TW201540155A - Package substrate and manufacturing method thereof - Google Patents

Package substrate and manufacturing method thereof Download PDF

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TW201540155A
TW201540155A TW103112821A TW103112821A TW201540155A TW 201540155 A TW201540155 A TW 201540155A TW 103112821 A TW103112821 A TW 103112821A TW 103112821 A TW103112821 A TW 103112821A TW 201540155 A TW201540155 A TW 201540155A
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Taiwan
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package substrate
layer
opening
manufacturing
release layer
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TW103112821A
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Chinese (zh)
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TWI500374B (en
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Yu-Ying Chao
Zhao-Chong Zeng
Jian-Jhih Du
Chun-Wei Liu
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Unimicron Technology Corp
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Priority to TW103112821A priority Critical patent/TWI500374B/en
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Publication of TWI500374B publication Critical patent/TWI500374B/en
Publication of TW201540155A publication Critical patent/TW201540155A/en

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Abstract

This invention provides a manufacturing method of package substrate, firstly providing a board body having opposite a first surface and a second surface, part of the first surface of the board body is formed with a release layer, then forming a first inner wiring layer on the first surface of the board body where the release layer is not covered, and simultaneously forming a cladding layer that covers the release layer on the release layer, after that, forming a first wiring adding layer structure on the first inner wiring layer and the cladding layer, and removing the structure of the release layer in a direction towards the second surface, so as to form an opening connecting the first and the second surfaces, and the opening extends to the cladding layer, to form a slot structure. The manufacturing method facilitates removal of the release layer by the design of the cladding layer. This invention further provides the package substrate.

Description

封裝基板及其製法Package substrate and its preparation method

  本發明係有關一種封裝基板,尤指一種能提升可靠度之封裝基板及其製法。The invention relates to a package substrate, in particular to a package substrate capable of improving reliability and a preparation method thereof.

  隨著半導體封裝技術的演進,半導體裝置(Semiconductor device)已開發出不同的封裝型態,為了符合半導體封裝件輕薄短小、多功能、高速度及高頻化的開發方向,遂提供一種具有供電子元件放置之凹槽,此種方式不僅能整體 縮減半導體裝置的體積,亦能提升電性功能,而成為一種封裝趨勢。With the evolution of semiconductor packaging technology, semiconductor devices have developed different package types, and in order to meet the development direction of semiconductor packages, such as light, short, multi-functional, high-speed and high-frequency, The groove in which the component is placed can not only reduce the volume of the semiconductor device as a whole, but also enhance the electrical function, and becomes a packaging trend.

  習知製作凹槽之方式繁多。例如,壓合一核心板與具有開口之線路板,但因接置時需先進行對位動作而易產生精準誤差,且若接置不良將容易造成分層的問題,又,因需進行多段製程而導致製作時程較長,進而提高成本。There are many ways to make grooves. For example, a core board and a circuit board having an opening are pressed, but it is easy to produce a precise error due to the alignment action when the connection is performed, and if the connection is bad, the layering problem is easily caused, and The process leads to a longer manufacturing time and thus increases costs.

  於另一方式中。係先於封裝基板中嵌埋離型膜,再以頂針將離型膜上之結構移除。然而,此方式僅適合用於較大尺寸之凹槽,且該封裝基板之底側需製作供頂針插入之插孔,致使該封裝基板製作線路之空間減少。In another way. The release film is embedded in the package substrate, and the structure on the release film is removed by the ejector pin. However, this method is only suitable for the groove of a larger size, and the bottom side of the package substrate needs to be formed with a socket for insertion of the thimble, so that the space for making the circuit of the package substrate is reduced.

  因此,業界遂發展出一種製作開口之方式,如第1A至1B圖所示,係為習知封裝基板1之製法之剖視示意圖。Therefore, the industry has developed a method of making an opening, as shown in FIGS. 1A to 1B, which is a schematic cross-sectional view of a conventional method of manufacturing a package substrate 1.

  如第1A圖所示,提供一具有相對之第一表面10a及第二表面10b的板體10,且於該第一表面10a上形成一離形層11,並於該第一表面10a上壓合一線路增層結構14,而於該板體10之第二表面10b形成線路層13。As shown in FIG. 1A, a plate body 10 having a first surface 10a and a second surface 10b opposite to each other is provided, and a release layer 11 is formed on the first surface 10a, and is pressed on the first surface 10a. The line buildup structure 14 is integrated, and the circuit layer 13 is formed on the second surface 10b of the board 10.

