TW202122941A - Calibration device, calibration method and operating equipment applied thereto capable of adjusting and compensating the operating position of the working device to have a precise alignment - Google Patents

Calibration device, calibration method and operating equipment applied thereto capable of adjusting and compensating the operating position of the working device to have a precise alignment Download PDF

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TW202122941A
TW202122941A TW108145490A TW108145490A TW202122941A TW 202122941 A TW202122941 A TW 202122941A TW 108145490 A TW108145490 A TW 108145490A TW 108145490 A TW108145490 A TW 108145490A TW 202122941 A TW202122941 A TW 202122941A
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calibration
imager
working
center
operating
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TW108145490A
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TWI741442B (en
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陳振元
張簡榮力
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鴻勁精密股份有限公司
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Abstract

Disclosed are a calibration device and a calibration method. A carrier detection program is used for obtaining the position of the supporting part of a carrier after deformation, and implementing the working device detection program; the calibration mechanism of the calibration device is used for obtaining the distance between the calibration part of the calibration workpiece and the working device of the operating unit, so as to know the distance between the first center position of the working imager of the operating unit and the working device; an alignment procedure is executed in order to enable the first center of the working imager to be aligned with the third center of the carrier, so that the deviation between the working device and the supporting part can be obtained; a calibration procedure of the working device is then executed, which is used for calculating a compensation value by using a control mechanism of the calibration device based on the deviation, so as to adjust and compensate the operating position of the working device, thereby having the working device and the supporting part to be precisely aligned, which achieves the practical benefit of improving the accuracy of the operation.

Description

校正裝置、校正方法及其應用之作業設備Correction device, correction method and working equipment for application thereof

本發明係提供一種可使作業單元之作業器與承置器之承置部件準確對位,進而提升作業精準性之校正裝置及校正方法。The present invention provides a calibration device and a calibration method that can accurately align the working device of the working unit and the supporting part of the holder, thereby improving the working accuracy.

在現今,作業設備係以作業單元(如移料單元或檢查單元或清潔單元)之作業器(如移料器或CCD或清潔器)於不同承置器(如載台或測試器或預溫盤 )之承置部件執行取放電子元件之移料作業,或執行取像承置部件之檢查作業,亦或執行清潔承置部件的清潔作業;由於電子元件日後會應用於高溫場所或低溫場所,為確保電子元件之品質,業者必須對電子元件執行熱測作業或冷測作業,例如電子元件熱測作業,作業設備係設置一為載台之承置器,載台具有複數個為容置槽之承置部件以供承置電子元件,另於載台配置加熱件,以供升溫待測之電子元件,一為移料單元之作業單元,係設有複數個為移料器之作業器,並以複數個移料器將複數個待測之電子元件移入載台之複數個容置槽,載台於載送複數個電子元件之過程中,即利用加熱件先行預熱升溫複數個電子元件,而縮短複數個電子元件於複數個測試器之升溫作業時間;惟,在電子元件日趨精密微小之設計下,其移料器將電子元件移入載台之容置槽的精準度要求相當高,然因載台易受加熱件之高溫影響而膨脹變形增大,導致複數個容置槽之位置發生偏移問題,但移料器的作業位置係依變形前載台之容置槽位置而作相對配置,致使移料器的作業位置與變形後載台之容置槽的位置具有偏差量,以致移料器無法準確將電子元件移入變形後載台之容置槽,進而影響後續作業或碰損電子元件。Nowadays, the working equipment is based on the working device (such as the shifter or CCD or cleaner) of the working unit (such as the material moving unit or the inspection unit or the cleaning unit) on different holders (such as the stage or the tester or the preheating unit). plate ) Carry out the material transfer operation of picking and placing electronic components, or perform the inspection operation of the image receiving component, or perform the cleaning operation of cleaning the supporting parts; since the electronic components will be used in high temperature or low temperature places in the future, In order to ensure the quality of electronic components, the industry must perform thermal or cold testing of electronic components. For example, thermal testing of electronic components. The operating equipment is equipped with a carrier for the carrier, and the carrier has multiple accommodating slots. The supporting part is used to hold the electronic components, and the heating element is arranged on the stage to heat up the electronic components to be tested. One is the operating unit of the material moving unit, which is equipped with multiple operating devices as the material moving device. And use a plurality of shifters to move the plurality of electronic components to be tested into the plurality of accommodating slots of the carrier, the carrier is in the process of carrying the plurality of electronic components, that is, the heating element is used to preheat the plurality of electronic components. , And shorten the heating operation time of a plurality of electronic components in a plurality of testers; However, under the increasingly sophisticated and miniaturized design of electronic components, the accuracy requirements for the shifter to move the electronic components into the accommodating slot of the carrier are quite high. However, because the carrier is easily affected by the high temperature of the heating element, the expansion and deformation increase, which causes the position of the plurality of accommodating grooves to shift, but the working position of the material shifter is based on the position of the accommodating groove of the carrier before the deformation The relative configuration results in a deviation between the working position of the shifter and the position of the receiving slot of the deformed carrier, so that the shifter cannot accurately move the electronic components into the receiving slot of the deformed carrier, which affects subsequent operations or collisions. Damage to electronic components.

