TW201700767A - Thermo-resistant substrate and method for manufacturing same Part or the entire surface of the substrate is covered with thermal decomposed boron nitride film - Google Patents

Thermo-resistant substrate and method for manufacturing same Part or the entire surface of the substrate is covered with thermal decomposed boron nitride film Download PDF

Info

Publication number
TW201700767A
TW201700767A TW105109917A TW105109917A TW201700767A TW 201700767 A TW201700767 A TW 201700767A TW 105109917 A TW105109917 A TW 105109917A TW 105109917 A TW105109917 A TW 105109917A TW 201700767 A TW201700767 A TW 201700767A
Authority
TW
Taiwan
Prior art keywords
substrate
atom
heat
pbn
resistant substrate
Prior art date
Application number
TW105109917A
Other languages
Chinese (zh)
Inventor
加藤公二
山村和市
Original Assignee
信越化學工業股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 信越化學工業股份有限公司 filed Critical 信越化學工業股份有限公司
Publication of TW201700767A publication Critical patent/TW201700767A/en

Links

Landscapes

  • Chemical Vapour Deposition (AREA)

Abstract

The present invention is to provide a thermo-resistant substrate having a structure which is coated with a highly anti-corrosive and thermally decomposable boron nitride film. The thermo-resistant substrate of the present invention has a structure in which the entire or part of the substrate surface is covered with the thermal decomposable boron nitride film, and the thermo- resistant substrate is characterized in that: the aforementioned thermally decomposable boron nitride film comprises more than 0.001 atom% and less than 3 atom% of oxygen. The aforementioned oxygen-containing thermally decomposable boron nitride film may be produced by a chemical vapor deposition method using a gas containing nitrogen atoms and a gas containing borosn atom supplemented with a gas containing oxygen atoms.

Description

耐熱基材及其製造方法 Heat resistant substrate and method of manufacturing same

本發明關於一種耐熱基材,尤其關於一種耐熱基,其結構為被熱分解氮化硼膜所包覆。 The present invention relates to a heat resistant substrate, and more particularly to a heat resistant substrate having a structure coated with a thermally decomposed boron nitride film.

熱分解氮化硼(以下,有時稱作「PBN」(Pyrolytic Boron Nitride)),是藉由例如化學氣相沉積(Chemical Vapor Deposition,CVD)法製作而成,是具備高絕緣性、高耐熱性、可撓性的材料。關於藉由熱CVD法來製作PBN,已知以下方法:以1800~2000℃的高溫,使含B(硼)原子之氣體與含N(氮)原子之氣體發生反應,並使其堆積在被加熱物上。作為所使用的氣體,例如有三氯化硼與氨。由於需要1800℃以上的高溫,因此,CVD爐的爐材通常使用具有高耐熱性的石墨類的治具(jig)、絕熱材料。PBN因高耐熱性、強度等優異特性,而廣泛用作化合物半導體提拉用坩堝、分子束磊晶用金屬蒸發用坩堝、氮氧化物合成用坩堝、金屬有機化學氣相沉積(Metal Organic Chemical Vapor Deposition,MOCVD)裝置用治具等構件。近年來,在MOCVD裝置中使用H2、NH3等腐蝕性氣體,但PBN對該等氣體的耐性較高,此亦為PBN的特徵。 Thermal decomposition of boron nitride (hereinafter sometimes referred to as "PBN" (Pycolytic Boron Nitride) is produced by, for example, chemical vapor deposition (CVD) method, and is high in insulation and high in heat resistance. Sexual, flexible material. Regarding the production of PBN by a thermal CVD method, a method is known in which a gas containing a B (boron) atom is reacted with a gas containing an N (nitrogen) atom at a high temperature of 1800 to 2000 ° C, and is deposited in a Heating on the object. As the gas to be used, for example, boron trichloride and ammonia are used. Since a high temperature of 1800 ° C or higher is required, a graphite-based jig and a heat insulating material having high heat resistance are generally used as the furnace material of the CVD furnace. PBN is widely used as a catalyst for semiconductor semiconductor lifting, a metal evaporation for molecular beam epitaxy, a ruthenium oxide synthesis ruthenium, and a metal organic chemical vapor deposition (Metal Organic Chemical Vapor) because of its excellent properties such as high heat resistance and strength. Deposition, MOCVD) A fixture such as a fixture. In recent years, corrosive gases such as H 2 and NH 3 have been used in MOCVD apparatuses, but PBN has high resistance to such gases, which is also characteristic of PBN.

若將此種性質的PBN材料包覆於耐熱性基材上,則即便是H2、NH3等腐蝕性環境,亦可於高溫中使用基材。可供例如治具及加熱器使用等。 When a PBN material of this nature is coated on a heat-resistant substrate, the substrate can be used at a high temperature even in a corrosive environment such as H 2 or NH 3 . It can be used, for example, for fixtures and heaters.

MOCVD裝置中,使用由包含鎢、鉭而構成的金屬線之加熱器、或使用在碳上覆蓋(coating)有PBN而成的加熱器,亦有能夠加熱至1300~1500℃左右的溫度的加熱器。使用鎢、鉭而成的加熱器,雖然對H2、NH3的耐性較高,但存在以下問題:金屬氧化物以雜質的形式蒸發、或被加熱物的溫度分佈較差。另一方面,在碳上覆蓋有PBN而成的加熱器,其雜質不會蒸發,溫度分佈亦良好,但若長時間對NH3使用,則會發生局部腐蝕。若此種局部腐蝕繼續發展,則存在以下問題:PBN覆蓋層出現孔洞,內部的碳被H2、NH3消耗。 In the MOCVD apparatus, a heater including a metal wire including tungsten or tantalum, or a heater obtained by coating PBN on carbon, or a heating capable of heating to a temperature of about 1300 to 1500 ° C is used. Device. A heater made of tungsten or tantalum has high resistance to H 2 and NH 3 , but has a problem that the metal oxide is evaporated as an impurity or the temperature distribution of the object to be heated is poor. On the other hand, a heater in which carbon is coated with PBN does not evaporate impurities and has a good temperature distribution. However, if it is used for a long time for NH 3 , local corrosion occurs. If such localized corrosion continues to develop, there is a problem that pores appear in the PBN coating layer, and internal carbon is consumed by H 2 and NH 3 .

