件122閉合的狀態下,加熱器124、123分別位於內部空間V1的上方及下方。藉由加熱器124、123加熱內部空間V1。又,藉由加熱器124、123加熱被配置於內部空間V1的第一成形完畢基板S1。透過該加熱,使第一成形完畢基板S1的樹脂部分軟化。When the lower member 121 and the upper member 122 are closed, the heaters 124 and 123 are respectively located above and below the internal space V1. The internal space V1 is heated by the heaters 124 and 123. Furthermore, the first molded substrate S1 arranged in the internal space V1 is heated by the heaters 124 and 123 . This heating softens the resin portion of the first molded substrate S1.

內部空間V1中加熱第一成形完畢基板S1的時間,例如是使內部空間V1的溫度穩定且第一成形完畢基板S1的全區域被大致均等加熱所需的時間。此外,為了對內部空間V1進行保溫,下構件121及上構件122在將第一成形完畢基板S1搬入加熱部120內時以及將第一成形完畢基板S1自加熱部120內搬出時以外的時機中是閉合的。The time for heating the first formed substrate S1 in the internal space V1 is, for example, the time required to stabilize the temperature of the internal space V1 and to heat the entire area of the first formed substrate S1 approximately evenly. In addition, in order to keep the internal space V1 warm, the lower component 121 and the upper component 122 are closed except when the first formed substrate S1 is moved into the heating unit 120 and when the first formed substrate S1 is moved out of the heating unit 120.

在彎曲矯正裝置10中,第一成形完畢基板S1在被配置在加熱部120的內部空間V1中的狀態被加熱。因此,根據彎曲矯正裝置10,與例如加熱部120的上方整體開放的情況相比,能夠改善第一成形完畢基板S1的加熱效率。又,根據彎曲矯正裝置10,由於在第一成形完畢基板S1的加熱時不對第一成形完畢基板S1施加必要以上的力,所以能夠減低第一成形完畢基板S1破損的可能性。In the bend correction device 10, the first formed substrate S1 is heated while being arranged in the internal space V1 of the heating unit 120. Therefore, according to the bend correction device 10, the heating efficiency of the first formed substrate S1 can be improved compared with, for example, a case where the upper part of the heating unit 120 is entirely open. In addition, according to the bend correction device 10, since no more force than necessary is applied to the first formed substrate S1 when the first formed substrate S1 is heated, the possibility of damage to the first formed substrate S1 can be reduced.

又,在彎曲矯正裝置10中,以下構件121及上構件122閉合的狀態形成內部空間V1。因此,根據彎曲矯正裝置10,藉由解除下構件121及上構件122閉合的狀態,能夠易於進行將第一成形完畢基板S1配置於內部空間V1及自內部空間V1取出第一成形完畢基板S1的各者。Furthermore, in the curvature correction device 10, the inner space V1 is formed in a state where the lower member 121 and the upper member 122 are closed. Therefore, according to the bend correction device 10, by releasing the closed state of the lower member 121 and the upper member 122, it is possible to easily arrange the first molded substrate S1 in the internal space V1 and take out the first molded substrate S1 from the internal space V1. Everyone.

又,根據彎曲矯正裝置10,由於第一成形完畢基板S1被配置在凹部C1,例如在藉由使下構件121上昇來使下構件121與上構件122彼此重疊的情況下,能夠減低下構件121昇降時產生水平方向中的第一成形完畢基板S1的位置偏移的可能性。Furthermore, according to the bending correction device 10, since the first formed substrate S1 is arranged in the recess C1, for example, when the lower member 121 is raised to overlap the upper member 122, the possibility of positional deviation of the first formed substrate S1 in the horizontal direction when the lower member 121 is raised can be reduced.

再次參照第2圖及第3圖,加熱後的第一成形完畢基板S1,藉由搬送機構154而被自加熱部120搬送至冷卻部130。搬送機構154,不吸附第一成形完畢基板S1,而是以機械方式保持第一成形完畢基板S1。這是為了不要留下可能因為對被加熱軟化後的第一成形完畢基板S1的樹脂部分進行吸附保持而產生的吸附痕。Referring again to FIGS. 2 and 3 , the heated first formed substrate S1 is transported from the heating part 120 to the cooling part 130 by the transport mechanism 154 . The transport mechanism 154 does not adsorb the first molded substrate S1 but mechanically holds the first molded substrate S1. This is to avoid leaving adsorption marks that may be caused by adsorbing and holding the resin portion of the first molded substrate S1 that has been heated and softened.

冷卻部130包含:下構件131與上構件132。下構件131及上構件132的各者,包含自冷卻機供給而來的低溫熱媒循環的管狀流路(未圖示)的一部分。下構件131與上構件132在上下方向中彼此對向。在下構件131上配置有複數個(例如二個)第一成形完畢基板S1。下構件131被構成為會上昇及下降。藉由下構件131上昇,配置於下構件131上的第一成形完畢基板S1的上表面接觸上構件132的下表面,下構件131與上構件132將第一成形完畢基板S1夾持於彼此之間而重疊。第一成形完畢基板S1,在下構件131及上構件132在這樣上下重疊的狀態下,被由下構件131及上構件132加壓。第一成形完畢基板S1,在被由下構件131及上構件132加壓的狀態下由冷卻部130加以冷卻。藉此,第一成形完畢基板S1的彎曲被加以矯正,而製造第二成形完畢基板S2。The cooling unit 130 includes a lower member 131 and an upper member 132 . Each of the lower member 131 and the upper member 132 includes a part of a tubular flow path (not shown) in which the low-temperature heat medium supplied from the cooling machine circulates. The lower member 131 and the upper member 132 face each other in the up-down direction. A plurality of (for example, two) first molded substrates S1 are arranged on the lower member 131 . The lower member 131 is configured to rise and fall. As the lower member 131 rises, the upper surface of the first formed substrate S1 disposed on the lower member 131 contacts the lower surface of the upper member 132, and the lower member 131 and the upper member 132 hold the first formed substrate S1 between each other. Occasionally overlap. The first molded substrate S1 is pressed by the lower member 131 and the upper member 132 in a state where the lower member 131 and the upper member 132 are overlapped vertically. The first molded substrate S1 is cooled by the cooling unit 130 while being pressed by the lower member 131 and the upper member 132 . Thereby, the bend of the first molded substrate S1 is corrected, and the second molded substrate S2 is manufactured.

透過冷卻部130的冷卻而製造出的第二成形完畢基板S2,藉由搬送機構157而被自冷卻部130搬送至搬出側軌道部140。搬送機構157,例如包含複數個(例如二個)吸附部158。各吸附部158,藉由吸附第二成形完畢基板S2而保持第二成形完畢基板S2。搬送機構157,例如依序吸附被配置在冷卻部130的下構件131上的第二成形完畢基板S2,藉此保持複數個第二成形完畢基板S2。被搬送至搬出側軌道部140的第二成形完畢基板S2,被搬出至中繼部30的第一搬送機構300。The second formed substrate S2 manufactured by cooling the cooling section 130 is transported from the cooling section 130 to the carry-out side rail section 140 by the transport mechanism 157. The transport mechanism 157 includes, for example, a plurality of (for example, two) adsorption sections 158. Each adsorption section 158 holds the second formed substrate S2 by adsorbing the second formed substrate S2. The transport mechanism 157 holds a plurality of second formed substrates S2 by, for example, sequentially adsorbing the second formed substrates S2 disposed on the lower component 131 of the cooling section 130. The second formed substrate S2 transported to the carry-out side rail section 140 is carried out to the first transport mechanism 300 of the relay section 30.

<1-3. 中繼部的構成> 如上述,中繼部30包含:第一搬送機構300、治具350。首先對治具350的構成加以說明,接著對第一搬送機構300的構成加以說明。 <1-3. Structure of relay unit> As described above, the relay unit 30 includes the first conveyance mechanism 300 and the jig 350 . First, the structure of the jig 350 will be described, and then the structure of the first conveyance mechanism 300 will be described.

