TW202218265A - Connector for electrical connection - Google Patents
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- TW202218265A TW202218265A TW110139985A TW110139985A TW202218265A TW 202218265 A TW202218265 A TW 202218265A TW 110139985 A TW110139985 A TW 110139985A TW 110139985 A TW110139985 A TW 110139985A TW 202218265 A TW202218265 A TW 202218265A
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/648—Protective earth or shield arrangements on coupling devices, e.g. anti-static shielding
- H01R13/658—High frequency shielding arrangements, e.g. against EMI [Electro-Magnetic Interference] or EMP [Electro-Magnetic Pulse]
- H01R13/6581—Shield structure
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/648—Protective earth or shield arrangements on coupling devices, e.g. anti-static shielding
- H01R13/658—High frequency shielding arrangements, e.g. against EMI [Electro-Magnetic Interference] or EMP [Electro-Magnetic Pulse]
- H01R13/6598—Shield material
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- Coupling Device And Connection With Printed Circuit (AREA)
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Abstract
Description
本發明涉及配置於受檢設備與測試裝置之間的電連接用連接器。The present invention relates to a connector for electrical connection arranged between a device under inspection and a test apparatus.
在用於判斷如所製作的半導體設備的受檢設備是否不良的檢查程序中,在受檢設備與測試(test)裝備之間配置有電連接用連接器。已知一種檢查方法,即,電連接用連接器將受檢設備與測試裝置電連接,基於受檢設備與測試裝置是否通電來判斷受檢設備是否不良。In an inspection procedure for determining whether or not a device under inspection such as a fabricated semiconductor device is defective, a connector for electrical connection is arranged between the device under inspection and test equipment. There is known an inspection method in which an electrical connection connector electrically connects a device under inspection and a test device, and determines whether or not the device under inspection is defective based on whether or not the device under inspection and the test device are energized.
倘若在沒有電連接用連接器的情況下,受檢設備的端子直接與測試裝置的端子相接觸,則在反復的檢查過程中會導致測試裝置的端子磨損或破損,從而發生需要更換整個測試裝置的需求。可利用電連接用連接器來防止發生需要更換整個測試裝置的需求。If the terminals of the device under test are in direct contact with the terminals of the test device without a connector for electrical connection, the terminals of the test device will be worn or damaged during repeated inspections, resulting in the need to replace the entire test device. demand. Connectors for electrical connection can be used to prevent the need to replace the entire test set.
電連接用連接器可用於利用作為高頻訊號的射頻(Radio Frequency,RF)訊號的檢查方法。在利用射頻訊號的檢查方法的情況下,需要根據射頻訊號的頻帶匹配電連接用連接器的阻抗值。The connector for electrical connection can be used for an inspection method using a radio frequency (RF) signal, which is a high-frequency signal. In the case of the inspection method using the radio frequency signal, it is necessary to match the impedance value of the connector for electrical connection according to the frequency band of the radio frequency signal.
電連接用連接器可包括與受檢設備的端子相接觸的多個導電部。可透過向多個導電部施加射頻訊號來確認受檢設備與測試裝置是否通電。若向多個導電部施加射頻訊號,則多個導電部可能相互電磁影響。The connector for electrical connection may include a plurality of conductive portions that are in contact with the terminals of the device under test. Whether the device under test and the test device are powered on can be confirmed by applying radio frequency signals to the plurality of conductive parts. If a radio frequency signal is applied to the plurality of conductive parts, the plurality of conductive parts may electromagnetically influence each other.
發明所欲解決之問題The problem that the invention seeks to solve
本發明的多個實施例提供與受檢設備的穩定的電連接並輕鬆匹配阻抗值的電連接用連接器。Various embodiments of the present invention provide a connector for electrical connection that provides stable electrical connection to the device under test and easy matching of impedance values.
並且,本發明的多個實施例提供減少多個導電部相互之間的電磁影響的電連接用連接器。Also, various embodiments of the present invention provide a connector for electrical connection that reduces the electromagnetic influence between a plurality of conductive parts.
在利用射頻訊號的檢查方法中,電連接用連接器需要具有根據檢查方法的條件匹配的阻抗值。電連接用連接器需要根據檢查方法的條件來匹配阻抗值並提供與受檢設備的穩定的電連接。若沒有提供適當的阻抗匹配,則可能因檢查訊號的反射等在具有可靠性的檢查中存在局限性。In the inspection method using a radio frequency signal, the electrical connection connector needs to have an impedance value matched according to the conditions of the inspection method. The connector for electrical connection needs to match the impedance value according to the conditions of the inspection method and provide stable electrical connection with the device under inspection. If proper impedance matching is not provided, there may be limitations in reliable inspection due to reflection of inspection signals, etc.
