TW201832014A - Exposure apparatus capable of rapidly attenuating minute vibrations of a stage base - Google Patents

Exposure apparatus capable of rapidly attenuating minute vibrations of a stage base Download PDF

Info

Publication number
TW201832014A
TW201832014A TW107100616A TW107100616A TW201832014A TW 201832014 A TW201832014 A TW 201832014A TW 107100616 A TW107100616 A TW 107100616A TW 107100616 A TW107100616 A TW 107100616A TW 201832014 A TW201832014 A TW 201832014A
Authority
TW
Taiwan
Prior art keywords
stage
frame
movable
vibration
viscous fluid
Prior art date
Application number
TW107100616A
Other languages
Chinese (zh)
Inventor
長島寿一
Original Assignee
日商牛尾電機股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商牛尾電機股份有限公司 filed Critical 日商牛尾電機股份有限公司
Publication of TW201832014A publication Critical patent/TW201832014A/en

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70716Stages
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70716Stages
    • G03F7/70725Stages control
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70758Drive means, e.g. actuators, motors for long- or short-stroke modules or fine or coarse driving

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Vibration Prevention Devices (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

An exposure apparatus capable of rapidly attenuating minute vibrations of a stage base is provided. An aspect of the exposure apparatus includes a frame; a stage base in which the above-mentioned frame can be freely lifted and lowered and expanded in the in-plane direction intersecting with the lifting direction; a movable stage mounted on the stage base and movable freely in the in-plane direction; an exposure unit for irradiating light onto an object to be exposed placed on the movable stage to expose the object to light, a movable unit for moving the movable stage in the in-plane direction with respect to the stage base, a lift for lifting the stage base on which the movable stage is mounted relative to the frame, and a vibration damper which is connected to both the frame and the stage base and suppresses the vibration of the stage machine tool with respect to the frame, wherein the vibration damper is provided with a container that is fixed to one side of the frame and the stage base and that houses the viscous fluid therein, and an insertion body which is fixed to the other side and partially inserted into the viscous fluid in the container in a non-contact state with the inner wall of the container.

Description

曝光裝置Exposure device

[0001] 本發明是有關於曝光裝置,進一步詳細的話,有關於可以迅速地衰減將可動載台對於載台機床移動時發生的載台機床的振動的曝光裝置。[0001] The present invention relates to an exposure device. More specifically, the present invention relates to an exposure device capable of rapidly attenuating vibration of a stage machine tool when a movable stage is moved to the stage machine tool.

[0002] 曝光裝置,是在印刷電路基板和液晶面板等的也稱為工件的製造物的製造過程中,使用於配線等的圖型形成。這種曝光裝置,其典型的構成例,主要是具備:光照射部、使工件被曝光(複寫)並形成圖型的遮罩、將此遮罩保持的遮罩載台、將進行曝光處理的印刷電路基板和液晶面板等的工件保持的工件載台、將形成於遮罩的圖型投影在工件上的投影透鏡。   [0003] 在專利文獻1中,揭示了具有上述的典型的構成的曝光裝置。工件載台,通常是具備:可以將工件載置移動的可動載台、及限定該可動載台的可動領域的載台機床。   且這種工件載台,一般也被配備在成為曝光裝置整體的外骨骼的光學框架(或是光學台架)內。且,在載台機床及光學框架之間具有Z軸驅動機構。可動載台,是配合由這種Z軸驅動機構所進行的Z方向移動及載台機床上中的平面的移動,朝XYZθ方向可移動。 [習知技術文獻] [專利文獻]   [0004]   [專利文獻1]日本專利第5556774號公報[0002] An exposure device is used to form patterns such as wiring in a manufacturing process of a printed circuit board, a liquid crystal panel, or the like that is also called a workpiece. A typical configuration example of such an exposure device mainly includes a light irradiation section, a mask for exposing (copying) a workpiece, forming a pattern, a mask stage holding the mask, and performing exposure processing. A work stage for holding a work such as a printed circuit board and a liquid crystal panel, and a projection lens that projects a pattern formed on a mask onto the work. [0003] Patent Document 1 discloses an exposure apparatus having the typical configuration described above. The workpiece stage generally includes a movable stage capable of placing and moving a workpiece, and a stage machine tool that limits the movable area of the movable stage. In addition, such a workpiece stage is generally provided in an optical frame (or an optical stage) of an exoskeleton that becomes the entire exposure device. A Z-axis drive mechanism is provided between the stage machine and the optical frame. The movable stage is movable in the XYZθ direction in accordance with the Z-direction movement and the plane movement on the stage machine by the Z-axis drive mechanism. [Habitual technical literature] [patent literature]] [0004] [patent literature 1] Japanese Patent No. 5557774