雖然不清楚局部腐蝕的原因,但一般認為可能是由於NH3中所含的微量水分(H2O)或附著在裝置內的微量水分而引起腐蝕。 Although the cause of local corrosion is not known, it is generally considered that corrosion may be caused by a trace amount of moisture (H 2 O) contained in NH 3 or a trace amount of moisture attached to the apparatus.

於專利文獻1中,記載有以下事項:藉由以1750~2000℃的溫度對經蒸鍍而成的PBN覆蓋層進行退火,會使其具有耐水性,且不會對PBN覆蓋層性能造成不良影響。雖然記載有經退火的樣品對95~100℃的水的抵抗性不佳,但文中並未附加與其相關的詳細資料,關於對高溫中的水蒸氣和NH3等的耐性,未做任何敘述。 Patent Document 1 describes that the PBN coating layer which is vapor-deposited is annealed at a temperature of 1750 to 2000 ° C to impart water resistance and does not cause deterioration of PBN coating properties. influences. Although it is described that the annealed sample is not resistant to water of 95 to 100 ° C, no detailed information is attached thereto, and no mention is made regarding the resistance to water vapor and NH 3 in high temperature.

又,於專利文獻2中,雖然記載有將2.19~2.2g/cm3的高密度PBN覆蓋至石墨體上會降低對熔融 鋁的反應性,但對高溫中的耐水性和耐NH3性等,未做任何敘述。進一步,將反應溫度設為1950~2000℃以製作高密度PBN,但亦需要考慮在該條件下反應爐所使用的石墨類爐材的消耗、對維修等的影響。 Further, in Patent Document 2, it is described that the high-density PBN of 2.19 to 2.2 g/cm 3 is coated on the graphite body to lower the reactivity with molten aluminum, but the water resistance and NH 3 resistance at high temperatures are high. , did not make any statement. Further, the reaction temperature is set to 1950 to 2000 ° C to produce a high-density PBN, but it is also necessary to consider the influence of the consumption of the graphite-based furnace material used in the reactor under such conditions, maintenance, and the like.

[先行技術文獻] [Advanced technical literature] (專利文獻) (Patent Literature)

專利文獻1:日本專利第2729289號公報 Patent Document 1: Japanese Patent No. 2729289

專利文獻2:日本專利第3415626號公報 Patent Document 2: Japanese Patent No. 3415626

本發明是鑒於如上所述的問題而完成,其目的在於提供一種耐熱基材,其可用於半導體、LED及太陽能電池製造裝置等,且結構為被耐腐蝕性較高的熱分解氮化硼膜所包覆。 The present invention has been made in view of the above problems, and an object thereof is to provide a heat-resistant substrate which can be used for a semiconductor, an LED, a solar cell manufacturing apparatus, and the like, and has a structure of a thermally decomposable boron nitride film having high corrosion resistance. Wrapped.

為了解決上述問題,本發明提供一種耐熱基材,其結構為部分或整個基材表面被熱分解氮化硼(PBN)膜所包覆,該耐熱基材的特徵在於:前述熱分解氮化硼膜,含有0.001atom%以上且3atom%以下的氧(O)。 In order to solve the above problems, the present invention provides a heat-resistant substrate having a structure in which a part or the entire surface of a substrate is coated with a thermally decomposed boron nitride (PBN) film, which is characterized by: the aforementioned thermally decomposed boron nitride The film contains 0.001 atom% or more and 3 atom% or less of oxygen (O).

如此,藉由使PBN膜中含有0.001atom%以上且3atom%以下的氧,可提高熱分解氮化硼膜的密度,使熱分解氮化硼膜緻密,並可抑制與水分和NH3等發生反應。 By containing 0.001 atom% or more and 3 atom% or less of oxygen in the PBN film, the density of the thermally decomposed boron nitride film can be increased, the thermal decomposition boron nitride film can be made dense, and the occurrence of moisture and NH 3 can be suppressed. reaction.

此時,可將前述熱分解氮化硼膜的密度設為2.00g/cm3以上且2.20g/cm3以下。 In this case, the density of the thermally decomposed boron nitride film can be 2.00 g/cm 3 or more and 2.20 g/cm 3 or less.

又,前述基材可包含石墨、碳/碳複合材料、熱分解石墨、碳化矽、鎢、鉭中的任一種。 Further, the substrate may include any one of graphite, a carbon/carbon composite material, thermally decomposed graphite, tantalum carbide, tungsten, and rhodium.

當將這些耐熱基材作為例如MOCVD裝置的加熱器來使用時,即便在腐蝕性環境下長時間使用,亦不會發生局部腐蝕。 When these heat-resistant substrates are used as, for example, a heater of an MOCVD apparatus, local corrosion does not occur even when used for a long period of time in a corrosive environment.

又,本發明提供一種耐熱基材的製造方法,是製造耐熱基材的方法,其利用原料氣體,並藉由化學氣相沉積(CVD)法,將熱分解氮化硼膜包覆於基材表面上來製造耐熱基材,該原料氣體包括含有氮原子之氣體與含有硼原子之氣體,該耐熱基材的製造方法的特徵在於:藉由將含有氧原子之氣體混入至前述原料氣體中,而使前述熱分解氮化硼膜中含有0.001atom%以上且3atom%以下的氧。 Moreover, the present invention provides a method for producing a heat-resistant substrate, which is a method for producing a heat-resistant substrate, which utilizes a raw material gas and coats a thermally decomposed boron nitride film on a substrate by a chemical vapor deposition (CVD) method. A heat-resistant substrate comprising a gas containing a nitrogen atom and a gas containing a boron atom, the method for producing the heat-resistant substrate characterized by mixing a gas containing an oxygen atom into the raw material gas, The thermal decomposition boron nitride film contains 0.001 atom% or more and 3 atom% or less of oxygen.

如此,藉由供給包含氧原子(O)之氣體,可在不提高反應溫度的情況下,將PBN膜高密度化。 As described above, by supplying the gas containing the oxygen atom (O), the PBN film can be made denser without increasing the reaction temperature.

