TW202403933A - A die ejector and a die bonding apparatus including it - Google Patents

A die ejector and a die bonding apparatus including it Download PDF

Info

Publication number
TW202403933A
TW202403933A TW112113363A TW112113363A TW202403933A TW 202403933 A TW202403933 A TW 202403933A TW 112113363 A TW112113363 A TW 112113363A TW 112113363 A TW112113363 A TW 112113363A TW 202403933 A TW202403933 A TW 202403933A
Authority
TW
Taiwan
Prior art keywords
separator
wafer
drive
shaft
components
Prior art date
Application number
TW112113363A
Other languages
Chinese (zh)
Inventor
李昊城
權圭浩
金竝贊
Original Assignee
南韓商細美事有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 南韓商細美事有限公司 filed Critical 南韓商細美事有限公司
Publication of TW202403933A publication Critical patent/TW202403933A/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67092Apparatus for mechanical treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67132Apparatus for placing on an insulating substrate, e.g. tape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67144Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68381Details of chemical or physical process used for separating the auxiliary support from a device or wafer
    • H01L2221/68386Separation by peeling
    • H01L2221/6839Separation by peeling using peeling wedge or knife or bar

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

The invention provides a die ejector in which the power portion and a driving shaft are separated to prevent the driving shaft from buckling, and the straightness is improved, a method of separating dies using the die ejector, and a die bonding apparatus including the same. In one embodiment, the die ejector includes: an ejector component for ejecting dies on the dicing tape; a hood in close contact with a lower portion surface of the dicing tape and including vacuum holes for sucking the dicing tape and an opening through which the ejector component passes; an ejector body connected to the hood and including a driving shaft extending along a vertical direction therein for lifting and descending the ejector component and an air pipe in communication with the opening; and a power portion disposed below the driving shaft and in contact with the driving shaft to lift and descend the driving shaft along the vertical direction.

Description

晶片分離器及包括該晶片分離器的黏晶裝置Wafer separator and die bonding device including the same

本發明涉及動力部和驅動軸分離,防止驅動軸的屈曲,直線度得到改善的晶片分離器及包括該晶片分離器的黏晶裝置。The present invention relates to a wafer separator that separates a power part from a drive shaft, prevents buckling of the drive shaft, and improves straightness, and a die bonding device including the wafer separator.

半導體元件製造製程通過以晶圓為對象重複執行由曝光顯影、蝕刻、擴散、沉積及金屬加工等各種製程構成的單位製程來完成。形成由該半導體元件的晶圓通過切割製程分割成多個晶片,而該晶片通過接合製程接合在基板上。The semiconductor device manufacturing process is completed by repeatedly executing a unit process consisting of various processes such as exposure and development, etching, diffusion, deposition, and metal processing on a wafer. The wafer forming the semiconductor device is divided into multiple wafers through a cutting process, and the wafers are bonded to the substrate through a bonding process.

執行該黏晶製程的裝置可包括:拾取裝置,拾取該晶片進行分離;接合模組,將拾取的晶片附著於基板上。該拾取模組可包括:載台單元,支撐該晶圓;晶片分離器,以可沿垂直方向移動的方式安裝,以選擇性地從被該載台單元支撐的晶圓分離晶片;拾取單元,從該晶圓拾取該晶片附著於基板上。The device for performing the die bonding process may include: a pickup device that picks up the wafer for separation; and a bonding module that attaches the picked wafer to the substrate. The pickup module may include: a stage unit supporting the wafer; a wafer separator installed movably in a vertical direction to selectively separate the wafer from the wafer supported by the stage unit; the pickup unit, The wafer is picked up from the wafer and attached to the substrate.

該晶片分離器可包括:罩體,形成有用於吸附該切割膠帶的下部面的真空孔;分離器單元,設置於該罩體內並通過該罩體的上部沿垂直方向移動,以將該切割膠帶上的晶片從該切割膠帶進行分離。The wafer separator may include: a cover body formed with a vacuum hole for adsorbing the lower surface of the dicing tape; a separator unit disposed in the cover body and moving in a vertical direction through an upper part of the cover body to remove the dicing tape The wafer is separated from the dicing tape.

近來,隨著晶片的厚度變薄,在晶片分離過程中,有可能出現該晶片受損或不被該拾取單元拾取的不良問題,從而需要可精確剝離晶片的方法。Recently, as the thickness of the wafer becomes thinner, there may be a problem that the wafer is damaged or not picked up by the pickup unit during the wafer separation process, thereby requiring a method that can accurately peel off the wafer.

圖1為現有的晶片分離器20的概略正面圖。FIG. 1 is a schematic front view of a conventional wafer separator 20 .

如圖1所示,在晶片分離器20的罩體21上具備多個分離器部件22,而在與該罩體21結合的分離器主體內部,存在用於升降該些分離器部件22的多個驅動部23。此時,該些驅動部23的下部一側與動力部24結合並隨該動力部24沿垂直方向上升而一同上升,以升降該些分離器部件22,從而剝離附著於切割膠帶12上的晶片2。另外,因多個驅動部23相互連接,無法個別升降各分離器部件22,只能對外側的分離器部件22向內側分離器部件22依次提升,或對內側的分離器部件22向外側的分離器部件22依次降低。再者,因該切割膠帶12的拉伸力和升降該分離器部件22的力的衝突,導致該些驅動部23發生屈曲的問題。這時,就出現了需要通過分離該驅動部23及動力部24來進行修理該晶片分離器20的問題。As shown in FIG. 1 , the cover 21 of the wafer separator 20 is provided with a plurality of separator components 22 , and inside the separator main body combined with the cover 21 , there are multiple components for lifting and lowering the separator components 22 . A driving part 23. At this time, the lower side of the driving parts 23 is combined with the power part 24 and rises together with the power part 24 in the vertical direction to lift and lower the separator parts 22 to peel off the wafer attached to the dicing tape 12 2. In addition, since the plurality of driving parts 23 are connected to each other, it is impossible to lift each separator member 22 individually. The outer separator member 22 can only be sequentially lifted toward the inner separator member 22, or the inner separator member 22 can be separated toward the outer side. The device parts 22 are lowered in sequence. Furthermore, due to the conflict between the tensile force of the cutting tape 12 and the force of lifting the separator component 22, the driving parts 23 may buckle. At this time, there arises a problem that the wafer separator 20 needs to be repaired by separating the driving part 23 and the power part 24 .

現有技術文獻existing technical documents

(專利文獻1)韓國申請案第KR10-1585316號。(Patent Document 1) Korean Application No. KR10-1585316.

(專利文獻2)韓國申請案第KR10-1627906號。(Patent Document 2) Korean Application No. KR10-1627906.

要解決的技術問題Technical issues to be solved

本發明的目的在於克服所述問題而提供動力部和驅動軸分離,防止驅動軸的屈曲,直線度得到改善的晶片分離器及包括該晶片分離器的黏晶裝置。An object of the present invention is to provide a wafer separator that overcomes the above problems, separates the power part from the drive shaft, prevents buckling of the drive shaft, and improves straightness, and a die bonding device including the wafer separator.

解決問題的手段means of solving problems

為達到本發明的所述目的,提供如下所述晶片分離器及包括該晶片分離器的黏晶裝置。In order to achieve the object of the present invention, the following wafer separator and a die bonding device including the wafer separator are provided.

在本發明一實施例中,提供一種晶片分離器,包括:分離器部件,用於分離切割膠帶上的晶片;罩體,用於貼緊該切割膠帶的下部面並具備供該分離器部件通過的開口;分離器主體,與該罩體連接並且在內部包括沿垂直方向延伸的驅動軸;動力部,與該驅動軸分離設置並用於升降該驅動軸;及加壓部件,連接於該驅動軸並在該動力部升降該驅動軸時,沿向下方向施加外部壓力。In one embodiment of the present invention, a wafer separator is provided, including: a separator component used to separate wafers on a dicing tape; a cover body used to adhere to the lower surface of the dicing tape and have a structure for the separator component to pass the opening; the separator body, which is connected to the cover and includes a driving shaft extending in the vertical direction; a power part, which is provided separately from the driving shaft and is used to lift and lower the driving shaft; and a pressurizing component, connected to the driving shaft And when the power part lifts and lowers the drive shaft, external pressure is applied in a downward direction.

在一實施例中,該動力部可以包括呈懸臂狀的驅動傳遞塊,該驅動傳遞塊在上表面具有與該驅動軸接觸的接觸面。In one embodiment, the power part may include a cantilever-shaped drive transmission block, and the drive transmission block has a contact surface on an upper surface that contacts the drive shaft.

在一實施例中,該驅動軸的下端部可具有曲面,而該下端部與該接觸面點接觸。In one embodiment, the lower end of the driving shaft may have a curved surface, and the lower end is in point contact with the contact surface.

在一實施例中,該接觸面可以與該驅動軸的延伸方向垂直。In one embodiment, the contact surface may be perpendicular to the extending direction of the drive shaft.

在一實施例中,該晶片分離器還可包括設置於該分離器主體內部並圍繞該驅動軸的軸導件。In one embodiment, the wafer separator may further include a shaft guide disposed inside the separator body and surrounding the drive shaft.

在一實施例中,該晶片分離器還可包括設置於該罩體內部的推桿導件,該推桿導件連接該驅動軸的上端部及該分離器部件的一側面,導引該分離器部件沿垂直方向移動。In one embodiment, the wafer separator may further include a push rod guide disposed inside the cover. The push rod guide connects the upper end of the drive shaft and a side surface of the separator component to guide the separation. The parts move vertically.

