TW201832919A - Low refractive index layer-containing adhesive sheet, method for producing low refractive index layer-containing adhesive sheet, and optical device - Google Patents

Low refractive index layer-containing adhesive sheet, method for producing low refractive index layer-containing adhesive sheet, and optical device Download PDF

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TW201832919A
TW201832919A TW107102019A TW107102019A TW201832919A TW 201832919 A TW201832919 A TW 201832919A TW 107102019 A TW107102019 A TW 107102019A TW 107102019 A TW107102019 A TW 107102019A TW 201832919 A TW201832919 A TW 201832919A
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gel
refractive index
layer
index layer
solvent
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TW107102019A
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TWI756341B (en
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服部大輔
中村恒三
森島諒太
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日商日東電工股份有限公司
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    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/10Optical coatings produced by application to, or surface treatment of, optical elements
    • G02B1/11Anti-reflection coatings
    • G02B1/111Anti-reflection coatings using layers comprising organic materials
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/0001Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings specially adapted for lighting devices or systems
    • G02B6/0011Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings specially adapted for lighting devices or systems the light guides being planar or of plate-like form
    • G02B6/0033Means for improving the coupling-out of light from the light guide
    • G02B6/005Means for improving the coupling-out of light from the light guide provided by one optical element, or plurality thereof, placed on the light output side of the light guide
    • G02B6/0055Reflecting element, sheet or layer
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/20Adhesives in the form of films or foils characterised by their carriers
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/20Adhesives in the form of films or foils characterised by their carriers
    • C09J7/22Plastics; Metallised plastics
    • C09J7/26Porous or cellular plastics
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/0001Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings specially adapted for lighting devices or systems
    • G02B6/0011Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings specially adapted for lighting devices or systems the light guides being planar or of plate-like form
    • G02B6/0065Manufacturing aspects; Material aspects
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2203/00Applications of adhesives in processes or use of adhesives in the form of films or foils
    • C09J2203/318Applications of adhesives in processes or use of adhesives in the form of films or foils for the production of liquid crystal displays
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/10Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet
    • C09J2301/12Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet by the arrangement of layers
    • C09J2301/124Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet by the arrangement of layers the adhesive layer being present on both sides of the carrier, e.g. double-sided adhesive tape
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/30Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier
    • C09J2301/302Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier the adhesive being pressure-sensitive, i.e. tacky at temperatures inferior to 30°C
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/30Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier
    • C09J2301/312Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier parameters being the characterizing feature
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2483/00Presence of polysiloxane
    • C09J2483/006Presence of polysiloxane in the substrate
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B2207/00Coding scheme for general features or characteristics of optical elements and systems of subclass G02B, but not including elements and systems which would be classified in G02B6/00 and subgroups
    • G02B2207/107Porous materials, e.g. for reducing the refractive index
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B2207/00Coding scheme for general features or characteristics of optical elements and systems of subclass G02B, but not including elements and systems which would be classified in G02B6/00 and subgroups
    • G02B2207/109Sols, gels, sol-gel materials

Abstract

The purpose of this invention is to provide a low refractive index layer-containing adhesive sheet, which is thin and which has a low refractive index. In order to achieve this purpose, this low refractive index layer-containing adhesive sheet is characterized by being obtained by laminating, in the following order, a first adhesive layer, a low refractive index layer, and a second adhesive layer, the refractive index of the low refractive index layer not exceeding 1.25.

Description

含低折射率層之黏接著片材、含低折射率層之黏接著片材之製造方法及光學組件Adhesive sheet with low refractive index layer, method for manufacturing adhesive sheet with low refractive index layer, and optical component

本發明是關於含低折射率層之黏接著片材、含低折射率層之黏接著片材之製造方法及光學組件。The invention relates to an adhesive sheet with a low refractive index layer, a method for manufacturing an adhesive sheet with a low refractive index layer, and an optical component.

光學組件中,舉例來說,係利用作為低折射率的空氣層作成全反射層。具體而言,例如液晶組件中的各光學薄膜構件(如導光板與反射板)係隔著空氣層而積層。然而,一旦各構件間利用空氣層隔開,則尤其是在構件為大型等情況下,恐有構件撓曲等問題發生。又因組件薄型化的趨勢,而期望各構件的一體化。因此,已在實施不隔著空氣層而以黏接著劑將各構件一體化的方式(例如專利文獻1)。但是一旦沒有發揮全反射效果的空氣層,便恐有漏光等光學特性低落的可能。In the optical component, for example, a total reflection layer is formed by using an air layer having a low refractive index. Specifically, for example, each optical film member (such as a light guide plate and a reflection plate) in a liquid crystal module is laminated with an air layer interposed therebetween. However, once the members are separated by an air layer, problems such as deflection of the members may occur particularly when the members are large. In addition, due to the trend of thinner components, the integration of various components is expected. Therefore, a method of integrating each member with an adhesive without an air layer (for example, Patent Document 1) has been implemented. However, if there is no air layer exhibiting the total reflection effect, the optical characteristics such as light leakage may be deteriorated.

對此,有人提出使用低折射率層來代替空氣層的方式。例如,專利文獻2記載,在導光板與反射板之間插入折射率較導光板低的層。In response, a method of using a low refractive index layer instead of an air layer has been proposed. For example, Patent Document 2 describes that a layer having a lower refractive index than the light guide plate is inserted between the light guide plate and the reflection plate.

先前技術文獻 專利文獻 專利文獻1:日本特開第2012-156082號公報 專利文獻2:日本特開平10-62626號公報Prior Art Literature Patent Literature Patent Literature 1: Japanese Patent Application Laid-Open No. 2012-156082 Patent Literature 2: Japanese Patent Application Laid-Open No. 10-62626

發明欲解決之課題 低折射率層係形成於基材上使用。因此,於光學組件各構件間配置低折射率層時,同時亦會配置前述基材,導致光學組件的厚度增加。倘若僅有低折射率層則強度不足,故容易遭受物理性損傷而操作不易。Problem to be Solved by the Invention A low refractive index layer is formed on a substrate and used. Therefore, when a low-refractive-index layer is disposed between various components of the optical component, the aforementioned substrate is also disposed, which results in an increase in the thickness of the optical component. If there is only a low refractive index layer, the strength is insufficient, so it is easy to suffer physical damage and difficult to handle.

爰此,本發明之目的在於提供薄型且低折射率的含低折射率層之黏接著片材、含低折射率層之黏接著片材之製造方法及光學組件。Therefore, an object of the present invention is to provide a thin and low-refractive-index adhesive sheet containing a low-refractive index layer, a method for manufacturing an adhesive sheet including a low-refractive index layer, and an optical component.

用以解決課題之手段 為達成前述目的,本發明之含低折射率層之黏接著片材的特徵在於依序積層有第1黏接著層、低折射率層及第2黏接著層,且前述低折射率層之折射率為1.25以下。Means for solving the problem In order to achieve the foregoing object, the adhesive sheet with a low refractive index layer of the present invention is characterized in that a first adhesive layer, a low refractive index layer, and a second adhesive layer are sequentially laminated, and the foregoing The refractive index of the low refractive index layer is 1.25 or less.

本發明之第1含低折射率層之黏接著片材之製造方法,為前述本發明之含低折射率層之黏接著片材之製造方法,其包含下述步驟:低折射率層形成步驟,於轉印用樹脂薄膜基材上形成前述低折射率層;及轉印步驟,將前述低折射率層轉印至前述黏接著層上。The first method for manufacturing a low-refractive index layer-containing adhesive sheet of the present invention is the aforementioned method for manufacturing the low-refractive index layer-containing adhesive sheet of the present invention, which includes the following steps: a low-refractive index layer forming step Forming the low-refractive index layer on the transfer resin film substrate; and a transferring step of transferring the low-refractive index layer to the adhesive layer.

本發明之第2含低折射率層之黏接著片材之製造方法,為前述本發明之含低折射率層之黏接著片材之製造方法,其包含下述步驟:塗覆步驟,於前述黏接著層上直接塗覆屬前述低折射率層原料的塗覆液;及乾燥步驟,將前述塗覆液乾燥。The second method for manufacturing a low-refractive-index-containing adhesive sheet of the present invention is the aforementioned method for manufacturing the low-refractive-index-containing adhesive sheet of the present invention, which includes the following steps: a coating step, Directly coating the coating liquid that is the raw material of the low refractive index layer on the adhesive layer; and drying the coating liquid on the step of drying.

本發明之光學組件的特徵在於包含:含低折射率層之黏接著片材、第1光學機能層及第2光學機能層,且前述第1光學機能層係貼附於前述第1黏接著層之位在與前述低折射率層相反側之面上,前述第2光學機能層係貼附於前述第2黏接著層之位在與前述低折射率層相反側之面上。The optical component of the present invention is characterized by comprising an adhesive sheet including a low refractive index layer, a first optical function layer and a second optical function layer, and the first optical function layer is attached to the first adhesive layer. The position is on the side opposite to the low refractive index layer, and the second optical function layer is attached to the second adhesive layer on the side opposite to the low refractive index layer.

發明效果 依據本發明,可提供薄型且低折射率的含低折射率層之黏接著片材、含低折射率層之黏接著片材之製造方法及光學組件。Effects of the Invention According to the present invention, it is possible to provide a thin, low-refractive-index adhesive sheet containing a low-refractive index layer, a method for manufacturing an adhesive sheet including a low-refractive index layer, and an optical component.

接下來舉例以進一步具體說明本發明。惟本發明不受以下說明之任何限制。The following examples further illustrate the present invention. However, the present invention is not limited in any way by the following description.

本發明之含低折射率層之黏接著片材中,舉例來說,前述第1黏接著層及前述第2黏接著層之合計厚度,相對於前述第1黏接著層、前述低折射率層及前述第2黏接著層之合計厚度可為例如85%以上、88%以上、90%以上或92%以上,並可為例如99.9%以下、99.5%以下、99.3%以下、或99.2%以下。In the adhesive sheet with a low refractive index layer of the present invention, for example, the total thickness of the first adhesive layer and the second adhesive layer is larger than that of the first adhesive layer and the low refractive index layer. The total thickness of the second adhesive layer may be, for example, 85% or more, 88% or more, 90% or 92% or more, and may be, for example, 99.9% or less, 99.5% or less, 99.3% or less, or 99.2% or less.

本發明之含低折射率層之黏接著片材中,舉例來說,前述第1黏接著層、前述低折射率層及前述第2黏接著層之積層體的光穿透率可為80%以上。又例如,前述第1黏接著層、前述低折射率層及前述第2黏接著層之積層體的霧度可為3%以下。前述光穿透率可為例如82%以上、84%以上、86%以上或88%以上,其上限沒有特別限定,理想上為100%,可為例如95%以下、92%以下、91%以下或90%以下。前述積層體之霧度的測定,舉例來說,可使用與後述低折射率層之霧度測定相同的方法來。又,前述光穿透率為波長550nm之光的穿透率,例如可利用以下測定方法來測定。In the adhesive sheet with a low refractive index layer of the present invention, for example, the light transmittance of the laminated body of the first adhesive layer, the low refractive index layer, and the second adhesive layer may be 80%. the above. For another example, the haze of the laminated body of the first adhesive layer, the low refractive index layer, and the second adhesive layer may be 3% or less. The light transmittance may be, for example, 82% or more, 84% or more, 86% or more, or 88% or more. The upper limit is not particularly limited, and is preferably 100%, and may be, for example, 95% or less, 92% or less, and 91% or less. Or below 90%. The measurement of the haze of the laminated body can be performed by the same method as the haze measurement of the low-refractive index layer described later, for example. The light transmittance of the light having a wavelength of 550 nm can be measured by, for example, the following measurement method.

(光穿透率之測定方法) 使用分光光度計U-4100(日立製作所股份公司之商品名),以含低折射率層之黏接著片材未貼有分離件的狀態(前述第1黏接著層、前述低折射率層及前述第2黏接著層之積層體)作成測定對象之試樣。然後測定以空氣之全光線穿透率為100%時的前述試樣之全光線穿透率(光穿透率)。前述全光線穿透率(光穿透率)之値,係以波長550nm下之測定値作為其値。(Measurement method of light transmittance) Using a spectrophotometer U-4100 (trade name of Hitachi, Ltd.) in a state where the adhesive sheet with a low refractive index layer is not attached with a separator (the aforementioned first adhesive bond Layer, the low-refractive index layer, and the second laminated body) were used as samples for measurement. Then, the total light transmittance (light transmittance) of the aforementioned sample at a total light transmittance of 100% of air was measured. The 値 of the total light transmittance (light transmittance) refers to the 以 measured at a wavelength of 550 nm.

本發明之含低折射率層之黏接著片材中,舉例來說,前述低折射率層亦可為空隙層。In the adhesive sheet with a low refractive index layer of the present invention, for example, the aforementioned low refractive index layer may also be a void layer.

本發明之含低折射率層之黏接著片材,舉例來說,可在前述第1黏接著層及前述第2黏接著層中至少一者之位在與前述低折射率層相反側之面上貼附有分離件。In the adhesive sheet with a low refractive index layer of the present invention, for example, at least one of the first adhesive layer and the second adhesive layer may be on a surface opposite to the low refractive index layer. Separate pieces are attached.

本發明之第1含低折射率層之黏接著片材之製造方法,如前所述,為前述本發明之含低折射率層之黏接著片材之製造方法,其包含下述步驟:低折射率層形成步驟,於轉印用樹脂薄膜基材上形成前述低折射率層;及轉印步驟,將前述低折射率層轉印至前述黏接著層上。此外,一般常將厚度較低者稱為「薄膜」而厚度較高者稱為「片材」以示區別,惟本發明中將「薄膜」與「片材」視為無特別區別之詞。The first manufacturing method of the low-refractive-index-containing adhesive sheet of the present invention is, as described above, the aforementioned method of manufacturing the low-refractive-index-containing adhesive sheet of the present invention, which includes the following steps: A step of forming a refractive index layer forms the aforementioned low refractive index layer on the transfer resin film substrate; and a step of transferring the aforementioned low refractive index layer onto the adhesive layer. In addition, the lower thickness is often referred to as a "film" and the higher thickness is often referred to as a "sheet" to distinguish between them. However, in the present invention, the term "film" and "sheet" are considered to have no special difference.

本發明中,第1含低折射率層之黏接著片材之製造方法可例如進一步具有分離件貼附步驟:於前述黏接著層之位在與前述低折射率層相反側之面上添附前述分離件。In the present invention, the first method for manufacturing a low-refractive index adhesive sheet may further include, for example, a step of attaching a separator: adding the foregoing to the adhesive layer on a surface opposite to the low-refractive index layer Separate pieces.

本發明中,第1含低折射率層之黏接著片材之製造方法可例如進一步具有轉印用樹脂薄膜基材剝離步驟:於前述分離件貼附步驟後,將前述轉印用樹脂薄膜基材剝離。於此情形時,前述分離件與前述黏接著層的剝離力,宜大於前述轉印用樹脂薄膜基材與前述低折射率層之剝離力。In the present invention, the first method for producing a low-refractive-index-adhesive sheet may further include, for example, a transfer resin film substrate peeling step: after the separation member attaching step, the transfer resin film base材 peeling. In this case, the peeling force of the separator and the adhesive layer should preferably be greater than the peeling force of the transfer resin film substrate and the low refractive index layer.

本發明之第1含低折射率層之黏接著片材之製造方法中,舉例來說,前述轉印用樹脂薄膜基材可由含脂環式結構之樹脂或含脂肪族結構之樹脂形成。從對於形成低折射率層時之加熱乾燥等有耐久性的觀點來看,尤為理想的是耐熱性優良的含脂環式結構之樹脂。前述含脂肪族結構之樹脂沒有特別限定,可舉例如聚烯烴、聚丙烯、聚甲基戊烯等。前述含脂環式結構之樹脂沒有特別限定,可舉例如聚降莰烯、環狀烯烴共聚物等。In the first method for producing an adhesive sheet with a low refractive index layer according to the present invention, for example, the aforementioned resin film substrate for transfer may be formed of a resin containing an alicyclic structure or a resin containing an aliphatic structure. From the viewpoint of durability such as heat-drying when forming a low refractive index layer, an alicyclic structure-containing resin excellent in heat resistance is particularly desirable. The aforementioned aliphatic structure-containing resin is not particularly limited, and examples thereof include polyolefin, polypropylene, and polymethylpentene. The resin having an alicyclic structure is not particularly limited, and examples thereof include polynorbornene and a cyclic olefin copolymer.

本發明之光學組件並無特別限定,可舉例如液晶顯示器、有機EL(Electro Luminescence, 電致發光)顯示器、微型LED(Light Emitting Diode, 發光二極體)顯示器、有機EL照明等。The optical component of the present invention is not particularly limited, and examples thereof include a liquid crystal display, an organic EL (Electro-Luminescence) display, a micro LED (Light Emitting Diode) display, and organic EL lighting.

如前所述,若欲於低折射率層固定於基材上之狀態下直接操作處理,便會因基材厚度而讓包含低折射率層之總厚度大幅增加,故在將低折射率層組裝入組件中使用時,薄型化之關鍵的組件本身厚度也因而增加。As mentioned above, if the low refractive index layer is fixed to the substrate for direct operation, the total thickness of the low refractive index layer will be greatly increased due to the thickness of the substrate. When the package is used in a module, the thickness of the key component that is thinner is increased.

相對於此,本發明之含低折射率層之黏接著片材係例如藉著不含基材而能夠薄型化。具體而言,例如藉由不含基材,而能在前述黏接著層本身厚度以外的厚度幾無增加下,將低折射率層機能導入組件中。又,本發明之含低折射率層之黏接著片材,因於前述本發明之低折射率層的單面或兩面直接積層有前述黏接著層,故前述低折射率層受前述黏接著層保護而免於物理性損傷。因此,可避免低折射率層的脆弱成為致命性問題。尤其,可利用前述黏接著層彌補前述低折射率層的耐擦傷性,而能保護前述低折射率層免於擦傷。而且,本發明之含低折射率層之黏接著片材可利用前述黏接著層貼附於其他構件,故易於將前述低折射率層本身導入組件中。即,依據本發明之含低折射率層之黏接著片材,舉例來說,易於維持原本具高空隙率之低折射率層下使薄型化與低折射率層之物理性保護成為可能,亦進一步於維持原本之高透明性下將低折射率層所具有之機能導入其他組件中。On the other hand, the low-refractive-index-layer-containing adhesive sheet of the present invention can be made thinner without containing a substrate, for example. Specifically, for example, by not including the base material, the function of the low refractive index layer can be introduced into the device without increasing the thickness other than the thickness of the adhesive layer itself. In addition, since the low-refractive index layer-containing adhesive sheet of the present invention has the aforementioned adhesive layer directly laminated on one or both sides of the low-refractive index layer of the present invention, the low-refractive index layer is subjected to the aforementioned adhesive layer. Protected from physical damage. Therefore, the fragility of the low refractive index layer can be prevented from becoming a fatal problem. In particular, the abrasion resistance of the low-refractive index layer can be compensated by the adhesive layer, and the low-refractive index layer can be protected from abrasion. In addition, the adhesive sheet with a low refractive index layer of the present invention can be attached to other members by using the adhesive layer, so it is easy to introduce the low refractive index layer itself into a component. That is, according to the adhesive sheet with a low refractive index layer according to the present invention, for example, it is easy to maintain a low refractive index layer that originally had a high porosity to enable thinning and physical protection of the low refractive index layer. Further, the functions of the low refractive index layer can be introduced into other components while maintaining the original high transparency.

[含低折射率層之黏接著片材及其製造方法] 本發明含低折射率層之黏接著片材之製造方法沒有特別限定,舉例來說,可藉由前述本發明第1含低折射率層之黏接著片材之製造方法、或前述本發明第2含低折射率層之黏接著片材之製造方法進行。以下舉例說明。此外,以下會將前述本發明第1含低折射率層之黏接著片材之製造方法、及前述本發明第2含低折射率層之黏接著片材之製造方法統稱為「本發明之含低折射率層之黏接著片材之製造方法」。又,以下會將本發明之含低折射率層之黏接著片材中作為構成要素的低折射率層稱為「本發明之低折射率層」。復又會將製造本發明之低折射率層的方法稱為「本發明之低折射率層之製造方法」。[Adhesive Adhesive Sheet with Low Refractive Index Layer and Manufacturing Method thereof] The method for producing the adhesive sheet with low refractive index layer of the present invention is not particularly limited. For example, the first low refractive index containing low refractive index of the present invention can be used. The manufacturing method of the adhesive layer of the index layer, or the aforementioned method of manufacturing the second adhesive layer of the low refractive index layer of the present invention. Here are some examples. In addition, hereinafter, the method for producing the first adhesive sheet with a low refractive index layer of the present invention and the method for producing the second adhesive sheet with a low refractive index layer of the present invention will be collectively referred to as "the content of the present invention "Manufacturing method of adhesive sheet of low refractive index layer". In addition, the low-refractive-index layer which is a component in the adhesive sheet containing the low-refractive-index layer of this invention is called a "low-refractive-index layer of this invention" hereafter. Furthermore, the method of manufacturing the low refractive index layer of the present invention will be referred to as "the manufacturing method of the low refractive index layer of the present invention".

[1.低折射率層及其製造方法] 本發明之低折射率層可例如由矽化合物形成。又,本發明之低折射率層可為例如由微細孔粒子彼此化學結合所形成的低折射率層。舉例來說,前述微細孔粒子可為凝膠之粉碎物。[1. Low-refractive index layer and manufacturing method thereof] The low-refractive index layer of the present invention can be formed of, for example, a silicon compound. The low-refractive index layer of the present invention may be, for example, a low-refractive index layer formed by chemically combining fine-pored particles with each other. For example, the aforementioned fine pore particles may be a pulverized product of a gel.

本發明之低折射率層之製造方法中,舉例來說,用於將前述多孔體之凝膠粉碎的凝膠粉碎步驟可為1階段,惟宜分成多個粉碎階段進行。前述粉碎階段數沒有特別限定,舉例來說可為2階段,亦可為3階段以上。In the method for producing a low-refractive index layer of the present invention, for example, the gel pulverization step for pulverizing the gel of the aforementioned porous body may be one step, but it may be performed by dividing into a plurality of pulverization steps. The number of the pulverization stages is not particularly limited, and may be, for example, two stages or three or more stages.

本發明之低折射率層之製造方法中,舉例來說,前述多個粉碎階段可包含用於粉碎前述凝膠的第1粉碎階段及第2粉碎階段,其中前述第1粉碎階段是將前述凝膠粉碎成體積平均粒徑0.5~100μm之粒子的階段,而前述第2粉碎階段是在前述第1粉碎階段後將前述粒子進一步粉碎成體積平均粒徑10~1000nm之粒子的階段。又,在此情況下,前述多個粉碎階段係可包含亦可不包含前述第1粉碎階段及前述第2粉碎階段以外的粉碎階段。In the method for manufacturing a low-refractive index layer of the present invention, for example, the plurality of pulverization stages may include a first pulverization stage and a second pulverization stage for pulverizing the gel, wherein the first pulverization stage is to condense the coagulation The gum is pulverized into particles having a volume average particle diameter of 0.5 to 100 μm, and the second pulverizing step is a step of further pulverizing the particles into particles having a volume average particle diameter of 10 to 1000 nm after the first pulverizing step. In this case, the plurality of pulverization stages may or may not include pulverization stages other than the first pulverization stage and the second pulverization stage.

此外,本發明中,「粒子」(例如前述凝膠之粉碎物的粒子等)的形狀,沒有特別限定,例如可為球狀,亦可為非球狀系等。又,本發明中,前述粉碎物的粒子可為例如溶膠凝膠念珠狀粒子、奈米粒子(中空奈米氧化矽、奈米氣球粒子)、奈米纖維等。In addition, in the present invention, the shape of "particles" (for example, particles of a pulverized product of the gel described above) is not particularly limited, and may be, for example, spherical or non-spherical. In the present invention, the particles of the pulverized material may be, for example, sol-gel rosary particles, nano particles (hollow nano silica, nano balloon particles), nano fibers, and the like.

本發明中,舉例來說,前述凝膠以多孔質凝膠為佳,且前述凝膠之粉碎物以多孔質為佳,惟不限於此。In the present invention, for example, the gel is preferably a porous gel, and the pulverized material of the gel is preferably porous, but is not limited thereto.

本發明中,前述凝膠粉碎物由例如具有粒子狀、纖維狀、平板狀中至少一形狀之結構所構成亦可。前述粒子狀及平板狀之構成單元係例如可由無機物構成。此外,前述粒子狀構成單元之構成元素係例如可含有選自於由Si、Mg、Al、Ti、Zn及Zr所構成群組中之至少一元素。形成粒子狀之結構體(構成單元)可為實心粒子亦可為中空粒子,具體上可舉如聚矽氧粒子或具有微細孔之聚矽氧粒子、氧化矽中空奈米粒子或氧化矽奈米氣球等。纖維狀之構成單元係例如直徑為奈米尺寸之奈米纖維,具體上可舉如纖維素奈米纖維或氧化鋁奈米纖維等。平板狀之構成單元係例如奈米黏土,具體上可舉如奈米尺寸之膨土(例如Kunipia F[商品名])等。前述纖維狀之構成單元並無特別限定,舉來說可為選自於由碳奈米纖維、纖維素奈米纖維、氧化鋁奈米纖維、甲殼質奈米纖維、甲殼素奈米纖維、聚合物奈米纖維、玻璃奈米纖維及二氧化矽奈米纖維所構成之群組中的至少一纖維狀物質。In the present invention, the pulverized gel may have a structure having at least one of a particulate shape, a fibrous shape, and a flat shape, for example. The particle-like and plate-like constituent units may be made of, for example, an inorganic substance. The constituent element system of the particulate constituent unit may contain, for example, at least one element selected from the group consisting of Si, Mg, Al, Ti, Zn, and Zr. The particle-like structure (constituting unit) may be solid particles or hollow particles. Specifically, such as polysilicon particles or polysilicon particles with fine pores, hollow silica particles or silica nanoparticles. Balloons, etc. The fibrous structural unit is, for example, a nanofiber having a diameter of nanometer, and specifically, cellulose nanofiber or alumina nanofiber can be mentioned. The flat-shaped constituent unit is, for example, nano clay, and concretely, such as nano-sized bentonite (for example, Kunipia F [trade name]) and the like. The aforementioned fibrous structural unit is not particularly limited, and may be selected from the group consisting of carbon nanofiber, cellulose nanofiber, alumina nanofiber, chitin nanofiber, chitin nanofiber, and polymer At least one fibrous substance in the group consisting of nano-fiber, glass nano-fiber and silica nano-fiber.

本發明之低折射率層之製造方法中,前述凝膠粉碎步驟(例如前述多個粉碎階段、如前述第1粉碎階段及前述第2粉碎階段)係可例如於前述「其他溶劑」中進行。此外,前述「其他溶劑」的詳細說明係於後闡述。In the method for producing a low-refractive index layer of the present invention, the gel pulverization step (for example, the plurality of pulverization stages, such as the first pulverization stage and the second pulverization stage) may be performed, for example, in the aforementioned "other solvent". In addition, the detailed description of the "other solvent" mentioned above is explained later.

此外,本發明中的「溶劑」(例如凝膠製造用溶劑、低折射率層製造用溶劑、置換用溶劑等),可不使凝膠或其粉碎物等溶解,亦可例如將前述凝膠或其粉碎物等分散或沈澱於前述溶劑中。The "solvent" (for example, a solvent for producing a gel, a solvent for producing a low-refractive index layer, a solvent for replacement, etc.) in the present invention may not dissolve the gel or its pulverized matter, or may dissolve the gel or The pulverized material or the like is dispersed or precipitated in the aforementioned solvent.

前述第1粉碎階段後,前述凝膠的體積平均粒徑可為例如0.5~100μm、1~100μm、1~50μm、2~20μm或3~10μm。前述第2粉碎階段後,前述凝膠的體積平均粒徑可為例如10~1000nm、100~500nm或200~300nm。前述體積平均粒徑,係表示含前述凝膠之液體(含凝膠液體)中前述粉碎物的粒度偏差。前述體積平均粒徑例如可藉由動態光散射法、雷射繞射法等粒度分布評析裝置及掃描式電子顯微鏡(SEM)、穿透式電子顯微鏡(TEM)等電子顯微鏡等進行測定。After the first pulverization step, the volume average particle diameter of the gel may be, for example, 0.5 to 100 μm, 1 to 100 μm, 1 to 50 μm, 2 to 20 μm, or 3 to 10 μm. After the second pulverization step, the volume average particle diameter of the gel may be, for example, 10 to 1000 nm, 100 to 500 nm, or 200 to 300 nm. The volume-average particle diameter refers to the particle size deviation of the pulverized material in the gel-containing liquid (gel-containing liquid). The volume average particle diameter can be measured by, for example, a particle size distribution evaluation device such as a dynamic light scattering method or a laser diffraction method, and an electron microscope such as a scanning electron microscope (SEM) or a transmission electron microscope (TEM).

又,前述第1粉碎階段剛結束時,前述液體的剪切黏度在10001/s的剪切速度下可為例如50mPa/s以上、 1000mPa.s以上、2000mPa.s以上或3000mPa.s以上,並可為例如100Pa.s以下、50Pa.s以下或10Pa.s以下。前述第2粉碎階段剛結束時,前述液體的剪切黏度可為例如1mPa.s以上、2mPa.s以上或3mPa.s以上,並可為例如1000mPa.s以下、100mPa.s以下或50mPa.s以下。此外,剪切黏度的測定方法雖無特別限制,惟舉例來說,可如後述實施例所記載,使用振動式黏度測定機(Sekonic公司製,商品名FEM-1000V)來測定。In addition, immediately after the first pulverization stage, the shear viscosity of the liquid may be, for example, 50 mPa / s or more, 1000 mPa.s or more, 2000 mPa.s or more, or 3000 mPa.s or more at a shear rate of 10001 / s, and It may be, for example, 100 Pa.s or less, 50 Pa.s or less, or 10 Pa.s or less. Immediately after the second crushing stage, the shear viscosity of the liquid may be, for example, 1 mPa.s or more, 2 mPa.s or more, or 3 mPa.s or more, and may be, for example, 1000 mPa.s or less, 100 mPa.s or less, or 50 mPa.s. the following. The method for measuring the shear viscosity is not particularly limited, but it can be measured using, for example, a vibration viscosity measuring machine (manufactured by Sekonic Corporation, trade name FEM-1000V) as described in the examples described later.

前述第1粉碎階段後,舉例來說,含前述粒子之液體的剪切黏度可為50mPa.s以上,前述粒子的體積平均粒徑可為0.5~50μm。After the first pulverization stage, for example, the shear viscosity of the liquid containing the particles may be 50 mPa.s or more, and the volume average particle diameter of the particles may be 0.5 to 50 μm.

本發明之低折射率層之製造方法中,舉例來說,在前述溶劑置換步驟後、最初粉碎階段開始前,宜包含濃度調整步驟,對含前述凝膠之液體進行濃度調整,惟不包含亦可。在包含前述濃度調整步驟的情形時,舉例來說,在最初粉碎階段開始以後,宜不對含前述凝膠之液體進行濃度調整。In the manufacturing method of the low-refractive index layer of the present invention, for example, after the aforementioned solvent replacement step and before the initial pulverization stage starts, it is preferable to include a concentration adjustment step for adjusting the concentration of the liquid containing the aforementioned gel, but it does not include can. In the case where the aforementioned concentration adjustment step is included, for example, after the initial pulverization stage is started, it is desirable not to perform the concentration adjustment on the liquid containing the aforementioned gel.

前述濃度調整步驟中,可將含前述凝膠之液體的凝膠濃度調整成例如1重量%以上、1.5重量%以上、1.8重量%以上、2.0重量%以上或2.8重量%以上;並可調整成例如5重量%以下、4.5重量%以下、4.0重量%以下、3.8重量%以下或3.4重量%以下。前述濃度調整步驟中,含前述凝膠之液體的凝膠濃度可調整成例如1~5重量%、1.5~4.0重量%、2.0~3.8重量%、或2.8~3.4重量%。從凝膠粉碎步驟之操作容易性的觀點來看,前述凝膠濃度不宜過高以免黏度變得過高。又,從作為後述塗覆液使用的觀點來看,前述凝膠濃度不宜過低以免黏度變得過低。含前述凝膠之液體的凝膠濃度,舉例來說,可測定前述液體的重量、及扣除前述液體之溶劑後固體成分(凝膠)的重量,再由後者的測定値除以前者的測定値計算得出。In the foregoing concentration adjustment step, the gel concentration of the gel-containing liquid may be adjusted to, for example, 1% by weight or more, 1.5% by weight or more, 1.8% by weight or more, 2.0% by weight or 2.8% by weight or more; and may be adjusted to For example, 5 wt% or less, 4.5 wt% or less, 4.0 wt% or less, 3.8 wt% or less, or 3.4 wt% or less. In the foregoing concentration adjustment step, the gel concentration of the liquid containing the gel can be adjusted to, for example, 1 to 5 wt%, 1.5 to 4.0 wt%, 2.0 to 3.8 wt%, or 2.8 to 3.4 wt%. From the standpoint of the ease of operation of the gel pulverization step, the aforementioned gel concentration should not be too high to prevent the viscosity from becoming too high. From the viewpoint of use as a coating solution to be described later, the gel concentration should not be too low to prevent the viscosity from becoming too low. For example, the gel concentration of the gel-containing liquid can be determined by, for example, measuring the weight of the liquid and the weight of the solid component (gel) after deducting the solvent of the liquid, and then measuring the latter (excluding the former measurement). Calculated.

此外,前述濃度調整步驟,舉例來說,為能適當調整含前述凝膠之液體的凝膠濃度,可藉由添加溶劑來降低濃度或藉由揮發溶劑來提高濃度等。抑或,前述濃度調整步驟,舉例來說,倘若含前述凝膠之液體的凝膠濃度經測定的結果係為適當的凝膠濃度,則亦可不進行降低濃度或提高濃度(濃度調整)的作業,而直接將含前述凝膠之液體送往下一步驟。抑或,前述濃度調整步驟,舉例來說,倘若雖未經測定但含前述凝膠之液體的凝膠濃度明顯適宜,則測定及濃度調整亦可皆不進行而直接將含前述凝膠之液體送往下一步驟。In addition, the foregoing concentration adjustment step may, for example, be able to appropriately adjust the gel concentration of the liquid containing the gel, by adding a solvent to reduce the concentration or by evaporating the solvent to increase the concentration. Alternatively, for the aforementioned concentration adjustment step, for example, if the measurement result of the gel concentration of the liquid containing the aforementioned gel is an appropriate gel concentration, the operation of reducing the concentration or increasing the concentration (concentration adjustment) may not be performed. The liquid containing the aforementioned gel is directly sent to the next step. Alternatively, for the foregoing concentration adjustment step, for example, if the gel concentration of the liquid containing the above-mentioned gel is obviously suitable although not measured, the measurement and the concentration adjustment may be performed without sending the liquid containing the above-mentioned gel directly. Go to the next step.

前述凝膠粉碎步驟中,從最初的粉碎階段即將開始時一直到最後的粉碎階段剛結束時,含前述凝膠之液體的重量%濃度變化可為例如±3%以內、±2.8%以內、±2.6%以內、±2.4%以內或±2.2%以內。In the aforementioned gel pulverization step, from the beginning of the initial pulverization stage to the end of the final pulverization stage, the weight% concentration change of the gel-containing liquid may be, for example, within ± 3%, within ± 2.8%, ± Within 2.6%, within ± 2.4%, or within ± 2.2%.

本發明之低折射率層之製造方法中,進一步宜於前述溶劑置換步驟之前包含凝膠形態控制步驟,控制前述凝膠的形狀及大小。前述凝膠形態控制步驟中,宜進行控制以使凝膠大小不致變得過小。這是為了易於防止當凝膠大小變得過小時,發生大量溶劑附著於經細微粉碎之凝膠周圍,從而導致溶劑濃度的測定値低於實際濃度、溶劑殘留而變得高於實際濃度、甚且測定偏差值高等問題。也是基於在前述溶劑置換步驟之前,若凝膠大小不致過大,溶劑置換效率就會良好。又,在前述凝膠形態控制步驟後,宜將各凝膠的大小控制成接近均勻的狀態。這是因為若各凝膠的大小接近均勻,就能抑制含凝膠粉碎物之液體各批次間凝膠粉碎物的粒徑及凝膠濃度等的差異,而易於獲得均勻性極為優異的含凝膠粉碎物之液體。In the method for manufacturing a low-refractive index layer of the present invention, it is further preferable to include a gel morphology control step before the solvent replacement step to control the shape and size of the gel. In the aforementioned gel morphology control step, it is desirable to control so that the gel size does not become too small. This is to easily prevent when the gel size becomes too small, a large amount of solvent adheres to the finely pulverized gel, which will cause the measurement of the solvent concentration to be lower than the actual concentration, and the solvent remaining to become higher than the actual concentration. And the measurement deviation is high. It is also based on that before the solvent replacement step, if the gel size is not too large, the solvent replacement efficiency will be good. In addition, after the aforementioned gel morphology controlling step, it is desirable to control the size of each gel to a nearly uniform state. This is because if the size of each gel is nearly uniform, it is possible to suppress differences in the particle size and gel concentration of the gel pulverized material between batches of the liquid containing the pulverized gel, and it is easy to obtain a gel containing extremely excellent uniformity. Liquid of pulverized gel.

