TW201600634A - Intake and cooling device for MOCVD equipment - Google Patents

Intake and cooling device for MOCVD equipment Download PDF

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TW201600634A
TW201600634A TW103123869A TW103123869A TW201600634A TW 201600634 A TW201600634 A TW 201600634A TW 103123869 A TW103123869 A TW 103123869A TW 103123869 A TW103123869 A TW 103123869A TW 201600634 A TW201600634 A TW 201600634A
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gas
intake
air inlet
reaction
cooling device
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TWI513855B (en
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Haruhisa Takiguchi
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Advanced Micro Fab Equip Inc
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Abstract

The intake and cooling advice for MOCVD equipment of the present invention is disposed with the spraying head located at the top in the reaction chamber to install the intake piping of the organic metal gas by penetrating into the intake orifice of the isolation gas, so that the isolation gas can form the curtain shape air current and surround the periphery of the transporting organic metal gas to further separate the organic metal gas and the hydride gas just being sprayed to inhibit both from premature reaction to produce parasitism particles; the present invention can also prevent parasitism particles from being formed in the vicinity of intake orifice at the bottom of the intake device, so that the transporting organic metal gas and the hydride gas can be evenly distributed on the foundation support and each substrate to ensure the film growth quality and enhance the film growth rate.

Description

用於MOCVD設備的進氣及冷卻裝置Intake and cooling device for MOCVD equipment

本發明涉及半導體製造設備,特別涉及一種用於MOCVD設備的進氣及冷卻裝置。The present invention relates to semiconductor manufacturing equipment, and more particularly to an air intake and cooling apparatus for an MOCVD apparatus.

目前,在金屬有機化學氣相沉積法(以下簡稱MOCVD),將II或III族金屬有機化合物的氣體,與含IV或V族元素的氫化物氣體引入MOCVD設備的反應腔內,使兩者的混合氣體送到放置於反應腔內底部基座上的基片表面時,能夠在基片表面發生熱分解反應,從而外延生長形成化合物單晶薄膜。At present, in the metal organic chemical vapor deposition (hereinafter referred to as MOCVD), a gas of a Group II or III metal organic compound, and a hydride gas containing a Group IV or V element are introduced into a reaction chamber of an MOCVD apparatus to make both When the mixed gas is supplied to the surface of the substrate placed on the bottom of the bottom of the reaction chamber, a thermal decomposition reaction can be performed on the surface of the substrate to epitaxially grow a compound single crystal thin film.

如圖1、圖2所示,US2010/0143588A1提供的一種進氣裝置中,設有位於反應腔內頂部的氣體分布板,其包含多個平行延伸且交替分布的長形管狀氣體分布元件第一氣體分布元件、第二氣體分布元件。第一反應源氣體是第V族氫化物(氨氣NH3 )與載氣(氫氣H2 或氮氣N2 )的混合氣體,通過第一氣體分布元件的長條型進氣口輸送,形成長條形、窗簾狀的第一反應氣體氣流。第二反應源氣體是有機金屬氣體(MO,Metal-Organic)與載氣的混合氣體,有機金屬氣體例如是三甲基鎵(即(CH3 )3 Ga,簡稱TMG或TMGa,)、三甲基鋁(即[(CH3 )3 Al]2 ,簡稱TMA或TMAl)等,通過第二氣體分布元件的一組進氣孔輸送,形成排狀第二反應氣體氣流。同時,還有一路載氣通過相鄰氣體分布的第一氣體分布元件和第二氣體分布元件之間的間隙輸送,形成間隔的窗簾狀氣流穿插在前述第一反應氣體的氣流和第二反應氣體的氣流之間。As shown in FIG. 1 and FIG. 2, an air intake device provided in US 2010/0143588 A1 is provided with a gas distribution plate at the top of the reaction chamber, which comprises a plurality of elongated tubular gas distribution elements extending in parallel and alternately first. a gas distribution element and a second gas distribution element. The first reaction source gas is a mixed gas of a Group V hydride (ammonia NH 3 ) and a carrier gas (hydrogen H 2 or nitrogen N 2 ), which is transported through the elongated air inlet of the first gas distribution element to form a long gas. Strip, curtain-like first reactive gas stream. The second reaction source gas is a mixed gas of an organic metal gas (MO, Metal-Organic) and a carrier gas, and the organic metal gas is, for example, trimethylgallium (ie, (CH 3 ) 3 Ga, abbreviated as TMG or TMGa), A base aluminum (i.e., [(CH 3 ) 3 Al] 2 , abbreviated as TMA or TMAl) is transported through a set of intake holes of the second gas distributing element to form a second flow of the second reactive gas. At the same time, there is also a carrier gas transported through the gap between the first gas distribution element and the second gas distribution element of the adjacent gas distribution, forming a spaced curtain-like gas stream interposed between the first reaction gas stream and the second reaction gas Between the airflows.

如圖1、圖2、圖3所示,上述進氣裝置有以下的缺點:在該進氣裝置的邊緣,圓周上的不同位置具有不同的氣體混合狀態及氣體流量,容易形成渦流;而且,從進氣裝置噴出後兩種反應源氣體的分布區域是交替分布的長條型,非中心對稱,使得不同基片上或同一基片的不同位置上,特別是中心區域和邊緣區域之間兩種反應源氣體的分布不均勻,導致最終沉積形成的薄膜不均勻,影響產品品質。另外,該進氣裝置中難以避免兩種反應源氣體在到達基片表面之前過早反應形成GaN、AlN寄生顆粒的問題,寄生顆粒會附著在反應腔內污染設備,隨機落在基片上影響薄膜生長形態,使一部分有機金屬氣體耗費在生長寄生顆粒的過程,導致薄膜生長率下降。As shown in FIG. 1 , FIG. 2 and FIG. 3 , the air intake device has the following disadvantages: at the edge of the air intake device, different positions on the circumference have different gas mixing states and gas flow rates, and eddy currents are easily formed; The distribution areas of the two reaction source gases after being ejected from the air intake device are alternately elongated strips, which are non-central symmetrical, so that different positions on different substrates or on the same substrate, especially between the central region and the edge region The distribution of the reaction source gas is not uniform, resulting in uneven film formation in the final deposition, which affects product quality. In addition, it is difficult to avoid the problem that the two reaction source gases react prematurely to form GaN and AlN parasitic particles before reaching the surface of the substrate in the air intake device, and the parasitic particles may adhere to the pollution chamber in the reaction chamber, and randomly fall on the substrate to affect the film. The growth pattern causes a part of the organometallic gas to be consumed in the process of growing the parasitic particles, resulting in a decrease in the film growth rate.

US2009/0169744A1提供進氣裝置的一個實施例中,進氣裝置包括用來輸送在混合的氫化物氣體和載氣的第一氣體擴散腔,擴散腔底部包括第一氣體導管、用來輸送混合的有機金屬氣體和載氣第二氣體擴散腔,擴散腔底部包括第二氣體導管,兩者氣體導管排布成列,還包括用來輸送吹掃氣體(例如Ar、N2 、He等等)的第三氣體擴散腔,擴散腔底部上包括多個開口,這些開口排列成一行且排列在第一進氣導管和第二進氣導管之間,用於隔離兩種反應氣體第三氣體擴散腔下方還可以安裝一個冷卻夾套,使冷卻劑在冷卻夾套中流動,使進氣裝置的溫度保持在適當水準。US 2009/0169744 A1 provides an embodiment of an air intake device comprising a first gas diffusion chamber for transporting a mixed hydride gas and a carrier gas, the bottom of the diffusion chamber including a first gas conduit for conveying the mixture An organometallic gas and a carrier gas second gas diffusion chamber, the bottom of the diffusion chamber includes a second gas conduit, the gas conduits are arranged in a row, and further comprising a gas for conveying a purge gas (for example, Ar, N 2 , He, etc.) a third gas diffusion chamber, the bottom of the diffusion chamber includes a plurality of openings arranged in a row and arranged between the first intake conduit and the second intake conduit for isolating the two reactive gases below the third gas diffusion chamber It is also possible to install a cooling jacket to allow the coolant to flow in the cooling jacket to maintain the temperature of the air intake at an appropriate level.

