TW202223371A - Non-destructive x-ray coupled synchronous-scan mechanism and calibration method thereof - Google Patents
Non-destructive x-ray coupled synchronous-scan mechanism and calibration method thereof Download PDFInfo
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本發明係關於一種掃描機構;更詳而言之,特別係指一種非破壞性X光聯動同步掃描機構及其校正方法。The present invention relates to a scanning mechanism; more specifically, it particularly refers to a non-destructive X-ray linkage synchronous scanning mechanism and its calibration method.
一般IC封裝產業在產品封膠後為了確保其良率,大多會採用超音波掃瞄顯微鏡(SAT)進行檢測,而該檢測方法是將封膠後的產品放置於純水中,並以頻率高於20KHz的超音波來檢測是否有脫層、裂縫、氣洞或其他缺現存在,之後再將完成檢測後的產品烘乾,但只要產品在檢測的過程中吸收水氣而變成不良品,即便檢測後有烘乾的流程,也難以逆轉水氣對產品所造成的影響。Generally, in the IC packaging industry, in order to ensure the yield rate of products after sealing, most of them will use an ultrasonic scanning microscope (SAT) for testing. Use 20KHz ultrasonic to detect whether there is delamination, cracks, air holes or other defects, and then dry the products after the inspection, but as long as the products absorb moisture during the inspection process and become defective products, even if There is a drying process after testing, and it is difficult to reverse the impact of moisture on the product.
有鑑於此,本案申請人遂依其多年從事相關領域之研發經驗,針對前述之缺失進行深入探討,並依前述需求積極尋求解決之道,歷經長時間的努力研究與多次測試,終於完成本發明。In view of this, the applicant of this case, based on his years of experience in research and development in related fields, conducted in-depth discussions on the aforementioned deficiencies, and actively sought solutions based on the aforementioned needs. invention.
本發明之主要目的在於提供一種能快速檢測產品是否有缺陷的掃描機構。The main purpose of the present invention is to provide a scanning mechanism that can quickly detect whether a product is defective.
本發明之次要目的在於簡化現有的檢測步驟。A secondary purpose of the present invention is to simplify the existing detection steps.
為達上述目的,本發明係依照掃描方式的不同而產生以下三種態樣。In order to achieve the above-mentioned purpose, the present invention produces the following three aspects according to different scanning modes.
第一態樣之本發明非破壞性X光聯動同步掃描機構,係包含有放置平台、位移平台、X光發射裝置、偵檢器以及旋轉裝置。The non-destructive X-ray linkage synchronous scanning mechanism of the first aspect of the present invention includes a placing platform, a displacement platform, an X-ray emitting device, a detector and a rotating device.
所述放置平台係用於放置待檢測物,該放置平台上設有鏤空區塊以及設置於鏤空區塊周圍的定位塊。The placing platform is used for placing the object to be detected, and the placing platform is provided with a hollow block and a positioning block arranged around the hollow block.
所述位移平台係設置於放置平台下方,該位移平台係讓放置平台沿著X軸或Y軸移動。The displacement platform is arranged below the placement platform, and the displacement platform allows the placement platform to move along the X axis or the Y axis.
所述X光發射裝置係設置於放置平台上方。The X-ray emitting device is arranged above the placing platform.
所述偵檢器係設置於放置平台以及位移平台的下方,且該偵檢器係與X光發射裝置保持在同一直線上。The detector is arranged below the placing platform and the displacement platform, and the detector and the X-ray emitting device are kept on the same straight line.
所述旋轉裝置係由和X光發射裝置連結的上旋轉裝置以及和偵檢器連結的下旋轉裝置所組成,且該上旋轉裝置、下旋轉裝置係分別讓X光發射裝置和偵檢器以待檢測物為中心進行獨立轉動,且上旋轉裝置、下旋轉裝置轉動的同時,偵檢器與X光發射裝置仍會保持在同一直線上。The rotating device is composed of an upper rotating device connected with the X-ray emitting device and a lower rotating device connected with the detector, and the upper rotating device and the lower rotating device are respectively made by the X-ray emitting device and the detector. The object to be detected rotates independently around the center, and the detector and the X-ray emitting device will remain on the same straight line while the upper rotating device and the lower rotating device are rotating.
