TW202030065A - Electronic component crimping device and test handler including the same in which the position of the pressing-picking device or the spacing between the adjacent pressing-picking devices can be adjusted - Google Patents
Electronic component crimping device and test handler including the same in which the position of the pressing-picking device or the spacing between the adjacent pressing-picking devices can be adjusted Download PDFInfo
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本發明是關於用於電子元件測試分類作業中的壓接裝置,能夠將電子元件壓接於測試設備進行測試,以完成電子元件的測試分類作業。The invention relates to a crimping device used in the testing and classification of electronic components, which can crimp the electronic components to the testing equipment for testing, so as to complete the testing and classification of the electronic components.
電子元件測試分類設備能夠用來對電子元件(例如具錫球的IC)進行測試,主要是利用分類設備將電子元件逐個或逐批從電子元件的料盤取出,移送至測試設備,待測試設備測試完成後,分類設備再依測試結果將電子元件分類移送、放置於指定位置,例如是不同的數個料盤上。Electronic component testing and classification equipment can be used to test electronic components (such as ICs with solder balls), mainly using classification equipment to take out the electronic components from the electronic component tray one by one or batch by batch, and transfer them to the testing equipment. The equipment to be tested After the test is completed, the sorting equipment sorts and transfers the electronic components according to the test results and places them in designated locations, for example, on several different trays.
在上述的電子元件測試分類設備中,由於每批量測試的電子元件規格尺寸可能會不同,以致測試設備的測試座的尺寸以及相鄰測試座的間距會依待測電子元件改變,此外,電子元件的尺寸以及擺放在料盤中的間距也會不同,導致電子元件在料盤中的間距與測試時的間距不同,需要進行適當的變距與對位才能順利進行測試。In the above-mentioned electronic component testing and classification equipment, since the specifications and dimensions of the electronic components tested in each batch may be different, the size of the test socket of the test equipment and the distance between adjacent test sockets will change according to the electronic component to be tested. In addition, the electronic component The size and spacing of the electronic components in the tray will also be different, resulting in the difference between the spacing of the electronic components in the tray and the spacing during the test, and proper pitch change and alignment are required for the test to proceed smoothly.
基於上述情形,現有的分類設備大多具有變距機構,例如TWI569356號專利與TWI603821號專利中的變距機構即為一例,變距機構能夠從電子元件的料盤拿取多個電子元件,拿取後改變電子元件的間距,再將電子元件放置於入料載台,或者是從出料載台拿取電子元件,改變電子元件的間距後再將電子元件放置於料盤,藉此,移料器或壓移器只需要將電子元件從入料載台取出,移動壓抵於測試座,測試完成後再將電子元件移動放置於出料載台,即可利用同一分類設備配合使用於測試多種不同規格尺寸的電子元件。Based on the above situation, most of the existing sorting equipment has a pitch changing mechanism. For example, the pitch changing mechanism in the TWI569356 patent and the TWI603821 patent is an example. The pitch changing mechanism can take multiple electronic components from the electronic component tray. Then change the distance of the electronic components, and then place the electronic components on the feeding stage, or take the electronic components from the discharge stage, change the distance of the electronic components, and then place the electronic components on the tray, thereby moving the material Only need to take out the electronic components from the loading platform, move the electronic components against the test base, and move the electronic components on the discharge platform after the test is completed. The same sorting equipment can be used to test multiple Electronic components of different sizes.