第5圖是示意性表示治具350的俯視圖。第6圖是示意性表示治具350的正面圖。第7圖是示意性表示第5圖的VII-VII剖面的圖。如上述,經由治具350來進行彎曲矯正裝置10相對於切斷裝置20的定位。此外,在第6圖及第7圖的各者中,以虛線記載切斷裝置20的腳輪或支持裝置的腳部。FIG. 5 is a top view schematically showing the jig 350. FIG. 6 is a front view schematically showing the jig 350. FIG. 7 is a view schematically showing the VII-VII section of FIG. 5. As described above, the bending correction device 10 is positioned relative to the cutting device 20 via the jig 350. In addition, in each of FIG. 6 and FIG. 7, the casters of the cutting device 20 or the feet of the supporting device are recorded with dotted lines.

參照第5圖、第6圖及第7圖,治具350包含:第一定位構件360、第二定位構件370、承軸構件380。第一定位構件360及第二定位構件370的各者,被固定於彎曲矯正裝置10。另一方面,承軸構件380,被固定於切斷裝置20。5, 6 and 7, the jig 350 includes a first positioning member 360, a second positioning member 370 and a bearing member 380. Each of the first positioning member 360 and the second positioning member 370 is fixed to the bending correction device 10. On the other hand, the bearing member 380 is fixed to the cutting device 20.

第一定位構件360,在彎曲矯正裝置10中,以螺栓固定於X軸方向中的切斷裝置20側的端部的下端部且Y軸方向中的一方的端部(彎曲矯正裝置10的前方端部)。第一定位構件360包含:軸361、L字狀構件362。軸361,是向X軸方向延伸的棒狀構件。L字狀構件362包含彼此正交的二個面,且其中一方的面藉由螺栓而被固定於彎曲矯正裝置10。另一方的面固定有軸361。亦即,軸361經由L字狀構件362而被固定於彎曲矯正裝置10。The first positioning member 360 is fixed with a bolt to the lower end of the end on the cutting device 20 side in the X-axis direction and one end in the Y-axis direction (the front of the bend correcting device 10 ) with a bolt. Ends). The first positioning member 360 includes a shaft 361 and an L-shaped member 362 . The shaft 361 is a rod-shaped member extending in the X-axis direction. The L-shaped member 362 includes two surfaces that are orthogonal to each other, and one of the surfaces is fixed to the bend correction device 10 by bolts. The shaft 361 is fixed to the other surface. That is, the shaft 361 is fixed to the curve correction device 10 via the L-shaped member 362 .

第二定位構件370,在彎曲矯正裝置10中,以螺栓固定於X軸方向中的切斷裝置20側的端部的下端部且Y軸方向中的另一方的端部(彎曲矯正裝置10的後方端部)。第二定位構件370包含:軸371、調整螺栓372、板狀構件373。軸371,是向X軸方向延伸的棒狀構件。調整螺栓372被構成為,安裝於軸371的前端,且在X軸方向中相對於軸371伸縮。板狀構件373藉由螺栓而被固定於彎曲矯正裝置10。軸371被固定於板狀構件373。亦即,軸371及調整螺栓372的各者,經由板狀構件373而被固定於彎曲矯正裝置10。The second positioning member 370 is fixed by bolts to the lower end of the end on the cutting device 20 side in the X-axis direction and the other end in the Y-axis direction (the rear end of the bending correction device 10) in the bending correction device 10. The second positioning member 370 includes: a shaft 371, an adjustment bolt 372, and a plate-like member 373. The shaft 371 is a rod-like member extending in the X-axis direction. The adjustment bolt 372 is configured to be mounted on the front end of the shaft 371 and to extend and retract relative to the shaft 371 in the X-axis direction. The plate-like member 373 is fixed to the bending correction device 10 by bolts. The shaft 371 is fixed to the plate-like member 373. That is, each of the shaft 371 and the adjustment bolt 372 is fixed to the bending correction device 10 via the plate member 373 .

承軸構件380包含:固定部381、承受部382。固定部381具有在X軸方向延伸的形狀,且被藉由螺栓固定於切斷裝置20的角管220。固定部381,具有分別與在X軸方向延伸的角管220的上表面及兩側面對向的三個面。在三個面分別與角管220的上表面及兩側面對向的狀態下,固定部381被藉由螺栓固定於角管220。The bearing member 380 includes a fixed part 381 and a receiving part 382 . The fixing part 381 has a shape extending in the X-axis direction, and is fixed to the angle tube 220 of the cutting device 20 by bolts. The fixing part 381 has three surfaces respectively facing the upper surface and both sides of the angle tube 220 extending in the X-axis direction. In a state where the three surfaces are respectively facing the upper surface and both sides of the angle tube 220 , the fixing part 381 is fixed to the angle tube 220 by bolts.

承受部382,固定於固定部381的下端。承受部382,具有在X軸方向延伸的形狀。承受部382中,在彎曲矯正裝置10側的端部形成有凹部C2。在凹部C2中,嵌合有軸361的前端。藉此,決定相對於切斷裝置20之彎曲矯正裝置10在X軸方向及Y軸方向的各者中的位置。The receiving portion 382 is fixed to the lower end of the fixing portion 381. The receiving portion 382 has a shape extending in the X-axis direction. In the receiving portion 382, a recess C2 is formed at the end on the side of the bending correction device 10. The front end of the shaft 361 is fitted into the recess C2. Thereby, the position of the bending correction device 10 relative to the cutting device 20 in each of the X-axis direction and the Y-axis direction is determined.

又,在軸361的前端嵌合入凹部C2中的狀態下,藉由對調整螺栓372的伸縮狀態加以調整,來決定以軸361的前端為旋轉中心的彎曲矯正裝置10的旋轉方向的位置。如此,第一定位構件360及第二定位構件370的各者未固定於切斷裝置20。在本實施型態中,對調整螺栓372的伸縮狀態加以調整以使得彎曲矯正裝置10與切斷裝置20成為平行。In addition, by adjusting the expansion and contraction state of the adjustment bolt 372 while the front end of the shaft 361 is fitted into the recessed portion C2, the position in the rotation direction of the bend correction device 10 with the front end of the shaft 361 as the center of rotation is determined. In this way, each of the first positioning member 360 and the second positioning member 370 is not fixed to the cutting device 20 . In this embodiment, the expansion and contraction state of the adjustment bolt 372 is adjusted so that the bend correction device 10 and the cutting device 20 become parallel.

第8圖是示意性表示第一搬送機構300的俯視圖。第9圖是示意性表示第8圖的IX-IX剖面的圖。Fig. 8 is a plan view schematically showing the first transport mechanism 300. Fig. 9 is a view schematically showing a cross section taken along line IX-IX of Fig. 8 .

參照第8圖及第9圖,第一搬送機構300包含:基座板305、一對中繼軌道310、推桿321、電動致動器320、第一感測器340、第二感測器341。基座板305是板狀的構件,在X軸方向中延伸。一對中繼軌道310、電動致動器320及第一感測器340的各者,固定於基座板305。Referring to FIGS. 8 and 9 , the first transport mechanism 300 includes a base plate 305, a pair of intermediate rails 310, a push rod 321, an electric actuator 320, a first sensor 340, and a second sensor 341. The base plate 305 is a plate-shaped member extending in the X-axis direction. Each of the pair of intermediate rails 310, the electric actuator 320, and the first sensor 340 is fixed to the base plate 305.

一對中繼軌道310,在X軸方向中延伸,且被配置在彎曲矯正裝置10的搬出側軌道部140的延長線上。一對中繼軌道310的切斷裝置20側的前端,位於切斷裝置20的第二收容部210的附近。在彎曲矯正裝置10中製造出的第二成形完畢基板S2,被自搬出側軌道部140搬送至一對中繼軌道310。第二成形完畢基板S2,例如藉由將被載置於搬出側軌道部140的第二成形完畢基板S2向X軸方向搬送的推桿(未圖示),而被搬送至一對中繼軌道310的X軸方向中的大致中央部分。The pair of relay rails 310 extend in the X-axis direction and are arranged on the extension line of the carrying-out side rail section 140 of the bend correction device 10. The front end of the pair of relay rails 310 on the cutting device 20 side is located near the second receiving section 210 of the cutting device 20. The second formed substrate S2 manufactured in the bend correction device 10 is transported from the carrying-out side rail section 140 to the pair of relay rails 310. The second formed substrate S2 is transported to the substantially central portion of the pair of relay rails 310 in the X-axis direction by, for example, a push rod (not shown) that transports the second formed substrate S2 placed on the carrying-out side rail portion 140 in the X-axis direction.

