TWM568454U - Optical inspection apparatus - Google Patents

Optical inspection apparatus Download PDF

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Publication number
TWM568454U
TWM568454U TW107209198U TW107209198U TWM568454U TW M568454 U TWM568454 U TW M568454U TW 107209198 U TW107209198 U TW 107209198U TW 107209198 U TW107209198 U TW 107209198U TW M568454 U TWM568454 U TW M568454U
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Taiwan
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image
side light
light sources
platform
detecting device
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TW107209198U
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Chinese (zh)
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張祥毅
古振男
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由田新技股份有限公司
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Application filed by 由田新技股份有限公司 filed Critical 由田新技股份有限公司
Priority to TW107209198U priority Critical patent/TWM568454U/en
Publication of TWM568454U publication Critical patent/TWM568454U/en
Priority to CN201821840092.4U priority patent/CN209372707U/en

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Abstract

An optical inspection apparatus is adapted to inspect a test object. The optical inspection apparatus includes a platform, an image capturing element, at least two side light sources, at least two reflective elements and an inspection unit. The platform has an assembly opening, wherein the platform is configured for carrying the test object and test object is disposed corresponding to the assembly opening. The image capturing element and the two side light sources are respectively disposed above and under the platform, wherein the image capturing element is aligned with the assembly opening and the image capturing element captures the test object. The two reflective elements are disposed at the assembly opening. The two side light sources are respectively disposed corresponding to the two reflective elements, and each reflective element is located between the image capturing element and the corresponding side light source. Each side light source and the corresponding reflective element are able to supply a side light to the test object, such that an image of the test object is captured by the image capturing element. The inspection unit receives the image of the test object so as to inspect the test object.

Description

光學檢測設備Optical inspection equipment

本新型創作是有關於一種檢測設備,且特別是有關於一種光學檢測設備。The novel creation is related to a detection device, and in particular to an optical detection device.

在面板(panel)的製作過程中,因製程上的缺陷或失誤,可能導致面板點亮時產生亮點或碎亮點。因此,在面板製作完成後,皆會採用光學檢測設備對面板進行檢測,判斷面板是否存在亮點或碎亮點,若有,則進一步取得亮點或碎亮點的所在位置,以進行補修的程序。然而,在光學檢測過程中,取得的影像可能包含有面板中的亮點、面板中的碎亮點以及附著於面板上的異物等影像,一有不慎,便可能將附著於面板上的異物誤判為亮點或碎亮點,從而在檢測過程中產生誤宰(overkill)的情事。During the manufacturing process of the panel, defects or mistakes in the process may cause bright spots or broken spots when the panel is lit. Therefore, after the panel is completed, the panel is inspected by optical inspection equipment to determine whether there is a bright spot or a broken spot on the panel, and if so, the position of the bright spot or the broken spot is further obtained for repairing. However, in the optical detection process, the acquired image may include bright spots in the panel, broken bright spots in the panel, and foreign matter attached to the panel. If accidentally, the foreign matter attached to the panel may be misidentified as Highlights or broken highlights, resulting in overkill during the inspection process.

一般來說,光學檢測設備配設有側光源,用以投射側向光線至面板,以取得附著於面板上的異物的影像。然而,受限於側向光線投射至面板的角度限制,難以縮減側光源與面板之間的距離,致使投射至面板的光線的亮度不足,從而影響到檢測準確度。Generally, the optical detecting device is provided with a side light source for projecting lateral light to the panel to obtain an image of foreign matter attached to the panel. However, limited by the angle limitation of the lateral ray casting onto the panel, it is difficult to reduce the distance between the side light source and the panel, so that the brightness of the light projected to the panel is insufficient, thereby affecting the detection accuracy.

本新型創作提供一種光學檢測設備,有助於提高檢測準確度。The novel creation provides an optical detection device that helps to improve detection accuracy.

