TW201908064A - Device for grinding, polishing and/or cutting device an article - Google Patents

Device for grinding, polishing and/or cutting device an article Download PDF

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TW201908064A
TW201908064A TW106124018A TW106124018A TW201908064A TW 201908064 A TW201908064 A TW 201908064A TW 106124018 A TW106124018 A TW 106124018A TW 106124018 A TW106124018 A TW 106124018A TW 201908064 A TW201908064 A TW 201908064A
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abrasive particles
circular substrate
disposed
circular
abrasive
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TW106124018A
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Chinese (zh)
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黃聖凱
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黃聖凱
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Abstract

A device for grinding, polishing and/or cutting an article comprising: a circular substrate; and a plurality of grinding particles disposed on a surface of the circular substrate, wherein a portion of each of the grinding particles protrude from the surface of the circular substrate; wherein the plurality of the grinding particles may be disposed on the surface of the circular substrate in a different arrangement as desired.

Description

用於研磨、拋光及/或切割物件之裝置Device for grinding, polishing and/or cutting articles

本揭露係關於可用於研磨、拋光及/或切割物件之裝置。具體而言,本揭露係關於用於研磨、拋光及/或切割物件之裝置之研磨顆粒之特定排列變化。The present disclosure relates to devices that can be used to grind, polish, and/or cut articles. In particular, the present disclosure relates to specific alignment variations of abrasive particles for devices for grinding, polishing, and/or cutting articles.

習知的研磨或切割作業中,針對不同材質的物件或不同的加工條件,作業員必須選擇不同粗粒度的砂輪或鋸片(其中,相較於單個表面的砂輪,鋸片通常包含具有研磨顆粒的兩個表面)。此時,砂輪/鋸片的選擇是一個非常重要的課題。例如,若要達成較高的研磨效率,則要選擇具有粗粒度的砂輪;若要達成精密研磨和較細的物件表面,則要選擇具有細粒度的砂輪。又,若物件的接觸面積較小,則要選擇具有細粒度的砂輪;若物件的接觸面積較大,則要選擇具有粗粒度的砂輪。換句話說,根據不同的物件性質、加工目的和加工條件等,就必須要選擇且替換不同的砂輪來進行加工。 然而,選擇及替換的過程不僅耗費時間,尋找合適的砂輪/鋸片更是難上加難。因此,習知的砂輪/鋸片至少具有以下缺點:(1)效果不好;(2)無法根據不同物件之條件作變化;(3)沒有規則性的研磨顆粒的配置。因此,習知之砂輪/鋸片對於研磨效果及研磨時間形成嚴重的限制。In conventional grinding or cutting operations, the operator must select different coarse-grained grinding wheels or saw blades for different materials or different processing conditions (wherein the saw blade usually contains abrasive particles compared to a single surface grinding wheel). The two surfaces). At this point, the choice of grinding wheel / saw blade is a very important topic. For example, to achieve higher grinding efficiency, choose a grinding wheel with a coarse grain size; to achieve precision grinding and a finer surface of the object, choose a grinding wheel with a fine grain size. Moreover, if the contact area of the object is small, a grinding wheel having a fine particle size is selected; if the contact area of the object is large, a grinding wheel having a coarse grain size is selected. In other words, depending on the nature of the object, the purpose of the processing, the processing conditions, etc., it is necessary to select and replace different grinding wheels for processing. However, the process of selection and replacement is not only time consuming, but finding the right wheel/saw blade is even more difficult. Therefore, the conventional grinding wheel/saw blade has at least the following disadvantages: (1) the effect is not good; (2) it cannot be changed according to the conditions of different objects; (3) there is no regular arrangement of abrasive particles. Therefore, the conventional grinding wheel/saw blade has a severe limitation on the grinding effect and the grinding time.