[本發明所欲解決的課題]   [0005] 但是Z軸驅動機構,與載台機床和光學框架相比較的話剛性較低,伴隨圖型的微細化若可動載台的動作變迅速的話,在載台機床就會發生微細的振動。   另一方面可動載台的位置精度也伴隨圖型的微細化精密化,發生於可動載台每次動作時的載台機床的振動沒有衰減至規定的層級為止的話,曝光裝置不會進行曝光。   此結果,生產節拍時間無法被短縮的問題會發生。此問題雖是在步驟&返覆方式的曝光裝置時特別顯著,但其是在曝光裝置一般會產生的問題。   鑑於以上,本發明的課題是提供一種曝光裝置,可以將載台機床的微細的振動迅速地衰減。 [用以解決課題的手段]   [0006] 為了解決上述課題,本發明的曝光裝置的一態樣,是具備:框架、及對於上述框架可昇降自如且朝對於昇降方向交叉的面內方向擴大的載台機床、及被搭載於上述載台機床且朝上述面內方向可移動自如的可動載台、及對於被載置在上述可動載台的曝光對象將光照射地曝光的曝光部、及對於上述載台機床將上述可動載台朝上述面內方向移動的移動機、及將搭載了上述可動載台的上述載台機床對於上述框架昇降的昇降機、及與上述框架及上述載台機床的雙方連繫且抑制上述載台機床對於上述框架振動的制振緩衝器,上述制振緩衝器,是具備:被固定於上述框架及上述載台機床的一方且在內部收容了上述黏性流體的容器、及被固定於對於上述一方的另一方且一部分是在與其容器的內壁非接觸的狀態下被插入上述容器內的上述黏性流體的插入體。   依據這種曝光裝置的話,可以將載台機床的微細的振動,由黏性流體及插入體的阻力迅速地衰減。   [0007] 對於上述曝光裝置,上述移動機,是具有對於被包含於上述面內方向彼此交叉的2個方向成分各別彼此獨立地將上述可動載台移動的複數移動部,上述插入體,其被插入上述黏性流體的部分,是沿著上述2個方向成分之中的一方延伸的板部較佳。   依據這種曝光裝置的話,板部,是可以迅速地衰減由上述一方的方向成分中的可動載台的移動而在載台機床發生的振動。   [0008] 且具有上述板部的上述插入體,其上述板部,是沿著上述2個方向成分之中的一方及上述昇降方向的雙方延伸進一步較佳。板部是藉由沿著這種方向延伸,具有充分制振能力的制振緩衝器就容易被設於載台機床及框架的間隙。   進一步,具有上述板部的上述插入體,上述容器,具有分別將上述黏性流體收容且沿著上述2個方向成分之中對於上述一方的另一方並列的複數收容槽,上述插入體,是具有個別被插入上述複數收容槽的複數上述板部也較佳。藉由這種複數板部,可實現省空間且高的制振能力。   [0009] 且對於上述曝光裝置,上述插入體,其被插入上述黏性流體的部分,是沿著藉由上述制振緩衝器被抑制的上述載台機床的振動的方向延伸的板部也可以。這種板部,是由沿著振動方向延伸的側面從黏性流體將阻力承接使振動迅速地衰減。   且對於上述曝光裝置,上述黏性流體,是具有1000Pa‧s以上的黏度也可以。藉由使用這種高黏度的黏性流體,使振動迅速地被衰減。 [發明的效果]   [0010] 依據本發明的曝光裝置的話,可以將載台機床的微細的振動迅速地衰減。[Problems to be Solved by the Invention] 000 [0005] However, the Z-axis drive mechanism has lower rigidity compared with a stage machine tool and an optical frame. With the miniaturization of the pattern, if the movement of the movable stage becomes rapid, the Fine vibration occurs on the machine. On the other hand, the positional accuracy of the movable stage is accompanied by the miniaturization of the pattern. If the vibration of the stage machine tool does not attenuate to a predetermined level during each movement of the movable stage, the exposure device will not perform exposure. As a result, the problem that the production cycle time cannot be shortened occurs. Although this problem is particularly noticeable in the exposure device of the step-and-repeat method, it is a problem that generally occurs in the exposure device. In view of the foregoing, an object of the present invention is to provide an exposure apparatus capable of rapidly attenuating fine vibrations of a stage machine tool. [Means for Solving the Problems] [0006] In order to solve the above-mentioned problems, one aspect of the exposure apparatus of the present invention includes a frame and an in-plane direction that can be raised and lowered freely with respect to the frame and that intersects with the ascending and descending directions. A stage machine tool, a movable stage that is mounted on the stage machine tool and is movable in the in-plane direction, an exposure unit that exposes light to an exposure object placed on the movable stage, and The stage machine tool is a mobile machine that moves the movable stage in the in-plane direction, a lifter that lifts and lowers the stage machine tool on which the stage is mounted, and both the frame and the stage machine tool. A vibration damping damper that is connected to and restrains the stage machine tool from vibrating the frame, and the vibration damping damper includes a container fixed to one of the frame and the stage machine tool and containing the viscous fluid inside. And are fixed to the other of the one and are partially inserted into the container without contacting the inner wall of the container. The viscous fluid insert. According to this exposure device, the fine vibration of the stage machine can be rapidly attenuated by the resistance of the viscous fluid and the insert. [0007] In the exposure apparatus, the moving machine is provided with a plurality of moving parts for independently moving the movable stage with respect to two direction components included in the in-plane direction crossing each other, and the insert body, The portion to be inserted into the viscous fluid is preferably a plate portion extending along one of the two directional components. According to such an exposure device, the plate portion can rapidly attenuate vibrations generated in the stage machine tool due to the movement of the movable stage among the above-mentioned directional components. [0008] Further, it is more preferable that the insert body having the plate portion extends along one of the two direction components and both sides of the elevating direction. By extending the plate portion in such a direction, a vibration damping buffer having sufficient vibration damping ability can be easily installed in the gap between the stage machine tool and the frame. Further, the insert having the plate portion, and the container having a plurality of receiving grooves for accommodating the viscous fluid and arranging in parallel to the other one of the two components along the two directions, and the insert has It is also preferable that the plurality of plate portions are individually inserted into the plurality of receiving grooves. With such a plurality of plate portions, space saving and high vibration damping ability can be realized. [0009] Further, in the exposure apparatus, the insert may be a plate portion extending in a direction in which the viscous fluid is inserted in a direction in which the vibration of the stage machine tool is suppressed by the vibration damping buffer. . Such a plate portion receives resistance from a viscous fluid from a side surface extending in a vibration direction, and rapidly attenuates vibration. In the above exposure device, the viscous fluid may have a viscosity of 1000 Pa · s or more. By using such a high viscosity viscous fluid, vibration is rapidly attenuated. [Effects of the Invention] [0010] According to the exposure apparatus of the present invention, it is possible to rapidly attenuate the fine vibration of the stage machine tool.