本新型創作的光學檢測設備,適於檢測待測物。光學檢測設備包括平台、取像元件、至少二側光源、至少二反射元件以及檢測單元。平台具有安裝開口,其中平台用以承載待測物,且待測物對應於安裝開口設置。取像元件與前述二側光源分別設置於平台的上方與下方,其中取像元件對位於安裝開口,且影像擷取待側物。前述二反射元件設置於安裝開口。前述二反射元件係分別對應於前述二側光源,且各反射元件位於取像元件與對應的側光源之間。各側光源與對應的反射元件可提供待側物一側向光線,藉以取像元件擷取待側物之影像。檢測單元接收待側物之影像,藉以檢測待側物。The optical detection device created by the novel is suitable for detecting an object to be tested. The optical detecting device comprises a platform, an image capturing element, at least two side light sources, at least two reflective elements, and a detecting unit. The platform has a mounting opening, wherein the platform is used to carry the object to be tested, and the object to be tested is disposed corresponding to the mounting opening. The image capturing component and the two side light sources are respectively disposed above and below the platform, wherein the image capturing component pair is located at the mounting opening, and the image captures the side object. The aforementioned two reflective elements are disposed on the mounting opening. The two reflective elements respectively correspond to the two side light sources, and each of the reflective elements is located between the image capturing element and the corresponding side light source. Each of the side light sources and the corresponding reflective element can provide side light to the side of the object, whereby the image capturing element captures an image of the object to be side. The detecting unit receives the image of the object to be side, thereby detecting the object to be side.

基於上述,本新型創作的光學檢測設備藉由反射元件的設置,能夠縮減側光源與待測物之間的距離,使投射至待測物的側向光線的亮度提升且均勻,從而有助於提高檢測準確度。Based on the above, the optical detecting device of the present invention can reduce the distance between the side light source and the object to be tested by the arrangement of the reflective element, so that the brightness of the lateral light projected to the object to be tested is improved and uniform, thereby contributing to Improve detection accuracy.

為讓本新型創作的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。The above described features and advantages of the present invention will become more apparent and understood from the following description.

圖1是本新型創作一實施例的光學檢測設備的局部截面示意圖。圖2是本新型創作一實施例的光學檢測設備的局部俯視示意圖。圖3是本新型創作一實施例的光學檢測設備的電路示意圖。為求清楚表示,圖2省略繪示設置於平台110的上方的取像元件120。請參考圖1至圖3,在本實施例中,光學檢測設備100可用以檢測待測物中存在的瑕疵,其中待測物可為面板10,但不限於此。在其他實施例中,待測物也可以是導光板、偏光片或其他光學元件。BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a partial cross-sectional view showing an optical detecting apparatus of an embodiment of the present invention. 2 is a partial top plan view of an optical detecting apparatus according to an embodiment of the present invention. 3 is a circuit diagram of an optical detecting apparatus of an embodiment of the present invention. For the sake of clarity, FIG. 2 omits the imaging element 120 disposed above the platform 110. Referring to FIG. 1 to FIG. 3, in the embodiment, the optical detecting device 100 can be used to detect defects existing in the object to be tested, wherein the object to be tested can be the panel 10, but is not limited thereto. In other embodiments, the object to be tested may also be a light guide plate, a polarizer or other optical component.

光學檢測設備100包括平台110、取像元件120、背光源130、至少二反射元件140、至少二側光源150以及檢測單元160,假定背光源130位於整體設備的底側,背光源130、前述二側光源150、平台110以及取像元件120例如是由下往上依序排列。沿此排列方向,前述二側光源150設置於背光源130的上方,且位於平台110的下方。平台110設置於前述二側光源150的上方,且取像元件120設置於平台110的上方。進一步而言,前述二側光源150並列於平台110與背光源130之間,且平台110位於前述二側光源150與取像元件120之間。也就是說,背光源130與取像元件120分別位於平台110的相對兩側,且背光源130與平台110之間的距離大於任一側光源150與平台110之間的距離。The optical detecting device 100 includes a platform 110, an image capturing component 120, a backlight 130, at least two reflective components 140, at least two side light sources 150, and a detecting unit 160. Assuming that the backlight 130 is located at the bottom side of the overall device, the backlight 130, the foregoing two The side light source 150, the stage 110, and the image capturing element 120 are sequentially arranged, for example, from bottom to top. Along the arrangement direction, the two side light sources 150 are disposed above the backlight 130 and located below the platform 110. The platform 110 is disposed above the two side light sources 150, and the image capturing component 120 is disposed above the platform 110. Further, the two side light sources 150 are juxtaposed between the platform 110 and the backlight 130, and the platform 110 is located between the two side light sources 150 and the image capturing element 120. That is, the backlight 130 and the image capturing component 120 are respectively located on opposite sides of the platform 110, and the distance between the backlight 130 and the platform 110 is greater than the distance between any of the side light sources 150 and the platform 110.

