TW201828395A - Polarizer calibration device and method capable of precisely calibrating the angle between an alignment mark line and a polarizing axis - Google Patents

Polarizer calibration device and method capable of precisely calibrating the angle between an alignment mark line and a polarizing axis Download PDF

Info

Publication number
TW201828395A
TW201828395A TW107101115A TW107101115A TW201828395A TW 201828395 A TW201828395 A TW 201828395A TW 107101115 A TW107101115 A TW 107101115A TW 107101115 A TW107101115 A TW 107101115A TW 201828395 A TW201828395 A TW 201828395A
Authority
TW
Taiwan
Prior art keywords
polarizer
alignment mark
angle
polarizing plate
patent application
Prior art date
Application number
TW107101115A
Other languages
Chinese (zh)
Other versions
TWI656595B (en
Inventor
李玉龍
許琦欣
Original Assignee
大陸商上海微電子裝備(集團)股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 大陸商上海微電子裝備(集團)股份有限公司 filed Critical 大陸商上海微電子裝備(集團)股份有限公司
Publication of TW201828395A publication Critical patent/TW201828395A/en
Application granted granted Critical
Publication of TWI656595B publication Critical patent/TWI656595B/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • G02B5/3025Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1765Method using an image detector and processing of image signal
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9511Optical elements other than lenses, e.g. mirrors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Polarising Elements (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)

Abstract

The present invention provides a polarizer calibration device and method. The polarizer calibration device comprises a light source unit for generating non-polarized collimated light source; a polarizer fastening unit for fastening the polarizer; a detector for detecting an alignment mark of the polarizer; a polarization detection unit disposed below the polarizer fastening unit with a position corresponding to the polarizer; and a working table for carrying the fastening unit of the polarizer and the polarization detection unit for performing a horizontal movement. The polarizer calibration device and method according to the present invention may precisely calibrate the angle between an alignment mark line and a polarizing axis, so as to solve the problem that the angle between the alignment mark line and the polarizing axis may be deviated after experiencing different manufacturing processes.

Description

偏振片標定裝置及方法Polarizer calibration device and method

本發明有關於偏振片標定領域,特別有關於一種偏振片標定裝置及方法。The present invention relates to the field of polarizer calibration, and in particular to a polarizer calibration device and method.

眾所周知,偏振片、玻片、液晶等都具有偏振特性,在光學產品和實驗中都會用到大量的這些帶有偏振特性的元件。這些元件的偏振角度或光軸角度檢測顯得尤為重要。As we all know, polarizers, glass slides, liquid crystals, etc. all have polarization characteristics, and a large number of these components with polarization characteristics are used in optical products and experiments. Detection of the polarization angle or optical axis angle of these elements is particularly important.

如第1圖所示,在一些產品製造過程中,需要使用一種同時有對準標記12和起偏區域11的偏振片,但起偏區域11和對準標記12的製作採用的是兩種完全不同的製程,例如起偏區域11採用的是浸沒干涉光刻製作的線柵,對準標記12採用的是遮罩投影光刻或電子束光刻製作,在經歷了兩次完全不同的製程過程後,對準標記連線14與偏振片偏振軸13之間的夾角Φ是否發生了改變是很難保證也難以測量的,影響到使用該偏振片的產品精度。As shown in Figure 1, in some product manufacturing processes, it is necessary to use a polarizing plate with both an alignment mark 12 and a polarizing area 11; Different processes, such as the use of immersion interference photolithography for the polarized area 11 and mask projection lithography or electron beam lithography for the alignment mark 12 have undergone two completely different process processes. Later, it is difficult to ensure or measure whether the angle Φ between the alignment mark line 14 and the polarization axis 13 of the polarizer is changed, which affects the accuracy of the product using the polarizer.

本發明為了克服習知的問題,提供了一種偏振片標定裝置及方法,以解決偏振片在經歷不同製程後對準標記連線與偏振軸之間的夾角容易發生偏差的問題。In order to overcome the conventional problems, the present invention provides a polarizing plate calibration device and method, so as to solve the problem that the angle between the alignment mark connecting line and the polarization axis is easy to deviate after the polarizing plate undergoes different processes.

為實現上述目的,本發明提供了一種偏振片標定裝置,包括:光源單元,用於產生非偏振准直光源;偏振片固定單元,用於固定偏振片;探測器,用於探測偏振片的對準標記;檢偏單元,設置在偏振片固定單元下方,位置與偏振片對應;以及工作台,用於承載偏振片固定單元和檢偏單元作水平方向運動。To achieve the above object, the present invention provides a polarizer calibration device, including: a light source unit for generating a non-polarized collimated light source; a polarizer fixing unit for fixing a polarizer; and a detector for detecting a pair of polarizers. Quasi-markers; an analyzer unit, which is arranged below the polarizer fixing unit, corresponding to the position of the polarizer; and a table for carrying the polarizer fixing unit and the analyzer unit for horizontal movement.

較佳地,檢偏單元包括檢偏線柵、旋轉電機和光能量探測器,其中,光能量探測器和旋轉電機均安裝在工作台上,檢偏線柵設置在旋轉電機上且能在旋轉電機的帶動下繞豎直方向旋轉。Preferably, the analysis unit includes an analysis wire grid, a rotating electric machine, and a light energy detector, wherein the light energy detector and the rotating electric machine are both installed on a workbench, and the analysis wire grid is disposed on the rotating electric machine and can be connected to the rotating electric machine. Driven by the vertical rotation.

較佳地,光源單元、偏振片及檢偏單元的位置設置為,使得光源單元發出的非偏振准直光能夠依次經過偏振片和檢偏線柵後被光能量探測器接收。Preferably, the positions of the light source unit, the polarizing plate, and the analyzer unit are set so that the non-polarized collimated light emitted by the light source unit can be sequentially received by the light energy detector after passing through the polarizer and the analyzer wire grid.

較佳地,探測器採用對準CCD相機。Preferably, the detector is an aligned CCD camera.

較佳地,偏振片固定單元包括夾持架支撐件和夾持架,偏振片固定安裝在夾持架上,夾持架通過夾持架支撐件安裝在工作台上,夾持架可相對於夾持架支撐件旋轉,使得偏振片能夠至少處於正面朝上的第一位置和正面朝下的第二位置。Preferably, the polarizing plate fixing unit includes a holding frame support and a holding frame, the polarizing plate is fixedly installed on the holding frame, the holding frame is installed on the workbench through the holding frame support, and the holding frame can be opposite to The holder support is rotated so that the polarizer can be in at least a first position facing up and a second position facing down.

較佳地,夾持架設有一個凹槽,偏振片固定在凹槽中,夾持架由透光材料製成。Preferably, the holding frame is provided with a groove, the polarizing plate is fixed in the groove, and the holding frame is made of a light-transmitting material.

