TW201712783A - Contactless wafer moving device generating a sucking force that is applied to a to-be-moved wafer in a way that the to-be-moved wafer is held at a distance from an operating terminal - Google Patents

Contactless wafer moving device generating a sucking force that is applied to a to-be-moved wafer in a way that the to-be-moved wafer is held at a distance from an operating terminal Download PDF

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TW201712783A
TW201712783A TW104130555A TW104130555A TW201712783A TW 201712783 A TW201712783 A TW 201712783A TW 104130555 A TW104130555 A TW 104130555A TW 104130555 A TW104130555 A TW 104130555A TW 201712783 A TW201712783 A TW 201712783A
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wafer
base
moved
moving arm
handling device
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TW104130555A
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Chinese (zh)
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TWI581359B (en
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yi-zheng Wang
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Ssa Wet Technology Co Ltd
yi-zheng Wang
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Abstract

A contactless wafer moving device operable to move a to-be-moved wafer includes a base, a moving arm, a tube disposed in the moving arm, and a negative pressure device. The moving arm, which is pivotally connected to the base and moves relative to the base, includes an operating terminal away from the base. The tube includes a channel that receives fluid and a sucking opening that is communicated with the channel and formed at the operating terminal. The negative pressure device is connected to the channel and applies a negative pressure to the fluid in the channel, so that the sucking opening generates a sucking force that is applied to the to-be-moved wafer in a way that the to-be-moved wafer is held at a distance from the operating terminal. As a result, the to-be-moved wafers can be moved without contact.

Description

非接觸式的晶圓搬運裝置Non-contact wafer handling device

本發明為有關一種晶圓搬運裝置,尤指一種非接觸式的晶圓搬運裝置。The present invention relates to a wafer handling device, and more particularly to a non-contact wafer handling device.

晶圓(Wafer)是指矽半導體積體電路製作所用的矽晶片,並於其上製作積體電路(integrated circuit, IC),而積體電路之製作過程需要經過數十甚至上百個步驟,並隨著電子資訊產品朝輕薄短小化的方向發展,若仍與以往一樣利用人力操作,則容易造成誤差,而使製作良率下降,且越來越複雜的製程需要耗費大量的人力,因此,現在的晶圓廠都利用機械手臂來取代人力搬運晶圓。A wafer (Wafer) refers to a germanium wafer used in the fabrication of a semiconductor integrated circuit, and an integrated circuit (IC) is fabricated thereon, and the fabrication process of the integrated circuit requires dozens or even hundreds of steps. With the development of electronic information products in the direction of lightness and thinness, if they are still manpowered as in the past, it is easy to cause errors, and the production yield is reduced, and the increasingly complicated process requires a lot of manpower. Therefore, Today's fabs use robotic arms instead of manpower to handle wafers.

而常見的晶圓夾持機械手臂如美國專利公告第US 6918735號之「Holding device for wafers」,其揭露一種晶圓用之夾持裝置,包含有一夾持臂、二相對設置於該夾持臂上的夾具以及一與該二夾具電性連接的傳動裝置,該傳動裝置控制該二夾具的開闔,而可夾持晶圓周邊之一部份而移動。A common wafer holding robot, such as the "Holding device for wafers" of US Pat. No. 6,918,735, which discloses a holding device for a wafer, comprising a clamping arm and two oppositely disposed on the clamping arm The upper clamp and a transmission electrically connected to the two clamps, the transmission controls the opening of the two clamps, and can move a part of the periphery of the wafer.

然而,該二夾具夾持晶圓時,容易因施力不均而造成晶圓彎曲或損壞,且該二夾具會擋住部分晶圓的表面,而無法進行製程之處理,此外,該二夾具運作一段時間之後,其取放晶圓的位置可能會產生偏移,而刮傷晶圓,因此,如何減少因該夾持裝置而造成晶圓損壞的問題,以及晶圓被該夾持裝置擋住而無法進行製程處理的問題,實為一重要課題。However, when the two clamps hold the wafer, the wafer is easily bent or damaged due to uneven application, and the two clamps block the surface of a part of the wafer, and the process cannot be processed. Moreover, the two fixtures operate. After a period of time, the position at which the wafer is picked and dropped may be offset, and the wafer is scratched. Therefore, how to reduce the wafer damage caused by the clamping device and the wafer being blocked by the clamping device The problem of not being able to process the process is an important issue.