推桿321被構成為,在X軸方向中移動,且對被載置於中繼軌道310的第二成形完畢基板S2加以搬送。推桿321,安裝於電動致動器320上。The push rod 321 is configured to move in the X-axis direction and transport the second molded substrate S2 placed on the relay rail 310 . The push rod 321 is installed on the electric actuator 320.

電動致動器320,在X軸方向中延伸,例如包含:滾珠螺桿、驅動滾珠螺桿的馬達、線性導軌(全都未圖示)。在藉由驅動滾珠螺桿而在X軸方向中移動的移動部上,固定有推桿321的基部。亦即,推桿321伴隨著電動致動器320所含的馬達的驅動而在X軸方向中移動。推桿321搬送第二成形完畢基板S2,並將第二成形完畢基板S2收容至第二收容部210所含的基板匣中。The electric actuator 320 extends in the X-axis direction, and includes, for example, a ball screw, a motor that drives the ball screw, and a linear guide rail (all not shown). The base of the push rod 321 is fixed to the moving part that moves in the X-axis direction by driving the ball screw. That is, the push rod 321 moves in the X-axis direction as the motor included in the electric actuator 320 is driven. The push rod 321 transports the second formed substrate S2 and stores the second formed substrate S2 into the substrate cassette included in the second accommodating part 210 .

第一感測器340,例如配置在搬出側軌道部140與一對中繼軌道310的邊界附近。第一感測器340被構成為,對第二成形完畢基板S2已被從彎曲矯正裝置10傳遞到第一搬送機構300的情形加以檢測。第一感測器340發出的檢測訊號,被發送至彎曲矯正裝置10的第一控制部162。The first sensor 340 is, for example, disposed near the boundary between the carrying-out side rail 140 and the pair of relay rails 310. The first sensor 340 is configured to detect that the second formed substrate S2 has been transferred from the bend correction device 10 to the first transfer mechanism 300. The detection signal from the first sensor 340 is sent to the first control unit 162 of the bend correction device 10.

第二感測器341,例如配置在一對中繼軌道310的切斷裝置20側的端部附近。第二感測器341被構成為,對第二成形完畢基板S2已被從第一搬送機構300傳遞到切斷裝置20的第二收容部210的情形加以檢測。第二感測器341發出的檢測訊號,被發送至彎曲矯正裝置10的第一控制部162。The second sensor 341 is arranged, for example, near the ends of the pair of relay rails 310 on the cutting device 20 side. The second sensor 341 is configured to detect that the second molded substrate S2 has been transferred from the first transport mechanism 300 to the second accommodating part 210 of the cutting device 20 . The detection signal sent by the second sensor 341 is sent to the first control part 162 of the curve correction device 10 .

在第一搬送機構300中,上方由蓋體330所覆蓋。蓋體330,例如是壓克力製。在由基座板305及蓋體330所圍繞的空間中,例如配置有一對中繼軌道310、推桿321及電動致動器320。具體而言,相對於藉由治具350而彼此平行配置的彎曲矯正裝置10與切斷裝置20,跨渡基座板305而配置中繼部30,以使得第一搬送機構300的一對中繼軌道310與彎曲矯正裝置10的搬出側軌道部140平行連接,且與可配置切斷裝置20的第二收容部210的位置通連。如此,第一搬送機構300,未被固定於切斷裝置20。In the first conveyance mechanism 300, the upper part is covered by the cover 330. The cover 330 is made of acrylic, for example. In the space surrounded by the base plate 305 and the cover 330, for example, a pair of relay rails 310, a push rod 321, and an electric actuator 320 are arranged. Specifically, with respect to the bend correction device 10 and the cutting device 20 which are arranged parallel to each other by the jig 350 , the relay portion 30 is arranged across the base plate 305 so that the pair of the first conveyance mechanism 300 is centered. The relay rail 310 is connected in parallel with the carry-out side rail portion 140 of the bend correction device 10 and communicates with a position where the second housing portion 210 of the cutting device 20 can be disposed. In this way, the first conveyance mechanism 300 is not fixed to the cutting device 20 .

[2. 動作] 第10圖是表示自彎曲矯正裝置10至切斷裝置20的第二成形完畢基板S2的搬送動作的流程圖。左側的流程圖所示的處理,是在由第一感測器340檢測到第二成形完畢基板S2的通過後,由彎曲矯正裝置10的第一控制部162所執行。右側的流程圖所示的處理,是由切斷裝置20的第二控制部202所執行。 [2. Action] FIG. 10 is a flowchart showing the transport operation of the second formed substrate S2 from the bend correction device 10 to the cutting device 20 . The processing shown in the flowchart on the left is executed by the first control unit 162 of the bend correction device 10 after the first sensor 340 detects the passage of the second molded substrate S2. The processing shown in the flowchart on the right is executed by the second control unit 202 of the cutting device 20 .

參照第10圖左側的流程圖,第一控制部162控制第一通訊部161以將接收要求訊號發送至切斷裝置20(步驟S100)。第一控制部162,判定是否經由第一通訊部161而自切斷裝置20接收到接收可能訊號(步驟S110)。若判定未接收到接收可能訊號(步驟S110中的否),第一控制部162便待機直到接收到接收可能訊號為止。Referring to the flowchart on the left side of FIG. 10 , the first control unit 162 controls the first communication unit 161 to send a reception request signal to the disconnection device 20 (step S100). The first control unit 162 determines whether a reception possible signal is received from the disconnection device 20 via the first communication unit 161 (step S110). If it is determined that the reception possible signal is not received (No in step S110), the first control unit 162 waits until a reception possible signal is received.

另一方面,若判定已接收到接收可能訊號(步驟S110中的是),第一控制部162便控制電動致動部320,以開始將被載置於一對中繼軌道310的第二成形完畢基板S2搬送至切斷裝置20(步驟S120)。藉此,開始推桿321所進行的第二成形完畢基板S2的搬送。On the other hand, if it is determined that the reception possible signal has been received (Yes in step S110), the first control unit 162 controls the electric actuator 320 to start the second forming process that will be placed on the pair of relay rails 310. The completed substrate S2 is transported to the cutting device 20 (step S120). Thereby, the conveyance of the second molded substrate S2 by the push rod 321 is started.

第一控制部162,判定是否經由第一通訊部161而自第二感測器341接收到檢測訊號(步驟S130)。若判定未自第二感測器341接收到檢測訊號(步驟S130的否),第一控制部162便待機直到自第二感測器341接收到檢測訊號為止。The first control unit 162 determines whether a detection signal is received from the second sensor 341 via the first communication unit 161 (step S130). If it is determined that no detection signal is received from the second sensor 341 (No in step S130), the first control unit 162 waits until a detection signal is received from the second sensor 341.

另一方面,若判定自第二感測器341接收到檢測訊號(步驟S130的是),第一控制部162便控制第一通訊部161,以將表示向切斷裝置20搬送第二成形完畢基板S2已結束的訊號(以下亦稱為「搬送結束訊號」)發送至切斷裝置20(步驟S140)。藉此,向切斷裝置20的第二收容部210所含的基板匣搬送第二成形完畢基板S2結束。On the other hand, if it is determined that the detection signal is received from the second sensor 341 (Yes in step S130), the first control unit 162 controls the first communication unit 161 to send a signal indicating that the conveyance of the second formed substrate S2 to the cutting device 20 has been completed (hereinafter also referred to as a "conveying completion signal") to the cutting device 20 (step S140). Thereby, the conveyance of the second formed substrate S2 to the substrate box contained in the second storage unit 210 of the cutting device 20 is completed.

參照第10圖的右側的流程圖,第二控制部202判定是否經由第二通訊部201自彎曲矯正裝置10接收到接收要求訊號(步驟S200)。若判定未接收到接收要求訊號(步驟S200中的否),第二控制部202便待機直到接收到接收要求訊號為止。Referring to the flowchart on the right side of FIG. 10 , the second control unit 202 determines whether a reception request signal is received from the bend correction device 10 via the second communication unit 201 (step S200 ). If it is determined that the reception request signal is not received (No in step S200), the second control unit 202 waits until the reception request signal is received.

