TW202226360A - Grinding apparatus and method of driving grinding apparatus - Google Patents
Grinding apparatus and method of driving grinding apparatus Download PDFInfo
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- TW202226360A TW202226360A TW110147179A TW110147179A TW202226360A TW 202226360 A TW202226360 A TW 202226360A TW 110147179 A TW110147179 A TW 110147179A TW 110147179 A TW110147179 A TW 110147179A TW 202226360 A TW202226360 A TW 202226360A
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
- B24B27/0076—Other grinding machines or devices grinding machines comprising two or more grinding tools
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/02—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B1/00—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/005—Feeding or manipulating devices specially adapted to grinding machines
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/02—Frames; Beds; Carriages
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/12—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B51/00—Arrangements for automatic control of a series of individual steps in grinding a workpiece
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
- B24B7/228—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
Abstract
Description
本發明係關於研削裝置以及研削裝置的驅動方法。The present invention relates to a grinding device and a driving method of the grinding device.
IC(Integrated Circuit,積體電路)及LSI(Large Scale Integration,大型積體電路)等元件的晶片為行動電話及個人電腦等各種電子設備中不可或缺的構成要素。此種晶片例如係藉由將在正面形成有多個元件之晶圓進行薄化後,將包含一個個元件之區域各別分割而製造。Chips for components such as IC (Integrated Circuit) and LSI (Large Scale Integration) are indispensable components in various electronic devices such as mobile phones and personal computers. Such a chip is manufactured by, for example, thinning a wafer on which a plurality of elements are formed on the front surface, and then dividing the regions including the elements individually.
作為薄化晶圓之方法,可列舉例如由具有研削輪與卡盤台之研削裝置所進行之研削,所述研削輪具備環狀分散配置之多個研削磨石,所述卡盤台吸引保持被加工物。以此種研削裝置薄化晶圓之情形,常在研削前於晶圓的正面黏貼膠膜(保護膠膜)(例如參照專利文獻1)。As a method of thinning the wafer, for example, grinding by a grinding device having a grinding wheel and a chuck table, the grinding wheel including a plurality of grinding stones arranged in a ring-shaped manner, and the chuck table attracting and holding processed objects. In the case of thinning a wafer with such a grinding apparatus, an adhesive film (protective film) is often attached to the front surface of the wafer before grinding (for example, refer to Patent Document 1).
然後,在卡盤台已吸引保持黏貼有膠膜之晶圓的正面側之狀態下,多個研削磨石研削晶圓的背面側,藉此薄化晶圓。如此將膠膜黏貼於形成有元件之晶圓的正面,藉此可緩和研削晶圓時施加於元件之衝擊,並防止元件損壞。 [習知技術文獻] [專利文獻] Then, in a state in which the chuck table has attracted and held the front side of the wafer to which the adhesive film is attached, a plurality of grinding stones grind the back side of the wafer, thereby thinning the wafer. By sticking the adhesive film on the front surface of the wafer on which the element is formed, the impact applied to the element when the wafer is ground can be alleviated and the element can be prevented from being damaged. [Previously known technical literature] [Patent Literature]
專利文獻1:日本特開2007-288031號公報。Patent Document 1: Japanese Patent Laid-Open No. 2007-288031.
[發明所欲解決的課題] 上述的膠膜的厚度及接著強度等係依據其種類而異。因此,黏貼於晶圓等被加工物之膠膜係因應研削條件等而分開使用。然後,在研削裝置中,該被加工物單元會被從卡匣搬送至卡盤台並被研削,所述卡匣容納黏貼有所要求的膠膜之被加工物(被加工物單元)。 [Problems to be solved by the invention] The thickness and adhesive strength of the above-mentioned adhesive film vary depending on the type. Therefore, adhesive films attached to workpieces such as wafers are used separately according to grinding conditions and the like. Then, in the grinding device, the workpiece unit is transported from the cassette containing the workpiece (the workpiece unit) to which the desired film is attached and ground to a chuck table.
在此,對被加工物黏貼膠膜係使用專用裝置而進行,但消耗品亦即膠膜的交換或補充係操作員手動進行。因此,有在此裝置裝設有不適當的膠膜之狀態下對被加工物黏貼膠膜之虞。Here, the sticking of the adhesive film to the workpiece is performed using a dedicated device, but the exchange or replenishment of the adhesive film, which is a consumable, is performed manually by an operator. Therefore, there is a possibility that the adhesive film is attached to the workpiece in a state where the device is equipped with an inappropriate adhesive film.
並且,將被加工物單元容納於卡匣及/或將容納被加工物單元之卡匣搬入研削裝置的動作,有時為操作員手動進行。因此,有將容納黏貼有不適當的膠膜之被加工物之卡匣搬入研削裝置之虞。In addition, the operation of accommodating the workpiece unit in the cassette and/or carrying the cassette accommodating the workpiece unit into the grinding device may be performed manually by an operator. Therefore, there is a possibility that the cassette for accommodating the workpiece to which the inappropriate film is attached is carried into the grinding device.
再者,即使是不同種類的膠膜,其等的顏色及觸感大多類似。因此,在研削裝置研削被加工物前,操作員難以藉由觀看或觸摸黏貼於被加工物之膠膜而確認其種類。Furthermore, even the different types of adhesive films are mostly similar in color and touch. Therefore, before the grinding device grinds the workpiece, it is difficult for the operator to confirm the type of the film attached to the workpiece by viewing or touching it.
有鑑於此等問題,本發明之目的為提供一種研削裝置,其可防止研削黏貼有不適當的膠膜之被加工物。In view of these problems, an object of the present invention is to provide a grinding device which can prevent grinding of a workpiece to which an inappropriate adhesive film is adhered.