在電連接用連接器中,隨著導電部的橫截面面積越大,可提供越穩定的受檢設備與電連接用連接器之間的電連接。但是,當考慮到受檢設備的精細化趨勢以及如下要說明的電磁干擾或串擾等時,技術上很難使導電部的大小達到需要水準。In the connector for electrical connection, as the cross-sectional area of the conductive portion becomes larger, more stable electrical connection between the device under test and the connector for electrical connection can be provided. However, it is technically difficult to make the size of the conductive portion meet the required level when considering the trend of refinement of the equipment under inspection, and electromagnetic interference or crosstalk, which will be described below.
在利用射頻訊號的測試中,多個導電部相互之間可發生電磁干擾。電連接用連接器可發生串擾(cross talk;訊號干擾)。當在電連接用連接器發生串擾時,可能無法正常地測量電連接用連接器是否通電。在發生串擾的情況下,利用電連接用連接器的檢查方法的可靠性可能會降低。本發明的多個實施例可解決這種問題。In tests using radio frequency signals, electromagnetic interference may occur between a plurality of conductive parts. Crosstalk (signal interference) may occur with connectors for electrical connection. When crosstalk occurs in the electrical connection connector, it may not be possible to measure whether the electrical connection connector is energized normally. When crosstalk occurs, the reliability of the inspection method using the electrical connection connector may decrease. Embodiments of the present invention address this problem.
本發明的多個實施例透過解決這種問題來輕鬆匹配阻抗值並提供與受檢設備的穩定的電連接。Embodiments of the present invention address this problem by easily matching impedance values and providing a stable electrical connection to the device under test.
本發明的多個實施例可針對導電部的大小提供更多的設計餘裕。Various embodiments of the present invention may provide more design margins for the size of the conductive portion.
並且,本發明的多個實施例可防止電連接用連接器的多個導電部相互之間發生電磁干擾。 解決問題之技術手段 In addition, the various embodiments of the present invention can prevent electromagnetic interference between the conductive parts of the electrical connection connector. technical means to solve problems
本發明的一實施方式提供電連接用連接器的多個實施例。One embodiment of the present invention provides a plurality of examples of electrical connection connectors.
根據一實施例的電連接用連接器配置於受檢設備與測試裝置之間,沿著上下方向導電,以使受檢設備與測試裝置相互電連接,上述電連接用連接器包括:遮罩部,劃分以格子圖案配置的多個格子區域,並沿著上下方向延伸;導電部,在上述格子區域中沿著上下方向延伸,使上述格子區域的上端與上述格子區域的下端導電;以及絕緣部,在上述格子區域中對上述導電部與上述遮罩部進行絕緣。According to an embodiment, the electrical connection connector is disposed between the device under test and the test device, and conducts electricity along the up-down direction, so that the device under test and the test device are electrically connected to each other, and the connector for electrical connection includes: a shield portion a plurality of lattice regions arranged in a lattice pattern are divided and extend in the up-down direction; a conductive portion extends in the up-down direction in the lattice region, so that the upper end of the lattice region and the lower end of the lattice region are electrically conductive; and an insulating portion , insulate the conductive portion and the shield portion in the lattice region.
上述遮罩部可包括:多個第一遮罩壁,沿著一側延伸,並沿著橫穿上述一側的另一側相互隔開;以及多個第二遮罩壁,沿著上述另一側延伸,並沿著上述一側相互隔開。The shield portion may include: a plurality of first shield walls extending along one side and spaced apart from each other along the other side traversing the one side; and a plurality of second shield walls extending along the other side One side extends and is spaced from each other along said side.
上述遮罩部可從上述絕緣部的上端沿著上下方向延伸至上述絕緣部的下端。The shield portion may extend from the upper end of the insulating portion to the lower end of the insulating portion along the vertical direction.
上述遮罩部的上下方向長度可與上述導電部的上下方向長度相同或大於上述導電部的上下方向長度。The vertical length of the shield portion may be the same as or greater than the vertical length of the conductive portion.
上述遮罩部可由金屬材料形成。The above-mentioned mask portion may be formed of a metal material.
上述遮罩部可以以減少向分別位於上述多個格子區域中的上述導電部的電磁干擾的方式橫向包圍上述導電部的外部面。The shield portion may laterally surround the outer surface of the conductive portion so as to reduce electromagnetic interference to the conductive portion respectively located in the plurality of lattice regions.
上述格子區域的橫向剖面可以為矩形形狀。The transverse cross-section of the above-mentioned lattice region may be in a rectangular shape.
上述導電部可包括導電性粒子和導電性金屬線中的至少一個,上述導電性粒子和導電性金屬線中的至少一個可被矽橡膠維持,上述絕緣部可與上述矽橡膠是相同的材質。The conductive portion may include at least one of conductive particles and conductive metal wires, at least one of the conductive particles and conductive metal wires may be maintained by silicone rubber, and the insulating portion may be made of the same material as the silicone rubber.
上述導電部的橫向剖面的直徑長度與上述格子區域的橫向剖面的短邊長度的比例可以為1:2至1:5。The ratio of the length of the diameter of the transverse section of the conductive portion to the length of the short side of the transverse section of the lattice region may be 1:2 to 1:5.