然而,以上述第一實施例為例,該進氣裝置不僅結構複雜,而且該進氣裝置的底面為平面,該平面上有很多區域沒有氣體流過,容易形成渦流擾亂寄生顆粒,致使寄生顆粒附著在進氣裝置的底面難以去除。並且,第三氣體擴散腔下表面的出口遠離兩種反應源氣體的輸出位置,因而經由出口輸送的吹掃氣體難以起到隔開兩種反應源氣體或將附著寄生顆粒去除的作用。However, taking the first embodiment as an example, the air intake device is not only complicated in structure, but also the bottom surface of the air intake device is a plane, and there are many regions on the plane where no gas flows, and eddy current is easily formed to disturb the parasitic particles, causing parasitic particles. It is difficult to remove the bottom surface attached to the air intake device. Further, the outlet of the lower surface of the third gas diffusion chamber is away from the output positions of the two reaction source gases, and thus it is difficult for the purge gas delivered via the outlet to separate the two reaction source gases or remove the attached parasitic particles.

本發明的目的是提供一種用於MOCVD設備的進氣及冷卻裝置,將有機金屬氣體與氫化物氣體隔開,抑制兩者過早反應產生寄生顆粒;防止寄生顆粒形成在進氣裝置底面的進氣口附近;使輸送的有機金屬氣體與氫化物氣體在基座上及在各基片上都能夠均勻分布。It is an object of the present invention to provide an intake and cooling device for an MOCVD apparatus that separates an organometallic gas from a hydride gas to suppress premature reaction between the two to generate parasitic particles; and prevent parasitic particles from forming on the underside of the air intake device. Near the gas port; the transported organometallic gas and hydride gas can be evenly distributed on the susceptor and on each substrate.

為了達到上述目的,本發明的技術方案是提供一種用於MOCVD設備的進氣及冷卻裝置,設有位於反應腔內頂部的噴淋頭,其中包含:In order to achieve the above object, the technical solution of the present invention is to provide an air intake and cooling device for an MOCVD apparatus, which is provided with a shower head located at the top of the reaction chamber, and includes:

多個互相隔離的反應氣體擴散腔,所述多個反應氣體擴散腔包括多塊隔板,其中位於底部的隔板上設置有多組氣體導管,通過導管向反應腔通入反應氣體,所述多組氣體導管包括:一組第一進氣導管,用來向MOCVD設備的反應腔內輸送有機金屬氣體;a plurality of mutually separated reaction gas diffusion chambers, wherein the plurality of reaction gas diffusion chambers comprise a plurality of separators, wherein the separators at the bottom are provided with a plurality of sets of gas conduits, and the reaction gases are introduced into the reaction chamber through the conduits, The plurality of sets of gas conduits includes: a set of first intake ducts for transporting organometallic gases into the reaction chamber of the MOCVD apparatus;

一組第二進氣導管,用來輸送氫化物氣體;所述有機金屬氣體和氫化物氣體由該噴淋頭輸送的載氣攜帶至反應腔內底部的基片表面進行薄膜沉積反應;a set of second intake ducts for transporting hydride gas; the organometallic gas and hydride gas carried by the shower head are carried to the surface of the substrate at the bottom of the reaction chamber for film deposition reaction;

所述多個反應氣體擴散腔下方還包括一個冷卻板,所述反應氣體擴散腔底部隔板與冷卻板之間構成隔離氣體擴散腔,所述冷卻板上包括:A cooling plate is further disposed under the plurality of reaction gas diffusion chambers, and an isolation gas diffusion chamber is formed between the bottom partition plate of the reaction gas diffusion chamber and the cooling plate, and the cooling plate comprises:

一組第一進氣口,用來向所述反應腔內輸送隔離氣體;每個所述第一進氣導管分別穿設在與之相對應的一個第一進氣口之中,使第一進氣口輸送的隔離氣體所形成的簾幕狀氣流環繞在有機金屬氣體週邊,將剛噴出的有機金屬氣體與氫化物氣體隔開;以及,a set of first air inlets for conveying an isolation gas into the reaction chamber; each of the first air intake ducts is respectively disposed in a first air inlet corresponding thereto, so that the first inlet a curtain-like airflow formed by the isolation gas transported by the gas port surrounds the periphery of the organometallic gas, and separates the freshly sprayed organometallic gas from the hydride gas;

一組第二進氣口,各自為下端口徑大於上端口徑的漏斗狀;a set of second air inlets, each having a funnel shape with a lower port diameter greater than an upper port diameter;

所述第一進氣口及第二進氣口的下端開口,在冷卻板的底面相互間隔且交替分布;每個所述第二進氣口和與之相對應的一個第二進氣導管連通,通過所述第二進氣口將氫化物氣體和載氣混合後的氣體向所述反應腔內輸送。The lower end openings of the first air inlet and the second air inlet are spaced apart from each other and alternately arranged on a bottom surface of the cooling plate; each of the second air inlets is connected to a second air inlet duct corresponding thereto The gas obtained by mixing the hydride gas and the carrier gas is transported into the reaction chamber through the second intake port.

可選地,所述第一進氣導管單獨輸送有機金屬氣體,或者輸送有機金屬氣體和載氣的混合氣體;Optionally, the first intake duct separately transports an organometallic gas or a mixed gas of an organometallic gas and a carrier gas;

所述第二進氣導管單獨輸送氫化物氣體,或者輸送氫化物氣體和載氣的混合氣體;The second intake duct separately transports a hydride gas or a mixed gas of a hydride gas and a carrier gas;

所述第一進氣口輸送的隔離氣體,是載氣或吹掃氣體或其混合氣體。The isolation gas delivered by the first air inlet is a carrier gas or a purge gas or a mixed gas thereof.

可選地,在所述多個互相隔離的反應氣體擴散腔內部,設置有第一隔板、第二隔板、第三隔板;Optionally, a first separator, a second separator, and a third separator are disposed inside the plurality of mutually separated reaction gas diffusion chambers;

所述冷卻板與第三隔板之間形成的隔離氣體擴散腔,連通至開設在冷卻板上的所述第一進氣口和第二進氣口;An isolation gas diffusion chamber formed between the cooling plate and the third partition plate is connected to the first air inlet and the second air inlet opening on the cooling plate;

所述第三隔板與第二隔板之間形成的第二反應氣體擴散腔連通至第二導管,所述第二導管插入到對應的第二進氣口中,使第二進氣口的上端圍繞在第二進氣口的下端的週邊;a second reaction gas diffusion chamber formed between the third partition plate and the second partition plate communicates with the second conduit, and the second conduit is inserted into the corresponding second intake port to make the upper end of the second intake port Surrounding the periphery of the lower end of the second air inlet;

所述第二隔板與第一隔板之間形成的第一反應氣體擴散腔通道連通至第一導管,所述第一導管穿插在對應的第一進氣口中。A first reactive gas diffusion chamber passage formed between the second partition and the first partition communicates with the first conduit, and the first conduit is interspersed in the corresponding first inlet.

可選地,所述噴淋頭的冷卻板中,避開各進氣口及與之連通的各氣體通道的位置,設有供冷卻介質流通的管道。Optionally, in the cooling plate of the shower head, a position for each of the air inlets and the gas passages communicating therewith is avoided, and a conduit for circulating the cooling medium is provided.

可選地,所述第二進氣口的側壁設置有緩衝區,所述第二進氣導管連通所述第二反應氣體擴散腔將反應氣體通入所述緩衝區,反應氣體經過緩衝區後流入第二進氣口。可選地,所述第二導管的封閉的底端插入到第二進氣口內,通過開設在該第二導管側壁上的若干開孔來輸送氣體。Optionally, a sidewall of the second air inlet is provided with a buffer, and the second air inlet conduit communicates with the second reaction gas diffusion chamber to pass a reaction gas into the buffer zone, and the reaction gas passes through the buffer zone. Flow into the second air inlet. Optionally, the closed bottom end of the second conduit is inserted into the second air inlet, and the gas is delivered through a plurality of openings formed in the side wall of the second conduit.