前述凝膠形態控制步驟中,可將前述凝膠的短徑控制成例如0.5cm以上、0.6cm以上、0.7cm以上或0.8cm以上,並可控制成例如15cm以下、13cm以下、10cm以下或8cm以下。又,前述凝膠形態控制步驟中,可將前述凝膠的長徑控制成例如30cm以下、低於30cm、28cm以下、25cm以下或20cm以下,並可控制成例如1cm以上、2cm以上、3cm以上、4cm以上或5cm以上。此外,本發明中,立體物(3次元體)的「短徑」是指在可測定前述立體物之長度的位置中,於長度會是最短之處所測出的長度。又,本發明中,立體物(3次元體)的「長徑」是指在可測定前述立體物之長度的位置中,於長度會是最長之處所測出的長度。In the gel morphology control step, the short diameter of the gel can be controlled to be, for example, 0.5 cm or more, 0.6 cm or more, 0.7 cm or more, or 0.8 cm or more, and can be controlled to be, for example, 15 cm or less, 13 cm or less, 10 cm or less, or 8 cm. the following. In the gel shape control step, the long diameter of the gel may be controlled to be, for example, 30 cm or less, less than 30 cm, 28 cm or less, 25 cm or less, or 20 cm or less, and may be controlled to be 1 cm or more, 2 cm or more, and 3 cm or more , 4cm or more or 5cm or more. In addition, in the present invention, the "short diameter" of a three-dimensional object (three-dimensional body) means a length measured at a position where the length is the shortest among the positions where the length of the three-dimensional object can be measured. In the present invention, the "long diameter" of the three-dimensional object (three-dimensional body) refers to a length measured at a position where the length of the three-dimensional object is the longest at a position where the length of the three-dimensional object can be measured.

前述凝膠形態控制步驟後,前述凝膠的形狀沒有特別限定,可控制成例如長方體(亦包括立方體)、圓柱形、多角形之立體物(例如三角柱、六角柱等多角柱)、球型或橢圓球(例如像橄欖球的形狀)等。前述凝膠形態控制步驟後,前述凝膠的形狀控制成長方體或接近長方體的形狀相當簡便故為佳。前述凝膠形態控制步驟中,在將前述凝膠控制成長方體的情形時,短邊可控制在例如0.5cm以上、0.6cm以上、0.7cm以上或0.8cm以上,亦可控制在例如15cm以下、13cm以下、10cm以下或8cm以下。又,前述凝膠形態控制步驟中,在將前述凝膠控制成長方體的情形時,長邊可控制在例如30cm以下、低於30cm、28cm以下、25cm以下或20cm以下,亦可控制在例如1cm以上、2cm以上、3cm以上、4cm以上或5cm以上。此外,本發明中,長方體的「短邊」是指最短的邊,「長邊」是指最長的邊。After the gel shape control step, the shape of the gel is not particularly limited, and can be controlled into, for example, a rectangular parallelepiped (including a cube), a cylindrical, polygonal three-dimensional object (such as a triangular column, a hexagonal column, or a polygonal column), a spherical shape, or An oval ball (like a shape like a rugby ball) and the like. After the gel morphology control step, it is preferable that the shape of the gel is controlled to a rectangular parallelepiped or a shape close to a rectangular parallelepiped. In the gel shape control step, when the gel is controlled into a rectangular parallelepiped, the short side can be controlled to be, for example, 0.5 cm or more, 0.6 cm or more, 0.7 cm or more, or 0.8 cm or more, and for example, 15 cm or less, 13 cm or less, 10 cm or less, or 8 cm or less. In the gel morphology control step, when the gel is controlled into a rectangular parallelepiped, the long side can be controlled to be, for example, 30 cm or less, less than 30 cm, 28 cm or less, 25 cm or 20 cm, or 1 cm. Above, above 2cm, above 3cm, above 4cm, or above 5cm. In the present invention, the "short side" of the cuboid refers to the shortest side, and the "long side" refers to the longest side.

前述凝膠形態控制步驟,舉例來說,可在製造前述凝膠的前述凝膠製造步驟後進行,亦可在前述凝膠製造步驟中(與前述凝膠製造步驟同時)進行。更具體來說係例如以下所述。The gel morphology control step may be performed, for example, after the gel manufacturing step for manufacturing the gel, or may be performed during the gel manufacturing step (simultaneously with the gel manufacturing step). More specifically, it is as follows, for example.

前述凝膠形態控制步驟中,例如可在前述凝膠已固定的狀態下將前述凝膠切斷,藉此控制前述凝膠成前述立體物。若前述凝膠的脆性極高的情況,切斷凝膠時凝膠可能會與切斷方向無關地不均勻崩解。於是,藉由將凝膠周圍固定,切斷時施加之壓縮方向的壓力會均勻施予凝膠本身,因此便能夠於切斷方向將凝膠均勻切斷。舉例來說可為:前述溶劑置換步驟前的前述凝膠形狀為近長方體,在前述凝膠形態控制步驟中,前述近長方體的凝膠表面6個面中的5面係與其他物質接觸從而讓前述凝膠固定,並且在其餘1面呈露出的狀態下,從前述露出面對前述凝膠插入切斷治具從而將前述凝膠切斷。前述切斷治具沒有特別限定,惟可舉例如刀具、線狀細形治具、薄而鋭利的板狀治具等。又,前述凝膠的切斷,舉例來說,可在前述其他溶劑中進行。In the gel morphology control step, for example, the gel can be cut in a state where the gel is fixed, thereby controlling the gel to form the three-dimensional object. When the gel is extremely brittle, the gel may disintegrate unevenly regardless of the cutting direction when the gel is cut. Therefore, by fixing the periphery of the gel, the pressure in the compression direction applied at the time of cutting is uniformly applied to the gel itself, so that the gel can be uniformly cut in the cutting direction. For example, the shape of the gel before the solvent replacement step is a cuboid, and in the gel shape control step, 5 of the 6 faces of the gel surface of the cuboid are in contact with other substances so that The gel is fixed and the gel is cut by inserting a cutting jig from the exposed surface with the remaining one surface exposed. The cutting jig is not particularly limited, but examples thereof include a cutter, a linear thin jig, and a thin and sharp plate jig. The gel may be cut in, for example, the other solvent.

又,例如,在前述凝膠製造步驟中,可藉由在對應於前述立體物之形狀及大小的模型(容器)內將前述凝膠的原料固化,將前述凝膠控制成前述立體物。藉此,即便在凝膠的脆性極高的情況下,由於不需要將前述凝膠切斷就能將前述凝膠控制為預定形狀及大小,故可避免切斷凝膠時凝膠會與切斷方向無關地不均勻崩解的情形。In addition, for example, in the gel manufacturing step, the raw material of the gel can be cured in a mold (container) corresponding to the shape and size of the three-dimensional object to control the gel into the three-dimensional object. With this, even when the gel is extremely brittle, the gel can be controlled to a predetermined shape and size without cutting the gel, so that the gel and the gel can be avoided when the gel is cut. A case where the fracture direction disintegrates unevenly.

又,本發明之低折射率層之製造方法中,舉例來說,可在最初的粉碎階段結束後、最後的粉碎階段結束前,測定含前述凝膠之液體(含凝膠液體)的凝膠濃度,並僅將前述凝膠濃度在預定數値範圍內的前述液體供其後的粉碎階段之用。此外,在測定凝膠濃度時必須作成均勻液體,因此,在前述粉碎階段結束後,宜形成有一定程度的高黏度而不易固液分離的液體。如前所述,從含凝膠液體的操作容易性的觀點來看,凝膠濃度不宜過高以免過於形成高黏度;而由作成塗覆液使用的觀點來看,凝膠濃度不宜過低以免過於形成低黏度。若由此等觀點來看,可僅將前述凝膠濃度在預定數値範圍內的液體,一以貫之地供至最後的粉碎階段結束後為止。前述凝膠濃度的預定數値範圍,舉例來說,係如前述可為例如2.8重量%以上且3.4重量%以下,惟不限於此。又,前述凝膠濃度測定(濃度管理)係如前述,可在最初的粉碎階段結束後、最後的粉碎階段結束前進行,亦可再加上或取而代之,在前述溶劑置換步驟後前述凝膠粉碎步驟前、以及最後的粉碎階段(例如前述第2粉碎階段)後的其一或二者進行。因此,前述凝膠濃度測定後,舉例來說,係僅將前述凝膠濃度在預定數値範圍內的前述液體供往其後的粉碎階段,抑或將其作為含凝膠粉碎物之液體完成品來供應。又,在前述溶劑置換步驟後前述凝膠粉碎步驟前進行前述凝膠濃度測定的情形時,其後仍可視需要進行前述濃度調整步驟。In the method for producing a low-refractive index layer of the present invention, for example, the gel of the gel-containing liquid (gel-containing liquid) can be measured after the end of the first pulverization stage and before the end of the final pulverization stage. Concentration, and only the aforementioned liquid having the aforementioned gel concentration within a predetermined range is used for the subsequent pulverization stage. In addition, it is necessary to make a uniform liquid when measuring the gel concentration. Therefore, it is desirable to form a liquid with a high degree of viscosity that is not easy to separate solid and liquid after the end of the aforementioned pulverization stage. As mentioned above, from the viewpoint of ease of handling of gel-containing liquids, the gel concentration should not be too high to avoid excessively high viscosity; and from the viewpoint of use as a coating solution, the gel concentration should not be too low to avoid Too low viscosity. From these viewpoints, only the liquid having the gel concentration within a predetermined range may be continuously supplied until the end of the final pulverization stage. The predetermined range of the gel concentration may be, for example, 2.8% by weight or more and 3.4% by weight or less as described above, but is not limited thereto. The gel concentration measurement (concentration management) is performed as described above, and may be performed after the end of the first pulverization stage and before the end of the final pulverization stage, or may be added or replaced, and the gel may be pulverized after the solvent replacement step One or both of these steps are performed before the step and after the final pulverization step (for example, the aforementioned second pulverization step). Therefore, after the gel concentration is measured, for example, only the aforementioned liquid having the gel concentration within a predetermined range is supplied to the subsequent pulverization stage, or it is used as a liquid finished product containing the pulverized gel. To supply. When the gel concentration measurement is performed before the gel pulverization step after the solvent replacement step, the concentration adjustment step may be performed thereafter if necessary.

此外,在前述溶劑置換步驟後前述凝膠粉碎步驟前的濃度管理上,由於附著於凝膠的溶劑量不穩定,故濃度測定値每次測定的偏差值會有變大的狀況。因此,宜在前述溶劑置換步驟後前述凝膠粉碎步驟前的濃度管理之前,先藉由前述凝膠形態控制步驟,將前述凝膠的形狀及大小控制成幾乎均勻的狀態。藉此可安定地進行濃度測定。此外,舉例來說,藉此亦可將含凝膠液體的凝膠濃度統一而高精度地進行管理。In addition, in the concentration management before the gel pulverization step after the solvent replacement step, since the amount of the solvent attached to the gel is unstable, the deviation value of the concentration measurement and each measurement may increase. Therefore, it is preferable to control the shape and size of the gel to an almost uniform state by the gel shape control step before the concentration management before the gel pulverization step after the solvent replacement step. This enables stable concentration measurement. In addition, for example, the gel concentration of the gel-containing liquid can be uniformly and accurately managed.

本發明之低折射率層之製造方法中,前述多個粉碎階段之至少一者宜與其他至少一粉碎階段為不同的粉碎方式。前述多個粉碎階段中的粉碎方式可全部不同,但亦可為以相同粉碎方式進行的粉碎階段。例如,前述多個粉碎階段為3階段的情況下,可為3階段全部以不同方式(即用3種粉碎方式)進行,亦可為任意2個粉碎階段以相同粉碎方式進行,僅另外1個粉碎階段以不同粉碎方式進行。另外,粉碎方式並不受特別限定,例如有後述之空蝕方式、無介質方式等。In the method for manufacturing a low-refractive index layer of the present invention, it is preferable that at least one of the plurality of pulverization stages is different from the other at least one pulverization stage by a different pulverization method. The pulverization methods in the plurality of pulverization steps may all be different, but may be pulverization steps performed in the same pulverization method. For example, when the aforementioned multiple crushing stages are three stages, all three stages may be performed in different ways (that is, using three crushing ways), or any two crushing stages may be performed in the same crushing way, and only one other The comminution stage is carried out in different comminution ways. The pulverization method is not particularly limited, and examples thereof include a cavitation method and a mediumless method which will be described later.

本發明之低折射率層之製造方法中,前述含凝膠粉碎物之液體係例如含有將前述凝膠粉碎所得粒子(粉碎物粒子)的溶膠液。In the method for producing a low-refractive index layer of the present invention, the gel-containing pulverized material-containing liquid system contains, for example, a sol liquid obtained by pulverizing the gel (particles pulverized).

本發明之低折射率層之製造方法中,前述多個粉碎階段可包括粗粉碎階段及本粉碎階段,利用前述粗粉碎階段獲得塊狀溶膠粒子後,再利用前述本粉碎階段獲得保有多孔質凝膠網絡的溶膠粒子。In the method for manufacturing a low-refractive index layer of the present invention, the plurality of pulverization stages may include a coarse pulverization stage and a current pulverization stage. After obtaining the massive sol particles by using the coarse pulverization stage, the porous coagulation retention is obtained by using the foregoing pulverization stage. Colloidal network of sol particles.

本發明之低折射率層之製造方法,舉例來說,在前述多個階段之粉碎階段之至少一階段(例如前述第1粉碎階段及前述第2粉碎階段之至少一者)後,進一步包含一將前述凝膠粒子分級的分級步驟。The manufacturing method of the low-refractive index layer of the present invention, for example, further includes a step after at least one of the pulverizing stages of the foregoing multiple stages (for example, at least one of the aforementioned first pulverizing stage and the aforementioned second pulverizing stage). A classification step for classifying the aforementioned gel particles.

本發明之低折射率層之製造方法係例如包含凝膠化步驟,將塊狀的多孔體於溶劑中凝膠化而作成前述凝膠。此時,例如在前述多個階段之粉碎階段內,於最初的粉碎階段(例如前述第1粉碎階段)中使用經由前述凝膠化步驟而凝膠化的前述凝膠。The method for producing a low-refractive index layer of the present invention includes, for example, a gelation step, and gelatinizing a porous body in a solvent to form the aforementioned gel. In this case, for example, in the pulverization stage of the plurality of stages, the gel that is gelled through the gelation step is used in the first pulverization stage (for example, the first pulverization stage).

本發明之低折射率層之製造方法係例如包含熟成步驟,於溶劑中對經凝膠化之前述凝膠進行熟成。此時,舉例來說,在前述多個階段之粉碎階段內,於最初的粉碎階段(例如前述第1粉碎階段)中使用前述熟成步驟後的前述凝膠。The method for producing a low-refractive index layer of the present invention includes, for example, a ripening step, and the gelatinized gel is aged in a solvent. At this time, for example, in the pulverization stage of the plurality of stages, the gel after the aging step is used in the first pulverization stage (for example, the first pulverization stage).

本發明之低折射率層之製造方法係例如於前述凝膠化步驟後進行前述溶劑置換步驟,將前述溶劑置換成其他溶劑。此時,例如,在前述多個階段之粉碎階段中最初的粉碎階段(例如前述第1粉碎階段),使用前述其他溶劑中的前述凝膠。The method for producing a low-refractive index layer according to the present invention is, for example, performing the solvent replacement step after the gelation step, and replacing the solvent with another solvent. At this time, for example, in the first pulverization stage (for example, the first pulverization stage) among the pulverization stages of the plurality of stages, the gel in the other solvent is used.

本發明之低折射率層之製造方法中前述多個階段之粉碎階段之至少一階段(例如前述第1粉碎階段及前述第2粉碎階段之至少一者)中,係例如一邊測定前述液的剪切黏度一邊控制前述多孔體的粉碎。In the method for manufacturing a low-refractive index layer of the present invention, at least one of the pulverization stages of the plurality of stages (for example, at least one of the first pulverization stage and the second pulverization stage), for example, the shear of the liquid is measured. The pulverization of the porous body was controlled while cutting viscosity.

本發明之低折射率層之製造方法中前述多個階段之粉碎階段之至少一階段(例如前述第1粉碎階段及前述第2粉碎階段之至少一者)係利用例如高壓無介質粉碎來進行。In the method for producing a low-refractive index layer of the present invention, at least one of the pulverization stages of the plurality of stages (for example, at least one of the first pulverization stage and the second pulverization stage) is performed using, for example, high-pressure non-media pulverization.

本發明之低折射率層之製造方法中,前述凝膠為例如至少含有3官能以下飽和鍵官能基的矽化合物之凝膠。In the method for producing a low-refractive index layer according to the present invention, the gel is, for example, a gel of a silicon compound containing at least a trifunctional or less saturated bond functional group.

此外,以下於本發明之低折射率層之製造方法中,時亦將利用含前述凝膠粉碎步驟之步驟所得之含凝膠粉碎物之液體稱為「本發明之含凝膠粉碎物之液體」。In addition, in the method for producing a low-refractive index layer of the present invention, the gel-containing liquid obtained by using the step including the aforementioned gel-pulverizing step is also referred to as "the gel-containing liquid of the present invention" ".

依據本發明之含凝膠粉碎物之液體,舉例來說,藉由形成其塗覆膜,並使前述塗覆膜中的前述粉碎物彼此化學結合,便可形成作成機能性多孔體的前述本發明之低折射率層。依據本發明之含凝膠粉碎物之液體,例如可將前述本發明之低折射率層賦予至各種對象物。故而,本發明之含凝膠粉碎物之液體及其製造方法,係例如在前述本發明之低折射率層的製造上殊為有用。According to the gel-containing pulverized liquid of the present invention, for example, by forming a coating film thereof and chemically combining the pulverized materials in the coating film with each other, the above-mentioned text as a functional porous body can be formed. Invented low refractive index layer. According to the liquid containing a pulverized gel according to the present invention, the aforementioned low refractive index layer of the present invention can be provided to various objects, for example. Therefore, the pulverized gel-containing liquid of the present invention and the method for producing the same are particularly useful for the production of the low refractive index layer of the present invention, for example.

本發明之含凝膠粉碎物之液體,舉例來說,具有極優良的均勻性,故例如在將前述本發明之低折射率層應用於光學構件等之用途時,可使其外觀得良好。The gel-containing liquid of the present invention has, for example, extremely excellent homogeneity. Therefore, when the low-refractive index layer of the present invention is used in an optical member or the like, the appearance can be improved.

本發明之含凝膠粉碎物之液體,舉例來說,可為藉由將前述含凝膠粉碎物之液體塗覆(塗佈)於基板上並進一步乾燥以獲得具有高空隙率之層(低折射率層)用的含凝膠粉碎物之液體。又,本發明之含凝膠粉碎物之液體,舉例來說,可為用以獲得高空隙率多孔體(厚度大或塊狀的塊體)的含凝膠粉碎物之液體。前述塊體係例如可藉由使用前述含凝膠粉碎物之液體進行整體製膜而獲得。The gel-containing pulverized material liquid of the present invention can be obtained by, for example, coating (coating) the aforementioned gel-containing pulverized liquid on a substrate and further drying to obtain a layer having a high porosity (low Refractive index layer) A liquid containing a pulverized gel. The gel-containing pulverized substance liquid of the present invention may be, for example, a gel-containing pulverized substance-containing liquid for obtaining a porous body having a high porosity (a thick or massive block). The block system can be obtained, for example, by integrally forming a film using the gel-containing pulverized liquid.

如同前述,本發明之低折射率層可為空隙層。以下有時會將作成空隙層之本發明之低折射率層稱為「本發明之空隙層」。舉例來說,可利用包含下述步驟之製造方法來製造具有高空隙率之前述本發明之空隙層:製造前述本發明之含凝膠粉碎物之液體的步驟、將前述含凝膠粉碎物之液體塗覆於基板上形成塗覆膜的步驟、及使前述塗覆膜乾燥的步驟。As before, the low refractive index layer of the present invention may be a void layer. Hereinafter, the low-refractive index layer of the present invention, which is a void layer, may be referred to as "a void layer of the present invention". For example, the aforementioned voided layer of the present invention having a high porosity can be produced by a manufacturing method including the steps of: a step of producing the gelled liquid containing the present invention; A step of applying a liquid on a substrate to form a coating film, and a step of drying the aforementioned coating film.

又例如可利用包含下述步驟之製造方法來製造積層薄膜捲材:製造前述本發明之含凝膠粉碎物之液體的步驟、將捲狀之前述樹脂薄膜輸出的步驟、於已輸出之前述樹脂薄膜塗覆前述含凝膠粉碎物之液體而形成塗覆膜的步驟、將前述塗覆膜乾燥的步驟、以及於前述乾燥步驟後將於前述樹脂薄膜上形成有前述本發明之低折射率層的積層薄膜捲取的步驟。以下有時將此種製造方法稱為「本發明之積層薄膜捲材的製造方法」。又,以下有時將利用本發明之積層薄膜捲材的製造方法製出的積層薄膜捲材稱為「本發明之積層薄膜捲材」。For another example, a laminated film roll can be manufactured by a manufacturing method including the following steps: the step of manufacturing the gel-containing liquid of the present invention, the step of outputting the rolled resin film, and the output of the resin. A step of thin-film coating the liquid containing the pulverized gel to form a coating film, a step of drying the coating film, and forming the low-refractive index layer of the present invention on the resin film after the drying step Steps of taking up the laminated film. Hereinafter, such a manufacturing method is sometimes referred to as "the manufacturing method of the laminated film roll of this invention." In addition, the laminated film roll produced by the manufacturing method of the laminated film roll of this invention may be hereafter called "the laminated film roll of this invention."

[2.含凝膠粉碎物之液體及其製造方法] 本發明之含凝膠粉碎物之液體係例如包含:已利用前述凝膠粉碎步驟(例如前述第1粉碎階段及前述第2粉碎階段)粉碎之凝膠的粉碎物、及前述其他溶劑。[2. Liquid containing gel pulverized material and production method thereof] The liquid system containing gel pulverized material of the present invention includes, for example, the aforementioned gel pulverization step (for example, the first pulverization phase and the second pulverization phase) have been used. The pulverized product of the pulverized gel and the other solvents mentioned above.

本發明之低折射率層之製造方法,舉例來說係如前述可包含多個階段之用以粉碎前述凝膠(例如多孔體凝膠)的凝膠粉碎步驟,亦可例如包含前述第1粉碎階段及前述第2粉碎階段。以下,主要針對本發明之含凝膠粉碎物之液體的製造方法包含前述第1粉碎階段及前述第2粉碎階段的情況舉例說明。以下,主要針對前述凝膠為多孔體(多孔體凝膠)的情況予以說明。惟本發明不限於此,於前述凝膠為多孔體之情況外,仍可由前述凝膠為多孔體(多孔體凝膠)的說明類推適用。又,以下有時會將本發明之低折射率層之製造方法中的前述多個粉碎階段(例如前述第1粉碎階段及前述第2粉碎階段)合稱為「凝膠粉碎步驟」。The manufacturing method of the low-refractive-index layer of the present invention is, for example, the aforementioned gel pulverization step for pulverizing the gel (for example, a porous body gel), which may include a plurality of stages, or may include the first pulverization, for example. Stage and the aforementioned second crushing stage. Hereinafter, a case where the method for producing a gel-pulverized liquid containing the present invention includes the first pulverization stage and the second pulverization stage will be described as an example. Hereinafter, the case where the gel is a porous body (porous body gel) will be mainly described. However, the present invention is not limited to this. In addition to the case where the gel is a porous body, the explanation that the gel is a porous body (porous body gel) can be applied analogously. The plurality of pulverization stages (for example, the first pulverization stage and the second pulverization stage) in the method for producing a low-refractive index layer of the present invention may be collectively referred to as a "gel pulverization step" hereinafter.

本發明之含凝膠粉碎物之液體,可用於製造發揮與空氣層相同之機能(例如低折射性)的機能性多孔體。前述機能性多孔體可為例如本發明之低折射率層。具體而言,藉由本發明之製造方法獲得的含凝膠粉碎物之液體,係含有前述多孔體凝膠的粉碎物,前述粉碎物中,未粉碎之前述多孔體凝膠的三維結構被破壞,而可形成與前述為粉碎之多孔體凝膠不同的新三維結構。因此,舉例來說,使用前述含凝膠粉碎物之液體形成之塗覆膜(機能性多孔體之前驅物),會成為形成有新的孔結構(新的空隙結構)的層,該結構在使用前述未粉碎之多孔體凝膠所形成的層無法獲得。藉此,前述層可發揮與空氣層同樣機能(例如,同樣的低折射性)。又,本發明之含凝膠粉碎物之液體,舉例來說,係藉由含有前述粉碎物殘留之矽醇基,而在作成前述塗覆膜(機能性多孔體之前驅物)已形成新的三維結構後,前述粉碎物彼此可進行化學結合。藉此,雖然所形成之機能性多孔體為具有空隙的結構,但可維持充分的強度與可撓性。因此,藉由本發明可容易且簡單地將機能性多孔體賦予至各式各樣的對象物。藉由本發明之製造方法獲得的含凝膠粉碎物之液體,例如在製造可成為空氣層之代替品的前述多孔質結構時甚為有用。此外,在前述空氣層的情況下,例如藉由在構件與構件兩者間經由間隔物等設置間隙而進行積層的方式,有必要於前述構件間形成空氣層。然而,使用本發明之含凝膠粉碎物之液體所形成之前述機能性多孔體,係僅將其配置於目標部位,便可發揮與前述空氣層同樣的機能。因此,如前述,可較形成前述空氣層更容易且簡單地將與前述空氣層相同的機能賦予至各式各樣的對象物。The liquid containing the pulverized gel of the present invention can be used to produce a functional porous body that exhibits the same function as the air layer (for example, low refractive index). The functional porous body may be, for example, the low refractive index layer of the present invention. Specifically, the pulverized gel-containing liquid obtained by the production method of the present invention is a pulverized product containing the porous body gel, and the three-dimensional structure of the unpulverized porous body gel is destroyed in the pulverized product. Instead, a new three-dimensional structure can be formed which is different from the above-mentioned pulverized porous body gel. Therefore, for example, a coating film (precursor of a functional porous body) formed by using the above-mentioned gel-containing pulverized liquid will become a layer having a new pore structure (new void structure). A layer formed using the aforementioned unpulverized porous body gel cannot be obtained. Thereby, the said layer can exhibit the same function (for example, the same low refractive property) as an air layer. In addition, the gel-containing pulverized material liquid of the present invention, for example, contains a silanol group remaining from the pulverized material, and a new coating film (precursor of a functional porous body) has been formed into a new one. After the three-dimensional structure, the crushed materials can be chemically combined with each other. Thereby, although the formed functional porous body has a structure having voids, sufficient strength and flexibility can be maintained. Therefore, according to the present invention, a functional porous body can be easily and simply provided to various objects. The pulverized gel-containing liquid obtained by the production method of the present invention is very useful for producing the aforementioned porous structure which can be used as a substitute for the air layer. In addition, in the case of the aforementioned air layer, for example, it is necessary to form an air layer between the members by laminating them by providing a gap between the member and the member via a spacer or the like. However, the functional porous body formed by using the gel-pulverized liquid of the present invention can exhibit the same function as the air layer only by disposing the porous body at a target portion. Therefore, as described above, it is possible to more easily and simply impart the same functions as the air layer to various objects than to form the air layer.

本發明之含凝膠粉碎物之液體係例如可作為用於形成前述機能性多孔體之溶液,或用於形成低折射層之溶液。本發明之含凝膠粉碎物之液體中,前述多孔體為其粉碎物。The gel system-containing liquid system of the present invention can be used, for example, as a solution for forming the aforementioned functional porous body or as a solution for forming a low refractive layer. In the gel-containing pulverized material liquid of the present invention, the porous body is a pulverized material.

本發明之含凝膠粉碎物之液體中,粉碎物(多孔體凝膠之粒子)的體積平均粒徑範圍為例如10~1000nm、100~500nm、200~300nm。前述體積平均粒徑,係表示本發明之含凝膠粉碎物之液體中前述粉碎物的粒度偏差。前述體積平均粒徑如同前述,係例如可藉由動態光散射法、雷射繞射法等粒度分布評析裝置及掃描式電子顯微鏡(SEM)、穿透式電子顯微鏡(TEM)等電子顯微鏡等進行測定。In the gel-containing pulverized material liquid of the present invention, the volume average particle diameter range of the pulverized material (particles of the porous body gel) is, for example, 10 to 1000 nm, 100 to 500 nm, and 200 to 300 nm. The above-mentioned volume average particle diameter indicates a particle size deviation of the above-mentioned pulverized material in the gel-containing pulverized liquid of the present invention. The volume average particle diameter is the same as that described above, and it can be performed, for example, by a particle size distribution evaluation device such as a dynamic light scattering method or a laser diffraction method, and an electron microscope such as a scanning electron microscope (SEM) or a transmission electron microscope (TEM). Determination.

又,本發明之含凝膠粉碎物之液體中,前述粉碎物的凝膠濃度沒有特別限制,例如粒徑10~1000nm的粒子佔2.5~4.5重量%、2.7~4.0重量%、2.8~3.2重量%。In the gel-containing pulverized material liquid of the present invention, the gel concentration of the pulverized material is not particularly limited. For example, particles having a particle size of 10 to 1000 nm occupy 2.5 to 4.5% by weight, 2.7 to 4.0% by weight, and 2.8 to 3.2% by weight. %.

本發明之含凝膠粉碎物之液體中,前述凝膠(例如、多孔體凝膠)沒有特別限制,可舉例如矽化合物等。In the gel-containing liquid of the present invention, the gel (for example, a porous body gel) is not particularly limited, and examples thereof include a silicon compound.

前述矽化合物不受特別限制,可舉例如至少含有3官能以下之飽和鍵官能基的矽化合物。前述「含有3官能以下之飽和鍵官能基」係指矽化合物具有3個以下的官能基,且此等官能基與矽(Si)形成飽和鍵。The silicon compound is not particularly limited, and examples thereof include a silicon compound containing at least a trifunctional saturated bond functional group. The aforementioned “functional group containing a saturated bond with a trifunctional or less function” means that the silicon compound has 3 or less functional groups, and these functional groups form a saturated bond with silicon (Si).

前述矽化合物係例如為下述式(2)所示化合物。The silicon compound is, for example, a compound represented by the following formula (2).

[化學式1]前述式(2)中,例如,X為2、3或4, R1 及R2 各自為直鏈或分枝烷基, R1 及R2 可為相同亦可為不同, 在X為2的情況下,R1 彼此可為相同亦可為不同, R2 彼此可為相同亦可為不同。[Chemical Formula 1] In the foregoing formula (2), for example, X is 2, 3, or 4, R 1 and R 2 are each a linear or branched alkyl group, R 1 and R 2 may be the same or different, and X is 2 In this case, R 1 may be the same as or different from each other, and R 2 may be the same or different from each other.

前述X及R1 例如與前述式(1)之X及R1 相同。又,前述R2 例如可援用後述之式(1)中R1 的例示。The X and R 1 are, for example, the same as X and R 1 in the formula (1). The R 2 can be exemplified by R 1 in the formula (1) described later.

前述式(2)所示矽化合物的具體例可舉如X為3之下述式(2')所示化合物。下式(2')中,R1 及R2 分別與前述式(2)相同。在R1 及R2 為甲基時,前述矽化合物為三甲氧基(甲基)矽烷(以下亦稱為「MTMS」)。Specific examples of the silicon compound represented by the formula (2) include compounds represented by the following formula (2 ′) in which X is 3. In the following formula (2 '), R 1 and R 2 are the same as those in the formula (2). When R 1 and R 2 are methyl, the silicon compound is trimethoxy (methyl) silane (hereinafter also referred to as “MTMS”).

[化學式2]在本發明之含凝膠粉碎物之液體中,前述溶劑中之前述多孔體凝膠的粉碎物濃度不受特別限制,例如為0.3至50%(v/v)、0.5至30%(v/v)、1.0至10%(v/v)。前述粉碎物之濃度一旦過高,則例如前述含凝膠粉碎物之液體之流動性可能會顯著降低而產生塗覆時的凝結物、塗痕。另一方面,若前述粉碎物的濃度過低,則例如不僅會在溶劑的乾燥花費相當長的時間,還會因為剛乾燥後的殘留溶劑亦變多,而有空隙率下降的可能性。[Chemical Formula 2] In the gel-containing pulverized material liquid of the present invention, the pulverized material concentration of the porous body gel in the solvent is not particularly limited, and is, for example, 0.3 to 50% (v / v), 0.5 to 30% (v / v). v), 1.0 to 10% (v / v). If the concentration of the pulverized material is too high, for example, the fluidity of the gel-containing pulverized material liquid may be significantly reduced, which may cause coagulation or coating marks during coating. On the other hand, if the concentration of the pulverized material is too low, for example, not only does it take a considerable amount of time to dry the solvent, but also the residual solvent immediately after drying also increases, and the porosity may decrease.

本發明之含凝膠粉碎物之液體的物性並無特別限制。前述含凝膠粉碎物之液體的剪切黏度係例如在1000l/s的剪切速度下為例如1mPa‧s至1Pa‧s、1mPa‧s至500mPa‧s、1mPa‧s至50mPa‧s、1mPa‧s至30mPa‧s、1mPa‧s至10mPa‧s、10mPa‧s至1Pa‧s、10mPa‧s至500mPa‧s、10mPa‧s至50mPa‧s、10mPa‧s至30mPa‧s、30mPa‧s至1Pa‧s、30mPa‧s至500mPa‧s、30mPa‧s至50mPa‧s、50mPa‧s至1Pa‧s、50mPa‧s至500mPa‧s、或500mPa‧s至1Pa‧s的範圍。剪切黏度一旦過高,就可能會例如產生塗痕,而出現凹版塗佈之轉印率降低等不良情況。相反地,剪切黏度一旦過低,就可能會例如無法使塗覆時的濕式塗佈厚度加厚,而無法於乾燥後獲得所欲的厚度。The physical properties of the liquid containing the pulverized gel of the present invention are not particularly limited. The shear viscosity of the gel-containing pulverized material is, for example, 1 mPa‧s to 1 Pa‧s, 1 mPa‧s to 500 mPa‧s, 1 mPa‧s to 50 mPa‧s, 1 mPa at a shear rate of 1000 l / s. ‧S to 30mPa‧s, 1mPa‧s to 10mPa‧s, 10mPa‧s to 1Pa‧s, 10mPa‧s to 500mPa‧s, 10mPa‧s to 50mPa‧s, 10mPa‧s to 30mPa‧s, 30mPa‧s The range is from 1Pa‧s, 30mPa‧s to 500mPa‧s, 30mPa‧s to 50mPa‧s, 50mPa‧s to 1Pa‧s, 50mPa‧s to 500mPa‧s, or 500mPa‧s to 1Pa‧s. If the shear viscosity is too high, for example, coating marks may be generated, and defects such as a reduction in the transfer rate of gravure coating may occur. Conversely, if the shear viscosity is too low, for example, the thickness of the wet coating during coating may not be increased, and the desired thickness may not be obtained after drying.

本發明之含凝膠粉碎物之液體中,作為前述溶劑可舉例如分散介質等。前述分散介質(以下亦稱為「塗覆用溶劑」)不受特別限制,可舉例如後述之凝膠化溶劑及粉碎用溶劑,並以前述粉碎用溶劑為宜。前述塗覆用溶劑包含沸點70℃以上至低於180℃、而且20℃下之飽和蒸氣壓在15kPa以下的有機溶劑。In the liquid containing the pulverized gel of the present invention, the solvent may be, for example, a dispersion medium. The dispersion medium (hereinafter also referred to as "coating solvent") is not particularly limited, and examples thereof include a gelling solvent and a pulverizing solvent described later, and the pulverizing solvent is preferably used. The coating solvent includes an organic solvent having a boiling point of 70 ° C. or higher and lower than 180 ° C. and a saturated vapor pressure at 20 ° C. of 15 kPa or less.

