TW201909026A - Image capture device - Google Patents

Image capture device Download PDF

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TW201909026A
TW201909026A TW106132159A TW106132159A TW201909026A TW 201909026 A TW201909026 A TW 201909026A TW 106132159 A TW106132159 A TW 106132159A TW 106132159 A TW106132159 A TW 106132159A TW 201909026 A TW201909026 A TW 201909026A
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Taiwan
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light
sensor
image capturing
disposed
capturing device
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TW106132159A
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Chinese (zh)
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TWI653583B (en
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鐘煒竣
巫仁杰
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金佶科技股份有限公司
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V40/00Recognition of biometric, human-related or animal-related patterns in image or video data
    • G06V40/10Human or animal bodies, e.g. vehicle occupants or pedestrians; Body parts, e.g. hands
    • G06V40/12Fingerprints or palmprints
    • G06V40/13Sensors therefor
    • G06V40/1318Sensors therefor using electro-optical elements or layers, e.g. electroluminescent sensing
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/10Image acquisition
    • G06V10/12Details of acquisition arrangements; Constructional details thereof
    • G06V10/14Optical characteristics of the device performing the acquisition or on the illumination arrangements
    • G06V10/143Sensing or illuminating at different wavelengths
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/10Image acquisition
    • G06V10/12Details of acquisition arrangements; Constructional details thereof
    • G06V10/14Optical characteristics of the device performing the acquisition or on the illumination arrangements
    • G06V10/147Details of sensors, e.g. sensor lenses
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00

Abstract

An image capturing apparatus including a cover plate, a light source, a sensor, and a collimator is provided. The light source and the sensor are located on the same side of the cover plate. The collimator is disposed between the cover plate and the sensor, and the collimator includes collimating elements overlapped with each other. Each collimating element includes a transparent substrate and a light absorbing layer disposed on the transparent substrate. The light absorbing layer includes a plurality of light passing openings. The light passing openings expose sensing areas of the sensor. Spacing between the light passing openings is S. A width of each light passing opening is W, and W < S. A transparent substrate thickness of a first collimating element in the collimating elements is T1. A transparent substrate thickness of a second collimating element in the collimating elements is T2. The image capturing apparatus satisfies:.

Description

取像裝置Imaging device

本發明是有關於一種光電裝置,且特別是有關於一種取像裝置。The present invention relates to a photoelectric device, and more particularly to an image capturing device.

生物辨識的種類包括臉部、聲音、虹膜、視網膜、靜脈、掌紋和指紋辨識等。依照感測方式的不同,生物特徵辨識裝置可分為光學式、電容式、超音波式及熱感應式。一般而言,光學式生物特徵辨識裝置包括光源、導光元件以及感測器。光源所發出的光束照射按壓在導光元件上的待辨識物。感測器接收被待辨識物反射的光束,以進行生物特徵的辨識。在感測器取像的過程中,被指紋反射的光束容易散亂地傳遞至感測器,而造成取像品質不佳,影響辨識結果。雖然已有技術針對取像品質進行改善,然而現階段技術的改良仍難以有效改善串擾(crosstalk)問題。Types of biometrics include face, voice, iris, retina, vein, palm print, and fingerprint recognition. According to different sensing methods, biometric identification devices can be divided into optical, capacitive, ultrasonic, and thermal sensing. Generally, an optical biometric identification device includes a light source, a light guide element, and a sensor. The light beam emitted by the light source illuminates the object to be identified pressed on the light guide element. The sensor receives the light beam reflected by the object to be identified for identification of biological characteristics. During the process of image pickup by the sensor, the light beam reflected by the fingerprint is easily scattered to the sensor, resulting in poor image acquisition quality and affecting the identification result. Although the existing technology improves the image acquisition quality, it is still difficult to effectively improve the crosstalk problem by the current technology improvement.

本發明提供一種取像裝置,其具有良好的辨識能力。The invention provides an image capturing device, which has good identification ability.

本發明的一種取像裝置,其包括蓋板、光源、感測器以及準直器。感測器配置在光源旁。光源與感測器位於蓋板的同一側。準直器配置在蓋板與感測器之間,且準直器包括多個彼此重疊的準直元件。多個準直元件的每一個包括透光基板以及配置在透光基板上的吸光層。吸光層包括多個透光開口。多個透光開口暴露出感測器的多個感測區。多個透光開口的間距為S。多個透光開口的每一個的寬度為W,且W<S。多個準直元件中的第一準直元件的透光基板厚度為T1。多個準直元件中的第二準直元件的透光基板厚度為T2。取像裝置滿足:An image capturing device of the present invention includes a cover plate, a light source, a sensor, and a collimator. The sensor is arranged next to the light source. The light source and the sensor are located on the same side of the cover. The collimator is disposed between the cover plate and the sensor, and the collimator includes a plurality of collimating elements overlapping each other. Each of the plurality of collimating elements includes a light-transmitting substrate and a light-absorbing layer disposed on the light-transmitting substrate. The light absorbing layer includes a plurality of light transmitting openings. The plurality of light-transmitting openings expose a plurality of sensing regions of the sensor. The distance between the plurality of transparent openings is S. The width of each of the plurality of light-transmitting openings is W, and W <S. The thickness of the transparent substrate of the first collimating element among the plurality of collimating elements is T1. The thickness of the light-transmitting substrate of the second collimating element of the plurality of collimating elements is T2. The imaging device meets: .