  如第1B圖所示,移除該離形層11上的線路增層結構14材料,以形成開口100,且該離形層11外露於該開口100,俾供放置如半導體晶片之電子元件(圖略)。As shown in FIG. 1B, the material of the wiring build-up structure 14 on the release layer 11 is removed to form an opening 100, and the release layer 11 is exposed to the opening 100 for placing electronic components such as semiconductor wafers ( Figure omitted).

  惟,習知封裝基板之製法中,因該離型層11係接觸該板體10與該線路增層結構14之線路140,且該板體10與該線路140之材質不同,故不容易移除該離形層11,且於移除時容易損壞線路140。However, in the conventional method of manufacturing a package substrate, since the release layer 11 contacts the line 140 of the board body 10 and the line build-up structure 14, and the board 10 and the line 140 are different in material, it is not easy to move. In addition to the release layer 11, the line 140 is easily damaged upon removal.

  再者,若不移除該離型層11,將使該開口100之空間變小,而不利於放置電子元件之選擇性。Moreover, if the release layer 11 is not removed, the space of the opening 100 will be made small, which is disadvantageous for the selectivity of placing electronic components.

  因此,如何克服上述習知技術之種種問題,實已成為目前業界亟待克服之難題。Therefore, how to overcome the various problems of the above-mentioned prior art has become a difficult problem to be overcome in the industry.

  鑑於上述習知技術之種種缺失,本發明係提供一種封裝基板,係包括:板體,係具有相對之第一表面與第二表面、及連通該第一與第二表面之開口;第一內線路層,係設於該板體之第一表面上,且該第一內線路層具有外露於該開口之外露部,該外露部之邊緣係具有溝道;以及第一線路增層結構,係設於該第一內線路層上,且該開口延伸至該外露部,令該外露部與該開口作為槽結構。The present invention provides a package substrate, comprising: a plate body having opposite first and second surfaces, The circuit layer is disposed on the first surface of the board body, and the first inner circuit layer has an exposed portion exposed to the opening, the edge of the exposed portion has a channel; and the first line build-up structure The first inner circuit layer is disposed on the first inner circuit layer, and the opening extends to the exposed portion, so that the exposed portion and the opening serve as a groove structure.

  前述之封裝基板中,該溝道之深度係小於25μm,且該外露部外露於該開口之表面與該第一表面之間具有高度差。In the above package substrate, the depth of the channel is less than 25 μm, and the exposed portion is exposed to a height difference between the surface of the opening and the first surface.

  本發明亦提供一種封裝基板,係包括:板體,係具有相對之第一表面與第二表面、及連通該第一與第二表面之開口;第一內線路層,係設於該板體之第一表面上;以及第一線路增層結構,係設於該第一內線路層上並封蓋該開口之一側,且該開口延伸至該第一線路增層結構而成為槽結構,使部分該第一線路增層結構作為該槽結構之底部。The present invention also provides a package substrate, comprising: a plate body having opposite first and second surfaces, and an opening connecting the first and second surfaces; the first inner circuit layer is disposed on the plate body And the first line build-up structure is disposed on the first inner circuit layer and covers one side of the opening, and the opening extends to the first line build-up structure to form a groove structure. A portion of the first line build-up structure is made to be the bottom of the trench structure.

  前述之封裝基板中,該底部位於該開口中之表面係與該第一表面之間具有高度差。In the foregoing package substrate, the surface of the bottom portion in the opening has a height difference from the first surface.

  本發明復提供一種封裝基板之製法,係包括:提供一具有相對之第一表面與第二表面的板體,於該第一表面上定義一預移除區,且該預移除區上形成有離型層;於該板體未被離型層所覆蓋之第一表面上形成第一內線路層,同時於離型層上形成覆蓋該離型層之包覆層;於該第一內線路層與該包覆層上形成第一線路增層結構;以及移除該離型層及該預移除區朝該第二表面方向上之結構,以形成連通該第一與第二表面之開口,且該開口延伸至該第包覆層,而成為槽結構。The invention provides a method for manufacturing a package substrate, comprising: providing a plate body having an opposite first surface and a second surface, defining a pre-removed area on the first surface, and forming the pre-removed area a release layer; a first inner circuit layer formed on the first surface of the plate body not covered by the release layer, and a cladding layer covering the release layer is formed on the release layer; Forming a first line build-up structure on the circuit layer and the cover layer; and removing the release layer and the structure of the pre-removal area toward the second surface to form a communication between the first and second surfaces Opening, and the opening extends to the first cladding layer to form a groove structure.

  前述之製法中,該離形層之材質係為抗黏性或非黏性材質。例如,該離形層之厚度係至多100μm。In the above method, the material of the release layer is a non-stick or non-stick material. For example, the thickness of the release layer is at most 100 μm.