[0012]以下,依據圖面說明本發明的實施例。   第1圖,是將本發明的曝光裝置的一實施例中的內部構造從曝光裝置的側方透視的構造圖。   在本說明書中,為了說明裝置的方向等,在各圖使用共通的座標系。與第1圖的紙面垂直的方向是此共通座標系的X軸方向,第1圖的左右方向是Y軸方向,第1圖的上下方向是Z軸方向。   第1圖所示的曝光裝置1,是進行步驟&返覆處理的曝光裝置。   曝光裝置1,是具備用來限定曝光裝置1的外形並且將曝光裝置1整體支撐的光學框架10。此光學框架10,是相當於本發明的框架的一例。   [0013] 曝光裝置1,是在光學框架10的上方具備光源部20。光源部20是具有燈泡21及鏡子22及擋板23,燈泡21,是從燈泡亮燈裝置24被供給電力而亮燈。從燈泡21發出的光是由鏡子22朝向第1圖的下方被反射。擋板23,是切換從鏡子22朝向下方的光的透過及遮斷,將曝光通斷(ON/OFF)。   遮罩30及投影透鏡40是被設置在光學框架10的內部。在遮罩30中形成有曝光的圖型,來自光源部20的光是照射在遮罩30。透過了遮罩30的曝光光是藉由投影透鏡40而被投影在工件W上。   [0014] 將光源部20及遮罩30及投影透鏡40合併者,是相當於本發明的曝光部的一例。   在光學框架10內,具備將工件W保持並朝XYZθ方向移動的工件載台50。   在曝光裝置1中,也具備將:燈泡21的亮燈、由擋板23所進行的曝光的通斷(ON/OFF)、及將工件載台50中的XYZθ方向的移動,控制的控制部60。   第2圖,是將工件載台50周邊的構造從上方所見的俯視圖。   與第2圖的紙面垂直的方向,是上述的共通座標系中的Z軸方向,第2圖的左右方向是Y軸方向,第2圖的上下方向是X軸方向。   [0015] 以下,參照第1圖及第2圖的雙方說明工件載台50的構造。   在本實施例中,工件載台50,是採用H型載台。在此工件載台50中,設有:沿著XY平面擴大的載台機床51、及將載台機床51支撐於光學框架10上的Z軸驅動機構52、及在載台機床51上朝XYθ方向可移動的可動載台53。Z軸驅動機構52是將載台機床51朝Z軸方向驅動(昇降)並支撐於任意的高度。被保持於工件載台50的工件W是藉由此Z軸驅動機構52,而被移動並保持於由投影透鏡40所產生的曝光圖型對焦的位置。   [0016] 載台機床51,是相當於本發明的載台機床的一例,可動載台53,是相當於本發明的可動載台的一例,Z軸驅動機構52,是相當於本發明的昇降機的一例。   在載台機床51的上面,固定有朝Y軸方向延伸的2條固定導件54。此2條固定導件54之間,是掛架有移動導件55,可動載台53可載置在該移動導件55上。   [0017] 移動導件55,是例如藉由由線性馬達所構成的致動器也就是Y軸驅動機構54a而在固定導件54上被驅動朝Y軸方向移動。且,可動載台53,是例如藉由由線性馬達所構成的致動器也就是X軸驅動機構55a而在移動導件55上被驅動朝X軸方向移動。由此,可實現XY面內方向的可動載台53及工件W的移動。   將固定導件54、Y軸驅動機構54a、移動導件55、及X軸驅動機構55a合併者,是相當於本發明的移動機的一例,Y軸驅動機構54a及X軸驅動機構55a,是相當於本發明的複數移動部的一例。   [0018] 且設於2個固定導件54上的2個Y軸驅動機構54a,是可彼此反向驅動,藉由這種驅動使移動導件55在XY面內旋轉。藉由此XY面內的旋轉,可實現可動載台53及工件W的θ方向旋轉。   柱狀鏡53a是被固定在可動載台53的側面中,雷射測長器11是被設置在光學框架10的內壁中。可動載台53的位置,是藉由從雷射測長器11被射出藉由柱狀鏡53a被反射的雷射光而精密地被測量。   可動載台53及工件W的位置精度,是伴隨曝光圖型的微細化而越來越要求高精度。   [0019] 但是在上述構成的可動載台53是沿著XY平面方向(在工件W的表面的方向)移動的話,對於其的反力會發生並將載台機床51推壓。   載台機床51本身因為是為了曝光圖型的對焦等而有必要使昇降移動,不直接固定在光學框架10,而是被支撐在Z軸驅動機構52。因此,與直接不動地被固定於光學框架10的其他的構件相比較的話,剛性是若干差,因此對於可動載台53的驅動的反力會在載台機床51造成微細的XY平面方向的振動。   [0020] 此振動雖會衰減,但是在振動的時點中,此振動會對於高位置精度曝光造成弊害。因此,本實施例的曝光裝置1是藉由步驟&返覆方式在各曝光領域形成圖型的情況時,可動載台53從某領域朝下個的領域移動之後,必需等待直到微細的振動收納為止的一定的時間。   這種待機時間因為會成為作業時間的損失,所以在本實施例中,設有抑制對於光學框架10的載台機床51的振動的制振緩衝器70,來謀求振動的迅速衰減。此制振緩衝器70,是相當於本發明的制振緩衝器的一例。   [0021] 在本實施例中,其中一例設有4個制振緩衝器70。且,本實施例的情況時,對於Y軸方向的振動,是藉由具有省略圖示的反質量的抑制機構而被抑制,各制振緩衝器70的其中一例是成為抑制X軸方向的振動。   以下,說明制振緩衝器70的構造的詳細。   第3圖,是顯示制振緩衝器的構造的剖面圖。   與第3圖的紙面垂直的方向,是上述的共通座標系的X軸方向,第3圖的左右方向是Y軸方向,第3圖的上下方向是Z軸方向。   制振緩衝器70是具備容器71及插入體72,其中一例,容器71是被固定於光學框架10,插入體72是被固定於載台機床51。此容器71,是相當於本發明的容器的一例,插入體72,是相當於本發明的插入體的一例。在容器71中,設有上面側開口且在下面側具有底部朝X軸方向延伸的收容槽73,在收容槽73的內部空間中被充填(收容)有黏性流體74。   [0022] 插入體72的一部分是成為朝X軸方向延伸的板部75。板部75,是從收容槽73的上面側的開口被插入黏性流體74中,在與收容槽73的內壁分離的狀態下被保持。此板部75,是相當於本發明的複數板部的一例。   因為板部75是與收容槽73的內壁分離,所以此制振緩衝器70,不支撐載台機床51的Z方向,而只有單純將工件面方向(實際上X軸方向)的振動衰減的功能。   [0023] 黏性流體74,是具有室溫例如6000Pa‧s(帕秒)的高黏度,在插入體72及容器71之間產生高阻力。   如此收容槽73和板部75朝X軸方向延伸的構造的制振緩衝器70,是在光學框架10及載台機床51之間的有限的空間,可以沿著載台機床51設置,有助於裝置的小型化。   [0024] 第4圖,是顯示黏性阻力的原理的圖。   在容器的壁101及移動物體102之間具有間隔h的間隙,該間隙是充滿黏度μ的黏性流體103。移動物體102,主要是由圖的下方側的面102a與黏性流體103接觸,以下將此面102a稱為阻力面102a。移動物體102是對於壁101平行地移動的情況,藉由被充填於移動物體102及壁101之間的間隙的黏性流體103,而發生與移動物體102的移動的方向反向的黏性阻力。阻力面102a的面積是A、移動物體102的速度是V的情況,在阻力面102a發生的黏性阻力的阻力F可由F=μAv/h求得。   [0025] 在曝光裝置1的載台機床51發生的振動,因為即使只是亞毫秒的衰減時間也會妨害作業時間短縮,所以可更迅速衰減較佳。在如此的迅速衰減的實現中,更高的黏性阻力因為是成為必要,所以期望面積A的增加及間隔h的減少。且,以由黏性阻力使振動的衰減效率佳地作動的方式,阻力面102a及移動體102,是沿著被抑制的振動的方向(在第3圖的例中為X軸方向)延伸較佳。但是,藉由制振緩衝器70本身的剛性的確保和設置空間的限制等,在面積A的增加和間隔h的減少具有上限。   [0026] 對於此黏性流體103的黏度μ沒有特別上限,利用具有較高的黏度μ的黏性流體103較佳。即使現實的裝置尺寸也可獲得充分大的阻力的黏度μ的話,室溫且5000Pa‧s以上進一步較佳。又,可以確保設置空間的話,1000Pa‧s以上的黏性流體也可最佳地使用。如此的最佳的黏性流體,具體而言例如高黏度矽油。   返回至第3圖持續說明。   插入體72的板部75,是朝X軸方向延伸並且也朝Z軸方向延伸,板部75的主要從黏性流體74承受黏性阻力的阻力面75a,是成為朝XZ面內方向擴大。且,板部75的表背雙面是成為阻力面75a,並且由板部75所具有的各面之中最大面積的面是成為阻力面75a。   [0027] 由X軸驅動機構55a所產生的可動載台53的驅動的反力而在載台機床51發生的振動是X軸方向的振動。由朝X軸方向延伸的板部75所產生的黏性阻力,是將這種X軸方向的振動效率佳地衰減。且,伴隨由驅動的反力而在載台機床51發生的振動板部75及阻力面75a是對於黏性流體74及收容槽73由充分高的速度朝X軸方向移動而發生高的黏性阻力。藉由這種高的黏性阻力而使X軸方向的振動迅速地衰減。   板部75的朝XZ面內方向擴大的構造,是省空間且可獲得寬阻力面75a的構造並且對於X軸方向的動作具有大的剛性的構造。因此,即使大的阻力產生,載台機床51的振動也可至阻力面75a為止確實地傳達,藉由黏性阻力而被確實地衰減。   [0028] 另一方面,由Z軸驅動機構52所產生的載台機床51的驅動若與載台機床51的振動比較的話因為充分小所以黏性阻力也小,由Z軸驅動機構52所產生的載台機床51的驅動無法妨害制振緩衝器70。且,因為板部75也朝Z軸方向延伸,所以載台機床51即使朝Z軸方向被驅動,阻力面75a及收容槽73的內壁的距離也不會變化,制振緩衝器70的基本的性能被維持。在收容槽73中具有某程度的深度,被充填的黏性流體74也因為具有某程度的重量,所以板部75即使是伴隨載台機床51的上下動而上下,板部75也不會從收容槽73及黏性流體74脫離。   [0029] 進一步,在本實施例中,在制振緩衝器70的容器71中設有複數(其中一例為2個)收容槽73。這些複數收容槽73,因為彼此之間,是在與阻力面75a交叉的方向(其中一例Y軸方向)並列所以成為省空間的構造。這些的收容槽73,是相當於本發明的複數收容槽的一例。且,複數板部75是個別被插入這些複數收容槽73中。由此,阻力面75a的數量增加,總面積也增加,阻力也增加。   [0030] 接著,說明檢證了這種制振緩衝器70的性能的實驗結果。   第5圖,是顯示制振緩衝器被取下的比較例中的振動衰減的圖表。   第6圖,是顯示具備制振緩衝器的實施例中的振動衰減的圖表。   第5圖及第6圖的縱軸是顯示由任意單位振動的變位,橫軸是顯示時間。且,第5圖及第6圖所示的細線的圖表G1、G2是顯示振動的實測值,粗線的圖表G3、G4是顯示3點移動平均值。進一步,在第5圖及第6圖中,是顯示藉由對於3點移動平均值的圖表G3、G4將包絡曲線抽出而獲得的衰減曲線T1、T2,這些的衰減曲線T1、T2,是顯示振幅的衰減狀態。   [0031] 在此實驗中,與上述的實施例的構造同樣地使用在載台機床51的周圍具有4個制振緩衝器70,在各制振緩衝器70中具有2個收容槽73及板部75的裝置。阻力面的面積,是每一制振緩衝器70數百平方cm程度,收容槽73及板部75的間隙是1cm以下。   對於載台機床51給與衝擊力使振動的話,載台機床51是由約70Hz振動。此振動,在比較例中是由ζ=0.03的衰減率衰減,對於此,在實施例中是由ζ=0.065的衰減率衰減,經過例如200ms,振動波是成為幾乎零。   又,在上述實施例中雖顯示,具備H型載台的例,但是本發明的載台機床及可動載台,是平面載台也可以。且,H型載台的情況時,本發明的載台機床沒有必要具有平面狀的上面,固定導件可以固定程度地具有平面方向漸廣的骨架構造也可以。   [0032] 且在上述實施例中雖顯示,容器71是被固定於光學框架10,插入體72是被固定於載台機床51的例,但是本發明的插入體及容器,插入體是被固定於光學框架10,容器是被固定於載台機床51也可以。   且在上述實施例中,雖例示藉由黏性阻力而將振動衰減的制振緩衝器,但是本發明的制振緩衝器,是藉由壓力阻力而將振動衰減也可以。   且在上述實施例中,雖例示抑制X軸方向的振動的制振緩衝器70,但是本發明的制振緩衝器,是抑制Y軸方向的振動也可以,抑制朝X軸方向及Y軸方向的雙方交叉的方向的振動也可以。進一步,本發明的曝光裝置,是具備抑制振動的方向不同的複數制振緩衝器也可以。[0012] Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a structural view of an internal structure of an exposure apparatus according to an embodiment of the present invention, as viewed from the side of the exposure apparatus. In this manual, to explain the orientation of the device, etc., common coordinate systems are used in each drawing. The direction perpendicular to the paper surface in FIG. 1 is the X-axis direction of this common coordinate system, the left-right direction in FIG. 1 is the Y-axis direction, and the up-down direction in FIG.