TW202037928A - Radiation detection module, radiation detector, and radiation detection module production method - Google Patents
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Abstract
Description
本發明的實施形態是有關放射線檢測模組,放射線檢測器及放射線檢測模組的製造方法。The embodiment of the present invention relates to a radiation detection module, a radiation detector, and a method for manufacturing the radiation detection module.
放射線檢測器之一例,有X線檢測器。在X線檢測器是設有將X線變換成螢光的閃爍器,及將螢光變換成電氣訊號的陣列基板。又,為了提高螢光的利用效率來改善感度特性,而有在閃爍器上更設置反射層的情況。在此,為了抑制起因於水蒸氣等的特性的劣化,閃爍器與反射層是需要與外部氣氛隔離。例如,當閃爍器為含CsI(碘化銫):Tl(鉈)或CsI:Na(鈉)等時,恐有因水蒸氣等而特性劣化變大之虞。An example of a radiation detector is an X-ray detector. The X-ray detector is equipped with a scintillator that converts X-rays into fluorescence, and an array substrate that converts fluorescence into electrical signals. In addition, in order to increase the efficiency of fluorescent utilization and improve the sensitivity characteristics, there are cases where a reflective layer is provided on the scintillator. Here, in order to suppress the deterioration of the characteristics due to water vapor or the like, the scintillator and the reflective layer need to be isolated from the external atmosphere. For example, when the scintillator contains CsI (cesium iodide): Tl (thallium) or CsI: Na (sodium), etc., there is a possibility that the characteristics of the scintillator may deteriorate due to water vapor or the like.
因此,提案以帽子形狀的防濕部來覆蓋閃爍器與反射層,將防濕部的帽簷(帽緣)部黏著於陣列基板的技術,作為可取得高的防濕性能的構造。 可是,若將防濕部的帽簷部黏著於陣列基板,則需要用以將帽簷部黏著於閃爍器的周邊的空間。近年來期望X線檢測器的小型化,但若設為帽子形狀的防濕部,則恐有不能謀求X線檢測器的小型化之虞。Therefore, a technology of covering the scintillator and the reflective layer with a hat-shaped moisture-proof part and adhering the brim (hat edge) of the moisture-proof part to the array substrate is proposed as a structure that can achieve high moisture-proof performance. However, if the brim portion of the moisture-proof part is adhered to the array substrate, a space for adhering the brim portion to the periphery of the scintillator is required. In recent years, miniaturization of X-ray detectors has been desired, but if a hat-shaped moisture-proof part is used, there is a possibility that miniaturization of X-ray detectors cannot be achieved.
又,若對於人體進行大量的X線照射,則對健康有不良影響,因此對人體的X線照射量是被壓到必要的最低限度。為此,被用在醫療的X線檢測器的情況,恐有被照射的X線的強度變小,透過防濕部的X線的強度變得非常小之虞。此情況,若將防濕部的厚度形成薄,則可增大透過的X線的強度。可是,一旦將帽子形狀的防濕部的厚度形成薄,則在將鋁等的箔形成帽子形狀時容易產生龜裂等。 於是,期望開發一種可謀求X線檢測器的小型化,且可將防濕部的厚度形成薄之技術。 [先前技術文獻] [專利文獻]Moreover, if a large amount of X-ray irradiation is performed on the human body, it will have an adverse effect on health. Therefore, the amount of X-ray irradiation on the human body is suppressed to the minimum necessary. For this reason, in the case of X-ray detectors used in medical treatment, the intensity of the irradiated X-rays may decrease, and the intensity of X-rays passing through the moisture-proof part may become very small. In this case, if the thickness of the moisture-proof part is made thin, the strength of X-rays transmitted can be increased. However, once the thickness of the hat-shaped moisture-proof part is made thin, cracks and the like are likely to occur when foil such as aluminum is formed into the hat shape. Therefore, it is desired to develop a technology that can reduce the size of the X-ray detector and can reduce the thickness of the moisture-proof portion. [Prior Technical Literature] [Patent Literature]
[專利文獻1]日本特開2009-128023號公報[Patent Document 1] JP 2009-128023 A
(發明所欲解決的課題)(The problem to be solved by the invention)
本發明所欲解決的課題是在於提供一種可謀求放射線檢測器的小型化,且可將防濕部的厚度形成薄之放射線檢測模組,放射線檢測器及放射線檢測模組的製造方法。 (用以解決課題的手段)The problem to be solved by the present invention is to provide a radiation detection module that can reduce the size of the radiation detector and can reduce the thickness of the moisture-proof part, a radiation detector and a method for manufacturing the radiation detection module. (Means to solve the problem)
實施形態的放射線檢測模組係具備: 陣列基板,其係具有複數的光電變換部; 閃爍器,其係被設在前述複數的光電變換部上; 框狀的密封部,其係含熱可塑性樹脂作為主成分,被設在前述閃爍器的周圍,被接合至前述陣列基板與前述閃爍器;及 防濕部,其係覆蓋前述閃爍器的上方,周緣附近被接合於前述密封部的外面。 前述密封部的外面的形狀為突出至外側的曲面。The radiation detection module of the implementation form has: An array substrate, which has a plurality of photoelectric conversion parts; A scintillator, which is arranged on the aforementioned plural photoelectric conversion parts; A frame-shaped sealing portion containing thermoplastic resin as a main component is provided around the scintillator and is bonded to the array substrate and the scintillator; and The moisture-proof part covers the upper part of the scintillator, and is joined to the outer surface of the sealing part near the periphery. The shape of the outer surface of the aforementioned sealing portion is a curved surface protruding to the outside.
以下,一面參照圖面,一面舉例說明有關實施形態。另外,各圖面中,對於同樣的構成要素附上同樣的符號,詳細的說明適當省略。 又,本發明的實施形態的放射線檢測器是除了X線以外,還可使適用於γ線等的各種放射線。在此,舉例說明放射線之中具代表性的X線的情況作為一例。因此,藉由將以下的實施形態的「X線」置換成「其他的放射線」,亦可使適用於其他的放射線。 又,放射線檢測器是例如可用在一般醫療等。但,放射線檢測器的用途是不限於一般醫療。Hereinafter, referring to the drawings, the relevant embodiments are described as examples. In addition, in each drawing, the same symbols are attached to the same components, and detailed descriptions are omitted as appropriate. In addition, the radiation detector of the embodiment of the present invention can be applied to various radiation such as gamma rays in addition to X-rays. Here, the case of a representative X-ray among radiation rays is given as an example. Therefore, by replacing "X-ray" in the following embodiment with "other radiation", it can also be applied to other radiation. In addition, the radiation detector can be used in general medical care, for example. However, the use of radiation detectors is not limited to general medical treatment.