在本發明一實施例中,提供一種晶片分離器,包括:多個分離器部件,分離切割膠帶上的晶片;多個驅動軸,升降該些分離器部件;多個驅動傳遞塊,與該些驅動軸分離設置並各自升降該些驅動軸;及多個加壓部件,連接於該些驅動軸並在升降時,沿向下方向施加外部壓力;其中,該些分離器部件、多個驅動軸、多個驅動傳遞塊及多個加壓部件各一對一連接。In one embodiment of the present invention, a wafer separator is provided, including: a plurality of separator components for separating wafers on a dicing tape; a plurality of drive shafts for lifting and lowering the separator components; a plurality of drive transmission blocks, and the The driving shafts are separately arranged and lift the driving shafts respectively; and a plurality of pressurizing components are connected to the driving shafts and apply external pressure in the downward direction when lifting; wherein, the separator components, the plurality of driving shafts , multiple drive transmission blocks and multiple pressurizing components are each connected one-to-one.

在本發明一實施例中,提供一種黏晶裝置,包括:晶片分離器,向上推該晶片以使其上升,從而將附著於切割膠帶上的晶片從該切割膠片進行分離;及黏晶模組,將通過該晶片分離器分離的該晶片接合於基板上;其中,該晶片分離器,包括:多個分離器部件,以疊套形式設置並分離切割膠帶上的晶片;罩體,貼緊該切割膠片的下部面,並具備真空吸附該切割膠帶的真空孔和供該些分離器部件通過的開口;分離器主體,與該罩體連接,並在內部具有沿垂直方向延伸且各自升降該些分離器部件的多個驅動軸以及連通於該開口的空氣管路;多個驅動傳遞塊,設置於該些驅動軸下部,並各與該些驅動軸接觸,以沿該垂直方向升降該些驅動軸;加壓部件,設置於該分離器主體內部,並且由各自圍繞該些驅動軸的彈性體構成,且通過該驅動傳遞塊對該驅動軸施加壓力;軸導件,設置於該分離器主體內部並各圍繞該些驅動軸的軸導件;及推桿導件,設置於該罩體內部並連接該些驅動軸各自的上端部和該些分離器部件各自的不同的單側面,且沿該垂直方向導引該分離器部件。In one embodiment of the present invention, a die bonding device is provided, including: a wafer separator that pushes the wafer upward to lift it, thereby separating the wafer attached to the dicing tape from the dicing film; and a die bonding module. , the wafer separated by the wafer separator is joined to the substrate; wherein, the wafer separator includes: a plurality of separator components, which are arranged in a stacked form and separate the wafers on the cutting tape; a cover body, which is close to the The lower surface of the cutting film is provided with a vacuum hole for vacuum adsorbing the cutting tape and an opening for the separator components to pass; the separator main body is connected to the cover body and has internal components extending in a vertical direction and lifting and lowering respectively. A plurality of drive shafts of the separator component and an air pipeline connected to the opening; a plurality of drive transmission blocks are provided at the lower portions of the drive shafts and are each in contact with the drive shafts to lift and lower the drives in the vertical direction. a shaft; a pressurizing component, which is disposed inside the separator body and is composed of an elastomer each surrounding the drive shafts, and exerts pressure on the drive shaft through the drive transmission block; a shaft guide, which is disposed inside the separator body a shaft guide that is internal and surrounds each of the drive shafts; and a push rod guide that is disposed inside the cover and connects the respective upper ends of the drive shafts and the different single sides of the separator components, and along the The vertical direction guides the separator part.

有益效果beneficial effects

本發明可提供動力部和驅動軸分離,防止驅動軸的屈曲,直線度得到改善的晶片分離器及包括該晶片分離器的黏晶裝置。The present invention can provide a wafer separator in which the power part and the drive shaft are separated, the buckling of the drive shaft is prevented, and the straightness is improved, and a die bonding device including the wafer separator.

下面,結合附圖對本發明的優選實施例進行詳細說明,以幫助發明所屬技術領域通常知識者更好地理解本發明。但是,在詳細說明本發明優選實施例的過程中,若認為對相關已知配置或功能的詳細說明會混淆本發明的主旨,則將省略其詳細說明。另外,對起到類似的功能及作用的部件,在全部附圖中使用相同的附圖標記。另外,在本說明書中,“上”、“上部”、“上表面”、“下”、“下部”、“下表面”、“側面”等術語是基於附圖的,而在實際情況下,可根據元件和構件的設置方向有所不同。Below, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings to help those with ordinary knowledge in the technical field to which the invention belongs better understand the present invention. However, during the detailed description of the preferred embodiments of the present invention, if the detailed description of related known configurations or functions is considered to obscure the gist of the present invention, the detailed description will be omitted. In addition, the same reference numerals are used throughout the drawings for components that have similar functions and effects. In addition, in this specification, terms such as "upper", "upper part", "upper surface", "lower", "lower part", "lower surface", "side", etc. are based on the drawings, but in actual situations, Can vary depending on the orientation of components and structures.

另外,在全部說明書中,說某個部分與其他部分“連接”時,其不僅包括“直接連接”的情況,而且,還包括其中間通過其他部件“間接連接”的情況。此外,“包括”某個構成要素是指可以進一步包括其他構成要素,而不是排除其他構成要素,除非另有相反的記載。In addition, throughout the specification, when it is said that a certain part is "connected" to other parts, it includes not only the case of "direct connection", but also the case of "indirect connection" through other parts. In addition, "including" a certain constituent element means that other constituent elements can be further included, rather than excluding other constituent elements, unless otherwise stated to the contrary.

圖2為用於說明根據本發明一實施例的黏晶裝置10的俯視示意圖;圖3為圖2的根據本發明一實施例的晶片分離器100的立體示意圖;圖4為用於說明根據本發明一實施例的晶片拾取裝置200的截面示意圖。以下結合圖2至圖4進行說明。FIG. 2 is a schematic top view illustrating the die bonding device 10 according to an embodiment of the present invention; FIG. 3 is a schematic three-dimensional view of the wafer separator 100 according to an embodiment of the present invention; A schematic cross-sectional view of a wafer pickup device 200 according to an embodiment of the invention. Description will be made below with reference to Figures 2 to 4.

黏晶裝置10可用於從含有通過切割製程獨立分開的晶片2的晶圓1上拾取該晶片2並接合於基板3上。該黏晶裝置10還可以包括:晶舟裝載端口6,放置用於收納該晶圓1的晶舟5;晶圓導軌7,用於導引該晶圓1的移送;以及晶圓移送單元8,用於將晶圓1從該晶舟5移送至該晶圓載台13。The die bonding device 10 can be used to pick up the wafer 2 from the wafer 1 containing the wafer 2 independently separated by the cutting process and bond the wafer 2 to the substrate 3 . The die bonding device 10 may also include: a wafer boat loading port 6 for placing the wafer boat 5 for receiving the wafer 1; a wafer guide rail 7 for guiding the transfer of the wafer 1; and a wafer transfer unit 8 , used to transfer the wafer 1 from the wafer boat 5 to the wafer stage 13 .

該晶圓1可以附著於切割膠帶12的狀態提供,而該切割膠帶12可裝設於大致呈圓環狀的安裝框架15。此時,該黏晶裝置10包括用於支撐該晶圓1的載台單元11,而該載台單元11可包括:晶圓載台13,可沿水平方向移動;擴展環14,設置於該晶圓載台13上並用於支撐該切割膠帶12上的邊緣部位;以及夾具,用於通過降低安裝框架15以擴展該切割膠帶12。The wafer 1 can be provided in a state of being attached to a dicing tape 12 , and the dicing tape 12 can be mounted on a substantially annular mounting frame 15 . At this time, the die bonding device 10 includes a stage unit 11 for supporting the wafer 1, and the stage unit 11 may include: a wafer stage 13 that can move in a horizontal direction; an expansion ring 14 that is disposed on the wafer 1. a round stage 13 for supporting the edge of the cutting tape 12; and a clamp for extending the cutting tape 12 by lowering the mounting frame 15.

進一步地,該黏晶裝置10可包括:晶片分離器100,用於從該切割膠帶12選擇性地分離該晶片2;晶片拾取裝置200,用於拾取通過該晶片分離器100從該切割膠帶12至少部分分離的晶片2。此時,該晶片拾取裝置200可包括:拾取器210、用於移動該拾取器210的拾取器驅動部220等。與此同時,在該晶圓載台13的上方,可設置用於從該晶片2中檢測需要拾取的晶片2的攝像機單元230。Further, the die bonding device 10 may include: a wafer separator 100 for selectively separating the wafer 2 from the dicing tape 12; and a wafer pickup device 200 for picking up the wafer 2 from the dicing tape 12 through the wafer separator 100. At least partially separated wafer 2 . At this time, the wafer pickup device 200 may include: a pickup 210, a pickup driving part 220 for moving the pickup 210, and the like. At the same time, above the wafer stage 13, a camera unit 230 for detecting the wafer 2 to be picked up from the wafer 2 can be provided.

該拾取器210可設置於該晶圓1上方,可利用真空壓力拾取該晶片2。另外,該拾取器210可被配置為可通過該拾取器驅動部220沿垂直及水平方向移動,且可進行旋轉以調整被該拾取器210拾取的晶片2的角度。該拾取器驅動部220可沿水平及垂直方向移動,以將已逐一拾取該晶片2的該拾取器200移送至晶片載台1517上。此時,該晶片分離器100可通過將待拾取的晶片2推升上來,以將其從該切割膠帶12分離出來,以便拾取。The picker 210 can be disposed above the wafer 1 and can use vacuum pressure to pick up the wafer 2 . In addition, the pickup 210 may be configured to move in vertical and horizontal directions through the pickup driving part 220, and may be rotated to adjust the angle of the wafer 2 picked up by the pickup 210. The pickup driving part 220 can move in horizontal and vertical directions to move the pickup 200 that has picked up the wafers 2 one by one to the wafer stage 1517 . At this time, the wafer separator 100 can push up the wafer 2 to be picked up to separate it from the dicing tape 12 for picking.