第二態樣之本發明非破壞性X光聯動同步掃描機構,係包含有放置平台、位移平台、X光發射裝置、偵檢器以及旋轉裝置。The non-destructive X-ray linkage synchronous scanning mechanism of the second aspect of the present invention includes a placing platform, a displacement platform, an X-ray emitting device, a detector and a rotating device.
所述放置平台係用於放置待檢測物,該放置平台上設有鏤空區塊以及設置於鏤空區塊周圍的定位塊;The placing platform is used for placing the object to be detected, and the placing platform is provided with a hollow block and a positioning block arranged around the hollow block;
所述位移平台係設置於放置平台下方,該位移平台係讓放置平台沿著X軸或Y軸移動;The displacement platform is arranged below the placement platform, and the displacement platform is to allow the placement platform to move along the X-axis or the Y-axis;
所述X光發射裝置係設置於放置平台上方;The X-ray emitting device is arranged above the placing platform;
所述偵檢器係設置於放置平台以及位移平台的下方,且該偵檢器係與X光發射裝置保持在同一直線上;The detector is arranged below the placement platform and the displacement platform, and the detector and the X-ray emitting device are kept on the same straight line;
所述旋轉裝置係由旋轉支架以及與旋轉支架連結的傳動裝置所組成,該旋轉支架於遠離傳動裝置的一端係同時連結X光發射裝置和偵檢器,並使X光發射裝置和偵檢器以待檢測物為中心進行轉動,且旋轉支架在轉動時偵檢器與X光發射裝置仍會保持在同一直線上。The rotating device is composed of a rotating bracket and a transmission device connected with the rotating bracket. The rotating bracket is connected with the X-ray emission device and the detector at the end away from the transmission device, and makes the X-ray emission device and the detector. Rotate with the object to be detected as the center, and the detector and the X-ray emitting device will remain on the same straight line when the rotating bracket rotates.
第三態樣之本發明非破壞性X光聯動同步掃描機構,係包含有放置平台、位移平台、X光發射裝置以及偵檢器。The non-destructive X-ray linkage synchronous scanning mechanism of the third aspect of the present invention includes a placement platform, a displacement platform, an X-ray emitting device and a detector.
所述放置平台係用於放置待檢測物,該放置平台上設有鏤空區塊以及設置於鏤空區塊周圍的定位塊。The placing platform is used for placing the object to be detected, and the placing platform is provided with a hollow block and a positioning block arranged around the hollow block.
所述位移平台係包含有位於放置平台上方的上層XY軸移動裝置,以及位於放置平台下方的下層XY軸移動裝置,且該放置平台上設有增加上層XY軸移動裝置穩定度的上層輔助滑軌,此外該放置平台上方設有增加下層XY軸移動裝置穩定度的下層輔助滑軌。The displacement platform includes an upper-layer XY-axis moving device located above the placing platform, and a lower-layer XY-axis moving device located below the placing platform, and the placing platform is provided with an upper-layer auxiliary slide rail that increases the stability of the upper-layer XY-axis moving device , in addition, a lower auxiliary slide rail is arranged above the placing platform to increase the stability of the lower XY axis moving device.
所述位移平台係位於放置平台下方,該下層位移平台包含有下層XY軸移動裝置、設置於下層XY軸移動裝置上的下層調整座、設置於下層調整座上的偵檢器以及和下層XY軸移動裝置連結的下層輔助滑軌。The displacement platform is located under the placement platform, and the lower displacement platform includes a lower XY axis moving device, a lower adjusting seat arranged on the lower XY axis moving device, a detector arranged on the lower adjusting seat, and a lower XY axis. The lower auxiliary slide to which the mobile device is attached.