(X線檢測器及X線檢測模組)
圖1是用以舉例表示本實施形態的X線檢測器1及X線檢測模組10的模式立體圖。
另外,為了避免成為繁雜,在圖1中,省略保護層2f、反射層6、防濕部7及密封部8等來繪圖。
圖2是用以舉例表示X線檢測模組10的模式剖面圖。
圖3是X線檢測器1的方塊圖。(X-ray detector and X-ray detection module)
FIG. 1 is a schematic perspective view for illustrating an
如圖1及圖2所示般,在X線檢測器1是設有X線檢測模組10及電路基板11。並且,在X線檢測器1是可設置未圖示的框體。在框體的內部是可設置X線檢測模組10及電路基板11。例如,可在框體的內部設置板狀的支撐板12,在支撐板12的X線的射入側的面設置X線檢測模組10,在與支撐板12的X線的射入側相反側的面設置電路基板11。As shown in FIGS. 1 and 2, the
在X線檢測模組10是設有陣列基板2、閃爍器5、反射層6、防濕部7及密封部8。
陣列基板2是具有基板2a、光電變換部2b、控制線(或閘極線)2c1、資料線(或訊號線)2c2、配線焊墊2d1、配線焊墊2d2及保護層2f。
另外,光電變換部2b、控制線2c1及資料線2c2的數量等並非限於舉例說明者。The
基板2a是呈現板狀,由無鹼玻璃等的玻璃所形成。基板2a的平面形狀是可設為四角形。基板2a的厚度是例如可設為0.7mm程度。
光電變換部2b是在基板2a的一方的面側設置複數個。
光電變換部2b是呈現矩形狀,被設在藉由控制線2c1及資料線2c2所區劃的區域。複數的光電變換部2b是排列成矩陣狀。另外,1個的光電變換部2b是對應於X線畫像的1個的畫素(pixel)。The
在複數的光電變換部2b的各者是設有光電變換元件2b1及開關元件的薄膜電晶體(TFT;Thin Film Transistor)2b2。
又,可設置蓄積在光電變換元件2b1中變換的訊號電荷之未圖示的蓄積電容器。蓄積電容器是例如呈現矩形平板狀,可設在各薄膜電晶體2b2下。但,依光電變換元件2b1的電容,光電變換元件2b1可兼任蓄積電容器。Each of the plural
光電變換元件2b1是例如可設為發光二極體等。 薄膜電晶體2b2是進行往蓄積電容器的電荷的蓄積及放出的開關。薄膜電晶體2b2是具有閘極電極、汲極電極及源極電極。薄膜電晶體2b2的閘極電極是與對應的控制線2c1電性連接。薄膜電晶體2b2的汲極電極是與對應的資料線2c2電性連接。薄膜電晶體2b2的源極電極是被電性連接對應的光電變換元件2b1及蓄積電容器。又,光電變換元件2b1的陽極側與蓄積電容器是可接地。另外,光電變換元件2b1的陽極側與蓄積電容器是亦可連接至未圖示的旁通線。The photoelectric conversion element 2b1 can be, for example, a light emitting diode or the like. The thin-film transistor 2b2 is a switch for accumulating and discharging electric charge to the accumulating capacitor. The thin film transistor 2b2 has a gate electrode, a drain electrode and a source electrode. The gate electrode of the thin film transistor 2b2 is electrically connected to the corresponding control line 2c1. The drain electrode of the thin film transistor 2b2 is electrically connected to the corresponding data line 2c2. The source electrode of the thin film transistor 2b2 is electrically connected to the corresponding photoelectric conversion element 2b1 and the storage capacitor. In addition, the anode side of the photoelectric conversion element 2b1 and the storage capacitor are grounded. In addition, the anode side of the photoelectric conversion element 2b1 and the storage capacitor may be connected to a bypass line not shown.
控制線2c1是取預定的間隔來互相平行地設置複數條。控制線2c1是例如延伸於行方向。1條的控制線2c1是與被設在基板2a的周緣附近的複數的配線焊墊2d1之中的1個電性連接。在1個的配線焊墊2d1是被設在可撓性印刷基板2e1的複數的配線之中的1條會被電性連接。被設在可撓性印刷基板2e1的複數的配線的另一端是與被設在電路基板11的讀出電路11a分別電性連接。A plurality of control lines 2c1 are arranged in parallel with each other at predetermined intervals. The control line 2c1 extends in the row direction, for example. One control line 2c1 is electrically connected to one of a plurality of wiring pads 2d1 provided near the periphery of the
資料線2c2是取預定的間隔來互相平行地設置複數條。資料線2c2是例如延伸於與行方向正交的列方向。1條的資料線2c2是與被設在基板2a的周緣附近的複數的配線焊墊2d2之中的1個電性連接。在1個的配線焊墊2d2是被設在可撓性印刷基板2e2的複數的配線之中的1條會被電性連接。被設在可撓性印刷基板2e2的複數的配線的另一端是與被設在電路基板11的訊號檢測電路11b分別電性連接。
控制線2c1及資料線2c2是例如可使用鋁或鉻等的低電阻金屬來形成。A plurality of data lines 2c2 are arranged parallel to each other at predetermined intervals. The data line 2c2 extends in the column direction orthogonal to the row direction, for example. One data line 2c2 is electrically connected to one of a plurality of wiring pads 2d2 provided near the periphery of the
保護層2f是覆蓋光電變換部2b、控制線2c1及資料線2c2。保護層2f是可由絕緣性材料所形成。絕緣性材料是例如可設為氧化物絕緣材料、氮化物絕緣材料、氧氮化物絕緣材料及樹脂等。The
閃爍器5是被設在複數的光電變換部2b上,將射入的X線變換成可視光亦即螢光。閃爍器5是以覆蓋基板2a上的設有複數的光電變換部2b的區域(有效畫素區域A)之方式設置。
閃爍器5是例如可設為含碘化銫(CsI):鉈(Tl)、碘化鈉(NaI):鉈(Tl)、或溴化銫(CsBr):銪(Eu)等者。閃爍器5是可利用真空蒸鍍法來形成。若利用真空蒸鍍法來形成閃爍器5,則形成由複數的柱狀結晶的集合體所成的閃爍器5。閃爍器5的厚度是例如可設為600μm程度。The
另外,在利用真空蒸鍍法來形成閃爍器5時,使用具有開口的遮罩。此情況,在與陣列基板2上的開口對峙的位置(有效畫素區域A上)形成有閃爍器5。又,藉由蒸鍍的膜是在遮罩的表面也形成。而且,在遮罩的開口的附近,膜是以慢慢地突出至開口的內部之方式成長。一旦膜突出至開口的內部,則在開口的附近,往陣列基板2的蒸鍍會被抑制。因此,如圖1及圖2所示般,閃爍器5的周緣附近是隨著往外側而厚度漸減。In addition, when forming the
又,閃爍器5是例如亦可使用鋱賦活硫氧化釓(Gd2
O2
S/Tb、或GOS)等來形成。此情況,可以每複數的光電變換部2b設有四角柱狀的閃爍器5之方式設置矩陣狀的溝部。In addition, the