[解決課題的技術手段] 根據本發明的一態樣,提供一種研削裝置,其具備:卡匣載置台,其用於載置容納被加工物單元之卡匣,所述被加工物單元係在被加工物的一面黏貼膠膜而成;卡盤台,其用於保持該被加工物單元;搬送機構,其用於在該卡匣與該卡盤台之間搬送該被加工物單元;第一測量單元,其用於測量使用於計算保持於該搬送機構之該被加工物單元的厚度值或該被加工物單元的厚度值之值;研削單元,其用於研削保持於該卡盤台之該被加工物單元;以及控制單元,其用於控制各構成要素,並且,該控制單元具備:判斷部,其因應該被加工物單元的厚度值而判斷該被加工物單元是否為研削對象,該被加工物單元的厚度值係根據由該第一測量單元所進行之對於從該卡匣搬出後且搬入該卡盤台前的該被加工物單元之測量所獲得。 [Technical means to solve the problem] According to an aspect of the present invention, there is provided a grinding device including: a cassette mounting table for mounting a cassette for accommodating a workpiece unit, the workpiece unit being glued to one surface of the workpiece film; a chuck table for holding the workpiece unit; a conveying mechanism for transferring the workpiece unit between the cassette and the chuck table; a first measurement unit for The measurement is used to calculate the thickness value of the workpiece unit held by the conveying mechanism or the value of the thickness value of the workpiece unit; the grinding unit is used for grinding the workpiece unit held on the chuck table; and a control unit for controlling each of the constituent elements, and the control unit includes a judgment unit for judging whether the workpiece unit is a grinding object based on the thickness value of the workpiece unit, and the workpiece unit is The thickness value is obtained from the measurement of the workpiece unit after being carried out from the cassette and before being carried into the chuck table by the first measuring unit.
再者,本發明的一態樣中,較佳為該控制單元具備:記憶部,其用於儲存該被加工物及該膠膜各自的厚度值,並且,該判斷部比較將儲存於該記憶部之該被加工物及該膠膜的各自厚度值進行合計之值、與根據由該第一測量單元所進行之測量所獲得之該被加工物單元的厚度值,而判斷於該被加工物是否黏貼有所要求的膠膜。Furthermore, in one aspect of the present invention, it is preferable that the control unit is provided with: a memory part for storing the respective thickness values of the workpiece and the adhesive film, and the judgment part compares and stores in the memory The value of the sum of the respective thickness values of the workpiece and the adhesive film of the part, and the thickness value of the workpiece unit obtained from the measurement performed by the first measuring unit, is determined as the workpiece. Whether the required film is pasted.
並且,本發明的一態樣中,較佳為該第一測量單元具備:第一非接觸式距離測量器,其設置於保持於該搬送機構之該被加工物單元的一面側,並測量至該被加工物單元的一面為止的距離;以及第二非接觸式距離測量器,其設置於保持於該搬送機構之該被加工物單元的一面的背面亦即另一面側,並測量至該被加工物單元的另一面為止的距離。Furthermore, in one aspect of the present invention, it is preferable that the first measuring unit includes: a first non-contact distance measuring device provided on one side of the workpiece unit held by the conveying mechanism, and measuring to The distance to one side of the workpiece unit; and a second non-contact distance measuring device, which is provided on the back side of one side of the workpiece unit held by the conveying mechanism, that is, the other side, and measures to the workpiece The distance to the other side of the workpiece unit.
並且,本發明的一態樣中,較佳為進一步具備:第二測量單元,其用於測量使用於計算保持於該卡盤台之該被加工物單元的厚度值或該被加工物單元的厚度值之值,並且,該判斷部比較根據由該第二測量單元所進行之測量所獲得之該被加工物單元的厚度值、與根據由該第一測量單元所進行之測量所獲得之該被加工物單元的厚度值,而判斷該第二測量單元是否正常地進行動作。In addition, in one aspect of the present invention, it is preferable to further include: a second measuring unit for measuring the thickness value of the workpiece unit held on the chuck table or the thickness of the workpiece unit for calculating the thickness value of the workpiece unit. the value of the thickness value, and the judgment part compares the thickness value of the workpiece unit obtained from the measurement by the second measurement unit with the thickness value obtained from the measurement by the first measurement unit The thickness value of the workpiece unit is used to determine whether or not the second measurement unit is operating normally.
根據本發明的另一態樣,提供一種研削裝置的驅動方法,所述研削裝置具備:卡匣載置台,其用於載置容納被加工物單元之卡匣,所述被加工物單元係在被加工物的一面黏貼膠膜而成;卡盤台,其用於保持該被加工物單元;搬送機構,其用於在該卡匣與該卡盤台之間搬送該被加工物單元;第一測量單元,其用於測量使用於計算保持於該搬送機構之該被加工物單元的厚度值或該被加工物單元的厚度值之值;研削單元,其用於研削保持於該卡盤台之該被加工物單元;以及控制單元,其用於控制各構成要素,並且,所述研削裝置的驅動方法具備:第一搬出步驟,該搬送機構從載置於該卡匣載置台之該卡匣搬出該被加工物單元;第一測量步驟,該第一測量單元測量使用於計算在該搬出步驟從該卡匣搬出之該被加工物單元的厚度值或該被加工物單元的厚度值之值;第一判斷步驟,該控制單元因應根據在該第一測量步驟的測量所獲得之該被加工物單元的厚度值,而判斷該被加工物單元是否為研削對象;以及搬入步驟,其在該第一判斷步驟判斷該被加工物單元為研削對象之情形中,該搬送機構將該被加工物單元搬入該卡盤台,在該第一判斷步驟判斷該被加工物單元並非為研削對象之情形中,該搬送機構將該被加工物單元再次搬入該卡匣。According to another aspect of the present invention, there is provided a driving method of a grinding device including a cassette mounting table for mounting a cassette for accommodating a workpiece unit, the workpiece unit being fastened to One side of the object to be processed is formed by pasting the adhesive film; a chuck table, which is used to hold the workpiece unit; a conveying mechanism, which is used to transport the workpiece unit between the cassette and the chuck table; the first a measuring unit for measuring the value used for calculating the thickness value of the workpiece unit held by the conveying mechanism or the thickness value of the workpiece unit; a grinding unit for grinding the workpiece held on the chuck table the workpiece unit; and a control unit for controlling each component, and the driving method of the grinding device includes: a first carrying out step in which the carrying mechanism removes the card from the cassette mounted on the cassette mounting table. The cassette unloads the workpiece unit; the first measurement step, the first measurement unit is used to calculate the thickness value of the workpiece unit or the thickness value of the workpiece unit carried out from the cassette in the unloading step. value; a first judging step, the control unit judges whether the workpiece unit is a grinding object according to the thickness value of the workpiece unit obtained by the measurement in the first measuring step; and a loading step, which is in In the case where the first judging step judges that the workpiece unit is the grinding object, the conveying mechanism carries the workpiece unit into the chuck table, and the first judging step judges that the workpiece unit is not the grinding object In this case, the transport mechanism transports the workpiece unit into the cassette again.