本發明之目的一,係提供一種校正裝置,以供校正具有作業取像器及作業器之作業單元,校正裝置包含校正機構及控制機構,校正機構係設置校正取像器及校準件,校準件係設有校位部,校正取像器係取像該校準件之校位部及作業單元之作業器;控制機構係具有控制器,以接收該校正取像器所傳輸之影像資料,並分析作業器與作業取像器之距離;藉以取得作業器的初始位置,而供校正調整作業器之實際作業位置,達到提升作業準確性之實用效益。The first object of the present invention is to provide a calibration device for calibrating a working unit with a working imager and a working device. The calibration device includes a calibration mechanism and a control mechanism. The calibration mechanism is provided with a calibration imager and a calibration piece. The calibration piece It is equipped with a calibration unit. The calibration imager is an operating device that captures the calibration unit and operation unit of the calibration part; the control mechanism has a controller to receive the image data transmitted by the calibration imager and analyze it The distance between the operating device and the operating imager; in order to obtain the initial position of the operating device, it can be used to correct and adjust the actual operating position of the operating device to achieve the practical benefit of improving the accuracy of the operation.

本發明之目的二,係提供一種校正裝置,更包含調整機構,該調整機構係設有至少一調整器,以於校正取像器之第二中心與校準件之校位部具有偏差時,利用調整器調整該校正取像器之位置,以利準確取像該作業單元之作業器,達到提升校正準確性之實用效益。The second objective of the present invention is to provide a calibration device, which further includes an adjustment mechanism. The adjustment mechanism is provided with at least one adjuster for correcting the deviation between the second center of the imager and the calibration part of the calibration part. The adjuster adjusts the position of the calibrated image taker, so as to accurately capture the operating device of the operating unit, and achieve the practical benefit of improving the accuracy of the calibration.

本發明之目的三,係提供一種校正裝置,其校準件之校位部可供作業單元之作業取像器取像,以利作業單元調整該作業取像器的第一中心準確對位校準件之校位部,而使作業取像器的第一中心與校正取像器之第二中心準確對位,以利分析作業器與作業取像器之距離,達到提升校正準確性之實用效益。The third object of the present invention is to provide a calibration device, the calibration part of the calibration part can be used to capture images of the working imager of the working unit, so that the working unit can adjust the first center of the working imager to accurately align the calibration part The alignment part makes the first center of the working imager accurately align with the second center of the calibration imager to facilitate the analysis of the distance between the working imager and the working imager to achieve the practical benefit of improving the accuracy of the calibration.

本發明之目的四,係提供一種校正方法,其承置器檢知程序係取得變形後承置器之承置部件的位置,並執行作業器檢知程序,係以校正裝置之校正機構取得校準件之校位部與作業單元之作業器的距離,以得知作業單元之作業取像器的第一中心位置與作業器的距離,於執行對位程序,以令作業取像器之第一中心對位承置器之第三中心,以得知作業器與承置部件間的偏差量,再執行作業器調校程序,係以校正裝置之控制機構依據偏差量而計算出補償值 ,加以調整補償作業器之作業位置,使作業器與承置部件準確對位,達到提升作業精準性之實用效益。The fourth object of the present invention is to provide a calibration method in which the carrier detection program is to obtain the position of the supporting part of the carrier after deformation, and the working tool detection program is executed to obtain the calibration by the calibration mechanism of the calibration device The distance between the alignment part of the piece and the working device of the working unit to know the distance between the first center position of the working imager of the working unit and the working device. The center is aligned with the third center of the supporting device to know the deviation amount between the working device and the supporting part, and then the working device adjustment program is executed, and the control mechanism of the correction device calculates the compensation value according to the deviation amount , To adjust the working position of the compensation working device to make the working device and the supporting part accurately align, to achieve the practical benefit of improving the accuracy of the operation.

本發明之目的五,係提供一種應用校正裝置之作業設備,包含機台、供料裝置、收料裝置、作業裝置、本發明校正裝置及中央控制裝置,供料裝置係配置於機台,並設有至少一供料器,以供容納待作業之電子元件;收料裝置係配置於機台,並設有至少一收料器,以供容納已作業之電子元件;作業裝置係配置於機台,並設有至少一承置器及至少一作業單元,承置器係承置電子元件,作業單元係設置作業器及作業取像器,並以作業器對電子元件執行預設作業;本發明校正裝置係配置於機台,並包含校正機構及控制機構,以校正電子元件;中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。The fifth object of the present invention is to provide a working equipment using a calibration device, including a machine, a feeding device, a receiving device, a working device, a calibration device of the present invention, and a central control device. The feeding device is arranged on the machine and At least one feeder is provided to accommodate the electronic components to be operated; the receiving device is arranged on the machine, and at least one receiver is provided to accommodate the electronic components that have been operated; the operating device is arranged on the machine The table is equipped with at least one holder and at least one working unit. The holder is for holding electronic components. The working unit is equipped with a working device and a working imager, and the working device is used to perform preset operations on the electronic components; The calibration device of the invention is configured in the machine and includes a calibration mechanism and a control mechanism to calibrate electronic components; the central control device is used to control and integrate the actions of each device to perform automated operations and achieve practical benefits of enhancing operational performance.

