TW201902696A - Laminate for circuit boards, metal base circuit board and power module - Google Patents

Laminate for circuit boards, metal base circuit board and power module Download PDF

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TW201902696A
TW201902696A TW107119650A TW107119650A TW201902696A TW 201902696 A TW201902696 A TW 201902696A TW 107119650 A TW107119650 A TW 107119650A TW 107119650 A TW107119650 A TW 107119650A TW 201902696 A TW201902696 A TW 201902696A
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rubber
resin
circuit board
insulating layer
laminate
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TW107119650A
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TWI670172B (en
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水野克美
木內陽子
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日商日本發條股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/04Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
    • B32B15/08Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L101/00Compositions of unspecified macromolecular compounds
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L33/00Compositions of homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides or nitriles thereof; Compositions of derivatives of such polymers
    • C08L33/04Homopolymers or copolymers of esters
    • C08L33/06Homopolymers or copolymers of esters of esters containing only carbon, hydrogen and oxygen, which oxygen atoms are present only as part of the carboxyl radical
    • C08L33/08Homopolymers or copolymers of acrylic acid esters
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L79/00Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen or carbon only, not provided for in groups C08L61/00 - C08L77/00
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/05Insulated conductive substrates, e.g. insulated metal substrate

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  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Laminated Bodies (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Insulated Metal Substrates For Printed Circuits (AREA)

Abstract

Provided is a laminate for circuit boards, which comprises a metal substrate, an insulating layer that is provided on at least one surface of the metal substrate, and a metal foil that is provided on the insulating layer. The insulating layer contains a resin component and an inorganic filler; and the resin component has a phase separation structure that comprises a discontinuous phase containing a thermosetting resin and a continuous phase containing a rubber.

Description

電路基板用積層板、金屬基底電路基板及電力模組Multilayer board for circuit board, metal base circuit board and power module

發明領域 本發明是有關於電路基板用積層板、由該電路基板用積層板製造的金屬基底電路基板及具備該金屬基底電路基板的電力模組。FIELD OF THE INVENTION The present invention relates to a laminated board for a circuit board, a metal base circuit board produced from the laminated board for the circuit board, and a power module including the metal base circuit board.

背景技術 近年來電子技術的發展驚人,電機電子儀器的高性能化及小型化急速進展。伴隨於此,該等所使用之對應高密度安裝的金屬基底電路基板亦比以往增加而發展小型化且高密度化。故,針對金屬基底電路基板亦要求各種性能之改善,為了因應該等期望正進行廣泛的努力。Background Art In recent years, the development of electronic technology has been astounding, and the high performance and miniaturization of motor electronic instruments have progressed rapidly. Along with this, the metal base circuit board corresponding to the high-density mounting used in these has been increased in size and increased in density. Therefore, various performance improvements are required for the metal base circuit substrate, and extensive efforts are being made in response to expectations.

迄今,廣泛地使用採用了環氧樹脂的樹脂組成物來作為在構成金屬基底電路基板的絕緣層中使用的樹脂組成物。舉例言之,於日本特開2007-254709號公報中,揭示有一種在含有環氧樹脂之組成物中添加有特定苯酚系硬化劑、苯氧樹脂及橡膠粒子的樹脂組成物,作為能提供即便絕緣層表面之粗度小,與導體層之界面密接強度亦高的絕緣層之樹脂組成物。又,於國際公開第2009/119598號公報中,揭示有一種在含有環氧樹脂之組成物中添加有特定苯氧樹脂、氰酸酯樹脂的樹脂組成物,以謀求除了鍍敷密接性外更改善耐熱性及耐濕可靠性。Heretofore, a resin composition using an epoxy resin has been widely used as a resin composition used in an insulating layer constituting a metal base circuit substrate. For example, Japanese Laid-Open Patent Publication No. 2007-254709 discloses a resin composition in which a specific phenol-based curing agent, a phenoxy resin, and rubber particles are added to a composition containing an epoxy resin, and A resin composition of an insulating layer having a small thickness on the surface of the insulating layer and a high adhesion strength to the interface of the conductor layer. Further, Japanese Laid-Open Patent Publication No. 2009/119598 discloses a resin composition in which a specific phenoxy resin or a cyanate resin is added to a composition containing an epoxy resin, in addition to plating adhesion. Improve heat resistance and moisture resistance reliability.

發明概要 隨著上述電機電子儀器的高性能化及小型化之急速進展,安裝有電機元件及/或電子元件的零件之發熱量日益變大。故,對應高密度安裝的金屬基底電路基板被要求能進一步地改善加工性,以及於高溫吸濕條件下的耐吸水性及耐氧化劣化性。SUMMARY OF THE INVENTION With the rapid development of the high performance and miniaturization of the above-described motor electronic devices, the amount of heat generated by the components to which the motor components and/or electronic components are mounted is increasing. Therefore, it is required to further improve the workability and the water absorption resistance and the oxidation deterioration resistance under high temperature moisture absorption conditions in accordance with the high-density mounting of the metal base circuit substrate.

本發明之目的在提供一種加工性優異且於高溫吸濕條件下的耐吸水性及耐氧化劣化性優異的電路基板用積層板、由該電路基板用積層板製造的金屬基底電路基板以及具備該金屬基底電路基板的電力模組。An object of the present invention is to provide a laminated board for a circuit board which is excellent in workability and is excellent in water absorption resistance and oxidation deterioration resistance under high temperature moisture absorption conditions, a metal base circuit board produced from the laminated board for a circuit board, and the like. A power module of a metal base circuit substrate.

依據本發明之一態樣,可提供一種電路基板用積層板,具備:金屬基板;絕緣層,其設置於該金屬基板之至少單面上;及金屬箔,其設置於該絕緣層上;上述絕緣層含有樹脂成分及無機填充材,且上述樹脂成分具有相分離結構,該相分離結構包括含有熱硬化性樹脂的非連續相及含有橡膠的連續相。According to an aspect of the present invention, a laminated board for a circuit board can be provided, comprising: a metal substrate; an insulating layer disposed on at least one side of the metal substrate; and a metal foil disposed on the insulating layer; The insulating layer contains a resin component and an inorganic filler, and the resin component has a phase separation structure including a discontinuous phase containing a thermosetting resin and a continuous phase containing rubber.

依據本發明之其他態樣,上述電路基板用積層板至少含有重量平均分子量為150萬以下的橡膠作為上述橡膠。According to another aspect of the invention, the laminated board for a circuit board contains at least a rubber having a weight average molecular weight of 1.5 million or less as the rubber.

再者,依據其他態樣,上述電路基板用積層板至少含有主鏈為飽和結構的橡膠作為上述橡膠。Further, according to another aspect, the laminated board for a circuit board contains at least a rubber having a saturated structure in the main chain as the rubber.

再者,依據其他態樣,上述電路基板用積層板至少含有丙烯酸橡膠作為上述橡膠。Further, according to another aspect, the laminated board for a circuit board contains at least an acrylic rubber as the rubber.

再者,依據其他態樣,上述電路基板用積層板於上述絕緣層中上述橡膠之摻合比相對於上述樹脂成分之總質量為1~40質量%。Further, according to another aspect, the laminated board for a circuit board has a blending ratio of the rubber in the insulating layer of 1 to 40% by mass based on the total mass of the resin component.

再者,依據其他態樣,上述電路基板用積層板至少含有氰酸酯樹脂作為上述熱硬化性樹脂。Further, according to another aspect, the laminated board for a circuit board contains at least a cyanate resin as the thermosetting resin.

再者,依據其他態樣,上述電路基板用積層板含有雙酚型氰酸酯樹脂及酚醛清漆型氰酸酯樹脂作為上述熱硬化性樹脂。In addition, the laminated board for a circuit board contains the bisphenol type cyanate resin and the novolak type cyanate resin as the said thermosetting resin.

再者,依據其他態樣,上述電路基板用積層板作為上述熱硬化性樹脂之環氧樹脂之摻合比相對於上述熱硬化性樹脂之總質量為0~10質量%。In addition, the blending ratio of the laminated board for a circuit board as the epoxy resin of the thermosetting resin is 0 to 10% by mass based on the total mass of the thermosetting resin.

又,依據本發明之其他態樣,可提供一種金屬基底電路基板,係藉由將上述電路基板用積層板中任一者具備的上述金屬箔圖案化而製得。Moreover, according to another aspect of the present invention, a metal base circuit board can be obtained by patterning the metal foil provided in any one of the circuit board laminates.

再者,依據本發明之其他態樣,可提供一種電力模組,其具備上述金屬基底電路基板。Furthermore, according to another aspect of the present invention, a power module including the above-described metal base circuit substrate can be provided.

依據本發明,可提供一種加工性優異且於高溫吸濕條件下的耐吸水性及耐氧化劣化性優異的電路基板用積層板、由該電路基板用積層板製造的金屬基底電路基板以及具備該金屬基底電路基板的電力模組。According to the present invention, it is possible to provide a laminated board for a circuit board which is excellent in workability and is excellent in water absorption resistance and oxidative deterioration resistance under high temperature moisture absorption conditions, a metal base circuit board manufactured from the laminated board for circuit board, and the like A power module of a metal base circuit substrate.