基於上述習知技術的問題,實有必要提供產業界一種經改良的用於研磨、拋光及/或切割物件之裝置,以達成多變化且有效率的研磨、拋光及/或切割作業。 本揭露之一種實施方式提供一種用於研磨、拋光及/或切割一物件之裝置,其包含:一圓形基板;及複數個研磨顆粒,其設置在該圓形基板之一表面上,其中各個研磨顆粒之部分係突出於該圓形基板之該表面;其中該複數個研磨顆粒可依需要而以不同之排列方式被設置於該圓形基板之該表面上。 在本揭露之一實施方式中,該圓形基板具有一圓心,而該複數個研磨顆粒可自該圓心沿徑向方向排列。 在本揭露之一實施方式中,該複數個研磨顆粒可以該圓心為中心,呈同心圓之方式形成複數個圓形之排列。 在本揭露之一實施方式中,該複數個研磨顆粒可圍繞該圓心形成複數個四邊形之排列。 在本揭露之一實施方式中,該複數個研磨顆粒可圍繞該圓心形成複數個六邊形之排列。 在本揭露之一實施方式中,該複數個研磨顆粒可圍繞該圓心形成複數個多邊形之排列。 在本揭露之一實施方式中,該複數個研磨顆粒可呈直線排列。 在本揭露之一實施方式中,該複數個研磨顆粒可沿該圓形基板之一周緣連續地呈一排或一排以上之排列。 在本揭露之一實施方式中,該複數個研磨顆粒可沿該圓形基板之一周緣不連續地呈一排或一排以上之排列。 在本揭露之一實施方式中,該複數個研磨顆粒可沿該圓形基板之一周緣呈一排或一排以上之排列,且可呈直線排列。 在本揭露之一實施方式中,該圓形基板之該表面可被規則地或不規則地區分為多個區域,且其中該各區域中之該複數個研磨顆粒之排列方式不同。 在本揭露之一實施方式中,該複數個研磨顆粒以相同間距設置在該圓形基板上。 在本揭露之一實施方式中,該複數個研磨顆粒以不同間距設置在該圓形基板上。 在本揭露之一實施方式中,該複數個研磨顆粒之一部分規則地以不同間距設置在該圓形基板上。 在本揭露之一實施方式中,該複數個研磨顆粒突出於該圓形基板之該表面之該部分之高度相同。 在本揭露之一實施方式中,該複數個研磨顆粒突出於該圓形基板之該表面之該部分之高度不同。 在本揭露之一實施方式中,該複數個研磨顆粒突出於該圓形基板之該表面之該部分規則地呈現不同高度。 在本揭露之一實施方式中,該複數個研磨顆粒包含尖狀研磨顆粒、線狀研磨顆粒及面狀研磨顆粒,其中該尖狀研磨顆粒係為該研磨顆粒之突出於該圓形基板之該表面之該部分經構形以使其與欲被研磨之該物件呈點接觸,其中該線狀研磨顆粒係為該研磨顆粒之突出於該圓形基板之該表面之該部分經構形以使其與欲被研磨之該物件呈線接觸,其中該面狀研磨顆粒係為該研磨顆粒之突出於該圓形基板之該表面之該部分經構形以使其與欲被研磨之該物件呈面接觸。 在本揭露之一實施方式中,該等尖狀研磨顆粒、線狀研磨顆粒及面狀研磨顆粒之彼此間之數目之比例可依需要而被調整。 在本揭露之一實施方式中,該等尖狀研磨顆粒、線狀研磨顆粒及面狀研磨顆粒可分別以不同之排列方式被設置於該圓形基板之該表面上。 在本揭露之一實施方式中,該等線狀研磨顆粒可經構形以使其與欲被研磨之該物件具有不同之方向之線接觸。 在本揭露之一實施方式中,該圓形基板之該表面可被規則地或不規則地區分為多個區域,且其中各區域中之該等尖狀研磨顆粒、線狀研磨顆粒及面狀研磨顆粒之彼此間之數目之比例不同。 在本揭露之一實施方式中,該複數個研磨顆粒之材料包含氧化鋁、碳化矽、陶瓷、金剛石及立方氮化硼,該複數個研磨顆粒之形狀、大小、比例及材料可依需要而被調整。 在本揭露之一實施方式中,該複數個研磨顆粒藉由一填料以層疊方式設置。 在本揭露之一實施方式中,該用於研磨、拋光及/或切割一物件之裝置進一步包含另一組複數個研磨顆粒,其設置在該圓形基板之另一表面上,其中該另一組複數個研磨顆粒之每一者之部分係突出於該圓形基板之該另一表面;其中該另一組複數個研磨顆粒可依需要而以不同之排列方式被設置於該圓形基板之該另一表面上。 藉由上述設置,本揭露之裝置得以提供多變化且有效率的研磨、拋光及/或切割作業。Based on the above-mentioned problems of the prior art, it is necessary to provide an improved apparatus for grinding, polishing and/or cutting articles in the industry to achieve a multi-variable and efficient grinding, polishing and/or cutting operation. An embodiment of the present disclosure provides an apparatus for grinding, polishing, and/or cutting an object, comprising: a circular substrate; and a plurality of abrasive particles disposed on a surface of the circular substrate, wherein each A portion of the abrasive particles protrudes from the surface of the circular substrate; wherein the plurality of abrasive particles are disposed on the surface of the circular substrate in a different arrangement as needed. In an embodiment of the present disclosure, the circular substrate has a center, and the plurality of abrasive particles may be aligned from the center of the circle in a radial direction. In an embodiment of the present disclosure, the plurality of abrasive particles may form a plurality of circular arrangements in a concentric manner centering on the center of the circle. In an embodiment of the present disclosure, the plurality of abrasive particles may form an arrangement of a plurality of quadrangles around the center of the circle. In one embodiment of the present disclosure, the plurality of abrasive particles can form a plurality of hexagonal arrangements around the center of the circle. In an embodiment of the present disclosure, the plurality of abrasive particles may form an arrangement of a plurality of polygons around the center of the circle. In an embodiment of the present disclosure, the plurality of abrasive particles may be arranged in a straight line. In an embodiment of the present disclosure, the plurality of abrasive particles may be continuously arranged in a row or more along a circumference of one of the circular substrates. In one embodiment of the present disclosure, the plurality of abrasive particles may be arranged discontinuously in one row or more along a circumference of one of the circular substrates. In one embodiment of the present disclosure, the plurality of abrasive particles may be arranged in a row or more along a circumference of one of the circular substrates, and may be arranged in a line. In an embodiment of the present disclosure, the surface of the circular substrate may be divided into a plurality of regions by regular or irregular regions, and wherein the plurality of abrasive particles in the regions are arranged differently. In an embodiment of the present disclosure, the plurality of abrasive particles are disposed on the circular substrate at the same pitch. In an embodiment of the present disclosure, the plurality of abrasive particles are disposed on the circular substrate at different intervals. In one embodiment of the present disclosure, one of the plurality of abrasive particles is regularly disposed on the circular substrate at different intervals. In an embodiment of the present disclosure, the plurality of abrasive particles protrude from the same portion of the surface of the circular substrate to have the same height. In an embodiment of the present disclosure, the plurality of abrasive particles protrude from a height of the portion of the surface of the circular substrate. In an embodiment of the present disclosure, the portion of the plurality of abrasive particles protruding from the surface of the circular substrate regularly presents different heights. In an embodiment of the present disclosure, the plurality of abrasive particles comprise sharp abrasive particles, linear abrasive particles, and planar abrasive particles, wherein the sharp abrasive particles are the abrasive particles protruding from the circular substrate. The portion of the surface is configured to be in point contact with the article to be abraded, wherein the linear abrasive particles are configured such that the portion of the abrasive particle that protrudes from the surface of the circular substrate is configured such that And contacting the object to be ground in line, wherein the planar abrasive particle is such that the portion of the abrasive particle protruding from the surface of the circular substrate is configured to be in contact with the object to be ground Face contact. In one embodiment of the present disclosure, the ratio of the number of the pointed abrasive particles, the linear abrasive particles, and the planar abrasive particles to each other can be adjusted as needed. In one embodiment of the present disclosure, the pointed abrasive particles, the linear abrasive particles, and the planar abrasive particles may be disposed on the surface of the circular substrate in different arrangements. In one embodiment of the present disclosure, the linear abrasive particles can be configured to be in line contact with the article to be abraded in a different direction. In an embodiment of the present disclosure, the surface of the circular substrate may be divided into a plurality of regions by regular or irregular regions, and the pointed abrasive particles, the linear abrasive particles and the planar shape in each region The ratio of the number of abrasive particles to each other is different. In an embodiment of the present disclosure, the material of the plurality of abrasive particles comprises alumina, tantalum carbide, ceramic, diamond, and cubic boron nitride, and the shape, size, proportion, and material of the plurality of abrasive particles may be Adjustment. In one embodiment of the present disclosure, the plurality of abrasive particles are disposed in a stacked manner by a filler. In one embodiment of the present disclosure, the apparatus for grinding, polishing, and/or cutting an object further includes another set of plurality of abrasive particles disposed on the other surface of the circular substrate, wherein the other And constituting each of the plurality of abrasive particles to protrude from the other surface of the circular substrate; wherein the other plurality of abrasive particles may be disposed on the circular substrate in different arrangements as needed On the other surface. With the above arrangement, the apparatus of the present disclosure provides a variety of varied and efficient grinding, polishing and/or cutting operations.