可選地,所述第一進氣口的下端位置低於穿設在其中的第一進氣導管的下端位置。Optionally, a lower end position of the first air inlet is lower than a lower end position of the first air intake duct disposed therein.

可選地,所述第二進氣口是側壁與豎直方向夾角恆定的錐形漏斗結構。Optionally, the second air inlet is a tapered funnel structure whose angle between the side wall and the vertical direction is constant.

可選地,所述第二進氣口是雙錐形漏斗結構,包含側壁與豎直方向夾角為第一角度的上段,和側壁與豎直方向夾角為第二角度的下段,第一角度小於第二角度。Optionally, the second air inlet is a double-cone funnel structure, and includes an upper portion in which a side wall is at a first angle from a vertical direction, and a lower portion in which a side wall and a vertical direction are at a second angle, where the first angle is smaller than The second angle.

可選地,所述第二進氣口為多面體漏斗結構,所述第二進氣口的末端邊緣為多邊形,側壁設有多條棱。Optionally, the second air inlet is a polyhedral funnel structure, the end edge of the second air inlet is polygonal, and the side wall is provided with a plurality of edges.

與現有技術相比,本發明提供的用於MOCVD設備的進氣及冷卻裝置,其優點在於:Compared with the prior art, the present invention provides an intake and cooling device for an MOCVD apparatus, which has the advantages of:

本發明中通過噴淋頭內間隔設置的隔板來形成氣體通道;將若干進氣口直接開設在冷卻板上,並使冷卻介質通道在其間橫向佈置,以減少整個設備的體積;各進氣口均勻分布,有效改善基座上及在各基片上氣體分布的均勻性,從而保證薄膜生長品質,提升薄膜生長率。In the present invention, the gas passage is formed by the partitions disposed in the shower head; a plurality of air inlets are directly opened on the cooling plate, and the cooling medium passages are laterally arranged therebetween to reduce the volume of the entire apparatus; The mouth is evenly distributed, which effectively improves the uniformity of gas distribution on the susceptor and on each substrate, thereby ensuring the film growth quality and increasing the film growth rate.

本發明中將有機金屬氣體的進氣導管穿設在隔離氣體的進氣口中,使隔離氣體能夠形成簾幕狀的氣流並環繞在有機金屬氣體週邊,從而將剛噴出的有機金屬氣體與氫化物氣體隔開,抑制兩者過早反應產生寄生顆粒。In the present invention, an intake duct of an organometallic gas is passed through the inlet of the insulating gas, so that the insulating gas can form a curtain-like airflow and surround the periphery of the organometallic gas, thereby displacing the newly injected organic metal gas and the hydride. The gas is separated to inhibit premature reaction between the two to produce parasitic particles.

本發明中通過擴大其中一些進氣口的末端口徑,例如形成漏斗狀,來增大噴淋頭底面被設置為進氣口的面積,利用進氣口的氣流吹走寄生顆粒,同時有效縮減噴淋頭底面寄生顆粒可能吸附的區域的面積。In the present invention, by expanding the end diameter of some of the air inlets, for example, forming a funnel shape, the area of the bottom surface of the shower head is set as the air inlet, and the air flow of the air inlet is used to blow off the parasitic particles, and the spray is effectively reduced. The area of the area where the parasitic particles on the underside of the showerhead may adsorb.

本發明的優選實施例中通過將其中一些進氣口設計為上下兩段的側壁與豎直方向夾角不同的雙錐形漏斗結構,使靠近冷卻板底面的下段的夾角更大,以保證在冷卻板中同時開設進氣口與冷卻介質通道後的機械強度,並有效減少寄生顆粒可能吸附的區域的面積。In a preferred embodiment of the present invention, by designing some of the air inlets into a double-cone funnel structure in which the side walls of the upper and lower sections are different from the vertical direction, the angle of the lower section near the bottom surface of the cooling plate is larger to ensure cooling. The mechanical strength of the inlet and the cooling medium passage are simultaneously established in the plate, and the area of the area where the parasitic particles may be adsorbed is effectively reduced.

本發明所採用的具體實施例,將藉由以下之實施例及附呈圖式作進一步之說明。The specific embodiments of the present invention will be further described by the following examples and the accompanying drawings.

如圖4所示,本發明提供的進氣裝置是一種噴淋頭800,其設置在MOCVD(金屬有機化學氣相沉積)設備反應腔900內的頂部,通過設置的第一進氣導管810、第二進氣導管820、第一進氣口830,分別向反應腔900內輸送有機金屬氣體、氫化物氣體,和將兩者攜帶至基片920表面進行薄膜沉積反應的載氣,同時還通過由第一進氣口830輸送的載氣將有機金屬氣體和氫化物氣體相互隔開,以防止剛噴出的有機金屬氣體和氫化物氣體太早反應而在噴淋頭800底面的進氣口附近產生寄生顆粒。As shown in FIG. 4, the air intake device provided by the present invention is a shower head 800 disposed at the top of a reaction chamber 900 of an MOCVD (Metal Organic Chemical Vapor Deposition) apparatus, through a first intake duct 810 disposed, The second intake duct 820 and the first air inlet 830 respectively transport the organometallic gas, the hydride gas into the reaction chamber 900, and carry the carrier gas to the surface of the substrate 920 for film deposition reaction, and also pass The carrier gas transported by the first intake port 830 separates the organometallic gas and the hydride gas from each other to prevent the newly ejected organometallic gas and the hydride gas from reacting too early near the gas inlet of the bottom surface of the shower head 800. Parasitic particles are produced.

如圖5所示,還設置有一組第二進氣口840,其與一組第一進氣口830各自的開口在噴淋頭800底面間隔交替、均勻分布。每一個第二進氣導管820連通至與之對應的一個第二進氣口840,使第二進氣口840的首端圍繞在第二進氣導管820的末端週邊,由第二進氣口840將氫化物氣體與載氣的混合氣體輸送至反應腔900。每一個第一進氣導管810穿設在與之對應的一個第一進氣口830中,則由第一進氣口830輸送的載氣形成簾幕狀的氣流,將由第一進氣導管810輸送的有機金屬氣體與由第二進氣導管820至第二進氣口840輸送的氫化物氣體隔開。噴淋頭底面上,在極(?)邊緣區域以內,每一個第一進氣口830被多個(如4個)均勻分布的第二進氣口840圍繞且與該多個第二進氣口840距離相等,同樣的每一個第二進氣口840也被多個均勻分布第一進氣口830圍繞且與該多個第一進氣口距離相等。As shown in FIG. 5, a set of second air inlets 840 are also provided, which are alternately and evenly distributed with the respective openings of the first group of first air inlets 830 at the bottom surface of the shower head 800. Each of the second intake ducts 820 is connected to a second intake port 840 corresponding thereto, so that the first end of the second intake port 840 surrounds the periphery of the end of the second intake duct 820, and the second intake port 840 delivers a mixed gas of hydride gas and carrier gas to the reaction chamber 900. Each of the first intake ducts 810 is disposed in a first intake port 830 corresponding thereto, and the carrier gas transported by the first intake port 830 forms a curtain-like airflow to be used by the first intake duct 810. The delivered organometallic gas is separated from the hydride gas delivered by the second intake conduit 820 to the second intake port 840. On the bottom surface of the shower head, within the edge region of the pole (?), each of the first air inlets 830 is surrounded by a plurality of (eg, four) uniformly distributed second air inlets 840 and with the plurality of second air intakes Ports 840 are equally spaced, and each of the same second inlets 840 is also surrounded by a plurality of uniformly distributed first inlets 830 and equidistant from the plurality of first inlets.