本發明的主要目的,在於解決因該夾持裝置而造成晶圓損壞以及擋住部分晶圓表面而無法進行製程處理的問題。The main object of the present invention is to solve the problem that the wafer is damaged by the clamping device and the surface of a portion of the wafer is blocked, so that the process cannot be processed.

為達上述目的,本發明提供一種非接觸式的晶圓搬運裝置,係用以搬運一待搬運晶圓,包含有一基座、一移動臂、一管體以及一負壓裝置,該移動臂與該基座樞接並相對該基座移動,並具有一遠離該基座的操作端,該管體設置於該移動臂之中,包含有一容置一流體的通道以及一和該通道連通並形成於該操作端的吸取口,該負壓裝置連接於該通道。In order to achieve the above object, the present invention provides a non-contact wafer transfer device for carrying a wafer to be transported, comprising a base, a moving arm, a tube body and a negative pressure device, the moving arm and the The base is pivoted and moved relative to the base, and has an operating end remote from the base. The tube body is disposed in the moving arm, and includes a channel for accommodating a fluid and a communication with the channel. The suction device is connected to the passage at the suction port of the operating end.

其中,該負壓裝置對該通道內的該流體產生一負壓而使該操作端產生一作用於該待搬運晶圓的吸附力,並讓該待搬運晶圓與該吸取口保持一操作距離。The negative pressure device generates a negative pressure on the fluid in the channel to cause the operating end to generate an adsorption force acting on the wafer to be transported, and maintain the operating distance between the wafer to be transported and the suction port. .

綜上所述,藉由該負壓裝置對該通道內的該流體產生一負壓而使該吸取口產生一吸附力,該吸附力可以吸附該待搬運晶圓並使該待搬運晶圓與該吸取口保持一距離,因此,可以在不接觸該待搬運晶圓的情況下,搬運該待搬運晶圓至不同位置,並可防止習知因需要利用該夾持裝置夾持該待搬運晶圓而造成損壞的問題,以及該待搬運晶圓之表面被該夾持裝置擋住而無法進行製程處理的問題。In summary, the negative pressure device generates a negative pressure on the fluid in the channel, so that the suction port generates an adsorption force, and the adsorption force can adsorb the wafer to be transported and the wafer to be handled and The suction port is kept at a distance, so that the wafer to be conveyed can be transported to different positions without contacting the wafer to be conveyed, and the conventional holding of the crystal to be carried by the clamping device can be prevented. The problem of damage caused by the roundness, and the surface of the wafer to be handled is blocked by the holding device, and the process cannot be processed.

有關本發明的詳細說明及技術內容,現就配合圖式說明如下:The detailed description and technical content of the present invention will now be described as follows:

請參閱「圖1」及「圖2A」至「圖2C」所示,為本發明第一實施例的剖面示意圖以及作動流程示意圖。本發明為一種非接觸式的晶圓搬運裝置,係用以搬運一待搬運晶圓70,包含有一基座10、一移動臂20、一管體30以及一負壓裝置40,該移動臂20與該基座10樞接並相對該基座10移動,包含有一遠離該基座10的操作端21,該管體30設置於該移動臂20之中,並包含有一容置一流體的通道31以及一和該通道31連通並形成於該操作端21的吸取口32,該負壓裝置40連接於該通道31。此實施例中,該基座10更包含有一樞接件11,而該移動臂20透過該樞接件11而與該基座10樞接,且該管體30延伸至該基座10再與該負壓裝置40連接,然該管體30亦可僅設置於該移動臂20,而不與延伸至該基座10。Please refer to FIG. 1 and FIG. 2A to FIG. 2C for a schematic cross-sectional view and a schematic diagram of an operation flow according to a first embodiment of the present invention. The present invention is a non-contact wafer transfer device for carrying a wafer to be transported 70, comprising a base 10, a moving arm 20, a tube body 30 and a vacuum device 40, the moving arm 20 The base 10 is pivotally connected to the base 10 and includes a working end 21 away from the base 10. The tube 30 is disposed in the moving arm 20 and includes a passage 31 for accommodating a fluid. And a suction port 32 communicating with the passage 31 and formed at the operating end 21, the vacuum device 40 is connected to the passage 31. In this embodiment, the base 10 further includes a pivoting member 11 , and the moving arm 20 is pivotally connected to the base 10 through the pivoting member 11 , and the tubular body 30 extends to the base 10 to The vacuum device 40 is connected, but the tube 30 can also be disposed only on the moving arm 20 without extending to the base 10.