在本發明的一實施例中,透光基板的表面上形成有多個凹陷,且吸光層配置在透光基板的多個凹陷中。In an embodiment of the present invention, a plurality of depressions are formed on a surface of the light-transmitting substrate, and the light-absorbing layer is disposed in the plurality of depressions of the light-transmitting substrate.

在本發明的一實施例中,取像裝置滿足:In an embodiment of the present invention, the imaging device satisfies: .

在本發明的一實施例中,取像裝置滿足:In an embodiment of the present invention, the imaging device satisfies: .

在本發明的一實施例中,第一準直元件配置在第二準直元件與感測器之間。In an embodiment of the invention, the first collimating element is disposed between the second collimating element and the sensor.

在本發明的一實施例中,第二準直元件配置在第一準直元件與感測器之間。In an embodiment of the present invention, the second collimating element is disposed between the first collimating element and the sensor.

在本發明的一實施例中,第二準直元件包括彼此重疊的n個透光基板,所述n個透光基板的厚度小於T1,且該些n個透光基板的厚度總和為T2。In an embodiment of the present invention, the second collimating element includes n light-transmitting substrates overlapping each other, the thickness of the n light-transmitting substrates is less than T1, and the total thickness of the n light-transmitting substrates is T2.

在本發明的一實施例中,取像裝置更包括顯示面板。顯示面板配置在蓋板與準直器之間。In an embodiment of the invention, the image capturing device further includes a display panel. The display panel is arranged between the cover and the collimator.

在本發明的一實施例中,取像裝置更包括帶通濾光層。帶通濾光層配置在顯示面板與感測器之間,其中光源的發光頻譜落在帶通濾光層的穿透頻譜內。In an embodiment of the invention, the image capturing device further includes a band-pass filter layer. The band-pass filter layer is disposed between the display panel and the sensor, wherein the light emission spectrum of the light source falls within the transmission spectrum of the band-pass filter layer.

在本發明的一實施例中,顯示面板為有機發光二極體顯示面板。In an embodiment of the invention, the display panel is an organic light emitting diode display panel.

在本發明的一實施例中,取像裝置更包括黏著層。黏著層配置在多個透光基板之間。In an embodiment of the invention, the image capturing device further includes an adhesive layer. The adhesive layer is disposed between the plurality of light-transmitting substrates.

基於上述,在本發明實施例的取像裝置中,的設計可使大角度的光束在多個準直元件之間經由多次反射而被吸光層吸收,進而有效改善串擾問題,使取像裝置具有良好的辨識能力。Based on the above, in the image pickup device according to the embodiment of the present invention, The design allows large-angle beams to be absorbed by the light absorbing layer through multiple reflections between multiple collimating elements, thereby effectively improving the problem of crosstalk and enabling the image pickup device to have a good discrimination ability.

為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。In order to make the above features and advantages of the present invention more comprehensible, embodiments are hereinafter described in detail with reference to the accompanying drawings.

圖1是依照本發明的第一實施例的取像裝置的剖面示意圖。圖2是圖1中的準直器的俯視示意圖。請參照圖1及圖2,本發明的第一實施例的取像裝置100適於擷取待測物10的生物特徵。舉例而言,待測物10為手指,且生物特徵為指紋或靜脈,但不以此為限。在一實施例中,待測物10可為手掌,且生物特徵可為掌紋。FIG. 1 is a schematic cross-sectional view of an image capturing apparatus according to a first embodiment of the present invention. FIG. 2 is a schematic top view of the collimator in FIG. 1. Please refer to FIG. 1 and FIG. 2. The image capturing device 100 according to the first embodiment of the present invention is adapted to capture biological characteristics of the object 10 to be measured. For example, the object to be measured 10 is a finger, and the biological characteristic is a fingerprint or a vein, but not limited thereto. In one embodiment, the test object 10 may be a palm, and the biological feature may be a palm print.

取像裝置100包括蓋板110、光源120、感測器130以及準直器140。感測器130配置在光源120旁。光源120與感測器130位於蓋板110的同一側。準直器140配置在蓋板110與感測器130之間,且準直器140可藉由黏著層(未繪示)或固定機構(未繪示)而固定在蓋板110與感測器130之間。The image capturing device 100 includes a cover plate 110, a light source 120, a sensor 130, and a collimator 140. The sensor 130 is disposed beside the light source 120. The light source 120 and the sensor 130 are located on the same side of the cover plate 110. The collimator 140 is disposed between the cover plate 110 and the sensor 130, and the collimator 140 can be fixed on the cover plate 110 and the sensor by an adhesive layer (not shown) or a fixing mechanism (not shown). Between 130.