平台110具有安裝開口111,其中平台110用以承載面板10,且面板10對應於安裝開口111設置,舉例來說,面板10的至少部分與安裝開口111相重疊。取像元件120對位於安裝開口111,且取像元件120可為線掃描相機或面掃描相機,但不限於此。背光源130對位於安裝開口111,配置用以朝向安裝開口111投射背光線131,以照射對應於安裝開口111設置的面板10。進一步而言,背光線131可在穿透面板10後射向取像元件120,其中取像元件120依據穿透面板10的背光線131取得混合瑕疵表面影像。其中,混和瑕疵表面影像可包含有面板10中的亮點、面板10中的碎亮點以及附著於面板10上的異物等影像,以下分別稱為亮點影像、碎亮點影像以及異物影像。The platform 110 has a mounting opening 111 in which the platform 110 is used to carry the panel 10 and the panel 10 is disposed corresponding to the mounting opening 111, for example, at least a portion of the panel 10 overlapping the mounting opening 111. The image capturing element 120 is located at the mounting opening 111, and the image capturing element 120 may be a line scan camera or a face scan camera, but is not limited thereto. The pair of backlights 130 are located at the mounting opening 111 and are configured to project the backlight line 131 toward the mounting opening 111 to illuminate the panel 10 disposed corresponding to the mounting opening 111. Further, the backlight line 131 can be incident on the image capturing component 120 after penetrating the panel 10 , wherein the image capturing component 120 obtains a mixed pupil surface image according to the backlight line 131 penetrating the panel 10 . The mixed 瑕疵 surface image may include bright spots in the panel 10, broken bright spots in the panel 10, and foreign matter attached to the panel 10, and are hereinafter referred to as a bright spot image, a broken bright spot image, and a foreign matter image.

在本實施例中,各側光源150的所在位置是以不阻礙背光線131射向面板10的路徑為原則,其中各側光源150正對一個反射元件140,且各反射元件140位於取像元件120與對應的側光源150之間,並且各反射元件140的所在位置是以不阻礙背光線131射向面板10的路徑為原則。進一步而言,各側光源150所投射的側向光線151並非直接射向面板10,而是先射向對應的反射元件140,接著,經由對應的反射元件140反射至面板10。如此為之,有助於提高側向光線151投射至面板10的均勻度與亮度。側向光線151可在穿透面板10後射向取像元件120,其中取像元件120依據穿透面板10的側向光線151取得異物表面影像。其中,異物表面影像包含有異物影像。也就是說,混和瑕疵表面影像的組成與異物表面影像的組成不同。特別說明的是,各側光源150用以沿對應的傳遞路徑投射側向光線151至對應的反射元件140,且前述二傳遞路徑互不重疊,也就是說,前述二側光源150與前述二反射元件140的排列方式是以不干涉任一側向光線151的傳遞路徑為原則。In this embodiment, the position of each side light source 150 is based on a path that does not hinder the backlight line 131 from being directed toward the panel 10, wherein each side light source 150 faces a reflective element 140, and each reflective element 140 is located in the image capturing element. Between 120 and the corresponding side light source 150, and the position of each reflective element 140 is based on a path that does not hinder the backlight line 131 from being directed toward the panel 10. Further, the lateral light rays 151 projected by the side light sources 150 are not directly incident on the panel 10 but are first directed to the corresponding reflective elements 140 and then reflected to the panel 10 via the corresponding reflective elements 140. As such, it helps to increase the uniformity and brightness of the lateral ray 151 projected onto the panel 10. The lateral ray 151 can be directed toward the imaging element 120 after penetrating the panel 10, wherein the imaging element 120 obtains a foreign object surface image according to the lateral ray 151 penetrating the panel 10. Among them, the foreign object surface image contains a foreign matter image. That is to say, the composition of the surface image of the mixed raft is different from the composition of the surface image of the foreign matter. Specifically, each of the side light sources 150 is configured to project the lateral light ray 151 to the corresponding reflective element 140 along the corresponding transmission path, and the two transfer paths do not overlap each other, that is, the two side light sources 150 and the foregoing two reflections. The arrangement of the elements 140 is based on the principle of not interfering with the transmission path of any of the lateral rays 151.

