TW201938984A - Optical inspection apparatus - Google Patents
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- TW201938984A TW201938984A TW107107325A TW107107325A TW201938984A TW 201938984 A TW201938984 A TW 201938984A TW 107107325 A TW107107325 A TW 107107325A TW 107107325 A TW107107325 A TW 107107325A TW 201938984 A TW201938984 A TW 201938984A
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- G—PHYSICS
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- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
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Abstract
Description
本發明是有關於一種檢測設備,且特別是有關於一種光學檢測設備。The invention relates to a detection device, and in particular to an optical detection device.
為提高自動化生產的效率,自動光學檢測(Automated Optical Inspection)已廣泛地應用於面板、電路板、晶圓、發光二極體或封裝測試等相關產業,其可透過高速度、高精確度的光學影像檢測系統取得待測物的影像,以進行瑕疵判斷、定位量測、尺寸量測或幾何量測等,取代傳統以人力使用光學儀器來進行檢測的方式。In order to improve the efficiency of automated production, Automated Optical Inspection has been widely used in related industries such as panel, circuit board, wafer, light-emitting diode or packaging test, which can pass high-speed, high-precision optical The image detection system obtains the image of the object to be tested for defect judgment, positioning measurement, size measurement or geometric measurement, etc., instead of the traditional method of using optical instruments for detection by human labor.
因應檢測需求,自動光學檢測設備大多設有至少兩種光源,分別對待測物進行打光,例如以同軸光源對待測物進行同軸打光(coaxial lighting),或者是以側光源對待測物進行斜向打光(Oblique lighting)。進一步而言,側光源可採用可見光源或不可見光源(例如紅外光及/或紫外光),實務上,在替換側光源的過程中,使用者需先將原有的側光源自機台拆解下來,接著將另一側光源組裝至機台,不僅拆裝耗時,也會影響到側光源的打光角度。In response to detection requirements, most automatic optical detection devices are provided with at least two light sources, which are used to light the object to be measured, for example, coaxial light is used to coaxially light the object to be measured, or side light sources are used to incline the object to be measured. Oblique lighting. Further, the side light source may be a visible light source or an invisible light source (such as infrared light and / or ultraviolet light). In practice, in the process of replacing the side light source, the user must first remove the original side light source from the machine. After disassembling it, the other side light source is assembled to the machine, which not only takes time to disassemble, but also affects the lighting angle of the side light source.
本發明提供一種光學檢測設備,具有極佳的使用便利性與可靠度。The invention provides an optical detection device, which has excellent convenience and reliability.
本發明的光學檢測設備用以檢測放置於工作平面上的待測物。光學檢測設備包括載架、影像擷取元件、旋轉載盤、第一光源以及第二光源。影像擷取元件設置於載架上。影像擷取元件具有光軸,且光軸延伸通過待測物。旋轉載盤設置於載架上,且位於影像擷取元件的一側。第一光源配置用以發出第一光線。第二光源與第一光源分別設置於旋轉載盤的相對兩側,且配置用以發出第二光線。旋轉載盤配置用以依軸線相對於載架旋轉而使第一光源的第一光線或第二光源的第二光線射向待測物,且軸線與光軸相交。The optical detection device of the present invention is used to detect a test object placed on a work plane. The optical detection device includes a carrier, an image capturing element, a rotating carrier, a first light source and a second light source. The image capturing element is arranged on the carrier. The image capturing element has an optical axis, and the optical axis extends through the object to be measured. The rotary carrier is arranged on the carrier and is located on one side of the image capturing element. The first light source is configured to emit a first light. The second light source and the first light source are respectively disposed on opposite sides of the rotary carrier, and are configured to emit a second light. The rotating carrier is configured to rotate relative to the carrier according to an axis so that the first light from the first light source or the second light from the second light source strikes the object to be measured, and the axis intersects the optical axis.
基於上述,本發明的光學檢測設備能透過旋轉載盤切換第一光源與第二光源的方位,使第一光源與第二光源的其中一者朝向分光元件,不僅能免去拆裝替換光源的程序,也能避免影響到光線的投射角度,因而具有極佳的使用便利性與可靠度。Based on the above, the optical detection device of the present invention can switch the orientation of the first light source and the second light source by rotating the carrier plate, so that one of the first light source and the second light source faces the beam splitting element, and it is not only necessary to disassemble and replace the light source. The program can also avoid affecting the projection angle of light, so it has excellent convenience and reliability.