前述分類設備雖然能夠配合使用於測試多種不同規格尺寸的電子元件,但是在改變測試不同規格尺寸的電子元件時,需要使用不同的測試設備,各個測試設備上的測試座具有各別不同的規格尺寸與測試座間距,需要將移料器或壓移器及其治具卸下,連同治具改換成另一個符合測試座與電子元件規格尺寸的移料器或壓移器,拆卸與改換移料器或壓移器的過程中,需要耗費時間反覆拆卸、對位與校正,將會降低整體生產線的稼動率,而同一分類設備需要準備多組移料器或壓移器進行替換,也會增加分類設備的設備成本。Although the aforementioned classification equipment can be used to test a variety of electronic components with different specifications and sizes, when changing and testing electronic components with different specifications and sizes, different test equipment is required. The test sockets on each test equipment have different specifications and sizes. The distance from the test seat needs to be removed from the shifter or pressure shifter and its jig, and the jig is replaced with another shifter or pressure shifter that meets the specifications and dimensions of the test seat and electronic components. Disassembly and replacement During the process of the feeder or the pressure shifter, it takes time to repeatedly disassemble, align and correct, which will reduce the utilization rate of the overall production line. The same sorting equipment needs to prepare multiple sets of shifters or pressure shifters for replacement. Increase equipment cost of sorting equipment.
因此,本發明的其中一項目的在於提供一種壓接裝置,具有可拿取電子元件的壓取器,且壓取器的位置可供調整,而不需要準備多組壓取器進行替換。Therefore, one of the objectives of the present invention is to provide a crimping device with a depressor capable of taking electronic components, and the position of the depressor can be adjusted without the need to prepare multiple groups of depressors for replacement.
其次,在壓接裝置中具有可調整位置的壓取器,將能夠在改變測試的電子元件的規格尺寸時,以調整的方式改變壓取器的位置或相鄰兩個壓取器之間的間距,免除拆卸組裝壓取器及其治具所需要的時間。Secondly, the presser with adjustable position in the crimping device will be able to change the position of the presser or the gap between two adjacent pressers in an adjustable manner when changing the specifications and dimensions of the electronic components to be tested. Spacing, eliminating the time required to disassemble and assemble the press and its fixture.
為了達成上述及其他目的,本發明提供一種電子元件壓接裝置,包括變距組、壓取器與驅動機構。變距組包括座部與至少一載台,該載台位於座部的其中一表面,且該載台在該座部表面的位置為可調整者。壓取器設置於載台,使壓取器的位置能隨載台調整。變距組設置於驅動機構,使驅動機構能帶動變距組與壓取器沿一壓接方向移動。In order to achieve the above and other objectives, the present invention provides a crimping device for electronic components, which includes a variable pitch group, a press and a driving mechanism. The variable pitch set includes a seat and at least one carrier. The carrier is located on one of the surfaces of the seat, and the position of the carrier on the surface of the seat is adjustable. The extractor is arranged on the carrier so that the position of the extractor can be adjusted with the carrier. The variable pitch group is arranged on the driving mechanism, so that the driving mechanism can drive the variable pitch group and the presser to move in a crimping direction.
在某些情況中,座部與載台其中之一具有定位孔,其中另一者具有定位柱,變距組還包含鎖附裝置,使載台可拆卸地壓抵於座部,並且使定位柱插置於該定位孔。In some cases, one of the seat and the carrier has a positioning hole, and the other has a positioning post. The pitch change set also includes a locking device to make the carrier detachably press against the seat and position the The column is inserted into the positioning hole.
在某些情況中,鎖附裝置包含電磁線圈,電磁線圈固定地設置於座部與載台其中之一,座部與載台的其中另一者以磁性材質製成,較佳者,座部與載台其中一者還具有永久磁鐵,其中另一者以磁性材質製成。In some cases, the locking device includes an electromagnetic coil, the electromagnetic coil is fixedly disposed on one of the seat and the carrier, and the other of the seat and the carrier is made of a magnetic material, preferably, the seat One of the carrier and the carrier also has a permanent magnet, and the other is made of magnetic material.
在某些情況中,座部與載台其中之一具有穿孔,其中另一者具有螺孔,該鎖附裝置包含螺桿,螺桿穿設於穿孔並且螺鎖於螺孔。In some cases, one of the seat and the carrier has a perforation, and the other has a screw hole. The locking device includes a screw. The screw passes through the perforation and is screwed to the screw hole.
在某些情況中,座部包含橫向滑軌,橫向滑軌垂直於壓接方向,載台可滑動地設置於橫向滑軌。In some cases, the seat includes a horizontal sliding rail, the horizontal sliding rail is perpendicular to the crimping direction, and the carrier is slidably arranged on the horizontal sliding rail.
