TW202030065A - Electronic component crimping device and test handler including the same in which the position of the pressing-picking device or the spacing between the adjacent pressing-picking devices can be adjusted - Google Patents

Electronic component crimping device and test handler including the same in which the position of the pressing-picking device or the spacing between the adjacent pressing-picking devices can be adjusted Download PDF

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TW202030065A
TW202030065A TW108103978A TW108103978A TW202030065A TW 202030065 A TW202030065 A TW 202030065A TW 108103978 A TW108103978 A TW 108103978A TW 108103978 A TW108103978 A TW 108103978A TW 202030065 A TW202030065 A TW 202030065A
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electronic component
carrier
seat
pressing
test
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TW108103978A
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Chinese (zh)
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TWI687289B (en
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蔡志欣
巫吉生
張銘德
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鴻勁精密股份有限公司
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Abstract

The present invention provides an electronic component crimping device which includes a variable pitch assembly, a pressing-picking device and a driving mechanism. The pressing-picking device is disposed on the variable pitch assembly and the variable pitch assembly is disposed on the driving mechanism, so that the driving mechanism can drive the variable pitch assembly and the pressing-picking device to move to perform the crimping and testing operations on the electronic components. The variable pitch assembly can adjust the position of the pressing-picking device, or can adjust the spacing between the adjacent pressing-picking devices when multiple pressing-picking devices are been disposed. When a user adjusts the position of the pressing-picking device, there is no need to detach the entire material transferring device, the pressing-moving device or/and its additional fixtures, which can reduce the time required to change the position of the pressing-picking device and reduce the equipment cost of the test handler. Therefore, the overall usage cost of the user can be reduced.

Description

電子元件壓接裝置及包含該電子元件壓接裝置之測試分類設備Electronic component crimping device and test classification equipment containing the electronic component crimping device

本發明是關於用於電子元件測試分類作業中的壓接裝置,能夠將電子元件壓接於測試設備進行測試,以完成電子元件的測試分類作業。The invention relates to a crimping device used in the testing and classification of electronic components, which can crimp the electronic components to the testing equipment for testing, so as to complete the testing and classification of the electronic components.

電子元件測試分類設備能夠用來對電子元件(例如具錫球的IC)進行測試,主要是利用分類設備將電子元件逐個或逐批從電子元件的料盤取出,移送至測試設備,待測試設備測試完成後,分類設備再依測試結果將電子元件分類移送、放置於指定位置,例如是不同的數個料盤上。Electronic component testing and classification equipment can be used to test electronic components (such as ICs with solder balls), mainly using classification equipment to take out the electronic components from the electronic component tray one by one or batch by batch, and transfer them to the testing equipment. The equipment to be tested After the test is completed, the sorting equipment sorts and transfers the electronic components according to the test results and places them in designated locations, for example, on several different trays.

在上述的電子元件測試分類設備中,由於每批量測試的電子元件規格尺寸可能會不同,以致測試設備的測試座的尺寸以及相鄰測試座的間距會依待測電子元件改變,此外,電子元件的尺寸以及擺放在料盤中的間距也會不同,導致電子元件在料盤中的間距與測試時的間距不同,需要進行適當的變距與對位才能順利進行測試。In the above-mentioned electronic component testing and classification equipment, since the specifications and dimensions of the electronic components tested in each batch may be different, the size of the test socket of the test equipment and the distance between adjacent test sockets will change according to the electronic component to be tested. In addition, the electronic component The size and spacing of the electronic components in the tray will also be different, resulting in the difference between the spacing of the electronic components in the tray and the spacing during the test, and proper pitch change and alignment are required for the test to proceed smoothly.

基於上述情形,現有的分類設備大多具有變距機構,例如TWI569356號專利與TWI603821號專利中的變距機構即為一例,變距機構能夠從電子元件的料盤拿取多個電子元件,拿取後改變電子元件的間距,再將電子元件放置於入料載台,或者是從出料載台拿取電子元件,改變電子元件的間距後再將電子元件放置於料盤,藉此,移料器或壓移器只需要將電子元件從入料載台取出,移動壓抵於測試座,測試完成後再將電子元件移動放置於出料載台,即可利用同一分類設備配合使用於測試多種不同規格尺寸的電子元件。Based on the above situation, most of the existing sorting equipment has a pitch changing mechanism. For example, the pitch changing mechanism in the TWI569356 patent and the TWI603821 patent is an example. The pitch changing mechanism can take multiple electronic components from the electronic component tray. Then change the distance of the electronic components, and then place the electronic components on the feeding stage, or take the electronic components from the discharge stage, change the distance of the electronic components, and then place the electronic components on the tray, thereby moving the material Only need to take out the electronic components from the loading platform, move the electronic components against the test base, and move the electronic components on the discharge platform after the test is completed. The same sorting equipment can be used to test multiple Electronic components of different sizes.

前述分類設備雖然能夠配合使用於測試多種不同規格尺寸的電子元件,但是在改變測試不同規格尺寸的電子元件時,需要使用不同的測試設備,各個測試設備上的測試座具有各別不同的規格尺寸與測試座間距,需要將移料器或壓移器及其治具卸下,連同治具改換成另一個符合測試座與電子元件規格尺寸的移料器或壓移器,拆卸與改換移料器或壓移器的過程中,需要耗費時間反覆拆卸、對位與校正,將會降低整體生產線的稼動率,而同一分類設備需要準備多組移料器或壓移器進行替換,也會增加分類設備的設備成本。Although the aforementioned classification equipment can be used to test a variety of electronic components with different specifications and sizes, when changing and testing electronic components with different specifications and sizes, different test equipment is required. The test sockets on each test equipment have different specifications and sizes. The distance from the test seat needs to be removed from the shifter or pressure shifter and its jig, and the jig is replaced with another shifter or pressure shifter that meets the specifications and dimensions of the test seat and electronic components. Disassembly and replacement During the process of the feeder or the pressure shifter, it takes time to repeatedly disassemble, align and correct, which will reduce the utilization rate of the overall production line. The same sorting equipment needs to prepare multiple sets of shifters or pressure shifters for replacement. Increase equipment cost of sorting equipment.