前述有機溶劑可舉例如四氯化碳、1,2-二氯乙烷、1,1,2,2-四氯乙烷、三氯乙烯、異丁醇、異丙醇、異戊醇、1-戊醇(丁基甲醇)、乙醇(酒精)、乙二醇單乙基醚、乙二醇單乙基醚乙酸酯、乙二醇單正丁基醚、乙二醇單甲基醚、二甲苯、甲酚、氯苯、醋酸異丁酯、醋酸異丙酯、醋酸異戊酯、醋酸乙酯、醋酸正丁酯、醋酸正丙酯、醋酸正戊酯、環己醇、環己酮、1,4-二烷、N,N-二甲基甲醯胺、苯乙烯、四氯乙烯、1,1,1-三氯乙烷、甲苯、1-丁醇、2-丁醇、甲基異丁基酮、甲乙酮、甲基環己烷、甲基環己酮、甲基-正丁基酮、異戊醇等。又,前述分散介質中可含有適量令表面張力降低的全氟系界面活性劑或矽系界面活性劑等。Examples of the organic solvent include carbon tetrachloride, 1,2-dichloroethane, 1,1,2,2-tetrachloroethane, trichloroethylene, isobutanol, isopropanol, isoamyl alcohol, 1 -Pentyl alcohol (butyl methanol), ethanol (alcohol), ethylene glycol monoethyl ether, ethylene glycol monoethyl ether acetate, ethylene glycol mono-n-butyl ether, ethylene glycol monomethyl ether, Xylene, cresol, chlorobenzene, isobutyl acetate, isopropyl acetate, isoamyl acetate, ethyl acetate, n-butyl acetate, n-propyl acetate, n-amyl acetate, cyclohexanol, cyclohexanone 1,4-two Alkane, N, N-dimethylformamide, styrene, tetrachloroethylene, 1,1,1-trichloroethane, toluene, 1-butanol, 2-butanol, methyl isobutyl ketone, Methyl ethyl ketone, methyl cyclohexane, methyl cyclohexanone, methyl-n-butyl ketone, isoamyl alcohol, and the like. In addition, the dispersion medium may contain an appropriate amount of a perfluoro-based surfactant, a silicon-based surfactant, or the like that reduces the surface tension.

本發明之含凝膠粉碎物之液體,可舉例如溶膠粒子液,即分散於前述分散介質之溶膠狀的前述粉碎物。本發明之含凝膠粉碎物之液體係例如在基材上進行塗佈、乾燥後,藉由後述之結合步驟進行化學交聯,可連續成膜為具有一定水準以上強度的空隙層。另外,本發明中之「溶膠」係指藉由粉碎凝膠之三維結構,使粉碎物(維持著部分空隙結構之奈米三維結構之多孔體溶膠的粒子)分散於溶劑中表現流動性的狀態。The gel-containing pulverized substance liquid of the present invention may be, for example, a sol particle liquid, that is, the pulverized substance in the form of a sol dispersed in the dispersion medium. The liquid system containing the pulverized gel of the present invention can be formed into a void layer having a strength of a certain level or more continuously by coating and drying the substrate, and then performing chemical crosslinking through a bonding step described later. In addition, the "sol" in the present invention refers to a state where the three-dimensional structure of the gel is pulverized, and the pulverized material (particles of a porous body sol that maintains a nano-dimensional three-dimensional structure with a partial void structure) is dispersed in a solvent to exhibit fluidity .

本發明之含凝膠粉碎物之液體,係例如亦可進一步含有用以使前述凝膠之粉碎物彼此進行化學結合的觸媒。前述觸媒的含有率不受特別限定,相對於前述凝膠粉碎物的重量為例如0.01至20重量%、0.05至10重量%、或0.1至5重量%。The pulverized gel-containing liquid of the present invention may further contain, for example, a catalyst for chemically bonding the pulverized gels. The content rate of the catalyst is not particularly limited, and is, for example, 0.01 to 20% by weight, 0.05 to 10% by weight, or 0.1 to 5% by weight based on the weight of the pulverized gel.

又,本發明之含凝膠粉碎物之液體,係例如亦可進一步含有用以使前述凝膠粉碎物彼此間接性結合的交聯輔助劑。前述交聯輔助劑的含有率不受特別限定,相對於前述凝膠粉碎物的重量為例如0.01至20重量%、0.05至15重量%、或0.1至10重量%。In addition, the gel-pulverized material-containing liquid of the present invention may further contain, for example, a crosslinking auxiliary agent for indirectly bonding the gel-pulverized materials to each other. The content rate of the said crosslinking adjuvant is not specifically limited, For example, it is 0.01 to 20 weight%, 0.05 to 15 weight%, or 0.1 to 10 weight% with respect to the weight of the said crushed gel.

此外,本發明之含凝膠粉碎物之液體,於前述凝膠之構成單元單體的官能基中,無益於凝膠內交聯結構的官能基比率可為例如30mol%以下、25mol%以下、20mol%以下、15mol%以下,並可為例如1mol%以上、2mol%以上、3mol%以上、4mol%以上。無益於凝膠內交聯結構的官能基比率,舉例來說可如下述方式進行測定。In addition, in the liquid containing the pulverized gel of the present invention, among the functional groups of the constituent units of the gel, the functional group ratio that is not beneficial to the cross-linked structure in the gel may be, for example, 30 mol% or less, 25 mol% or less, 20 mol% or less, 15 mol% or less, and may be, for example, 1 mol% or more, 2 mol% or more, 3 mol% or more, and 4 mol% or more. The ratio of functional groups that is not beneficial to the cross-linked structure in the gel can be measured, for example, as follows.

(無益於凝膠內交聯結構的官能基比率之測定方法) 將凝膠乾燥後,測定固態NMR(Si-NMR),從NMR的峰值比算出無益於交聯結構的殘餘矽醇基(無益於凝膠內交聯結構之官能基)的比率。又,在前述官能基為矽醇基以外的情形時,仍可依據該方式從NMR峰值比算出無益於凝膠內交聯結構之官能基的比率。(Measurement method of functional group ratio that is not conducive to cross-linking structure in the gel) After drying the gel, the solid state NMR (Si-NMR) is measured, and the residual silanol groups that are not conducive to the cross-linking structure are calculated from the peak ratio of NMR. The ratio of the functional groups of the crosslinked structure within the gel. When the functional group is other than a silanol group, the ratio of the functional group that is not beneficial to the crosslinked structure in the gel can be calculated from the NMR peak ratio according to this method.

以下舉例說明本發明含凝膠粉碎物之液體之製造方法。本發明之含凝膠粉碎物之液體在無特別記載的前提下,可援用以下之說明。The following is an example to explain the method for producing the gel-containing liquid of the present invention. Unless otherwise stated, the gel-containing pulverized liquid of the present invention can be referred to the following description.

本發明之含凝膠粉碎物之液體之製造方法中,混合步驟係將前述多孔體凝膠之粒子(粉碎物)與前述溶劑混合的步驟,其可有可無。前述混合步驟的具體例,可舉例如將凝膠狀矽化合物(矽化合物凝膠)之粉碎物與分散介質混合的步驟,且其中前述矽化合物凝膠之粉碎物得自含有至少3官能以下之飽和鍵官能基的矽化合物。在本發明中,前述多孔體凝膠的粉碎物係可藉由後述凝膠粉碎步驟,自前述多孔體凝膠獲得。此外,前述多孔體凝膠之粉碎物,例如可從進行過後述之熟成步驟之熟成處理後的前述多孔體凝膠獲得。In the method for producing a pulverized gel-containing liquid of the present invention, the mixing step is a step of mixing the particles (pulverized material) of the porous gel with the solvent, and it is optional. Specific examples of the aforementioned mixing step include a step of mixing a pulverized substance of a gel-like silicon compound (silicon compound gel) with a dispersion medium, and the pulverized substance of the aforementioned silicon compound gel is obtained from a substance containing at least three functions Saturated bond functional silicon compounds. In the present invention, the pulverized material of the porous body gel can be obtained from the porous body gel by a gel pulverization step described later. The pulverized product of the porous body gel can be obtained, for example, from the porous body gel that has been subjected to a aging process described later.

本發明之含凝膠粉碎物之液體之製造方法中,凝膠化步驟係例如使塊狀之多孔體在溶劑中凝膠化成前述多孔體凝膠的步驟,前述凝膠化步驟的具體例,例如為使前述含有至少3官能以下之飽和鍵官能基之矽化合物在溶劑中凝膠化來生成矽化合物凝膠的步驟。In the method for producing a gel-containing pulverized product of the present invention, the gelation step is, for example, a step of gelatinizing a porous body in a solvent into the aforementioned porous body gel, and a specific example of the aforementioned gelation step, For example, this step is a step of gelling a silicon compound containing a saturated bond functional group having at least three functions in a solvent to form a silicon compound gel.

以下,將舉前述多孔體為矽化合物的情況為例,說明前述凝膠化步驟。Hereinafter, the case where the porous body is a silicon compound will be described as an example to explain the gelation step.

前述凝膠化步驟係例如在脫水縮合觸媒存在下將單體之前述矽化合物藉由脫水縮合反應進行凝膠化的步驟,藉此獲得矽化合物凝膠。前述矽化合物凝膠係例如具有殘餘矽醇基,前述殘餘矽醇基宜進行適當調整,以因應後述之前述矽化合物凝膠之粉碎物彼此的化學結合。The gelation step is, for example, a step of gelling the silicon compound of the monomer by a dehydration condensation reaction in the presence of a dehydration condensation catalyst, thereby obtaining a silicon compound gel. The silicon compound gel system has, for example, a residual silanol group, and the residual silanol group should be appropriately adjusted so as to correspond to the chemical bonding between the pulverized products of the silicon compound gel described later.

在前述凝膠化步驟中,前述矽化合物不受特別限制,只要為可藉由脫水縮合反應而凝膠化者即可。藉由前述脫水縮合,舉例而言,前述矽化合物之間便會結合。前述矽化合物間之結合為例如氫鍵或分子間作用力結合。In the aforementioned gelation step, the aforementioned silicon compound is not particularly limited as long as it can be gelated by a dehydration condensation reaction. By the aforementioned dehydration condensation, for example, the aforementioned silicon compounds are combined. The aforementioned bonding between silicon compounds is, for example, hydrogen bonding or intermolecular force bonding.

前述矽化合物係可舉例如下述式(1)所示之矽化合物。由於前述式(1)之矽化合物具有羥基,因此在前述式(1)之矽化合物間,例如可能藉由各自的羥基而形成氫鍵或分子間作用力結合。Examples of the silicon compound include a silicon compound represented by the following formula (1). Since the silicon compound of the formula (1) has a hydroxyl group, the silicon compound of the formula (1) may, for example, form a hydrogen bond or an intermolecular force bond through the respective hydroxyl group.

[化學式3] [Chemical Formula 3]

前述式(1)中係例如X為2、3或4,R1 為直鏈或分枝烷基。前述R1 之碳數係例如1至6、1至4、1至2。前述直鏈烷基可舉如甲基、乙基、丙基、丁基、戊基、己基等,前述分枝烷基可舉如異丙基、異丁基等。前述X為例如3或4。In the formula (1), for example, X is 2, 3, or 4, and R 1 is a linear or branched alkyl group. The carbon number of the aforementioned R 1 is, for example, 1 to 6, 1 to 4, or 1 to 2. Examples of the linear alkyl group include methyl, ethyl, propyl, butyl, pentyl, and hexyl, and examples of the branched alkyl group include isopropyl and isobutyl. The X is, for example, 3 or 4.

前述式(1)所示矽化合物的具體例可舉如X為3之下述式(1')所示化合物。在下述式(1')中,R1 與前述式(1)相同,例如為甲基。在R1 為甲基時,前述矽化合物為參(羥基)甲基矽烷。前述X為3時,前述矽化合物例如為具有3個官能基的3官能矽烷。Specific examples of the silicon compound represented by the aforementioned formula (1) include compounds represented by the following formula (1 ′) in which X is 3. In the following formula (1 ′), R 1 is the same as the aforementioned formula (1), and is, for example, a methyl group. When R 1 is a methyl group, the silicon compound is ginsyl (hydroxy) methyl silane. When X is 3, the silicon compound is, for example, a trifunctional silane having three functional groups.

[化學式4] [Chemical Formula 4]

又,前述式(1)所示矽化合物之具體例可舉如X為4之化合物。此時,前述矽化合物係例如具有4個官能基的4官能矽烷。Specific examples of the silicon compound represented by the formula (1) include compounds in which X is 4. In this case, the silicon compound is, for example, a tetrafunctional silane having four functional groups.

前述矽化合物,例如亦可為藉由水解形成前述式(1)之矽化合物的前驅物。前述前驅物,例如只要為可藉由水解形成前述矽化合物者即可,作為具體例可舉如前述式(2)所示化合物。The silicon compound may be, for example, a precursor that forms the silicon compound of the formula (1) by hydrolysis. The precursor may be, for example, one that can form the silicon compound by hydrolysis, and a specific example is a compound represented by the formula (2).

前述矽化合物為前述式(2)所示之前驅物時,本發明之製造方法係例如亦可在前述凝膠化步驟之前,包含一將前述前驅物水解的步驟。When the silicon compound is a precursor represented by the formula (2), the manufacturing method of the present invention may include, for example, a step of hydrolyzing the precursor before the gelation step.

前述水解的方法不受特別限制,例如可藉由在觸媒存在下的化學反應進行。前述觸媒可舉如草酸、乙酸等酸等。前述水解反應的進行,舉例來說,可在室溫環境下,將草酸的水溶液緩慢滴入混合至前述矽化合物前驅物之二甲亞碸溶液後,維持該狀態攪拌30分鐘左右。在水解前述矽化合物前驅物時,例如可將前述矽化合物前驅物之烷氧基完全水解,以便更有效率地展現其後之凝膠化・熟成・空隙結構形成後的加熱・固定化。The aforementioned method of hydrolysis is not particularly limited, and may be performed, for example, by a chemical reaction in the presence of a catalyst. Examples of the catalyst include acids such as oxalic acid and acetic acid. The hydrolysis reaction proceeds, for example, at room temperature, an aqueous solution of oxalic acid is slowly dropped into the dimethylarsin solution of the silicon compound precursor, and the state is maintained for about 30 minutes. When hydrolyzing the aforementioned silicon compound precursor, for example, the alkoxy group of the aforementioned silicon compound precursor can be completely hydrolyzed in order to more efficiently exhibit subsequent gelation, maturation, and heating / fixation after formation of the void structure.

在本發明中,前述矽化合物係例如可例示三甲氧基(甲基)矽烷之水解物。In the present invention, the silicon compound is, for example, a hydrolyzate of trimethoxy (methyl) silane.

前述單體之矽化合物不受特別限制,例如可因應所製機能性多孔體的用途作適當選擇。在前述機能性多孔體的製造中,前述矽化合物,例如在重視低折射率性的情況下,從低折射率性優良的觀點來看係以前述3官能矽烷為佳,此外,在重視強度(例如耐擦傷性)時,從耐擦傷性的觀點來看係以前述4官能矽烷為佳。此外,成為前述矽化合物凝膠原料之前述矽化合物,係例如可僅使用一種、亦可併用兩種以上。就具體例而言,作為前述單體矽化合物係例如可僅含有前述3官能矽烷,亦可僅含有前述4官能矽烷,或可含有前述3官能矽烷及前述4官能矽烷兩者,更可含有其它的矽化合物。在前述矽化合物使用兩種以上矽化合物的情形時,其比率不受特別限制,可適當設定。The silicon compound of the aforementioned monomer is not particularly limited, and can be appropriately selected according to the purpose of the functional porous body to be produced, for example. In the production of the functional porous body, for example, in the case where the silicon compound emphasizes low refractive index properties, the trifunctional silane is preferred from the viewpoint of excellent low refractive index properties, and in addition, emphasis is placed on strength ( In the case of abrasion resistance, for example, the aforementioned tetrafunctional silane is preferred from the viewpoint of abrasion resistance. The silicon compound used as the silicon compound gel raw material may be used alone, or two or more kinds may be used in combination. As a specific example, the monomeric silicon compound may contain, for example, only the trifunctional silane, only the tetrafunctional silane, or both the trifunctional silane and the tetrafunctional silane, and may further include other Silicon compounds. When two or more silicon compounds are used as the silicon compound, the ratio is not particularly limited and can be appropriately set.

前述矽化合物等多孔體的凝膠化,係例如可藉由前述多孔體間的脫水縮合反應來進行。前述脫水縮合反應例如宜在觸媒存在下進行,前述觸媒可舉例如酸觸媒及鹼性觸媒等脫水縮合觸媒,前述酸觸媒有鹽酸、草酸、硫酸等,前述鹼性觸媒有氨、氫氧化鉀、氫氧化鈉、氫氧化銨等。前述脫水縮合觸媒可為酸觸媒亦可為鹼觸媒,但以鹼觸媒為佳。在前述脫水縮合反應中,相對於前述多孔體之前述觸媒的添加量不受特別限制,相對於前述多孔體1莫耳,觸媒例如為0.01至10莫耳、0.05至7莫耳、0.1至5莫耳。The gelation of the porous body such as the silicon compound can be performed, for example, by a dehydration condensation reaction between the porous bodies. The dehydration condensation reaction is preferably performed in the presence of a catalyst. The catalyst may be, for example, an acid catalyst and an alkaline catalyst, such as hydrochloric acid, oxalic acid, sulfuric acid, etc., and the alkaline catalyst. There are ammonia, potassium hydroxide, sodium hydroxide, and ammonium hydroxide. The dehydration condensation catalyst may be an acid catalyst or an alkali catalyst, but an alkali catalyst is preferred. In the aforementioned dehydration condensation reaction, the amount of the catalyst added to the porous body is not particularly limited, and the catalyst is, for example, 1 to 10 moles, 0.05 to 7 moles, and 0.1 to 1 mole of the porous body. To 5 moles.

前述矽化合物等多孔體的凝膠化,例如以在溶劑中進行為佳。前述溶劑中之前述多孔體的比例不受特別限制。前述溶劑可舉如二甲亞碸(DMSO)、N-甲基吡咯啶酮(NMP)、N,N-二甲基乙醯胺(DMAc)、二甲基甲醯胺(DMF)、γ-丁內酯(GBL)、乙腈(MeCN)、乙二醇乙基醚(EGEE)等。前述溶劑係例如可為1種亦可將2種以上併用。用來進行前述凝膠化的溶劑以下亦稱作「凝膠化用溶劑」。The gelation of the porous body such as the silicon compound is preferably performed in a solvent, for example. The proportion of the porous body in the solvent is not particularly limited. Examples of the aforementioned solvent include dimethylsulfinium (DMSO), N-methylpyrrolidone (NMP), N, N-dimethylacetamide (DMAc), dimethylformamide (DMF), γ- Butyrolactone (GBL), acetonitrile (MeCN), ethylene glycol ethyl ether (EGEE), etc. The said solvent system may be 1 type, and may use 2 or more types together, for example. The solvent used for the above-mentioned gelation is hereinafter also referred to as a "solvent for gelation".

前述凝膠化之條件並無特別限制。對含有前述多孔體之前述溶劑的處理溫度係例如20~30℃、22~28℃、24~26℃,處理時間為例如1~60分、5~40分、10~30分。進行前述脫水縮合反應時,其處理條件並無特別限制,可沿用該等例示條件。藉由進行前述凝膠化,在前述多孔體為矽化合物的情況下,舉例來說,矽氧烷鍵會成長,而形成前述矽化合物之原始粒子,再藉由反應的進行,前述原始粒子會連結成念珠狀並生成三維結構的凝膠。The conditions for the aforementioned gelation are not particularly limited. The processing temperature of the solvent containing the porous body is, for example, 20 to 30 ° C, 22 to 28 ° C, or 24 to 26 ° C, and the processing time is, for example, 1 to 60 minutes, 5 to 40 minutes, or 10 to 30 minutes. When the aforementioned dehydration condensation reaction is performed, the treatment conditions are not particularly limited, and the exemplified conditions may be used. By performing the aforementioned gelation, in the case where the porous body is a silicon compound, for example, a siloxane bond will grow to form the original particles of the silicon compound, and by the reaction proceeding, the original particles will be Connects into a rosary and produces a three-dimensional structured gel.

在前述凝膠化步驟中所獲得之前述多孔體的凝膠形態不受特別限制。一般而言,「凝膠」係指溶質具有因相互作用故失去獨立的運動性而集結成之結構,且呈現固化狀態。此外,凝膠之中,一般而言,濕凝膠係指含有分散介質且在分散介質中溶質採一樣的結構者,乾凝膠則指去除溶劑且溶質採具有空隙之網目結構者。在本發明中,前述矽化合物凝膠,例如以使用濕凝膠為佳。在前述多孔體凝膠為矽化合物凝膠時,前述矽化合物凝膠之殘餘矽醇基不受特別限制,例如可同樣例示為後述之範圍。The gel morphology of the porous body obtained in the gelation step is not particularly limited. Generally speaking, "gel" refers to a structure in which solutes have agglomerates that have lost their independent motility due to interactions, and have a solidified state. In addition, among the gels, generally, a wet gel refers to a person that contains a dispersion medium and has the same structure in the solute, and a xerogel refers to a solvent that removes the solvent and has a mesh structure with voids. In the present invention, the silicon compound gel is preferably a wet gel, for example. When the porous body gel is a silicon compound gel, the residual silanol group of the silicon compound gel is not particularly limited, and, for example, the remaining silanol group may be exemplified in a range described later.

藉由前述凝膠化獲得之前述多孔體凝膠,係例如可直接供給至前述溶劑置換步驟及前述第1粉碎階段,亦可在前述第1粉碎階段前,先實施前述熟成步驟中的熟成處理。前述熟成步驟係在溶劑中將已凝膠化之前述多孔體(多孔體凝膠)進行熟成。在前述熟成步驟中,前述熟成處理的條件不受特別限制,例如將前述多孔體凝膠於溶劑中以預定溫度進行培養即可。根據前述熟成處理,舉例來說,對於經凝膠化所得之具有三維結構的多孔體凝膠,可進一步使前述原始粒子成長,藉此可使前述粒子本身的尺寸變大。於是,就結果而言,可將前述粒子彼此接觸的頸部接觸狀態從例如點接觸增加為面接觸。進行如上述之熟成處理的多孔體凝膠,係例如本身的強度會增加,就結果而言,可更加提升進行粉碎後之前述粉碎物三維結構的強度。藉此,在使用前述本發明之含凝膠粉碎物之液體形成塗覆膜時,例如可抑制下述情況:在塗覆後之乾燥步驟中,堆積了前述三維基本結構之空隙結構的細孔尺寸,隨著前述乾燥步驟中產生之前述塗覆膜中溶劑的揮發而收縮。The porous body gel obtained by the gelation may be directly supplied to the solvent replacement step and the first pulverization step, or the aging treatment in the aging step may be performed before the first pulverization step. . The maturing step is a step of maturing the gelled porous body (porous body gel) in a solvent. In the maturing step, the conditions for the maturing treatment are not particularly limited, and for example, the porous body gel may be cultured in a solvent at a predetermined temperature. According to the aforementioned aging treatment, for example, for a porous body gel having a three-dimensional structure obtained by gelation, the original particles can be further grown, thereby increasing the size of the particles themselves. Then, as a result, the neck contact state in which the aforementioned particles are in contact with each other can be increased from, for example, point contact to surface contact. The porous body gel subjected to the above-mentioned maturing treatment has its own strength, for example, and as a result, the strength of the three-dimensional structure of the pulverized material after pulverization can be further improved. Thereby, when the coating film is formed using the gel-containing pulverized substance liquid of the present invention, for example, it is possible to suppress the following cases: in the drying step after coating, the pores of the void structure of the three-dimensional basic structure are piled up. The size shrinks with the evaporation of the solvent in the coating film produced in the drying step.

前述熟成處理的溫度下限係例如30℃以上、35℃以上、40℃以上,其上限係例如80℃以下、75℃以下、70℃以下,其範圍係例如30~80℃、35~75℃、40~70℃。前述預定時間不受特別限制,其下限係例如5小時以上、10小時以上、15小時以上,其上限係例如50小時以下、40小時以下、30小時以下,其範圍係例如5至50小時、10至40小時、15至30小時。另外,關於熟成的最適合條件,舉例來說,宜如前述設定成前述多孔體凝膠中的原始粒子之尺寸可增大、且前述頸部接觸面積可增大的條件。此外,在前述熟成步驟中,前述熟成處理的溫度,係例如以將所使用溶劑之沸點考慮進去的方式為佳。前述熟成處理,舉例來說,若熟成溫度過高,則會因為前述溶劑過度揮發,使前述塗佈液濃縮,而有造成三維空隙結構之細孔被封閉等問題的可能性。另一方面,前述熟成處理,舉例來說,若熟成溫度過低,則無法充分獲得前述熟成帶來的效果,量產過程之經時的溫度偏差會增大,而有製得品質低劣之製品的可能性。The lower limit of the temperature for the ripening process is, for example, 30 ° C or higher, 35 ° C or higher, and 40 ° C or higher. The upper limits are, for example, 80 ° C or lower, 75 ° C or lower, and 70 ° C or lower. The ranges are, for example, 30 to 80 ° C, 35 to 75 ° C, 40 ~ 70 ℃. The aforementioned predetermined time is not particularly limited, and its lower limit is, for example, 5 hours or more, 10 hours or more, 15 hours or more, and its upper limit is, for example, 50 hours or less, 40 hours or less, and 30 hours or less, and its range is, for example, 5 to 50 hours, 10 To 40 hours, 15 to 30 hours. In addition, as for the most suitable conditions for the ripening, for example, the conditions for setting the size of the primary particles in the porous body gel to be increased and the neck contact area to be increased as described above are suitable. Moreover, in the said aging process, the temperature of the said aging process is the method which considered the boiling point of the solvent used, for example. For example, if the maturing temperature is too high, the coating solution may be concentrated due to excessive volatilization of the solvent, which may cause problems such as pores of the three-dimensional void structure being closed. On the other hand, if the ripening temperature is too low, for example, if the ripening temperature is too low, the effects brought about by the ripening cannot be fully obtained, the temperature deviation over time during the mass production process will increase, and products of poor quality will be produced. Possibility.

前述熟成處理係例如可使用與前述凝膠化步驟相同的溶劑,具體而言,相對於前述凝膠處理後的反應物(即含有前述多孔體凝膠的前述溶劑),以直接進行處理為佳。在前述多孔體凝膠為前述矽化合物凝膠的情況下,結束凝膠化後之熟成處理之前述矽化合物凝膠所含的殘餘矽醇基莫耳數,例如為在將使用於凝膠化之原材料(例如前述矽化合物或其前驅物)之烷氧基的莫耳數定義為100時殘餘矽醇基的比例,其下限例如為50%以上、40%以上、30%以上,其上限例如為1%以下、3%以下、5%以下,其範圍例如為1至50%、3至40%、5至30%。在提升前述矽化合物凝膠之硬度的目的下,係例如以殘餘矽醇基的莫耳數越低為越佳。若殘餘矽醇基的莫耳數過高,則例如在形成前述機能性多孔體時,會有到前述機能性多孔體之前驅物被交聯為止無法維持空隙結構的可能性。另一方面,若殘餘矽醇基的莫耳數過低,則例如在前述結合步驟中,會有前述機能性多孔體之前驅物無法交聯,變得無法賦予充分之膜強度的可能性。另外,雖然上述為殘餘矽醇基的例子,但例如在前述矽化合物凝膠的原材料使用以各種反應性官能基修飾之前述矽化合物時,即使對於各個官能基亦可適用同樣的現象。The ripening treatment system may use, for example, the same solvent as the gelation step, and specifically, it is preferable to directly process the reactant after the gelation treatment (that is, the solvent containing the porous gel). . In the case where the porous body gel is the silicon compound gel, the number of residual silanol groups contained in the silicon compound gel after the gelation and curing treatment is completed, for example, when the gel is used for gelation. The molar number of alkoxy groups of raw materials (such as the aforementioned silicon compounds or their precursors) is defined as the proportion of residual silanol groups at 100, and the lower limit is, for example, 50% or more, 40% or more, and 30% or more. The upper limit is, for example, It is 1% or less, 3% or less, and 5% or less, and the ranges are, for example, 1 to 50%, 3 to 40%, and 5 to 30%. For the purpose of increasing the hardness of the aforementioned silicon compound gel, for example, the lower the mole number of the residual silanol group, the better. When the molar number of the residual silanol group is too high, for example, when the functional porous body is formed, there is a possibility that the void structure cannot be maintained until the precursor of the functional porous body is crosslinked. On the other hand, if the molar number of the residual silanol group is too low, for example, in the bonding step, the precursor of the functional porous body may not be crosslinked, and sufficient film strength may not be provided. In addition, although the above is an example of a residual silanol group, for example, when the silicon compound modified with various reactive functional groups is used as a raw material of the silicon compound gel, the same phenomenon can be applied to each functional group.

藉由前述凝膠化所得之前述多孔體凝膠,例如可在前述熟成步驟實施熟成處理後,實施溶劑置換步驟,再於其後供予前述粉碎步驟。前述溶劑置換步驟,係將前述溶劑置換為其他溶劑。The porous body gel obtained by the gelation may be subjected to, for example, the aging process, the solvent replacement step, and the pulverization step thereafter. The solvent replacement step is to replace the solvent with another solvent.

在本發明中,前述粉碎步驟係如前述,為粉碎前述多孔體凝膠的步驟。前述粉碎,舉例來說,可對前述凝膠化步驟後的前述多孔體凝膠實施,再者,亦可對已實施前述熟成處理之熟成後的多孔體凝膠實施。In the present invention, the pulverizing step is a step of pulverizing the porous body gel as described above. The pulverization may be performed, for example, on the porous body gel after the gelation step, and may also be performed on the porous body gel that has undergone the aging treatment.

又,如同前述,在前述溶劑置換步驟前(例如前述熟成步驟後),可先進行控制前述凝膠形狀及大小的凝膠形態控制步驟。前述凝膠形態控制步驟要控制的前述凝膠之形狀及大小沒有特別限定,例如與前述相同。前述凝膠形態控制步驟係例如可藉由將前述凝膠分割(例如切割)成適當大小及形狀的立體物(3次元體)來進行。In addition, as described above, before the solvent replacement step (for example, after the ripening step), a gel shape control step that controls the shape and size of the gel may be performed first. The shape and size of the gel to be controlled in the gel morphology controlling step are not particularly limited, and are the same as those described above, for example. The gel morphology control step can be performed, for example, by dividing (for example, cutting) the gel into three-dimensional objects (three-dimensional bodies) of an appropriate size and shape.

進一步如前所述,在對前述凝膠實施前述溶劑置換步驟後進行前述粉碎步驟。前述溶劑置換步驟,係將前述溶劑置換為其他溶劑。這是由於若不將前述溶劑置換成前述其他溶劑,則例如在凝膠化步驟所使用的觸媒及溶劑也會殘留到前述熟成步驟後,從而可能會進一步經時產生凝膠化而影響最後所獲得之含凝膠粉碎物之液體的保存期限,並會有使用前述含凝膠粉碎物之液體所形成的塗覆膜在乾燥時的乾燥效率降低等的可能。此外,前述凝膠粉碎步驟中的前述其他溶劑以下亦稱為「粉碎用溶劑」。Further, as described above, the pulverization step is performed after the gel replacement step is performed on the gel. The solvent replacement step is to replace the solvent with another solvent. This is because if the aforementioned solvent is not replaced with the aforementioned other solvent, for example, the catalyst and solvent used in the gelation step will remain after the aforementioned ripening step, which may further cause gelation over time and affect the final result. The shelf life of the obtained gel-containing pulverized substance-containing liquid may reduce the drying efficiency of the coating film formed by using the gel-containing pulverized substance-containing liquid during drying. The other solvents in the gel pulverizing step are hereinafter also referred to as "solvents for pulverization".

前述粉碎用溶劑(其他溶劑)沒有特別限制,可使用例如有機溶劑。前述有機溶劑可舉例如沸點140℃以下、130℃以下、沸點100℃以下、沸點85℃以下的溶劑。具體例則可舉例如異丙醇(IPA)、乙醇、甲醇、n-丁醇、2-丁醇、異丁醇、戊基醇、丙二醇單甲基醚(PGME)、甲賽璐蘇、丙酮等。前述粉碎用溶劑例如可為1種亦可為2種以上之併用。The aforementioned pulverizing solvent (other solvents) is not particularly limited, and for example, an organic solvent can be used. Examples of the organic solvent include solvents having a boiling point of 140 ° C or lower, 130 ° C or lower, a boiling point of 100 ° C or lower, and a boiling point of 85 ° C or lower. Specific examples include, for example, isopropyl alcohol (IPA), ethanol, methanol, n-butanol, 2-butanol, isobutanol, pentyl alcohol, propylene glycol monomethyl ether (PGME), methylcellulose, and acetone. Wait. The pulverization solvent may be used singly or in combination of two or more kinds.

又,在前述粉碎用溶劑極性低的情形等,舉例來說,可將前述溶劑置換步驟分成多個溶劑置換階段進行,而前述溶劑置換階段中,宜令後進行之階段的前述其他溶劑之親水性較先進行之階段更低。如此進行會例如提升溶劑置換效率,也能使前述凝膠中的凝膠製造用溶劑(例如DMSO)殘留量變得極低。作為具體例係例如可將前述溶劑置換步驟分成3階段的溶劑置換階段進行,首先在第1溶劑置換階段將凝膠中的DMSO置換成水,接著在第2溶劑置換階段將凝膠中的前述水置換成IPA,再在第3置換階段將凝膠中的前述IPA置換成異丁醇。Further, in the case where the solvent for pulverization is low in polarity, for example, the solvent replacement step may be divided into a plurality of solvent replacement steps, and in the solvent replacement step, the hydrophilicity of the other solvents in the subsequent steps may be made hydrophilic. Sex is lower than the first stage. In this way, for example, the efficiency of solvent replacement is improved, and the residual amount of the gel-producing solvent (for example, DMSO) in the gel can be extremely low. As a specific example, for example, the solvent replacement step can be divided into three solvent replacement stages. First, the DMSO in the gel is replaced with water in the first solvent replacement stage, and then the aforementioned in the gel is replaced in the second solvent replacement stage. Water was replaced with IPA, and the aforementioned IPA in the gel was replaced with isobutanol in the third replacement stage.

前述凝膠化用溶劑與前述粉碎用溶劑的組合沒有特別限制,可舉例如DMSO與IPA的組合、DMSO與乙醇的組合、DMSO與異丁醇的組合、DMSO與正丁醇的組合等。如此一來,藉由將前述凝膠化用溶劑換成前述粉碎用溶劑,便例如可在後述之塗膜形成中形成較均勻的塗覆膜。The combination of the gelling solvent and the pulverizing solvent is not particularly limited, and examples thereof include a combination of DMSO and IPA, a combination of DMSO and ethanol, a combination of DMSO and isobutanol, a combination of DMSO and n-butanol, and the like. In this way, by changing the solvent for gelation to the solvent for pulverization, for example, a relatively uniform coating film can be formed in the coating film formation described later.

前述溶劑置換步驟沒有特別限定,例如可如下述般進行。即首先將利用前述凝膠製造步驟所製造之凝膠(例如前述熟成處理後的凝膠)浸漬於或使其接觸於前述其他溶劑,並在前述其他溶劑中溶解前述凝膠中的凝膠製造用觸媒、在縮合反應生成的醇成分、水等。然後,將前述凝膠所浸漬或接觸的溶劑移除,並再次將前述凝膠浸漬於或使其接觸於新的溶劑。反覆進行直到前述凝膠中凝膠製造用溶劑的殘留量達到所欲量為止。每1次的浸漬時間為例如0.5小時以上、1小時以上或1.5小時以上,上限値沒有特別限定,例如10小時以下。又上述溶劑的浸漬亦可對應前述溶劑對凝膠的連續性接觸。又,前述浸漬中的溫度沒有特別限定,可為例如20~70℃、25~65℃、或30~60℃。一旦進行加熱就會讓溶劑置換加速進行,而進行置換所需的溶劑量會減少,惟在室溫下簡便地進行溶劑置換亦可。又,例如,將前述溶劑置換步驟分成多個溶劑置換階段進行時,前述多個溶劑置換階段可各自如前述般進行。The said solvent replacement process is not specifically limited, For example, it can perform as follows. That is, first, a gel produced by the aforementioned gel manufacturing step (for example, the gel after the aging treatment) is immersed in or brought into contact with the other solvent, and the gel in the gel is dissolved in the other solvent. A catalyst, an alcohol component produced by a condensation reaction, water, and the like are used. Then, the solvent impregnated or contacted with the aforementioned gel is removed, and the aforementioned gel is impregnated with or brought into contact with a new solvent again. This is repeated until the residual amount of the gel-producing solvent in the gel reaches a desired amount. The immersion time per time is, for example, 0.5 hours or more, 1 hour or more, or 1.5 hours or more. The upper limit 値 is not particularly limited, and is, for example, 10 hours or less. The solvent impregnation may correspond to the continuous contact of the solvent with the gel. The temperature during the dipping is not particularly limited, and may be, for example, 20 to 70 ° C, 25 to 65 ° C, or 30 to 60 ° C. Once the heating is performed, the solvent replacement is accelerated, and the amount of the solvent required for the replacement is reduced. However, the solvent replacement may be easily performed at room temperature. For example, when the solvent replacement step is divided into a plurality of solvent replacement steps, the plurality of solvent replacement steps may be performed as described above.