蓋板110適於保護位於其下的元件,其可以是玻璃基板或塑膠基板。玻璃基板可以是經化學強化或物理強化的玻璃基板,也可以是未經強化的玻璃基板。塑膠基板可以是聚碳酸酯(polycarbonate, PC)、聚對苯二甲酸乙二酯(polyethylene terephthalate, PET)、聚甲基丙烯酸甲酯(polymethylmethacrylate, PMMA)或聚醯亞胺(polyimide, PI)等,但不以此為限。The cover plate 110 is adapted to protect the components underneath it, which may be a glass substrate or a plastic substrate. The glass substrate may be a chemically or physically strengthened glass substrate or an unreinforced glass substrate. The plastic substrate can be polycarbonate (PC), polyethylene terephthalate (PET), polymethylmethacrylate (PMMA), or polyimide (PI), etc. , But not limited to this.

蓋板110具有內表面SI以及與內表面SI相對的外表面SO。蓋板110的內表面SI為蓋板110面向感測器130的表面,而蓋板110的外表面SO為待測物10的接觸面。也就是說,待測物10碰觸蓋板110的外表面SO以進行生物特徵識別。The cover plate 110 has an inner surface SI and an outer surface SO opposite to the inner surface SI. The inner surface SI of the cover plate 110 is the surface of the cover plate 110 facing the sensor 130, and the outer surface SO of the cover plate 110 is the contact surface of the object to be measured 10. That is, the object under test 10 touches the outer surface SO of the cover plate 110 to perform biometric identification.

光源120適於提供照射待測物10的光束B。光源120可以包括多個發光元件122。各發光元件122朝向待測物10發出光束B。多個發光元件122可以包括發光二極體、雷射二極體或上述兩者的組合。此外,光束B可以包括可見光、非可見光或上述兩者的組合。非可見光可為紅外光,但不以此為限。The light source 120 is adapted to provide a light beam B that illuminates the object 10 to be measured. The light source 120 may include a plurality of light emitting elements 122. Each light emitting element 122 emits a light beam B toward the test object 10. The plurality of light emitting elements 122 may include a light emitting diode, a laser diode, or a combination of the two. In addition, the light beam B may include visible light, non-visible light, or a combination of the two. Invisible light may be infrared light, but it is not limited to this.

感測器130適於接收光束B被待測物10反射的部分(即帶有指紋圖案資訊的光束B1)。感測器130可包括電荷耦合元件(Charge Coupled Device, CCD)、互補式金屬氧化物半導體元件(Complementary Metal-Oxide Semiconductor, CMOS)或其他適當種類的影像感測元件。The sensor 130 is adapted to receive a portion of the light beam B reflected by the object 10 (ie, the light beam B1 with fingerprint pattern information). The sensor 130 may include a Charge Coupled Device (CCD), a Complementary Metal-Oxide Semiconductor (CMOS), or other appropriate types of image sensing devices.

在一實施例中,感測器130內可整合有脈寬調變電路。藉由脈寬調變電路控制多個發光元件122的發光時間與感測器130的取像時間,使多個發光元件122的發光時間與感測器130的取像時間同步,可達到精確控制的效果,但不以此為限。In one embodiment, a pulse width modulation circuit may be integrated in the sensor 130. By controlling the light emitting time of the plurality of light emitting elements 122 and the image capturing time of the sensor 130 through the pulse width modulation circuit, the light emitting time of the plurality of light emitting elements 122 and the image capturing time of the sensor 130 are synchronized, and the accuracy can be achieved The effect of control, but not limited to this.

準直器140適於將光束B被待測物10反射且朝感測器130傳遞的部分準直化。準直器140包括多個彼此重疊的準直元件。在本實施例中,準直器140包括第一準直元件142以及第二準直元件144等兩個準直元件,且第一準直元件142配置在第二準直元件144與感測器130之間。然而,準直器140中準直元件的數量及多個準直元件之間的相互配置關係可依需求改變,而不以圖1所顯示的為限。The collimator 140 is adapted to collimate a portion of the light beam B reflected by the object to be measured 10 and transmitted toward the sensor 130. The collimator 140 includes a plurality of collimating elements that overlap each other. In this embodiment, the collimator 140 includes two collimation elements such as a first collimation element 142 and a second collimation element 144, and the first collimation element 142 is disposed between the second collimation element 144 and the sensor. Between 130. However, the number of collimating elements in the collimator 140 and the mutual configuration relationship between the plurality of collimating elements may be changed according to requirements, and are not limited to those shown in FIG. 1.

多個準直元件的每一個包括透光基板以及配置在透光基板上的吸光層。舉例而言,第一準直元件142包括透光基板1421以及吸光層1422,其中吸光層1422配置在透光基板1421面向感測器130的表面S1421S上且位於透光基板1421與感測器130之間。第二準直元件144包括透光基板1441、吸光層1442以及吸光層1443,其中吸光層1442配置在透光基板1441面向感測器130的表面S1441S上且位於透光基板1441與透光基板1421之間,而吸光層1443配置在透光基板1441面向蓋板110的表面S1441C上且位於蓋板110與透光基板1441之間。Each of the plurality of collimating elements includes a light-transmitting substrate and a light-absorbing layer disposed on the light-transmitting substrate. For example, the first collimating element 142 includes a light-transmitting substrate 1421 and a light-absorbing layer 1422. The light-absorbing layer 1422 is disposed on the surface S1421S of the light-transmitting substrate 1421 facing the sensor 130 and is located on the light-transmitting substrate 1421 and the sensor 130. between. The second collimating element 144 includes a light-transmitting substrate 1441, a light-absorbing layer 1442, and a light-absorbing layer 1443. The light-absorbing layer 1442 is disposed on the surface S1441S of the light-transmitting substrate 1441 facing the sensor 130, and is located on the light-transmitting substrate 1441 and the light-transmitting substrate 1421. The light absorbing layer 1443 is disposed on the surface S1441C of the light-transmitting substrate 1441 facing the cover 110 and is located between the cover 110 and the light-transmitting substrate 1441.