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。In order to make the above features and advantages of the present invention more comprehensible, embodiments are hereinafter described in detail with reference to the accompanying drawings.
圖1是本發明一實施例的光學檢測設備的示意圖。圖2是圖1的旋轉載盤旋轉後的示意圖。請參考圖1與圖2,在本實施例中,光學檢測設備100可用以檢測放置於工作平面10上的待測物20,並且,使用者可視需求切換至少兩光源的方位,以選擇透過其中一光源所發出的光線射向待測物20。具體而言,光學檢測設備100包括載架110、分光元件120、影像擷取元件130、旋轉載盤140、第一光源150以及第二光源160,其中分光元件120、影像擷取元件130、旋轉載盤140皆設置於載架110上,且待測物20、分光元件120以及影像擷取元件130相互對準。FIG. 1 is a schematic diagram of an optical detection device according to an embodiment of the present invention. FIG. 2 is a schematic diagram after the rotary carrier of FIG. 1 is rotated. Please refer to FIG. 1 and FIG. 2. In this embodiment, the optical detection device 100 can be used to detect the object to be measured 20 placed on the work plane 10, and the user can switch the positions of at least two light sources according to the needs to choose to pass through them. The light emitted by a light source is directed toward the object 20 to be measured. Specifically, the optical detection device 100 includes a carrier 110, a spectroscopic element 120, an image capturing element 130, a rotating carrier 140, a first light source 150, and a second light source 160. The spectroscopic element 120, image capturing element 130, The transfer tray 140 is all disposed on the carrier 110, and the object to be measured 20, the light splitting element 120 and the image capturing element 130 are aligned with each other.
待測物20與影像擷取元件130分別位於分光元件120的相對兩側,其中影像擷取元件130具有光軸131,且光軸131延伸通過分光元件120與待測物20。因此,自待測物20反射的光線實質上可沿著光軸131穿過分光元件120並射向影像擷取元件130,而影像擷取元件130接收自待測物20反射的光線,以取得待測物20的影像。影像擷取元件130包括感光元件132與鏡頭133,其中感光元件132與分光元件120分別位於鏡頭133的相對兩側,且鏡頭133用以調整進入到影像擷取元件130中的光線的路徑,以令光線落在感光元件132而成像。The object to be measured 20 and the image capturing element 130 are located on opposite sides of the spectroscopic element 120, respectively. The image capturing element 130 has an optical axis 131, and the optical axis 131 extends through the spectroscopic element 120 and the object to be measured 20. Therefore, the light reflected from the DUT 20 can substantially pass through the spectroscopic element 120 along the optical axis 131 and be incident on the image capturing element 130, and the image capturing element 130 receives the light reflected from the DUT 20 to obtain An image of the test object 20. The image capturing element 130 includes a light sensing element 132 and a lens 133, wherein the light sensing element 132 and the beam splitting element 120 are located on opposite sides of the lens 133, respectively, and the lens 133 is used to adjust the path of light entering the image capturing element 130 to Light is caused to fall on the photosensitive element 132 to form an image.
旋轉載盤140位於分光元件120與影像擷取元件130的一側,且是以不妨礙光線的傳遞路徑為配置原則。另一方面,第一光源150與第二光源160分別設置於旋轉載盤140的相對兩側,在圖1所示的狀態下,第一光源150朝向分光元件120,且第二光源160背向分光元件120。換句話說,第二光源160與分光元件120分別位於第一光源150的相對兩側。在本實施例中,旋轉載盤140能夠依軸線141相對於載架110旋轉,藉由旋轉載盤140依軸線141相對於載架110旋轉,能使第二光源160轉向分光元件120,如圖2所示。在圖2所示的狀態下,第二光源160朝向分光元件120,且第一光源150背向分光元件120。換句話說,第一光源150與分光元件120分別位於第二光源160的相對兩側。The rotating carrier 140 is located on one side of the light splitting element 120 and the image capturing element 130, and is arranged on the principle that it does not hinder the transmission path of light. On the other hand, the first light source 150 and the second light source 160 are respectively disposed on opposite sides of the rotary carrier 140. In the state shown in FIG. 1, the first light source 150 faces the beam splitter 120, and the second light source 160 faces away. Spectroscopic element 120. In other words, the second light source 160 and the spectroscopic element 120 are located on opposite sides of the first light source 150, respectively. In this embodiment, the rotary carrier 140 can rotate relative to the carrier 110 along the axis 141, and the rotary light carrier 140 can rotate relative to the carrier 110 along the axis 141, so that the second light source 160 can be turned to the beam splitting element 120, as shown in FIG. 2 shown. In the state shown in FIG. 2, the second light source 160 faces the spectroscopic element 120, and the first light source 150 faces away from the spectroscopic element 120. In other words, the first light source 150 and the spectroscopic element 120 are located on opposite sides of the second light source 160, respectively.