因此,本發明的其中一項目的在於提供一種壓接裝置,具有可拿取電子元件的壓取器,且壓取器的位置可供調整,而不需要準備多組壓取器進行替換。Therefore, one of the objectives of the present invention is to provide a crimping device with a depressor capable of taking electronic components, and the position of the depressor can be adjusted without the need to prepare multiple groups of depressors for replacement.

其次,在壓接裝置中具有可調整位置的壓取器,將能夠在改變測試的電子元件的規格尺寸時,以調整的方式改變壓取器的位置或相鄰兩個壓取器之間的間距,免除拆卸組裝壓取器及其治具所需要的時間。Secondly, the presser with adjustable position in the crimping device will be able to change the position of the presser or the gap between two adjacent pressers in an adjustable manner when changing the specifications and dimensions of the electronic components to be tested. Spacing, eliminating the time required to disassemble and assemble the press and its fixture.

為了達成上述及其他目的,本發明提供一種電子元件壓接裝置,包括變距組、壓取器與驅動機構。變距組包括座部與至少一載台,該載台位於座部的其中一表面,且該載台在該座部表面的位置為可調整者。壓取器設置於載台,使壓取器的位置能隨載台調整。變距組設置於驅動機構,使驅動機構能帶動變距組與壓取器沿一壓接方向移動。In order to achieve the above and other objectives, the present invention provides a crimping device for electronic components, which includes a variable pitch group, a press and a driving mechanism. The variable pitch set includes a seat and at least one carrier. The carrier is located on one of the surfaces of the seat, and the position of the carrier on the surface of the seat is adjustable. The extractor is arranged on the carrier so that the position of the extractor can be adjusted with the carrier. The variable pitch group is arranged on the driving mechanism, so that the driving mechanism can drive the variable pitch group and the presser to move in a crimping direction.

在某些情況中,座部與載台其中之一具有定位孔,其中另一者具有定位柱,變距組還包含鎖附裝置,使載台可拆卸地壓抵於座部,並且使定位柱插置於該定位孔。In some cases, one of the seat and the carrier has a positioning hole, and the other has a positioning post. The pitch change set also includes a locking device to make the carrier detachably press against the seat and position the The column is inserted into the positioning hole.

在某些情況中,鎖附裝置包含電磁線圈,電磁線圈固定地設置於座部與載台其中之一,座部與載台的其中另一者以磁性材質製成,較佳者,座部與載台其中一者還具有永久磁鐵,其中另一者以磁性材質製成。In some cases, the locking device includes an electromagnetic coil, the electromagnetic coil is fixedly disposed on one of the seat and the carrier, and the other of the seat and the carrier is made of a magnetic material, preferably, the seat One of the carrier and the carrier also has a permanent magnet, and the other is made of magnetic material.

在某些情況中,座部與載台其中之一具有穿孔,其中另一者具有螺孔,該鎖附裝置包含螺桿,螺桿穿設於穿孔並且螺鎖於螺孔。In some cases, one of the seat and the carrier has a perforation, and the other has a screw hole. The locking device includes a screw. The screw passes through the perforation and is screwed to the screw hole.

在某些情況中,座部包含橫向滑軌,橫向滑軌垂直於壓接方向,載台可滑動地設置於橫向滑軌。In some cases, the seat includes a horizontal sliding rail, the horizontal sliding rail is perpendicular to the crimping direction, and the carrier is slidably arranged on the horizontal sliding rail.

在某些情況中,座部還包含縱向滑軌,縱向滑軌垂直於橫向滑軌與壓接方向,橫向滑軌可滑動地設置於縱向滑軌。In some cases, the seat part further includes a longitudinal slide rail, the longitudinal slide rail is perpendicular to the transverse slide rail and the crimping direction, and the transverse slide rail is slidably arranged on the longitudinal slide rail.

在某些情況中,座部還包含能夠帶動載台沿滑軌移動的螺桿組。In some cases, the seat also includes a screw group that can drive the carrier to move along the slide rail.

在某些情況中,變距組包含複數個載台,螺桿組包含第一段部與第二段部,第一段部的導程不同於第二段部的導程,其中一載台與第一段部連動,其中另一載台與第二段部連動。In some cases, the variable pitch group includes a plurality of stages, and the screw group includes a first section and a second section. The lead of the first section is different from the lead of the second section. The first section is linked, and the other carrier is linked with the second section.

本發明還提供一種測試分類設備,包括上述之電子元件壓接裝置,還包括機台、供料裝置、收料裝置與測試裝置。供料裝置配置於機台,並設有至少一供料承置器,用以容納至少一待測之電子元件。收料裝置配置於機台,並設有至少一收料承置器,用以容納至少一完測之電子元件。測試裝置,裝配於該機台,並設有至少一測試座。電子元件壓接裝置配置於機台,以將其中至少一電子元件移載至測試裝置、朝向測試裝置壓抵電子元件、並將電子元件移出測試裝置,以供測試裝置對電子元件執行測試作業。控制裝置係用以整合供料裝置、電子元件壓接裝置、測試裝置與收料裝置作動,以執行自動化作業。The present invention also provides a test classification equipment, including the above-mentioned electronic component crimping device, and also including a machine, a feeding device, a receiving device and a testing device. The feeding device is arranged on the machine and is provided with at least one feeding holder for accommodating at least one electronic component to be tested. The material receiving device is arranged on the machine and is provided with at least one material receiving holder for accommodating at least one electronic component that has been tested. The test device is assembled on the machine and is provided with at least one test seat. The electronic component crimping device is configured on the machine to transfer at least one of the electronic components to the testing device, press against the electronic component towards the testing device, and move the electronic component out of the testing device for the testing device to perform testing operations on the electronic component. The control device is used to integrate the actions of the feeding device, the electronic component crimping device, the testing device and the receiving device to perform automated operations.