反射層6是為了提高螢光的利用效率來改善感度特性而設。亦即,反射層6是使在閃爍器5中產生的螢光之中,朝向與設有光電變換部2b的側相反側的光反射,而使朝向光電變換部2b。但,反射層6不是一定為必要,只要按照被X線檢測模組10要求的感度特性等來設置即可。
在以下說明設有反射層6的情況,作為一例。The
反射層6是被設在閃爍器5的X線的射入側。反射層6是至少覆蓋閃爍器5的上面。反射層6是亦可更覆蓋閃爍器5的側面5a。
例如,可將混合由氧化鈦(TiO2
)等所成的光散射性粒子、樹脂及溶媒的材料塗佈於閃爍器5上,予以乾燥而形成反射層6。
又,例如,可藉由將由銀合金或鋁等的光反射率高的金屬所成的層成膜於閃爍器5上而形成反射層6。
又,例如,亦可藉由將表面由銀合金或鋁等的光反射率高的金屬所成的薄板或含光散射性粒子的樹脂薄板等設在閃爍器5上而作為反射層6。The
另外,將糊狀的材料塗佈於閃爍器5上,予以乾燥時,由於隨著乾燥,材料會收縮,因此閃爍器5會被拉伸,閃爍器5會有從陣列基板2剝離的情況。為此,將薄板狀的反射層6設在閃爍器5上為理想。此情況,亦可將薄板狀的反射層6例如利用雙面膠帶等來接合於閃爍器5上,但將薄板狀的反射層6載置於閃爍器5上為理想。若將薄板狀的反射層6載置於閃爍器5上,則容易抑制閃爍器5起因於反射層6的膨脹或收縮而從陣列基板2剝離。In addition, when a paste material is applied to the
防濕部7是為了抑制反射層6的特性或閃爍器5的特性因空氣中含的水分而劣化而設。
防濕部7是覆蓋閃爍器5及密封部8的至少一部分。在防濕部7與反射層6等之間是亦可有間隙,或防濕部7與反射層6等亦可接觸。例如,若在比大氣壓更減壓的環境中接合防濕部7與密封部8,則可使防濕部7與反射層6等接觸。又,一般在閃爍器5是存在其體積的10%~40%程度的空隙。因此,若在空隙含氣體,則在以航空機等輸送X線檢測器1時,氣體會膨脹而恐有防濕部7破損之虞。若在比大氣壓更減壓的環境中接合防濕部7與密封部8,則即使是X線檢測器1以航空機等輸送的情況,還是可抑制防濕部7破損。亦即,藉由密封部8及防濕部7所區劃的空間的壓力是比大氣壓更低為理想。The moisture-
在此,會有在密封部8的內部有氣泡或空隙,或在密封部8與防濕部7之間有間隙或洩漏通道,或在密封部8與陣列基板2之間有間隙或洩漏通道的情況。此情況,在比大氣壓更減壓的環境中接合防濕部7與密封部8,然後回到大氣壓環境時,會有大氣經由間隙或洩漏通道等來侵入至內部的情況。一旦大氣侵入至內部,則防濕部7與閃爍器5會不緊貼,在防濕部7的表面產生皺紋,或喪失張力。因此,容易目視得知有間隙或洩漏通道等。有間隙或洩漏通道等的製品的壽命是恐有變短之虞,但在檢查中可容易發現除去如此的製品。因此,可容易使X線檢測器1的品質提升。Here, there may be bubbles or voids inside the sealing
防濕部7是可設為含金屬的薄板。金屬是例如可設為含鋁的金屬、含銅的金屬、含鎂的金屬、含鎢的金屬、不鏽鋼、Kovar材等。此情況,若設為含金屬的防濕部7,則幾乎可完全去除透過防濕部7的水分。The moisture-
又,防濕部7是亦可設為層疊樹脂膜及金屬膜的層疊薄板。此情況,樹脂膜是例如可設為由聚醯亞胺樹脂、環氧樹脂、聚對苯二甲酸乙二酯樹脂、鐵氟龍(註冊商標)、低密度聚乙烯、高密度聚乙烯、彈性橡膠等所形成者。金屬膜是例如可設為含前述的金屬者。金屬膜是例如可利用濺射法、層壓法等來形成。此情況,金屬膜設於閃爍器5側為理想。若形成如此,則由於可藉由樹脂膜來覆蓋金屬膜,因此可抑制金屬膜因外力等而受傷。又,若金屬膜設於比樹脂膜更內側(閃爍器5側),則可抑制閃爍器5的特性因經由樹脂層的透濕而劣化。
又,可取代金屬膜,或與金屬膜一起設置無機膜。無機膜是例如可設為含氧化矽、氧化鋁等的膜。無機膜是例如可利用濺射法等來形成。Moreover, the moisture-
在設為含金屬膜的層疊薄板時,例如,可使用具有與金屬膜的厚度大致相同的厚度的樹脂膜。若設置具有如此的厚度的樹脂膜,則可使防濕部7的剛性增加,因此在製造工程中,可抑制在防濕部7產生針孔。另外,一般,樹脂的線膨脹係數是比金屬的線膨脹係數更大,因此若樹脂膜的厚度過厚,則容易產生後述的陣列基板2的彎曲。因此,樹脂膜的厚度是設為金屬膜的厚度以下為理想。In the case of a laminated sheet containing a metal film, for example, a resin film having a thickness approximately the same as that of the metal film can be used. If a resin film having such a thickness is provided, the rigidity of the moisture-
又,防濕部7的厚度是可考慮X線的吸收或剛性等來決定。此情況,若增厚防濕部7的厚度,則被防濕部7吸收的X線的量變多。另一方面,若將防濕部7的厚度形成薄,則剛性會降低而容易破損。In addition, the thickness of the moisture-
例如,若將防濕部7的厚度形成未滿10μm,則防濕部7的剛性過低,恐有因外力等所造成的損傷而產生針孔,發生洩漏之虞。若防濕部7的厚度超過50μm,則防濕部7的剛性過高,對閃爍器5的上端的凹凸的追隨性變差。因此,恐有前述的間隙或洩漏通道的確認困難之虞。而且,恐有後述的陣列基板2的彎曲容易發生之虞。For example, if the thickness of the moisture-
因此,防濕部7的厚度是10μm以上、50μm以下為理想。
此情況,防濕部7是例如可設為厚度為10μm以上,50μm以下的鋁箔。若鋁箔的厚度為10μm以上,50μm以下,則相較於厚度為100μm的鋁箔,可將X線的透過量增多20%~30%程度。又,若設為厚度為10μm以上,50μm以下的鋁箔,則可抑制前述的洩漏的發生,且前述的間隙或洩漏通道的確認容易。又,可抑制後述的陣列基板2的彎曲。Therefore, the thickness of the moisture-
在此,若對於人體進行大量的X線照射,則對健康有不良影響,因此對人體的X線照射量是被壓到必要的最低限度。為此,被用在醫療的X線檢測器1的情況,恐有被照射的X線的強度變小,透過防濕部7的X線的強度變得非常小之虞。本實施形態的防濕部7是設為厚度為10μm以上,50μm以下的薄板,因此即使被照射的X線的強度小的情況,也可進行X線畫像的攝影。Here, if a large amount of X-ray irradiation is performed on the human body, it will have an adverse effect on health. Therefore, the amount of X-ray irradiation on the human body is suppressed to the minimum necessary. For this reason, in the case of the
此情況,若將防濕部7的厚度形成薄,則防濕部7的剛性會降低。因此,若設置帽簷部等作為立體的防濕部,則例如在沖壓成形金屬箔時容易產生龜裂等。如圖2所示般,呈現薄板狀的防濕部7的周緣附近是被接合於密封部8的外面8a。因此,不需要預先將防濕部7加工成立體形狀,可照原樣將呈現薄板狀的防濕部7接合於密封部8的外面8a。其結果,即使將防濕部7的厚度設為10μm以上,50μm以下,也可抑制在防濕部7產生龜裂等。In this case, if the thickness of the moisture-
又,如後述般,藉由加熱防濕部7的周緣附近,來接合防濕部7的周緣附近與密封部8。此情況,一旦防濕部7的周緣附近的溫度及密封部8的溫度降低,則在防濕部7的周緣附近與密封部8之間產生熱應力。若在防濕部7的周緣附近與密封部8之間產生熱應力,則恐有在防濕部7的周緣附近與密封部8之間產生剝離之虞。一旦產生剝離,則恐有防濕性能顯著降低之虞。由於防濕部7的厚度是10μm以上,50μm以下,因此在熱應力產生時,防濕部7容易延長。所以,可使熱應力緩和,因此可抑制在防濕部7的周緣附近與密封部8之間產生剝離。In addition, as described later, by heating the vicinity of the periphery of the moisture-
如圖2所示般,密封部8是被接合於閃爍器5的側面5a與陣列基板2。此情況,密封部8是可使與閃爍器5的側面5a緊貼。閃爍器5成為複數的柱狀結晶的集合體的情況,在閃爍器5的側面5a形成有凹凸。因此,若密封部8的一部分被設在閃爍器5的側面5a的凹凸的內部,則可擴大密封部8與閃爍器5的接合強度。密封部8是可使與陣列基板2緊貼。若密封部8與陣列基板2緊貼,則可抑制含在大氣的水分等會透過密封部8與陣列基板2之間來到達閃爍器5。As shown in FIG. 2, the sealing