簡言之,光學檢測設備100能透過旋轉載盤140切換第一光源150與第二光源160的方位,使第一光源150與第二光源160的其中一者朝向分光元件120,不僅能免去拆裝替換光源的程序,也能避免影響到光線的投射角度,因而具有極佳的使用便利性與可靠度。In short, the optical detection device 100 can switch the orientation of the first light source 150 and the second light source 160 through the rotating carrier 140, so that one of the first light source 150 and the second light source 160 faces the beam splitting element 120, which can not only eliminate The procedure of disassembling and replacing the light source can also avoid affecting the projection angle of the light, so it has excellent convenience and reliability.
請繼續參考圖1與圖2,在本實施例中,軸線141與光軸131相交,其中光軸131例如是垂直於工作平面10,且軸線141與工作平面10夾銳角。進一步而言,旋轉載盤140包括座部142與承載部143,其中座部142可旋轉地連接載架110,且配置用以調整第一光源150所發出的第一光線151與工作平面10之間的夾角A,或者是調整第二光源160所發出的第二光線161與工作平面10之間的夾角B。也就是說,使用者可使旋轉部142相對於載架110旋轉,以令第一光源150的第一光線151與工作平面10之間的夾角A在30度至60度之間作調整,或者是令第二光源160的第二光線161與工作平面10之間的夾角B在30度至60度之間作調整。更準確來說,夾角A(或夾角B)的調整範圍可大於等於30度且小於等於60度,且是以55度為優選,藉此角度設定可使影像擷取元件130所取得的影像更為清晰。Please continue to refer to FIG. 1 and FIG. 2. In this embodiment, the axis 141 intersects the optical axis 131. The optical axis 131 is, for example, perpendicular to the work plane 10, and the axis 141 is at an acute angle with the work plane 10. Further, the rotating carrier 140 includes a seat portion 142 and a bearing portion 143, wherein the seat portion 142 is rotatably connected to the carrier 110, and is configured to adjust the first light 151 emitted by the first light source 150 and the working plane 10. The included angle A between the two is the adjusted angle B between the second light 161 emitted from the second light source 160 and the work plane 10. That is, the user can rotate the rotating portion 142 relative to the carrier 110 so that the included angle A between the first light 151 of the first light source 150 and the work plane 10 is adjusted between 30 degrees and 60 degrees, or The angle B between the second light 161 of the second light source 160 and the work plane 10 is adjusted between 30 degrees and 60 degrees. More specifically, the adjustment range of the included angle A (or included angle B) can be 30 degrees or more and 60 degrees or less, and 55 degrees is preferred. With this angle setting, the image obtained by the image capturing element 130 can be more For clarity.
另一方面,第一光源150與第二光源160分別設置於承載部143的相對兩側,其中承載部143可旋轉地連接座部142,且第一光源150(或第二光源160)與座部142分別位於承載部143的相對兩側。承載部143用以承載第一光源150與第二光源160,並且,承載部143能依軸線141相對於座部142旋轉,以切換第一光源150與第二光源160的方位。On the other hand, the first light source 150 and the second light source 160 are respectively disposed on opposite sides of the bearing portion 143, wherein the bearing portion 143 is rotatably connected to the seat portion 142, and the first light source 150 (or the second light source 160) and the seat The portions 142 are respectively located on opposite sides of the bearing portion 143. The bearing portion 143 is used to carry the first light source 150 and the second light source 160, and the bearing portion 143 can rotate relative to the seat portion 142 along the axis 141 to switch the orientations of the first light source 150 and the second light source 160.
在本實施例中,軸線141與光軸131相交,其中光軸131例如是垂直於工作平面10,且第一光線151(或第二光線161)例如是垂直於軸線141。因此,軸線141與光軸131之間的夾角C可等於夾角A(或夾角B)。也就是說,藉由使座部142相對於載架110旋轉,可同時調整夾角A(或夾角B)與夾角C,且兩者的角度相等。In the present embodiment, the axis 141 intersects the optical axis 131, where the optical axis 131 is, for example, perpendicular to the work plane 10, and the first light ray 151 (or the second light 161) is, for example, perpendicular to the axis 141. Therefore, the included angle C between the axis 141 and the optical axis 131 may be equal to the included angle A (or included angle B). That is, by rotating the seat portion 142 relative to the carrier 110, the included angle A (or included angle B) and the included angle C can be adjusted at the same time, and the angles of the two are equal.