又,舉例來說,可將前述溶劑置換步驟分成多個溶劑置換階段來進行,並可令後進行之階段的前述其他溶劑之親水性較先進行之階段低。如此這般,藉由慢慢地將置換用溶劑(前述其他溶劑)從親水性高的溶劑換成親水性低(疏水性高)的溶劑,可使凝膠中凝膠製造用溶劑的殘存量變得極低。若依此進行,便可製造例如空隙率更高(故例如低折射率)的空隙層。In addition, for example, the aforementioned solvent replacement step may be divided into a plurality of solvent replacement stages, and the hydrophilicity of the aforementioned other solvents in the later stage may be lower than that in the earlier stage. In this way, by gradually changing the solvent for replacement (the other solvents mentioned above) from a solvent with a high hydrophilicity to a solvent with a low hydrophilicity (high hydrophobicity), the residual amount of the solvent for producing a gel in the gel can be changed. Very low. If this is done, a void layer having a higher porosity (for example, a lower refractive index) can be produced.

已進行前述溶劑置換步驟後之前述凝膠中凝膠製造用溶劑殘存量宜為0.005g/ml以下、更佳為0.001g/ml以下、尤佳為0.0005g/ml以下。前述凝膠中凝膠製造用溶劑殘存量的殘存量下限値沒有特別限定,例如為零、或在檢測極限値以下或低於其值。The residual amount of the solvent for producing the gel in the gel after the solvent replacement step has been performed is preferably 0.005 g / ml or less, more preferably 0.001 g / ml or less, and even more preferably 0.0005 g / ml or less. The lower limit of the residual amount of the residual amount of the solvent for producing a gel in the gel is not particularly limited, and is, for example, zero, or less than or lower than the detection limit.

已進行前述溶劑置換步驟後之前述凝膠中凝膠製造用溶劑殘存量,舉例而言,可依下述方式進行測定。The residual amount of the solvent for producing a gel in the gel after the solvent replacement step has been performed can be measured, for example, in the following manner.

(凝膠中凝膠製造用溶劑之殘存量測定方法) 取凝膠0.2g並添加丙酮10ml,於室溫下使用振盪器以120rpm振盪3日,進行萃取。於氣相層析分析儀(Aglent公司製、商品名7890A)注入該抽出液1μl,進行分析。此外,為了確認測定的再現性,可例如以n=2(測定次數2次)或以上的測定次數取樣測定。再由標準品製作檢量線,求出每1g凝膠之各成分量,而算出每1g凝膠之凝膠製造溶劑的殘存量。(Method for measuring the remaining amount of a solvent for producing a gel in a gel) 0.2 g of the gel was added, and 10 ml of acetone was added, and the mixture was shaken at 120 rpm for 3 days at room temperature to perform extraction. 1 μl of the extract was injected into a gas chromatograph (manufactured by Aglent, trade name 7890A) and analyzed. In addition, in order to confirm the reproducibility of the measurement, for example, the measurement can be performed by sampling at a measurement number of n = 2 (the number of measurement times twice) or more. Then, a calibration curve was prepared from the standard product, and the amount of each component per 1 g of the gel was calculated, and the remaining amount of the gel-producing solvent per 1 g of the gel was calculated.

在將前述溶劑置換步驟分成多個溶劑置換階段來進行,並令後進行之階段的前述其他溶劑之親水性較先進行之階段低時,前述其他溶劑(置換用溶劑)並無特別限定。於最後進行的前述溶劑置換階段中,前述其他溶劑(置換用溶劑)宜為空隙層製造用溶劑。前述空隙層製造用溶劑可舉例如沸點140℃以下的溶劑。又,前述空隙層製造用溶劑可舉例如醇、醚、酮、酯系溶劑、脂肪族烴系溶劑、芳香族系溶劑等。沸點140℃以下之醇的具體例,可舉例如異丙醇(IPA)、乙醇、甲醇、n-丁醇、2-丁醇、異丁醇(IBA)、1-戊醇、2-戊醇等。沸點140℃以下之醚的具體例,可舉例如丙二醇單甲基醚(PGME)、甲賽璐蘇、乙賽璐蘇等。沸點140℃以下之酮的具體例,可舉例如丙酮、甲乙酮、甲基異丁酮、環戊酮等。沸點140℃以下之酯系溶劑的具體例,可舉例如醋酸乙酯、醋酸丁酯、醋酸異丙酯、醋酸正丙酯等。沸點140℃以下之脂肪族烴系溶劑的具體例,可舉例如己烷、環己烷、庚烷、辛烷等。沸點140℃以下之芳香族系溶劑的具體例,可舉例如甲苯、苯、二甲苯、苯甲醚等。塗覆時,從不易侵蝕基材(例如樹脂薄膜)的觀點來看,前述空隙層製造用溶劑宜為醇、醚或脂肪族烴系溶劑。又,前述粉碎用溶劑係例如可為1種類亦可為2種以上合併使用。尤其異丙醇(IPA)、乙醇、n-丁醇、2-丁醇、異丁醇(IBA)、戊基醇、丙二醇單甲基醚(PGME)、甲賽璐蘇、庚烷、辛烷,就室溫下低揮發性此面向而言係為適宜。尤其,為能抑制凝膠材質粒子(例如氧化矽化合物)的飛散,前述空隙層製造用溶劑的飽和蒸氣壓不宜過高(揮發性不過高)。此類溶劑係例如以具有碳數3或4以上之脂肪族基的溶劑為佳、具有碳數4以上之脂肪族基的溶劑較佳。前述具有碳數3或4以上之脂肪族基的溶劑可為例如醇。此類溶劑具體而言宜為例如異丙醇(IPA)、異丁醇(IBA)、n-丁醇、2-丁醇、1-戊醇、2-戊醇,尤宜為異丁醇(IBA)。When the solvent replacement step is performed by dividing into a plurality of solvent replacement steps, and the hydrophilicity of the other solvent in the subsequent step is lower than that in the first step, the other solvent (the solvent for replacement) is not particularly limited. In the aforementioned solvent replacement step, the other solvent (solvent for replacement) is preferably a solvent for producing a void layer. Examples of the solvent for producing the void layer include solvents having a boiling point of 140 ° C or lower. Examples of the solvent for producing the void layer include alcohols, ethers, ketones, ester solvents, aliphatic hydrocarbon solvents, and aromatic solvents. Specific examples of alcohols having a boiling point of 140 ° C or lower include, for example, isopropyl alcohol (IPA), ethanol, methanol, n-butanol, 2-butanol, isobutanol (IBA), 1-pentanol, and 2-pentanol. Wait. Specific examples of the ether having a boiling point of 140 ° C or lower include propylene glycol monomethyl ether (PGME), methylcellulose, and ethylcellulose. Specific examples of the ketone having a boiling point of 140 ° C. or lower include acetone, methyl ethyl ketone, methyl isobutyl ketone, and cyclopentanone. Specific examples of the ester-based solvent having a boiling point of 140 ° C. or lower include, for example, ethyl acetate, butyl acetate, isopropyl acetate, and n-propyl acetate. Specific examples of the aliphatic hydrocarbon-based solvent having a boiling point of 140 ° C. or lower include, for example, hexane, cyclohexane, heptane, and octane. Specific examples of the aromatic solvent having a boiling point of 140 ° C or lower include toluene, benzene, xylene, and anisole. In coating, from the viewpoint of not easily attacking the substrate (for example, a resin film), the solvent for producing the void layer is preferably an alcohol, an ether, or an aliphatic hydrocarbon-based solvent. Moreover, the said pulverization solvent system may be 1 type, and may use 2 or more types together, for example. Especially isopropyl alcohol (IPA), ethanol, n-butanol, 2-butanol, isobutanol (IBA), amyl alcohol, propylene glycol monomethyl ether (PGME), methylcellulose, heptane, octane In terms of low volatility at room temperature, this aspect is suitable. In particular, in order to suppress the scattering of gel material particles (for example, a silicon oxide compound), the saturation vapor pressure of the solvent for producing the interstitial layer should not be too high (the volatility is not too high). Such a solvent is preferably a solvent having an aliphatic group having 3 or more carbon atoms, for example, and a solvent having an aliphatic group of 4 or more carbon atoms is preferred. The aforementioned solvent having an aliphatic group having 3 or 4 carbon atoms may be, for example, an alcohol. Such solvents are specifically, for example, isopropyl alcohol (IPA), isobutanol (IBA), n-butanol, 2-butanol, 1-pentanol, 2-pentanol, and particularly preferably isobutanol ( IBA).

最後進行之前述溶劑置換階段以外的前述其他溶劑(置換用溶劑)沒有特別限制,可舉例如醇、醚、酮等。醇的具體例可舉例如異丙醇(IPA)、乙醇、甲醇、n-丁醇、2-丁醇、異丁醇(IBA)、戊醇等。醚的具體例可舉例如、丙二醇單甲基醚(PGME)、甲賽璐蘇、乙賽璐蘇等。酮的具體例可舉例如丙酮等。前述其他溶劑(置換用溶劑)只要能夠置換前述凝膠製造用溶劑或之前階段中的前述他溶劑(置換用溶劑)即可。又,最後進行之前述溶劑置換階段以外的前述其他溶劑(置換用溶劑),宜為最終不會殘留於凝膠中的溶劑、或是即便殘留但塗覆時不易侵蝕基材(例如樹脂薄膜)的溶劑。從塗覆時不易侵蝕基材的觀點來看,最後進行之前述溶劑置換階段以外的前述其他溶劑(置換用溶劑)宜為醇。如此,宜於前述多個溶劑置換階段之至少一階段中,以醇為前述其他溶劑。The other solvents (solvent for replacement) other than the solvent replacement step performed last are not particularly limited, and examples thereof include alcohols, ethers, and ketones. Specific examples of the alcohol include isopropyl alcohol (IPA), ethanol, methanol, n-butanol, 2-butanol, isobutanol (IBA), and pentanol. Specific examples of the ether include propylene glycol monomethyl ether (PGME), methylcellulose, and ethylcellulose. Specific examples of the ketone include acetone. The other solvent (solvent for replacement) may be substituted for the solvent for gel production or the other solvent (solvent for replacement) in the previous stage. In addition, the other solvents (replacement solvents) other than the solvent replacement stage performed last are preferably solvents that do not remain in the gel eventually, or that they do not easily attack the substrate (such as a resin film) even if they remain. Solvent. From the viewpoint that the substrate is not easily eroded during coating, the other solvents (replacement solvents) other than the solvent replacement stage performed last are preferably alcohols. In this way, it is preferable to use alcohol as the other solvent in at least one of the plurality of solvent replacement stages.

於最初進行之前述溶劑置換階段中,前述其他溶劑係例如可為水或以任意比率含有水之混合溶劑。若為水或含水之混合溶劑,則由於與親水性高的凝膠製造用溶劑(例如DMSO)的相溶性高,故容易置換前述凝膠製造用溶劑,又從成本面來來亦頗佳。In the aforementioned solvent replacement stage performed initially, the aforementioned other solvent may be, for example, water or a mixed solvent containing water at an arbitrary ratio. If it is water or a mixed solvent containing water, since it has high compatibility with a highly hydrophilic gel-producing solvent (for example, DMSO), it is easy to replace the above-mentioned gel-producing solvent, and it is also excellent in terms of cost.

前述多個溶劑置換階段宜包含:前述其他溶劑為水之階段、其後進行之前述其他溶劑為具有碳數3以下脂肪族基之溶劑的階段、及再其後進行之前述其他溶劑為具有碳數4以上脂肪族基之溶劑的階段。又,前述具有碳數3以下脂肪族基之溶劑、及前述具有碳數4以上脂肪族基之溶劑中至少一者可為醇。具有碳數3以下脂肪族基的醇沒有特別限定,可舉例如異丙醇(IPA)、乙醇、甲醇、n-丙醇等。具有碳數4以上脂肪族基之醇沒有特別限定,可舉例如n-丁醇、2-丁醇、異丁醇(IBA)、戊醇等。舉例來說,前述具有碳數3以下脂肪族基之溶劑可為異丙醇,前述具碳數4以上脂肪族基之溶劑可為異丁醇。The plurality of solvent replacement stages may include a stage in which the other solvent is water, a stage in which the other solvent is a solvent having an aliphatic group having a carbon number of 3 or less, and a stage in which the other solvent is a carbon Stages of 4 or more aliphatic solvent. In addition, at least one of the solvent having an aliphatic group with a carbon number of 3 or less and the solvent having an aliphatic group with a carbon number of 4 or more may be an alcohol. The alcohol having an aliphatic group having a carbon number of 3 or less is not particularly limited, and examples thereof include isopropyl alcohol (IPA), ethanol, methanol, and n-propanol. The alcohol having an aliphatic group having 4 or more carbon atoms is not particularly limited, and examples thereof include n-butanol, 2-butanol, isobutanol (IBA), and pentanol. For example, the aforementioned solvent having an aliphatic group with a carbon number of 3 or less may be isopropanol, and the aforementioned solvent having an aliphatic group with a carbon number of 4 or more may be isobutanol.

本發明人等,舉例而言,為能在200℃以下之較溫和的條件下形成具有膜強度的空隙層,而發現著眼於前述凝膠製造用溶劑的殘存量至為重要。此一知見並未見於先前技術,包括前述專利文獻及非專利文獻,乃本發明人等獨自發現的知見。The present inventors, for example, have found that it is important to focus on the remaining amount of the above-mentioned gel-forming solvent in order to form a void layer having film strength under relatively mild conditions of 200 ° C or lower. This knowledge has not been found in the prior art, including the aforementioned patent documents and non-patent literatures, but is a knowledge discovered by the present inventors and others alone.

如此,藉由降低凝膠中凝膠製造用溶劑的殘存量即能製造低折射率之空隙層的理由(機制)仍不明,惟例如可推測如下。即蓋因如前所述,凝膠製造用溶劑為了凝膠化反應進行之故,以高沸點溶劑(例如DMSO等)為佳。而且,在將前述凝膠所製成之溶膠液塗覆乾燥而製造空隙層時,在一般乾燥溫度及乾燥時間(未特別限定惟例如100℃下1分鐘等)下,難以將前述高沸點溶劑完全去除。一旦乾燥溫度過高、或乾燥時間過長,就可能會產生基材劣化等問題。並可推測,前述塗覆乾燥時所殘留的前述高沸點溶劑會進入前述凝膠之粉碎物彼此之間,使前述粉碎物彼此滑動,造成前述粉碎物彼此緊密堆積而空隙率變少,因此難以展現低折射率。即可想見,若與之相反,使前述高沸點溶劑的殘存量減少,便可抑制此種現象而能展現低折射率。不過此等僅為推測機制之一例,不對本發明作任何限定。In this way, the reason (mechanism) for producing a low-refractive void layer by reducing the remaining amount of the gel-producing solvent in the gel is still unknown, but it is speculated as follows, for example. That is, as described above, a solvent for producing a gel is preferably a high-boiling-point solvent (for example, DMSO) because the gelation reaction proceeds. In addition, when the sol solution made of the gel is coated and dried to produce a void layer, it is difficult to dissolve the high-boiling-point solvent at a general drying temperature and drying time (not specifically limited, for example, 1 minute at 100 ° C., etc.). Remove completely. If the drying temperature is too high or the drying time is too long, problems such as deterioration of the substrate may occur. It can be speculated that the high-boiling-point solvent remaining during the coating and drying will enter between the pulverized materials of the gel and cause the pulverized materials to slide with each other, resulting in the pulverized materials being closely packed with each other and reducing the porosity, so it is difficult Exhibits a low refractive index. That is to say, if the remaining amount of the high-boiling-point solvent is reduced on the contrary, such a phenomenon can be suppressed and a low refractive index can be exhibited. However, these are only examples of the speculative mechanism and do not limit the present invention in any way.

此外,本發明中,「溶劑」(例如凝膠製造用溶劑、空隙層製造用溶劑、置換用溶劑等)可不使凝膠或其粉碎物等溶解,可為例如將前述凝膠或其粉碎物等分散或沈澱於前述溶劑中。In the present invention, the "solvent" (for example, a solvent for producing a gel, a solvent for producing a void layer, a solvent for replacement, etc.) may not dissolve the gel or its pulverized substance, and may be, for example, the gel or its pulverized substance. Etc. dispersed or precipitated in the aforementioned solvent.

前述凝膠製造用溶劑如前所述,沸點可例如在140℃以上。The solvent for producing the gel is as described above, and the boiling point may be, for example, 140 ° C or higher.

前述凝膠製造用溶劑係例如水溶性溶劑。此外,本發明中,「水溶性溶劑」係指能以任意比率與水混合的溶劑。The solvent for producing the gel is, for example, a water-soluble solvent. In the present invention, the "water-soluble solvent" refers to a solvent that can be mixed with water at an arbitrary ratio.

在將前述溶劑置換步驟分成多個溶劑置換階段進行的情形時,其方法沒有特別限定,可令各個溶劑置換階段以例如如下方式進行。即,首先使前述凝膠浸漬或接觸於前述其他溶劑,並將前述凝膠中的凝膠製造用觸媒、縮合反應所生成的醇成分、水等溶解於前述其他溶劑中。然後,將前述凝膠所浸漬或接觸的溶劑移除,並再次將前述凝膠浸漬於或使其接觸於新的溶劑。反覆進行直到前述凝膠中凝膠製造用溶劑的殘留量達到所欲量為止。每1次的浸漬時間為例如0.5小時以上、1小時以上或1.5小時以上,上限値沒有特別限定,例如10小時以下。又上述溶劑的浸漬亦可對應前述溶劑對凝膠的連續性接觸。又,前述浸漬中的溫度沒有特別限定,可為例如20~70℃、25~65℃、或30~60℃。一旦進行加熱就會讓溶劑置換加速進行,而進行置換所需的溶劑量會減少,惟在室溫下簡便地進行溶劑置換亦可。進行多次該溶劑置換階段,慢慢地將前述其他溶劑(置換用溶劑)從親水性高的溶劑換成親水性低(疏水性高)的溶劑。為了除去親水性高的凝膠製造用溶劑(例如DMSO等),例如像前述般在最初使用水作為置換用溶劑是簡便且效率佳的。然後在以水除去DMSO等後,將凝膠中的水以例如異丙醇⇒異丁醇(塗覆用溶劑)的順序置換。即,由於水與異丁醇相溶性低,故藉由置換異丙醇一次後再置換成作為塗覆溶劑之異丁醇,可效率良好地進行溶劑置換。惟此僅為一例,如前所述,前述其他溶劑(置換用溶劑)沒有特別限定。When the aforementioned solvent replacement step is divided into a plurality of solvent replacement steps, the method is not particularly limited, and each solvent replacement step can be performed, for example, as follows. That is, the gel is first immersed or contacted with the other solvent, and the gel production catalyst in the gel, an alcohol component produced by the condensation reaction, water, and the like are dissolved in the other solvent. Then, the solvent impregnated or contacted with the aforementioned gel is removed, and the aforementioned gel is impregnated with or brought into contact with a new solvent again. This is repeated until the residual amount of the gel-producing solvent in the gel reaches a desired amount. The immersion time per time is, for example, 0.5 hours or more, 1 hour or more, or 1.5 hours or more. The upper limit 値 is not particularly limited, and is, for example, 10 hours or less. The solvent impregnation may correspond to the continuous contact of the solvent with the gel. The temperature during the dipping is not particularly limited, and may be, for example, 20 to 70 ° C, 25 to 65 ° C, or 30 to 60 ° C. Once the heating is performed, the solvent replacement is accelerated, and the amount of the solvent required for the replacement is reduced. However, the solvent replacement may be easily performed at room temperature. This solvent replacement step is performed multiple times, and the other solvent (the solvent for replacement) is gradually changed from a solvent having a high hydrophilicity to a solvent having a low hydrophilicity (high hydrophobicity). In order to remove a highly hydrophilic gel-producing solvent (for example, DMSO), for example, it is simple and efficient to use water as the solvent for replacement as described above. After removing DMSO and the like with water, the water in the gel is replaced in the order of, for example, isopropyl alcohol ⇒ isobutanol (solvent for coating). That is, since water has low compatibility with isobutanol, by replacing isopropyl alcohol once and then replacing with isobutanol as a coating solvent, solvent replacement can be performed efficiently. However, this is only an example, and as mentioned above, the other solvents (replacement solvents) are not particularly limited.

本發明中,凝膠之製造方法係例如前述般,可進行多次前述溶劑置換階段,慢慢地將前述其他溶劑(置換用溶劑)從親水性高的溶劑換成親水性低(疏水性高)的溶劑。若如此進行,便如前述可將前述凝膠中凝膠製造用溶劑的殘存量變得極低。不僅如此,舉例而言,相較於僅使用塗覆用溶劑以1階段進行溶劑置換,亦可將溶劑用量壓得極低而能低成本化。In the present invention, the method for producing the gel is as described above, and the solvent replacement stage may be performed multiple times, and the other solvent (solvent for replacement) may be slowly changed from a solvent with high hydrophilicity to a solvent with low hydrophilicity (high hydrophobicity). ) Solvent. By doing so, as described above, the residual amount of the gel-producing solvent in the gel can be extremely low. In addition, for example, the solvent amount can be reduced to a very low level and the cost can be reduced as compared with using only a solvent for coating in one stage.

然後,於前述溶劑置換步驟後,將前述凝膠於前述粉碎用溶劑中粉碎,進行凝膠粉碎步驟。又例如像前述般,前述溶劑置換步驟後,在前述凝膠粉碎步驟前可視需要先進行凝膠濃度測定,進而亦可視需要在其後進行前述凝膠濃度調整步驟。前述溶劑置換步驟後前述凝膠粉碎步驟前的凝膠濃度測定,係例如可依下述方式進行。即,首先,在前述溶劑置換步驟後,從前述其他溶劑(粉碎用溶劑)中將凝膠取出。該凝膠係例如利用前述凝膠形態控制步驟而控制成適當形狀及大小(例如塊體狀)的凝膠塊。接著,將附著於前述凝膠塊周圍的溶劑去除,然後以重量乾燥法測定佔一個凝膠塊的固體成分濃度。此時,為取得測定値的再現性,以隨機取出的多個(例如6個)凝膠塊進行測定,算出其平均値與値的偏差。前述濃度調整步驟,係可例如藉由再添加前述其他溶劑(粉碎用溶劑)來降低前述含凝膠液體的凝膠濃度。又,前述濃度調整步驟,相反地,可藉由使前述其他溶劑(粉碎用溶劑)蒸發來提高前述含凝膠液體的凝膠濃度。Then, after the solvent replacement step, the gel is pulverized in the pulverization solvent to perform a gel pulverization step. For another example, as described above, after the solvent replacement step, the gel concentration measurement may be performed as required before the gel pulverization step, and the gel concentration adjustment step may be performed after that if necessary. The measurement of the gel concentration before the gel pulverization step after the solvent replacement step can be performed, for example, in the following manner. That is, first, after the solvent replacement step, the gel is taken out of the other solvent (solvent for pulverization). This gel is, for example, a gel block controlled to have an appropriate shape and size (for example, a block shape) by the gel shape control step. Next, the solvent adhering to the periphery of the gel block was removed, and then the solid content concentration in one gel block was measured by a weight drying method. At this time, in order to obtain the reproducibility of the measurement radon, the measurement is performed with a plurality of (for example, six) gel pieces taken out randomly, and the deviation between the average radon and the radon is calculated. The concentration adjustment step can reduce the gel concentration of the gel-containing liquid by, for example, further adding the other solvent (solvent for pulverization). In addition, the concentration adjustment step may conversely increase the gel concentration of the gel-containing liquid by evaporating the other solvent (solvent for pulverization).

本發明之含凝膠粉碎物之液體之製造方法係如前述,可以1階段進行前述凝膠粉碎步驟,亦可分成多個粉碎階段。具體上可例如進行前述第1粉碎階段及前述第2粉碎階段。又,前述凝膠粉碎步驟除了前述第1粉碎階段及前述第2粉碎階段外,亦可再施加凝膠粉碎步驟。即,本發明之製造方法中,前述凝膠粉碎步驟不僅限定於2階段的粉碎階段,亦可包含3階段以上的粉碎階段。The method for producing a gel-pulverized liquid according to the present invention is as described above, and the gel pulverization step may be performed in one stage or may be divided into a plurality of pulverization stages. Specifically, for example, the first pulverization stage and the second pulverization stage may be performed. The gel pulverization step may be performed in addition to the first pulverization step and the second pulverization step. That is, in the manufacturing method of the present invention, the gel pulverization step is not limited to the two-stage pulverization stage, and may include three or more pulverization stages.

以下,就前述第1粉碎階段及前述第2粉碎階段予以說明。Hereinafter, the first pulverization stage and the second pulverization stage will be described.

前述第1粉碎階段為將前述多孔體凝膠粉碎之步驟。前述第2粉碎階段為在前述第1粉碎階段後進一步粉碎前述多孔體凝膠之粒子的步驟。The first pulverization step is a step of pulverizing the porous body gel. The second pulverization step is a step of further pulverizing particles of the porous body gel after the first pulverization step.

經由前述第1粉碎階段所得之前述多孔體凝膠的粒子體積平均粒徑、及經由前述第2粉碎階段所得之前述多孔體凝膠的粒子體積平均粒徑係例如同前所述。前述體積平均粒徑的測定方法亦例如同前所述。The particle volume average particle diameter of the porous body gel obtained in the first pulverizing step and the particle volume average particle diameter of the porous body gel obtained in the second pulverizing step are, for example, the same as described above. The method for measuring the volume average particle diameter is, for example, the same as described above.

前述第1粉碎階段剛結束後及前述第2粉碎階段剛結束後的前述含凝膠粉碎物之液體的剪切黏度係例如同前所述。前述剪切黏度的測定方法亦例如同前所述。The shear viscosity of the gel-pulverized material-containing liquid immediately after the first pulverization stage and immediately after the second pulverization stage are as described above. The method for measuring the shear viscosity is, for example, the same as described above.

此外,例如前述般,可在前述第1粉碎階段剛結束後測定含凝膠液體的凝膠濃度,僅將前述凝膠濃度在預定數値範圍內的前述液體供往前述第2粉碎階段,藉此進行前述含凝膠液體的濃度管理。In addition, for example, as described above, the gel concentration of the gel-containing liquid can be measured immediately after the first pulverization stage, and only the liquid whose gel concentration is within a predetermined range is supplied to the second pulverization stage. This performs the concentration control of the aforementioned gel-containing liquid.

前述多孔體凝膠的粉碎方法沒有特別限制,例如可藉由高壓無介質粉碎裝置、超音波均質機、高速旋轉均質機、高壓擠壓粉碎裝置、使用其他空蝕現象的濕式無介質粉碎裝置等進行。前述第1粉碎階段及前述第2粉碎階段可實施相同的粉碎方法,亦可實施不同的粉碎方法,惟以實施彼此相異的粉碎方法為佳。The method for pulverizing the porous body gel is not particularly limited. For example, a high-pressure medium-free pulverizer, an ultrasonic homogenizer, a high-speed rotating homogenizer, a high-pressure extrusion pulverizer, and a wet-type medium-free pulverizer using other cavitation phenomena And so on. The first pulverization stage and the second pulverization stage may be performed by the same pulverization method or different pulverization methods, but it is preferable to implement pulverization methods different from each other.

作為前述粉碎方法,宜以藉由控制能量來粉碎前述多孔體凝膠的方法,實施前述第1粉碎階段及前述第2粉碎階段中至少一者。前述藉由控制能量來粉碎前述多孔體凝膠的方法,可舉例如藉由高壓無介質粉碎裝置等進行的方法。As the pulverization method, it is preferable to perform at least one of the first pulverization step and the second pulverization step by a method of pulverizing the porous body gel by controlling energy. The method of pulverizing the porous body gel by controlling energy may be a method performed by a high-pressure medium-free pulverizing device or the like.

藉由超音波粉碎前述多孔體凝膠的方法,雖然粉碎強度強,但難以控制(監控)粉碎程度。與此相對,若是藉由控制能量來粉碎前述多孔體凝膠的方法,便可一面控制(監控)前述粉碎一面進行粉碎。藉此,可在有限的工作量內製造均勻的含凝膠粉碎物之液體。因此,能夠以例如量產基準來製造前述含凝膠粉碎物之液體。Although the method for pulverizing the porous body gel by ultrasonic waves has strong pulverization strength, it is difficult to control (monitor) the degree of pulverization. In contrast, if the porous body gel is pulverized by controlling energy, the pulverization can be performed while controlling (monitoring) the pulverization. Thereby, a uniform gel-containing pulverized liquid can be produced in a limited workload. Therefore, the above-mentioned gel-containing pulverized liquid can be produced on a mass production basis, for example.

相對於例如於粉碎時以物理方式破壞凝膠結構之球磨等進行介質粉碎的裝置, 均質機等空蝕式粉碎裝置係例如由於使用無介質方式,因此能夠將已內包於凝膠三維結構,相對結合力較弱的多孔質粒子接合面,以高速的剪切應力剝離。如此藉由粉碎前述多孔體凝膠,獲得新的溶膠三維結構,前述三維結構係例如在形成塗覆膜時,可維持具有一定範圍之粒度分布的空隙結構,可再形成藉由塗覆、乾燥時的堆積而得的空隙結構。前述粉碎條件無特別限制,例如宜藉由瞬間賦予高速的流動,以不使溶劑揮發的方式將凝膠粉碎。例如,宜以成為如前述之粒度偏差(例如體積平均粒徑或粒度分布)的粉碎物的方式進行粉碎。假設,在粉碎時間、強度等工作量不足的情況下,例如會有殘留粗粒、無法形成緻密之細孔、增加外觀缺陷、無法得到高品質的可能性。另一方面,當工作量過多時,例如可能會形成比期望的粒度分布更微細的溶膠粒子,使塗覆・乾燥後堆積而成的空隙尺寸變微細,而無法達成期望的空隙率。Compared to a device for pulverizing a medium, such as a ball mill that physically destroys the gel structure during pulverization, a cavitation pulverizing device such as a homogenizer can use a medium-free method, for example, so that the three-dimensional structure of the gel can be encapsulated. The porous particles have a relatively weak binding force, and they are peeled off with high-speed shear stress. In this way, a new sol three-dimensional structure is obtained by pulverizing the porous body gel. The three-dimensional structure can maintain a void structure with a certain range of particle size distribution when forming a coating film, and can be formed again by coating and drying. The void structure obtained from the accumulation of time. The aforementioned pulverization conditions are not particularly limited, and for example, it is preferable to pulverize the gel in such a manner that the solvent is not volatilized by instantaneously imparting a high-speed flow. For example, it is preferable to grind | pulverize so that it may become the grind | pulverized material of the particle size deviation (for example, volume average particle diameter or particle size distribution) as mentioned above. It is assumed that when the workload such as pulverization time and strength is insufficient, for example, coarse particles may remain, dense pores may not be formed, appearance defects may increase, and high quality may not be obtained. On the other hand, when the workload is excessive, for example, sol particles may be formed with a finer particle size distribution than desired, and the size of the voids formed after coating and drying may become fine, and the desired void ratio may not be achieved.

宜在前述第1粉碎階段及前述第2粉碎階段的至少一者中,一面測定前述液之剪切黏度一面控制前述多孔體的粉碎。具體的方法,例如可舉出在前述粉碎階段的途中階段,調整成兼具所欲剪切黏度及極優良均勻性之溶膠液的方法,在線內監測前述液之剪切黏度,並回饋至前述粉碎階段的方法。藉此,可製造兼具所欲剪切黏度及極優異均勻性的含凝膠粉碎物之液體。因此,舉例來說,可因應其用途,控制前述含凝膠粉碎物之液體的特性。In at least one of the first pulverization stage and the second pulverization stage, it is preferable to control the pulverization of the porous body while measuring the shear viscosity of the liquid. Specific methods include, for example, a method of adjusting a sol solution having desired shear viscosity and excellent uniformity at the midway stage of the aforementioned pulverization phase, monitoring the shear viscosity of the liquid in-line, and feeding back to the foregoing Method of crushing stage. This makes it possible to produce a gel-containing pulverized liquid having both a desired shear viscosity and extremely excellent uniformity. Therefore, for example, the characteristics of the aforementioned gel-containing pulverized liquid can be controlled in accordance with its use.

在前述粉碎階段後,前述多孔體凝膠為前述矽化合物凝膠時,前述粉碎物所含之殘餘矽醇基的比例並無特別限制,例如可與關於前述熟成處理後之矽化合物凝膠所例示的範圍相同。After the pulverization stage, when the porous body gel is the silicon compound gel, the ratio of the residual silanol groups contained in the pulverized material is not particularly limited. For example, it can be related to the silicon compound gel after the aging treatment. The ranges illustrated are the same.

在本發明之製造方法中,可進一步在前述粉碎步驟(前述第1粉碎階段及前述第2粉碎階段)之至少一者後,進行分級步驟。前述分級步驟係將前述多孔體凝膠的粒子進行分級。前述「分級」係指例如將前述多孔體凝膠的粒子因應粒徑進行區分的動作。分級的方法不受特別限制,可使用篩進行。藉由如此以多個階段實施粉碎處理的方式,將如前述使均勻性極為優良,因此在使用於光學零件等用途時,可令其外觀良好,藉由進一步實施分級處理,可令其外觀變得更良好。In the manufacturing method of the present invention, a classification step may be performed after at least one of the above-mentioned pulverization steps (the first pulverization step and the second pulverization step). The classification step is to classify particles of the porous gel. The "classification" refers to, for example, an operation of classifying particles of the porous body gel according to the particle diameter. The classification method is not particularly limited and can be performed using a sieve. By performing the pulverization treatment in multiple stages in this way, the uniformity is extremely excellent as described above. Therefore, when used in applications such as optical parts, the appearance can be made good. By further performing a classification treatment, the appearance can be changed. Better.

前述凝膠粉碎步驟及任意之前述分級步驟後,含有前述粉碎物之前述溶劑中的前述粉碎物之比例不受特別限制,例如可例示在上述之前述本發明之含凝膠粉碎物之液體中的條件。前述比例,例如可為在前述凝膠粉碎步驟後含有前述粉碎物之溶劑本身的條件,亦可為在前述凝膠粉碎步驟後,被當作前述含凝膠粉碎物之液體使用前時所調整的條件。After the gel pulverization step and any of the classification steps, the proportion of the pulverized material in the solvent containing the pulverized material is not particularly limited. For example, it can be exemplified in the gel pulverized material-containing liquid of the present invention described above. conditions of. The aforementioned ratio may be, for example, a condition of the solvent itself containing the pulverized substance after the gel pulverizing step, or may be adjusted before the gel pulverized substance-containing liquid is used after the gel pulverizing step. conditions of.