應說明的是,各準直元件中的透光基板的數量、吸光層的數量、透光基板與吸光層的相對配置關係及吸光層的形成方法可以需求改變,而不以圖1所顯示的為限。透光基板1441的表面S1441S上形成有多個凹陷C,且吸光層1442配置在透光基板1441的多個凹陷C中,使得吸光層1442的外表面T1442與表面S1441S未形成有多個凹陷C的部分齊平。形成吸光層1442的方法可包括以下步驟。首先,在透光基板1441的表面S1441S上形成多個凹陷C。其次,於多個凹陷C中形成吸光材料。然後,固化吸光材料以形成吸光層1442。在一實施例中,透光基板1441及其多個凹陷C可以利用模鑄成型,而可省略形成多個凹陷C的步驟。It should be noted that the number of light-transmitting substrates in each collimating element, the number of light-absorbing layers, the relative configuration relationship between the light-transmitting substrate and the light-absorbing layer, and the method of forming the light-absorbing layer can be changed as required, and not shown in FIG. 1 Limited. A plurality of depressions C are formed on the surface S1441S of the light-transmitting substrate 1441, and the light absorption layer 1442 is disposed in the plurality of depressions C of the light-transmitting substrate 1441, so that the outer surface T1442 and the surface S1441S of the light-absorbing layer 1442 are not formed with a plurality of depressions C. The parts are flush. The method of forming the light absorbing layer 1442 may include the following steps. First, a plurality of depressions C are formed on the surface S1441S of the light-transmitting substrate 1441. Next, a light absorbing material is formed in the plurality of depressions C. Then, the light absorbing material is cured to form a light absorbing layer 1442. In an embodiment, the light-transmitting substrate 1441 and the plurality of recesses C thereof may be formed by die casting, and the step of forming the plurality of recesses C may be omitted.

在各準直元件中,透光基板(如透光基板1421及透光基板1441)提供吸光層(如吸光層1422、吸光層1442以及吸光層1443)的承載面,其可以是玻璃基板或塑膠基板。吸光層用以吸收光束B被待測物10反射的部分中的大角度光束(如光束B2及光束B3),以達到將傳遞至感測器130的光束準直化的效果。吸光層具有高吸收率以及低反射率,以降低傳遞至吸光層的光束被吸光層反射的比例以及光束被吸光層反射的次數,進而有效降低大角度光束被感測器130接收到的比例。所述低反射率是指反射率在可見光波段及紅外光波段低於10%。舉例而言,吸光層可以是低反射率的油墨,但不以此為限。Among the collimating elements, the light-transmitting substrate (such as the light-transmitting substrate 1421 and the light-transmitting substrate 1441) provides a bearing surface of the light-absorbing layer (such as the light-absorbing layer 1422, the light-absorbing layer 1442, and the light-absorbing layer 1443), which can be a glass substrate or a plastic Substrate. The light absorbing layer is used to absorb the large-angle light beams (such as the light beams B2 and B3) in the part of the light beam B reflected by the object to be measured 10, so as to achieve the effect of collimating the light beams transmitted to the sensor 130. The light absorbing layer has high absorptivity and low reflectivity to reduce the ratio of the light beam transmitted to the light absorbing layer to be reflected by the light absorbing layer and the number of times the light beam is reflected by the light absorbing layer, thereby effectively reducing the ratio of the large angle light beam received by the sensor 130. The low reflectance means that the reflectance is lower than 10% in the visible light band and the infrared light band. For example, the light-absorbing layer may be a low reflectivity ink, but is not limited thereto.

此外,為了使光束B被待測物10反射的部分(如光束B1)能夠被感測器130接收,吸光層包括多個透光開口O。多個透光開口O暴露出感測器130的多個感測區132。具體地,吸光層1422、吸光層1442以及吸光層1443的多個透光開口O對應感測器130的多個感測區132設置。此處,多個感測區132可以是多個電荷耦合元件的所在位置或是互補式金屬氧化物半導體元件的多個像素區。In addition, in order that the portion of the light beam B reflected by the object to be measured 10 (such as the light beam B1) can be received by the sensor 130, the light absorption layer includes a plurality of light-transmitting openings O. The plurality of light-transmitting openings O expose the plurality of sensing regions 132 of the sensor 130. Specifically, the plurality of light-transmitting openings O of the light-absorbing layer 1422, the light-absorbing layer 1442, and the light-absorbing layer 1443 are disposed corresponding to the plurality of sensing regions 132 of the sensor 130. Here, the plurality of sensing regions 132 may be positions of a plurality of charge-coupled devices or a plurality of pixel regions of a complementary metal oxide semiconductor device.