用以實施發明之形態 以下,詳述本發明之實施形態。 本發明之實施形態的電路基板用積層板具備:金屬基板;絕緣層,其設置於該金屬基板之至少單面上;及金屬箔其設置於該絕緣層上。圖2及圖3所示電路基板用積層板1作成以下3層結構:於金屬基板2之單面上形成絕緣層3,且於絕緣層3上形成金屬箔4。於本發明之其他實施形態中,電路基板用積層板亦可作成以下5層結構:於金屬基板2之兩面形成絕緣層3,更於各絕緣層3上形成金屬箔4。另,於圖2及圖3中,X及Y方向是與金屬基板2之主面呈平行且相互呈正交的方向,Z方向則為相對於X及Y方向呈垂直的厚度方向。圖2中顯示矩形上的電路基板用積層板1作為一例,電路基板用積層板1亦可具有其他形狀。Embodiments for Carrying Out the Invention Hereinafter, embodiments of the present invention will be described in detail. A laminated board for a circuit board according to an embodiment of the present invention includes a metal substrate, an insulating layer provided on at least one surface of the metal substrate, and a metal foil provided on the insulating layer. The laminated board 1 for a circuit board shown in FIG. 2 and FIG. 3 has a three-layer structure in which an insulating layer 3 is formed on one surface of the metal substrate 2, and a metal foil 4 is formed on the insulating layer 3. In another embodiment of the present invention, the laminated board for a circuit board may have a five-layer structure in which an insulating layer 3 is formed on both surfaces of the metal substrate 2, and a metal foil 4 is formed on each insulating layer 3. In FIGS. 2 and 3, the X and Y directions are parallel to the main surface of the metal substrate 2 and perpendicular to each other, and the Z direction is a thickness direction perpendicular to the X and Y directions. In FIG. 2, a laminated board 1 for a circuit board on a rectangular shape is shown as an example, and the laminated board 1 for circuit boards may have another shape.

實施形態之電路基板用積層板具備的絕緣層為使用樹脂組成物所形成塗膜的硬化物,且前述樹脂組成物至少含有樹脂成分及無機填充材。絕緣層至少含有熱硬化性樹脂及橡膠作為樹脂成分。The insulating layer provided in the laminated board for a circuit board of the embodiment is a cured product using a coating film formed of a resin composition, and the resin composition contains at least a resin component and an inorganic filler. The insulating layer contains at least a thermosetting resin and rubber as a resin component.

樹脂成分於絕緣層中形成相分離結構。該相分離結構為連續相(基質)中分散有非連續相的海島結構,非連續相含有熱硬化性樹脂,連續相則含有橡膠。依此,於實施形態中,絕緣層之特徵之一在於具有以下相分離結構:橡膠並非是以非連續相分散於基質中,而是橡膠構成連續相(基質),熱硬化性樹脂以非連續相(分散相)分散於該連續相中。以下,將絕緣層所含之具有包含橡膠之連續相及包含熱硬化性樹脂之非連續相的相分離結構,稱作本發明之相分離結構等。The resin component forms a phase separation structure in the insulating layer. The phase separation structure is a sea-island structure in which a discontinuous phase is dispersed in a continuous phase (matrix), the discontinuous phase contains a thermosetting resin, and the continuous phase contains rubber. Accordingly, in one embodiment, one of the characteristics of the insulating layer is that it has a phase separation structure in which rubber is not dispersed in a matrix in a discontinuous phase, but rubber constitutes a continuous phase (matrix), and the thermosetting resin is discontinuous. The phase (dispersion phase) is dispersed in the continuous phase. Hereinafter, a phase separation structure having a continuous phase containing rubber and a discontinuous phase containing a thermosetting resin contained in the insulating layer is referred to as a phase separation structure of the present invention.

橡膠雖為低吸水性,但即便橡膠以非連續相(分散相)分散於構成絕緣層的基質中,亦無法獲得作為金屬基底電路基板所期望的低吸水性。藉由使絕緣層中橡膠構成連續相(基質),可發揮絕緣層中抑制吸水之效果,有助於提升金屬基底電路基板中的低吸水性。又,橡膠之透氧性亦低,因此,橡膠構成連續相亦有助於提升金屬基底電路基板中的耐氧化劣化性。Although rubber is low in water absorbability, even if rubber is dispersed in a matrix which constitutes an insulating layer in a discontinuous phase (dispersion phase), low water absorption which is desired as a metal base circuit substrate cannot be obtained. By forming the continuous phase (matrix) of the rubber in the insulating layer, the effect of suppressing water absorption in the insulating layer can be exhibited, and the low water absorption in the metal base circuit substrate can be improved. Further, since the oxygen permeability of the rubber is also low, the rubber constitutes the continuous phase and contributes to the improvement of the oxidation deterioration resistance in the metal base circuit substrate.

具有柔軟性的橡膠與熱硬化性樹脂相溶而提升加工性,伴隨著硬化形成相分離結構,並改善絕緣層的機械強度或應力緩和。The soft rubber is compatible with the thermosetting resin to improve the workability, and the phase separation structure is formed by hardening, and the mechanical strength or stress relaxation of the insulating layer is improved.

絕緣層中本發明之相分離結構之有無例如可藉由顯微鏡觀察及/或散射測定來確認。於顯微鏡觀察之情形時,可藉由掃描式電子顯微鏡(SEM)、原子力顯微鏡、光學顯微鏡、穿透式電子顯微鏡等確認相分離結構。又,於散射測定之情形時,可藉由微小角入射小角X射線散射測定、元素分析、能量分散式X射線分析、電子探針顯微分析儀、X射線光電子分光法等,確認相分離結構之有無。The presence or absence of the phase separation structure of the present invention in the insulating layer can be confirmed, for example, by microscopic observation and/or scattering measurement. In the case of microscopic observation, the phase separation structure can be confirmed by a scanning electron microscope (SEM), an atomic force microscope, an optical microscope, a transmission electron microscope, or the like. Further, in the case of scattering measurement, phase separation structure can be confirmed by small angle incident small angle X-ray scattering measurement, elemental analysis, energy dispersive X-ray analysis, electron probe microanalyzer, X-ray photoelectron spectroscopy, and the like. Whether there is.

又,絕緣層中本發明之相分離結構之有無亦可藉由DMA測定(動態黏彈性測定)來確認。當樹脂成分中橡膠之摻合比不高時,利用該DMA測定的本發明之相分離結構之確認方法為特別有效的方法。舉例言之,當橡膠之摻合比相對於樹脂成分之總質量通常小於50質量%,理想的是40質量%以下時,會成為特別有效的方法。 即,在橡膠形成連續相的本發明之相分離結構之情形時,即便橡膠之摻合比為少量,亦可藉由DMA測定,明確地觀測來自橡膠的峰值。另一方面,在例如像是橡膠粒子般橡膠形成非連續相的逆相分離結構之情形時,若橡膠之摻合比不高,則無法藉由DMA測定檢測出來自橡膠的峰值。吾人推測這是因為在橡膠形成非連續相的逆相分離結構之情形時,若橡膠之摻合比為少量,則樹脂的作用會占有優勢,不易藉由DMA測定觀測來自橡膠的峰值。Further, the presence or absence of the phase separation structure of the present invention in the insulating layer can be confirmed by DMA measurement (dynamic viscoelasticity measurement). When the blending ratio of the rubber in the resin component is not high, the method for confirming the phase-separated structure of the present invention measured by the DMA is a particularly effective method. For example, when the blending ratio of the rubber is usually less than 50% by mass, preferably 40% by mass or less, relative to the total mass of the resin component, it becomes a particularly effective method. That is, in the case of the phase separation structure of the present invention in which the rubber forms the continuous phase, even if the blend ratio of the rubber is small, the peak derived from the rubber can be clearly observed by DMA measurement. On the other hand, in the case of a reverse phase separation structure in which a rubber forms a discontinuous phase like rubber particles, if the blending ratio of the rubber is not high, the peak from the rubber cannot be detected by the DMA measurement. It is assumed that this is because in the case of a reverse phase separation structure in which the rubber forms a discontinuous phase, if the rubber blending ratio is small, the effect of the resin is dominant, and it is difficult to observe the peak from the rubber by DMA measurement.

以下,利用圖1A~圖1E所示照片,說明本發明之相分離結構。在此,圖1A~圖1E所示照片皆為觀察切斷絕緣層並以機械方式研磨其截面者的照片。 圖1A為顯示本發明之相分離結構之一例的掃描式電子顯微鏡(Scanning Electron Microscope;SEM)照片。為了以容易理解的方式說明本發明之相分離結構,圖1A所示相分離結構不含無機填充材。於圖1A所示相分離結構中,非連續相(分散相)的熱硬化性樹脂102分散於連續相的橡膠101中。藉由依此使橡膠構成連續相,如上述,低吸水性與耐氧化劣化性提升。Hereinafter, the phase separation structure of the present invention will be described using the photographs shown in Figs. 1A to 1E. Here, the photographs shown in FIGS. 1A to 1E are photographs of those in which the insulating layer is cut and mechanically polished. Fig. 1A is a scanning electron microscope (SEM) photograph showing an example of a phase separation structure of the present invention. In order to explain the phase separation structure of the present invention in an easily understandable manner, the phase separation structure shown in Fig. 1A does not contain an inorganic filler. In the phase separation structure shown in Fig. 1A, the thermosetting resin 102 of a discontinuous phase (dispersion phase) is dispersed in the rubber 101 of the continuous phase. By thus, the rubber constitutes a continuous phase, and as described above, the low water absorbability and the oxidation deterioration resistance are improved.

相對於此,圖1D的SEM照片顯示與本發明之相分離結構相反的相分離結構(以下稱作「逆相分離結構」等)。於圖1D所示逆相分離結構中,非連續相(分散相)的橡膠粒子112分散於連續相的熱硬化性樹脂111中。於此種逆相分離結構中,即便含有橡膠成分,亦無法獲得上述效果。On the other hand, the SEM photograph of FIG. 1D shows a phase separation structure (hereinafter referred to as "reverse phase separation structure" or the like) which is opposite to the phase separation structure of the present invention. In the reverse phase separation structure shown in Fig. 1D, the rubber particles 112 of the discontinuous phase (dispersion phase) are dispersed in the thermosetting resin 111 of the continuous phase. In such a reverse phase separation structure, even if a rubber component is contained, the above effects cannot be obtained.