密封部8的外面8a的形狀是可設為突出至外側的曲面。如此,可拉長密封部8的外面8a與閃爍器5的側面5a之間的距離L。因此,可抑制含在大氣的水分等會透過密封部8的內部來到達閃爍器5。
又,若密封部8的外面8a的形狀成為突出至外側的曲面,則容易使防濕部7的周緣附近仿照密封部8的外面8a。因此,容易使防濕部7緊貼於密封部8。又,由於可使防濕部7平緩地變形,因此即使將防濕部7的厚度形成薄,也可抑制在防濕部7產生龜裂等。The shape of the
又,如圖2所示般,在使防濕部7緊貼於密封部8時,使防濕部7的周端面7a與陣列基板2接觸,或周端面7a位於陣列基板2的附近為理想。如此,可有效地抑制含在大氣的水分等侵入至密封部8的內部。Also, as shown in FIG. 2, when the moisture-
又,密封部8的高度是設為閃爍器5的高度以下為理想。若密封部8的高度成為閃爍器5的高度以下,則可使成為防濕部7的薄板不勉強變形,因此可抑制在防濕部7產生皺紋、破斷、針孔等。In addition, it is desirable that the height of the sealing
又,若密封部8的高度比閃爍器5的高度更低,則可使防濕部7的周緣附近彎曲。若可使防濕部7的周緣附近彎曲,則可吸收防濕部7的熱收縮量與陣列基板2的熱收縮量的差。因此,可抑制陣列基板2因熱應力而變形。
另外,有關使密封部8的高度比閃爍器5的高度更低的詳細後述(參照圖8)。In addition, if the height of the sealing
密封部8是可設為含熱可塑性樹脂作為主成分者。若密封部8含熱可塑性樹脂作為主成分,則可藉由加熱來與陣列基板2、閃爍器5及防濕部7接合。在此,例如,若密封部8含紫外線硬化樹脂作為主成分,則在將密封部8與陣列基板2、閃爍器5及防濕部7接合時需要照射紫外線。然而,防濕部7是含金屬等,因此無法使紫外線透過。又,若防濕部7設為透過紫外線者,則恐有閃爍器5因紫外線而變色,產生的螢光不被吸收之虞。
相對於此,密封部8是含熱可塑性樹脂作為主成分,因此可藉由加熱來容易地進行接合。又,閃爍器5也不會有藉由紫外線而變色的情形。又,由於密封部8的加熱與冷卻所要的時間短即能完成,因此可謀求製造時間的縮短,進而製造成本的減低。The sealing
熱可塑性樹脂是例如可設為尼龍、PET (Polyethyleneterephthalate)、聚氨酯、聚酯、聚氯乙烯、ABS(Acrylonitrile Butadiene Styrene),丙烯、聚苯乙烯、聚乙烯、聚丙烯等。此情況,聚乙烯的水蒸氣透過係數是0.068g・mm/day・m2
,聚丙烯的水蒸氣透過係數是0.04g・mm/day・m2
。因此,若密封部8含聚乙烯及聚丙烯的至少任一個作為主成分,則可大幅度減少透過密封部8的內部而到達閃爍器5的水分。
熱可塑性樹脂的剛性是可比防濕部7的剛性更低。The thermoplastic resin can be, for example, nylon, PET (Polyethyleneterephthalate), polyurethane, polyester, polyvinyl chloride, ABS (Acrylonitrile Butadiene Styrene), propylene, polystyrene, polyethylene, polypropylene, etc. In this case, the water vapor transmission coefficient of polyethylene is 0.068g・mm/day・m 2 , and the water vapor transmission coefficient of polypropylene is 0.04g・mm/day・m 2 . Therefore, if the sealing
又,密封部8是可更包含使用無機材料的填充物。若由無機材料所成的填充物含在密封部8,則可更抑制水分的透過。無機材料是例如可設為滑石、石墨、雲母、高嶺土(以高嶺石作為主成分的黏土)等。填充物是例如可設為具有扁平的形態者。從外部侵入至密封部8的內部的水分是藉由由無機材料所成的填充物來阻礙擴散,因此可使水分通過密封部8的速度減少。所以,可減少到達閃爍器5的水分的量。In addition, the sealing
在此,被保管在高溫多濕的環境的X線檢測器1會有時被使用在更低的溫度的環境,此如的情況,處於框體的內部的水蒸氣會結露,有時附著於X線檢測器1的表面。若在密封部8的外面8a有微細的龜裂,則附著於表面的水分會侵入至龜裂,恐有被導入至密封部8的內部之虞。又,有時X線檢測器1會被搬送至冰點下以下的環境,侵入至龜裂的水分會凍結。一旦侵入至龜裂的水分凍結,則體積會變大,因此隨著龜裂變大,水分更容易侵入。若以上的情形被重複,則恐有產生密封部8的破損、防濕部7與密封部8的剝離、陣列基板2與密封部8的剝離等之虞。
因此,密封部8的至少外面8a是具有撥水性者為理想。若密封部8的至少外面8a具有撥水性,則可抑制水分侵入至龜裂。
例如,可在密封部8的外面8a塗佈撥水劑。又,密封部8只要含聚乙烯及聚丙烯的至少任一個作為主成分,便可設為具有撥水性的外面8a。Here, the
又,將熱可塑性樹脂框狀地塗佈之後,緊接著觀察內部來檢查泡、異物、洩漏通道等的有無為理想。若如此的檢查可利用目視或光學顯微鏡來進行,則可使生產效率提升。因此,被框狀地塗佈的熱可塑性樹脂是在厚度為最厚的部分也透明為理想。亦即,密封部8是具有透光性者為理想。如此,可容易除去有泡、異物、洩漏通道等恐有壽命變短的製品。因此,可使製品的品質提升。In addition, after coating the thermoplastic resin in a frame shape, it is ideal to observe the inside immediately to check for the presence of bubbles, foreign matter, leakage channels, etc. If such inspection can be performed by visual inspection or optical microscope, production efficiency can be improved. Therefore, it is desirable that the thermoplastic resin coated in a frame shape is transparent at the thickest part. In other words, it is desirable that the sealing
其次,回到圖1,說明有關電路基板11。
如圖1所示般,電路基板11是被設在與陣列基板2的設有閃爍器5的側相反側。電路基板11是與X線檢測模組10 (陣列基板2)電性連接。
如圖3所示般,在電路基板11是設有讀出電路11a及訊號檢測電路11b。另外,亦可將該等的電路設於1個的基板,或亦可將該等的電路分開設於複數的基板。Next, returning to FIG. 1, the
讀出電路11a是切換薄膜電晶體2b2的ON狀態與OFF狀態。
讀出電路11a是具有複數的閘極驅動器11aa及行選擇電路11ab。
在行選擇電路11ab是從被設在X線檢測器1的外部之未圖示的畫像處理部等輸入控制訊號S1。行選擇電路11ab是按照X線畫像的掃描方向,輸入控制訊號S1至對應的閘極驅動器11aa。
閘極驅動器11aa是輸入控制訊號S1至對應的控制線2c1。
例如,讀出電路11a是經由可撓性印刷基板2e1來按各控制線2c1依序輸入控制訊號S1。薄膜電晶體2b2會依據被輸入至控制線2c1的控制訊號S1來成為ON狀態,可接收來自蓄積電容器的電荷(畫像資料訊號S2)。The
訊號檢測電路11b是具有複數的積分放大器11ba、複數的選擇電路11bb及複數的AD轉換器11bc。
1個的積分放大器11ba是與1條的資料線2c2電性連接。積分放大器11ba是依序接收來自光電變換部2b的畫像資料訊號S2。而且,積分放大器11ba是將在一定時間內流動的電流積分,且將對應於該積分値的電壓輸出至選擇電路11bb。如此,可將在預定的時間內流動於資料線2c2的電流的値(電荷量)變換成電壓値。亦即,積分放大器11ba是將對應於在閃爍器5中產生的螢光的強弱分布之畫像資料資訊變換成電位資訊。The signal detection circuit 11b has a complex integrating amplifier 11ba, a complex selection circuit 11bb, and a complex AD converter 11bc.