下文將參照圖式詳細描述本揭露之實施方式,其包含多種實施例。應注意的是,本案實施方式之內容僅用於例示本揭露的一種具體態樣,並非限制本案所請揭露之範圍。 圖1展示本揭露第一實施例之俯視圖。第一實施例為一種用於研磨一物件(例如玻璃、鑽石、藍寶石、石材、建築物、晶圓等;圖式未顯示)之裝置1(如砂輪),其可與習知之固定式的電動砂輪機或手持的電動砂輪機協同使用。裝置1包含一圓形基板10(在另一實施例中,基板亦可為任意形狀)及複數個研磨顆粒12。研磨顆粒12可藉由黏合劑、鑲嵌、電鍍、燒結或任何固定的方式設置在圓形基板10之表面102上。研磨顆粒12之一部分係突出於圓形基板10之表面102以用來與物件進行研磨、切割、拋光或鑽孔等作業,而研磨顆粒12之另一部分是以黏合、鑲嵌、電鍍或燒結等方式固定在圓形基板10上。在另一實施例中,研磨顆粒12之整體是突出且固定在圓形基板10上(即未嵌入圓形基板10中)。 圓形基板10具有一圓心C,研磨顆粒12可自圓心C沿徑向方向D排列,較佳地,研磨顆粒12是根據不同物件的條件(例如硬度、組織、種類、形狀和尺寸)而以不同配置方式設置於圓形基板10之表面102上。本揭露之重點之一在於研磨顆粒12之配置(接觸面積、排列方式及比例)之「多樣變化」,如下詳述。 接觸面積﹞ 請同時參考圖1及圖2,其中圖2係為說明設置於圓形基板10之表面102上的研磨顆粒12可經構形成為尖狀研磨顆粒121、線狀研磨顆粒123或面狀研磨顆粒125。 所謂尖狀研磨顆粒121係指設置於圓形基板10之研磨顆粒12其突出於圓形基板10之表面102之部分經構形以可與欲被研磨之物件呈點接觸,其中,上述突出於圓形基板10之表面102之部分可為圓錐形、角錐形或任何與物件呈點接觸之任何形狀。進一步而言,無論可經構形成為尖狀研磨顆粒121之研磨顆粒12之本身為何種形狀,其僅須經設置將其突出於圓形基板10之表面102之部分可與欲被研磨之物件呈點接觸,即為尖狀研磨顆粒121。由於尖狀研磨顆粒121與物件接觸的面積較小,因此可達到較精細且小範圍的研磨功效。 所謂線狀研磨顆粒123係指設置於圓形基板10之研磨顆粒12其突出於圓形基板10之表面102之部分經構形以可與欲被研磨之物件呈線接觸。進一步而言,無論可經構形成為尖狀研磨顆粒123之研磨顆粒12之本身為何種形狀,其僅須經設置將其突出於圓形基板10之表面102之部分可與欲被研磨之物件呈線接觸,即為線狀研磨顆粒123。特別的是,線狀研磨顆粒123係具有方向性,即線狀研磨顆粒123可經構形以使其與欲被研磨之物件具有不同之方向的線接觸,尤其該方向性係可視需要而被設定或調整。舉例而言,使用者可將區域G2中的線狀研磨顆粒123經調整為特定方向,如,可將線狀研磨顆粒123之線狀方向調整成皆平行於圓形基板10之徑向方向D,或,將線狀研磨顆粒123之一部分之線狀方向調整成相對於圓形基板10之徑向方向D偏離0至180度(例如20度),以達到特定需求的研磨功效。 所謂面狀研磨顆粒125係指設置於圓形基板10之研磨顆粒12其突出於圓形基板10之表面102之部分經構形以可與欲被研磨之物件呈面接觸,其中,上述突出於圓形基板10之表面102之部分之可與欲研磨物件之面可為圓面形、方面形或任何與物件呈面接觸之任何形狀。進一步而言,無論可經構形成為面狀研磨顆粒125之研磨顆粒12之本身為何種形狀,其僅須經設置將其突出於圓形基板10之表面102之部分可與欲被研磨之物件呈面接觸,即為面狀研磨顆粒125。面狀研磨顆粒125的接觸面積較大,因此可達到較快速且較大範圍的研磨功效。 大致來說,尖狀研磨顆粒121適合用在切割作業,而線狀研磨顆粒123及面狀研磨顆粒125適合用在拋光及研磨作業。就本揭露而言,尖狀研磨顆粒121、線狀研磨顆粒123及面狀研磨顆粒125之數目之比例可依需要而被調整。在一實施例中,尖狀研磨顆粒121、線狀研磨顆粒123及面狀研磨顆粒125的數量比例可為(但不限於)3:1:6或3:2:5或6:4:0。 此外,尖狀研磨顆粒121、線狀研磨顆粒123及面狀研磨顆粒125可依需要分別被配置於圓形基板10上之不同部分;參照圖1,圓形基板10之表面102可被規則地或不規則地區分為多個區域G1、G2及G3。區域G1設有尖狀研磨顆粒121,區域G2設有線狀研磨顆粒123,區域G3設有面狀研磨顆粒125。又,上述分別具有尖狀研磨顆粒121、線狀研磨顆粒123及面狀研磨顆粒125之各區域的範圍皆可根據不同物件的條件而變化,例如將包含有尖狀研磨顆粒123之區域設置靠近圓心C,將包含有面狀研磨顆粒125之區域設置靠近圓形基板10之周緣為區域G3,將包含有線狀研磨顆粒123之區域設置介於其間,如此一來,圓形基板10上的研磨顆粒12具有接觸面積的規則性變化。 關於研磨顆粒12之尺寸,複數個研磨顆粒12可為(但不限於)0.3mm至5mm的顆粒,顆粒形狀可為圓形、方形或任何形狀。在一較佳實施例中,研磨顆粒12可為(但不限於)0.5mm之圓形顆粒。 在一實施例中,複數個研磨顆粒12可經構形以使得其突出於圓形基板10之表面102之部分之高度相同,例如(但不限於)0.5mm。在另一實施例中,複數個研磨顆粒12可經構形以使得其突出於圓形基板10之表面102之部分之高度不同,例如,可將區域G1中的研磨顆粒12經設置使得其突出於圓形基板10之表面102之部分之高度為(但不限於)0.5mm,可將區域G2中的研磨顆粒12經設置以使得其突出於圓形基板10之表面102之部分之高度為(但不限於)0.4mm,可將區域G3中的研磨顆粒12經設置以使得其突出於圓形基板10之表面102之部分之高度為(但不限於)0.6mm。在另一實施例中,可將複數個研磨顆粒12經設置以使得其突出於圓形基板10之表面102之部分是「規則地」呈現不同高度,舉例來說,可將複數個研磨顆粒12之突出於圓形基板10之表面102之部分的高度自圓心C沿徑向方向D逐漸變大、逐漸變小或呈現漸層式的波浪的變化。或,將一圈排列的研磨顆粒12之突出於圓形基板10之表面102之部分的高度設置為(但不限於)0.5mm,鄰接該圈排列的研磨顆粒12之突出於圓形基板10之表面102之部分的高度設置為(但不限於)0.4mm,即將該等圈排列之研磨顆粒12呈現一圈排列高,一圈排列低之變化,以此特定規則呈現高度變化。須強調的是,本揭露的規則性高度變化可以促成不同的研磨功效。 關於研磨顆粒之材料選用,研磨顆粒12之材料可包含氧化鋁、碳化矽、陶瓷、金剛石及立方氮化硼。同樣地,研磨顆粒12之材料之比例可依需要而被調整。此外,研磨顆粒12之形狀、大小、比例及材料可依需要而被調整或混合使用以呈現不同變化之態樣。 排列方式﹞ 研磨顆粒12在圓形基板10之表面102上之排列方式及其排列所呈現之形狀可依需要而有所變化,以下以例示性地說明數種本揭露之研磨顆粒12在圓形基板10之表面102所可能呈現的排列方式,事實上本揭露之研磨顆粒12所可能呈現之排列方式並不限於以下所呈現者,其係可依使用者的需要而有其他變化之排列形狀。 請同時參照圖1至圖9。圖1展示本揭露第一實施例之俯視圖,其中複數個研磨顆粒12以圓心C為中心,呈同心圓之方式形成複數個圓形之排列E1、E2等(為了方便解說,排列E1、E2為研磨顆粒12的排列形狀,圖式並未標示其他重複性排列的元件符號)。研磨顆粒12排列的密度可自圓心C沿徑向方向D逐漸變化(變大或變小或呈其他規則性的變化),以不同間距變化設置在圓形基板10上。 圖3展示本揭露第二實施例之俯視圖,其中複數個研磨顆粒12以圓心C為中心,呈同心圓之方式形成複數個圓形之排列M1、M2等。 圖4展示本揭露第三實施例之俯視圖,其中複數個研磨顆粒12可圍繞圓心C形成複數個四邊形之排列N1、N2等。其中,複數個研磨顆粒12可以相同間距(例如5-10mm)設置在圓形基板10上。 圖5展示本揭露第四實施例之俯視圖,其中複數個研磨顆粒12可圍繞圓心C形成複數個六邊形之排列P1、P2等。在另一實施例中,複數個研磨顆粒12可圍繞圓心C形成複數個多邊形之排列,多邊形可為(但不限於)三邊形、五邊形及八邊形(圖式未顯示)。 圖6展示本揭露第五實施例之俯視圖,其中複數個研磨顆粒12可呈直線排列Q1、Q1'、Q1''等。排列Q1與排列Q1'的夾角θ1為60度,排列Q1'與排列Q1''的夾角θ2為60度,因此,第五實施例的研磨顆粒12大致呈現放射狀的星形。 圖7展示本揭露第六實施例之俯視圖,其中複數個研磨顆粒12可沿圓形基板10周緣連續地呈一排或一排以上(例如三排)之排列S1、S2等。亦即,第六實施例的研磨顆粒12大致緊靠圓形基板10的周緣。 圖8展示本揭露第七實施例之俯視圖,其中複數個研磨顆粒12可沿圓形基板10之一周緣不連續地呈一排或一排以上(例如三排)之排列T1、T2等。簡單來說,第七實施例就是把第六實施例中的部分研磨顆粒12拿掉,以形成不連續的排列T1、T2等。 圖9展示本揭露第八實施例之俯視圖,其中複數個研磨顆粒12可沿圓形基板10之一周緣呈一排或一排以上之排列X1、X2等,且可呈直線排列Y1、Y2等。簡單來說,第八實施例就是把第五實施例及第六實施例的組合。 值得注意的是,圖1、圖3至圖9的研磨顆粒12的間距、密度、高度、大小及數量皆可以特定方式變化,例如研磨顆粒12的數量自圓心C沿徑向方向D逐漸變少。此外,如上所述,尖狀研磨顆粒121、線狀研磨顆粒123及面狀研磨顆粒125的數量及比例變化皆可應用於圖3至圖9的裝置1。 層疊式研磨顆粒﹞ 圖1至圖9之實施例亦可製造為層疊式研磨顆粒,請參圖10所示之圓形基板10之部分剖視圖。具體來說,研磨顆粒12經過多次使用後,會有耗損及脫落的可能。為了達到長久使用本揭露之用於研磨、拋光及/或切割物件之裝置且不需定期更新研磨顆粒12,本揭露的圓形基板10以層疊方式設置研磨顆粒12,如圖10所示,研磨顆粒可分別佈置於第一層131、第二層132及第三層133而層疊設置,其中不同層的研磨顆粒12藉由填料134(例如有機材料)固定。如此一來,若表層的研磨顆粒12經多次使用後鈍化且脫落,緊鄰表層研磨顆粒12的下層研磨顆粒12即可暴露在圓形基板10之表面102上,作為後續的研磨拋光切割基礎。舉例而言,若設置於第一層131的研磨顆粒12經多次使用後鈍化且脫落,則第二層132之研磨顆粒12即可在介於第一層131及第二層132之間的填料134經磨耗後而露出於圓形基板10之表面102上,進而作為後續的研磨拋光切割基礎;同樣地,若之後設置於第二層132的研磨顆粒12亦經多次使用後鈍化且脫落,則第三層133之研磨顆粒12即可在介於第二層132及第三層133之間的填料134經磨耗後而露出於圓形基板10之表面102上,進而作為後續的研磨拋光切割基礎。 雙面研磨 拋光 切割裝置﹞ 上述之裝置皆可用於研磨、拋光及切割等作業。為了更加精進研磨拋光切割作業的效率(特別是切割作業的效率),本揭露之用於研磨、拋光及/或切割物件之裝置之圓形基板之另一表面亦可設有另一組複數個研磨顆粒(圖式未顯示),亦即,該圓形基板之兩個表面(正面及反面)皆設有研磨顆粒。如此一來,當用於研磨、拋光及/或切割物件之裝置與物件之表面呈一角度(例如90度)接觸時,用於研磨、拋光及/或切割物件之裝置之圓形基板的兩個表面皆可與物件進行研磨、拋光及切割作業。圓形基板之另一表面之另一組複數個研磨顆粒之配置方式可參酌圖1至圖9之實施例之研磨顆粒12之配置方式,茲不贅述。應瞭解本揭露並不限於本文中所揭示之特定結構或設置,本揭露所屬技術領域具有通常知識者當可理解,在本揭露之精神下,本文中所揭示之此等結構及設置在一定程度上可經改變或置換。亦應瞭解本文所使用之術語及描述方向或相對位置之用語僅為描述特定實施方式及便於說明與理解而使用,並不意欲限制本揭露之範圍;本揭露之範疇僅由隨附申請專利範圍及其等效之設置而限制。