TW201631285A - Decompression drying apparatus and substrate processing system - Google Patents

Decompression drying apparatus and substrate processing system Download PDF

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TW201631285A
TW201631285A TW105101208A TW105101208A TW201631285A TW 201631285 A TW201631285 A TW 201631285A TW 105101208 A TW105101208 A TW 105101208A TW 105101208 A TW105101208 A TW 105101208A TW 201631285 A TW201631285 A TW 201631285A
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chamber
decompression
chambers
drying
substrate processing
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伊藤禎彦
池森一博
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東麗工程股份有限公司
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    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F26DRYING
    • F26BDRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
    • F26B5/00Drying solid materials or objects by processes not involving the application of heat
    • F26B5/04Drying solid materials or objects by processes not involving the application of heat by evaporation or sublimation of moisture under reduced pressure, e.g. in a vacuum
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F26DRYING
    • F26BDRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
    • F26B5/00Drying solid materials or objects by processes not involving the application of heat
    • F26B5/04Drying solid materials or objects by processes not involving the application of heat by evaporation or sublimation of moisture under reduced pressure, e.g. in a vacuum
    • F26B5/042Drying solid materials or objects by processes not involving the application of heat by evaporation or sublimation of moisture under reduced pressure, e.g. in a vacuum for drying articles or discrete batches of material in a continuous or semi-continuous operation, e.g. with locks or other air tight arrangements for charging/discharging
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02296Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer
    • H01L21/02318Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
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  • Life Sciences & Earth Sciences (AREA)
  • Molecular Biology (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Drying Of Solid Materials (AREA)

Abstract

An object of the present invention is using a single vacuum pump to correspond to a decompression operation of all chambers in a drying apparatus that is provided for flat substrates and comprises multiple chamber decompression drying device. The solution of the present invention is to provide a decompression drying apparatus, which comprises multiple decompression chambers; a single vacuum pump, which has a gas-drawing opening that is connected to each of the chambers through piping; valves, which control gas draining and decompression condition of each of the chambers and are mounted on the piping to respectively correspond to the chambers; and a control device, which controls each of the valves through a predetermined decompression process.

Description

減壓乾燥裝置及基板處理系統 Vacuum drying device and substrate processing system

本發明有關於一種用以從形成於套接管(ferrule)的細縫噴出塗布液藉此將塗布液塗布至基板並將該基板予以乾燥之基板處理系統,尤其有關於一種用以將基板上的塗布液予以乾燥之乾燥裝置以及使用該乾燥裝置之基板處理系統。 The present invention relates to a substrate processing system for spraying a coating liquid from a slit formed in a ferrule, thereby applying a coating liquid to a substrate and drying the substrate, and more particularly to a method for using a substrate A drying device for drying the coating liquid and a substrate processing system using the drying device.

以用以對玻璃基板或膜等基板塗布塗布液之裝置而言,已知有一種塗布裝置,係具備有形成有用以噴出塗布液之細縫(silt)的套接管。該塗布裝置係具備有:槽,係儲留塗布液;以及塗布液供給泵,係用以將該槽內的塗布液供給達至套接管的細縫。 In an apparatus for applying a coating liquid to a substrate such as a glass substrate or a film, there is known a coating apparatus including a ferrule formed with a slit for discharging a coating liquid. The coating apparatus includes a tank for storing a coating liquid, and a coating liquid supply pump for supplying the coating liquid in the tank to a slit of the ferrule.

前述套接管的前述細縫係沿著基板的寬度方向長形地形成,並一邊使套接管水平地與前述基板相對移動,一邊從前述細縫將塗布液噴出至載置於台(stage)上的基板,藉 此於前述基板的表面形成塗布液的薄膜(塗膜)。 The slit of the ferrule is formed to be elongated along the width direction of the substrate, and the coating liquid is ejected from the slit to the stage while the ferrule is horizontally moved relative to the substrate. Substrate This forms a film (coating film) of the coating liquid on the surface of the aforementioned substrate.

近來亦提供有一種塗布液,係改良塗布液的特性,且前述塗布裝置所為之塗布速度係提升至200mm/sec以上。針對使用此種高速塗布液之塗布,在塗布裝置中需藉由塗布液供給泵及塗布控制系統的改良來對應,但在乾燥裝置尤其是減壓乾燥裝置中,大幅地縮短乾燥時間係需要急速地減壓,而在進行急速減壓之情形中,由於乾燥時的氣流會影響塗膜的均勻度,因此難以以單純的減壓速度的增加來對應。 Recently, a coating liquid is also provided which improves the characteristics of the coating liquid, and the coating speed of the coating apparatus is raised to 200 mm/sec or more. In the application of such a high-speed coating liquid, it is necessary to improve the coating apparatus by the coating liquid supply pump and the coating control system. However, in the drying apparatus, particularly the vacuum drying apparatus, the drying time is drastically shortened. When the pressure is reduced, the airflow during drying affects the uniformity of the coating film, so it is difficult to cope with the increase in the simple decompression speed.

因此,如專利文獻2所示般,將乾燥裝置的減壓用腔室(chamber)作成多段構成,在各個腔室確保充分的乾燥時間,另一方面,去除最初的一片,在連續塗布中將基板分配至複數個腔室,藉此縮短製程循環時間(process cycle time)。 Therefore, as shown in Patent Document 2, the chamber for decompression of the drying device is configured in a plurality of stages, and sufficient drying time is ensured in each chamber. On the other hand, the first sheet is removed, and in the continuous coating, The substrate is distributed to a plurality of chambers, thereby shortening the process cycle time.

然而,依據專利文獻2所示的乾燥裝置,由於在各個腔室設置真空泵(vacuum pump),並另外設置連接至全部腔室的共通真空泵,因此有使用多個價格高昂的真空泵導致設備成本增加之問題。 However, according to the drying device shown in Patent Document 2, since a vacuum pump is provided in each chamber, and a common vacuum pump connected to all the chambers is additionally provided, the use of a plurality of expensive vacuum pumps results in an increase in equipment cost. problem.

近年來,包含有液晶面板的顯示器機器的價格顯著地降低,為了因應該價格降低,不僅要刪減製造運轉費用 (running cost),為了刪減設備折舊費更需要刪減製造線路的設備費用。 In recent years, the price of a display device including a liquid crystal panel has been remarkably lowered, and in order to reduce the cost of the manufacturing, it is necessary to reduce the manufacturing operation cost. (running cost), in order to reduce the depreciation of equipment, it is necessary to cut the cost of equipment for manufacturing lines.

[先前技術文獻] [Previous Technical Literature]

[專利文獻] [Patent Literature]

專利文獻1:日本特開H09-29167號公報。 Patent Document 1: Japanese Laid-Open Patent Publication No. H09-29167.

專利文獻2:日本特開2012-189303號公報。 Patent Document 2: Japanese Laid-Open Patent Publication No. 2012-189303.

因此,本發明的目的係提供一種即使在用以藉由減壓乾燥法將塗布基板予以乾燥之乾燥裝置成為多段腔室構成之情形中亦能以單獨或比腔室合計還少數的真空泵連續地進行減壓乾燥之乾燥裝置以及包含有該乾燥裝置之基板處理系統。 Accordingly, it is an object of the present invention to provide a vacuum pump which can be continuously or in combination with a plurality of chambers even in a case where a drying device for drying a coated substrate by a vacuum drying method is constituted as a multi-stage chamber. A drying device that performs drying under reduced pressure and a substrate processing system including the drying device.

本發明的減壓乾燥裝置係藉由搬運裝置將塗布有塗布液的片狀基板搬入至減壓乾燥裝置的腔室內,並因應預先設定的減壓程序(sequence)將前述腔室內予以減壓,藉此將塗布至前述基板的前述塗布液予以乾燥;該減壓乾燥裝置係具備有:複數個減壓用腔室;單一個減壓用泵,係經由配管連接至設置於各個腔室的吸氣口;閥,係分別設置於前述配管,用以使前述減壓用泵動作,藉此控制各個腔室的減壓狀態; 以及控制裝置,係以因應預先設定的減壓程序將各個腔室的減壓狀態予以減壓之方式個別控制各個閥。 In the vacuum drying apparatus of the present invention, the sheet substrate coated with the coating liquid is carried into the chamber of the vacuum drying apparatus by the conveying device, and the chamber is decompressed according to a predetermined decompression sequence. Thereby, the coating liquid applied to the substrate is dried; the vacuum drying apparatus includes a plurality of pressure reducing chambers; and a single pressure reducing pump is connected to the suction chambers provided in the respective chambers via pipes a valve; the valve is respectively disposed in the pipe for operating the decompression pump, thereby controlling the decompression state of each chamber; And the control device individually controls each valve so that the decompressed state of each chamber is decompressed in response to a preset decompression program.