圖1B為光學顯微鏡照片,其顯示在本發明之相分離結構中分散有無機填充材的結構之一例。在此,無機填充材使用2種無機填充材103a、103b。無機填充材103a為氮化鋁,由實線包圍的條狀無機填充材103b為氮化硼。由該照片中可自無機填充材103a、103b之間隙或空隙確認本發明之相分離結構。舉例言之,若觀看虛線框A內,則可確認在無機填充材(氮化鋁)103a之空隙中,非連續相(分散相)的熱硬化性樹脂102分散於連續相的橡膠101中。 相對於圖1B所示相分離結構,圖1C為不含橡膠系的光學顯微鏡照片。於圖1C所示結構中,無機填充材(氮化鋁)123a以及由實線包圍的條狀無機填充材(氮化硼)123b分散於連續相的熱硬化性樹脂121中。若觀看虛線框A’內,則可得知無機填充材(氮化鋁)123a之空隙僅由熱硬化性樹脂121填滿。Fig. 1B is an optical micrograph showing an example of a structure in which an inorganic filler is dispersed in the phase separation structure of the present invention. Here, two kinds of inorganic fillers 103a and 103b are used as the inorganic filler. The inorganic filler 103a is aluminum nitride, and the strip-shaped inorganic filler 103b surrounded by a solid line is boron nitride. From the photograph, the phase separation structure of the present invention can be confirmed from the gap or void of the inorganic fillers 103a, 103b. For example, when the inside of the broken line frame A is viewed, it is confirmed that the thermosetting resin 102 of the discontinuous phase (dispersion phase) is dispersed in the rubber 101 of the continuous phase in the void of the inorganic filler (aluminum nitride) 103a. Fig. 1C is an optical microscope photograph without a rubber system with respect to the phase separation structure shown in Fig. 1B. In the structure shown in FIG. 1C, an inorganic filler (aluminum nitride) 123a and a strip-shaped inorganic filler (boron nitride) 123b surrounded by a solid line are dispersed in the continuous phase thermosetting resin 121. When the inside of the broken line frame A' is viewed, it is understood that the void of the inorganic filler (aluminum nitride) 123a is filled only by the thermosetting resin 121.

又,圖1E為SEM照片,其相對於顯示逆相分離結構的圖1D,顯示分散有無機填充材的結構之一例。在此,於連續相的熱硬化性樹脂111中,分散有2種無機填充材,即,無機填充材(氧化鋁)113a以及由虛線包圍的條狀無機填充材(氮化硼)113b與橡膠粒子112。可得知橡膠粒子112並未均勻地分散於2種無機填充材(氧化鋁)113a及無機填充材(氮化硼)113b之間隙。 可於本發明中使用的橡膠只要是常溫下具有橡膠彈性的高分子材料即可,舉例言之,可為常溫(例如25℃)下的彈性模數為100MPa以下者。1E is an SEM photograph showing an example of a structure in which an inorganic filler is dispersed with respect to FIG. 1D showing a reverse phase separation structure. Here, in the continuous phase thermosetting resin 111, two kinds of inorganic fillers, that is, an inorganic filler (alumina) 113a and a strip-shaped inorganic filler (boron nitride) 113b surrounded by a broken line and rubber are dispersed. Particle 112. It is understood that the rubber particles 112 are not uniformly dispersed in the gap between the two inorganic fillers (alumina) 113a and the inorganic filler (boron nitride) 113b. The rubber to be used in the present invention may be any polymer material having rubber elasticity at normal temperature, and may be, for example, a modulus of elasticity of 100 MPa or less at normal temperature (for example, 25 ° C).

於絕緣層中,為了形成本發明之相分離結構,在硬化前的絕緣層用樹脂組成物中,宜構成橡膠與熱硬化性樹脂溶解於溶劑中且相互均勻分散的相溶狀態。若自該狀態加熱而展開熱硬化性樹脂之硬化,則局部上熱硬化性樹脂之分子量增大而黏度提高,最後黏度會高(硬)於橡膠。若由黏度觀點來考察,則更低黏度的成分形成連續相,因此,可形成具有包含橡膠之連續相及包含熱硬化性樹脂之非連續相的本發明之相分離結構。In the insulating layer, in order to form the phase-separated structure of the present invention, it is preferred that the resin composition for the insulating layer before curing be in a state in which the rubber and the thermosetting resin are dissolved in a solvent and uniformly dispersed. When the thermosetting resin is cured by heating in this state, the molecular weight of the thermosetting resin locally increases and the viscosity increases, and finally the viscosity is high (hard) to the rubber. From the viewpoint of viscosity, the lower viscosity component forms a continuous phase, and therefore, the phase separation structure of the present invention having a continuous phase containing rubber and a discontinuous phase containing a thermosetting resin can be formed.

故,若由對溶劑之溶解性之觀點來看,則橡膠之重量平均分子量宜為150萬以下,較為理想的是130萬以下,更為理想的是90萬以下。橡膠之重量平均分子量之下限值並無特殊限制,例如宜為5萬以上。 在此,重量平均分子量表示藉由GPC(凝膠滲透層析術)法所測定的聚苯乙烯換算值。Therefore, from the viewpoint of solubility in a solvent, the weight average molecular weight of the rubber is preferably 1.5,000,000 or less, preferably 1.3 million or less, more preferably 900,000 or less. The lower limit of the weight average molecular weight of the rubber is not particularly limited, and is, for example, preferably 50,000 or more. Here, the weight average molecular weight represents a polystyrene-converted value measured by a GPC (gel permeation chromatography) method.

實施形態中可適當運用的橡膠例如可列舉如下。即,可列舉如:苯乙烯丁二烯橡膠、異戊二烯橡膠、丁二烯橡膠、氯丁二烯橡膠或丙烯腈·丁二烯橡膠等二烯系橡膠;丁基橡膠、乙烯丙烯橡膠、乙烯丙烯二烯橡膠、胺甲酸乙酯橡膠、聚矽氧橡膠、氟橡膠、氯磺化聚乙烯橡膠、氯化聚乙烯、丙烯酸橡膠、多硫化橡膠或表氯醇橡膠等非二烯系橡膠;苯乙烯系、烯烴系、酯系、胺甲酸乙酯系、醯胺系、聚氯乙烯(polyvinyl chloride;PVC)系或氟系等的熱可塑性彈性體;或是天然橡膠等。Examples of the rubber which can be suitably used in the embodiment are as follows. That is, a diene rubber such as styrene butadiene rubber, isoprene rubber, butadiene rubber, chloroprene rubber or acrylonitrile butadiene rubber; butyl rubber or ethylene propylene rubber; Non-diene rubber such as ethylene propylene diene rubber, urethane rubber, polyoxyethylene rubber, fluororubber, chlorosulfonated polyethylene rubber, chlorinated polyethylene, acrylic rubber, polysulfide rubber or epichlorohydrin rubber; A thermoplastic elastomer such as styrene, olefin, ester, urethane, guanamine, polyvinyl chloride (PVC) or fluorine; or natural rubber.

於本發明之實施形態中,橡膠之主鏈宜為飽和結構。在此,主鏈為飽和結構意指聚合物主鏈在碳原子彼此的鍵結中不具雙鍵或三鍵之不飽和鍵的結構。In an embodiment of the invention, the main chain of the rubber is preferably a saturated structure. Here, the main chain is a saturated structure means a structure in which a polymer main chain does not have a double bond or a triple bond unsaturated bond in a bond of carbon atoms to each other.

主鏈為飽和結構的橡膠例如可列舉:丁基橡膠、乙烯丙烯橡膠、乙烯丙烯二烯橡膠、胺甲酸乙酯橡膠、聚矽氧橡膠、氟橡膠、氯磺化聚乙烯橡膠、氯化聚乙烯、丙烯酸橡膠、多硫化橡膠或表氯醇橡膠等非二烯系橡膠;或是苯乙烯系、烯烴系、酯系、胺甲酸乙酯系、醯胺系、PVC系或氟系等的熱可塑性彈性體等。於一實施形態中,特別理想的是丙烯酸橡膠。 絕緣層可單獨含有1種作為橡膠,亦可含有2種以上。Examples of the rubber whose main chain is a saturated structure include butyl rubber, ethylene propylene rubber, ethylene propylene diene rubber, urethane rubber, polyoxyethylene rubber, fluororubber, chlorosulfonated polyethylene rubber, and chlorinated polyethylene. Non-diene rubber such as acrylic rubber, polysulfide rubber or epichlorohydrin rubber; or thermoplastic elastomer such as styrene, olefin, ester, urethane, guanamine, PVC or fluorine. Body and so on. In one embodiment, an acrylic rubber is particularly preferred. The insulating layer may contain one type of rubber alone or two or more types.

構成非連續相的熱硬化性樹脂例如可列舉:氰酸酯樹脂、環氧樹脂、苯酚樹脂、脲樹脂、三聚氰胺樹脂、丙烯酸樹脂、胺甲酸乙酯樹脂、馬來醯亞胺樹脂、苯并 樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、不飽和聚酯樹脂、矽樹脂、酞酸二烯丙酯樹脂、醇酸樹脂等。熱硬化性樹脂可單獨使用1種,亦可併用2種以上。Examples of the thermosetting resin constituting the discontinuous phase include cyanate resin, epoxy resin, phenol resin, urea resin, melamine resin, acrylic resin, urethane resin, maleic imine resin, and benzo. Resin, polyimine resin, polyamidimide resin, unsaturated polyester resin, oxime resin, diallyl phthalate resin, alkyd resin, and the like. The thermosetting resin may be used alone or in combination of two or more.