所述X光發射裝置係透過上層調整座與上層XY軸移動裝置連結。The X-ray emitting device is connected with the upper XY axis moving device through the upper adjusting seat.
所述偵檢器係透過下層調整座與下層XY軸移動裝置連結。The detector is connected with the lower XY axis moving device through the lower adjustment seat.
此外,為了確保上述機構檢測的準確率,本發明另再提供一種非破壞性X光聯動同步掃描機構的校正方法,係將一外觀為透明且其內部具有多個以不同深度及距離排列的不透明檢測元件的校正裝置放置於放置平台上,並轉動X光發射裝置和偵檢器,使其以多個不同的位置或角度掃描校正裝置並建立出檢測元件的掃描軌跡圖,之後將掃描軌跡圖和標準軌跡圖比對,判斷掃描軌跡圖上的軌跡範圍是否有變大、變小或變形的情況發生,最後再根據掃描軌跡圖和標準軌跡圖的差異來進行X光發射裝置或偵檢器的校正。In addition, in order to ensure the accuracy of the above-mentioned mechanism detection, the present invention further provides a method for calibrating a non-destructive X-ray linkage synchronous scanning mechanism. The calibration device of the detection element is placed on the placing platform, and the X-ray emission device and the detector are rotated to scan the calibration device at a number of different positions or angles to establish the scanning trajectory map of the detection element, and then the scanning trajectory map will be scanned. Compare with the standard trajectory map to determine whether the trajectory range on the scanning trajectory map has become larger, smaller or deformed. Finally, according to the difference between the scanning trajectory map and the standard trajectory map, the X-ray emission device or detector will be used. 's correction.
本發明非破壞性X光聯動同步掃描機構及其校正方法之特色在於,只使用X光照設待檢測物來快速得知其內部狀況並以此來簡化檢測流程,此外本發明建立明確的校正制度來將量測誤差降到最低。The characteristics of the non-destructive X-ray linkage synchronous scanning mechanism and its calibration method of the present invention are that only X-rays are used to set the object to be inspected to quickly know its internal conditions, thereby simplifying the inspection process. In addition, the present invention establishes a clear calibration system to minimize measurement errors.
為期許本發明之目的、功效、特徵及結構能夠有更為詳盡之瞭解,茲舉較佳實施例並配合圖式說明如後。In order to allow a more detailed understanding of the purpose, effect, features and structure of the present invention, preferred embodiments are given and described in conjunction with the drawings as follows.
首先請同時參閱圖1、圖2以及圖3。First, please refer to Figure 1, Figure 2 and Figure 3 at the same time.
圖1為第一態樣之本發明非破壞性X光聯動同步掃描機構示意圖,圖2為第一態樣之本發明非破壞性X光聯動同步掃描機構俯視示意圖,圖3為第一態樣之本發明非破壞性X光聯動同步掃描機構側視示意圖。1 is a schematic diagram of the non-destructive X-ray linked synchronous scanning mechanism of the present invention according to the first aspect, FIG. 2 is a schematic top view of the non-destructive X-ray linked synchronous scanning mechanism of the present invention according to the first aspect, and FIG. 3 is the first aspect The schematic side view of the non-destructive X-ray linkage synchronous scanning mechanism of the present invention.