依據本發明的減壓乾燥裝置,不僅可作成用以將單一個或比腔室合計還少數的減壓用泵連接至複數個減壓腔室之基板處理線路構成,並可因應各個腔室預先設定的減壓程序個別地控制經由配管連接至各個腔室之閥,藉此能將真空泵的容量減少成比分別設置於複數個腔室之情形的合計還少,故即使將塗布結束的基板逐一搬入至各個腔室,亦能於各基板連續性地實現依照設計的基板乾燥狀態。藉此,可大幅地降低減壓乾燥裝置的成本。 The vacuum drying apparatus according to the present invention can be constructed not only for the substrate processing circuit for connecting a single or a plurality of decompression pumps which are combined with a plurality of chambers to a plurality of decompression chambers, but also for each chamber in advance. The set pressure reduction program individually controls the valves connected to the respective chambers via the pipes, whereby the capacity of the vacuum pump can be reduced to be smaller than the total of the cases in which the plurality of chambers are respectively disposed, so that even the substrates after the coating are finished one by one. By moving into each chamber, it is also possible to continuously realize the dry state of the substrate according to the design on each substrate. Thereby, the cost of the vacuum drying apparatus can be greatly reduced.

此外,本發明的閥為閥開閉角度控制式閥,並藉由閥開閉角度來控制腔室內的減壓狀態。 Further, the valve of the present invention is a valve opening and closing angle control type valve, and the pressure reducing state in the chamber is controlled by the valve opening and closing angle.

如此,由於能藉由閥開閉角度控制閥的流量,因此可細微地調整各個閥的排氣力,而能因應預先設定的減壓程序控制各個腔室的減壓狀態。 In this way, since the flow rate of the valve can be controlled by the valve opening and closing angle, the exhaust force of each valve can be finely adjusted, and the decompression state of each chamber can be controlled in accordance with a preset decompression program.

此外,本發明的第二實施形態的減壓乾燥裝置係藉由搬運裝置將塗布有塗布液的片狀基板搬入至減壓乾燥裝置的腔室內,並因應預先設定的減壓程序將前述腔室內予以減壓,藉此將塗布至前述基板的前述塗布液予以乾燥;該減壓乾燥裝置係具備有:複數個減壓用腔室;單一個減壓用泵, 其吸氣口係經由配管連接至各個腔室;調節器(regulator),係分別設置於前述配管,並使前述減壓用泵動作,藉此控制各個腔室的減壓狀態;控制裝置,係以因應設定於前述各個腔室的減壓程序個別控制前述調節器;以及閥,係對應前述腔室並分別設置於前述配管,用以控制朝向前述各個腔室的氣流。 Further, in the vacuum drying apparatus according to the second embodiment of the present invention, the sheet substrate coated with the coating liquid is carried into the chamber of the vacuum drying apparatus by the conveying device, and the chamber is opened in accordance with a preset pressure reducing program. The coating liquid applied to the substrate is dried by decompression, and the vacuum drying apparatus includes a plurality of pressure reducing chambers and a single pressure reducing pump. The intake port is connected to each chamber via a pipe; regulators are respectively disposed in the pipe, and the decompression pump is operated to control the decompression state of each chamber; the control device is The regulators are individually controlled in response to a decompression program set in each of the chambers; and valves are provided corresponding to the chambers and are respectively disposed in the piping to control airflow toward the respective chambers.

依據本發明的第二實施形態的減壓乾燥裝置,藉由將調節器使用於減壓狀態的控制,能更正確地控制各個腔室的減壓狀態。 According to the vacuum drying apparatus of the second embodiment of the present invention, the pressure reducing state of each chamber can be more accurately controlled by using the regulator for the control of the reduced pressure state.

本發明的基板處理系統係具有複數個具有塗布乾燥裝置之片狀基板處理線路,該塗布乾燥裝置係藉由塗布裝置將塗布液塗布至片狀基板,接著將經過塗布的前述片狀基板搬入至具有至少一個減壓用腔室的乾燥裝置,並因應設定於前述腔室的減壓程序將腔室內予以減壓,藉此進行減壓乾燥,並在乾燥結束後搬出至下個步驟;該基板處理系統係具備有:複數個減壓用泵,係用以進行前述減壓乾燥,且總數比基板處理系統所含有的全部的乾燥裝置的腔室數量的合計還少;配管,係以前述減壓用泵可連接至全部的腔室之方式設置;以及複數個閥,係經由前述配管連接至前述腔室,用以進行前述複數個減壓用泵的連接切換。 The substrate processing system of the present invention has a plurality of sheet substrate processing lines having a coating and drying device which applies a coating liquid to a sheet substrate by a coating device, and then carries the coated sheet substrate into the coating substrate. a drying device having at least one decompression chamber, and decompressing the chamber in accordance with a decompression program set in the chamber, thereby performing vacuum drying, and carrying out the drying to the next step; the substrate The processing system includes a plurality of decompression pumps for performing the decompression drying, and the total number of chambers is smaller than the total number of chambers of all the drying devices included in the substrate processing system; The pressure pump is connectable to all of the chambers; and a plurality of valves are connected to the chamber via the piping for performing the connection switching of the plurality of pressure reducing pumps.

依據本發明的基板處理系統,由於在分別包含有減壓 乾燥裝置的複數個基板處理線路間共用減壓用泵,因此與於各個減壓乾燥裝置分配並連接特定的減壓用泵之基板處理系統相比,即使在製程循環時間變慢之情形中,亦能藉由將未稼動的減壓用泵追加連接至減壓用泵需要追加的基板處理線路來維持循環時間,並可減少所設置的減壓用泵的台數,從而能降低基板處理系統的成本。 The substrate processing system according to the present invention includes decompression Since the decompression pump is shared between the plurality of substrate processing lines of the drying device, the substrate processing system that distributes and connects the specific decompression pump to each of the decompression drying devices is used, even in the case where the process cycle time is slow. It is also possible to maintain the cycle time by additionally connecting the undecompressed decompression pump to the substrate processing line to be added to the decompression pump, and to reduce the number of decompression pumps provided, thereby reducing the substrate processing system. the cost of.

本發明的基板處理系統中的閥中之至少與全部的乾燥裝置的腔室數量的合計相同數量的閥係具有流量控制功能,且至少一個具有流量控制功能的閥係連接至各個腔室。 The valve of the substrate processing system of the present invention has at least the same number of chambers as the total number of chambers of the drying device having a flow control function, and at least one valve system having a flow control function is connected to each chamber.

藉此,能因應預先設定的減壓程序藉由控制裝置將各個腔室予以減壓。 Thereby, each chamber can be decompressed by the control device in response to a preset decompression program.

