TW202224797A - Substrate processing apparatus, cleaning unit, and cleaning method for multiple valve - Google Patents

Substrate processing apparatus, cleaning unit, and cleaning method for multiple valve Download PDF

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TW202224797A
TW202224797A TW110142931A TW110142931A TW202224797A TW 202224797 A TW202224797 A TW 202224797A TW 110142931 A TW110142931 A TW 110142931A TW 110142931 A TW110142931 A TW 110142931A TW 202224797 A TW202224797 A TW 202224797A
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valve
cleaning
supply
piping
channel valve
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TW110142931A
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TWI816227B (en
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脇田明日香
野村高幸
藤原友則
小路丸友則
東克栄
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日商斯庫林集團股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67051Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/02Cleaning by the force of jets or sprays
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B9/00Cleaning hollow articles by methods or apparatus specially adapted thereto 
    • B08B9/02Cleaning pipes or tubes or systems of pipes or tubes
    • B08B9/027Cleaning the internal surfaces; Removal of blockages
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67184Apparatus for manufacturing or treating in a plurality of work-stations characterized by the presence of more than one transfer chamber
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67196Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the transfer chamber
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

The object of the present invention is to effectively clean a multi-channel valve. The substrate processing apparatus of the present invention includes a storage tank for supplying a chemical liquid; a multi-channel valve capable of selectively supplying a plurality of processing liquids; and a processing liquid nozzle for processing the substrate by using the processing liquids supplied from the multi-channel valve; the substrate processing apparatus can switch between a substrate processing mode for processing the substrate and a cleaning mode for at least cleaning the multi-channel valve; in the cleaning mode, the chemical liquid is supplied from the storage tank to the multi-channel valve in the cleaning path, which is a path that passes through the storage tank and the multi-channel valve without passing through the processing liquid nozzle.

Description

基板處理裝置、洗淨單元及多通道閥洗淨方法Substrate processing apparatus, cleaning unit, and multi-channel valve cleaning method

本案說明書所揭示之技術係關於一種基板處理技術者。於成為處理對象之基板,包含例如半導體晶圓、液晶顯示裝置用玻璃基板、有機EL(electroluminescence:電致發光)顯示裝置等之平面顯示器(FPD,flat panel display)用基板、光碟用基板、磁碟用基板、磁光碟用基板、光罩用玻璃基板、陶瓷基板、場發射顯示器(field emission display,即FED)用基板、或太陽能電池用基板等。The technology disclosed in the description of this case is related to a substrate processing technology. Substrates to be processed include, for example, semiconductor wafers, glass substrates for liquid crystal display devices, substrates for flat panel displays (FPDs) such as organic EL (electroluminescence) display devices, substrates for optical discs, magnetic Substrates for discs, substrates for magneto-optical discs, glass substrates for masks, ceramic substrates, substrates for field emission displays (FED), or substrates for solar cells, etc.

於基板處理裝置中,有為了於基板處理中使用複數種處理液,而設置可選擇性供給複數種處理液中之1種之閥門單元即多通道閥之情形(例如,參照專利文獻1)。 [先前技術文獻] [專利文獻] In a substrate processing apparatus, in order to use a plurality of processing liquids for substrate processing, a valve unit that can selectively supply one of a plurality of processing liquids, that is, a multi-channel valve is provided (for example, refer to Patent Document 1). [Prior Art Literature] [Patent Literature]

[專利文獻1]日本專利特開2019-012791號公報[Patent Document 1] Japanese Patent Laid-Open No. 2019-012791

[發明所欲解決之問題][Problems to be Solved by Invention]

上述般之多通道閥為分別自連接於上游側之複數個配管供給處理液之構造,由於為配管連接集中之部位故容易積留污垢。另一方面,由於構造複雜,故有不容易充分洗淨之問題。The above-mentioned multi-channel valve is a structure in which the treatment liquid is supplied from a plurality of pipes connected to the upstream side, respectively, and since the pipe connections are concentrated, dirt tends to accumulate. On the other hand, since the structure is complicated, there is a problem that it is not easy to sufficiently wash.

本案說明書所揭示之技術係鑑於以上記載之問題而完成者,即用於有效地洗淨多通道閥之技術。 [解決問題之技術手段] The technology disclosed in the description of the present case was completed in view of the above-mentioned problems, that is, the technology for effectively cleaning the multi-channel valve. [Technical means to solve problems]

本案說明書所揭示之技術之第1態樣之基板處理裝置具備:貯槽,其用於供給藥液;多通道閥,其被供給用於處理基板之複數種處理液,且可選擇性供給複數種上述處理液中之至少1種;及處理液噴嘴,其用於使用自上述多通道閥供給之上述處理液處理上述基板;可切換用於處理上述基板之基板處理模式、與用於至少洗淨上述多通道閥之洗淨模式;於上述基板處理模式下,藉由供給至上述處理液噴嘴之上述處理液處理上述基板;於上述洗淨模式下,於不經由上述處理液噴嘴而經由上述貯槽與上述多通道閥之路徑即洗淨路徑中,自上述貯槽向上述多通道閥供給上述藥液。The substrate processing apparatus according to the first aspect of the technology disclosed in this specification is provided with: a storage tank for supplying a chemical solution; and a multi-channel valve for supplying a plurality of processing liquids for processing a substrate, and a plurality of types can be selectively supplied at least one of the above-mentioned processing liquids; and a processing liquid nozzle for processing the above-mentioned substrate using the above-mentioned processing liquid supplied from the above-mentioned multi-channel valve; the substrate processing mode for processing the above-mentioned substrate is switchable and for at least cleaning The cleaning mode of the multi-channel valve; in the substrate processing mode, the substrate is processed by the processing liquid supplied to the processing liquid nozzle; in the cleaning mode, the storage tank is not passed through the processing liquid nozzle in the cleaning mode In the cleaning path, which is a path with the multi-channel valve, the chemical solution is supplied from the storage tank to the multi-channel valve.

本案說明書所揭示之技術之第2態樣之基板處理裝置與第1態樣之基板處理裝置相關聯,其中上述藥液為複數種上述處理液中之1種。The substrate processing apparatus of the second aspect of the technology disclosed in this specification is related to the substrate processing apparatus of the first aspect, wherein the chemical solution is one of a plurality of the aforementioned processing solutions.

本案說明書所揭示之技術之第3態樣之基板處理裝置與第1或第2態樣之基板處理裝置相關聯,其中於上述洗淨路徑之上述貯槽之下游,且上述多通道閥之上游之位置,進而具備:複數個供給配管,其等被供給上述藥液;及至少1個連接配管,其跨及複數個上述供給配管而連接。The substrate processing apparatus of the third aspect of the technology disclosed in this specification is associated with the substrate processing apparatus of the first or second aspect, wherein the cleaning path is downstream of the storage tank and upstream of the multi-channel valve. The position further includes: a plurality of supply pipes to which the chemical solution is supplied; and at least one connection pipe that is connected across the plurality of supply pipes.

本案說明書所揭示之技術之第4態樣之基板處理裝置與第3態樣之基板處理裝置相關聯,其中上述連接配管收納於收納上述多通道閥之殼體內。The substrate processing apparatus of the fourth aspect of the technology disclosed in the present specification is related to the substrate processing apparatus of the third aspect, wherein the connection piping is accommodated in a case that accommodates the multi-channel valve.

本案說明書所揭示之技術之第5態樣之基板處理裝置與第3或第4態樣之基板處理裝置相關聯,其中上述連接配管收納於收納上述貯槽及上述多通道閥之殼體內。The substrate processing apparatus of the fifth aspect of the technology disclosed in this specification is related to the substrate processing apparatus of the third or fourth aspect, wherein the connection piping is accommodated in a housing that accommodates the storage tank and the multi-channel valve.

本案說明書所揭示之技術之第6態樣之基板處理裝置與第3至5中任一態樣之基板處理裝置相關聯,其中上述多通道閥具備使複數個上述供給配管之各者開關之複數個選擇閥門,於上述洗淨模式下,複數個上述供給配管中之至少1個藉由對應之上述選擇閥門而開關。The substrate processing apparatus of the sixth aspect of the technology disclosed in this specification is related to the substrate processing apparatus of any one of the third to fifth aspects, wherein the multi-channel valve includes a plurality of switches for opening and closing each of the plurality of supply pipes. a selector valve, and in the cleaning mode, at least one of the plurality of supply pipes is opened and closed by the corresponding selector valve.

本案說明書所揭示之技術之第7態樣之基板處理裝置與第1至6中任一態樣之基板處理裝置相關聯,其中於上述洗淨模式下,上述藥液於上述洗淨路徑中循環。The substrate processing apparatus of the seventh aspect of the technology disclosed in this specification is associated with the substrate processing apparatus of any one of the first to sixth aspects, wherein in the cleaning mode, the chemical solution circulates in the cleaning path .

本案說明書所揭示之技術之第8態樣之基板處理裝置與第7態樣之基板處理裝置相關聯,其進而具備:沖洗液供給源,其用於供給沖洗液;及抽吸部,其對於上述多通道閥內進行抽吸;於上述洗淨模式下,於上述洗淨路徑中之上述藥液循環之後,對上述多通道閥供給上述沖洗液,進而藉由上述抽吸部抽吸上述多通道閥內。The substrate processing apparatus of the eighth aspect of the technology disclosed in this specification is associated with the substrate processing apparatus of the seventh aspect, and further includes: a rinsing liquid supply source for supplying the rinsing liquid; and a suction unit for Suction is performed in the multi-channel valve; in the cleaning mode, after the chemical solution circulates in the cleaning path, the flushing liquid is supplied to the multi-channel valve, and the multi-channel valve is further sucked by the suction part. in the channel valve.

本案說明書所揭示之技術之第9態樣之基板處理裝置與第8態樣之基板處理裝置相關聯,其中於上述洗淨模式下,重複複數次上述洗淨路徑中之上述藥液循環、於上述藥液循環之後供給上述沖洗液、及供給上述沖洗液之後之上述多通道閥內之抽吸。The substrate processing apparatus of the ninth aspect of the technology disclosed in this specification is associated with the substrate processing apparatus of the eighth aspect, wherein in the cleaning mode, the circulation of the chemical solution in the cleaning path is repeated a plurality of times, The flushing liquid is supplied after the circulation of the chemical solution, and the suction in the multi-channel valve after the flushing liquid is supplied.

本案說明書所揭示之技術之第10態樣之基板處理裝置與第1至7中之任一態樣之基板處理裝置相關聯,其中於上述洗淨模式下,上述藥液之供給壓變動。The substrate processing apparatus of the tenth aspect of the technology disclosed in this specification is related to the substrate processing apparatus of any one of the first to seventh aspects, wherein the supply pressure of the chemical solution varies in the cleaning mode.

本案說明書所揭示之技術之第11態樣之洗淨單元具備:貯槽,其用於供給藥液;及洗淨配管,其用於形成用以至少洗淨多通道閥之路徑即洗淨路徑;上述多通道閥被供給複數種處理液,且可選擇性供給複數種上述處理液中之至少一種;上述洗淨路徑經過上述貯槽;上述多通道閥於上述洗淨路徑中,藉由自上述貯槽供給之上述藥液被洗淨;上述洗淨配管可相對於上述多通道閥裝卸。The cleaning unit according to the eleventh aspect of the technology disclosed in this specification is provided with: a storage tank for supplying a chemical solution; and a cleaning pipe for forming a cleaning path, which is a path for cleaning at least the multi-channel valve; The multi-channel valve is supplied with a plurality of treatment liquids, and can selectively supply at least one of the plurality of treatment liquids; the cleaning path passes through the storage tank; the multi-channel valve is in the cleaning path by passing from the storage tank The supplied chemical solution is washed, and the washing pipe can be attached to and detached from the multi-channel valve.

本案說明書所揭示之技術之第12態樣之洗淨單元與第11態樣之洗淨單元相關聯,其中於上述洗淨路徑之上述貯槽之下游、且上述多通道閥之上游之位置,進而具備:複數個供給配管,其等被供給上述藥液;及至少1個連接配管,其跨及複數個上述供給配管而連接。The cleaning unit of the twelfth aspect of the technology disclosed in this specification is associated with the cleaning unit of the eleventh aspect, wherein the cleaning path is downstream of the storage tank and upstream of the multi-channel valve, and further It includes: a plurality of supply pipes to which the chemical solution is supplied; and at least one connection pipe connected across the plurality of the supply pipes.

本案說明書所揭示之技術之第13態樣之洗淨單元與第12態樣之洗淨單元相關聯,其中上述多通道閥具備使複數個上述供給配管之各者開關之複數個選擇閥門,複數個上述供給配管中之至少1個藉由對應之上述選擇閥門而開關。The cleaning unit of the thirteenth aspect of the technology disclosed in this specification is associated with the cleaning unit of the twelfth aspect, wherein the multi-channel valve includes a plurality of selector valves for opening and closing each of the plurality of supply pipes, and the plurality of At least one of the supply pipes is opened and closed by the corresponding selector valve.

本案說明書所揭示之技術之第14態樣之洗淨單元與第11至13中任一態樣之洗淨單元相關聯,其中上述藥液於上述洗淨路徑中循環。The cleaning unit of the 14th aspect of the technology disclosed in this specification is associated with the cleaning unit of any one of the 11th to 13th aspects, wherein the chemical solution is circulated in the cleaning path.

本案說明書所揭示之技術之第15態樣之洗淨單元與第11至14中任一態樣之洗淨單元相關聯,其進而具備:沖洗液供給源,其用於供給沖洗液;及抽吸部,其對於上述多通道閥內進行抽吸;於上述洗淨路徑中之上述藥液循環之後,對上述多通道閥供給上述沖洗液,進而藉由上述抽吸部抽吸上述多通道閥內。The cleaning unit of the fifteenth aspect of the technology disclosed in the present specification is associated with the cleaning unit of any one of aspects 11 to 14, and further includes: a rinse liquid supply source for supplying the rinse liquid; and a pump a suction part for suctioning the inside of the multi-channel valve; after the chemical solution circulates in the cleaning path, the flushing liquid is supplied to the multi-channel valve, and then the multi-channel valve is sucked by the suction part Inside.

本案說明書所揭示之技術之第16態樣之洗淨單元與第15態樣之洗淨單元相關聯,重複複數次上述洗淨路徑中之上述藥液循環、於上述藥液循環之後供給上述沖洗液、及供給上述沖洗液之後之上述多通道閥內之抽吸。The cleaning unit of the 16th aspect of the technology disclosed in the present specification is associated with the cleaning unit of the 15th aspect, repeats the above-mentioned chemical solution circulation in the above-mentioned cleaning path a plurality of times, and supplies the above-mentioned rinsing after the above-mentioned chemical solution circulation. liquid, and suction in the multi-channel valve after supplying the flushing liquid.

本案說明書所揭示之技術之第17態樣之多通道閥洗淨方法將以被供給用於處理基板之複數種處理液,且可選擇性供給複數種上述處理液中之至少1種之狀態連接於基板處理裝置之多通道閥洗淨,且上述基板處理裝置具備:貯槽,其用於供給藥液;及處理液噴嘴,其用於使用自上述多通道閥供給之上述處理液處理上述基板;上述基板處理裝置可切換用於處理上述基板之基板處理模式、與用於至少洗淨上述多通道閥之洗淨模式;於上述基板處理模式下,藉由供給至上述處理液噴嘴之上述處理液處理上述基板;於上述洗淨模式下,於不經由上述處理液噴嘴而經由上述貯槽與上述多通道閥之路徑即洗淨路徑中,自上述貯槽向上述多通道閥供給上述藥液;於上述洗淨模式下,具備洗淨上述多通道閥之步驟。 [發明之效果] The multi-channel valve cleaning method according to the seventeenth aspect of the technology disclosed in this specification is connected in a state in which a plurality of processing liquids for processing a substrate are supplied, and at least one of the plurality of processing liquids can be selectively supplied. A multi-channel valve cleaning in a substrate processing apparatus, and the substrate processing apparatus includes: a storage tank for supplying a chemical solution; and a processing liquid nozzle for processing the substrate using the processing liquid supplied from the multi-channel valve; The substrate processing apparatus can switch between a substrate processing mode for processing the substrate and a cleaning mode for cleaning at least the multi-channel valve; in the substrate processing mode, the processing liquid supplied to the processing liquid nozzle is processing the substrate; in the cleaning mode, supplying the chemical solution from the storage tank to the multi-channel valve in a cleaning path that does not pass through the processing liquid nozzle but through the storage tank and the multi-channel valve; In the cleaning mode, a step of cleaning the above-mentioned multi-channel valve is provided. [Effect of invention]

根據本案說明書所揭示之技術之至少第1、第11、第17態樣,藉由對不經由處理液噴嘴之洗淨路徑供給藥液,而可有效地洗淨多通道閥。According to at least the first, eleventh, and seventeenth aspects of the technology disclosed in this specification, the multi-channel valve can be efficiently cleaned by supplying the chemical liquid to the cleaning path that does not pass through the processing liquid nozzle.