於此實施例中,該移動臂20更包含有複數個支臂22以及複數個設置於該些支臂22之間的轉動單元23,藉由該些轉動單元23的運作,而可控制該些支臂22的相對位置,使該移動臂20可以於一特定距離內進行操作。且更設置一感應件60於該操作端21,用以感測該待搬運晶圓70與該操作端21之距離。In this embodiment, the moving arm 20 further includes a plurality of arms 22 and a plurality of rotating units 23 disposed between the arms 22, and the rotating units 23 can control the rotating units 23. The relative position of the arms 22 allows the moving arm 20 to operate within a certain distance. Further, a sensing component 60 is disposed at the operating end 21 for sensing the distance between the wafer 70 to be handled and the operating end 21.

續搭配參閱「圖2A」至「圖2C」所示,於運作時,該些轉動單元23運作而使該移動臂20的該操作端21靠近該待搬運晶圓70,接著,該負壓裝置40進行運作而對該通道31內的該流體產生一負壓,使該吸取口32產生一吸附力,該吸附力會作用於該待搬運晶圓70上而可吸附該待搬運晶圓70,或利用流體本身與該操作端21之間的黏滯力,即只要流體不流失,該待搬運晶圓70就一直會被吸附住,並讓該待搬運晶圓70與該操作端21保持一操作距離,當該感應件60感應到該待搬運晶圓70與該操作端21保持於該操作距離時,該移動臂20會搬運該待搬運晶圓70移動,以進行下一步製程之運作,因此,可以在不接觸到該待搬運晶圓70的情況下搬運該待搬運晶圓70,防止習知因需要利用夾持裝置夾持該待搬運晶圓70而造成的損壞,以及該待搬運晶圓70之一上表面71被夾持裝置擋住而無法進行製程處理的問題。Referring to FIG. 2A to FIG. 2C, in operation, the rotating unit 23 operates to bring the operating end 21 of the moving arm 20 close to the wafer 70 to be transported, and then the vacuum device 40 is operated to generate a negative pressure on the fluid in the channel 31, so that the suction port 32 generates an adsorption force, which acts on the wafer 70 to be transported to adsorb the wafer 70 to be transferred. Or using the viscous force between the fluid itself and the operating end 21, that is, as long as the fluid is not lost, the wafer to be transported 70 is always adsorbed, and the wafer to be transported 70 is kept at the operating end 21 When the sensing member 60 senses that the to-be-transferred wafer 70 and the operating end 21 are maintained at the operating distance, the moving arm 20 carries the wafer 70 to be moved to perform the next process. Therefore, the wafer to be transferred 70 can be transported without contacting the wafer 70 to be conveyed, thereby preventing damage caused by the need to clamp the wafer 70 to be handled by the clamping device, and the to-be-handled One of the upper surfaces 71 of the wafer 70 is blocked by the holding device and cannot enter The process of handling the problem.

於本發明中,該流體可以為液體或氣體,且該液體可以選用具有清潔或其他功用的液體,使該待搬運晶圓70於搬運的同時,可以進行製程的前置處理,以降低製程運作時間。此外,需特別說明的是,若為液體時,會先於該待搬運晶圓70之該上表面71上形成一層液體,再經由該吸取口32產生的該吸附力吸取該待搬運晶圓70。In the present invention, the fluid may be a liquid or a gas, and the liquid may be selected to have a cleaning or other utility liquid, so that the wafer to be transported 70 can be processed while pre-processing to reduce the process operation. time. In addition, it should be particularly noted that, if it is a liquid, a liquid is formed on the upper surface 71 of the wafer 70 to be transferred, and the adsorption force generated by the suction port 32 is used to suck the wafer 70 to be transported. .