本發明第二實施形態的基板處理系統係具有複數個具有塗布乾燥裝置之片狀基板處理線路,該塗布乾燥裝置係藉由塗布裝置將塗布液塗布至片狀基板,接著將經過塗布的前述片狀基板搬入至具有至少一個減壓用腔室的乾燥裝置,並因應設定於前述腔室的減壓程序將腔室內予以減壓,藉此進行減壓乾燥,並在乾燥結束後搬出至下個步驟;該基板處理系統係具備有:複數個減壓用泵,係用以進行前述減壓乾燥,且總數比基板處理系統所含有的全部的乾燥裝置的腔室數量的合計還少;配管,係以前述減壓用泵可連接至全部的腔室之方式設置;複數個閥,係經由前述配管連接至前述腔室,用以進行前述複數個減壓用泵的連 接切換;調節器,係設置於各個腔室,用以控制各個腔室的減壓狀態;以及控制裝置,係因應設定於前述腔室的減壓程序將各個腔室內予以減壓。 A substrate processing system according to a second embodiment of the present invention includes a plurality of sheet-like substrate processing lines having a coating and drying device that applies a coating liquid to a sheet substrate by a coating device, and then applies the coated sheet. The substrate is carried into a drying device having at least one decompression chamber, and the chamber is decompressed in accordance with a decompression program set in the chamber, thereby drying under reduced pressure, and then moving out to the next after drying is completed. The substrate processing system includes a plurality of pressure reducing pumps for performing the vacuum drying, and the total number of chambers is smaller than the total number of chambers of all the drying devices included in the substrate processing system; The pressure reducing pump is connectable to all of the chambers; a plurality of valves are connected to the chamber via the piping for performing the foregoing plurality of pressure reducing pumps The switch is arranged in each chamber to control the decompression state of each chamber; and the control device decompresses each chamber according to a decompression program set in the chamber.

依據本發明的第二實施形態的基板處理系統,藉由將調節器使用於減壓狀態的控制,能更正確地控制各個腔室的減壓狀態。 According to the substrate processing system of the second embodiment of the present invention, the pressure reducing state of each chamber can be more accurately controlled by using the regulator for the control of the reduced pressure state.

本發明第三實施形態的基板處理系統係具有複數個具有塗布乾燥裝置之片狀基板處理線路,該塗布乾燥裝置係藉由塗布裝置將塗布液塗布至片狀基板,接著將經過塗布的前述片狀基板搬入至具有至少一個減壓用腔室的乾燥裝置,並因應設定於前述腔室的減壓程序將腔室內予以減壓,藉此進行減壓乾燥,並在乾燥結束後搬出至下個步驟;該基板處理系統係具備有:複數個減壓用泵,係用以進行前述減壓乾燥,且總數比基板處理系統所含有的全部的乾燥裝置的腔室數量的合計還少;配管,係以前述減壓用泵可連接至全部的腔室之方式設置;複數個閥,係經由前述配管連接至前述腔室,用以進行前述複數個減壓用泵的連接切換;控制裝置,係因應設定於前述腔室的減壓程序將各個腔室內予以減壓;以及減壓用緩衝槽,係設置於至少一個前述減壓用泵。 A substrate processing system according to a third embodiment of the present invention includes a plurality of sheet-like substrate processing lines having a coating and drying device that applies a coating liquid to a sheet substrate by a coating device, and then applies the coated sheet. The substrate is carried into a drying device having at least one decompression chamber, and the chamber is decompressed in accordance with a decompression program set in the chamber, thereby drying under reduced pressure, and then moving out to the next after drying is completed. The substrate processing system includes a plurality of pressure reducing pumps for performing the vacuum drying, and the total number of chambers is smaller than the total number of chambers of all the drying devices included in the substrate processing system; Provided that the pressure reducing pump is connectable to all of the chambers; a plurality of valves are connected to the chamber via the piping for performing switching connection of the plurality of pressure reducing pumps; and a control device The respective chambers are decompressed in accordance with a decompression program set in the chamber; and a decompression buffer tank is provided in at least one of the decompression pumps.

依據本發明第三實施形態的基板處理系統,主要能區 分成固定地連接至各個基板處理線路的減壓乾燥裝置之減壓用泵、以及必要時臨時地連接至減壓乾燥裝置之減壓用泵(臨時連接用減壓泵),並可藉由於該臨時連接用減壓泵設置緩衝槽來調整減壓力,而能大幅地減少所設置的減壓用泵的台數。 The substrate processing system according to the third embodiment of the present invention, the main energy region a pressure reducing pump that is fixedly connected to a vacuum drying device of each substrate processing line, and a decompression pump (temporary connection decompression pump) that is temporarily connected to the vacuum drying device as needed, and The temporary connection decompression pump is provided with a buffer tank to adjust the depressurization pressure, and the number of decompression pumps to be installed can be greatly reduced.

依據本發明,在包含有針對基板的塗布步驟以及接續於該塗布步驟的乾燥步驟之基板處理系統中,不會降低乾燥步驟中的基板乾燥品質,且能從現行的一台腔室對應一台減壓乾燥用泵之構成使乾燥步驟中所使用的一台減壓乾燥裝置中的減壓乾燥用泵台數減少,而能大幅地減少基板處理系統的設備成本。 According to the present invention, in the substrate processing system including the coating step for the substrate and the drying step following the coating step, the drying quality of the substrate in the drying step is not lowered, and one chamber can be used from the current one chamber. The configuration of the vacuum drying pump reduces the number of pumps for vacuum drying in one of the vacuum drying apparatuses used in the drying step, and the equipment cost of the substrate processing system can be greatly reduced.

1、40‧‧‧減壓乾燥裝置 1, 40‧‧‧ decompression drying device

2a至2c、2aa至2bc‧‧‧腔室 2a to 2c, 2aa to 2bc‧‧‧ chamber

3‧‧‧機器人 3‧‧‧ Robot

4、4a、4b、4ab‧‧‧真空泵 4, 4a, 4b, 4ab‧‧‧ vacuum pump

21‧‧‧腔室蓋 21‧‧‧ chamber cover

22‧‧‧腔室容器 22‧‧‧Cell container

23、26、28‧‧‧閥 23, 26, 28‧‧‧ valves

24‧‧‧調整器 24‧‧‧ adjuster

25‧‧‧配管 25‧‧‧Pipe

27‧‧‧緩衝槽 27‧‧‧buffer tank

30、30a、30b、40、40a、40b‧‧‧減壓乾燥裝置 30, 30a, 30b, 40, 40a, 40b‧‧‧ decompression drying device

31‧‧‧機器人手臂 31‧‧‧Robot arm

32‧‧‧基板 32‧‧‧Substrate

55、56、57‧‧‧基板處理系統 55, 56, 57‧‧‧ substrate processing system

101a、101b‧‧‧基板處理線路 101a, 101b‧‧‧ substrate processing circuit

圖1係顯示本發明的減壓乾燥裝置的實施形態之一的概略立體圖。 Fig. 1 is a schematic perspective view showing one embodiment of the vacuum drying apparatus of the present invention.

圖2係顯示用以表示基板的乾燥時間與腔室內壓的關係之圖表以及腔室內壓與閥的開度之圖。 Fig. 2 is a graph showing the relationship between the drying time of the substrate and the pressure in the chamber, and the pressure in the chamber and the opening degree of the valve.

圖3係顯示製程循環與乾燥循環的關係之圖表。 Figure 3 is a graph showing the relationship between the process cycle and the drying cycle.

圖4係顯示本發明的減壓乾燥裝置的其他實施形態之概略立體圖。 Fig. 4 is a schematic perspective view showing another embodiment of the reduced-pressure drying apparatus of the present invention.

圖5係顯示本發明的基板處理系統的實施形態之一的概略立體圖。 Fig. 5 is a schematic perspective view showing one embodiment of the substrate processing system of the present invention.

圖6係顯示複數個基板處理線路中的製程循環與乾燥循環的關係之圖表。 Figure 6 is a graph showing the relationship between a process cycle and a drying cycle in a plurality of substrate processing lines.

圖7係顯示本發明的基板處理系統的第二實施形態之概略立體圖。 Fig. 7 is a schematic perspective view showing a second embodiment of the substrate processing system of the present invention.

圖8係顯示本發明的基板處理系統的第三實施形態的概略立體圖。 Fig. 8 is a schematic perspective view showing a third embodiment of the substrate processing system of the present invention.

以下,依據圖式說明本發明的實施形態。 Hereinafter, embodiments of the present invention will be described based on the drawings.