為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如後:In order to enable your reviewer to have a better understanding of the present invention, a preferred embodiment is given with the accompanying drawings. The details are as follows:

請參閱第1、2、3圖,本發明作業設備包含機台10、供料裝置20、收料裝置30、作業裝置40、本發明校正裝置50及中央控制裝置(圖未示出);供料裝置20係配置於機台10,並設有至少一供料器21,以供容納待作業之電子元件;收料裝置30係配置於機台10,並設有至少一收料器31,以供容納已作業之電子元件;作業裝置40係配置於機台10,並設有至少一承置器及至少一作業單元,承置器係承置電子元件,作業單元係設置作業器及作業取像器,並以作業器對電子元件執行預設作業;更進一步,承置器可為載台或測試器或預溫盤,作業單元可為移料單元或檢查單元或清潔單元,作業器可為移料器或CCD或清潔器;於本實施例中,作業裝置40係設有第一承置器、第二承置器及第三承置器,第一承置器係為第一載台41,其中心係為第三中心L3,第一載台41並設有複數個為第一容置槽411之第一承置部件,以供承置待作業之電子元件,另於至少一承置器設有至少一溫控件,以供溫控電子元件,溫控件可為加熱件、致冷晶片或預溫流體,於本實施例中,第一載台41之內部設有為加熱件412之溫控件,以供預熱電子元件;第二承置器係為第二載台42,並設有複數個為第二容置槽421之第二承置部件,以供承置已作業之電子元件;第三承置器係為測試器,測試器包含電性連接之電路板431及具電性承接件(如探針)之測試座432,以供測試電子元件;又作業裝置40係設有第一作業單元、第二作業單元及第三作業單元,第一作業單元係設有第一作業取像器441及複數個為第一移料器442之第一作業器,第一移料器442之中心係為第一中心為L1,第一移料器442係於供料裝置20、校正裝置50及第一載台41間移載待作業之電子元件,第二作業單元係設有第二作業取像器451及複數個為第二移料器452之第二作業器,以於第一載台41取出待作業之電子元件,並將電子元件移載且壓抵於測試座432而執行測試作業,以及將測試座432之已作業電子元件移載至第二載台42,第二載台42係載出已作業之電子元件 ,第三作業單元係設有第三作業取像器461及複數個為第三移料器462之第三作業器,第三移料器462於第二載台42取出已作業之電子元件,並依作業結果,將已作業之電子元件移載至收料裝置30而分類收置;該中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升作業效能之實用效益。Please refer to Figures 1, 2 and 3, the working equipment of the present invention includes a machine 10, a feeding device 20, a receiving device 30, a working device 40, a correction device 50 of the present invention, and a central control device (not shown); The material device 20 is arranged on the machine table 10 and is provided with at least one feeder 21 for accommodating electronic components to be operated; the material receiving device 30 is arranged on the machine table 10 and is provided with at least one material receiver 31, To accommodate the electronic components that have been operated; the working device 40 is arranged on the machine 10, and is provided with at least one holder and at least one working unit. The holder is for holding the electronic components, and the working unit is provided with a working device and a working unit. Take the imager, and use the operating device to perform preset operations on the electronic components; further, the holder can be a stage or a tester or a pre-warming plate, and the operating unit can be a material transfer unit, an inspection unit or a cleaning unit, and an operating device It can be a material shifter or a CCD or a cleaner; in this embodiment, the working device 40 is provided with a first holder, a second holder, and a third holder, and the first holder is the first holder. The center of the carrier 41 is the third center L3. The first carrier 41 is also provided with a plurality of first supporting parts that are the first accommodating grooves 411 for holding electronic components to be operated, and at least A susceptor is provided with at least one temperature control for temperature control electronic components. The temperature control can be a heating element, a cooling chip or a pre-warming fluid. In this embodiment, the first carrier 41 is provided with It is the temperature control of the heating element 412 for preheating the electronic components; the second holder is the second carrier 42 and is provided with a plurality of second holders which are the second accommodating grooves 421 for supplying Hold the electronic components that have been operated; the third holder is a tester, which includes an electrically connected circuit board 431 and a test socket 432 with electrical sockets (such as probes) for testing electronic components; Furthermore, the working device 40 is provided with a first working unit, a second working unit, and a third working unit. The first working unit is provided with a first working imager 441 and a plurality of first workings which are the first shifters 442 The center of the first shifter 442 is the first center L1, and the first shifter 442 transfers the electronic components to be operated between the feeding device 20, the calibration device 50 and the first carrier 41. The second operating unit is provided with a second operating imager 451 and a plurality of second operating devices that are second shifters 452, to take out the electronic components to be operated on the first stage 41, and transfer the electronic components and Press against the test base 432 to perform the test operation, and transfer the operated electronic components of the test base 432 to the second stage 42, and the second stage 42 loads the operated electronic components The third operating unit is provided with a third operating imager 461 and a plurality of third operating devices that are third shifters 462. The third shifter 462 takes out the electronic components that have been operated on the second stage 42. According to the operation result, the electronic components that have been operated are transferred to the receiving device 30 for sorting and storage; the central control device is used to control and integrate the actions of each device to perform automated operations to achieve practical benefits of improving the operation efficiency.