藉此,本發明所提供的電子元件壓接裝置能夠利用變距組調整各別壓取器的位置,在具有多個壓取器時,能夠調整相鄰壓取器之間的間距,從而能夠符合不同電子元件的測試需求。在改變欲測試的電子元件時,使用者能夠調整壓取器的位置,而不需要拆換整個壓取器、移料器或壓移器及其附屬的治具,而能夠減少拆換零件、對位與校正所需要的時間,從而提高整體測試分類設備的工作效率,並且降低測試分類設備的設備成本。Thereby, the electronic component crimping device provided by the present invention can adjust the position of each individual depressor by using the variable pitch group. When there are multiple depressors, the distance between adjacent depressors can be adjusted so as to Meet the test requirements of different electronic components. When changing the electronic components to be tested, the user can adjust the position of the extractor, without disassembling and replacing the entire extractor, the material shifter or the pressure shifter and its attached fixtures, which can reduce the number of replacement parts, The time required for alignment and correction can improve the overall efficiency of the testing and classification equipment and reduce the equipment cost of the testing and classification equipment.

本發明提供一種電子元件壓接裝置,可供組裝於測試分類設備中,請參考第1圖,測試分類設備是用於對晶片、電路板等電子元件進行測試,並依測試結果將電子元件分類的設備,測試分類設備包括機台91、供料裝置92、收料裝置93與測試裝置94,並可容置入料料盤95與出料料盤96、97。機台91例如是平台式機架,可供其他各個裝置組裝固定,機台91具有軌道911、912以及橫移機組913、914。供料裝置92包括取放裝置921、入料載台922、923與供料承置器924,供料承置器924供容置入料料盤95,取放裝置921能夠從入料料盤95拿取承載在入料料盤95中的電子元件,並且將電子元件移動、放置於入料載台922或入料載台923,入料載台922設置於軌道911而能夠沿軌道911移動,將電子元件移送至測試裝置94旁側,等待電子元件壓接裝置10、20拿取電子元件,以將電子元件移動到測試裝置94進行測試。測試裝置94具有測試電路板,測試電路板中包括一至數個測試座941。電子元件壓接裝置10設置於橫移機組913,而能受橫移機組913驅動在軌道911與測試裝置94之間移動。收料裝置93包括出料載台931、932、另一取放裝置933與收料承置器934,出料載台931、932能夠沿軌道911、912移動,電子元件完成測試後,電子元件壓接裝置10、20能夠將電子元件移動到測試裝置94旁側,並將電子元件放置於出料載台931或出料載台932,出料載台931、932於測試裝置94旁側接收並承載電子元件後,將電子元件移送至靠近取放裝置933處,取放裝置933能夠從出料載台931或出料載台932拿取電子元件,收料承置器934供容置出料料盤96、97,取放裝置933能夠依電子元件的測試結果將電子元件移動、分類放置於出料料盤96、97,即可完成電子元件之測試分類作業。此外,測試分類設備還具有控制裝置,以整合供料裝置、電子元件壓接裝置、測試裝置與收料裝置作動,以執行上述自動化作業。其中,在第1圖所示的測試分類設備中具有兩組入料載台、電子元件壓接裝置與出料載台,能夠從測試裝置的左右兩側分別將電子元件移入、移出測試裝置,惟若僅採用單一組入料載台、電子元件壓接裝置與出料載台進行作業者,亦無不可。由於兩組電子元件壓接裝置僅位置與移動方向反向設置,可以採用相同或對稱的機構設置,以下僅舉其中一組電子元件壓接裝置詳細說明。The present invention provides a crimping device for electronic components, which can be assembled into test classification equipment. Please refer to Figure 1. The test classification equipment is used to test electronic components such as chips and circuit boards and classify the electronic components according to the test results. The testing and classification equipment includes a machine 91, a feeding device 92, a receiving device 93, and a testing device 94, and can accommodate an input tray 95 and a discharge tray 96, 97. The machine table 91 is, for example, a platform-type rack, which can be assembled and fixed by other devices. The machine table 91 has rails 911 and 912 and traverse units 913 and 914. The feeding device 92 includes a pick-and-place device 921, feeding platforms 922, 923, and a feeder 924. The feeder 924 is for receiving the feeding tray 95. 95 takes the electronic components carried in the feeding tray 95, and moves and places the electronic components on the feeding stage 922 or the feeding stage 923. The feeding stage 922 is set on the rail 911 and can move along the rail 911 , The electronic component is transferred to the side of the testing device 94, waiting for the electronic component crimping device 10, 20 to take the electronic component, so as to move the electronic component to the testing device 94 for testing. The test device 94 has a test circuit board, and the test circuit board includes one or more test sockets 941. The electronic component crimping device 10 is installed in the traverse unit 913 and can be driven by the traverse unit 913 to move between the rail 911 and the testing device 94. The receiving device 93 includes discharging stages 931 and 932, another picking and placing device 933 and a receiving holder 934. The discharging stages 931 and 932 can move along the rails 911 and 912. After the electronic components are tested, the electronic components The crimping device 10, 20 can move the electronic components to the side of the testing device 94, and place the electronic components on the discharge stage 931 or the discharge stage 932, and the discharge stages 931, 932 are received beside the testing device 94 After the electronic components are loaded, the electronic components are transferred to a place close to the pick-and-place device 933, which can pick up the electronic components from the discharge stage 931 or the discharge stage 932, and the receiving holder 934 is for receiving and unloading The material trays 96, 97, and the pick-and-place device 933 can move, sort and place the electronic components on the discharge trays 96, 97 according to the test results of the electronic components, and then complete the testing and sorting operation of the electronic components. In addition, the test classification equipment also has a control device to integrate the feeding device, the electronic component crimping device, the testing device and the receiving device to perform the above-mentioned automated operations. Among them, the test classification equipment shown in Figure 1 has two sets of feeding stage, electronic component crimping device and discharge stage, which can move electronic components into and out of the test device from the left and right sides of the test device. However, if only a single set of feeding stage, electronic component crimping device and discharge stage are used for operation, it is not impossible. Since the two sets of electronic component crimping devices are only arranged in opposite positions to the moving direction, they can be set up with the same or symmetrical mechanism. The following is a detailed description of only one set of electronic component crimping devices.