圖1係顯示本發明的減壓乾燥裝置的實施形態之一的概略立體圖。該減壓乾燥裝置30係藉由搬運裝置將藉由未圖示的塗布裝置於表面形成有塗布膜的基板32搬入至減壓乾燥裝置30的腔室2a至2c的任一者,並將腔室內予以減壓,藉此使基板32的表面的塗布膜乾燥。在此,在本發明中,雖然利用機器人3作為搬運裝置,但亦可利用其他搬運機構,例如亦可利用滾子輸送帶(roller conveyer)或浮式搬運裝置(float transportation)。此外,機器人3並未限定其形式。再者,雖然圖1的實施形態所示的減壓乾燥裝置30為三段腔室構成,但本發明同樣可應用於三段構成以外的複數段腔室構成的減壓乾燥裝置。 Fig. 1 is a schematic perspective view showing one embodiment of the vacuum drying apparatus of the present invention. In the vacuum drying apparatus 30, the substrate 32 having the coating film formed on its surface by a coating device (not shown) is carried into any of the chambers 2a to 2c of the vacuum drying apparatus 30, and the chamber is placed. The inside of the substrate 32 is depressurized to dry the coating film on the surface of the substrate 32. Here, in the present invention, the robot 3 is used as the transport device, but other transport mechanisms may be used. For example, a roller conveyer or a float transport may be used. Further, the robot 3 is not limited in its form. Further, although the vacuum drying apparatus 30 shown in the embodiment of Fig. 1 has a three-stage chamber configuration, the present invention is also applicable to a vacuum drying apparatus including a plurality of chambers other than the three-stage configuration.

本發明的減壓乾燥裝置30係具有腔室2a至2c,且各個腔室係由腔室蓋21及腔室容器22所構成。當機器人3 將積載於機器人手臂(robot hand)31的基板32搬運至減壓乾燥裝置30時,腔室蓋21係藉由未圖示的驅動裝置從與腔室容器22的接觸位置上升。於腔室容器22的內部設置有未圖示的基板承接台以及貫通腔室容器22的底部及前述基板承接台之複數個基板承接構件(亦未圖示),並藉由未圖示的前述驅動裝置進行上升及下降。此外,於前述基板承接台中之與前述基板承接構件不同的位置設置有複數個用以防止乾燥時基板32與前述基板承接台接觸之未圖示的基板保持構件,前述基板承接構件係能下降至比前述基板保持構件還低的位置。另一方面,於前述基板承接構件上升時,前述基板承接構件係能上升至比機器人手臂31的位置還高的位置。 The vacuum drying apparatus 30 of the present invention has chambers 2a to 2c, and each chamber is constituted by a chamber cover 21 and a chamber container 22. When robot 3 When the substrate 32 loaded on the robot hand 31 is transported to the vacuum drying device 30, the chamber cover 21 is raised from the contact position with the chamber container 22 by a driving device (not shown). A substrate receiving base (not shown) and a plurality of substrate receiving members (not shown) that penetrate the bottom of the chamber container 22 and the substrate receiving table are provided inside the chamber container 22, and are not shown in the drawings. The drive unit is raised and lowered. Further, a plurality of substrate holding members (not shown) for preventing the substrate 32 from coming into contact with the substrate receiving table during drying are provided at a position different from the substrate receiving member in the substrate receiving table, and the substrate receiving member can be lowered to A position lower than the aforementioned substrate holding member. On the other hand, when the substrate receiving member is raised, the substrate receiving member can be raised to a position higher than the position of the robot arm 31.

當機器人手臂31進入達至腔室內的規定位置時,前述基板承接構件係上升並保持基板32。同時,機器人手臂31係從腔室內抽離,前述基板承接構件係下降並將基板32傳遞至前述基板保持構件。接著,腔室蓋21下降,在下降結束之同時,腔室開始減壓。在此,於連續基板處理動作時,由於朝腔室2a至2c的基板搬運係針對基板搬出完畢的腔室進行,因此動作說明並未指定特定腔室地進行。 When the robot arm 31 enters a predetermined position in the chamber, the substrate receiving member rises and holds the substrate 32. At the same time, the robot arm 31 is pulled out from the chamber, and the substrate receiving member is lowered and the substrate 32 is transferred to the substrate holding member. Then, the chamber cover 21 is lowered, and at the same time as the end of the lowering, the chamber starts to decompress. Here, in the continuous substrate processing operation, since the substrate transfer system to the chambers 2a to 2c is performed for the chamber in which the substrate is carried out, the operation description is not performed in the specific chamber.

於腔室2a至2c中,為了減壓,於腔室容器22設置有連接至真空泵4之配管25。為了將腔室2a至2c連接至單一個真空泵4,配管25係作成圖1所示的配管構成。此外, 為了於腔室2a至2c的減壓時控制各個腔室的開閉及其排氣流量,於各個腔室的配管25設置有閥23。閥23的內部係具有旋轉閥,如圖2所示的概略構造般,在與流體的流動方向垂直之情形時關閉;在與流動方向平行之情形時全開,且能藉由相對於閥本體之閥的開度來調整流量。 In the chambers 2a to 2c, a piping 25 connected to the vacuum pump 4 is provided in the chamber container 22 for decompression. In order to connect the chambers 2a to 2c to a single vacuum pump 4, the piping 25 is constructed as a piping as shown in Fig. 1. In addition, In order to control the opening and closing of the respective chambers and the flow rate of the exhaust gas during the decompression of the chambers 2a to 2c, a valve 23 is provided in the piping 25 of each chamber. The inside of the valve 23 has a rotary valve which, like the schematic configuration shown in Fig. 2, is closed when it is perpendicular to the flow direction of the fluid; it is fully open when it is parallel to the flow direction, and can be opened relative to the valve body The valve opening is used to adjust the flow.

在此,使用圖2詳細說明減壓乾燥。如圖2所示之「腔室內壓力/時間變化」圖表所示般,在減壓乾燥中並非是直線性地減壓,而是分成幾個階段進行減壓,藉此防止將片狀基板般這種面積較大的對象物予以乾燥時的氣流所導致的乾燥不均。在屬於減壓開始階段之階段1(T0至T1)中,由於急遽的減壓會引起乾燥不均,因此如圖2所示之「各階段的閥開度」所示般,稍微開啟閥23且同時驅動真空泵(4),緩緩地進行減壓對象腔室的減壓。接著,在階段2(T1至T2)中,增加閥23的開度,使減壓速度上升。再者,在階段3(T2至T4)中,為了到達至到達真空度,將閥予以全開。在此,T3係從T2至到達真空度為止的時間,由於閥23為全開狀態,因此規定於階段3。到達真空度的目的在於液體的乾燥,只要數帕斯卡(Pa)即足夠。接著,一定時間地維持到達真空度後,關閉閥23,從圖1中未圖示的配管路徑供給清靜空氣(CDA)或氮氣體N2,將腔室2a內返回至大氣壓後,將腔室蓋21上升,進行基板32的替換。這些一連串的動作(減壓程序)係藉由未圖示的控制裝置進行控制。 Here, the vacuum drying will be described in detail using FIG. 2 . As shown in the graph of "in-chamber pressure/time change" shown in Fig. 2, in the vacuum drying, the pressure is not linearly reduced, but the pressure is reduced in several stages, thereby preventing the sheet substrate. Such a large object is unevenly dried due to the air flow when it is dried. In the stage 1 (T0 to T1) which is the start stage of the decompression, since the rapid decompression causes uneven drying, the valve 23 is slightly opened as shown in the "valve opening degree of each stage" as shown in FIG. At the same time, the vacuum pump (4) is driven, and the pressure reduction of the decompression target chamber is gradually performed. Next, in the phase 2 (T1 to T2), the opening degree of the valve 23 is increased to increase the decompression speed. Furthermore, in stage 3 (T2 to T4), the valve is fully opened in order to reach the degree of vacuum. Here, since T3 is from T2 to the time when the degree of vacuum is reached, since the valve 23 is in the fully open state, it is defined in the stage 3. The purpose of reaching the degree of vacuum is to dry the liquid as long as a few Pascals (Pa) is sufficient. Then, after maintaining the degree of vacuum for a certain period of time, the valve 23 is closed, and the clean air (CDA) or the nitrogen gas N2 is supplied from the piping path (not shown) in FIG. 1, and the inside of the chamber 2a is returned to the atmospheric pressure, and then the chamber cover is closed. 21 is raised, and replacement of the substrate 32 is performed. These series of operations (decompression procedures) are controlled by a control device not shown.