根據本發明,可提供一種耐熱基材,其結構為被耐蝕性較高的熱分解氮化硼膜所包覆。本耐熱基材可使用於半導體、LED及太陽能電池製造裝置等之中,即便在腐蝕性環境下長時間使用,亦不會發生局部腐蝕。又,本發明的製造方法,由於亦可抑制因較高的反應溫度所致 的爐材的消耗,因此反應爐的維修次數減少,亦可提升生產性。 According to the present invention, there can be provided a heat-resistant substrate which is structured to be coated with a thermally decomposable boron nitride film having high corrosion resistance. The heat-resistant substrate can be used in semiconductors, LEDs, solar cell manufacturing apparatuses, and the like, and local corrosion does not occur even when used for a long period of time in a corrosive environment. Moreover, the production method of the present invention can also be suppressed due to a high reaction temperature. The consumption of the furnace material, so the number of maintenance of the reactor is reduced, and the productivity can be improved.

01‧‧‧耐熱基材 01‧‧‧Heat resistant substrate

02、9‧‧‧基材 02, 9‧‧‧Substrate

03‧‧‧熱分解氮化硼膜 03‧‧‧ Thermal decomposition of boron nitride film

1‧‧‧外管 1‧‧‧External management

2‧‧‧中管 2‧‧‧中管

3‧‧‧內管 3‧‧‧Inside

4‧‧‧供給管 4‧‧‧Supply tube

5‧‧‧圓筒 5‧‧‧Cylinder

6‧‧‧加熱器 6‧‧‧heater

7‧‧‧積載台 7‧‧‧Standard

8‧‧‧旋轉機構 8‧‧‧Rotating mechanism

10‧‧‧支持治具 10‧‧‧Support fixture

11‧‧‧PBN膜 11‧‧‧PBN film

第1圖是表示本發明的耐熱基材的一例的說明圖。 Fig. 1 is an explanatory view showing an example of a heat resistant base material of the present invention.

第2圖是可用於本發明中的反應爐的剖面圖及供給管的示意圖。 Fig. 2 is a schematic cross-sectional view of a reaction furnace and a supply pipe which can be used in the present invention.

第3圖是表示實施例中的熱分解氮化硼的包覆方法的說明圖。 Fig. 3 is an explanatory view showing a coating method of thermally decomposed boron nitride in the examples.

第4圖是表示實施例中的石墨基材表面上的PBN膜中的氧濃度與氧供給量的關係的圖表。 Fig. 4 is a graph showing the relationship between the oxygen concentration and the oxygen supply amount in the PBN film on the surface of the graphite substrate in the examples.

第5圖是表示實施例中的石墨基材表面上的PBN膜的密度與氧供給量的關係的圖表。 Fig. 5 is a graph showing the relationship between the density of the PBN film on the surface of the graphite substrate and the amount of supplied oxygen in the examples.

以下,詳細說明本發明的實施方式,但本發明並不限定於以下說明。 Hereinafter, embodiments of the present invention will be described in detail, but the present invention is not limited to the following description.

本發明人,對改善PBN膜的耐腐蝕性進行深入研究,結果考慮到以下問題:NH3所含的微量水分和附著於爐內的水分在高溫中與PBN反應,生成氧化硼(以下表示為B2O3),且其在高溫中蒸發,因此,在PBN膜上可能會出現孔洞。發現於反復進行多次實驗以抑制該B2O3的生成的期間中,若PBN膜內含有少量的氧,則可提高PBN膜的密度,並可抑制孔洞的產生,從而完成本發明。 The present inventors conducted intensive studies on improving the corrosion resistance of the PBN film, and as a result, the following problems were considered: the trace amount of moisture contained in the NH 3 and the moisture adhering to the furnace reacted with PBN at a high temperature to form boron oxide (hereinafter referred to as B 2 O 3 ), and it evaporates at a high temperature, and therefore, pores may occur on the PBN film. In the period in which the experiment was repeated to suppress the formation of the B 2 O 3 , if a small amount of oxygen was contained in the PBN film, the density of the PBN film was increased, and the generation of voids was suppressed, and the present invention was completed.

以下,參照圖式進行說明。 Hereinafter, description will be made with reference to the drawings.

將本發明的耐熱基材的一例表示第1圖。耐熱基材01,是基材02的部分或整個表面被熱分解氮化硼膜03所包覆,該熱分解氮化硼膜03含有0.001atom%以上且3atom%以下的氧。於第1圖所示的例中,雖然整個基材02被包覆,但包覆範圍並無特別限定。再者,於本發明中,所謂「耐熱基材」,只要未特別記載,皆是指將基材02與熱分解氮化硼膜03結合而成的整個結構物01。 An example of the heat resistant base material of the present invention is shown in Fig. 1. In the heat-resistant substrate 01, part or the entire surface of the substrate 02 is covered with a thermally decomposable boron nitride film 03, and the thermally decomposed boron nitride film 03 contains 0.001 atom% or more and 3 atom% or less of oxygen. In the example shown in Fig. 1, although the entire substrate 02 is coated, the coating range is not particularly limited. In the present invention, the term "heat-resistant substrate" means the entire structure 01 in which the substrate 02 and the thermally decomposed boron nitride film 03 are combined unless otherwise specified.