  前述之製法中,藉由定深盲撈(blind routing)方式移除該板體之第二表面與該離型層之間的材料。例如,該定深盲撈方式係沿該離型層之邊緣進行。In the above method, the material between the second surface of the plate and the release layer is removed by blind routing. For example, the deep blind fishing method is performed along the edge of the release layer.

  前述之製法中,該包覆層外露於該開口以作為該槽結構之底部,且該包覆層之表面與該第一表面之間具有高度差,並於形成該開口後,該底部之邊緣係具有溝道,且該溝道之深度係小於25μm。In the above method, the coating layer is exposed to the opening as the bottom of the groove structure, and the surface of the coating layer has a height difference from the first surface, and after the opening is formed, the edge of the bottom portion There is a channel, and the depth of the channel is less than 25 μm.

  前述之製法中,於形成該開口時,一併移除該包覆層外露於開口之部分,令該第一線路增層結構外露於該開口,以作為該槽結構之底部,且該底部之表面與該第一表面之間具有高度差。In the above method, when the opening is formed, the portion of the cladding exposed to the opening is removed, and the first line build-up structure is exposed to the opening to serve as the bottom of the trench structure, and the bottom portion There is a height difference between the surface and the first surface.

  前述之封裝基板及其製法中,復包括於該板體之第二表面上形成線路層。In the above package substrate and method of manufacturing the same, a circuit layer is formed on the second surface of the board.

  另外,前述之封裝基板及其製法中,復包括於該板體之第二表面上形成第二線路增層結構,且於移除該板體之第二表面與該離型層之間的材料時,一併移除該板體之第二表面上的材料,本案以向上增層一次為例,另外亦可依使用者需求選擇性地增層多層後再一併移除。In addition, in the foregoing package substrate and the manufacturing method thereof, the second line build-up structure is formed on the second surface of the board body, and the material between the second surface of the board body and the release layer is removed. At the same time, the material on the second surface of the plate body is removed. In this case, the upper layer is added once, and the layer may be selectively added and then removed according to the user's requirements.

  由上可知,本發明之封裝基板及其製法,係藉由先以該包覆層覆蓋該離型層,故於移除該離型層時,該離型層僅接觸該包覆層,因而容易移除該離形層,且不會損壞線路增層結構之線路,並使該開口之空間較大,以利於放置電子元件之選擇性。As can be seen from the above, the package substrate of the present invention and the method for preparing the same by covering the release layer with the cladding layer, the release layer only contacts the cladding layer when the release layer is removed. The release layer is easily removed without damaging the wiring of the line build-up structure and providing a large space for the opening to facilitate the placement of electronic components.

1,2,2’‧‧‧封裝基板1,2,2'‧‧‧Package substrate

10,20‧‧‧板體10,20‧‧‧ board

10a,20a‧‧‧第一表面10a, 20a‧‧‧ first surface

10b,20b‧‧‧第二表面10b, 20b‧‧‧ second surface

100,200‧‧‧開口100,200‧‧‧ openings

11,21‧‧‧離型層11,21‧‧‧ release layer

13,241,251‧‧‧線路層13,241,251‧‧‧ circuit layer

14‧‧‧線路增層結構14‧‧‧Line layering structure

140‧‧‧線路140‧‧‧ lines

22‧‧‧第一內線路層22‧‧‧First inner circuit layer

22’‧‧‧包覆層22'‧‧‧Cladding

22a,22b‧‧‧金屬材22a, 22b‧‧‧Metal

220‧‧‧外露部220‧‧‧Exposed Department

221‧‧‧溝道221‧‧‧Channel

23‧‧‧第二內線路層23‧‧‧Second inner circuit layer

24‧‧‧第一線路增層結構24‧‧‧First line build-up structure

240,250‧‧‧介電層240, 250‧‧‧ dielectric layer

242,252‧‧‧導電盲孔242,252‧‧‧ conductive blind holes

25‧‧‧第二線路增層結構25‧‧‧Second line build-up structure

26,26’‧‧‧槽結構26,26’‧‧‧ trough structure

260,260’‧‧‧底部260, 260’ ‧ ‧ bottom

C‧‧‧預移除區C‧‧‧Pre-removal area

D,T‧‧‧高度差D, T‧‧‧ height difference

d‧‧‧深度D‧‧‧depth

t‧‧‧厚度T‧‧‧thickness

  第1A至1B圖係為習知封裝基板之製法的剖視示意圖;以及1A to 1B are schematic cross-sectional views showing a method of manufacturing a conventional package substrate;

  第2A至2E圖係為本發明之封裝基板之製法之剖視示意圖;其中,第2E’圖係為第2E圖之另一實施例。2A to 2E are schematic cross-sectional views showing a method of manufacturing the package substrate of the present invention; wherein the 2E' diagram is another embodiment of the 2Eth diagram.