較佳地,夾持架支撐件與夾持架的安裝面定義了一基準方向,偏振片標定裝置更包括或連接至一控制器,控制器用於控制工作台將偏振片的對準標記移動至探測器的探測視場內,並根據探測器獲得的對準標記的位置信息計算出基準方向與偏振片的對準標記連線的夾角θ。Preferably, the mounting surface of the holder support and the holder defines a reference direction. The polarizer calibration device further includes or is connected to a controller, and the controller is used to control the table to move the alignment mark of the polarizer to Within the detection field of view of the detector, the angle θ between the reference direction and the alignment mark of the polarizer is calculated based on the position information of the alignment mark obtained by the detector.

較佳地,控制器更用於:控制工作台將偏振片固定單元和檢偏單元移動至與光源單元對應的位置;在偏振片的第一位置和第二位置下,分別控制旋轉電機帶動檢偏線柵旋轉並控制光能量探測器對依次經過偏振片和檢偏線柵的光進行探測;以及根據光能量探測器的探測結果計算出基準方向與偏振片的偏振軸的夾角α。Preferably, the controller is further configured to: control the table to move the polarizer fixing unit and the analyzer unit to positions corresponding to the light source unit; and under the first and second positions of the polarizer, respectively control the rotating motor to drive the detector The polarization grid rotates and controls the light energy detector to detect the light passing through the polarizer and the analyzer in turn; and the angle α between the reference direction and the polarization axis of the polarization plate is calculated according to the detection result of the light energy detector.

較佳地,控制器更用於根據基準方向與偏振片的對準標記連線的夾角θ以及基準方向與偏振片的偏振軸的夾角α計算偏振片的對準標記連線和偏振軸之間的夾角Φ。Preferably, the controller is further configured to calculate an interval between the alignment mark line of the polarizer and the polarization axis based on an included angle θ between the reference direction and the alignment mark of the polarizer and the included angle α of the reference direction and the polarization axis of the polarizer. Angle Φ.

較佳地,工作台包括滑台和直線導軌,滑台安裝在直線導軌上,偏振片固定單元和檢偏單元設置在滑台上。Preferably, the worktable includes a slide table and a linear guide, the slide table is mounted on the linear guide, and the polarizing plate fixing unit and the analyzer are arranged on the slide table.

為了達到上述目的,本發明更提出一種偏振片方向標定方法,採用上述的偏振片方向標定裝置,包括如下步驟:In order to achieve the above object, the present invention further provides a method for calibrating the direction of a polarizer, which uses the above-mentioned device for calibrating a direction of a polarizer and includes the following steps:

步驟1:設定一個基準方向;Step 1: Set a reference direction;

步驟2:測量偏振片的對準標記連線和基準方向之間的夾角θ;Step 2: Measure the angle θ between the alignment mark line of the polarizer and the reference direction;

步驟3:測量偏振片的偏振軸和基準方向之間的夾角α;Step 3: measure the angle α between the polarization axis of the polarizer and the reference direction;

步驟4,根據步驟2和步驟3的結果,計算偏振片的對準標記連線和偏振軸之間的夾角Φ。Step 4. According to the results of steps 2 and 3, calculate the angle Φ between the alignment mark line of the polarizer and the polarization axis.

較佳地,步驟2包括:Preferably, step 2 includes:

步驟21:探測器探測偏振片上其中一個對準標記的信號並計算該對準標記的位置;Step 21: the detector detects a signal of one of the alignment marks on the polarizer and calculates the position of the alignment mark;

步驟22:探測器探測偏振片上另一個對準標記的信號並計算該另一個對準標記的位置;Step 22: the detector detects the signal of another alignment mark on the polarizer and calculates the position of the other alignment mark;

步驟23:根據偏振片上其中一個對準標記和另一個對準標記的位置,計算對準標記連線與基準方向之間的夾角。Step 23: Calculate the angle between the alignment mark line and the reference direction based on the position of one of the alignment marks and the other alignment mark on the polarizer.

較佳地,步驟23包括根據偏振片上其中一個對準標記和另一個對準標記的位置,計算兩個對準標記之間的X方向距離以及Y方向距離,根據該X方向距離和Y方向距離計算對準標記連線與基準方向之間的夾角,其中Y方向為基準方向,X方向為水平面內與Y方向垂直的方向。Preferably, step 23 includes calculating the X-direction distance and the Y-direction distance between the two alignment marks according to the positions of one of the alignment marks and the other alignment mark on the polarizer, and according to the X-direction distance and the Y-direction distance Calculate the angle between the alignment mark line and the reference direction, where the Y direction is the reference direction and the X direction is the direction perpendicular to the Y direction in the horizontal plane.

較佳地,步驟3包括:Preferably, step 3 includes:

步驟31:使光源單元發出的非偏振准直光投射到偏振片表面;Step 31: project the unpolarized collimated light emitted from the light source unit to the surface of the polarizer;

步驟32:檢偏單元中旋轉電機帶動檢偏線柵旋轉,由光能量探測器探測並選取經過檢偏線柵後光強最小時旋轉電機的第一旋轉角度α1;Step 32: The rotation motor in the analysis unit drives the rotation of the detection wire grid, and the light energy detector detects and selects the first rotation angle α1 of the rotation motor when the light intensity is minimum after passing through the detection wire grid;

步驟33:翻轉偏振片,檢偏單元中旋轉電機再次帶動檢偏線柵旋轉,由光能量探測器探測並選取經過檢偏線柵後光強最小時旋轉電機的第二旋轉角度α2;Step 33: flip the polarizer, the rotating motor in the analyzer unit drives the analyzer wire grid to rotate again, and the light energy detector detects and selects the second rotation angle α2 of the rotary motor when the light intensity is minimum after passing through the analyzer wire grid;

步驟34:根據步驟32和步驟33的結果,計算得出偏振片的偏振軸和基準方向之間的夾角α。Step 34: According to the results of steps 32 and 33, an angle α between the polarization axis of the polarizer and the reference direction is calculated.

較佳地,步驟33中,翻轉是指使偏振片從正面朝上變為正面朝下。Preferably, in step 33, flipping means that the polarizing plate is changed from the front side to the front side.

較佳地,步驟32和步驟33中,通過函數擬合經過檢偏線柵後的光強變化,選取經過檢偏線柵後光強最小時旋轉電機的旋轉角度。Preferably, in steps 32 and 33, the light intensity change after passing through the calibration wire grid is fitted by a function, and the rotation angle of the rotating motor is selected when the light intensity after passing through the calibration wire grid is the smallest.

較佳地,函數採用傅裡葉函數。Preferably, the function is a Fourier function.

較佳地,步驟4中通過對對準標記連線和基準方向之間的夾角θ與偏振軸和基準方向之間的夾角α求和,獲取對準標記連線和偏振軸之間的夾角Φ。Preferably, in step 4, the angle θ between the alignment mark line and the polarization axis is obtained by summing the angle θ between the alignment mark line and the reference direction to obtain the angle Φ between the alignment mark line and the reference axis. .

較佳地,步驟2在步驟3之前或者之後執行。Preferably, step 2 is performed before or after step 3.