請參考第2圖至第4圖,本實施例之電子元件壓接裝置10包括變距組11、壓取器12與驅動裝置13。Please refer to FIGS. 2 to 4, the electronic component crimping device 10 of this embodiment includes a variable pitch group 11, a presser 12 and a driving device 13.

請參考第4圖,該變距組11包括一座部111與四具載台112a、112b、112c、112d,座部111包括橫向滑軌113、縱向滑軌114、115、橫向螺桿組116、縱向螺桿組117、第一滑塊118與第二滑塊119。Please refer to Figure 4, the variable pitch group 11 includes a base 111 and four stages 112a, 112b, 112c, 112d. The base 111 includes a horizontal slide 113, a longitudinal slide 114, 115, a horizontal screw group 116, and a longitudinal The screw group 117, the first slider 118 and the second slider 119.

縱向滑軌114、115與橫向滑軌113垂直,縱向滑軌114、115可滑動地設置於橫向滑軌113而能沿橫向滑軌113移動,橫向螺桿組116設置平行於橫向滑軌113,橫向螺桿組116具有前段部與後段部,前段部螺合於縱向滑軌114,後段部螺合於縱向滑軌115,使橫向螺桿組116與縱向滑軌114、115連動,能夠在橫向螺桿組116轉動時帶動縱向滑軌114、115移動,其中,橫向螺桿組116可以連接握柄而採用人力手動轉動,或者連接馬達等動力裝置而經由電路控制轉動,橫向螺桿組116的前段部與後段部具有不同的導程,舉例而言,前段部與後段部的導程可設置為大小相等、方向相反,使得橫向螺桿組116轉動時能使縱向滑軌114與縱向滑軌115移動靠近或遠離。The longitudinal slide rails 114, 115 are perpendicular to the transverse slide rail 113, the longitudinal slide rails 114, 115 are slidably arranged on the transverse slide rail 113 and can move along the transverse slide rail 113, and the transverse screw group 116 is arranged parallel to the transverse slide rail 113. The screw group 116 has a front section and a rear section. The front section is screwed to the longitudinal slide rail 114, and the rear section is screwed to the longitudinal slide rail 115, so that the horizontal screw group 116 is linked with the longitudinal slide rails 114 and 115, and can be moved in the horizontal screw group 116. When rotating, the longitudinal slide rails 114 and 115 are driven to move. Among them, the transverse screw set 116 can be connected to a handle and manually rotated by manpower, or connected to a power device such as a motor to control rotation through a circuit. The front and rear sections of the transverse screw set 116 have Different lead, for example, the lead of the front section and the rear section can be set to be equal in size and opposite in direction, so that when the horizontal screw group 116 rotates, the longitudinal slide rail 114 and the longitudinal slide rail 115 can move closer or farther away.

四具載台112a、112b、112c、112d分別設置於縱向滑軌114、115,而位於座部111的一側表面,例如第2圖與第3圖所示之座部111的底部表面,並且能沿縱向滑軌114、115移動,第一滑塊118藉滑桿插置於其中兩個載台112a、112b,並且排列位於兩縱向滑軌114、115之間,第二滑塊119也藉滑桿插置於其中兩個載台112c、112d,並且排列於兩縱向滑軌114、115之間,使得載台112a、112b、112c、112d與第一滑塊118或第二滑塊119連動,於第一滑塊118移動時帶動載台112a、112b一同移動,並且於第二滑塊119移動時帶動載台112c、112d一同移動。The four stages 112a, 112b, 112c, 112d are respectively arranged on the longitudinal slide rails 114, 115, and are located on one side surface of the seat 111, such as the bottom surface of the seat 111 shown in Figures 2 and 3, and Can move along the longitudinal slide rails 114, 115, the first slider 118 is inserted into two of the platforms 112a, 112b by means of a slide bar, and is arranged between the two longitudinal slide rails 114, 115, the second slider 119 also borrows The slide bar is inserted into two of the stages 112c, 112d and arranged between the two longitudinal slide rails 114, 115, so that the stages 112a, 112b, 112c, 112d are linked with the first slider 118 or the second slider 119 When the first slider 118 moves, the stages 112a and 112b are driven to move together, and when the second slider 119 moves, the stages 112c and 112d are driven to move together.

縱向螺桿組117設置平行於縱向滑軌114、115,縱向螺桿組117具有第一段部117a與第二段部117b,第一段部117a螺合於第一滑塊118,第二段部117b螺合於第二滑塊119,使縱向螺桿組117與第一滑塊118、第二滑塊119以及載台112a、112b、112c、112d連動,能夠在縱向螺桿組117轉動時帶動第一滑塊118與第二滑塊119移動,進而帶動載台112a、112b、112c、112d移動,其中縱向螺桿組117的第一段部117a與第二段部117b具有不同的導程,舉例而言,第一段部117a與第二段部117b的導程可設置為大小相等、方向相反,使得縱向螺桿組117轉動時能使第一滑塊118與第二滑塊119靠近或遠離。然而,在本發明其他可能的實施例中,若將第一段部與第二段部的導程改為方向相同大小不同者,例如第一段部的導程為第二段部的導程的兩倍,亦屬可行。與橫向螺桿組116相似,縱向螺桿組117也可以連接握柄而採用人力手動轉動,或者連接馬達等動力裝置而經由電路控制轉動,從而帶動第一滑塊118與第二滑塊119靠近或遠離。The longitudinal screw group 117 is arranged parallel to the longitudinal slide rails 114 and 115. The longitudinal screw group 117 has a first section 117a and a second section 117b. The first section 117a is screwed to the first slider 118, and the second section 117b Screwed to the second sliding block 119, so that the longitudinal screw group 117 is linked with the first sliding block 118, the second sliding block 119 and the stages 112a, 112b, 112c, 112d, and can drive the first sliding block when the longitudinal screw group 117 rotates. The block 118 and the second sliding block 119 move to drive the stages 112a, 112b, 112c, 112d to move. The first section 117a and the second section 117b of the longitudinal screw group 117 have different leads. For example, The lead of the first section 117a and the second section 117b can be set to be equal in size and opposite in direction, so that when the longitudinal screw group 117 rotates, the first slider 118 and the second slider 119 can be moved closer or farther away. However, in other possible embodiments of the present invention, if the leads of the first section and the second section are changed to the same direction and different sizes, for example, the lead of the first section is the lead of the second section. It is also feasible. Similar to the horizontal screw group 116, the longitudinal screw group 117 can also be connected to a handle for manual rotation, or connected to a power device such as a motor and controlled to rotate via a circuit, thereby driving the first slider 118 and the second slider 119 to move closer or farther away .