又,與本案說明書所揭示之技術相關聯之目的、特徵、態樣、優點藉由以下所示之詳細說明隨附圖式而進一步明瞭。Furthermore, the objects, features, aspects, and advantages related to the technology disclosed in the present specification will be further clarified by the accompanying drawings in the detailed description shown below.

以下,一面參照隨附之圖式一面對實施形態進行說明。於以下實施形態,雖為說明技術亦顯示詳細之特徵等,但該等為例示,該等全部未必為實施形態可實施所必要之特徵。Hereinafter, the embodiment will be described with reference to the accompanying drawings. In the following embodiments, although detailed features and the like are also shown for the purpose of explaining the technology, these are examples, and all of them are not necessarily features necessary for the implementation of the embodiments.

另,圖式係概略性顯示者,係為了方便說明起見,而於圖式中適當地省略構成、或簡化構成者。又,不同之圖式各自所示之構成等之大小及位置之相互關係未必為準確記載者,而為可適當變更者。又,於非剖視圖之俯視圖等圖式中,有為容易理解實施形態之內容,而附加陰影線之情形。In addition, the drawings are shown schematically, and for convenience of description, the configuration is appropriately omitted or simplified in the drawings. In addition, the mutual relationship of the size and the position of the structure etc. shown in each of the different drawings is not necessarily exactly what is described, but can be appropriately changed. In addition, in some drawings, such as a top view which is not a cross-sectional view, hatching may be added in order to make it easy to understand the content of an embodiment.

又,於以下所示之說明,對同樣之構成要件附註相同之符號而圖示,其等之名稱與功能亦同樣。因此,有為避免重複而省略其等相關之詳細說明之情形。In addition, in the description shown below, the same code|symbol is attached|subjected to the same component, and it is shown in figure, and the name and function of the same are also the same. Therefore, in some cases, detailed descriptions related to them are omitted in order to avoid repetition.

又,於本案說明書記載之說明中,於將某構成要件記載為「具備」、「包含」或「具有」等之情形時,只要無特別記述,則並非排除其他構成要件之存在之排他性之表現。In addition, in the description of the description of this case, when a certain component is described as "has", "includes" or "has", unless otherwise specified, it is not an expression of exclusivity that excludes the existence of other components .

又,於本案說明書記載之說明中,即使於使用「第1」或「第2」等序數之情形時,該等用語亦係為了便於容易理解實施形態之內容而使用者,並非限定於可能藉由該等序數而產生之順序等者。In addition, in the descriptions described in the specification of this application, even when ordinal numbers such as "1st" or "2nd" are used, these terms are used to facilitate the understanding of the content of the embodiment, and are not limited to those that may be used by The order resulting from the ordinal numbers is equivalent.

又,於本案說明書記載之說明中,即使於使用「上」、「下」、「左」、「右」、「側」、「底」、「正」或「背」等意為特定之位置或方向之用語之情形時,該等用語亦係為了便於容易理解實施形態之內容而使用者,與實際實施時之位置或方向無關係。In addition, in the description described in the description of this case, even if the use of "up", "down", "left", "right", "side", "bottom", "front" or "back" means a specific position In the case of terms of directions or directions, these terms are also used by the user to facilitate easy understanding of the content of the embodiment, and have nothing to do with the actual position or direction of the implementation.

又,於本案說明書記載之說明中,於記載為「…之上表面」或「…之下表面」等之情形時,設為除成為對象之構成要件之上表面自身或下表面自身以外,亦包含於成為對象之構成要件之上表面或下表面形成有其他構成要件之狀態者。即,例如,於記載為「設置於甲之上表面之乙」之情形時,並不妨礙於甲與乙之間介存其他構成要件「丙」者。In addition, in the description described in the specification of this application, when it is described as "the upper surface of ..." or "the lower surface of ...", etc., it is assumed that in addition to the upper surface itself or the lower surface itself of the constituent elements that become the object, it is also It includes the state in which other constituent elements are formed on the upper surface or the lower surface of the constituent element to be the target. That is, for example, when it is described as "B installed on the upper surface of A", it does not prevent the existence of another constituent element "C" between A and B.

<實施形態> 以下,對本實施形態相關之基板處理裝置、及洗淨單元進行說明。 <Embodiment> Hereinafter, the substrate processing apparatus and the cleaning unit according to the present embodiment will be described.

<關於基板處理裝置之構成> 圖1係概略性顯示本實施形態相關之基板處理裝置1之構成例之俯視圖。基板處理裝置1具備裝載埠601、傳載機械手602、中心機械手603、控制部90、及至少1個處理單元600(於圖1中為4個處理單元)。 <About the configuration of the substrate processing apparatus> FIG. 1 is a plan view schematically showing a configuration example of a substrate processing apparatus 1 according to the present embodiment. The substrate processing apparatus 1 includes a load port 601 , a transfer robot 602 , a central robot 603 , a control unit 90 , and at least one processing unit 600 (four processing units in FIG. 1 ).

處理單元600為可使用於基板處理之單片式之裝置,具體而言為進行去除附著於基板W之有機物之處理之裝置。附著於基板W之有機物為例如已使用之光阻膜。該光阻膜係例如作為離子注入步驟用之注入遮罩使用者。The processing unit 600 is a monolithic device that can be used for substrate processing, specifically, a device that performs processing to remove organic substances attached to the substrate W. As shown in FIG. The organic matter attached to the substrate W is, for example, a photoresist film that has been used. The photoresist film is used, for example, as an implant mask for the ion implantation step.

另,處理單元600可具有腔室180。於該情形時,藉由控制部90控制腔室180內之氛圍,處理單元600可於期望之氛圍中進行基板處理。Also, the processing unit 600 may have the chamber 180 . In this case, by controlling the atmosphere in the chamber 180 by the control unit 90, the processing unit 600 can perform substrate processing in a desired atmosphere.

控制部90可控制基板處理裝置1之各個構成之動作。載體C係收納基板W之收納器。又,裝載埠601係保持複數個載體C之收納器保持機構。傳載機械手602可於裝載埠601與基板載置部604之間搬送基板W。中心機械手603可於基板載置部604及處理單元600之間搬送基板W。The control unit 90 can control the operations of the respective components of the substrate processing apparatus 1 . The carrier C is a container for accommodating the substrate W. As shown in FIG. In addition, the loading port 601 is a container holding mechanism for holding a plurality of carriers C. As shown in FIG. The transfer robot 602 can transfer the substrate W between the loading port 601 and the substrate placing portion 604 . The central robot 603 can transfer the substrate W between the substrate placement portion 604 and the processing unit 600 .

藉由以上之構成,傳載機械手602、基板載置部604及中心機械手603作為於各個處理單元600與裝載埠601之間搬送基板W之搬送機構發揮功能。With the above configuration, the transfer robot 602 , the substrate placement portion 604 , and the center robot 603 function as a transfer mechanism for transferring the substrate W between the respective processing units 600 and the loading port 601 .

藉由傳載機械手602自載體C取出未處理之基板W。且,將未處理之基板W經由基板載置部604交接至中心機械手603。The unprocessed substrate W is taken out from the carrier C by the transfer robot 602 . Then, the unprocessed substrate W is transferred to the central robot 603 via the substrate placement portion 604 .

中心機械手603將該未處理之基板W搬入至處理單元600。且,處理單元600對基板W進行處理。The central robot 603 carries the unprocessed substrate W into the processing unit 600 . Then, the processing unit 600 processes the substrate W.

藉由中心機械手603自處理單元600取出於處理單元600中已處理之基板W。且,於根據需要,將已處理之基板W經過其他處理單元600之後,經由基板載置部604交接至傳載機械手602。傳載機械手602將已處理之基板W搬入載體C。藉由以上,進行對基板W之處理。The processed substrate W in the processing unit 600 is taken out from the processing unit 600 by the central robot 603 . And, after passing the processed substrate W through another processing unit 600 as required, it is transferred to the transfer robot 602 via the substrate placement portion 604 . The transfer robot 602 carries the processed substrate W into the carrier C. As shown in FIG. By the above, the process of the board|substrate W is performed.

圖2係顯示圖1例示之控制部90之構成例之圖。控制部90亦可藉由具有電路之一般電腦構成。具體而言,控制部90具備中央運算處理裝置(central processing unit,即CPU)91、唯讀記憶體(read only memory,即ROM)92、隨機存取記憶體(random access memory,即RAM)93、記錄裝置94、輸入部96、顯示部97及通信部98、及將該等相互連接之匯流排線95。FIG. 2 is a diagram showing a configuration example of the control unit 90 illustrated in FIG. 1 . The control unit 90 may also be constituted by a general computer having a circuit. Specifically, the control unit 90 includes a central processing unit (CPU) 91 , a read only memory (ROM) 92 , and a random access memory (RAM) 93 , a recording device 94, an input unit 96, a display unit 97, a communication unit 98, and a bus line 95 connecting these to each other.

ROM92存儲基本程式。RAM93作為供CPU91進行特定之處理時之作業區域使用。記錄裝置94由快閃記憶體或硬碟裝置等非揮發性記錄裝置構成。輸入部96由各種開關或觸控面板等構成,自使用者接收處理配方等輸入設定指示。顯示部97由例如液晶顯示裝置及燈等構成,於CPU91之控制下顯示各種資訊。通信部98具有經由區域網路(LAN,local area network)等之資料通信功能。The ROM 92 stores basic programs. The RAM 93 is used as a work area when the CPU 91 performs specific processing. The recording device 94 is constituted by a non-volatile recording device such as a flash memory or a hard disk device. The input unit 96 is composed of various switches, a touch panel, or the like, and receives input setting instructions such as processing recipes from the user. The display unit 97 is composed of, for example, a liquid crystal display device and a lamp, and displays various information under the control of the CPU 91 . The communication unit 98 has a data communication function via a local area network (LAN, local area network) or the like.

於記錄裝置94,預先設定圖1之基板處理裝置1之各個構成之控制相關之複數個模式。藉由使CPU91執行處理程式94P,而選擇上述複數個模式中之1個模式,於該模式下控制各個控制。另,亦可將處理程式94P記錄於外部之記錄媒體。若使用該記錄媒體,則可於控制部90安裝處理程式94P。又,控制部90執行之功能之一部分或全部未必由軟體實現,亦可由專用之邏輯電路等之硬體實現。In the recording device 94, a plurality of modes related to the control of each configuration of the substrate processing apparatus 1 of FIG. 1 are preset. By causing the CPU 91 to execute the processing program 94P, one of the above-mentioned plural modes is selected, and each control is controlled in this mode. In addition, the processing program 94P may be recorded on an external recording medium. If this recording medium is used, the processing program 94P can be installed in the control unit 90 . In addition, some or all of the functions performed by the control unit 90 are not necessarily realized by software, but may be realized by hardware such as a dedicated logic circuit.

圖3係顯示本實施形態相關之基板處理裝置1之構成中經由配管連接於各個處理單元600之構造例之圖。FIG. 3 is a diagram showing an example of a structure in which each processing unit 600 is connected via piping in the structure of the substrate processing apparatus 1 according to the present embodiment.

如圖3所例示,基板處理裝置1具備箱櫃30、箱櫃40、箱櫃50、流體箱60、流體箱70、處理單元600A、及處理單元600B。另,箱櫃之數量並非限定於圖3所示之數量者。又,流體箱只要相對於1個處理單元具備1個即可。又,處理單元600A及處理單元600B為與圖1所示之處理單元600同等者。As illustrated in FIG. 3 , the substrate processing apparatus 1 includes a tank 30 , a tank 40 , a tank 50 , a fluid tank 60 , a fluid tank 70 , a processing unit 600A, and a processing unit 600B. In addition, the number of cabinets is not limited to the number shown in FIG. 3 . In addition, it is sufficient that only one fluid tank is provided for one processing unit. In addition, the processing unit 600A and the processing unit 600B are equivalent to the processing unit 600 shown in FIG. 1 .

箱櫃30具備藥液貯槽32、閥門34、泵36、及過濾器38。於藥液貯槽32,貯存有可用於處理基板W之藥液(例如H 2O 2、NH 4OH、O 3或IPA(Isopropyl Alcohol:異丙醇)等有機溶劑等)、可用於洗淨稍後敘述之多通道閥之藥液、或兼用於該等之藥液。閥門34、泵36及過濾器38分別設置於連接於藥液貯槽32之配管即供給配管39。 The tank 30 includes a chemical liquid storage tank 32 , a valve 34 , a pump 36 , and a filter 38 . In the chemical liquid storage tank 32, a chemical liquid (for example, organic solvents such as H 2 O 2 , NH 4 OH, O 3 , IPA (Isopropyl Alcohol: isopropyl alcohol), etc., which can be used for processing the substrate W is stored, and can be used for cleaning a little. The medicinal solution of the multi-channel valve described later, or the medicinal solution used in combination with these. The valve 34 , the pump 36 , and the filter 38 are respectively provided in the supply piping 39 , which is a piping connected to the chemical solution storage tank 32 .

貯存於藥液貯槽32之藥液於藉由控制部90之控制而調整開關之閥門34打開之狀態下,藉由同樣由控制部90之控制而動作之泵36通過過濾器38且流到供給配管39內,流向下游之流體箱60,進而流向處理單元600A等。The chemical liquid stored in the chemical liquid storage tank 32 passes through the filter 38 and flows to the supply by the pump 36 which is also operated by the control of the control section 90 in a state where the valve 34 of the adjustment switch is opened by the control of the control section 90. The inside of the piping 39 flows to the downstream fluid tank 60 and further to the processing unit 600A and the like.

箱櫃40具備藥液貯槽42、閥門44、泵46、及過濾器48。於藥液貯槽42,貯存有可用於處理基板W之藥液、可用於洗淨稍後敘述之多通道閥之藥液、或兼用於該等之藥液。閥門44、泵46及過濾器48分別設置於連接於藥液貯槽42之配管即供給配管49。The tank 40 includes a chemical liquid storage tank 42 , a valve 44 , a pump 46 , and a filter 48 . The chemical liquid storage tank 42 stores a chemical liquid that can be used for processing the substrate W, a chemical liquid that can be used to clean a multi-channel valve described later, or a chemical liquid that can be used in combination with these. The valve 44 , the pump 46 and the filter 48 are respectively provided in the supply piping 49 which is a piping connected to the chemical solution storage tank 42 .

貯存於藥液貯槽42之藥液於藉由控制部90之控制而調整開關之閥門44打開之狀態下,藉由同樣由控制部90之控制而動作之泵46通過過濾器48且流到供給配管49內,流向下游之流體箱60,進而流向處理單元600A等。The chemical solution stored in the chemical solution storage tank 42 passes through the filter 48 and flows to the supply by the pump 46 which is also operated by the control of the control part 90 in a state in which the valve 44 which is adjusted and opened by the control of the control part 90 is opened. The inside of the piping 49 flows to the downstream fluid tank 60 and further to the processing unit 600A and the like.

箱櫃50具備藥液貯槽52、閥門54、泵56、及過濾器58。於藥液貯槽52,貯存有可用於處理基板W之藥液、可用於洗淨稍後敘述之多通道閥之藥液、或兼用於該等之藥液。閥門54、泵56及過濾器58分別設置於連接於藥液貯槽52之配管即供給配管59。The tank 50 includes a chemical liquid storage tank 52 , a valve 54 , a pump 56 , and a filter 58 . The chemical liquid storage tank 52 stores a chemical liquid that can be used for processing the substrate W, a chemical liquid that can be used to clean a multi-channel valve described later, or a chemical liquid that can be used in combination with these. The valve 54 , the pump 56 and the filter 58 are respectively provided in the supply piping 59 which is a piping connected to the chemical solution storage tank 52 .

貯存於藥液貯槽52之藥液於藉由控制部90之控制而調整開關之閥門54打開之狀態下,藉由同樣由控制部90之控制而動作之泵56通過過濾器58且流到供給配管59內,流向下游之流體箱60,進而流向處理單元600A等。The chemical liquid stored in the chemical liquid storage tank 52 passes through the filter 58 and flows to the supply by the pump 56 which is also operated by the control of the control section 90 in a state in which the valve 54 of the adjustment switch is opened by the control of the control section 90. The inside of the piping 59 flows to the downstream fluid tank 60 and further to the processing unit 600A and the like.

又,作為自純水供給源供給之沖洗液之純水亦流到連接於純水供給源之供給配管100內,流向下游之流體箱60,進而流向處理單元600A等。In addition, the pure water as the flushing liquid supplied from the pure water supply source also flows into the supply piping 100 connected to the pure water supply source, to the downstream fluid tank 60, and further to the processing unit 600A and the like.