如圖1所示,前述二反射元件140設置於平台110,且對位安裝開口111中,舉例來說,前述二反射元件140可分別固定於安裝開口111中的相對兩內壁面。背光源130、前述二側光源150以及前述二反射元件140依序由下往上排列,且沿此排列方向,各側光源150位於背光源130與對應的反射元件140之間。基於反射元件140的設置,側光源150所投射的側向光線151射向面板10的角度得以被調整,藉此,大多側向光線151因全反射效應而未能穿透面板10,故能避免產生取像元件120取得的異物表面影像包含有亮點影像與碎亮點影像。並且,因反射元件140可對側向光線151的投射路徑進行調整,側光源150與面板10之間的距離得以被縮減,例如縮減至25毫米,因而有助於提高側向光線151投射至面板10的均勻度與亮度。As shown in FIG. 1 , the two reflective elements 140 are disposed on the platform 110 , and in the alignment mounting openings 111 , for example, the two reflective elements 140 can be respectively fixed to the opposite inner wall surfaces of the mounting openings 111 . The backlight 130, the two side light sources 150, and the two reflective elements 140 are sequentially arranged from bottom to top, and the side light sources 150 are located between the backlight 130 and the corresponding reflective elements 140 along the arrangement direction. Based on the arrangement of the reflective element 140, the angle of the lateral light 151 projected by the side light source 150 toward the panel 10 is adjusted, whereby most of the lateral light 151 fails to penetrate the panel 10 due to the total reflection effect, thereby avoiding The foreign object surface image obtained by the image capturing component 120 includes a bright spot image and a broken bright spot image. Moreover, since the reflective element 140 can adjust the projection path of the lateral light 151, the distance between the side light source 150 and the panel 10 can be reduced, for example, to 25 mm, thereby contributing to the improvement of the lateral light 151 projection to the panel. 10 uniformity and brightness.

在其一實施例中,各側向光線151為平行光,平行面板10的朝向背光源130的表面11,進一步來說,上述平行光係指各側向光線151自對應的反射元件140反射後的反射光。在另一實施例中,各側向光線151自對應的反射元件140反射後的反射光與面板10的表面11之間的夾角落在130度至180度之間,圖1繪示出夾角為180度的態樣。In one embodiment, each of the lateral rays 151 is parallel light, the surface 11 of the parallel panel 10 facing the backlight 130. Further, the parallel light means that the lateral rays 151 are reflected from the corresponding reflective elements 140. Reflected light. In another embodiment, the corner between the reflected light reflected from the corresponding reflective element 140 and the surface 11 of the panel 10 is between 130 degrees and 180 degrees. FIG. 1 illustrates the angle of 180 degrees of appearance.