多個透光開口O的間距為S。多個透光開口O的每一個的寬度為W,且W<S。第一準直元件142的透光基板厚度為T1。第二準直元件144的透光基板厚度為T2。取像裝置100滿足:。此處,準直元件的透光基板厚度是指該準直元件中所有的透光基板的厚度總合。在本實施例中,第一準直元件142僅包括一個透光基板(即透光基板1421),且第二準直元件144僅包括一個透光基板(即透光基板1441)。因此,第一準直元件142的透光基板厚度T1即透光基板1421的厚度,而第二準直元件144的透光基板厚度T2即透光基板1441的厚度。The distance between the plurality of transparent openings O is S. The width of each of the plurality of light-transmitting openings O is W, and W <S. The thickness of the transparent substrate of the first collimating element 142 is T1. The thickness of the transparent substrate of the second collimating element 144 is T2. The image capturing device 100 satisfies: . Here, the thickness of the light-transmitting substrate of the collimating element refers to the total thickness of all light-transmitting substrates in the collimating element. In this embodiment, the first collimating element 142 includes only one transparent substrate (ie, the transparent substrate 1421), and the second collimating element 144 includes only one transparent substrate (ie, the transparent substrate 1441). Therefore, the thickness T1 of the transparent substrate of the first collimating element 142 is the thickness of the transparent substrate 1421, and the thickness T2 of the transparent substrate of the second collimating element 144 is the thickness of the transparent substrate 1441.

藉由的設計,可使大角度的光束(如光束B2及光束B3)在多個準直元件之間經由多次反射而被吸光層吸收,進而有效改善串擾問題,使取像裝置100具有良好的辨識能力。在一實施例中,取像裝置100若滿足的設計,可進一步降低大角度光束被感測器130接收的比例,使訊噪比有效提升,而有助於後端辨識訊號與雜訊,進而提升辨識的成功率。在又一實施例中,取像裝置100若滿足,訊噪比可趨近於0。By The design can make large-angle beams (such as beams B2 and B3) be absorbed by the light-absorbing layer through multiple reflections between multiple collimating elements, thereby effectively improving the crosstalk problem and making the imaging device 100 have good identification. ability. In one embodiment, if the image capturing device 100 satisfies The design can further reduce the ratio of the large-angle beam received by the sensor 130, effectively improve the signal-to-noise ratio, and help the back-end identify signals and noise, thereby improving the success rate of identification. In another embodiment, if the image capturing device 100 satisfies , The signal-to-noise ratio can approach 0.

接著搭配圖3至圖5說明取像裝置的其他實施型態,其中相同的元件以相同的標號表示,於下便不再重述。圖3至圖5分別是依照本發明的第二實施例至第四實施例的取像裝置的剖面示意圖。Next, other embodiments of the image capturing device will be described with reference to FIGS. 3 to 5. The same components are denoted by the same reference numerals, and will not be described again below. 3 to 5 are schematic cross-sectional views of an image capturing device according to the second embodiment to the fourth embodiment of the present invention, respectively.

請參照圖3,本發明的第二實施例的取像裝置200與圖1的取像裝置100的主要差異如下所述。在取像裝置200中,第二準直元件144配置在第一準直元件142與感測器130之間。進一步而言,第一準直元件142的吸光層1422配置在透光基板1421面向蓋板110的表面S1421C上且位於透光基板1421與蓋板110之間。第二準直元件144的吸光層1442配置在透光基板1441面向蓋板110的表面S1441C上且位於透光基板1441與透光基板1421之間。第二準直元件144的吸光層1443配置在透光基板1441面向感測器130的表面S1441S上且位於感測器130與透光基板1441之間。透光基板1441的表面S1441C上形成有多個凹陷C,且吸光層1442配置在透光基板1441的多個凹陷C中,使得吸光層1442的外表面T1442與表面S1441C未形成有多個凹陷C的部分齊平。Referring to FIG. 3, the main differences between the image capturing device 200 of the second embodiment of the present invention and the image capturing device 100 of FIG. 1 are as follows. In the image capturing device 200, the second collimating element 144 is disposed between the first collimating element 142 and the sensor 130. Further, the light absorbing layer 1422 of the first collimation element 142 is disposed on a surface S1421C of the transparent substrate 1421 facing the cover plate 110 and is located between the transparent substrate 1421 and the cover plate 110. The light absorbing layer 1442 of the second collimating element 144 is disposed on a surface S1441C of the transparent substrate 1441 facing the cover plate 110 and is located between the transparent substrate 1441 and the transparent substrate 1421. The light absorbing layer 1443 of the second collimating element 144 is disposed on a surface S1441S of the transparent substrate 1441 facing the sensor 130 and is located between the sensor 130 and the transparent substrate 1441. A plurality of depressions C are formed on the surface S1441C of the light-transmitting substrate 1441, and the light absorption layer 1442 is disposed in the plurality of depressions C of the light-transmitting substrate 1441, so that the outer surface T1442 and the surface S1441C of the light-absorbing layer 1442 are not formed with a plurality of depressions C. The parts are flush.