在某些情況中,座部還包含縱向滑軌,縱向滑軌垂直於橫向滑軌與壓接方向,橫向滑軌可滑動地設置於縱向滑軌。In some cases, the seat part further includes a longitudinal slide rail, the longitudinal slide rail is perpendicular to the transverse slide rail and the crimping direction, and the transverse slide rail is slidably arranged on the longitudinal slide rail.
在某些情況中,座部還包含能夠帶動載台沿滑軌移動的螺桿組。In some cases, the seat also includes a screw group that can drive the carrier to move along the slide rail.
在某些情況中,變距組包含複數個載台,螺桿組包含第一段部與第二段部,第一段部的導程不同於第二段部的導程,其中一載台與第一段部連動,其中另一載台與第二段部連動。In some cases, the variable pitch group includes a plurality of stages, and the screw group includes a first section and a second section. The lead of the first section is different from the lead of the second section. The first section is linked, and the other carrier is linked with the second section.
本發明還提供一種測試分類設備,包括上述之電子元件壓接裝置,還包括機台、供料裝置、收料裝置與測試裝置。供料裝置配置於機台,並設有至少一供料承置器,用以容納至少一待測之電子元件。收料裝置配置於機台,並設有至少一收料承置器,用以容納至少一完測之電子元件。測試裝置,裝配於該機台,並設有至少一測試座。電子元件壓接裝置配置於機台,以將其中至少一電子元件移載至測試裝置、朝向測試裝置壓抵電子元件、並將電子元件移出測試裝置,以供測試裝置對電子元件執行測試作業。控制裝置係用以整合供料裝置、電子元件壓接裝置、測試裝置與收料裝置作動,以執行自動化作業。The present invention also provides a test classification equipment, including the above-mentioned electronic component crimping device, and also including a machine, a feeding device, a receiving device and a testing device. The feeding device is arranged on the machine and is provided with at least one feeding holder for accommodating at least one electronic component to be tested. The material receiving device is arranged on the machine and is provided with at least one material receiving holder for accommodating at least one electronic component that has been tested. The test device is assembled on the machine and is provided with at least one test seat. The electronic component crimping device is configured on the machine to transfer at least one of the electronic components to the testing device, press against the electronic component towards the testing device, and move the electronic component out of the testing device for the testing device to perform testing operations on the electronic component. The control device is used to integrate the actions of the feeding device, the electronic component crimping device, the testing device and the receiving device to perform automated operations.
藉此,本發明所提供的電子元件壓接裝置能夠利用變距組調整各別壓取器的位置,在具有多個壓取器時,能夠調整相鄰壓取器之間的間距,從而能夠符合不同電子元件的測試需求。在改變欲測試的電子元件時,使用者能夠調整壓取器的位置,而不需要拆換整個壓取器、移料器或壓移器及其附屬的治具,而能夠減少拆換零件、對位與校正所需要的時間,從而提高整體測試分類設備的工作效率,並且降低測試分類設備的設備成本。Thereby, the electronic component crimping device provided by the present invention can adjust the position of each individual depressor by using the variable pitch group. When there are multiple depressors, the distance between adjacent depressors can be adjusted so as to Meet the test requirements of different electronic components. When changing the electronic components to be tested, the user can adjust the position of the extractor, without disassembling and replacing the entire extractor, the material shifter or the pressure shifter and its attached fixtures, which can reduce the number of replacement parts, The time required for alignment and correction can improve the overall efficiency of the testing and classification equipment and reduce the equipment cost of the testing and classification equipment.