於本發明之實施形態中,熱硬化性樹脂特別宜為氰酸酯樹脂。氰酸酯樹脂例如可列舉:雙酚型氰酸酯樹脂、酚醛清漆型氰酸酯樹脂。 雙酚型氰酸酯樹脂例如可列舉如:雙酚A型氰酸酯樹脂、雙酚E型苯酚樹脂、四甲基雙酚F型氰酸酯樹脂等。雙酚型氰酸酯樹脂之重量平均分子量並無特殊限制,可為寡聚物或單體。舉例言之,若由耐熱性之觀點來看,則以四甲基雙酚F型氰酸酯樹脂、雙酚A型氰酸酯樹脂、雙酚E型氰酸酯樹脂之順序為優選,若由反應性之觀點來看,則雙酚A型氰酸酯樹脂為優選。In the embodiment of the present invention, the thermosetting resin is particularly preferably a cyanate resin. Examples of the cyanate resin include a bisphenol type cyanate resin and a novolak type cyanate resin. Examples of the bisphenol-type cyanate resin include a bisphenol A type cyanate resin, a bisphenol E type phenol resin, and a tetramethyl bisphenol F type cyanate resin. The weight average molecular weight of the bisphenol type cyanate resin is not particularly limited and may be an oligomer or a monomer. For example, from the viewpoint of heat resistance, the order of tetramethyl bisphenol F type cyanate resin, bisphenol A type cyanate resin, and bisphenol E type cyanate resin is preferable. From the viewpoint of reactivity, a bisphenol A type cyanate resin is preferred.

於本發明之一實施形態中,熱硬化性樹脂宜使用雙酚型氰酸酯樹脂及酚醛清漆型氰酸酯樹脂之混合系。其比率例如宜為以雙酚型氰酸酯樹脂:酚醛清漆型氰酸酯樹脂表示的質量比為11:1~1:1,且更宜為9:1~2:1。In one embodiment of the present invention, a thermosetting resin is preferably a mixed system of a bisphenol-type cyanate resin and a novolak-type cyanate resin. The ratio is preferably, for example, a mass ratio of bisphenol type cyanate resin: novolac type cyanate resin of from 11:1 to 1:1, and more preferably from 9:1 to 2:1.

環氧樹脂例如可列舉:雙酚A型環氧樹脂、雙酚F型環氧樹脂、三型環氧樹脂、聯苯型環氧樹脂、萘型環氧樹脂、雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、苯酚酚醛清漆型環氧樹脂、o-甲酚酚醛清漆型環氧樹脂、聯苯酚醛清漆型環氧樹脂、三苯甲烷型環氧樹脂、二環戊二烯型環氧樹脂、脂環族環氧樹脂、溴化環氧樹脂等分子中具有2個以上環氧基的環氧樹脂等。Examples of the epoxy resin include bisphenol A type epoxy resin, bisphenol F type epoxy resin, and three Type epoxy resin, biphenyl type epoxy resin, naphthalene type epoxy resin, bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, phenol novolak type epoxy resin, O-cresol novolak type epoxy resin, biphenyl novolac type epoxy resin, triphenylmethane type epoxy resin, dicyclopentadiene type epoxy resin, alicyclic epoxy resin, brominated epoxy resin An epoxy resin having two or more epoxy groups in the same molecule.

不過,於本發明之實施形態中,當不含環氧樹脂或是含有環氧樹脂時,其含有率有時宜相對於熱硬化性樹脂之總質量為預定量以下。舉例言之,將熱硬化性樹脂之總質量作為基準,環氧樹脂之含有率宜為0~10質量%,較為理想的是0~7質量%,更為理想的是0~5質量%。However, in the embodiment of the present invention, when the epoxy resin is not contained or the epoxy resin is contained, the content thereof is preferably a predetermined amount or less with respect to the total mass of the thermosetting resin. For example, the content of the epoxy resin is preferably from 0 to 10% by mass, more preferably from 0 to 7% by mass, even more preferably from 0 to 5% by mass, based on the total mass of the thermosetting resin.

如上述,絕緣層之樹脂成分具有由含有熱硬化性樹脂的非連續相與含有橡膠的連續相所構成的相分離結構,若由放熱性之觀點來看,則含有橡膠的連續相之摻合比宜低於含有熱硬化性樹脂的非連續相之摻合比。於一實施形態中,橡膠之摻合比宜相對於樹脂成分之總質量為1~40質量%之範圍,較為理想的是5~30質量%,更為理想的是5~20質量%。As described above, the resin component of the insulating layer has a phase separation structure composed of a discontinuous phase containing a thermosetting resin and a continuous phase containing rubber, and if it is exothermic, blending of a continuous phase containing rubber The ratio is preferably lower than the blend ratio of the discontinuous phase containing the thermosetting resin. In one embodiment, the rubber blending ratio is preferably in the range of 1 to 40% by mass based on the total mass of the resin component, more preferably 5 to 30% by mass, still more preferably 5 to 20% by mass.

於實施形態中,絕緣層與樹脂成分一同地含有無機填充材。該無機填充材例如可列舉:氧化鋁、氮化鋁、氮化硼、氮化矽、氧化鎂、氧化矽等。宜使用選自於該等中的1種或2種以上。無機填充材並無非連續相及連續相的區別而存在於樹脂成分中。即,無機填充材可存在於非連續相中,亦可存在於連續相中,也可以存在於兩者。又,無機填充材亦可橫跨非連續相及連續相而存在。In the embodiment, the insulating layer contains an inorganic filler together with the resin component. Examples of the inorganic filler include alumina, aluminum nitride, boron nitride, tantalum nitride, magnesium oxide, and cerium oxide. One or two or more selected from the group consisting of these are preferably used. The inorganic filler is present in the resin component without distinction between the discontinuous phase and the continuous phase. That is, the inorganic filler may be present in the discontinuous phase, may be present in the continuous phase, or may be present in both. Further, the inorganic filler may exist across the discontinuous phase and the continuous phase.

於含有無機填充材的系統中,會有伴隨著硬化的發熱反應因無機填充材之存在而受到抑制之傾向。具體而言,考慮到反應熱被無機填充材吸收,因此硬化反應變慢,或是因無機填充材的表面官能基而阻礙熱硬化性樹脂之硬化反應等問題。故,亦可使用經表面處理的無機填充材,且宜於與後述效果促進劑之適當組合中使用無機填充材。作為無機填充材之表面處理,舉例言之,可將無機填充材之表面藉由可伴隨著與熱硬化性樹脂反應而化學鍵結的官能基來修飾,或是藉由與熱硬化性樹脂相溶性高的官能基來修飾(例如氰酸酯基、環氧基、胺基、羥基、羧基、乙烯基、苯乙烯基、甲基丙烯酸基、丙烯酸基、脲基、巰基、硫離子基、異氰酸酯基等),例如可運用矽烷耦合處理或電漿處理等。In a system containing an inorganic filler, there is a tendency that the exothermic reaction accompanying hardening is suppressed by the presence of the inorganic filler. Specifically, in consideration of the fact that the reaction heat is absorbed by the inorganic filler, the curing reaction is slow, or the surface functional group of the inorganic filler hinders the curing reaction of the thermosetting resin. Therefore, a surface-treated inorganic filler can also be used, and an inorganic filler is preferably used in an appropriate combination with an effect accelerator described later. As the surface treatment of the inorganic filler, for example, the surface of the inorganic filler may be modified by a functional group which may be chemically bonded to react with the thermosetting resin, or may be compatible with the thermosetting resin. High functional groups for modification (eg cyanate groups, epoxy groups, amine groups, hydroxyl groups, carboxyl groups, vinyl groups, styryl groups, methacrylic groups, acrylic groups, urea groups, mercapto groups, sulfur groups, isocyanate groups) Etc.), for example, decane coupling treatment or plasma treatment can be used.

於實施形態中,將樹脂成分之合計體積作為基準,絕緣層中所含無機填充材之比例宜為50~90體積%。無機填充材之含有率更宜為60~80體積%。若填充率過低,則無法獲得所期望之熱傳導率,並有無機填充材沉澱之傾向。另一方面,若填充率過高,則黏度變得過高而無法製得均勻之塗膜,可能成為氣孔缺陷增加之原因。In the embodiment, the ratio of the inorganic filler contained in the insulating layer is preferably from 50 to 90% by volume based on the total volume of the resin components. The content of the inorganic filler is more preferably 60 to 80% by volume. If the filling rate is too low, the desired thermal conductivity cannot be obtained, and there is a tendency for the inorganic filler to precipitate. On the other hand, if the filling ratio is too high, the viscosity becomes too high to obtain a uniform coating film, which may cause an increase in pore defects.

絕緣層亦可含有硬化促進劑。硬化促進劑並無特殊限制,例如可列舉:苯并 化合物、硼酸鹽錯合物、環烷酸鋅、環烷酸鈷、辛酸錫、辛酸鈷、雙乙醯丙酮鈷(II)、三乙醯丙酮鈷(III)等有機金屬鹽、苯酚、雙酚A、壬基酚等酚化合物等。The insulating layer may also contain a hardening accelerator. The hardening accelerator is not particularly limited, and for example, benzo Compound, borate complex, zinc naphthenate, cobalt naphthenate, tin octoate, cobalt octoate, cobalt (II) acetoacetate, cobalt (III) such as triethyl hydrazine, phenol, bisphenol A, phenolic compounds such as nonylphenol.

苯并 化合物只要是分子內具有至少一個苯并 環者即可。苯并 化合物可使用單體,亦可使用數分子聚合而構成寡聚物狀態者。於一實施形態中,苯并 化合物宜為分子內具有2個以上苯并 環的單體。又,亦可同時使用具有不同結構的複數種苯并 化合物。Benzo The compound has at least one benzoic acid in the molecule The ring can be. Benzo The compound may be a monomer or a polymer which is polymerized to form an oligomer state. In one embodiment, benzo The compound preferably has two or more benzo groups in the molecule. The monomer of the ring. Also, it is also possible to simultaneously use a plurality of benzenes having different structures. Compound.