  以下藉由特定的具體實施例說明本發明之實施方式,熟悉此技藝之人士可由本說明書所揭示之內容輕易地瞭解本發明之其他優點及功效。The other embodiments of the present invention will be readily understood by those skilled in the art from this disclosure.

  須知,本說明書所附圖式所繪示之結構、比例、大小等,均僅用以配合說明書所揭示之內容,以供熟悉此技藝之人士之瞭解與閱讀,並非用以限定本發明可實施之限定條件,故不具技術上之實質意義,任何結構之修飾、比例關係之改變或大小之調整,在不影響本發明所能產生之功效及所能達成之目的下,均應仍落在本發明所揭示之技術內容得能涵蓋之範圍內。同時,本說明書中所引用之如“上”、“下”、“第一”、“第二”、及“一”等之用語,亦僅為便於敘述之明瞭,而非用以限定本發明可實施之範圍,其相對關係之改變或調整,在無實質變更技術內容下,當亦視為本發明可實施之範疇。It is to be understood that the structure, the proportions, the size, and the like of the present invention are intended to be used in conjunction with the disclosure of the specification, and are not intended to limit the invention. The conditions are limited, so it is not technically meaningful. Any modification of the structure, change of the proportional relationship or adjustment of the size should remain in this book without affecting the effects and the objectives that can be achieved by the present invention. The technical content disclosed in the invention can be covered. In the meantime, the terms "upper", "lower", "first", "second", "one", and the like, are used for convenience of description, and are not intended to limit the present invention. The scope of the invention, the change or adjustment of the relative relationship, is also considered to be within the scope of the invention.

  第2A至2E圖係為本發明之封裝基板2之製法之剖視示意圖。2A to 2E are schematic cross-sectional views showing a method of manufacturing the package substrate 2 of the present invention.

  如第2A圖所示,提供一具有相對之第一表面20a及第二表面20b的板體20,再於該第一表面20a上形成一離形層21。接著,於該板體20之第一表面20a與第二表面20b上同時形成金屬材22a,22b,且該金屬材22a,22b如化鍍銅、電鍍銅等,並無特別限制。As shown in FIG. 2A, a plate body 20 having a first surface 20a and a second surface 20b opposite thereto is provided, and a release layer 21 is formed on the first surface 20a. Then, the metal materials 22a, 22b are simultaneously formed on the first surface 20a and the second surface 20b of the plate body 20, and the metal materials 22a, 22b are, for example, copper plating, copper plating, or the like, and are not particularly limited.

  於本實施例中,該板體20可為一銅箔基板移除該銅箔後之基材,且待移除該銅箔後再形成該離形層21。In this embodiment, the plate body 20 can be a substrate after the copper foil substrate is removed from the copper foil, and the release layer 21 is formed after the copper foil is removed.

  再者,於該第一表面20a上定義一預移除區C,令該離型層21僅設於該預移除區C上。Furthermore, a pre-removed area C is defined on the first surface 20a such that the release layer 21 is disposed only on the pre-removed area C.

  又,該離型層21之材質係為抗黏性或非黏性的固態離型薄膜材料,如固態離型聚醯亞胺(Polyimide, PI)材,且該離型層21之厚度t係約為1μm至100μm之間。Moreover, the material of the release layer 21 is an anti-adhesive or non-adhesive solid release film material, such as a solid release polyimine (PI) material, and the thickness of the release layer 21 is t It is between about 1 μm and 100 μm.

  另外,該離型層21之製作係先將一固態離型薄膜貼覆於該第一表面20a上,再使用雷射加工以撕除該預移除區C外的離型薄膜材料,藉以形成該離型層21。In addition, the release layer 21 is formed by first attaching a solid release film to the first surface 20a, and then using laser processing to tear off the release film material outside the pre-removed area C, thereby forming The release layer 21 is.

  如第2B圖所示,圖案化蝕刻該金屬材22a,22b,以於該板體20之第一表面20a與該離型層21上分別形成第一內線路層22及覆蓋該離型層21之包覆層22’,且於該第二表面20b上形成第二內線路層23。As shown in FIG. 2B, the metal materials 22a, 22b are patterned and etched to form a first inner wiring layer 22 and cover the release layer 21 on the first surface 20a of the board 20 and the release layer 21, respectively. The cladding layer 22' is formed on the second surface 20b to form a second inner wiring layer 23.