本發明提供的一種偏振片標定裝置及方法,在原有設備基礎上加入偏振片固定單元、探測器、檢偏單元和工作台控制單元,利用所述偏振片標定方法在使用偏振片之前精確標定出偏振片對準標記連線和偏振軸之間的夾角,解決了偏振片在經歷不同製程後對準標記連線與偏振片偏振軸之間的夾角發生偏差的問題。The polarizer calibration device and method provided by the present invention include a polarizer fixing unit, a detector, an analyzer, and a workbench control unit based on the original equipment. The polarizer calibration method is used to accurately calibrate the polarizer before using the polarizer. The angle between the polarizer alignment mark line and the polarization axis solves the problem that the angle between the polarizer alignment line and the polarization axis of the polarizer deviates after undergoing different processes.

為使本發明的上述目的、特徵和優點能夠更加明顯易懂,下面結合圖式對本發明的實施方式做詳細的說明。需說明的是,本發明圖式均採用簡化的形式且均使用非精准的比例,僅用以方便、明晰地輔助說明本發明實施例的目的。In order to make the foregoing objects, features, and advantages of the present invention more comprehensible, the embodiments of the present invention are described in detail below with reference to the drawings. It should be noted that the drawings of the present invention are in simplified form and use inaccurate proportions, and are only used to facilitate and clearly explain the purpose of the embodiments of the present invention.

如第2圖所示,本發明的偏振片標定裝置包括:As shown in Figure 2, the polarizer calibration device of the present invention includes:

光源單元1,用於產生非偏振准直光源;Light source unit 1 for generating a non-polarized collimated light source;

偏振片固定單元,用於固定偏振片4;A polarizer fixing unit for fixing the polarizer 4;

探測器,用於探測偏振片4上的對準標記,本實施的探測器較佳採用對準CCD相機2;A detector for detecting an alignment mark on the polarizer 4; the detector of this embodiment preferably uses an alignment CCD camera 2;

檢偏單元,設置在偏振片固定單元下方,位置與所述偏振片4對應;An analysis unit is disposed below the polarizer fixing unit, and the position corresponds to the polarizer 4;

以及工作台,用於實現偏振片4和檢偏單元的水平方向運動;所述偏振片固定單元和檢偏單元設置在工作台上。And a worktable for realizing horizontal movement of the polarizing plate 4 and the analysis unit; the polarizing plate fixing unit and the analysis unit are arranged on the worktable.

如第1圖所示,所述偏振片上設有兩個對準標記12和偏振軸13,為示區別,以下將該兩個對準標記12分別稱為第一對準標記16和第二對準標記17。As shown in FIG. 1, the polarizer is provided with two alignment marks 12 and a polarization axis 13. To show the difference, the two alignment marks 12 are hereinafter referred to as a first alignment mark 16 and a second pair, respectively. Quasi-marker 17.

繼續參照第2圖,所述工作台包括直線導軌9和滑台10,所述滑台10安裝在直線導軌9上,具體地,滑台10能在直線導軌9上水平方向滑動,從而帶動偏振片4和檢偏單元作水平方向運動,使偏振片4上的對準標記12能夠進入對準CCD相機2的視場內,使對準CCD相機2獲取對準標記訊號。Continuing to refer to FIG. 2, the table includes a linear guide 9 and a slide table 10. The slide table 10 is mounted on the linear guide 9. Specifically, the slide table 10 can slide horizontally on the linear guide 9 to drive polarization. The plate 4 and the analysis unit are moved in a horizontal direction, so that the alignment mark 12 on the polarizing plate 4 can enter the field of view of the alignment CCD camera 2, and the alignment CCD camera 2 obtains an alignment mark signal.

進一步地,所述偏振片固定單元包括夾持架安裝座3、兩個夾持架支撐柱和夾持架5,所述夾持架5上設有凹槽,所述偏振片4固定安裝在所述凹槽裡;所述夾持架5安裝在夾持架安裝座3上,所述夾持架安裝座3架設在兩個所述夾持架支撐柱上,所述夾持架支撐柱設置在滑台10上。Further, the polarizing plate fixing unit includes a clamping frame mounting base 3, two clamping frame supporting columns, and a clamping frame 5, the clamping frame 5 is provided with a groove, and the polarizing plate 4 is fixedly mounted on the In the groove; the clamping frame 5 is mounted on the clamping frame mounting base 3, the clamping frame mounting base 3 is mounted on two clamping frame supporting columns, and the clamping frame supporting columns Set on the slide table 10.

更進一步地,如第3及4圖所示,所述夾持架安裝座3有一個靠面,具有較高的平面度,所述夾持架5至少有一個側面(夾持架平面18)也有較高的平面度,所述側面(夾持架平面18)和所述靠面緊緊貼合,從而在所述夾持架安裝座3與夾持架5之間形成一安裝面。本發明偏振片方向標定裝置定義了一個基準方向15,本實施例較佳水平方向為基準方向15,例如定義為水平Y軸方向,所述安裝面的延伸方向與基準方向15一致,使得安裝在夾持架5上的偏振片4的偏振軸13與基準方向15形成第一夾角(具有角度值α),見第12圖,並且偏振片4的兩個對準標記連線14與基準方向15形成第二夾角(具有角度值θ)。Furthermore, as shown in Figs. 3 and 4, the holder mounting base 3 has a leaning surface with a high flatness, and the holder 5 has at least one side (the holder plane 18) There is also a high degree of flatness, and the side surface (clamping frame plane 18) and the abutment surface closely fit together to form a mounting surface between the clamping frame mounting seat 3 and the clamping frame 5. The polarizer orientation calibration device of the present invention defines a reference direction 15. The preferred horizontal direction in this embodiment is the reference direction 15, for example, it is defined as the horizontal Y-axis direction. The extension direction of the mounting surface is consistent with the reference direction 15. The polarizing axis 13 of the polarizing plate 4 on the holder 5 forms a first angle (having an angle value α) with the reference direction 15, as shown in FIG. 12, and the two alignment marks 14 and the reference direction 15 of the polarizing plate 4 A second included angle is formed (having an angle value θ).

令水平面內與基準方向15垂直的方向為X軸方向,如第10至13圖所示,所述夾持架5設計為可以帶動偏振片4繞Y軸方向旋轉。具體地,當夾持架5從第12圖所示位置繞Y軸方向旋轉180°後,偏振片4也被帶動繞Y軸方向旋轉了180°,此時,如第13圖所示,偏振軸13與基準方向15的夾角為–α,即偏振軸13相對於基準方向15旋轉了2α角度。The direction perpendicular to the reference direction 15 in the horizontal plane is the X-axis direction. As shown in FIGS. 10 to 13, the holder 5 is designed to drive the polarizing plate 4 to rotate about the Y-axis direction. Specifically, after the holder 5 is rotated 180 ° around the Y-axis direction from the position shown in FIG. 12, the polarizing plate 4 is also driven to rotate 180 ° around the Y-axis direction. At this time, as shown in FIG. 13, the polarization The angle between the axis 13 and the reference direction 15 is −α, that is, the polarization axis 13 is rotated by an angle of 2α relative to the reference direction 15.