再者,本發明的另一態樣中,較佳為,該研削裝置進一步具備:第二測量單元,其用於測量使用於計算保持於該卡盤台之該被加工物單元的厚度值或該被加工物單元的厚度值之值,並且,所述研削裝置的驅動方法具備:研削步驟,該研削單元研削在該搬入步驟搬入該卡盤台之該被加工物單元;第二測量步驟,該第二測量單元測量使用於計算在該研削步驟研削之該被加工物單元的厚度值或該被加工物單元的厚度值之值;第二搬出步驟,該搬送機構從該卡盤台搬出已在該第二測量步驟測量厚度值之該被加工物單元;第三測量步驟,該第一測量單元測量使用於計算在該第二搬出步驟從該卡盤台搬出之該被加工物單元的厚度值或該被加工物單元的厚度值之值;以及第二判斷步驟,該控制單元比較根據由該第二測量步驟所進行之測量所獲得之該被加工物單元的厚度值、與根據由該第三測量步驟所進行之測量所獲得之該被加工物單元的厚度值,而判斷該第二測量單元是否正常地進行動作。Furthermore, in another aspect of the present invention, preferably, the grinding device further includes: a second measuring unit for measuring a thickness value or The value of the thickness value of the workpiece unit, and the driving method of the grinding device includes: a grinding step in which the grinding unit grinds the workpiece unit carried into the chuck table in the carrying-in step; and a second measuring step, The second measuring unit measures the value used to calculate the thickness value of the workpiece unit ground in the grinding step or the thickness value of the workpiece unit; in the second unloading step, the transfer mechanism unloads the workpiece from the chuck table. The workpiece unit whose thickness value is measured in the second measurement step; in the third measurement step, the first measurement unit is used to calculate the thickness of the workpiece unit unloaded from the chuck table during the second unloading step value or the value of the thickness value of the workpiece unit; and a second judging step, the control unit compares the thickness value of the workpiece unit obtained according to the measurement performed by the second measuring step with the value according to the workpiece unit obtained by the second measuring step The thickness value of the workpiece unit obtained by the measurement performed in the third measurement step is used to determine whether the second measurement unit operates normally.
或者,本發明的另一態樣中,較佳為,該研削裝置進一步具備:第二測量單元,其用於測量使用於計算保持於該卡盤台之該被加工物單元的厚度值或該被加工物單元的厚度值之值,並且,所述研削裝置的驅動方法具備:第四測量步驟,其在將已在該搬入步驟搬入該卡盤台之該被加工物單元進行研削之前,該第二測量單元測量使用於計算該被加工物單元的厚度值或該被加工物單元的厚度值之值;以及第三判斷步驟,該控制單元比較根據由該第四測量步驟所進行之測量所獲得之該被加工物單元的厚度值、與根據由該第一測量步驟所進行之測量所獲得之該被加工物單元的厚度值,而判斷該第二測量單元是否正常地進行動作。Or, in another aspect of the present invention, preferably, the grinding device further includes: a second measuring unit for measuring the thickness value of the workpiece unit held on the chuck table or the The value of the thickness value of the workpiece unit, and the driving method of the grinding device includes: a fourth measurement step of grinding the workpiece unit that has been carried into the chuck table in the carrying step. The second measuring unit measures a value used to calculate the thickness value of the workpiece unit or the thickness value of the workpiece unit; and a third judging step, the control unit compares according to the measurement performed by the fourth measuring step. The obtained thickness value of the workpiece unit and the thickness value of the workpiece unit obtained by the measurement performed in the first measurement step are used to determine whether the second measurement unit operates normally.
[發明功效] 在本發明中,根據由第一測量單元所進行之測量,而可掌握從卡匣搬出後且搬入卡盤台前的被加工物單元的厚度值。在此,被加工物單元的厚度值為將被加工物及黏貼於其之膠膜的各自厚度值進行合計之值。 [Inventive effect] In this invention, the thickness value of the to-be-processed object unit after carrying out from a cassette and before carrying it into a chuck table can be grasped based on the measurement performed by the 1st measurement means. Here, the thickness value of the workpiece unit is a value obtained by adding up the respective thickness values of the workpiece and the adhesive film attached thereto.
因此,若根據該測量,則可判斷黏貼於被加工物之膠膜是否具有所要求的厚度,亦即是否為所要求的種類。換言之,可在搬入卡盤台前判斷被加工物單元是否為研削對象。其結果,防止研削黏貼有不適當的膠膜之被加工物。Therefore, according to this measurement, it can be judged whether the adhesive film attached to the workpiece has the required thickness, that is, whether it is of the required type. In other words, it is possible to determine whether or not the workpiece unit is a grinding target before being loaded into the chuck table. As a result, the workpiece to which an inappropriate film is adhered is prevented from being ground.
參照附圖,針對本發明的實施方式進行說明。圖1為示意性地表示本發明的研削裝置的一例之立體圖。此外,圖1所示之X軸方向(前後方向)及Y軸方向(左右方向)為在水平面上互相正交之方向,並且,Z軸方向(上下方向)為與X軸方向及Y軸方向正交之方向(垂直方向)。Embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a perspective view schematically showing an example of the grinding apparatus of the present invention. In addition, the X-axis direction (front-rear direction) and the Y-axis direction (left-right direction) shown in FIG. 1 are directions orthogonal to each other on the horizontal plane, and the Z-axis direction (up-down direction) is the X-axis direction and the Y-axis direction. Orthogonal direction (vertical direction).