的 The exposure device 1 shown in FIG. 1 is an exposure device that performs a step & reply process. The exposure device 1 is provided with an optical frame 10 for limiting the external shape of the exposure device 1 and supporting the exposure device 1 as a whole. This optical frame 10 is an example of a frame equivalent to the present invention. [0013] The exposure device 1 includes a light source unit 20 above the optical frame 10. The light source unit 20 includes a bulb 21, a mirror 22, and a baffle 23, and the bulb 21 is turned on by being supplied with power from the bulb lighting device 24. The light emitted from the bulb 21 is reflected by the mirror 22 downward toward the first figure. The shutter 23 switches the transmission and blocking of the light downward from the mirror 22 to turn the exposure on and off. The radon mask 30 and the projection lens 40 are provided inside the optical frame 10. An exposure pattern is formed in the mask 30, and light from the light source unit 20 is irradiated onto the mask 30. The exposure light that has passed through the mask 30 is projected onto the workpiece W by the projection lens 40. [0014] The combination of the light source section 20, the mask 30, and the projection lens 40 is an example of an exposure section corresponding to the present invention. In the optical frame 10, a work stage 50 is provided which holds the work W and moves it in the XYZθ direction. The exposure device 1 also includes a control unit that controls the lighting of the light bulb 21, the ON / OFF of the exposure by the shutter 23, and the movement in the XYZθ direction of the work stage 50. 60. FIG. 2 is a plan view of the structure around the workpiece stage 50 as viewed from above. The direction perpendicular to the paper surface in FIG. 2 is the Z-axis direction in the above-mentioned common coordinate system, the left-right direction in FIG. 2 is the Y-axis direction, and the up-down direction in FIG. 2 is the X-axis direction. [0015] Hereinafter, the structure of the work stage 50 will be described with reference to both of FIG. 1 and FIG. 2. In this embodiment, the workpiece stage 50 is an H-shaped stage. The workpiece stage 50 is provided with a stage machine tool 51 that expands along the XY plane, a Z-axis drive mechanism 52 that supports the stage machine tool 51 on the optical frame 10, and an XYθ on the stage machine tool 51. Directionally movable stage 53. The Z-axis driving mechanism 52 drives (elevates) the stage machine 51 in the Z-axis direction and supports it at an arbitrary height. The workpiece W held on the workpiece stage 50 is moved and held at the position where the exposure pattern generated by the projection lens 40 is focused by the Z-axis driving mechanism 52. [0016] The stage machine 51 is an example of a stage machine corresponding to the present invention, and the movable stage 53 is an example of a movable stage corresponding to the present invention. The Z-axis driving mechanism 52 is an elevator corresponding to the present invention. An example. 2 On the upper surface of the stage machine 51, two fixing guides 54 extending in the Y-axis direction are fixed. Between the two fixed guides 54, a mobile guide 55 is hung on a rack, and a movable stage 53 can be placed on the mobile guide 55. [0017] The moving guide 55 is driven to move in the Y-axis direction on the fixed guide 54 by, for example, an Y-axis driving mechanism 54a, which is an actuator composed of a linear motor. The movable stage 53 is driven to move in the X-axis direction on the moving guide 55 by an X-axis drive mechanism 55a, which is an actuator composed of a linear motor, for example. Accordingly, the movable stage 53 and the workpiece W in the XY plane direction can be moved. The combination of the fixed guide 54, the Y-axis driving mechanism 54a, the moving guide 55, and the X-axis driving mechanism 55a is an example of a mobile machine corresponding to the present invention. The Y-axis driving mechanism 54a and the X-axis driving mechanism 55a are This corresponds to an example of a plurality of moving parts of the present invention. [0018] The two Y-axis driving mechanisms 54a provided on the two fixed guides 54 can be driven in opposite directions to each other, and the moving guide 55 is rotated in the XY plane by this driving. By this rotation in the XY plane, the θ direction of the movable stage 53 and the workpiece W can be realized. The columnar mirror 53 a is fixed in the side surface of the movable stage 53, and the laser length gauge 11 is provided in the inner wall of the optical frame 10. The position of the movable stage 53 is precisely measured by the laser light emitted from the laser length gauge 11 and reflected by the lenticular lens 53a.精度 The positional accuracy of the movable stage 53 and the workpiece W is increasingly demanding high accuracy as the exposure pattern is miniaturized. [0019] However, when the movable stage 53 configured as described above is moved in the XY plane direction (direction on the surface of the workpiece W), a reaction force against the movement occurs and pushes the stage machine 51. The ballast stage machine 51 itself needs to be moved up and down for focusing or the like of the exposure pattern, and is not directly fixed to the optical frame 10 but is supported by the Z-axis drive mechanism 52. Therefore, compared with other members which are directly fixed to the optical frame 10, the rigidity is slightly worse. Therefore, the reaction force for driving the movable stage 53 causes fine vibrations in the XY plane direction of the stage machine 51. . [0020] Although this vibration is attenuated, at the time of the vibration, this vibration may cause disadvantages for high position accuracy exposure. Therefore, in the case where the exposure device 1 of this embodiment forms a pattern in each exposure area by a step & rewind method, after moving the movable stage 53 from a certain area to the next area, it is necessary to wait until the fine vibration is stored. Up to a certain time. Since this standby