供給配管39亦連接於流體箱60以外之流體箱(例如流體箱70或未圖示之其他流體箱),使藥液貯槽32內之藥液流向各個流體箱。The supply piping 39 is also connected to a fluid tank other than the fluid tank 60 (eg, the fluid tank 70 or another fluid tank not shown), so that the chemical liquid in the chemical liquid storage tank 32 flows to each of the fluid tanks.

供給配管49亦連接於流體箱60以外之流體箱(例如流體箱70或未圖示之其他流體箱),使藥液貯槽32內之藥液流向各個流體箱。The supply piping 49 is also connected to a fluid tank other than the fluid tank 60 (eg, the fluid tank 70 or another fluid tank not shown), so that the chemical liquid in the chemical liquid storage tank 32 flows to each of the fluid tanks.

供給配管59亦連接於流體箱60以外之流體箱(例如流體箱70或未圖示之其他流體箱),使藥液貯槽32內之藥液流向各個流體箱。The supply piping 59 is also connected to a fluid tank other than the fluid tank 60 (for example, the fluid tank 70 or another fluid tank not shown), so that the chemical liquid in the chemical liquid storage tank 32 flows to each of the fluid tanks.

供給配管100亦連接於流體箱60以外之流體箱(例如流體箱70或未圖示之其他流體箱),使作為沖洗液之純水流向各個流體箱。The supply piping 100 is also connected to a fluid tank other than the fluid tank 60 (eg, the fluid tank 70 or another fluid tank not shown), so that pure water as a flushing liquid flows to each of the fluid tanks.

流體箱60具備供給閥門62A、供給閥門62B、供給閥門62C及供給閥門62D、連接配管64E、連接配管64F、連接配管64G、連接閥門66E、連接閥門66F、連接閥門66G、多通道閥68、開放閥門65、供給閥門67、及排液閥門69。The fluid tank 60 includes a supply valve 62A, a supply valve 62B, a supply valve 62C, a supply valve 62D, a connection pipe 64E, a connection pipe 64F, a connection pipe 64G, a connection valve 66E, a connection valve 66F, a connection valve 66G, a multi-channel valve 68, and an open Valve 65 , supply valve 67 , and drain valve 69 .

供給閥門62A、供給閥門62B、供給閥門62C及供給閥門62D係設置於自上游側連接之各個配管(例如供給配管39、供給配管49、供給配管59及供給配管100)之閥門。The supply valve 62A, the supply valve 62B, the supply valve 62C, and the supply valve 62D are valves provided in the respective pipes (eg, the supply piping 39, the supply piping 49, the supply piping 59, and the supply piping 100) connected from the upstream side.

連接配管64E係於供給閥門62A及供給閥門62B之下游,跨及設置有供給閥門62A之配管與設置有供給閥門62B之配管的配管。The connection piping 64E is downstream of the supply valve 62A and the supply valve 62B, and spans the piping provided with the supply valve 62A and the piping provided with the supply valve 62B.

連接配管64F係於供給閥門62B及供給閥門62C之下游,跨及設置有供給閥門62B之配管與設置有供給閥門62C之配管的配管。The connection piping 64F is downstream of the supply valve 62B and the supply valve 62C, and spans the piping provided with the supply valve 62B and the piping provided with the supply valve 62C.

連接配管64G係於供給閥門62C及供給閥門62D之下游,跨及設置有供給閥門62C之配管與設置有供給閥門62D之配管的配管。The connection piping 64G is downstream of the supply valve 62C and the supply valve 62D, and spans the piping provided with the supply valve 62C and the piping provided with the supply valve 62D.

連接閥門66E係設置於連接配管64E之閥門。連接閥門66F係設置於連接配管64F之閥門。連接閥門66G係設置於連接配管64G之閥門。The connection valve 66E is a valve provided in the connection pipe 64E. The connection valve 66F is a valve provided in the connection pipe 64F. The connection valve 66G is a valve provided in the connection pipe 64G.

多通道閥68係可連接於與供給閥門62A、供給閥門62B、供給閥門62C及供給閥門62D各者對應之複數個配管,且選擇該等複數個配管中之至少1個並流向下游之供給配管61之閥。The multi-channel valve 68 can be connected to a plurality of pipes corresponding to each of the supply valve 62A, the supply valve 62B, the supply valve 62C, and the supply valve 62D, and at least one of the plurality of pipes is selected and flows to the downstream supply pipe Valve of 61.

開放閥門65係設置於配管之閥門,且該配管於設置有供給閥門之任一配管中之連接閥門之下游且多通道閥68之上游分支。開放閥門65係用於對配管內導入空氣或惰性氣體(例如氮),或對於配管內進行抽吸(即,將配管內排氣)之閥門。The opening valve 65 is a valve provided in a pipe, and the pipe is branched downstream of the connecting valve in any pipe provided with a supply valve and upstream of the multi-channel valve 68 . The opening valve 65 is a valve for introducing air or an inert gas (eg, nitrogen) into the piping, or for suctioning the piping (ie, exhausting the piping).

供給閥門67係設置於多通道閥68之下游之供給配管61之閥門。於藉由控制部90之控制而供給閥門67打開之狀態下,自多通道閥68供給之處理液供給至處理單元600A。The supply valve 67 is a valve of the supply pipe 61 provided downstream of the multi-channel valve 68 . The treatment liquid supplied from the multi-channel valve 68 is supplied to the treatment unit 600A in a state in which the supply valve 67 is opened under the control of the control unit 90 .

排液閥門69係設置於在供給配管61中之多通道閥68之下游且供給閥門67之上游分支之配管之閥門。排液閥門69係用於排出配管內之處理液之閥門。A drain valve 69 is a valve of the piping branched downstream of the multi-channel valve 68 in the supply piping 61 and upstream of the supply valve 67 . The drain valve 69 is a valve for draining the treatment liquid in the piping.

此處,處理液不限於貯存於藥液貯槽32、藥液貯槽42及藥液貯槽52之藥液,例如亦包含純水(DIW:Deionized Water:去離子水)等之沖洗液、或該等之混合液。Here, the treatment liquid is not limited to the chemical liquid stored in the chemical liquid storage tank 32 , the chemical liquid storage tank 42 , and the chemical liquid storage tank 52 , but also includes, for example, a rinsing liquid such as pure water (DIW: Deionized Water), or the like. of the mixture.

流體箱70具備供給閥門72A、供給閥門72B、供給閥門72C及供給閥門72D、連接配管74E、連接配管74F、連接配管74G、連接閥門76E、連接閥門76F、連接閥門76G、多通道閥78、開放閥門75、供給閥門77、及排液閥門79。The fluid tank 70 includes a supply valve 72A, a supply valve 72B, a supply valve 72C, a supply valve 72D, a connection pipe 74E, a connection pipe 74F, a connection pipe 74G, a connection valve 76E, a connection valve 76F, a connection valve 76G, a multi-channel valve 78, and an open Valve 75 , supply valve 77 , and drain valve 79 .

供給閥門72A、供給閥門72B、供給閥門72C及供給閥門72D係設置於自上游側連接之各個配管之閥門。The supply valve 72A, the supply valve 72B, the supply valve 72C, and the supply valve 72D are valves provided in the respective pipes connected from the upstream side.

連接配管74E係於供給閥門72A及供給閥門72B之下游,跨及設置有供給閥門72A之配管與設置有供給閥門72B之配管的配管。The connection piping 74E is downstream of the supply valve 72A and the supply valve 72B, and spans the piping provided with the supply valve 72A and the piping provided with the supply valve 72B.

連接配管74F係於供給閥門72B及供給閥門72C之下游,跨及設置有供給閥門72B之配管與設置有供給閥門72C之配管的配管。The connection piping 74F is downstream of the supply valve 72B and the supply valve 72C, and spans the piping provided with the supply valve 72B and the piping provided with the supply valve 72C.

連接配管74G係於供給閥門72C及供給閥門72D之下游,跨及設置有供給閥門72C之配管與設置有供給閥門72D之配管的配管。The connection piping 74G is downstream of the supply valve 72C and the supply valve 72D, and spans the piping provided with the supply valve 72C and the piping provided with the supply valve 72D.

連接閥門76E係設置於連接配管74E之閥門。連接閥門76F係設置於連接配管74F之閥門。連接閥門76G係設置於連接配管74G之閥門。The connection valve 76E is a valve provided in the connection pipe 74E. The connection valve 76F is a valve provided in the connection pipe 74F. The connection valve 76G is a valve provided in the connection pipe 74G.

多通道閥78係可連接於與供給閥門72A、供給閥門72B、供給閥門72C及供給閥門72D分別對應之複數個配管,且選擇該等複數個配管中之至少1個並流向下游之供給配管71之閥。The multi-channel valve 78 can be connected to a plurality of pipes corresponding to the supply valve 72A, the supply valve 72B, the supply valve 72C, and the supply valve 72D, respectively, and at least one of the plurality of pipes is selected and flows to the downstream supply pipe 71 valve.

開放閥門75係設置於配管之閥門,且該配管於設置有供給閥門之任一個配管中之連接閥門之下游且多通道閥78之上游分支。開放閥門75係用於對配管內導入空氣或惰性氣體(例如氮),或對於配管內進行抽吸之閥門。The opening valve 75 is a valve provided in the piping, and the piping is branched downstream of the connecting valve in any piping provided with the supply valve and upstream of the multi-channel valve 78 . The open valve 75 is a valve for introducing air or an inert gas (eg, nitrogen) into the piping, or for suctioning the piping.

供給閥門77係設置於多通道閥78之下游之供給配管71之閥門。於藉由控制部90之控制供給閥門77打開之狀態下,自多通道閥78供給之處理液供給至處理單元600B。The supply valve 77 is a valve of the supply pipe 71 provided downstream of the multi-channel valve 78 . The processing liquid supplied from the multi-channel valve 78 is supplied to the processing unit 600B in a state in which the supply valve 77 is opened by the control of the control unit 90 .

排液閥門79係設置於在供給配管71中之多通道閥78之下游且供給閥門77之上游分支之配管之閥門。排液閥門79係用於排出配管內之處理液之閥門。The drain valve 79 is a valve provided in the piping branched downstream of the multi-channel valve 78 in the supply piping 71 and upstream of the supply valve 77 . The drain valve 79 is a valve for draining the treatment liquid in the piping.

多通道閥68具備:連接部68A,其跨及自上游側連接之複數個配管(例如供給配管39、供給配管49、供給配管59及供給配管100)而連接;選擇閥門68B、選擇閥門68C、選擇閥門68D及選擇閥門68E,其等於連接部68A之上游側,設置於複數個配管各者;及選擇閥門68F,其於連接部68A之下游側,設置於與連接部68A連接之供給配管61。The multi-channel valve 68 includes a connection portion 68A that is connected across a plurality of pipes (for example, the supply pipe 39, the supply pipe 49, the supply pipe 59, and the supply pipe 100) connected from the upstream side; a selection valve 68B, a selection valve 68C, The selector valve 68D and the selector valve 68E, which are equal to the upstream side of the connection portion 68A, are provided in each of the plurality of pipes; and the selector valve 68F, which is provided on the downstream side of the connection portion 68A, is provided in the supply pipe 61 connected to the connection portion 68A. .

於多通道閥68中之選擇閥門68B、選擇閥門68C、選擇閥門68D及選擇閥門68E中之至少1個、及選擇閥門68F打開之狀態下,將自上游側供給之處理液經由多通道閥68供給至處理單元600A。In a state where at least one of the selection valve 68B, the selection valve 68C, the selection valve 68D, and the selection valve 68E, and the selection valve 68F of the multi-channel valve 68 are open, the processing liquid supplied from the upstream side is passed through the multi-channel valve 68 supplied to the processing unit 600A.

多通道閥78具備:連接部78A,其跨及自上游側連接之複數個配管而連接;選擇閥門78B、選擇閥門78C、選擇閥門78D及選擇閥門78E,其等於連接部78A之上游側,設置於複數個配管各者;及選擇閥門78F,其於連接部78A之下游側,設置於與連接部78A連接之供給配管71。The multi-channel valve 78 includes a connection portion 78A connected across a plurality of pipes connected from the upstream side, and a selection valve 78B, a selection valve 78C, a selection valve 78D, and a selection valve 78E, which are provided on the upstream side of the connection portion 78A. In each of the plurality of pipes; and the selector valve 78F is provided on the supply pipe 71 connected to the connection portion 78A on the downstream side of the connection portion 78A.

於多通道閥78中之選擇閥門78B、選擇閥門78C、選擇閥門78D及選擇閥門78E中之至少1個、及選擇閥門78F打開之狀態下,將自上游側供給之處理液經由多通道閥78供給至處理單元600B。此處,於多通道閥68以複數個選擇閥門(即選擇閥門68B、選擇閥門68C、選擇閥門68D及選擇閥門68E)沿鉛直方向排列之方式配置之情形時,期望對選擇閥門68E供給來自純水供給源之純水(DIW)。In a state where at least one of the selection valve 78B, the selection valve 78C, the selection valve 78D, and the selection valve 78E, and the selection valve 78F of the multi-channel valve 78 are open, the processing liquid supplied from the upstream side is passed through the multi-channel valve 78 supplied to the processing unit 600B. Here, in the case where the multi-channel valve 68 is arranged such that a plurality of selection valves (ie, selection valve 68B, selection valve 68C, selection valve 68D, and selection valve 68E) are arranged in the vertical direction, it is desirable to supply the selection valve 68E with pure The pure water (DIW) of the water supply source.

控制部90藉由控制各個箱櫃中之閥門之開關及泵之輸出,而向流體箱供給處理液。且,控制部90藉由控制流體箱中之各個閥門之開關及設置於多通道閥68之各個閥門之開關,而調整供給至多通道閥68之各種處理液之流量,並使處理液供給至對應之處理單元600供給。The control unit 90 supplies the treatment liquid to the fluid tank by controlling the opening and closing of the valves in each cabinet and the output of the pump. In addition, the control unit 90 adjusts the flow rates of various treatment liquids supplied to the multi-channel valve 68 by controlling the switches of each valve in the fluid tank and the switches of each valve provided in the multi-channel valve 68, and supplies the treatment liquid to the corresponding The processing unit 600 supplies.

<關於處理單元> 圖4係顯示處理單元600之構成例之圖。如圖4所例示,處理單元600具備:旋轉卡盤10,其以大致水平姿勢保持1塊基板W,且使基板W繞通過基板W之中央部之鉛直之旋轉軸線Z1旋轉;處理液噴嘴20,其對基板W噴出處理液;噴嘴臂22,其將處理液噴嘴20安裝於端部;及筒狀之處理杯12,其繞基板W之旋轉軸線Z包圍旋轉卡盤10。 <About the processing unit> FIG. 4 is a diagram showing a configuration example of the processing unit 600 . As shown in FIG. 4 , the processing unit 600 includes: a spin chuck 10 that holds one substrate W in a substantially horizontal posture and rotates the substrate W around a vertical rotation axis Z1 passing through the center of the substrate W; a processing liquid nozzle 20 , which sprays the processing liquid to the substrate W; the nozzle arm 22 , which installs the processing liquid nozzle 20 at the end;

於假設複數種處理液之情形時,可與各種處理液對應地設置複數個處理液噴嘴20。處理液噴嘴20對基板W之上表面噴出處理液。In the case of assuming a plurality of processing liquids, a plurality of processing liquid nozzles 20 may be provided corresponding to various processing liquids. The processing liquid nozzle 20 discharges the processing liquid to the upper surface of the substrate W. As shown in FIG.

旋轉卡盤10具備:圓板狀之旋轉基台10A,其真空吸附大致水平姿勢之基板W之下表面;旋轉軸10C,其自旋轉基台10A之中央部向下方延伸;及旋轉馬達10D,其藉由使旋轉軸10C旋轉,而使吸附於旋轉基底10A之基板W旋轉。另,亦可取代旋轉卡盤10,使用夾持式之卡盤,該夾持式之卡盤具備自旋轉基台之上表面外周部向上方突出之複數根卡盤銷,藉由該等卡盤銷夾持基板W之周緣部。The spin chuck 10 includes: a disk-shaped rotating base 10A for vacuum suctioning the lower surface of the substrate W in a substantially horizontal posture; a rotating shaft 10C extending downward from the center of the rotating base 10A; and a rotating motor 10D, By rotating the rotating shaft 10C, the substrate W attached to the rotating base 10A is rotated. In addition, instead of the spin chuck 10, a clamp-type chuck can be used. The clamp-type chuck is provided with a plurality of chuck pins protruding upward from the outer peripheral portion of the upper surface of the rotary base. The disk pin clamps the peripheral portion of the substrate W. As shown in FIG.