請參照圖4,本發明的第三實施例的取像裝置300與圖1的取像裝置100的主要差異如下所述。在取像裝置300中,除了透光基板1441、吸光層1442以及吸光層1443之外,第二準直元件144還包括透光基板1444以及吸光層1445。在本實施例中,透光基板1444位於透光基板1441與蓋板110之間,吸光層1443位於透光基板1441與透光基板1444之間,且吸光層1443與吸光層1445分別位於透光基板1444的兩相對表面上。透光基板1444面向感測器130的表面S1444S上形成有多個凹陷C,且吸光層1443配置在透光基板1444的多個凹陷C中,使得吸光層1443的外表面T1443與表面S1444S未形成有多個凹陷C的部分齊平。Please refer to FIG. 4. The main differences between the image capturing device 300 according to the third embodiment of the present invention and the image capturing device 100 of FIG. 1 are as follows. In the image capturing device 300, in addition to the light-transmitting substrate 1441, the light-absorbing layer 1442, and the light-absorbing layer 1443, the second collimating element 144 further includes a light-transmitting substrate 1444 and a light-absorbing layer 1445. In this embodiment, the light-transmitting substrate 1444 is located between the light-transmitting substrate 1441 and the cover plate 110, the light-absorbing layer 1443 is located between the light-transmitting substrate 1441 and the light-transmitting substrate 1444, and the light-absorbing layer 1443 and the light-absorbing layer 1445 are respectively located in light-transmitting The substrate 1444 is on two opposite surfaces. A plurality of depressions C are formed on the surface S1444S of the light-transmitting substrate 1444 facing the sensor 130, and the light-absorbing layer 1443 is disposed in the plurality of depressions C of the light-transmitting substrate 1444, so that the outer surface T1443 and the surface S1444S of the light-absorbing layer 1443 are not formed. The portion having the plurality of depressions C is flush.

透光基板1441的厚度T2A以及透光基板1444的厚度T2B小於T1,且厚度T2A與厚度T2B的總和為T2。也就是,T2A+T2B=T2。此外,厚度T2A與厚度T2B可相同或不同。在另一實施例中,第二準直元件144可包括兩層以上的透光基板以及三層以上的吸光層。同理,第一準直元件142可包括一層以上的透光基板以及兩層以上的吸光層,且第一準直元件142的透光基板厚度T1為所述一層以上的透光基板的厚度總和。The thickness T2A of the transparent substrate 1441 and the thickness T2B of the transparent substrate 1444 are smaller than T1, and the sum of the thickness T2A and the thickness T2B is T2. That is, T2A + T2B = T2. In addition, the thickness T2A and the thickness T2B may be the same or different. In another embodiment, the second collimating element 144 may include two or more transparent substrates and three or more light absorbing layers. Similarly, the first collimating element 142 may include one or more light-transmitting substrates and two or more light-absorbing layers, and the thickness T1 of the light-transmitting substrate of the first collimating element 142 is the sum of the thicknesses of the light-transmitting substrates of one or more layers .

補充說明的是,圖3的取像裝置200的第二準直元件144也可同此實施例改良,於此便不再重述。It is added that the second collimating element 144 of the image capturing device 200 in FIG. 3 can also be improved with this embodiment, and will not be repeated here.

請參照圖5,本發明的第四實施例的取像裝置400與圖1的取像裝置100的主要差異如下所述。在取像裝置400中,取像裝置400進一步包括顯示面板410以及帶通濾光層420。顯示面板410配置在蓋板110與準直器140之間,其適於提供影像畫面。舉例而言,顯示面板410可以是薄膜電晶體液晶顯示面板(Thin Film Transistor Liquid Crystal Display panel, TFT-LCD panel)、微型發光二極體顯示面板(Micro Light Emitting Diode display panel, Micro LED display panel)或有機發光二極體顯示面板(Organic Light Emitting Diode display panel, OLED display panel),但不以此為限。Referring to FIG. 5, the main differences between the image capturing device 400 of the fourth embodiment of the present invention and the image capturing device 100 of FIG. 1 are as follows. In the image capturing device 400, the image capturing device 400 further includes a display panel 410 and a band-pass filter layer 420. The display panel 410 is disposed between the cover plate 110 and the collimator 140 and is adapted to provide an image frame. For example, the display panel 410 may be a Thin Film Transistor Liquid Crystal Display panel (TFT-LCD panel), a Micro Light Emitting Diode display panel, or a Micro LED display panel. Or organic light emitting diode display panel (Organic Light Emitting Diode display panel, OLED display panel), but not limited to this.