續參閱「圖3」所示,為本發明第二實施例的剖面示意圖,與第一實施例不同的是,第二實施例更包含有一輔助固定件50,該輔助固定件50設置於該操作端21並包含有一自該操作端21朝外延伸而覆蓋該待搬運晶圓70之該上表面71的上蓋51以及一自該上蓋51周緣垂直延伸的擋止件52,該上蓋51配合該待搬運晶圓70的形狀而為一圓盤形狀,而該待搬運晶圓70於搬運的過程中可能會因為該移動臂20移動速度較快或其他原因,使該待搬運晶圓70平移,最後,因為該待搬運晶圓70的平移而使該吸取口32無法吸附該待搬運晶圓70,而掉落損壞,因此,該擋止件52可以限制該待搬運晶圓70平移,進而防止該待搬運晶圓70掉落損壞,而使生產成本提升的問題。Referring to FIG. 3, a cross-sectional view of a second embodiment of the present invention is different from the first embodiment. The second embodiment further includes an auxiliary fixing member 50, and the auxiliary fixing member 50 is disposed in the operation. The end portion 21 includes an upper cover 51 extending outward from the operating end 21 to cover the upper surface 71 of the wafer 70 to be conveyed, and a stopper 52 extending perpendicularly from the periphery of the upper cover 51. The upper cover 51 is matched with the upper cover 51. The shape of the wafer 70 is a disc shape, and the wafer to be transported 70 may be moved by the moving arm 20 during the transportation process, or the wafer 70 to be transported may be translated. Because the translation of the wafer 70 to be transferred causes the suction port 32 to be unable to adsorb the wafer to be transferred 70, and the drop is damaged. Therefore, the stopper 52 can restrict the translation of the wafer 70 to be carried, thereby preventing the wafer 70 from being transferred. The problem that the wafer 70 to be handled is dropped and damaged, and the production cost is increased.

續參閱「圖4」所示,為本發明第三實施例的剖面示意圖,與第二實施例不同的是,該輔助固定件50更包含有一對應於該上蓋51並設置於該擋止件52遠離該上蓋51之一側的下蓋53,於此實施例中,該下蓋53與該擋止件52為利用一轉動件(圖未示)相互連接,而可進行開闔,形成一腔室54。於操作時,該下蓋53會先打開,使該吸取口32吸附該待搬運晶圓70並保持該操作距離,之後,該下蓋53會關閉,如此一來,該待搬運晶圓70可於該腔室54中先進行製程的前置處理,且當該待搬運晶圓70不慎掉落時,會落在與之較為接近的該下蓋53上,而可以減少因掉落到地面或其他物件上而造成的損害。FIG. 4 is a cross-sectional view showing a third embodiment of the present invention. The second embodiment is different from the second embodiment. The auxiliary fixing member 50 further includes a corresponding cover 51 and is disposed on the blocking member 52. The lower cover 53 is away from the side of the upper cover 51. In this embodiment, the lower cover 53 and the blocking member 52 are connected to each other by a rotating member (not shown), and can be opened to form a cavity. Room 54. During operation, the lower cover 53 is opened first, so that the suction port 32 adsorbs the wafer to be transported 70 and maintains the operating distance. Thereafter, the lower cover 53 is closed, so that the wafer to be transported 70 can be The pre-processing of the process is first performed in the chamber 54, and when the wafer 70 to be transported is accidentally dropped, it will fall on the lower cover 53 which is closer to the lower cover 53 and can be reduced to fall to the ground. Damage caused by or on other objects.