於本發明的耐熱基材中,基材02表面上的熱分解氮化硼膜03,含有0.001atom%以上且3atom%以下的O(氧)。如前所述,藉此可將熱分解氮化硼膜的密度設為2.01g/cm3以上且2.20g/cm3以下,一般認為可抑制PBN與水分的反應。進一步,一般認為藉由將O(氧)固溶於六方晶的層間或取代至N(氮)位置,可降低與水分的反應性,且可抑制孔洞的產生。當氧原子少於0.001atom%時,PBN密度幾乎並未提高。又,若欲使其含有多於3atom%的氧原子,由於氧的供給量增加,因此,石墨類爐材的消耗加劇。進一步,若氧的添加量增加,由於PBN膜中生成B2O3,會引起PBN膜的不良情況或PBN產率下降,因而欠佳。更佳是將氧含量設為0.015atom%以上,或將密度設為2.05g/cm3以上。 In the heat-resistant substrate of the present invention, the thermally decomposed boron nitride film 03 on the surface of the substrate 02 contains 0.001 atom% or more and 3 atom% or less of O (oxygen). As described above, the density of the thermally decomposed boron nitride film can be set to 2.01 g/cm 3 or more and 2.20 g/cm 3 or less, and it is considered that the reaction between PBN and water can be suppressed. Further, it is considered that by dissolving O (oxygen) in a hexagonal layer or substituting to a N (nitrogen) position, reactivity with water can be reduced, and generation of pores can be suppressed. When the oxygen atom is less than 0.001 atom%, the PBN density hardly increases. Further, if it is intended to contain more than 3 atom% of oxygen atoms, the amount of oxygen supplied increases, so that the consumption of the graphite-based furnace material is intensified. Further, if the amount of oxygen added is increased, the formation of B 2 O 3 in the PBN film may cause a problem of the PBN film or a decrease in the PBN yield, which is not preferable. More preferably, the oxygen content is set to 0.015 atom% or more, or the density is set to 2.05 g/cm 3 or more.

被包覆的基材02可包含例如石墨、碳/碳複合材料(carbon/carbon composite,碳纖維強化碳基材複合材料)、熱分解石墨、碳化矽、鎢及鉭中的任一種。亦可使用它們的複合材料。若為這種基材,其耐熱性較高,適合用於半導體、LED及太陽能電池製造裝置等之中。當然,並不限定於這些材料,可適當決定。 The coated substrate 02 may comprise, for example, any of graphite, carbon/carbon composite (carbon/carbon composite), thermally decomposed graphite, tantalum carbide, tungsten, and tantalum. They can also be used in their composite materials. Such a substrate has high heat resistance and is suitable for use in semiconductors, LEDs, and solar cell manufacturing apparatuses. Of course, it is not limited to these materials, and can be appropriately determined.

含有氧之熱分解氮化硼膜03,如前所述,可藉由CVD法製造。具體而言,可利用添加含有N(氮)原子之氣體例如氨、含有B(硼)原子之氣體例如三氯化硼、及含有O(氧)原子之氣體,並藉由實行CVD來製造。對含有O(氧)原子之氣體並無特別限制,可使用在分子內具有O原子之慣用氣體。較佳為使用選自O2、O3、H2O、NOx及COx中的至少一種氣體。這些氣體價格低廉,可穩定供給。 The thermal decomposition boron nitride film 03 containing oxygen can be produced by a CVD method as described above. Specifically, it can be produced by adding a gas containing an N (nitrogen) atom such as ammonia, a gas containing a B (boron) atom such as boron trichloride, and a gas containing an O (oxygen) atom by performing CVD. The gas containing an O (oxygen) atom is not particularly limited, and a conventional gas having an O atom in the molecule can be used. It is preferred to use at least one gas selected from the group consisting of O 2 , O 3 , H 2 O, NOx, and COx. These gases are inexpensive and stable.

當供給O2氣體(氧氣)來作為含有氧原子之氣體時,較佳是以相對於含有B(硼)原子之氣體,氧與硼的供給量的莫耳比(O/B比)為例如4×10-5~1.8×10-1的範圍的方式來進行供給,以使熱分解氮化硼膜中含有0.001atom%以上且3atom%以下的氧。當供給O2氣以外的氣體,例如O3、H2O、NOx、COx及它們的混合氣體等時,較佳是以O/B比在相同範圍內的方式進行供給。雖然亦取決於所使用的反應爐,但若O/B比小於上述範圍,可能會導致難以使熱分解氮化硼膜中含有充分的氧。若多於該範圍,因氧供給量增多,可能會導致用 於高溫用反應爐材的石墨構件過度消耗,因而欠佳。更佳的O/B比為4×10-4~1.6×10-1的範圍。 When O 2 gas (oxygen) is supplied as a gas containing an oxygen atom, it is preferable to use, for example, a molar ratio (O/B ratio) of a supply amount of oxygen and boron to a gas containing a B (boron) atom. The supply is performed in a range of 4 × 10 -5 to 1.8 × 10 -1 so that the thermally decomposed boron nitride film contains 0.001 atom% or more and 3 atom% or less of oxygen. When a gas other than the O 2 gas, for example, O 3 , H 2 O, NOx, COx, or a mixed gas thereof, is supplied, it is preferable to supply the gas in such a manner that the O/B ratio is in the same range. Although depending on the reactor to be used, if the O/B ratio is less than the above range, it may be difficult to contain sufficient oxygen in the thermally decomposed boron nitride film. If it is more than this range, the amount of oxygen supplied may increase, and the graphite member used for the high-temperature reaction furnace may be excessively consumed, which is not preferable. A more preferable O/B ratio is in the range of 4 × 10 -4 to 1.6 × 10 -1 .

於本發明中,由於可將含有氧原子之氣體,預先與含有氮原子之氣體或含有硼原子之氣體混合後進行供給,因此,可供給組成比固定的混合氣體。於供給該混合氣體時,使用例如第2圖所示的二重或三重供給管4,可分離供給含有硼原子之氣體或含有氮原子之氣體,並且除此以外亦可供給含有氧原子之氣體。若以此種方式進行供給,則可抑制如下所述的情況,亦即:在向成膜裝置內供給前的階段中,原料氣體發生反應而堵塞供給管。再者,第2圖的右框內的上側是由外管1和內管3所組成的二重管的示意圖,框內下側是在此基礎上具備中管2之三重管的示意圖。第2圖的左側是反應爐的剖面圖,將基材放置於圓筒5內的具備旋轉機構8之積載台7上,利用加熱器6進行加熱並且自供給管4供給上述氣體,來進行CVD。又,除了二重或三重供給管4以外,亦可使用四重管或四重管以上的多重管。 In the present invention, since the gas containing an oxygen atom can be supplied in advance by mixing with a gas containing a nitrogen atom or a gas containing a boron atom, a mixed gas having a fixed composition ratio can be supplied. When the mixed gas is supplied, for example, a gas containing a boron atom or a gas containing a nitrogen atom can be separated and supplied by using a double or triple feed pipe 4 as shown in Fig. 2, and a gas containing an oxygen atom can be supplied. . When the supply is performed in this manner, it is possible to suppress the reaction of the material gas and block the supply tube in the stage before the supply to the film formation apparatus. Further, the upper side in the right frame of Fig. 2 is a schematic view of a double tube composed of the outer tube 1 and the inner tube 3, and the lower side of the frame is a schematic view of the triple tube having the middle tube 2 on the basis of this. The left side of Fig. 2 is a cross-sectional view of the reactor, and the substrate is placed on the stowage stage 7 including the rotating mechanism 8 in the cylinder 5, heated by the heater 6, and the gas is supplied from the supply pipe 4 to perform CVD. . Further, in addition to the double or triple feed pipe 4, a multiple pipe of a quadruple pipe or a quadruple pipe or more may be used.