第一光源150與第二光源160包括可見光光源與不可見光光源的組合,其中不可見光光源可以是紅外光光源或紫外光光源。分光元件120位於第一光線151(或第二光線161)的傳遞路徑上,其中分光元件120具有相對的第一表面121與第二表面122,第一表面121朝向第一光源150(或第二光源160),且第二表面122朝向待測物20。The first light source 150 and the second light source 160 include a combination of a visible light source and an invisible light source. The invisible light source may be an infrared light source or an ultraviolet light source. The light splitting element 120 is located on the transmission path of the first light 151 (or the second light 161), where the light splitting element 120 has a first surface 121 and a second surface 122 opposite to each other, and the first surface 121 faces the first light source 150 (or the second Light source 160), and the second surface 122 faces the object 20 to be measured.
在圖1所示的狀態下,第一光線151射向第一表面121並在通過分光元件120後自第二表面122射向待測物20。後續,自待測物20反射的第一光線151射向第二表面122並在通過分光元件120後自第一表面121射向影像擷取元件130,而影像擷取元件130接收自待測物20反射的第一光線151,以取得待測物20的影像。特別說明的是,在圖1中,自待測物20反射的第一光線151例如是與光軸131重疊。In the state shown in FIG. 1, the first light 151 is emitted toward the first surface 121 and is emitted from the second surface 122 toward the object 20 after passing through the light splitting element 120. Subsequently, the first light 151 reflected from the DUT 20 is directed toward the second surface 122 and after passing through the spectroscopic element 120, it is directed from the first surface 121 to the image capturing element 130, and the image capturing element 130 is received from the DUT 20 reflects the first light 151 to obtain an image of the object 20 to be measured. It is particularly noted that, in FIG. 1, the first light 151 reflected from the object to be measured 20 overlaps the optical axis 131, for example.
在圖2所示的狀態下,第二光線161射向第一表面121並在通過分光元件120後自第二表面122射向待測物20。後續,自待測物20反射的第二光線161射向第二表面122並在通過分光元件120後自第一表面121射向影像擷取元件130,而影像擷取元件130接收自待測物20反射的第二光線161,以取得待測物20的影像。特別說明的是,在圖2中,自待測物20反射的第二光線161例如是與光軸131重疊。In the state shown in FIG. 2, the second light 161 is emitted toward the first surface 121 and is emitted from the second surface 122 toward the object 20 after passing through the light splitting element 120. Subsequently, the second light 161 reflected from the object under test 20 is emitted toward the second surface 122 and after passing through the spectroscopic element 120 from the first surface 121 to the image capturing element 130, and the image capturing element 130 receives the object from the object to be measured 20 reflects the second light 161 to obtain an image of the object 20 to be measured. In particular, in FIG. 2, the second light 161 reflected from the object to be measured 20 overlaps the optical axis 131, for example.
另一方面,光學檢測設備100更包括第三光源170,設置於載架110上。旋轉載盤140與第三光源170分別位於分光元件120的相對兩側,且第三光源170朝向分光元件120的第二表面122。第三光源170所發出的第三光線171射向第二表面122並自第二表面122反射而射向待測物20。後續,自待測物20反射的第三光線171射向第二表面122並在通過分光元件120後自第一表面121射向影像擷取元件130,而影像擷取元件130接收自待測物20反射的第三光線171,以取得待測物20的影像。特別說明的是,在圖1與圖2中,自第二表面122反射而射向待測物20的第三光線171例如是與光軸131重疊,並且,自待測物20反射的第一光線151例如是與光軸131重疊。On the other hand, the optical detection device 100 further includes a third light source 170 disposed on the carrier 110. The rotating carrier 140 and the third light source 170 are respectively located on opposite sides of the light splitting element 120, and the third light source 170 faces the second surface 122 of the light splitting element 120. The third light 171 emitted by the third light source 170 is directed toward the second surface 122 and is reflected from the second surface 122 to the object 20 to be measured. Subsequently, the third light 171 reflected from the DUT 20 is directed toward the second surface 122 and after passing through the spectroscopic element 120, it is directed from the first surface 121 to the image capturing element 130, and the image capturing element 130 is received from the DUT 20 reflects the third light 171 to obtain an image of the object 20 to be measured. In particular, in FIG. 1 and FIG. 2, the third light 171 reflected from the second surface 122 and directed toward the test object 20 is, for example, an optical axis 131 that overlaps with the first light reflected from the test object 20. The light ray 151 overlaps the optical axis 131, for example.