本領域具通常知識者容易理解,上述夾持架安裝座3和夾持架支撐柱也可以一體成型為單個部件,並且偏振片4的安裝方式也不僅限於上述實施例,任何可將偏振片4保持於檢偏單元上方且可實現偏振片4翻轉(從正面朝上變為正面朝下)的安裝結構都可用於替代上述偏振片固定單元。Those skilled in the art can easily understand that the above-mentioned clamping frame mounting seat 3 and the clamping frame supporting column can also be integrally formed into a single component, and the installation method of the polarizing plate 4 is not limited to the above embodiment, and any polarizing plate 4 The mounting structure that is maintained above the analysis unit and can realize the flip of the polarizer 4 (from front to top to front to bottom) can be used to replace the above-mentioned polarizer fixing unit.

繼續參照第2圖,所述檢偏單元包括檢偏線柵6、旋轉電機7和光能量探測器(ED)8,所述光能量探測器8安裝在滑台10上,所述旋轉電機7例如是一環形電機,設置在光能量探測器8的外周且安裝在滑台10上,所述檢偏線柵6架設在旋轉電機7上,即檢偏線柵6僅外圍部分支撐在旋轉電機7上,中央部分不受支撐,並且檢偏線柵6和光能量探測器8位置相對應。具體地,旋轉電機7可繞豎直Z軸轉動,並帶動檢偏線柵6一起繞Z軸轉動,從而改變檢偏線柵6的光柵方向與偏振片4的偏振軸13之間的夾角。同時,光能量探測器8獲取檢偏線柵6旋轉過程中光源單元1發出的光依次經過偏振片4和檢偏線柵6後的光強訊息,該光強訊息與檢偏線柵6的光柵方向與偏振片4的偏振軸13之間的夾角相關。Continuing to refer to FIG. 2, the analysis unit includes an analysis wire grid 6, a rotary electric machine 7, and a light energy detector (ED) 8. The light energy detector 8 is mounted on a slide table 10. The rotary electric machine 7 is, for example, It is a ring-shaped motor, which is arranged on the outer periphery of the light energy detector 8 and is mounted on the slide table 10. The calibration wire grid 6 is mounted on the rotary electric machine 7, that is, only the peripheral portion of the calibration wire grid 6 is supported on the rotary electric machine 7. In the upper part, the central part is not supported, and the position of the detection wire grid 6 and the light energy detector 8 correspond to each other. Specifically, the rotating electric machine 7 can rotate about the vertical Z axis and drive the analyzer wire grid 6 to rotate about the Z axis together, thereby changing the angle between the grating direction of the analyzer wire grid 6 and the polarization axis 13 of the polarizer 4. At the same time, the light energy detector 8 obtains the light intensity information of the light emitted from the light source unit 1 during the rotation of the analyzer wire grid 6 after passing through the polarizer 4 and the analyzer wire grid 6 in sequence. The grating direction is related to the included angle between the polarization axes 13 of the polarizer 4.

本領域具通常知識者容易理解,為了使光源單元1發出的光能夠經由偏振片4照射到檢偏線柵6上,所述夾持架5較佳採用透光材料製成,或者採用環狀結構,以便透過偏振片4中央部分的光能夠基本不受影響地入射至檢偏線柵6。此外,所述光源單元1發出的光較佳垂直(沿Z軸方向)入射至偏振片4表面。Those skilled in the art can easily understand that, in order to allow the light emitted from the light source unit 1 to be irradiated onto the analyzer wire grid 6 through the polarizing plate 4, the clamping frame 5 is preferably made of a light-transmitting material or a ring shape. The structure is such that the light transmitted through the central portion of the polarizing plate 4 can be incident on the analyzer wire grid 6 substantially unaffected. In addition, the light emitted by the light source unit 1 is preferably incident on the surface of the polarizing plate 4 vertically (along the Z-axis direction).

本領域具通常知識者更容易理解,上述光源單元1、偏振片固定單元、探測器、檢偏單元以及工作台中的一個或多個可由控制器進行控制,所述控制器可集成於相應的部件中或者通過外接方式連接,可分別設置也可以共用一個總的控制器。對探測器獲取的數據的處理,和/或對檢偏單元獲取的數據的處理,也可採用所述控制器來實現,或者通過其他處理設備來進行處理。由於這些都屬於本領域所熟知且容易實現的方式,對此不一一列舉。It is easier for those with ordinary knowledge in the art to understand that one or more of the light source unit 1, the polarizer fixing unit, the detector, the analyzer, and the workbench can be controlled by a controller, and the controller can be integrated in the corresponding component. In the middle or through external connection, you can set up or share a total controller. The processing of the data obtained by the detector and / or the processing of the data obtained by the analysis unit may also be implemented by the controller, or processed by other processing equipment. Since these are well-known and easy to implement methods in the art, they are not listed one by one.

本實施例更提供一種偏振片方向標定方法,如第5圖所示,具體包括:This embodiment further provides a method for calibrating the direction of a polarizer. As shown in FIG. 5, the method specifically includes:

第一步,設定一個基準方向15,本實施例較佳水平Y方向為基準方向15。In the first step, a reference direction 15 is set. In this embodiment, the horizontal Y direction is preferably the reference direction 15.

第二步,測量並計算偏振片上對準標記連線14和基準方向15之間的夾角,如第6圖所示,具體如下:In the second step, the angle between the alignment mark line 14 and the reference direction 15 on the polarizer is measured and calculated, as shown in Fig. 6, as follows:

如第3及7圖所示,沿X方向移動滑台10,使第一對準標記16進入對準CCD相機2的對準視場,對準CCD相機2獲取第一對準標記16訊號,並通過數字圖像處理算法計算出第一對準標記16在對準CCD相機2感光面上的位置;As shown in FIGS. 3 and 7, the slide table 10 is moved in the X direction so that the first alignment mark 16 enters the alignment field of view of the CCD camera 2, and the CCD camera 2 is aligned to obtain the signal of the first alignment mark 16. The position of the first alignment mark 16 on the photosensitive surface of the alignment CCD camera 2 is calculated by a digital image processing algorithm;

繼續沿X方向移動滑台10,使第二對準標記17進入CCD2的對準視場,對準CCD相機2獲取第二對準標記17訊號,並通過數字圖像處理算法計算出第二對準標記17在對準CCD相機2感光面上的位置;在本實施例中,所述對準CCD相機2的對準視場的大小(Y向可測範圍)大於第一對準標記16與第二對準標記17之間的Y向距離。Continue to move the slide table 10 in the X direction so that the second alignment mark 17 enters the alignment field of view of the CCD2, and align the CCD camera 2 to obtain the signal of the second alignment mark 17 and calculate the second pair through the digital image processing algorithm The position of the quasi mark 17 on the photosensitive surface of the alignment CCD camera 2; in this embodiment, the size of the alignment field of view of the alignment CCD camera 2 (the measurable range in the Y direction) is larger than that of the first alignment mark 16 and The Y-direction distance between the second alignment marks 17.

繼續參照第7圖,計算第一對準標記16和第二對準標記17的X方向距離為L1,第一對準標記16和第二對準標記17的Y方向距離為L2,則獲得對準標記連線14和基準方向15之間的夾角。Continuing to refer to FIG. 7, calculate the X-direction distance of the first alignment mark 16 and the second alignment mark 17 as L1, and the Y-direction distance of the first alignment mark 16 and the second alignment mark 17 as L2. The angle between the quasi-marking line 14 and the reference direction 15.