另一方面,若判定已接收到接收要求訊號(步驟S200中的是),第二控制部202便判定第二收容部210所含的複數個基板匣的任一者中是否存在規定的空位空間(步驟S210)。此外,規定的空位空間是預先決定的空間,可為能夠收容一片第二成形完畢基板S2的空間,亦可為能夠收容複數片第二成形完畢基板S2的空間。On the other hand, if it is determined that the receiving request signal has been received (yes in step S200), the second control unit 202 determines whether there is a specified empty space in any of the plurality of substrate boxes contained in the second receiving unit 210 (step S210). In addition, the specified empty space is a predetermined space, which can be a space capable of accommodating one second formed substrate S2, or a space capable of accommodating a plurality of second formed substrates S2.

若判定任何基板匣中皆不存在規定的空位空間(步驟S210中的否),第二控制部202便待機直到接收到基板匣中出現規定的空位空間為止。在切斷裝置20中,與該流程圖所示的處理並列進行自第二收容部210取出第二成形完畢基板S2並切斷第二成形完畢基板S2的處理。藉由自第二收容部210取出第二成形完畢基板S2,第二收容部210所含的基板匣的空位空間變大。If it is determined that there is no specified empty space in any substrate box (No in step S210), the second control unit 202 waits until receiving a signal that a specified empty space appears in the substrate box. In the cutting device 20, the processing of taking out the second formed substrate S2 from the second receiving unit 210 and cutting the second formed substrate S2 is performed in parallel with the processing shown in the flowchart. By taking out the second formed substrate S2 from the second receiving unit 210, the empty space of the substrate box contained in the second receiving unit 210 becomes larger.

另一方面,若判定複數個基板匣的任一者中存在規定的空位空間(步驟S210中的是),第二控制部202便控制第二收容部210以使得具有規定的空位空間的基板匣來到第二成形完畢基板S2的接收位置(步驟S220)。然後,第二控制部202控制第二通訊部201以將接收可能訊號發送至彎曲矯正裝置10(步驟S230)。On the other hand, if it is determined that there is a specified empty space in any one of the plurality of substrate cassettes (yes in step S210), the second control unit 202 controls the second receiving unit 210 so that the substrate cassette with the specified empty space comes to the receiving position of the second formed substrate S2 (step S220). Then, the second control unit 202 controls the second communication unit 201 to send a reception possible signal to the bend correction device 10 (step S230).

第二控制部202,判定是否已經由第二通訊部201自彎曲矯正裝置10接收到搬送結束訊號(步驟S240)。若判定未接收到搬送結束訊號(步驟S240中的否),第二控制部202便待機直到接收到搬送結束訊號為止。The second control unit 202 determines whether the second communication unit 201 has received the transport end signal from the bending correction device 10 (step S240). If it is determined that the transport end signal has not been received (No in step S240), the second control unit 202 waits until the transport end signal is received.

另一方面,若判定已接收到搬送結束訊號(步驟S240中的是),該流程圖所示的處理便結束。藉此,向切斷裝置20的第二收容部210所含的基板匣搬送第二成形完畢基板S2結束,第二控制部202能夠認知到第二成形完畢基板S2的搬送已結束。On the other hand, if it is determined that the transfer end signal has been received (YES in step S240), the process shown in this flowchart ends. Thereby, the transportation of the second molded substrate S2 to the substrate cassette contained in the second accommodating part 210 of the cutting device 20 is completed, and the second control unit 202 can recognize that the transportation of the second molded substrate S2 is completed.

在彎曲矯正系統5中,響應於第一感測器340檢測到第二成形完畢基板S2的接收,而將接收要求訊號發送至切斷裝置20。因此,根據彎曲矯正系統5,由於在向切斷裝置20搬送第二成形完畢基板S2前將要求第二成形完畢基板S2的接收之訊號發送至切斷裝置20,所以能夠實現與切斷裝置20的狀況對應的第二成形完畢基板S2的搬送。In the bend correction system 5, in response to the first sensor 340 detecting the reception of the second formed substrate S2, a reception request signal is sent to the cutting device 20. Therefore, according to the bend correction system 5, since the signal requesting the reception of the second formed substrate S2 is sent to the cutting device 20 before the second formed substrate S2 is conveyed to the cutting device 20, the conveyance of the second formed substrate S2 corresponding to the state of the cutting device 20 can be realized.

又,在彎曲矯正系統5中,響應於第一通訊部161自切斷裝置20接收到接收可能訊號,第一搬送機構300將第二成形完畢基板S2搬送至切斷裝置20。因此,根據彎曲矯正系統5,由於是在接收到接收可能訊號後進行第二成形完畢基板S2的搬送,所以能夠在適當的時機將第二成形完畢基板S2搬送至切斷裝置20。Furthermore, in the bend correction system 5 , in response to the first communication unit 161 receiving the reception possible signal from the cutting device 20 , the first transport mechanism 300 transports the second molded substrate S2 to the cutting device 20 . Therefore, according to the bend correction system 5, since the second molded substrate S2 is transferred after receiving the reception enable signal, the second molded substrate S2 can be transferred to the cutting device 20 at an appropriate timing.

又,在彎曲矯正系統5中,響應於第二感測器341檢測到第二成形完畢基板S2的搬送,將搬送結束訊號發送至切斷裝置20。因此,根據彎曲矯正系統5,能夠使切斷裝置20認知到向切斷裝置20搬送第二成形完畢基板S2已結束。In addition, in the bending correction system 5, in response to the second sensor 341 detecting the conveyance of the second formed substrate S2, a conveyance completion signal is sent to the cutting device 20. Therefore, according to the bending correction system 5, the cutting device 20 can recognize that the conveyance of the second formed substrate S2 to the cutting device 20 has been completed.

又,在製造系統1中,響應於第二收容部210中的第二成形完畢基板S2的收容狀態(基板匣中的空位空間的狀態),來判定切斷裝置20是否可接收第二成形完畢基板S2。因此,根據製造系統1,能夠適當地判定切斷裝置20中是否可接收第二成形完畢基板S2。Furthermore, in the manufacturing system 1 , it is determined whether the cutting device 20 can receive the second molded substrate S2 in response to the storage state of the second molded substrate S2 in the second container 210 (the state of the empty space in the substrate cassette). Substrate S2. Therefore, according to the manufacturing system 1, it can be appropriately determined whether the second molded substrate S2 can be received in the cutting device 20.

[3. 特徵] 如以上所述,在彎曲矯正系統5中,中繼部30所含的第一搬送機構300自彎曲矯正裝置10接收第二成形完畢基板S2,並將接收到的第二成形完畢基板S2搬送至切斷裝置20。因此,根據彎曲矯正系統5,由於是藉由第一搬送機構300將第二成形完畢基板S2自彎曲矯正裝置10搬送至切斷裝置20,所以即便彎曲矯正裝置10自切斷裝置20獨立,也能夠輕易將第二成形完畢基板S2搬送至切斷裝置20。 [3. Characteristics] As described above, in the bend correction system 5 , the first transport mechanism 300 included in the relay unit 30 receives the second molded substrate S2 from the bend correction device 10 , and transports the received second molded substrate S2 to Cut-off device 20. Therefore, according to the bend correction system 5, since the second molded substrate S2 is transported from the bend correction device 10 to the cutting device 20 by the first transport mechanism 300, even if the bend correction device 10 is independent from the cutting device 20, The second molded substrate S2 can be easily transported to the cutting device 20 .

此外,彎曲矯正系統5為本發明中的「彎曲矯正系統」的一例。彎曲矯正裝置10為本發明中的「彎曲矯正裝置」的一例,中繼部30為本發明中的「中繼部」的一例,第一搬送機構300為本發明中的「第一搬送機構」的一例。第一控制部162為本發明中的「第一控制部」的一例,第一通訊部161為本發明中的「通訊部」的一例。第一感測器340為本發明中的「第一感測器」的一例,第二感測器341為本發明中的「第二感測器」的一例。一對中繼軌道310為本發明中的「一對軌道」的一例,推桿321為本發明中的「搬送構件」的一例。In addition, the curve correction system 5 is an example of the "curvature correction system" in the present invention. The bend correction device 10 is an example of the "bend correction device" in the present invention, the relay unit 30 is an example of the "relay unit" in the present invention, and the first transport mechanism 300 is the "first transport mechanism" in the present invention. An example of. The first control unit 162 is an example of the "first control unit" in the present invention, and the first communication unit 161 is an example of the "communication unit" in the present invention. The first sensor 340 is an example of the "first sensor" in the present invention, and the second sensor 341 is an example of the "second sensor" in the present invention. The pair of relay rails 310 is an example of the "pair of rails" in the present invention, and the push rod 321 is an example of the "conveying member" in the present invention.