設各個進氣口的末端是位於噴淋頭800底面的一端,而各個進氣口的首端是位於噴淋頭800內連通至相應氣體通道的一端。本例中第一進氣導管810的末端外徑,小於環繞在其外側的第一進氣口830的末端內徑,且兩者都小於第二進氣口840的末端口徑。若第二進氣導管820的末端外徑小於第二進氣口840的首端內徑時,可以使第二進氣口840輸送的載氣包圍在第二進氣導管820輸送的氫化物氣體外並將兩者在第二進氣口840內混合後一起輸送至反應腔900;若第二進氣導管820的末端外徑等於第二進氣口840的首端內徑(即兩者緊密配合)時,可以使第二進氣導管820輸送的氫化物氣體和載氣的混合氣體直接經由第二進氣口840向反應腔900輸送。The ends of the respective intake ports are located at one end of the bottom surface of the shower head 800, and the head ends of the respective intake ports are one end of the sprinkler head 800 that communicates with the corresponding gas passage. In this example, the outer diameter of the tip of the first intake duct 810 is smaller than the inner diameter of the end of the first intake port 830 surrounding the outer side thereof, and both are smaller than the end diameter of the second intake port 840. If the outer diameter of the distal end of the second intake duct 820 is smaller than the inner diameter of the first end of the second intake port 840, the carrier gas transported by the second intake port 840 may surround the hydride gas transported by the second intake duct 820. And the two are mixed together in the second air inlet 840 and then sent to the reaction chamber 900; if the outer diameter of the second intake duct 820 is equal to the inner diameter of the first end of the second air inlet 840 (ie, the two are tight In the case of the cooperation, the mixed gas of the hydride gas and the carrier gas transported by the second intake duct 820 can be directly sent to the reaction chamber 900 via the second intake port 840.

而為了減少寄生顆粒在噴淋頭800底面的積聚,在兼顧各路氣體流量的前提下,可以通過擴大各進氣口末端的口徑(例如擴大第二進氣口840和/或第一進氣口830),將噴淋頭800底面盡可能多的面積開設為進氣口。因而,在噴淋頭800底面的進氣口處由於有氣體流動,寄生顆粒不容易附著;而噴淋頭800底面除進氣口外的其他面積被縮減,可以有效減少寄生顆粒附著的影響。參見圖6所示,優選的示例中,將第二進氣口840設計成末端口徑大於其首端口徑的漏斗狀。第一進氣導管810、第二進氣導管820、第一進氣口830可以為首末端口徑一致的直筒狀。In order to reduce the accumulation of parasitic particles on the bottom surface of the shower head 800, the diameter of the end of each air inlet can be enlarged (for example, the second air inlet 840 and/or the first air intake are enlarged) while taking into account the flow of each gas. Port 830), the area of the bottom surface of the shower head 800 is opened as an air inlet. Therefore, the parasitic particles are not easily attached due to the gas flow at the air inlet of the bottom surface of the shower head 800. The area of the bottom surface of the shower head 800 except the air inlet is reduced, and the influence of the parasitic particle adhesion can be effectively reduced. Referring to Figure 6, in a preferred example, the second air inlet 840 is designed to have a funnel shape with an end aperture greater than its first port diameter. The first intake duct 810, the second intake duct 820, and the first intake port 830 may have a straight cylindrical shape with the same initial diameter.

如圖6、圖7所示,所述的噴淋頭800內部設有第一隔板851、第二隔板852、第三隔板853和冷卻板854,這些板在豎直方向間隔分布。本例中,第一隔板851最靠近噴淋頭800的頂部,而冷卻板854最靠近噴淋頭800的底部。在冷卻板854上直接開設所述的第一進氣口830第二進氣導管820和第二進氣口840第一進氣口830;還在所述的冷卻板854中避開各進氣口的位置設有橫向分布的冷卻介質管道850,使冷卻介質在管道850中流通,將噴淋頭800的溫度控制在合適的範圍。冷卻板854與第三隔板853之間形成的第三氣體通道,直接連通冷卻板854上的第一進氣口830和第二進氣口840以輸送載氣。第三隔板853與第二隔板852之間形成的第二氣體通道,連通至作為第二進氣導管820的第二導管821第二進氣導管820以輸送氫化物氣體;該第二導管821穿過第三氣體通道並且與該第三氣體通道互不導通,之後該第二導管821的末端插入到冷卻板854上的第二進氣口840中。第二隔板852與第一隔板851之間形成的第一氣體通道,經由第一導管811輸送有機金屬氣體;該第一導管811穿過第二氣體通道、第三隔板853和第三氣體通道而與之均不導通,所述第一導管811最後插入到所述第一進氣口830中作為第一進氣導管810。優選地,是使第一進氣口830的末端位置,比第一進氣導管810(第一導管811)的末端位置更低,即,第一進氣口830的末端對應冷卻板854的底面,而第一導管811的末端還沒有達到冷卻板854的底面,從而在第一進氣口830內的底部形成一個載氣與有機金屬氣體的混合區域。As shown in FIG. 6 and FIG. 7, the showerhead 800 is internally provided with a first partition 851, a second partition 852, a third partition 853 and a cooling plate 854 which are spaced apart in the vertical direction. In this example, the first partition 851 is closest to the top of the showerhead 800, and the cooling plate 854 is closest to the bottom of the showerhead 800. The first intake port 830, the second intake duct 820, and the second intake port 840, the first intake port 830, are directly opened on the cooling plate 854; the intake ports are also avoided in the cooling plate 854. The location of the mouth is provided with a laterally distributed cooling medium conduit 850 which allows the cooling medium to circulate in the conduit 850 to control the temperature of the showerhead 800 to a suitable range. A third gas passage formed between the cooling plate 854 and the third partition 853 directly communicates with the first intake port 830 and the second intake port 840 on the cooling plate 854 to transport the carrier gas. a second gas passage formed between the third partition 853 and the second partition 852 is connected to the second duct 821 as the second intake duct 820, the second intake duct 820 to transport the hydride gas; the second duct The 821 passes through the third gas passage and is non-conducting with the third gas passage, after which the end of the second conduit 821 is inserted into the second intake port 840 on the cooling plate 854. a first gas passage formed between the second partition 852 and the first partition 851, conveying the organometallic gas via the first conduit 811; the first conduit 811 passing through the second gas passage, the third partition 853, and the third The gas passage is not electrically connected thereto, and the first conduit 811 is finally inserted into the first intake port 830 as the first intake duct 810. Preferably, the end position of the first intake port 830 is lower than the end position of the first intake duct 810 (the first duct 811), that is, the end of the first intake port 830 corresponds to the bottom surface of the cooling plate 854. The end of the first duct 811 has not yet reached the bottom surface of the cooling plate 854, so that a mixed region of the carrier gas and the organometallic gas is formed at the bottom in the first intake port 830.

如圖8、圖9所示,在噴淋頭800的第二實施例中,與上述第一實施例中的不同點在於,冷卻板854上每個第二導管821並不直接插入到第二進氣口840中,而是略有偏移。例如,第二進氣口840的首端附近設置有一個緩衝區855,本例中該緩衝區855為臺階狀,第二導管821向緩衝區855輸送氫化物氣體,以減少衝擊效應(impinging effect)。同時第一進氣口830第三氣體通道也將一路載氣連通至本例的緩衝區855,使載氣和第二導管821輸送的氫化物氣體在緩衝區855處或在第二進氣口840中混合後一同由第二進氣口840輸出。As shown in FIGS. 8 and 9, in the second embodiment of the shower head 800, the difference from the first embodiment described above is that each of the second ducts 821 on the cooling plate 854 is not directly inserted into the second. In the air inlet 840, there is a slight offset. For example, a buffer zone 855 is disposed near the first end of the second air inlet 840. In this example, the buffer zone 855 is stepped, and the second conduit 821 delivers hydride gas to the buffer zone 855 to reduce the impact effect. ). At the same time, the first gas inlet 830 third gas passage also connects one carrier gas to the buffer zone 855 of the present example, so that the carrier gas and the second conduit 821 transport the hydride gas at the buffer zone 855 or at the second air inlet. The 840 is mixed and outputted by the second intake port 840 together.