如以上所述,可製作含有前述微細孔粒子(凝膠狀化合物之粉碎物)的液體(例如懸濁液)。此外,可在製作出含有前述微細孔粒子的液體後或是在製作過程當中,藉由添加使前述微細孔粒子彼此行化學結合之觸媒來製作含有前述微細孔粒子及前述觸媒的含有液。前述觸媒的添加量沒有特別限定,相對於前述凝膠狀矽化合物之粉碎物的重量,可為例如0.01至20重量%、0.05至10重量%、或0.1至5重量%。前述觸媒亦可為例如促進前述微細孔粒子彼此交聯結合的觸媒。使前述微細孔粒子彼此行化學結合之化學反應宜利用二氧化矽溶膠分子中所含殘留矽醇基的脫水縮合反應。藉前述觸媒促進矽醇基之羥基彼此的反應,可做到在短時間內使空隙結構硬化的連續成膜。前述觸媒可舉如光活性觸媒及熱活性觸媒。根據前述光活性觸媒,例如在前述空隙層形成步驟中,可不依賴加熱使前述微細孔粒子互相進行化學結合(例如交聯)。藉此,例如在前述空隙層形成步驟中就不容易因加熱產生前述空隙層全體的收縮,所以可維持較高的空隙率。此外,除前述觸媒外可再使用可產生觸媒之物質(觸媒產生劑),或以其取代前述觸媒。例如,除了前述光活性觸媒以外,亦可再使用藉由光產生觸媒之物質(光觸媒產生劑)或取而代之;或是除了前述熱活性觸媒以外,亦可再使用藉由熱產生觸媒之物質(熱觸媒產生劑)或取而代之。前述光觸媒產生劑並無特別限定,可舉如光鹼產生劑(藉由照光產生鹼性觸媒之物質)、光酸產生劑(藉由照光產生酸性觸媒之物質)等,且以光鹼產生劑為佳。前述光鹼產生劑可舉如:9-蒽基甲基-N,N-二乙基胺甲酸酯(9-anthrylmethyl N,N-diethylcarbamate、商品名WPBG-018)、(E)-1-[3-(2-羥苯基)-2-丙烯醯基]哌啶((E)-1-[3-(2-hydroxyphenyl)-2-propenoyl]piperidine、商品名WPBG-027)、1-(蒽醌-2-基)乙基咪唑羧酸酯(1-(anthraquinon-2-yl)ethyl imidazolecarboxylate、商品名WPBG-140)、2-硝苯基甲基-4-甲基丙烯醯氧基哌啶-1-羧酸酯(商品名WPBG-165)、1,2-二異丙基-3-[雙(二甲胺基)亞甲基]鈲-2-(3-苯甲醯苯基)丙酸酯(商品名WPBG-266)、1,2-二環己基-4,4,5,5-四甲基雙鈲正丁基三苯基硼酸酯(商品名WPBG-300)及2-(9-氧雜二苯并哌喃-2-基)丙酸-1,5,7-三氮雜雙環[4.4.0]癸-5-烯(東京化成工業股份有限公司)、含4-哌啶甲醇之化合物(商品名HDPD-PB100:Heraeus公司製)等。另外,前述含有「WPBG」之商品名均為和光純藥工業股份有限公司之商品名。前述光酸產生劑可舉如芳香族鋶鹽(商品名SP-170:ADEKA公司)、三芳基鋶鹽(商品名CPI101A:San-Apro Ltd.)、芳香族錪鹽(商品名Irgacure250:Ciba Japan K.K.)等。此外,使前述微細孔粒子互相進行化學結合的觸媒不受到前述光活性觸媒及前述光觸媒產生劑限定,例如亦可為熱活性觸媒或熱觸媒產生劑。使前述微細孔粒子彼此行化學結合之觸媒可舉如氫氧化鉀、氫氧化鈉、氫氧化銨等鹼性觸媒、及鹽酸、乙酸、草酸等酸觸媒等。其等當中又以鹼性觸媒為佳。使前述微細孔粒子互相進行化學結合的觸媒或觸媒產生劑,係例如可藉由在正要塗佈前添加至含有前述粉碎物(微細孔粒子)之溶膠粒子液(例如懸濁液)的方式使用,或者藉由將前述觸媒或觸媒產生劑混合至溶劑之混合液的方式使用。前述混合液,例如為直接添加至前述溶膠粒子液而溶解的塗覆液、將前述觸媒或觸媒產生劑溶解於溶劑的溶液、或者亦可為將前述觸媒或觸媒產生劑分散於溶劑的分散液。前述溶劑不受特別限制,可舉例如水、緩衝液等。As described above, a liquid (for example, a suspension) containing the fine pores (a pulverized product of a gel-like compound) can be prepared. In addition, after the liquid containing the fine pore particles is prepared or during the manufacturing process, a catalyst containing the fine pore particles to chemically bond with each other can be added to prepare a liquid containing the fine pore particles and the catalyst. . The addition amount of the catalyst is not particularly limited, and may be, for example, 0.01 to 20% by weight, 0.05 to 10% by weight, or 0.1 to 5% by weight with respect to the weight of the pulverized product of the gelatinous silicon compound. The catalyst may be, for example, a catalyst that promotes cross-linking and bonding of the microporous particles. The chemical reaction for chemically combining the aforementioned fine pore particles with each other should preferably utilize a dehydration condensation reaction of the residual silanol groups contained in the silica sol molecules. By the aforementioned catalyst promoting the reaction of the hydroxyl groups of the silanol group, continuous film formation that hardens the void structure in a short time can be achieved. Examples of the catalyst include a photoactive catalyst and a thermally active catalyst. According to the photoactive catalyst, for example, in the step of forming the void layer, the fine pore particles can be chemically bonded (eg, crosslinked) to each other without relying on heating. Accordingly, for example, in the step of forming the void layer, it is difficult for the entire void layer to shrink due to heating, so that a high void ratio can be maintained. In addition, in addition to the aforementioned catalyst, a catalyst-generating substance (catalyst generating agent) may be reused or replaced with the aforementioned catalyst. For example, in addition to the aforementioned photoactive catalyst, a substance (photocatalyst generating agent) that generates a catalyst by light may be used or replaced; or in addition to the aforementioned thermally active catalyst, a catalyst generated by heat may also be used Substance (thermal catalyst generator) or replace it. The aforementioned photocatalyst generator is not particularly limited, and examples thereof include a photobase generator (a substance that generates an alkaline catalyst by irradiating light), a photoacid generator (a substance that generates an acidic catalyst by irradiating light), and the like, and a photobase The generating agent is preferred. Examples of the aforementioned photobase generator include: 9-anthrylmethyl-N, N-diethylcarbamate (9-anthrylmethyl N, N-diethylcarbamate, trade name WPBG-018), (E) -1- [3- (2-hydroxyphenyl) -2-propenyl] piperidine ((E) -1- [3- (2-hydroxyphenyl) -2-propenoyl] piperidine, trade name WPBG-027), 1- (Anthraquinone-2-yl) ethyl imidazole carboxylate (1- (anthraquinon-2-yl) ethyl imidazole carboxylate, trade name WPBG-140), 2-nitrophenylmethyl-4-methacryloxy Piperidine-1-carboxylic acid ester (trade name WPBG-165), 1,2-diisopropyl-3- [bis (dimethylamino) methylene] fluorene-2- (3-benzidine Propyl) propionate (trade name WPBG-266), 1,2-dicyclohexyl-4,4,5,5-tetramethylbisfluorene-n-butyltriphenylborate (trade name WPBG-300) And 2- (9-oxadibenzopiperan-2-yl) propanoic acid-1,5,7-triazabicyclo [4.4.0] dec-5-ene (Tokyo Chemical Industry Co., Ltd.), Compound containing 4-piperidinemethanol (trade name HDPD-PB100: manufactured by Heraeus) and the like. In addition, the aforementioned trade names containing "WPBG" are trade names of Wako Pure Chemical Industries, Ltd. Examples of the photoacid generator include an aromatic sulfonium salt (trade name SP-170: ADEKA), a triarylsulfonium salt (trade name CPI101A: San-Apro Ltd.), and an aromatic sulfonium salt (trade name Irgacure250: Ciba Japan). KK) and so on. The catalyst for chemically bonding the fine pore particles to each other is not limited to the photoactive catalyst and the photocatalyst generating agent, and may be, for example, a thermally active catalyst or a thermal catalyst generating agent. Examples of the catalyst for chemically bonding the fine pore particles to each other include alkaline catalysts such as potassium hydroxide, sodium hydroxide, and ammonium hydroxide, and acid catalysts such as hydrochloric acid, acetic acid, and oxalic acid. Among them, alkaline catalysts are preferred. The catalyst or catalyst generator for chemically bonding the fine pore particles to each other is, for example, a sol particle liquid (for example, a suspension) containing the pulverized material (fine pore particles) before being coated. It is used in the manner of, or is used in the manner of mixing the catalyst or the catalyst generator into a solvent mixture. The mixed liquid is, for example, a coating liquid directly added to the sol particle liquid and dissolved, a solution in which the catalyst or catalyst generator is dissolved in a solvent, or the catalyst or catalyst generator may be dispersed in Solvent dispersion. The aforementioned solvent is not particularly limited, and examples thereof include water and a buffer solution.

又,舉例而言,可進一步在製作出含有前述微細孔粒子之液體後,藉由在前述含微細孔粒子之液體中添加微量高沸點溶劑,來改善塗覆成膜時的膜外觀。前述高沸點溶劑量沒有特別限定,相對於前述含微細孔粒子之液體的固體成分量以質量比計係例如0.05倍~0.8倍量、0.1~0.5倍量、特別是0.15倍~0.4倍量。前述高沸點溶劑沒有特別限定,可舉例如二甲基亞碸(DMSO)、N,N-二甲基甲醯胺(DMF)、N,N-二甲基乙醯胺(DMAc)、N-甲基吡咯啶酮(NMP)、γ-丁基內酯(GBL)、乙二醇乙基醚(EGEE)等。尤以沸點110℃以上之溶劑為佳,不限於前述具體例。前述高沸點溶劑被認為在形成粒子並排而成之膜時會代替流平劑發揮作用。凝膠合成時亦宜使用前述高沸點溶劑。不過,於完全去除合成時所用之溶劑後在製作前述含微細孔粒子之液體後重新添加前述高沸點溶劑的方式,會易於有效地發揮作用,惟詳細原因不明。惟,此等機制係屬例示,不對本發明作任何限定。In addition, for example, after the liquid containing the fine pore particles is prepared, a small amount of a high boiling point solvent can be added to the liquid containing the fine pore particles to improve the appearance of the film during coating. The amount of the high-boiling-point solvent is not particularly limited, and it is, for example, 0.05 to 0.8 times the amount, 0.1 to 0.5 times the amount, and particularly 0.15 to 0.4 times the mass ratio of the solid content of the liquid containing the fine pores. The high-boiling point solvent is not particularly limited, and examples thereof include dimethylsulfinium (DMSO), N, N-dimethylformamide (DMF), N, N-dimethylacetamide (DMAc), and N- Methylpyrrolidone (NMP), γ-butyl lactone (GBL), ethylene glycol ethyl ether (EGEE), and the like. A solvent having a boiling point of 110 ° C or higher is particularly preferred, and is not limited to the foregoing specific examples. The above-mentioned high-boiling-point solvent is considered to function as a leveling agent when a film in which particles are formed side by side is formed. The above-mentioned high-boiling-point solvents are also preferably used in gel synthesis. However, the method of adding the aforementioned high-boiling-point solvent after preparing the liquid containing the fine pore particles after completely removing the solvent used in the synthesis can easily and effectively function, but the detailed reason is unknown. However, these mechanisms are examples and do not limit the present invention in any way.

[3.低折射率層之製造方法及含低折射率層之黏接著片材之製造方法] 以下,舉例說明本發明之低折射率層之製造方法及含低折射率層之黏接著片材之製造方法。以下,主要說明前述本發明之低折射率層為矽化合物所形成之聚矽氧多孔體的情形。惟,本發明之低折射率層並不僅限於聚矽氧多孔體。本發明之低折射率層為聚矽氧多孔體以外的情形,只要未特別聲明均可準用以下說明。[3. Manufacturing method of low refractive index layer and manufacturing method of adhesive sheet containing low refractive index layer] Hereinafter, the manufacturing method of the low refractive index layer of the present invention and the adhesive sheet containing low refractive index layer will be described by examples. Of manufacturing method. Hereinafter, the case where the low-refractive index layer of the present invention is a polysilicon porous body formed of a silicon compound will be mainly described. However, the low-refractive index layer of the present invention is not limited to a polysilicon porous body. In the case where the low-refractive index layer of the present invention is other than a polysilicon porous body, the following description can be used unless otherwise specified.

本發明之低折射率層之製造方法,舉例而言,包含下述步驟:前驅物形成步驟,其係使用前述本發明之含凝膠粉碎物之液體來形成前述低折射率層之前驅物;以及結合步驟,其係令前述前驅物所含前述含凝膠粉碎物之液體之前述粉碎物彼此行化學結合。前述前驅物,例如亦可稱為塗覆膜。The method for manufacturing a low-refractive index layer of the present invention includes, for example, the following steps: a precursor forming step, which uses the gel-containing pulverized liquid of the present invention to form the low-refractive index layer precursor; And a combining step of chemically bonding the pulverized materials of the gel-containing liquid containing the precursor to the pulverized materials. The precursor may be referred to as a coating film, for example.

依據本發明之低折射率層之製造方法,會形成例如發揮與空氣層相同機能的多孔質結構。其理由例如可推測如下,但本發明不受此推測限制。以下,舉本發明之低折射率層為聚矽氧多孔體之情形為例予以說明。According to the method for producing a low-refractive index layer of the present invention, for example, a porous structure exhibiting the same function as the air layer is formed. The reason can be presumed as follows, but the present invention is not limited by this presumption. Hereinafter, a case where the low refractive index layer of the present invention is a polysilicon porous body will be described as an example.

在前述聚矽氧多孔體之製造方法所使用之前述本發明之含凝膠粉碎物之液體,係由於含有前述矽化合物凝膠的粉碎物,因此前述凝膠狀二氧化矽化合物的三維結構,成為被分散於三維基本結構的狀態。因此,在前述聚矽氧多孔體之製造方法,例如使用前述含凝膠粉碎物之液體形成前述前驅物(例如塗覆膜),前述三維基本結構堆積起來,形成基於前述三維基本結構的空隙結構。亦即,根據前述聚矽氧多孔體之製造方法,會形成與前述矽化合物凝膠的三維結構不同,自前述三維基本結構之前述粉碎物形成之新的三維結構。此外,在前述聚矽氧多孔體之製造方法中,由於進一步使前述粉碎物彼此進行化學結合,因此前述新的三維結構會被固定化。因此,利用前述聚矽氧多孔體之製造方法獲得之前述聚矽氧多孔體,雖為具有空隙的結構,但仍可維持充分的強度與可撓性。由本發明所得之低折射率層(例如聚矽氧多孔體),舉例來說,可作為利用空隙之構件而用於隔熱材、吸音材、光學構件、吸墨層(ink receiving layer)等廣泛領域的製品,再者,可製作賦予了各種機能的積層薄膜。The gel-containing pulverized liquid of the present invention used in the method for producing a polysilicone porous body is a three-dimensional structure of the gel-like silicon dioxide compound because the pulverized product containing the silicon compound gel is contained in the liquid, It is in a state of being dispersed in a three-dimensional basic structure. Therefore, in the method for manufacturing the polysilicon porous body, for example, the precursor (for example, a coating film) is formed using the gel-containing liquid, and the three-dimensional basic structure is stacked to form a void structure based on the three-dimensional basic structure. . That is, according to the method for producing a polysilicon porous body, a three-dimensional structure different from the three-dimensional structure of the silicon compound gel is formed from the pulverized material of the three-dimensional basic structure. In addition, in the method for manufacturing the polysilicon porous body, the pulverized materials are further chemically bonded to each other, so that the new three-dimensional structure is fixed. Therefore, although the aforementioned polysiloxane porous body obtained by the method for producing the aforementioned polysiloxane porous body has a structure having voids, it can still maintain sufficient strength and flexibility. The low-refractive index layer (for example, a polysilicon porous body) obtained by the present invention can be used, for example, as a member using a gap, and is widely used in heat-insulating materials, sound-absorbing materials, optical members, and ink receiving layers. Products in the field, and furthermore, laminated films having various functions can be produced.

本發明之低折射率層之製造方法,只要沒有特別記載,便可援用前述本發明之含凝膠粉碎物之液體的說明。As long as the manufacturing method of the low-refractive index layer of the present invention is not specifically described, the above description of the gel-containing pulverized liquid of the present invention can be referred to.

在前述多孔體之前驅物的形成步驟中,係例如將前述本發明之含凝膠粉碎物之液體塗覆於前述基材上。本發明之含凝膠粉碎物之液體,係例如於塗覆在基材上並使前述塗覆膜乾燥後,透過前述結合步驟使前述粉碎物彼此進行化學結合(例如交聯),藉此可令具有一定水準以上之膜強度的低折射率層連續成膜。In the step of forming the precursor of the porous body, for example, the gel-containing pulverized material-containing liquid of the present invention is applied to the substrate. The gel-containing pulverized material liquid of the present invention is, for example, after being coated on a substrate and drying the coating film, the pulverized materials are chemically bonded (for example, cross-linked) to each other through the bonding step. A low refractive index layer having a film strength above a certain level is continuously formed.

前述含凝膠粉碎物之液體對前述基材的塗覆量沒有特別限制,例如可因應所欲之前述本發明之低折射率層的厚度等來作適當設定。具體例方面,在形成厚度0.1至1000μm之前述聚矽氧多孔體時,前述含凝膠粉碎物之液體對前述基材的塗覆量係每1m2 基材面積有例如前述粉碎物0.01至60000μg、0.1至5000μg、1至50μg。前述含凝膠粉碎物之液體的理想塗覆量與例如液體濃度或塗覆方式等相關,因而難以一概而論,若考慮生產性,則宜盡可能以薄層塗覆。塗佈量一旦過多,便例如會提高於溶劑揮發前在乾燥爐乾燥的可能性。因此,在奈米粉碎溶膠粒子於溶劑中沉降堆積而形成空隙構造之前,可能會因溶劑乾燥而讓空隙的形成受阻,且空隙率大幅下降。另一方面,塗佈量一旦過薄,則因基材之凹凸、親疏水性之偏差等而產生塗覆收縮(cissing)的風險可能大增。The coating amount of the gel-containing pulverized liquid on the substrate is not particularly limited, and can be appropriately set according to the thickness of the low-refractive index layer of the present invention and the like. In a specific example, when forming the aforementioned polysiloxane porous body having a thickness of 0.1 to 1000 μm, the coating amount of the gel-containing pulverized material to the substrate is, for example, 0.01 to 60,000 μg per 1 m 2 of the substrate area. , 0.1 to 5000 μg, 1 to 50 μg. The ideal coating amount of the aforementioned gel-containing pulverized liquid is related to, for example, the liquid concentration or the coating method, so it is difficult to generalize. If productivity is considered, it should be coated in a thin layer as much as possible. When the coating amount is excessive, for example, the possibility of drying in a drying furnace before the solvent is evaporated is increased. Therefore, before the nano-pulverized sol particles are deposited and accumulated in a solvent to form a void structure, the drying of the solvent may hinder the formation of voids, and the porosity may decrease significantly. On the other hand, if the coating amount is too thin, the risk of coating cissing due to unevenness of the substrate, variation in hydrophilicity and hydrophobicity, and the like may increase significantly.

在將前述含凝膠粉碎物之液體塗覆於前述基材後,可對前述多孔體的前驅物(塗覆膜)施以乾燥處理。藉由前述乾燥處理,舉例來說,不僅可去除前述多孔體之前驅物中的前述溶劑(前述含凝膠粉碎物之液體所含溶劑),目的更在於在乾燥處理中使溶膠粒子沉降、堆積而形成空隙結構。前述乾燥處理之溫度為例如、50~250℃、60~150℃、70~130℃;前述乾燥處理之時間為例如0.1~30分鐘、0.2~10分鐘、0.3~3分鐘。關於乾燥處理溫度及時間,就例如連續生產性或展現高空隙率的關聯性而言,以較低溫度且較短時間為佳。條件若過度嚴苛,則例如在基材為樹脂薄膜的情況下,由於接近前述基材之玻璃轉移溫度,前述基材會在乾燥爐中伸展而可能在剛塗覆後就於所形成之空隙結構出現裂痕等缺陷。另一方面,條件若過度和緩,就可能會在例如離開乾燥爐的時間點含有殘留溶劑,因而在下一步驟中與輥件摩擦時出現刮傷等發生外觀上的不良情況。After the liquid containing the pulverized gel is applied to the substrate, the precursor (coating film) of the porous body may be dried. With the aforementioned drying treatment, for example, not only the aforementioned solvent (the solvent contained in the aforementioned gel-containing liquid containing the pulverized gel) in the porous body precursor can be removed, but also the purpose is to settle and accumulate the sol particles during the drying process. A void structure is formed. The temperature of the drying process is, for example, 50 to 250 ° C, 60 to 150 ° C, or 70 to 130 ° C. The time of the drying process is, for example, 0.1 to 30 minutes, 0.2 to 10 minutes, or 0.3 to 3 minutes. Regarding the drying treatment temperature and time, for example, continuous productivity or a correlation exhibiting a high porosity is preferably a lower temperature and a shorter time. If the conditions are excessively severe, for example, when the substrate is a resin film, the substrate will stretch in a drying furnace due to its approach to the glass transition temperature of the substrate, and may form voids immediately after coating. Defects such as cracks in the structure. On the other hand, if the conditions are excessively mild, residual solvents may be contained at the time of leaving the drying furnace, for example, and there may be appearance defects such as scratches when rubbing with the roller in the next step.

前述乾燥處理係例如可為自然乾燥、加熱乾燥,亦可為減壓乾燥。前述乾燥方法沒有特別限制,例如可使用一般的加熱機構。前述加熱機構可舉如熱風器、加熱輥、遠紅外線加熱器等。其中,在以工業上連續生產為前提下,宜使用加熱乾燥。又,所用溶劑方面,以抑制乾燥時隨溶劑揮發而產生的收縮應力及其所致之空隙層(前述聚矽氧多孔體)龜裂現象為目的,宜為表面張力低的溶劑。前述溶劑可舉如以異丙醇(IPA)為代表之低級醇、己烷、全氟己烷等,但不限於此。The drying treatment system may be, for example, natural drying, heating drying, or drying under reduced pressure. The drying method is not particularly limited, and for example, a general heating mechanism can be used. Examples of the heating means include a hot air heater, a heating roller, and a far-infrared heater. Among them, under the premise of industrial continuous production, heating and drying should be used. In addition, the solvent used is preferably a solvent having a low surface tension for the purpose of suppressing shrinkage stress caused by evaporation of the solvent during drying and cracking of the void layer (the aforementioned polysiloxane porous body) caused by the solvent. Examples of the aforementioned solvent include lower alcohols such as isopropyl alcohol (IPA), hexane, and perfluorohexane, but are not limited thereto.

前述基材沒有特別限制,可適宜使用例如熱可塑性樹脂製之基材、玻璃製之基材、以矽為代表之無機基板、以熱硬化性樹脂等成形之塑膠、半導體等之元件、以奈米碳管為代表之碳纖維類材料等,但不限於此。前述基材的形態,可舉例如薄膜、板等。前述熱可塑性樹脂,可舉例如聚對苯二甲酸乙二酯(PET)、丙烯酸系樹脂、醋酸丙酸纖維素(CAP)、環烯烴聚合物(COP)、三醋酸酯(TAC)、聚萘二甲酸乙二酯(PEN)、聚乙烯(PE)、聚丙烯(PP)等。The substrate is not particularly limited. For example, a substrate made of a thermoplastic resin, a substrate made of glass, an inorganic substrate typified by silicon, a plastic such as a thermosetting resin, a semiconductor element, etc. Carbon fiber materials such as rice carbon tubes are representative, but not limited thereto. Examples of the form of the substrate include a film and a plate. Examples of the thermoplastic resin include polyethylene terephthalate (PET), acrylic resin, cellulose acetate propionate (CAP), cycloolefin polymer (COP), triacetate (TAC), and polynaphthalene. Ethylene diformate (PEN), polyethylene (PE), polypropylene (PP), etc.

本發明之低折射率層之製造方法中,前述結合步驟係令前述多孔體之前驅物(塗覆膜)所含有的前述粉碎物彼此進行化學結合的步驟。舉例來說,藉由前述結合步驟,前述多孔體之前驅物中的前述粉碎物之三維結構被固定化。以習知之燒結進行固定化時,係例如藉由進行200℃以上之高溫處理來激發矽醇基的脫水縮合,形成矽氧烷鍵結。本發明之前述結合步驟中,在例如基材為樹脂薄膜時,係藉由使可催化上述脫水縮合反應的各種添加劑起反應,而可在不損及前述基材下,以100℃左右之較低的乾燥溫度、及低於數分鐘的短暫處理時間連續地形成空隙構造並將其固定化。In the method for producing a low-refractive index layer according to the present invention, the bonding step is a step of chemically bonding the pulverized materials contained in the porous body precursor (coating film) to each other. For example, the three-dimensional structure of the pulverized material in the precursor of the porous body is fixed by the foregoing bonding step. When the conventional sintering is used for immobilization, for example, the dehydration condensation of the silanol group is excited by performing a high-temperature treatment at 200 ° C. or higher to form a siloxane bond. In the foregoing bonding step of the present invention, for example, when the substrate is a resin film, various additives that can catalyze the above-mentioned dehydration condensation reaction are reacted, so that the substrate can be compared at about 100 ° C without damaging the substrate. A low drying temperature and a short processing time of less than a few minutes continuously form a void structure and fix it.

前述使其化學結合的方法沒有特別限制,例如可因應前述凝膠(例如矽化合物凝膠)的種類來作適當決定。就具體例而言,前述化學結合係例如可藉由前述粉碎物彼此之化學性交聯來進行,其他亦可考量的是例如在將氧化鈦等無機粒子添加至前述粉碎物時,使前述無機粒子與前述粉碎物進行化學性交聯的方式。此外,在提供酵素等生物觸媒的情況下,亦有可能使與觸媒活性點不同的部位與前述粉碎物行化學交聯結合。因此,本發明不僅是例如由前述溶膠粒子彼此形成的低折射率層,可想見可擴展到有機無機混成低折射率層、主客體低折射率層等應用,但不限於此。The aforementioned method of chemically bonding is not particularly limited, and it may be appropriately determined according to the type of the gel (for example, a silicon compound gel). As a specific example, the chemical bonding system can be performed, for example, by chemically crosslinking the pulverized materials with each other. Other considerations include, for example, adding inorganic particles such as titanium oxide to the pulverized materials. A method of chemically crosslinking the ground product. In addition, in the case of providing a biocatalyst such as an enzyme, it is possible to chemically crosslink the site different from the active point of the catalyst with the crushed product. Therefore, the present invention is not only a low-refractive index layer formed by the aforementioned sol particles, but it is conceivable that the present invention can be extended to applications such as an organic-inorganic mixed low-refractive index layer and a host-guest low-refractive index layer, but is not limited thereto.

舉例而言,可因應前述凝膠(例如矽化合物凝膠)之粉碎物的種類,經由於觸媒存在下之化學反應來進行前述結合步驟。本發明中的化學反應,宜利用前述矽化合物凝膠之粉碎物所含有之殘餘矽醇基的脫水縮合反應。藉前述觸媒促進矽醇基之羥基彼此的反應,可做到在短時間內使空隙結構硬化的連續成膜。前述觸媒可舉如氫氧化鉀、氫氧化鈉、氫氧化銨等鹼性觸媒,及鹽酸、乙酸、草酸等酸觸媒等,惟不限於此。前述脫水縮合反應之觸媒以鹼性觸媒尤佳。此外,亦可適宜使用藉由照光而展現觸媒活性的光酸產生觸媒或光鹼產生觸媒等。光酸產生觸媒及光鹼產生觸媒沒有特別限定,例如同前所述。前述觸媒例如同前所述,宜於正要進行塗覆前才添加於含有前述粉碎物之溶膠粒子液中作使用,或宜作成已使前述觸媒混合於溶劑中之混合液來使用。前述混合液例如可為:直接添加溶解於前述溶膠粒子液的塗覆液、使前述觸媒溶解於溶劑的溶液、或使前述觸媒分散於溶劑的分散液。前述溶劑無特別限制,如同前述可舉例如水、緩衝液等。For example, the aforementioned bonding step may be performed through a chemical reaction in the presence of a catalyst in accordance with the type of pulverized matter of the aforementioned gel (for example, a silicon compound gel). The chemical reaction in the present invention is preferably a dehydration condensation reaction of residual silanol groups contained in the pulverized material of the aforementioned silicon compound gel. By the aforementioned catalyst promoting the reaction of the hydroxyl groups of the silanol group, continuous film formation that hardens the void structure in a short time can be achieved. Examples of the aforementioned catalyst include alkaline catalysts such as potassium hydroxide, sodium hydroxide, and ammonium hydroxide, and acid catalysts such as hydrochloric acid, acetic acid, and oxalic acid. The catalyst for the aforementioned dehydration condensation reaction is particularly preferably a basic catalyst. In addition, a photoacid-generating catalyst or a photobase-generating catalyst that exhibits catalytic activity by irradiating light can also be suitably used. The photoacid-generating catalyst and the photobase-generating catalyst are not particularly limited, and are, for example, the same as described above. The catalyst is, for example, the same as described above, and is preferably added to the sol particle liquid containing the pulverized material just before coating, or it may be used as a mixed liquid in which the catalyst is mixed in a solvent. The mixed solution may be, for example, a coating solution dissolved in the sol particle liquid, a solution in which the catalyst is dissolved in a solvent, or a dispersion in which the catalyst is dispersed in a solvent. The aforementioned solvent is not particularly limited, and examples thereof include water, buffer, and the like.

此外,例如於本發明之含凝膠液體中,亦可進一步添加用以使前述凝膠之粉碎物彼此形成間接性結合的交聯輔助劑。此交聯輔助劑會進入粒子(前述粉碎物)之間,藉由粒子與交聯輔助劑各自交互作用或結合,使距離稍遠的粒子亦可互相結合,而可有效率地提升強度。前述交聯輔助劑以多交聯矽烷單體為佳。前述多交聯矽烷單體具體上具有例如2以上且3以下之烷氧矽基,且烷氧矽基間之鏈長可為碳數1以上且10以下,並可含有碳以外之元素。前述交聯輔助劑可舉例如:雙(三甲氧矽基)乙烷、雙(三乙氧矽基)乙烷、雙(三甲氧矽基)甲烷、雙(三乙氧矽基)甲烷、雙(三乙氧矽基)丙烷、雙(三甲氧矽基)丙烷、雙(三乙氧矽基)丁烷、雙(三甲氧矽基)丁烷、雙(三乙氧矽基)戊烷、雙(三甲氧矽基)戊烷、雙(三乙氧矽基)己烷、雙(三甲氧矽基)己烷、雙(三甲氧矽基)-N-丁基-N-丙基-乙烷-1,2-二胺、參(3-三甲氧矽基丙基)三聚異氰酸酯、參(3-三乙氧矽基丙基)三聚異氰酸酯等。該交聯輔助劑的添加量沒有特別限定,舉例來說係相對於前述矽化合物粉碎物的重量為0.01至20重量%、0.05至15重量%、或0.1至10重量%。In addition, for example, in the gel-containing liquid of the present invention, a cross-linking auxiliary agent for indirectly bonding the ground particles of the gel may be further added. This cross-linking auxiliary agent will enter between the particles (the above-mentioned pulverized material), and the particles and the cross-linking auxiliary agent interact or combine with each other, so that particles with a longer distance can also be combined with each other, and the strength can be effectively improved. The crosslinking assistant is preferably a polycrosslinking silane monomer. The polycrosslinked silane monomer specifically has, for example, an alkoxysilyl group of 2 or more and 3 or less, and the chain length between the alkoxysilyl groups may be 1 or more and 10 or less, and may contain elements other than carbon. Examples of the cross-linking auxiliary agent include: bis (trimethoxysilyl) ethane, bis (triethoxysilyl) ethane, bis (trimethoxysilyl) methane, bis (triethoxysilyl) methane, bis (Triethoxysilyl) propane, bis (trimethoxysilyl) propane, bis (triethoxysilyl) butane, bis (trimethoxysilyl) butane, bis (triethoxysilyl) pentane, Bis (trimethoxysilyl) pentane, bis (triethoxysilyl) hexane, bis (trimethoxysilyl) hexane, bis (trimethoxysilyl) -N-butyl-N-propyl-ethyl Alkane-1,2-diamine, ginseng (3-trimethoxysilylpropyl) trimer isocyanate, ginseng (3-triethoxysilylpropyl) trimer isocyanate, and the like. The amount of the crosslinking auxiliary to be added is not particularly limited, and is, for example, 0.01 to 20% by weight, 0.05 to 15% by weight, or 0.1 to 10% by weight based on the weight of the pulverized silicon compound.

前述於觸媒存在下之化學反應係可藉由例如下述方式進行:前述觸媒或觸媒產生劑已事先添加於前述含凝膠粉碎物之液體中,而對含有前述觸媒或觸媒產生劑的前述塗覆膜進行照光或加熱;或對前述塗覆膜噴附前述觸媒或觸媒產生劑後進行光照射或加熱;或在噴附前述觸媒或觸媒產生劑的同時進行光照射或加熱。例如,在前述觸媒為光活性觸媒的情況下,可藉由照光,使前述微細孔粒子彼此進行化學結合而形成前述聚矽氧多孔體。此外,在前述觸媒為熱活性觸媒的情況下,可藉由加熱,使前述微細孔粒子彼此進行化學結合而形成前述聚矽氧多孔體。前述照光之照光量(能量)沒有特別限定,以@360nm換算可為例如200至800mJ/cm2 、250至600mJ/cm2 、300至400mJ/cm2 。在照射量不足下,利用觸媒產生劑之光吸收的分解作用會停滯而效果不彰,由避免上述情形的觀點來看,以200mJ/cm2 以上的累積光量為佳。此外,從避免低折射率層下的基材受損而產生熱皺褶的觀點來看,以800mJ/cm2 以下的累積光量為佳。前述照光時的光波長沒有特別限定,例如為200~500nm、300~450nm。前述照光時的光照射時間沒有特別限定,例如為0.1~30分鐘、0.2~10分鐘、0.3~3分鐘。前述加熱處理的條件沒有特別限制,前述加熱溫度為例如50~250℃、60~150℃、70~130℃;前述加熱時間為例如0.1~30分、0.2~10分、0.3~3分。又,所用溶劑方面,例如以抑制乾燥時隨溶劑揮發而產生的收縮應力及其所致之空隙層龜裂現象為目的,宜為表面張力低的溶劑。可舉例如以異丙醇(IPA)為代表的低級醇、己烷、全氟己烷等,惟不限於此。The aforementioned chemical reaction in the presence of a catalyst can be performed, for example, in the following manner: the aforementioned catalyst or catalyst generating agent has been previously added to the aforementioned gel-containing liquid, and The coating film of the generator is irradiated with light or heated; or the coating film is sprayed with the catalyst or catalyst generator and then irradiated or heated with light; or while the catalyst or catalyst generator is sprayed with the coating film Light irradiation or heating. For example, when the catalyst is a photoactive catalyst, the microporous particles can be chemically bonded to each other by irradiating light to form the polysiloxane porous body. In addition, when the catalyst is a thermally active catalyst, the microporous particles can be chemically bonded to each other by heating to form the polysilica porous body. The amount of light (energy) of the aforementioned light is not particularly limited, and may be, for example, 200 to 800 mJ / cm 2 , 250 to 600 mJ / cm 2 , or 300 to 400 mJ / cm 2 in terms of @ 360nm. Under the insufficient irradiation amount, the decomposition effect of the light absorption by the catalyst generator will stagnate and the effect will be inadequate. From the viewpoint of avoiding the above situation, a cumulative light amount of 200 mJ / cm 2 or more is preferable. In addition, from the viewpoint of avoiding damage to the base material under the low-refractive index layer and generating thermal wrinkles, a cumulative light amount of 800 mJ / cm 2 or less is preferred. The wavelength of the light during the illumination is not particularly limited, and is, for example, 200 to 500 nm and 300 to 450 nm. The light irradiation time during the irradiation is not particularly limited, and is, for example, 0.1 to 30 minutes, 0.2 to 10 minutes, and 0.3 to 3 minutes. The conditions of the heat treatment are not particularly limited. The heating temperature is, for example, 50 to 250 ° C., 60 to 150 ° C., or 70 to 130 ° C., and the heating time is, for example, 0.1 to 30 minutes, 0.2 to 10 minutes, or 0.3 to 3 minutes. In addition, the solvent used is, for example, a solvent having a low surface tension for the purpose of suppressing the shrinkage stress caused by the solvent volatilization during drying and the cracking of the void layer caused by the solvent. Examples include, but are not limited to, lower alcohols such as isopropyl alcohol (IPA), hexane, and perfluorohexane.

如上述方式進行,可製造出本發明之低折射率層(例如聚矽氧多孔體)。惟,本發明之低折射率層之製造方法不限於上述方式。此外,以下有時會將作為聚矽氧多孔體之本發明之低折射率層稱為「本發明之聚矽氧多孔體」。As described above, the low-refractive index layer (for example, a polysilicon porous body) of the present invention can be manufactured. However, the manufacturing method of the low-refractive-index layer of this invention is not limited to the said method. In addition, the low-refractive-index layer of this invention which is a polysiloxane porous body may be called the "polysiloxane porous body of this invention" hereafter.