請參考第1圖至第4圖,壓取器12係設置於載台112a、112b、112c、112d的底部表面而能於載台移動時一同移動,其中,壓取器12例如是能夠連接外部真空壓力源的電子元件吸取座,能夠從入料載台922拿取電子元件99,並且將電子元件99攜帶至測試裝置94的測試座941後,朝向測試裝置94的測試座941壓抵電子元件99,以供測試座941穩定接觸電子元件99,在測試裝置完成測試後,壓取器12仍然保持拿取電子元件99,待移動至出料載台931後才放下電子元件99,依測試電子元件的實際測試條件的需求,壓取器12中可能含有例如TWI349777號專利或TWI564576號專利中所述的溫控機構或防結露機構,或者也可能含有例如TWI445963號專利或TWI477791號專利中所述的浮動裝置。Please refer to Figures 1 to 4, the extractor 12 is disposed on the bottom surface of the carrier 112a, 112b, 112c, 112d and can move together when the carrier moves. The extractor 12 can be connected to the outside, for example. The electronic component suction seat of the vacuum pressure source can take the electronic component 99 from the loading platform 922 and carry the electronic component 99 to the test seat 941 of the test device 94, and then press the electronic component toward the test seat 941 of the test device 94 99, for the test socket 941 to stably contact the electronic component 99. After the test device finishes the test, the press 12 still keeps taking the electronic component 99. After moving to the discharge stage 931, the electronic component 99 is put down. The actual test conditions of the components are required. The press 12 may contain the temperature control mechanism or the anti-condensation mechanism described in the TWI349777 patent or the TWI564576 patent, or may also contain the temperature control mechanism or the anti-condensation mechanism described in the TWI445963 patent or the TWI477791 patent. The floating device.

該驅動機構13係供變距組11設置,驅動機構13包括動力源131、傳動組132、升降螺桿組133、機架134、升降滑軌135與下壓臂136,動力源131例如是馬達,傳動組132例如是皮帶輪組,連接於動力源131而可受動力源131帶動,升降螺桿組133連接於傳動組132而可受傳動組帶動轉動,機架134設置於升降滑軌135而能沿升降滑軌135移動,以升降滑軌135的延伸方向定為壓接方向,下壓臂136設置於機架134,並且與升降螺桿組133螺合,於升降螺桿組133轉動時帶動下壓臂136沿壓接方向升降移動,變距組11設置於下壓臂136的底部,使驅動機構13能藉由動力源131帶動傳動組132、升降螺桿組133與下壓臂136,進而帶動變距組11與壓取器12隨下壓臂136沿壓接方向移動。The driving mechanism 13 is provided for the variable pitch group 11. The driving mechanism 13 includes a power source 131, a transmission group 132, a lifting screw group 133, a frame 134, a lifting slide 135 and a pressing arm 136. The power source 131 is, for example, a motor. The transmission group 132 is, for example, a pulley group, which is connected to the power source 131 and can be driven by the power source 131. The lifting screw group 133 is connected to the transmission group 132 and can be driven by the transmission group to rotate. The frame 134 is arranged on the lifting slide 135 and can be driven along The lifting slide 135 moves, and the extension direction of the lifting slide 135 is set as the crimping direction. The lower pressing arm 136 is arranged on the frame 134 and is screwed with the lifting screw assembly 133 to drive the lower pressing arm when the lifting screw assembly 133 rotates. 136 moves up and down along the crimping direction, and the pitch changing group 11 is arranged at the bottom of the lower pressing arm 136, so that the driving mechanism 13 can drive the transmission group 132, the lifting screw group 133 and the lower pressing arm 136 by the power source 131 to drive the pitch changing The group 11 and the presser 12 move with the lower pressing arm 136 in the pressing direction.

利用上述裝置,於進行電子元件的測試分類作業時,可以利用驅動機構13帶動變距組11與壓取器12沿壓接方向移動,能夠拾取電子元件99,並可將電子元件壓抵於測試裝置進行測試,其中,壓接方向與縱向滑軌及橫向滑軌三者彼此相互垂直,能夠藉由橫向螺桿組與縱向螺桿組調整載台在座部底部表面的位置,調整各個載台之間的間距,從而符合各別電子元件的尺寸與測試需求。Using the above-mentioned device, when performing the test and classification operation of electronic components, the drive mechanism 13 can be used to drive the variable pitch group 11 and the presser 12 to move in the crimping direction, so that the electronic components 99 can be picked up and the electronic components can be pressed against the test The device is tested, in which the crimping direction and the longitudinal slide rail and the transverse slide rail are perpendicular to each other. The position of the carrier on the bottom surface of the seat can be adjusted by the horizontal screw group and the longitudinal screw group to adjust the distance between each carrier. Spacing to meet the size and testing requirements of individual electronic components.