如圖10所示,在噴淋頭800的第三實施例中,與上述第一實施例中的不同點在於,提供了另一種第二導管822。本例所述的第二導管822的頂端連通第二氣體通道,而該第二導管822的底端是封閉的,所述第二導管822底端插入到第二進氣口840內之後,通過開設在該第二導管822側壁上的若干開孔來輸送氫化物氣體,以減少衝擊效應。As shown in Fig. 10, in the third embodiment of the shower head 800, the difference from the first embodiment described above is that another second duct 822 is provided. The top end of the second duct 822 of the present example communicates with the second gas passage, and the bottom end of the second duct 822 is closed. After the bottom end of the second duct 822 is inserted into the second air inlet 840, A plurality of openings are formed in the sidewalls of the second conduit 822 to deliver hydride gas to reduce impact effects.

上述第一到第三實施例中所用的冷卻板854中,第二進氣口840第二進氣導管820是角度恆定的錐形漏斗結構。該角度是指錐形漏斗結構的側壁與豎直方向的夾角。In the cooling plate 854 used in the above first to third embodiments, the second intake port 840 and the second intake duct 820 are tapered funnel structures having a constant angle. This angle refers to the angle between the side wall of the tapered funnel structure and the vertical direction.

如圖17、圖18所示,另一個示例的冷卻板854中,第二進氣口840第二進氣導管820是雙錐形漏斗結構860,即,上段861和下段862分別為角度恆定的錐形漏斗結構,且下段862的角度大於上段861的角度,而下段862末端的口徑大於上段861末端的口徑;下段862是指該第二進氣口840第二進氣導管820更靠近冷卻板854底面的部分,下段862的末端口徑就是該第二進氣口840第二進氣導管820的末端口徑;上段861則是更靠近冷卻板854頂面的部分,位於冷卻板854內部。該示例在冷卻板854開設第二進氣口840第二進氣導管820之後保證機械強度的同時,還能夠有效擴大冷卻板854底面開設為進氣口的面積,以減少寄生顆粒可能吸附的區域的面積。As shown in FIGS. 17 and 18, in another exemplary cooling plate 854, the second intake port 840 is a double-cone funnel structure 860, that is, the upper segment 861 and the lower segment 862 are respectively angled constant. Conical funnel structure, and the angle of the lower section 862 is greater than the angle of the upper section 861, and the diameter of the end of the lower section 862 is larger than the diameter of the end of the upper section 861; the lower section 862 means that the second intake port 840 is closer to the cooling plate of the second intake duct 820 The portion of the bottom surface of the 854, the end diameter of the lower portion 862 is the end diameter of the second intake port 820 of the second air inlet 840; the upper portion 861 is the portion closer to the top surface of the cooling plate 854, located inside the cooling plate 854. This example can ensure the mechanical strength after the second air inlet 840 of the cooling plate 854 is opened, and can also effectively enlarge the area of the bottom surface of the cooling plate 854 as an air inlet to reduce the area where the parasitic particles may be adsorbed. Area.

如圖11、圖12所示,還有一個示例的冷卻板854中,為了擴大冷卻板854底面開設為進氣口的面積,將第二進氣口840第二進氣導管820設計為多面體漏斗結構823,即,第二進氣口840第二進氣導管820類似花瓣狀,在其側壁設有多條棱,末端邊緣為多邊形(而上述兩個示例中所示第二進氣口840第二進氣導管820中內壁光滑過渡,末端邊緣為圓形)。圖13中進一步示出了第二進氣口840第二進氣導管820為多面體漏斗結構823的冷卻板854,與底端封閉、側壁開孔輸氣的第二導管822組合的一種示例。As shown in FIG. 11 and FIG. 12, in an exemplary cooling plate 854, in order to enlarge the area of the bottom surface of the cooling plate 854 as the intake port, the second intake port 840 is designed as a polyhedral funnel. The structure 823, that is, the second air inlet 840, is similar to a petal shape, and has a plurality of ribs on its side wall, and the end edges are polygonal (the second air inlet 840 is shown in the above two examples) The inner wall of the two intake ducts 820 has a smooth transition and the end edges are rounded. Further shown in FIG. 13 is a second inlet 840. The second intake conduit 820 is a cooling plate 854 of the polyhedral funnel structure 823, in combination with a second conduit 822 having a bottom closed, side wall open gas.

如圖14、圖15、圖16所示,在一個具體的應用(例如第二進氣口840第二進氣導管820為錐形漏斗結構)中,噴淋頭800的冷卻板854為厚度20mm、直徑460mm的圓形。在A-A’方向任意兩個第二進氣口840第二進氣導管820圓心到圓心之間的間距為28.3mm,在B-B’方向任意兩個第二進氣口840第二進氣導管820圓心到圓心之間的間距D為20mm。每四個第二進氣口840第二進氣導管820將一個第一進氣口830包圍在其中,使該第一進氣口830位於這些第二進氣口840第二進氣導管820的對角線交叉點,相鄰第二進氣口840第二進氣導管820的邊緣之間的最近距離為G-1 ,第一進氣口830的邊緣到任意一個第二進氣口840第二進氣導管820的邊緣的最近距離為G-2As shown in FIG. 14, FIG. 15, and FIG. 16, in a specific application (for example, the second intake port 840 and the second intake duct 820 are tapered funnel structures), the cooling plate 854 of the shower head 800 has a thickness of 20 mm. , a diameter of 460mm. Any two second intake ports 840 in the A-A' direction, the distance between the center of the second intake duct 820 and the center of the circle is 28.3 mm, and any two of the second intake ports 840 in the BB' direction are second. The distance D between the center of the air duct 820 and the center of the circle is 20 mm. Each of the four second intake ports 840 encloses a first intake port 830 therein such that the first intake port 830 is located at the second intake port 840 of the second intake duct 820 At the diagonal intersection, the closest distance between the edges of the second intake duct 820 adjacent to the second intake port 840 is G -1 , the edge of the first intake port 830 to any one of the second intake ports 840 The closest distance of the edge of the two intake ducts 820 is G -2 .

如圖19所示,將這四個第二進氣口840第二進氣導管820的圓心位置作為四角圍成的方形區域設為一單元區,則該單元區的邊長為間距D,面積S1=D2 。設第二進氣口840第二進氣導管820的末端口徑為Od-1 ,第二進氣口840第二進氣導管820的首端口徑為Od-5 。設第一進氣口830的末端口徑為Od-2 ,穿插在其中的第一導管811的外徑為Od-3 ,第一導管811的內徑即第一進氣導管810的末端口徑為Od-4 。設一作業區的面積為,作業區與單元區的面積的比值S2/S1,表1、表2中列出了上述若干參數的一些示例。 【表1】【表2】 As shown in FIG. 19, the square center of the four second air inlets 840 and the second air intake duct 820 are defined as a unit area, and the side length of the unit area is the distance D and the area. S1=D 2 . The second intake port 840 has a second intake port 820 having an end diameter of O d-1 , and the second intake port 840 has a first port diameter of the second intake duct 820 of O d - 5 . Provided the first intake port 830 is the end diameter O d-2, the outer diameter of the first conduit 811 inserted therein is O d-3, i.e., the inner diameter of the first conduit 811 is a first intake conduit tip diameter 810 Is O d-4 . Set the area of a work area to The ratio S2/S1 of the area of the work area to the unit area, and some examples of the above several parameters are listed in Table 1 and Table 2. 【Table 1】 【Table 2】

如圖17、圖18、圖20所示,在另一個具體應用(例如第二進氣口840第二進氣導管820為雙錐形漏斗結構860)中,冷卻板854的厚度為T;其中,與該冷卻板854頂面距離T-3 的區域為直筒狀,口徑(即第二進氣口840第二進氣導管820的首端口徑)為Od-5 ;之後厚度T-2 的區域為上段,上段861的側壁與豎直方向的角度為θ,上段861的末端口徑為Od -x ;與該冷卻板854底面距離T-1 的區域為下段862,下段862的側壁與豎直方向的角度為2θ,下段862的末端口徑為Od-1 。各參數有如下的關係:As shown in FIGS. 17, 18, and 20, in another specific application (eg, the second intake port 840, the second intake conduit 820 is a double-cone funnel structure 860), the thickness of the cooling plate 854 is T; with the surface of the cooling plate 854 from the area T -3 is straight cylindrical, diameter (i.e., a second intake port 840 of the second inlet conduit 820 of the head end diameter) of O d-5; after the thickness T -2 The area is the upper stage, the angle of the side wall of the upper section 861 and the vertical direction is θ, the end diameter of the upper section 861 is O d -x ; the area of the bottom surface distance T -1 from the cooling plate 854 is the lower section 862, and the side wall and the vertical section of the lower section 862 The angle in the straight direction is 2θ, and the end diameter of the lower segment 862 is O d-1 . Each parameter has the following relationship: ; .