因此,如圖2所示,被拾取的該晶片2可通過該晶片拾取裝置200移送至晶片載台1517上,而黏晶模組16可拾取該晶片載台1517上的晶片2接合於該基板3上。該基板3從第一卡槽4a移送至基板載台3s,在該基板載台3s上調節該基板3的位置完成黏晶製程,之後將該基板3移送至第二卡槽4b。Therefore, as shown in FIG. 2 , the picked wafer 2 can be transferred to the wafer stage 1517 through the wafer pickup device 200 , and the die bonding module 16 can pick up the wafer 2 on the wafer stage 1517 and bond it to the substrate. 3 on. The substrate 3 is transferred from the first slot 4a to the substrate stage 3s, the position of the substrate 3 is adjusted on the substrate stage 3s to complete the die bonding process, and then the substrate 3 is transferred to the second slot 4b.

圖5至圖8表示根據本發明一實施例的晶片分離器100。具體而言,圖5為根據本發明一實施例的晶片分離器100的局部分解示意圖;圖6為根據本發明一實施例的晶片分離器100的截面示意圖;圖7為根據本發明一實施例的晶片分離器100的下部局部放大示意圖;圖8為根據本發明一實施例的晶片分離器100的上部局部放大示意圖。下面,結合圖5至圖8進行詳細說明。5 to 8 illustrate a wafer separator 100 according to an embodiment of the present invention. Specifically, FIG. 5 is a partially exploded schematic view of the wafer separator 100 according to an embodiment of the present invention; FIG. 6 is a cross-sectional schematic view of the wafer separator 100 according to an embodiment of the present invention; FIG. 7 is a schematic cross-sectional view of the wafer separator 100 according to an embodiment of the present invention. FIG. 8 is a partially enlarged schematic diagram of the lower part of the wafer separator 100 according to an embodiment of the present invention. Detailed description will be given below with reference to FIGS. 5 to 8 .

如圖5及圖6所示,根據本發明一實施例的晶片分離器100包括罩體110、與該罩體110結合的分離器主體120及設置於該分離器主體120的下部的動力部130。在該罩體110的內部可提供具有不同尺寸的孔的矩形形狀、以疊套形式(類似望遠鏡)設置並用於分離切割膠帶12(請參閱圖4)上的晶片2的分離器部件101。該罩體110貼緊該切割膠帶12(請參閱圖4)的下部面,具有真空吸附該切割膠帶12的真空孔111和供該分離器部件101通過的開口112。在該分離器主體120的內部設置驅動軸121,而該驅動軸121在該分離器主體120的內部沿該垂直方向延伸,以各自垂直移動該分離器部件101。另外,在該分離器主體120的內部,可具備與該開口112連通的空氣管路124。另外,該分離器部件101的形狀雖然圖示為內部形成有孔的矩形銷的形狀,但也可以矩形塊的形狀形成,本發明不對其進行限制。As shown in FIGS. 5 and 6 , a wafer separator 100 according to an embodiment of the present invention includes a cover 110 , a separator body 120 combined with the cover 110 , and a power part 130 disposed at the lower part of the separator body 120 . A separator part 101 may be provided inside the cover 110 in a rectangular shape with holes of different sizes, arranged in a stack (like a telescope) and used to separate the wafers 2 on the dicing tape 12 (see Figure 4). The cover 110 is close to the lower surface of the cutting tape 12 (see FIG. 4 ) and has a vacuum hole 111 for vacuum adsorbing the cutting tape 12 and an opening 112 for the separator component 101 to pass through. A driving shaft 121 is provided inside the separator body 120 , and the driving shaft 121 extends along the vertical direction inside the separator body 120 to vertically move the separator components 101 respectively. In addition, the separator body 120 may be provided with an air pipe 124 communicating with the opening 112 inside. In addition, although the shape of the separator member 101 is shown as a rectangular pin with a hole formed inside, it may also be formed in the shape of a rectangular block, and the present invention is not limited thereto.

該些分離器部件101可包括設置於最內側的第一分離器部件101a、相鄰設置於該第一分離器部件101a的外側的第二分離器部件101b、相鄰設置於該第二分離器部件101b的外側的第三分離器部件101c及設置於最外側的第四分離器部件101d,而多個該分離器部件101a、101b、101c、101d可以上部面呈矩形形狀的疊套形式設置。另外,該驅動軸121可具有多個,例如,可包括沿該垂直方向升降該第一分離器部件101a的第一驅動軸121a、沿該垂直方向升降該第二分離器部件101b的第二驅動軸121b、沿該垂直方向升降該第三分離器部件101c的第三驅動軸121c及沿該垂直方向升降該第四分離器部件101d的第四驅動軸121d。此時,多個該驅動軸121a、121b、121c、121d可一對一設置於該分離器部件101的不同的單側面。與此同時,該空氣管路124可設置於該些驅動軸121a、121b、121c、121d之間,並可沿垂直方向延伸以對齊於該驅動軸121。The separator components 101 may include a first separator component 101a disposed on the innermost side, a second separator component 101b disposed adjacent to the outer side of the first separator component 101a, and a second separator component 101b disposed adjacent to the second separator component 101a. The third separator component 101c on the outer side of the component 101b and the fourth separator component 101d disposed on the outermost side, and a plurality of the separator components 101a, 101b, 101c, 101d can be arranged in a stacked form with the upper surface having a rectangular shape. In addition, the driving shaft 121 may have multiple, for example, may include a first driving shaft 121a that lifts and lowers the first separator component 101a along the vertical direction, and a second driving shaft that lifts and lowers the second separator component 101b along the vertical direction. The shaft 121b, the third driving shaft 121c that lifts and lowers the third separator part 101c along the vertical direction, and the fourth driving shaft 121d that lifts and lowers the fourth separator part 101d along the vertical direction. At this time, a plurality of the driving shafts 121a, 121b, 121c, and 121d can be disposed one-to-one on different single sides of the separator component 101. At the same time, the air pipe 124 can be disposed between the driving shafts 121a, 121b, 121c, and 121d, and can extend in a vertical direction to be aligned with the driving shaft 121.

因此,在該第一驅動軸121a沿該垂直方向移動的情況下,可升降該第一分離器部件101a,在該第二驅動軸121b沿該垂直方向移動的情況下,可升降該第二分離器部件101b,在該第三驅動軸121c沿該垂直方向移動的情況下,可升降該第三分離器部件101c,而在該第四驅動軸121d沿該垂直方向移動的情況下,可升降該第四分離器部件101d。即根據各驅動軸121的升降,該分離器部件101可聯動一同升降。此時,該分離器部件101及驅動軸121的數量可進行各種變更,可根據接合於基板的該晶片2的大小變化,而本發明的範圍不受該變化的影響。Therefore, when the first drive shaft 121a moves along the vertical direction, the first separator component 101a can be raised and lowered, and when the second drive shaft 121b moves along the vertical direction, the second separator component 101a can be raised and lowered. The third separator component 101b can be raised and lowered when the third driving shaft 121c moves along the vertical direction, and when the fourth driving shaft 121d moves along the vertical direction, the third separator component 101c can be raised and lowered. Fourth separator component 101d. That is, according to the lifting and lowering of each drive shaft 121, the separator component 101 can be moved up and down simultaneously. At this time, the number of the separator components 101 and the driving shafts 121 can be variously changed, and can be changed according to the size of the wafer 2 bonded to the substrate, and the scope of the present invention is not affected by this change.

進一步地,該驅動軸121可包括加壓部件122。該加壓部件122可被配置為在朝向該分離器主體120的內部突出形成的階梯部和該驅動軸121的下端部之間圍繞該驅動軸121。該加壓部件122可各設置在該些驅動軸121a、121b、121c、121d上,可包括設置於該第一驅動軸121a的第一加壓部件122a、設置於該第二驅動軸121b的第二加壓部件122b、設置於該第三驅動軸121c的第三加壓部件122c及設置於該第四驅動軸121d的第四加壓部件122d。在這種情況下,該些加壓部件122a、122b、122c、122d可向該些驅動軸121a、121b、121c、121d施加向下方向的外部壓力。換言之,該驅動軸121可在該加壓部件122向該動力部130施加外部壓力時,在接觸於該動力部130的狀態下沿該垂直方向上升或下降,具體而言,該加壓部122可向將要後述的該驅動傳遞塊132施加外部壓力。在這種情況下,如圖6所示,該加壓部件122可由彈性體構成,但不僅限於此,只要其能向該動力部130施加外部壓力即可。Further, the drive shaft 121 may include a pressurizing member 122 . The pressurizing member 122 may be configured to surround the driving shaft 121 between a step portion protruding toward the inside of the separator body 120 and a lower end portion of the driving shaft 121 . The pressurizing component 122 may be respectively disposed on the drive shafts 121a, 121b, 121c, and 121d, and may include a first pressurizing component 122a disposed on the first drive shaft 121a, a third pressurizing component 122a disposed on the second drive shaft 121b. The two pressing members 122b, the third pressing member 122c provided on the third driving shaft 121c, and the fourth pressing member 122d provided on the fourth driving shaft 121d. In this case, the pressurizing components 122a, 122b, 122c, and 122d may apply downward external pressure to the driving shafts 121a, 121b, 121c, and 121d. In other words, when the pressurizing component 122 applies external pressure to the power part 130, the driving shaft 121 can rise or fall along the vertical direction while contacting the power part 130. Specifically, the pressurizing part 122 External pressure can be applied to the drive transmission block 132, which will be described later. In this case, as shown in FIG. 6 , the pressurizing member 122 may be made of elastic body, but is not limited thereto, as long as it can apply external pressure to the power part 130 .