請參考圖1與圖3,檢測單元160電性耦接取像元件120、背光源130以及各側光源140,其中檢測單元160可為中央處理器、其他可程式化之一般用途或特殊用途的微處理器、數位訊號處理器、可程式化控制器、特殊應用積體電路、可程式化邏輯裝置或其他類似裝置或這些裝置的組合,且用以控制背光源130投射背光線131以、各側光源150投射側向光線151以及比對取像元件120取得的混和瑕疵表面影像與異物表面影像。在比對混和瑕疵表面影像與異物表面影像的過程中,檢測單元160可基於異物表面影像濾除混和瑕疵表面影像中的不必要影像,進一步而言,檢測單元160可基於異物表面影像中的異物影像將混和瑕疵表面影像中的異物影像濾除,以取得亮點影像與碎亮點影像的分布。由於異物表面影像實質上未包含有亮點影像與碎亮點影像,因此能防止混和瑕疵表面影像中的亮點影像與碎亮點影像在比對混和瑕疵表面影像與異物表面影像的過程中被濾除,從而有助於提高檢測準確度。Referring to FIG. 1 and FIG. 3, the detecting unit 160 is electrically coupled to the image capturing component 120, the backlight 130, and the side light sources 140. The detecting unit 160 can be a central processing unit, other programmable general purpose or special purpose. a microprocessor, a digital signal processor, a programmable controller, a special application integrated circuit, a programmable logic device or the like, or a combination of these devices, and used to control the backlight 130 to project the backlight 131, each The side light source 150 projects the side light ray 151 and the mixed 瑕疵 surface image and the foreign object surface image obtained by the image capturing element 120. In the process of aligning the surface image and the foreign object surface image, the detecting unit 160 may filter unnecessary images in the mixed surface image based on the foreign object surface image. Further, the detecting unit 160 may be based on the foreign matter in the foreign object surface image. The image filters the foreign matter image in the mixed surface image to obtain the distribution of the bright spot image and the broken spot image. Since the surface image of the foreign object does not substantially contain the bright spot image and the broken bright spot image, it can prevent the bright spot image and the broken bright spot image in the mixed surface image from being filtered out during the process of comparing the mixed surface image and the foreign object surface image, thereby Helps improve detection accuracy.

請參考圖1與圖2,在本實施例中,光學檢測設備100更包括至少二載架170,其中並列的前述二載架170連接平台110朝向背光源130的一側(或稱平台110背向取像元件120的一側),且各載架170的所在位置是以不阻礙背光線131射向面板10的路徑為原則。進一步而言,前述二載架170分別對應於前述二反射元件140設置,且分別設置鄰近安裝開口111。各載架170配置用以承載一個側光源150,其中各載架170具有朝向對應的反射元件140的出光開口171,且各側光源150投射出的側向光線151經由對應的出光開口171射向對應的反射元件140。Referring to FIG. 1 and FIG. 2 , in the embodiment, the optical detecting device 100 further includes at least two carriers 170 , wherein the parallel two carriers 170 connect the platform 110 toward the side of the backlight 130 (or the platform 110 back). The position of each of the carriers 170 is based on a path that does not hinder the backlight 131 from being incident on the panel 10. Further, the two carriers 170 are respectively disposed corresponding to the foregoing two reflective elements 140, and are respectively disposed adjacent to the mounting openings 111. Each of the carriers 170 is configured to carry a side light source 150, wherein each of the carriers 170 has a light-emitting opening 171 facing the corresponding reflective element 140, and the lateral light 151 projected by each side light source 150 is directed toward the corresponding light-emitting opening 171. Corresponding reflective element 140.

特別說明的是,本新型創作對於側光源的數量、反射元件的數量以及載架的數量不作限制。In particular, the novel creation does not limit the number of side light sources, the number of reflective elements, and the number of carriers.

另一方面,光學檢測設備100更包括至少二限位件180,設置於安裝開口111的周圍,且彼此相對。前述二限位件180配置用以卡制面板10,以使面板10的至少部分重疊於安裝開口111,並且防止面板10相對於平台110滑移。在本實施例中,限位件180的數量可以是大於二個,且限位件180的材質可為橡膠、矽膠或其他防滑且能適度變形的材質,以避免損傷面板10或面板10於檢測過程中滑移。舉例來說,各限位件180可包括承載部181,朝向安裝開口111延伸,其中各承載部181的至少部分重疊於安裝開口111,且配置用以承載面板10。如圖1所示,承載部181可具有L型卡槽,以供面板10的側緣卡抵於其中,從而限制面板10在互為垂直的兩方向上的移動自由度。On the other hand, the optical detecting device 100 further includes at least two limiting members 180 disposed around the mounting opening 111 and facing each other. The two second limiting members 180 are configured to clamp the panel 10 such that at least a portion of the panel 10 overlaps the mounting opening 111 and prevents the panel 10 from slipping relative to the platform 110. In this embodiment, the number of the limiting members 180 may be greater than two, and the material of the limiting member 180 may be rubber, silicone or other non-slip and moderately deformable material to avoid damage to the panel 10 or the panel 10 for detection. Slip during the process. For example, each of the limiting members 180 can include a carrying portion 181 extending toward the mounting opening 111 , wherein at least a portion of each of the carrying portions 181 is overlapped with the mounting opening 111 and configured to carry the panel 10 . As shown in FIG. 1, the carrying portion 181 may have an L-shaped card slot for the side edges of the panel 10 to be engaged therein, thereby restricting the degree of freedom of movement of the panel 10 in two directions perpendicular to each other.