[實施例] [Examples]

以下,示出實施例和比較例來更具體地說明本發明,但是本發明並不限定於以下說明。 Hereinafter, the invention will be more specifically described by way of examples and comparative examples, but the invention is not limited by the description below.

<實施例1> <Example 1>

於實施例1中,利用第2圖所示的反應爐,藉由熱CVD來製作耐熱基材。利用二重管,將氨氣(NH3)18SLM(standard L/M)、三氯化硼氣(BCl3)5 SLM、及O2氣體0.1sccm(standard cc/m)供給至反應爐內,於50mm×50mm×10mmt的石墨製基材表面上,以使PBN的厚度成為0.3mm的方式來覆蓋PBN。保持此時的爐內溫度1900℃、壓力100Pa。如第3圖所示,在覆蓋時利用支持治具10支撐基材9的部分,未被PBN膜11覆蓋,成為石墨露出的未經覆蓋部分(第3圖b、c),因此變更支撐點,再次以相同方式覆蓋PBN(第3圖c、d)。使用阿米泰克(AMETEK,Inc.)公司製EDAX Genesis EDS,對所獲得的耐熱基材的PBN膜中的氧濃度進行測定,結果為0.001atom%。又,利用阿基米德(Archimedes)法對PBN膜的密度進行測定,結果為2.01g/cm3In Example 1, a heat-resistant substrate was produced by thermal CVD using the reactor shown in Fig. 2 . Using a double tube, ammonia gas (NH 3) 18SLM (standard L / M), boron trichloride gas (BCl 3) 5 SLM, and O 2 gas 0.1sccm (standard cc / m) is supplied into the reactor, The PBN was covered on the surface of a graphite substrate of 50 mm × 50 mm × 10 mmt so that the thickness of the PBN became 0.3 mm. The furnace temperature at this time was maintained at 1900 ° C and the pressure was 100 Pa. As shown in Fig. 3, the portion of the substrate 9 supported by the support jig 10 at the time of covering is not covered by the PBN film 11, and is an uncovered portion where the graphite is exposed (Fig. 3, b, c), so the support point is changed. , again covering the PBN in the same way (Fig. 3, c, d). The oxygen concentration in the PBN film of the obtained heat-resistant substrate was measured using EDAX Genesis EDS manufactured by AMETEK, Inc., and found to be 0.001 atom%. Further, the density of the PBN film was measured by the Archimedes method and found to be 2.01 g/cm 3 .

其次,將該耐熱基材於真空中加熱至1600℃後,暴露在2000Pa的氨氣環境中150小時。冷卻後取出耐熱基材,結果於PBN膜上未發現到達至基材的孔洞。 Next, the heat-resistant substrate was heated to 1600 ° C in a vacuum and exposed to an ammonia atmosphere of 2000 Pa for 150 hours. After the cooling, the heat-resistant substrate was taken out, and as a result, no pores reaching the substrate were observed on the PBN film.

<實施例2> <Example 2>

於實施例2中,利用第2圖所示的反應爐,藉由熱CVD來製作耐熱基材。利用二重管,將氨氣18SLM、三氯化硼氣5SLM、及O2氣體1sccm供給至反應爐內,於50mm×50mm×10mmt的石墨製基材表面上,以使PBN的厚度成為0.3mm的方式來覆蓋PBN。保持此時的爐內溫度1900℃、壓力100Pa。變更支撐點,再次以相同方式對石墨露出的未經覆蓋部分進行PBN覆蓋。對以此種方式製作而成的耐熱基材的PBN膜中的氧 濃度進行測定,結果為0.015atom%。又,對PBN膜的密度進行測定,結果為2.05g/cm3In Example 2, a heat-resistant substrate was produced by thermal CVD using the reactor shown in Fig. 2 . Using a double tube, ammonia gas 18SLM, boron trichloride gas 5SLM, and O 2 gas 1 sccm were supplied to the reaction furnace on a surface of a graphite substrate of 50 mm × 50 mm × 10 mmt so that the thickness of the PBN became 0.3 mm. The way to cover the PBN. The furnace temperature at this time was maintained at 1900 ° C and the pressure was 100 Pa. The support point was changed, and the uncovered portion of the graphite was again covered in the same manner by PBN. The oxygen concentration in the PBN film of the heat-resistant substrate produced in this manner was measured and found to be 0.015 atom%. Further, the density of the PBN film was measured and found to be 2.05 g/cm 3 .

其次,將該耐熱基材於真空中加熱至1600℃後,暴露於2000Pa的氨氣環境中150小時。冷卻後取出耐熱基材,結果於PBN膜上並未發現到達至基材的孔洞。 Next, the heat-resistant substrate was heated to 1600 ° C in a vacuum and exposed to an ammonia atmosphere of 2000 Pa for 150 hours. After the cooling, the heat-resistant substrate was taken out, and as a result, no pores reaching the substrate were observed on the PBN film.

