TW201614254A - Testing apparatus - Google Patents

Testing apparatus

Info

Publication number
TW201614254A
TW201614254A TW103140006A TW103140006A TW201614254A TW 201614254 A TW201614254 A TW 201614254A TW 103140006 A TW103140006 A TW 103140006A TW 103140006 A TW103140006 A TW 103140006A TW 201614254 A TW201614254 A TW 201614254A
Authority
TW
Taiwan
Prior art keywords
pcb
flash memory
memory chip
interface
testing apparatus
Prior art date
Application number
TW103140006A
Other languages
English (en)
Other versions
TWI519800B (zh
Inventor
hua-an Yang
Original Assignee
Silicon Motion Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Silicon Motion Inc filed Critical Silicon Motion Inc
Application granted granted Critical
Publication of TWI519800B publication Critical patent/TWI519800B/zh
Publication of TW201614254A publication Critical patent/TW201614254A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56016—Apparatus features
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/005—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor comprising combined but independently operative RAM-ROM, RAM-PROM, RAM-EPROM cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0401—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals in embedded memories
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5602—Interface to device under test

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
TW103140006A 2014-10-08 2014-11-19 測試裝置 TWI519800B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410528010.2A CN105575836B (zh) 2014-10-08 2014-10-08 测试装置

Publications (2)

Publication Number Publication Date
TWI519800B TWI519800B (zh) 2016-02-01
TW201614254A true TW201614254A (en) 2016-04-16

Family

ID=55655279

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103140006A TWI519800B (zh) 2014-10-08 2014-11-19 測試裝置

Country Status (3)

Country Link
US (1) US9470714B2 (zh)
CN (1) CN105575836B (zh)
TW (1) TWI519800B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI814109B (zh) * 2021-10-15 2023-09-01 思達科技股份有限公司 測試裝置及其跳線器

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10103476B1 (en) * 2017-08-10 2018-10-16 Amphenol East Asia Electronic Technology (Shen Zhen) Co., Ltd. DDR socket connector
CN108595991B (zh) * 2018-04-12 2021-07-27 南宁磁动电子科技有限公司 一种eMMC芯片数据的读取设备
CN109326315B (zh) * 2018-09-11 2021-04-20 Oppo（重庆）智能科技有限公司 用于电子元件的检测装置和利用其进行故障测试的方法

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Publication number Priority date Publication date Assignee Title
US5387861A (en) * 1993-06-16 1995-02-07 Incal Technology, Inc. Programmable low profile universally selectable burn-in board assembly
KR100280637B1 (ko) * 1997-11-24 2001-02-01 윤종용 고정된플래시롬의데이터갱신이가능한컴퓨터시스템및그제어방법
US6369595B1 (en) * 1999-01-21 2002-04-09 Micron Technology, Inc. CSP BGA test socket with insert and method
DE19961791C2 (de) * 1999-12-21 2002-11-28 Infineon Technologies Ag Anordnung zum Testen von Chips mittels einer gedruckten Schaltungsplatte
TWI227497B (en) 2003-09-19 2005-02-01 Supreme Electronics Co Ltd A four functions in one tool for testing, repairing, recording and analyzing
CN101079328A (zh) * 2006-05-04 2007-11-28 怀斯特尔技术有限公司 在线测试期间闪存的并行编程
US8491997B2 (en) 2006-06-22 2013-07-23 Sabic Innovative Plastics Ip B.V. Conductive wire comprising a polysiloxane/polyimide copolymer blend
KR101341566B1 (ko) * 2007-07-10 2013-12-16 삼성전자주식회사 소켓, 검사 장치, 그리고 적층형 반도체 소자 제조 방법
US8212350B2 (en) * 2009-04-06 2012-07-03 Intel Corporation Space and cost efficient incorporation of specialized input-output pins on integrated circuit substrates
KR20110118003A (ko) * 2010-04-22 2011-10-28 삼성전자주식회사 반도체 패키지 및 그의 테스트 소켓
CN102346199A (zh) * 2010-07-30 2012-02-08 中芯国际集成电路制造(上海)有限公司 球栅阵列测试座
TWI489474B (zh) 2011-10-25 2015-06-21 Silicon Motion Inc 內嵌閃存卡燒機方法以及測試板、以及內嵌閃存卡
TWI451106B (zh) 2012-03-26 2014-09-01 Silicon Motion Inc 晶圓測試系統及其測試方法
US9952279B2 (en) * 2012-12-21 2018-04-24 Taiwan Semiconductor Manufacturing Company, Ltd. Apparatus for three dimensional integrated circuit testing
CN103514958B (zh) 2012-12-31 2016-02-10 Tcl集团股份有限公司 一种emmc芯片寿命检测方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI814109B (zh) * 2021-10-15 2023-09-01 思達科技股份有限公司 測試裝置及其跳線器

Also Published As

Publication number Publication date
TWI519800B (zh) 2016-02-01
CN105575836B (zh) 2018-06-12
US9470714B2 (en) 2016-10-18
US20160103152A1 (en) 2016-04-14
CN105575836A (zh) 2016-05-11

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