請參考第5圖,本發明第二實施例提供另一變距組31,可適用於如第1圖至第4圖所示之實施例中,並取代其中的變距組11,供壓取器12設置於其上。本發明第二實施例之變距組31包括一座部311與數個載台312a、312b,座部311是以例如鐵等磁性物質製成,座部311的底面具有數組定位孔313、314,在一組定位孔313中有數個孔位313a、313b、313c,載台312a底面供設置壓取器12,載台312a的頂面具有數個定位柱315a、315b,定位柱315a、315b的數量、尺寸與位置對應於定位孔313而可插置於定位孔313的任一孔位313a、313b或313c中。變距組還具有一鎖附裝置316,鎖附裝置316為電磁線圈,設置固定於載台312a,鎖附裝置316可經由導線或電源端子接受外部電路與電力的控制而激磁,利用磁力將載台312a鎖附於座部311,將載台312a可拆卸地壓抵於座部311。Please refer to Figure 5, the second embodiment of the present invention provides another variable pitch group 31, which can be applied to the embodiments shown in Figures 1 to 4, and replaces the variable pitch group 11 for pressing The device 12 is provided thereon. The variable pitch group 31 of the second embodiment of the present invention includes a base portion 311 and a plurality of stages 312a and 312b. The base portion 311 is made of a magnetic material such as iron. The base portion 311 has an array of positioning holes 313 and 314 on the bottom surface. There are several holes 313a, 313b, and 313c in a set of positioning holes 313. The bottom surface of the carrier 312a is provided with the extractor 12, and the top surface of the carrier 312a has several positioning posts 315a, 315b. The number of positioning posts 315a, 315b , The size and position correspond to the positioning hole 313 and can be inserted into any position 313a, 313b or 313c of the positioning hole 313. The variable pitch group also has a locking device 316. The locking device 316 is an electromagnetic coil and is fixed to the carrier 312a. The locking device 316 can be excited by the control of an external circuit and power through a wire or a power terminal, and the carrier can be excited by magnetic force. The platform 312a is locked to the seat 311, and the carrier 312a is detachably pressed against the seat 311.

利用上述裝置,於電子元件壓接裝置安裝於測試分類設備中使用時,可以將載台312a的定位柱315a、315b插置於座部311底面的其中一孔位313a、313b或313c中,並利用電力使鎖附裝置316激磁,使載台312a鎖附並固定於座部311的底面;當使用者欲測試不同尺寸的電子元件時,可以先切斷鎖附裝置316的電力,使鎖附裝置316消磁,即可將載台312a直接卸除,隨即可以將定位柱315a、315b插置於座部311的另一孔位313a、313b或313c中,再以電力使鎖附裝置316激磁,即可調整各別載台的位置與相鄰載台之間的間距,從而符合各別電子元件的尺寸與測試需求。Using the above device, when the electronic component crimping device is installed in a test classification equipment, the positioning posts 315a, 315b of the carrier 312a can be inserted into one of the holes 313a, 313b, or 313c on the bottom surface of the seat 311, and The power is used to excite the locking device 316 to lock and fix the carrier 312a on the bottom surface of the seat 311; when the user wants to test electronic components of different sizes, the power of the locking device 316 can be cut off first to make the locking The device 316 is demagnetized, and the carrier 312a can be directly removed, and then the positioning posts 315a, 315b can be inserted into another hole 313a, 313b or 313c of the seat 311, and then the locking device 316 can be excited by electricity. The position of each carrier and the distance between adjacent carriers can be adjusted to meet the size and test requirements of individual electronic components.

在上述第二實施例中,較佳者,載台也以例如鐵等磁性物質製成,並且於載台與座部其中任一者安裝永久磁鐵,可以在鎖附裝置316消磁時將載台與座部預先保持定位,避免在調整載台位置而切斷鎖附裝置的電力時造成載台直接墜落,提高使用者的操作便利性。In the above-mentioned second embodiment, preferably, the carrier is also made of magnetic material such as iron, and a permanent magnet is installed on either the carrier or the seat. The carrier can be demagnetized when the locking device 316 is demagnetized. The positioning with the seat is maintained in advance to avoid the direct falling of the carrier when the power of the locking device is cut off when the position of the carrier is adjusted, thereby improving the convenience of the user's operation.

其次,在本發明其他可能的實施例中,也可以將載台的鎖附裝置改設置於座部,並且以例如鐵等磁性物質製作載台,同樣可以獲得上述第二實施例相似的使用效果。Secondly, in other possible embodiments of the present invention, the locking device of the carrier can also be changed to the seat, and the carrier is made of a magnetic substance such as iron, and similar use effects of the second embodiment can be obtained. .

請參考第6圖,本發明第三實施例提供另一變距組31,與前述第5圖所示的本發明第二實施例相似,惟其中座部311與載台312a、312b可能不具有電磁線圈,係將鎖附裝置317改設置為螺桿,於載台312a設置穿孔318,並且於座部311設置螺孔319,利用鎖附裝置317穿設於載台312a的穿孔318並且可拆卸地螺鎖於座部311的螺孔319,同樣能夠將載台312a鎖附並且壓抵固定於座部311,藉由定位柱315a、315b與定位孔313、314提供可調整載台位置的使用功能。Please refer to Figure 6, the third embodiment of the present invention provides another variable pitch group 31, which is similar to the second embodiment of the present invention shown in Figure 5 above, except that the seat 311 and the stages 312a, 312b may not have The electromagnetic coil is changed from the locking device 317 to a screw. A perforation 318 is provided on the carrier 312a, and a screw hole 319 is provided on the seat 311. The locking device 317 is used to penetrate through the perforation 318 of the carrier 312a and detachably The screw hole 319 screwed to the seat 311 can also lock and press the carrier 312a to the seat 311. The positioning posts 315a, 315b and the positioning holes 313, 314 provide the function of adjusting the position of the carrier .

在本發明其他可能的實施例中,也可以改變前述第6圖所示第三實施例中的穿孔318與螺孔319的位置,例如改於座部設置穿孔,並且於載台設置螺孔,改以鎖附裝置之螺桿穿設於座部的穿孔並且可拆卸地螺鎖於載台的螺孔,同樣能獲得前述第三實施例相似的使用功能。In other possible embodiments of the present invention, the positions of the perforation 318 and the screw hole 319 in the third embodiment shown in Figure 6 can also be changed, for example, a perforation is provided on the seat and a screw hole is provided on the carrier. By changing the screw of the locking device through the perforation of the seat and detachably screwed to the screw hole of the carrier, the similar use function of the aforementioned third embodiment can also be obtained.