校正裝置50係配置於機台10,包含校正機構51及控制機構52,更包含基座53及調整機構54。The calibration device 50 is disposed on the machine table 10 and includes a calibration mechanism 51 and a control mechanism 52, and further includes a base 53 and an adjustment mechanism 54.

校正機構51係設置校準件511及校正取像器512,校準件511係設有校位部5111,更進一步,校準件511可裝配於機台10或基座53,校準件511可作固定式配置或可作至少一方向位移配置,校位部5111可為標記圖案或標記塊;於本實施例中,校準件511係以透明材質製作,並於預設位置設有為標記圖案之校位部5111,校準件511係於遠離校位部5111之一端裝設有支撐架5112;校正取像器512係取像該校準件511之校位部5111及作業單元之作業器,更進一步,校正取像器512可裝配於機台10或基座53,校正取像器512可作固定式配置或可作至少一方向位移配置,校正取像器512可配置於校準件511之上方或下方,亦或搭配菱鏡使用而配置於校準件511之側方;於本實施例中,校正取像器512係為CCD,其中心係為第二中心L2,校正取像器512並位於校準件511之下方,而供取像校準件511之校位部5111及複數個第一移料器442。The calibration mechanism 51 is provided with a calibration part 511 and a calibration imagefinder 512. The calibration part 511 is provided with a calibration part 5111. Furthermore, the calibration part 511 can be assembled on the machine table 10 or the base 53, and the calibration part 511 can be used as a fixed type. Disposable or displaceable in at least one direction, the alignment part 5111 can be a marking pattern or a marking block; in this embodiment, the alignment element 511 is made of transparent material, and is provided with a marking pattern at a preset position. A support frame 5112 is installed at the end of the calibration part 511 far away from the calibration part 5111; the calibration image picker 512 is an operating device that captures the calibration part 5111 of the calibration part 511 and the operating unit. The image taker 512 can be assembled on the machine table 10 or the base 53, the correction image taker 512 can be configured in a fixed configuration or can be configured to be displaced in at least one direction, and the correction image taker 512 can be arranged above or below the calibration element 511. Or it can be used with a diamond mirror to be arranged on the side of the calibration part 511; in this embodiment, the correction imager 512 is a CCD, and its center is the second center L2, and the correction imager 512 is located on the calibration part 511 Below, the alignment part 5111 of the image calibration element 511 and a plurality of first shifters 442 are provided.

控制機構52係具有控制器521,以接收校正機構51之校正取像器512所傳輸之影像資料,並分析作業器與作業取像器之距離,以取得作業器的初始位置,而供校正調整該作業器之實際作業位置;於本實施例中,控制器521可接收校正取像器512所傳輸之校位部5111的影像資料及複數個第一移料器442的影像資料,控制器521並接收第一作業取像器441所傳輸之第一載台41的影像資料 ;控制機構52更包含資料庫522,資料庫522具有作業器之基準影像資料,以供控制器521作一比對分析,於本實施例中,資料庫522具有第一載台41的基準影像資料。The control mechanism 52 has a controller 521 to receive the image data transmitted by the calibration imager 512 of the calibration mechanism 51 and analyze the distance between the operating device and the operating imager to obtain the initial position of the operating device for calibration adjustment The actual operating position of the operating device; in this embodiment, the controller 521 can receive the image data of the calibration unit 5111 and the image data of the plurality of first shifters 442 transmitted by the calibration image capture device 512, and the controller 521 And receive the image data of the first carrier 41 transmitted by the first operating imager 441 The control mechanism 52 further includes a database 522. The database 522 has reference image data of the operating device for the controller 521 for a comparative analysis. In this embodiment, the database 522 has the reference image of the first carrier 41 data.

基座53係供裝配校正機構51,於本實施例中,基座53係設有底板531及側板532,底板531供裝配校正機構51之校正取像器512,側板532與校準件511之支撐架5112間設有第一驅動源533,第一驅動源533帶動校準件511之支撐架5112作第一方向(如Z方向)位移,而調整校準件511之作業高度。The base 53 is used to assemble the calibration mechanism 51. In this embodiment, the base 53 is provided with a bottom plate 531 and a side plate 532. The bottom plate 531 is used to assemble the calibration imager 512 of the calibration mechanism 51, and the side plate 532 and the calibration piece 511 are supported. A first driving source 533 is arranged between the frames 5112, and the first driving source 533 drives the support frame 5112 of the calibration element 511 to move in a first direction (such as the Z direction) to adjust the working height of the calibration element 511.