time is a loss of working time, in this embodiment, a vibration damping buffer 70 is provided to suppress vibration of the stage machine 51 of the optical frame 10 to achieve rapid attenuation of vibration. This vibration damping buffer 70 is an example of a vibration damping buffer corresponding to the present invention. [0021] In this embodiment, one example is provided with four vibration damping buffers 70. Further, in the case of this embodiment, the vibration in the Y-axis direction is suppressed by an anti-mass suppression mechanism having an illustration not shown. One example of each damper 70 is to suppress the vibration in the X-axis direction. . Hereinafter, the structure of the vibration damping buffer 70 will be described in detail. FIG. 3 is a cross-sectional view showing the structure of a vibration damping buffer. The direction perpendicular to the paper surface in FIG. 3 is the X-axis direction of the above-mentioned common coordinate system, the left-right direction in FIG. 3 is the Y-axis direction, and the up-down direction in FIG. 3 is the Z-axis direction. The vibration damping buffer 70 includes a container 71 and an insert 72. For example, the container 71 is fixed to the optical frame 10, and the insert 72 is fixed to the stage machine 51. This container 71 is an example of a container corresponding to the present invention, and the insert 72 is an example of an insert corresponding to the present invention. The container 71 is provided with a receiving groove 73 which is opened on the upper side and has a bottom extending in the X-axis direction on the lower side, and a viscous fluid 74 is filled (accommodated) in the internal space of the receiving groove 73. [0022] A part of the insertion body 72 is a plate portion 75 extending in the X-axis direction. The plate portion 75 is inserted into the viscous fluid 74 through the opening on the upper surface side of the storage groove 73, and is held in a state separated from the inner wall of the storage groove 73. This plate portion 75 is an example of a plurality of plate portions corresponding to the present invention. Since the plate portion 75 is separated from the inner wall of the receiving groove 73, the vibration damping buffer 70 does not support the Z direction of the stage machine 51, but only attenuates the vibration in the workpiece surface direction (actually the X axis direction). Features. [0023] The viscous fluid 74 has a high viscosity at room temperature, for example, 6000 Pa · s (Pa second), and generates high resistance between the insert 72 and the container 71. The vibration damping buffer 70 having the structure in which the receiving groove 73 and the plate portion 75 extend in the X-axis direction is a limited space between the optical frame 10 and the stage machine 51, and can be installed along the stage machine 51 to help For device miniaturization. [0024] FIG. 4 is a diagram showing the principle of viscous resistance.具有 There is a gap h between the wall 101 of the container and the moving object 102, and the gap is a viscous fluid 103 filled with a viscosity μ. The moving object 102 is mainly in contact with the viscous fluid 103 by a surface 102a on the lower side of the figure, and this surface 102a is hereinafter referred to as a resistance surface 102a. The moving object 102 is a case where the wall 101 moves in parallel. The viscous fluid 103 filled in the gap between the moving object 102 and the wall 101 causes viscous resistance that is opposite to the moving direction of the moving object 102. . When the area of the resistance surface 102a is A and the speed of the moving object 102 is V, the resistance F of the viscous resistance occurring at the resistance surface 102a can be obtained by F = μAv / h. [0025] Since the vibration of the stage machine tool 51 of the exposure device 1 can hinder the shortening of the operation time even if the attenuation time is only sub-millisecond, it is preferable that the vibration can be attenuated more quickly. In the realization of such rapid decay, since higher viscous resistance is necessary, an increase in the area A and a decrease in the interval h are expected. In addition, the resistance surface 102a and the moving body 102 are extended along the direction of the suppressed vibration (the X-axis direction in the example in FIG. 3) so that the damping efficiency of the vibration is efficiently operated by the viscous resistance. good. However, the increase in the area A and the decrease in the interval h have an upper limit by securing the rigidity of the vibration damping buffer 70 itself, limiting the installation space, and the like. [0026] There is no particular upper limit for the viscosity μ of the viscous fluid 103, and it is preferable to use the viscous fluid 103 having a higher viscosity μ. If the viscosity μ with sufficient resistance can be obtained even in a realistic device size, room temperature and 5000 Pa · s or more are more preferable. In addition, if the installation space can be secured, a viscous fluid of 1000 Pa · s or more can be optimally used. Such an optimal viscous fluid, such as, for example, high viscosity silicone oil. Return to Figure 3 for continued explanation. The plate portion 75 of the cymbal insert 72 extends in the X-axis direction and also extends in the Z-axis direction. The resistance surface 75 a of the plate portion 75 that mainly receives viscous resistance from the viscous fluid 74 is expanded in the XZ plane. In addition, the front and back sides of the plate portion 75 are the resistance surfaces 75 a, and the surface having the largest area among the surfaces of the plate portion 75 is the resistance surface 75 a. [0027] The vibration generated in the stage machine tool 51 by the reaction force of the movable stage 53 generated by the X-axis drive mechanism 55a is the X-axis direction vibration. The viscous