第三步,測量偏振軸13與基準方向15之間的夾角,如第8圖所示,具體如下:In the third step, the angle between the polarization axis 13 and the reference direction 15 is measured, as shown in Fig. 8, as follows:

打開光源單元1,產生非偏振准直光源垂直入射至偏振片4表面;Turn on the light source unit 1 to generate a non-polarized collimated light source perpendicularly incident on the surface of the polarizer 4;

啟動旋轉電機7帶動檢偏線柵6旋轉,同步的,光能量探測器8採集經過檢偏線柵6後的光強,如第9圖所示,根據馬呂斯定律,光強隨檢偏線柵6旋轉的角度呈現出正弦變化,用函數擬合該正弦曲線,本實施例較佳使用傅裡葉函數,計算出光強最小處時旋轉電機7旋轉的角度為α1;Start the rotary motor 7 to drive the analyzer wire grid 6 to rotate. In synchronization, the light energy detector 8 collects the light intensity after passing through the analyzer wire grid 6, as shown in Figure 9. According to Marius's law, the light intensity changes with the analyzer. The rotation angle of the wire grid 6 exhibits a sinusoidal change. The function is used to fit the sine curve. In this embodiment, a Fourier function is preferably used to calculate the rotation angle of the rotary motor 7 when the light intensity is minimum.

旋轉電機7回零;Rotating motor 7 return to zero;

如第10至13圖所示,將夾持架5繞Y軸旋轉180°,則偏振片4被帶動繞Y軸旋轉180°,偏振軸13與基準方向15的夾角變為-α,即偏振軸13發生了2α的改變;As shown in Figures 10 to 13, if the holder 5 is rotated 180 ° about the Y axis, the polarizer 4 is driven to rotate 180 ° about the Y axis, and the angle between the polarization axis 13 and the reference direction 15 becomes -α, which is polarization Axis 13 changed by 2α;

再一次啟動旋轉電機7帶動檢偏線柵6旋轉,同步的,光能量探測器8採集經過檢偏線柵6後的光強,根據馬呂斯定律,光強隨檢偏線柵6旋轉的角度呈現出正弦變化,如第9圖所示,用合適函數擬合該正弦曲線,這裡較佳使用傅裡葉函數,計算出光強最小處時旋轉電機7旋轉的角度為α2;Once again, the rotary motor 7 is started to drive the detection wire grid 6 to rotate. In a synchronous manner, the light energy detector 8 collects the light intensity after passing through the detection wire grid 6. According to Marius's law, the light intensity rotates with the detection wire grid 6 The angle exhibits a sinusoidal change. As shown in FIG. 9, a suitable function is used to fit the sine curve. Here, it is preferable to use a Fourier function to calculate the rotation angle of the rotary motor 7 when the light intensity is minimum at α2;

獲得偏振軸13的方向的改變量為α2-α1;To obtain the amount of change in the direction of the polarization axis 13 as α2-α1;

最後計算得出偏振軸13與基準方向15之間的夾角為α=(α2-α1)/2。採用旋轉電機7兩次旋轉角度的差值來計算夾角α,可以免去對旋轉電機7零位(0度位置)的校準,更能抵消測量誤差,從而提高測量精度。Finally, the angle between the polarization axis 13 and the reference direction 15 is calculated as α = (α2-α1) / 2. The difference between the two rotation angles of the rotating electric machine 7 is used to calculate the included angle α, which can eliminate the calibration of the zero position (0 degree position) of the rotating electric machine 7, and can more accurately offset the measurement error, thereby improving the measurement accuracy.

第四步,根據上述第二步和第三步的結果,計算對準標記連線14和偏振軸13之間的夾角,具體如下:In the fourth step, the angle between the alignment mark line 14 and the polarization axis 13 is calculated based on the results of the second and third steps, as follows:

對上述對準標記連線14和基準方向15之間的夾角θ與上述偏振軸13和基準方向15之間的夾角α求和,即對準標記連線14和偏振軸13之間的夾角Φ=θ+α,這裡的Φ單次標定精度達到0.01。Sum the angle θ between the alignment mark line 14 and the reference direction 15 and the angle α between the polarization axis 13 and the reference direction 15, that is, the angle Φ between the alignment mark line 14 and the polarization axis 13 = θ + α, where the single calibration accuracy of Φ is 0.01.

通過上述方法,即可方便、準確地測量出偏振片4的對準標記連線14和偏振軸13之間的夾角。Through the above method, the angle between the alignment mark line 14 of the polarizing plate 4 and the polarization axis 13 can be conveniently and accurately measured.

本領域具通常知識者應當理解,上述實施例的描述順序不應對上述方法的步驟執行順序造成限制,例如,第二步中也可先使第二對準標記17進入對準CCD相機2的對準視場,再使第一對準標記16進入對準CCD相機2的對準視場,夾角θ的計算公式不變。再例如,第二步也可以在第三步之後執行,即先求出夾角α再求出夾角θ。只要能夠最終求得Φ,上述方法中的各步驟及各步驟中的子步驟的順序都可靈活調整。Those skilled in the art should understand that the description order of the above embodiments should not limit the execution order of the steps of the above method. For example, in the second step, the second alignment mark 17 may be first entered into the alignment of the CCD camera 2. In the quasi-field of view, the first alignment mark 16 is brought into the alignment field of view of the CCD camera 2 again, and the calculation formula of the included angle θ is unchanged. As another example, the second step may be performed after the third step, that is, firstly, the angle α is obtained, and then the angle θ is obtained. As long as Φ can be finally obtained, the order of each step in the above method and the sub-steps in each step can be flexibly adjusted.

顯然,本領域的具通常知識者可以對發明進行各種改動和變型而不脫離本發明的精神和範圍。這樣,倘若本發明的這些修改和變型屬於本發明申請專利範圍及其等同技術的範圍之內,則本發明也意圖包括這些改動和變型在內。Obviously, those skilled in the art can make various modifications and variations to the invention without departing from the spirit and scope of the invention. In this way, if these modifications and variations of the present invention fall within the scope of the patent application for the present invention and the scope of equivalent technologies, the present invention also intends to include these modifications and variations.