<實施例3> <Example 3>

於實施例3中,利用第2圖所示的反應爐,藉由熱CVD來製作耐熱基材。利用二重管,將氨氣18SLM、三氯化硼氣5SLM、及O2氣體100sccm供給至反應爐內,於50mm×50mm×10mmt的石墨製基材表面上,以使PBN的厚度成為0.3mm的方式來覆蓋PBN。保持為此時的爐內溫度1900℃、壓力100Pa。變更支撐點,再次以相同方式對石墨露出的未經覆蓋部分進行PBN覆蓋。對以此種方式製作而成的耐熱基材的PBN膜中的氧濃度進行測定,結果為0.70atom%。又,對PBN膜的密度進行測定,結果為2.14g/cm3In Example 3, a heat-resistant substrate was produced by thermal CVD using the reactor shown in Fig. 2. Using a double tube, ammonia gas 18SLM, boron trichloride gas 5SLM, and O 2 gas 100sccm were supplied to the reaction furnace on the surface of a 50 mm × 50 mm × 10 mmt graphite substrate so that the thickness of the PBN became 0.3 mm. The way to cover the PBN. The furnace temperature at this time was maintained at 1900 ° C and the pressure was 100 Pa. The support point was changed, and the uncovered portion of the graphite was again covered in the same manner by PBN. The oxygen concentration in the PBN film of the heat-resistant substrate produced in this manner was measured and found to be 0.70 atom%. Further, the density of the PBN film was measured and found to be 2.14 g/cm 3 .

其次,將該耐熱基材於真空中加熱至1600℃後,暴露於2000Pa的氨氣環境中150小時。冷卻後取出耐熱基材,於PBN膜上並未發現到達至基材的孔洞。 Next, the heat-resistant substrate was heated to 1600 ° C in a vacuum and exposed to an ammonia atmosphere of 2000 Pa for 150 hours. After cooling, the heat-resistant substrate was taken out, and no pores reaching the substrate were found on the PBN film.

<實施例4> <Example 4>

於實施例4中,利用第2圖所示的反應爐,藉由熱CVD來製作耐熱基材。利用二重管,將氨氣18SLM、三氯化硼氣5SLM、及O2氣體400sccm供給至反應爐 內,於50mm×50mm×10mmt的石墨製基材表面上,以使PBN的厚度成為0.3mm的方式來覆蓋PBN。保持此時的爐內溫度1900℃、壓力100Pa。變更支撐點,再次以相同方式對石墨露出的未經覆蓋部分進行PBN覆蓋。對以此種方式製作而成的耐熱基材的PBN膜中的氧濃度進行測定,結果為2.7atom%。又,對PBN膜的密度進行測定,結果為2.19g/cm3In Example 4, a heat-resistant substrate was produced by thermal CVD using the reactor shown in Fig. 2. Using a double tube, ammonia gas 18SLM, boron trichloride gas 5SLM, and O 2 gas 400sccm were supplied to the reaction furnace on a surface of a graphite substrate of 50 mm × 50 mm × 10 mmt so that the thickness of the PBN became 0.3 mm. The way to cover the PBN. The furnace temperature at this time was maintained at 1900 ° C and the pressure was 100 Pa. The support point was changed, and the uncovered portion of the graphite was again covered in the same manner by PBN. The oxygen concentration in the PBN film of the heat-resistant substrate produced in this manner was measured and found to be 2.7 atom%. Further, the density of the PBN film was measured and found to be 2.19 g/cm 3 .

其次,將該耐熱基材於真空中加熱至1600℃後,暴露於2000Pa的氨氣環境中150小時。冷卻後取出耐熱基材,於PBN膜上並未發現到達基材的孔洞。 Next, the heat-resistant substrate was heated to 1600 ° C in a vacuum and exposed to an ammonia atmosphere of 2000 Pa for 150 hours. After cooling, the heat-resistant substrate was taken out, and no pores reaching the substrate were found on the PBN film.

<實施例5> <Example 5>

於實施例5中,利用第2圖所示的反應爐,藉由熱CVD來製作耐熱基材。利用二重管,將氨氣18SLM、三氯化硼氣5SLM、及O2氣體450sccm供給至反應爐內,於50mm×50mm×10mmt的石墨製基材表面上,以使PBN的厚度成為0.3mm的方式來覆蓋PBN。保持此時的爐內溫度1900℃、壓力100Pa。變更支撐點,再次以相同方式對石墨露出的未經覆蓋部分進行PBN覆蓋。對以此種方式製作而成的耐熱基材的PBN膜中的氧濃度進行測定,結果為3.0atom%。又,對PBN膜的密度進行測定,結果為2.19g/cm3In Example 5, a heat-resistant substrate was produced by thermal CVD using the reactor shown in Fig. 2. Using a double tube, ammonia gas 18SLM, boron trichloride gas 5SLM, and O 2 gas 450sccm were supplied to the reaction furnace on a surface of a graphite substrate of 50 mm × 50 mm × 10 mmt so that the thickness of the PBN became 0.3 mm. The way to cover the PBN. The furnace temperature at this time was maintained at 1900 ° C and the pressure was 100 Pa. The support point was changed, and the uncovered portion of the graphite was again covered in the same manner by PBN. The oxygen concentration in the PBN film of the heat-resistant substrate produced in this manner was measured and found to be 3.0 atom%. Further, the density of the PBN film was measured and found to be 2.19 g/cm 3 .

其次,將該耐熱基材於真空中加熱至1600℃後,暴露於2000Pa的氨氣環境中150小時。冷卻後取出耐熱基材,於PBN膜上並未發現到達至基材的孔洞。 Next, the heat-resistant substrate was heated to 1600 ° C in a vacuum and exposed to an ammonia atmosphere of 2000 Pa for 150 hours. After cooling, the heat-resistant substrate was taken out, and no pores reaching the substrate were found on the PBN film.