冷卻介質管道850橫向開設在第二進氣口840第二進氣導管820與第一進氣口830之間的冷卻板854中,各冷卻介質管道850的圓心到相鄰的第二進氣口840第二進氣導管820或第一進氣口830的中心軸的距離為7.07mm;各冷卻介質管道850的圓心與冷卻板854頂面的距離為T-4 。表3、表4中列出了上述若干參數的一些示例。 【表3】 【表4】 The cooling medium pipe 850 is laterally opened in the cooling plate 854 between the second intake port 820 and the first intake port 830, and the center of each cooling medium pipe 850 is adjacent to the adjacent second air inlet. 840 The distance between the central axis of the second intake duct 820 or the first intake port 830 is 7.07 mm; the distance between the center of each cooling medium duct 850 and the top surface of the cooling plate 854 is T -4 . Some examples of several of the above parameters are listed in Tables 3 and 4. 【table 3】 【Table 4】

如圖4所示,上述各例提供的噴淋頭800,位於MOCVD設備反應腔900內的頂部;所述反應腔900內的底部設置有用來承載基片920的基座910,其能夠繞中心軸旋轉;該基座910下方還設有基片920的加熱器930;通過加熱器可以使基座910上的基片溫度達到合適的生長晶體的溫度,典型的如大於600℃,甚至大於1000℃。 MOCVD設備還設置有抽氣裝置,將反應後的廢氣排出反應腔進行處理或再利用。As shown in FIG. 4, the shower head 800 provided in each of the above examples is located at the top of the reaction chamber 900 of the MOCVD apparatus; the bottom of the reaction chamber 900 is provided with a pedestal 910 for carrying the substrate 920, which can be wound around the center. The shaft is rotated; a heater 930 of the substrate 920 is further disposed under the base 910; the temperature of the substrate on the base 910 can be raised to a suitable temperature for growing the crystal by a heater, typically greater than 600 ° C or even greater than 1000 °C. The MOCVD apparatus is further provided with an air suction device that discharges the reacted exhaust gas out of the reaction chamber for processing or reuse.

所述基片常用的有:磷化鎵(GaP)、磷化銦(InP)、矽(Si)、碳化矽(SiC)及藍寶石(Sapphire,Al2 O3 )等等。通常所生長的主要為III-V族化合物半導體薄膜,其中通過第一進氣口輸送用來提供Ⅲ族元素來源的有機金屬氣體,常用的有:三甲基鎵(TMGa)、三甲基鋁(TMAl)、三甲基銦(TMIn)等等。通過第二進氣口輸送用來提供V族元素來源的氫化物氣體,常用的有氨氣(NH3 )、砷化氫(AsH3 )、磷化氫(PH3 )、及乙矽烷 (Si2 H6 )等等。可能還在所輸入的氣體中混有作為n型摻雜源的甲矽烷(SiH4 ),或作為p型摻雜源的二茂鎂(CP2 Mg),等等。通過第一、第二進氣口輸送的載氣,常用的有:氫氣(H2 )、氮氣(N2 )等等。Commonly used for the substrate are: gallium phosphide (GaP), indium phosphide (InP), bismuth (Si), tantalum carbide (SiC), sapphire (Al 2 O 3 ), and the like. Generally, a III-V compound semiconductor thin film is grown, wherein an organometallic gas for supplying a group III element is supplied through a first gas inlet, and commonly used are: trimethylgallium (TMGa), trimethylaluminum. (TMAl), trimethylindium (TMIn), and the like. Conveying through the second intake port for providing a source of a group V element hydride gases, commonly used ammonia (NH 3), arsine (AsH 3), phosphine (PH 3), and disilane (Si 2 H 6 ) and so on. It is also possible to mix, in the gas to be input, methanthan (SiH 4 ) as an n-type dopant source, or ferrocene (CP 2 Mg) as a p-type dopant source, and the like. The carrier gas delivered through the first and second intake ports is commonly used: hydrogen (H 2 ), nitrogen (N 2 ), and the like.

或者,在另一種應用結構中,通過第一進氣導管來輸送有機金屬氣體與載氣的混合氣體,通過第二進氣導管來輸送有機金屬氣體與氫化物氣體的混合氣體。通過第一進氣口輸送並形成簾幕狀氣流,用以將前兩路氣體隔開的隔離氣體,不僅可以使用載氣,還可以使用Ar或He等等吹掃氣體(purge gas),或者吹掃氣體與載氣的混合氣體,或者其他能夠有效隔開有機金屬氣體與氫化物氣體同時又不會影響反應腔內工藝處理的輔助氣體。Alternatively, in another application structure, the mixed gas of the organometallic gas and the carrier gas is transported through the first intake duct, and the mixed gas of the organometallic gas and the hydride gas is transported through the second intake duct. The first gas inlet conveys and forms a curtain-like gas flow, and the isolation gas for separating the first two channels of gas can use not only a carrier gas but also a purge gas such as Ar or He, or A mixture of purge gas and carrier gas, or other auxiliary gas that effectively separates the organometallic gas from the hydride gas without affecting the process in the reaction chamber.

如圖21所示,以三甲基鎵TMGa為例,分析反應腔內的化學反應過程。在反應腔內靠近進氣口處(100℃左右時),通過與NH3 反應TMGa迅速耗盡變成加合物;隨著氣體向下噴射,加合物遇熱(在約500℃左右時)又重新分解使TMGa濃度升高;進而在更靠近高溫的基片處(溫度約900K以上時),TMGa則幾乎全部熱解為一甲基鎵MMGa,由MMGa作為GaN薄膜生長中Ga原子的主要來源。位於基片表面的氣體形成邊界層,該邊界層的厚度δ有一個優選值δ0 ,例如δ0 =10mm,δ0 一般與金屬有機氣體的種類擴散、溫度梯度、氣體流速等。通常是希望邊界層的厚度δ能夠小於該優選值δ0 ,以保證能具有高的薄膜生長率;否則薄膜生長率會降低而生成的寄生顆粒將增加。As shown in Fig. 21, trimethylgallium TMGa is taken as an example to analyze the chemical reaction process in the reaction chamber. In the reaction chamber near the inlet (about 100 ° C), TMGa is rapidly depleted by reaction with NH 3 to become an adduct; as the gas is sprayed downward, the adduct is heated (at about 500 ° C) It is re-decomposed to increase the concentration of TMGa; furthermore, at the substrate closer to high temperature (when the temperature is above 900K), TMGa is almost completely pyrolyzed into monomethyl gallium MMGa, which is mainly used as the Ga atom in the growth of GaN film. source. The gas on the surface of the substrate forms a boundary layer having a thickness δ having a preferred value δ 0 , such as δ 0 = 10 mm, δ 0 generally associated with species diffusion of metal organic gases, temperature gradients, gas flow rates, and the like. It is generally desirable that the thickness δ of the boundary layer can be less than the preferred value δ 0 to ensure a high film growth rate; otherwise the film growth rate will decrease and the generated parasitic particles will increase.