苯并 化合物例如可列舉:P-d型苯并 、雙酚F型苯并 、F-a型苯并 等,其中,宜為P-d型苯并 。P-d型苯并 具有二苯亞甲基骨架等剛直之骨架,因此,其衍生化合物相較於例如衍生自Ba型苯并 的化合物,可形成具有更良好之熱特性的交聯結構。Benzo The compound may, for example, be a Pd-type benzoate. Bisphenol F type benzo Fa type benzo Etc. Among them, it should be Pd-type benzo . Pd type benzo a rigid skeleton having a diphenylmethylene skeleton, and thus, a derivative compound thereof is derived, for example, from a Ba-type benzene The compound can form a crosslinked structure with better thermal properties.

硼酸鹽錯合物可為磷系硼酸鹽錯合物,亦可為非磷系硼酸鹽錯合物。 磷系硼酸鹽錯合物之例子可列舉如:四苯基鏻四苯硼酸鹽、四苯基鏻四對甲苯硼酸鹽、三-三級丁基鏻四苯硼酸鹽、二-三級丁基甲基鏻四苯硼酸鹽、對甲苯基三苯基鏻四對甲苯硼酸鹽、四苯基鏻四氟硼酸鹽、三苯基膦三苯硼酸鹽等。The borate complex may be a phosphorus borate complex or a non-phosphorus borate complex. Examples of the phosphorus-based borate complex compound include, for example, tetraphenylphosphonium tetraphenylborate, tetraphenylphosphonium tetra-p-toluate borate, tris-tert-butylphosphonium tetraphenylborate, and di-tertiary butylmethyl group. Panthene tetraphenylborate, p-tolyltriphenylphosphonium tetra-p-toluene borate, tetraphenylphosphonium tetrafluoroborate, triphenylphosphine triphenylborate, and the like.

非磷系硼酸鹽錯合物之例子可列舉如:四苯硼酸鈉、吡啶三苯硼酸鹽、2-乙基-4-甲基咪唑四苯硼酸鹽、1,5-重氮雙環[4.3.0]壬烯-5-四苯硼酸鹽、三苯基(n-丁基)硼酸鋰等。Examples of the non-phosphorus borate complex may be, for example, sodium tetraphenylborate, pyridine triphenyl borate, 2-ethyl-4-methylimidazolium tetraphenylborate, 1,5-diazabicyclo[4.3. 0] terpene-5-tetraphenylborate, lithium triphenyl(n-butyl)borate, and the like.

於實施形態中,當絕緣層中添加硬化促進劑時,其含有率可適當地設定。舉例言之,當硬化促進劑使用苯并 化合物時,將熱硬化性樹脂之合計質量作為基準,其含有率宜為1~20質量%,且更宜為5~15質量%。In the embodiment, when a hardening accelerator is added to the insulating layer, the content ratio thereof can be appropriately set. For example, when the hardening accelerator uses benzo In the case of the compound, the content of the thermosetting resin is preferably from 1 to 20% by mass, and more preferably from 5 to 15% by mass, based on the total mass of the thermosetting resin.

於實施形態中,絕緣層更可含有其他成分。絕緣層可含有的其他成分例如可列舉:矽烷耦合劑及鈦耦合劑等耦合劑、離子吸附劑、防沉劑、抗水解劑、調平劑、抗氧化劑等等。In an embodiment, the insulating layer may further contain other components. Examples of other components which may be contained in the insulating layer include a coupling agent such as a decane coupling agent and a titanium coupling agent, an ion adsorbent, an anti-settling agent, an anti-hydrolysis agent, a leveling agent, an antioxidant, and the like.

絕緣層是由樹脂組成物所形成塗膜的硬化物,且前述樹脂組成物至少含有上述樹脂成分及無機填充材。如上述,為了能形成本發明之相分離結構,該樹脂組成物宜構成橡膠與熱硬化性樹脂相互均勻分散的相溶狀態,因此,宜含有可溶解橡膠與樹脂的溶劑。此種溶劑例如可列舉:N,N-二甲基甲醯胺(DMF)、N,N-二甲基乙醯胺、N-甲基-2-吡咯啶酮(NMP)等醯胺系溶劑、1-甲氧基-2-丙醇、乙二醇單甲基醚等醚系溶劑、甲基乙基酮(MEK)、甲基異丁基酮(MIBK)、環己酮、環戊酮等酮系溶劑、甲苯、二甲苯等芳香族系溶劑等。作為其使用形態,可單獨使用1種溶劑,亦可混合使用2種以上。The insulating layer is a cured product of a coating film formed of a resin composition, and the resin composition contains at least the above resin component and an inorganic filler. As described above, in order to form the phase-separated structure of the present invention, the resin composition preferably constitutes a state in which the rubber and the thermosetting resin are uniformly dispersed in each other. Therefore, it is preferred to contain a solvent which can dissolve the rubber and the resin. Examples of such a solvent include amide-based solvents such as N,N-dimethylformamide (DMF), N,N-dimethylacetamide, and N-methyl-2-pyrrolidone (NMP). , an ether solvent such as 1-methoxy-2-propanol or ethylene glycol monomethyl ether, methyl ethyl ketone (MEK), methyl isobutyl ketone (MIBK), cyclohexanone, cyclopentanone A ketone solvent, an aromatic solvent such as toluene or xylene, or the like. One type of solvent may be used alone or two or more types may be used in combination.

形成本發明之相分離結構前的塗膜(例如乾燥膜)宜構成橡膠與熱硬化性樹脂相互均勻分散的相溶狀態,因此,柔軟性高且加工性優異。故,具有歷經此種橡膠與熱硬化性樹脂之相溶狀態所形成本發明之相分離結構的絕緣層具有優異之加工性。The coating film (for example, a dried film) before the formation of the phase separation structure of the present invention preferably constitutes a state in which the rubber and the thermosetting resin are uniformly dispersed in each other, and therefore has high flexibility and excellent workability. Therefore, the insulating layer having the phase separation structure of the present invention formed by the compatibility state of such a rubber and a thermosetting resin has excellent workability.

於實施形態之電路基板用積層板中,金屬基板例如由單體金屬或合金所構成。金屬基板之材料例如可使用鋁、鐵、銅、鋁合金或不鏽鋼。金屬基板更可含有碳等之非金屬。舉例言之,金屬基板2亦可含有已與碳複合化的鋁。又,金屬基板可具有單層結構,亦可具有多層結構。In the laminated board for a circuit board of the embodiment, the metal substrate is made of, for example, a single metal or an alloy. The material of the metal substrate can be, for example, aluminum, iron, copper, aluminum alloy or stainless steel. The metal substrate may further contain a non-metal such as carbon. For example, the metal substrate 2 may also contain aluminum that has been compounded with carbon. Further, the metal substrate may have a single layer structure or a multilayer structure.

金屬基板具有高熱傳導率。典型而言,金屬基板2具有60W·m-1 ·K-1 以上的熱傳導率。 金屬基板可具有可撓性,亦可不具可撓性。金屬基板之厚度例如位於0.2-5mm之範圍內。The metal substrate has high thermal conductivity. Typically, the metal substrate 2 has a thermal conductivity of 60 W·m -1 ·K -1 or more. The metal substrate may or may not be flexible. The thickness of the metal substrate is, for example, in the range of 0.2 to 5 mm.

金屬箔設置於絕緣層上。金屬箔將絕緣層夾在中間而與金屬基板相對向。 金屬箔例如由單體金屬或合金所構成。金屬箔之材料例如可使用銅或鋁。金屬箔之厚度例如為10~500μm之範圍。The metal foil is disposed on the insulating layer. The metal foil sandwiches the insulating layer and faces the metal substrate. The metal foil is composed of, for example, a single metal or an alloy. As the material of the metal foil, for example, copper or aluminum can be used. The thickness of the metal foil is, for example, in the range of 10 to 500 μm.

實施形態之電路基板用積層板例如可藉由以下方法來製造。 首先,將上述樹脂組成物塗佈於金屬基板及金屬箔中之至少一者。樹脂組成物之塗佈例如可利用輥塗法、棒塗法或網版印刷法。可藉由連續方式進行,亦可藉由單板方式進行。The laminate for a circuit board of the embodiment can be produced, for example, by the following method. First, the resin composition is applied to at least one of a metal substrate and a metal foil. The coating of the resin composition can be carried out, for example, by a roll coating method, a bar coating method or a screen printing method. This can be done in a continuous manner or by a single board.

視需要使塗膜乾燥後,以金屬基板與金屬箔夾著塗膜而相對向的方式疊合。再者,將該等進行熱壓。依上述作成而可製得電路基板用積層板。After drying the coating film as needed, the metal substrate and the metal foil are laminated so as to face each other with the coating film interposed therebetween. Furthermore, these are subjected to hot pressing. According to the above, a laminate for a circuit board can be obtained.

於該方法中,藉由將樹脂組成物塗佈於金屬板及金屬箔中之至少一者而形成塗膜,然而,於其他態樣中,亦可將分散液塗佈於PET薄膜等基材上並乾燥,藉此預先形成塗膜,並將其熱轉印於金屬基板及金屬箔之一者。In this method, a coating film is formed by applying a resin composition to at least one of a metal plate and a metal foil. However, in other aspects, the dispersion may be applied to a substrate such as a PET film. The coating film is formed in advance and dried, and is thermally transferred to one of a metal substrate and a metal foil.