在此情況下,該動力部130可與該驅動軸121的下部相鄰設置,並可沿垂直方向升降該驅動軸121。該分離器主體120連接於該動力部130,而該動力部130可包括形成有對應於該分離器主體120的大小的主體孔131h的支撐部131。因此,該分離器主體120可插入該主體孔131h,而圍繞該分離器主體120的外側而設的突出部123可以接合到該支撐部131並由該支撐部131支撐。即該分離器主體120可拆卸地接合於該支撐部131,從而該驅動軸121可與該動力部130分開管理,並且可以容易地與該動力部130分開組裝和管理。此外,該動力部130可與該驅動軸121接觸,以沿垂直方向升降該驅動軸121。In this case, the power part 130 can be disposed adjacent to the lower part of the driving shaft 121 and can lift the driving shaft 121 in a vertical direction. The separator body 120 is connected to the power part 130 , and the power part 130 may include a support part 131 formed with a body hole 131 h corresponding to the size of the separator body 120 . Therefore, the separator body 120 can be inserted into the body hole 131h, and the protruding portion 123 provided around the outside of the separator body 120 can be coupled to and supported by the supporting portion 131 . That is, the separator body 120 is detachably coupled to the supporting part 131 , so that the driving shaft 121 can be managed separately from the power part 130 , and can be easily assembled and managed separately from the power part 130 . In addition, the power part 130 can contact the driving shaft 121 to lift the driving shaft 121 in a vertical direction.

在這種情況下,該動力部130可以有多個,並且例如可包括與該第一驅動軸121a的下端部相鄰設置的第一動力部130a、該第二驅動軸121b的下端部相鄰設置的第二動力部130b、與該第三驅動軸121c的下端部相鄰設置的第三動力部130c及與該第四驅動軸121d的下端部相鄰設置的第四動力部130d。此時,該動力部130的數量可與該分離器部件101及驅動軸121的數量相同,因此,當該分離器部件101及驅動軸121的數量發生改變時,該動力部130的數量也可一同發生改變,但本發明的範圍不受限於上述變化。In this case, there may be a plurality of power parts 130, and may include, for example, a first power part 130a adjacent to the lower end of the first drive shaft 121a, and a lower end adjacent to the second drive shaft 121b. The second power part 130b is provided, the third power part 130c is provided adjacent to the lower end of the third driving shaft 121c, and the fourth power part 130d is provided adjacent to the lower end of the fourth driving shaft 121d. At this time, the number of the power part 130 can be the same as the number of the separator part 101 and the drive shaft 121. Therefore, when the number of the separator part 101 and the drive shaft 121 changes, the number of the power part 130 can also be changed. Modifications may occur together, but the scope of the present invention is not limited to the above modifications.

該動力部130還可包括呈懸臂狀的驅動傳遞塊132,該驅動傳遞塊132在其上表面具有與該驅動軸121接觸的接觸面133,而該驅動傳遞塊132可具有多個,例如,可包括設置於該第一動力部130a的第一驅動傳遞塊132a、設置於該第二動力部130b的第二驅動傳遞塊132b、設置於該第三動力部130c的第三驅動傳遞塊132c及設置於該第四動力部130d的第四驅動傳遞塊132d。The power part 130 may further include a cantilever-shaped drive transmission block 132. The drive transmission block 132 has a contact surface 133 on its upper surface that contacts the drive shaft 121. The drive transmission block 132 may have multiple, for example, It may include a first drive transmission block 132a provided on the first power part 130a, a second drive transmission block 132b provided on the second power part 130b, a third drive transmission block 132c provided on the third power part 130c, and The fourth drive transmission block 132d is provided in the fourth power part 130d.

另外,該動力部130還可包括用於沿該垂直方向升降該驅動傳遞塊132的馬達135、滾珠螺桿136及滾珠螺母137。即該驅動傳遞塊132通過該馬達135沿該垂直方向移動,而該驅動軸121得到與該驅動傳遞塊132接觸的該垂直方向的力升降。同樣,該馬達135可以具備多個,可各連接於多個該驅動傳遞塊132a、132b、132c、132d獨立驅動。因此,可個別升降多個該驅動軸121a、121b、121c、121d。因此,在根據本發明一實施例的晶片分離器100中,該些分離器部件101a、101b、101c、101d、多個驅動軸121a、121b、121c、121d、多個驅動傳遞塊132a、132b、132c、132d及多個加壓部件122a、122b、122c、122d可各一對一連接。In addition, the power part 130 may also include a motor 135, a ball screw 136 and a ball nut 137 for lifting and lowering the drive transmission block 132 in the vertical direction. That is, the drive transmission block 132 moves in the vertical direction through the motor 135, and the drive shaft 121 is lifted and lowered by the force in the vertical direction from contact with the drive transmission block 132. Similarly, the motor 135 may be provided in plurality, and each may be connected to a plurality of the drive transmission blocks 132a, 132b, 132c, and 132d to be driven independently. Therefore, a plurality of the drive shafts 121a, 121b, 121c, and 121d can be raised and lowered individually. Therefore, in the wafer separator 100 according to an embodiment of the present invention, the separator components 101a, 101b, 101c, 101d, the plurality of drive shafts 121a, 121b, 121c, 121d, the plurality of drive transmission blocks 132a, 132b, 132c, 132d and the plurality of pressurizing members 122a, 122b, 122c, 122d can each be connected one to one.

在這種情況下,如圖6及圖7所示,該驅動軸121的下端部可具有一曲面,該下端部可點接觸(point contact)於該驅動傳遞塊132的該接觸面133。因此,即使該驅動傳遞塊132相對於該垂直方向是彎曲或傾斜的,也可從該驅動軸121的下端部與該接觸面133接觸的點沿該垂直方向傳遞得到動力。例如,即使該驅動傳遞塊132沿垂直方向彎曲,該驅動軸121也可從該下端部接觸的點傳遞得到垂直方向的力。In this case, as shown in FIGS. 6 and 7 , the lower end of the drive shaft 121 may have a curved surface, and the lower end may be in point contact with the contact surface 133 of the drive transmission block 132 . Therefore, even if the drive transmission block 132 is curved or inclined relative to the vertical direction, power can be transmitted along the vertical direction from the point where the lower end of the drive shaft 121 contacts the contact surface 133 . For example, even if the drive transmission block 132 is bent in a vertical direction, the drive shaft 121 can transmit a force in the vertical direction from the contact point of the lower end.

進一步地,根據本發明第一實施例的晶片分離器100還可包括軸導件140。該軸導件140可設置於該分離器主體120內部並配置成圍繞該驅動軸121。另外,該軸導件140可沿該驅動軸121的長度方向在兩端設置,並且該軸導件140可包括位於上端部的上端部軸導件141及位於下端部的下端部軸導件142。在這種情形下,該軸導件140沿該垂直方向延伸形成,該驅動軸121在該軸導件140內可驅動地上下耦合,因此,該軸導件140可改善該驅動軸121的垂直運動。此外,該軸導件140可在每個該驅動軸121個別設置,以個別導引多個該驅動軸121a、121b、121c、121d。Further, the wafer separator 100 according to the first embodiment of the present invention may further include a shaft guide 140. The shaft guide 140 may be disposed inside the separator body 120 and configured to surround the drive shaft 121 . In addition, the shaft guide 140 may be provided at both ends along the length direction of the drive shaft 121 , and the shaft guide 140 may include an upper end shaft guide 141 located at an upper end and a lower end shaft guide 142 located at a lower end. . In this case, the shaft guide 140 is formed to extend along the vertical direction, and the drive shaft 121 can be driven up and down in the shaft guide 140. Therefore, the shaft guide 140 can improve the vertical direction of the drive shaft 121. sports. In addition, the shaft guide 140 can be individually provided on each driving shaft 121 to individually guide a plurality of the driving shafts 121a, 121b, 121c, and 121d.

另外,根據本發明第一實施例的晶片分離器100還可包括推桿導件150。該推桿導件150設置於該罩體110內部並連接該驅動軸121的上端部及該分離器部件101的單側面。該推桿導件150可沿該垂直方向與該驅動軸並排連接並可連接於該些驅動軸121a、121b、121c、121d,例如,可包括連接於該第一驅動軸121a的第一推桿導件150a、連接於該第二驅動軸121b的第二推桿導件150b、連接於該第三驅動軸121c的第三推桿導件150c及連接於該第四驅動軸121d的第四推桿導件150d。即該些推桿導件150a、150b、150c、150d可一對一連接於該些驅動軸121a、121b、121c、121d的上端部。In addition, the wafer separator 100 according to the first embodiment of the present invention may further include a push rod guide 150 . The push rod guide 150 is disposed inside the cover 110 and connects the upper end of the drive shaft 121 and one side of the separator component 101 . The push rod guide 150 can be connected side by side with the drive shaft along the vertical direction and can be connected to the drive shafts 121a, 121b, 121c, 121d. For example, it can include a first push rod connected to the first drive shaft 121a. The guide member 150a, the second push rod guide 150b connected to the second drive shaft 121b, the third push rod guide 150c connected to the third drive shaft 121c and the fourth push rod guide connected to the fourth drive shaft 121d. Rod guide 150d. That is, the push rod guides 150a, 150b, 150c, and 150d can be connected to the upper ends of the drive shafts 121a, 121b, 121c, and 121d in a one-to-one manner.