噴嘴臂22具備臂部22A、軸體22B、及致動器22C。致動器22C調整軸體22B之繞軸之角度。臂部22A之一端部固定於軸體22B,臂部22A之另一端部與軸體22B之軸分離而配置。又,於臂部22A之另一端部,安裝有處理液噴嘴20。藉此,處理液噴嘴20構成為可沿基板W之半徑方向搖動。另,搖動之處理液噴嘴20之移動方向只要具有基板W之半徑方向之成分即可,無需與基板W之半徑方向嚴密平行。此處,噴嘴臂22亦可藉由未圖示之馬達等,能沿鉛直方向升降。於此情形時,可藉由噴嘴臂22之升降而調整安裝於噴嘴臂22之端部之處理液噴嘴20與基板W之上表面之間之距離。The nozzle arm 22 includes an arm portion 22A, a shaft body 22B, and an actuator 22C. The actuator 22C adjusts the angle around the axis of the shaft body 22B. One end of the arm portion 22A is fixed to the shaft body 22B, and the other end portion of the arm portion 22A is disposed apart from the shaft of the shaft body 22B. Moreover, the processing liquid nozzle 20 is attached to the other end part of 22 A of arm parts. Thereby, the process liquid nozzle 20 is comprised so that it can rock|fluctuate in the radial direction of the board|substrate W. In addition, the moving direction of the oscillating processing liquid nozzle 20 only needs to have a component in the radial direction of the substrate W, and does not need to be strictly parallel to the radial direction of the substrate W. As shown in FIG. Here, the nozzle arm 22 can also be raised and lowered in the vertical direction by a motor or the like not shown. In this case, the distance between the processing liquid nozzle 20 mounted on the end of the nozzle arm 22 and the upper surface of the substrate W can be adjusted by raising and lowering the nozzle arm 22 .

控制部90控制旋轉馬達10D之轉速,且自處理液噴嘴20向基板W之上表面噴出處理液。又,控制部90藉由控制致動器22C之驅動,而使處理液噴嘴20於基板W之上表面搖動。The control unit 90 controls the rotational speed of the rotary motor 10D, and discharges the processing liquid from the processing liquid nozzle 20 to the upper surface of the substrate W. As shown in FIG. In addition, the control unit 90 swings the processing liquid nozzle 20 on the upper surface of the substrate W by controlling the driving of the actuator 22C.

<關於基板處理裝置之動作> 接著,參照圖1至圖4,且說明關於本實施形態之基板處理裝置1之動作。 <About the operation of the substrate processing apparatus> Next, the operation of the substrate processing apparatus 1 according to the present embodiment will be described with reference to FIGS. 1 to 4 .

傳載機械手602自裝載埠601之載體C對基板載置部604搬送基板W。中心機械手603自基板載置部604對1個處理單元600搬送基板W。處理單元600處理基板W。中心機械手603自處理單元600對基板載置部604搬送基板W。傳載機械手602自基板載置部604對裝載埠601之載體C搬送基板W。The transfer robot 602 transfers the substrate W from the carrier C of the loading port 601 to the substrate placing portion 604 . The central robot 603 transfers the substrate W to one processing unit 600 from the substrate placement unit 604 . The processing unit 600 processes the substrate W. The central robot 603 transfers the substrate W from the processing unit 600 to the substrate placement portion 604 . The transfer robot 602 transfers the substrate W to the carrier C of the loading port 601 from the substrate placing portion 604 .

上述基板W之處理於將基板處理裝置1設定為基板處理模式之狀態下進行。於基板處理模式下,首先藉由控制部90之控制,自箱櫃30、箱櫃40、箱櫃50及未圖示之處理液(包含純水)之供給源之至少1者供給可用於處理基板W之處理液。The above-mentioned processing of the substrate W is performed in a state where the substrate processing apparatus 1 is set to the substrate processing mode. In the substrate processing mode, firstly, under the control of the control unit 90, at least one of the cabinet 30, the cabinet 40, the cabinet 50 and the supply source of the processing liquid (including pure water) not shown is supplied for processing. The processing liquid for the substrate W.

接著,藉由控制部90之控制,於與進行基板W之處理之處理單元600(此處設為處理單元600A)對應之流體箱(此處設為流體箱60)中,打開設置於供給之處理液流經之至少1根配管之閥門(即供給閥門62A、供給閥門62B、供給閥門62C及供給閥門62D中之至少1個),將處理液供給至多通道閥68。Next, under the control of the control unit 90, in the fluid tank (here, the fluid tank 60) corresponding to the processing unit 600 (here, the processing unit 600A) that processes the substrate W, the fluid tank (here, the fluid tank 60) is opened and provided in the supply. The valve of at least one pipe (ie, at least one of the supply valve 62A, the supply valve 62B, the supply valve 62C, and the supply valve 62D) through which the treatment liquid flows, supplies the treatment liquid to the multi-channel valve 68 .

此時,設置於連接配管64E之連接閥門66E、設置於連接配管64F之連接閥門66F、設置於連接配管64G之連接閥門66G、及開放閥門65分別關閉。但,根據需要,開放閥門65對配管內導入空氣或惰性氣體。At this time, the connection valve 66E provided in the connection piping 64E, the connection valve 66F provided in the connection piping 64F, the connection valve 66G provided in the connection piping 64G, and the opening valve 65 are closed, respectively. However, as necessary, the valve 65 is opened to introduce air or an inert gas into the piping.

接著,藉由控制部90之控制,調整選擇閥門68B、選擇閥門68C、選擇閥門68D、選擇閥門68E及選擇閥門68F中之至少1者之開關,經由連接部68A,將處理液供給至多通道閥68之下游側。Next, under the control of the control unit 90, the switches of at least one of the selection valve 68B, the selection valve 68C, the selection valve 68D, the selection valve 68E, and the selection valve 68F are adjusted, and the processing liquid is supplied to the multi-channel valve through the connection part 68A. Downstream side of 68.

接著,藉由控制部90之控制,打開供給閥門67,將處理液供給至對應之處理單元600A。其中,排液閥門69為了調整可用於處理基板W之處理液,根據需要,排出配管內之處理液。Next, under the control of the control unit 90, the supply valve 67 is opened to supply the treatment liquid to the corresponding treatment unit 600A. Among them, the liquid drain valve 69 discharges the processing liquid in the piping as necessary in order to adjust the processing liquid that can be used for processing the substrate W.

另一方面,基板處理裝置1可切換為用於洗淨包含多通道閥68之配管構造等之模式即洗淨模式。如以下所示,該切換主要藉由配管構造之閥門之開關而進行。On the other hand, the substrate processing apparatus 1 can be switched to the cleaning mode, which is a mode for cleaning the piping structure including the multi-channel valve 68 and the like. As shown below, this switching is mainly performed by opening and closing the valve of the piping structure.

於洗淨模式下,首先藉由控制部90之控制,自箱櫃30、箱櫃40、箱櫃50及未圖示之處理液(包含純水)之供給源之至少1者供給可用於洗淨包含多通道閥68之配管構造之處理液。In the washing mode, at least one of the supply sources of the tank 30, the tank 40, the tank 50 and the supply source of the treatment liquid (including pure water) not shown is firstly supplied by the control unit 90 and can be used for washing. The processing liquid containing the piping structure of the multi-channel valve 68 is clean.

接著,藉由控制部90之控制,於成為洗淨之對象之流體箱(此處設為流體箱60)中,打開設置於供給之處理液流經之至少1個配管之閥門(即供給閥門62A、供給閥門62B、供給閥門62C及供給閥門62D中之至少1個),將處理液供給至多通道閥68。Next, under the control of the control unit 90, in the fluid tank to be cleaned (here, the fluid tank 60), the valve (ie, the supply valve) provided in at least one pipe through which the supplied treatment liquid flows is opened. 62A, at least one of the supply valve 62B, the supply valve 62C, and the supply valve 62D) to supply the treatment liquid to the multi-channel valve 68 .

此時,設置於連接配管64E之連接閥門66E、設置於連接配管64F之連接閥門66F及設置於連接配管64G之連接閥門66G分別打開。因此,供給至流體箱60之處理液可同時供給至多通道閥68之選擇閥門68B、選擇閥門68C、選擇閥門68D及選擇閥門68E。At this time, the connection valve 66E provided in the connection piping 64E, the connection valve 66F provided in the connection piping 64F, and the connection valve 66G provided in the connection piping 64G are each opened. Therefore, the treatment liquid supplied to the fluid tank 60 can be simultaneously supplied to the selection valve 68B, the selection valve 68C, the selection valve 68D, and the selection valve 68E of the multi-channel valve 68 .

另,亦可藉由關閉連接閥門66E、連接閥門66F及連接配管64G中之至少1個,而僅洗淨多通道閥68之選擇閥門68B、選擇閥門68C、選擇閥門68D及選擇閥門68E中之一部分。In addition, by closing at least one of the connection valve 66E, the connection valve 66F, and the connection pipe 64G, only the selection valve 68B, the selection valve 68C, the selection valve 68D, and the selection valve 68E of the multi-channel valve 68 may be cleaned. part.

又,藉由控制部90之控制,調整選擇閥門68B、選擇閥門68C、選擇閥門68D、選擇閥門68E及選擇閥門68F中之至少1個之開關,經由連接部68A將處理液供給至多通道閥68之下游側。In addition, under the control of the control unit 90, the switches of at least one of the selector valve 68B, selector valve 68C, selector valve 68D, selector valve 68E, and selector valve 68F are adjusted, and the treatment liquid is supplied to the multi-channel valve 68 via the connection unit 68A. downstream side.

此處,若於位於連接部68A之上游側之選擇閥門68B、選擇閥門68C、選擇閥門68D及選擇閥門68E中之至少1個,因(例如隔開2秒重複之)開關動作而產生急劇之流速變化,則有產生因管內之壓力變動而使配管振動之水錘之情形。又,有產生因管內之壓力變動而發泡之空化之情形。Here, if at least one of the selection valve 68B, the selection valve 68C, the selection valve 68D, and the selection valve 68E located on the upstream side of the connection portion 68A, a sharp switch occurs due to the switching action (for example, repeated every 2 seconds). Changes in flow velocity may cause water hammer to vibrate the piping due to pressure fluctuations in the piping. In addition, there are cases in which cavitation due to foaming occurs due to pressure fluctuations in the pipe.

該等現象係可於洗淨模式下對洗淨對象帶來物理衝擊者,可提高洗淨效果。These phenomena can bring physical impact to the cleaning object in the cleaning mode, which can improve the cleaning effect.

又,藉由控制部90之控制,關閉供給閥門67,且打開排液閥門69,排出洗淨多通道閥68所使用之處理液。In addition, under the control of the control unit 90 , the supply valve 67 is closed, and the drain valve 69 is opened, and the treatment liquid used for the cleaning of the multi-channel valve 68 is drained.

另,亦可使流經排液閥門69之處理液循環至貯存同種處理液之藥液貯槽或未圖示之供給源。於該情形時,可減少洗淨模式下使用之處理液之量。In addition, the treatment liquid flowing through the drain valve 69 can also be circulated to a chemical liquid storage tank for storing the same kind of treatment liquid or a supply source not shown. In this case, the amount of the treatment liquid used in the cleaning mode can be reduced.

又,可使用如下方法:首先使用藥液進行上述般之洗淨模式之洗淨,進而將使用之處理液變更為純水(DIW)進行洗淨,最後使用開放閥門65於包含多通道閥68之配管內進行抽吸。再者,亦可重複複數次於供給藥液後供給沖洗液(純水),進而對於配管內進行抽吸之循環。In addition, the following method can be used: first, the cleaning in the above-mentioned cleaning mode is performed using a chemical solution, and then the used treatment solution is changed to pure water (DIW) for cleaning, and finally, the opening valve 65 is used to include the multi-channel valve 68. Suction inside the piping. Furthermore, after supplying the chemical solution, a cycle of supplying the flushing solution (pure water) and then pumping the inside of the piping may be repeated several times.

根據此種方法,由藥液及純水,沖洗殘存於配管內之洗淨對象之物質,進而抽吸可能包含洗淨對象之物質之藥液及純水,藉此可提高洗淨效果。另,根據發明者們之實驗,可知,於藉由藥液及純水進行洗淨之後進行抽吸之情形時,較不進行抽吸而長時間(例如24小時)進行藥液及純水之洗淨之情形,更短時間(例如2小時至6小時)內進行使用藥液及純水之洗淨,且每次洗淨後進行抽吸之洗淨效果更佳。According to this method, the substance to be cleaned remaining in the piping is rinsed with the chemical solution and pure water, and the chemical solution and pure water that may contain the substance to be cleaned are sucked, thereby improving the cleaning effect. In addition, according to the experiments of the inventors, it was found that in the case where suction is performed after washing with the chemical solution and pure water, the chemical solution and the pure water are performed for a long time (for example, 24 hours) without suction. In the case of cleaning, cleaning with chemical solution and pure water is performed in a shorter time (eg, 2 hours to 6 hours), and the cleaning effect of suction after each cleaning is better.

如以上,基板處理裝置1於洗淨模式下,可洗淨包含多通道閥68之配管構造。藉此,可去除殘存於配管內之洗淨對象之物質,於基板處理模式下,維持處理液之雜質較少之狀態,且進行基板處理。As described above, the substrate processing apparatus 1 can clean the piping structure including the multi-channel valve 68 in the cleaning mode. Thereby, the substances remaining in the piping to be cleaned can be removed, and in the substrate processing mode, the substrate processing can be performed while maintaining a state with less impurities in the processing liquid.

此處,將洗淨模式中形成之被供給處理液之路徑稱為洗淨路徑。於上述情形時,洗淨路徑相當於自任一藥液貯槽經由供給配管到達流體箱內之多通道閥,進而到達設置有位於多通道閥之下游之排液閥門69(或排液閥門79)之配管為止之路徑。藉由關閉供給閥門67,而形成自藥液貯槽到達多通道閥之洗淨路徑,作為不包含處理液噴嘴20之路徑。Here, the path formed in the cleaning mode to which the processing liquid is supplied is referred to as a cleaning path. In the above case, the cleaning path corresponds to the multi-channel valve in the fluid tank from any chemical liquid storage tank through the supply piping, and then to the place where the drain valve 69 (or the drain valve 79) located downstream of the multi-channel valve is arranged. The path to the end of the piping. By closing the supply valve 67 , a cleaning path from the chemical liquid storage tank to the multi-channel valve is formed as a path not including the processing liquid nozzle 20 .

又,貯存於洗淨模式下可用於洗淨配管構造之處理液之藥液貯槽可兼用為貯存可用於基板處理之處理液之藥液貯槽。因此,無需另外設置貯存可用於洗淨配管構造之處理液之藥液貯槽。又,若具備複數個藥液貯槽,則可根據成為洗淨對象之物質分開使用複數種藥液進行洗淨。In addition, the chemical liquid storage tank for storing the processing liquid that can be used for cleaning the piping structure in the cleaning mode can also be used as the chemical liquid storage tank for storing the processing liquid that can be used for substrate processing. Therefore, there is no need to provide a separate chemical liquid storage tank for storing the processing liquid that can be used for cleaning the piping structure. Furthermore, if a plurality of chemical liquid storage tanks are provided, a plurality of chemical liquids can be used for cleaning separately according to the substances to be cleaned.

又,亦可同時洗淨複數個流體箱中之多通道閥68。藉此,可縮短洗淨時間。又,藉由將各不相同之藥液供給至流體箱,而可有效地進行藥液對洗淨對象之效果之比較等。Also, the multi-channel valves 68 in a plurality of fluid tanks may be cleaned at the same time. Thereby, the cleaning time can be shortened. In addition, by supplying different chemical liquids to the fluid tank, it is possible to effectively compare the effects of chemical liquids on objects to be cleaned, and the like.

又,若僅限定於一部分流體箱,則於其他流體箱中以基板處理模式進行基板處理,故作為基板處理裝置1整體,可不中斷基板處理而進行洗淨。In addition, if it is limited to only a part of the fluid tanks, the substrate processing is performed in the substrate processing mode in the other fluid tanks, so that the substrate processing apparatus 1 as a whole can perform cleaning without interrupting the substrate processing.

又,亦可藉由箱櫃中之泵之輸出調整、閥門之開關調整、選擇閥門之開關調整等使洗淨模式之藥液之供給壓變動。In addition, the supply pressure of the chemical solution in the cleaning mode can also be changed by adjusting the output of the pump in the cabinet, adjusting the opening and closing of the valve, and adjusting the opening and closing of the selection valve.

另,於洗淨模式下,可以處理液噴嘴20自基板W之上方退避之方式,藉由致動器22C之驅動使處理液噴嘴20移動,但處理液噴嘴20亦可仍位於基板W之上方。於洗淨模式下,因關閉供給閥門67,故於洗淨模式下使用之處理液不會到達處理單元600。因此,即使處理液噴嘴20仍位於基板W之上方,亦不會因處理液而污染基板W。In addition, in the cleaning mode, the processing liquid nozzle 20 may be moved by the drive of the actuator 22C in such a manner that the processing liquid nozzle 20 is retracted from above the substrate W, but the processing liquid nozzle 20 may still be located above the substrate W. . In the cleaning mode, since the supply valve 67 is closed, the processing liquid used in the cleaning mode does not reach the processing unit 600 . Therefore, even if the processing liquid nozzle 20 is still positioned above the substrate W, the substrate W will not be contaminated by the processing liquid.