第一收容部100為本發明中的「第一收容部」的一例,加熱部120為本發明中的「加熱部」的一例,冷卻部130為本發明中的「冷卻部」的一例。第二搬送機構150為本發明中的「第二搬送機構」的一例。第二收容部210為本發明中的「第二收容部」的一例。切斷裝置20為本發明中的「加工裝置」的一例。製造系統1為本發明中的「製造系統」的一例。The first storage section 100 is an example of the "first storage section" in the present invention, the heating section 120 is an example of the "heating section" in the present invention, and the cooling section 130 is an example of the "cooling section" in the present invention. The second conveying mechanism 150 is an example of the "second conveying mechanism" in the present invention. The second storage section 210 is an example of the "second storage section" in the present invention. The cutting device 20 is an example of the "processing device" in the present invention. The manufacturing system 1 is an example of the "manufacturing system" in the present invention.

[4. 其他實施型態] 上述實施型態的思想,並不限定於以上說明過的實施型態。以下,針對能夠應用上述實施型態的思想的其他實施型態的一例加以說明。 [4. Other implementation forms] The concept of the above implementation forms is not limited to the implementation forms described above. Below, an example of other implementation forms to which the concept of the above implementation forms can be applied is described.

<4-1> 上述實施型態中,在彎曲矯正裝置10與切斷裝置20之間僅設置一個第一搬送機構300。然而,第一搬送機構300的數量不限於此。例如,亦可在彎曲矯正裝置10與切斷裝置20之間設置複數個第一搬送機構300。例如,能夠以複數個第一搬送機構300排列在Y軸方向的方式配置複數個第一搬送機構300,亦能夠以複數個第一搬送機構300排列在高度方向的方式配置複數個第一搬送機構300。藉此,能夠將複數個第二成形完畢基板S2以並列的方式自彎曲矯正裝置20搬送至切斷裝置20。 <4-1> In the above embodiment, only one first conveying mechanism 300 is provided between the bend correction device 10 and the cutting device 20 . However, the number of first conveyance mechanisms 300 is not limited to this. For example, a plurality of first conveyance mechanisms 300 may be provided between the bend correction device 10 and the cutting device 20 . For example, a plurality of first transport mechanisms 300 can be arranged so that a plurality of first transport mechanisms 300 are arranged in the Y-axis direction, or a plurality of first transport mechanisms 300 can be arranged so as to be arranged in the height direction. 300. Thereby, a plurality of second molded substrates S2 can be transported in parallel from the bend correction device 20 to the cutting device 20 .

<4-2> 上述實施型態中,第二成形完畢基板S2是自彎曲矯正裝置10搬送至切斷裝置20。然而,第二成形完畢基板S2的搬送目的地不限於此。第二成形完畢基板S2,例如亦可搬送至對第二成形完畢基板S2的表面進行研磨的研磨機,或是對第二成形完畢基板S2的表面進行標記的雷射標記裝置。亦即,第二成形完畢基板S2的搬送目的地,只要是對第二成形完畢基板S2施加加工的加工裝置即可。 <4-2> In the above-mentioned embodiment, the second formed substrate S2 is transported from the bending correction device 10 to the cutting device 20. However, the transport destination of the second formed substrate S2 is not limited thereto. The second formed substrate S2 can also be transported to, for example, a grinder for grinding the surface of the second formed substrate S2, or a laser marking device for marking the surface of the second formed substrate S2. That is, the transport destination of the second formed substrate S2 can be any processing device that processes the second formed substrate S2.

<4-3> 上述實施型態中,亦可對被搬送至搬出側軌道部140的第二成形完畢基板S2的彎曲量加以測量。例如,亦可在搬出側軌道部140的附近設置對第二成形完畢基板S2的彎曲程度加以測量的測量部,以測量第二成形完畢基板S2的彎曲量。測量部,例如可由雷射位移計來加以構成。可使雷射位移計沿第二成形完畢基板S2的長側或短側方向移動,來測量第二成形完畢基板S2的彎曲量。例如亦可為以下的構成:當第二成形完畢基板S2的彎曲量在容許值以下時,將第二成形完畢基板S2搬送至中繼部30,且當第二成形完畢基板S2的彎曲量大於容許值時,不將第二成形完畢基板S2搬送至中繼部30。例如亦可為,搬出側軌道部140延伸至第一收容部100為止,當第二成形完畢基板S2的彎曲量大於容許值時,將第二成形完畢基板S2收容至第一收容部100所含的基板匣。 <4-3> In the above-mentioned embodiment, the bending amount of the second formed substrate S2 transported to the side rail section 140 can also be measured. For example, a measuring unit for measuring the bending degree of the second formed substrate S2 can be set near the side rail section 140 to measure the bending amount of the second formed substrate S2. The measuring unit can be composed of a laser displacement meter, for example. The laser displacement meter can be moved along the long side or short side direction of the second formed substrate S2 to measure the bending amount of the second formed substrate S2. For example, the following configuration may be adopted: when the bending amount of the second formed substrate S2 is below the allowable value, the second formed substrate S2 is transported to the relay section 30, and when the bending amount of the second formed substrate S2 is greater than the allowable value, the second formed substrate S2 is not transported to the relay section 30. For example, the side rail section 140 may extend to the first receiving section 100, and when the bending amount of the second formed substrate S2 is greater than the allowable value, the second formed substrate S2 is received in the substrate box contained in the first receiving section 100.

以上,針對本發明的實施型態以例示性方式加以說明。亦即,詳細說明及隨附圖式是為了例示性說明而揭示。據此,詳細說明及隨附圖式所記載的構成要素中,可能包含用以解決問題時非必須的構成要素。因此,不應該因為在詳細說明及隨附圖式中有記載該等非必須的構成要素,就立刻認定該等非必須的構成要素是必須的。The above is an illustrative description of the embodiments of the present invention. That is, the detailed description and the accompanying drawings are disclosed for illustrative purposes. Accordingly, the components described in the detailed description and the accompanying drawings may include components that are not essential for solving the problem. Therefore, it should not be immediately determined that these non-essential components are essential just because they are described in the detailed description and the accompanying drawings.

又,上述實施型態在所有方面皆僅為本發明的例示。上述實施型態在本發明的範圍內可進行各種改良或變更。亦即,本發明的實施時,能夠對應實施型態而適當採用具體的構成。Furthermore, the above-mentioned embodiments are merely examples of the present invention in all aspects. The above-mentioned embodiments can be variously improved or modified within the scope of the present invention. That is, when implementing the present invention, a specific configuration can be appropriately adopted corresponding to the embodiment.

[追記] 本說明書中,至少揭示有包含以下技術的多種技術性思想。 [Additional Note] This manual discloses at least a variety of technical ideas including the following technologies.

<技術1> (構成) 一種彎曲矯正系統,具備: 彎曲矯正裝置,其矯正第一成形完畢基板的彎曲,並製造第二成形完畢基板;及 中繼部,其被配置在前述彎曲矯正裝置的外部的加工裝置與前述彎曲矯正裝置之間;其中, 前述加工裝置進行前述第二成形完畢基板的加工; 前述中繼部包含:第一搬送機構,其自前述彎曲矯正裝置接收前述第二成形完畢基板,並將已接收的前述第二成形完畢基板搬送至前述加工裝置。 <Technique 1> (Construction) A bending correction system comprises: a bending correction device that corrects the bending of a first formed substrate and manufactures a second formed substrate; and a relay section that is arranged between a processing device outside the bending correction device and the bending correction device; wherein, the processing device processes the second formed substrate; the relay section includes: a first conveying mechanism that receives the second formed substrate from the bending correction device and conveys the received second formed substrate to the processing device.

(功效等) 在該彎曲矯正系統中,中繼部所含的第一搬送機構自彎曲矯正裝置接收第二成形完畢基板,並將接收到的第二成形完畢基板搬送至加工裝置。因此,根據該彎曲矯正系統,由於是藉由第一搬送機構將第二成形完畢基板自彎曲矯正裝置搬送至加工裝置,即便彎曲矯正裝置自加工裝置獨立,也能夠輕易將第二成形完畢基板搬送至加工裝置。 (efficacy, etc.) In this bend correction system, the first conveying mechanism included in the relay unit receives the second formed substrate from the bend correcting device, and conveys the received second formed substrate to the processing device. Therefore, according to this bend correction system, since the second molded substrate is transported from the bend correction device to the processing device by the first transport mechanism, even if the bend correction device is independent from the processing device, the second molded substrate can be easily transported to the processing device.