又,本發明之含低折射率層之黏接著片材的製造中,係於本發明之低折射率層上進一步形成黏接著層(黏接著層形成步驟)。具體上,例如可藉由於本發明之低折射率層上塗佈(塗覆)黏著劑或接著劑而形成前述黏接著層。此外,亦可將於基材上積層有前述黏接著層之黏著膠帶等的前述黏接著層側貼合至本發明之低折射率層上,藉此於本發明之低折射率層上形成前述黏接著層。此時,前述黏著膠帶等之基材可繼續保持貼合的狀態,亦可自前述黏接著層剝離。尤其,如同前述,藉由將基材剝離而作成沒有基材(無基材)之含低折射率層之黏接著片材,能使厚度大幅降低,並可使組件等的厚度增加受抑。在本發明中,「黏著劑」及「黏著層」舉例來說係指以被黏著體可再剝離為前提要件的劑或層。本發明中,「接著劑」及「接著層」舉例來說係指不以被黏著體可再剝離為前提要件的劑或層。惟,本發明中,「黏著劑」及「接著劑」並不一定可明確區分,而「黏著層」及「接著層」亦不一定可明確區分。在本發明中,形成前述黏接著層之黏著劑或接著劑並無特別限定,例如可使用一般的黏著劑或接著劑等。前述黏著劑或接著劑,可舉例如丙烯酸類、乙烯醇類、聚矽氧類、聚酯類、聚胺酯類、聚醚類等聚合物製接著劑;橡膠類接著劑等。此外,亦可舉如由戊二醛、三聚氰胺、草酸等的乙烯醇系聚合物之水溶性交聯劑等構成的接著劑等。作為前述黏著劑,從透明性及黏著力的觀點來看,以丙烯酸系黏著劑尤佳。又,作為前述黏著劑,從耐久性的觀點來看,宜為儲存彈性模數高的黏著劑。前述黏著劑(例如丙烯酸系黏著劑)之23℃時的儲存彈性模數(G')可為例如1.0×105 以上、1.1×105 以上、或1.2×105 以上,其上限値沒有特別限定,惟例如1.0×107 以下。該等黏著劑及接著劑可僅使用1種,亦可併用多種(例如混合、積層等)。如同前述,可利用前述黏接著層來保護前述低折射率層免於物理性傷害(尤其是擦傷)。又,前述黏接著層宜為即便作成沒有基材(無基材)之含低折射率層之黏接著片材時仍耐壓性優良而前述低折射率層不致損壞者,惟不限於此。又,前述黏接著層之厚度無特別限制,例如為0.1~100μm、5~50μm、10~30μm或12~25μm。In addition, in the production of the adhesive sheet with a low refractive index layer of the present invention, an adhesive layer is further formed on the low refractive index layer of the present invention (adhesive layer forming step). Specifically, for example, the aforementioned adhesive layer can be formed by applying (coating) an adhesive or an adhesive to the low refractive index layer of the present invention. In addition, the side of the adhesive layer such as an adhesive tape on which the aforementioned adhesive layer is laminated on the substrate may be laminated to the low refractive index layer of the present invention, thereby forming the aforementioned on the low refractive index layer of the present invention. Adhesive layer. At this time, the substrate such as the adhesive tape may continue to be in a bonded state, or may be peeled from the adhesive layer. In particular, as described above, by peeling off the base material to produce an adhesive sheet with a low refractive index layer without a base material (no base material), the thickness can be greatly reduced, and the increase in the thickness of components and the like can be suppressed. In the present invention, the "adhesive" and "adhesive layer" refer to, for example, an agent or a layer on the premise that the adherend can be peeled off again. In the present invention, the "adhesive" and "adhesive layer" mean, for example, an agent or a layer that does not require the adherend to be peelable again. However, in the present invention, "adhesive" and "adhesive" are not necessarily clearly distinguishable, and "adhesive layer" and "adhesive layer" are not necessarily clearly distinguishable. In the present invention, the adhesive or adhesive that forms the adhesive layer is not particularly limited, and for example, a general adhesive or adhesive can be used. Examples of the adhesive or adhesive include polymer-based adhesives such as acrylics, vinyl alcohols, polysiloxanes, polyesters, polyurethanes, and polyethers; and rubber-based adhesives. In addition, an adhesive such as a water-soluble cross-linking agent of a vinyl alcohol polymer such as glutaraldehyde, melamine, and oxalic acid may be used. As said adhesive agent, an acrylic adhesive agent is especially preferable from a viewpoint of transparency and adhesive force. Moreover, as said adhesive agent, it is preferable that it is an adhesive agent with a high storage elastic modulus from a viewpoint of durability. The storage elastic modulus (G ') of the aforementioned adhesive (for example, an acrylic adhesive) at 23 ° C may be, for example, 1.0 × 10 5 or more, 1.1 × 10 5 or more, or 1.2 × 10 5 or more. The upper limit 値 is not particularly limited. It is limited, for example, 1.0 × 10 7 or less. These adhesives and adhesives may be used singly or in combination (for example, mixing and laminating). As mentioned above, the adhesive layer can be used to protect the low refractive index layer from physical damage (especially abrasion). The adhesive layer is preferably one which is excellent in pressure resistance even when the adhesive sheet containing a low-refractive index layer without a substrate (no substrate) is formed and the low-refractive index layer is not damaged, but is not limited thereto. The thickness of the adhesive layer is not particularly limited, and is, for example, 0.1 to 100 μm, 5 to 50 μm, 10 to 30 μm, or 12 to 25 μm.

以此般方式獲得之本發明之低折射率層係例如可進一步與其他薄膜(層)積層而形成含有前述多孔質結構的積層結構體。此時,在前述積層結構體中,各構成要素可透過例如前述黏接著層(黏著劑或接著劑)而積層。The low-refractive index layer of the present invention obtained in this manner can be further laminated with another film (layer) to form a laminated structure including the porous structure. At this time, in the laminated structure, each constituent element can be laminated through, for example, the adhesive layer (adhesive or adhesive).

基於效率,前述各構成要素之積層係例如可藉由使用長條薄膜的連續處理(即所謂捲對捲(Roll to Roll)等)進行積層,當基材為成形物・元件等時,亦可進行批次處理後將其積層。Based on the efficiency, the lamination of each of the aforementioned constituent elements can be laminated by, for example, continuous processing using a long film (so-called roll to roll, etc.). When the base material is a molded article or element, it may be laminated. They are laminated after batch processing.

以下,利用圖1~3舉例說明使用轉印用樹脂薄膜基材(以下有時簡稱「基材」)來製造本發明之低折射率層及含低折射率層之黏接著片材的方法。此外,圖示之製造方僅為一例,不限於此。Hereinafter, a method of manufacturing the low-refractive index layer and the low-refractive index layer-containing adhesive sheet of the present invention using a transfer resin film substrate (hereinafter sometimes referred to as a "substrate") will be described with reference to FIGS. 1 to 3 as examples. In addition, the manufacturer of the illustration is just an example, and it is not limited to this.

圖1之剖面圖示意性表示使用前述基材來製造本發明之低折射率層及含低折射率層之黏接著片材的步驟之一例。圖1中,前述低折射率層之形成方法包含下述步驟:塗覆步驟(1),係將前述本發明之含凝膠粉碎物之液體20''塗覆於基材10上;塗覆膜形成步驟(乾燥步驟)(2),係使含凝膠粉碎物之液體20''乾燥而形成作為前述低折射率層之前驅層的塗覆膜20';及化學處理步驟(例如交聯處理步驟)(3),係對塗覆膜20'進行化學處理(例如交聯處理步驟)而形成低折射率層20。如此即可如圖示般,使用基材10形成低折射率層20。此外,前述低折射率層之形成方法可適當包含或不包含前述步驟(1)~(3)以外之步驟。可進一步如圖示般進行下述步驟:黏接著層塗覆步驟(4),於低折射率層20之位在與基材10相反側之面上塗覆黏接著層30;被覆步驟(5),以分離件40被覆黏接著層30;剝離步驟(6),從低折射率層20剝離並除去基材10;黏接著層塗覆步驟(7),於低折射率層20之已剝離基材10側的面上塗覆另一黏接著層30;被覆步驟(8),以另一分離件40被覆前述另一黏接著層30,而製造出含低折射率層之黏接著片材,其包含於低折射率層20之單面或兩面直接積層了黏接著層30的積層體。此外,圖1係示出各別進行黏接著層塗覆步驟(4)及被覆步驟(5)的方法,惟亦可藉由將低折射率層20貼附在已預先賦予分離件40之黏接著層30(例如分離件40及黏接著層30呈一體的黏著膠帶)上,而同時進行黏接著層塗覆步驟(4)及被覆步驟(5)。黏接著層塗覆步驟(7)及被覆步驟(8)亦同。又,前述含低折射率層之黏接著片材之形成方法可適當包含或不包含前述步驟(1)~(8)以外之步驟。又,圖1所製造之含低折射率層之黏接著片材於使用時,可例如將被覆並保護黏接著層30的分離件40去除而使黏接著層30暴露以作使用。The cross-sectional view of FIG. 1 schematically shows an example of steps for manufacturing the low-refractive index layer and the low-refractive index layer-containing adhesive sheet of the present invention using the aforementioned substrate. In FIG. 1, the method for forming the aforementioned low refractive index layer includes the following steps: a coating step (1), which coats the gel-containing liquid 20 ″ of the present invention on a substrate 10; The film forming step (drying step) (2) is a step of drying the gel-containing liquid 20 "to form a coating film 20 'as a precursor layer of the aforementioned low refractive index layer; and a chemical treatment step (such as crosslinking (Processing step) (3): The coating film 20 'is subjected to a chemical treatment (for example, a crosslinking treatment step) to form a low-refractive index layer 20. In this way, as shown in the figure, the low refractive index layer 20 can be formed using the substrate 10. In addition, the method for forming the low-refractive index layer may appropriately include or exclude steps other than the steps (1) to (3). The following steps can be further performed as shown in the figure: an adhesive layer coating step (4), applying an adhesive layer 30 on the surface of the low refractive index layer 20 on the side opposite to the substrate 10; and a coating step (5) The adhesive layer 30 is covered with a separating member 40; the peeling step (6) peels and removes the substrate 10 from the low-refractive index layer 20; the adhesive layer coating step (7), the peeled base of the low-refractive index layer 20 The other side of the material 10 is coated with another adhesive layer 30; in the coating step (8), the other another adhesive layer 30 is covered with another separating member 40 to produce an adhesive sheet containing a low refractive index layer, which One or both sides of the low refractive index layer 20 are directly laminated with a laminated body of the adhesive layer 30. In addition, FIG. 1 shows a method of separately performing an adhesive layer coating step (4) and a covering step (5), but it is also possible to attach the low-refractive index layer 20 to the adhesive that has been previously given to the separator 40. Then, the layer 30 (for example, the adhesive tape in which the separating member 40 and the adhesive layer 30 are integrated) is simultaneously subjected to the adhesive layer coating step (4) and the covering step (5). The same applies to the adhesive layer coating step (7) and the covering step (8). In addition, the method for forming the low-refractive index-containing adhesive sheet may include or not include steps other than the steps (1) to (8) as appropriate. In addition, when the adhesive sheet containing the low refractive index layer manufactured in FIG. 1 is used, for example, the separating member 40 covering and protecting the adhesive layer 30 can be removed to expose the adhesive layer 30 for use.

在前述塗覆步驟(1)中,含凝膠粉碎物之液體20''之塗覆方法並無特別限定,可採用一般的塗覆方法。前述塗覆方法可舉如狹縫式模塗(slot die)法、反向凹版塗佈(reverse gravure coat)法、微凹版(micro gravure)法(微凹版塗佈(micro gravure coat)法)、浸漬法(浸漬塗佈法)、旋塗法、刷塗法、輥塗法、柔版印刷法、線棒塗佈法、噴塗法、擠壓塗佈法、淋幕式塗佈法、反向塗佈法等。其等之中,從生產性、塗膜之平滑性等觀點來看,以擠壓塗佈法、淋幕式塗佈法、輥塗法、微凹版塗佈法等為佳。含凝膠粉碎物之液體20''之塗覆量並無特別限定,例如可作適當設定以使多孔質結構(低折射率層)20之厚度妥適。多孔質結構(低折射率層)20之厚度並無特別限定,例如與前述相同。In the aforementioned coating step (1), the coating method of the gel-containing liquid 20 "is not particularly limited, and a general coating method can be adopted. The aforementioned coating method may be, for example, a slot die method, a reverse gravure coat method, a micro gravure method (micro gravure coat method), Dipping method (dip coating method), spin coating method, brush coating method, roll coating method, flexographic printing method, wire rod coating method, spray coating method, extrusion coating method, curtain coating method, reverse Coating method, etc. Among these, from the viewpoints of productivity and smoothness of the coating film, an extrusion coating method, a curtain coating method, a roll coating method, a micro gravure coating method, and the like are preferred. The coating amount of the gel-pulverized liquid 20 "is not particularly limited, and for example, it can be appropriately set so that the thickness of the porous structure (low-refractive index layer) 20 is appropriate. The thickness of the porous structure (low-refractive index layer) 20 is not particularly limited, and is, for example, the same as that described above.

前述乾燥步驟(2)中,係將含凝膠粉碎物之液體20''乾燥(即去除含凝膠粉碎物之液體20''中所含分散介質)而形成塗覆膜(前驅層)20'。乾燥處理之條件並無特別限定,如同前述。In the aforementioned drying step (2), the gel-containing liquid 20 "is dried (that is, the dispersion medium contained in the gel-containing liquid 20" is removed) to form a coating film (precursor layer) 20 '. The conditions for the drying treatment are not particularly limited, as described above.

再者,在前述化學處理步驟(3)中,對含有塗覆前所添加之前述觸媒(例如光活性觸媒、光觸媒產生劑、熱活性觸媒或熱觸媒產生劑)的塗覆膜20',進行照光或加熱,使塗覆膜(前驅物)20'中之前述粉碎物彼此進行化學結合(例如交聯),形成低折射率層20。前述化學處理步驟(3)之照光或加熱條件無特別限定,就如同前述。Furthermore, in the aforementioned chemical processing step (3), a coating film containing the aforementioned catalyst (for example, a photoactive catalyst, a photocatalyst generating agent, a thermally active catalyst, or a thermal catalyst generating agent) added before coating is applied. 20 ', irradiate with light or heat to chemically combine (for example, cross-link) the aforementioned pulverized materials in the coating film (precursor) 20' to form a low refractive index layer 20. The irradiation or heating conditions of the aforementioned chemical processing step (3) are not particularly limited, as described above.

接下來,圖2係示意性表示狹縫式模塗法之塗覆裝置及使用了該裝置之前述低折射率層之形成方法之一例。另外,圖2雖為剖面圖,但為了易讀性省略了影線。Next, FIG. 2 schematically shows an example of a coating device of a slit die coating method and a method of forming the aforementioned low refractive index layer using the device. In addition, although FIG. 2 is a cross-sectional view, hatching is omitted for readability.

如圖所示,使用了該裝置之方法的各步驟係藉由輥件一邊朝一方向輸送基材10一邊進行該步驟。輸送速度無特別限定,例如為1~100m/分、3~50m/分、5~30m/分。As shown in the figure, each step of the method using the apparatus is performed while the substrate 10 is conveyed in one direction by a roller. The conveying speed is not particularly limited, and is, for example, 1 to 100 m / min, 3 to 50 m / min, and 5 to 30 m / min.

首先,一邊從送出輥101輸出基材10一邊輸送,並在塗覆輥102進行塗覆步驟(1),即於基材上塗覆本發明之含凝膠粉碎物之液體20'',然後續於烘箱區110內過渡到乾燥步驟(2)。圖2之塗覆裝置中,係於塗覆步驟(1)後在乾燥步驟(2)前先進行預乾燥步驟。預乾燥步驟可不經過加熱,在室溫下進行。於乾燥步驟(2)中,使用加熱機構111。加熱機構111如同前述,可適當使用熱風器、加熱輥、遠紅外線加熱器等。此外,例如可將乾燥步驟(2)分成多個步驟,令乾燥溫度隨著後續的乾燥步驟愈來愈高。First, the substrate 10 is conveyed while being output from the feed roller 101, and the coating step (1) is performed on the coating roller 102, that is, the gel-containing liquid 20 '' of the present invention is coated on the substrate, and then continued The transition to the drying step (2) is performed in the oven area 110. In the coating apparatus of FIG. 2, a pre-drying step is performed after the coating step (1) and before the drying step (2). The pre-drying step may be performed at room temperature without heating. In the drying step (2), a heating mechanism 111 is used. As described above, the heating mechanism 111 may be a heater, a heating roller, a far-infrared heater, or the like. In addition, for example, the drying step (2) can be divided into a plurality of steps, so that the drying temperature becomes higher with the subsequent drying step.

於乾燥步驟(2)後,在化學處理區120內進行化學處理步驟(3)。在化學處理步驟(3)中,例如當乾燥後之塗覆膜20'含有光活性觸媒時,係以配置在基材10上下的燈(照光機構)121進行照光。或者,例如在乾燥後之塗覆膜20'含有熱活性觸媒時,使用熱風器(加熱機構)代替燈(照光裝置)121,以配置在基材10上下的熱風器121將基材10加熱。藉由該交聯處理,可引發塗覆膜20'中之前述粉碎物彼此的化學結合,讓低折射率層20硬化.強化。再者,雖省略圖示,惟可利用捲對捲(Roll to Roll)法進行圖1之前述步驟(4)~(8),製造前述含低折射率層之黏接著片材。其後,利用捲取輥105捲取所製出之前述含低折射率層之黏接著片材。After the drying step (2), a chemical treatment step (3) is performed in the chemical treatment zone 120. In the chemical treatment step (3), for example, when the dried coating film 20 'contains a photoactive catalyst, the light is irradiated with a lamp (lighting mechanism) 121 disposed above and below the substrate 10. Alternatively, for example, when the dried coating film 20 ′ contains a thermally active catalyst, a hot air heater (heating mechanism) is used instead of the lamp (lighting device) 121, and the hot air heater 121 disposed above and below the base material 10 heats the base material 10. . By this cross-linking treatment, the aforementioned pulverized materials in the coating film 20 'can be chemically bonded to each other, and the low refractive index layer 20 can be hardened. strengthen. In addition, although illustration is omitted, the aforementioned steps (4) to (8) of FIG. 1 may be performed by using a roll to roll method to manufacture the aforementioned adhesive sheet containing a low refractive index layer. Thereafter, the produced adhesive sheet containing the low-refractive index layer is taken up by a take-up roll 105.

圖3示意性表示微凹版法(微凹版塗佈法)之塗覆裝置及使用了該裝置的前述多孔質結構形成方法之一例。另外,該圖雖為剖面圖,但為了易讀性省略了影線。FIG. 3 schematically shows an example of a coating device of a microgravure method (microgravure coating method) and the aforementioned porous structure forming method using the same. Although this figure is a cross-sectional view, hatching has been omitted for readability.

如圖所示,使用該裝置之方法的各步驟與圖2同樣地係藉由輥件一邊朝一方向輸送基材10一邊進行該步驟。輸送速度無特別限定,例如為1~100m/分、3~50m/分、5~30m/分。As shown in the figure, the steps of the method using the apparatus are performed in the same manner as in FIG. 2 while the substrate 10 is conveyed in one direction by a roller. The conveying speed is not particularly limited, and is, for example, 1 to 100 m / min, 3 to 50 m / min, and 5 to 30 m / min.

首先,一邊從送出輥201輸出基材10進行輸送一邊實施塗覆步驟(1),在基材10塗覆本發明之含凝膠粉碎物之液體20''。含凝膠粉碎物之液體20''的塗覆係如圖示,利用儲液區202、刮刀(doctor knife)203及微凹版204進行。具體上,係使儲留在儲液區202中的含凝膠粉碎物之液體20''附著於微凹版204表面,再以刮刀203控制成預定的厚度並同時以微凹版204塗覆於基材10表面。另外,微凹版204為例示,並不限於此,亦可使用其他任意的塗覆機構。First, the coating step (1) is performed while conveying the substrate 10 from the sending-out roller 201 for conveyance, and the substrate 10 is coated with the gel-pulverized liquid 20 '' of the present invention. The coating of the liquid 20 "containing the pulverized gel was performed using a liquid storage area 202, a doctor knife 203, and a microgravure 204 as shown in the figure. Specifically, the liquid 20 '' containing the pulverized gel stored in the liquid storage area 202 is attached to the surface of the microgravure 204, and then controlled to a predetermined thickness by a doctor blade 203 and simultaneously coated on the substrate with the microgravure 204材 10 surface. In addition, the micro gravure 204 is exemplified and is not limited to this, and any other coating mechanism may be used.

接下來進行乾燥步驟(2)。具體而言,如圖示將塗覆了含凝膠粉碎物之液體20''之基材10輸送至烤箱區210中,藉由烤箱區210內之加熱機構211加熱進行乾燥。加熱機構211亦可例如與圖2相同。又,例如亦可藉由將烘箱區210分成多個區塊而將乾燥步驟(2)分成多個步驟,令乾燥溫度隨著後續的乾燥步驟愈來愈高。於乾燥步驟(2)後,在化學處理區220內進行化學處理步驟(3)。在化學處理步驟(3)中,例如當乾燥後之塗覆膜20'含有光活性觸媒時,係以配置在基材10上下的燈(照光機構)221進行照光。或者,例如當乾燥後之塗覆膜20'含有熱活性觸媒時,會使用熱風器(加熱機構)來代替燈(照光裝置)221,以配置在基材10下方的熱風器(加熱機構)221將基材10加熱。藉由該交聯處理,會引發塗覆膜20'中之前述粉碎物彼此的化學結合,形成低折射率層20。Next, a drying step (2) is performed. Specifically, as shown in the figure, the substrate 10 coated with the gel-containing pulverized liquid 20 ″ is transferred to the oven zone 210 and dried by heating by a heating mechanism 211 in the oven zone 210. The heating mechanism 211 may be the same as, for example, FIG. 2. In addition, for example, the drying step (2) can be divided into a plurality of steps by dividing the oven area 210 into a plurality of blocks, so that the drying temperature becomes higher and higher with the subsequent drying step. After the drying step (2), a chemical treatment step (3) is performed in the chemical treatment zone 220. In the chemical processing step (3), for example, when the dried coating film 20 'contains a photoactive catalyst, the light is irradiated with a lamp (lighting mechanism) 221 disposed above and below the substrate 10. Or, for example, when the dried coating film 20 'contains a thermally active catalyst, a hot air heater (heating mechanism) is used instead of the lamp (lighting device) 221, and the hot air heater (heating mechanism) disposed below the substrate 10 is used. 221 The substrate 10 is heated. By this cross-linking treatment, chemical bonding between the aforementioned pulverized materials in the coating film 20 ′ is initiated, and the low refractive index layer 20 is formed.

再者,雖省略圖示,惟可利用捲對捲(Roll to Roll)法進行圖1之前述步驟(4)~(8),製造前述含低折射率層之黏接著片材。其後,利用捲取輥251捲取所製出之前述含低折射率層之黏接著片材。In addition, although illustration is omitted, the aforementioned steps (4) to (8) of FIG. 1 may be performed by using a roll to roll method to manufacture the aforementioned adhesive sheet containing a low refractive index layer. Thereafter, the prepared adhesive sheet containing the low-refractive index layer is wound up by a take-up roll 251.

[4.空隙層] 以下,就本發明之低折射率層為空隙層的情形(本發明之空隙層)舉例說明。惟,此等係為例示,並不限制本發明。又,以下對於空隙本身相關事項(例如空隙率、細孔徑等)以外之事項(例如霧度、折射率、層厚度、耐擦傷性、Rz係數等)的記載,在未特別聲明下,亦可援用於本發明之低折射率層為空隙層以外的情形。[4. Void layer] Hereinafter, a case where the low-refractive index layer of the present invention is a void layer (the void layer of the present invention) will be exemplified. However, these are examples and do not limit the present invention. In addition, the following description of matters (such as haze, refractive index, layer thickness, abrasion resistance, Rz coefficient, etc.) other than matters related to the void itself (such as porosity, pore size, etc.) may be described without special notice. The low refractive index layer used in the present invention is a case other than the void layer.

本發明之空隙層係可為例如空隙率為35體積%以上且峰值細孔徑為50nm以下。但此為例示,本發明之空隙層不限於此。The void layer system of the present invention may be, for example, a void ratio of 35% by volume or more and a peak pore diameter of 50 nm or less. However, this is an example, and the void layer of the present invention is not limited to this.

前述空隙率可為例如35體積%以上、38體積%以上、或40體積%以上,並可為90體積%以下、80體積%以下、或75體積%以下。前述本發明之空隙層可為例如空隙率60體積%以上的高空隙層。The porosity may be, for example, 35 vol% or more, 38 vol% or more, or 40 vol% or more, and may be 90 vol% or less, 80 vol% or less, or 75 vol% or less. The void layer of the present invention may be a high void layer having a void ratio of 60% by volume or more.

前述空隙率可經由例如下述測定方法作測定。The porosity can be measured by, for example, the following measurement method.

(空隙率之測定方法) 作為空隙率測定對象的層若僅以單一層含有空隙,則層構成物質與空氣的比率(體積比)便能利用常規方法(例如測定重量及體積算出密度)算出,故可藉此計算空隙率(體積%)。又,由於折射率與空隙率具有相關關係,故例如亦可從層的折射率値算出空隙率。具體上可例如由橢圓偏振計測出的折射率値,依Lorentz‐Lorenz's formula(勞侖茲-勞侖次公式)計算空隙率。(Measurement method of porosity) If the layer to be measured for porosity contains voids in a single layer, the ratio (volume ratio) of the layer constituent substance to the air can be calculated by a conventional method (for example, measuring the weight and volume to calculate the density). Therefore, the porosity (volume%) can be calculated from this. In addition, since the refractive index has a correlation with the porosity, the porosity can also be calculated from the refractive index 的 of the layer, for example. Specifically, for example, the refractive index 测 measured by an ellipsometer can be used to calculate the porosity according to Lorentz-Lorenz's formula.

本發明之空隙層係例如像前述般可經由凝膠粉碎物(微細孔粒子)的化學結合來製造。此時,為求方便,空隙層的空隙可分成下述(1)~(3)的3種類。 (1)原料凝膠本身(粒子內)所具有的空隙 (2)凝膠粉碎物單元所具有的空隙 (3)因凝膠粉碎物的堆積而產生之粉碎物間的空隙The void layer of the present invention can be produced, for example, as described above, through chemical bonding of a pulverized gel (fine-pored particles). At this time, for convenience, the voids of the void layer can be classified into the following three types (1) to (3). (1) The voids in the raw gel itself (inside the particles) (2) The voids in the gel pulverized substance unit (3) The voids between the pulverized substances due to the accumulation of the pulverized gel

前述(2)的空隙,是不論凝膠粉碎物(微細孔粒子)的尺寸、大小等而將粉碎前述凝膠所生成之各粒子群視為一整塊(塊體, block)時,各塊體內可形成之有別於前述(1)的粉碎時形成之空隙。又,前述(3)的空隙是在粉碎(例如無介質粉碎等)中,因凝膠粉碎物(微細孔粒子)的尺寸、大小等不一而產生的空隙。本發明的空隙層係例如藉由具有前述(1)~(3)的空隙而有適當的空隙率及峰值細孔徑。The void in the above (2) refers to the case where each particle group generated by pulverizing the gel is regarded as a single block (block) regardless of the size and size of the pulverized gel (fine-pored particles). The voids that can be formed in the body are different from those formed during the crushing of (1) above. The voids in the above (3) are voids caused by the size, size, and the like of the pulverized gel (fine-pored particles) during the pulverization (for example, medium-free pulverization, etc.). The void layer of the present invention has an appropriate porosity and peak pore diameter, for example, by having the voids (1) to (3).

又,前述峰值細孔徑可為例如5nm以上、10nm以上、或20nm以上,並可為50nm以下、40nm以下、或30nm以下。於空隙層中,在空隙率高的狀態下若峰值細孔徑過大,便會光散射而呈不透明。又,本發明貸中,空隙層的峰值細孔徑下限値沒有特別限定,但,惟若峰值細孔徑過小,便會難以提高空隙率,故峰值細孔徑不宜過小。本發明中,峰值細孔徑可例如利用下述方法來測定。The peak pore diameter may be, for example, 5 nm or more, 10 nm or more, or 20 nm or more, and may be 50 nm or less, 40 nm or less, or 30 nm or less. In the void layer, if the peak pore diameter is too large in a state where the void ratio is high, light is scattered and becomes opaque. In addition, in the present invention, the lower limit of the peak pore diameter of the void layer is not particularly limited. However, if the peak pore diameter is too small, it is difficult to increase the porosity, so the peak pore diameter should not be too small. In the present invention, the peak pore diameter can be measured, for example, by the following method.

(峰值細孔徑的測定方法) 使用細孔分布/比表面積測定裝置(BELLSORP MINI/MicrotracBEL公司之商品名),從利用氮吸附之BJH圖及BET圖、等溫吸附線的計算結果,算出峰值細孔徑。(Measurement method of peak pore diameter) Using a pore distribution / specific surface area measuring device (a brand name of BELLSORP MINI / MicrotracBEL), the peak pore diameter was calculated from the calculation results of the BJH chart and BET chart of nitrogen adsorption, and the isothermal adsorption line. Aperture.

又,本發明之空隙層的厚度沒有特別限定,可為例如100nm以上、200nm以上、或300nm以上,並可為10000nm以下、5000nm以下、或2000nm以下。The thickness of the void layer of the present invention is not particularly limited, and may be, for example, 100 nm or more, 200 nm or more, or 300 nm or more, and may be 10,000 nm or less, 5000 nm or less, or 2000 nm or less.

本發明之空隙層或低折射率層,從表面強度等的關係來說,表面粗度Rz係數宜盡可能低。前述表面粗度Rz係數可為例如100nm以下、95nm以下、或90nm以下。前述表面粗度Rz係數若在100nm以上,本發明之空隙層或低折射率層表面的強度便易於抑制或防止掉落時容易損傷等問題。前述表面粗度Rz係數的下限値沒有特別限定,例如50nm以上。In the void layer or the low-refractive-index layer of the present invention, the surface roughness Rz coefficient should preferably be as low as possible from the relationship of surface strength and the like. The aforementioned surface roughness Rz coefficient may be, for example, 100 nm or less, 95 nm or less, or 90 nm or less. If the surface roughness Rz coefficient is 100 nm or more, the strength of the surface of the void layer or the low-refractive index layer of the present invention can be easily suppressed or prevented from being easily damaged when dropped. The lower limit 値 of the surface roughness Rz coefficient is not particularly limited, and is, for example, 50 nm or more.

此外,本發明中,前述表面粗度Rz係數是指JIS B 0601:1970/JIS B 0601:1994所定義的十點平均粗度。前述表面粗度Rz係數(十點平均粗度)的定義,具體上是從粗度曲線於其平均線方向截取僅僅基準長度,求出該截取部分自平均線起於縱倍率之方向所測出之最高峰頂至第5高峰頂的標高(Yp)絕對値的平均値、與最低谷底至第5低谷底的標高(Yv)絕對値的平均値兩者之和,該係數即表其值。前述表面粗度Rz係數可例如經由使用原子間力顯微鏡(AFM)的方法來測定。具體上,利用前述原子間力顯微鏡測定一定範圍的表面,並計算該區域的十點表面粗度(Rz)。例如,可使用精工電子公司製SPI3800(商品名)作為前述原子間力顯微鏡,以DFM模式測定5μm×5μm範圍的表面影像,利用裝置搭載的體算出十點表面粗度(Rz)。In the present invention, the aforementioned surface roughness Rz coefficient refers to a ten-point average roughness defined by JIS B 0601: 1970 / JIS B 0601: 1994. The definition of the aforementioned surface roughness Rz coefficient (ten-point average roughness) is specifically taken from the roughness curve in the direction of its average line to intercept only the reference length, and the measured portion is measured from the average line in the direction of the vertical magnification. The sum of the average 値 of the absolute value of the elevation (Yp) of the highest peak to the fifth peak and the average 値 of the absolute value of the elevation (Yv) of the lowest valley to the 5th lowest, the coefficient is the value. The aforementioned surface roughness Rz coefficient can be measured, for example, by a method using an atomic force microscope (AFM). Specifically, the surface of a certain range was measured using the aforementioned interatomic force microscope, and the ten-point surface roughness (Rz) of the area was calculated. For example, SPI3800 (trade name) manufactured by Seiko Instruments Inc. may be used as the interatomic force microscope to measure a surface image in a range of 5 μm × 5 μm in DFM mode, and calculate a ten-point surface roughness (Rz) using a body mounted on the device.

又,本發明之空隙層,舉例而言,其表示膜強度之利用BEMCOT(註冊商標)測得的耐擦傷性可為60~100%,表示可撓性之利用MIT試驗所得的耐折次數可為100次以上,惟不限於此。In addition, the void layer of the present invention, for example, indicates that the abrasion resistance measured using BEMCOT (registered trademark) of the film strength can be 60 to 100%, and the number of fold resistance obtained by the MIT test indicating flexibility can be measured. It is 100 times or more, but it is not limited to this.

本發明之空隙層,舉例而言,由於使用前述多孔體凝膠之粉碎物,因此前述多孔體凝膠之三維結構被破壞,形成與前述多孔體凝膠不同之新的三維結構。如此,本發明之空隙層會是新的孔結構(新的空隙結構)所形成的層,且是由前述多孔體凝膠形成之層無從獲得之新的孔結構,藉此可形成空隙率高之奈米級空隙層。此外,本發明之空隙層,在例如前述空隙層為聚矽氧多孔體的情況下,舉例來說,在調整矽化合物凝膠之矽氧烷鍵官能基數的同時,使前述粉碎物彼此進行化學結合。又,作為前述空隙層之前驅物的新三維結構形成後,就在結合步驟進行化學結合(例如交聯),故本發明之空隙層,在例如前述空隙層為機能性多孔體的情況下雖然是具有空隙的結構,但仍能維持充分的強度與可撓性。因此,依據本發明,可容易且簡便地將空隙層賦予至各式各樣的對象物。For example, the void layer of the present invention uses the pulverized material of the porous body gel, so that the three-dimensional structure of the porous body gel is destroyed, and a new three-dimensional structure different from the porous body gel is formed. In this way, the void layer of the present invention will be a layer formed by a new pore structure (new void structure) and a new pore structure that cannot be obtained from the layer formed by the aforementioned porous body gel, thereby forming a high void ratio Nano-scale void layer. In addition, in the void layer of the present invention, for example, when the void layer is a porous polysiloxane, for example, while adjusting the number of siloxane bond functional groups of a silicon compound gel, the pulverized materials are chemically treated with each other. Combined. In addition, after the formation of a new three-dimensional structure as a precursor of the aforementioned void layer, chemical bonding (for example, cross-linking) is performed in the bonding step. Therefore, for example, when the aforementioned void layer is a functional porous body, It has a void structure, but still maintains sufficient strength and flexibility. Therefore, according to the present invention, it is possible to easily and simply apply the void layer to various objects.

本發明之空隙層,係例如像前述般含有多孔體凝膠的粉碎物,且前述粉碎物彼此以化學方式結合。在本發明之空隙層中,前述粉碎物彼此的化學結合(化學鍵)形態並無特別限制,前述化學鍵之具體例可舉如交聯鍵結等。此外,使前述粉碎物彼此化學結合的方法,係例如如同前述空隙層之製造方法中所詳細說明者。The void layer of the present invention is, for example, a pulverized product containing a porous body gel as described above, and the pulverized products are chemically bonded to each other. In the void layer of the present invention, the chemical bonding (chemical bond) form of the pulverized materials is not particularly limited, and specific examples of the chemical bond include cross-linking bonding and the like. The method of chemically bonding the pulverized materials to each other is, for example, as described in detail in the method for producing the void layer.

前述交聯結合係例如為矽氧烷鍵。前述矽氧烷鍵可舉如以下所示T2鍵、T3鍵、T4鍵。在本發明之聚矽氧多孔體具有矽氧烷鍵時,例如可具有任意一種鍵,亦可具有任意兩種鍵,亦可具有全部三種鍵。前述矽氧烷鍵中,T2及T3之比率越高,便越富可撓性,並可期凝膠本來的特性,但膜強度會變得脆弱。另一方面,若前述矽氧烷鍵中的T4比率越高,便越易展現膜強度,但空隙尺寸會變小,可撓性會變弱。因此,宜因應例如用途來變化T2、T3、T4比率。The cross-linking bonding system is, for example, a siloxane bond. Examples of the siloxane bond include a T2 bond, a T3 bond, and a T4 bond as shown below. When the polysiloxane porous body of the present invention has a siloxane bond, for example, it may have any kind of bond, any two kinds of bonds, or all three kinds of bonds. Among the aforementioned siloxane bonds, the higher the ratio of T2 and T3, the more flexible it is, and the inherent properties of the gel can be expected, but the film strength becomes weak. On the other hand, if the T4 ratio in the siloxane bond is higher, the strength of the film is more likely to be exhibited, but the void size becomes smaller and the flexibility becomes weaker. Therefore, it is desirable to change the T2, T3, and T4 ratios according to, for example, use.

[化學式5] [Chemical Formula 5]

本發明之空隙層具有前述矽氧烷鍵時,T2、T3及T4的比例例如在相對以「1」表示T2時,T2:T3:T4=1:[1~100]:[0~50]、1:[1~80]:[1~40]、1:[5~60]:[1~30]。When the void layer of the present invention has the aforementioned siloxane bond, the ratio of T2, T3, and T4 is, for example, when T2 is represented by "1", T2: T3: T4 = 1: [1 to 100]: [0 to 50] , 1: [1 to 80]: [1 to 40], 1: [5 to 60]: [1 to 30].