再者,該些推桿導件150a、150b、150c、150d可各一對一連接於該些分離器部件101a、101b、101c、101d並可各設置於該分離器部件101的不同單側面,因此,如圖8所示,該些推桿導件150a、150b、150c、150d可以該分離器部件101為中心,各設置於不同的單側面。Furthermore, the push rod guides 150a, 150b, 150c, and 150d can each be connected to the separator parts 101a, 101b, 101c, and 101d in a one-to-one manner and can be respectively disposed on different single sides of the separator part 101, Therefore, as shown in FIG. 8 , the push rod guides 150a, 150b, 150c, and 150d can be centered on the separator component 101, and are each arranged on a different single side.

根據如上該的根據本發明一實施例的晶片分離器100的結構,因該動力部130和該驅動軸121分離,易於組裝及管理,容易沿該垂直方向對齊該動力部130和該驅動軸121。另外,該驅動軸121因與該驅動傳遞塊132點接觸,可不受外部的影響沿該垂直方向升降,該軸導件140及推桿導件150增強該驅動軸121的剛性,從而可防止該驅動軸121屈曲或偏向一側,改善直線度,而且,因該些分離器部件101a、101b、101c、101d、多個驅動軸121a、121b、121c、121d及多個驅動傳遞塊132a、132b、132c、132d各自連接成對移動,從而可使上述各對個別升降。According to the above structure of the wafer separator 100 according to an embodiment of the present invention, since the power part 130 and the drive shaft 121 are separated, it is easy to assemble and manage, and it is easy to align the power part 130 and the drive shaft 121 along the vertical direction. . In addition, because the drive shaft 121 is in point contact with the drive transmission block 132, it can move up and down in the vertical direction without being affected by the outside. The shaft guide 140 and the push rod guide 150 enhance the rigidity of the drive shaft 121, thereby preventing the The drive shaft 121 is bent or deflected to one side to improve the straightness, and because the separator parts 101a, 101b, 101c, 101d, the plurality of drive shafts 121a, 121b, 121c, 121d and the plurality of drive transmission blocks 132a, 132b, 132c and 132d are respectively connected and moved in pairs, so that each pair can be raised and lowered individually.

因此,不同於現有的從外側分離器部件向內側分離器部件分階段升上,或從內側的分離器部件向外側的分離器部件分階段下降的多階段方式,可個別升降該些分離器部件101a、101b、101c、101d,從而可實現精確控制,且因可按時間差個別升降,因此可減少薄的晶片在分離過程中產生的裂縫的發生率。Therefore, unlike the existing multi-stage method in which the outer separator part is raised in stages toward the inner separator part, or the inner separator part is lowered in stages, the separator parts can be raised and lowered individually. 101a, 101b, 101c, and 101d, thereby enabling precise control, and because they can be lifted and lowered individually according to time differences, the incidence of cracks generated in the separation process of thin wafers can be reduced.

進一步地,根據本發明一實施例的晶片分離器100還可包括控制部(未圖示),該控制部(未圖示)連接於該動力部130,可個別控制多個該驅動傳遞塊132a、132b、132c、132d的上下移動。因此,該控制部(未圖示)可個別升降與該分離器部件101結合的多個該驅動傳遞塊132a、132b、132c、132d中的至少一個,以通過檢測該晶片2的大小只個別升降設置於該晶片2的下部面的分離器部件101。再者,該空氣管路124與該開口112連通,並且可以將被該分離器部件101提升到該切割膠帶上的晶片2吸附起來,因此,防止該晶片2在剝離過程中浮起,從而易於剝離,可實現精確剝離。Furthermore, the wafer separator 100 according to an embodiment of the present invention may further include a control part (not shown), which is connected to the power part 130 and can individually control a plurality of the drive transmission blocks 132a. , 132b, 132c, 132d move up and down. Therefore, the control part (not shown) can individually lift at least one of the plurality of drive transmission blocks 132a, 132b, 132c, and 132d combined with the separator component 101, so as to individually lift and lower the wafer 2 by detecting the size of the wafer 2. A separator member 101 is provided on the lower surface of the wafer 2 . Furthermore, the air pipeline 124 is connected to the opening 112 and can adsorb the wafer 2 lifted by the separator part 101 onto the dicing tape, thereby preventing the wafer 2 from floating during the peeling process, thereby making it easy to Peeling for precise peeling.

請再次參閱圖4,根據本發明一實施例的晶片拾取裝置200,包括:晶片分離器100,向上推該晶片2以使其上升,從而將附著於切割膠帶12上的晶片2從該切割膠片12進行分離;及真空的拾取器210,拾取通過該晶片分離器100分離的該晶片2;如圖5至圖8所示,其中,該晶片分離器100,包括:多個分離器部件101a、101b、101c、101d,以疊套形式設置並分離切割膠帶12上的晶片2;罩體110,貼緊該切割膠片12的下部面,並具備真空吸附該切割膠帶12的真空孔111和供該些分離器部件101a、101b、101c、101d通過的開口112;分離器主體120,與該罩體110連接,並在內部具備沿垂直方向延伸且各自升降該些分離器部件101a、101b、101c、101d的多個驅動軸121a、121b、121c、121d、連通於該開口112的空氣管路124;多個驅動傳遞塊132a、132b、132c、132d,設置於該些驅動軸121a、121b、121c、121d下方,並各與該些驅動軸121a、121b、121c、121d接觸,以沿該垂直方向升降該些驅動軸121a、121b、121c、121d;加壓部件122,設置於該分離器主體120內部並且由各自圍繞該些驅動軸121a、121b、121c、121d的彈性體構成,且向該驅動傳遞塊132加壓該驅動軸121a、121b、121c、121d;軸導件140,設置於該分離器主體120內部並各圍繞該些驅動軸121a、121b、121c、121d的軸導件;及多個推桿導件150a、150b、150c、150d,設置於該罩體110內部並連接該些驅動軸121a、121b、121c、121d各自的上端部和該些分離器部件101a、101b、101c、101d各自的不同的單側面,且沿該垂直方向導引該些分離器部件101a、101b、101c、101d。Please refer to FIG. 4 again. A wafer pickup device 200 according to an embodiment of the present invention includes a wafer separator 100 that pushes the wafer 2 upward to lift it, thereby removing the wafer 2 attached to the dicing tape 12 from the dicing film. 12 for separation; and a vacuum picker 210 to pick up the wafer 2 separated by the wafer separator 100; as shown in Figures 5 to 8, wherein the wafer separator 100 includes: a plurality of separator components 101a, 101b, 101c, and 101d are arranged in a stacked form to separate the wafer 2 on the cutting tape 12; the cover 110 is close to the lower surface of the cutting tape 12, and has a vacuum hole 111 for vacuum adsorbing the cutting tape 12 and a vacuum hole 111 for vacuum adsorption of the cutting tape 12. The openings 112 through which the separator components 101a, 101b, 101c, and 101d pass; the separator body 120 is connected to the cover 110 and has internally provided with the separator components 101a, 101b, 101c, 101a, 101b, 101c, The plurality of drive shafts 121a, 121b, 121c, 121d of 101d are connected to the air pipe 124 of the opening 112; the plurality of drive transmission blocks 132a, 132b, 132c, 132d are provided on the drive shafts 121a, 121b, 121c, 121d, and each contacts the driving shafts 121a, 121b, 121c, and 121d to lift and lower the driving shafts 121a, 121b, 121c, and 121d in the vertical direction; the pressurizing component 122 is disposed inside the separator body 120 And it is composed of elastic bodies surrounding the drive shafts 121a, 121b, 121c, and 121d respectively, and pressurizes the drive shafts 121a, 121b, 121c, and 121d to the drive transmission block 132; the shaft guide 140 is provided in the separator. Shaft guides inside the main body 120 and surrounding the driving shafts 121a, 121b, 121c, 121d; and a plurality of push rod guides 150a, 150b, 150c, 150d, which are arranged inside the cover 110 and connected to the driving shafts The respective upper ends of 121a, 121b, 121c, and 121d and the different single side surfaces of the separator components 101a, 101b, 101c, and 101d, and guide the separator components 101a, 101b, 101c, and 101d along the vertical direction. .

圖9至圖10為根據本發明一實施例的晶片分離器100和現有的晶片分離器20(請參閱圖1)的比較示意圖。下面,結合圖9至圖10進行說明。具體而言,圖9(a)與圖9(b)為根據本發明一實施例的晶片分離器100中直線度改善程度的比較示意圖。圖9(a)表示圖1的現有晶片分離器20(請參閱圖1)的驅動部23的屈曲程度,圖9(b)表示根據本發明一實施例的晶片分離器100的驅動軸121的屈曲程度。請參閱圖9(a)及圖9(b),現有的驅動部23受切割膠帶12(請參閱圖1)的張力,從該垂直方向偏向一側,但與此相反,根據本發明一實施例的驅動軸121,因通過該軸導件140剛性得到增強,不屈曲至一側,而且通過點接觸於該驅動傳遞塊132,改善直線度。9 to 10 are schematic diagrams comparing a wafer separator 100 according to an embodiment of the present invention and an existing wafer separator 20 (please refer to FIG. 1 ). Next, description will be made with reference to FIGS. 9 to 10 . Specifically, FIG. 9(a) and FIG. 9(b) are schematic diagrams comparing the degree of straightness improvement in the wafer separator 100 according to an embodiment of the present invention. Figure 9(a) shows the degree of bending of the driving part 23 of the conventional wafer separator 20 (see Figure 1) of Figure 1, and Figure 9(b) shows the degree of bending of the driving shaft 121 of the wafer separator 100 according to an embodiment of the present invention. degree of buckling. Please refer to Figure 9 (a) and Figure 9 (b). The conventional driving part 23 is biased to one side from the vertical direction by the tension of the cutting tape 12 (see Figure 1). However, on the contrary, according to an embodiment of the present invention, The drive shaft 121 of this example has its rigidity enhanced by the shaft guide 140 and does not bend to one side, and is in point contact with the drive transmission block 132, thereby improving the straightness.