接著,使用圖3說明在使用複數個腔室連續地實施上述循環之情形中各個腔室的處理製程的相關關係。在此,圖3的圖表所示的腔室一、二、三係顯示連續基板處理中的基板搬入的順序,例如腔室一為圖1的腔室2a之情形,腔室二為圖1的腔室2b之情形,腔室三為腔室2c之情形。在基板塗布/乾燥製程中,塗布時間與乾燥時間幾乎未一致,一般而言乾燥時間比塗布時間還長。因此,在連續性地進行基板處理之情形中,在乾燥結束前將下個塗布完畢的基板般入至減壓乾燥裝置。為了與此對應,一般而言於減壓乾燥裝置設置有複數個腔室。圖3係顯示圖1所示的三段腔室構成的減壓乾燥裝置的基板處理圖表的一例。由此可知,三段腔室的全部腔室並未同時變成成為閥全開之圖2的圖表的階段3,且其中的任兩台腔室同時地變成階段3之時間亦非常短。此情形表示即使在三段腔室構成中,真空泵只要具備有最高能同時處理二段分的腔室之能力即足夠。亦即,在前述腔室一為階段3之情形中,前述腔室二為階段1或階段2,前述腔室三為未使用狀態。當腔室二變成階段3時,腔室一係從階段4變成階段5亦即變成閥關閉狀態,腔室三係變成階段1或階段2。再者,當腔室三成為階段3時,腔室二係從階段4變成階段5亦即變成閥關閉狀態,腔室一重新變成階段1或階段2,重複該循環。因此,不會有三段腔室同時地變成階段3之情形。 Next, the correlation of the processing processes of the respective chambers in the case where the above-described cycles are continuously performed using a plurality of chambers will be described using FIG. Here, the chambers one, two, and three of the chambers shown in the graph of FIG. 3 show the order in which the substrates are carried in the continuous substrate processing, for example, the chamber one is the chamber 2a of FIG. 1, and the chamber two is the one of FIG. In the case of the chamber 2b, the chamber 3 is the case of the chamber 2c. In the substrate coating/drying process, the coating time and the drying time are hardly the same, and in general, the drying time is longer than the coating time. Therefore, in the case where the substrate treatment is continuously performed, the next coated substrate is introduced into the vacuum drying apparatus before the end of drying. To cope with this, in general, the vacuum drying apparatus is provided with a plurality of chambers. Fig. 3 is a view showing an example of a substrate processing chart of the vacuum drying apparatus including the three-stage chamber shown in Fig. 1; It can be seen that all of the chambers of the three-stage chamber do not simultaneously become stage 3 of the graph of Fig. 2 in which the valve is fully open, and the time during which any two of the chambers simultaneously become stage 3 is also very short. This case means that even in the configuration of the three-stage chamber, it is sufficient that the vacuum pump has the capability of having the chamber capable of simultaneously processing the two-stage portion at the same time. That is, in the case where the chamber is in the stage 3, the chamber 2 is the stage 1 or the stage 2, and the chamber 3 is in an unused state. When the chamber 2 becomes the stage 3, the chamber changes from the stage 4 to the stage 5, that is, the valve is closed, and the chamber three becomes the stage 1 or the stage 2. Furthermore, when the chamber 3 becomes the stage 3, the chamber second becomes the stage 5 from the stage 4 to the stage 5, and the chamber is again changed to the stage 1 or the stage 2, and the cycle is repeated. Therefore, there is no case where the three-stage chamber simultaneously becomes the stage 3.

當然,圖3係顯示典型的液體的乾燥循環的一例之物,此循環會根據塗布液而改變。然而,一般而言即使塗布液不同,為了防止乾燥不均,屬於緩減壓的階段1係需要一定時間,且屬於急速減壓的階段2係受到腔室容積左右。因此,根據塗布液的種類受到影響者為階段3,針對在階段3朝縮短的方向變更之情形,由於僅是圖表整體朝左邊被壓縮,因此階段3不會重疊。另一方面,針對在階段3朝被延長的方向變更之情形,在可強化真空泵4的能力之情形中以此種方應對應即可;而在真空泵4的能力強化無法對應之情形中,則增加腔室段數或增加減壓乾燥裝置,並配合全體的循環時間。在增加腔室段數或增加減壓乾燥裝置之情形中,只要因應需要增設真空泵即可。亦即,即使如上述般考量所有情況,亦無須於各個腔室設置真空泵。 Of course, Fig. 3 shows an example of a typical liquid drying cycle, which cycle is changed depending on the coating liquid. However, in general, even if the coating liquid is different, in order to prevent uneven drying, the stage 1 which is a slow decompression requires a certain period of time, and the stage 2 which is a rapid decompression is affected by the volume of the chamber. Therefore, the person affected by the type of the coating liquid is the stage 3, and in the case where the stage 3 is changed in the shortening direction, since only the entire chart is compressed toward the left side, the stage 3 does not overlap. On the other hand, in the case where the phase 3 is changed in the direction in which the direction is extended, in the case where the capacity of the vacuum pump 4 can be enhanced, such a square should be used; and in the case where the capacity enhancement of the vacuum pump 4 cannot be matched, Increase the number of chamber sections or increase the decompression drying device and match the overall cycle time. In the case of increasing the number of chamber sections or increasing the decompression drying apparatus, it is only necessary to add a vacuum pump as needed. That is, even if all the conditions are considered as described above, it is not necessary to provide a vacuum pump in each chamber.

圖4係示意性地顯示圖1的減壓乾燥裝置的變化實施例。與圖1的構成不同,在圖3的減壓乾燥裝置40中,於各個腔室2a至2c中,於配管25設置有調節器24。在此構成中,閥23係僅單純地具有開/閉的功能,流量調整係由調節器24所進行。關於調節器24的設置位置,除了圖4的例子之外亦可設置於比閥23還接近腔室側。在圖1的構成中以具有圖2所示般的旋轉閥之閥進行流量調整之情形中,開度與流量不一定會顯示出一次函數關係,因此需要 藉由事前測試預先調整設定值。因此,在頻繁地進行塗布液交換(亦即製造品種變更)之情形中,有條件設定耗時之可能性。因此,利用調節器,不僅能在塗布液交換時等迅速地對應,只要利用減壓動作專用調節器,則可進行更精密地流量設定。 Fig. 4 is a view schematically showing a modified embodiment of the reduced-pressure drying apparatus of Fig. 1. Unlike the configuration of FIG. 1, in the vacuum drying apparatus 40 of FIG. 3, the regulator 24 is provided in the piping 25 in each of the chambers 2a to 2c. In this configuration, the valve 23 has only a function of opening/closing, and the flow rate adjustment is performed by the regulator 24. Regarding the installation position of the regulator 24, in addition to the example of Fig. 4, it may be disposed closer to the chamber side than the valve 23. In the configuration of Fig. 1, in the case where the flow rate is adjusted by the valve having the rotary valve as shown in Fig. 2, the opening degree and the flow rate do not necessarily exhibit a linear function relationship, and therefore it is necessary The set value is adjusted in advance by an ex ante test. Therefore, in the case where the coating liquid exchange (i.e., the manufacturing type change) is frequently performed, it is possible to set the possibility of time consuming. Therefore, the regulator can not only quickly respond to the exchange of the coating liquid or the like, but can also perform more precise flow rate setting by using the regulator for the decompression operation.