<關於基板處理裝置之構成之變化例> 圖5係顯示本實施形態相關之基板處理裝置1A之構成中經由配管連接於各個處理單元600之構造之變化例的圖。 <About the modification of the structure of the substrate processing apparatus> FIG. 5 is a diagram showing a modification of the structure of the substrate processing apparatus 1A according to the present embodiment, which is connected to each processing unit 600 via piping.

於圖5中與圖3之情形不同,於流體箱160內未設置供給閥門62D以外之供給閥門、連接配管、及連接閥門。同樣地,於流體箱170內,未設置供給閥門72D以外之供給閥門、及連接閥門。另,供給閥門62D及供給閥門72D亦可設置於較對應之流體箱更上游側。In FIG. 5 , unlike the case of FIG. 3 , supply valves other than the supply valve 62D, connection pipes, and connection valves are not provided in the fluid tank 160 . Similarly, in the fluid tank 170, supply valves other than the supply valve 72D and connection valves are not provided. In addition, the supply valve 62D and the supply valve 72D may be provided on the upstream side of the corresponding fluid tank.

取而代之,於各個箱櫃之下游、且流體箱之上游,設置有對應之配管及閥門。Instead, corresponding piping and valves are provided downstream of each tank and upstream of the fluid tank.

即,於箱櫃之下游、且流體箱之上游之供給配管39中,設置供給閥門162A,於箱櫃之下游、且流體箱之上游之供給配管49中,設置供給閥門162B,於箱櫃之下游、且流體箱之上游之供給配管59中,設置供給閥門162C。That is, a supply valve 162A is provided in the supply piping 39 downstream of the tank and upstream of the fluid tank, and a supply valve 162B is provided in the supply piping 49 downstream of the tank and upstream of the fluid tank. A supply valve 162C is provided in the supply piping 59 downstream and upstream of the fluid tank.

又,連接配管164E於供給閥門162A及供給閥門162B之下游,跨及設置有供給閥門162A之配管與設置有供給閥門162B之配管而設置。In addition, the connection piping 164E is provided downstream of the supply valve 162A and the supply valve 162B, and is provided across the piping provided with the supply valve 162A and the piping provided with the supply valve 162B.

又,連接配管164F於供給閥門162B及供給閥門162C之下游,跨及設置有供給閥門162B之配管與設置有供給閥門162C之配管而設置。Moreover, the connection piping 164F is provided downstream of the supply valve 162B and the supply valve 162C, and is provided astride the piping provided with the supply valve 162B, and the piping provided with the supply valve 162C.

又,連接配管164G於供給閥門162C之下游,跨及設置有供給閥門162C之配管與供給配管100而設置。Moreover, the connection piping 164G is provided downstream of the supply valve 162C, and is provided astride the piping provided with the supply valve 162C and the supply piping 100 .

又,連接閥門166E設置於連接配管164E。又,連接閥門164F設置於連接配管164F。連接閥門166G設置於連接配管164G。Moreover, the connection valve 166E is provided in the connection piping 164E. Moreover, the connection valve 164F is provided in the connection piping 164F. The connection valve 166G is provided in the connection piping 164G.

於此種構成中,與圖3之情形同樣,切換基板處理模式與洗淨模式,且進行處理。In this configuration, as in the case of FIG. 3 , the substrate processing mode and the cleaning mode are switched, and processing is performed.

具體而言,於基板處理模式下,藉由控制部90之控制,打開與貯存可用於處理基板W之處理液之箱櫃(此處設為箱櫃30)對應之閥門(即供給閥門162A),並將處理液供給至流體箱160。Specifically, in the substrate processing mode, under the control of the control unit 90, the valve (ie, the supply valve 162A) corresponding to the tank (here, the tank 30) that stores the processing liquid that can be used to process the substrate W is opened. , and supply the treatment liquid to the fluid tank 160 .

此時,分別關閉連接閥門166E、連接閥門166F及連接閥門166G。At this time, the connection valve 166E, the connection valve 166F and the connection valve 166G are respectively closed.

接著,藉由控制部90之控制,打開供給閥門67,將處理液供給至對應之處理單元600A。Next, under the control of the control unit 90, the supply valve 67 is opened to supply the treatment liquid to the corresponding treatment unit 600A.

另一方面,於洗淨模式下,藉由控制部90之控制,打開與貯存可用於洗淨包含多通道閥68之配管構造之處理液之箱櫃(此處設為箱櫃30)對應之閥門(即供給閥門162A),將處理液供給至流體箱160。On the other hand, in the cleaning mode, under the control of the control unit 90 , the tank corresponding to the tank (here, the tank 30 ) that stores the processing liquid that can be used to clean the piping structure including the multi-channel valve 68 is opened. The valve (ie, the supply valve 162A) supplies the treatment liquid to the fluid tank 160 .

此時,分別打開連接閥門166E、連接閥門166F及連接閥門166G。因此,供給至流體箱160之處理液可同時供給至多通道閥68之選擇閥門68B、選擇閥門68C、選擇閥門68D及選擇閥門68E。At this time, the connection valve 166E, the connection valve 166F, and the connection valve 166G are opened, respectively. Therefore, the treatment liquid supplied to the fluid tank 160 can be simultaneously supplied to the selection valve 68B, the selection valve 68C, the selection valve 68D, and the selection valve 68E of the multi-channel valve 68 .

接著,藉由控制部90之控制,關閉供給閥門67,且打開排液閥門69,排出可用於洗淨多通道閥68之處理液。Next, under the control of the control unit 90 , the supply valve 67 is closed, and the drain valve 69 is opened, and the treatment liquid that can be used for cleaning the multi-channel valve 68 is drained.

如以上,基板處理裝置1A於洗淨模式下,可洗淨包含多通道閥68之配管構造。As described above, the substrate processing apparatus 1A can clean the piping structure including the multi-channel valve 68 in the cleaning mode.

又,除藉由圖3所示之基板處理裝置發揮之效果以外,藉由將連接配管及連接閥門設置於較各個流體箱更上游側,與於各個流體箱內設置該等構成之情形相比,可將構成簡化。Furthermore, in addition to the effects exhibited by the substrate processing apparatus shown in FIG. 3 , by arranging the connection piping and the connection valve on the upstream side of each fluid tank, compared with the case where these structures are provided in each fluid tank , the structure can be simplified.

圖6係顯示本實施形態相關之基板處理裝置1B之構成中經由配管連接於各個處理單元600之構造之另一變化例的圖。另,於圖6中,對於與圖3所示之構成同樣之構成,省略一部分圖示。FIG. 6 is a diagram showing another modification of the structure of the substrate processing apparatus 1B according to the present embodiment, which is connected to each processing unit 600 via piping. In addition, in FIG. 6, about the structure similar to the structure shown in FIG. 3, a part of illustration is abbreviate|omitted.

於圖6中與圖3之情形不同,於設置有流體箱260中之任一供給閥門(即,供給閥門62A、供給閥門62B、供給閥門62C及供給閥門62D中之任一者)之配管之下游,連接有用於供給為洗淨配管構造而使用之藥液的供給配管239。同樣地,於設置有流體箱270中之任一供給閥門(即,供給閥門72A、供給閥門72B、供給閥門72C及供給閥門72D中之任一者)之配管之下游,連接有用於供給為洗淨配管構造而使用之藥液的供給配管239。另,供給配管239亦可為於較各個流體箱更靠上游之位置連接之配管。6 is different from the case of FIG. 3 , in the piping provided with any one of the supply valves in the fluid tank 260 (ie, any one of the supply valve 62A, the supply valve 62B, the supply valve 62C, and the supply valve 62D) Downstream, a supply piping 239 for supplying a chemical solution used for cleaning the piping structure is connected. Likewise, downstream of the piping provided with any one of the supply valves in the fluid tank 270 (ie, any one of the supply valve 72A, the supply valve 72B, the supply valve 72C, and the supply valve 72D), there is connected a pipe for supplying the washing machine The supply piping 239 of the chemical solution used in the clean piping structure. In addition, the supply piping 239 may be a piping connected upstream of each fluid tank.

且,供給配管239於上游側連接於洗淨櫃230。洗淨櫃230具備藥液貯槽232、閥門234、泵236、及過濾器238。於藥液貯槽232,貯存有可用於洗淨包含多通道閥之配管構造之藥液。閥門234、泵236及過濾器238分別設置於連接於藥液貯槽232之配管即供給配管239。In addition, the supply piping 239 is connected to the washing tank 230 on the upstream side. The cleaning cabinet 230 includes a chemical liquid storage tank 232 , a valve 234 , a pump 236 , and a filter 238 . In the chemical liquid storage tank 232, a chemical liquid that can be used for cleaning the piping structure including the multi-channel valve is stored. The valve 234 , the pump 236 and the filter 238 are respectively provided in the supply piping 239 , which is a piping connected to the chemical solution storage tank 232 .

貯存於藥液貯槽232之藥液於藉由控制部90之控制而調整開關之閥門234打開之狀態下,藉由同樣由控制部90之控制而動作之泵236通過過濾器238且流到供給配管239內,流向下游之流體箱260。進而,藉由打開流體箱260中之供給閥門240(或流體箱270中之供給閥門241),而對多通道閥68(或多通道閥78)供給藥液。The chemical liquid stored in the chemical liquid storage tank 232 passes through the filter 238 and flows to the supply by the pump 236 which is also operated by the control of the control section 90 in a state in which the valve 234 of the adjustment switch is opened by the control of the control section 90. The inside of the piping 239 flows to the downstream fluid tank 260 . Furthermore, by opening the supply valve 240 in the fluid tank 260 (or the supply valve 241 in the fluid tank 270 ), the multi-channel valve 68 (or the multi-channel valve 78 ) is supplied with the chemical solution.

另,於流體箱260,設置自設置有排液閥門69之配管進而分支之配管即循環配管264。於循環配管264設置有循環閥門262,由控制部90之控制來控制排液閥門69及循環閥門262之開關動作,藉此可選擇將可用於洗淨之藥液排液還是使之循環。In addition, in the fluid tank 260, a circulation pipe 264, which is a pipe branched from the pipe provided with the drain valve 69, is provided. A circulation valve 262 is provided in the circulation piping 264, and the opening and closing operations of the drain valve 69 and the circulation valve 262 are controlled by the control of the control unit 90, whereby it is possible to select whether to drain or circulate the chemical solution that can be used for cleaning.

同樣地,於流體箱270,設置自設置有排液閥門79之配管進而分支之配管即循環配管274。於循環配管274設置有循環閥門272,由控制部90之控制來控制排液閥門79及循環閥門272之開關動作,藉此可選擇將可用於洗淨之藥液排液還是使之循環。Similarly, the fluid tank 270 is provided with a circulation pipe 274 which is a branched pipe from the pipe provided with the drain valve 79 . A circulation valve 272 is provided in the circulation piping 274, and the opening and closing operations of the drain valve 79 and the circulation valve 272 are controlled by the control of the control unit 90, whereby it is possible to select whether to drain or circulate the chemical solution that can be used for cleaning.

如以上,基板處理裝置1B於洗淨模式下,可洗淨包含多通道閥68之配管構造。As described above, the substrate processing apparatus 1B can clean the piping structure including the multi-channel valve 68 in the cleaning mode.

又,除藉由圖3所示之基板處理裝置發揮之效果以外,藉由具備貯存可用於洗淨包含多通道閥之配管構造之藥液之專用藥液貯槽232,亦可使洗淨所使用之藥液之種類及濃度等不依存於基板處理。因此,供給之藥液之自由度提高。Furthermore, in addition to the effect exhibited by the substrate processing apparatus shown in FIG. 3 , by providing a dedicated chemical solution storage tank 232 for storing a chemical solution that can be used for cleaning the piping structure including the multi-channel valve, it is also possible to use a chemical solution for cleaning. The type and concentration of the chemical solution do not depend on the substrate processing. Therefore, the degree of freedom of the medicinal solution to be supplied is improved.

此處,於上述洗淨模式下,亦可自流體箱內拆除洗淨對象即多通道閥,而於其他部位予以洗淨。Here, in the above-mentioned cleaning mode, the multi-channel valve, which is the object to be cleaned, may be removed from the fluid tank, and other parts may be cleaned.

圖7係顯示以收納於洗淨模式下拆除之多通道閥68之方式構成之箱櫃330之構成例的圖。FIG. 7 is a diagram showing a configuration example of the cabinet 330 configured to accommodate the multi-channel valve 68 removed in the washing mode.

如圖7所例示,箱櫃330具備藥液貯槽332、閥門331、閥門333、閥門334、閥門335、泵336、開放閥門337、過濾器338、供給配管339、循環配管402、供給配管404、供給配管406、供給配管408、供給配管410、供給配管414、及連接配管412。As shown in FIG. 7 , the tank 330 includes a chemical liquid storage tank 332, a valve 331, a valve 333, a valve 334, a valve 335, a pump 336, an opening valve 337, a filter 338, a supply piping 339, a circulation piping 402, a supply piping 404, Supply piping 406 , supply piping 408 , supply piping 410 , supply piping 414 , and connecting piping 412 .

於藥液貯槽332,貯存有可用於處理基板W之藥液、可用於洗淨多通道閥68之藥液、或可用於洗淨多通道閥68之純水。藉由打開閥門331而自藥液供給源供給藥液,藉由打開閥門333而自純水供給源供給純水。The chemical solution storage tank 332 stores a chemical solution that can be used to process the substrate W, a chemical solution that can be used to clean the multi-channel valve 68 , or pure water that can be used to clean the multi-channel valve 68 . The chemical solution is supplied from the chemical solution supply source by opening the valve 331 , and pure water is supplied from the pure water supply source by opening the valve 333 .

閥門335、開放閥門337、泵336及過濾器338分別設置於自藥液貯槽332連接於多通道閥68之供給配管414。又,閥門334於閥門335之上游設置於自供給配管414分支之循環配管402。循環配管402使流經供給配管414之藥液循環至藥液貯槽332。The valve 335 , the opening valve 337 , the pump 336 and the filter 338 are respectively provided in the supply piping 414 connected from the chemical liquid storage tank 332 to the multi-channel valve 68 . Moreover, the valve 334 is provided in the circulation piping 402 branched from the supply piping 414 upstream of the valve 335. The circulation piping 402 circulates the chemical liquid flowing through the supply piping 414 to the chemical liquid storage tank 332 .

於搭載之多通道閥68之上游側,連接自供給配管414分別分支之供給配管404、供給配管406、供給配管408及供給配管410,又,跨及供給配管404、供給配管406、供給配管408及供給配管410設置連接配管412。The supply piping 404, the supply piping 406, the supply piping 408, and the supply piping 410 branched from the supply piping 414 are connected to the upstream side of the mounted multi-channel valve 68, and the supply piping 404, the supply piping 406, and the supply piping 408 are connected across the And the supply piping 410 is provided with the connecting piping 412 .

又,於搭載之多通道閥68之下游側,連接有將已用於洗淨多通道閥68之處理液排液、或使之循環之配管340。Moreover, the piping 340 which drains or circulates the process liquid used for washing|cleaning the multi-channel valve 68 is connected to the downstream side of the multi-channel valve 68 mounted.

於基板處理模式下,於關閉閥門335且打開閥門334之狀態下,將用於處理基板W之藥液自藥液貯槽332經由供給配管414、循環配管402及供給配管339,供給至下游之流體箱。此時,多通道閥68搭載於下游之流體箱內。In the substrate processing mode, when the valve 335 is closed and the valve 334 is opened, the chemical solution for processing the substrate W is supplied from the chemical solution storage tank 332 to the downstream fluid through the supply piping 414 , the circulation piping 402 and the supply piping 339 . box. At this time, the multi-channel valve 68 is mounted in the downstream fluid tank.

另一方面,於洗淨模式下,於關閉閥門334且打開閥門335之狀態下,將用於洗淨多通道閥68之藥液自藥液貯槽332經由供給配管414、連接配管412、供給配管404、供給配管406、供給配管408及供給配管410供給至多通道閥68。之後,自連接於多通道閥68之下游之配管340將藥液排液或回收。On the other hand, in the cleaning mode, in the state where the valve 334 is closed and the valve 335 is opened, the chemical solution for cleaning the multi-channel valve 68 is sent from the chemical solution storage tank 332 through the supply piping 414, the connecting piping 412, and the supply piping. 404 , the supply piping 406 , the supply piping 408 , and the supply piping 410 are supplied to the multi-channel valve 68 . After that, the chemical liquid is drained or recovered from the piping 340 connected downstream of the multi-channel valve 68 .