One integrating amplifier 11ba is electrically connected to one data line 2c2. The integrating amplifier 11ba sequentially receives the image data signal S2 from the
選擇電路11bb是選擇進行讀出的積分放大器11ba,依序讀出被變換成電位資訊的畫像資料訊號S2。 AD轉換器11bc是將被讀出的畫像資料訊號S2依序變換成數位訊號。被變換成數位訊號的畫像資料訊號S2是經由配線來輸入至畫像處理部。另外,被變換成數位訊號的畫像資料訊號S2是亦可藉由無線來發送至畫像處理部。The selection circuit 11bb selects the integrating amplifier 11ba for reading, and sequentially reads the image data signal S2 converted into potential information. The AD converter 11bc sequentially converts the read image data signal S2 into a digital signal. The image data signal S2 converted into a digital signal is input to the image processing unit via wiring. In addition, the image data signal S2 converted into a digital signal can also be sent to the image processing unit by wireless.
畫像處理部是根據被變換成數位訊號的畫像資料訊號S2來構成X線畫像。另外,畫像處理部是亦可與電路基板11一體化。The image processing unit composes an X-ray image based on the image data signal S2 converted into a digital signal. In addition, the image processing unit may be integrated with the
其次,說明有關其他的實施形態的X線檢測模組。
圖4(a)、(b)是用以舉列表示其他的實施形態的X線檢測模組10a的模式剖面圖。如後述般,密封部8是藉由將使軟化的熱可塑性樹脂框狀地塗佈於陣列基板2上或以3D印表機等來將熱可塑性樹脂框裝地設於陣列基板2上來形成。因此,會有密封部8的尺寸偏差的情況。Next, X-ray detection modules related to other embodiments will be described.
4(a) and (b) are schematic cross-sectional views for illustrating the
若密封部8的尺寸有偏差,則防濕部7的周端面7a會與陣列基板2干涉,而有在防濕部7的周緣附近產生皺紋等的情況。一旦在防濕部7的周緣附近產生皺紋等,則恐有產生防濕部7的剝離等之虞。
此情況,如圖4(a)所示般,可使在防濕部17的周端面17a與陣列基板2之間設有距離H1。例如,只要縮短呈現薄板狀的防濕部17的尺寸即可。如此,即使密封部8的尺寸有偏差,也可抑制在防濕部17的周緣附近產生皺紋等。If there is a deviation in the size of the sealing
此情況,若距離H1太大,則恐有侵入至密封部8的內部的水分變多之虞。若根據本發明者們取得的見解,則如圖4(b)所示般,使距離H1成為密封部8的高度H2的一半以下為理想。此情況,若距離H1變更小,則侵入至密封部8的內部的水分會變更少。In this case, if the distance H1 is too large, there is a possibility that the moisture intruding into the inside of the sealing
圖5是用以舉例表示其他的實施形態的X線檢測模組10b的模式剖面圖。
圖6(a)是防濕部17的模式平面圖。
圖6(b)是防濕部17的模式立體圖。
如圖5所示般,亦可沿著陣列基板2來折彎防濕部17的周緣附近。亦即,可在防濕部17的周緣設置沿著陣列基板2的折彎部17b。此情況,折彎部17b是亦可黏著於陣列基板2。如此,可藉由防濕部17來覆蓋密封部8的外面8a,因此可有效地抑制水分侵入至防濕部17的內部。另外,若太擴大折彎部17b的尺寸,則恐有不能謀求X線檢測模組10b的小型化,進而X線檢測器1的小型化之虞。因此,折彎部17b的尺寸是例如設為2mm以下為理想。FIG. 5 is a schematic cross-sectional view for illustrating an
又,若將防濕部17的周緣附近折彎,則會產生以下的問題。
防濕部17是可使用無歪斜或凹凸的薄板來形成。若將成為防濕部17的薄板蓋在閃爍器5上,則薄板是形成僅閃爍器5的厚度的程度從陣列基板2浮起的狀態。容易沿著密封部8來將處於如此的狀態的薄板的周緣附近彎曲至陣列基板2側,拉長的應力是幾乎不會施加於薄板。In addition, if the vicinity of the periphery of the moisture-
可是,在呈現框狀的密封部8的角落的部分,將薄板折彎成與邊相同的形狀是幾何學上不可能。因此,需要藉由拉長薄板的一部分來使沿著密封部8。
防濕部17是被要求遮蔽來自外部的水分,但若拉長薄板的一部分,則恐有該部分變薄,或產生微細的龜裂,或產生針孔之虞。一旦產生龜裂或針孔,則遮蔽水分的能力會降低。However, it is geometrically impossible to bend the thin plate into the same shape as the side in the corner portion of the frame-shaped
此情況,如圖6(a)、(b)所示般,若在防濕部17的角落部設置朝向外側突出的凸狀的凸部17c,則可吸收前述的幾何學的歪斜。因此,可抑制薄板的一部分被拉長,所以可抑制產生龜裂或針孔。In this case, as shown in Figs. 6(a) and (b), if a
圖7是用以舉例表示其他的實施形態的X線檢測模組10c的模式剖面圖。
如前述般,陣列基板2的材料、閃爍器5的材料、防濕部7的材料及密封部8的材料是不同。因此,分別具有不同的線膨脹係數。在此,X線檢測模組10c起動的期間產生熱,因此該等的溫度會變高。又,亦有X線檢測器1的周圍的溫度變化的情況。因此,按照溫度變化,在該等之間產生熱應力。此情況,一旦在防濕部7產生拉伸應力F,則拉伸應力F會被施加於防濕部7與密封部8的接合部分,或密封部8與陣列基板2的接合部分,恐有發生剝落或破斷等之虞。一旦發生剝落或破斷等,則水分容易到達閃爍器5。又,亦有在陣列基板2產生彎曲等的變形之虞。FIG. 7 is a schematic cross-sectional view for illustrating an
於是,在本實施形態的X線檢測模組10c中,在密封部8的外面8a設置凹部8a1。若設有凹部8a1,則凹部8a1的附近容易變形。因此,藉由凹部8a1的附近變形,可使產生的拉伸應力F緩和。Therefore, in the
又,可在防濕部7的與凹部8a1對峙的部分設置撓曲部7c。撓曲部7c是可比防濕部7的未設有撓曲部7c的部分更容易彈性變形。若設有撓曲部7c,則藉由撓曲部7c彈性變形,可使產生的拉伸應力F緩和。此情況,撓曲部7c與凹部8a1是亦可使接觸,或如圖7所示般亦可在撓曲部7c與凹部8a1之間設置間隙。若撓曲部7c與凹部8a1接觸,則由於可提高撓曲部7c的剛性,因此可抑制在撓曲部7c產生破斷或針孔。若在撓曲部7c與凹部8a1之間設有間隙,則由於撓曲部7c的變形容易,因此拉伸應力F的緩和變容易。
若可使拉伸應力F緩和,則可抑制防濕部7的剝落或破斷等。又,可抑制在陣列基板2產生彎曲等的變形。Moreover, the bending