調整機構54係裝配校正取像器512或基座53,以供調整校正取像器512或基座53之位置,於本實施例中,調整機構54係設有至少一調整器541,調整器541裝配於校正取像器512之下方,以供調整該校正取像器512之位置。The adjustment mechanism 54 is equipped with a correction imager 512 or a base 53 for adjusting the position of the correction imager 512 or the base 53. In this embodiment, the adjustment mechanism 54 is provided with at least one adjuster 541. 541 is mounted under the correction imager 512 for adjusting the position of the correction imager 512.

請參閱第4至8圖(配合參閱第1至3圖),本發明校正方法包含承置器檢知程序551、作業器檢知程序552、對位程序553及作業器調校程序554。Please refer to FIGS. 4 to 8 (see FIGS. 1 to 3 for reference). The calibration method of the present invention includes a carrier detection program 551, a working device detection program 552, an alignment program 553, and a working device calibration program 554.

承置器檢知程序551係取得變形後承置器之承置部件的位置;承置器檢知程序551更包含建立承置器樣本程序,建立承置器樣本程序係於控制機構52之資料庫522建立承置器之基準影像資料,於本實施例中,建立承置器樣本程序係於控制機構52之資料庫522建立第一載台41之基準影像資料;承置器檢知程序551係以作業單元之作業取像器取像變形後之承置器,並將影像資料傳輸至控制機構52之控制器521;於本實施例中,當第一載台41因受熱而發生膨脹變形增大,由於第一載台41具有複數個定位點413,承置器檢知程序551係以第一作業取像器441取像變形後之第一載台41的複數個定位點413,並將複數個定位點413的影像資料傳輸至控制機構52之控制器521,控制機構52之控制器521可由複數個定位點413計算出第一載台41的變形量,亦或將變形後第一載台41的影像資料與資料庫522的第一載台41基準影像資料作比對分析,上述方式均可取得變形後第一載台41之第一容置槽411的位置,使得控制器521獲知變形後第一載台41之第一容置槽411的位置。The supporting device detection program 551 is to obtain the position of the supporting part of the supporting device after deformation; the supporting device detection program 551 further includes the creation of a supporting device sample program, which is the data of the control mechanism 52 The database 522 establishes the base image data of the holder. In this embodiment, the procedure of creating the holder sample is to create the base image data of the first stage 41 in the database 522 of the control mechanism 52; the holder detection program 551 It uses the working imager of the working unit to take an image of the deformed holder, and transmits the image data to the controller 521 of the control mechanism 52; in this embodiment, when the first stage 41 expands and deforms due to heat Because the first stage 41 has a plurality of positioning points 413, the carrier detection program 551 uses the first working imager 441 to capture the plurality of positioning points 413 of the deformed first stage 41, and The image data of the plurality of positioning points 413 are transmitted to the controller 521 of the control mechanism 52. The controller 521 of the control mechanism 52 can calculate the deformation amount of the first stage 41 from the plurality of positioning points 413, or the deformation of the first stage 41 The image data of the carrier 41 and the reference image data of the first carrier 41 of the database 522 are compared and analyzed. The above methods can obtain the position of the first receiving slot 411 of the first carrier 41 after the deformation, so that the controller 521 The position of the first accommodating groove 411 of the first carrier 41 after deformation is known.

作業器檢知程序552係以校正裝置50之校正機構51取得校準件511之校位部5111與作業單元之作業器的距離,以得知作業單元之作業取像器的第一中心L1位置與作業器的距離;於本實施例中,第一作業單元依預設行程驅動第一移料器442位移至校正裝置50之校準件511上方,且相對於校正取像器512,校正取像器512即取像校位部5111與第一移料器442,以取得校位部5111與第一移料器442之距離,然在第一作業取像器441之第一中心L1與校準件511之校位部5111作中心對位的要件下,而可獲得第一作業取像器441與第一移料器442之相對位置 ,當複數個第一移料器442依序位移至校準件511之上方而供取像後,即可獲得複數個第一移料器442與第一作業取像器441間之相對位置,並將資料傳輸至控制機構52之控制器521。The working device detection program 552 uses the calibration mechanism 51 of the calibration device 50 to obtain the distance between the calibration part 5111 of the calibration piece 511 and the working device of the working unit, so as to know the position of the first center L1 of the working imager of the working unit and The distance of the working device; in this embodiment, the first working unit drives the first material shifter 442 to move above the calibration member 511 of the calibration device 50 according to the preset stroke, and the calibration imager 512 is calibrated relative to the calibration imager 512 512 is to capture the alignment part 5111 and the first material shifter 442 to obtain the distance between the alignment part 5111 and the first material shifter 442, and then the first center L1 of the first working imager 441 and the alignment element 511 The alignment part 5111 is used as a center alignment requirement, and the relative position of the first operating imager 441 and the first shifter 442 can be obtained. , When the plurality of first material shifters 442 sequentially move to the top of the calibration member 511 for capturing images, the relative positions between the plurality of first material shifters 442 and the first working imager 441 can be obtained, and The data is transmitted to the controller 521 of the control mechanism 52.