Embodiments of the present disclosure, including various embodiments, are described in detail below with reference to the drawings. It should be noted that the content of the embodiments of the present invention is only used to illustrate one specific aspect of the disclosure, and is not intended to limit the scope of the disclosure. Figure 1 shows a top view of a first embodiment of the present disclosure. The first embodiment is a device 1 (such as a grinding wheel) for grinding an object (such as glass, diamond, sapphire, stone, building, wafer, etc.; not shown), which can be combined with a conventional fixed electric Grinding machines or hand-held electric grinders work together. The device 1 includes a circular substrate 10 (in another embodiment, the substrate can also be of any shape) and a plurality of abrasive particles 12. The abrasive particles 12 can be disposed on the surface 102 of the circular substrate 10 by adhesive, inlay, electroplating, sintering, or any fixed means. One portion of the abrasive particles 12 protrudes from the surface 102 of the circular substrate 10 for grinding, cutting, polishing or drilling with the object, and another portion of the abrasive particles 12 is bonded, inlaid, plated or sintered. It is fixed on the circular substrate 10. In another embodiment, the entirety of the abrasive particles 12 is projecting and secured to the circular substrate 10 (ie, not embedded in the circular substrate 10). The circular substrate 10 has a center C, and the abrasive particles 12 can be aligned from the center C in the radial direction D. Preferably, the abrasive particles 12 are based on conditions of different articles (such as hardness, texture, type, shape and size). Different configurations are provided on the surface 102 of the circular substrate 10. One of the focuses of the present disclosure is the "various variations" in the arrangement (contact area, arrangement and ratio) of the abrasive particles 12, as detailed below. [ Contact Area] Please refer to both FIG. 1 and FIG. 2, wherein FIG. 2 is a view that the abrasive particles 12 disposed on the surface 102 of the circular substrate 10 may be configured as sharp abrasive particles 121, linear abrasive particles 123 or The particles 125 are surface-polished. The term "pointed abrasive particles 121" means that the abrasive particles 12 disposed on the circular substrate 10 are partially protruded from the surface 102 of the circular substrate 10 to be in point contact with the object to be polished, wherein the protrusions are Portions of the surface 102 of the circular substrate 10 can be conical, pyramidal or any shape that is in point contact with the article. Further, regardless of the shape of the abrasive particles 12 that can be formed into the sharp abrasive particles 121, it only needs to be disposed to protrude from the surface 102 of the circular substrate 10 to be related to the object to be polished. In point contact, it is a pointed abrasive particle 121. Since the area of the sharp abrasive particles 121 in contact with the object is small, a finer and smaller range of grinding efficiency can be achieved. By linear abrasive particles 123 is meant that the abrasive particles 12 disposed on the circular substrate 10 are configured to protrude from the surface 102 of the circular substrate 10 to be in line contact with the article to be abraded. Further, regardless of the shape of the abrasive particles 12 that can be formed into the sharp abrasive particles 123, it only needs to be disposed to protrude from the surface 102 of the circular substrate 10 to be related to the object to be polished. In line contact, it is a linear abrasive particle 123. In particular, the linear abrasive particles 123 are directional, that is, the linear abrasive particles 123 may be configured such that they have line contact with the object to be ground in a different direction, in particular, the directionality may be Set or adjust. For example, the user can adjust the linear abrasive particles 123 in the region G2 to a specific direction. For example, the linear direction of the linear abrasive particles 123 can be adjusted to be parallel to the radial direction D of the circular substrate 10. Or, the linear direction of a portion of the linear abrasive particles 123 is adjusted to be offset from the radial direction D of the circular substrate 10 by 0 to 180 degrees (for example, 20 degrees) to achieve a specific desired abrasive effect. By the surface-grinding particles 125, the abrasive particles 12 disposed on the circular substrate 10 are partially protruded from the surface 102 of the circular substrate 10 to be in surface contact with the object to be polished, wherein the protrusions are The portion of the surface 102 of the circular substrate 10 may be rounded, embossed, or any shape that is in surface contact with the article. Further, regardless of the shape of the abrasive particles 12 that can be formed into the planar abrasive particles 125, they only need to be disposed to protrude from the surface 102 of the circular substrate 10 to be related to the object to be polished. In surface contact, it is a planar abrasive particle 125. The contact area of the planar abrasive particles 125 is large, so that a faster and wider range of polishing effects can be achieved. In general, the sharp abrasive particles 121 are suitable for use in cutting operations, while the linear abrasive particles 123 and the planar abrasive particles 125 are suitable for use in polishing and grinding operations. For purposes of the present disclosure, the ratio of the number of sharp abrasive particles 121, linear abrasive particles 123, and planar abrasive particles 125 can be adjusted as desired. In an embodiment, the ratio of the number of the sharp abrasive particles 121, the linear abrasive particles 123, and the planar abrasive particles 125 may be (but is not limited to) 3:1:6 or 3:2:5 or 6:4:0. . In addition, the sharp abrasive particles 121, the linear abrasive particles 123, and the planar abrasive particles 125 may be respectively disposed on different portions of the circular substrate 10 as needed; referring to FIG. 1, the surface 102 of the circular substrate 10 may be regularly Or irregular areas are divided into multiple areas G1, G2 and G3. The region G1 is provided with sharp abrasive particles 121, the region G2 is provided with linear abrasive particles 123, and the region G3 is provided with planar abrasive particles 125. Further, the ranges of the respective regions