上述導電部的橫向剖面的直徑長度與上述格子區域的橫向剖面的對角線長度之比可以為1:4至1:7。The ratio of the diameter length of the transverse section of the conductive portion to the diagonal length of the transverse section of the lattice region may be 1:4 to 1:7.
上述遮罩部可包括銅、鋁、不銹鋼、銅合金、鋁合金及不銹鋼合金中的至少一種,上述絕緣部可包括矽橡膠。The shielding portion may include at least one of copper, aluminum, stainless steel, copper alloy, aluminum alloy, and stainless steel alloy, and the insulating portion may include silicone rubber.
上述絕緣部可形成多孔性泡沫結構。The above insulating portion may form a porous foam structure.
本發明還可包括:上端膜,附著在上述導電部的上端;以及下端膜,附著在上述導電部的下端。The present invention may further include: an upper end film attached to the upper end of the conductive portion; and a lower end film attached to the lower end of the conductive portion.
上述上端膜可包括與上述導電部的上部電連接的上端墊,上述下端膜可包括與上述導電部的下部電連接的下端墊,上述上端墊、上述導電部及上述下端墊可形成沿著上下方向導電的導電通道,上述導電通道的上下方向長度可大於上述遮罩部的上下方向長度。 對照先前技術之功效 The upper end film may include an upper end pad electrically connected to the upper portion of the conductive portion, the lower end film may include a lower end pad electrically connected to the lower portion of the conductive portion, and the upper end pad, the conductive portion and the lower end pad may be formed along the upper and lower ends. For the conductive channel with conductive direction, the vertical length of the conductive channel may be greater than the vertical length of the shield portion. Efficacy compared to prior art
根據本發明的多個實施例,可提供與受檢設備的穩定的電連接。According to various embodiments of the present invention, a stable electrical connection to the device under test can be provided.
根據本發明的多個實施例,可輕鬆匹配電連接用連接器的阻抗值。According to various embodiments of the present invention, impedance values of electrical connection connectors can be easily matched.
根據本發明的多個實施例,電連接用連接器的導電部的大小設計餘裕可以更大。According to various embodiments of the present invention, the size design margin of the conductive portion of the electrical connection connector can be larger.
根據本發明的多個實施例,可減少電連接用連接器的多個導電部相互之間發生的電磁影響。According to various embodiments of the present invention, it is possible to reduce the electromagnetic influence between the plurality of conductive parts of the electrical connection connector.
本發明的多個實施例以說明本發明的技術思想為目的。本發明的發明要求保護範圍並不局限於如下提出的多個實施例或對於這些多個實施例的具體說明。The various embodiments of the present invention are for the purpose of explaining the technical idea of the present invention. The claimed scope of the present invention is not limited to the various embodiments set forth below or the specific descriptions of these various embodiments.
在本發明中,“實施例”作為用於輕鬆說明本發明的技術思想的任意的區分,各個實施例無需相互排斥。例如,在一實施例中公開的多個結構可在另一實施例中應用並實施,可在不脫離本發明的範圍的前提下變更來應用及實施。In the present invention, the "embodiment" is an arbitrary distinction for easily explaining the technical idea of the present invention, and each embodiment does not need to be mutually exclusive. For example, various structures disclosed in one embodiment may be applied and implemented in another embodiment, and may be applied and implemented with modifications without departing from the scope of the present invention.
除非另有定義,否則在本發明中所使用的所有的技術術語及科技術語具有本發明所屬技術領域的普通技術人員通常所理解的含義。在本發明中使用的所有術語為了更明確的說明本發明的目的而選擇,並不是為了限制本發明的保護範圍而選擇。Unless otherwise defined, all technical and scientific terms used in the present invention have the meanings commonly understood by those of ordinary skill in the art to which the present invention belongs. All terms used in the present invention are selected for the purpose of describing the present invention more clearly, and are not selected for limiting the protection scope of the present invention.
除非在對應表述所包括的語句或句子中另有提及,否則在本發明中使用的如“包括”、“具備”、“具有”等表述應被理解為包括可能包含其他實施例的開放式術語(open-ended terms)。Unless otherwise mentioned in the statement or sentence included in the corresponding expression, expressions such as "comprising", "having", "having" and the like used in the present invention should be understood to include open-ended that may include other embodiments terms (open-ended terms).
在本發明中使用的如“僅由對應結構構成”的表述應理解為除該結構之外排除可能包括其他結構的封閉式術語(closed-ended terms)。Expressions such as "consisting only of the corresponding structure" used in the present invention should be understood to exclude closed-ended terms that may include other structures in addition to that structure.
除非另有提及,否則在本發明中記述的單數型表述可包括複數型的含義,這也同樣適用於發明要求保護範圍中所記載的單數型的表述。Unless otherwise mentioned, the singular expression described in the present invention may include the meaning of the plural form, and the same applies to the singular expression described in the protection scope of the invention.