在以上實施例中,電子元件壓接裝置具有四或八個載台以及四或八個壓取器,然而,基於載台位置可調整的功能下,如果僅安裝一個載台與一個壓取器者,亦無不可。In the above embodiments, the electronic component crimping device has four or eight stages and four or eight presses. However, based on the function of adjusting the position of the stage, if only one carrier and one press are installed It’s all right.

總結以上說明,上述實施例的電子元件壓接裝置能提供可調整壓取器位置的使用功能,能夠在不卸除整個移料器或壓移器及其治具的情形下,調整各別壓取器的位置或相鄰壓取器的間距,而能夠符合不同電子元件的測試需求,在改變欲測試電子元件時,能夠提高電子元件壓接裝置與測試分類設備的維護與調整速度,減少停機調整與對位、校正所損耗的時間,提高整體生產線的稼動率;此外,由於減少需要預先準備替換使用的移料器、壓移器及其附加治具,也能夠降低測試分類設備的設備成本。以上實施例僅在於說明並闡述本創作的技術內容,本專利的專利範圍應以後述的申請專利範圍為準。To sum up the above description, the electronic component crimping device of the above embodiment can provide the function of adjusting the position of the presser, and can adjust the respective pressures without removing the entire material shifter or the presser and its fixture. The position of the picker or the distance between adjacent pickers can meet the test requirements of different electronic components. When the electronic components to be tested are changed, the maintenance and adjustment speed of the electronic component crimping device and the test classification equipment can be improved, and the downtime can be reduced. Adjusting and aligning and correcting the time wasted to improve the utilization rate of the overall production line; in addition, because it reduces the need to prepare for replacement of the material shifter, pressure shifter and additional fixtures, it can also reduce the equipment cost of the test classification equipment . The above embodiments are only to illustrate and illustrate the technical content of this creation, and the patent scope of this patent shall be subject to the scope of patent application described later.

10:電子元件壓接裝置 11:變距組 111:座部 112a、112b、112c、112d:載台 113:橫向滑軌 114、115:縱向滑軌 116:橫向螺桿組 117:縱向螺桿組 117a:第一段部 117b:第二段部 118:第一滑塊 119:第二滑塊 12:壓取器 13:驅動機構 131:動力源 132:傳動組 133:升降螺桿組 134:機架 135:升降滑軌 136:下壓臂 20:電子元件壓接裝置 31:變距組 311:座部 312a、312b:載台 313:定位孔 313a、313b、313c:孔位 314:定位孔 315a、315b:定位柱 316:鎖附裝置 317:鎖附裝置 91:機台 911、912:軌道 913、914:橫移機組 92:供料裝置 921:取放裝置 922、923:入料載台 924:供料承置器 93:收料裝置 931、932:出料載台 933:取放裝置 934:收料承置器 94:測試裝置 941:測試座 95:入料料盤 96、97:出料料盤 99:電子元件 10: crimping device for electronic components 11: Variable pitch group 111: Seat 112a, 112b, 112c, 112d: stage 113: Horizontal slide 114, 115: longitudinal slide 116: Transverse screw group 117: Longitudinal screw group 117a: The first section 117b: The second section 118: The first slider 119: second slider 12: Presser 13: Drive mechanism 131: Power Source 132: Transmission Group 133: Lifting screw group 134: Rack 135: Lifting slide 136: Down Arm 20: crimping device for electronic components 31: Variable pitch group 311: Seat 312a, 312b: carrier 313: positioning hole 313a, 313b, 313c: hole position 314: positioning hole 315a, 315b: positioning column 316: Locking Device 317: Locking Device 91: Machine 911, 912: Orbit 913, 914: Traverse unit 92: Feeding device 921: Pick and Place Device 922, 923: Feeding stage 924: Feed Holder 93: Receiving device 931, 932: discharge stage 933: Pick and Place Device 934: Receiver 94: test device 941: Test Block 95: feeding tray 96, 97: discharge tray 99: electronic components

第1圖為本發明第一實施例測試分類設備之平面示意圖。 第2圖為本發明第一實施例電子元件壓接裝置之側面示意圖。 第3圖為第2圖之局部放大示意圖。 第4圖為本發明第一實施例變距組之立體圖。 第5圖為本發明第二實施例變距組之立體分解圖。 第6圖為本發明第三實施例變距組之立體分解圖。Figure 1 is a schematic plan view of the test classification device according to the first embodiment of the present invention. Figure 2 is a side view of the electronic component crimping device according to the first embodiment of the invention. Figure 3 is a partial enlarged schematic view of Figure 2. Figure 4 is a three-dimensional view of the variable pitch group according to the first embodiment of the present invention. Fig. 5 is a perspective exploded view of the variable pitch group according to the second embodiment of the invention. Fig. 6 is a three-dimensional exploded view of the variable pitch group according to the third embodiment of the present invention.