其次,說明由上述電路基板用積層板製得的金屬基底電路基板。 圖4中顯示金屬基底電路基板之一實施形態。圖4所示金屬基底電路基板1’由圖2及圖3所示電路基板用積層板1製得,且包含有金屬基板2、絕緣層3及電路圖案4’。電路圖案4’藉由將參照圖2及圖3所說明電路基板用積層板之金屬箔4圖案化而製得。該圖案化例如可藉由於金屬箔4上形成遮罩圖案,並利用蝕刻除去金屬箔4的露出部而製得。金屬基底電路基板1’例如可藉由對先前的電路基板用積層板1之金屬箔4進行上述圖案化,並視需要進行切斷及穿孔加工等加工而製得。Next, a metal base circuit board produced by the above laminated board for a circuit board will be described. An embodiment of a metal base circuit substrate is shown in FIG. The metal base circuit board 1' shown in Fig. 4 is obtained from the laminated board 1 for circuit boards shown in Figs. 2 and 3, and includes a metal substrate 2, an insulating layer 3, and a circuit pattern 4'. The circuit pattern 4' is obtained by patterning the metal foil 4 of the laminated board for a circuit board described with reference to Figs. 2 and 3. This patterning can be obtained, for example, by forming a mask pattern on the metal foil 4 and removing the exposed portion of the metal foil 4 by etching. The metal base circuit board 1' can be obtained by, for example, patterning the metal foil 4 of the conventional circuit board laminate 1 and performing processing such as cutting and punching as necessary.

實施形態之金屬基底電路基板由上述電路基板用積層板製得,因此,低吸水性、加工性及耐氧化劣化性優異。Since the metal base circuit board of the embodiment is obtained from the above-mentioned laminated board for a circuit board, it is excellent in low water absorbability, workability, and oxidation deterioration resistance.

圖5中顯示一實施形態之電力模組。該電力模組100具備包含有金屬基板13c、絕緣層13b及電路圖案13a的本發明一實施形態之金屬基底電路基板13,因此,低吸水性、加工性及耐氧化劣化性優異。在隨著電力元件之高性能化而有發熱溫度增加傾向的現況中,本發明之模組亦可適當地運用在習知電力模組中無法因應的溫度區。A power module of an embodiment is shown in FIG. Since the power module 100 includes the metal base circuit board 13 according to the embodiment of the present invention including the metal substrate 13c, the insulating layer 13b, and the circuit pattern 13a, it is excellent in low water absorption, workability, and oxidation deterioration resistance. In the current situation in which the heat generation temperature tends to increase as the power element is improved in performance, the module of the present invention can also be suitably applied to a temperature zone that cannot be accommodated in a conventional power module.

再者,相較於圖6中顯示一例的習知電力模組200,實施形態之電力模組100因具備金屬基底電路基板13而構成構件(層)減少,全體厚度變薄,因此,可構成更低熱阻且小型化設計。又,由於穿孔、切斷等加工容易,因此,亦具有組裝容易等優點。In addition, compared with the conventional power module 200 shown in FIG. 6, the power module 100 of the embodiment has a reduced number of constituent members (layers) due to the metal base circuit board 13, and the entire thickness is reduced. Lower thermal resistance and miniaturized design. Moreover, since processing such as piercing and cutting is easy, it is also advantageous in that assembly is easy.

實施例 以下,記載本發明之例子。本發明並不限於該等。 <組成物之調製> 合成例1~6:樹脂組成物1~6之調製 將雙酚型氰酸酯樹脂(以下亦稱作「B型氰酸酯樹脂」)(商品名「BA200」;日本龍沙(LONZA)股份有限公司製造)與酚醛清漆型氰酸酯樹脂(以下亦稱作「N型氰酸酯樹脂」)(商品名「PT30」;日本龍沙(LONZA)股份有限公司製造),混合成以質量比計構成B型氰酸酯樹脂:N型氰酸酯樹脂=9:1。相對於所製得氰酸酯樹脂之混合物100質量份,添加下式表示的Pd型苯并 化合物(商品名「Pd型苯并 」;四國化成工業股份有限公司製造)10質量份作為硬化促進劑,並於100℃下攪拌至混合物變得均勻為止,且藉由溶劑甲基乙基酮(MEK)溶液化。EXAMPLES Hereinafter, examples of the present invention will be described. The invention is not limited to the ones. <Preparation of Composition> Synthesis Examples 1 to 6: Preparation of Resin Compositions 1 to 6 A bisphenol-type cyanate resin (hereinafter also referred to as "B-type cyanate resin") (trade name "BA200"; Japan Longsha (LONZA) Co., Ltd.) and a novolac type cyanate resin (hereinafter also referred to as "N-type cyanate resin") (trade name "PT30"; manufactured by Japan Longsha (LONZA) Co., Ltd.) The mixture was mixed to form a B-type cyanate resin in a mass ratio: N-type cyanate resin = 9:1. The Pd-type benzophenone represented by the following formula is added to 100 parts by mass of the mixture of the cyanate resin obtained. Compound (trade name "Pd type benzophenone" 10 parts by mass of a hardening accelerator was stirred at 100 ° C until the mixture became homogeneous, and was solubilized by a solvent methyl ethyl ketone (MEK).

於所製得樹脂溶液中,使橡膠(聚合物主鏈為飽和鍵結的丙烯酸酯共聚物)相對於樹脂成分全體(包含該橡膠)100質量份分別為1、5、10、20、30、40質量份,以及作為填料(無機填充材)的氮化鋁(AlN)與氮化硼(BN)之1:1(質量比)之混合物,相對於樹脂成分全體以合計構成65體積%之方式分散,藉此,調製樹脂組成物1~6。In the obtained resin solution, the rubber (the acrylate copolymer in which the polymer main chain is saturated) is 1, 5, 10, 20, 30 with respect to 100 parts by mass of the entire resin component (including the rubber). 40 parts by mass, and a mixture of 1:1 (mass ratio) of aluminum nitride (AlN) and boron nitride (BN) as a filler (inorganic filler), which is 65 vol% in total with respect to the entire resin component Dispersion, thereby modulating the resin compositions 1 to 6.

[化學式1] [Chemical Formula 1]

合成例7:樹脂組成物1R之調製 將B型氰酸酯樹脂(商品名「BA200」;日本龍沙(LONZA)股份有限公司製造)與N型氰酸酯樹脂(商品名「PT30」;日本龍沙(LONZA)股份有限公司製造),混合成以質量比計構成B型氰酸酯樹脂:N型氰酸酯樹脂=9:1。相對於所製得氰酸酯樹脂之混合物100質量份,添加上述式表示的Pd型苯并 化合物(商品名「Pd型苯并 」;四國化成工業股份有限公司製造)10質量份作為硬化促進劑,並於100℃下攪拌至混合物變得均勻為止,且藉由溶劑乙二醇單甲基醚溶液化。Synthesis Example 7: Preparation of Resin Composition 1R A B-type cyanate resin (trade name "BA200"; manufactured by Japan Longsa (LONZA) Co., Ltd.) and N-type cyanate resin (trade name "PT30"; Japan) Lonza (manufactured by LONZA Co., Ltd.), mixed to form a B-type cyanate resin in a mass ratio: N-type cyanate resin = 9:1. The Pd-type benzoic acid represented by the above formula is added to 100 parts by mass of the mixture of the cyanate resin obtained. Compound (trade name "Pd type benzophenone" 10 parts by mass of a curing accelerator was added at 100 ° C until the mixture became homogeneous, and was dissolved in a solvent ethylene glycol monomethyl ether.

於所製得樹脂溶液中,使氮化鋁(AlN)與氮化硼(BN)之1:1(質量比)之混合物,相對於樹脂成分全體以合計構成65體積%之方式分散,藉此,調製樹脂組成物1R。In the obtained resin solution, a mixture of 1:1 (mass ratio) of aluminum nitride (AlN) and boron nitride (BN) is dispersed so as to be 65 vol% in total with respect to the entire resin component. The resin composition 1R was prepared.

合成例8:樹脂組成物2R之調製 除了相對於氰酸酯樹脂之混合物90質量份添加苯氧樹脂(商品名「YP-500」;新日鐵住金化學股份有限公司製造)10質量份,並混合至變得均勻為止之外,藉由與樹脂組成物1R相同的方法,調製樹脂組成物2R。Synthesis Example 8: Preparation of the resin composition 2R: 10 parts by mass of a phenoxy resin (trade name "YP-500"; manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd.) was added in an amount of 90 parts by mass based on the mixture of the cyanate resin. The resin composition 2R was prepared by the same method as the resin composition 1R except that it was mixed until it became uniform.

合成例9:組成物3R之調製 除了相對於氰酸酯樹脂之混合物90質量份添加丙烯酸橡膠粒子(商品名「UNI-POWDER」;JX能源股份有限公司製造)10質量份,並混合至變得均勻為止之外,藉由與樹脂組成物1R相同的方法,調製樹脂組成物3R。Synthesis Example 9: Preparation of the composition 3R 10 parts by mass of acryl rubber particles (trade name "UNI-POWDER"; manufactured by JX Energy Co., Ltd.) was added to 90 parts by mass of the mixture of the cyanate resin and mixed. The resin composition 3R was prepared by the same method as the resin composition 1R except that it was uniform.

表1中顯示所製得樹脂組成物1~6、1R~3R。又,橡膠之重量平均分子量為藉由GPC法所測定聚苯乙烯換算值。The obtained resin compositions 1 to 6, 1R to 3R are shown in Table 1. Further, the weight average molecular weight of the rubber is a value in terms of polystyrene measured by a GPC method.

[表1] [Table 1]

<積層板之製造> 將上述中所調製各樹脂組成物塗佈於電路用銅箔,使加熱加壓後的厚度構成100μm。接著,使溶劑乾燥後,與構成基底的銅板黏合而進行加熱加壓成形,並製作積層板。<Manufacturing of laminated board> Each of the resin compositions prepared as described above was applied to a copper foil for a circuit, and the thickness after heating and pressurization was 100 μm. Next, after drying the solvent, it is bonded to the copper plate constituting the base, and is subjected to heat and pressure molding to form a laminate.