  如第2C圖所示,於該板體20之第一表面20a、第一內線路層22與包覆層22’上形成第一線路增層結構24,且於該板體20之第二表面20b與該第二內線路層23上形成第二線路增層結構25。As shown in FIG. 2C, a first line build-up structure 24 is formed on the first surface 20a of the board 20, the first inner circuit layer 22 and the cladding layer 22', and on the second surface of the board 20 A second line build-up structure 25 is formed on the second inner circuit layer 23 and 20b.

  於本實施例中,該第一線路增層結構24具有至少一介電層240、設於該介電層240上之線路層241、及電性連接該線路層241之導電盲孔242。In this embodiment, the first line build-up structure 24 has at least one dielectric layer 240, a circuit layer 241 disposed on the dielectric layer 240, and a conductive via 242 electrically connected to the circuit layer 241.

  再者,該導電盲孔242係連接該第一內線路層22。Moreover, the conductive blind vias 242 are connected to the first inner wiring layer 22.

  又,該第二線路增層結構25具有至少一介電層250、設於該介電層250上之線路層251、及電性連接該線路層251與第二內線路層23之導電盲孔252。Moreover, the second circuit build-up structure 25 has at least one dielectric layer 250, a circuit layer 251 disposed on the dielectric layer 250, and a conductive blind via electrically connecting the circuit layer 251 and the second inner circuit layer 23. 252.

  另外,於該預移除區C所對應上方的介電層250中不會形成線路層251與第二內線路層23。In addition, the circuit layer 251 and the second inner wiring layer 23 are not formed in the dielectric layer 250 corresponding to the pre-removed area C.

  如第2D至2E圖所示,移除該離型層21及該預移除區C朝該第二表面20b方向上之結構,以形成連通該第一與第二表面20a,20b及第二線路增層結構25之開口200,且該包覆層22’外露於該開口200以作為外露部220,該開口200並延伸至該第一線路增層結構24,令該外露部220與該開口200作為槽結構26,俾供放置如半導體晶片之電子元件(圖略),其中,該包覆層22’(或該外露部220)係為該槽結構26之底部260。As shown in FIGS. 2D to 2E, the release layer 21 and the structure of the pre-removed area C in the direction of the second surface 20b are removed to form the first and second surfaces 20a, 20b and the second. An opening 200 of the line build-up structure 25, and the cover layer 22' is exposed to the opening 200 as an exposed portion 220, and the opening 200 extends to the first line build-up structure 24, so that the exposed portion 220 and the opening As a slot structure 26, an electronic component (not shown) such as a semiconductor wafer is placed, wherein the cladding layer 22' (or the exposed portion 220) is the bottom 260 of the trench structure 26.

  於本實施例中,係藉由定深盲撈(blind routing)方式移除該板體20之第二表面20b與該離型層21之間的材料、該離型層21及該板體20之第二表面20b上的材料,其精度可達25μm。具體地,係使用銑刀沿該離型層21之邊緣(即沿該預移除區C之邊緣)進行切除。In this embodiment, the material between the second surface 20b of the plate body 20 and the release layer 21, the release layer 21 and the plate body 20 are removed by blind routing. The material on the second surface 20b has an accuracy of up to 25 μm. Specifically, the cutting is performed along the edge of the release layer 21 (i.e., along the edge of the pre-removed area C) using a milling cutter.

  再者,形成該開口200後,於該外露部220上會有銑刀旋轉的痕跡,且該外露部220之邊緣係具有溝道221,該溝道221之深度d係小於25μm。Furthermore, after the opening 200 is formed, there is a trace of the milling cutter rotating on the exposed portion 220, and the edge of the exposed portion 220 has a channel 221 having a depth d of less than 25 μm.

  又,因為定深盲撈之方式是藉由偵測金屬與探針(圖略)間的電容以控制盲撈深度,故進行盲撈製程時,於底面保有金屬(即該包覆層22’),可更精確控制該槽結構26之深度,其精度可達25μm。Moreover, because the method of deep-blind fishing is to control the blind fishing depth by detecting the capacitance between the metal and the probe (not shown), when the blind fishing process is performed, the metal is retained on the bottom surface (ie, the cladding layer 22' The depth of the groove structure 26 can be more precisely controlled with an accuracy of up to 25 μm.

  另外,該底部260之表面(即該外露部220外露於該開口200之表面)與該第一表面20a之間具有高度差T,如第2E圖所示,該底部260之表面高度位置低於該第一表面20a之高度位置。In addition, the surface of the bottom portion 260 (ie, the exposed portion 220 is exposed on the surface of the opening 200) has a height difference T from the first surface 20a. As shown in FIG. 2E, the surface height of the bottom portion 260 is lower than that. The height position of the first surface 20a.