each having the sharp abrasive particles 121, the linear abrasive particles 123, and the planar abrasive particles 125 may vary depending on the conditions of different articles, for example, the region including the sharp abrasive particles 123 is placed close to each other. In the center C, the region including the planar abrasive grains 125 is disposed close to the circumference of the circular substrate 10 as the region G3, and the region including the linear abrasive particles 123 is disposed therebetween, so that the polishing on the circular substrate 10 is performed. The particles 12 have a regular change in contact area. Regarding the size of the abrasive particles 12, the plurality of abrasive particles 12 can be, but are not limited to, particles of 0.3 mm to 5 mm, and the particle shape can be circular, square, or any shape. In a preferred embodiment, the abrasive particles 12 can be, but are not limited to, circular particles of 0.5 mm. In one embodiment, the plurality of abrasive particles 12 can be configured such that they protrude from the surface 102 of the circular substrate 10 to the same height, such as, but not limited to, 0.5 mm. In another embodiment, the plurality of abrasive particles 12 can be configured such that the height of the portion of the surface 102 of the circular substrate 10 is different, for example, the abrasive particles 12 in the region G1 can be set such that they protrude The height of the portion of the surface 102 of the circular substrate 10 is, but not limited to, 0.5 mm, and the abrasive particles 12 in the region G2 may be disposed such that the height of the portion of the surface 102 of the circular substrate 10 is ( However, without limitation, 0.4 mm, the abrasive particles 12 in the region G3 may be disposed such that the height of a portion thereof protruding from the surface 102 of the circular substrate 10 is, but not limited to, 0.6 mm. In another embodiment, the plurality of abrasive particles 12 can be disposed such that they protrude from the surface 102 of the circular substrate 10 to "regularly" exhibit different heights, for example, a plurality of abrasive particles 12 can be The height of the portion protruding from the surface 102 of the circular substrate 10 gradually increases from the center C in the radial direction D, becomes smaller, or exhibits a gradual change in wave shape. Or, the height of a portion of the array of abrasive particles 12 protruding from the surface 102 of the circular substrate 10 is set to, but not limited to, 0.5 mm, and the abrasive particles 12 arranged adjacent to the circle protrude from the circular substrate 10. The height of the portion of the surface 102 is set to, but not limited to, 0.4 mm, i.e., the abrasive particles 12 arranged in the circle are arranged in a high circle, and the arrangement of the rings is low, and the height variation is exhibited by the specific rule. It should be emphasized that the regular height variations of the present disclosure can contribute to different grinding efficiencies. Regarding the material of the abrasive particles, the material of the abrasive particles 12 may comprise alumina, tantalum carbide, ceramic, diamond, and cubic boron nitride. Likewise, the ratio of the material of the abrasive particles 12 can be adjusted as needed. In addition, the shape, size, proportion, and material of the abrasive particles 12 can be adjusted or mixed as needed to exhibit different variations. [ Arrangement] The arrangement of the abrasive particles 12 on the surface 102 of the circular substrate 10 and the shape of the arrangement thereof may be varied as needed. Hereinafter, several abrasive grains 12 of the present disclosure are exemplarily illustrated in a circle. The arrangement of the surface 102 of the substrate 10 may be arranged. In fact, the arrangement of the abrasive particles 12 of the present disclosure may not be limited to those presented below, which may have other changed arrangement shapes according to the needs of the user. . Please refer to FIG. 1 to FIG. 9 at the same time. 1 shows a plan view of a first embodiment of the present disclosure, in which a plurality of abrasive particles 12 are formed in a concentric manner around a center C, forming a plurality of circular arrays E1, E2, etc. (for convenience of explanation, the arrays E1 and E2 are The arrangement of the abrasive particles 12, the figure does not indicate other repetitively arranged component symbols). The density of the arrangement of the abrasive particles 12 may gradually change from the center C in the radial direction D (becoming larger or smaller or in other regular variations), and may be disposed on the circular substrate 10 at different pitch variations. 3 shows a plan view of a second embodiment of the present disclosure, in which a plurality of abrasive particles 12 are formed in a concentric manner around a center C, forming a plurality of circular arrays M1, M2, and the like. 4 shows a top view of a third embodiment of the present disclosure, in which a plurality of abrasive particles 12 can form a plurality of quadrilateral arrangements N1, N2, etc. around the center C. Among them, the plurality of abrasive particles 12 may be disposed on the circular substrate 10 at the same pitch (for example, 5-10 mm). 5 shows a top view of a fourth embodiment of the present disclosure, in which a plurality of abrasive particles 12 can form a plurality of hexagonal arrangements P1, P2, etc. around the center C. In another embodiment, the plurality of abrasive particles 12 may form an arrangement of a plurality of polygons around the center C. The polygons may be, but are not limited to, a trigon, a pentagon, and an octagon (not shown). 