第一態樣之本發明非破壞性X光聯動同步掃描機構1,係包含有放置平台11、位移平台12、X光發射裝置13、偵檢器14以及旋轉裝置15。The non-destructive X-ray linkage
所述放置平台11係用於放置待檢測物,該放置平台11上設有鏤空區塊111以及設置於鏤空區塊111周圍並用於固定待檢測物位置的定位塊112,且該鏤空區塊111上還設有能讓光線穿透的透明板材,此外該待檢測物可為IC封裝產品、高階PCB電路板、鋰電池、液晶面板…等。The placing
所述位移平台12係設置於放置平台11下方,該位移平台12係讓放置平台11沿著X軸或Y軸移動,讓本發明可將放置於放置平台11上的待檢測物移動至特定位置。The
所述X光發射裝置13係設置於放置平台11上方,該X光發射裝置13係用於發出檢測用的X光。The
所述偵檢器14係設置於放置平台11以及位移平台12的下方,該偵檢器14係用於接收X光照射待檢測物後所產生的影像,且該偵檢器14係與X光發射裝置13保持在同一直線上。The
所述旋轉裝置15係由和X光發射裝置13連結的上旋轉裝置151以及和偵檢器14連結的下旋轉裝置152所組成,且該上旋轉裝置151、下旋轉裝置152係分別讓X光發射裝置13和偵檢器14以待檢測物為中心進行獨立轉動,使本發明能以多種不同的角度來照射待檢測物,且上旋轉裝置151、下旋轉裝置152轉動的同時,偵檢器14與X光發射裝置13仍會保持在同一直線上。The
有關於第一態樣之本發明實施方式及相關可供參考圖式詳述如下所示:The detailed description of the first aspect of the present invention and related drawings for reference are as follows:
第一態樣之本發明在實際操作上係將待檢測物放置於透明板材上,並再利用定位塊112固定住待檢測物來避免其在檢測的過程中移動而影響檢測結果,當確認待檢測物固定至定位後即可開始進行檢測。In the first aspect of the present invention, in practice, the object to be detected is placed on the transparent plate, and the
接著,當檢測開始時,位移平台12會開始移動放置平台11,使待檢測物需要檢測的部位移動至X光發射裝置13下方,並以X光照射該檢測部位,接著再分別轉動X光發射裝置13和偵檢器14並以不同的角度來照射待檢測物同樣的部位,使本發明能更完整的對待檢測物進行分析。Then, when the detection starts, the
再來,當本發明從該部位取得足夠的影像資訊後,位移平台12便會再次移動,使下一個需檢測的部位被移動至X光發射裝置13下方,並再一次透過X光發射裝置13以多種不同的角度照射該部位,之後再不斷的重複前述動作直到待檢測物上所有需被檢測的部位均經過X光發射裝置13的拍攝。Then, when the present invention obtains enough image information from the part, the
最後,本發明將拍得的X光影像傳送至圖像處理裝置進行讀取以及影像的校正,之後再經由2D或3D的影像處理將X光影像呈現在顯示器上,讓檢測者根據影像結果來判斷待檢測物是否有瑕疵。Finally, the present invention transmits the captured X-ray image to the image processing device for reading and image correction, and then presents the X-ray image on the display through 2D or 3D image processing, allowing the inspector to make a judgment based on the image result. Determine whether the object to be tested is defective.
續請同時參閱圖4、圖5以及圖6。Please refer to Figure 4, Figure 5 and Figure 6 at the same time.
圖4為第二態樣之本發明非破壞性X光聯動同步掃描機構示意圖,圖5為第二態樣之本發明非破壞性X光聯動同步掃描機構俯視示意圖,圖6為第二態樣之本發明非破壞性X光聯動同步掃描機構側視示意圖。4 is a schematic diagram of the non-destructive X-ray linked synchronous scanning mechanism of the present invention in the second aspect, FIG. 5 is a schematic top view of the non-destructive X-ray linked synchronous scanning mechanism of the present invention in the second aspect, and FIG. 6 is the second aspect The schematic side view of the non-destructive X-ray linkage synchronous scanning mechanism of the present invention.