再者,於洗淨模式下,也可於關閉閥門334且打開閥門335之狀態下,將用於洗淨多通道閥68之純水自藥液貯槽332經由供給配管414、連接配管412、供給配管404、供給配管406、供給配管408及供給配管410供給至多通道閥68。再者,之後,亦可使用開放閥門337於包含多通道閥68之配管內進行抽吸。Furthermore, in the cleaning mode, the pure water for cleaning the multi-channel valve 68 may be supplied from the chemical solution storage tank 332 through the supply piping 414, the connecting piping 412, and the The piping 404 , the supply piping 406 , the supply piping 408 , and the supply piping 410 are supplied to the multi-channel valve 68 . In addition, after that, it is also possible to use the open valve 337 to perform suction in the piping including the multi-channel valve 68 .

如以上,於洗淨模式之箱櫃330內,可洗淨包含多通道閥68之配管構造。As described above, in the tank 330 in the cleaning mode, the piping structure including the multi-channel valve 68 can be cleaned.

又,除由圖3所示之基板處理裝置發揮之效果以外,藉由拆除多通道閥68將其配置於藥液貯槽332之附近,即使挪用基板處理裝置之構成,亦可將用於洗淨之配管構造短化且簡易化,縮短用於洗淨之時間。Furthermore, in addition to the effect exhibited by the substrate processing apparatus shown in FIG. 3 , by removing the multi-channel valve 68 and disposing it near the chemical liquid storage tank 332 , even if the structure of the substrate processing apparatus is diverted, it can be used for cleaning The piping structure is shortened and simplified, and the time for cleaning is shortened.

此處,用於洗淨多通道閥之專用單元即洗淨單元亦可與基板處理裝置分開設置。Here, the cleaning unit, which is a dedicated unit for cleaning the multi-channel valve, may be provided separately from the substrate processing apparatus.

圖8係顯示以收納多通道閥68之方式構成之洗淨單元80之構成例的圖。FIG. 8 is a diagram showing a configuration example of the cleaning unit 80 configured to accommodate the multi-channel valve 68 .

如圖8所例示,洗淨單元80具備藥液貯槽82、閥門81、閥門83、閥門84、閥門85、泵86、開放閥門87、過濾器88、開放閥門89、供給配管502、循環配管514、供給配管506、供給配管508、供給配管510、供給配管512、連接配管504、及排液配管516。As illustrated in FIG. 8 , the cleaning unit 80 includes a chemical solution tank 82 , a valve 81 , a valve 83 , a valve 84 , a valve 85 , a pump 86 , an open valve 87 , a filter 88 , an open valve 89 , a supply pipe 502 , and a circulation pipe 514 , supply piping 506 , supply piping 508 , supply piping 510 , supply piping 512 , connecting piping 504 , and drain piping 516 .

於藥液貯槽82,貯存有可用於洗淨多通道閥68之藥液。藥液藉由打開閥門81而供給至多通道閥68。另,純水藉由打開閥門83而自純水供給源供給至多通道閥68。In the chemical liquid storage tank 82, a chemical liquid that can be used for cleaning the multi-channel valve 68 is stored. The chemical liquid is supplied to the multi-channel valve 68 by opening the valve 81 . In addition, the pure water is supplied to the multi-channel valve 68 from the pure water supply source by opening the valve 83 .

開放閥門87、泵86及過濾器88分別設置於對所搭載之多通道閥68供給藥液或純水之供給配管502。此處,開放閥門87可用於配管內之抽吸。The opening valve 87 , the pump 86 , and the filter 88 are respectively provided in the supply piping 502 for supplying the chemical solution or pure water to the mounted multi-channel valve 68 . Here, the open valve 87 can be used for suction in the piping.

於搭載之多通道閥68之上游側,連接分別自供給配管502分支之供給配管506、供給配管508、供給配管510及供給配管512,又,跨及供給配管506、供給配管508、供給配管510及供給配管512設置連接配管504。Supply piping 506, supply piping 508, supply piping 510, and supply piping 512 branched from supply piping 502 are connected to the upstream side of the mounted multi-channel valve 68, and are connected across supply piping 506, supply piping 508, and supply piping 510. And the supply piping 512 is provided with the connecting piping 504 .

又,於搭載之多通道閥68之下游,在用於將可用於洗淨多通道閥68之處理液排液之排液配管516設置閥門85,在用於使可用於洗淨多通道閥68之藥液循環至藥液貯槽82之循環配管514設置閥門84。此處,開放閥門89可用於多通道閥68之下游之配管內之抽吸。Further, downstream of the mounted multi-channel valve 68, a valve 85 is provided in the drain pipe 516 for draining the processing liquid that can be used for cleaning the multi-channel valve 68, A valve 84 is provided in the circulation piping 514 for circulating the chemical liquid to the chemical liquid storage tank 82 . Here, the open valve 89 can be used for suction in the piping downstream of the multi-channel valve 68 .

於洗淨單元80中,用於洗淨搭載之多通道閥68之洗淨路徑藉由洗淨配管形成。此處,於圖8之例中,洗淨配管包含自藥液貯槽82向下游側到達供給配管502,進而到達供給配管506、供給配管508、供給配管510及供給配管512之配管、與自藥液貯槽82向上游側到達循環配管514及排液配管516之配管。洗淨配管構成為可相對於多通道閥68裝卸。In the cleaning unit 80, a cleaning path for cleaning the mounted multi-channel valve 68 is formed by cleaning piping. Here, in the example of FIG. 8 , the cleaning piping includes piping from the chemical solution storage tank 82 to the downstream side to the supply piping 502 , and further to the supply piping 506 , the supply piping 508 , the supply piping 510 , and the supply piping 512 , and the self-medication. The liquid storage tank 82 reaches the piping of the circulation piping 514 and the drain piping 516 on the upstream side. The cleaning piping is configured to be detachable from the multi-channel valve 68 .

又,於搭載之多通道閥68之下游,在用於將可用於洗淨多通道閥68之處理液之排液之排液配管516設置閥門85,在用於使可用於洗淨多通道閥68之藥液循環至藥液貯槽82之循環配管514設置閥門84。此處,開放閥門89用於多通道閥68之下游之配管內之抽吸。Further, downstream of the mounted multi-channel valve 68, a valve 85 is provided in the drain piping 516 for draining the processing liquid that can be used for cleaning the multi-channel valve 68, A valve 84 is provided in the circulation piping 514 of the chemical liquid of 68 to the chemical liquid storage tank 82 . Here, the open valve 89 is used for suction in the piping downstream of the multi-channel valve 68 .

於使用洗淨單元80洗淨多通道閥68之情形時,將藥液,進而根據需要將純水自藥液貯槽82供給至多通道閥68。且,於使可用於洗淨之藥液循環至藥液貯槽82之情形時,打開閥門84,且關閉閥門85。另一方面,於將可用於洗淨之藥液或純水排液之情形時,關閉閥門84,且打開閥門85。When the multi-channel valve 68 is cleaned using the cleaning unit 80 , the chemical solution and, if necessary, pure water is supplied to the multi-channel valve 68 from the chemical solution storage tank 82 . Then, when the chemical solution that can be used for cleaning is circulated to the chemical solution storage tank 82, the valve 84 is opened and the valve 85 is closed. On the other hand, when the chemical solution or pure water that can be used for cleaning is to be drained, the valve 84 is closed and the valve 85 is opened.

尤其,於藥液之洗淨之後,進而進行純水之洗淨之後,藉由開放閥門87及開放閥門89於多通道閥68之上游側及下游側之兩者進行配管內之抽吸,抽吸可能包含洗淨對象之物質之藥液或純水,藉此可提高洗淨效果。又,藉由重複複數次該循環,可提高洗淨效果。In particular, after cleaning of the chemical solution and further cleaning with pure water, suction in the piping is performed by the open valve 87 and the open valve 89 on both the upstream side and the downstream side of the multi-channel valve 68, and suction is performed. The cleaning effect can be improved by absorbing medicinal liquid or pure water that may contain the substance to be washed. Moreover, by repeating this cycle a plurality of times, the cleaning effect can be improved.

如以上,使用洗淨單元80,可洗淨包含多通道閥68之配管構造。As described above, by using the cleaning unit 80, the piping structure including the multi-channel valve 68 can be cleaned.

又,除藉由圖3所示之基板處理裝置發揮之效果以外,因拆除多通道閥68於為了洗淨多通道閥68而設置之洗淨單元80中進行洗淨,故洗淨所使用之藥液之種類及濃度等不依存於基板處理。因此,供給之藥液之自由度提高。Furthermore, in addition to the effect exhibited by the substrate processing apparatus shown in FIG. 3 , since the multi-channel valve 68 is removed and cleaning is performed in the cleaning unit 80 provided for cleaning the multi-channel valve 68, the cleaning used for cleaning The type and concentration of the chemical solution do not depend on the substrate processing. Therefore, the degree of freedom of the medicinal solution to be supplied is improved.

<關於藉由以上記載之實施形態產生之效果> 接著,顯示藉由以上記載之實施形態產生之效果之例。另,於以下之說明中,雖基於以上記載之實施形態所例示之具體之構成來記載該效果,但於產生同樣之效果之範圍內,可置換為本案說明書所例示之其他具體之構成。即,以下為方便起見,有僅代表性記載建立對應之具體構成中之任一者之情形,但亦可將代表性記載之具體構成置換為建立對應之其他具體構成。 <About the effects produced by the above-described embodiment> Next, an example of the effect produced by the embodiment described above is shown. In addition, in the following description, although this effect is described based on the specific structure exemplified in the above-described embodiment, it can be replaced with another specific structure exemplified in the present specification within the scope of producing the same effect. That is, in the following, for the sake of convenience, only one of the specific configurations corresponding to the representative description may be described, but the specific configuration of the representative description may be replaced with other specific configurations corresponding to each other.

根據以上記載之實施形態,基板處理裝置具備用於供給藥液之貯槽、多通道閥68(或多通道閥78)、及處理液噴嘴20。此處,貯槽係與例如藥液貯槽32、藥液貯槽42、藥液貯槽52、藥液貯槽232、藥液貯槽332等中之至少1個對應者。多通道閥68供給用於處理基板W之複數種處理液。又,多通道閥68選擇性供給複數種處理液中之至少1種。處理液噴嘴20使用自多通道閥68供給之處理液處理基板W。此處,基板處理裝置可切換用於處理基板W之基板處理模式、與至少用於洗淨多通道閥68之洗淨模式。於基板處理模式下,藉由供給至處理液噴嘴20之處理液處理基板W。於洗淨模式下,於不經由處理液噴嘴20而經由藥液貯槽32與多通道閥68之路徑之洗淨路徑中,自藥液貯槽32向多通道閥68供給藥液。According to the embodiment described above, the substrate processing apparatus includes the tank for supplying the chemical solution, the multi-channel valve 68 (or the multi-channel valve 78 ), and the processing solution nozzle 20 . Here, the storage tank corresponds to, for example, at least one of the chemical liquid storage tank 32 , the chemical liquid storage tank 42 , the chemical liquid storage tank 52 , the chemical liquid storage tank 232 , the chemical liquid storage tank 332 , and the like. The multi-channel valve 68 supplies a plurality of processing liquids for processing the substrate W. In addition, the multi-channel valve 68 selectively supplies at least one of a plurality of treatment liquids. The processing liquid nozzle 20 processes the substrate W using the processing liquid supplied from the multi-channel valve 68 . Here, the substrate processing apparatus can switch between a substrate processing mode for processing the substrate W and a cleaning mode for cleaning at least the multi-channel valve 68 . In the substrate processing mode, the substrate W is processed by the processing liquid supplied to the processing liquid nozzle 20 . In the cleaning mode, the chemical liquid is supplied from the chemical liquid storage tank 32 to the multi-channel valve 68 in the cleaning path that does not pass through the processing liquid nozzle 20 but passes through the path of the chemical liquid storage tank 32 and the multi-channel valve 68 .

根據此種構成,藉由對不經由處理液噴嘴20之洗淨路徑供給藥液,而可有效地洗淨多通道閥68。又,因該洗淨路徑不包含處理液噴嘴20,故於洗淨模式下不會自處理液噴嘴20噴出藥液,而不會因該藥液污染基板W。According to such a configuration, the multi-channel valve 68 can be cleaned efficiently by supplying the chemical liquid to the cleaning path that does not pass through the processing liquid nozzle 20 . In addition, since the cleaning path does not include the processing liquid nozzle 20, the chemical liquid is not ejected from the processing liquid nozzle 20 in the cleaning mode, and the substrate W is not contaminated by the chemical liquid.

另,即使於對上述構成適當追加本案說明書所例示之其他構成之情形,即,適當追加作為上述構成未言及之本案說明書中之其他構成之情形時,亦可產生同樣之效果。In addition, the same effect can be produced even when other structures illustrated in the present specification are appropriately added to the above-mentioned structures, that is, when other structures in the present specification that are not mentioned as the above-mentioned structures are appropriately added.

又,根據以上記載之實施形態,藥液為複數種處理液中之1種。根據此種構成,因可將可用於處理基板W之自藥液貯槽供給之藥液挪用於洗淨多通道閥68,故無需為了洗淨多通道閥68而另外準備藥液貯槽。Moreover, according to the embodiment described above, the chemical liquid is one of a plurality of treatment liquids. According to such a configuration, since the chemical solution supplied from the chemical solution storage tank that can be used for processing the substrate W can be diverted to the cleaning multi-channel valve 68 , there is no need to prepare a separate chemical solution storage tank for cleaning the multi-channel valve 68 .

又,根據以上記載之實施形態,基板處理裝置具備:複數個供給配管,其等於洗淨路徑之藥液貯槽32之下游、且多通道閥68之上游之位置被供給藥液;及至少1個連接配管,其跨及複數個供給配管而連接。此處,供給配管與例如供給配管39、供給配管49、供給配管59、供給配管100、供給配管404、供給配管406、供給配管408、供給配管410等對應。又,連接配管與例如連接配管64E、連接配管64F、連接配管64G、連接配管74E、連接配管74F、連接配管74G、連接配管164E、連接配管164F、連接配管164G、連接配管412等對應。根據此種構成,可經由連接配管對連接於多通道閥68之複數個供給配管同時供給藥液。因此,可同時洗淨連接於多通道閥68之複數個供給配管,縮短洗淨時間。Furthermore, according to the above-described embodiment, the substrate processing apparatus includes: a plurality of supply pipes to which the chemical solution is supplied to a position downstream of the chemical solution storage tank 32 in the cleaning path and upstream of the multi-channel valve 68; and at least one The connecting pipe is connected across the plurality of supply pipes. Here, the supply piping corresponds to, for example, supply piping 39, supply piping 49, supply piping 59, supply piping 100, supply piping 404, supply piping 406, supply piping 408, supply piping 410, and the like. The connection piping corresponds to, for example, connection piping 64E, connection piping 64F, connection piping 64G, connection piping 74E, connection piping 74F, connection piping 74G, connection piping 164E, connection piping 164F, connection piping 164G, connection piping 412, and the like. According to such a configuration, the chemical solution can be simultaneously supplied to the plurality of supply pipes connected to the multi-channel valve 68 via the connection pipes. Therefore, a plurality of supply pipes connected to the multi-channel valve 68 can be cleaned at the same time, and the cleaning time can be shortened.

又,根據以上記載之實施形態,連接配管收納於收納多通道閥68之殼體(例如流體箱60、流體箱70、箱櫃330等)內。根據此種構成,可於每個流體箱60,切換基板處理模式與洗淨模式執行處理。因此,作為基板處理裝置1整體,可縮短基板處理之中斷時間。Moreover, according to the embodiment described above, the connection piping is accommodated in the case (for example, the fluid tank 60 , the fluid tank 70 , the tank 330 , etc.) that accommodates the multi-channel valve 68 . According to such a configuration, the substrate processing mode and the cleaning mode can be switched to perform processing for each fluid tank 60 . Therefore, as a whole of the substrate processing apparatus 1, the interruption time of the substrate processing can be shortened.

又,根據以上記載之實施形態,連接配管412收納於收納藥液貯槽332及多通道閥68之箱櫃330內。根據此種構成,於箱櫃330內,收納多通道閥68、藥液貯槽332及連接配管412,藉此,即使挪用基板處理裝置之構成,亦可將用於洗淨之配管構造短化且簡易化,縮短用於洗淨之時間。Moreover, according to the embodiment described above, the connection piping 412 is accommodated in the tank 330 that accommodates the chemical solution storage tank 332 and the multi-channel valve 68 . According to such a configuration, the multi-channel valve 68 , the chemical liquid storage tank 332 , and the connection piping 412 are accommodated in the cabinet 330 , so that even if the configuration of the substrate processing apparatus is used, the piping structure for cleaning can be shortened and Simplified, shortening the time for cleaning.