現有渦輪式(turbo disk type)的MOCVD設備中需要消耗的反應氣體更多,氣體流速高,並且必須使承載基片的基座高速旋轉(>1000rpm),來減少邊界層的厚度δ,及使氣體能夠在基片上均勻分布。本發明在渦輪式的MOCVD設備中使用上述各實施例描述的噴淋頭後,不需要使基座高速旋轉,也能保證有具有高的薄膜生長率和氣體均勻分布狀態。In the existing turbo disk type MOCVD equipment, more reaction gas is consumed, the gas flow rate is high, and the base of the carrier substrate must be rotated at a high speed (>1000 rpm) to reduce the thickness δ of the boundary layer, and The gas can be evenly distributed on the substrate. According to the present invention, in the turbine type MOCVD apparatus, after the shower heads described in the above embodiments are used, it is possible to ensure a high film growth rate and a uniform gas distribution state without rotating the susceptor at a high speed.

儘管本發明的內容已經通過上述優選實施例作了詳細介紹,但應當認識到上述的描述不應被認為是對本發明的限制。在本領域技術人員閱讀了上述內容後,對於本發明的多種修改和替代都將是顯而易見的。因此,本發明的保護範圍應由所附的專利範圍來限定。Although the present invention has been described in detail by the preferred embodiments thereof, it should be understood that the foregoing description should not be construed as limiting. Various modifications and alterations of the present invention will be apparent to those skilled in the art. Therefore, the scope of the invention should be limited by the scope of the appended claims.

800‧‧‧噴淋頭
810‧‧‧第一進氣導管
811‧‧‧第一導管
820‧‧‧第二進氣導管
821、822‧‧‧第二導管
823‧‧‧多面體漏斗結構
830‧‧‧第一進氣口
840‧‧‧第二進氣口
850‧‧‧冷卻介質管道
851‧‧‧第一隔板
852‧‧‧第二隔板
853‧‧‧第三隔板
854‧‧‧冷卻板
855‧‧‧緩衝區
860‧‧‧雙錐形漏斗結構
861‧‧‧上段
862‧‧‧下段
900‧‧‧反應腔
910‧‧‧基座
920‧‧‧基片
930‧‧‧加熱器
Od-1、Od-2、Od-4、Od -x‧‧‧末端口徑
Od-3‧‧‧外徑
Od-5‧‧‧首端口徑
T、T-2‧‧‧厚度
T-1、T-3、T-4‧‧‧距離
θ‧‧‧角度
δ0‧‧‧厚度
800‧‧‧Sprinkler
810‧‧‧First intake duct
811‧‧‧First catheter
820‧‧‧Second intake duct
821, 822‧‧‧ second catheter
823‧‧‧Multifaceted funnel structure
830‧‧‧First air inlet
840‧‧‧second air inlet
850‧‧‧Cooling medium pipeline
851‧‧‧ first partition
852‧‧‧Second partition
853‧‧‧ third partition
854‧‧‧Cooling plate
855‧‧‧buffer
860‧‧‧Double cone funnel structure
861‧‧‧上段
862‧‧‧ lower section
900‧‧‧Reaction chamber
910‧‧‧Base
920‧‧‧ substrates
930‧‧‧heater
O d-1 , O d-2 , O d-4 , O d -x ‧‧‧ end caliber
The outer diameter O d-3 ‧‧‧
O d-5 ‧‧‧first port diameter
T, T -2 ‧‧‧ thickness
T -1 , T -3 , T -4 ‧‧‧ Distance θ‧‧‧ Angle δ 0 ‧‧‧ Thickness

圖1、圖2及圖3是現有第一種進氣裝置氣體分布效果的側視圖及俯視圖; 圖4是設置本發明所述進氣及冷卻裝置的MOCVD設備的結構示意圖; 圖5是本發明所述進氣及冷卻裝置的進氣口分布的示意圖; 圖6、圖7是本發明所述裝置在第一實施例中的A-A’向和B-B’向的剖視圖; 圖8、圖9是本發明所述裝置在第二實施例中的C-C’向和B-B’向的剖視圖; 圖10是本發明所述裝置在第三實施例中的B-B’ 向的剖視圖; 圖11是本發明所述裝置中冷卻板的第二進氣口為多面體漏斗結構的示意圖; 圖12是圖11所示多面體漏斗結構的一個示例在A-A’向的剖視圖; 圖13是圖11所示多面體漏斗結構的另一個示例在B-B’向的剖視圖。 圖14是本發明所述裝置的冷卻板上的進氣口分布示意圖; 圖15、圖16是本發明中第二進氣口為錐形漏斗結構時冷卻板沿A-A’向和B-B’向的示意圖; 圖17、圖18是本發明中第二進氣口為雙錐形漏斗結構時冷卻板沿A-A’向和B-B’向的示意圖; 圖19是本發明中冷卻板上進氣口分布的一個具體示例的尺寸示意圖; 圖20是本發明中第二進氣口為雙錐形漏斗結構時的一個具體示例的尺寸示意圖; 圖21是本發明中反應腔內的化學反應過程示意圖;1 , 2 and 3 are a side view and a plan view of a gas distribution effect of a first air intake device of the present invention; FIG. 4 is a schematic structural view of an MOCVD apparatus provided with the air intake and cooling device of the present invention; FIG. 6 and FIG. 7 are cross-sectional views of the apparatus of the present invention in the A-A' direction and the BB' direction in the first embodiment; FIG. Figure 9 is a cross-sectional view of the apparatus of the present invention taken along the line C-C' and BB' in the second embodiment; Figure 10 is a BB' direction of the apparatus of the present invention in the third embodiment. 1 is a schematic view showing a structure of a polyhedral funnel of a cooling plate in the apparatus of the present invention; FIG. 12 is a cross-sectional view of an example of the structure of the polyhedral funnel shown in FIG. 11 taken along line A-A'; It is a cross-sectional view taken along line BB' of another example of the polyhedral funnel structure shown in FIG. Figure 14 is a schematic view showing the distribution of the air inlet on the cooling plate of the device of the present invention; Figure 15 and Figure 16 are the cooling plate along the A-A' direction and B- when the second air inlet is a tapered funnel structure in the present invention. Figure 17 and Figure 18 are schematic views of the cooling plate along the A-A' direction and the BB' direction when the second air inlet is a double-cone funnel structure in the present invention; Figure 19 is a view of the present invention. FIG. 20 is a schematic view showing the size of a specific example of the distribution of the intake port on the cooling plate; FIG. 20 is a schematic view showing a specific example of the case where the second intake port is a double-cone funnel structure in the present invention; Schematic diagram of the chemical reaction process;

810‧‧‧第一進氣導管 810‧‧‧First intake duct

811‧‧‧第一導管 811‧‧‧First catheter

820‧‧‧第二進氣導管 820‧‧‧Second intake duct

821‧‧‧第二導管 821‧‧‧second catheter

830‧‧‧第一進氣口 830‧‧‧First air inlet

840‧‧‧第二進氣口 840‧‧‧second air inlet

851‧‧‧第一隔板 851‧‧‧ first partition

852‧‧‧第二隔板 852‧‧‧Second partition

853‧‧‧第三隔板 853‧‧‧ third partition

854‧‧‧冷卻板 854‧‧‧Cooling plate

Claims (10)