而第二態樣之本發明非破壞性X光聯動同步掃描機構1,係包含有放置平台11、位移平台12、X光發射裝置13、偵檢器14以及旋轉裝置15。The non-destructive X-ray linkage
所述放置平台11係用於放置待檢測物,該放置平台11上設有鏤空區塊111以及設置於鏤空區塊111周圍並用於固定待檢測物位置的定位塊112,且該鏤空區塊111上還設有能讓光線穿透的透明板材,此外該待檢測物可為IC封裝產品、高階PCB電路板、鋰電池、液晶面板…等。The placing
所述位移平台12係設置於放置平台11下方,該位移平台12係讓放置平台11沿著X軸或Y軸移動,讓本發明可將放置於放置平台11上的待檢測物移動至特定位置。The
所述X光發射裝置13係設置於放置平台11上方,該X光發射裝置13係用於發出檢測用的X光。The
所述偵檢器14係設置於放置平台11以及位移平台12的下方,該偵檢器14係用於接收X光照射待檢測物後所產生的影像,且該偵檢器14係與X光發射裝置13保持在同一直線上。The
所述旋轉裝置15係由旋轉支架153以及與旋轉支架153連結的傳動裝置154所組成,該旋轉支架153於遠離傳動裝置154的一端係同時連結X光發射裝置13和偵檢器14,並使X光發射裝置13和偵檢器14以待檢測物為中心進行轉動,且旋轉支架153在轉動時偵檢器14與X光發射裝置13仍會保持在同一直線上。The
有關於第二態樣之本發明實施方式及相關可供參考圖式詳述如下所示:The detailed description of the second aspect of the present invention and related drawings for reference are as follows:
第二態樣之本發明在實際操作上係將待檢測物放置於透明板材上,並再利用定位塊112固定住待檢測物來避免其在檢測的過程中移動而影響檢測結果,當確認待檢測物固定至定位後即可開始進行檢測。In the second aspect of the present invention, in practice, the object to be detected is placed on the transparent plate, and the
接著,當檢測開始時,位移平台12會開始移動放置平台11,使待檢測物需要檢測的部位移動至X光發射裝置13下方,並以X光照射該檢測部位,接著旋轉支架153會同時轉動X光發射裝置13和偵檢器14並以不同的角度來照射待檢測物同樣的部位,使本發明能更完整的對待檢測物進行分析。Then, when the detection starts, the
再來,當本發明從該部位取得足夠的影像資訊後,位移平台12便會再次移動,使下一個需檢測的部位被移動至X光發射裝置13下方,並再一次透過X光發射裝置13以多種不同的角度照射該部位,之後再不斷的重複前述動作直到待檢測物上所有需被檢測的部位均經過X光發射裝置13的拍攝。Then, when the present invention obtains enough image information from the part, the
最後,本發明將拍得的X光影像傳送至圖像處理裝置進行讀取以及影像的校正,之後再經由2D或3D的影像處理將X光影像呈現在顯示器上,讓檢測者根據影像結果來判斷待檢測物是否有瑕疵。Finally, the present invention transmits the captured X-ray image to the image processing device for reading and image correction, and then presents the X-ray image on the display through 2D or 3D image processing, allowing the inspector to make a judgment based on the image result. Determine whether the object to be tested is defective.
續請同時參閱圖7以及圖8。Continued please refer to Figure 7 and Figure 8 at the same time.
圖7為第三態樣之本發明非破壞性X光聯動同步掃描機構示意圖,圖8為第三態樣之本發明非破壞性X光聯動同步掃描機構側視示意圖。7 is a schematic diagram of the non-destructive X-ray linkage synchronous scanning mechanism of the present invention in the third aspect, and FIG. 8 is a schematic side view of the non-destructive X-ray linkage synchronous scanning mechanism of the present invention in the third aspect.