又,如後述的圖15所示般,在密封部8的外面8a是亦可設置凸部18c。另外,有關凸部18c的詳細後述。Moreover, as shown in FIG. 15 mentioned later, the
圖8是用以舉例表示其他的實施形態的X線檢測模組10d的模式剖面圖。
如圖8所示般,密封部8的高度H3是可比閃爍器5的高度H4更低。若密封部8的高度H3比閃爍器5的高度H4更低,則可使防濕部7的周緣附近彎曲。亦即,如此,容易設置防濕部7的周緣附近的撓曲部7d。撓曲部7d是比防濕部7的未設有撓曲部7d的部分更容易彈性變形。若設有撓曲部7d,則可取得與前述的撓曲部7c同樣的效果。亦即,藉由撓曲部7d彈性變形,可使產生的拉伸應力F緩和,因此可抑制防濕部7的剝落或破斷等發生或在陣列基板2產生彎曲等的變形。Fig. 8 is a schematic cross-sectional view illustrating an
例如,使用鋁箔的防濕部7的線膨脹係數是成為23×10-6
程度。陣列基板2的線膨脹係數是成為4×10-6
程度。因此,若被固定於密封部8的防濕部7的溫度降低,則防濕部7會比陣列基板2還收縮大。此情況,若防濕部7成為幾乎完全的平面狀,則無法吸收收縮量的差,在陣列基板2產生彎曲。相對於此,若設有撓曲部7c、7d,則可吸收收縮量的差,因此可抑制在陣列基板2產生彎曲。For example, the coefficient of linear expansion of the moisture-
此情況,閃爍器5的高度H4與密封部8的高度H3的差是可設為防濕部7的厚度以上。例如,閃爍器5的高度H4與密封部8的高度H3的差是可設為0.1mm以上。另一方面,若密封部8的高度H3過低,則在靜電等的高的電壓被施加時,恐有防濕部7與陣列基板2短路之虞。因此,閃爍器5的高度H4與密封部8的高度H3的差是設為0.5mm以下為理想。亦即,閃爍器5的高度H4與密封部8的高度H3的差是設為0.1mm以上,0.5mm以下為理想。In this case, the difference between the height H4 of the
若根據本發明者們取得的見解,則密封部8的高度H3是閃爍器5的高度H4的30%以上,70%以下為理想。若將密封部8的高度H3設為如此,則可謀求前述的陣列基板2的彎曲的抑制、每單位時間的透濕量的減低、密封部8的形成所必要的材料的量的減低等。According to the findings obtained by the inventors, the height H3 of the sealing
例如,每單位時間的透濕量的減低效果是可如以下般思考。
若將防濕部7與密封部8的合計之每單位時間的透濕量設為Q,將防濕部7的每單位時間的透濕量設為Q7,將密封部8的每單位時間的透濕量設為Q8,則以下的式子成立。
Q=Q7+Q8
此情況,由於Q7是可思考成大致一定,因此Q的增減是幾乎依據Q8的增減而定。
在此,若將密封部8的透濕係數設為P,將密封部8的透濕剖面積設為S(mm2
),將密封部8的透濕寬度設為W,將密封部8的周長設為L(mm),將密封部8的高度設為H(mm),則以下的式子成立。
Q8=P×S/W=P×L×H/W
因此,若縮小密封部8的高度H,則可縮小密封部8的每單位時間的透濕量Q8,進而可縮小防濕部7與密封部8的合計之每單位時間的透濕量Q。
亦即,由於可謀求防濕性的提升,因此可使X線檢測模組10的可靠度提升。For example, the effect of reducing the moisture permeability per unit time can be considered as follows. If the total moisture permeability per unit time of the moisture-
圖9(a)、(b)是用以舉例表示其他的實施形態的撓曲部7e的模式剖面圖。
如圖9(a)、(b)所示般,撓曲部7e是亦可設在防濕部7的與閃爍器5的上面5b對峙的區域。撓曲部7e是例如可設為呈現壓紋狀。撓曲部7e的與閃爍器5側相反側的面(X線射入的側的面)是從防濕部7的與閃爍器5側相反側的面朝向外部突出。撓曲部7e的閃爍器5的面是從防濕部7的閃爍器5側的面朝向外部突出。Figs. 9(a) and (b) are schematic cross-sectional views for illustrating another embodiment of the
撓曲部7e的肉厚尺寸是可設為與防濕部7的未設有撓曲部7e的部分的肉厚尺寸大致相同。撓曲部7e是例如藉由在薄板狀的防濕部7實施根據沖壓刻印金屬模具的沖壓加工(模壓加工)來形成。另外,即使為層疊樹脂膜及由無機材料所成的膜之低透濕防濕膜,還是可藉由實施根據沖壓刻印金屬模具的沖壓加工(模壓加工)來形成撓曲部7e。The thickness of the
撓曲部7e的高度尺寸是可比防濕部7的未設有撓曲部7e的部分的肉厚尺寸更大。撓曲部7e的寬度尺寸、數量、配置等是無特別加以限定。撓曲部7e的寬度尺寸、數量、配置等是可按照前述的熱收縮量的大小或防濕部7的大小等來適當決定。The height dimension of the
撓曲部7e是比防濕部7的未設有撓曲部7e的部分更容易彈性變形。因此,藉由撓曲部7e彈性變形,可吸收根據線膨脹係數的差的熱收縮量的差。因此,若設置撓曲部7e,則可抑制在陣列基板2產生彎曲。
此情況,如圖9(a)所示般,亦可在防濕部7只設撓曲部7e,或如圖9(b)所示般,亦可在防濕部7設置撓曲部7e,且在防濕部7的周緣附近設置撓曲部7d、7c。The
圖10是用以舉例表示比較例的X線檢測模組110的模式剖面圖。
如圖10所示般,密封部8會與陣列基板2接合,若未與閃爍器5的側面5a接合,則容易發生密封部8的剝落。例如前述般,藉由起動所造成的溫度變化或周圍溫度的變化而產生熱應力。此情況,若密封部8只與陣列基板2接合,則密封部8的接合強度會變低。因此,恐有因產生的熱應力而發生密封部8的剝落之虞。FIG. 10 is a schematic cross-sectional view for illustrating an
相對的,在本實施形態的X線檢測模組10、10a~10c中,密封部8是被接合於閃爍器5的側面5a與陣列基板2。又,密封部8是與閃爍器5的側面5a緊貼。再者,密封部8的一部分會被設在閃爍器5的側面5a的凹凸的內部。因此,可提高密封部8的接合強度,所以可抑制密封部8因熱應力而剝落。In contrast, in the
圖11是用以舉例表示比較例的X線檢測模組110a的模式剖面圖。
如圖11所示般,密封部118的外面118a的露出部118a1是成為隨著往陣列基板2側而傾斜至接近閃爍器5的方向的傾斜面。因此,在陣列基板2的附近,密封部118的外面118a與閃爍器5的側面5a之間的距離L變短。因此,含在大氣的水分等會容易透過密封部118與陣列基板2之間來到達閃爍器5。FIG. 11 is a schematic cross-sectional view for illustrating an
相對的,在本實施形態的X線檢測模組10、10a~10c中,密封部8的外面8a的形狀是成為突出至外側的曲面。因此,在陣列基板2的附近,可拉長密封部18的外面18a與閃爍器5的側面5a之間的距離L,所以含在大氣的水分等難以到達閃爍器5。In contrast, in the
圖12是用以舉例表示比較例的X線檢測模組110b的模式剖面圖。
如圖12所示般,若密封部128的高度比閃爍器5的高度更高,則在蓋上成為防濕部17的薄板時須使勉強地變形。因此容易在防濕部17產生皺紋、破斷、針孔等。
又,密封部128的外面128a的露出部分容易變大。一旦露出部分變大,則水分的透過剖面變大,因此更多的水分會容易侵入至密封部128的內部。FIG. 12 is a schematic cross-sectional view for illustrating an
相對於此,在本實施形態的X線檢測模組10、10a~10c中,密封部8的高度會成為閃爍器5的高度以下,因此可使成為防濕部7的薄板不勉強變形。因此,可抑制在防濕部7產生皺紋、破斷、針孔等。On the other hand, in the