此外,圖10(a)與圖10(b)表示了在有負載時各分離器部件的平坦度的比較示意圖。圖10(a)為表示現有的晶片分離器20(請參閱圖1)和根據本發明一實施例的晶片分離器100(請參閱圖6)在1至4位置的高度差異的示意圖。如圖10(a)所示,在現有的晶片分離器20(請參閱圖1)的情況下,在2位置和4位置之間,產生相當於a的最大高度差異,而在根據本發明一實施例的晶片分離器100(請參閱圖6)的情況下,在2位置和4位置,產生相當於變得最大高度差異。圖10(b)表示了根據圖10(a)的結果差異,如圖10(b)所示,在現有的晶片分離器20的情況下,因晶片2和拾取器210之間的距離不固定,在拾取晶片2過程中,拾取不穩定或導致晶片2受損,與此相反,在根據本發明一實施例的晶片分離器100的情況下,可確保晶片2和拾取器210之間的統一間距,可以穩定地拾取晶片2。In addition, FIG. 10(a) and FIG. 10(b) show a comparison of the flatness of each separator component when there is a load. FIG. 10( a ) is a schematic diagram showing the height difference between the existing wafer separator 20 (see FIG. 1 ) and the wafer separator 100 (see FIG. 6 ) according to an embodiment of the present invention at positions 1 to 4. As shown in FIG. 10(a), in the case of the existing wafer separator 20 (see FIG. 1), a maximum height difference equivalent to a is generated between the 2 position and the 4 position, while in the case of the present invention In the case of the wafer separator 100 of the embodiment (see FIG. 6 ), a maximum height difference occurs between the 2 position and the 4 position. Figure 10(b) shows the difference in the results according to Figure 10(a). As shown in Figure 10(b), in the case of the existing wafer separator 20, the distance between the wafer 2 and the pickup 210 is not fixed. , during the process of picking up the wafer 2, the picking is unstable or causes damage to the wafer 2. In contrast, in the case of the wafer separator 100 according to an embodiment of the present invention, the unity between the wafer 2 and the picker 210 can be ensured. spacing, wafer 2 can be picked up stably.

圖11表示根據本發明另一實施例的晶片分離器100的截面示意圖。以下省略與根據本發明前述實施例的晶片分離器100重複的部分,重點說明差異。FIG. 11 shows a schematic cross-sectional view of a wafer separator 100 according to another embodiment of the present invention. The following parts that are repeated with the wafer separator 100 according to the previous embodiment of the present invention are omitted, and the differences are emphasized.

如圖11所示,在根據本發明另一實施例的晶片分離器100中,該驅動傳遞塊132可具備曲面,而該曲面可與該驅動軸121點接觸。換言之,形成於該驅動傳遞塊132的上面的接觸面133可以是朝向該驅動軸121一側突出形成的曲面,且可與該驅動軸121的下端部點接觸。此時,該驅動傳遞塊132可以為呈懸臂狀並相鄰設置於該驅動軸121的一端部的球狀的升降部件。因此,即使該驅動傳遞塊132彎曲或以該垂直方向為准傾斜,也可沿該垂直方向升降該驅動軸121。As shown in FIG. 11 , in the wafer separator 100 according to another embodiment of the present invention, the drive transmission block 132 may have a curved surface, and the curved surface may be in point contact with the drive shaft 121 . In other words, the contact surface 133 formed on the upper surface of the drive transmission block 132 may be a curved surface protruding toward the drive shaft 121 side, and may be in point contact with the lower end of the drive shaft 121 . At this time, the drive transmission block 132 may be a spherical lifting component in a cantilever shape and adjacent to one end of the drive shaft 121 . Therefore, even if the drive transmission block 132 is bent or tilted relative to the vertical direction, the drive shaft 121 can be raised or lowered along the vertical direction.

進一步地,該罩體110還可包括吸附部113。該吸附部113結合於該罩體110的一側並可與形成於該罩體110的真空孔111連通,而且可吸附放置於該分離器部件101的外側的晶片2。因此,在晶片2的分離過程中,可不受影響地吸附放置於該分離器部件101的外側的晶片2。Furthermore, the cover 110 may also include an adsorption part 113 . The adsorption part 113 is coupled to one side of the cover 110 and can communicate with the vacuum hole 111 formed in the cover 110 , and can adsorb the wafer 2 placed outside the separator component 101 . Therefore, during the separation process of the wafer 2, the wafer 2 placed outside the separator part 101 can be adsorbed without being affected.

圖12為根據本發明一實施例的晶片剝離方法(S100)的流程框圖,將參閱圖6的晶片分離器100一同進行說明。FIG. 12 is a flow chart of a wafer peeling method (S100) according to an embodiment of the present invention, which will be described with reference to the wafer separator 100 of FIG. 6 .

如圖12所示,根據本發明一實施例的晶片剝離方法(S100),包括:在切割膠帶12上設置晶片2的步驟(S110);在設置晶片2的切割膠帶12的下部面貼緊分離器部件101的步驟(S120);升降設置於連接在分離器部件101的驅動軸121的下部的驅動傳遞塊132的步驟(S130);結合於驅動軸121的分離器部件101剝離晶片2的步驟(S140)。As shown in Figure 12, the wafer peeling method (S100) according to an embodiment of the present invention includes: the step of setting the wafer 2 on the dicing tape 12 (S110); and closely separating the lower surface of the dicing tape 12 where the wafer 2 is set. The step of lifting the separator unit 101 (S120); the step of raising and lowering the drive transmission block 132 provided at the lower part of the drive shaft 121 of the separator unit 101 (S130); and the step of peeling off the wafer 2 by the separator unit 101 coupled to the drive shaft 121. (S140).

此時,在升降驅動傳遞塊132的步驟(S130),可在利用連接於該驅動軸121的加壓部件122向該驅動傳遞塊132加壓驅動軸121的狀態下,升降該驅動傳遞塊132。進一步地,在升降該驅動傳遞塊132的步驟(S130),該驅動傳遞塊132可在與該驅動軸121的下端部點接觸的狀態下升降。因此,該驅動軸121可在該驅動傳遞塊132上升或下降時一同上升或下降,可通過該加壓部件122的加壓,穩定維持該驅動傳遞塊132和該驅動軸121的點接觸。進一步地,根據本發明一實施例的晶片剝離方法(S100)可通過該加壓部件122精確控制該驅動傳遞塊132的升降程度,可連續調節升降高度或速度,因此,可通過精確控制該分離器部件101,易於剝離薄的晶片2。與此同時,該加壓部件122在該驅動傳遞塊132下降的情況下,也能通過該驅動傳遞塊132加壓該驅動軸121移動。At this time, in the step of raising and lowering the drive transmission block 132 ( S130 ), the drive transmission block 132 can be raised and lowered while the drive shaft 121 is pressed against the drive transmission block 132 by the pressing member 122 connected to the drive shaft 121 . . Further, in the step of raising and lowering the drive transmission block 132 ( S130 ), the drive transmission block 132 may be raised and lowered in a state of point contact with the lower end of the drive shaft 121 . Therefore, the drive shaft 121 can rise or fall together with the drive transmission block 132 , and the point contact between the drive transmission block 132 and the drive shaft 121 can be stably maintained by the pressure of the pressurizing member 122 . Furthermore, the wafer peeling method (S100) according to an embodiment of the present invention can accurately control the lifting degree of the drive transmission block 132 through the pressurizing component 122, and can continuously adjust the lifting height or speed. Therefore, the separation can be accurately controlled by The device component 101 makes it easy to peel off the thin wafer 2. At the same time, when the drive transmission block 132 descends, the pressing member 122 can also press the drive shaft 121 to move through the drive transmission block 132 .

進一步地,在升降該驅動傳遞塊132的步驟(S130),各多個驅動傳遞塊132a、132b、132c、132d可個別得到控制,可以連續控制多個該驅動傳遞塊132。進一步地,在升降該驅動傳遞塊132的步驟(S130),可混合執行使該驅動傳遞塊132中的一部分上升,其餘一部分下降的動作。因此,除現有的從最外側的分離器部件向內側分階段上升的剝離方法或從內側向最外側分階段下降的剝離方法,還可使任意該驅動傳遞塊132無時間差地上升或下降,以實現連續精確的晶片2剝離。另外,因連續完成該些驅動傳遞塊132的上升或下降,可減少晶片2的裂縫發生率,實現穩定的剝離。Furthermore, in the step of raising and lowering the drive transmission block 132 (S130), each of the plurality of drive transmission blocks 132a, 132b, 132c, and 132d can be controlled individually, and a plurality of the drive transmission blocks 132 can be continuously controlled. Furthermore, in the step of raising and lowering the drive transmission block 132 ( S130 ), the operation of raising part of the drive transmission block 132 and lowering the remaining part may be performed in a mixed manner. Therefore, in addition to the existing peeling method of ascending in steps from the outermost separator member to the inner side or descending in stages from the inner side to the outermost part, any of the drive transmission blocks 132 can be raised or lowered without any time difference, so as to Achieve continuous and accurate wafer 2 debonding. In addition, since the driving transmission blocks 132 are continuously raised or lowered, the occurrence rate of cracks in the wafer 2 can be reduced and stable peeling can be achieved.

另外,在上述剝離晶片2的步驟(S140),連接於該罩體110的該吸附部113可吸附位於該分離器部件101的外側的晶片2。因此,在分離晶片2時,可防止位於分離器部件101的外側的晶片2浮起,而只將分離器部件101貼緊的位置的晶片2作為目標進行剝離。In addition, in the step of peeling off the wafer 2 ( S140 ), the adsorption part 113 connected to the cover 110 can adsorb the wafer 2 located outside the separator component 101 . Therefore, when the wafers 2 are separated, the wafers 2 located outside the separator member 101 can be prevented from floating, and only the wafers 2 at the positions where the separator member 101 is in close contact can be targeted for peeling.