又,根據以上記載之實施形態,多通道閥68具備使複數個供給配管各者開關之複數個選擇閥門。此處,選擇閥門為與例如選擇閥門68B、選擇閥門68C、選擇閥門68D、選擇閥門68E、選擇閥門68F、選擇閥門78B、選擇閥門78C、選擇閥門78D、選擇閥門78E、選擇閥門78F等中之至少1個對應者。Moreover, according to the above-described embodiment, the multi-channel valve 68 includes a plurality of selector valves for opening and closing each of the plurality of supply pipes. Here, the selection valve is, for example, selection valve 68B, selection valve 68C, selection valve 68D, selection valve 68E, selection valve 68F, selection valve 78B, selection valve 78C, selection valve 78D, selection valve 78E, selection valve 78F, etc. At least 1 counterpart.

於洗淨模式下,複數個供給配管中之至少1個藉由對應之選擇閥門而開關。根據此種構成,若因選擇閥門之開關動作而產生急劇之流速變化,則有產生因管內之壓力變動而使配管振動之水錘之情形。又,有產生因管內之壓力變動而發泡之空化之情形。藉由該等現象,對洗淨對象帶來物理衝擊,可提高洗淨效果。In the cleaning mode, at least one of the plurality of supply pipes is opened and closed by the corresponding selection valve. According to such a configuration, if a rapid change in flow rate occurs due to the opening and closing operation of the selector valve, there may be cases where a water hammer occurs that causes the piping to vibrate due to the pressure change in the pipe. In addition, there are cases in which cavitation due to foaming occurs due to pressure fluctuations in the pipe. By these phenomena, a physical impact is given to the cleaning object, and the cleaning effect can be improved.

又,根據以上記載之實施形態,於洗淨模式下,藥液於洗淨路徑中循環。根據此種構成,可減少用於洗淨之藥液之量。Furthermore, according to the above-described embodiment, in the cleaning mode, the chemical solution circulates in the cleaning path. According to such a configuration, the amount of the chemical solution used for cleaning can be reduced.

又,根據以上記載之實施形態,基板處理裝置具備:沖洗液供給源(例如純水供給源),其用於供給沖洗液;及抽吸部,其於多通道閥68內進行抽吸。此處,抽吸部為與例如開放閥門65、開放閥門75、開放閥門337等中之至少1個對應者。於洗淨模式下,於洗淨路徑中之藥液循環之後,對多通道閥68供給沖洗液,進而藉由開放閥門65於多通道閥68內抽吸。根據此種構成,由藥液及純水,沖洗殘存於配管內之洗淨對象之物質,進而抽吸可能包含洗淨對象之物質之藥液及純水,藉此可提高洗淨效果。Furthermore, according to the above-described embodiment, the substrate processing apparatus includes: a rinsing liquid supply source (eg, a pure water supply source) for supplying the rinsing liquid; Here, the suction part corresponds to at least one of the open valve 65 , the open valve 75 , the open valve 337 , and the like, for example. In the cleaning mode, after the chemical liquid in the cleaning path is circulated, the flushing liquid is supplied to the multi-channel valve 68 , and then the valve 65 is opened to suck in the multi-channel valve 68 . According to this configuration, the substance to be cleaned remaining in the piping is flushed with the chemical solution and pure water, and the chemical solution and pure water that may contain the substance to be cleaned are further suctioned, thereby improving the cleaning effect.

又,根據以上記載之實施形態,於洗淨模式下,重複複數次洗淨路徑中之藥液循環、於藥液循環之後供給沖洗液、及於供給沖洗液之後之多通道閥68內之抽吸。根據此種構成,藉由重複由藥液及純水,沖洗殘存於配管內之洗淨對象之物質,進而抽吸可能包含洗淨對象之物質之藥液及純水之循環,而可提高洗淨效果。Furthermore, according to the above-described embodiment, in the cleaning mode, the circulation of the chemical solution in the cleaning path, the supply of the rinse solution after the cycle of the chemical solution, and the pumping in the multi-channel valve 68 after the supply of the rinse solution are repeated several times. Suck. According to such a configuration, by repeating the circulation of the chemical solution and the pure water remaining in the piping by rinsing the substance to be cleaned by the chemical solution and the pure water, and by suctioning the chemical solution and the pure water that may contain the substance to be cleaned, the cleaning can be improved. net effect.

又,根據以上記載之實施形態,於洗淨模式下,使藥液之供給壓變動。根據此種構成,若產生急劇之流速變化,則有產生因管內之壓力變動而使配管振動之水錘之情形。又,有產生因管內之壓力變動而發泡之空化之情形。藉由該等現象,對洗淨對象帶來物理衝擊,可提高洗淨效果。Furthermore, according to the above-described embodiment, in the cleaning mode, the supply pressure of the chemical solution is changed. According to such a configuration, if a rapid change in flow velocity occurs, there is a case where a water hammer that causes the piping to vibrate due to the pressure change in the pipe is generated. In addition, there are cases in which cavitation due to foaming occurs due to pressure fluctuations in the pipe. By these phenomena, a physical impact is given to the cleaning object, and the cleaning effect can be improved.

根據以上記載之實施形態,洗淨單元具備用於供給藥液之貯槽、與洗淨配管。此處,貯槽為與例如藥液貯槽82等對應者。洗淨配管形成用於至少洗淨多通道閥68之路徑即洗淨路徑。洗淨路徑經過藥液貯槽82。於洗淨路徑中,藉由自藥液貯槽82供給之藥液洗淨多通道閥68。又,洗淨配管可相對於多通道閥68裝卸。According to the above-described embodiment, the cleaning unit includes the storage tank for supplying the chemical solution and the cleaning piping. Here, the storage tank corresponds to, for example, the chemical liquid storage tank 82 or the like. The cleaning piping forms a cleaning path, which is a path for cleaning at least the multi-channel valve 68 . The cleaning path passes through the chemical liquid storage tank 82 . In the cleaning path, the multi-channel valve 68 is cleaned by the chemical solution supplied from the chemical solution storage tank 82 . In addition, the wash piping can be attached to and detached from the multi-channel valve 68 .

根據此種構成,藉由對洗淨路徑供給藥液,而可有效地洗淨多通道閥68。又,因拆除多通道閥68於為了洗淨多通道閥68而設置之洗淨單元80中進行洗淨,故洗淨所使用之藥液之種類及濃度等不依存於基板處理。因此,供給之藥液之自由度提高。According to such a configuration, the multi-channel valve 68 can be cleaned efficiently by supplying the chemical solution to the cleaning path. In addition, since the multi-channel valve 68 is removed and cleaning is performed in the cleaning unit 80 provided for cleaning the multi-channel valve 68, the type and concentration of the chemical solution used for cleaning do not depend on the substrate processing. Therefore, the degree of freedom of the medicinal solution to be supplied is improved.

另,於無特別限制之情形時,可變更進行各個處理之順序。In addition, in the case of no particular limitation, the order of performing each process can be changed.

又,即使於對上述構成適當追加本案說明書所例示之其他構成之情形,即適當追加作為上述構成未言及之本案說明書中之其他構成之情形時,亦可產生同樣之效果。In addition, the same effect can be produced even when other structures illustrated in the description of the present application are appropriately added to the above-mentioned structures, that is, other structures in the description of the present application that are not mentioned as the above-mentioned structures are appropriately added.

又,根據以上記載之實施形態,洗淨單元具備:複數個供給配管506(或供給配管508、供給配管510、供給配管512),其等於洗淨路徑之藥液貯槽82之下游、且多通道閥68之上游之位置,被供給藥液;及至少1個連接配管504,其跨及複數個供給配管而連接。根據此種構成,可經由連接配管對連接於多通道閥68之複數個供給配管同時供給藥液。藉此,可同時洗淨連接於多通道閥68之複數個供給配管,縮短洗淨時間。Furthermore, according to the above-described embodiment, the cleaning unit includes a plurality of supply piping 506 (or supply piping 508, supply piping 510, and supply piping 512) which are equal to the downstream of the chemical solution storage tank 82 in the cleaning path and have multiple channels. The position upstream of the valve 68 is supplied with the chemical solution; and at least one connection pipe 504 is connected across the plurality of supply pipes. According to such a configuration, the chemical solution can be simultaneously supplied to the plurality of supply pipes connected to the multi-channel valve 68 via the connection pipes. Thereby, a plurality of supply pipes connected to the multi-channel valve 68 can be cleaned at the same time, and the cleaning time can be shortened.

又,根據以上記載之實施形態,多通道閥68具備使複數個供給配管各者開關之複數個選擇閥門。且,複數個供給配管中之至少1個藉由對應之選擇閥門而開關。根據此種構成,若藉由選擇閥門之開關動作產生急劇之流速變化,則有產生因管內之壓力變動而使配管振動之水錘之情形。又,有產生因管內之壓力變動而發泡之空化之情形。藉由該等現象,對洗淨對象帶來物理衝擊,可提高洗淨效果。Moreover, according to the above-described embodiment, the multi-channel valve 68 includes a plurality of selector valves for opening and closing each of the plurality of supply pipes. And, at least one of the plurality of supply pipes is opened and closed by the corresponding selection valve. According to such a configuration, if a rapid change in flow rate occurs due to the opening and closing operation of the selector valve, there may be cases where a water hammer occurs that causes the piping to vibrate due to the pressure change in the pipe. In addition, there are cases in which cavitation due to foaming occurs due to pressure fluctuations in the pipe. By these phenomena, a physical impact is given to the cleaning object, and the cleaning effect can be improved.

又,根據以上記載之實施形態,於洗淨路徑中使藥液循環。根據此種構成,可減少用於洗淨之藥液之量。Moreover, according to the embodiment described above, the chemical solution is circulated in the cleaning path. According to such a configuration, the amount of the chemical solution used for cleaning can be reduced.

又,根據以上記載之實施形態,洗淨單元具備:沖洗液供給源(例如純水供給源),其用於供給沖洗液;及抽吸部,其於多通道閥68內進行抽吸。此處,抽吸部為與例如開放閥門87、開放閥門89等中之至少1個對應者。於洗淨路徑中之藥液循環之後,對多通道閥68供給沖洗液,進而藉由開放閥門87於多通道閥68內抽吸。根據此種構成,由藥液及純水,沖洗殘存於配管內之洗淨對象之物質,進而抽吸可能包含洗淨對象之物質之藥液及純水,藉此可提高洗淨效果。Furthermore, according to the above-described embodiment, the cleaning unit includes a rinse liquid supply source (eg, a pure water supply source) for supplying the rinse liquid, and a suction unit that performs suction in the multi-channel valve 68 . Here, the suction part corresponds to at least one of the open valve 87, the open valve 89, and the like, for example. After the chemical liquid in the cleaning path is circulated, the flushing liquid is supplied to the multi-channel valve 68 , and then the multi-channel valve 68 is sucked by opening the valve 87 . According to this configuration, the substance to be cleaned remaining in the piping is flushed with the chemical solution and pure water, and the chemical solution and pure water that may contain the substance to be cleaned are further suctioned, thereby improving the cleaning effect.

又,根據以上記載之實施形態,重複複數次洗淨路徑中之藥液循環、於藥液循環之後供給沖洗液、及於供給沖洗液之後之多通道閥68內之抽吸。根據此種構成,藉由重複由藥液及純水,沖洗殘存於配管內之洗淨對象之物質,進而抽吸可能包含洗淨對象之物質之藥液及純水之循環,而可提高洗淨效果。Furthermore, according to the above-described embodiment, the circulation of the chemical solution in the cleaning path, the supply of the rinse solution after the cycle of the chemical solution, and the suction in the multi-channel valve 68 after the supply of the rinse solution are repeated a plurality of times. According to such a configuration, by repeating the circulation of the chemical solution and the pure water remaining in the piping by rinsing the substance to be cleaned by the chemical solution and the pure water, and by suctioning the chemical solution and the pure water that may contain the substance to be cleaned, the cleaning can be improved. net effect.

<關於以上記載之實施形態之變化例> 於以上記載之實施形態中,雖有亦記載各個構成要件之尺寸、形狀、相對之配置關係或實施條件等之情形,但其等係所有態樣中之一例,並非限定者。 <About the modification of the above-mentioned embodiment> In the above-described embodiments, the dimensions, shapes, relative arrangement relationships, and implementation conditions of the respective constituent elements are also described, but these are all examples and are not limited.

因此,於本案說明書所揭示之技術範圍內假設未例示之無數變化例、及均等物。例如,包含將至少1個構成要件加以變化之情形、追加之情形或省略之情形。Therefore, innumerable variations and equivalents that are not illustrated are assumed within the technical scope disclosed in the present specification. For example, the case where at least one constituent element is changed, the case where it is added, or the case where it is omitted is included.

又,於以上記載之實施形態中,未特別指定地記載材料名稱等之情形時,只要不產生矛盾,則包含於該材料包含有其他添加物之例如合金等。In addition, in the embodiment described above, when the material name or the like is not specifically described, as long as there is no conflict, other additives, such as alloys, are included in the material.

1:基板處理裝置 1A:基板處理裝置 1B:基板處理裝置 10:旋轉卡盤 10A:旋轉基台 10C:旋轉軸 10D:旋轉馬達 12:處理杯 20:處理液噴嘴 22:噴嘴臂 22A:臂部 22B:軸體 22C:致動器 30:箱櫃 32:藥液貯槽 34:閥門 36:泵 38:過濾器 39:供給配管 40:箱櫃 42:藥液貯槽 44:閥門 46:泵 48:過濾器 49:供給配管 50:箱櫃 52:藥液貯槽 54:閥門 56:泵 58:過濾器 59:供給配管 60:流體箱 61:供給配管 62A:供給閥門 62B:供給閥門 62C:供給閥門 62D:供給閥門 64E:連接配管 64F:連接配管 64G:連接配管 65:開放閥門 66E:連接閥門 66F:連接閥門 66G:連接閥門 67:供給閥門 68:多通道閥 68A:連接部 68B:選擇閥門 68C:選擇閥門 68D:選擇閥門 68E:選擇閥門 68F:選擇閥門 69:排液閥門 70:流體箱 71:供給配管 72A:供給閥門 72B:供給閥門 72C:供給閥門 72D:供給閥門 74E:連接配管 74F:連接配管 74G:連接配管 75:開放閥門 76E:連接閥門 76F:連接閥門 76G:連接閥門 77:供給閥門 78:多通道閥 78A:連接部 78B:選擇閥門 78C:選擇閥門 78D:選擇閥門 78E:選擇閥門 78F:選擇閥門 79:排液閥門 80:洗淨單元 81:閥門 82:藥液貯槽 83:閥門 84:閥門 85:閥門 86:泵 87:開放閥門 88:過濾器 89:開放閥門 90:控制部 91:CPU 92:ROM 93:RAM 94:記錄裝置 94P:處理程式 95:匯流排線 96:輸入部 97:顯示部 98:通信部 100:供給配管 160:流體箱 162A:供給閥門 162B:供給閥門 162C:供給閥門 164E:連接配管 164F:連接配管 164G:連接配管 166E:連接閥門 166F:連接閥門 166G:連接閥門 170:流體箱 180:腔室 230:洗淨櫃 232:藥液貯槽 234:閥門 236:泵 238:過濾器 239:供給配管 240:供給閥門 241:供給閥門 260:流體箱 262:循環閥門 264:循環配管 270:流體箱 272:循環閥門 274:循環配管 330:箱櫃 331:閥門 332:藥液貯槽 333:閥門 334:閥門 335:閥門 336:泵 337:開放閥門 338:過濾器 339:供給配管 340:配管 402:循環配管 404:供給配管 406:供給配管 408:供給配管 410:供給配管 412:連接配管 414:供給配管 502:供給配管 504:連接配管 506:供給配管 508:供給配管 510:供給配管 512:供給配管 514:循環配管 516:排液配管 600:處理單元 600A:處理單元 600B:處理單元 601:裝載埠 602:傳載機械手 603:中心機械手 604:基板載置部 C:載體 W:基板 Z1:旋轉軸線 1: Substrate processing device 1A: Substrate processing device 1B: Substrate processing device 10: Rotary chuck 10A: Rotary abutment 10C: Rotary axis 10D: Rotary Motor 12: Processing Cups 20: Treatment fluid nozzle 22: Nozzle Arm 22A: Arm 22B: Shaft body 22C: Actuator 30: Cabinets 32: Liquid storage tank 34: Valve 36: Pump 38: Filter 39: Supply piping 40: Cabinets 42: Liquid storage tank 44: Valve 46: Pump 48: Filter 49: Supply piping 50: Cabinets 52: Liquid storage tank 54: Valve 56: Pump 58: Filter 59: Supply piping 60: Fluid tank 61: Supply piping 62A: Supply valve 62B: Supply valve 62C: Supply valve 62D: Supply valve 64E: Connecting piping 64F: Connecting piping 64G: Connecting piping 65: Open valve 66E: Connection valve 66F: Connection valve 66G: Connection valve 67: Supply valve 68: Multi-channel valve 68A: Connector 68B: Select Valve 68C: Select Valve 68D: Select Valve 68E: Select valve 68F: Select Valve 69: Drain valve 70: Fluid tank 71: Supply piping 72A: Supply valve 72B: Supply valve 72C: Supply valve 72D: Supply valve 74E: Connecting piping 74F: Connecting Piping 74G: Connecting Piping 75: Open valve 76E: Connection valve 76F: Connection valve 76G: Connection valve 77: Supply valve 78: Multi-channel valve 78A: Connector 78B: Select Valve 78C: Select Valve 78D: Select Valve 78E: Select Valve 78F: Select Valve 79: Drain valve 80: washing unit 81: Valve 82: Liquid storage tank 83: Valve 84: Valve 85: Valve 86: Pump 87: Open valve 88: Filter 89: Open valve 90: Control Department 91:CPU 92:ROM 93: RAM 94: Recording device 94P: Handler 95: bus wire 96: Input section 97: Display part 98: Ministry of Communications 100: Supply piping 160: Fluid Tank 162A: Supply valve 162B: Supply valve 162C: Supply valve 164E: Connecting Piping 164F: Connecting Piping 164G: Connecting Piping 166E: Connection valve 166F: Connection valve 166G: Connection valve 170: Fluid Tank 180: Chamber 230: Wash Cabinet 232: Liquid storage tank 234: Valve 236: Pump 238: Filter 239: Supply piping 240: Supply valve 241: Supply valve 260: Fluid Tank 262: Circulation valve 264: Circulation piping 270: Fluid Tank 272: Circulation valve 274: Circulation piping 330: Cabinets 331: Valve 332: Liquid storage tank 333: Valve 334: Valve 335: Valve 336: Pump 337: Open valve 338: Filter 339: Supply piping 340: Piping 402: Circulation piping 404: Supply piping 406: Supply piping 408: Supply piping 410: Supply piping 412: Connecting piping 414: Supply piping 502: Supply piping 504: Connecting Piping 506: Supply piping 508: Supply piping 510: Supply piping 512: Supply piping 514: Circulation piping 516: Drain piping 600: Processing unit 600A: Processing unit 600B: Processing Unit 601: Loadport 602: Carrier Manipulator 603: Center Robot 604: Substrate mounting part C: carrier W: substrate Z1: Rotation axis