如圖1所示,其中二限位件180分別對位於前述二側光源150,且前述二限位件180分別設置於前述二反射元件140背向前述二側光源150的一側。也就是說,各反射元件140是先安裝於對應的限位件180,再與對應的限位件180安裝於平台110,且各反射元件140落在安裝開口111中。如圖2所示,光學檢測設備更包括至少一定位件190(示意地繪示出兩個),其中各定位件190的對側設有一個限位件180,且各定位件190的推塊191朝向安裝開口111延伸。使用者可透過各定位件190的控制部192調整推塊191的位置,以使推塊191逼近面板10並推抵面板10抵靠位於定位件190的對側的限位件180,從而更加穩固地將面板10卡制於平台110上。推塊191的材質可為橡膠、矽膠或其他防滑且能適度變形的材質,以避免損傷面板10或面板10於檢測過程中滑移。As shown in FIG. 1 , the two limiting members 180 are respectively disposed on the two side light sources 150 , and the two limiting members 180 are respectively disposed on a side of the two reflective elements 140 facing away from the two side light sources 150 . That is to say, each of the reflective elements 140 is first mounted on the corresponding limiting member 180, and then mounted to the platform 110 with the corresponding limiting member 180, and each reflective element 140 falls in the mounting opening 111. As shown in FIG. 2, the optical detecting device further includes at least one positioning member 190 (two are schematically shown), wherein the opposite side of each positioning member 190 is provided with a limiting member 180, and the pushing block of each positioning member 190 The 191 extends toward the mounting opening 111. The user can adjust the position of the push block 191 through the control portion 192 of each positioning member 190 to make the push block 191 approach the panel 10 and push the panel 10 against the limit member 180 on the opposite side of the positioning member 190, thereby being more stable. The panel 10 is snapped onto the platform 110. The material of the push block 191 can be rubber, silicone or other non-slip and moderately deformable material to avoid damaging the panel 10 or the panel 10 from slipping during the detection process.

綜上所述,本新型創作的光學檢測設備藉由反射元件的設置,能夠縮減側光源與待測物之間的距離,使投射至待測物的側向光線的亮度提升且均勻,從而有助於提高檢測準確度,特別是可降低過檢率,所謂的過檢係指將合格品錯誤判定為不合格品,其會導致合格品不能出廠而被廢棄處理,而將合格品錯誤判定為不合格品的比率即稱為過檢率。進一步而言,藉由背光源投射背光線至待測物,取像元件能依據穿透待測物的背光線取得混合瑕疵表面影像。另一方面,藉由側光源投射側向光線,並使側向光線經反射元件偏折而射向待測物,取像元件能依據穿透待測物的側向光線取得異物表面影像。最後,對混合瑕疵表面影像與異物瑕疵表面影像進行比對,判斷出待測物中的灰塵及異物的所在位置,以進行後續補修的程序。In summary, the optical detecting device created by the present invention can reduce the distance between the side light source and the object to be tested by the arrangement of the reflective element, so that the brightness of the lateral light projected to the object to be tested is improved and uniform, thereby Help to improve the detection accuracy, especially to reduce the over-detection rate. The so-called over-test refers to the erroneous determination of the qualified product as a non-conforming product, which will cause the qualified product to be disposed of and discarded, and the qualified product is erroneously determined as The ratio of non-conforming products is called the over-test rate. Further, by projecting the backlight line to the object to be tested by the backlight, the image capturing component can obtain the mixed 瑕疵 surface image according to the backlight line penetrating the object to be tested. On the other hand, the lateral light source is projected by the side light source, and the lateral light is deflected by the reflective element to be directed toward the object to be tested. The image capturing element can obtain the surface image of the foreign object according to the lateral light that penetrates the object to be tested. Finally, the mixed 瑕疵 surface image is compared with the foreign object 瑕疵 surface image to determine the location of the dust and foreign matter in the object to be tested, and the subsequent repair process is performed.