上述實施例僅用以說明本發明而非限制,發明所屬技術領域通常知識者應當理解,可以對本發明進行修改、變形或者等同替換,而不脫離本發明的精神和範圍,其均應涵蓋在本發明的申請專利範圍當中。The above embodiments are only used to illustrate the present invention and not to limit it. Those of ordinary skill in the technical field to which the invention belongs should understand that the present invention can be modified, deformed or equivalently substituted without departing from the spirit and scope of the present invention. All of them should be covered by this invention. Within the scope of patent applications for inventions.

1:晶圓 2:晶片 3:基板 3s:基板載台 4a:第一卡槽 4b:第二卡槽 5:晶舟 6:晶舟裝載端口 7:晶圓導軌 8:晶圓移送單元 10:黏晶裝置 11:載台單元 12:切割膠帶 13:晶圓載台 14:擴展環 15:安裝框架 16:黏晶模組 17:晶片載台 20:現有的晶片分離器 21:罩體 22:分離器部件 23:驅動部 24:動力部 100:晶片分離器 101、101a、101b、101c、101d:分離器部件 110:罩體 111:真空孔 112:開口 113:吸附部 120:分離器主體 121、121a、121b、121c、121d:驅動軸 122、122a、122b、122c、122d:加壓部件 123:突出部 124:空氣管路 130、130a、130b、130c、130d:動力部 131:支撐部 131h:主體孔 132、132a、132b、132c、132d:驅動傳遞塊 133:接觸面 135:馬達 136:滾珠螺桿 137:滾珠螺母 140:軸導件 141:上端部軸導件 142:下端部軸導件 150、150a、150b、150c、150d:推桿導件 200:晶片拾取裝置 210:拾取器 220:拾取器驅動部 230:攝像機單元 1:wafer 2:wafer 3:Substrate 3s: Substrate carrier 4a: First card slot 4b: Second card slot 5:Jingzhou 6: Crystal boat loading port 7: Wafer guide 8: Wafer transfer unit 10:Crystal bonding device 11: Carrier unit 12: Cutting tape 13:Wafer carrier 14:Extended ring 15:Installation frame 16:Crystal bonding module 17:wafer stage 20: Existing wafer separator 21: Cover body 22:Separator parts 23:Drive Department 24:Power Department 100:wafer separator 101, 101a, 101b, 101c, 101d: separator parts 110: cover body 111: Vacuum hole 112:Open your mouth 113:Adsorption part 120:Separator body 121, 121a, 121b, 121c, 121d: drive shaft 122, 122a, 122b, 122c, 122d: Pressurized parts 123:Protrusion 124:Air pipeline 130, 130a, 130b, 130c, 130d: Power department 131: Support part 131h: Main body hole 132, 132a, 132b, 132c, 132d: drive transfer block 133:Contact surface 135: Motor 136: Ball screw 137:Ball nut 140: Shaft guide 141:Upper end shaft guide 142:Lower end shaft guide 150, 150a, 150b, 150c, 150d: push rod guide 200: Wafer pick-up device 210: Pickup 220: Pickup drive unit 230:Camera unit

圖1為現有的晶片分離器的截面示意圖; 圖2為根據本發明一實施例的黏晶裝置的俯視示意圖; 圖3為根據本發明一實施例的晶片分離器的立體示意圖; 圖4為根據本發明一實施例的晶片拾取裝置的截面示意圖; 圖5為根據本發明一實施例的晶片分離器的局部分解示意圖; 圖6為根據本發明一實施例的晶片分離器的截面示意圖; 圖7為根據本發明一實施例的驅動傳遞塊的局部放大圖; 圖8為根據本發明一實施例的推桿導件的局部放大圖; 圖9(a)和圖9(b)為現有的晶片分離器和根據本發明一實施例的晶片分離器中的驅動軸的直線度的比較示意圖,其中圖9(a)表示圖1的現有晶片分離器的驅動部的屈曲程度,圖9(b)表示根據本發明一實施例的晶片分離器的驅動軸的屈曲程度; 圖10(a)和圖10(b)為現有的晶片分離器和根據本發明一實施例的晶片分離器的平整度的比較示意,其中圖10(a)表示圖1的現有的晶片分離器(改善前)和根據本發明一實施例的晶片分離器(改善後)分別在1至4位置的高度差異的示意圖,圖10(b)表示根據圖10(a)的結果反映在拾取晶片時的平整度差異的示意圖; 圖11為根據本發明另一實施例的晶片分離器的截面示意圖; 圖12為根據本發明一實施例的晶片分離方法的流程框圖。 Figure 1 is a schematic cross-sectional view of a conventional wafer separator; Figure 2 is a schematic top view of a die bonding device according to an embodiment of the present invention; Figure 3 is a perspective view of a wafer separator according to an embodiment of the present invention; Figure 4 is a schematic cross-sectional view of a wafer pickup device according to an embodiment of the present invention; Figure 5 is a partially exploded schematic view of a wafer separator according to an embodiment of the present invention; Figure 6 is a schematic cross-sectional view of a wafer separator according to an embodiment of the present invention; Figure 7 is a partial enlarged view of the drive transmission block according to an embodiment of the present invention; Figure 8 is a partial enlarged view of a push rod guide according to an embodiment of the present invention; 9(a) and 9(b) are schematic diagrams comparing the straightness of the drive shaft in the existing wafer separator and the wafer separator according to an embodiment of the present invention, wherein FIG. 9(a) represents the existing wafer separator in FIG. 1 The degree of buckling of the driving part of the wafer separator. Figure 9(b) shows the degree of buckling of the driving shaft of the wafer separator according to an embodiment of the present invention; 10(a) and 10(b) are schematic comparisons of the flatness of an existing wafer separator and a wafer separator according to an embodiment of the present invention, wherein FIG. 10(a) represents the existing wafer separator of FIG. 1 Schematic diagram of the height difference between positions 1 to 4 of the wafer separator (before improvement) and according to an embodiment of the present invention (after improvement). Figure 10(b) shows that the results according to Figure 10(a) are reflected when picking up wafers. Schematic diagram of the difference in flatness; Figure 11 is a schematic cross-sectional view of a wafer separator according to another embodiment of the present invention; Figure 12 is a flow chart of a wafer separation method according to an embodiment of the present invention.

2:晶片 2:wafer

12:切割膠帶 12: Cutting tape

101、101a、101b、101c、101d:分離器部件 101, 101a, 101b, 101c, 101d: separator parts

110:罩體 110: cover body

111:真空孔 111: Vacuum hole

112:開口 112:Open your mouth

120:分離器主體 120:Separator body

121b、121c:驅動軸 121b, 121c: drive shaft

122b、122c:加壓部件 122b, 122c: Pressurized parts

123:突出部 123:Protrusion

124:空氣管路 124:Air pipeline

130、130b、130c:動力部 130, 130b, 130c: Power department

131:支撐部 131: Support part

132b、132c:驅動傳遞塊 132b, 132c: Drive transfer block

133:接觸面 133:Contact surface

136:滾珠螺桿 136: Ball screw

137:滾珠螺母 137:Ball nut

140:軸導件 140: Shaft guide

141:上端部軸導件 141:Upper end shaft guide

142:下端部軸導件 142:Lower end shaft guide

150b、150c:推桿導件 150b, 150c: Push rod guide

Claims (20)