圖1所示之研削裝置2具備支撐各種構成要素之基台4。基台4的上表面前端側形成有開口4a,開口4a內設有搬送機構6。搬送機構6例如為具有多個關節之機械臂。圖2為示意性地表示被搬送機構6搬送之被加工物單元的一例之立體圖。The
圖2所示之被加工物單元11具有圓盤狀的被加工物13。被加工物13例如為由矽(Si)等半導體材料所構成之晶圓。被加工物13的正面13a側係以互相交叉之多條分割預定線15劃分成多個區域,各區域形成有IC或LSI等元件17。The
此外,被加工物13的材質、形狀、構造及大小等並無限制。例如,被加工物13亦可為由其他半導體材料、陶瓷、樹脂及金屬等材料而成之基板。同樣地,元件17的種類、數量、形狀、構造、大小及配置等亦無限制。In addition, the material, shape, structure, size, etc. of the
並且,被加工物13的正面13a黏貼有直徑與被加工物13的直徑大致相等之薄膜狀的膠膜19。膠膜19例如為由樹脂所構成,在研削被加工物13的背面13b側時緩和施加於正面13a側之衝擊而保護元件17。In addition, a film-like
然後,本實施方式中,在已保持被加工物單元11的一面11a(膠膜19之未黏貼於被加工物13的側的面19a)側之狀態下,研削一面11a的背面亦即另一面11b(被加工物13的背面13b)側。Then, in the present embodiment, in a state where the
圖1所示之開口4a的前方設置有卡匣載置台10a、10b,所述卡匣載置台10a、10b用於載置容納被加工物單元11之卡匣8a、8b。而且,搬送機構6不僅可保持並搬送被加工物單元11,也可使被加工物單元11上下反轉。The front of the opening 4a shown in FIG. 1 is provided with the
並且,開口4a的後方設置有測量單元(第一測量單元)12,所述測量單元12用於計算保持於搬送機構6之被加工物單元11的厚度值。圖3為示意性地表示測量單元12之側視圖。Further, behind the
測量單元12具有:四角柱狀的支撐部14,其沿著Z軸方向延伸;及四角柱狀的上表面側測量器16及下表面側測量器18,其等固定於支撐部14的前表面側(搬送機構6側)且沿著X軸方向延伸。上表面側測量器16及下表面側測量器18在Z軸方向分離,且為利用雷射光束測量與測量對象的距離之非接觸式距離測量器。The
具體而言,上表面側測量器16具有:投光部16a,其朝向下方投射雷射光束;及受光部16b,其接收被測量對象的上表面(例如,被加工物單元11的另一面11b)反射之雷射光束。然後,上表面側測量器16根據所投射之雷射光束與所接收之雷射光束的相位差等,而測量至測量對象的上表面為止的距離。Specifically, the upper surface
同樣地,下表面側測量器18具有:投光部18a,其朝向上方投射雷射光束;受光部18b,其接收被測量對象的下表面(例如,被加工物單元11的一面11a)反射之雷射光束。然後,下表面側測量器18根據所投射之雷射光束與所接收之雷射光束的相位差等,而測量至測量對象的下表面為止的距離。Similarly, the lower surface
此外,投光部16a例如包含:光源,其投射會在測量對象的上表面(例如,被加工物13的背面13b)被反射之波長的光;及透鏡及/或鏡子,其將來自此光源的光引導往測量對象。同樣地,投光部18a例如包含:光源,其投射會在測量對象的下表面(例如,膠膜19的面19a)被反射之波長的光;及透鏡及/或鏡子,其將來自此光源的光引導往測量對象。In addition, the
因此,從投光部16a投射之光的波長與從投光部18a投射之光的波長也可不同。並且,受光部16b、18b例如包含將被測量對象反射之光引導往受光元件之透鏡及/或鏡子、與檢測被測量對象反射之光之CMOS(Complementary Metal-Oxide Semiconductor,互補金氧半導體)影像感測器等受光元件。Therefore, the wavelength of the light projected from the
圖1所示之開口4a的斜後方(測量單元12的一側)設置有用於調整被加工物單元11的位置之位置調整機構20。位置調整機構20例如具備圓盤狀的工作台與配置於工作台周圍之多個銷。A
藉由多個銷沿著工作台的徑向移動,而例如被加工物單元11的中心會在X軸方向及Y軸方向中定位於預定的位置,所述被加工單元11係藉由搬送機構6而被從卡匣8a搬出,並載於位置調整機構20的工作台。此外,本實施方式中,被加工物單元11係以背面11b朝上之方式載於位置調整機構20的工作台。By moving the plurality of pins in the radial direction of the table, for example, the center of the
並且,本實施方式中,藉由搬送機構6而被從卡匣8a搬出之被加工物單元11,其外周部定位於測量單元12的上表面側測量器16與下表面側測量器18之間,並在計算其厚度值後被搬入位置調整機構20。Furthermore, in the present embodiment, the
測量單元12的後方設有搬送機構22,所述搬送機構22保持被加工物單元11並將被加工物單元11搬送至後方。搬送機構22具備:保持墊,其吸引保持被加工物單元11的上表面(本實施方式中為背面11b)側;及臂部,其連接此保持墊。而且,搬送機構22藉由臂部而使保持墊旋轉,藉此將已以位置調整機構20調整位置之被加工物單元11搬送至後方。A
搬送機構22的後方設有圓盤狀的旋轉台24。旋轉台24係與馬達等旋轉驅動源(未圖示)連接,並繞相對於Z軸方向呈大致平行的旋轉軸旋轉。旋轉台24的上表面設有可保持被加工物單元11之三個卡盤台26。A disk-shaped
三個卡盤台26係沿著旋轉台24的圓周方向而大致等間隔地設置。此外,設於旋轉台24上之卡盤台26的數量等並無限制。The three chuck tables 26 are provided at substantially equal intervals along the circumferential direction of the
圖4為示意性地表示旋轉台24及其周邊的構造之俯視圖。此外,圖4中,為了便於說明而以虛線表現部分要素。搬送機構22係將以保持墊保持之被加工物單元11搬入卡盤台26,所述卡盤台26配置於與搬送機構22相鄰之搬入搬出區域A(參照圖4)。FIG. 4 is a plan view schematically showing the structure of the
旋轉台24例如在圖1及圖4中往箭頭所示之方向旋轉,並使各卡盤台26依序移動至搬入搬出區域A、粗研削區域B及精研削區域C。各卡盤台26係與馬達等旋轉驅動源(未圖示)連接,並繞相對於Z軸方向呈大致平行的旋轉軸旋轉。The
各卡盤台26例如具有由不鏽鋼等金屬材料所構成之圓盤狀的框體。此框體的上表面側形成有在上端具圓形狀開口之凹部,此凹部固定有由陶瓷等所構成之圓盤狀的多孔板。Each chuck table 26 has a disk-shaped frame body made of a metal material such as stainless steel, for example. A concave portion having a circular opening at the upper end is formed on the upper surface side of the frame body, and a disc-shaped porous plate made of ceramics or the like is fixed to the concave portion.