1‧‧‧光源單元1‧‧‧light source unit

10‧‧‧滑台10‧‧‧Slide

11‧‧‧起偏區域11‧‧‧from the partial area

12‧‧‧對準標記12‧‧‧ alignment mark

13‧‧‧偏振軸13‧‧‧ polarization axis

14‧‧‧對準標記連線14‧‧‧ alignment mark connection

15‧‧‧基準方向15‧‧‧ reference direction

16‧‧‧第一對準標記16‧‧‧ First alignment mark

17‧‧‧第二對準標記17‧‧‧Second alignment mark

18‧‧‧夾持架平面18‧‧‧ flat plane

2‧‧‧對準CCD相機2‧‧‧ aimed at CCD camera

3‧‧‧夾持架安裝座3‧‧‧ Clamping Frame Mount

4‧‧‧偏振片4‧‧‧ Polarizer

5‧‧‧夾持架5‧‧‧ clamping frame

6‧‧‧檢偏線柵6‧‧‧Analysis wire grid

7‧‧‧旋轉電機7‧‧‧ rotating motor

8‧‧‧光能量探測器8‧‧‧ Light Energy Detector

9‧‧‧直線導軌9‧‧‧ linear guide

第1圖為偏振片上偏振軸和對準標記夾角示意圖。 第2圖為本發明偏振片標定裝置示意圖。 第3圖為本發明夾持架截面示意圖。 第4圖為本發明夾持架安裝座和夾持架之間位置關係截面示意圖。 第5圖為本發明偏振軸和對準標記連線夾角標定方法示意圖。 第6圖為本發明對準標記連線與基準方向夾角標定流程圖。 第7圖為本發明對準標記連線與基準方向夾角示意圖。 第8圖為本發明偏振軸和基準方向夾角標定流程圖。 第9圖為本發明旋轉電機旋轉角度和光強變化示意圖。 第10圖為本發明偏振片相對於Y軸0°時示意圖。 第11圖為本發明偏振片相對於Y軸旋轉180°後示意圖。 第12圖為本發明偏振片相對於Y軸0°時偏振軸與基準方向夾角示意圖。 第13圖為本發明偏振片相對於Y軸旋轉180°後偏振軸與基準方向的夾角示意圖。Figure 1 is a schematic diagram of the angle between the polarization axis and the alignment mark on the polarizer. Figure 2 is a schematic diagram of a polarizer calibration device according to the present invention. Fig. 3 is a schematic cross-sectional view of a clamping frame according to the present invention. FIG. 4 is a schematic cross-sectional view of the positional relationship between the clamping frame mounting seat and the clamping frame according to the present invention. FIG. 5 is a schematic diagram of a method for calibrating an included angle between a polarization axis and an alignment mark of the present invention. FIG. 6 is a flowchart of calibrating the angle between the alignment mark line and the reference direction according to the present invention. FIG. 7 is a schematic diagram of the included angle between the alignment mark line and the reference direction of the present invention. Fig. 8 is a flowchart of the calibration of the angle between the polarization axis and the reference direction of the present invention. FIG. 9 is a schematic diagram of changes in the rotation angle and light intensity of the rotating electric machine according to the present invention. FIG. 10 is a schematic diagram of the polarizer of the present invention at 0 ° with respect to the Y axis. FIG. 11 is a schematic diagram of the polarizer of the present invention after being rotated 180 ° with respect to the Y axis. FIG. 12 is a schematic diagram of the included angle between the polarization axis and the reference direction when the polarizer of the present invention is 0 ° with respect to the Y axis. FIG. 13 is a schematic diagram of the included angle between the polarization axis and the reference direction after the polarizer of the present invention is rotated 180 ° with respect to the Y axis.

Claims (19)