而第三態樣之本發明非破壞性X光聯動同步掃描機構1,係包含有放置平台11、位移平台12、X光發射裝置13以及偵檢器14。The non-destructive X-ray linkage
所述放置平台11係用於放置待檢測物,該放置平台11上設有鏤空區塊111以及設置於鏤空區塊111周圍的定位塊112,且該鏤空區塊111上還設有能讓光線穿透的透明板材,此外該待檢測物可為IC封裝產品、高階PCB電路板、鋰電池、液晶面板…等。The placing
所述位移平台12係包含有位於放置平台11上方的上層XY軸移動裝置121,以及位於放置平台11下方的下層XY軸移動裝置122,且該放置平台11上設有增加上層XY軸移動裝置121穩定度的上層輔助滑軌1211,此外該放置平台11上方設有增加下層XY軸移動裝置122穩定度的下層輔助滑軌1221,又該上層XY軸移動裝置121和下層XY軸移動裝置122係與同步電控裝置電性連結以確保上層XY軸移動裝置121和下層XY軸移動裝置122能同步移動至相同位置。The
所述X光發射裝置13係透過上層調整座與上層XY軸移動裝置121連結。The
所述偵檢器14係透過下層調整座與下層XY軸移動裝置122連結。The
有關於第三態樣之本發明實施方式及相關可供參考圖式詳述如下所示:The detailed description of the third aspect of the present invention and related drawings for reference are as follows:
第三態樣之本發明在實際操作上係將待檢測物放置於透明板材上,並再利用定位塊112固定住待檢測物來避免其在檢測的過程中移動而影響檢測結果,當確認待檢測物固定至定位後即可開始進行檢測。In the present invention of the third aspect, in practice, the object to be detected is placed on the transparent plate, and the
接著,當檢測開始時,上層XY軸移動裝置121和下層XY軸移動裝置122會分別將X光發射裝置13和偵檢器14移動至待檢測物需要檢測部位的上方和下方後,再以X光照射該檢測部位後,之後將X光發射裝置13和偵檢器14移動至下一個需檢測部位的上方和下方,並直到所有需被檢測的部位均經過X光發射裝置13的拍攝。Then, when the detection starts, the upper XY-
最後,本發明將拍得的X光影像傳送至圖像處理裝置進行讀取以及影像的校正,之後再經由2D或3D的影像處理將X光影像呈現在顯示器上,讓檢測者根據影像結果來判斷待檢測物是否有瑕疵。Finally, the present invention transmits the captured X-ray image to the image processing device for reading and image correction, and then presents the X-ray image on the display through 2D or 3D image processing, allowing the inspector to make a judgment based on the image result. Determine whether the object to be tested is defective.
續請同時參閱圖9以及圖10並搭配圖1。Continued, please refer to FIG. 9 and FIG. 10 together with FIG. 1 at the same time.
圖9為本發明之掃描校正示意圖,圖10為本發明之標準影像軌跡示意圖。FIG. 9 is a schematic diagram of scanning calibration of the present invention, and FIG. 10 is a schematic diagram of a standard image trajectory of the present invention.
此外,為了確保上述機構檢測的準確率,本發明另再提供一種非破壞性X光聯動同步掃描機構1的校正方法,係將一外觀為透明且其內部具有多個以不同深度及距離排列的不透明檢測元件21的校正裝置2放置於放置平台11上,並轉動X光發射裝置13和偵檢器14,使其以多個不同的位置或角度掃描校正裝置2並建立出檢測元件21的掃描軌跡圖,之後將掃描軌跡圖和標準軌跡圖比對,判斷掃描軌跡圖上的軌跡範圍是否有變大、變小或變形的情況發生,最後再根據掃描軌跡圖和標準軌跡圖的差異來進行X光發射裝置13或偵檢器14的校正,而該檢測元件21係選用點、線、平面或立體物任意其中一種。In addition, in order to ensure the accuracy of the above-mentioned mechanism detection, the present invention further provides a method for calibrating the non-destructive X-ray linkage
而X光發射裝置13和偵檢器14在完全無誤差下所拍得的檢測元件21影像尺寸會和實際尺寸一致,且軌跡範圍也會和理論計算值相符。The size of the image of the
續請同時參閱圖11以及圖12並搭配圖9和圖10。Continued, please refer to FIG. 11 and FIG. 12 together with FIG. 9 and FIG. 10 .