圖13是用以舉例表示比較例的X線檢測模組110c的模式剖面圖。
如圖13所示般,若密封部138的外面138a成為垂直於陣列基板2的平面,則難以用防濕部117來覆蓋外面138a。若外面138a未藉由防濕部117所覆蓋,則由於水分的透過剖面變大,因此更多的水分會容易侵入至密封部138的內部。此情況,若將防濕部117的周緣附近117a折彎來覆蓋外面138a,則容易在折彎部117b產生龜裂或破斷。一旦產生龜裂或破斷,則恐有水分經由龜裂或破斷來侵入之虞。FIG. 13 is a schematic cross-sectional view for illustrating an
相對於此,在本實施形態的X線檢測模組10、10a~10c中,密封部8的外面8a的形狀是成為突出至外側的曲面。因此,在藉由密封部7來覆蓋外面8a時,不會產生須勉強地彎曲密封部7的部分。因此,無產生龜裂或破斷的情形,可藉由密封部7來覆蓋外面8a。In contrast, in the
(X線檢測模組的製造方法及X線檢測器的製造方法)
其次,舉例表示有關X線檢測模組的製造方法及X線檢測器的製造方法。
首先,在基板2a上依序形成控制線2c1、資料線2c2、配線焊墊2d1、配線焊墊2d2、光電變換部2b及保護層2f等而製造陣列基板2。陣列基板2是例如可使用半導體製造製程來製造。另外,陣列基板2的製造是適用既知的技術,因此詳細的說明省略。(Method of manufacturing X-ray inspection module and method of manufacturing X-ray detector)
Next, an example of the manufacturing method of the X-ray detection module and the manufacturing method of the X-ray detector are shown.
First, a control line 2c1, a data line 2c2, a wiring pad 2d1, a wiring pad 2d2, a
其次,以覆蓋基板2a上的有效畫素區域A的方式形成閃爍器5。
例如,閃爍器5是可利用真空蒸鍍法來形成。若利用真空蒸鍍法來形成閃爍器5,則形成由複數的柱狀結晶的集合體所成的閃爍器5。閃爍器5的厚度是可按照被X線檢測器1要求的DQE特性、感度特性、解像度特性等來適當變更。閃爍器5的厚度是例如可設為600μm程度。Next, the
又,亦可混合發光物質及黏合劑材,以覆蓋有效畫素區域A的方式塗佈被混合的材料,予以燒成,在被燒成的材料形成矩陣狀的溝部,每複數的光電變換部2b設有四角柱狀的閃爍器5。In addition, it is also possible to mix the luminescent material and the adhesive material, apply the mixed material so as to cover the effective pixel area A, and then fire it. The fired material forms a matrix of grooves for every plural
其次,在閃爍器5上形成反射層6。
例如,反射層6是可藉由將混合複數的光散射性粒子、樹脂及溶媒的塗佈液塗佈於閃爍器5上,使乾燥而形成。
又,例如,亦可藉由將由銀合金或鋁等的光反射率高的金屬所成的層成膜於閃爍器5上而形成反射層6。
又,例如,亦可將表面由銀合金或鋁等的光反射率高的金屬所成的薄板或含光散射性粒子的樹脂薄板等設置或貼附於閃爍器5上而設置反射層6。Next, a
其次,形成密封部8。
例如,使用溶劑來使熱可塑性樹脂軟化,將使軟化的熱可塑性樹脂框狀地塗佈於閃爍器5的周圍,使溶劑蒸發而固化熱可塑性樹脂,可形成密封部8。
又,例如,藉由加熱熱可塑性樹脂來使軟化,將使軟化的熱可塑性樹脂框狀地塗佈於閃爍器5的周圍,藉由放熱等來使熱可塑性樹脂固化而可形成密封部8。
又,例如,亦可使用3D印表機等來形成框狀的密封部8。Next, the sealing
圖14是用以舉例表示比較例的熱可塑性樹脂18的塗佈的模式立體圖。如前述般,使軟化的熱可塑性樹脂18是被框狀地塗佈。因此,接縫18a會至少產生1處。框狀地塗佈使軟化的熱可塑性樹脂18時,若將熱可塑性樹脂18的每單位時間的供給量設為一定,或將吐出熱可塑性樹脂18的噴嘴的移動速度B設為一定,則如圖14所示般,有在供給的始點與供給的終點的接縫18a產生凹陷18b的情況。例如,若供給的始點與供給的終點分離,則有在供給的始點與供給的終點的接縫18a產生高度比周圍低的陡峭的凹陷18b的情況。一旦產生陡峭的凹陷18b,則成為防濕部7的薄板無法沿著凹陷18b,恐有產生洩漏通道之虞。在洩漏通道的部分,防濕部7與密封部8的外面8a未被接合,水分容易經由洩漏通道來侵入。FIG. 14 is a schematic perspective view for illustrating the application of the
圖15是用以舉例表示本實施形態的熱可塑性樹脂18的塗佈的模式立體圖。
如圖15所示般,可在接縫18a形成凸部18c。例如,可藉由在接縫18a的部分使熱可塑性樹脂18的每單位時間的供給量增加或使噴嘴的移動速度B延遲來形成凸部18c。此情況,具有平緩的外面,形成高度低的凸部18c為理想。
相較於陡峭的凹陷18b,使成為防濕部7的薄板沿著凸部18c較為容易。因此,可抑制洩漏通道產生。FIG. 15 is a schematic perspective view for exemplifying the application of the
其次,將成為防濕部7的薄板蓋在閃爍器5、反射層6及密封部8,將薄板的周緣附近接合於密封部8的外面8a。
例如,在將薄板的周緣附近推壓於密封部8的外面8a的狀態下加熱薄板,可使密封部8的外面8a溶融而接合防濕部7。藉由薄板接合於密封部8的外面8a來形成防濕部7。
薄板的接合是可在比大氣壓更減壓的環境中進行。Next, a thin plate serving as the moisture-
在比大氣壓更減壓的環境中,將薄板接合於密封部8的外面8a。
藉此,可抑制含水蒸氣的空氣被收納於防濕部7的內部。又,如藉由航空機來輸送X線檢測器1的情況等般,即使是X線檢測器1被放置在比大氣壓更減壓的環境的情況,還是可抑制防濕部7因處於防濕部7的內部的空氣而膨脹或變形。又,由於防濕部7會藉由大氣壓而壓制住,因此防濕部7會緊貼於閃爍器5。
如以上般,可製造X線檢測模組10、10a~10c。The thin plate is joined to the
其次,經由可撓性印刷基板2e1、2e2來電性連接陣列基板2與電路基板11。
其他,適當安裝電路零件等。Next, the
其次,在未圖示的框體的內部容納陣列基板2、電路基板11等。
此情況,若陣列基板2的彎曲大,則恐有陣列基板2與被容納於框體的內部的構件干涉,或陣列基板2干涉到框體的內壁之虞。如前述般,若設為本實施形態的X線檢測模組10,則由於可抑制陣列基板2的彎曲,因此可謀求組裝工程的作業的順暢化。
又,可因應所需,進行確認光電變換元件2b1的異常的有無或電氣性的連接的異常的有無之電氣試驗、X線畫像試驗等。
如以上般,可製造X線檢測器1。
另外,為了確認製品的防濕可靠度或對於溫度環境的變化的可靠度,亦可實施高溫高濕試驗、冷熱循環試驗等。Next, the
如以上說明般,本實施形態的X線檢測模組的製造方法是可具備以下的工程。
在被設於陣列基板2的複數的光電變換部2b上形成閃爍器5的工程。
將使軟化的熱可塑性樹脂18框狀地塗佈於閃爍器5的周圍而形成密封部8的工程。
使成為防濕部7的薄板蓋在閃爍器5及密封部8,加熱薄板的周緣附近,將薄板的周緣附近接合於密封部8的外面8a的工程。
此情況,在密封部8形成的工程中,可在塗佈的接縫18a形成凸部18c。As described above, the manufacturing method of the X-ray detection module of this embodiment can include the following processes.