作業器檢知程序552更包含作業取像器校位程序,作業取像器校位程序係於校正取像器512取像該作業器之前,以作業取像器的第一中心L1與校準件511之校位部512作校位;於本實施例中,於校正取像器512執行取像複數個第一移料器442之前,第一作業單元係驅動第一作業取像器441位移至校準件511之上方,令第一作業取像器441之第一中心L1與校準件511之校位部5111作校正對位,以利正確取得複數個第一移料器442與第一作業取像器441間之相對位置。The working device detection program 552 further includes a working imager calibration program. The working imager calibration program is performed before the calibration imager 512 takes the image of the working device, using the first center L1 of the working imager and the calibration piece The calibration unit 512 of 511 performs calibration; in this embodiment, before the calibration image capture device 512 performs image capture of the plurality of first shifters 442, the first operating unit drives the first operating image capture device 441 to move to Above the calibration part 511, the first center L1 of the first working imager 441 and the calibration part 5111 of the calibration part 511 are calibrated and aligned to facilitate the correct acquisition of a plurality of first shifters 442 and the first working fetching device. The relative position between the imagers 441.

作業器檢知程序552更包含校正取像器校位程序,校正取像器校位程序係於執行作業取像器校位程序前,校正取像器512之第二中心L2係與校準件511之校位部5111作校位;於本實施例中,校正取像器512係取像校準件511之校位部5111,若有誤差,可由控制器521增設補償值,亦或利用調整機構54之調整器541調整校正取像器512之位置,使校正取像器512之第二中心L2對位該校準件511之校位部5111,以利校正取像器512正確取像第一移料器442之位置。The working device detection program 552 further includes a calibration imager calibration program. The calibration imager calibration program is used to calibrate the second center L2 system of the imager 512 and the calibration part 511 before the operation imager calibration program is executed. In this embodiment, the calibration imager 512 is the calibration part 5111 of the calibration piece 511. If there is an error, the compensation value can be added by the controller 521, or the adjustment mechanism 54 can be used. The adjuster 541 adjusts the position of the calibration imager 512, so that the second center L2 of the calibration imager 512 is aligned with the calibration part 5111 of the calibration piece 511, so that the calibration imager 512 can correctly capture the first shifting material 442 location.

作業器檢知程序552更包含校正取像器與作業取像器校位程序,校正取像器與作業取像器校位程序係於執行作業取像器校位程序後,以使作業取像器之第一中心L1與校正取像器512之第二中心L2作校正對位;於本實施例中,當校準件511之校位部5111分別與第一作業取像器441的第一中心L1及校正取像器512之第二中心L2作校正對位後,即可使第一作業取像器441的第一中心L1與校正取像器512之第二中心L2作校正對位,以利校正取像器512正確取像第一移料器442之位置。The operating device detection program 552 further includes calibration imager and operating imager calibration program. The calibration imager and operating imager calibration program are executed after the operating imager calibration program is executed, so that the operating image can be captured. The first center L1 of the camera is aligned with the second center L2 of the calibration imager 512; in this embodiment, when the calibration part 5111 of the calibration element 511 is respectively aligned with the first center of the first working imager 441 After L1 and the second center L2 of the correction imager 512 are calibrated and aligned, the first center L1 of the first working imager 441 and the second center L2 of the correction imager 512 can be calibrated and aligned to The position of the first shifter 442 can be correctly captured by the image capturing device 512.

對位程序553係以作業取像器之第一中心對位承置器之第三中心 ,以得知作業器與承置部件間的偏差量;於本實施例中,對位程序553係以第一作業取像器441的第一中心L1對位變形後第一載台41之第三中心L3,進而取得第一載台41之第三中心L3與複數個第一移料器442間之相對位置,使得控制機構52之控制器521得知複數個第一移料器442與變形後第一載台41之複數個第一容置槽411的偏差量。The alignment program 553 is based on the first center of the working imager to align the third center of the holder , In order to know the amount of deviation between the working device and the supporting part; in this embodiment, the alignment program 553 is aligned and deformed by the first center L1 of the first working imager 441. Three centers L3, and then obtain the relative position between the third center L3 of the first carrier 41 and the plurality of first shifters 442, so that the controller 521 of the control mechanism 52 knows the plurality of first shifters 442 and the deformation The deviation amount of the plurality of first accommodating grooves 411 of the rear first carrier 41.