在本發明中使用的“第一”、“第二”等表述用於相互區分多個結構要素,並非用於限定這些結構要素的順序或重要性。Expressions such as "first" and "second" used in the present invention are used to distinguish a plurality of structural elements from each other, and are not used to limit the order or importance of these structural elements.
在本發明中使用的“上側”、“上”等方向指示語意味著以電連接用連接器100為基準與受檢設備相接觸的方向,“下側”、“下”等方向指示語意味著與上側方向的相反方向。參照第1圖,上側方向可以為以“U”表示的方向,下側方向可以為以“D”表示的方向。並且,在本發明中“橫向”意味著橫穿“上下方向”的方向。這只是用於以能夠明確理解本發明的方式說明的基準,根據基準的不同,可以不同地定義上側及下側。Directional terms such as "upper side" and "upper" used in the present invention mean the direction of contact with the device under test with reference to the
以下,參照多個附圖,對本發明的多個實施例進行說明。在附圖中,對相同或對應的結構要素賦予相同的附圖標記。並且,在以下的多個實施例的說明中,可省略重複記述相同或對應的結構要素。但是,即使省略了與結構要素有關的記述,也並不意味著這種結構要素不包括在一種實施例中。Hereinafter, a plurality of embodiments of the present invention will be described with reference to a plurality of drawings. In the drawings, the same or corresponding structural elements are given the same reference numerals. In addition, in the description of the following embodiments, repeated description of the same or corresponding constituent elements may be omitted. However, even if the description about a structural element is omitted, it does not mean that such a structural element is not included in an embodiment.
第1圖為一實施例的電連接用連接器100的上下方向剖面圖。FIG. 1 is a vertical cross-sectional view of an
一實施例的電連接用連接器100可配置於受檢設備與測試裝置之間。電連接用連接器100可使受檢設備與測試裝置相互電連接。電連接用連接器100可以為沿著上下方向導電的各向異性。The
電連接用連接器100可包括劃分多個區域115的遮罩部110。遮罩部110可沿著上下方向延伸。遮罩部110可沿著上下方向延伸並劃分多個區域115。The
為了便利,被遮罩部110包圍並被劃分的區域115可與遮罩部110隔開規定的距離,但並不局限於此,區域115可以是與遮罩部110的內部面相接觸的區域。多個區域115可分別分離。多個區域115能夠按相同的間距隔開。多個區域115的隔開距離可以為遮罩部110的橫向厚度。多個區域115的配置及基於此的電連接用連接器100的形狀將參照第2圖及第3圖。For convenience, the
電連接用連接器100可包括導電性的導電部120。導電部120可在區域115中沿著上下方向延伸,使區域115的上端與區域115的下端導電。導電部120的上端可以與受檢設備的端子相接觸。導電部120的下端可以與測試裝置的端子相接觸。導電部120的上端與受檢設備的端子之間還可配置具有電導電性的結構,例如,彈性導電體、金屬板等。這種結構能夠進一步改善與測試裝置的電接觸。在導電部120的下端與測試裝置的端子之間,具有導電性的結構能夠以相同或類似的形態追加配置。The
導電部120可分別配置在多個區域115。分別配置在多個區域115的多個導電部120中一部分可以為與受檢設備的接地端子相接觸的接地導電部。接地導電部可將有可能在受檢設備中發生的洩漏電流、靜電等向電連接用連接器100外部釋放。接地導電部120可透過向電連接用連接器100外部釋放洩漏電流、靜電等來防止在電連接用連接器100中發生串擾(crosstalk;訊號干擾)。接地導電部可去除導電部之間的電磁干擾或串擾。The
電連接用連接器100可包括絕緣部130,上述絕緣部130在區域115中對導電部120與遮罩部110進行絕緣。絕緣部130可包括絕緣性的絕緣物質。絕緣部130可填充在區域115中的導電部120與遮罩部110之間。絕緣部130可橫向與導電部120的外部面和遮罩部110的內部面相接觸。The
第2圖為在第1圖中的“A”方向俯視的電連接用連接器100的俯視圖的一例示。FIG. 2 is an example of a plan view of the
作為電連接用連接器100的一例示,如第2圖所示,遮罩部110可劃分圓筒形的區域115。圓筒形的區域115可被遮罩部110所包圍。當區域115是圓筒形時,區域115可具有圓形形狀的橫向剖面。配置在區域115的導電部120的橫向剖面可以為圓形形狀。As an example of the