本發明提供一種電子元件壓接裝置,可供組裝於測試分類設備中,請參考第1圖,測試分類設備是用於對晶片、電路板等電子元件進行測試,並依測試結果將電子元件分類的設備,測試分類設備包括機台91、供料裝置92、收料裝置93與測試裝置94,並可容置入料料盤95與出料料盤96、97。機台91例如是平台式機架,可供其他各個裝置組裝固定,機台91具有軌道911、912以及橫移機組913、914。供料裝置92包括取放裝置921、入料載台922、923與供料承置器924,供料承置器924供容置入料料盤95,取放裝置921能夠從入料料盤95拿取承載在入料料盤95中的電子元件,並且將電子元件移動、放置於入料載台922或入料載台923,入料載台922設置於軌道911而能夠沿軌道911移動,將電子元件移送至測試裝置94旁側,等待電子元件壓接裝置10、20拿取電子元件,以將電子元件移動到測試裝置94進行測試。測試裝置94具有測試電路板,測試電路板中包括一至數個測試座941。電子元件壓接裝置10設置於橫移機組913,而能受橫移機組913驅動在軌道911與測試裝置94之間移動。收料裝置93包括出料載台931、932、另一取放裝置933與收料承置器934,出料載台931、932能夠沿軌道911、912移動,電子元件完成測試後,電子元件壓接裝置10、20能夠將電子元件移動到測試裝置94旁側,並將電子元件放置於出料載台931或出料載台932,出料載台931、932於測試裝置94旁側接收並承載電子元件後,將電子元件移送至靠近取放裝置933處,取放裝置933能夠從出料載台931或出料載台932拿取電子元件,收料承置器934供容置出料料盤96、97,取放裝置933能夠依電子元件的測試結果將電子元件移動、分類放置於出料料盤96、97,即可完成電子元件之測試分類作業。此外,測試分類設備還具有控制裝置,以整合供料裝置、電子元件壓接裝置、測試裝置與收料裝置作動,以執行上述自動化作業。其中,在第1圖所示的測試分類設備中具有兩組入料載台、電子元件壓接裝置與出料載台,能夠從測試裝置的左右兩側分別將電子元件移入、移出測試裝置,惟若僅採用單一組入料載台、電子元件壓接裝置與出料載台進行作業者,亦無不可。由於兩組電子元件壓接裝置僅位置與移動方向反向設置,可以採用相同或對稱的機構設置,以下僅舉其中一組電子元件壓接裝置詳細說明。The present invention provides a crimping device for electronic components, which can be assembled into test classification equipment. Please refer to Figure 1. The test classification equipment is used to test electronic components such as chips and circuit boards and classify the electronic components according to the test results. The testing and classification equipment includes a
請參考第2圖至第4圖,本實施例之電子元件壓接裝置10包括變距組11、壓取器12與驅動裝置13。Please refer to FIGS. 2 to 4, the electronic
請參考第4圖,該變距組11包括一座部111與四具載台112a、112b、112c、112d,座部111包括橫向滑軌113、縱向滑軌114、115、橫向螺桿組116、縱向螺桿組117、第一滑塊118與第二滑塊119。Please refer to Figure 4, the
縱向滑軌114、115與橫向滑軌113垂直,縱向滑軌114、115可滑動地設置於橫向滑軌113而能沿橫向滑軌113移動,橫向螺桿組116設置平行於橫向滑軌113,橫向螺桿組116具有前段部與後段部,前段部螺合於縱向滑軌114,後段部螺合於縱向滑軌115,使橫向螺桿組116與縱向滑軌114、115連動,能夠在橫向螺桿組116轉動時帶動縱向滑軌114、115移動,其中,橫向螺桿組116可以連接握柄而採用人力手動轉動,或者連接馬達等動力裝置而經由電路控制轉動,橫向螺桿組116的前段部與後段部具有不同的導程,舉例而言,前段部與後段部的導程可設置為大小相等、方向相反,使得橫向螺桿組116轉動時能使縱向滑軌114與縱向滑軌115移動靠近或遠離。The longitudinal slide rails 114, 115 are perpendicular to the