一種偏振片標定裝置,其包括: 光源單元,用於產生非偏振准直光源; 偏振片固定單元,用於固定偏振片; 探測器,用於探測該偏振片的對準標記; 檢偏單元,設置在該偏振片固定單元下方,位置與該偏振片對應;以及 工作台,用於承載該偏振片固定單元和該檢偏單元作水平方向運動。A polarizer calibration device includes: a light source unit for generating a non-polarized collimated light source; a polarizer fixing unit for fixing a polarizer; a detector for detecting an alignment mark of the polarizer; an analyzer unit, The polarizer is arranged below the polarizer fixing unit at a position corresponding to the polarizer; and a table is used for carrying the polarizer fixing unit and the analyzer unit for horizontal movement. 如申請專利範圍第1項所述之偏振片標定裝置,其中該檢偏單元包括檢偏線柵、旋轉電機和光能量探測器,其中,該光能量探測器和該旋轉電機均安裝在該工作台上,該檢偏線柵設置在該旋轉電機上且能在該旋轉電機的帶動下繞豎直方向旋轉。The polarizing plate calibration device according to item 1 of the scope of patent application, wherein the analyzer includes an analyzer wire grid, a rotating electric machine, and a light energy detector, and the light energy detector and the rotating electric machine are both installed on the workbench. On the other hand, the detection wire grid is arranged on the rotary electric machine and can be rotated in a vertical direction by the rotary electric machine. 如申請專利範圍第2項所述之偏振片標定裝置,其中該光源單元、該偏振片及該檢偏單元的位置設置為,使得該光源單元發出的非偏振准直光能夠依次經過該偏振片和該檢偏線柵後被該光能量探測器接收。The polarizing plate calibration device as described in item 2 of the scope of patent application, wherein the positions of the light source unit, the polarizing plate, and the analyzer unit are set so that non-polarized collimated light emitted by the light source unit can pass through the polarizing plate in order. And the detection wire grid is received by the light energy detector. 如申請專利範圍第1至3項中之任一項所述之偏振片標定裝置,其中該探測器採用對準CCD相機。The polarizing plate calibration device according to any one of claims 1 to 3, wherein the detector uses an aligned CCD camera. 如申請專利範圍第1至3項中之任一項所述之偏振片標定裝置,其中該偏振片固定單元包括夾持架支撐件和夾持架,該偏振片固定安裝在該夾持架上,該夾持架通過該夾持架支撐件安裝在該工作台上,該夾持架可相對於該夾持架支撐件旋轉,使得該偏振片能夠至少處於正面朝上的第一位置和正面朝下的第二位置。The polarizer calibration device according to any one of claims 1 to 3, wherein the polarizer fixing unit includes a holder support and a holder, and the polarizer is fixedly mounted on the holder , The clamping frame is mounted on the table through the clamping frame support, and the clamping frame can be rotated relative to the clamping frame support, so that the polarizer can be at least in a first position and a front side facing up Point down to the second position. 如申請專利範圍第5項所述之偏振片標定裝置,其中該夾持架設有一個凹槽,該偏振片固定在該凹槽中,該夾持架由透光材料製成。The polarizing plate calibration device according to item 5 of the scope of the patent application, wherein the holder is provided with a groove, the polarizer is fixed in the groove, and the holder is made of a light-transmitting material. 如申請專利範圍第5項所述之偏振片標定裝置,其中該夾持架支撐件與該夾持架的安裝面定義了一基準方向,該偏振片標定裝置更包括或連接至一控制器,該控制器用於: 控制該工作台將該偏振片的對準標記移動至該探測器的探測視場內,並根據該探測器獲得的對準標記的位置訊息計算出該基準方向與該偏振片的對準標記連線的夾角θ。According to the polarizing plate calibration device described in item 5 of the scope of patent application, wherein the holding frame support member and the mounting surface of the holding frame define a reference direction, the polarizing plate calibration device further includes or is connected to a controller, The controller is configured to: control the table to move the alignment mark of the polarizer into the detection field of view of the detector, and calculate the reference direction and the polarizer according to the position information of the alignment mark obtained by the detector. The angle θ of the alignment line of the alignment mark. 如申請專利範圍第7項所述之偏振片標定裝置,其中該控制器更用於: 控制該工作台將該偏振片固定單元和該檢偏單元移動至與該光源單元對應的位置; 在該偏振片的該第一位置和該第二位置下,分別控制旋轉電機帶動檢偏線柵旋轉並控制光能量探測器對依次經過偏振片和檢偏線柵的光進行探測;以及 根據光能量探測器的探測結果計算出該基準方向與該偏振片的偏振軸的夾角α。The polarizing plate calibration device according to item 7 of the scope of patent application, wherein the controller is further configured to: control the table to move the polarizing plate fixing unit and the analyzer unit to positions corresponding to the light source unit; At the first position and the second position of the polarizing plate, respectively controlling the rotating electrical machine to drive the detection wire grid to rotate and control the light energy detector to detect the light passing through the polarizing plate and the detection wire grid in sequence; and according to the light energy detection The detection result of the polarizer calculates the angle α between the reference direction and the polarization axis of the polarizer. 如申請專利範圍第8項所述之偏振片標定裝置,其中該控制器更用於根據該基準方向與該偏振片的對準標記連線的夾角θ以及該基準方向與該偏振片的偏振軸的夾角α計算該偏振片的對準標記連線和偏振軸之間的夾角Φ。The polarizing plate calibration device according to item 8 of the scope of patent application, wherein the controller is further configured to: according to an angle θ between a line connecting the reference direction and the alignment mark of the polarizing plate; The angle α between the alignment mark line of the polarizer and the polarization axis is calculated. 如申請專利範圍第1項所述之偏振片標定裝置,其中該工作台包括滑台和直線導軌,該滑台安裝在直線導軌上,該偏振片固定單元和該檢偏單元設置在滑台上。The polarizing plate calibration device according to item 1 of the scope of patent application, wherein the table includes a slide table and a linear guide, the slide table is mounted on the linear guide, and the polarizer fixing unit and the analyzer are disposed on the slide table. . 一種偏振片標定方法,採用如申請專利範圍第1至10項中之任一項所述之偏振片標定裝置,該偏振片標定方法包括如下步驟: 步驟1:設定一個基準方向; 步驟2:測量偏振片的對準標記連線和基準方向之間的夾角θ; 步驟3:測量偏振片的偏振軸和基準方向之間的夾角α;以及 步驟4,根據該步驟2和該步驟3的結果,計算偏振片的對準標記連線和偏振軸之間的夾角Φ。A polarizing plate calibration method using the polarizing plate calibration device described in any one of claims 1 to 10 of the patent application scope. The polarizing plate calibration method includes the following steps: Step 1: Set a reference direction; Step 2: Measure The angle θ between the alignment mark line of the polarizer and the reference direction; step 3: measuring the angle α between the polarization axis of the polarizer and the reference direction; and step 4, according to the results of step 2 and step 3, Calculate the angle Φ between the alignment mark line of the polarizer and the polarization axis. 如申請專利範圍第11項所述之偏振片標定方法,其中該步驟2包括: 步驟21:探測器探測偏振片上其中一個對準標記的訊號並計算該對準標記的位置; 步驟22:探測器探測偏振片上另一個對準標記的訊號並計算另一個該對準標記的位置;以及 步驟23:根據偏振片上其中一個對準標記和另一個對準標記的位置,計算對準標記連線與基準方向之間的夾角。The method for calibrating a polarizer as described in item 11 of the patent application scope, wherein step 2 includes: Step 21: The detector detects a signal of one of the alignment marks on the polarizer and calculates the position of the alignment mark; Step 22: The detector Detecting the signal of another alignment mark on the polarizer and calculating the position of another alignment mark; and step 23: calculating the alignment mark line and the reference based on the positions of one alignment mark and the other alignment mark on the polarizer The angle between the directions. 如申請專利範圍第12項所述之偏振片標定方法,其中該步驟23包括: 根據偏振片上其中一個對準標記和另一個對準標記的位置,計算兩個對準標記之間的X方向距離以及Y方向距離,根據該X方向距離和該Y方向距離計算對準標記連線與基準方向之間的夾角,其中Y方向為該基準方向,X方向為水平面內與該Y方向垂直的方向。The method for calibrating a polarizer as described in item 12 of the patent application scope, wherein step 23 includes: calculating the X-direction distance between the two alignment marks according to the position of one of the alignment marks and the other alignment mark on the polarizer. And the distance in the Y direction, the angle between the alignment mark line and the reference direction is calculated according to the distance in the X direction and the distance in the Y direction, where the Y direction is the reference direction and the X direction is a direction perpendicular to the Y direction in the horizontal plane. 如申請專利範圍第11項所述之偏振片標定方法,其中該步驟3包括: 步驟31:使光源單元發出的非偏振准直光投射到偏振片表面; 步驟32:檢偏單元中旋轉電機帶動檢偏線柵旋轉,由光能量探測器探測並選取經過檢偏線柵後光強最小時旋轉電機的第一旋轉角度α1; 步驟33:翻轉偏振片,檢偏單元中旋轉電機再次帶動檢偏線柵旋轉,由光能量探測器探測並選取經過檢偏線柵後光強最小時旋轉電機的第二旋轉角度α2; 步驟34:根據該步驟32和該步驟33的結果,計算得出偏振片的偏振軸和基準方向之間的夾角α。The method for calibrating a polarizer according to item 11 of the scope of patent application, wherein step 3 includes: step 31: projecting non-polarized collimated light from the light source unit onto the surface of the polarizer; step 32: driven by a rotating motor in the analyzer unit The detection grid rotates, and the light energy detector detects and selects the first rotation angle α1 of the rotating motor when the light intensity is minimum after passing through the detection grid. Step 33: Turn the polarizer, and the rotating motor in the detection unit drives the detection again. The wire grid rotates, and the light energy detector detects and selects the second rotation angle α2 of the rotary electric machine when the light intensity after the detection grid is minimized. Step 34: According to the results of step 32 and step 33, a polarizer is calculated. The angle α between the polarization axis and the reference direction. 如申請專利範圍第14項所述之偏振片標定方法,其中該步驟33中,翻轉是指使偏振片從正面朝上變為正面朝下。The method for calibrating a polarizing plate as described in item 14 of the scope of the patent application, wherein in step 33, flipping means that the polarizing plate is changed from the front side to the front side. 如申請專利範圍第14項所述之偏振片標定方法,其中該步驟32和該步驟33中,通過函數擬合經過檢偏線柵後的光強變化,選取經過檢偏線柵後光強最小時旋轉電機的旋轉角度。The calibration method of the polarizer as described in item 14 of the scope of the patent application, wherein in step 32 and step 33, the light intensity change after passing through the calibration wire grid is fitted by a function, and the light intensity after passing through the calibration wire grid is selected. Rotation angle of the rotary motor. 如申請專利範圍第16項所述之偏振片標定方法,其中該函數採用傅裡葉函數。The calibration method of a polarizer according to item 16 of the scope of the patent application, wherein the function uses a Fourier function. 如申請專利範圍第11項所述之偏振片標定方法,其中該步驟4中通過對該對準標記連線和基準方向之間的夾角θ與該偏振軸和基準方向之間的夾角α求和,獲取對準標記連線和偏振軸之間的夾角Φ。The method for calibrating a polarizer as described in item 11 of the scope of patent application, wherein in step 4, the angle θ between the alignment mark line and the reference direction and the angle α between the polarization axis and the reference direction are summed up. To obtain the angle Φ between the alignment mark line and the polarization axis. 如申請專利範圍第11項所述之偏振片標定方法,其中該步驟2在該步驟3之前或者之後執行。The method for calibrating a polarizer as described in item 11 of the scope of patent application, wherein step 2 is performed before or after step 3.
TW107101115A 2017-01-17 2018-01-11 Polarizer calibration device and method TWI656595B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
??201710036210.X 2017-01-17
CN201710036210.XA CN108318222B (en) 2017-01-17 2017-01-17 Polaroid calibration device and method