圖1係概略性顯示實施形態相關之基板處理裝置之構成例之俯視圖。 圖2係顯示圖1中例示之控制部之構成例之圖。 圖3係顯示實施形態相關之基板處理裝置之構成中經由配管連接於各個處理單元之構造例的圖。 圖4係顯示處理單元之構成例之圖。 圖5係顯示實施形態相關之基板處理裝置之構成中經由配管連接於各個處理單元之構造之變化例之圖。 圖6係顯示實施形態相關之基板處理裝置之構成中經由配管連接於各個處理單元之構造之另一變化例的圖。 圖7係顯示以收納洗淨模式下拆除之多通道閥之方式構成之箱櫃之構成例的圖。 圖8係顯示以收納多通道閥之方式構成之洗淨單元之構成例的圖。 FIG. 1 is a plan view schematically showing a configuration example of a substrate processing apparatus according to the embodiment. FIG. 2 is a diagram showing a configuration example of the control unit illustrated in FIG. 1 . FIG. 3 is a diagram showing an example of a structure in which each processing unit is connected via piping in the structure of the substrate processing apparatus according to the embodiment. FIG. 4 is a diagram showing a configuration example of a processing unit. FIG. 5 is a diagram showing a modification of the structure connected to each processing unit via piping in the structure of the substrate processing apparatus according to the embodiment. FIG. 6 is a diagram showing another modification of the structure connected to each processing unit via piping in the structure of the substrate processing apparatus according to the embodiment. FIG. 7 is a diagram showing a configuration example of a cabinet configured to accommodate the multi-channel valve removed in the washing mode. FIG. 8 is a diagram showing a configuration example of a cleaning unit configured to accommodate a multi-channel valve.

1:基板處理裝置 1: Substrate processing device

30:箱櫃 30: Cabinets

32:藥液貯槽 32: Liquid storage tank

34:閥門 34: Valve

36:泵 36: Pump

38:過濾器 38: Filter

39:供給配管 39: Supply piping

40:箱櫃 40: Cabinets

42:藥液貯槽 42: Liquid storage tank

44:閥門 44: Valve

46:泵 46: Pump

48:過濾器 48: Filter

49:供給配管 49: Supply piping

50:箱櫃 50: Cabinets

52:藥液貯槽 52: Liquid storage tank

54:閥門 54: Valve

56:泵 56: Pump

58:過濾器 58: Filter

59:供給配管 59: Supply piping

60:流體箱 60: Fluid tank

61:供給配管 61: Supply piping

62A:供給閥門 62A: Supply valve

62B:供給閥門 62B: Supply valve

62C:供給閥門 62C: Supply valve

62D:供給閥門 62D: Supply valve

64E:連接配管 64E: Connecting piping

64F:連接配管 64F: Connecting piping

64G:連接配管 64G: Connecting piping

65:開放閥門 65: Open valve

66E:連接閥門 66E: Connection valve

66F:連接閥門 66F: Connection valve

66G:連接閥門 66G: Connection valve

67:供給閥門 67: Supply valve

68:多通道閥 68: Multi-channel valve

68A:連接部 68A: Connector

68B:選擇閥門 68B: Select Valve

68C:選擇閥門 68C: Select Valve

68D:選擇閥門 68D: Select Valve

68E:選擇閥門 68E: Select valve

68F:選擇閥門 68F: Select Valve

69:排液閥門 69: Drain valve

70:流體箱 70: Fluid tank

71:供給配管 71: Supply piping

72A:供給閥門 72A: Supply valve

72B:供給閥門 72B: Supply valve

72C:供給閥門 72C: Supply valve

72D:供給閥門 72D: Supply valve

74E:連接配管 74E: Connecting piping

74F:連接配管 74F: Connecting Piping

74G:連接配管 74G: Connecting Piping

75:開放閥門 75: Open valve

76E:連接閥門 76E: Connection valve

76F:連接閥門 76F: Connection valve

76G:連接閥門 76G: Connection valve

77:供給閥門 77: Supply valve

78:多通道閥 78: Multi-channel valve

78A:連接部 78A: Connector

78B:選擇閥門 78B: Select Valve

78C:選擇閥門 78C: Select Valve

78D:選擇閥門 78D: Select Valve

78E:選擇閥門 78E: Select Valve

78F:選擇閥門 78F: Select Valve

79:排液閥門 79: Drain valve

100:供給配管 100: Supply piping

600A:處理單元 600A: Processing unit

600B:處理單元 600B: Processing Unit

Claims (17)

一種基板處理裝置,其具備: 貯槽,其用於供給藥液; 多通道閥,其被供給用於處理基板之複數種處理液,且可選擇性供給複數種上述處理液中之至少1種;及 處理液噴嘴,其用於使用自上述多通道閥供給之上述處理液處理上述基板;且 可切換用於處理上述基板之基板處理模式、與用於至少洗淨上述多通道閥之洗淨模式; 於上述基板處理模式下,藉由供給至上述處理液噴嘴之上述處理液處理上述基板;且 於上述洗淨模式下,於不經由上述處理液噴嘴而經由上述貯槽與上述多通道閥之路徑之洗淨路徑中,自上述貯槽向上述多通道閥供給上述藥液。 A substrate processing apparatus comprising: A storage tank, which is used to supply the medicinal liquid; A multi-channel valve, which is supplied with a plurality of processing liquids for processing the substrate, and can selectively supply at least one of the plurality of above-mentioned processing liquids; and a processing liquid nozzle for processing the substrate using the processing liquid supplied from the multi-channel valve; and A substrate processing mode for processing the substrate and a cleaning mode for cleaning at least the multi-channel valve can be switched; In the substrate processing mode, the substrate is processed by the processing liquid supplied to the processing liquid nozzle; and In the cleaning mode, the chemical solution is supplied from the storage tank to the multi-channel valve in a cleaning path that passes through the path of the storage tank and the multi-channel valve without passing through the processing liquid nozzle. 如請求項1之基板處理裝置,其中 上述藥液為複數種上述處理液中之1種。 The substrate processing apparatus of claim 1, wherein The above-mentioned chemical liquid is one of a plurality of the above-mentioned treatment liquids. 如請求項1或2之基板處理裝置,其中 於上述洗淨路徑之上述貯槽之下游,且上述多通道閥之上游之位置,進而具備: 複數個供給配管,其等被供給上述藥液;及 至少1個連接配管,其跨及複數個上述供給配管而連接。 The substrate processing apparatus of claim 1 or 2, wherein The position downstream of the storage tank in the cleaning path and upstream of the multi-channel valve is further provided with: a plurality of supply pipes, which are supplied with the above-mentioned chemical solution; and At least one connection pipe is connected across the plurality of supply pipes. 如請求項3之基板處理裝置,其中 上述連接配管收納於收納上述多通道閥之殼體內。 The substrate processing apparatus of claim 3, wherein The said connection piping is accommodated in the case which accommodates the said multi-channel valve. 如請求項3之基板處理裝置,其中 上述連接配管收納於收納上述貯槽及上述多通道閥之殼體內。 The substrate processing apparatus of claim 3, wherein The said connection piping is accommodated in the case which accommodates the said storage tank and the said multi-channel valve. 如請求項3之基板處理裝置,其中 上述多通道閥具備使複數個上述供給配管之各者開關之複數個選擇閥門, 於上述洗淨模式下,複數個上述供給配管中之至少1個藉由對應之上述選擇閥門而開關。 The substrate processing apparatus of claim 3, wherein The multi-channel valve includes a plurality of selector valves for opening and closing each of the plurality of supply pipes, In the cleaning mode, at least one of the plurality of supply pipes is opened and closed by the corresponding selector valve. 如請求項1或2之基板處理裝置,其中 於上述洗淨模式下,上述藥液於上述洗淨路徑中循環。 The substrate processing apparatus of claim 1 or 2, wherein In the cleaning mode, the chemical solution circulates in the cleaning path. 如請求項7之基板處理裝置,其進而具備: 沖洗液供給源,其用於供給沖洗液;及 抽吸部,其對於上述多通道閥內進行抽吸;且 於上述洗淨模式下,於上述洗淨路徑中之上述藥液循環之後,對上述多通道閥供給上述沖洗液,進而藉由上述抽吸部抽吸上述多通道閥內。 The substrate processing apparatus of claim 7, further comprising: a flushing fluid supply for supplying flushing fluid; and a suction part, which performs suction in the above-mentioned multi-channel valve; and In the cleaning mode, after the chemical solution circulates in the cleaning path, the flushing solution is supplied to the multi-channel valve, and the inside of the multi-channel valve is sucked by the suction part. 如請求項8之基板處理裝置,其中 於上述洗淨模式下,重複複數次上述洗淨路徑中之上述藥液循環、於上述藥液循環之後供給上述沖洗液、及供給上述沖洗液之後之上述多通道閥內之抽吸。 The substrate processing apparatus of claim 8, wherein In the cleaning mode, the circulation of the chemical solution in the cleaning path, the supply of the rinse solution after the cycle of the chemical solution, and the suction in the multi-channel valve after the supply of the rinse solution are repeated several times. 如請求項1或2之基板處理裝置,其中 於上述洗淨模式下,上述藥液之供給壓變動。 The substrate processing apparatus of claim 1 or 2, wherein In the cleaning mode, the supply pressure of the chemical solution fluctuates. 一種洗淨單元,其具備: 貯槽,其用於供給藥液;及 洗淨配管,其用於形成用以至少洗淨多通道閥之路徑即洗淨路徑;且 上述多通道閥被供給複數種處理液,且可選擇性供給複數種上述處理液中之至少一種; 上述洗淨路徑經過上述貯槽; 上述多通道閥於上述洗淨路徑中,藉由自上述貯槽供給之上述藥液被洗淨; 上述洗淨配管可相對於上述多通道閥裝卸。 A cleaning unit comprising: Reservoirs for supplying medicinal liquids; and a cleaning pipe for forming a cleaning path, which is a path for cleaning at least the multi-channel valve; and The multi-channel valve is supplied with a plurality of treatment liquids, and can selectively supply at least one of the plurality of treatment liquids; The cleaning path passes through the storage tank; The multi-channel valve is cleaned in the cleaning path by the chemical solution supplied from the storage tank; The said cleaning piping is attachable and detachable with respect to the said multi-channel valve. 如請求項11之洗淨單元,其中 於上述洗淨路徑之上述貯槽之下游、且上述多通道閥之上游之位置,進而具備: 複數個供給配管,其等被供給上述藥液;及 至少1個連接配管,其跨及複數個上述供給配管而連接。 The cleaning unit of claim 11, wherein In a position downstream of the storage tank in the cleaning path and upstream of the multi-channel valve, further comprising: a plurality of supply pipes, which are supplied with the above-mentioned chemical solution; and At least one connection pipe is connected across the plurality of supply pipes. 如請求項12之洗淨單元,其中 上述多通道閥具備使複數個上述供給配管之各者開關之複數個選擇閥門,且 複數個上述供給配管中之至少1個藉由對應之上述選擇閥門而開關。 The cleaning unit of claim 12, wherein The multi-channel valve includes a plurality of selector valves for opening and closing each of the plurality of supply pipes, and At least one of the plurality of supply pipes is opened and closed by the corresponding selector valve. 如請求項11至13中任一項之洗淨單元,其中 上述藥液於上述洗淨路徑中循環。 The cleaning unit of any one of claims 11 to 13, wherein The above-mentioned chemical solution circulates in the above-mentioned cleaning path. 如請求項11至13中任一項之洗淨單元,其進而具備: 沖洗液供給源,其用於供給沖洗液;及 抽吸部,其對於上述多通道閥內進行抽吸;且 於上述洗淨路徑中之上述藥液循環之後,對上述多通道閥供給上述沖洗液,進而藉由上述抽吸部抽吸上述多通道閥內。 The cleaning unit of any one of claims 11 to 13, further comprising: a flushing fluid supply for supplying flushing fluid; and a suction part, which performs suction in the above-mentioned multi-channel valve; and After the chemical liquid circulates in the cleaning path, the flushing liquid is supplied to the multi-channel valve, and the inside of the multi-channel valve is sucked by the suction part. 如請求項15之洗淨單元,其中 重複複數次上述洗淨路徑中之上述藥液循環、於上述藥液循環之後供給上述沖洗液、及供給上述沖洗液之後之上述多通道閥內之抽吸。 The cleaning unit of claim 15, wherein The circulation of the chemical solution in the cleaning path, the supply of the rinse solution after the cycle of the chemical solution, and the suction in the multi-channel valve after the supply of the rinse solution are repeated a plurality of times. 一種多通道閥洗淨方法,其將以被供給用於處理基板之複數種處理液,且可選擇性供給複數種上述處理液中之至少1種之狀態連接於基板處理裝置之多通道閥洗淨,且 上述基板處理裝置具備: 貯槽,其用於供給藥液;及 處理液噴嘴,其用於使用自上述多通道閥供給之上述處理液處理上述基板;且 上述基板處理裝置可切換用於處理上述基板之基板處理模式、與用於至少洗淨上述多通道閥之洗淨模式; 於上述基板處理模式下,藉由供給至上述處理液噴嘴之上述處理液處理上述基板; 於上述洗淨模式下,於不經由上述處理液噴嘴而經由上述貯槽與上述多通道閥之路徑即洗淨路徑中,自上述貯槽向上述多通道閥供給上述藥液;且 於上述洗淨模式下,具備洗淨上述多通道閥之步驟。 A multi-channel valve cleaning method, which is connected to a multi-channel valve cleaning device of a substrate processing apparatus in a state in which a plurality of processing liquids for processing a substrate are supplied, and at least one of the plurality of above-mentioned processing liquids can be selectively supplied clean, and The above-mentioned substrate processing apparatus includes: Reservoirs for supplying medicinal liquids; and a processing liquid nozzle for processing the substrate using the processing liquid supplied from the multi-channel valve; and The substrate processing apparatus can switch between a substrate processing mode for processing the substrate and a cleaning mode for cleaning at least the multi-channel valve; In the substrate processing mode, the substrate is processed by the processing liquid supplied to the processing liquid nozzle; In the cleaning mode, the chemical solution is supplied from the storage tank to the multi-channel valve in a cleaning path that does not pass through the processing liquid nozzle but passes through the storage tank and the multi-channel valve; and In the above-mentioned cleaning mode, a step of cleaning the above-mentioned multi-channel valve is provided.
TW110142931A 2020-12-28 2021-11-18 Substrate processing apparatus, cleaning unit, and cleaning method for multiple valve TWI816227B (en)

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