卡盤台26的上表面被構成為中心比外緣稍微凸起之相當於圓錐側面之形狀,並發揮作為保持被加工物單元11的下表面(本實施方式中為正面11a)側之保持面26a的功能。亦即,各卡盤台26在上部具備保持被加工物單元11之保持面26a。The upper surface of the chuck table 26 is formed in a shape corresponding to a conical side surface whose center is slightly convex from the outer edge, and serves as a holding surface for holding the lower surface (in this embodiment, the
此保持面26a係透過形成於卡盤台26內部之吸引路徑(未圖示)等而與真空泵等吸引源(未圖示)連接。已搬入卡盤台26之被加工物單元11,其下表面側係藉由作用於保持面26a之吸引源的負壓而被吸引。The holding
如圖1所示,粗研削區域B及精研削區域C的後方(旋轉台24的後方)分別設有柱狀的支撐構造28。各支撐構造28的前表面側設有Z軸移動機構30。各Z軸移動機構30具備在Z軸方向呈大致平行的一對導軌32,移動板34係以可滑動之態樣裝設於導軌32。As shown in FIG. 1 , a
各移動板34的後表面(背面)側固定有構成滾珠螺桿之螺帽(未圖示),相對於導軌32呈大致平行的螺旋軸36以可旋轉之態樣與此螺帽連結。螺旋軸36的一端部連接有馬達38。藉由馬達38而使螺旋軸36旋轉,藉此移動板34會沿著導軌32在Z軸方向移動。A nut (not shown) constituting a ball screw is fixed to the rear surface (back surface) side of each moving
各移動板34的前表面(正面)側設有固定具40。各固定具40支撐有用於研削被加工物單元11的研削單元42。各研削單元42具備固定於固定具40之主軸外殼44。A
成為相對於Z軸方向呈大致平行的旋轉軸之主軸46係以可旋轉之態樣容納於各主軸外殼44。各主軸46的下端部從主軸外殼44的下端面露出。此主軸46的下端部固定有圓盤狀的安裝件48。The
粗研削區域B側的研削單元42的安裝件48下表面裝設有粗研削用的第一研削輪50a。粗研削用的第一研削輪50a具備第一輪基台,所述第一輪基台係以不鏽鋼或鋁等金屬形成為與安裝件48大致同徑。A
第一輪基台的下表面環狀配置有多個第一研削磨石,所述第一研削磨石係將適於粗研削之金剛石等磨粒以陶瓷(vitrified)或熱固性樹脂(resinoid)等結合劑固定而成。並且,粗研削區域B側的研削單元42的主軸外殼44容納有與主軸46的上端側連接之馬達等第一旋轉驅動源(未圖示)。A plurality of first grinding stones are annularly arranged on the lower surface of the first wheel base, and the first grinding stones are made of abrasive grains such as diamond suitable for rough grinding, vitrified, thermosetting resin, etc. The binding agent is fixed. Furthermore, the
藉由第一旋轉驅動源的動力,第一研削輪50a會與主軸46一起旋轉。第一研削輪50a的附近設有液體供給用噴嘴(未圖示),所述液體供給用噴嘴可將純水等液體(研削液)供給至被加工物單元11與第一研削磨石接觸之部分(加工點)。但是,也可取代此液體供給用噴嘴、或與液體供給用噴嘴一起,在第一研削輪50a設置使用於供給液體之液體供給口。The
同樣地,精研削區域C側的研削單元42的安裝件48的下表面裝設有精研削用的第二研削輪50b。精研削用的第二研削輪50b具備第二輪基台,所述第二輪基台係以不鏽鋼或鋁等金屬形成為與安裝件48大致同徑。Similarly, the
第二輪基台的下表面環狀配置有多個第二研削磨石,所述第二研削磨石係將適於精研削之金剛石等磨粒以陶瓷或樹脂等結合劑固定而成。並且,精研削區域C側的研削單元42的主軸外殼44容納有與主軸46的上端側連接之馬達等第二旋轉驅動源(未圖示)。A plurality of second grinding stones are annularly arranged on the lower surface of the second wheel base, and the second grinding stones are formed by fixing abrasive grains such as diamond suitable for fine grinding with a bonding agent such as ceramics or resin. In addition, the
藉由第二旋轉驅動源的動力,第二研削輪50b會與主軸46一起旋轉。第二研削輪50b的附近設有液體供給用噴嘴(未圖示),所述液體供給用噴嘴可將純水等液體(研削液)供給至被加工物單元11與第二研削磨石接觸之部分(加工點)。但是,也可取代此液體供給用噴嘴、或與液體供給用噴嘴一起,在第二研削輪50b設置使用於供給液體之液體供給口。The
藉由上述2組研削單元42而依序研削保持於各卡盤台26之被加工物單元11。具體而言,以粗研削區域B側的研削單元42研削粗研削區域B的卡盤台26所保持之被加工物單元11,以精研削區域C側的研削單元42研削精研削區域C的卡盤台26所保持之被加工物單元11。The
如圖1所示,精研削區域C側的研削單元42的前方設有測量單元(第二測量單元)52,所述測量單元(第二測量單元)52用於計算精研削後的被加工物單元11的厚度值。As shown in FIG. 1 , a measuring unit (second measuring unit) 52 is provided in front of the grinding
測量單元52具有:第一測量部,其前端能接觸測量對象的上表面(本實施方式中為被加工物單元11的背面11b);及第二測量部,其前端能接觸卡盤台26的保持面26a。而且,第一測量部及第二測量部會分別測量在垂直方向之前端的位置(高度)。亦即,第二測量單元52包含2個接觸式位置(高度)測量器。The
在搬入搬出區域A的前方且搬送機構22的側方設有搬送機構54,所述搬送機構54保持研削後的被加工物單元11並將研削後的被加工物單元11搬送至前方。搬送機構54具備:保持墊,其吸引保持被加工物單元11的上表面(本實施方式中為背面11b)側;臂部,其連接此保持墊。然後,搬送機構54藉由臂部而使保持墊旋轉,藉此將研削後的被加工物單元11從卡盤台26搬送至前方。In front of the carry-in and carry-out area A and on the side of the