接著,使用圖5至圖6,說明在具有複數個包含有圖1所示的本發明的減壓乾燥裝置的基板處理線路之基板處理系統中,應用圖1至圖4所示的本發明的減壓乾燥裝置,在系統整體中將設備予以簡化之實施例。圖5係由包含有本發明的減壓乾燥裝置之複數個基板處理線路所構成的基板處理系統的一實施例。基板處理系統係在例如為液晶面板的情形時具有5至6條基板處理線路,各個基板處理線路係由洗淨→乾燥→塗布→乾燥→預焙(prebake)→曝光→顯像/蝕刻→洗淨→烘焙(bake)之步驟所構成。在此為了簡略說明,圖5以後的基板處理系統係描繪成以元件符號101a及101b所示的二線路構成,且裝置亦與圖1同樣地僅顯示搬入機器人及減壓乾燥裝置。基板處理線路101a、101b的減壓乾燥裝置30a、30b的各個單體係與圖1所示的減壓乾燥裝置30相同的構成,裝置構成的詳細說明係省略。在圖5的基板處理系統55中設置有新的真空泵4ab,經由藉由閥26所分歧的配管25連接至各個腔室2aa至2bc。在此,閥26僅控制連接至腔室的配管25的開/閉,並不控制排氣流量。此外,以閥的型式而言雖然需要使用四通閥,但 驅動方式可為空壓開閉或電磁開閉中的任一種。在圖5的基板處理系統55中,從閥26伸出的配管係相對於閥23在與腔室相反側(亦即真空泵側)中與來自真空泵4a或真空泵4b的配管結合。在圖5的構成中,為了對應排氣的控制,閥26需要連接至真空泵側。此外,為了不使真空泵4a、4b承受過重的負載,進一步設置有閥28,並區分以真空泵4a、4b與真空泵4ab進行減壓之腔室(2aa至2bc的任一者)。其理由如下。 Next, a substrate processing system having a plurality of substrate processing lines including the vacuum drying apparatus of the present invention shown in FIG. 1 will be described with reference to FIGS. 5 to 6, using the present invention shown in FIGS. 1 to 4. The vacuum drying apparatus is an embodiment in which the apparatus is simplified in the entire system. Fig. 5 is an embodiment of a substrate processing system comprising a plurality of substrate processing lines including the reduced-pressure drying apparatus of the present invention. The substrate processing system has 5 to 6 substrate processing lines in the case of, for example, a liquid crystal panel, and each substrate processing circuit is washed, dried, coated, dried, prebaked, exposed, developed, imaged, and etched. It consists of a net → bake step. For the sake of brevity, the substrate processing system of FIG. 5 and later is depicted as two lines shown by the reference numerals 101a and 101b, and the apparatus only displays the loading robot and the vacuum drying apparatus in the same manner as in FIG. The respective systems of the vacuum drying apparatuses 30a and 30b of the substrate processing lines 101a and 101b have the same configuration as the vacuum drying apparatus 30 shown in Fig. 1, and detailed description of the apparatus configuration is omitted. A new vacuum pump 4ab is provided in the substrate processing system 55 of FIG. 5, and is connected to the respective chambers 2aa to 2bc via a pipe 25 branched by the valve 26. Here, the valve 26 controls only the opening/closing of the pipe 25 connected to the chamber, and does not control the exhaust gas flow rate. In addition, although the valve type requires the use of a four-way valve, The driving method may be any one of air pressure opening and closing or electromagnetic opening and closing. In the substrate processing system 55 of Fig. 5, the piping extending from the valve 26 is coupled to the piping from the vacuum pump 4a or the vacuum pump 4b in the opposite side of the chamber (i.e., the vacuum pump side) with respect to the valve 23. In the configuration of Fig. 5, in order to correspond to the control of the exhaust gas, the valve 26 needs to be connected to the vacuum pump side. Further, in order to prevent the vacuum pumps 4a and 4b from being subjected to an excessive load, the valve 28 is further provided, and the chambers (2aa to 2bc) which are decompressed by the vacuum pumps 4a and 4b and the vacuum pump 4ab are distinguished. The reason is as follows.

在來自真空泵4ab的配管在真空泵側連接至閥23之情形中,真空泵4a或真空泵4b亦相對於真空泵4ab所進行減壓的腔室(2aa至2bc的任一者)成為連接狀態。在此情形中,難以預測對於真空泵的負載造成何種影響,最壞的情況有因為過度負載導致真空泵4a及真空泵4b任一者或雙方停止之危險性。因此,為了防止此種事態,於真空泵4a及真空泵4b與來自真空泵4ab的配管連接部之間進一步設置有閥28,藉此防止真空泵4a或真空泵4b相對於真空泵4ab所減壓之前述腔室(2aa至2bc的任一者中連接有真空泵4ab者)成為連接狀態。 In the case where the piping from the vacuum pump 4ab is connected to the valve 23 on the vacuum pump side, the vacuum pump 4a or the vacuum pump 4b is also connected to the chamber (2aa to 2bc) which is decompressed by the vacuum pump 4ab. In this case, it is difficult to predict what kind of influence is exerted on the load of the vacuum pump, and the worst case is the risk of stopping either or both of the vacuum pump 4a and the vacuum pump 4b due to excessive load. Therefore, in order to prevent such a situation, a valve 28 is further provided between the vacuum pump 4a and the vacuum pump 4b and the piping connection portion from the vacuum pump 4ab, thereby preventing the vacuum pump 4a or the vacuum pump 4b from being decompressed with respect to the chamber of the vacuum pump 4ab ( A vacuum pump 4ab is connected to any of 2aa to 2bc) to be in a connected state.

圖6係說明相對於圖5所示的基板處理系統55,在連續進行基板處理的情形中的各個基板處理線路的各個腔室間的製程相關關係。為了容易理解說明,各個線路的起點與塗布循環/乾燥循環係設成相同。在此,線路一及線路 二係為了顯示基板處理的順序而簡單定義的名稱,亦可為圖5的基板處理線路101a、101b的任一者;圖6的圖表所示的腔室一、二、三係用以表示連續基板處理中的基板搬入的順序,例如在線路一為圖5的基板處理線路101a且腔室一為腔室2aa之情形中,腔室二為腔室2ab,腔室三為腔室2bc。從圖6可知,在圖表上被縱線夾著的區域x中,真空泵的負載變成最大。在此,雖然可於各個基板處理線路101a、101b的減壓乾燥裝置30a、30b追加真空泵,但針對圖6所示未處於全開狀態的線路的腔室三連接追加的真空泵4ab,藉此可將真空泵4a、4b限定至僅分別與二腔室分的最大負載對應的能力。當然,亦可因應減壓負載及乾燥循環設置複數個真空泵4ab。 Fig. 6 is a view showing the process-related relationship between the respective chambers of the respective substrate processing lines in the case where the substrate processing is continuously performed with respect to the substrate processing system 55 shown in Fig. 5. For easy understanding of the description, the starting point of each line is set to be the same as the coating cycle/drying cycle. Here, line one and line The names that are simply defined in order to display the order of the substrate processing may be any of the substrate processing lines 101a and 101b of FIG. 5; the chambers one, two, and three of the chambers shown in the graph of FIG. 6 are used to indicate continuous In the case where the substrate is carried in the substrate processing, for example, in the case where the line one is the substrate processing line 101a of FIG. 5 and the chamber one is the chamber 2aa, the chamber 2 is the chamber 2ab, and the chamber 3 is the chamber 2bc. As can be seen from Fig. 6, in the region x sandwiched by the vertical line on the graph, the load of the vacuum pump becomes maximum. Here, although the vacuum pump can be added to the vacuum drying apparatuses 30a and 30b of the respective substrate processing lines 101a and 101b, the additional vacuum pump 4ab is connected to the chamber 3 of the line which is not in the fully open state as shown in FIG. The vacuum pumps 4a, 4b are limited to the capacity corresponding only to the maximum load of the two chambers, respectively. Of course, a plurality of vacuum pumps 4ab can also be provided in response to the reduced pressure load and the drying cycle.