作業器調校程序554係以校正裝置之控制機構依據偏差量而計算出補償值,加以調整補償作業器之作業位置,使作業器與承置部件準確對位;於本實施例中,控制機構52之控制器521於得知複數個第一移料器442與變形後第一載台41之複數個第一容置槽411的偏差量後,由於第一作業取像器441的第一中心L1對位第一載台41之第三中心L3,即可以第一作業取像器441的第一中心L1為基準,而於複數個第一移料器442之位置值加入補償值,以調整複數個第一移料器442之實際作業位置,令複數個第一移料器442精準對位變形後第一載台41之複數個第一容置槽411,使得複數個第一移料器442準確於變形後第一載台41之複數個第一容置槽411取放電子元件。The working device calibration program 554 uses the control mechanism of the calibration device to calculate the compensation value according to the deviation amount, and adjusts the working position of the compensation working device to make the working device and the supporting part accurately align; in this embodiment, the control mechanism After the controller 521 of 52 knows the deviation between the plurality of first shifters 442 and the plurality of first accommodating grooves 411 of the deformed first carrier 41, due to the first center of the first working imager 441 L1 is aligned with the third center L3 of the first stage 41, that is, the first center L1 of the first working imager 441 can be used as a reference, and the compensation value is added to the position value of the plurality of first shifters 442 to adjust The actual operating positions of the plurality of first shifters 442 enable the plurality of first shifters 442 to be precisely aligned and deformed. The plurality of first accommodating grooves 411 of the first carrier 41 make the plurality of first shifters 442 accurately picks and places electronic components in the plurality of first accommodating grooves 411 of the first carrier 41 after deformation.

10:機台 20:供料裝置 21:供料器 30:收料裝置 31:收料器 40:作業裝置 41:第一載台 411:第一容置槽 412:加熱件 413:定位點 42:第二載台 421:第二容置槽 431:電路板 432:測試座 441:第一作業取像器 442:第一移料器 451:第二作業取像器 452:第二移料器 461:第三作業取像器 462:第三移料器 50:校正裝置 51:校正機構 511:校準件 5111:校位部 5112:支撐架 512:校正取像器 52:控制機構 521:控制器 522:資料庫 53:基座 531:底板 532:側板 533:第一驅動源 54:調整機構 541:調整器 551:承置器檢知程序 552:作業器檢知程序 553:對位程序 554:作業器調校程序 L1:第一中心 L2:第二中心 L3:第三中心10: Machine 20: Feeding device 21: feeder 30: Receiving device 31: Receiver 40: operating device 41: First stage 411: first housing tank 412: heating element 413: Anchor Point 42: second stage 421: second holding tank 431: Circuit Board 432: Test Block 441: First job imager 442: first shifter 451: Second job imager 452: Second Shifter 461: Third job imager 462: Third Shifter 50: Calibration device 51: Correction mechanism 511: Calibration part 5111: School Position Department 5112: Support frame 512: Calibration viewfinder 52: control mechanism 521: Controller 522: Database 53: Pedestal 531: bottom plate 532: Side Panel 533: first drive source 54: adjustment mechanism 541: Adjuster 551: Holder detection program 552: Working device detection program 553: Alignment Program 554: Work Device Calibration Program L1: First center L2: second center L3: Third Center

第1圖:本發明作業設備之示意圖。 第2圖:本發明承置器、作業單元及校正裝置之配置圖。 第3圖:本發明校正裝置之示意圖。 第4圖:校正方法之流程圖。 第5圖:校正方法之校正示意圖(一)。 第6圖:校正方法之校正示意圖(二)。 第7圖:校正方法之校正示意圖(三)。 第8圖:校正方法之校正示意圖(四)。 第9圖:校正方法之校正示意圖(五)。Figure 1: Schematic diagram of the working equipment of the present invention. Figure 2: The layout diagram of the holder, working unit and calibration device of the present invention. Figure 3: A schematic diagram of the calibration device of the present invention. Figure 4: Flow chart of the calibration method. Figure 5: Schematic diagram of the calibration method (1). Figure 6: Schematic diagram of the calibration method (2). Figure 7: Schematic diagram of the calibration method (3). Figure 8: Schematic diagram of the calibration method (4). Figure 9: Schematic diagram of the calibration method (5).

41:第一載台41: First stage

411:第一容置槽411: first housing tank

441:第一作業取像器441: First job imager

442:第一移料器442: first shifter

50:校正裝置50: Calibration device

511:校準件511: Calibration part

512:校正取像器512: Calibration viewfinder

52:控制機構52: control mechanism

521:控制器521: Controller

522:資料庫522: database

53:基座53: Pedestal

54:調整機構54: adjustment mechanism

L1:第一中心L1: First center

L3:第三中心L3: Third Center

Claims (10)