當區域115和導電部120均可具有圓形形狀的橫向剖面時,導電部120與遮罩部110可隔開規定的距離。導電部120的外部面與遮罩部110的內部面可橫向隔開相同的間距。導電部120的外部面與遮罩部110的內部面之間的距離可沿著導電部120的外周恆定。導電部120的外部面可以為配置有導電性粒子和/或導電性金屬線的虛擬邊界面。虛擬邊界面可基於配置有導電性粒子和/或導電性金屬線的虛擬邊界面的平均大小來設定。When both the
電連接用連接器100可包括絕緣部130,上述絕緣部130在導電部120與遮罩部110之間對導電部120與遮罩部110進行絕緣。絕緣部130的橫向剖面可以為形成內部空腔的氣缸形狀。絕緣部130的橫向厚度可沿著導電部120的外周恆定。絕緣部130的橫向厚度可以為導電部120的外部面與遮罩部110的內部面之間的橫向距離。絕緣部130可以橫向與導電部120的外部面及遮罩部110的內部面相接觸。絕緣部130的內部面可以與導電部120的外部面相接觸,絕緣部130的外部面可以與遮罩部110的內部面相接觸。The
第3圖為在第1圖中的“A”方向俯視的電連接用連接器100的俯視圖的另一例示。Fig. 3 is another example of a plan view of the
作為電連接用連接器100的另一例示,如第3圖所示,遮罩部110可劃分矩形柱(包括正方形柱)的區域115。具有格子圖案的區域115可被稱為格子區域115。矩形柱的區域115可被遮罩部110所包圍。區域115可具有矩形(包括正方形)形狀的橫向剖面。在此情況下,配置在區域115內部的導電部120的橫向剖面可以為圓形形狀。As another example of the
當遮罩部110劃分矩形柱的區域115時,遮罩部110可包括沿著上下方向延伸的壁。遮罩部110可包括多個第一遮罩壁110a,在橫向沿著一側延伸,並沿著橫穿一側的另一側相互隔開。遮罩部110可包括多個第二遮罩壁110b,沿著另一側延伸,並沿著一側相互隔開。When the
多個第一遮罩壁110a相互隔開的距離與多個第二遮罩壁110b相互隔開的距離可相同。多個第一遮罩壁110a和多個第二遮罩壁110b能夠以相互橫穿的方式配置。區域115可被多個第一遮罩壁110a和多個第二遮罩壁110b劃分。The distance by which the plurality of
在電連接用連接器100中,區域115能夠以格子圖案配置。區域115相互之間可按相同的間距配置。區域115相互之間可並排配置。In the
當區域115具有矩形形狀的橫向剖面時,導電部120與遮罩部110之間的距離會沿著導電部120的外周改變。在橫向方向,導電部120的外部面和遮罩部110的內部面可沿著導電部120的外周按不同的間距隔開。隨著導電部120與遮罩部110之間的隔開間距的變化,阻抗值的匹配可以更加簡單。以下,參照第5圖,更加詳細地說明基於導電部120與遮罩部110之間的隔開間距的變化的阻抗值的匹配。When the
電連接用連接器100可包括絕緣部130,上述絕緣部130在導電部120與遮罩部110之間對導電部120和遮罩部110進行絕緣。絕緣部130的橫向剖面可以為內部形成圓形空間的矩形形狀。絕緣部130的橫向厚度可沿著導電部120的外周改變。絕緣部130可與導電部120的外部面和遮罩部110的內部面相接觸。絕緣部130的內部面可與導電部120的外部面相接觸,絕緣部130的外部面可與遮罩部110的內部面相接觸。絕緣部130的內部面可與作為形成導電部120的虛擬的邊界面的導電部120的外部面相接觸。The
第4圖為第3圖所示的電連接用連接器100的一部分的立體圖。FIG. 4 is a perspective view of a part of the
在第4圖中示出的電連接用連接器100的一部分可以為使電連接用連接器100的上側和電連接用連接器100的下側導電的電連接用連接器100的一個單位結構。A part of the
電連接用連接器100的遮罩部110可由金屬材料形成。例如,金屬材料可包括銅、鋁、不銹鋼、銅合金、鋁合金及不銹鋼合金中的至少一種。由金屬材料形成的遮罩部110可橫向包圍分別位於多個區域115的導電部120的外部面。The
分別位於多個區域115的多個導電部120可相互之間產生電磁影響。由金屬材料形成的遮罩部110可橫向包圍多個導電部120的外部面來減少可能發生在各個導電部120的電磁影響。由於遮罩部110已接地,從而可形成用於減少電磁干擾的區域。The plurality of
遮罩部110可橫向包圍導電部120的外部面來減少對導電部120的電磁干擾。導電部120可被遮罩部110電磁性遮罩規定比例。隨著遮罩部110減少對導電部120的電磁干擾,可防止在電連接用連接器100發生如電磁雜訊的串擾。因此,可提升利用電連接用連接器100的檢查方法的可靠性。The
電連接用連接器100的導電部120可包括導電性粒子和/或導電性金屬線121。導電部120可包括用於維持導電性粒子和/或導電性金屬線121的維持部122。維持部122可包括矽橡膠。隨著導電部120包括作為維持部122的矽橡膠,導電部120可具有彈性。The
電連接用連接器100的絕緣部130可以是與矽橡膠相同的材質。電連接用連接器100的絕緣部130可包括絕緣物質。絕緣部130可包括作為絕緣物質的矽橡膠。絕緣部130的絕緣物質可以為與維持導電性粒子和/或導電性金屬線121的導電部120的維持部122相同的材質。隨著絕緣部130包括作為絕緣物質的矽橡膠,絕緣部130可具有彈性。The insulating