綜上所述,本發明具有以下特點:In summary, the present invention has the following features:

一、 藉由該負壓裝置使該吸取口產生一吸附力,而可讓該待搬運晶圓與該操作端保持一操作距離,因此,可以在不接觸到該待搬運晶圓的情況下搬運該待搬運晶圓,防止習知因需要利用夾持裝置夾持該待搬運晶圓而造成的損壞,以及該待搬運晶圓之該上表面被夾持裝置擋住而無法進行製程處理的問題。1. The suction device generates an adsorption force by the suction device, so that the wafer to be conveyed can be kept at an operating distance from the operation end, so that the wafer can be handled without contacting the wafer to be conveyed. The wafer to be conveyed prevents the conventional wafer from being damaged by the clamping device, and the upper surface of the wafer to be conveyed is blocked by the holding device and cannot be processed.

二、 該流體可以為具有清潔或其他功用的液體,而可在搬運的同時,進行製程的前置處理,以降低製程運作時間。Second, the fluid can be a liquid with clean or other functions, and can be pre-processed at the same time as the process to reduce the process operation time.

三、 藉由該擋止件的設置,可以限制該待搬運晶圓於搬運過程中平移,防止使該吸取口無法吸附該待搬運晶圓,而掉落損壞的問題。3. By the arrangement of the stopper, the wafer to be conveyed can be restricted from being translated during the conveyance process, and the problem that the suction port cannot absorb the wafer to be conveyed and the damage is dropped can be prevented.

四、 藉由該輔助固定件之該腔室的設置,該待搬運晶圓可於該腔室中先進行製程的前置處理,且當該待搬運晶圓不慎掉落時,會落在與之較為接近的該下蓋上,而可以減少因掉落到地面或其他物件上而造成的損害。4. The chamber to be transported can be pre-processed in the chamber by the setting of the chamber of the auxiliary fixing member, and when the wafer to be transported is accidentally dropped, it will fall on The lower cover is closer to the damage, and the damage caused by falling onto the ground or other objects can be reduced.

因此本發明極具進步性及符合申請發明專利的要件,爰依法提出申請,祈鈞局早日賜准專利,實感德便。Therefore, the present invention is highly progressive and conforms to the requirements of the invention patent application, and the application is made according to law, and the praying office grants the patent as soon as possible.

以上已將本發明做一詳細說明,惟以上所述者,僅爲本發明的一較佳實施例而已,當不能限定本發明實施的範圍。即凡依本發明申請範圍所作的均等變化與修飾等,皆應仍屬本發明的專利涵蓋範圍內。The present invention has been described in detail above, but the foregoing is only a preferred embodiment of the present invention, and is not intended to limit the scope of the invention. That is, the equivalent changes and modifications made by the scope of the present application should remain within the scope of the patent of the present invention.

10‧‧‧基座
11‧‧‧樞接件
20‧‧‧移動臂
21‧‧‧操作端
22‧‧‧支臂
23‧‧‧轉動單元
30‧‧‧管體
31‧‧‧通道
32‧‧‧吸取口
40‧‧‧負壓裝置
50‧‧‧輔助固定件
51‧‧‧上蓋
52‧‧‧擋止件
53‧‧‧下蓋
54‧‧‧腔室
60‧‧‧感應件
70‧‧‧待搬運晶圓
71‧‧‧上表面
10‧‧‧ Pedestal
11‧‧‧ pivotal parts
20‧‧‧ moving arm
21‧‧‧Operator
22‧‧‧ Arms
23‧‧‧Rotating unit
30‧‧‧pipe body
31‧‧‧ channel
32‧‧‧ suction port
40‧‧‧Negative pressure device
50‧‧‧Auxiliary fixtures
51‧‧‧Upper cover
52‧‧‧stops
53‧‧‧Under the cover
54‧‧‧ chamber
60‧‧‧Inductive parts
70‧‧‧ wafers to be handled
71‧‧‧Upper surface

圖1,為本發明第一實施例的剖面示意圖。 圖2A~2C,為本發明第一實施例的作動流程示意圖。 圖3,為本發明第二實施例的剖面示意圖。 圖4,為本發明第三實施例的剖面示意圖。Fig. 1 is a schematic cross-sectional view showing a first embodiment of the present invention. 2A-2C are schematic diagrams showing the operation flow of the first embodiment of the present invention. Figure 3 is a cross-sectional view showing a second embodiment of the present invention. Figure 4 is a cross-sectional view showing a third embodiment of the present invention.