  於另一實施例中,如第2E’圖所示,移除製程後,可再移除外露於該開口200之外露部220,令該第一線路增層結構24之介電層240外露於該開口200,以作為槽結構26’之底部260’,且該底部260’位於該開口200中之表面係與該第一表面20a之間具有高度差D(D>10μm),即該底部260’之表面高度位置低於該第一表面20a之高度位置,而該介電層240之厚度之值大於該高度差D之值。In another embodiment, as shown in FIG. 2E′, after the removal process, the exposed portion 220 exposed to the opening 200 may be removed, so that the dielectric layer 240 of the first line build-up structure 24 is exposed. The opening 200 serves as the bottom portion 260' of the groove structure 26', and the surface of the bottom portion 260 in the opening 200 has a height difference D (D>10 μm) between the surface and the first surface 20a, that is, the bottom portion 260 The surface height position is lower than the height position of the first surface 20a, and the thickness of the dielectric layer 240 is greater than the value of the height difference D.

  本發明之製法中,因先以金屬包覆層22’覆蓋該離型層21,故於移除該離型層21時,該離型層21僅接觸金屬材質,因而容易移除該離形層21,且不會損壞線路層241,251、第一內線路層22與第二內線路層23。In the manufacturing method of the present invention, since the release layer 21 is first covered with the metal coating layer 22', when the release layer 21 is removed, the release layer 21 is only in contact with the metal material, so that the release is easily removed. The layer 21 does not damage the wiring layers 241, 251, the first inner wiring layer 22 and the second inner wiring layer 23.

  再者,本發明之製法因會移除該離型層21,故相較於習知製法,本發明之開口200之空間較大,因而有利於放置電子元件之選擇性。Furthermore, the method of the present invention removes the release layer 21, so that the opening 200 of the present invention has a larger space than the conventional method, thereby facilitating the selectivity of placing electronic components.

  本發明復提供一種封裝基板2,2’,係包括:一板體20、一第一內線路層22以及第一線路增層結構24。The present invention further provides a package substrate 2, 2' comprising: a plate body 20, a first inner circuit layer 22, and a first line build-up structure 24.

  所述之板體20係具有相對之第一表面20a與第二表面20b、及連通該第一與第二表面20a,20b之開口200。The plate body 20 has opposite first and second surfaces 20a and 20b, and an opening 200 communicating with the first and second surfaces 20a and 20b.

  所述之第一內線路層22係設於該板體20之第一表面20a上。The first inner circuit layer 22 is disposed on the first surface 20a of the board body 20.

  所述之第一線路增層結構24係設於該金屬層22上,且該開口200延伸至該第一線路增層結構24。The first line build-up structure 24 is disposed on the metal layer 22, and the opening 200 extends to the first line build-up structure 24.

  於一實施例中,該第一內線路層22具有外露於該開口200之外露部220,令該外露部220與該開口200作為槽結構26,且該外露部220作為該槽結構26之底部260。具體地,該外露部220外露於該開口200之表面與該第一表面20a之間具有高度差T,且該外露部220之邊緣係具有溝道221,例如,該溝道221之深度d係小於25μm。In an embodiment, the first inner circuit layer 22 has an exposed portion 220 exposed to the opening 200, so that the exposed portion 220 and the opening 200 serve as the groove structure 26, and the exposed portion 220 serves as the bottom portion of the groove structure 26. 260. Specifically, the exposed portion 220 has a height difference T between the surface of the opening 200 and the first surface 20a, and the edge of the exposed portion 220 has a channel 221, for example, the depth d of the channel 221 Less than 25 μm.

  於一實施例中,該第一線路增層結構24係封蓋該開口200之一側而成為槽結構26’,並令部分該第一線路增層結構24作為該槽結構26’之底部260’,且該底部260’位於該開口200中之表面與該第一表面20a之間具有高度差D。In one embodiment, the first line build-up structure 24 covers one side of the opening 200 to form a groove structure 26', and a portion of the first line build-up structure 24 serves as the bottom portion 260 of the groove structure 26'. ', and the surface of the bottom portion 260' located in the opening 200 has a height difference D from the first surface 20a.

  於一實施例中,所述之封裝基板2,2’復包括設於該板體20之第二表面20b上之線路層,如該第二內線路層23。In one embodiment, the package substrate 2, 2' includes a circuit layer disposed on the second surface 20b of the board 20, such as the second inner circuit layer 23.