6 shows a plan view of a fifth embodiment of the present disclosure, in which a plurality of abrasive particles 12 may be arranged in a straight line Q1, Q1', Q1'', and the like. The angle θ1 between the arrangement Q1 and the arrangement Q1' is 60 degrees, and the angle θ2 between the arrangement Q1' and the arrangement Q1'' is 60 degrees. Therefore, the abrasive particles 12 of the fifth embodiment substantially assume a radial star shape. 7 shows a plan view of a sixth embodiment of the present disclosure, in which a plurality of abrasive particles 12 are continuously arranged in a row or rows (eg, three rows) of S1, S2, etc. along the circumference of the circular substrate 10. That is, the abrasive particles 12 of the sixth embodiment substantially abut against the circumference of the circular substrate 10. 8 shows a top view of a seventh embodiment of the present disclosure, in which a plurality of abrasive particles 12 may be discontinuously arranged in one or more rows (eg, three rows) of T1, T2, etc. along one circumference of the circular substrate 10. Briefly, the seventh embodiment removes the partially ground particles 12 of the sixth embodiment to form discontinuous alignments T1, T2, and the like. 9 is a plan view showing an eighth embodiment of the present disclosure, in which a plurality of abrasive particles 12 may be arranged in a row or more rows along the circumference of one of the circular substrates 10, X1, X2, etc., and may be arranged in a straight line, Y1, Y2, etc. . In brief, the eighth embodiment is a combination of the fifth embodiment and the sixth embodiment. It should be noted that the pitch, density, height, size and number of the abrasive particles 12 of FIGS. 1 , 3 to 9 can be varied in a specific manner, for example, the number of abrasive particles 12 gradually decreases from the center C in the radial direction D. . Further, as described above, the variations in the number and proportion of the sharp abrasive particles 121, the linear abrasive particles 123, and the planar abrasive particles 125 are applicable to the apparatus 1 of FIGS. 3 to 9. [ Laminated Grinding Particles] The embodiments of FIGS. 1 to 9 can also be fabricated as laminated abrasive particles. Referring to a partial cross-sectional view of the circular substrate 10 shown in FIG. Specifically, after the abrasive particles 12 are used a plurality of times, there is a possibility of wear and fall off. In order to achieve long-term use of the apparatus for grinding, polishing and/or cutting articles of the present disclosure without periodically updating the abrasive particles 12, the circular substrate 10 of the present disclosure is provided with abrasive particles 12 in a stacked manner, as shown in FIG. The particles may be disposed in a stacked manner on the first layer 131, the second layer 132, and the third layer 133, respectively, wherein the abrasive particles 12 of the different layers are fixed by a filler 134 (for example, an organic material). In this way, if the surface of the abrasive particles 12 is passivated and detached after repeated use, the underlying abrasive particles 12 immediately adjacent to the surface abrasive particles 12 can be exposed on the surface 102 of the circular substrate 10 as a basis for subsequent abrasive polishing. For example, if the abrasive particles 12 disposed on the first layer 131 are passivated and detached after being used multiple times, the abrasive particles 12 of the second layer 132 may be between the first layer 131 and the second layer 132. After the filler 134 is abraded, it is exposed on the surface 102 of the circular substrate 10, and further serves as a basis for the subsequent polishing and polishing. Similarly, if the abrasive particles 12 disposed in the second layer 132 are used repeatedly, passivation and shedding Then, the abrasive particles 12 of the third layer 133 can be exposed on the surface 102 of the circular substrate 10 after the filler 134 between the second layer 132 and the third layer 133 is worn, and then used as a subsequent polishing and polishing. Cutting basis. [ Double-side grinding , polishing , cutting device] The above devices can be used for grinding, polishing and cutting. In order to further improve the efficiency of the grinding and polishing cutting operation (especially the efficiency of the cutting operation), the other surface of the circular substrate of the device for polishing, polishing and/or cutting the object of the present disclosure may be provided with another plurality of surfaces. The abrasive particles (not shown), that is, the two surfaces (front and back) of the circular substrate are provided with abrasive particles. As such, when the device for grinding, polishing, and/or cutting the article is in contact with the surface of the article at an angle (eg, 90 degrees), two of the circular substrates of the device for grinding, polishing, and/or cutting the article Surfaces can be ground, polished and cut with objects. Another configuration of the plurality of abrasive particles of the other surface of the circular substrate may be arranged in accordance with the arrangement of the abrasive particles 12 of the embodiment of FIGS. 1 to 9 and will not be described again. It should be understood that the present disclosure is not limited to the specific structures or arrangements disclosed herein. It is understood by those of ordinary skill in the art that, in light of the present disclosure, the structures and arrangements disclosed herein are to some extent It can be changed or replaced. It is also to be understood that the terms of the description and the description of the invention are intended to And its equivalent setting is limited.