帶通濾光層420配置在準直器140與感測器130之間(未繪示)或顯示面板410與準直器140之間,其用以讓來自光源120的光束通過且過濾其他光束,以避免環境光束或來自顯示面板410的光束傳遞至感測器130所造成的干擾,進而提升電子裝置400的辨識能力。舉例而言,帶通濾光層420可為紅外帶通濾光層,其讓波長為800 nm至900 nm的光束通過,且過濾波長為800 nm至900 nm以外的光束。對應地,光源120選用波長落在800 nm至900 nm的範圍內的紅外光源。在其他實施例中,帶通濾光層420可選用讓波長為840 nm至860 nm的光束或波長為890 nm至990 nm的光束通過的帶通濾光層,且光源120選用波長落在840 nm至860 nm或890nm至990nm的範圍內的紅外光源,但本發明並不限於此。The band-pass filter layer 420 is disposed between the collimator 140 and the sensor 130 (not shown) or between the display panel 410 and the collimator 140, and is used to pass the light beam from the light source 120 and filter other light beams. In order to avoid the interference caused by the ambient light beam or the light beam from the display panel 410 being transmitted to the sensor 130, the identification ability of the electronic device 400 is further improved. For example, the bandpass filter layer 420 may be an infrared bandpass filter layer, which allows a light beam with a wavelength of 800 nm to 900 nm to pass, and filters a light beam with a wavelength other than 800 nm to 900 nm. Correspondingly, the light source 120 is an infrared light source with a wavelength in the range of 800 nm to 900 nm. In other embodiments, the bandpass filter layer 420 may be a bandpass filter layer that allows a light beam with a wavelength of 840 nm to 860 nm or a light beam with a wavelength of 890 nm to 990 nm to pass, and the light source 120 is selected to have a wavelength of 840. An infrared light source in a range of nm to 860 nm or 890 nm to 990 nm, but the present invention is not limited thereto.

補充說明的是,圖3的取像裝置200及圖4的取像裝置300也可進一步包括顯示面板410與帶通濾光層420,於此便不再重述。It is added that the image capturing device 200 in FIG. 3 and the image capturing device 300 in FIG. 4 may further include a display panel 410 and a band-pass filter layer 420, which will not be repeated here.

在上述實施例中,多個準直元件之間可經由黏著層(未繪示)或固定機構(未繪示)而固定在一起。舉例而言,可在多個準直元件的多個透光基板之間形成黏著層,使多個準直元件牢固地固定在一起,但不以此為限。黏著層可以是光學膠粘劑(Optical Clear Adhesive, OCA)或芯片附著薄膜(Die Attach Film, DAF),但不以此為限。In the above embodiment, a plurality of collimating elements may be fixed together through an adhesive layer (not shown) or a fixing mechanism (not shown). For example, an adhesive layer may be formed between a plurality of transparent substrates of a plurality of collimating elements, so that the plurality of collimating elements are firmly fixed together, but not limited thereto. The adhesive layer may be an optical clear adhesive (OCA) or a die attach film (DAF), but is not limited thereto.

綜上所述,在本發明實施例的取像裝置中,的設計可使大角度的光束在多個準直元件之間經由多次反射而被吸光層吸收,進而有效改善串擾問題,使取像裝置具有良好的辨識能力。在一實施例中,取像裝置可進一步包括顯示面板以兼具生物特徵辨識及顯示的功能。在又一實施例中,取像裝置的光源可為紅外光源,且取像裝置還可包括紅外帶通濾光層,以避免環境光束或來自顯示面板的光束傳遞至感測器所造成的干擾,進而提升電子裝置的辨識能力。In summary, in the image pickup device according to the embodiment of the present invention, The design allows large-angle beams to be absorbed by the light absorbing layer through multiple reflections between multiple collimating elements, thereby effectively improving the problem of crosstalk and enabling the image pickup device to have a good discrimination ability. In one embodiment, the image capturing device may further include a display panel to have functions of biometric identification and display. In another embodiment, the light source of the image capturing device may be an infrared light source, and the image capturing device may further include an infrared bandpass filter layer to avoid interference caused by the ambient light beam or the light beam from the display panel transmitted to the sensor. , Thereby improving the recognition ability of the electronic device.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed as above with the examples, it is not intended to limit the present invention. Any person with ordinary knowledge in the technical field can make some modifications and retouching without departing from the spirit and scope of the present invention. The protection scope of the present invention shall be determined by the scope of the attached patent application.