此外,本發明之空隙層以例如所含矽原子呈矽氧烷鍵結為佳。作為具體例,前述聚矽氧多孔體所含之所有矽原子中未結合的矽原子(亦即殘留矽醇)的比例為例如低於50%、30%以下、15%以下。The void layer of the present invention is preferably, for example, when the silicon atoms contained therein are siloxane bonded. As a specific example, the proportion of unbound silicon atoms (that is, residual silanol) in all silicon atoms contained in the aforementioned polysilica porous body is, for example, less than 50%, 30% or less, and 15% or less.

本發明之空隙層具有孔結構,孔之空隙尺寸係指空隙(孔)之長軸直徑及短軸直徑中的前述長軸直徑。空孔尺寸為例如5nm~50nm。前述空隙尺寸其下限為例如5nm以上、10nm以上、20nm以上,其上限為例如、50nm以下、40nm以下、30nm以下,其範圍為例如5nm~50nm、10nm~40nm。由於要因應使用空隙結構之用途來決定理想的空隙尺寸,故空隙尺寸必須因應例如目的來調整成所欲的空隙尺寸。空隙尺寸,例如可藉由以下的方法評價。The void layer of the present invention has a pore structure, and the pore void size refers to the aforementioned major axis diameter of the major axis diameter and the minor axis diameter of the gap (hole). The pore size is, for example, 5 nm to 50 nm. The lower limit of the gap size is, for example, 5 nm or more, 10 nm or more, and 20 nm or more. The upper limit is, for example, 50 nm or less, 40 nm or less, and 30 nm or less. The range is, for example, 5 nm to 50 nm, 10 nm to 40 nm. Since the ideal gap size is determined according to the use of the gap structure, the gap size must be adjusted to a desired gap size according to, for example, the purpose. The void size can be evaluated, for example, by the following method.

(空隙層的剖面SEM觀察) 在本發明中,空隙層之形態可用SEM(掃描型電子顯微鏡)來進行觀察及解析。具體上,例如將空隙層在冷卻下作FIB加工(加速電壓:30kV),對所得之剖面試樣利用FIB-SEM(FEI公司製:商品名Helios NanoLab 600、加速電壓:1kV)以觀察倍率100,000倍獲得剖面電子影像。(Sectional SEM observation of void layer) In the present invention, the shape of the void layer can be observed and analyzed with a SEM (scanning electron microscope). Specifically, for example, the void layer is subjected to FIB processing (acceleration voltage: 30 kV) under cooling, and the obtained cross-sectional sample is FIB-SEM (manufactured by FEI: brand name Helios NanoLab 600, acceleration voltage: 1 kV) to observe a magnification of 100,000. Obtain cross-section electronic images.

(空隙尺寸之評價) 本發明中,前述空隙尺寸可藉由BET試驗法定量化。具體上,細孔分布/比表面積測定裝置(BELLSORP MINI/MicrotracBEL公司之商品名)的毛細管中,投入0.1g試樣(本發明之空隙層)後,於室溫下進行24小時減壓乾燥,使空隙結構造內的氣體脫氣。然後藉由使氮氣吸附於前述試樣,畫出BET圖及BJH圖、吸附等溫線,求得細孔分布。藉此可評價空隙尺寸。(Evaluation of void size) In the present invention, the aforementioned void size can be legally quantified by a BET test. Specifically, a pore distribution / specific surface area measuring device (BELLSORP MINI / MicrotracBEL trade name) was charged with a 0.1 g sample (the void layer of the present invention) in a capillary tube, and then dried under reduced pressure at room temperature for 24 hours. Degas the gas in the void structure. Then, by adsorbing nitrogen on the sample, a BET chart, a BJH chart, and an adsorption isotherm were drawn to obtain a pore distribution. Thereby, the void size can be evaluated.

本發明之空隙層,舉例來說,其表示膜強度之利用BEMCOT(註冊商標)測得的耐擦傷性為60~100%。本發明由於例如具有如此的膜強度,所以在各種製程下的耐擦傷性均為優異。本發明例如在前述空隙層製膜後的捲取及處理製品薄膜時的生產製程中具有耐致傷性。另一方面,本發明之空隙層,例如,可取代降低空隙率的方式,而利用後述加熱步驟中的觸媒反應,來提升前述矽化合物凝膠之粉碎物的粒子尺寸、及前述粉碎物彼此結合之頸部的結合力。藉此,本發明之空隙層,舉例來說,可賦予原本脆弱的空隙結構一定水準的強度。The void layer of the present invention, for example, has a scratch resistance of 60 to 100% as measured by BEMCOT (registered trademark), which indicates film strength. Since the present invention has such a film strength, for example, it has excellent scratch resistance in various processes. The present invention has, for example, scratch resistance in a production process when winding and processing a product film after the formation of the void layer film. On the other hand, instead of reducing the porosity, the void layer of the present invention can use a catalyst reaction in a heating step described later to increase the particle size of the pulverized material of the silicon compound gel and the pulverized material to each other. The binding power of the neck. With this, the void layer of the present invention can, for example, impart a certain level of strength to the originally weak void structure.

前述耐擦傷性之下限為例如60%以上、80%以上、90%以上,其上限為例如、100%以下、99%以下、98%以下,其範圍為例如60~100%、80~99%、90~98%。The lower limit of the abrasion resistance is, for example, 60% or more, 80% or more, and 90% or more. The upper limit is, for example, 100% or less, 99% or less, and 98% or less, and the ranges are, for example, 60 to 100%, 80 to 99%. , 90 ~ 98%.

前述耐擦傷性例如可藉由以下方法進行測定。The abrasion resistance can be measured, for example, by the following method.

(耐擦傷性之評價) (1)將已塗覆成膜於丙烯酸薄膜上之空隙層(本發明之低折射率層)取樣成直徑15mm左右之圓形試樣。 (2)接著,對前述試樣,以螢光X射線(島津製作所公司製:ZSX PrimusII)鑑定矽,測定Si塗佈量(Si0 )。然後對前述丙烯酸系薄膜上的前述空隙層,在前述取樣處的附近將前述空隙層裁切成50mm×100mm並將其固定於玻璃板(厚3mm)後,以Bemcot(註冊商標)進行滑動試驗。滑動條件為重量100g、來回10次。 (3)以和前述(1)相同的方式,從作完滑動的前述空隙層取樣並進行螢光X測定,測定擦傷試驗後的Si殘存量(Si1 )。耐擦傷性係以Bemcot(註冊商標)滑動試驗前後的Si殘存率(%)界定,並以下式顯示。 耐擦傷性(%)=[殘存Si量(Si1 )/Si塗佈量(Si0 )]×100(%)(Evaluation of abrasion resistance) (1) A void layer (low refractive index layer of the present invention) which has been coated and formed on an acrylic film is sampled into a circular sample having a diameter of about 15 mm. (2) Next, the sample was identified by fluorescent X-rays (Shimadzu Corporation: ZSX Primus II), and the Si coating amount (Si 0 ) was measured. Then, the gap layer on the acrylic film was cut to a size of 50 mm × 100 mm in the vicinity of the sampling place and fixed to a glass plate (thickness 3 mm), and then a sliding test was performed with Bemcot (registered trademark). . The sliding condition was 100 g in weight, 10 times back and forth. (3) In the same manner as in the above (1), a sample was taken from the gap layer on which sliding was performed, and fluorescence X measurement was performed to measure the residual amount of Si (Si 1 ) after the abrasion test. The abrasion resistance is defined by the Si residual rate (%) before and after the Bemcot (registered trademark) sliding test, and is shown by the following formula. Scratch resistance (%) = [Residual Si amount (Si 1 ) / Si coating amount (Si 0 )] × 100 (%)

本發明之空隙層,例如表示可撓性之利用MIT試驗的耐折次數為100次以上。本發明係例如由於具有如此的可撓性,因此例如在製造過程的捲取或使用時等有優良的可操作性。The void layer of the present invention has, for example, flexibility that is 100 times or more by the MIT test. Since the present invention has such flexibility, it has excellent operability, for example, during winding or use in a manufacturing process.

前述耐折次數之下限例如為100次以上、500次以上、1000次以上,其上限無特別限定,例如為10000次以下,其範圍例如為100~10000次、500~10000次、1000~10000次。The lower limit of the number of times of folding resistance is, for example, 100 times or more, 500 times, or 1,000 times or more, and the upper limit is not particularly limited. For example, the upper limit is 10,000 times or less, and the range is, for example, 100 to 10,000 times, 500 to 10,000 times, or 1,000 to 10,000 times. .

前述可撓性意指例如物質變形的容易度。前述利用MIT試驗所得的耐折次數例如可藉由以下方法進行測定。The aforementioned flexibility means, for example, the ease with which a substance deforms. The number of times of folding resistance obtained by the MIT test can be measured by the following method, for example.

(耐折試驗之評價) 將前述空隙層(本發明之空隙層)切成20mm×80mm的直條狀後,裝載至MIT耐折試驗機(Tester Sangyo公司製:BE-202),施加1.0N之負重。箝住前述空隙層的夾持部使用R2.0mm,耐折次數最多進行10000次,將前述空隙層斷裂時的次數作為耐折次數。(Evaluation of Bending Resistance Test) The above-mentioned void layer (the void layer of the present invention) was cut into a straight strip of 20 mm × 80 mm, and then loaded into a MIT bending tester (manufactured by Tester Sangyo: BE-202), and 1.0 N was applied. The burden. The clamping portion that clamped the void layer was R2.0 mm, and the number of times of folding resistance was 10,000 times at most. The number of times when the void layer was broken was taken as the number of times of folding resistance.

本發明之空隙層中,表示空隙率的膜密度沒有特別限制,其下限為例如1g/cm3 以上、5g/cm3 以上、10g/cm3 以上、15g/cm3 以上,其上限為例如50g/cm3 以下、40g/cm3 以下、30g/cm3 以下、2.1g/cm3 以下,其範圍為例如5~50g/cm3 、10~40g/cm3 、15~30g/cm3 、1~2.1g/cm3In the void layer of the present invention, the film density indicating the porosity is not particularly limited, and its lower limit is, for example, 1 g / cm 3 or more, 5 g / cm 3 or more, 10 g / cm 3 or more, and 15 g / cm 3 or more, and its upper limit is, for example, 50 g / cm 3 or less, 40 g / cm 3 or less, 30 g / cm 3 or less, 2.1 g / cm 3 or less, and the range is, for example, 5 to 50 g / cm 3 , 10 to 40 g / cm 3 , 15 to 30 g / cm 3 , 1 ~ 2.1g / cm 3 .

前述膜密度,例如可藉由如下述的方法進行測定。The film density can be measured, for example, by the following method.

(膜密度評價) 於丙烯酸薄膜形成空隙層(本發明之空隙層)後,使用X射線繞射裝置(RIGAKU公司製:RINT-2000)測定全反射域的X射線反射率。在進行強度(Intensity)與2θ的擬合(fitting)後,由空隙層、基材的全反射臨界角算出空孔率(P%)。膜密度可以下式顯示。 膜密度(%)=100(%)-空隙率(P%)(Film density evaluation) After forming a void layer (the void layer of the present invention) on an acrylic film, the X-ray reflectance in the total reflection region was measured using an X-ray diffraction device (manufactured by RIGAKU: RINT-2000). After fitting between Intensity and 2θ, the porosity (P%) was calculated from the critical angle of the total reflection of the void layer and the substrate. The film density can be expressed by the following formula. Membrane density (%) = 100 (%)-porosity (P%)

本發明之空隙層只要如前述般具有孔結構(多孔質結構)即可,而前述孔結構可為例如連續的連泡結構體。前述開放性發泡結構體例如係表示在前述空隙層中孔結構以三維型態連結,亦可說是前述孔結構之內部空隙連接在一起的狀態。在多孔質體具有連泡結構的情況下,可藉此提高整體中所佔的空隙率,但在使用如中空二氧化矽的獨泡粒子時,就無法形成連泡結構。相對於此,本發明之空隙層,由於溶膠粒子(形成溶膠之多孔體凝膠的粉碎物)具有三維的樹狀結構,因此可藉由前述樹狀粒子在前述塗覆膜(含有前述多孔體凝膠粉碎物之溶膠的塗覆膜)中的沉降堆積,而輕易地形成連泡結構。此外,本發明之空隙層較佳係形成「連泡結構具有多個細孔分布」的單塊(monolith)結構。前述獨塊結構,係指例如存在有奈米級微細空隙的結構,以及相同奈米空隙以集結成連泡結構形成存在的階層結構。在形成前述獨塊結構的情況下,例如可在以微細空隙賦予膜強度的同時,以粗大的連泡空隙賦予高空隙率,而做到兼具膜強度與高空隙率。要形成此等獨塊結構,舉例來說,重要的是首先針對粉碎成前述粉碎物之前階段的前述多孔體凝膠,控制其生成之空隙結構的細孔分布。此外,例如可在粉碎前述多孔體凝膠時,將前述粉碎物的粒度分布控制成所欲尺寸,從而形成前述獨塊結構。The void layer of the present invention may have a pore structure (porous structure) as described above, and the pore structure may be, for example, a continuous continuous cell structure. The open foamed structure indicates, for example, a state in which the pore structures are connected in a three-dimensional manner in the void layer, and the internal voids of the pore structure are connected together. In the case where the porous body has a continuous cell structure, the porosity occupied by the entire body can be increased, but when a single cell particle such as hollow silica is used, a continuous cell structure cannot be formed. In contrast, the void layer of the present invention has a three-dimensional tree structure because the sol particles (the pulverized product of the porous body gel forming the sol) have a three-dimensional tree structure. Therefore, the tree particles can be used in the coating film (containing the porous body). The coating film of the sol of the gel pulverized substance is deposited and accumulated, and a continuous foam structure is easily formed. In addition, the void layer of the present invention preferably forms a monolith structure having a "continuous cell structure with a plurality of fine pore distributions". The aforementioned monolithic structure refers to, for example, a structure in which nano-level fine voids exist, and a hierarchical structure in which the same nano-voids are aggregated to form a continuous cell structure. In the case of forming the aforementioned monolithic structure, for example, the strength of the film can be imparted with fine voids and the high void fraction can be imparted with coarse continuous voids to achieve both film strength and high void fraction. To form such a monolithic structure, for example, it is important to first control the pore distribution of the void structure generated by the aforementioned porous body gel at a stage before being crushed into the aforementioned pulverized material. In addition, for example, when the porous body gel is pulverized, the particle size distribution of the pulverized material can be controlled to a desired size to form the monolithic structure.

在本發明之空隙層中,表示柔軟性的斷裂龜裂發生伸長率沒有特別限制,其下限為例如0.1%以上、0.5%以上、1%以上,其上限為例如3%以下。前述斷裂龜裂發生伸長率的範圍,為例如0.1~3%、0.5~3%、1~3%。In the void layer of the present invention, there is no particular limitation on the elongation at break caused by fracture, which indicates flexibility, and the lower limit thereof is, for example, 0.1% or more, 0.5% or more, and 1% or more, and the upper limit thereof is, for example, 3% or less. The range of the elongation at which the fracture occurs is, for example, 0.1 to 3%, 0.5 to 3%, or 1 to 3%.

前述斷裂龜裂發生伸長率,例如可藉由如下述之方法進行測定。The elongation at which the fracture and crack occurs can be measured, for example, by the following method.

(斷裂龜裂發生伸長率評價) 於丙烯酸系薄膜上形成空隙層(本發明之空隙層)後,進行5mm×140mm直條狀之採樣。接著,以夾具間距離為100mm的方式將前述樣品箝定於拉伸試驗機(島津製作所公司製:AG-Xplus)後,以0.1mm/s的拉伸速度進行拉伸試驗。仔細觀察試驗中之前述樣品,在前述樣品的一部分出現龜裂時結束試驗,將出現龜裂時的伸長率(%)作為斷裂龜裂發生伸長率。(Evaluation of elongation at break and crack occurrence) After forming a void layer (the void layer of the present invention) on an acrylic film, a 5 mm × 140 mm straight strip was sampled. Next, the sample was clamped to a tensile tester (manufactured by Shimadzu Corporation: AG-Xplus) so that the distance between the clamps was 100 mm, and then a tensile test was performed at a tensile speed of 0.1 mm / s. The foregoing sample in the test was carefully observed, and the test was terminated when a part of the sample appeared cracking, and the elongation (%) at the time of cracking was taken as the elongation at which cracking occurred.

本發明之空隙層中,表示透明性的霧度沒有特別限制,其下限為例如0.1%以上、0.2%以上、0.3%以上,其上限為例如10%以下、5%以下、3%以下,其範圍為例如0.1~10%、0.2~5%、0.3~3%。In the void layer of the present invention, the haze indicating transparency is not particularly limited, and its lower limit is, for example, 0.1% or more, 0.2% or more, and 0.3% or more, and its upper limit is, for example, 10% or less, 5% or less, and 3% or less. The range is, for example, 0.1 to 10%, 0.2 to 5%, and 0.3 to 3%.

前述霧度,例如可藉由如下述的方法進行測定。The haze can be measured, for example, by the following method.

(霧度之評價) 將空隙層(本發明之空隙層)裁切成50mm×50mm的大小並設置於霧度計(村上色彩技術研究所公司製:HM-150)上,測定霧度。關於霧度值,藉由以下的公式算出。 霧度(%)=[擴散穿透率(%)/全光線穿透率(%)]×100(%)(Evaluation of Haze) The void layer (the void layer of the present invention) was cut into a size of 50 mm × 50 mm and set on a haze meter (manufactured by Murakami Color Technology Research Institute: HM-150), and the haze was measured. The haze value was calculated by the following formula. Haze (%) = [diffusive transmittance (%) / full light transmittance (%)] × 100 (%)

前述折射率,一般係以真空中光波面的傳達速度與在介質內的傳播速度之比,稱作該介質之折射率。本發明之空隙層(例如聚矽氧多孔體)的折射率沒有特別限制,其上限為例如1.3以下、低於1.3、1.25以下、1.2以下、1.15以下,其下限為例如1.05以上、1.06以上、1.07以上,其範圍為例如1.05以上1.3以下、1.05以上低於1.3、1.05以上1.25以下、1.06以上~低於1.2、1.07以上至1.15以下。The aforementioned refractive index is generally referred to as the refractive index of the medium by the ratio of the transmission speed of the light wave surface in the vacuum to the propagation speed in the medium. The refractive index of the void layer (for example, a polysilicon porous body) of the present invention is not particularly limited, and its upper limit is, for example, 1.3 or less, less than 1.3, 1.25 or less, 1.2 or less, and 1.15 or less, and its lower limit is, for example, 1.05 or more, 1.06 or more, 1.07 or more, for example, ranges from 1.05 or more and 1.3 or less, 1.05 or more and less than 1.3, 1.05 or more and 1.25 or less, 1.06 or more and less than 1.2, 1.07 or more and 1.15 or less.

本發明中,在未特別說明的前提下,前述折射率係指在波長550nm下測得的折射率。又,折射率之測定方法並無特別限定,例如可藉由下述方法進行測定。In the present invention, unless otherwise specified, the aforementioned refractive index refers to a refractive index measured at a wavelength of 550 nm. The method for measuring the refractive index is not particularly limited, and it can be measured, for example, by the following method.

(折射率之評價) 於丙烯酸薄膜上形成空隙層(本發明之空隙層)後,裁切成50mm×50mm的大小並將其以黏著層貼合於玻璃板(厚:3mm)的表面。用黑色奇異筆將前述玻璃板的背面中央部(直徑20mm左右)塗黑,製作不會在前述玻璃板背面反射的試樣。將前述試樣安裝於橢圓偏光計(J‧ A‧ Woollam Japan公司製:VASE)上,在波長500nm且入射角50~80度之條件下測定折射率,並取平均値作為折射率。(Evaluation of refractive index) After forming a void layer (the void layer of the present invention) on an acrylic film, it was cut into a size of 50 mm × 50 mm and bonded to the surface of a glass plate (thickness: 3 mm) with an adhesive layer. The central part (about 20 mm in diameter) of the back surface of the glass plate was black-coated with a black singular pen to prepare a sample that was not reflected on the back surface of the glass plate. The aforementioned sample was mounted on an elliptical polarimeter (J‧ A‧ Woollam Japan: VASE), and the refractive index was measured at a wavelength of 500 nm and an incident angle of 50 to 80 degrees, and the average chirp was taken as the refractive index.

本發明之空隙層的厚度沒有特別限制,其下限為例如0.05μm以上、0.1μm以上,其上限為例如1000μm以下、100μm以下,其範圍為例如0.05~1000μm、0.1~100μm。The thickness of the void layer of the present invention is not particularly limited, and its lower limit is, for example, 0.05 μm or more and 0.1 μm or more, and its upper limit is, for example, 1000 μm or less and 100 μm or less, and its range is, for example, 0.05 to 1000 μm or 0.1 to 100 μm.

本發明之空隙層的形態沒有特別限制,例如可為薄膜狀,亦可為塊狀等。The form of the void layer of the present invention is not particularly limited, and may be, for example, a film shape or a block shape.

本發明之空隙層之製造方法沒有特別限制,可例如利用先前說明之前述空隙層之製造方法來製造。The method for producing the void layer of the present invention is not particularly limited, and it can be produced, for example, by using the aforementioned method for producing the void layer.

實施例 接下來,針對本發明之實施例加以說明。惟,本發明不受以下實施例限定。Examples Next, examples of the present invention will be described. However, the present invention is not limited to the following examples.

此外,以下參考例、實施例及比較例中,各物質的份數(相對使用量)在未特別聲明下為質量份(重量份)。In addition, in the following reference examples, examples, and comparative examples, the parts (relative amount) of each substance are parts by mass (parts by weight) unless otherwise specified.

[參考例1] 首先,進行矽化合物的凝膠化(下述步驟(1))及熟成步驟(下述步驟(2)),製造出具有多孔質結構的凝膠(聚矽氧多孔體)。進一步於其後進行下述(3)形態控制步驟、(4)溶劑置換步驟、(5)濃度測定(濃度管理)及濃度調整步驟 、(6)粉碎步驟,獲得低折射率層形成用塗覆液(含凝膠粉碎物之液體)。此外,本參考例如下所述是將下述(3)形態控制步驟作為有別於下述步驟(1)的步驟來進行。惟本發明不限定於此,亦可為例如在下述步驟(1)中進行下述(3)形態控制步驟。[Reference Example 1] First, gelation of a silicon compound (step (1) below) and aging step (step (2) below) were performed to produce a gel having a porous structure (polysiloxane porous body) . Then, the following (3) morphology control step, (4) solvent replacement step, (5) concentration measurement (concentration management) and concentration adjustment step, and (6) pulverization step are further performed to obtain a coating for forming a low refractive index layer. Liquid (liquid containing pulverized gel). In addition, as described below, for example, the reference (3) form control step is performed as a step different from the following step (1). However, the present invention is not limited to this, and for example, the following (3) form control step may be performed in the following step (1).

(1)矽化合物之凝膠化 將9.5kg的矽化合物前驅物MTMS溶解於22kg的DMSO中。在前述混合液添加0.01mol/L的草酸水溶液5kg,並藉由於室溫下攪拌120分鐘使MTMS水解,生成參(羥基)甲基矽烷。(1) Gelation of silicon compound Dissolve 9.5 kg of the silicon compound precursor MTMS in 22 kg of DMSO. 5 kg of an 0.01 mol / L oxalic acid aqueous solution was added to the aforementioned mixed solution, and MTMS was hydrolyzed by stirring at room temperature for 120 minutes to generate ginsyl (hydroxy) methylsilane.

在55kg的DMSO添加3.8kg的28%濃度氨水、及2kg的純水後,再追加經前述水解處理的前述混合液,於室溫下攪拌60分鐘。將攪拌60分鐘後的液體倒入長30cm×寬30cm×高5cm的不銹鋼容器中並於室溫靜置,藉此進行參(羥基)甲基矽烷的凝膠化,獲得凝膠狀矽化合物。After adding 3.8 kg of 28% ammonia water and 2 kg of pure water to 55 kg of DMSO, the hydrolyzed mixture was added, and the mixture was stirred at room temperature for 60 minutes. The liquid after stirring for 60 minutes was poured into a stainless steel container having a length of 30 cm × width 30 cm × height 5 cm and allowed to stand at room temperature, thereby performing gelation of ginsyl (hydroxy) methylsilane to obtain a gel-like silicon compound.

(2)熟成步驟 將經前述凝膠化處理所得之凝膠狀矽化合物於40℃下培育20小時進行熟成處理,獲得前述長方體形狀之塊狀凝膠。該凝膠之原料中DMSO(沸點130℃以上之高沸點溶劑)的使用量佔原料全體約83重量%,故沸點130℃以上之高沸點溶劑顯然含50重量%以上。又,該凝膠之原料中MTMS(作為凝膠構成單元之單體)的使用量佔原料全體約8重量%,故作為凝膠構成單元之單體(MTMS)水解產生之低於沸點130℃之溶劑(此情形為甲醇)的含量顯然在20重量%以下。(2) Maturation step The gelatinous silicon compound obtained by the aforementioned gelation treatment was incubated at 40 ° C for 20 hours and subjected to a maturation treatment to obtain the aforementioned cuboid shaped gel. The amount of DMSO (high boiling point solvent above 130 ° C) used in the raw material of the gel accounts for about 83% by weight of the entire raw material, so the high boiling point solvent above 130 ° C obviously contains more than 50% by weight. In addition, the amount of MTMS (monomer as a constituent unit of the gel) in the raw material of the gel accounts for about 8% by weight of the entire raw material. Therefore, the hydrolysis of the monomer (MTMS) as the constituent unit of the gel is 130 ° C below the boiling point The content of the solvent (in this case, methanol) is clearly below 20% by weight.

(3)形態控制步驟 在經由前述步驟(1)(2)而於前述30cm×30cm×5cm不銹鋼容器中合成的凝膠上,倒入作為置換溶劑的水。接著,於前述不銹鋼容器中從上方對凝膠緩慢插入切斷用治具──切斷刃,將凝膠切成1.5cm×2cm×5cm尺寸的長方體。(3) Morphology control step Pour water as a replacement solvent on the gel synthesized in the aforementioned 30 cm x 30 cm x 5 cm stainless steel container through the steps (1) and (2). Next, the gel was slowly inserted from above into the cutting jig, a cutting blade, into the stainless steel container, and the gel was cut into a rectangular parallelepiped having a size of 1.5 cm × 2 cm × 5 cm.

(4)溶劑置換步驟 接著以下述(4-1)~(4-3)的方式進行溶劑置換步驟。(4) Solvent replacement step Next, the solvent replacement step is performed in the following manner (4-1) to (4-3).

(4-1) 前述「(3)形態控制步驟」後,將前述凝膠狀矽化合物浸漬於前述凝膠狀矽化合物之8倍重量的水中,以僅有水對流的方式緩慢攪拌1h。1h後以等量的水作換水,再攪拌3h。再於其後再度換水,然後於60℃下緩慢攪拌同時加熱3h。(4-1) After the aforementioned "(3) morphology control step", the gel-like silicon compound was immersed in 8 times the weight of the gel-like silicon compound in water, and slowly stirred for 1 h with only water convection. After 1h, change the water with the same amount of water and stir for 3h. After that, the water was changed again, and then slowly stirred at 60 ° C while heating for 3 hours.

(4-2) 於(4-1)後,將水換成前述凝膠狀矽化合物之4倍重量的異丙醇,同樣於60℃下攪拌6h並加熱。(4-2) After (4-1), water was replaced with 4 times the weight of isopropyl alcohol of the aforementioned gelatinous silicon compound, and the same was stirred at 60 ° C for 6 hours and heated.

(4-3) 於(4-2)後,將異丙醇換成同重量的異丁醇,同樣在60℃下加熱6h,將前述凝膠狀矽化合物中所含溶劑置換成異丁醇。以上述方式進行,製造出本發明之空隙層製造用凝膠。(4-3) After (4-2), replace isopropanol with isobutanol of the same weight, and heat it at 60 ° C for 6 hours to replace the solvent contained in the gel-like silicon compound with isobutanol. . In the above manner, a gel for producing a void layer of the present invention was produced.

(5)濃度測定(濃度管理)及濃度調整步驟 於前述(4)的溶劑置換步驟後,將前述塊體狀的凝膠取出,去除附著在凝膠周圍的溶劑。然後,以重量乾燥法測定單一凝膠塊體中所佔的固體成分濃度。此時,為取得測定値的再現性,以隨機取出的6個塊體進行測定,算出其平均値與數値偏差。此時凝膠中固體成分濃度(凝膠濃度)的平均値為5.20重量%,而6個凝膠中前述凝膠濃度値的偏差在±0.1%以內。以該測定值為基準,添加異丁醇溶劑以調整凝膠固體成分濃度(凝膠濃度)變成約3.0重量%。(5) Concentration measurement (concentration management) and concentration adjustment step After the solvent replacement step of the above (4), the block-shaped gel is taken out, and the solvent attached to the periphery of the gel is removed. Then, the solid content concentration in a single gel block was measured by a weight drying method. At this time, in order to obtain the reproducibility of the measurement cymbal, measurement was performed on six randomly taken blocks, and the deviation between the average 値 and the number 値 was calculated. At this time, the average 値 of the solid content concentration (gel concentration) in the gel was 5.20% by weight, and the deviation of the aforementioned gel concentration 中 in the six gels was within ± 0.1%. Based on the measured value, an isobutanol solvent was added to adjust the gel solid content concentration (gel concentration) to approximately 3.0% by weight.

(6)凝膠粉碎步驟 以2階段對前述(5)濃度測定(濃度管理)及濃度調整步驟後的前述凝膠(凝膠狀矽化合物)進行粉碎,第1粉碎階段為連續式乳化分散(太平洋機工公司製,Milder MDN304型),第2粉碎階段為高壓無介質粉碎(Sugino Machine公司製:Star Burst HJP-25005型)。該粉碎處理,是對經前述溶劑置換之使凝膠狀矽化合物含有溶劑而成的凝膠43.4kg追加異丁醇26.6kg並秤量後進行粉碎,第1粉碎階段以循環粉碎20分鐘,第2粉碎階段之粉碎壓力100MPa。如此進行而獲得分散了奈米尺寸粒子(前述凝膠粉碎物)的異丁醇分散液(含凝膠粉碎物之液體)。進一步於該含凝膠粉碎物之液體3kg中添加224g之WPBG-266(商品名、Wako製)的甲基異丁酮1.5重量%濃度溶液,再添加67.2g之雙(三甲氧基矽基)乙烷(TCI製)的甲基異丁酮5重量%濃度溶液後,添加31.8g之N,N-二甲基甲醯胺並混合,獲得塗覆液。(6) Gel pulverization step The pulverization of the gel (gel-like silicon compound) after the concentration measurement (concentration management) and the concentration adjustment step in (5) is performed in two steps. The first pulverization step is continuous emulsification dispersion ( Made by Pacific Machinery Co., Ltd., Milder MDN304 type), the second pulverization stage is high-pressure non-media pulverization (made by Sugino Machine: Star Burst HJP-25005 type). This pulverization process is to add 46.6 kg of gel made of the gel-like silicon compound containing the solvent replaced by the aforementioned solvent, add 26.6 kg of isobutanol, and measure the pulverization. The first pulverization stage is cyclic pulverization for 20 minutes. The crushing pressure in the crushing stage is 100 MPa. In this way, an isobutanol dispersion liquid (a liquid containing a gel-pulverized product) in which nano-sized particles (the gel-pulverized product) were dispersed was obtained. Furthermore, 224 g of a 1.5% by weight methyl isobutyl ketone solution of WPBG-266 (trade name, manufactured by Wako) was added to 3 kg of the gel-pulverized liquid, and 67.2 g of bis (trimethoxysilyl) was further added. After a 5 wt% solution of methyl isobutyl ketone in ethane (manufactured by TCI), 31.8 g of N, N-dimethylformamide was added and mixed to obtain a coating solution.

又,在前述第1粉碎階段(粗粉碎步驟)後、前述第2粉碎階段(奈米粉碎步驟)前,測定前述液(高黏度凝膠粉碎液)的固體成分濃度(凝膠濃度),結果為3.01重量%。於前述第1粉碎階段(粗粉碎步驟)後、前述第2粉碎階段(奈米粉碎步驟)前,前述凝膠粉碎物的體積平均粒子徑為3~5μm,而前述液體的剪切黏度為4,000mPa・s。此時的高黏度凝膠粉碎液因高黏度故不會固液分離,可作為均勻液使用,故直接採用前述第1粉碎階段(粗粉碎步驟)後的測定値。再者,於前述第2粉碎階段(奈米粉碎步驟)後,前述凝膠之粉碎物的體積平均粒徑為250~350nm,前述液體的剪切黏度為5m~10mPa.s。進一步於前述第2粉碎階段(奈米粉碎步驟)後,再次測定前述液(含凝膠粉碎物之液體)的固體成分濃度(凝膠濃度),結果為3.01重量%,與前述第1粉碎階段(粗粉碎步驟)後沒有變化。The solid content concentration (gel concentration) of the solution (high-viscosity gel pulverization solution) was measured after the first pulverization step (coarse pulverization step) and before the second pulverization step (nano pulverization step). It was 3.01% by weight. After the first pulverization step (coarse pulverization step) and before the second pulverization step (nano pulverization step), the volume average particle diameter of the gel pulverized material is 3 to 5 μm, and the shear viscosity of the liquid is 4,000 mPa ・ s. The high-viscosity gel pulverized liquid at this time does not have solid-liquid separation due to its high viscosity, and can be used as a homogeneous liquid. Therefore, the measurement 后 after the first pulverization step (coarse pulverization step) described above is directly used. Furthermore, after the second pulverization step (nano pulverization step), the volume average particle diameter of the pulverized material of the gel is 250 to 350 nm, and the shear viscosity of the liquid is 5 m to 10 mPa.s. Further after the second pulverization step (nano pulverization step), the solid content concentration (gel concentration) of the liquid (liquid containing gel pulverized material) was measured again. As a result, it was 3.01% by weight, which was the same as the first pulverization step. No change after (coarse pulverization step).

此外,本參考例中,前述第1粉碎階段後及前述第2粉碎階段後的前述凝膠之粉碎物(溶膠粒子)的平均粒徑,是以動態光散射式Nanotrac粒度分析計(日機裝公司製,商品名UPA-EX150型)鑑定。又,本實施例中,前述第1粉碎階段後及前述第2粉碎階段後的前述液體之剪切黏度,是以振動式黏度測定機(Sekonic公司製,商品名FEM-1000V)鑑定。以下各實施例及比較例亦同。In addition, in this reference example, the average particle diameter of the pulverized material (sol particles) of the gel after the first pulverization stage and after the second pulverization stage is based on a dynamic light scattering Nanotrac particle size analyzer (Nikkiso equipment Company system, trade name UPA-EX150). In this embodiment, the shear viscosity of the liquid after the first pulverization stage and after the second pulverization stage are identified with a vibration viscosity measuring machine (manufactured by Sekonic Corporation, trade name FEM-1000V). The same applies to the following examples and comparative examples.

又,在前述第1粉碎步驟(粗粉碎步驟)後,前述含凝膠粉碎物之液體的固體成分(凝膠)方面,是測定(計算)構成單元單體的官能基(矽醇基)中無益於凝膠內交聯結構之官能基(殘餘矽醇基)的比率,結果獲得11mol%之測定値。此外,無益於凝膠內交聯結構的官能基(殘餘矽醇基)的比率,是經由以下方法測定:將凝膠乾燥後,測定固態NMR(Si-NMR),由NMR峰值比算出無益於交聯結構的殘餘矽醇基之比率。In addition, after the first pulverization step (coarse pulverization step), the solid content (gel) of the gel-containing pulverized material was measured (calculated) in the functional group (silanol group) constituting the unit monomer. The ratio of the functional group (residual silanol group) which is not beneficial to the cross-linked structure in the gel, as a result, 11 mol% of the measured fluorene was obtained. In addition, the ratio of functional groups (residual silanol groups) that are not conducive to the cross-linking structure in the gel is determined by the following method: After drying the gel, the solid-state NMR (Si-NMR) is measured, and the calculation from the NMR peak ratio is not beneficial The ratio of residual silanol groups in the crosslinked structure.

以上述方式進行,製造出本參考例(參考例1)之空隙層形成用塗覆液(含凝膠粉碎物之液體)。又,以前述方法測定空隙層形成用塗覆液(含凝膠粉碎物之液體)中凝膠粉碎物(微細孔粒子)的峰值細孔徑,結果為12nm。In the above manner, a coating liquid (a liquid containing a pulverized gel) for forming a void layer of the present reference example (Reference Example 1) was produced. The peak pore diameter of the pulverized gel (fine-pored particles) in the coating liquid (a pulverized gel-containing liquid) for forming a void layer was measured by the method described above, and it was 12 nm.