resistance generated by the plate portion 75 extending in the X-axis direction damps such vibration in the X-axis direction with high efficiency. In addition, the vibration plate portion 75 and the resistance surface 75a generated in the stage machine 51 due to the reaction force of the drive are highly viscous to the viscous fluid 74 and the receiving groove 73 at a sufficiently high speed in the X-axis direction. resistance. With such high viscous resistance, the vibration in the X-axis direction is rapidly attenuated. The structure in which the cymbal plate portion 75 expands in the XZ plane direction is a structure that saves space, can obtain a wide resistance surface 75a, and has a large rigidity for the movement in the X-axis direction. Therefore, even if a large resistance is generated, the vibration of the stage machine 51 can be reliably transmitted to the resistance surface 75a, and it can be reliably attenuated by the viscous resistance. [0028] On the other hand, if the drive of the stage machine 51 by the Z-axis drive mechanism 52 is sufficiently smaller than the vibration of the stage machine 51, the viscosity resistance is also small because it is sufficiently small, and is generated by the Z-axis drive mechanism 52. The driving of the stage machine 51 cannot interfere with the vibration damping buffer 70. In addition, since the plate portion 75 also extends in the Z-axis direction, even if the stage machine 51 is driven in the Z-axis direction, the distance between the resistance surface 75a and the inner wall of the receiving groove 73 does not change, and the basic of the damping buffer 70 Performance is maintained. The storage tank 73 has a certain depth, and the filled viscous fluid 74 also has a certain weight. Therefore, even if the plate portion 75 moves up and down as the stage machine 51 moves up and down, the plate portion 75 does not move from The receiving groove 73 and the viscous fluid 74 are separated. [0029] Furthermore, in the present embodiment, a plurality of (one example is two) storage grooves 73 are provided in the container 71 of the vibration damping buffer 70. The plurality of receiving grooves 73 are space-saving structures because they are juxtaposed in a direction (one example of the Y-axis direction) that intersects the resistance surface 75a. These storage tanks 73 are examples of a plurality of storage tanks corresponding to the present invention. The plurality of plate portions 75 are individually inserted into the plurality of receiving grooves 73. As a result, the number of resistance surfaces 75a increases, the total area also increases, and the resistance also increases. [0030] Next, experimental results verifying the performance of the vibration damping buffer 70 will be described. Fig. 5 is a graph showing vibration attenuation in a comparative example in which the vibration damping buffer is removed. Fig. 6 is a graph showing vibration attenuation in the embodiment provided with the vibration damping buffer.图 The vertical axis of Figs. 5 and 6 shows the displacement of vibration by an arbitrary unit, and the horizontal axis shows the time. The thin-line graphs G1 and G2 shown in FIGS. 5 and 6 are actual measured values showing vibrations, and the thick-line graphs G3 and G4 are three-point moving averages. Further, in FIGS. 5 and 6, the attenuation curves T1 and T2 obtained by extracting the envelope curves from the graphs G3 and G4 of the 3-point moving average are shown. The attenuation curves T1 and T2 are displayed. The attenuation state of the amplitude. [0031] In this experiment, similar to the structure of the above-mentioned embodiment, four vibration damping buffers 70 are used around the stage machine 51, and two storage grooves 73 and plates are provided in each vibration damping buffer 70. Device of section 75. The area of the resistance surface is about 70 hundreds square cm per damping buffer, and the gap between the receiving groove 73 and the plate portion 75 is 1 cm or less. (2) If an impact force is applied to the stage machine tool 51 to vibrate, the stage machine tool 51 vibrates at approximately 70 Hz. This vibration is attenuated by the attenuation rate of ζ = 0.03 in the comparative example, and in this embodiment, it is attenuated by the attenuation rate of ζ = 0.065. After 200ms, for example, the vibration wave becomes almost zero. In addition, although the above-mentioned embodiment shows the example which has an H-type stage, the stage machine tool and movable stage of this invention may be a plane stage. Moreover, in the case of an H-shaped stage, the stage machine tool of the present invention does not necessarily have a flat upper surface, and the fixed guide may have a skeleton structure that gradually widens in the plane direction. [0032] In the above embodiment, although the container 71 is fixed to the optical frame 10 and the insert 72 is an example of being fixed to the stage machine 51, the insert and container of the present invention are fixed. In the optical frame 10, the container may be fixed to the stage machine 51. Also, in the above-mentioned embodiment, although the vibration damping damper that attenuates vibration by viscous resistance is exemplified, the vibration damping damper of the present invention may attenuate vibration by pressure resistance. In the above-mentioned embodiment, the vibration damping buffer 70 that suppresses vibration in the X-axis direction is exemplified. However, the vibration damping buffer of the present invention may suppress vibration in the Y-axis direction and may suppress the vibration in the X-axis direction and the Y-axis direction Vibration in the direction where both sides intersect is also possible. Further, the exposure apparatus of the present invention may be provided with a plurality of vibration damping buffers having different directions for suppressing vibration.

