TW201612533A - Test cell structure of display panel and related display panel - Google Patents

Test cell structure of display panel and related display panel

Info

Publication number
TW201612533A
TW201612533A TW103131960A TW103131960A TW201612533A TW 201612533 A TW201612533 A TW 201612533A TW 103131960 A TW103131960 A TW 103131960A TW 103131960 A TW103131960 A TW 103131960A TW 201612533 A TW201612533 A TW 201612533A
Authority
TW
Taiwan
Prior art keywords
display panel
test
cell structure
conductive lines
electrically connected
Prior art date
Application number
TW103131960A
Other languages
English (en)
Other versions
TWI540323B (zh
Inventor
Cheng-Liang Chang
Yuh-Huah Wang
Yen-Yu Peng
Che-Ming Yang
Original Assignee
Au Optronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Au Optronics Corp filed Critical Au Optronics Corp
Priority to TW103131960A priority Critical patent/TWI540323B/zh
Priority to CN201410589356.3A priority patent/CN104332122B/zh
Priority to US14/562,785 priority patent/US9418582B2/en
Publication of TW201612533A publication Critical patent/TW201612533A/zh
Application granted granted Critical
Publication of TWI540323B publication Critical patent/TWI540323B/zh

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/12—Test circuits or failure detection circuits included in a display system, as permanent part thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Liquid Crystal (AREA)
  • General Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Thin Film Transistor (AREA)
TW103131960A 2014-09-16 2014-09-16 顯示面板之測試單元結構與顯示面板 TWI540323B (zh)

Priority Applications (3)

Application Number Priority Date Filing Date Title
TW103131960A TWI540323B (zh) 2014-09-16 2014-09-16 顯示面板之測試單元結構與顯示面板
CN201410589356.3A CN104332122B (zh) 2014-09-16 2014-10-28 显示面板的测试单元结构与显示面板
US14/562,785 US9418582B2 (en) 2014-09-16 2014-12-08 Test cell structure of display panel and related display panel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW103131960A TWI540323B (zh) 2014-09-16 2014-09-16 顯示面板之測試單元結構與顯示面板

Publications (2)

Publication Number Publication Date
TW201612533A true TW201612533A (en) 2016-04-01
TWI540323B TWI540323B (zh) 2016-07-01

Family

ID=52406840

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103131960A TWI540323B (zh) 2014-09-16 2014-09-16 顯示面板之測試單元結構與顯示面板

Country Status (3)

Country Link
US (1) US9418582B2 (zh)
CN (1) CN104332122B (zh)
TW (1) TWI540323B (zh)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI562108B (en) 2016-03-02 2016-12-11 Au Optronics Corp Display panel and method for verifying driving lines thereon
CN109154729B (zh) * 2016-10-10 2022-02-01 京东方科技集团股份有限公司 显示面板及其信号线的修复方法、显示装置
CN106449461B (zh) * 2016-11-07 2020-05-05 南京华东电子信息科技股份有限公司 一种tft基板上阵列检查测试方块的连接测试方法
CN107068046A (zh) * 2017-04-19 2017-08-18 京东方科技集团股份有限公司 显示面板及显示装置
CN106991952B (zh) * 2017-05-02 2020-10-16 厦门天马微电子有限公司 一种显示面板及显示装置
CN106970296B (zh) * 2017-05-31 2019-07-19 友达光电（苏州）有限公司 显示面板、测试装置与测试方法
TWI657300B (zh) 2017-08-10 2019-04-21 友達光電股份有限公司 陣列基板
CN109166504B (zh) * 2018-10-17 2021-10-01 惠科股份有限公司 测试电路及显示装置
KR20200120781A (ko) * 2019-04-11 2020-10-22 삼성디스플레이 주식회사 표시 장치 및 그 검사 방법
KR102651587B1 (ko) * 2020-01-22 2024-03-27 삼성디스플레이 주식회사 표시 패널 검사 장치 및 표시 장치
CN113035101B (zh) * 2021-03-19 2022-09-23 昆山国显光电有限公司 显示面板、器件性能测试方法和显示设备

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4924589A (en) * 1988-05-16 1990-05-15 Leedy Glenn J Method of making and testing an integrated circuit
CN100351678C (zh) * 2003-08-27 2007-11-28 中华映管股份有限公司 显示面板合并检测电路
CN100346200C (zh) * 2003-11-05 2007-10-31 友达光电股份有限公司 显示器组件及其组装方法
KR100992139B1 (ko) * 2003-11-28 2010-11-04 삼성전자주식회사 박막 트랜지스터 표시판
TWI333094B (en) * 2005-02-25 2010-11-11 Au Optronics Corp System and method for display testing
KR101129618B1 (ko) * 2005-07-19 2012-03-27 삼성전자주식회사 액정 표시 패널 및 이의 검사 방법과 이의 제조방법
TWI399734B (zh) 2008-11-07 2013-06-21 Au Optronics Corp 液晶顯示面板
JP5351268B2 (ja) * 2010-01-06 2013-11-27 パナソニック株式会社 アクティブマトリクス基板、表示パネル及びそれらの検査方法
CN102566169B (zh) * 2010-12-31 2015-02-25 上海天马微电子有限公司 液晶显示装置的检测装置及其测试方法
KR101943069B1 (ko) 2011-12-01 2019-04-18 삼성디스플레이 주식회사 배선 및 역다중화부의 불량 검출 방법, 불량 검출 장치 및 불량 검출 장치를 포함하는 표시 패널
US9299299B2 (en) * 2012-10-11 2016-03-29 Shenzhen China Star Optoelectronics Technology Co., Ltd Array substrate, PSAV liquid crystal display panel and manufacturing method thereof

Also Published As

Publication number Publication date
TWI540323B (zh) 2016-07-01
US20160078792A1 (en) 2016-03-17
US9418582B2 (en) 2016-08-16
CN104332122A (zh) 2015-02-04
CN104332122B (zh) 2017-01-18

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