1‧‧‧裝置1‧‧‧ device

10‧‧‧圓形基板10‧‧‧Circular substrate

12‧‧‧研磨顆粒12‧‧‧Abrasive particles

102‧‧‧表面102‧‧‧ surface

121‧‧‧尖狀研磨顆粒121‧‧‧ pointed abrasive particles

123‧‧‧線狀研磨顆粒123‧‧‧Wire-shaped abrasive particles

125‧‧‧面狀研磨顆粒125‧‧‧Surface abrasive particles

131‧‧‧第一層131‧‧‧ first floor

132‧‧‧第二層132‧‧‧ second floor

133‧‧‧第三層133‧‧‧ third floor

134‧‧‧填料134‧‧‧Filling

C‧‧‧圓心C‧‧‧ Center

D‧‧‧徑向方向D‧‧‧ radial direction

E1、E2、M1、M2、N1、N2‧‧‧排列E1, E2, M1, M2, N1, N2‧‧‧

G1、G2、G3‧‧‧區域G1, G2, G3‧‧‧ areas

P1、P2、Q1、Q1'、Q1''、S1、S2‧‧‧排列P1, P2, Q1, Q1', Q1'', S1, S2‧‧‧

T1、T2、X1、X2、Y1、Y2‧‧‧排列T1, T2, X1, X2, Y1, Y2‧‧‧

θ1、θ2‧‧‧夾角Θ1, θ2‧‧‧ angle

以下所描述的附圖僅是出於例示性目的,並非欲以任何方式限制本揭露之範疇。 圖1展示本揭露第一實施例之俯視圖。 圖2展示本揭露尖狀研磨顆粒、線狀研磨顆粒及面狀研磨顆粒之示意圖。 圖3展示本揭露第二實施例之俯視圖。 圖4展示本揭露第三實施例之俯視圖。 圖5展示本揭露第四實施例之俯視圖。 圖6展示本揭露第五實施例之俯視圖。 圖7展示本揭露第六實施例之俯視圖。 圖8展示本揭露第七實施例之俯視圖。 圖9展示本揭露第八實施例之俯視圖。 圖10展示本揭露之圓形基板之部分剖面圖。The drawings described below are for illustrative purposes only and are not intended to limit the scope of the disclosure in any way. Figure 1 shows a top view of a first embodiment of the present disclosure. 2 shows a schematic view of the pointed abrasive particles, linear abrasive particles, and planar abrasive particles. Figure 3 shows a top view of a second embodiment of the present disclosure. Figure 4 shows a top view of a third embodiment of the present disclosure. Figure 5 shows a top view of a fourth embodiment of the present disclosure. Figure 6 shows a top view of a fifth embodiment of the present disclosure. Figure 7 shows a top view of a sixth embodiment of the present disclosure. Figure 8 shows a top view of a seventh embodiment of the present disclosure. Figure 9 shows a top view of an eighth embodiment of the present disclosure. Figure 10 shows a partial cross-sectional view of the circular substrate of the present disclosure.

Claims (25)