綜上所述,本發明的光學檢測設備能透過旋轉載盤切換第一光源與第二光源的方位,使第一光源與第二光源的其中一者朝向分光元件,不僅能免去拆裝替換光源的程序,也能避免影響到光線的投射角度,因而具有極佳的使用便利性與可靠度。另一方面,光學檢測設備也能透過旋轉載盤調整第一光源的第一光線或第二光源的第二光線投射至待測物的角度,例如是介於30度至60度,且是以55度為優選,藉此角度設定可使影像擷取元件所取得的影像更為清晰。In summary, the optical detection device of the present invention can switch the orientation of the first light source and the second light source by rotating the carrier plate, so that one of the first light source and the second light source faces the beam splitting element, which not only eliminates disassembly and replacement The program of the light source can also avoid affecting the projection angle of the light, so it has excellent convenience and reliability. On the other hand, the optical detection device can also adjust the angle at which the first light from the first light source or the second light from the second light source is projected to the object to be measured by rotating the carrier, for example, between 30 degrees and 60 degrees, and 55 degrees is preferred, and the angle setting can make the image obtained by the image capturing element clearer.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed as above with the examples, it is not intended to limit the present invention. Any person with ordinary knowledge in the technical field can make some modifications and retouching without departing from the spirit and scope of the present invention. The protection scope of the present invention shall be determined by the scope of the attached patent application.
10‧‧‧工作平面10‧‧‧Working plane
20‧‧‧待測物20‧‧‧DUT
100‧‧‧光學檢測設備100‧‧‧ Optical Inspection Equipment
110‧‧‧載架110‧‧‧ Carrier
120‧‧‧分光元件120‧‧‧ Beamsplitter
121‧‧‧第一表面121‧‧‧ the first surface
122‧‧‧第二表面122‧‧‧Second surface
130‧‧‧影像擷取元件130‧‧‧Image capture element
131‧‧‧光軸131‧‧‧ Optical axis
132‧‧‧感光元件132‧‧‧photosensitive element
133‧‧‧鏡頭133‧‧‧ lens
140‧‧‧旋轉載盤140‧‧‧rotating carrier
141‧‧‧軸線141‧‧‧ axis
142‧‧‧座部142‧‧‧Seat
143‧‧‧承載部143‧‧‧bearing department
150‧‧‧第一光源150‧‧‧first light source
151‧‧‧第一光線151‧‧‧First Light
160‧‧‧第二光源160‧‧‧second light source
161‧‧‧第二光線161‧‧‧second light
170‧‧‧第三光源170‧‧‧ third light source
171‧‧‧第三光線171‧‧‧ third light
A~C‧‧‧夾角A ~ C‧‧‧ Angle
圖1是本發明一實施例的光學檢測設備的示意圖。 圖2是圖1的旋轉載盤旋轉後的示意圖。FIG. 1 is a schematic diagram of an optical detection device according to an embodiment of the present invention. FIG. 2 is a schematic diagram after the rotary carrier of FIG. 1 is rotated.
Claims (10)
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CN201810415909.1A CN110231145A (en) | 2018-03-06 | 2018-05-03 | Optical detection apparatus |
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TWI254402B (en) * | 2005-06-20 | 2006-05-01 | Nat Pingtung University Of Sci | Examination device for semiconductor package components |
TWI504912B (en) * | 2014-08-07 | 2015-10-21 | Utechzone Co Ltd | Light source device |
CN104215178B (en) * | 2014-09-28 | 2016-08-31 | 福建师范大学 | Object volume non-contact measurement method based on reflecting mirror secondary imaging and device |
CN105572073B (en) * | 2015-12-31 | 2018-05-18 | 哈尔滨工业大学 | A kind of method that liquid refractivity is measured under the conditions of extra electric field |
TWI623741B (en) * | 2016-06-23 | 2018-05-11 | 由田新技股份有限公司 | Optical inspection system |
CN106247197A (en) * | 2016-08-01 | 2016-12-21 | 上海澳华光电内窥镜有限公司 | A kind of light supply apparatus and control method |
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