一種晶片分離器,包括: 一分離器部件,用於分離一切割膠帶上的一晶片; 一罩體,用於貼緊該切割膠帶的一下部面並具備供該分離器部件通過的一開口; 一分離器主體,與該罩體連接並且在內部包括沿一垂直方向延伸的一驅動軸; 一動力部,與該驅動軸分離設置並且用於升降該驅動軸;及 一加壓部件,連接於該驅動軸並且在該動力部升降該驅動軸時,沿向下方向施加一外部壓力。 A wafer separator including: a separator component for separating a wafer on a dicing tape; A cover body, used to adhere to the lower surface of the cutting tape and provided with an opening for the separator component to pass; a separator body connected to the cover and internally including a drive shaft extending in a vertical direction; A power part, which is provided separately from the drive shaft and is used to lift the drive shaft; and A pressurizing component is connected to the drive shaft and applies an external pressure in a downward direction when the power part lifts and lowers the drive shaft. 如請求項1所述的晶片分離器,其中該動力部包括呈懸臂狀的一驅動傳遞塊,該驅動傳遞塊在一上表面具有與該驅動軸接觸的一接觸面。The wafer separator according to claim 1, wherein the power part includes a cantilever-shaped drive transmission block, and the drive transmission block has a contact surface on an upper surface that is in contact with the drive shaft. 如請求項2所述的晶片分離器,其中該接觸面與該驅動軸的一延伸方向垂直。The wafer separator according to claim 2, wherein the contact surface is perpendicular to an extending direction of the driving shaft. 如請求項3所述的晶片分離器,其中該驅動軸的一下端部具有一曲面,且該下端部與該接觸面點接觸。The wafer separator according to claim 3, wherein the lower end of the driving shaft has a curved surface, and the lower end is in point contact with the contact surface. 如請求項4所述的晶片分離器,其中該加壓部件為一彈性體,配置成在朝向該分離器主體的內部突出形成的一階梯部和該驅動軸的該下端部之間圍繞該驅動軸。The wafer separator according to claim 4, wherein the pressing member is an elastic body and is configured to surround the drive between a step portion protruding toward the inside of the separator body and the lower end of the drive shaft. axis. 如請求項5所述的晶片分離器,其中該晶片分離器包括設置於該分離器主體內部並圍繞該驅動軸的一軸導件。The wafer separator of claim 5, wherein the wafer separator includes a shaft guide disposed inside the separator body and surrounding the driving shaft. 如請求項6所述的晶片分離器,其中該軸導件包括圍繞該驅動軸的兩端部的一上端部軸導件及一下端部軸導件。The wafer separator of claim 6, wherein the shaft guide includes an upper end shaft guide and a lower end shaft guide surrounding both ends of the driving shaft. 如請求項7所述的晶片分離器,其中該晶片分離器還包括連接該驅動軸的一上端部及該分離器部件的一側面,並且沿一垂直方向導引該分離器部件的一推桿導件。The wafer separator of claim 7, wherein the wafer separator further includes a push rod connecting an upper end of the drive shaft and a side surface of the separator component and guiding the separator component in a vertical direction. guide. 如請求項8所述的晶片分離器,其中該分離器主體還包括連通於該開口的一空氣管路。The wafer separator according to claim 8, wherein the separator body further includes an air pipeline connected to the opening. 如請求項9所述的晶片分離器,其中該罩體包括吸附該切割膠帶的一真空孔。The wafer separator of claim 9, wherein the cover includes a vacuum hole for adsorbing the dicing tape. 如請求項10所述的晶片分離器,其中該動力部還包括具有供該分離器主體插入的一主體孔的一支撐部;及該分離器主體可拆卸地接合於該支撐部。The wafer separator of claim 10, wherein the power part further includes a support part having a body hole for inserting the separator body; and the separator body is detachably coupled to the support part. 如請求項2所述的晶片分離器,其中該接觸面為朝向該驅動軸一側突出形成的一曲面,並與該驅動軸的一下端部表面點接觸。The wafer separator according to claim 2, wherein the contact surface is a curved surface protruding toward one side of the driving shaft and in point contact with the lower end surface of the driving shaft. 如請求項2所述的晶片分離器,其中該罩體包括結合於該罩體並用於吸附位於該分離器部件的一外側的一晶片的一吸附部。The wafer separator of claim 2, wherein the cover includes an adsorption portion coupled to the cover and used to adsorb a wafer located on an outside of the separator component. 一種晶片分離器,包括: 多個分離器部件,用於分離一切割膠帶上的一晶片; 多個驅動軸,用於升降該些分離器部件; 多個驅動傳遞塊,與該些驅動軸分離設置並用於各自升降該些驅動軸;及 多個加壓部件,連接於該些驅動軸並在升降時沿向下方向施加一外部壓力; 其中該些分離器部件、該些驅動軸、該些驅動傳遞塊及該些加壓部件各自一對一連接。 A wafer separator including: a plurality of separator components for separating a wafer on a dicing tape; A plurality of drive shafts for lifting and lowering the separator components; A plurality of drive transmission blocks, provided separately from the drive shafts and used to lift the drive shafts respectively; and A plurality of pressurizing components connected to the drive shafts and applying an external pressure in a downward direction when lifting; The separator components, the drive shafts, the drive transmission blocks and the pressurizing components are each connected one to one. 如請求項14所述的晶片分離器,其中在該些驅動軸的各上端部還包括一對一連接的推桿導件。The wafer separator according to claim 14, wherein each upper end of the drive shafts further includes push rod guides connected one to one. 如請求項15所述的晶片分離器,其中該些分離器部件以上部面呈矩形形狀的疊套形式設置;及該些驅動軸及推桿導件,在該分離器部件的不同的單側面各自一對一設置。The wafer separator of claim 15, wherein the separator components are arranged in a stacked form with upper surfaces in a rectangular shape; and the drive shafts and push rod guides are located on different single sides of the separator component. Set each one to one. 如請求項14所述的晶片分離器,其中該晶片分離器還包括設置於該些驅動軸之間並沿與該驅動軸平行的方向延伸的一空氣管路。The wafer separator of claim 14, wherein the wafer separator further includes an air pipeline disposed between the driving shafts and extending in a direction parallel to the driving shafts. 如請求項14所述的晶片分離器,其中該晶片分離器還包括連接於該些驅動傳遞塊的一控制部;及該控制部控制該驅動傳遞塊的一升降程度。The wafer separator according to claim 14, wherein the wafer separator further includes a control part connected to the drive transmission blocks; and the control part controls a lifting degree of the drive transmission blocks. 如請求項18所述的晶片分離器,其中該控制部個別控制該些驅動傳遞塊。The wafer separator as claimed in claim 18, wherein the control part controls the drive transmission blocks individually. 一種黏晶裝置,包括: 一晶片分離器,向上推升從而將附著於一切割膠帶上的一晶片從該切割膠片進行分離;及 一黏晶模組,將通過該晶片分離器分離的該晶片接合於一基板上; 其中該晶片分離器,包括: 多個分離器部件,以疊套形式設置並用於分離該切割膠帶上的該晶片; 一罩體,用於貼緊該切割膠片的一下部面,並具備真空吸附該切割膠帶的一真空孔和供該些分離器部件通過的一開口; 一分離器主體,與該罩體連接,並在內部具有沿一垂直方向延伸且各自升降該些分離器部件的多個驅動軸以及連通於該開口的一空氣管路; 多個驅動傳遞塊,設置於該些驅動軸下方,並各自與該些驅動軸接觸,以沿該垂直方向升降該些驅動軸; 一加壓部件,設置於該分離器主體內部,並由各自圍繞該些驅動軸的一彈性體構成,且通過該驅動傳遞塊對該驅動軸施加壓力; 一軸導件,設置於該分離器主體內部,並各自圍繞該些驅動軸;及 一推桿導件,設置於該罩體內部,並連接該些驅動軸各自的上端部和該些分離器部件各自的不同的單側面,且沿該垂直方向導引該分離器部件。 A crystal bonding device including: a wafer separator that pushes upward to separate a wafer attached to a dicing tape from the dicing film; and A die bonding module for bonding the wafer separated by the wafer separator to a substrate; The wafer separator includes: A plurality of separator components, arranged in a stack and used to separate the wafer on the dicing tape; A cover body, used to adhere to the lower surface of the cutting film, and has a vacuum hole for vacuum adsorption of the cutting tape and an opening for the separator components to pass; A separator body connected to the cover and having a plurality of drive shafts extending in a vertical direction and respectively lifting and lowering the separator components and an air pipeline connected to the opening; A plurality of drive transmission blocks are arranged below the drive shafts and are each in contact with the drive shafts to lift and lower the drive shafts in the vertical direction; A pressurizing component is provided inside the separator body and is composed of an elastic body surrounding the drive shafts respectively, and applies pressure to the drive shaft through the drive transmission block; A shaft guide is disposed inside the separator body and surrounds the drive shafts respectively; and A push rod guide is disposed inside the cover body and connects the upper ends of the drive shafts and different single sides of the separator components, and guides the separator components in the vertical direction.
TW112113363A 2022-06-30 2023-04-10 A die ejector and a die bonding apparatus including it TW202403933A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020220080584A KR20240003293A (en) 2022-06-30 2022-06-30 A die ejector and a die bonding apparatus including it
KR10-2022-0080584 2022-06-30

Publications (1)

Publication Number Publication Date
TW202403933A true TW202403933A (en) 2024-01-16

Family

ID=89289043

Family Applications (1)

Application Number Title Priority Date Filing Date
TW112113363A TW202403933A (en) 2022-06-30 2023-04-10 A die ejector and a die bonding apparatus including it

Country Status (3)

Country Link
KR (1) KR20240003293A (en)
CN (1) CN117334598A (en)
TW (1) TW202403933A (en)

Also Published As

Publication number Publication date
KR20240003293A (en) 2024-01-08
CN117334598A (en) 2024-01-02

Similar Documents

Publication Publication Date Title
KR101135903B1 (en) Device for thin die detachment and pick-up
JP4816654B2 (en) Chip peeling device, chip peeling method, and chip pickup device
US9039867B2 (en) Method for detaching a semiconductor chip from a foil
JP6685245B2 (en) Semiconductor manufacturing apparatus and semiconductor device manufacturing method
JP2000353710A (en) Manufacture of pellet pickup device and semiconductor device
CN1707750A (en) Stripping device for wafer separation
CN107622955B (en) Semiconductor manufacturing apparatus and method for manufacturing semiconductor device
CN1669119A (en) Method and apparatus for picking up semiconductor chip and suction and exfoliation tool used therefor
JP2005322815A (en) Manufacturing apparatus and manufacturing method of semiconductor apparatus
WO2019033491A1 (en) Glass substrate separation method and glass substrate separation apparatus
JP4671841B2 (en) Degassing method and degassing apparatus between objects
JP2007103826A (en) Pickup device for semiconductor chip
JP7333807B2 (en) Apparatus and method for die transfer in bonding facility
JP2013102126A (en) Manufacturing method of semiconductor device and manufacturing apparatus of semiconductor device
JP4924316B2 (en) Semiconductor manufacturing apparatus and semiconductor manufacturing method
TW202403933A (en) A die ejector and a die bonding apparatus including it
JP4816598B2 (en) Chip peeling device, chip peeling method, and chip pickup device
JP6324857B2 (en) Die bonder, bonding method and pickup device
JP2003118859A (en) Device and method for extracting flexible tabular body
TW202015878A (en) A die ejecting apparatus
JP2016219573A (en) Pickup apparatus and method
JP4369298B2 (en) DIE PICKUP DEVICE AND DIE PICKUP METHOD
TWI779702B (en) Die ejector and die bonding apparatus including the same
CN112331089B (en) Adsorption device, laminating equipment and laminating method of substrate
KR102382558B1 (en) Die Pick-up Apparatus and Operating Method of Die Pick-up Apparatus