電連接用連接器100的遮罩部110可從絕緣部130的上端延伸至絕緣部130的下端。遮罩部110的上端可位於與絕緣部130的上端相同的高度。遮罩部110的下端可位於與絕緣部130的下端相同的高度。遮罩部110可橫向與絕緣部130的外部面相接觸,並相對於絕緣部130的整個上下方向延伸。The
遮罩部110的上下方向長度可與導電部120的上下方向長度相同。當導電部120從絕緣部130的上端延伸至絕緣部130的下端時,遮罩部110可從絕緣部130的上端延伸至絕緣部130的下端。其中,導電部120的上下方向長度可以與遮罩部110的上下方向長度相同。The vertical length of the
遮罩部110的上下方向長度可大於導電部120的上下方向長度。導電部120可延伸與絕緣部130的上下方向長度的一部分。例如,導電部120可延伸絕緣部130的上下方向長度的0.2倍至0.8倍。遮罩部110可從絕緣部130的上端延伸至絕緣部130的下端。其中,遮罩部110的上下方向長度可大於導電部120的上下方向長度。The vertical length of the
隨著遮罩部110的上下方向長度與導電部120的上下方向長度相同或大於導電部120的上下方向長度,遮罩部110可橫向包圍導電部120的上下方向整體長度。As the vertical length of the
第5圖為在第4圖中的“B”方向俯視的電連接用連接器的一部分的俯視圖。參照第5圖,更詳細地說明電連接用連接器100的阻抗值的匹配。Fig. 5 is a plan view of a part of the electrical connection connector viewed in the "B" direction in Fig. 4 . Referring to FIG. 5 , the matching of impedance values of the
當電連接用連接器100使用在利用作為高頻訊號的射頻訊號的檢查方法時,為了提升電力傳輸效率並減少訊號波形扭曲,可根據射頻訊號的頻域對電連接用連接器100的阻抗值進行匹配。電連接用連接器100的阻抗值可基於作為與受檢設備的端子相接觸的一結構的區域115的阻抗值。When the
電連接用連接器100應在匹配阻抗值的同時提供與受檢設備的穩定的電連接。在電連接用連接器100所接觸的受檢設備中,端子的大小可根據作為已設計的端子之間的距離的螺距(pitch)改變。為了與受檢設備的穩定的電連接,電連接用連接器100需要具有大小與受檢設備的端子的大小相對應的導電部120。The
參照第5圖,導電部120的橫向剖面的直徑長度可以為a。導電部120的橫向剖面的直徑可以為以作為配置有導電部120的導電性粒子和/或導電性金屬線121(參照第4圖)的虛擬的邊界面的導電部120的外部面為基準測量的直徑長度的平均。Referring to FIG. 5 , the diameter length of the transverse section of the
區域115的橫向剖面可以為矩形形狀。例如,區域115的橫向剖面的形狀可以為正方形。區域115的橫向剖面的短邊長度可以為b1。區域115的橫向剖面的對角線長度可以為b2。對角線可以為在區域115的橫向剖面中連接相互不相鄰的兩個頂點的線。當區域115是正方形時,由於區域115的橫向剖面的4個邊的長度相同,因此,在區域中,上述短邊長度意味著上述4個邊中任意一個邊長。The transverse cross-section of the
在電連接用連接器100中,區域115的阻抗值可根據如下數學式求出。
[數學式1]
在數學式1中a可以為在橫向剖面的導電部120的直徑長度,b可以為在橫向剖面包圍導電部120的部分,即,可以為填充絕緣部130的區域115的平均邊長。並且,在數學式1中,ε可以為電容率(permittivity;εγ是介電常數),μ可以為磁導率(permeability),L可以為電感量(inductance),C可以為電容量(capacitance)。
In the
以下,比較區域115具有圓形形狀的剖面的情況和區域115具有矩形形狀的剖面的情況。Hereinafter, the case where the
參照第2圖,在區域115具有圓形形狀的剖面的情況下,區域115的平均邊長b可以為區域115的直徑。Referring to FIG. 2 , when the
如第2圖所示,從導電部120至遮罩部110的距離沿著導電部120的外周相同。因此,若確定區域115的平均邊長b,則用於匹配阻抗值的導電部120的直徑長度a也可根據b確定。As shown in FIG. 2 , the distance from the
為了與受檢設備的穩定的電連接,電連接用連接器100應可具有與受檢設備的端子的大小相對應的導電部120的大小。當確定阻抗值Z
0時,導電部120的直徑長度a根據區域115的平均邊長b(區域115的圓形剖面的直徑)確定。因此,可減少能夠改變導電部120的直徑的設計餘裕,從而很難增加導電部120的直徑。因此,很難實現與受檢設備的穩定的電連接。
For stable electrical connection with the device under test, the
參照第3圖,在區域115具有矩形形狀的剖面的情況下,區域115的平均邊長度b可基於區域115的短邊長度、長邊長度及對角線長度來求出。3 , when the
如第5圖所示,從導電部120至遮罩部110的距離可沿著導電部120的外周改變。區域115的橫向剖面的短邊長度可以為b1,區域115的橫向剖面的對角線長度可以為b2。區域115的平均邊長b可以為第5圖所示的b1和b2之間的值。區域115的橫向剖面的對角線長度b2大於短邊長度b1。因此,區域115的平均邊長b可大於短邊長度b1。As shown in FIG. 5 , the distance from the