以圖6的基板處理系統的變化例而言,可構成為與相對於圖1的減壓乾燥裝置之圖4的減壓乾燥裝置相同,且如圖7的實施例的基板處理系統56般利用調節器。由於構成圖7的基板處理系統56之各個基板處理線路101a、101b的減壓乾燥裝置40a、40b的構成係與圖4的減壓乾燥裝置40相同,因此省略重複部分的說明。在此,在針對圖1的減壓乾燥裝置30追加有調節器24之圖4的減壓乾燥裝置40之情形中,調節器24的設置位置無論是在閥的前後何者皆可;而在圖7的實施例中,需要設置於比閥23還靠近腔室側,且來自真空泵4ab的配管係需要在閥23與調節器24之間連接至朝向腔室2aa至2bc的配管25。此種對配管 與機器的配置產生限制之理由如下。 A variation of the substrate processing system of FIG. 6 can be configured as the vacuum drying apparatus of FIG. 4 with respect to the vacuum drying apparatus of FIG. 1, and can be utilized as the substrate processing system 56 of the embodiment of FIG. Regulator. Since the configurations of the vacuum drying apparatuses 40a and 40b constituting the respective substrate processing lines 101a and 101b of the substrate processing system 56 of Fig. 7 are the same as those of the vacuum drying apparatus 40 of Fig. 4, the description of the overlapping portions will be omitted. Here, in the case of the vacuum drying apparatus 40 of FIG. 4 in which the regulator 24 is added to the vacuum drying apparatus 30 of FIG. 1, the setting position of the regulator 24 can be performed before and after the valve; In the embodiment of Fig. 7, it is necessary to be disposed closer to the chamber than the valve 23, and the piping from the vacuum pump 4ab needs to be connected between the valve 23 and the regulator 24 to the piping 25 facing the chambers 2aa to 2bc. Such pair of piping The reasons for the limitation with the configuration of the machine are as follows.

如圖6的圖表所示般,在區域x中,真空泵4a、4b係分別進行二台腔室(2aa至2bc的任一者)的減壓。在此狀態下,當來自真空泵4ab的配管在真空泵側連接至閥23時,為了將剩餘之處於階段1或階段2的腔室(2aa至2bc的任一者中連接有真空泵4ab者)予以減壓,閥23係成為開狀態,結果變成連接至真空泵4a、4b。在此情形中,難以預測對於真空泵的負載造成何種影響,最壞的情況有因為過度負載導致真空泵4a及真空泵4b任一者或雙方停止之危險性。因此,為了防止此種事態,來自真空泵4ab的配管係在閥23與調節器24之間連接至朝向腔室的配管,且該部位的閥23需要設定成關閉。 As shown in the graph of Fig. 6, in the region x, the vacuum pumps 4a and 4b perform decompression of the two chambers (any of 2aa to 2bc). In this state, when the piping from the vacuum pump 4ab is connected to the valve 23 on the vacuum pump side, in order to reduce the remaining chambers in the stage 1 or the stage 2 (the vacuum pump 4ab is connected to any of 2aa to 2bc) When the pressure is applied, the valve 23 is opened, and as a result, it is connected to the vacuum pumps 4a and 4b. In this case, it is difficult to predict what kind of influence is exerted on the load of the vacuum pump, and the worst case is the risk of stopping either or both of the vacuum pump 4a and the vacuum pump 4b due to excessive load. Therefore, in order to prevent such a situation, the piping from the vacuum pump 4ab is connected between the valve 23 and the regulator 24 to the piping facing the chamber, and the valve 23 at this portion needs to be set to be closed.

圖8係顯示圖5的基板處理系統的變化例的不同實施例。在圖8的基板處理系統57中,基板處理線路101a、101b共用的真空泵4ab係具備有緩衝槽27。設置緩衝槽27並將緩衝槽27內預先減壓,藉此真空泵4ab能增大真空容量。因此,能將真空泵4ab的能力設定成比計算上所導出者還低。如此,可進一步減少基板處理系統57的設備成本。 Figure 8 is a diagram showing different embodiments of variations of the substrate processing system of Figure 5. In the substrate processing system 57 of FIG. 8, the vacuum pump 4ab common to the substrate processing lines 101a and 101b is provided with a buffer tank 27. The buffer tank 27 is provided and the inside of the buffer tank 27 is depressurized in advance, whereby the vacuum pump 4ab can increase the vacuum capacity. Therefore, the capacity of the vacuum pump 4ab can be set to be lower than that calculated by the calculation. As such, the equipment cost of the substrate processing system 57 can be further reduced.

在圖8中,各個基板處理線路101a、101b亦可為與圖7相同具備有調節器24之構成,亦可為與未使用調節器24的圖5相同的構成。然而,來自真空泵4ab的配管連接位 置係因為與圖7的減壓乾燥裝置的說明所記載的內容相同的理由,而需要作成與圖7相同的構成。 In FIG. 8, each of the substrate processing lines 101a and 101b may have the same configuration as that of FIG. 7, and may have the same configuration as that of FIG. 5 in which the regulator 24 is not used. However, the piping connection position from the vacuum pump 4ab The reason for the same arrangement as that described in the description of the vacuum drying apparatus of Fig. 7 is that it is necessary to have the same configuration as that of Fig. 7 .

以上,依據本發明的各個實施形態的減壓乾燥裝置30或40,即使為具有複數個腔室的減壓乾燥裝置,亦無須設置與腔室的數量相同數量的真空泵,而能提供一種設備成本較低之減壓乾燥裝置。 As described above, according to the vacuum drying apparatus 30 or 40 of each embodiment of the present invention, even if it is a vacuum drying apparatus having a plurality of chambers, it is not necessary to provide the same number of vacuum pumps as the number of chambers, thereby providing an equipment cost. Lower vacuum drying unit.

此外,依據本發明的各個實施形態的基板處理系統55、56、57,將構成基板處理系統之基板處理線路的減壓乾燥裝置的真空泵作成比相同的減壓乾燥裝置的腔室總數還少的數量,且能不會降低系統產量(system throughput)地進行預定的基板乾燥。 Further, according to the substrate processing systems 55, 56, and 57 of the embodiments of the present invention, the vacuum pump of the vacuum drying apparatus constituting the substrate processing line of the substrate processing system is made smaller than the total number of chambers of the same vacuum drying apparatus. The amount and the predetermined substrate drying can be performed without reducing the system throughput.

說明書中所揭示的基板處理系統的實施形態並未因為塗布裝置而有所限制。因此,只要是塗布塗布液並將塗布液乾燥之形式的基板處理系統,則能應用於包括細縫噴嘴塗布機(slit nozzle coater)、旋轉塗布機(spin coater)、噴墨印刷機(ink jet printer)之任意的塗布裝置。此外,關於基板,從使用有液晶等之矩形基板以至於半導體晶圓用的圓形基板皆能對應。此外,塗布液亦無任何限制,只要是能使溶劑蒸發來進行乾燥者,則任意的塗布液皆能對應。 The embodiment of the substrate processing system disclosed in the specification is not limited by the coating device. Therefore, as long as it is a substrate processing system in which a coating liquid is applied and the coating liquid is dried, it can be applied to a slit nozzle coater, a spin coater, an ink jet (ink jet). Any coating device of printer). Further, the substrate can be used from a rectangular substrate using a liquid crystal or the like to a circular substrate for a semiconductor wafer. Further, the coating liquid is not limited in any way, and any coating liquid can be used as long as it can evaporate the solvent and dry it.

因此,本發明的減壓乾燥裝置及基板處理系統係可應 用於包括液晶面板製造裝置、有機EL(electroluminescence;電致發光)面板製造裝置、觸控面板製造裝置、半導體製造裝置之各種產業用途。 Therefore, the vacuum drying apparatus and the substrate processing system of the present invention are It is used in various industrial applications including a liquid crystal panel manufacturing apparatus, an organic EL (electroluminescence) panel manufacturing apparatus, a touch panel manufacturing apparatus, and a semiconductor manufacturing apparatus.