四具載台112a、112b、112c、112d分別設置於縱向滑軌114、115,而位於座部111的一側表面,例如第2圖與第3圖所示之座部111的底部表面,並且能沿縱向滑軌114、115移動,第一滑塊118藉滑桿插置於其中兩個載台112a、112b,並且排列位於兩縱向滑軌114、115之間,第二滑塊119也藉滑桿插置於其中兩個載台112c、112d,並且排列於兩縱向滑軌114、115之間,使得載台112a、112b、112c、112d與第一滑塊118或第二滑塊119連動,於第一滑塊118移動時帶動載台112a、112b一同移動,並且於第二滑塊119移動時帶動載台112c、112d一同移動。The four
縱向螺桿組117設置平行於縱向滑軌114、115,縱向螺桿組117具有第一段部117a與第二段部117b,第一段部117a螺合於第一滑塊118,第二段部117b螺合於第二滑塊119,使縱向螺桿組117與第一滑塊118、第二滑塊119以及載台112a、112b、112c、112d連動,能夠在縱向螺桿組117轉動時帶動第一滑塊118與第二滑塊119移動,進而帶動載台112a、112b、112c、112d移動,其中縱向螺桿組117的第一段部117a與第二段部117b具有不同的導程,舉例而言,第一段部117a與第二段部117b的導程可設置為大小相等、方向相反,使得縱向螺桿組117轉動時能使第一滑塊118與第二滑塊119靠近或遠離。然而,在本發明其他可能的實施例中,若將第一段部與第二段部的導程改為方向相同大小不同者,例如第一段部的導程為第二段部的導程的兩倍,亦屬可行。與橫向螺桿組116相似,縱向螺桿組117也可以連接握柄而採用人力手動轉動,或者連接馬達等動力裝置而經由電路控制轉動,從而帶動第一滑塊118與第二滑塊119靠近或遠離。The
請參考第1圖至第4圖,壓取器12係設置於載台112a、112b、112c、112d的底部表面而能於載台移動時一同移動,其中,壓取器12例如是能夠連接外部真空壓力源的電子元件吸取座,能夠從入料載台922拿取電子元件99,並且將電子元件99攜帶至測試裝置94的測試座941後,朝向測試裝置94的測試座941壓抵電子元件99,以供測試座941穩定接觸電子元件99,在測試裝置完成測試後,壓取器12仍然保持拿取電子元件99,待移動至出料載台931後才放下電子元件99,依測試電子元件的實際測試條件的需求,壓取器12中可能含有例如TWI349777號專利或TWI564576號專利中所述的溫控機構或防結露機構,或者也可能含有例如TWI445963號專利或TWI477791號專利中所述的浮動裝置。Please refer to Figures 1 to 4, the
該驅動機構13係供變距組11設置,驅動機構13包括動力源131、傳動組132、升降螺桿組133、機架134、升降滑軌135與下壓臂136,動力源131例如是馬達,傳動組132例如是皮帶輪組,連接於動力源131而可受動力源131帶動,升降螺桿組133連接於傳動組132而可受傳動組帶動轉動,機架134設置於升降滑軌135而能沿升降滑軌135移動,以升降滑軌135的延伸方向定為壓接方向,下壓臂136設置於機架134,並且與升降螺桿組133螺合,於升降螺桿組133轉動時帶動下壓臂136沿壓接方向升降移動,變距組11設置於下壓臂136的底部,使驅動機構13能藉由動力源131帶動傳動組132、升降螺桿組133與下壓臂136,進而帶動變距組11與壓取器12隨下壓臂136沿壓接方向移動。The
利用上述裝置,於進行電子元件的測試分類作業時,可以利用驅動機構13帶動變距組11與壓取器12沿壓接方向移動,能夠拾取電子元件99,並可將電子元件壓抵於測試裝置進行測試,其中,壓接方向與縱向滑軌及橫向滑軌三者彼此相互垂直,能夠藉由橫向螺桿組與縱向螺桿組調整載台在座部底部表面的位置,調整各個載台之間的間距,從而符合各別電子元件的尺寸與測試需求。Using the above-mentioned device, when performing the test and classification operation of electronic components, the
請參考第5圖,本發明第二實施例提供另一變距組31,可適用於如第1圖至第4圖所示之實施例中,並取代其中的變距組11,供壓取器12設置於其上。本發明第二實施例之變距組31包括一座部311與數個載台312a、312b,座部311是以例如鐵等磁性物質製成,座部311的底面具有數組定位孔313、314,在一組定位孔313中有數個孔位313a、313b、313c,載台312a底面供設置壓取器12,載台312a的頂面具有數個定位柱315a、315b,定位柱315a、315b的數量、尺寸與位置對應於定位孔313而可插置於定位孔313的任一孔位313a、313b或313c中。變距組還具有一鎖附裝置316,鎖附裝置316為電磁線圈,設置固定於載台312a,鎖附裝置316可經由導線或電源端子接受外部電路與電力的控制而激磁,利用磁力將載台312a鎖附於座部311,將載台312a可拆卸地壓抵於座部311。Please refer to Figure 5, the second embodiment of the present invention provides another