<技術2> (構成) 技術1所述之彎曲矯正系統,更具備: 第一控制部,其控制前述第一搬送機構;及 第一通訊部,其與前述加工裝置通訊。 <Technology 2> (composition) The curve correction system described in Technology 1 further has: The first control part controls the aforementioned first conveying mechanism; and The first communication unit communicates with the aforementioned processing device.

(功效等) 根據該彎曲矯正系統,由於是在使用第一控制部及第一通訊部的情況下,藉由第一搬送機構將第二成形完畢基板自彎曲矯正裝置搬送至加工裝置,即便彎曲矯正裝置自加工裝置獨立,也能夠輕易將第二成形完畢基板搬送至加工裝置。 (Effects, etc.) According to the bending correction system, since the second formed substrate is transported from the bending correction device to the processing device by the first transport mechanism when the first control unit and the first communication unit are used, the second formed substrate can be easily transported to the processing device even if the bending correction device is independent of the processing device.

<技術3> (構成) 技術2所述之彎曲矯正系統,其中, 前述中繼部更包含:第一感測器,其對已自前述彎曲矯正裝置接收到前述第二成形完畢基板的情形加以檢測; 前述第一控制部,響應於前述第一感測器檢測到前述第二成形完畢基板的接收,控制前述第一通訊部以向前述加工裝置發送要求前述第二成形完畢基板的接收之訊號。 <Technique 3> (Construction) The bending correction system described in Technique 2, wherein, the relay unit further comprises: a first sensor, which detects that the second formed substrate has been received from the bending correction device; the first control unit, in response to the first sensor detecting the reception of the second formed substrate, controls the first communication unit to send a signal to the processing device requesting the reception of the second formed substrate.

(功效等) 在該彎曲矯正系統中,響應於第一感測器檢測到第二成形完畢基板的接收,向加工裝置發送要求第二成形完畢基板的接收之訊號。因此,根據該彎曲矯正系統,由於是在向加工裝置搬送第二成形完畢基板前,向加工裝置發送要求第二成形完畢基板的接收之訊號,所以能夠實現與加工裝置的狀態對應的第二成形完畢基板的搬送。 (efficacy, etc.) In the bend correction system, in response to the first sensor detecting the reception of the second formed substrate, a signal requesting the reception of the second formed substrate is sent to the processing device. Therefore, according to this bend correction system, since the signal requesting reception of the second molded substrate is sent to the processing device before the second molded substrate is transferred to the processing device, it is possible to realize the second molding according to the state of the processing device. The transfer of the substrate is completed.

<技術4> (構成) 技術2或技術3所述之彎曲矯正系統,其中, 前述第一控制部,響應於前述第一通訊部自前述加工裝置接收到表示可接收前述第二成形完畢基板之訊號,控制前述第一搬送機構以將前述第二成形完畢基板搬送至前述加工裝置。 <Technology 4> (composition) The curve correction system described in Technology 2 or Technology 3, wherein, The first control unit, in response to the first communication unit receiving a signal indicating that the second formed substrate can be received from the processing device, controls the first transport mechanism to transport the second formed substrate to the processing device. .

(功效等) 在該彎曲矯正系統中,響應於第一通訊部自加工裝置接收到表示可接收第二成形完畢基板之訊號,第一搬送機構將第二成形完畢基板搬送至加工裝置。因此,根據該彎曲矯正系統,由於是在接收到表示可接收第二成形完畢基板之訊號後進行第二成形完畢基板的搬送,所以能夠在適當的時機將第二成形完畢基板搬送至加工裝置。 (Effects, etc.) In the bending correction system, in response to the first communication unit receiving a signal from the processing device indicating that the second formed substrate can be received, the first conveying mechanism conveys the second formed substrate to the processing device. Therefore, according to the bending correction system, since the second formed substrate is conveyed after receiving the signal indicating that the second formed substrate can be received, the second formed substrate can be conveyed to the processing device at an appropriate time.

<技術5> (構成) 技術2至技術4中任一者所述之彎曲矯正系統,其中, 前述中繼部更包含:第二感測器,其對前述第二成形完畢基板已被搬送至前述加工裝置的情形加以檢測; 前述第一控制部,響應於前述第二感測器檢測到前述第二成形完畢基板的搬送,控制前述第一通訊部以向前述加工裝置發送表示向前述加工裝置搬送前述第二成形完畢基板已結束之訊號。 <Technology 5> (composition) The curvature correction system according to any one of Technologies 2 to 4, wherein, The relay part further includes: a second sensor that detects that the second formed substrate has been transported to the processing device; The first control unit, in response to the second sensor detecting the transportation of the second molded substrate, controls the first communication unit to send an indication to the processing device that the second molded substrate has been transported to the processing device. The signal of the end.

(功效等) 在該彎曲矯正系統中,響應於第二感測器檢測到第二成形完畢基板的搬送,向加工裝置發送表示向加工裝置搬送第二成形完畢基板已結束之訊號。因此,根據該彎曲矯正系統,能夠使加工裝置認知到向加工裝置搬送第二成形完畢基板已結束。 (Effects, etc.) In the bending correction system, in response to the second sensor detecting the conveyance of the second formed substrate, a signal indicating that the conveyance of the second formed substrate to the processing device has been completed is sent to the processing device. Therefore, according to the bending correction system, the processing device can recognize that the conveyance of the second formed substrate to the processing device has been completed.

<技術5-2> (構成) 技術1至技術5中任一者所述之彎曲矯正系統,其中, 前述第一搬送機構包含: 一對軌道,其載置有第前述第二成形完畢基板;及 搬送構件,其搬送被載置於前述一對軌道上的前述第二成形完畢基板。 <Technique 5-2> (Composition) The bending correction system described in any one of Techniques 1 to 5, wherein, the aforementioned first conveying mechanism comprises: a pair of rails on which the aforementioned second formed substrate is placed; and a conveying member that conveys the aforementioned second formed substrate placed on the aforementioned pair of rails.

(功效等) 在該彎曲矯正系統中,自彎曲矯正裝置接收到的第二成形完畢基板被載置於一對軌道上,且搬送構件將被載置於一對軌道上的第二成形完畢基板搬送至加工裝置。因此,根據該彎曲矯正系統,由於是藉由第一搬送機構將第二成形完畢基板自彎曲矯正裝置搬送至加工裝置,即便彎曲矯正裝置自加工裝置獨立,也能夠輕易將第二成形完畢基板搬送至加工裝置。 (Effects, etc.) In the bending correction system, the second formed substrate received from the bending correction device is placed on a pair of rails, and the conveying member conveys the second formed substrate placed on the pair of rails to the processing device. Therefore, according to the bending correction system, since the second formed substrate is conveyed from the bending correction device to the processing device by the first conveying mechanism, even if the bending correction device is independent of the processing device, the second formed substrate can be easily conveyed to the processing device.

<技術6> (構成) 技術1至技術5中任一者所述之彎曲矯正系統,其中, 前述彎曲矯正裝置具備: 第一收容部,其收容前述第一成形完畢基板; 加熱部,其加熱前述第一成形完畢基板; 冷卻部,其在對前述第一成形完畢基板加壓的狀態下冷卻前述第一成形完畢基板;及 第二搬送機構,其將自前述第一收容部供給而來的前述第一成形完畢基板搬送至前述加熱部,並將由前述加熱部加熱後的前述第一成形完畢基板搬送至前述冷卻部;並且, 前述加熱部,在前述第一成形完畢基板被配置在前述加熱部中形成的內部空間中的狀態下,加熱前述第一成形完畢基板。 <Technology 6> (composition) The curvature correction system according to any one of Technologies 1 to 5, wherein, The aforementioned bend correction device has: A first receiving part that receives the aforementioned first formed substrate; a heating part that heats the first formed substrate; a cooling unit that cools the first formed substrate while pressurizing the first formed substrate; and a second transport mechanism that transports the first formed substrate supplied from the first accommodating section to the heating section, and transports the first formed substrate heated by the heating section to the cooling section; and , The heating unit heats the first molded substrate in a state where the first molded substrate is disposed in the internal space formed in the heating unit.