一種用於研磨、拋光及/或切割一物件之裝置,其包含: 一圓形基板;及 複數個研磨顆粒,其設置在該圓形基板之一表面上,其中各個研磨顆粒之部分係突出於該圓形基板之該表面; 其中該複數個研磨顆粒可依需要而以不同之排列方式被設置於該圓形基板之該表面上。An apparatus for grinding, polishing, and/or cutting an object, comprising: a circular substrate; and a plurality of abrasive particles disposed on a surface of the circular substrate, wherein portions of each of the abrasive particles are protruded from The surface of the circular substrate; wherein the plurality of abrasive particles can be disposed on the surface of the circular substrate in different arrangements as needed. 如請求項1之裝置,其中該圓形基板具有一圓心,而該複數個研磨顆粒可自該圓心沿徑向方向排列。The apparatus of claim 1, wherein the circular substrate has a center, and the plurality of abrasive particles are aligned from the center of the circle in a radial direction. 如請求項2之裝置,其中該複數個研磨顆粒可以該圓心為中心,呈同心圓之方式形成複數個圓形之排列。The device of claim 2, wherein the plurality of abrasive particles are centered on the center of the circle to form a plurality of circular arrangements in a concentric manner. 如請求項2之裝置,其中該複數個研磨顆粒可圍繞該圓心形成複數個四邊形之排列。The device of claim 2, wherein the plurality of abrasive particles form an arrangement of a plurality of quadrangles around the center of the circle. 如請求項2之裝置,其中該複數個研磨顆粒可圍繞該圓心形成複數個六邊形之排列。The device of claim 2, wherein the plurality of abrasive particles form an arrangement of a plurality of hexagons around the center. 如請求項2之裝置,其中該複數個研磨顆粒可圍繞該圓心形成複數個多邊形之排列。The device of claim 2, wherein the plurality of abrasive particles form an arrangement of a plurality of polygons around the center of the circle. 如請求項1之裝置,其中該複數個研磨顆粒可呈直線排列。The device of claim 1, wherein the plurality of abrasive particles are arranged in a straight line. 如請求項1之裝置,其中該複數個研磨顆粒可沿該圓形基板之一周緣連續地呈一排或一排以上之排列。The device of claim 1, wherein the plurality of abrasive particles are continuously arranged in a row or more along a circumference of one of the circular substrates. 如請求項1之裝置,其中該複數個研磨顆粒可沿該圓形基板之一周緣不連續地呈一排或一排以上之排列。The device of claim 1, wherein the plurality of abrasive particles are arranged discontinuously in one row or more along a circumference of one of the circular substrates. 如請求項1之裝置,其中該複數個研磨顆粒可沿該圓形基板之一周緣呈一排或一排以上之排列,且可呈直線排列。The device of claim 1, wherein the plurality of abrasive particles are arranged in a row or more along a circumference of one of the circular substrates, and may be arranged in a line. 如請求項1之裝置,其中該圓形基板之該表面可被規則地或不規則地區分為多個區域,且其中該各區域中之該複數個研磨顆粒之排列方式不同。The device of claim 1, wherein the surface of the circular substrate is divided into a plurality of regions by regular or irregular regions, and wherein the plurality of abrasive particles in the regions are arranged differently. 如請求項1之裝置,其中該複數個研磨顆粒以相同間距設置在該圓形基板上。The device of claim 1, wherein the plurality of abrasive particles are disposed on the circular substrate at the same pitch. 如請求項1之裝置,其中該複數個研磨顆粒以不同間距設置在該圓形基板上。The device of claim 1, wherein the plurality of abrasive particles are disposed on the circular substrate at different pitches. 如請求項1之裝置,其中該複數個研磨顆粒之一部分規則地以不同間距設置在該圓形基板上。The device of claim 1, wherein one of the plurality of abrasive particles is regularly disposed on the circular substrate at different intervals. 如請求項1之裝置,其中該複數個研磨顆粒突出於該圓形基板之該表面之該部分之高度相同。The device of claim 1, wherein the plurality of abrasive particles protrude from the portion of the surface of the circular substrate at the same height. 如請求項1之裝置,其中該複數個研磨顆粒突出於該圓形基板之該表面之該部分之高度不同。The device of claim 1, wherein the plurality of abrasive particles protrude from a height of the portion of the surface of the circular substrate. 如請求項1之裝置,其中該複數個研磨顆粒突出於該圓形基板之該表面之該部分規則地呈現不同高度。The device of claim 1, wherein the portion of the plurality of abrasive particles that protrude from the surface of the circular substrate regularly exhibits different heights. 如請求項1之裝置,其中該複數個研磨顆粒包含尖狀研磨顆粒、線狀研磨顆粒及面狀研磨顆粒,其中該尖狀研磨顆粒係為該研磨顆粒之突出於該圓形基板之該表面之該部分經構形以使其與欲被研磨之該物件呈點接觸,其中該線狀研磨顆粒係為該研磨顆粒之突出於該圓形基板之該表面之該部分經構形以使其與欲被研磨之該物件呈線接觸,其中該面狀研磨顆粒係為該研磨顆粒之突出於該圓形基板之該表面之該部分經構形以使其與欲被研磨之該物件呈面接觸。The apparatus of claim 1, wherein the plurality of abrasive particles comprise sharp abrasive particles, linear abrasive particles, and planar abrasive particles, wherein the sharp abrasive particles are the surface of the abrasive particles protruding from the circular substrate The portion is configured to be in point contact with the article to be abraded, wherein the linear abrasive particles are configured such that the portion of the abrasive particle that protrudes from the surface of the circular substrate is configured to In line contact with the article to be ground, wherein the planar abrasive particle is such that the portion of the abrasive particle protruding from the surface of the circular substrate is configured to face the object to be polished contact. 如請求項18之裝置,其中該等尖狀研磨顆粒、線狀研磨顆粒及面狀研磨顆粒之彼此間之數目之比例可依需要而被調整。The apparatus of claim 18, wherein the ratio of the number of the pointed abrasive particles, the linear abrasive particles, and the planar abrasive particles to each other is adjusted as needed. 如請求項18之裝置,其中該等尖狀研磨顆粒、線狀研磨顆粒及面狀研磨顆粒可分別以不同之排列方式被設置於該圓形基板之該表面上。The device of claim 18, wherein the pointed abrasive particles, the linear abrasive particles, and the planar abrasive particles are respectively disposed on the surface of the circular substrate in a different arrangement. 如請求項18之裝置,其中該等線狀研磨顆粒可經構形以使其與欲被研磨之該物件具有不同之方向之線接觸。The device of claim 18, wherein the linear abrasive particles are conformable such that they are in line contact with the article to be abraded in a different direction. 如請求項18之裝置,其中該圓形基板之該表面可被規則地或不規則地區分為多個區域,且其中各區域中之該等尖狀研磨顆粒、線狀研磨顆粒及面狀研磨顆粒之彼此間之數目之比例不同。The device of claim 18, wherein the surface of the circular substrate is divided into a plurality of regions by regular or irregular regions, and wherein the pointed abrasive particles, the linear abrasive particles, and the planar polishing in each region The ratio of the number of particles to each other is different. 如請求項1之裝置,其中該複數個研磨顆粒之材料包含氧化鋁、碳化矽、陶瓷、金剛石及立方氮化硼,該複數個研磨顆粒之形狀、大小、比例及材料可依需要而被調整。The device of claim 1, wherein the material of the plurality of abrasive particles comprises alumina, tantalum carbide, ceramic, diamond and cubic boron nitride, and the shape, size, proportion and material of the plurality of abrasive particles can be adjusted as needed . 如請求項1之裝置,其中該複數個研磨顆粒藉由一填料以層疊方式設置。The device of claim 1, wherein the plurality of abrasive particles are disposed in a stacked manner by a filler. 如請求項1之裝置,其進一步包含: 另一組複數個研磨顆粒,其設置在該圓形基板之另一表面上,其中該另一組複數個研磨顆粒之每一者之部分係突出於該圓形基板之該另一表面; 其中該另一組複數個研磨顆粒可依需要而以不同之排列方式被設置於該圓形基板之該另一表面上。The apparatus of claim 1, further comprising: another set of plurality of abrasive particles disposed on the other surface of the circular substrate, wherein a portion of each of the other plurality of abrasive particles protrudes from The other surface of the circular substrate; wherein the other plurality of abrasive particles are disposed on the other surface of the circular substrate in a different arrangement as needed.
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