TW202323231A - 感光化射線性或感放射線性樹脂組成物、光阻膜、圖案形成方法、及電子器件的製造方法 - Google Patents

感光化射線性或感放射線性樹脂組成物、光阻膜、圖案形成方法、及電子器件的製造方法 Download PDF

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TW202323231A
TW202323231A TW111136819A TW111136819A TW202323231A TW 202323231 A TW202323231 A TW 202323231A TW 111136819 A TW111136819 A TW 111136819A TW 111136819 A TW111136819 A TW 111136819A TW 202323231 A TW202323231 A TW 202323231A
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Taiwan
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group
represented
sensitive
radiation
atom
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TW111136819A
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Chinese (zh)
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渋谷愛菜
小島雅史
後藤研由
白川三千紘
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日商富士軟片股份有限公司
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Publication of TW202323231A publication Critical patent/TW202323231A/zh

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    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F220/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
    • C08F220/02Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
    • C08F220/10Esters
    • C08F220/26Esters containing oxygen in addition to the carboxy oxygen
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/038Macromolecular compounds which are rendered insoluble or differentially wettable
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Materials For Photolithography (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
TW111136819A 2021-09-29 2022-09-28 感光化射線性或感放射線性樹脂組成物、光阻膜、圖案形成方法、及電子器件的製造方法 TW202323231A (zh)

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JP2021-160154 2021-09-29
JP2021160154 2021-09-29

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TW202323231A true TW202323231A (zh) 2023-06-16

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TW111136819A TW202323231A (zh) 2021-09-29 2022-09-28 感光化射線性或感放射線性樹脂組成物、光阻膜、圖案形成方法、及電子器件的製造方法

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TW (1) TW202323231A (https=)
WO (1) WO2023054127A1 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7720810B2 (ja) * 2022-04-06 2025-08-08 東京応化工業株式会社 レジスト組成物及びレジストパターン形成方法
JPWO2024142681A1 (https=) * 2022-12-28 2024-07-04
WO2025041781A1 (ja) * 2023-08-23 2025-02-27 東京応化工業株式会社 レジスト組成物、レジストパターン形成方法、化合物及び高分子化合物
WO2025248963A1 (ja) * 2024-05-27 2025-12-04 Jsr株式会社 感放射線性組成物及びレジストパターン形成方法
TW202547894A (zh) * 2024-05-31 2025-12-16 日商Jsr股份有限公司 感放射線性組成物及抗蝕劑圖案形成方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4612999B2 (ja) * 2003-10-08 2011-01-12 富士フイルム株式会社 ポジ型レジスト組成物及びそれを用いたパターン形成方法
JP6014507B2 (ja) * 2013-02-05 2016-10-25 富士フイルム株式会社 感活性光線性又は感放射線性樹脂組成物、感活性光線性又は感放射線性膜、パターン形成方法及び電子デバイスの製造方法
WO2016051985A1 (ja) * 2014-09-29 2016-04-07 富士フイルム株式会社 感活性光線性又は感放射線性樹脂組成物、パターン形成方法、及び電子デバイスの製造方法
KR102296567B1 (ko) * 2017-03-13 2021-09-01 후지필름 가부시키가이샤 감활성광선성 또는 감방사선성 수지 조성물, 레지스트막, 패턴 형성 방법, 전자 디바이스의 제조 방법
JP7058339B2 (ja) * 2018-09-13 2022-04-21 富士フイルム株式会社 感活性光線性又は感放射線性樹脂組成物、レジスト膜、パターン形成方法、電子デバイスの製造方法
JP7373470B2 (ja) * 2019-09-19 2023-11-02 信越化学工業株式会社 ケイ素含有レジスト下層膜形成用組成物及びパターン形成方法
JP7517106B2 (ja) * 2019-12-11 2024-07-17 信越化学工業株式会社 オニウム塩化合物、化学増幅レジスト組成物及びパターン形成方法
JP7255472B2 (ja) * 2019-12-12 2023-04-11 信越化学工業株式会社 オニウム塩化合物、化学増幅レジスト組成物及びパターン形成方法
EP4129975A4 (en) * 2020-03-30 2023-12-13 FUJIFILM Corporation ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, PATTERN FORMATION METHOD, RESIST FILM, AND PRODUCTION METHOD FOR ELECTRONIC DEVICE

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WO2023054127A1 (ja) 2023-04-06

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