The process of forming the
以上,舉例表示本發明的幾個的實施形態,但該等的實施形態是作為例子提示者,不是意圖限定發明的範圍。該等新穎的實施形態是可用其他的各種的形態來實施,可在不脫離發明的主旨範圍進行各種的省略、置換,變更等。該等實施形態及其變形例為發明的範圍或主旨所包含,且為申請專利範圍記載的發明及其均等的範圍所包含。又,前述的各實施形態是可互相組合實施。As mentioned above, several embodiments of the present invention have been exemplified, but these embodiments are presented as examples and are not intended to limit the scope of the invention. These novel embodiments can be implemented in various other forms, and various omissions, substitutions, changes, etc. can be made without departing from the scope of the spirit of the invention. These embodiments and their modifications are included in the scope or gist of the invention, and are included in the invention described in the scope of patent application and its equivalent scope. In addition, the aforementioned embodiments can be implemented in combination with each other.
1:X線檢測器 2:陣列基板 2a:基板 2b:光電變換部 2b1:光電變換元件 2b2:薄膜電晶體 2c1:控制線 2c2:資料線 2d1:配線焊墊 2d2:配線焊墊 2e1:可撓性印刷基板 2e2:可撓性印刷基板 2f:保護層 5:閃爍器 6:反射層 7:防濕部 7a:周端面 7c:撓曲部 7d:撓曲部 8:密封部 8a:外面 8a1:凹部 10:X線檢測模組 10a:X線檢測模組 10b:X線檢測模組 10c:X線檢測模組 10d:X線檢測模組 11:電路基板 11a:讀出電路 11aa:閘極驅動器 11ab:行選擇電路 11b:訊號檢測電路 11ba:積分放大器 11bb:選擇電路 11bc:AD轉換器 12:支撐板 17:防濕部 17a:周端面 17b:折彎部 18:熱可塑性樹脂 18a:接縫 18b:凹陷 18c:凸部 110:X線檢測模組 110a:X線檢測模組 110b:X線檢測模組 110c:X線檢測模組 117:防濕部 118:密封部 118a:外面 118a1:露出部 128:密封部 128a:外面 138:密封部 138a:外面 S1:控制訊號 S2:畫像資料訊號 H1:距離 L:距離 H2:高度 H3:高度 H4:高度 F:拉伸應力1: X-ray detector 2: Array substrate 2a: substrate 2b: Photoelectric conversion section 2b1: photoelectric conversion element 2b2: thin film transistor 2c1: control line 2c2: data line 2d1: Wiring pad 2d2: Wiring pad 2e1: Flexible printed circuit board 2e2: Flexible printed circuit board 2f: protective layer 5: scintillator 6: reflective layer 7: Moisture-proof part 7a: Zhou end face 7c: Flexure 7d: Flexure 8: Sealing part 8a: outside 8a1: recess 10: X-ray detection module 10a: X-ray inspection module 10b: X-ray detection module 10c: X-ray detection module 10d: X-ray detection module 11: Circuit board 11a: readout circuit 11aa: gate driver 11ab: Row selection circuit 11b: Signal detection circuit 11ba: integrating amplifier 11bb: select circuit 11bc: AD converter 12: Support plate 17: Moisture-proof part 17a: Zhou end face 17b: Bending part 18: Thermoplastic resin 18a: seam 18b: depression 18c: convex 110: X-ray detection module 110a: X-ray inspection module 110b: X-ray detection module 110c: X-ray detection module 117: Moisture-proof part 118: Sealing part 118a: outside 118a1: exposed part 128: Sealing part 128a: outside 138: Seal 138a: outside S1: Control signal S2: image data signal H1: distance L: distance H2: height H3: height H4: height F: Tensile stress
[圖1]是用以舉例表示本實施形態的X線檢測器及X線檢測模組的模式立體圖。
[圖2]是用以舉例表示X線檢測模組的模式剖面圖。
[圖3]是X線檢測器的方塊圖。
[圖4](a)、(b)是用以舉例表示其他的實施形態的X線檢測模組的模式剖面圖。
[圖5]是用以舉例表示其他的實施形態的X線檢測模組的模式剖面圖。
[圖6](a)是防濕部的模式平面圖,(b)是防濕部17的模式立體圖。
[圖7]是用以舉例表示其他的實施形態的X線檢測模組的模式剖面圖。
[圖8]是用以舉例表示其他的實施形態的X線檢測模組的模式剖面圖。
[圖9](a)、(b)是用以舉例表示其他的實施形態的撓曲部的模式剖面圖。
[圖10]是用以舉例表示比較例的X線檢測模組的模式剖面圖。
[圖11]是用以舉例表示比較例的X線檢測模組的模式剖面圖。
[圖12]是用以舉例表示比較例的X線檢測模組的模式剖面圖。
[圖13]是用以舉例表示比較例的X線檢測模組的模式剖面圖。
[圖14]是用以舉例表示比較例的熱可塑性樹脂的塗佈的模式立體圖。
[圖15]是用以舉例表示本實施形態的熱可塑性樹脂的塗佈的模式立體圖。[Fig. 1] is a schematic perspective view for illustrating the X-ray detector and the X-ray detection module of this embodiment.
[Figure 2] is a schematic cross-sectional view illustrating an X-ray detection module.
[Figure 3] is a block diagram of the X-ray detector.
[FIG. 4] (a) and (b) are schematic cross-sectional views for illustrating X-ray detection modules of other embodiments.
[Fig. 5] is a schematic cross-sectional view for illustrating an X-ray detection module of another embodiment.
[Fig. 6] (a) is a schematic plan view of the moisture-proof portion, and (b) is a schematic perspective view of the moisture-
2:陣列基板 2: Array substrate
2a:基板 2a: substrate
2b:光電變換部 2b: Photoelectric conversion section
2f:保護層 2f: protective layer
5:閃爍器 5: scintillator
5a:側面 5a: side
6:反射層 6: reflective layer
7:防濕部 7: Moisture-proof part
7a:周端面 7a: Zhou end face
8:密封部 8: Sealing part
8a:外面 8a: outside
10:X線檢測模組 10: X-ray detection module
12:支撐板 12: Support plate
A:有效畫素區域 A: Effective pixel area
L:距離 L: distance
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