[0033][0033]

W‧‧‧工件W‧‧‧ Workpiece

1‧‧‧曝光裝置1‧‧‧Exposure device

10‧‧‧光學框架10‧‧‧ Optical Frame

11‧‧‧雷射測長器11‧‧‧laser length measuring device

20‧‧‧光源部20‧‧‧Light source department

21‧‧‧燈泡21‧‧‧ bulb

22‧‧‧鏡子22‧‧‧Mirror

23‧‧‧擋板23‧‧‧ bezel

24‧‧‧燈泡亮燈裝置24‧‧‧ Bulb lighting device

30‧‧‧遮罩30‧‧‧Mask

40‧‧‧投影透鏡40‧‧‧ projection lens

50‧‧‧工件載台50‧‧‧ Workpiece stage

51‧‧‧載台機床51‧‧‧stage machine

52‧‧‧Z軸驅動機構52‧‧‧Z-axis drive mechanism

53‧‧‧可動載台53‧‧‧ movable carrier

53a‧‧‧柱狀鏡53a‧‧‧Column lens

54‧‧‧固定導件54‧‧‧Fixed guide

54a‧‧‧Y軸驅動機構54a‧‧‧Y-axis drive mechanism

55‧‧‧移動導件55‧‧‧moving guide

55a‧‧‧X軸驅動機構55a‧‧‧X-axis drive mechanism

60‧‧‧控制部60‧‧‧Control Department

70‧‧‧制振緩衝器70‧‧‧ vibration damping buffer

71‧‧‧容器71‧‧‧container

72‧‧‧插入體72‧‧‧ Insert

73‧‧‧收容槽73‧‧‧container

74‧‧‧黏性流體74‧‧‧Viscous fluid

75‧‧‧板部75‧‧‧ Board

75a‧‧‧阻力面75a‧‧‧ resistance surface

101‧‧‧壁101‧‧‧wall

102‧‧‧移動物體102‧‧‧moving objects

102a‧‧‧阻力面102a‧‧‧ resistance surface

103‧‧‧黏性流體103‧‧‧Viscous fluid

[0011]   [第1圖]將本發明的曝光裝置的一實施例中的內部構造從曝光裝置的側方透視的構造圖。   [第2圖]將工件載台周邊的構造從上方所見的俯視圖。   [第3圖]顯示制振緩衝器的構造的剖面圖   [第4圖]顯示黏性阻力的原理的圖。   [第5圖]顯示制振緩衝器被取下的比較例中的振動衰減的圖表。   [第6圖]顯示具備制振緩衝器的實施例中的振動衰減的圖表。[0011] [FIG. 1] A structural view in which the internal structure in one embodiment of the exposure apparatus of the present invention is seen from the side of the exposure apparatus.第 [Fig. 2] A plan view showing the structure around the workpiece stage from above.第 [Fig. 3] A cross-sectional view showing the structure of a vibration damper [Fig. 4] A diagram showing the principle of viscous resistance. [Fig. 5] A graph showing vibration attenuation in a comparative example in which a vibration damping buffer is removed. [Fig. 6] A graph showing vibration attenuation in an embodiment provided with a vibration damping buffer.

Claims (6)