利用上述裝置,於電子元件壓接裝置安裝於測試分類設備中使用時,可以將載台312a的定位柱315a、315b插置於座部311底面的其中一孔位313a、313b或313c中,並利用電力使鎖附裝置316激磁,使載台312a鎖附並固定於座部311的底面;當使用者欲測試不同尺寸的電子元件時,可以先切斷鎖附裝置316的電力,使鎖附裝置316消磁,即可將載台312a直接卸除,隨即可以將定位柱315a、315b插置於座部311的另一孔位313a、313b或313c中,再以電力使鎖附裝置316激磁,即可調整各別載台的位置與相鄰載台之間的間距,從而符合各別電子元件的尺寸與測試需求。Using the above device, when the electronic component crimping device is installed in a test classification equipment, the
在上述第二實施例中,較佳者,載台也以例如鐵等磁性物質製成,並且於載台與座部其中任一者安裝永久磁鐵,可以在鎖附裝置316消磁時將載台與座部預先保持定位,避免在調整載台位置而切斷鎖附裝置的電力時造成載台直接墜落,提高使用者的操作便利性。In the above-mentioned second embodiment, preferably, the carrier is also made of magnetic material such as iron, and a permanent magnet is installed on either the carrier or the seat. The carrier can be demagnetized when the
其次,在本發明其他可能的實施例中,也可以將載台的鎖附裝置改設置於座部,並且以例如鐵等磁性物質製作載台,同樣可以獲得上述第二實施例相似的使用效果。Secondly, in other possible embodiments of the present invention, the locking device of the carrier can also be changed to the seat, and the carrier is made of a magnetic substance such as iron, and similar use effects of the second embodiment can be obtained. .
請參考第6圖,本發明第三實施例提供另一變距組31,與前述第5圖所示的本發明第二實施例相似,惟其中座部311與載台312a、312b可能不具有電磁線圈,係將鎖附裝置317改設置為螺桿,於載台312a設置穿孔318,並且於座部311設置螺孔319,利用鎖附裝置317穿設於載台312a的穿孔318並且可拆卸地螺鎖於座部311的螺孔319,同樣能夠將載台312a鎖附並且壓抵固定於座部311,藉由定位柱315a、315b與定位孔313、314提供可調整載台位置的使用功能。Please refer to Figure 6, the third embodiment of the present invention provides another
在本發明其他可能的實施例中,也可以改變前述第6圖所示第三實施例中的穿孔318與螺孔319的位置,例如改於座部設置穿孔,並且於載台設置螺孔,改以鎖附裝置之螺桿穿設於座部的穿孔並且可拆卸地螺鎖於載台的螺孔,同樣能獲得前述第三實施例相似的使用功能。In other possible embodiments of the present invention, the positions of the
在以上實施例中,電子元件壓接裝置具有四或八個載台以及四或八個壓取器,然而,基於載台位置可調整的功能下,如果僅安裝一個載台與一個壓取器者,亦無不可。In the above embodiments, the electronic component crimping device has four or eight stages and four or eight presses. However, based on the function of adjusting the position of the stage, if only one carrier and one press are installed It’s all right.