<比較例1> <Comparative Example 1>

於比較例1中,利用第2圖所示的反應爐,藉由熱CVD來製作本發明的範圍外的耐熱基材。在不導入O2的情況下,利用二重管,將氨氣18SLM、三氯化硼氣5SLM供給至反應爐內,於50mm×50mm×10mmt的石墨製基材表面上,以使PBN的厚度成為0.3mm的方式來覆蓋PBN。保持此時的爐內溫度1900℃、壓力100Pa。變更支撐點,再次以相同方式對石墨露出的未經覆蓋部分進行PBN覆蓋。對以此種方式製作而成的耐熱基材的PBN膜中的氧濃度進行測定,結果為檢測極限以下(<0.001atom%)。又,對PBN膜的密度進行測定,結果為1.99g/cm3In Comparative Example 1, a heat-resistant substrate outside the scope of the present invention was produced by thermal CVD using the reactor shown in Fig. 2 . In the case where O 2 is not introduced, ammonia gas 18SLM and boron trichloride gas 5SLM are supplied to the reaction furnace by a double tube, and the thickness of the PBN is made on the surface of a graphite substrate of 50 mm × 50 mm × 10 mmt. Become a 0.3mm way to cover the PBN. The furnace temperature at this time was maintained at 1900 ° C and the pressure was 100 Pa. The support point was changed, and the uncovered portion of the graphite was again covered in the same manner by PBN. The oxygen concentration in the PBN film of the heat-resistant substrate produced in this manner was measured and found to be below the detection limit (<0.001 atom%). Further, the density of the PBN film was measured and found to be 1.99 g/cm 3 .

其次,將該耐熱基材於真空中加熱至1600℃後,暴露於2000Pa的氨氣環境中150小時。冷卻後取出耐熱基材,於PBN膜上發現到達至基材的孔洞。 Next, the heat-resistant substrate was heated to 1600 ° C in a vacuum and exposed to an ammonia atmosphere of 2000 Pa for 150 hours. After cooling, the heat-resistant substrate was taken out, and holes reaching the substrate were found on the PBN film.

<比較例2> <Comparative Example 2>

於比較例2中,利用第2圖所示的反應爐,藉由熱CVD來製作本發明的範圍外的耐熱基材。利用二重管,將氨氣18SLM、三氯化硼氣5SLM、及O2氣體600sccm供給至反應爐內,於50mm×50mm×10mmt的石墨製基材表面上,以使PBN的厚度成為0.3mm的方式來覆蓋PBN。保持此時的爐內溫度1900℃、壓力100Pa。變更支撐點,再次以相同方式對石墨露出的未經覆蓋部分進行PBN覆蓋。對以此種方式製作而成的耐熱基材的 PBN膜中的氧濃度進行測定,結果為本發明的範圍外的4.3atom%。又,對PBN膜的密度進行測定,結果為2.21g/cm3In Comparative Example 2, a heat-resistant substrate outside the scope of the present invention was produced by thermal CVD using the reactor shown in Fig. 2 . Using a double tube, ammonia gas 18SLM, boron trichloride gas 5SLM, and O 2 gas 600sccm were supplied to the reaction furnace on a surface of a graphite substrate of 50 mm × 50 mm × 10 mmt so that the thickness of the PBN became 0.3 mm. The way to cover the PBN. The furnace temperature at this time was maintained at 1900 ° C and the pressure was 100 Pa. The support point was changed, and the uncovered portion of the graphite was again covered in the same manner by PBN. The oxygen concentration in the PBN film of the heat-resistant substrate produced in this manner was measured and found to be 4.3 atom% outside the range of the present invention. Further, the density of the PBN film was measured and found to be 2.21 g/cm 3 .

但是,於利用本比較例2的方法製作時,相較於其他方法,氧供給量較多,因此,急劇地消耗反應爐中所使用的石墨構件。利用此種製法,由於維修頻率變高,生產性下降,因而欠佳。 However, when it was produced by the method of Comparative Example 2, the oxygen supply amount was large compared with the other methods, and therefore the graphite member used in the reaction furnace was suddenly consumed. With this method, the maintenance frequency is high and the productivity is lowered, which is not preferable.

若將以上實施例1~5與比較例1及2的結果匯總至表1,則如以下所示。 The results of the above Examples 1 to 5 and Comparative Examples 1 and 2 are summarized in Table 1, as shown below.

又,將氧供給量與PBN膜的氧濃度、PBN密度的關係,表示於第4圖、第5圖。 Further, the relationship between the oxygen supply amount and the oxygen concentration of the PBN film and the PBN density is shown in Figs. 4 and 5 .

其次,對使用石墨以外的基材的實施例進行說明。 Next, an example in which a substrate other than graphite is used will be described.

<實施例6至10> <Examples 6 to 10>

於實施例6至10中,利用第2圖所示的反應爐,藉由熱CVD來製作耐熱基材。利用三重管,將氨氣18 SLM、三氯化硼氣5SLM、及O2氣體100sccm供給至反應爐內,於50mm×50mm×10mmt的碳/碳複合材料、熱分解石墨、碳化矽、鎢、鉭製的各個基材表面上,以使PBN的厚度成為0.3mm的方式來覆蓋PBN。保持此時的爐內溫度1900℃、壓力100Pa。變更支撐點,再次以相同方式對石墨露出的未經覆蓋部分進行PBN覆蓋。對以此種方式製作而成的各個耐熱基材的PBN膜中的氧濃度進行測定,結果為0.65~0.71atom%。又,對PBN膜的密度進行測定,結果為2.12~2.15g/cm3In Examples 6 to 10, a heat-resistant substrate was produced by thermal CVD using the reactor shown in Fig. 2. Using a triple tube, ammonia 18 SLM, boron trichloride gas 5SLM, and O 2 gas 100 sccm are supplied to the reaction furnace, carbon/carbon composite material of 50 mm × 50 mm × 10 mmt, thermally decomposed graphite, tantalum carbide, tungsten, On the surface of each of the substrates, the PBN was covered so that the thickness of the PBN became 0.3 mm. The furnace temperature at this time was maintained at 1900 ° C and the pressure was 100 Pa. The support point was changed, and the uncovered portion of the graphite was again covered in the same manner by PBN. The oxygen concentration in the PBN film of each heat-resistant substrate produced in this manner was measured and found to be 0.65 to 0.71 atom%. Further, the density of the PBN film was measured and found to be 2.12 to 2.15 g/cm 3 .

進一步,以與實施例1~5同樣的方式進行耐性試驗,結果並未於PBN膜上發現到達至基材的孔洞。 Further, the resistance test was carried out in the same manner as in Examples 1 to 5. As a result, pores reaching the substrate were not found on the PBN film.