  於一實施例中,所述之封裝基板2,2’復包括設於該板體20之第二表面20b上之第二線路增層結構25。In one embodiment, the package substrate 2, 2' includes a second line build-up structure 25 disposed on the second surface 20b of the board 20.

  綜上所述,本發明之封裝基板及其製法,主要藉由該包覆層之設計,以利於移除該離形層,故能縮短製程時間,且不會損壞線路層,並有利於放置電子元件之選擇性。In summary, the package substrate of the present invention and the manufacturing method thereof are mainly designed by the cover layer to facilitate removal of the release layer, thereby shortening the process time without damaging the circuit layer and facilitating placement. The selectivity of electronic components.

  上述實施例係用以例示性說明本發明之原理及其功效,而非用於限制本發明。任何熟習此項技藝之人士均可在不違背本發明之精神及範疇下,對上述實施例進行修改。因此本發明之權利保護範圍,應如後述之申請專利範圍所列。The above embodiments are intended to illustrate the principles of the invention and its effects, and are not intended to limit the invention. Any of the above-described embodiments may be modified by those skilled in the art without departing from the spirit and scope of the invention. Therefore, the scope of protection of the present invention should be as set forth in the appended claims.

2‧‧‧封裝基板 2‧‧‧Package substrate

20‧‧‧板體 20‧‧‧ board

20a‧‧‧第一表面 20a‧‧‧ first surface

20b‧‧‧第二表面 20b‧‧‧second surface

200‧‧‧開口 200‧‧‧ openings

22‧‧‧第一內線路層 22‧‧‧First inner circuit layer

22’‧‧‧包覆層 22'‧‧‧Cladding

220‧‧‧外露部 220‧‧‧Exposed Department

221‧‧‧溝道 221‧‧‧Channel

23‧‧‧第二內線路層 23‧‧‧Second inner circuit layer

24‧‧‧第一線路增層結構 24‧‧‧First line build-up structure

240,250‧‧‧介電層 240, 250‧‧‧ dielectric layer

241,251‧‧‧線路層 241,251‧‧‧circuit layer

242,252‧‧‧導電盲孔 242,252‧‧‧ conductive blind holes

25‧‧‧第二線路增層結構 25‧‧‧Second line build-up structure

26‧‧‧槽結構 26‧‧‧ trough structure

260‧‧‧底部 260‧‧‧ bottom

d‧‧‧深度 D‧‧‧depth

T‧‧‧高度差 T‧‧‧ height difference

Claims (1)