[參考例2:黏接著層的形成] 經由下述(1)~(3)之程序,形成本參考例(參考例2)之黏接著層。[Reference Example 2: Formation of Adhesive Layer] An adhesive layer of this reference example (Reference Example 2) was formed through the following procedures (1) to (3).

(1)預聚物組成物的調製 在由丙烯酸-2-乙基己酯68份、N-乙烯-2-吡咯啶酮14.5份及丙烯酸-2-羥乙基酯17.5份構成的單體混合物中,摻混光聚合引發劑(商品名「IRGACURE 184」,BASF公司)0.035份及光聚合引發劑(商品名「IRGACURE 651」,BASF公司)0.035份後,照射外線至黏度(BH黏度計No.5轉子、10rpm、測定溫度30℃)達到約20Pa・s為止,獲得上述單體成分之一部分已聚合的預聚物組成物。(1) Prepolymer composition was prepared from a monomer mixture consisting of 68 parts of 2-ethylhexyl acrylate, 14.5 parts of N-ethylene-2-pyrrolidone, and 17.5 parts of 2-hydroxyethyl acrylate In the mixture, 0.035 parts of a photopolymerization initiator (trade name "IRGACURE 184", BASF Corporation) and 0.035 parts of a photopolymerization initiator (trade name "IRGACURE 651", BASF Corporation) were blended, and then an external line was irradiated to the viscosity (BH viscometer No. (5 rotor, 10 rpm, measurement temperature 30 ° C.) until about 20 Pa · s, to obtain a prepolymer composition in which a part of the monomer components has been polymerized.

(2)丙烯酸系黏著劑組成物的調製 於前述(1)所調製之預聚物組成物中,添加己二醇二丙烯酸酯(HDDA)0.150份、矽烷偶合劑(「KBM-403」信越化學工業社)0.3份並混合,獲得丙烯酸系黏著劑組成物。(2) Preparation of acrylic adhesive composition To the prepolymer composition prepared in (1) above, 0.150 parts of hexanediol diacrylate (HDDA) and a silane coupling agent ("KBM-403" Shin-Etsu Chemical Co., Ltd.) were added. Industry Co., Ltd.) 0.3 parts and mixed to obtain an acrylic adhesive composition.

(3)黏接著層的形成 將前述(2)所調製之丙烯酸系黏著劑組成物(丙烯酸系黏著劑溶液),以乾燥後黏接著層(黏著劑層)厚度為25μm的方式塗佈在已施以聚矽氧處理的聚對苯二甲酸乙二酯(PET)薄膜(三菱化學聚酯薄膜公司製, 厚度:50μm)之單面上,形成塗佈層。於該塗佈層上,設置已施以聚矽氧處理的聚對苯二甲酸乙二酯(PET)薄膜(三菱化學聚酯薄膜公司製、厚度:38μm),覆蓋前述塗佈層阻斷氧,形成積層體。接著,從前述積層體上面(MRF38側)以黑光燈(東芝製)照射照度5mW/cm2 之紫外線300秒。再以90℃乾燥機進行2分鐘的乾燥處理,使殘存單體揮發,形成黏接著層(黏著劑層)。該黏著劑層(黏接著層)之23℃時儲存彈性模數G'為1.1×105(3) Formation of Adhesive Layer The acrylic adhesive composition (acrylic adhesive solution) prepared in the above (2) was applied on the adhesive layer (adhesive layer) after drying to a thickness of 25 μm. A coating layer was formed on one side of a polyethylene terephthalate (PET) film (manufactured by Mitsubishi Chemical Polyester Film Co., Ltd., thickness: 50 μm) treated with silicone. A polyethylene terephthalate (PET) film (manufactured by Mitsubishi Chemical Polyester Film Co., Ltd., thickness: 38 μm) was provided on the coating layer to cover the coating layer to block oxygen. To form a laminated body. Next, a black light (manufactured by Toshiba) was irradiated with ultraviolet light having an illuminance of 5 mW / cm 2 for 300 seconds from the upper surface (MRF38 side) of the laminated body. Then, a drying process was performed in a 90 ° C. dryer for 2 minutes to volatilize the remaining monomers to form an adhesive layer (adhesive layer). The storage elastic modulus G ′ of the adhesive layer (adhesive layer) at 23 ° C. was 1.1 × 10 5 .

[參考例3:黏接著層的形成] 經由下述(1)~(3)之程序,形成本參考例(參考例3)之黏接著層。[Reference Example 3: Formation of Adhesive Layer] An adhesive layer of this reference example (Reference Example 3) was formed through the following procedures (1) to (3).

(1)丙烯酸系聚合物溶液的調製 將丙烯酸丁酯90.7份、N-丙烯醯基嗎福林6份、丙烯酸3份、2-羥丁基丙烯酸酯0.3份及聚合引發劑2,2'-偶氮二異丁腈0.1重量份與100g的醋酸乙酯一起裝入設有攪拌葉、溫度計、氮氣導入管及冷卻器之4口燒瓶中。接著,將前述4口燒瓶內之內容物緩慢攪拌一邊導入氮氣進行氮置換。然後,前述4口燒瓶內的液溫保持在55℃左右,進行8小時聚合反應,調製出丙烯酸系聚合物溶液。(1) Preparation of acrylic polymer solution: 90.7 parts of butyl acrylate, 6 parts of N-propenyl morpholine, 3 parts of acrylic acid, 0.3 parts of 2-hydroxybutyl acrylate, and polymerization initiator 2,2'- 0.1 part by weight of azobisisobutyronitrile was placed together with 100 g of ethyl acetate into a 4-necked flask equipped with a stirring blade, a thermometer, a nitrogen introduction tube, and a cooler. Next, the contents of the four-necked flask were slowly stirred while introducing nitrogen to replace the nitrogen. Then, the liquid temperature in the 4-necked flask was maintained at about 55 ° C., and a polymerization reaction was performed for 8 hours to prepare an acrylic polymer solution.

(2)丙烯酸系黏著劑組成物的調製 調製丙烯酸系黏著劑組成物(丙烯酸系黏著劑溶液),其相對於100份之前述(1)所得丙烯酸系聚合物溶液之固體成分,摻混有異氰酸酯交聯劑(日本聚胺酯工業公司製商品名「CORONATE L」、三羥甲基丙烷的甲苯二異氰酸酯加成物)0.2份,苯甲醯基過氧化物(日本油脂公司製商品名「Nyper BMT」)0.3份,及γ-環氧丙氧基丙基甲氧基矽烷(信越化學工業公司製商品名「KBM-403」)0.2份。(2) Preparation of acrylic adhesive composition The acrylic adhesive composition (acrylic adhesive solution) was prepared by mixing isocyanate with 100 parts of the solid content of the acrylic polymer solution obtained in the above (1). Crosslinking agent (trade name "CORONATE L" manufactured by Japan Polyurethane Industry Corporation, toluene diisocyanate adduct of trimethylolpropane), benzyl peroxide (trade name "Nyper BMT" manufactured by Japan Oil Corporation) ) 0.3 parts, and 0.2 parts of γ-glycidoxypropylmethoxysilane (trade name "KBM-403" manufactured by Shin-Etsu Chemical Co., Ltd.).

(3)黏接著層的形成 將前述(2)所得丙烯酸系黏著劑組成物,以乾燥後黏著劑層厚度為5μm的方式,塗佈在已施以聚矽氧處理的聚對苯二甲酸乙二酯(PET)薄膜(三菱化學聚酯薄膜公司製, 厚度:38μm)之單面上,於150℃下進行3分鐘乾燥,形成黏著劑層(黏接著層)。該黏著劑層(黏接著層)之23℃時儲存彈性模數G'為1.3×105(3) Formation of Adhesive Layer The acrylic adhesive composition obtained in the above (2) was coated on polyethylene terephthalate treated with polysiloxane so that the thickness of the adhesive layer after drying was 5 μm. One side of a diester (PET) film (manufactured by Mitsubishi Chemical Polyester Film Co., Ltd., thickness: 38 μm) was dried at 150 ° C. for 3 minutes to form an adhesive layer (adhesive layer). The storage elastic modulus G ′ of the adhesive layer (adhesive layer) at 23 ° C. was 1.3 × 10 5 .

[參考例4:黏接著層的形成] 經由下述(1)~(3)之程序,形成本參考例(參考例4)之黏接著層。[Reference Example 4: Formation of Adhesive Layer] An adhesive layer of this reference example (Reference Example 4) was formed through the following procedures (1) to (3).

(1)丙烯酸系聚合物溶液的調製 將丙烯酸丁酯97份、丙烯酸3份、2-羥乙基丙烯酸酯1份及聚合引發劑2,2'-偶氮二異丁腈0.1份與100g的醋酸乙酯一起裝入設有攪拌葉、溫度計、氮氣導入管及冷卻器之4口燒瓶中。接著,將前述4口燒瓶內之內容物緩慢攪拌一邊導入氮氣進行氮置換。然後,前述4口燒瓶內的液溫保持在55℃左右,進行8小時聚合反應,調製出丙烯酸系聚合物溶液。(1) Preparation of acrylic polymer solution: 97 parts of butyl acrylate, 3 parts of acrylic acid, 1 part of 2-hydroxyethyl acrylate, and 0.1 part of 2,2'-azobisisobutyronitrile and 100 g of Ethyl acetate was put together in a 4-necked flask equipped with a stirring blade, a thermometer, a nitrogen introduction tube, and a cooler. Next, the contents of the four-necked flask were slowly stirred while introducing nitrogen to replace the nitrogen. Then, the liquid temperature in the 4-necked flask was maintained at about 55 ° C., and a polymerization reaction was performed for 8 hours to prepare an acrylic polymer solution.

(2)丙烯酸系黏著劑組成物的調製 調製丙烯酸系黏著劑組成物(丙烯酸系黏著劑溶液),其相對於100份之前述(1)所得丙烯酸系聚合物溶液之固體成分,摻混有異氰酸酯交聯劑(日本聚胺酯工業公司製商品名「CORONATE L」、三羥甲基丙烷的甲苯二異氰酸酯加成物)0.5份,苯苯甲醯基過氧化物(日本油脂公司製商品名「Nyper BMT」)0.2份,及γ-環氧丙氧基丙基甲氧基矽烷(信越化學工業公司製商品名「KBM-403」)0.2份。(2) Preparation of acrylic adhesive composition The acrylic adhesive composition (acrylic adhesive solution) was prepared by mixing isocyanate with 100 parts of the solid content of the acrylic polymer solution obtained in the above (1). Crosslinking agent (trade name "CORONATE L" manufactured by Japan Polyurethane Industry Co., Ltd., toluene diisocyanate adduct of trimethylolpropane), benzylhydrazine peroxide ("Nyper BMT" ") 0.2 parts, and 0.2 parts of γ-glycidoxypropylmethoxysilane (trade name" KBM-403 "manufactured by Shin-Etsu Chemical Co., Ltd.).

(3)黏接著層的形成 將前述(2)所得丙烯酸系黏著劑組成物之溶液,以乾燥後黏著劑層厚度為20μm的方式,塗佈在已施以聚矽氧處理的聚對苯二甲酸乙二酯(PET)薄膜(三菱化學聚酯薄膜公司製, 厚度:38μm)之單面上,於150℃下進行3分鐘乾燥,形成黏著劑層(黏接著層)。該黏著劑層(黏接著層)之23℃時儲存彈性模數G'為1.1×105(3) Formation of Adhesive Layer The solution of the acrylic adhesive composition obtained in the above (2) was applied to poly (phenylene terephthalate) treated with polysiloxane so that the thickness of the adhesive layer after drying was 20 μm. One side of ethylene formate (PET) film (manufactured by Mitsubishi Chemical Polyester Film Co., Ltd., thickness: 38 μm) was dried at 150 ° C. for 3 minutes to form an adhesive layer (adhesive layer). The storage elastic modulus G ′ of the adhesive layer (adhesive layer) at 23 ° C. was 1.1 × 10 5 .

[參考例5:黏接著層的形成] 經由下述(1)~(3)之程序,形成本參考例(參考例5)之黏接著層。[Reference Example 5: Formation of Adhesive Layer] An adhesive layer of this reference example (Reference Example 5) was formed through the following procedures (1) to (3).

(1)丙烯酸系聚合物溶液的調製 丙烯酸丁酯77份、苯氧基乙基丙烯酸酯20份、N-乙烯-2-吡咯啶酮2份、丙烯酸0.5份、4-羥丁基丙烯酸酯0.5份及聚合引發劑2,2'-偶氮二異丁腈0.1份與100份的醋酸乙酯一起裝入設有攪拌葉、溫度計、氮氣導入管及冷卻器之4口燒瓶內。接著,將前述4口燒瓶內之內容物緩慢攪拌一邊導入氮氣進行氮置換。然後,前述4口燒瓶內的液溫保持在55℃左右,進行8小時聚合反應,調製出丙烯酸系聚合物溶液。(1) Preparation of acrylic polymer solution: 77 parts of butyl acrylate, 20 parts of phenoxyethyl acrylate, 2 parts of N-ethylene-2-pyrrolidone, 0.5 parts of acrylic acid, and 4-hydroxybutyl acrylate 0.5 Parts and 0.1 parts of polymerization initiator 2,2'-azobisisobutyronitrile and 100 parts of ethyl acetate were put into a 4-necked flask equipped with a stirring blade, a thermometer, a nitrogen introduction tube and a cooler. Next, the contents of the four-necked flask were slowly stirred while introducing nitrogen to replace the nitrogen. Then, the liquid temperature in the 4-necked flask was maintained at about 55 ° C., and a polymerization reaction was performed for 8 hours to prepare an acrylic polymer solution.

(2)丙烯酸系黏著劑組成物的調製 調製丙烯酸系黏著劑組成物之溶液,其相對於100份之前述(1)所得丙烯酸系聚合物溶液之固體成分,摻混有異氰酸酯交聯劑(三井化學公司製商品名「Takenate D160N」、三羥甲基丙烷六亞甲基異氰酸酯)0.1份、苯甲醯基過氧化物(日本油脂公司製商品名「Nyper BMT」)0.3份、γ-環氧丙氧基丙基甲氧基矽烷(信越化學工業公司製商品名「KBM-403」)0.2份。(2) Preparation of acrylic adhesive composition A solution of the acrylic adhesive composition was prepared by mixing an isocyanate crosslinking agent (Mitsui with respect to 100 parts of the solid content of the acrylic polymer solution obtained in the above (1)). Chemical Co., Ltd. trade name "Takenate D160N", trimethylolpropane hexamethylene isocyanate) 0.1 part, benzyl peroxide (0.3N part of Nippon Oil Company, trade name "Nyper BMT"), γ-epoxy 0.2 parts of propoxypropylmethoxysilane (trade name "KBM-403" manufactured by Shin-Etsu Chemical Co., Ltd.).

(3)黏接著層的形成 將前述(2)所得之丙烯酸系黏著劑組成物之溶液塗佈在業經聚矽氧系剝離劑處理之聚對苯二甲酸乙二酯薄膜(分離件薄膜:三菱化學聚酯薄膜股份公司製、商品名「MRF38」)之單面,進行150℃下3分鐘的乾燥,在分離件薄膜的表面形成厚度20μm的黏著劑層(黏接著層)。該黏著劑層(黏接著層)之23℃時儲存彈性模數G'為1.1×105(3) Formation of Adhesive Layer The solution of the acrylic adhesive composition obtained in the above (2) was applied to a polyethylene terephthalate film (separator film: Mitsubishi) treated with a silicone release agent. One side of Chemical Polyester Film Co., Ltd. (trade name "MRF38") was dried at 150 ° C for 3 minutes to form an adhesive layer (adhesive layer) having a thickness of 20 µm on the surface of the separator film. The storage elastic modulus G ′ of the adhesive layer (adhesive layer) at 23 ° C. was 1.1 × 10 5 .

[實施例1] 將參考例1所製作的低折射率層形成用塗覆液塗覆於厚度100μm由含脂環式結構樹脂薄膜(日本ZEON 股份公司、商品名「ZEONOR :ZF14薄膜」)構成之基材(基材薄膜)上並進行乾燥,形成膜厚約800nm的低折射率層(折射率:1.18)。再將附分離件(75μm)且厚度25μm之參考例2所得黏著劑(第1黏接著層)貼合在低折射率層面上後,從前述含脂環式結構樹脂薄膜側進行累積光量300mJ/cm2 的UV照射。然後,自前述黏著劑(黏接著層)與低折射率層之集合體將前述含脂環式結構樹脂薄膜(基材薄膜)剝離。然後,於已剝離前述基材薄膜之面再貼合附另一分離件之厚度5μm之參考例3所得黏著劑(第2黏接著層),獲得總厚度(整體厚度)約31μm的含低折射率層之黏接著片材。此外,總厚度(整體厚度)是指前述第1黏接著層、前述低折射率層及前述第2黏接著層之積層體[分離件不計]的厚度合計,以下各實施例及比較例亦同。該含低折射率層之黏接著片材中,黏著劑(黏接著層)之厚度(前述第1黏接著層及前述第2黏接著層之厚度合計)相對於總厚度(整體厚度)所佔比率約為97%。該含低折射率層之黏接著片材的光學特性示於表1。再者,使用前述含低折射率層之黏接著片材,將液晶TV之LED側光型背光所用導光板與反射板一體化時的輝度特性結果亦示於表1。[Example 1] A coating liquid for forming a low refractive index layer prepared in Reference Example 1 was applied to a thickness of 100 μm and was composed of an alicyclic structure resin film (Japanese ZEON Corporation, trade name "ZEONOR: ZF14 film"). The substrate (substrate film) was dried, and a low refractive index layer (refractive index: 1.18) with a film thickness of about 800 nm was formed. Then, the adhesive (the first adhesive layer) obtained in Reference Example 2 with a separator (75 μm) and a thickness of 25 μm was laminated on a low refractive index layer, and the accumulated light amount from the alicyclic structure resin film side was 300 mJ / cm 2 of UV irradiation. Then, the alicyclic structure resin film (base film) is peeled from the aggregate of the adhesive (adhesive layer) and the low refractive index layer. Then, the adhesive agent (the second adhesive layer) obtained in Reference Example 3 with a thickness of 5 μm and another separator was attached to the surface on which the substrate film was peeled off, to obtain a low refractive index with a total thickness (overall thickness) of about 31 μm. The adhesive layer is bonded to the sheet. In addition, the total thickness (overall thickness) refers to the total thickness of the laminated body [excluding separated parts] of the first adhesive layer, the low-refractive index layer, and the second adhesive layer. The same applies to the following examples and comparative examples. . In the adhesive sheet with a low refractive index layer, the thickness of the adhesive (adhesive layer) (total thickness of the first adhesive layer and the second adhesive layer) is accounted for the total thickness (overall thickness) The ratio is about 97%. The optical characteristics of the low-refractive-index-containing adhesive sheet are shown in Table 1. In addition, the results of the luminance characteristics when the light guide plate and the reflection plate used for the LED side-light type backlight of the liquid crystal TV are integrated using the aforementioned adhesive sheet with a low refractive index layer are also shown in Table 1.

[實施例2] 令實施例1記載之黏著劑兩者均為參考例3所得之黏著劑,此外進行和實施例1相同之操作,獲得總厚度(整體厚度)約11μm之含低折射率層之黏接著片材。該含低折射率層之黏接著片材中,黏著劑(黏接著層)之厚度(前述第1黏接著層及前述第2黏接著層之厚度合計)相對於總厚度(整體厚度)所佔比率約為91%。該含低折射率層之黏接著片材的光學特性示於表1。再者,使用前述含低折射率層之黏接著片材,將液晶TV之LED側光型背光所用導光板與反射板一體化時的輝度特性結果亦示於表1。[Example 2] Let both the adhesives described in Example 1 be those obtained in Reference Example 3, and perform the same operation as in Example 1 to obtain a low refractive index layer with a total thickness (overall thickness) of about 11 μm. The sticky sheet. In the adhesive sheet with a low refractive index layer, the thickness of the adhesive (adhesive layer) (total thickness of the first adhesive layer and the second adhesive layer) is accounted for the total thickness (overall thickness) The ratio is about 91%. The optical characteristics of the low-refractive-index-containing adhesive sheet are shown in Table 1. In addition, the results of the luminance characteristics when the light guide plate and the reflection plate used for the LED side-light type backlight of the liquid crystal TV are integrated using the aforementioned adhesive sheet with a low refractive index layer are also shown in Table 1.

[實施例3] 令實施例1記載之黏著劑中的第1黏接著層為參考例4所得黏著劑(黏接著層),並令第2黏接著層為參考例5所得黏著劑(黏接著層),此外進行和實施例1相同之操作,獲得總厚度(整體厚度)約41μm之含低折射率層之黏接著片材。該含低折射率層之黏接著片材中,黏著劑(黏接著層)厚度(前述第1黏接著層及前述第2黏接著層之厚度合計)相對於總厚度(整體厚度)之所佔比率約為98%。該含低折射率層之黏接著片材的光學特性示於表1。再者,使用前述含低折射率層之黏接著片材,將液晶TV之LED側光型背光所用導光板與反射板一體化時的輝度特性結果亦示於表1。[Example 3] Let the first adhesive layer in the adhesive described in Example 1 be the adhesive (adhesive layer) obtained in Reference Example 4, and let the second adhesive layer be the adhesive (adhesive layer) obtained in Reference Example 5. Layer), and the same operation as in Example 1 was performed to obtain a low refractive index layer-containing adhesive sheet having a total thickness (overall thickness) of about 41 μm. The ratio of the thickness of the adhesive (adhesive layer) (total thickness of the first adhesive layer and the second adhesive layer) to the total thickness (overall thickness) of the adhesive sheet with a low refractive index layer The ratio is about 98%. The optical characteristics of the low-refractive-index-containing adhesive sheet are shown in Table 1. In addition, the results of the luminance characteristics when the light guide plate and the reflection plate used for the LED side-light type backlight of the liquid crystal TV are integrated using the aforementioned adhesive sheet with a low refractive index layer are also shown in Table 1.

[比較例1] 除了將實施例1記載之低折射率層變更為折射率1.28之低折射率層以外,進行和實施例1相同之操作,獲得含低折射率層之黏接著片材。該含低折射率層之黏接著片材的光學特性示於表1。再者,使用前述含低折射率層之黏接著片材,將液晶TV之LED側光型背光所用導光板與反射板一體化時的輝度特性結果亦示於表1。[Comparative Example 1] The same operation as in Example 1 was performed except that the low-refractive index layer described in Example 1 was changed to a low-refractive index layer having a refractive index of 1.28 to obtain an adhesive sheet containing a low-refractive index layer. The optical characteristics of the low-refractive-index-containing adhesive sheet are shown in Table 1. In addition, the results of the luminance characteristics when the light guide plate and the reflection plate used for the LED side-light type backlight of the liquid crystal TV are integrated using the aforementioned adhesive sheet with a low refractive index layer are also shown in Table 1.

[比較例2] 僅以不含低折射率層之厚度25μm的黏著劑進行導光板與反射板的一體化。光學特性之測定結果示於表1。[Comparative Example 2] The light guide plate and the reflection plate were integrated only with an adhesive having a thickness of 25 μm that did not include a low refractive index layer. The measurement results of the optical characteristics are shown in Table 1.

[比較例3] 不將導光板與反射板一體化,僅隔著空氣層(不使用低折射率層及黏接著層)將其等積層,測定光學特性。結果示於表1。[Comparative Example 3] The light guide plate and the reflecting plate were not integrated, and only an air layer (a low-refractive index layer and an adhesive layer was not used) was laminated together to measure optical characteristics. The results are shown in Table 1.

此外,表1中的輝度特性(輝度均一性)係依下述方式測定。The luminance characteristics (brightness uniformity) in Table 1 were measured in the following manner.

(輝度特性之測定方法) 在具有LED側光型背光之TV的導光板與反射板之間,導入實施例記載之含低折射率層之黏著片材,使導光板與反射板一體化。使TV為全白畫面,利用分光放射計SR-UL2(TOPCON TECHNOHOUSE公司商品名)從導光板之LED入射側往終端側測定各個座標的輝度。(Measurement method of luminance characteristics) Between the light guide plate and the reflection plate of a TV having an LED side-light backlight, an adhesive sheet including a low refractive index layer described in the embodiment is introduced to integrate the light guide plate and the reflection plate. The TV was made completely white, and the luminance of each coordinate was measured from the incident side of the LED of the light guide plate to the terminal side using a spectroradiometer SR-UL2 (TOPCON TECHNOHOUSE company trade name).

再者,使用精工電子公司製SPI3800(商品名),依前述測定方法測定實施例1~3及比較例1之含低折射率層之黏接著片材中低折射率層(空隙層)的表面粗度Rz係數(十點平均粗度)。其測定結果合併示表1。The surface of the low-refractive-index layer (void layer) in the adhesive sheet containing the low-refractive index layer in Examples 1 to 3 and Comparative Example 1 was measured by the aforementioned measuring method using SPI3800 (trade name) manufactured by Seiko Instruments Inc. Coarseness Rz coefficient (ten-point average thickness). The measurement results are shown in Table 1.

[表1] [Table 1]

如表1所示,在使用實施例1及2之含低折射率層之黏接著片材將導光板與反射板一體化的情形時,來自LED的光從導光板入射側傳播至終端側,輝度特性良好(輝度均一)。又,在將導光板與反射板一體化時,反射板沒有翹曲,作業性良好。相對於此,低折射率層之折射率超過1.25的比較例1、以及沒有低折射率層的比較例2中,在將導光板與反射板一體化時,於光傳播至導光板之終端側前就會發生漏光,光未能及至終端側,故輝度不均一。又,使用了空氣層代替含低折射率層之黏接著片材的比較例3,在將導光板與反射板一體化時反射板發生翹曲,作業困難。再者,亦發生因反射板翹曲導致的輝度不均缺陷。As shown in Table 1, in the case where the light guide plate and the reflective plate are integrated using the adhesive sheet with a low refractive index layer of Examples 1 and 2, light from the LED propagates from the incident side of the light guide plate to the terminal side. Brightness characteristics are good (uniform brightness). When the light guide plate and the reflecting plate are integrated, the reflecting plate is not warped and the workability is good. In contrast, in Comparative Example 1 in which the refractive index of the low refractive index layer exceeds 1.25, and Comparative Example 2 in which the low refractive index layer is not provided, when the light guide plate and the reflective plate are integrated, light propagates to the terminal side of the light guide plate There will be light leakage before, and the light does not reach the terminal side, so the brightness is not uniform. Further, in Comparative Example 3, in which an air layer was used instead of the adhesive sheet containing a low refractive index layer, the reflection plate was warped when the light guide plate and the reflection plate were integrated, and the work was difficult. Furthermore, the uneven brightness defect caused by the warpage of the reflecting plate also occurs.

又,實施例1~3所用低折射率層儘管折射率極低僅1.18(即空隙率高),表面粗度Rz係數仍小至87nm。如此87nm之數値即便與比較例1之低折射率層相較,仍為幾不遜色的數値。若為此種表面粗度Rz係數小的低折射率層,如前所述,低折射率層表面的強度便易於抑制或防止掉落時容易損傷等問題。從而亦易於抑制或防止因低折射率層表面損傷所致之光學特性的低落。In addition, the low-refractive-index layers used in Examples 1 to 3 had an extremely low refractive index of only 1.18 (that is, a high porosity), and the surface roughness Rz coefficient was still as small as 87 nm. This number of 87 nm is almost inferior to that of the low refractive index layer of Comparative Example 1. In the case of such a low refractive index layer having a small surface roughness Rz coefficient, as described above, the strength of the surface of the low refractive index layer is easily suppressed or prevented from being easily damaged when dropped. Therefore, it is also easy to suppress or prevent the degradation of the optical characteristics caused by the surface damage of the low refractive index layer.

產業上之可利用性 如同上述說明,依據本發明,可提供薄型且低折射率的含低折射率層之黏接著片材、含低折射率層之黏接著片材之製造方法及光學組件。本發明之用途沒有特別限定,舉例而言,可於液晶顯示器、有機EL顯示器、微型LED顯示器、有機EL照明等光學組件全面廣泛利用。Industrial Applicability As described above, according to the present invention, it is possible to provide a thin, low-refractive-index adhesive sheet containing a low-refractive index layer, a method for manufacturing an adhesive sheet including a low-refractive index layer, and an optical device. The application of the present invention is not particularly limited. For example, it can be widely used in optical components such as liquid crystal displays, organic EL displays, micro LED displays, and organic EL lighting.

本申請案以2017年1月31日提申之日本專利申請案特願2017-016188、及2017年10月4日提申之日本專利申請案特願2017-194713為基礎主張優先權,並將其全部揭示內容納入本案。This application claims priority based on Japanese Patent Application Japanese Patent Application No. 2017-016188 filed on January 31, 2017 and Japanese Patent Application Japanese Patent Application No. 2017-194713 filed on October 4, 2017. Its full disclosure is incorporated into this case.

10‧‧‧基材10‧‧‧ Substrate

20‧‧‧低折射率層20‧‧‧ Low refractive index layer

20'‧‧‧塗覆膜(前驅層)20'‧‧‧ coated film (precursor layer)

20''‧‧‧含凝膠粉碎物之液體20``‧‧‧Liquid containing smashed gel

30‧‧‧黏接著層(黏著劑)30‧‧‧ Adhesive layer (adhesive)

40‧‧‧分離件40‧‧‧ Separator

101‧‧‧送出輥101‧‧‧feed out roller

102‧‧‧塗覆輥102‧‧‧Coating roller

105‧‧‧捲取輥105‧‧‧ take-up roll

106‧‧‧輥件106‧‧‧Roller

110‧‧‧烘箱區110‧‧‧Oven area

111‧‧‧熱風器(加熱機構)111‧‧‧hot air heater (heating mechanism)

120‧‧‧化學處理區120‧‧‧Chemical treatment zone

121‧‧‧燈(照光機構)或熱風器(加熱機構)121‧‧‧ lamp (lighting mechanism) or hot air heater (heating mechanism)

201‧‧‧送出輥201‧‧‧feed out roller

202‧‧‧儲液區202‧‧‧Liquid storage area

203‧‧‧刮刀(doctor knife)203‧‧‧ doctor knife

204‧‧‧微凹版204‧‧‧Micro-gravure

210‧‧‧烘箱區210‧‧‧ Oven area

211‧‧‧加熱機構211‧‧‧Heating mechanism

220‧‧‧化學處理區220‧‧‧Chemical treatment zone

221‧‧‧燈(照光機構)或熱風器(加熱機構)221‧‧‧ lamp (lighting mechanism) or hot air heater (heating mechanism)

251‧‧‧捲取輥251‧‧‧ take-up roller

圖1為製程剖面圖,其示意性表示本發明之低折射率層之製造方法、及含低折射率層之黏接著片材之製造方法之一例。 圖2為示意性表示本發明之低折射率層之製造方法及含低折射率層之黏接著片材之製造方法的部分步驟以及所用裝置之一例之圖。 圖3為示意性表示本發明之低折射率層之製造方法及含低折射率層之黏接著片材之製造方法的部分步驟以及所用裝置之另一例之圖。 圖4為實施例之含低折射率層之黏接著片材的剖面SEM影像。FIG. 1 is a cross-sectional view of a manufacturing process, which schematically illustrates an example of a method for manufacturing a low refractive index layer and a method for manufacturing an adhesive sheet including a low refractive index layer according to the present invention. FIG. 2 is a view schematically showing a part of the steps of the method for manufacturing the low-refractive index layer and the method for manufacturing the adhesive sheet including the low-refractive index layer of the present invention, and an example of an apparatus used therefor. FIG. 3 is a view schematically showing a part of the steps of the method for manufacturing the low-refractive index layer and the method for manufacturing the adhesive sheet containing the low-refractive index layer and another example of the device used in the present invention. FIG. 4 is a cross-sectional SEM image of an adhesive sheet containing a low refractive index layer according to an embodiment.

Claims (11)

一種含低折射率層之黏接著片材,特徵在於其依序積層有第1黏接著層、低折射率層及第2黏接著層, 且前述低折射率層之折射率為1.25以下。An adhesive sheet with a low refractive index layer is characterized in that it has a first adhesive layer, a low refractive index layer, and a second adhesive layer laminated in this order, and the refractive index of the aforementioned low refractive index layer is 1.25 or less. 如請求項1之含低折射率層之黏接著片材,其中前述第1黏接著層及前述第2黏接著層之合計厚度,相對於前述第1黏接著層、前述低折射率層及前述第2黏接著層之合計厚度為85%以上。For example, the adhesive sheet with a low refractive index layer according to claim 1, wherein the total thickness of the first adhesive layer and the second adhesive layer is larger than that of the first adhesive layer, the low refractive index layer, and the foregoing. The total thickness of the second adhesive layer is 85% or more. 如請求項1或2之含低折射率層之黏接著片材,其中前述低折射率層為空隙層。For example, the low-refractive index layer-containing adhesive sheet according to claim 1 or 2, wherein the aforementioned low-refractive index layer is a void layer. 如請求項1或2之含低折射率層之黏接著片材,其係於前述第1黏接著層及前述第2黏接著層中至少一者之位在與前述低折射率層相反側之面上貼附有分離件。For example, the low-refractive-index-containing adhesive sheet according to claim 1 or 2 is located on at least one of the first adhesive layer and the second adhesive layer on the opposite side of the low-refractive index layer. Separator is attached on the surface. 一種含低折射率層之黏接著片材之製造方法,係製造如請求項1至4中任一項之含低折射率層之黏接著片材,前述製造方法包含下述步驟: 低折射率層形成步驟,於轉印用樹脂薄膜基材上形成前述低折射率層;及 轉印步驟,將前述低折射率層轉印至前述黏接著層上。A method for manufacturing an adhesive sheet with a low refractive index layer is to manufacture the adhesive sheet with a low refractive index layer according to any one of claims 1 to 4. The aforementioned manufacturing method includes the following steps: A layer forming step of forming the aforementioned low refractive index layer on the transfer resin film substrate; and a transferring step of transferring the aforementioned low refractive index layer onto the adhesive layer. 如請求項5之製造方法,其中前述含低折射率層之黏接著片材為如請求項4之含低折射率層之黏接著片材, 且該製造方法進一步具有分離件貼附步驟:於前述黏接著層之位在與前述低折射率層相反側之面上添附前述分離件。The manufacturing method according to claim 5, wherein the adhesive sheet with a low refractive index layer is the adhesive sheet containing a low refractive index layer as described in claim 4, and the manufacturing method further has a step of attaching a separate piece: at The adhesive layer is provided with a separator on a side opposite to the low refractive index layer. 如請求項6之製造方法,其進一步具有轉印用樹脂薄膜基材剝離步驟:於前述分離件貼附步驟後,將前述轉印用樹脂薄膜基材剝離。The manufacturing method according to claim 6, further comprising a step of peeling the resin film substrate for transfer: after the step of attaching the separator, peeling the resin film substrate for transfer. 如請求項7之製造方法,其中前述分離件與前述黏接著層的剝離力,係大於前述轉印用樹脂薄膜基材與前述低折射率層之剝離力。The method according to claim 7, wherein the peeling force between the separator and the adhesive layer is greater than the peeling force between the transfer resin film substrate and the low refractive index layer. 如請求項5至8中任一項之製造方法,前述轉印用樹脂薄膜基材係由含脂環式結構樹脂形成。According to the manufacturing method of any one of claims 5 to 8, the resin film base material for transfer is made of an alicyclic structure resin. 一種含低折射率層之黏接著片材之製造方法,係製造如請求項1至4中任一項之含低折射率層之黏接著片材,前述製造方法包含下述步驟: 塗覆步驟,於前述黏接著層上直接塗覆屬前述低折射率層原料的塗覆液;及 乾燥步驟,將前述塗覆液乾燥。A method for manufacturing an adhesive sheet with a low refractive index layer is to produce the adhesive sheet with a low refractive index layer according to any one of claims 1 to 4. The aforementioned manufacturing method includes the following steps: a coating step Directly coating a coating liquid that is a raw material of the low refractive index layer on the adhesive layer; and a drying step of drying the coating liquid. 一種光學組件,特徵在於其包含:如請求項1至4中任一項之含低折射率層之黏接著片材、第1光學機能層及第2光學機能層,且 前述第1光學機能層係貼附於前述第1黏接著層之位在與前述低折射率層相反側之面上, 前述第2光學機能層係貼附於前述第2黏接著層之位在與前述低折射率層相反側之面上。An optical component, characterized in that it comprises: a low refractive index layer-containing adhesive sheet according to any one of claims 1 to 4, a first optical function layer and a second optical function layer, and the aforementioned first optical function layer The second adhesive layer is attached to the low-refractive index layer on the side opposite to the low-refractive index layer, and the second optical function layer is attached to the low-refractive index layer On the opposite side.
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