<相分離結構之確認> 藉由掃描式電子顯微鏡觀察絕緣層之截面,藉此,確認絕緣層中本發明之相分離結構之有無。<Confirmation of Phase Separation Structure> The cross section of the insulating layer was observed by a scanning electron microscope, thereby confirming the presence or absence of the phase separation structure of the present invention in the insulating layer.

其結果,在使用樹脂組成物1~6中任一者的絕緣層(實施例1~6)中,可確認與圖1B相同的相分離結構。相對於此,在使用樹脂組成物1R或2R的絕緣層(比較例1、比較例2)中,無法確認相分離結構。又,在使用樹脂組成物3R的絕緣層(比較例3)中,可確認與圖1E相同的相分離結構(逆相分離結構)。As a result, in the insulating layers (Examples 1 to 6) using any one of the resin compositions 1 to 6, the same phase separation structure as that of FIG. 1B was confirmed. On the other hand, in the insulating layer (Comparative Example 1 and Comparative Example 2) using the resin composition 1R or 2R, the phase separation structure could not be confirmed. Further, in the insulating layer (Comparative Example 3) using the resin composition 3R, the same phase separation structure (reverse phase separation structure) as that of Fig. 1E was confirmed.

再者,亦可藉由運用DMA測定的分析方法,確認絕緣層中本發明之相分離結構之有無。 於DMA測定中,藉由蝕刻,對各積層板除去電路用銅箔與基底銅板,並將已將所製得絕緣層切成寬度3mm×長度50mm之薄長方形狀者作為試樣。測定條件是-50℃~350℃為止以5℃/分進行升溫,並以頻率1Hz、拉伸模式進行測定。將在此所獲得儲存模數與損耗模數之比設為tanδ。Further, the presence or absence of the phase-separated structure of the present invention in the insulating layer can be confirmed by an analysis method using DMA measurement. In the DMA measurement, the copper foil for the circuit and the base copper plate were removed from each of the laminates by etching, and the obtained insulating layer was cut into a thin rectangular shape having a width of 3 mm and a length of 50 mm as a sample. The measurement conditions were carried out at a temperature of 5 ° C / min from -50 ° C to 350 ° C, and the measurement was carried out at a frequency of 1 Hz in a tensile mode. The ratio of the storage modulus to the loss modulus obtained here is set to tan δ.

圖7A為圖表,其顯示針對使用樹脂組成物3的絕緣層(實施例3),藉由DMA測定所獲得tanδ之特性,圖7B為圖表,其顯示針對使用樹脂組成物3R的絕緣層(比較例3),藉由DMA測定所獲得tanδ之特性。7A is a graph showing the characteristics of tan δ obtained by DMA measurement for the insulating layer using the resin composition 3 (Example 3), and FIG. 7B is a graph showing the insulating layer for the resin composition 3R (Comparative) Example 3) The characteristics of tan δ obtained by DMA measurement.

於圖7A所示圖表中,檢測出來自熱硬化性樹脂(氰酸酯樹脂)的峰值T1 與來自橡膠的峰值T2 ,可得知形成本發明之相分離結構。相對於此,於圖7B所示圖表中,由於並未檢測出來自橡膠的峰值,因此,所添加丙烯酸橡膠粒子並未形成連續相,而是以非連續相呈現分散狀態,可得知未形成本發明之相分離結構。In the graph shown in FIG. 7A, peak T detected from a thermosetting resin (cyanate ester resin) of a rubber from the peak T 2, may be that the phase separation structure of the present invention. On the other hand, in the graph shown in FIG. 7B, since the peak derived from the rubber was not detected, the added acrylic rubber particles did not form a continuous phase, but showed a dispersed state in a discontinuous phase, and it was found that the particles were not formed. The phase separation structure of the present invention.

於針對使用樹脂組成物1、2、4~6中任一者的絕緣層(實施例1、2、4~6)之DMA測定中,亦與圖7A相同,檢測出來自熱硬化性樹脂(氰酸酯樹脂)的峰值T1 與來自橡膠的峰值T2 ,可確認形成本發明之相分離結構。In the DMA measurement for the insulating layers (Examples 1, 2, 4 to 6) using any of the resin compositions 1, 2, 4 to 6, the same as in Fig. 7A, the thermosetting resin was detected ( peak cyanate resin) T 1 of the rubber from the peak T 2, confirmed that the phase separation structure of the present invention.

將形成有本發明之相分離結構者設為A,將未形成者設為B,表2中顯示結果。The phase-separated structure in which the present invention was formed was set to A, and the unformed one was set to B, and the results are shown in Table 2.

<評價> 藉由以下所示方法,評價加工性、吸水率、吸水焊料耐電壓及耐熱接著力。表2中顯示結果。又,吸水率小且吸水焊料耐電壓越大,表示低吸水性越優異。又,耐熱接著力越大,表示耐氧化劣化性越優異。<Evaluation> The workability, water absorption, water absorption solder withstand voltage, and heat resistant adhesion were evaluated by the methods shown below. The results are shown in Table 2. Further, the water absorption rate is small and the water absorption solder withstand voltage is larger, indicating that the water absorption is more excellent. Further, the greater the heat resistance adhesion force, the more excellent the oxidation resistance deterioration resistance.

[加工性] 加工性是藉由目視,觀察在利用剪切來切割乾燥膜時塗膜缺口之有無,且前述乾燥膜是將各樹脂組成物塗佈於電路用銅箔,並將其乾燥而形成。 將乾燥膜無缺口者設為A,將乾燥膜有缺口者設為B,表2中顯示結果。 另,可得知乾燥膜無缺口者加工性優異,再者,可得知在使其硬化的絕緣層中加工性亦優異。 [吸水率(質量%)] 藉由蝕刻對各積層板除去電路用銅箔與基底銅板後,針對所製得絕緣層,藉由以下方法測定吸水率。[Processability] The workability is obtained by visually observing the presence or absence of a coating film notch when the dried film is cut by shearing, and the dried film is applied to a copper foil for a circuit and dried. form. The dry film was not set to A, and the dried film was notched to B, and the results are shown in Table 2. Further, it was found that the dry film was excellent in the workability without being nicked, and further, it was found that the workability was also excellent in the insulating layer which was cured. [Water absorption ratio (% by mass)] After the copper foil for the circuit and the base copper plate were removed from each of the laminates by etching, the water absorption ratio was measured by the following method for the obtained insulating layer.

於溫度100℃下乾燥24小時後,測定絕緣層之質量。然後,於溫度85℃、濕度85%之條件下吸濕24小時後,再度測定絕緣層之質量。算出吸濕前後的質量增加率,並將其設為吸水率。After drying at a temperature of 100 ° C for 24 hours, the quality of the insulating layer was measured. Then, after absorbing moisture for 24 hours under the conditions of a temperature of 85 ° C and a humidity of 85%, the quality of the insulating layer was measured again. The mass increase rate before and after moisture absorption was calculated and set as the water absorption rate.

[吸水焊料耐電壓(kV)] 蝕刻各積層板之電路用銅箔面,並形成Φ20mm之電路圖案。於40℃98%之環境氣體下讓Φ20mm之電路圖案吸水24小時。接著,浮在280℃之焊料浴5分鐘後,藉由以下方法測定破壞電壓,藉此,獲得吸水焊料耐電壓。[Water-absorbing solder withstand voltage (kV)] The copper foil surface of the circuit for each laminated board was etched, and a circuit pattern of Φ20 mm was formed. The circuit pattern of Φ20 mm was allowed to absorb water for 24 hours under an ambient gas of 98% at 40 °C. Next, after floating in a solder bath of 280 ° C for 5 minutes, the breakdown voltage was measured by the following method, whereby the water absorption solder withstand voltage was obtained.

於Φ20mm之電路圖案與背面之銅板間,在絕緣油中施加交流電壓而測定耐電壓。自起始電壓每次500V提高電壓,並以各電壓每次施加20秒鐘,一面反覆該作業,一面逐步升壓,並測定破壞電壓。An withstand voltage was measured by applying an alternating voltage to the insulating oil between the circuit pattern of Φ20 mm and the copper plate on the back side. The voltage was increased from the initial voltage of 500 V each time, and each time the voltage was applied for 20 seconds, the operation was repeated, and the voltage was gradually increased, and the breakdown voltage was measured.

[耐熱接著力(MPa)] 蝕刻各積層板之電路用銅箔面,並形成Φ4mm之電路圖案。於大氣環境中,在200℃下將該電路圖案放置1000小時後,藉由以下方法,測定電路圖案之垂直剝落強度,藉此獲得耐熱接著力。[Heat Resistance Adhesion (MPa)] The copper foil surface of the circuit for each laminated board was etched, and a circuit pattern of Φ4 mm was formed. In the atmospheric environment, after the circuit pattern was placed at 200 ° C for 1000 hours, the vertical peeling strength of the circuit pattern was measured by the following method, whereby heat-resistant adhesion was obtained.

將附環氧接著劑之螺柱銷垂直固定於Φ4mm之電路圖案上,並以150℃加熱1小時,藉此使其硬化接著,並製作拉伸試驗之試樣。接著,將試樣固定於拉伸試驗機,並朝垂直方向拉伸螺柱銷,自電路圖案剝離時的負載與接著面積算出接著力,藉此,測定電路圖案之垂直剝落強度。A stud pin with an epoxy adhesive was vertically fixed on a circuit pattern of Φ 4 mm, and heated at 150 ° C for 1 hour, thereby hardening it, and a tensile test sample was prepared. Next, the sample was fixed to a tensile tester, and the stud pin was pulled in the vertical direction, and the contact force was calculated from the load and the contact area at the time of peeling off from the circuit pattern, whereby the vertical peeling strength of the circuit pattern was measured.