2a至2c‧‧‧腔室 2a to 2c‧‧‧ chamber

3‧‧‧機器人 3‧‧‧ Robot

4‧‧‧真空泵 4‧‧‧vacuum pump

21‧‧‧腔室蓋 21‧‧‧ chamber cover

22‧‧‧腔室容器 22‧‧‧Cell container

23‧‧‧閥 23‧‧‧Valves

25‧‧‧配管 25‧‧‧Pipe

30‧‧‧減壓乾燥裝置 30‧‧‧Decompression drying device

31‧‧‧機器人手臂 31‧‧‧Robot arm

32‧‧‧基板 32‧‧‧Substrate

Claims (7)

一種減壓乾燥裝置,係藉由搬運裝置將塗布有塗布液的片狀基板搬入至腔室內,並因應預先設定的減壓程序將前述腔室內予以減壓,藉此將塗布至前述基板的前述塗布液予以乾燥;該減壓乾燥裝置係具備有:複數個減壓用腔室;單一個減壓用泵,係經由配管連接至設置於各個腔室的吸氣口;閥,係分別設置於前述配管,用以使前述減壓用泵動作,藉此控制各個腔室的減壓狀態;以及控制裝置,係因應預先設定於前述各個腔室的減壓程序個別控制前述閥。 In a vacuum drying apparatus, a sheet substrate coated with a coating liquid is carried into a chamber by a conveying device, and the chamber is depressurized according to a predetermined pressure reducing program, thereby applying the coating to the substrate. The coating liquid is dried; the vacuum drying apparatus includes: a plurality of pressure reducing chambers; and a single pressure reducing pump connected to the air inlets provided in the respective chambers via pipes; the valves are respectively disposed on The piping is configured to operate the decompression pump to control a decompressed state of each chamber, and the control device individually controls the valves in accordance with a decompression program set in advance in each of the chambers. 如請求項1所記載之減壓乾燥裝置,其中前述閥為閥開閉角度控制式閥,並藉由閥開閉角度來控制腔室內的減壓狀態。 The vacuum drying apparatus according to claim 1, wherein the valve is a valve opening and closing angle control type valve, and the pressure reducing state in the chamber is controlled by a valve opening and closing angle. 一種減壓乾燥裝置,係藉由搬運裝置將塗布有塗布液的片狀基板搬入至腔室內,並因應預先設定的減壓程序將前述腔室內予以減壓,藉此將塗布至前述基板的前述塗布液予以乾燥;該減壓乾燥裝置係具備有:複數個減壓用腔室;單一個減壓用泵,其吸氣口係經由配管連接至各個腔室;調節器,係分別設置於前述配管,並使前述減壓用泵動作,藉此控制各個腔室的減壓狀態; 控制裝置,係以因應設定於前述各個腔室的減壓程序個別控制前述調節器;以及閥,係對應前述腔室並分別設置於前述配管,用以控制朝向前述各個腔室的氣流。 In a vacuum drying apparatus, a sheet substrate coated with a coating liquid is carried into a chamber by a conveying device, and the chamber is depressurized according to a predetermined pressure reducing program, thereby applying the coating to the substrate. The coating liquid is dried; the vacuum drying apparatus includes: a plurality of pressure reducing chambers; and a single pressure reducing pump, wherein the suction ports are connected to the respective chambers via pipes; the regulators are respectively disposed in the foregoing Piping, and operating the decompression pump, thereby controlling the decompression state of each chamber; The control device individually controls the regulators in accordance with a decompression program set in each of the chambers, and a valve corresponding to the chambers and provided in the piping to control airflow toward the respective chambers. 一種基板處理系統,係具有複數個具有塗布乾燥裝置之片狀基板處理線路,該塗布乾燥裝置係藉由塗布裝置將塗布液塗布至片狀基板,接著將經過塗布的前述片狀基板搬入至具有至少一個減壓用腔室的乾燥裝置,並因應設定於前述腔室的減壓程序將腔室內予以減壓,藉此進行減壓乾燥,並在乾燥結束後搬出至下個步驟;該基板處理系統係具備有:複數個減壓用泵,係用以進行前述減壓乾燥,且總數比基板處理系統所含有的全部的乾燥裝置的腔室數量的合計還少;配管,係以前述減壓用泵可連接至全部的腔室之方式設置;以及複數個閥,係經由前述配管連接至前述腔室,用以進行前述複數個減壓用泵的連接切換。 A substrate processing system comprising a plurality of sheet substrate processing lines having a coating drying device for applying a coating liquid to a sheet substrate by a coating device, and then loading the coated sheet substrate to have At least one drying device for the decompression chamber, and decompressing the chamber according to a decompression program set in the chamber, thereby performing vacuum drying, and carrying out the drying to the next step after the drying; the substrate processing The system includes a plurality of pressure reducing pumps for performing the reduced pressure drying, and the total number of chambers is smaller than the total number of chambers of all the drying devices included in the substrate processing system; The pump is connectable to all of the chambers; and a plurality of valves are connected to the chamber via the piping for performing the connection switching of the plurality of decompression pumps. 如請求項4所記載之基板處理系統,其中前述配管的前述複數個閥中之至少與全部的乾燥裝置的腔室數量的合計相同數量的閥係有流量控制功能,且至少一個具有流量控制功能的閥係連接至各個腔室。 The substrate processing system according to claim 4, wherein the same number of valves of at least one of the plurality of valves of the piping are the same as the total number of chambers, and at least one has a flow control function. The valve train is connected to each chamber. 一種基板處理系統,係具有複數個具有塗布乾燥裝置之片狀基板處理線路,該塗布乾燥裝置係藉由塗布裝 置將塗布液塗布至片狀基板,接著將經過塗布的前述片狀基板搬入至具有至少一個減壓用腔室的乾燥裝置,並因應設定於前述腔室的減壓程序將腔室內予以減壓,藉此進行減壓乾燥,並在乾燥結束後搬出至下個步驟;該基板處理系統係具備有:複數個減壓用泵,係用以進行前述減壓乾燥,且總數比基板處理系統所含有的全部的乾燥裝置的腔室數量的合計還少;配管,係以前述減壓用泵可連接至全部的腔室之方式設置;複數個閥,係經由前述配管連接至前述腔室,用以進行前述複數個減壓用泵的連接切換;調節器,係設置於各個腔室,用以控制各個腔室的減壓狀態;以及控制裝置,係因應設定於前述腔室的減壓程序將各個腔室內予以減壓。 A substrate processing system having a plurality of sheet substrate processing lines having a coating drying device, the coating drying device is coated Applying the coating liquid to the sheet substrate, then transferring the coated sheet substrate to a drying device having at least one decompression chamber, and decompressing the chamber according to a decompression program set in the chamber And drying under reduced pressure, and carrying out the drying to the next step; the substrate processing system is provided with: a plurality of pressure reducing pumps for performing the vacuum drying, and the total number of substrate processing systems The total number of chambers of all the drying devices included is small; the piping is provided such that the pressure reducing pump can be connected to all of the chambers; and the plurality of valves are connected to the chamber through the piping, for use To perform switching connection of the plurality of decompression pumps; the regulator is disposed in each chamber for controlling the decompression state of each chamber; and the control device is adapted to the decompression procedure set in the chamber Decompression is performed in each chamber. 一種基板處理系統,係具有複數個具有塗布乾燥裝置之片狀基板處理線路,該塗布乾燥裝置係藉由塗布裝置將塗布液塗布至片狀基板,接著將經過塗布的前述片狀基板搬入至具有至少一個減壓用腔室的乾燥裝置,並因應設定於前述腔室的減壓程序將腔室內予以減壓,藉此進行減壓乾燥,並在乾燥結束後搬出至下個步驟;該基板處理系統係具備有: 複數個減壓用泵,係用以進行前述減壓乾燥,且總數比基板處理系統所含有的全部的乾燥裝置的腔室數量的合計還少;配管,係以前述減壓用泵可連接至全部的腔室之方式設置;複數個閥,係經由前述配管連接至前述腔室,用以進行前述複數個減壓用泵的連接切換;控制裝置,係因應設定於前述腔室的減壓程序將各個腔室內予以減壓;以及減壓用緩衝槽,係設置於至少一個前述減壓用泵。 A substrate processing system comprising a plurality of sheet substrate processing lines having a coating drying device for applying a coating liquid to a sheet substrate by a coating device, and then loading the coated sheet substrate to have At least one drying device for the decompression chamber, and decompressing the chamber according to a decompression program set in the chamber, thereby performing vacuum drying, and carrying out the drying to the next step after the drying; the substrate processing The system is equipped with: A plurality of decompression pumps are used for performing the above-described decompression drying, and the total number is smaller than the total number of chambers of all the drying devices included in the substrate processing system; the piping is connected to the decompression pump to All of the chambers are disposed; a plurality of valves are connected to the chamber through the piping for performing switching connection of the plurality of decompression pumps; and the control device is configured to be decompressed according to the chamber The respective chambers are depressurized; and the decompression buffer tank is provided in at least one of the aforementioned decompression pumps.
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