綜上所述,若區域115具有正方形形狀的剖面,則區域115可具有比區域115具有圓形形狀的剖面的情況更大的平均邊長b。因此,用於匹配阻抗值的導電部120的直徑a可能會增加。In summary, if the
為了與受檢設備穩定地電連接,電連接用連接器100應可具有大小與受檢設備的端子的大小相對應的導電部120。在區域115具有矩形形狀的剖面的情況下,平均邊長度b可相對增加,因此,用於設定設計阻抗Z
0的導電部120的直徑a也可能增加。因此,可提供與受檢設備的穩定的電連接。並且,電連接用連接器100的設計餘裕可能更大。
For stable electrical connection with the device under test, the
當電連接用連接器100的適當阻抗值Z
0已被確定時,導電部120的橫向剖面的直徑長度a與區域115的橫向剖面的短邊長度b1的比例可以為1:2至1:5。
When the appropriate impedance value Z 0 of the
當電連接用連接器100的適當阻抗值Z
0已被確定時,導電部120的橫向剖面的直徑長度a與區域115的橫向剖面的對角線長度b2的比例可以為1:4至1:7。
When an appropriate impedance value Z 0 of the
第6圖為再一實施例的電連接用連接器100的一部分的立體圖。FIG. 6 is a perspective view of a part of an
再一實施例的電連接用連接器100可相同地包括一實施例的電連接用連接器100的結構要素。在附圖中,相同的附圖標記可意味著相同的結構要素。The
在再一實施例的電連接用連接器100中,絕緣部130可形成多孔性泡沫結構。在絕緣部130的多孔性泡沫結構中可形成多個氣孔。隨著絕緣部130形成多孔性泡沫結構,絕緣部130的電容率(誘電率;permittivity)可降低。在絕緣部130的電容率降低的情況下,可更有效地防止電連接用連接器100的多個導電部120相互發生電磁性干擾。隨著絕緣部130形成多孔性泡沫結構,絕緣部130可具有彈性。In yet another embodiment of the
第7圖為另一實施例的電連接用連接器100的上下方向剖面圖。FIG. 7 is a vertical cross-sectional view of an
另一實施例的電連接用連接器100可包括附著在導電部120的上端的上端膜140。上端膜140可包括與導電部120的上部電連接的上端墊141。上端膜140可與導電部120的上部相接觸。上端墊141的形狀及大小可與導電部120的形狀及大小相對應。上端墊141可具有導電性。上端墊141可包括導電性粒子。上端膜140可包括維持上端墊141的上端維持片142。上端維持片142可包括矽膠、矽橡膠及合成樹脂(例如,聚醯亞胺)中的至少一種。維持片142作為膜形狀,可包括矽膠、矽橡膠及合成樹脂。The
另一實施例的電連接用連接器100可包括附著在導電部120的下端的下端膜150。下端膜150可包括與導電部120的下部電連接的下端墊151。下端膜150可與導電部120的下部相接觸。下端墊151的形狀及大小可與導電部120的形狀及大小相對應。下端墊151可具有導電性。下端墊151可包括導電性粒子。下端膜150可包括維持下端墊151的下端維持片152。下端維持片152可包括矽膠、矽橡膠及合成樹脂(例如,聚醯亞胺)中的至少一種。The
上端墊141、導電部120及下端墊151可形成沿著上下方向導電的導電通道160。電連接用連接器100的上端和電連接用連接器100的下端可透過導電通道160導電。The
導電部120的上下方向長度可與遮罩部110的上下方向長度相同或小於遮罩部110的上下方向長度。包括上端墊141、導電部120及下端墊151的導電通道160的上下方向長度可大於遮罩部110的上下方向長度。The vertical length of the
多個實施例提供與受檢設備穩定地電連接的電連接用連接器100。根據本發明的多個實施例,可輕鬆匹配電連接用連接器100的阻抗值。並且,根據本發明的多個實施例,可減少電連接用連接器100的多個導電部120相互之間產生的電磁影響。Various embodiments provide a
以上,雖然透過部分實施例和附圖中所示的例子說明了本發明的技術思想,可在不超出本發明所屬技術領域的普通技術人員可理解的本發明的技術思想及範圍內進行多種置換、變形及變更。並且,這種置換、變形及變更應屬於所附的發明要求保護範圍內。In the above, although the technical idea of the present invention has been described through some embodiments and examples shown in the accompanying drawings, various substitutions can be made within the technical idea and scope of the present invention that can be understood by those skilled in the art to which the present invention belongs. , deformation and alteration. Moreover, such replacements, deformations and changes should fall within the protection scope of the appended invention claims.