[表2] [Table 2]

由表2可得知,本發明實施形態的實施例1~6加工性優異。 又,可得知本發明實施形態的實施例1~6之吸水率小,且吸水焊料耐電壓大,因此,低吸水性亦優異。 又,可得知本發明實施形態的實施例1~6之耐熱接著力大,因此,耐氧化劣化性亦優異。As is clear from Table 2, Examples 1 to 6 of the embodiment of the present invention are excellent in workability. Further, it is found that Examples 1 to 6 of the embodiment of the present invention have a small water absorption rate and a large water-resistant solder withstand voltage, and therefore, are excellent in low water absorption. Further, it can be seen that Examples 1 to 6 of the embodiment of the present invention have a large heat-resistance adhesion force, and therefore are excellent in oxidation deterioration resistance.

另,本發明並不限於上述實施形態,實施階段中可於未脫離其要旨之範圍內進行各種變形。又,各實施形態亦可盡可能地適當組合來實施,此時可獲得組合之效果。再者,上述實施形態中包含各種階段之發明,藉由所揭示複數個構成要件中適當之組合,可提出各種發明。舉例言之,當即便自實施形態所示全體構成要件中刪除數個構成要件,亦可解決發明欲解決之課題欄中所述課題,且可獲得發明效果欄中所述效果時,刪除該構成要件的結構可提出作為發明。The present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the spirit and scope of the invention. Further, each embodiment can be implemented as appropriate as possible, and the effect of the combination can be obtained. Furthermore, the above-described embodiments include various stages of the invention, and various inventions can be proposed by appropriate combinations of the plurality of constituent elements disclosed. For example, even if several constituent elements are deleted from the entire constituent elements shown in the embodiment, the problem described in the column to be solved by the invention can be solved, and when the effect described in the effect field of the invention can be obtained, the composition is deleted. The structure of the requirements can be proposed as an invention.

1‧‧‧電路基板用積層板1‧‧‧Laminated boards for circuit boards

1’、13‧‧‧金屬基底電路基板1', 13‧‧‧ metal base circuit substrate

2、13c、27‧‧‧金屬基板2, 13c, 27‧‧‧ metal substrate

3、13b‧‧‧絕緣層3, 13b‧‧‧ insulation

4‧‧‧金屬箔4‧‧‧metal foil

4’、13a、23‧‧‧電路圖案4', 13a, 23‧‧‧ circuit patterns

11、21‧‧‧電力元件11, 21‧‧‧ Power components

12‧‧‧焊料層12‧‧‧ solder layer

14、28‧‧‧放熱片14, 28‧‧ ‧ heat release film

15、29‧‧‧散熱裝置15, 29‧‧‧ Heat sink

22‧‧‧第一焊料層22‧‧‧First solder layer

24‧‧‧陶瓷基板24‧‧‧Ceramic substrate

25‧‧‧金屬化層25‧‧‧metallization

26‧‧‧第二焊料層26‧‧‧Second solder layer

100‧‧‧電力模組100‧‧‧Power Module

101‧‧‧連續相(橡膠)101‧‧‧Continuous phase (rubber)

102‧‧‧非連續相(熱硬化性樹脂)102‧‧‧ discontinuous phase (thermosetting resin)

103a、123a‧‧‧無機填充材(氮化鋁)103a, 123a‧‧‧Inorganic filler (aluminum nitride)

103b、113b、123b‧‧‧無機填充材(氮化硼)103b, 113b, 123b‧‧‧Inorganic filler (boron nitride)

111、121‧‧‧連續相(熱硬化性樹脂)111, 121‧‧‧Continuous phase (thermosetting resin)

112‧‧‧非連續相(橡膠粒子)112‧‧‧ discontinuous phase (rubber particles)

113a‧‧‧無機填充材(氧化鋁)113a‧‧Inorganic filler (alumina)

200‧‧‧習知電力模組200‧‧‧Knowledge Power Module

A、A’‧‧‧虛線框A, A’‧‧‧ dotted box

圖1A為SEM照片,其顯示由連續相之橡膠與非連續相之熱硬化性樹脂所構成的相分離結構之一例。 圖1B為光學顯微鏡照片,其顯示在由連續相之橡膠與非連續相之熱硬化性樹脂所構成的相分離結構中分散有無機填充材的結構之一例。 圖1C為光學顯微鏡照片,其顯示在連續相之熱硬化性樹脂中分散有無機填充材的結構之一例。 圖1D為SEM照片,其顯示由連續相之熱硬化性樹脂與非連續相之橡膠粒子所構成的相分離結構之一例。 圖1E為SEM照片,其顯示在由連續相之熱硬化性樹脂與非連續相之橡膠粒子所構成的相分離結構中分散有無機填充材的結構之一例。 圖2為示意顯示本發明之實施形態的電路基板用積層板之立體圖。 圖3為沿著圖2所示電路基板用積層板之II-II線之截面圖。 圖4為示意顯示由圖2及圖3所示電路基板用積層板製得的金屬基底電路基板之一例之截面圖。 圖5為示意顯示本發明之實施形態的電力模組之截面圖。 圖6為示意顯示習知電力模組之截面圖。 圖7A為圖表,其顯示針對實施例3之電路基板用積層體中所含絕緣層,藉由DMA測定所獲得tanδ之特性。 圖7B為圖表,其顯示針對比較例3之電路基板用積層體中所含絕緣層,藉由DMA測定所獲得tanδ之特性。Fig. 1A is a SEM photograph showing an example of a phase separation structure composed of a rubber of a continuous phase and a thermosetting resin of a discontinuous phase. Fig. 1B is an optical micrograph showing an example of a structure in which an inorganic filler is dispersed in a phase separation structure composed of a rubber of a continuous phase and a thermosetting resin of a discontinuous phase. Fig. 1C is an optical micrograph showing an example of a structure in which an inorganic filler is dispersed in a thermosetting resin in a continuous phase. Fig. 1D is a SEM photograph showing an example of a phase separation structure composed of a thermosetting resin of a continuous phase and rubber particles of a discontinuous phase. Fig. 1E is a SEM photograph showing an example of a structure in which an inorganic filler is dispersed in a phase separation structure composed of a thermosetting resin of a continuous phase and rubber particles of a discontinuous phase. FIG. 2 is a perspective view schematically showing a laminated board for a circuit board according to an embodiment of the present invention. Fig. 3 is a cross-sectional view taken along line II-II of the laminated board for circuit board shown in Fig. 2; 4 is a cross-sectional view schematically showing an example of a metal base circuit substrate obtained by laminating sheets for circuit boards shown in FIGS. 2 and 3. Fig. 5 is a cross-sectional view schematically showing a power module according to an embodiment of the present invention. Figure 6 is a cross-sectional view schematically showing a conventional power module. FIG. 7A is a graph showing the characteristics of tan δ obtained by DMA measurement of the insulating layer contained in the laminated body for a circuit board of Example 3. FIG. FIG. 7B is a graph showing the characteristics of tan δ obtained by DMA measurement of the insulating layer contained in the laminated body for a circuit board of Comparative Example 3.

Claims (10)

一種電路基板用積層板,具備: 金屬基板; 絕緣層,其設置於該金屬基板之至少單面上;及 金屬箔,其設置於該絕緣層上; 前述絕緣層含有樹脂成分及無機填充材,且前述樹脂成分具有相分離結構,該相分離結構包括含有熱硬化性樹脂的非連續相及含有橡膠的連續相。A laminated board for a circuit board, comprising: a metal substrate; an insulating layer provided on at least one surface of the metal substrate; and a metal foil provided on the insulating layer; wherein the insulating layer contains a resin component and an inorganic filler; Further, the resin component has a phase separation structure including a discontinuous phase containing a thermosetting resin and a continuous phase containing rubber. 如請求項1之電路基板用積層板,其中前述橡膠至少含有重量平均分子量為150萬以下的橡膠。The laminate for a circuit board according to claim 1, wherein the rubber contains at least a rubber having a weight average molecular weight of 1.5 million or less. 如請求項1之電路基板用積層板,其中前述橡膠至少含有主鏈為飽和構造的橡膠。The laminate for a circuit board according to claim 1, wherein the rubber contains at least a rubber having a saturated structure in the main chain. 如請求項1之電路基板用積層板,其中前述橡膠至少含有丙烯酸橡膠。A laminate for a circuit board according to claim 1, wherein the rubber contains at least an acrylic rubber. 如請求項1之電路基板用積層板,其中前述絕緣層中前述橡膠之摻合比相對於前述樹脂成分之總質量為1~40質量%。The laminate for a circuit board according to claim 1, wherein a blending ratio of the rubber in the insulating layer is 1 to 40% by mass based on the total mass of the resin component. 如請求項1之電路基板用積層板,其中前述熱硬化性樹脂至少含有氰酸酯樹脂。The laminate for a circuit board according to claim 1, wherein the thermosetting resin contains at least a cyanate resin. 如請求項1之電路基板用積層板,其中前述熱硬化性樹脂含有雙酚型氰酸酯樹脂及酚醛清漆型氰酸酯樹脂。The laminate for a circuit board according to claim 1, wherein the thermosetting resin contains a bisphenol type cyanate resin and a novolac type cyanate resin. 如請求項1之電路基板用積層板,其中作為前述熱硬化性樹脂之環氧樹脂之摻合比相對於前述熱硬化性樹脂之總質量為0~10質量%。The laminate for a circuit board according to claim 1, wherein a blending ratio of the epoxy resin as the thermosetting resin is from 0 to 10% by mass based on the total mass of the thermosetting resin. 一種金屬基底電路基板,係藉由將如請求項1至8中任一項之電路基板用積層板具備的前述金屬箔圖案化而製得。A metal base circuit board is obtained by patterning the metal foil provided in the laminated board for a circuit board according to any one of claims 1 to 8. 一種電力模組,具備如請求項9之金屬基底電路基板。A power module comprising the metal base circuit substrate of claim 9.
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