10‧‧‧待測物10‧‧‧ DUT

100、200‧‧‧取像裝置100, 200‧‧‧ image taking device

300、400‧‧‧取像裝置300, 400‧‧‧ image taking device

110‧‧‧蓋板110‧‧‧ cover

120‧‧‧光源120‧‧‧ light source

122‧‧‧發光元件122‧‧‧Light-emitting element

130‧‧‧感測器130‧‧‧Sensor

132‧‧‧感測區132‧‧‧Sensing area

140‧‧‧準直器140‧‧‧Collimator

142‧‧‧第一準直元件142‧‧‧First collimation element

144‧‧‧第二準直元件144‧‧‧Second collimation element

410‧‧‧顯示面板410‧‧‧Display Panel

420‧‧‧帶通濾光層420‧‧‧ Bandpass Filter

1421、1441、1444‧‧‧透光基板1421, 1441, 1444‧‧‧‧Transparent substrate

1422、1442‧‧‧吸光層1422, 1442‧‧‧ light absorption layer

1443、1445‧‧‧吸光層1443, 1445‧‧‧Light absorption layer

B、B1、B2、B3‧‧‧光束B, B1, B2, B3‧‧‧ Beams

C‧‧‧凹陷C‧‧‧ Depression

O‧‧‧透光開口O‧‧‧Translucent opening

S‧‧‧間距S‧‧‧Pitch

SI‧‧‧內表面SI‧‧‧Inner surface

SO、T1442、T1443‧‧‧外表面SO, T1442, T1443‧‧‧ Outer surface

S1421S、S1421C‧‧‧表面S1421S, S1421C‧‧‧Surface

S1441S、S1441C、S1444S‧‧‧表面S1441S, S1441C, S1444S‧‧‧Surface

T1、T2‧‧‧透光基板厚度T1, T2‧‧‧‧Transparent substrate thickness

T2A、T2B‧‧‧厚度T2A, T2B‧‧‧thickness

W‧‧‧寬度W‧‧‧Width

圖1是依照本發明的第一實施例的取像裝置的剖面示意圖。 圖2是圖1中的準直器的俯視示意圖。 圖3至圖5分別是依照本發明的第二實施例至第四實施例的取像裝置的剖面示意圖。FIG. 1 is a schematic cross-sectional view of an image capturing apparatus according to a first embodiment of the present invention. FIG. 2 is a schematic top view of the collimator in FIG. 1. 3 to 5 are schematic cross-sectional views of an image capturing device according to the second embodiment to the fourth embodiment of the present invention, respectively.

Claims (11)

一種取像裝置,包括: 一蓋板; 一光源; 一感測器,配置在該光源旁,且該光源與該感測器位於該蓋板的同一側;以及 一準直器,配置在該蓋板與該感測器之間,且該準直器包括多個彼此重疊的準直元件,其中該些準直元件的每一個包括一透光基板以及配置在該透光基板上的一吸光層,且該吸光層包括多個透光開口,該些透光開口暴露出該感測器的多個感測區,該些透光開口的間距為S,該些透光開口的每一個的寬度為W,且W<S,該些準直元件中的一第一準直元件的透光基板厚度為T1,該些準直元件中的一第二準直元件的透光基板厚度為T2,且該取像裝置滿足:An image capturing device includes: a cover plate; a light source; a sensor disposed next to the light source, and the light source and the sensor are located on the same side of the cover plate; and a collimator disposed on the Between the cover plate and the sensor, and the collimator includes a plurality of collimating elements overlapping each other, wherein each of the collimating elements includes a light-transmitting substrate and a light-absorbing member disposed on the light-transmitting substrate Layer, and the light absorbing layer includes a plurality of light-transmitting openings, the light-transmitting openings expose a plurality of sensing regions of the sensor, and a distance between the light-transmitting openings is S, and The width is W, and W <S. The thickness of the light-transmitting substrate of a first collimating element among the collimating elements is T1, and the thickness of the light-transmitting substrate of a second collimating element among the collimating elements is T2. , And the imaging device meets: . 如申請專利範圍第1項所述的取像裝置,其中該透光基板的一表面上形成有多個凹陷,且該吸光層配置在該透光基板的該些凹陷中。The image capturing device according to item 1 of the scope of patent application, wherein a plurality of depressions are formed on one surface of the light-transmitting substrate, and the light-absorbing layer is disposed in the depressions of the light-transmitting substrate. 如申請專利範圍第1項所述的取像裝置,其中該取像裝置滿足:The imaging device according to item 1 of the scope of patent application, wherein the imaging device satisfies: . 如申請專利範圍第1項所述的取像裝置,其中該取像裝置滿足:The imaging device according to item 1 of the scope of patent application, wherein the imaging device satisfies: . 如申請專利範圍第1項所述的取像裝置,其中該第一準直元件配置在該第二準直元件與該感測器之間。The image capturing device according to item 1 of the scope of patent application, wherein the first collimating element is disposed between the second collimating element and the sensor. 如申請專利範圍第1項所述的取像裝置,其中該第二準直元件配置在該第一準直元件與該感測器之間。The image capturing device according to item 1 of the scope of patent application, wherein the second collimating element is disposed between the first collimating element and the sensor. 如申請專利範圍第1項所述的取像裝置,其中該第二準直元件包括彼此重疊的n個透光基板,所述n個透光基板的厚度小於T1,且該些n個透光基板的厚度總和為T2。The image capturing device according to item 1 of the patent application scope, wherein the second collimating element includes n light-transmitting substrates overlapping each other, the thickness of the n light-transmitting substrates is less than T1, and the n light-transmitting The total thickness of the substrate is T2. 如申請專利範圍第1、3或4項所述的取像裝置,更包括: 一顯示面板,配置在該蓋板與該準直器之間。The image capturing device according to item 1, 3, or 4 of the scope of patent application, further includes: a display panel disposed between the cover plate and the collimator. 如申請專利範圍第8項所述的取像裝置,更包括: 一帶通濾光層,配置在該顯示面板與該感測器之間,其中該光源的發光頻譜落在該帶通濾光層的穿透頻譜內。The image capturing device according to item 8 of the scope of patent application, further comprising: a band-pass filter layer disposed between the display panel and the sensor, wherein the emission spectrum of the light source falls on the band-pass filter layer Within the transmission spectrum. 如申請專利範圍第8項所述的取像裝置,其中該顯示面板為一有機發光二極體顯示面板。The image capturing device according to item 8 of the scope of patent application, wherein the display panel is an organic light emitting diode display panel. 如申請專利範圍第7項所述的取像裝置,更包括: 一黏著層,配置在該些透光基板之間。The image capturing device according to item 7 of the patent application scope further includes: an adhesive layer disposed between the transparent substrates.
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