搬送機構54的前方設有清洗單元56,所述清洗單元56清洗被搬送機構54搬出之被加工物單元11。清洗單元56例如具備:旋轉工作台,其在保持被加工物單元11的下表面(本實施方式中為正面11a)側之狀態下進行旋轉;及噴嘴,其將清洗用的流體噴射至被旋轉工作台保持之被加工物單元11的上表面(本實施方式中為背面11b)側。A
藉由搬送機構6,搬送已被此清洗單元56清洗之被加工物單元11。例如,被加工物單元11係外周部被定位於測量單元12的上表面側測量器16與下表面側測量器18之間,並在計算其厚度值後被搬入卡匣8b。或者,被加工物單元11亦可從清洗單元56直接被搬入卡匣8b。The
再者,研削裝置2亦可具備上述構成要素以外的構成要素。例如,研削裝置2也可具備藉由觸碰感應器與顯示器所構成之觸控面板,所述觸碰感應器將來自操作員的指示輸入研削裝置2,所述顯示器向操作員輸出各種資訊。In addition, the grinding
藉由內置於研削裝置2之控制單元而控制研削裝置2的各構成要素的動作。圖5為示意性地表示內置於研削裝置之控制單元的一例之方塊圖。圖5所示之控制單元58例如具有:處理部60,其生成用於控制研削裝置2的構成要素之訊號;及記憶部62,其記憶處理部60中所使用之各種資訊(資料及程式等)。The operation of each component of the
此外,記憶部62中例如預先儲存有以下的值:在研削裝置2中構成成為研削對象之被加工物單元11之被加工物13及膠膜19的各自厚度值;及測量單元12的上表面側測量器16與下表面側測量器18之間隔值。In addition, the
處理部60的功能係藉由CPU(Central Processing Unit,中央處理單元)等而實現,所述CPU等讀取並執行儲存於記憶部62之程式。並且,記憶部62的功能可藉由DRAM(Dynamic Random Access Memory,動態隨機存取記憶體)、SRAM(Static Random Access Memory,靜態隨機存取記憶體)及NAND型快閃記憶體等半導體記憶體與HDD(Hard Disk Drive,硬式磁碟機)等磁性儲存裝置之至少一種而實現。The function of the
處理部60具備:搬送部64、測量部66、研削部68及判斷部70。在處理部60中,此等功能部係不同時或同時地獨立進行處理。並且,處理部60亦可具有搬送部64、測量部66、研削部68及判斷部70以外的功能部。例如,處理部60亦可具有顯示部,所述顯示部控制上述觸控面板的構成要素亦即顯示器的顯示。The
搬送部64控制搬送機構6、搬送機構22及搬送機構54的動作。例如,搬送部64以下述方式控制搬送機構6的動作:將被加工物單元11的外周部定位於測量單元12的上表面側測量器16與下表面側測量器18之間的位置(測量位置)。The
測量部66控制測量單元12及測量單元52的動作。例如,測量部66以下述方式控制測量單元12的動作:測量外周部定位於上述測量位置之被加工物單元11的上表面與上表面側測量器16的距離(第一距離)、以及此被加工物單元11的下表面與下表面側測量器18的距離(第二距離)。The
研削部68控制旋轉台24、卡盤台26及研削單元42、以及與此等相關之構成要素的動作。例如,研削部68以研削保持於卡盤台26之被加工物單元11之方式控制此等的動作。The grinding
判斷部70根據由測量單元12所進行之測量而計算被加工物單元11的厚度值。例如,判斷部70係從記憶於記憶部62之測量單元12的上表面側測量器16與下表面側測量器18之間隔值減去第一距離及第二距離而計算被加工物單元11的厚度值。The
再者,判斷部70係因應根據由測量單元12所進行之測量所獲得之被加工物單元11的厚度值,而判斷被加工物單元11是否為研削對象。例如,判斷部70比較將記憶於記憶部62之被加工物13及膠膜19的各自厚度值進行合計之值、與所計算之被加工物單元11的厚度值,而判斷在被加工物13是否黏貼有所要求的膠膜19。Furthermore, the
然後,判斷部70在判斷被加工物13黏貼有所要求的膠膜19之情形中,判斷被加工物單元11為研削對象,在判斷被加工物13並未黏貼有所要求的膠膜19之情形中,則判斷被加工物單元11並非研削對象。Then, the judging
圖6為示意性地表示研削裝置2的驅動方法的一例之流程圖。此驅動方法中,首先,搬送機構6從載置於卡匣載置台10a之卡匣8a搬出被加工物單元11(搬出步驟:S1)。然後,搬送機構6將被加工物單元11定位於上述的測量位置。FIG. 6 is a flowchart schematically showing an example of a driving method of the grinding
接著,測量單元12測量使用於計算被加工物單元11的厚度之值,亦即測量上述的第一距離及第二距離(測量步驟:S2)。然後,如同上述,控制單元58的判斷部70計算被加工物單元11的厚度值。Next, the
接著,判斷部70因應被加工物單元11的厚度值而判斷被加工物單元11是否為研削對象(判斷步驟:S3)。具體而言,如同上述,判斷部70根據被加工物13是否黏貼有所要求的膠膜19而判斷被加工物單元11是否為研削對象。Next, the
然後,在判斷被加工物單元11為研削對象之情形(S3:是)中,將被加工物單元11搬入卡盤台26(搬入步驟:S4)。具體而言,搬送機構6將被加工物單元11搬入位置調整機構20,搬送機構22將已以位置調整機構20調整位置之被加工物單元11從位置調整機構20搬出並搬入卡盤台26。Then, when it is determined that the
若將被加工物單元11搬入卡盤台26,則研削被加工物單元11(研削步驟:S5)。另一方面,在判斷被加工物單元11並非研削對象之情形(S3:否)中,將被加工物單元11再次搬入卡匣8a(搬入步驟:S6)。When the
如同上述,在研削裝置2及其驅動方法中,根據由測量單元12所進行之測量,而可掌握從卡匣8a搬出後且搬入卡盤台26前的被加工物單元11的厚度值。在此,被加工物單元11的厚度值為將被加工物13及黏貼於其之膠膜19的各自厚度值進行合計之值。As described above, in the grinding
因此,根據該測量,可判斷黏貼於被加工物13之膠膜19是否具有所要求的厚度,亦即是否為所要求的種類。換言之,可在搬入卡盤台26前判斷被加工物單元11是否為研削對象。其結果,防止研削黏貼有不適當的膠膜19之被加工物13。Therefore, according to the measurement, it can be determined whether the
再者,在研削裝置2中,亦可確認測量單元(第二測量單元)52是否正常地進行動作。圖7為示意性地表示進行此種確認之研削裝置2的驅動方法的一例之流程圖。此驅動方法中,首先,研削保持於卡盤台26之被加工物單元11(研削步驟:S11)。In addition, in the
接著,測量單元52測量使用於計算保持於卡盤台26之被加工物單元11的厚度值之值,亦即垂直方向中被加工物單元11的上表面的位置(高度)與卡盤台26的保持面26a的位置(高度)(測量步驟:S12)。Next, the measuring