一種曝光裝置,具備:   框架、及   對於前述框架可昇降自如且朝對於昇降方向交叉的面內方向擴大的載台機床、及   被搭載於前述載台機床且朝前述面內方向可移動自如的可動載台、及   對於被載置在前述可動載台的曝光對象將光照射地曝光的曝光部、及   對於前述載台機床將前述可動載台朝前述面內方向移動的移動機、及   將搭載了前述可動載台的前述載台機床對於前述框架昇降的昇降機、及   與前述框架及前述載台機床的雙方連繫且抑制前述載台機床對於前述框架振動的制振緩衝器,   前述制振緩衝器,是具備:   被固定於前述框架及前述載台機床的一方且在內部收容了黏性流體的容器、及   被固定於對於前述一方的另一方,一部分是在與前述容器的內壁非接觸的狀態下被插入前述黏性流體的插入體。An exposure device comprising: a frame, a stage machine tool capable of being raised and lowered freely with respect to the frame, and expanding in an in-plane direction intersecting with the raising and lowering direction, and a movable device mounted on the stage machine tool and freely movable in the plane direction. A stage, an exposure unit that exposes light to an exposure object placed on the movable stage, and a mobile machine that moves the movable stage in the plane direction with respect to the stage machine tool, and A lifter for lifting and lowering the frame by the platform machine tool of the movable platform and a vibration damping buffer connected to both the frame and the platform machine tool and suppressing the vibration of the platform machine to the frame, and the vibration damping buffer It includes: a container fixed to one of the frame and the stage machine and containing a viscous fluid inside, and fixed to the other of the one, part of which is not in contact with the inner wall of the container The insert of the viscous fluid is inserted in a state. 如申請專利範圍第1項的曝光裝置,其中,   前述移動機,是具有對於被包含於前述面內方向的彼此交叉的2個方向成分各別彼此獨立地將前述可動載台移動的複數移動部,   前述插入體,其被插入前述黏性流體的部分,是沿著前述2個方向成分之中的一方延伸的板部。For example, the exposure device according to item 1 of the patent application, wherein the moving machine has a plurality of moving sections for moving the movable stage independently of each other with respect to two directional components crossing each other included in the in-plane direction. The insert is a plate portion extending along one of the two directional components into which the viscous fluid is inserted. 如申請專利範圍第2項的曝光裝置,其中,   前述插入體,其前述板部,是沿著前述2個方向成分之中的一方及前述昇降方向的雙方延伸。For example, the exposure device according to item 2 of the patent application, wherein: the insert, the plate portion thereof extends along one of the two directional components and both sides of the elevating direction. 如申請專利範圍第2項的曝光裝置,其中,   前述容器,是具有:分別將前述黏性流體收容,沿著前述2個方向成分之中對於前述一方的另一方並列的複數收容槽,   前述插入體,是具有個別被插入前述複數收容槽的複數前述板部。For example, the exposure device according to item 2 of the patent application, wherein: the container has a plurality of storage grooves for accommodating the viscous fluid, and is arranged in parallel with the other of the one of the two components along the two directions, 插入 the insertion The body includes a plurality of the plate portions which are individually inserted into the plurality of receiving grooves. 如申請專利範圍第1至4項中任一項的曝光裝置,其中,   前述插入體,其被插入前述黏性流體的部分,是沿著藉由前述制振緩衝器被抑制的前述載台機床的振動的方向延伸的板部。The exposure device according to any one of claims 1 to 4, in which: (i) the aforementioned insert, the part inserted into the viscous fluid, is along the aforementioned stage machine tool which is suppressed by the aforementioned damping buffer; The direction of the plate extends in the direction of vibration. 如申請專利範圍第1至4項中任一項的曝光裝置,其中,   前述黏性流體,是具有1000Pa‧s以上的黏度。For example, the exposure device according to any one of claims 1 to 4, in which the aforementioned viscous fluid has a viscosity of 1,000 Pa · s or more.
TW107100616A 2017-02-02 2018-01-08 Exposure apparatus capable of rapidly attenuating minute vibrations of a stage base TW201832014A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017-017288 2017-02-02
JP2017017288A JP7052197B2 (en) 2017-02-02 2017-02-02 Exposure device

Publications (1)

Publication Number Publication Date
TW201832014A true TW201832014A (en) 2018-09-01

Family

ID=63074998

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107100616A TW201832014A (en) 2017-02-02 2018-01-08 Exposure apparatus capable of rapidly attenuating minute vibrations of a stage base

Country Status (4)

Country Link
JP (1) JP7052197B2 (en)
KR (1) KR20180090199A (en)
CN (1) CN108388084A (en)
TW (1) TW201832014A (en)

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5556774A (en) 1978-10-24 1980-04-25 Ikegami Tsushinki Co Ltd Pickup tube cathode blanking boosting device for television camera
JPS63231028A (en) * 1987-03-19 1988-09-27 Canon Inc Vibration damping device
JPH0642578A (en) * 1992-07-23 1994-02-15 Hitachi Ltd Semi-active vibration proof device, semi-active damper device, semi-active stiffness mechanism device, reduced projection exposure device and its semi-active damping method
JPH06307482A (en) * 1993-04-21 1994-11-01 Canon Inc Viscous damper device
JPH08170990A (en) * 1994-12-19 1996-07-02 Nikon Corp Stage apparatus
JPH10281216A (en) * 1997-04-08 1998-10-23 Hitachi Ltd Support element
JPH11154698A (en) * 1997-11-21 1999-06-08 Nikon Corp Table supporting apparatus
JPH11162828A (en) * 1997-11-21 1999-06-18 Nikon Corp Projection aligner and projection aligning method
JP3554186B2 (en) * 1998-04-08 2004-08-18 キヤノン株式会社 Exposure apparatus, device manufacturing method, and reaction force receiving method
US6953109B2 (en) * 2002-10-08 2005-10-11 Nikon Corporation Vibration isolator with low lateral stiffness
JP5556774B2 (en) * 2011-09-16 2014-07-23 ウシオ電機株式会社 Exposure equipment

Also Published As

Publication number Publication date
CN108388084A (en) 2018-08-10
JP7052197B2 (en) 2022-04-12
KR20180090199A (en) 2018-08-10
JP2018124464A (en) 2018-08-09

Similar Documents

Publication Publication Date Title
US5260580A (en) Stage device for an exposure apparatus and semiconductor device manufacturing method which uses said stage device
JP3810039B2 (en) Stage equipment
JP6319277B2 (en) Exposure apparatus, flat panel display manufacturing method, device manufacturing method, and exposure method
KR20120038394A (en) Exposure apparatus, exposure method, and device manufacturing method
US20110085152A1 (en) Vibration control apparatus, vibration control method, exposure apparatus, and device manufacturing method
TWI474888B (en) Lightning scribing device
TW548708B (en) Support table apparatus, exposure apparatus, and manufacturing method of device
JP2019016801A (en) Object-swapping method, object-swapping system, exposure apparatus, flat-panel display manufacturing method, and device manufacturing method
KR20160100379A (en) Objective lens support device and photoetching machine
TW201832014A (en) Exposure apparatus capable of rapidly attenuating minute vibrations of a stage base
JP7079858B2 (en) Stage equipment, lithography equipment, control units and methods
JPWO2006001282A1 (en) Positioning apparatus, positioning method, exposure apparatus, exposure method, and device manufacturing method
JP2011244608A (en) Linear motor, mobile device, exposure device, device manufacturing method, and flat panel display manufacturing method
JP2012004201A (en) Mobile device, exposure device, device manufacturing method, flat panel display manufacturing method and mobile device control method
CN108369388A (en) Lithographic equipment with active underframe support part
TWI758452B (en) Exposure apparatus, exposure method, manufacturing method of flat panel display, and device manufacturing method
US10522370B2 (en) Substrate processing apparatus
JP4080491B2 (en) Board inspection equipment
JP6015984B2 (en) Object carrying-out method, object exchange method, object holding device, object exchange system, exposure apparatus, flat panel display manufacturing method, and device manufacturing method
KR101582367B1 (en) Processing machine system and method of positioning processing machines
JPS62134930A (en) Mask substrate fixing mechanism
JP2018054962A (en) Object holder, exposure apparatus, flat panel display manufacturing method, device manufacturing method, and object holding method
KR101827282B1 (en) Driving chamber for substrate stage and apparatus for processing substrate having the same
KR20230065896A (en) Wafer processing method
TW201842413A (en) Object replacement device, object processing device, production method for flat panel display, device production method, object replacement method, and object processing method