再者,本發明並不限定於上述實施方式。上述實施方式為例示,具有實質上與本發明的專利申請範圍所記載的技術思想相同的結構,並發揮相同作用效果的技術方案,均包含在本發明的技術範圍內。 Furthermore, the present invention is not limited to the above embodiment. The above-described embodiment is exemplified, and a technical solution having substantially the same configuration as the technical idea described in the patent application scope of the present invention and exhibiting the same operational effects is included in the technical scope of the present invention.

01‧‧‧耐熱基材 01‧‧‧Heat resistant substrate

02‧‧‧基材 02‧‧‧Substrate

03‧‧‧熱分解氮化硼膜 03‧‧‧ Thermal decomposition of boron nitride film

Claims (4)

一種耐熱基材,其結構為部分或整個基材表面被熱分解氮化硼膜所包覆,該耐熱基材的特徵在於:前述熱分解氮化硼膜,含有0.001atom%以上且3atom%以下的氧。 A heat-resistant substrate having a structure in which a part or the entire surface of the substrate is coated with a thermally decomposed boron nitride film, and the heat-resistant substrate is characterized in that the thermally decomposed boron nitride film contains 0.001 atom% or more and 3 atom% or less. Oxygen. 如請求項1所述的耐熱基材,其中,前述熱分解氮化硼膜的密度為2.00g/cm3以上且2.20g/cm3以下。 The heat-resistant substrate according to claim 1, wherein the thermal decomposition boron nitride film has a density of 2.00 g/cm 3 or more and 2.20 g/cm 3 or less. 如請求項1或2所述的耐熱基材,其中,前述基材為石墨、碳/碳複合材料、熱分解石墨、碳化矽、鎢及鉭中的任一種。 The heat resistant substrate according to claim 1 or 2, wherein the substrate is any one of graphite, a carbon/carbon composite material, thermally decomposed graphite, tantalum carbide, tungsten, and rhenium. 一種耐熱基材的製造方法,是製造耐熱基材的方法,其利用原料氣體,並藉由化學氣相沉積法,將熱分解氮化硼膜包覆於基材表面上來製造耐熱基材,該原料氣體包括含有氮原子之氣體與含有硼原子之氣體,該耐熱基材的製造方法的特徵在於:藉由將含有氧原子之氣體混入至前述原料氣體中,而使前述熱分解氮化硼膜中含有0.001atom%以上且3atom%以下的氧。 A method for producing a heat-resistant substrate, which is a method for producing a heat-resistant substrate, which uses a raw material gas and coats a thermally decomposed boron nitride film on a surface of a substrate by a chemical vapor deposition method to produce a heat-resistant substrate. The material gas includes a gas containing a nitrogen atom and a gas containing a boron atom, and the method for producing the heat resistant substrate is characterized in that the thermally decomposed boron nitride film is formed by mixing a gas containing an oxygen atom into the material gas. It contains 0.001 atom% or more and 3 atom% or less of oxygen.
TW105109917A 2015-04-22 2016-03-29 Thermo-resistant substrate and method for manufacturing same Part or the entire surface of the substrate is covered with thermal decomposed boron nitride film TW201700767A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015087575A JP2016204704A (en) 2015-04-22 2015-04-22 Heat proof substrate, and manufacturing method thereof

Publications (1)

Publication Number Publication Date
TW201700767A true TW201700767A (en) 2017-01-01

Family

ID=57486805

Family Applications (1)

Application Number Title Priority Date Filing Date
TW105109917A TW201700767A (en) 2015-04-22 2016-03-29 Thermo-resistant substrate and method for manufacturing same Part or the entire surface of the substrate is covered with thermal decomposed boron nitride film

Country Status (2)

Country Link
JP (1) JP2016204704A (en)
TW (1) TW201700767A (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63104671A (en) * 1986-10-23 1988-05-10 Asahi Glass Co Ltd Metal coating nozzle
US6670025B2 (en) * 2001-05-24 2003-12-30 General Electric Company Pyrolytic boron nitride crucible and method

Also Published As

Publication number Publication date
JP2016204704A (en) 2016-12-08

Similar Documents

Publication Publication Date Title
TWI541375B (en) Formed sic product and method for producing the same
KR20120138636A (en) Ceramic heater
JP3779314B1 (en) Tantalum carbide-coated carbon material and method for producing the same
Nyutu et al. Formation of MoSi2–SiO2 coatings on molybdenum substrates by CVD/MOCVD
TW201704519A (en) Heat generation element and method for producing same
JP2010228965A (en) Corrosion resistant member
CN104495814A (en) Intercalation preparation method of graphene
KR20110084520A (en) Catalyst chemical vapor deposition apparatus
JP4856010B2 (en) Catalytic chemical vapor deposition system
Pedersen et al. On the effect of water and oxygen in chemical vapor deposition of boron nitride
TW201700767A (en) Thermo-resistant substrate and method for manufacturing same Part or the entire surface of the substrate is covered with thermal decomposed boron nitride film
JP6388515B2 (en) Method for producing pyrolytic carbon-coated graphite member
JPH05254808A (en) Preparation of boron nitride
KR101947485B1 (en) Method for SiC Coating of Graphite Base Substrate
JP4736076B2 (en) SiC film-covered glassy carbon material and method for producing the same
US8440566B2 (en) Method for forming an aluminum nitride thin film
Ye et al. Hexagonal boron nitride from a borazine precursor for coating of SiBNC fibers using a continuous atmospheric pressure CVD process
US9523157B2 (en) Method for growing an AIN monocrystal and device for implementing same
TW202003912A (en) Chemical vapor deposition apparatus and method of forming a film
Soler et al. Hot-wire chemical vapor deposition of few-layer graphene on copper substrates
JP2016113338A (en) Thermal decomposition boron nitride member and method for manufacturing the same
Hao et al. Cl2 corrosion resistance of SiC coatings with different morphologies
JP5876259B2 (en) Method for manufacturing member covered with aluminum nitride film
JP2014166957A5 (en)
Ye et al. Deposition of Hexagonal Boron Nitride from N‐Trimethylborazine (TMB) for Continuous CVD Coating of SiBNC Fibers