一種用於MOCVD設備的進氣及冷卻裝置,設有位於反應腔內頂部的噴淋頭,其中包含: 多個互相隔離的反應氣體擴散腔,所述多個反應氣體擴散腔包括多塊隔板,其中底部隔板上設置有多組氣體導管,通過導管向反應腔通入反應氣體,所述多組氣體導管包括: 一組第一進氣導管,用來向MOCVD設備的反應腔內輸送有機金屬氣體; 一組第二進氣導管,用來輸送氫化物氣體;所述有機金屬氣體和氫化物氣體由該噴淋頭輸送的載氣攜帶至反應腔內底部的基片表面進行薄膜沉積反應; 所述多個反應氣體擴散腔下方還包括一塊冷卻板,所述反應氣體擴散腔位於底部的隔板與冷卻板之間構成隔離氣體擴散腔,所述冷卻板上包括: 一組第一進氣口,用來向所述反應腔內輸送隔離氣體;每個所述第一進氣導管分別穿設在與之相對應的一個第一進氣口之中,使第一進氣口輸送的隔離氣體所形成的簾幕狀氣流環繞在有機金屬氣體週邊,將剛噴出的有機金屬氣體與氫化物氣體隔開;以及, 一組第二進氣口,各自為下端口徑大於上端口徑的漏斗狀; 所述第一進氣口及第二進氣口的下端開口,在冷卻板的底面相互間隔且交替分布;每個所述第二進氣口和與之相對應的一個第二進氣導管連通,通過所述第二進氣口將氫化物氣體和載氣混合後的氣體向所述反應腔內輸送。An intake and cooling device for an MOCVD apparatus, comprising a showerhead located at the top of the reaction chamber, comprising: a plurality of mutually separated reaction gas diffusion chambers, the plurality of reaction gas diffusion chambers comprising a plurality of separators Wherein the bottom baffle is provided with a plurality of sets of gas conduits through which a reaction gas is introduced into the reaction chamber, the plurality of sets of gas conduits comprising: a set of first intake ducts for transporting organic metals into the reaction chamber of the MOCVD apparatus a second intake duct for transporting a hydride gas; the organometallic gas and the hydride gas are carried by the shower gas carried by the shower head to the surface of the substrate at the bottom of the reaction chamber for a thin film deposition reaction; The plurality of reaction gas diffusion chambers further include a cooling plate, and the reaction gas diffusion chamber is disposed between the partition plate at the bottom and the cooling plate to form an isolation gas diffusion chamber, and the cooling plate comprises: a set of first air intake a port for conveying an isolation gas into the reaction chamber; each of the first intake ducts is respectively disposed in a corresponding one of the first intake ports to make the first intake air a curtain-like airflow formed by the transporting isolation gas surrounds the periphery of the organometallic gas, separating the freshly ejected organometallic gas from the hydride gas; and a set of second air inlets each having a lower port diameter greater than an upper port diameter a funnel shape; the lower end openings of the first air inlet and the second air inlet are spaced apart from each other and alternately arranged on a bottom surface of the cooling plate; each of the second air inlets and a second one corresponding thereto The gas conduit is in communication, and the gas obtained by mixing the hydride gas and the carrier gas is transported into the reaction chamber through the second intake port. 如申請專利範圍第1項之用於MOCVD設備的進氣及冷卻裝置,其中所述第一進氣導管單獨輸送有機金屬氣體,或者輸送有機金屬氣體和載氣的混合氣體; 所述第二進氣導管單獨輸送氫化物氣體,或者輸送氫化物氣體和載氣的混合氣體; 所述第一進氣口輸送的隔離氣體,是載氣或吹掃氣體或其混合氣體。An intake and cooling device for an MOCVD apparatus according to claim 1, wherein the first intake duct separately transports an organometallic gas or a mixed gas of an organometallic gas and a carrier gas; The gas conduit separately transports the hydride gas or a mixed gas of the hydride gas and the carrier gas; the isolation gas delivered by the first inlet is a carrier gas or a purge gas or a mixed gas thereof. 如申請專利範圍第1項之用於MOCVD設備的進氣及冷卻裝置,其中在所述噴淋頭內部,多個互相隔離的反應氣體擴散腔的多塊隔板包括有第一隔板、第二隔板、第三隔板; 所述冷卻板與第三隔板之間形成的隔離氣體擴散腔,連通至開設在冷卻板上的所述第一進氣口和第二進氣口; 所述第三隔板與第二隔板之間形成的第二反應氣體擴散腔連通至第二進氣導管,所述第二導管插入到對應的第二進氣口中,使第二進氣口的上端圍繞在第二導管的下端的週邊; 所述第二隔板與第一隔板之間形成的第一反應氣體擴散腔連通至第一進氣導管,所述第一進氣導管穿插在對應的第一進氣口中。An intake and cooling device for an MOCVD apparatus according to claim 1, wherein a plurality of partitions of the plurality of mutually separated reactive gas diffusion chambers include a first separator, a second partition plate and a third partition plate; an isolation gas diffusion chamber formed between the cooling plate and the third partition plate is connected to the first air inlet and the second air inlet opening formed on the cooling plate; a second reaction gas diffusion chamber formed between the third partition and the second partition is connected to the second intake duct, and the second duct is inserted into the corresponding second intake port to make the second intake port The upper end surrounds the periphery of the lower end of the second duct; the first reactive gas diffusion chamber formed between the second partition and the first partition communicates with the first intake duct, and the first intake duct is interspersed in the corresponding In the first air inlet. 如申請專利範圍第3項之用於MOCVD設備的進氣及冷卻裝置,其中所述噴淋頭的冷卻板中,避開各進氣口及與之連通的各氣體通道的位置,設有供冷卻介質流通的管道。An air intake and cooling device for an MOCVD apparatus according to claim 3, wherein the cooling plate of the shower head is provided with a position for avoiding each of the air inlets and the gas passages communicating therewith. A pipe through which the cooling medium circulates. 如申請專利範圍第3項之用於MOCVD設備的進氣及冷卻裝置,其中所述第二進氣口的側壁設置有緩衝區,所述第二進氣導管連通所述第二反應氣體擴散腔將反應氣體通入所述緩衝區,反應氣體經過緩衝區後流入第二進氣口。An intake and cooling device for an MOCVD apparatus according to claim 3, wherein a sidewall of the second intake port is provided with a buffer zone, and the second intake conduit is connected to the second reaction gas diffusion cavity The reaction gas is introduced into the buffer zone, and the reaction gas passes through the buffer zone and flows into the second air inlet. 如申請專利範圍第3項之用於MOCVD設備的進氣及冷卻裝置,其中所述第二導管的封閉的底端插入到第進氣口內,在該第二導管側壁上開設有若干開孔用來輸送反應氣體。An intake and cooling device for an MOCVD apparatus according to claim 3, wherein a closed bottom end of the second conduit is inserted into the first air inlet, and a plurality of openings are formed in the second conduit side wall. Used to transport the reaction gas. 如申請專利範圍第1項之用於MOCVD設備的進氣及冷卻裝置,其中所述第一進氣口的下端位置低於穿設在其中的第一進氣導管的下端位置。An intake and cooling device for an MOCVD apparatus according to claim 1, wherein a lower end position of the first intake port is lower than a lower end position of the first intake duct disposed therein. 如申請專利範圍第1項或第3項所述的用於MOCVD設備的進氣及冷卻裝置,其中所述第二進氣口是側壁與豎直方向夾角恆定的錐形漏斗結構。An intake and cooling device for an MOCVD apparatus according to claim 1 or 3, wherein the second air inlet is a tapered funnel structure having a constant angle between the side wall and the vertical direction. 如申請專利範圍第1項或第3項所述的用於MOCVD設備的進氣及冷卻裝置,其中所述第二進氣口是雙錐形漏斗結構,包含側壁與豎直方向夾角為第一角度的上段,和側壁與豎直方向夾角為第二角度的下段,第一角度小於第二角度。The intake and cooling device for an MOCVD apparatus according to claim 1 or 3, wherein the second air inlet is a double-cone funnel structure, and includes an angle between the side wall and the vertical direction. The upper segment of the angle, and the lower portion of the second angle of the sidewall and the vertical direction, the first angle being smaller than the second angle. 如申請專利範圍第1項或第3項所述的用於MOCVD設備的進氣及冷卻裝置,其中所述第二進氣口為多面體漏斗結構,所述第二進氣口的末端邊緣為多邊形,側壁設有多條棱。An intake and cooling device for an MOCVD apparatus according to claim 1 or 3, wherein the second air inlet is a polyhedral funnel structure, and an end edge of the second air inlet is a polygon The side wall is provided with a plurality of ribs.
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