然後,判斷部70會根據由測量單元52所進行之測量而計算被加工物單元11的厚度值。具體而言,判斷部70計算被加工物單元11的上表面的位置(高度)與卡盤台26的保持面26a的位置(高度)之差以作為被加工物單元11的厚度值。Then, the
此外,由測量單元52所進行之測量亦可在從被加工物單元11的研削前至研削後為止的期間連續進行。此情形,可控制上述的觸控面板的構成要素亦即顯示器,而即時地將研削中的被加工物單元11的厚度通知操作員等。In addition, the measurement by the
接著,從卡盤台26搬出被加工物單元11(搬出步驟:S13)。具體而言,搬送機構54將被加工物單元11搬入清洗單元56,搬送機構6將已以清洗單元56清洗之被加工物單元11從清洗單元56搬出並定位於上述的測量位置。Next, the
接著,測量單元(第一測量單元)12測量使用於計算被加工物單元11的厚度值之值,亦即測量上述的第一距離及第二距離(測量步驟:S14)。然後,如同上述,控制單元58的判斷部70計算被加工物單元11的厚度值。Next, the measuring unit (first measuring unit) 12 measures the value for calculating the thickness value of the
接著,判斷部70比較根據由測量單元52所進行之測量所獲得之被加工物單元11的厚度值、與根據由測量單元12所進行之測量所獲得之被加工物單元11的厚度值,而判斷測量單元52是否正常地進行動作(判斷步驟:S15)。Next, the
例如,若兩值相等,則判斷部70判斷測量單元52正常地進行動作,若兩值不同,則判斷部70判斷測量單元52並未正常地進行動作。或者,判斷部70亦可在兩值的差為預定的閾值以下之情形中判斷測量單元52正常地進行動作,在兩值的差超過預定的閾值之情形中判斷測量單元52並未正常地動作。此情形,記憶部62亦可預先記憶此閾值。For example, if the two values are equal, the
然後,在判斷測量單元52並未正常運作之情形(S15:否)中,將此狀況通知操作員(通知步驟:S16)。例如,在觸控面板的構成要素亦即顯示器顯示錯誤訊息(表示測量單元52並未正常地進行動作之訊息)。其後,搬送機構6將被加工物單元11搬入載置於卡匣載置台10b之卡匣8b(搬入步驟:S17)。Then, in the case where it is judged that the
另一方面,在判斷測量單元52正常地進行動作之情形(S15:是)中,不進行特別的處理,搬送機構6將被加工物單元11搬入載置於卡匣載置台10b之卡匣8b(搬入步驟:S17)。On the other hand, when it is determined that the
並且,亦可在研削被加工物單元11前確認測量單元(第二測量單元)52是否正常地進行動作。圖8為示意性地表示進行此種確認之研削裝置2的驅動方法的一例之流程圖。在此驅動方法中,首先,搬送機構6從載置於卡匣載置台10a之卡匣8a搬出被加工物單元11(搬出步驟:S21)。In addition, before grinding the
接著,測量單元(第一測量單元)12測量使用於計算被加工物單元11的厚度值之值,亦即測量上述的第一距離及第二距離(測量步驟:S22)。然後,如同上述,控制單元58的判斷部70計算被加工物單元11的厚度值。Next, the measurement unit (first measurement unit) 12 measures the value for calculating the thickness value of the
接著,將被加工物單元11搬入卡盤台26(搬入步驟:S23)。具體而言,搬送機構6將被加工物單元11搬入位置調整機構20,搬送機構22將已以位置調整機構20調整位置之被加工物單元11從位置調整機構20搬出並搬入卡盤台26。Next, the
接著,測量單元(第二測量單元)52測量使用於計算保持於卡盤台26之被加工物單元11的厚度值之值,亦即測量垂直方向中被加工物單元11的上表面的位置(高度)與卡盤台26的保持面26a的位置(高度)(測量步驟:S24)。Next, the measurement unit (second measurement unit) 52 measures the value for calculating the thickness value of the
然後,判斷部70根據由測量單元52所進行之測量而計算被加工物單元11的厚度值。具體而言,判斷部70計算被加工物單元11的上表面的位置(高度)與卡盤台26的保持面26a的位置(高度)之差以作為被加工物單元11的厚度值。Then, the
接著,判斷部70比較根據由測量單元52所進行之測量所獲得之被加工物單元11的厚度值、與根據由測量單元12所進行之測量所獲得之被加工物單元11的厚度值,而判斷測量單元52是否正常地進行動作(判斷步驟:S25)。Next, the
例如,若兩值相等,則判斷部70判斷測量單元52正常地進行動作,若兩值不同,則判斷部70判斷測量單元52並未正常地進行動作。或者,判斷部70亦可在兩值的差為預定的閾值以下之情形中判斷測量單元52正常地進行動作,在兩值的差超過預定的閾值之情形中判斷測量單元52並未正常地進行動作。此情形,記憶部62亦可預先記憶此閾值。For example, if the two values are equal, the
然後,在判斷測量單元52並未正常地進行動作之情形(S25:否)中,將此狀況通知操作員(通知步驟:S26)。例如,在觸控面板的構成要素亦即顯示器顯示錯誤訊息(表示測量單元52並未正常地進行動作之訊息)。Then, when it is judged that the
在圖7及圖8各自所示之研削裝置2的驅動方法中,比較根據由測量單元(第二測量單元)52所進行之測量所獲得之被加工物單元11的厚度值、與根據由測量單元(第一測量單元)12所進行之測量所獲得之被加工物單元11的厚度值,藉此確認測量單元52是否正常地進行動作。In the driving method of the grinding
因此,可在早期發現測量單元52的故障或動作不良。藉此,能在早期發現下述問題:由對於被加工物單元11之研削變得過度或不足所導致之加工不良的發生等。Therefore, failure or malfunction of the
並且,在研削裝置2中,被加工物單元11是否為研削對象的確認及測量單元(第二測量單元)52是否正常地進行動作的確認皆使用測量單元(第一測量單元)12進行。因此,相較於具備個別進行兩者的確認之構成要素之研削裝置,研削裝置2的構造較為簡化,以此點而言為較佳。Furthermore, in the
此外,研削裝置2僅為本發明的研削裝置的一例,本發明的研削裝置並不受限於研削裝置2。例如,測量單元12及測量單元52亦可被取代成直接測量被加工物單元11的厚度之測量單元。同樣地,測量單元12亦可被取代成在已接觸測量對象之狀態下進行測量之測量單元,並且,測量單元52亦可被取代成在未接觸測量對象之狀態下(非接觸)進行測量之測量單元。In addition, the grinding