圖11為本發明之偵檢器前後偏移影像軌跡示意圖(一),圖12為本發明之偵檢器前後偏移影像軌跡示意圖(二)。FIG. 11 is a schematic diagram (1) of the front and rear offset image trajectories of the detector of the present invention, and FIG. 12 is a schematic diagram (2) of the front and rear offset image trajectories of the detector of the present invention.
當偵檢器14有前後偏移的狀況,會使擷取到的影像兩端呈現大小不一的情況,當偵檢器14向前偏移時會造成軌跡圖上面的軌跡範圍變小,下面的軌跡範圍變大,且檢測元件21的影像呈現出上大下小的情況。When the
又當偵檢器14向後偏移時,則會造成軌跡圖上面的軌跡範圍變大,下面的軌跡範圍變小,且檢測元件21的影像呈現出上小下大的情況。When the
續請同時參閱圖13以及圖14並搭配圖9和圖10。Continued, please refer to FIGS. 13 and 14 together with FIGS. 9 and 10 .
圖13為本發明之偵檢器左右偏移影像軌跡示意圖(一),圖14為本發明之偵檢器左右偏移影像軌跡示意圖(二)。FIG. 13 is a schematic diagram (1) of the left and right shifting image trajectory of the detector according to the present invention, and FIG. 14 is a schematic diagram (2) of the left and right shifting image trajectory of the detector according to the present invention.
當偵檢器14向左偏移時,則會造成軌跡圖的右端高於左端,而檢測元件21則是會顯示出統一尺寸的影像。When the
此外,當偵檢器14向右偏移時,則會造成軌跡圖的左端高於右端,而檢測元件21也是會顯示出統一尺寸的影像。In addition, when the
因此,當本發明在利用校正裝置2進行校正時若發現偵檢器14有前、後、左、右偏移時,只要將各個軌跡之間的距離以及檢測元件21之間的距離進行計算,即可得知校正值並確保本發明的掃瞄正確性。Therefore, when the present invention finds that the
綜合上述,本發明非破壞性X光聯動同步掃描機構及其校正方法優點在於,只使用X光照設待檢測物來快速得知其內部狀況並以此來簡化檢測流程,此外本發明建立明確的校正制度來將量測誤差降到最低。To sum up the above, the advantages of the non-destructive X-ray linkage synchronous scanning mechanism and its calibration method of the present invention are that only X-rays are used to set the object to be inspected to quickly know its internal conditions and thus simplify the inspection process. In addition, the present invention establishes a clear Calibration system to minimize measurement error.
故,本發明在同類產品中具有極佳之進步性以及實用性,同時查遍國內外關於此類結構之技術資料文獻後,確實未發現有相同或近似之構造存在於本案申請之前,因此本案應已符合『創作性』、『合於產業利用性』以及『進步性』的專利要件,爰依法提出申請之。Therefore, the present invention has excellent progress and practicability among similar products, and at the same time, after searching domestic and foreign technical data and documents about such structures, it is true that no identical or similar structures exist before the application in this case. Therefore, this case The patent requirements for "creativeness", "suitability for industrial utilization" and "progressiveness" should be met, and the application should be filed in accordance with the law.
唯,以上所述者,僅係本發明之較佳實施例而已,舉凡應用本發明說明書及申請專利範圍所為之其它等效結構變化者,理應包含在本發明之申請專利範圍內。However, the above are only preferred embodiments of the present invention, and other equivalent structural changes made by applying the description of the present invention and the scope of the patent application should be included in the scope of the patent application of the present invention.