一種校正裝置,係供校正具有作業取像器及作業器之作業單元,該校 正裝置包含: 校正機構:係設置校準件及校正取像器,該校準件設有至少一校位部 ,該校正取像器係取像該校準件之該校位部及該作業單元 之該作業器; 控制機構:係具有控制器,以接收該校正機構之該校正取像器傳輸之 影像資料,以供分析該作業器與該作業取像器之距離。A calibration device for calibrating a working unit with a working imager and working device. The calibration The positive device contains: Calibration mechanism: a calibration part and a calibration imager are provided, and the calibration part is provided with at least one calibration unit , The calibration imager captures the calibration part and the operation unit of the calibration part The operating device; Control mechanism: it has a controller to receive the transmission of the correction imager of the correction mechanism Image data for analyzing the distance between the operating device and the operating imager. 依申請專利範圍第1項所述之校正裝置,其中,該校正機構之該校正 取像器係裝配於基座。According to the calibration device described in item 1 of the scope of patent application, the calibration of the calibration mechanism The imager is assembled on the base. 依申請專利範圍第2項所述之校正裝置,其中,該基座與該校準件之 間設有第一驅動源,該第一驅動源係供驅動該校準件作至少一方向位 移。According to the calibration device described in item 2 of the scope of patent application, wherein the base and the calibration piece are A first driving source is provided in between, and the first driving source is used to drive the calibration element for at least one direction position shift. 依申請專利範圍第2項所述之校正裝置,更包含調整機構,該調整機 構係設有至少一調整器,以供調整該校正取像器之位置。According to the calibration device described in item 2 of the scope of patent application, it also includes an adjustment mechanism, which The structure is provided with at least one adjuster for adjusting the position of the correction image taker. 依申請專利範圍第1項所述之校正裝置,其中,該校正機構之該校準 件的該校位部係供該作業單元之該作業取像器取像,該作業取像器並 傳輸取像資料至該控制機構之該控制器以供分析。According to the calibration device described in item 1 of the scope of patent application, the calibration of the calibration mechanism The alignment part of the document is for the operation imager of the operation unit to take the image, and the operation imager is parallel The image capturing data is transmitted to the controller of the control mechanism for analysis. 依申請專利範圍第1項所述之校正裝置,其中,該控制機構係設有資 料庫,該資料庫具有承置器之基準影像資料,以供傳輸至該控制器。According to the calibration device described in item 1 of the scope of patent application, the control mechanism is equipped with capital The database has the base image data of the holder for transmission to the controller. 一種校正方法,包含: 承置器檢知程序:係取得變形後承置器之承置部件的位置; 作業器檢知程序:係以校正裝置之校正取像器取得校準件之校位部與 作業單元之作業器的距離,以得知該作業單元之作 業取像器的第一中心與該作業器的距離; 對 位 程 序:係以該作業取像器之該第一中心與變形後該承置器 之第三中心作校正對位,以得知該作業器與該承置 部件的偏差量; 作業器調校程序:係以該校正裝置之控制機構依據偏差量而計算出補 償值,加以調整補償該作業器之作業位置,使該作 業器與該承置部件準確對位。A correction method, including: Supporter detection procedure: to obtain the position of the supporting part of the supporter after deformation; Working device detection procedure: the calibration part of the calibration part is obtained with the calibration imager of the calibration device and The distance of the working device of the working unit to know the work of the working unit The distance between the first center of the camera and the operating device; Sequence of position and process: based on the first center of the working imager and the holder after deformation The third center is calibrated and aligned to know that the working device and the bearing Deviation of components; Work device calibration procedure: the control mechanism of the calibration device calculates the compensation according to the deviation Compensation value, adjust and compensate the working position of the working device, so that the working position The industrial device is accurately aligned with the supporting component. 依申請專利範圍第7項所述之校正方法,其中,該作業器檢知程序更 包含作業取像器校位程序,該作業取像器校位程序係以該作業取像器 之該第一中心對位該校準件之該校位部。According to the calibration method described in item 7 of the scope of patent application, the detection procedure of the operating device is more Contains the job imager calibration program, the job imager calibration program is based on the job imager The first center is aligned with the calibration part of the calibration piece. 依申請專利範圍第8項所述之校正方法,其中,該作業器檢知程序更 包含校正取像器與作業取像器校位程序,該校正取像器與作業取像器 校位程序係以該作業取像器之該第一中心與該校正取像器之第二中 心作校正對位。According to the calibration method described in item 8 of the scope of patent application, the detection procedure of the operating device is more Contains calibration imager and job imager calibration program, the calibration imager and job imager The calibration procedure is based on the first center of the working imager and the second center of the calibration imager The heart makes corrections. 一種作業設備,包含: 機台; 供料裝置:係配置於該機台上,並設有至少一供料器,以供容納至 少一待作業之電子元件; 收料裝置:係配置於該機台上,並設有至少一收料器,以供容納至 少一已作業之電子元件; 作業裝置:係配置於該機台上,包含至少一承置器及至少一作業單元 ,該承置器係供承置電子元件,該作業單元係設置作業器 及作業取像器,並以該作業器對電子元件執行預設作業; 至少一依申請專利範圍第1至6項中任一項所述之校正裝置,係配置該 機台上; 中央控制裝置:係用以控制及整合各裝置作動。A kind of work equipment, including: Machine; Feeding device: It is configured on the machine platform and is provided with at least one feeder for receiving One less electronic component to be operated; Receiving device: It is configured on the machine platform and is equipped with at least one receiving device to accommodate One less electronic component already in operation; Working device: It is configured on the machine and includes at least one holder and at least one working unit , The holder is for holding electronic components, and the working unit is provided with a working device And a working imager, and use the working device to perform preset operations on the electronic components; At least one calibration device described in any one of items 1 to 6 of the scope of the patent application is equipped with the On the machine Central control device: It is used to control and integrate the actions of various devices.
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TWI827351B (en) * 2022-11-08 2023-12-21 鴻勁精密股份有限公司 Image acquiring and correcting method of electronic component

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