100:電連接用連接器
110:遮罩部
110a:第一遮罩壁
110b:第二遮罩壁
115:區域
120:導電部
121:導電性粒子和/或導電性金屬線
122:維持部
130:絕緣部
140:上端膜
141:上端墊
142:上端維持片
150:下端膜
151:下端墊
152:下端維持片
160:導電通道
a、b、b
1、b
2:長度
D:下側方向
U:上側方向
100: connector for electrical connection 110: shield
第1圖為一實施例的電連接用連接器的上下方向剖面圖。 第2圖為在第1圖中的“A”方向俯視的電連接用連接器的俯視圖的一例示。 第3圖為在第1圖中的“A”方向俯視的電連接用連接器的俯視圖的另一例示。 第4圖為第3圖所示的電連接用連接器的一部分的立體圖。 第5圖為在第4圖中的“B”方向俯視的電連接用連接器的一部分的俯視圖。 第6圖為再一實施例的電連接用連接器的一部分的立體圖。 第7圖為另一實施例的電連接用連接器的上下方向剖面圖。 FIG. 1 is a vertical cross-sectional view of an electrical connection connector according to an embodiment. Fig. 2 is an example of a plan view of the electrical connection connector viewed in the "A" direction in Fig. 1 . Fig. 3 is another example of a plan view of the electrical connection connector viewed in the "A" direction in Fig. 1 . FIG. 4 is a perspective view of a part of the electrical connection connector shown in FIG. 3 . Fig. 5 is a plan view of a part of the electrical connection connector viewed in the "B" direction in Fig. 4 . FIG. 6 is a perspective view of a part of an electrical connection connector according to still another embodiment. FIG. 7 is a vertical cross-sectional view of an electrical connection connector according to another embodiment.
100:電連接用連接器 100: Connector for electrical connection
110:遮罩部 110: Mask part
110a:第一遮罩壁 110a: first mask wall
110b:第二遮罩壁 110b: Second mask wall
115:區域 115: Area
120:導電部 120: Conductive part
130:絕緣部 130: Insulation part
Claims (14)
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KR10-2020-0141404 | 2020-10-28 | ||
KR1020200141404A KR102489319B1 (en) | 2020-10-28 | 2020-10-28 | Connector for electrical connection |
Publications (2)
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TW202218265A true TW202218265A (en) | 2022-05-01 |
TWI810694B TWI810694B (en) | 2023-08-01 |
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TW110139985A TWI810694B (en) | 2020-10-28 | 2021-10-28 | Connector for electrical connection |
Country Status (3)
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KR (1) | KR102489319B1 (en) |
TW (1) | TWI810694B (en) |
WO (1) | WO2022092812A1 (en) |
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KR20240015324A (en) * | 2022-07-27 | 2024-02-05 | 주식회사 아이에스시 | Connector for test |
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TW561266B (en) * | 1999-09-17 | 2003-11-11 | Jsr Corp | Anisotropic conductive sheet, its manufacturing method, and connector |
TWI239684B (en) * | 2003-04-16 | 2005-09-11 | Jsr Corp | Anisotropic conductive connector and electric inspection device for circuit device |
JP2005294131A (en) * | 2004-04-02 | 2005-10-20 | Sumitomo Electric Ind Ltd | Anisotropic conductive sheet |
KR200427407Y1 (en) * | 2006-06-02 | 2006-09-26 | 주식회사 아이에스시테크놀러지 | Silicone contactor |
KR100898503B1 (en) * | 2007-09-04 | 2009-05-20 | 주식회사 아이에스시테크놀러지 | Interposer for high frequency |
US8591262B2 (en) * | 2010-09-03 | 2013-11-26 | Pulse Electronics, Inc. | Substrate inductive devices and methods |
KR101762836B1 (en) * | 2015-09-10 | 2017-07-28 | 리노공업주식회사 | A probe socket |
-
2020
- 2020-10-28 KR KR1020200141404A patent/KR102489319B1/en active IP Right Grant
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2021
- 2021-10-27 WO PCT/KR2021/015229 patent/WO2022092812A1/en active Application Filing
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KR20220056641A (en) | 2022-05-06 |
KR102489319B1 (en) | 2023-01-18 |
WO2022092812A1 (en) | 2022-05-05 |
TWI810694B (en) | 2023-08-01 |
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