並且,圖6~圖8所示之研削裝置2的驅動方法僅為本發明的研削裝置的驅動方法的一例,本發明的研削裝置的驅動方法並不受限於圖6~圖8中任一者所示之研削裝置2的驅動方法。例如,將圖6~圖8所含之各步驟任意組合之研削裝置的驅動方法亦為本發明的研削裝置的驅動方法的一例。In addition, the driving method of the grinding
另外,上述之實施方式及變形例之構造及方法等,在不超出本發明之目的範圍內可進行適當變更並實施。In addition, the structure, method, etc. of the above-mentioned embodiment and the modification example can be suitably changed and implemented in the range which does not deviate from the objective of this invention.
11:被加工物單元
11a:正面
11b:背面
13:被加工物
13a:正面
13b:背面
15:分割預定線
17:元件
19:膠膜
19a:未黏貼於被加工物之側的面
2:研削裝置
4:基台
4a:開口
6:搬送機構
8a,8b:卡匣
10a,10b:卡匣載置台
12:測量單元
14:支撐部
16:上表面側測量器
16a:投光部
16b:受光部
18:下表面側測量器
18a:投光部
18b:受光部
20:位置調整機構
22:搬送機構
24:旋轉台
26:卡盤台
26a:保持面
28:支撐構造
30:Z軸移動機構
32:導軌
34:移動板
36:螺旋軸
38:馬達
40:固定具
42:研削單元
44:主軸外殼
46:主軸
48:安裝件
50a:第一研削輪
50b:第二研削輪
52:測量單元
54:搬送機構
56:清洗單元
58:控制單元
60:處理部
62:記憶部
64:搬送部
66:測量部
68:研削部
70:判斷部
11: Processed
圖1係示意性地表示研削裝置的一例之立體圖。 圖2係示意性地表示被加工物單元的一例之立體圖。 圖3係示意性地表示測量單元的一例之側視圖。 圖4係示意性地表示旋轉台及其周邊的構造的一例之俯視圖。 圖5係示意性地表示控制單元的一例之方塊圖。 圖6係示意性地表示研削裝置的驅動方法的一例之流程圖。 圖7係示意性地表示研削裝置的驅動方法的另一例之流程圖。 圖8係示意性地表示研削裝置的驅動方法的另一例的流程圖。 FIG. 1 is a perspective view schematically showing an example of a grinding apparatus. FIG. 2 is a perspective view schematically showing an example of a workpiece unit. FIG. 3 is a side view schematically showing an example of a measurement unit. FIG. 4 is a plan view schematically showing an example of the structure of the turntable and its periphery. FIG. 5 is a block diagram schematically showing an example of a control unit. FIG. 6 is a flowchart schematically showing an example of a driving method of the grinding device. FIG. 7 is a flowchart schematically showing another example of the driving method of the grinding device. FIG. 8 is a flowchart schematically showing another example of the driving method of the grinding device.
2:研削裝置 2: Grinding device
4:基台 4: Abutment
4a:開口 4a: Opening
6:搬送機構 6: Conveying mechanism
8a,8b:卡匣 8a, 8b: Cassette
10a,10b:卡匣載置台 10a, 10b: Cassette mounts
12:測量單元 12: Measuring unit
20:位置調整機構 20: Position adjustment mechanism
22:搬送機構 22: Conveying mechanism
24:旋轉台 24: Rotary table
26:卡盤台 26: Chuck table
26a:保持面 26a: Keep Faces
28:支撐構造 28: Support structure
30:Z軸移動機構 30: Z-axis moving mechanism
32:導軌 32: Rails
34:移動板 34: Mobile Board
36:螺旋軸 36: Screw shaft
38:馬達 38: Motor
40:固定具 40: Fixtures
42:研削單元 42: Grinding unit
44:主軸外殼 44: Spindle housing
46:主軸 46: Spindle
48:安裝件 48: Mounting pieces
50a:第一研削輪 50a: First grinding wheel
50b:第二研削輪 50b: Second grinding wheel
52:測量單元 52: Measuring unit
54:搬送機構 54: Conveying mechanism
56:清洗單元 56: Cleaning unit
Claims (8)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2020-211013 | 2020-12-21 | ||
JP2020211013A JP2022097831A (en) | 2020-12-21 | 2020-12-21 | Grinding device and method for driving grinding device |
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CN108500826A (en) * | 2017-02-27 | 2018-09-07 | 东莞新科技术研究开发有限公司 | Wafer reverse side grinding method |
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