(功效等) 在該彎曲矯正系統所含的彎曲矯正裝置中,第一成形完畢基板在被配置在加熱部的內部空間中的狀態下被加熱。因此,根據該彎曲矯正系統,與例如加熱部的上方整體開放的情況相較,能夠改善第一成形完畢基板的加熱效率。又,根據該彎曲矯正系統,由於在第一成形完畢基板的加熱時不對第一成形完畢基板施加必要以上的力,所以能夠減低第一成形完畢基板破損的可能性。 (efficacy, etc.) In the bend correction device included in this bend correction system, the first molded substrate is heated while being arranged in the internal space of the heating unit. Therefore, according to this bend correction system, the heating efficiency of the first molded substrate can be improved compared to, for example, a case where the upper part of the heating portion is entirely open. Furthermore, according to this bend correction system, no force greater than necessary is applied to the first molded substrate when heating the first molded substrate, so the possibility of damage to the first molded substrate can be reduced.

<技術7> (構成) 技術6所述之彎曲矯正系統,其中, 前述內部空間的高度方向的長度,比未發生彎曲的狀態的前述第一成形完畢基板的高度方向的長度更長。 <Technology 7> (composition) The bend correction system described in Technology 6, wherein, The height direction length of the internal space is longer than the height direction length of the first molded substrate in an unbent state.

(功效等) 根據該彎曲矯正系統,由於加熱部的內部空間的高度方向的長度,比未發生彎曲的狀態的第一成形完畢基板的高度方向的長度更長,所以能夠抑制在第一成形完畢基板的加熱時對第一成形完畢基板施加了必要以上的力的事態。 (Effects, etc.) According to the bending correction system, since the length of the internal space of the heating unit in the height direction is longer than the length of the first formed substrate in the non-bent state in the height direction, it is possible to prevent the first formed substrate from being subjected to a force greater than necessary when the first formed substrate is heated.

<技術8> (構成) 技術1至技術7中任一者所述之彎曲矯正系統,其中, 前述加工裝置包含:第二收容部,其收容前述第二成形完畢基板; 藉由前述第一搬送機構所搬送的前述第二成形完畢基板被收容於前述第二收容部。 <Technique 8> (Composition) The bending correction system described in any one of Techniques 1 to 7, wherein, the aforementioned processing device includes: a second receiving portion, which receives the aforementioned second formed substrate; the aforementioned second formed substrate transported by the aforementioned first transport mechanism is received in the aforementioned second receiving portion.

(功效等) 在該彎曲矯正系統中,藉由第一搬送機構所搬送的第二成形完畢基板被收容於第二收容部。因此,根據該彎曲矯正系統,由於是藉由第一搬送機構將第二成形完畢基板自彎曲矯正裝置搬送至加工裝置,且將第二成形完畢基板收容於第二收容部,即便彎曲矯正裝置自加工裝置獨立,也能夠輕易將第二成形完畢基板收容於第二收容部。 (efficacy, etc.) In this bend correction system, the second molded substrate transported by the first transport mechanism is accommodated in the second accommodating portion. Therefore, according to this bend correction system, since the second molded substrate is transported from the bend correction device to the processing device by the first transport mechanism, and the second molded substrate is accommodated in the second accommodating portion, even if the bend correction device automatically Even if the processing device is independent, the second molded substrate can be easily accommodated in the second accommodation portion.

<技術9> (構成) 一種製造系統,具備: 技術8所述的彎曲矯正系統;及 前述加工裝置;並且, 前述加工裝置更包含:第二控制部,其對應於前述第二收容部中的前述第二成形完畢基板的收容狀態,判定是否可接收前述第二成形完畢基板。 <Technology 9> (composition) A manufacturing system that has: The curve correction system described in Technology 8; and The aforementioned processing device; and, The processing device further includes a second control unit that determines whether the second molded substrate can be received in response to the storage state of the second molded substrate in the second accommodating part.

(功效等) 在該製造系統中,是對應於第二收容部中的第二成形完畢基板的收容狀態,判定由加工裝置進行的第二成形完畢基板的接收是否可行。因此,根據該製造系統,能夠適當判定加工裝置中是否可接收第二成形完畢基板。 (Effects, etc.) In the manufacturing system, it is determined whether the second formed substrate can be received by the processing device according to the storage state of the second formed substrate in the second storage unit. Therefore, according to the manufacturing system, it is possible to appropriately determine whether the second formed substrate can be received in the processing device.

<技術10> (構成) 技術9所述之製造系統,其中, 前述加工裝置更包含:第二通訊部,其與前述彎曲矯正系統通訊;並且, 前述第二控制部,在判定可接收前述第二成形完畢基板的情況下,控制前述第二通訊部,以向前述彎曲矯正系統發送表示可接收前述第二成形完畢基板之訊號。 <Technology 10> (composition) The manufacturing system described in Technology 9, wherein, The aforementioned processing device further includes: a second communication unit that communicates with the aforementioned bend correction system; and, When it is determined that the second formed substrate can be received, the second control unit controls the second communication unit to send a signal indicating that the second formed substrate can be received to the bend correction system.

(功效等) 在該製造系統中,在判定加工裝置中可接收第二成形完畢基板的情況下,自加工裝置向彎曲矯正系統發送表示可接收第二成形完畢基板之訊號(接收可能訊號)。因此,根據該製造系統,能夠僅在加工裝置中可接收第二成形完畢基板的情況下,將第二成形完畢基板自彎曲矯正系統搬送至加工裝置。 (efficacy, etc.) In this manufacturing system, when it is determined that the second molded substrate can be received in the processing device, a signal (reception possible signal) indicating that the second molded substrate can be received is sent from the processing device to the bend correction system. Therefore, according to this manufacturing system, the second molded substrate can be transported from the bend correction system to the processing device only when the processing device can receive the second molded substrate.

1:製造系統 5:彎曲矯正系統 10:彎曲矯正裝置 20:切斷裝置 30:中繼部 100:第一收容部 101:基板匣 110:搬入側軌道部 120:加熱部 121,131:下構件 122,132:上構件 123,124:加熱器 130:冷卻部 140:搬出側軌道部 150:第二搬送機構 151,154,157:搬送機構 152,158:吸附部 160:第一控制裝置 161:第一通訊部 162:第一控制部 200:第二控制裝置 201:第二通訊部 202:第二控制部 210:第二收容部 220:角管 300:第一搬送機構 305:基座板 310:中繼軌道 320:電動致動器 321:推桿 330:蓋體 340:第一感測器 341:第二感測器 350:治具 360:第一定位構件 361,371:軸 362:L字狀構件 370:第二定位構件 372:調整螺栓 373:板狀構件 380:承軸構件 381:固定部 382:承受部 C1,C2:凹部 L1:通訊線 S1:第一成形完畢基板 S2:第二成形完畢基板 V1:內部空間 1: Manufacturing system 5: Bending correction system 10: Bending correction device 20: Cutting device 30: Relay unit 100: First storage unit 101: Substrate box 110: Loading side rail unit 120: Heating unit 121,131: Lower component 122,132: Upper component 123,124: Heater 130: Cooling unit 140: Loading side rail unit 150: Second conveying mechanism 151,154,157: Conveying mechanism 152,158: Adsorption unit 160: First control unit 161: First communication unit 162: First control unit 200: Second control unit 201: Second communication unit 202: Second control unit 210: Second storage unit 220: Angle tube 300: First conveying mechanism 305: Base plate 310: Intermediate rail 320: Electric actuator 321: Push rod 330: Cover 340: First sensor 341: Second sensor 350: Fixture 360: First positioning member 361,371: Shaft 362: L-shaped member 370: Second positioning member 372: Adjustment bolt 373: Plate member 380: Bearing member 381: Fixing unit 382: Receiving unit C1,C2: Recess L1: Communication line S1: First formed substrate S2: Second formed substrate V1: Internal space

第1圖是示意性表示包含彎曲矯正系統的製造系統的正面圖。 第2圖是示意性表示彎曲矯正裝置的斜視圖。 第3圖是示意性表示彎曲矯正裝置的俯視圖。 第4圖是示意性表示下構件及上構件閉合狀態中的剖面的圖。 第5圖是示意性表示治具的俯視圖。 第6圖是示意性表示治具的正面圖。 第7圖是示意性表示第5圖的VII-VII剖面的圖。 第8圖是示意性表示第一搬送機構的俯視圖。 第9圖是示意性表示第8圖的IX-IX剖面的圖。 第10圖是表示自彎曲矯正裝置至切斷裝置的第二成形完畢基板的搬送動作的流程圖。 Fig. 1 is a front view schematically showing a manufacturing system including a bend correction system. Fig. 2 is a perspective view schematically showing the curvature correction device. Fig. 3 is a plan view schematically showing the curvature correction device. Fig. 4 is a diagram schematically showing a cross-section of the lower member and the upper member in a closed state. Fig. 5 is a top view schematically showing the jig. Figure 6 is a front view schematically showing the jig. Fig. 7 is a diagram schematically showing the VII-VII cross section of Fig. 5. Fig. 8 is a plan view schematically showing the first conveyance mechanism. Fig. 9 is a diagram schematically showing the IX-IX cross section of Fig. 8. FIG. 10 is a flowchart showing the transport operation of the second formed substrate from the bend correction device to the cutting device.