112a、112b:載台 112a, 112b: carrier

113:橫向滑軌 113: Horizontal slide

114、115:縱向滑軌 114, 115: longitudinal slide

116:橫向螺桿組 116: Transverse screw group

117:縱向螺桿組 117: Longitudinal screw group

118:第一滑塊 118: The first slider

12:壓取器 12: Presser

94:測試裝置 94: test device

941:測試座 941: Test Block

99:電子元件 99: electronic components

Claims (10)

一種電子元件壓接裝置,包含: 變距組,包含座部與至少一載台,該載台位於該座部的其中一表面,且該載台在該座部表面的位置為可調整者; 至少一壓取器,該壓取器設置於該載台,使該壓取器的位置能隨該載台調整; 驅動機構,該變距組設置於該驅動機構,該驅動機構能帶動該變距組與該壓取器沿一壓接方向移動。A crimping device for electronic components, comprising: The variable pitch set includes a seat and at least one carrier, the carrier is located on one of the surfaces of the seat, and the position of the carrier on the surface of the seat is adjustable; At least one extractor, which is arranged on the carrier so that the position of the extractor can be adjusted with the carrier; A driving mechanism, the distance changing group is arranged on the driving mechanism, and the driving mechanism can drive the distance changing group and the presser to move in a crimping direction. 如申請專利範圍第1項所述之電子元件壓接裝置,其中該座部與該載台其中一者具有定位孔,另一者具有定位柱,該變距組包含一鎖附裝置,該鎖附裝置使該載台可拆卸地壓抵於該座部,並且使該定位柱插置於該定位孔。The electronic component crimping device described in item 1 of the scope of patent application, wherein one of the seat and the carrier has a positioning hole, and the other has a positioning column, the variable pitch group includes a locking device, the lock The attachment device enables the carrier to be detachably pressed against the seat, and the positioning column is inserted into the positioning hole. 如申請專利範圍第2項所述之電子元件壓接裝置,其中該鎖附裝置包含一電磁線圈,該電磁線圈固定地設置於該座部與該載台其中一者,該座部與該載台其中另一者以磁性材質製成。The electronic component crimping device described in item 2 of the scope of patent application, wherein the locking device includes an electromagnetic coil, the electromagnetic coil is fixedly disposed on one of the seat and the carrier, the seat and the carrier The other one is made of magnetic material. 如申請專利範圍第3項所述之電子元件壓接裝置,其中該座部與該載台其中一者具有永久磁鐵,其中另一者以磁性材質製成。The electronic component crimping device described in item 3 of the scope of patent application, wherein one of the seat and the carrier has a permanent magnet, and the other is made of a magnetic material. 如申請專利範圍第2項所述之電子元件壓接裝置,其中該座部與該載台其中一者具有一穿孔,其中另一者具有一螺孔,該鎖附裝置包含一螺桿,該螺桿穿設於該穿孔並且螺鎖於該螺孔。According to the electronic component crimping device described in item 2 of the scope of patent application, one of the seat and the carrier has a through hole, and the other has a screw hole, the locking device includes a screw, and the screw Pass through the through hole and screw in the screw hole. 如申請專利範圍第1項所述之電子元件壓接裝置,其中該座部包含一橫向滑軌,該橫向滑軌垂直於該壓接方向,該載台可滑動地設置於該橫向滑軌。According to the electronic component crimping device described in claim 1, wherein the seat includes a horizontal sliding rail, the horizontal sliding rail is perpendicular to the crimping direction, and the carrier is slidably disposed on the horizontal sliding rail. 如申請專利範圍第6項所述之電子元件壓接裝置,其中該座部包含一縱向滑軌,該縱向滑軌垂直於該橫向滑軌與該壓接方向,該橫向滑軌可滑動地設置於該縱向滑軌。The electronic component crimping device described in item 6 of the scope of patent application, wherein the seat portion includes a longitudinal slide rail, the longitudinal slide rail is perpendicular to the transverse slide rail and the crimping direction, and the transverse slide rail is slidably arranged In the longitudinal slide. 如申請專利範圍第6項所述之電子元件壓接裝置,其中該座部包含一螺桿組,該螺桿組與該載台連動而能帶動該載台沿該橫向滑軌移動。According to the electronic component crimping device described in item 6 of the scope of patent application, the seat includes a screw group that is linked with the carrier to drive the carrier to move along the lateral slide rail. 如申請專利範圍第8項所述之電子元件壓接裝置,其中該變距組包含複數個載台,該螺桿組包含一第一段部與一第二段部,該第一段部的導程不同於該第二段部的導程,其中一載台與該第一段部連動,其中另一載台與該第二段部連動。The electronic component crimping device described in item 8 of the scope of application, wherein the variable pitch group includes a plurality of stages, the screw group includes a first section and a second section, and the guide of the first section The process is different from the lead of the second section. One of the stages is linked with the first stage, and the other stage is linked with the second stage. 一種測試分類設備,包含: 機台; 供料裝置,配置於該機台,並設有至少一供料承置器,用以容納至少一待測之電子元件; 收料裝置,配置於該機台,並設有至少一收料承置器,用以容納至少一完測之電子元件; 測試裝置,裝配於該機台,並設有至少一測試座;以及 如申請專利範圍第1項至第9項中任一項所述之電子元件壓接裝置; 其中該電子元件壓接裝置配置於該機台,以將其中至少一電子元件移載至該測試裝置、朝向該測試裝置壓抵電子元件、並將電子元件移出該測試裝置,以供該測試裝置對該電子元件執行測試作業; 控制裝置,用以整合該供料裝置、該電子元件壓接裝置、該測試裝置與該收料裝置作動,以執行自動化作業。A test classification device, including: Machine; The feeding device is arranged on the machine and is provided with at least one feeding holder for accommodating at least one electronic component to be tested; The receiving device is configured on the machine and is provided with at least one receiving holder for accommodating at least one electronic component that has been tested; The test device is assembled on the machine and is provided with at least one test seat; and The electronic component crimping device described in any one of items 1 to 9 of the scope of the patent application; The electronic component crimping device is arranged on the machine to transfer at least one of the electronic components to the testing device, press the electronic component toward the testing device, and move the electronic component out of the testing device for the testing device Perform test operations on the electronic component; The control device is used for integrating the feeding device, the electronic component crimping device, the testing device and the receiving device to perform automatic operations.
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Publication number Priority date Publication date Assignee Title
TWI741748B (en) * 2020-08-20 2021-10-01 鴻勁精密股份有限公司 Pressing mechanism and handler having the same

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CN103086153B (en) * 2011-11-01 2015-03-04 鸿劲科技股份有限公司 Variable distance transfer device for electronic components
TWI632101B (en) * 2017-12-01 2018-08-11 鴻勁精密股份有限公司 Electronic component variable pitch carrier and test equipment for its application

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