基於反射元件的設置,側光源所投射的側向光線射向待測物的角度得以被調整,藉此,大多側向光線因全反射效應而未能穿透待測物,以避免取像元件所取得的異物表面影像包含有待測物中的亮點與碎亮點等影像。由於第二影像實質上未包含有亮點影像與碎亮點影像,因此能防止混合瑕疵表面影像中的亮點影像與碎亮點影像在比對混合瑕疵表面影像與異物表面影像的過程中被濾除,從而有助於提高檢測準確度。Based on the arrangement of the reflective elements, the angle of the lateral light projected by the side light source to the object to be tested is adjusted, whereby most of the lateral light fails to penetrate the object to be tested due to the total reflection effect, thereby avoiding the image capturing element. The obtained foreign object surface image contains images such as bright spots and broken bright spots in the object to be tested. Since the second image substantially does not include the bright spot image and the broken bright spot image, the bright spot image and the broken bright spot image in the mixed surface image are prevented from being filtered out during the process of comparing the mixed surface image and the foreign object surface image, thereby Helps improve detection accuracy.

雖然本新型創作已以實施例揭露如上,然其並非用以限定本新型創作,任何所屬技術領域中具有通常知識者,在不脫離本新型創作的精神和範圍內,當可作些許的更動與潤飾,故本新型創作的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the novel creation, and any person skilled in the art can make some changes without departing from the spirit and scope of the novel creation. Retouching, the scope of protection of this new creation is subject to the definition of the scope of the patent application attached.

10‧‧‧面板10‧‧‧ panel

11‧‧‧表面 11‧‧‧ surface

100‧‧‧光學檢測設備 100‧‧‧Optical testing equipment

110‧‧‧平台 110‧‧‧ platform

111‧‧‧安裝開口 111‧‧‧Installation opening

120‧‧‧取像元件 120‧‧‧Image taking components

130‧‧‧背光源 130‧‧‧Backlight

131‧‧‧背光線 131‧‧‧Backlight

140‧‧‧反射元件 140‧‧‧reflecting elements

150‧‧‧側光源 150‧‧‧ side light source

151‧‧‧側向光線 151‧‧‧lateral light

160‧‧‧檢測單元 160‧‧‧Detection unit

170‧‧‧載架 170‧‧‧ Carrier

171‧‧‧出光開口 171‧‧‧Lighting opening

180‧‧‧限位件 180‧‧‧Limited parts

181‧‧‧承載部 181‧‧‧Loading Department

190‧‧‧定位件 190‧‧‧ Positioning parts

191‧‧‧推塊 191‧‧‧ push block

192‧‧‧控制部 192‧‧‧Control Department

圖1是本新型創作一實施例的光學檢測設備的局部截面示意圖。 圖2是本新型創作一實施例的光學檢測設備的局部俯視示意圖。 圖3是本新型創作一實施例的光學檢測設備的電路示意圖。BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a partial cross-sectional view showing an optical detecting apparatus of an embodiment of the present invention. 2 is a partial top plan view of an optical detecting apparatus according to an embodiment of the present invention. 3 is a circuit diagram of an optical detecting apparatus of an embodiment of the present invention.

Claims (9)