國內寄存資訊(請依寄存機構、日期、號碼順序註記) 無 國外寄存資訊(請依寄存國家、機構、日期、號碼順序註記) 無 Domestic storage information (please note in order of storage institution, date and number) without Overseas storage information (please note in order of storage country, institution, date, and number) without

1:製造系統 1: Manufacturing system

5:彎曲矯正系統 5:Bend correction system

10:彎曲矯正裝置 10:Bend correction device

20:切斷裝置 20: Cut off device

30:中繼部 30: Relay Department

160:第一控制裝置 160: First control device

161:第一通訊部 161: First Communications Department

162:第一控制部 162:First Control Department

200:第二控制裝置 200: Second control device

201:第二通訊部 201: Second Communications Department

202:第二控制部 202: Second control unit

210:第二收容部 210:Second Containment Department

300:第一搬送機構 300: First transport mechanism

350:治具 350:Jig

L1:通訊線 L1: communication line

Claims (10)

一種彎曲矯正系統,具備: 彎曲矯正裝置,其矯正第一成形完畢基板的彎曲,並製造第二成形完畢基板;及 中繼部,其被配置在前述彎曲矯正裝置的外部的加工裝置與前述彎曲矯正裝置之間;其中, 前述加工裝置進行前述第二成形完畢基板的加工; 前述中繼部包含:第一搬送機構,其自前述彎曲矯正裝置接收前述第二成形完畢基板,並將已接收的前述第二成形完畢基板搬送至前述加工裝置。 A curve correction system with: A bend correction device that corrects the bend of the first formed substrate and manufactures the second formed substrate; and a relay portion disposed between the external processing device of the bend correction device and the bend correction device; wherein, The aforementioned processing device processes the aforementioned second formed substrate; The relay unit includes a first transport mechanism that receives the second molded substrate from the bend correction device and transports the received second molded substrate to the processing device. 如請求項1所述之彎曲矯正系統,更具備: 第一控制部,其控制前述第一搬送機構;及 第一通訊部,其與前述加工裝置通訊。 The bend correction system as described in claim 1 further has: The first control part controls the aforementioned first conveying mechanism; and The first communication unit communicates with the aforementioned processing device. 如請求項2所述之彎曲矯正系統,其中, 前述中繼部更包含:第一感測器,其對已自前述彎曲矯正裝置接收到前述第二成形完畢基板的情形加以檢測; 前述第一控制部,響應於前述第一感測器檢測到前述第二成形完畢基板的接收,控制前述第一通訊部以向前述加工裝置發送要求前述第二成形完畢基板的接收之訊號。 The curvature correction system as claimed in claim 2, wherein, The relay part further includes: a first sensor that detects that the second formed substrate has been received from the bend correction device; The first control part, in response to the first sensor detecting the reception of the second formed substrate, controls the first communication part to send a signal requesting the reception of the second formed substrate to the processing device. 如請求項2或3所述之彎曲矯正系統,其中, 前述第一控制部,響應於前述第一通訊部自前述加工裝置接收到表示可接收前述第二成形完畢基板之訊號,控制前述第一搬送機構以將前述第二成形完畢基板搬送至前述加工裝置。 The bending correction system as described in claim 2 or 3, wherein, the first control unit, in response to the first communication unit receiving a signal from the processing device indicating that the second formed substrate can be received, controls the first conveying mechanism to convey the second formed substrate to the processing device. 如請求項2~4中任一項所述之彎曲矯正系統,其中, 前述中繼部更包含:第二感測器,其對前述第二成形完畢基板已被搬送至前述加工裝置的情形加以檢測; 前述第一控制部,響應於前述第二感測器檢測到前述第二成形完畢基板的搬送,控制前述第一通訊部以向前述加工裝置發送表示向前述加工裝置搬送前述第二成形完畢基板已結束之訊號。 The curvature correction system according to any one of claims 2 to 4, wherein, The relay part further includes: a second sensor that detects that the second formed substrate has been transported to the processing device; The first control unit, in response to the second sensor detecting the transportation of the second molded substrate, controls the first communication unit to send an indication to the processing device that the second molded substrate has been transported to the processing device. The signal of the end. 如請求項1~5中任一項所述之彎曲矯正系統,其中, 前述彎曲矯正裝置具備: 第一收容部,其收容前述第一成形完畢基板; 加熱部,其加熱前述第一成形完畢基板; 冷卻部,其在對前述第一成形完畢基板加壓的狀態下冷卻前述第一成形完畢基板;及 第二搬送機構,其將自前述第一收容部供給而來的前述第一成形完畢基板搬送至前述加熱部,並將由前述加熱部加熱後的前述第一成形完畢基板搬送至前述冷卻部;並且, 前述加熱部,在前述第一成形完畢基板被配置在前述加熱部中形成的內部空間中的狀態下,加熱前述第一成形完畢基板。 A bending correction system as described in any one of claims 1 to 5, wherein, the bending correction device comprises: a first receiving section for receiving the first formed substrate; a heating section for heating the first formed substrate; a cooling section for cooling the first formed substrate while pressurizing the first formed substrate; and a second conveying mechanism for conveying the first formed substrate supplied from the first receiving section to the heating section, and conveying the first formed substrate heated by the heating section to the cooling section; and, the heating section heats the first formed substrate while the first formed substrate is arranged in an internal space formed in the heating section. 如請求項6所述之彎曲矯正系統,其中, 前述內部空間的高度方向的長度,比未發生彎曲的狀態的前述第一成形完畢基板的高度方向的長度更長。 The curvature correction system as claimed in claim 6, wherein, The height direction length of the internal space is longer than the height direction length of the first molded substrate in an unbent state. 如請求項1~7中任一項所述之彎曲矯正系統,其中, 前述加工裝置包含:第二收容部,其收容前述第二成形完畢基板; 藉由前述第一搬送機構所搬送的前述第二成形完畢基板被收容於前述第二收容部。 The curvature correction system according to any one of claims 1 to 7, wherein, The aforementioned processing device includes: a second accommodation portion that accommodates the aforementioned second formed substrate; The second molded substrate transported by the first transport mechanism is accommodated in the second accommodating portion. 一種製造系統,具備: 請求項8所述的彎曲矯正系統;及 前述加工裝置;並且, 前述加工裝置更包含:第二控制部,其對應於前述第二收容部中的前述第二成形完畢基板的收容狀態,判定是否可接收前述第二成形完畢基板。 A manufacturing system that has: The curvature correction system described in claim 8; and The aforementioned processing device; and, The processing device further includes a second control unit that determines whether the second molded substrate can be received in response to the storage state of the second molded substrate in the second accommodating part. 如請求項9所述之製造系統,其中: 前述加工裝置更包含:第二通訊部,其與前述彎曲矯正系統通訊;並且, 前述第二控制部,在判定可接收前述第二成形完畢基板的情況下,控制前述第二通訊部,以向前述彎曲矯正系統發送表示可接收前述第二成形完畢基板之訊號。 A manufacturing system as described in claim 9, wherein: the aforementioned processing device further comprises: a second communication unit, which communicates with the aforementioned bending correction system; and, the aforementioned second control unit, when determining that the aforementioned second formed substrate can be received, controls the aforementioned second communication unit to send a signal to the aforementioned bending correction system indicating that the aforementioned second formed substrate can be received.
TW112122328A 2022-08-25 2023-06-15 Bending correction system and manufacturing system TW202410212A (en)

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