總結以上說明,上述實施例的電子元件壓接裝置能提供可調整壓取器位置的使用功能,能夠在不卸除整個移料器或壓移器及其治具的情形下,調整各別壓取器的位置或相鄰壓取器的間距,而能夠符合不同電子元件的測試需求,在改變欲測試電子元件時,能夠提高電子元件壓接裝置與測試分類設備的維護與調整速度,減少停機調整與對位、校正所損耗的時間,提高整體生產線的稼動率;此外,由於減少需要預先準備替換使用的移料器、壓移器及其附加治具,也能夠降低測試分類設備的設備成本。以上實施例僅在於說明並闡述本創作的技術內容,本專利的專利範圍應以後述的申請專利範圍為準。To sum up the above description, the electronic component crimping device of the above embodiment can provide the function of adjusting the position of the presser, and can adjust the respective pressures without removing the entire material shifter or the presser and its fixture. The position of the picker or the distance between adjacent pickers can meet the test requirements of different electronic components. When the electronic components to be tested are changed, the maintenance and adjustment speed of the electronic component crimping device and the test classification equipment can be improved, and the downtime can be reduced. Adjusting and aligning and correcting the time wasted to improve the utilization rate of the overall production line; in addition, because it reduces the need to prepare for replacement of the material shifter, pressure shifter and additional fixtures, it can also reduce the equipment cost of the test classification equipment . The above embodiments are only to illustrate and illustrate the technical content of this creation, and the patent scope of this patent shall be subject to the scope of patent application described later.
10:電子元件壓接裝置
11:變距組
111:座部
112a、112b、112c、112d:載台
113:橫向滑軌
114、115:縱向滑軌
116:橫向螺桿組
117:縱向螺桿組
117a:第一段部
117b:第二段部
118:第一滑塊
119:第二滑塊
12:壓取器
13:驅動機構
131:動力源
132:傳動組
133:升降螺桿組
134:機架
135:升降滑軌
136:下壓臂
20:電子元件壓接裝置
31:變距組
311:座部
312a、312b:載台
313:定位孔
313a、313b、313c:孔位
314:定位孔
315a、315b:定位柱
316:鎖附裝置
317:鎖附裝置
91:機台
911、912:軌道
913、914:橫移機組
92:供料裝置
921:取放裝置
922、923:入料載台
924:供料承置器
93:收料裝置
931、932:出料載台
933:取放裝置
934:收料承置器
94:測試裝置
941:測試座
95:入料料盤
96、97:出料料盤
99:電子元件
10: crimping device for electronic components
11: Variable pitch group
111:
第1圖為本發明第一實施例測試分類設備之平面示意圖。 第2圖為本發明第一實施例電子元件壓接裝置之側面示意圖。 第3圖為第2圖之局部放大示意圖。 第4圖為本發明第一實施例變距組之立體圖。 第5圖為本發明第二實施例變距組之立體分解圖。 第6圖為本發明第三實施例變距組之立體分解圖。Figure 1 is a schematic plan view of the test classification device according to the first embodiment of the present invention. Figure 2 is a side view of the electronic component crimping device according to the first embodiment of the invention. Figure 3 is a partial enlarged schematic view of Figure 2. Figure 4 is a three-dimensional view of the variable pitch group according to the first embodiment of the present invention. Fig. 5 is a perspective exploded view of the variable pitch group according to the second embodiment of the invention. Fig. 6 is a three-dimensional exploded view of the variable pitch group according to the third embodiment of the present invention.
112a、112b:載台 112a, 112b: carrier
113:橫向滑軌 113: Horizontal slide
114、115:縱向滑軌 114, 115: longitudinal slide
116:橫向螺桿組 116: Transverse screw group
117:縱向螺桿組 117: Longitudinal screw group
118:第一滑塊 118: The first slider
12:壓取器 12: Presser
94:測試裝置 94: test device
941:測試座 941: Test Block
99:電子元件 99: electronic components
Claims (10)
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