一種光學檢測設備,適於檢測一待測物,該光學檢測設備包括: 一平台,具有一安裝開口,其中該平台用以承載該待測物,且該待測物對應於該安裝開口設置; 一取像元件,設置於該平台的上方,影像擷取該待側物; 至少二側光源,設置於該平台的下方,且對位於該安裝開口; 至少二反射元件,設置於該安裝開口,其中該至少二反射元件係分別對應於該二側光源,且各該反射元件位於該取像元件與對應的該側光源之間, 其中,各該側光源與對應的該反射元件可提供該待側物一側向光線,藉以該取像元件擷取該待側物之影像;以及 一檢測單元,接收該待側物之影像,藉以檢測該待側物。An optical detecting device is adapted to detect a test object, the optical detecting device comprising: a platform having a mounting opening, wherein the platform is configured to carry the object to be tested, and the object to be tested is disposed corresponding to the mounting opening; An image taking component is disposed above the platform, and the image captures the object to be side; at least two side light sources are disposed under the platform and are located at the mounting opening; at least two reflective elements are disposed at the mounting opening, The at least two reflective elements respectively correspond to the two side light sources, and each of the reflective elements is located between the image capturing element and the corresponding side light source, wherein each of the side light sources and the corresponding one of the side light sources can provide the The side object is directed to the light, whereby the image capturing component captures an image of the object to be side; and a detecting unit receives the image of the object to be side, thereby detecting the object to be side. 如申請專利範圍第1項所述的光學檢測設備,更包括: 至少二載架,連接該平台背向該取像元件的一側,且分別配置用以承載該二側光源,其中該二載架分別對應於該二反射元件設置,且各該載架具有朝向對應的該反射元件的一出光開口,各該側光源投射出的該側向光線經由對應的該出光開口射向對應的該反射元件。The optical detecting device of claim 1, further comprising: at least two carriers connected to a side of the platform facing away from the image capturing component, and respectively configured to carry the two side light sources, wherein the two The racks are respectively disposed corresponding to the two reflective elements, and each of the racks has a light-emitting opening toward the corresponding reflective element, and the lateral light rays projected by the side light sources are directed to the corresponding reflections through the corresponding light-emitting openings. element. 如申請專利範圍第1項所述的光學檢測設備,更包括: 至少二限位件,設置於該安裝開口的周圍,且彼此相對,該二限位件配置用以卡制該待測物。The optical detecting device of claim 1, further comprising: at least two limiting members disposed around the mounting opening and facing each other, the two limiting members being configured to clamp the object to be tested. 如申請專利範圍第3項所述的光學檢測設備,其中各該限位件包括一承載部,朝向該安裝開口延伸,且配置用以該承載該待測物。The optical detecting device of claim 3, wherein each of the limiting members comprises a carrying portion extending toward the mounting opening and configured to carry the object to be tested. 如申請專利範圍第3項所述的光學檢測設備,其中該二限位件分別對位於該二側光源,且該二限位件分別設置於該二反射元件背向該二側光源的一側。The optical detecting device of claim 3, wherein the two limiting members are respectively located on the two side light sources, and the two limiting members are respectively disposed on a side of the two reflective elements facing away from the two side light sources. . 如申請專利範圍第3項所述的光學檢測設備,更包括: 至少一定位件,設置於其中一該限位件的對側,且配置用以推抵該待測物抵靠其中一該限位件。The optical detecting device of claim 3, further comprising: at least one positioning member disposed on an opposite side of one of the limiting members, and configured to push the object to be tested against one of the limits Bit pieces. 如申請專利範圍第3項所述的光學檢測設備,更包括: 一背光源,與該取像元件分別設置於該平台的相對兩側,其中該背光源對位於該安裝開口,該背光源配置用以投射一背光線至該待測物,並由該取像元件取得該待側物之另一影像,該檢測單元電性耦接該取像元件、該背光源以及各該側光源。The optical detecting device of claim 3, further comprising: a backlight, and the image capturing component are respectively disposed on opposite sides of the platform, wherein the backlight pair is located at the mounting opening, and the backlight is configured The image is electrically coupled to the image capturing component, the backlight, and each of the side light sources. The image is electrically coupled to the image capturing component, the backlight, and the side light source. 如申請專利範圍第1項所述的光學檢測設備,其中各該側向光線為平行光,平行於該待側物的一表面。The optical detecting device of claim 1, wherein each of the lateral rays is parallel light parallel to a surface of the object to be side. 如申請專利範圍第1項所述的光學檢測設備,其中各該側向光線與該待側物的一表面之間的夾角落在130度至180度之間。The optical detecting device of claim 1, wherein a corner between each of the lateral light and a surface of the object to be side is between 130 degrees and 180 degrees.
TW107209198U 2018-07-06 2018-07-06 Optical inspection apparatus TWM568454U (en)

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