Publications (2)

Publication Number Publication Date
TW201828395A true TW201828395A (en) 2018-08-01
TWI656595B TWI656595B (en) 2019-04-11

Family

ID=62891691

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107101115A TWI656595B (en) 2017-01-17 2018-01-11 Polarizer calibration device and method

Country Status (3)

Country Link
KR (1) KR102018908B1 (en)
CN (1) CN108318222B (en)
TW (1) TWI656595B (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109166474B (en) 2018-10-10 2021-08-31 京东方科技集团股份有限公司 Display module and laminating precision detection method
CN109633949B (en) * 2019-02-15 2021-07-23 深圳市华星光电半导体显示技术有限公司 Polaroid attaching machine and alignment method thereof
CN109817092A (en) * 2019-03-21 2019-05-28 京东方科技集团股份有限公司 A kind of polaroid alignment device and alignment method
CN111323857A (en) * 2020-03-01 2020-06-23 华中科技大学 Polarization-related super-surface structure, element and thermal radiation information loading method
CN111562091A (en) * 2020-06-23 2020-08-21 昆山鸿仕达智能科技有限公司 Method and device for measuring azimuth angle of polarizing axis
CN115083957A (en) * 2022-05-24 2022-09-20 睿励科学仪器(上海)有限公司 Method and device for rotating wafer

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1027746A (en) * 1996-07-11 1998-01-27 Nikon Corp Alignment method and aligner
JP2003148930A (en) * 2001-11-15 2003-05-21 Nikon Corp Substrate inspection device
KR100734749B1 (en) * 2005-03-31 2007-07-03 에버테크노 주식회사 Polarizing Film Inspecting Apparatus and Method
CN100451557C (en) * 2006-07-07 2009-01-14 中国科学院长春光学精密机械与物理研究所 A semi-circle absolute type polarization angle sensor
JP5061525B2 (en) * 2006-08-04 2012-10-31 株式会社日立製作所 Imprint method and imprint apparatus
CN101135860B (en) * 2007-09-04 2010-05-19 上海微电子装备有限公司 Light scribing device and Aligning system and aligning method used for light scribing device
CN101430272B (en) * 2008-12-22 2010-08-11 浙江大学 Electro-optical polarization spectrometry microscope
CN101576715B (en) * 2009-06-23 2011-05-04 芯硕半导体(中国)有限公司 Calibration method for microscopic imaging systems
CN101943630B (en) * 2009-07-08 2012-03-07 中国科学院半导体研究所 Method for analyzing polarization-maintaining characteristic of optical element
JP5446644B2 (en) * 2009-09-15 2014-03-19 王子ホールディングス株式会社 Bonding angle measuring device for elliptical polarizing plate
CN101915661A (en) * 2010-09-03 2010-12-15 无锡市奥达光电子有限责任公司 Method and device for detecting optical axis angle of polarization property component
CN102073324B (en) * 2010-12-29 2013-05-15 哈尔滨工业大学 Linearly polarized light-based polarization tracking method
CN102798463B (en) * 2011-06-30 2015-02-04 深圳光启高等理工研究院 Method and system for displaying light intensity of polarized light
KR20140075431A (en) * 2012-12-11 2014-06-19 삼성디스플레이 주식회사 Alignment device and method of aligning an object
CN103267629B (en) * 2013-06-25 2015-04-15 中国科学院上海光学精密机械研究所 Point-diffraction interference wave aberration measuring instrument and measuring method thereof
CN103558157B (en) * 2013-11-19 2015-10-28 上海理工大学 Based on digital robotization optical rotational activity spectrum instrument and the method for testing of DSP
CN104950584B (en) * 2014-03-25 2018-01-30 上海微电子装备(集团)股份有限公司 Imaging is to Barebone
KR20160033864A (en) * 2014-09-18 2016-03-29 디아이티 주식회사 polarizer for optical alignment and preparing method for the same
CN205808676U (en) * 2016-07-23 2016-12-14 马忠杰 A kind of polaroid shakes direction detection instrument thoroughly

Also Published As

Publication number Publication date
KR102018908B1 (en) 2019-09-05
CN108318222A (en) 2018-07-24
CN108318222B (en) 2020-04-10
KR20180084683A (en) 2018-07-25
TWI656595B (en) 2019-04-11

Similar Documents

Publication Publication Date Title
TWI656595B (en) Polarizer calibration device and method
JP5602420B2 (en) Displacement measuring device, exposure device, and precision processing equipment
JP6444207B2 (en) Inspection method and inspection apparatus for hexagonal single crystal substrate
TWI637246B (en) Projection exposure device and method
TWI634374B (en) Light alignment control method and light alignment equipment
JP6986166B2 (en) Crystal orientation adjustment processing method based on level sensor positioning
JP6000696B2 (en) X-ray stress measuring apparatus and X-ray stress measuring method
JP2016211916A (en) Apparatus and method for measuring x ray crystal orientation
JP2009063314A (en) Substrate position detecting device, substrate position regulating device, ellipsometer and film thickness measuring equipment
JP2017161252A (en) Surface shape measuring method, and surface shape measuring device
JP2019515267A (en) Method of detecting position of mask holder on measurement table
WO2022160564A1 (en) Monitor wafer measurement method, and measurement apparatus
TW201915427A (en) Flatness detector
CN108613641B (en) Two-dimentional orientation error precision measurement method for thin plate crystals
JP6195777B2 (en) Birefringence measuring method, mask blank substrate manufacturing method, mask blank manufacturing method, transfer mask manufacturing method, and semiconductor device manufacturing method
JP6639082B2 (en) Lithographic apparatus, lithographic method, and article manufacturing method
JP3845286B2 (en) Shape measuring apparatus and shape measuring method
JP2008076283A (en) Method for adjusting optical axis of substrate inspection device, and optical axis adjusting sample
JP7193196B2 (en) Measuring Mechanism for Alignment Film Exposure Apparatus and Adjustment Method for Alignment Film Exposure Apparatus
JP3940819B2 (en) Semiconductor wafer surface shape measuring apparatus and surface shape measuring method
JP5781397B2 (en) Circular shape measuring method and apparatus
JP2010502005A (en) Method and apparatus for aligning a flat table surface
JP2001311705A (en) X-ray diffraction device
JPH07270123A (en) Dislocation detection method, and optical heterodyne interference measuring method as well as dislocation detection apparatus using them
JP2016180627A (en) Polarized light measuring device, and polarized light irradiation device