1:非破壞性 X:光聯動同步掃描機構 11:放置平台 111:鏤空區塊 112:定位塊 12:位移平台 121:上層XY軸移動裝置 1211:上層輔助滑軌 122:下層XY軸移動裝置 1221:下層輔助滑軌 13:X光發射裝置 14:偵檢器 15:旋轉裝置 151:上旋轉裝置 152:下旋轉裝置 153:旋轉支架 154:傳動裝置 2:校正裝置 21:檢測元件 1: Non-destructive X: Optical linkage synchronous scanning mechanism 11: Place the platform 111: Hollow block 112: Positioning block 12: Displacement platform 121: Upper XY axis moving device 1211: Upper Auxiliary Rail 122: Lower XY axis moving device 1221: Lower Auxiliary Rails 13: X-ray emission device 14: Detector 15: Rotary device 151: Upper Rotary Device 152: Lower rotation device 153: Swivel bracket 154: Transmission 2: Correction device 21: Detection element
圖1:第一態樣之本發明非破壞性X光聯動同步掃描機構示意圖; 圖2:第一態樣之本發明非破壞性X光聯動同步掃描機構俯視示意圖; 圖3:第一態樣之本發明非破壞性X光聯動同步掃描機構側視示意圖; 圖4:第二態樣之本發明非破壞性X光聯動同步掃描機構示意圖; 圖5:第二態樣之本發明非破壞性X光聯動同步掃描機構俯視示意圖; 圖6:第二態樣之本發明非破壞性X光聯動同步掃描機構側視示意圖; 圖7:第三態樣之本發明非破壞性X光聯動同步掃描機構示意圖; 圖8:第三態樣之本發明非破壞性X光聯動同步掃描機構側視示意圖; 圖9:本發明之掃描校正示意圖; 圖10:本發明之標準影像軌跡示意圖; 圖11:本發明之偵檢器前後偏移影像軌跡示意圖(一); 圖12:本發明之偵檢器前後偏移影像軌跡示意圖(二); 圖13:本發明之偵檢器左右偏移影像軌跡示意圖(一); 圖14:本發明之偵檢器左右偏移影像軌跡示意圖(二); Figure 1: Schematic diagram of the non-destructive X-ray linkage synchronous scanning mechanism of the present invention in the first aspect; Figure 2: a schematic top view of the non-destructive X-ray linkage synchronous scanning mechanism of the present invention in the first aspect; Figure 3: a schematic side view of the non-destructive X-ray linkage synchronous scanning mechanism of the present invention in the first aspect; Figure 4: A schematic diagram of the non-destructive X-ray linkage synchronous scanning mechanism of the second aspect of the present invention; 5: A schematic top view of the non-destructive X-ray linkage synchronous scanning mechanism of the present invention in the second aspect; Figure 6: a schematic side view of the non-destructive X-ray linkage synchronous scanning mechanism of the second aspect of the present invention; Fig. 7: Schematic diagram of the non-destructive X-ray linkage synchronous scanning mechanism of the present invention in the third aspect; Figure 8: a schematic side view of the non-destructive X-ray linkage synchronous scanning mechanism of the third aspect of the present invention; Figure 9: a schematic diagram of scanning calibration of the present invention; Figure 10: Schematic diagram of the standard image trajectory of the present invention; Figure 11: Schematic diagram of the front and rear offset image tracks of the detector of the present invention (1); Figure 12: Schematic diagram (2) of the front and rear offset image tracks of the detector of the present invention; Figure 13: Schematic diagram (1) of the left and right offset image trajectory of the detector of the present invention; Figure 14: Schematic diagram (2) of the left and right offset image trajectory of the detector of the present invention;
無。none.
1:非破壞性X光聯動同步掃描機構 1: Non-destructive X-ray linkage synchronous scanning mechanism
11:放置平台 11: Place the platform
111:鏤空區塊 111: Hollow block
112:定位塊 112: Positioning block
12:位移平台 12: Displacement platform
13:X光發射裝置 13: X-ray emission device
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