10‧‧‧基座 10‧‧‧ Pedestal

11‧‧‧樞接件 11‧‧‧ pivotal parts

20‧‧‧移動臂 20‧‧‧ moving arm

21‧‧‧操作端 21‧‧‧Operator

22‧‧‧支臂 22‧‧‧ Arms

23‧‧‧轉動單元 23‧‧‧Rotating unit

30‧‧‧管體 30‧‧‧pipe body

31‧‧‧通道 31‧‧‧ channel

32‧‧‧吸取口 32‧‧‧ suction port

40‧‧‧負壓裝置 40‧‧‧Negative pressure device

60‧‧‧感應件 60‧‧‧Inductive parts

Claims (7)

一種非接觸式的晶圓搬運裝置,係用以搬運一待搬運晶圓,包含有: 一基座; 一與該基座樞接並相對該基座移動的移動臂,該移動臂具有一遠離該基座的操作端; 一設置於該移動臂之中的管體,該管體包含有一容置一流體的通道以及一和該通道連通並形成於該操作端的吸取口;以及 一連接於該通道的負壓裝置; 其中,該負壓裝置對該通道內的該流體產生一負壓而使該吸取口產生一作用於該待搬運晶圓的吸附力,並讓該待搬運晶圓與該操作端保持一操作距離。A non-contact wafer handling device for transporting a wafer to be carried, comprising: a base; a moving arm pivotally connected to the base and moving relative to the base, the moving arm has a distance An operating end of the base; a tube disposed in the moving arm, the tube body includes a passage for accommodating a fluid; and a suction port communicating with the passage and formed at the operating end; and a connection to the base a negative pressure device of the channel; wherein the negative pressure device generates a negative pressure on the fluid in the channel to cause the suction port to generate an adsorption force acting on the wafer to be transported, and to allow the wafer to be handled and the The operating terminal maintains an operating distance. 如申請專利範圍第1項所述之非接觸式的晶圓搬運裝置,其中更包含有一設置於該操作端的輔助固定件,該輔助固定件包含有一自該操作端朝外延伸而覆蓋該待搬運晶圓的一上表面的上蓋以及一自該上蓋周緣垂直延伸而限制該待搬運晶圓平移的擋止件。The non-contact wafer handling device of claim 1, further comprising an auxiliary fixing member disposed at the operating end, the auxiliary fixing member comprising an outer extending from the operating end to cover the to-be-handled An upper cover of an upper surface of the wafer and a stop extending perpendicularly from a periphery of the upper cover to limit translation of the wafer to be handled. 如申請專利範圍第2項所述之非接觸式的晶圓搬運裝置,其中該輔助固定件更包含有一對應於該上蓋並設置於該擋止件遠離該上蓋之一側的下蓋。The non-contact wafer handling device of claim 2, wherein the auxiliary fixing member further comprises a lower cover corresponding to the upper cover and disposed on a side of the blocking member away from the upper cover. 如申請專利範圍第2項所述之非接觸式的晶圓搬運裝置,其中該上蓋為一圓盤形狀。The non-contact wafer handling device of claim 2, wherein the upper cover is in the shape of a disk. 如申請專利範圍第1項所述之非接觸式的晶圓搬運裝置,其中該流體為氣體或液體。The non-contact wafer handling device of claim 1, wherein the fluid is a gas or a liquid. 如申請專利範圍第1項所述之非接觸式的晶圓搬運裝置,其中更包含一設置於該操作端的感應件。The non-contact wafer handling device of claim 1, further comprising an inductive member disposed at the operating end. 如申請專利範圍第1項所述之非接觸式的晶圓搬運裝置,其中該移動臂更包含有複數個支臂以及複數個設置於該些支臂之間的轉動單元。The non-contact wafer handling device of claim 1, wherein the moving arm further comprises a plurality of arms and a plurality of rotating units disposed between the arms.
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