【第1項】[Item 1]   一種封裝基板之製法,係包括:
  提供一具有相對之第一表面與第二表面的板體,且於該第一表面上定義一預移除區,該預移除區上形成有離型層;
  於該板體未被離型層所覆蓋之第一表面形成第一內線路層,同時於離型層上形成覆蓋該離型層之包覆層;
  於該第一內線路層與該包覆層上形成第一線路增層結構;以及
  移除該離型層及該預移除區朝該第二表面方向上之結構,以形成連通該第一與第二表面之開口,且該開口延伸至該包覆層,而成為槽結構。
  【第2項】如申請專利範圍第1項所述之封裝基板之製法,其中,該包覆層外露於該開口以作為該槽結構之底部。
  【第3項】如申請專利範圍第2項所述之封裝基板之製法,其中,形成該開口後,該底部之邊緣係具有溝道。
  【第4項】如申請專利範圍第1項所述之封裝基板之製法,其中,於形成該開口時,一併移除外露於該開口之包覆層,令該第一線路增層結構外露於該開口,以作為該槽結構之底部。
  【第5項】如申請專利範圍第1項所述之封裝基板之製法,其中,藉由盲撈方式移除該板體之第二表面與該離型層之間的材料。
  【第6項】如申請專利範圍第5項所述之封裝基板之製法,其中,藉由包覆層可使盲撈之定深精度達25μm。
  【第7項】如申請專利範圍第5項所述之封裝基板之製法,其中,該定深盲撈方式係沿該離型層之邊緣進行。
  【第8項】如申請專利範圍第1項所述之封裝基板之製法,復包括於該板體之第二表面上形成線路層。
  【第9項】如申請專利範圍第1或8項所述之封裝基板之製法,復包括於該板體之第二表面上形成第二線路增層結構。
  【第10項】如申請專利範圍第9項所述之封裝基板之製法,復包括於移除該板體之第二表面與該離型層之間的材料時,一併移除該板體之第二表面上的材料。
  【第11項】一種封裝基板,係包括:
  板體,係具有相對之第一表面與第二表面、及連通該第一與第二表面之開口;
  第一內線路層,係設於該板體之第一表面上,且該第一內線路層具有外露於該開口之外露部,該外露部之邊緣係具有溝道;以及
  第一線路增層結構,係設於該第一內線路層上,且該開口延伸至該外露部,令該外露部與該開口作為槽結構。
  【第12項】如申請專利範圍第11項所述之封裝基板,其中,該溝道之深度係小於25μm。
  【第13項】如申請專利範圍第11項所述之封裝基板,復包括設於該板體之第二表面上之線路層。
  【第14項】如申請專利範圍第11或13項所述之封裝基板,復包括設於該板體之第二表面上之第二線路增層結構。
  【第15項】如申請專利範圍第11項所述之封裝基板,其中,該外露部外露於該開口之表面與該第一表面之間具有高度差。
  【第16項】一種封裝基板,係包括:
  板體,係具有相對之第一表面與第二表面、及連通該第一與第二表面之開口;
  第一內線路層,係設於該板體之第一表面上;以及
  第一線路增層結構,係設於該第一內線路層上並封蓋該開口之一側,使該第一線路增層結構封蓋該開口之部分作為該槽結構之底部,並使該開口延伸至該第一線路增層結構而成為槽結構。
  【第17項】如申請專利範圍第16項所述之封裝基板,復包括設於該板體之第二表面上之線路層。
  【第18項】如申請專利範圍第16或17項所述之封裝基板,復包括設於該板體之第二表面上之第二線路增層結構。
  【第19項】如申請專利範圍第16項所述之封裝基板,其中,該底部位於該開口中之表面係與該第一表面之間具有高度差。
A method for manufacturing a package substrate, comprising:
Providing a plate body having an opposite first surface and a second surface, and defining a pre-removal zone on the first surface, the pre-removal zone being formed with a release layer;
Forming a first inner wiring layer on the first surface of the plate body not covered by the release layer, and forming a coating layer covering the release layer on the release layer;
Forming a first line build-up structure on the first inner circuit layer and the cladding layer; and removing the release layer and the structure of the pre-removal area toward the second surface to form a first connection And an opening of the second surface, and the opening extends to the cladding layer to form a groove structure.
[Claim 2] The method of manufacturing a package substrate according to claim 1, wherein the coating layer is exposed to the opening to serve as a bottom portion of the groove structure.
[Claim 3] The method for manufacturing a package substrate according to claim 2, wherein, after the opening is formed, the edge of the bottom portion has a channel.
[Claim 4] The method for manufacturing a package substrate according to claim 1, wherein when the opening is formed, the coating layer exposed to the opening is removed to expose the first line build-up structure At the opening, as the bottom of the groove structure.
[Claim 5] The method for manufacturing a package substrate according to claim 1, wherein the material between the second surface of the plate body and the release layer is removed by blind fishing.
[Claim 6] The method for manufacturing a package substrate according to claim 5, wherein the depth of the blind fishing is 25 μm by the coating layer.
[Claim 7] The method for manufacturing a package substrate according to claim 5, wherein the deep blind fishing method is performed along an edge of the release layer.
[Embodiment 8] The method for manufacturing a package substrate according to claim 1, further comprising forming a circuit layer on the second surface of the board.
[Embodiment 9] The method for manufacturing a package substrate according to claim 1 or 8, further comprising forming a second line build-up structure on the second surface of the board.
[10] The method for manufacturing a package substrate according to claim 9, wherein the method further comprises removing the material between the second surface of the plate and the release layer. The material on the second surface.
[Item 11] A package substrate, comprising:
The plate body has opposite first and second surfaces, and an opening connecting the first and second surfaces;
a first inner circuit layer is disposed on the first surface of the board body, and the first inner circuit layer has an exposed portion exposed to the opening, the edge of the exposed portion has a channel; and the first line is layered The structure is disposed on the first inner circuit layer, and the opening extends to the exposed portion, so that the exposed portion and the opening serve as a groove structure.
[12] The package substrate of claim 11, wherein the channel has a depth of less than 25 μm.
[Claim 13] The package substrate of claim 11, further comprising a circuit layer disposed on the second surface of the board.
[Claim 14] The package substrate according to claim 11 or 13, further comprising a second line build-up structure disposed on the second surface of the board.
[Claim 15] The package substrate of claim 11, wherein the exposed portion has a height difference between a surface exposed to the opening and the first surface.
[Item 16] A package substrate, comprising:
The plate body has opposite first and second surfaces, and an opening connecting the first and second surfaces;
a first inner circuit layer disposed on the first surface of the board; and a first line build-up structure disposed on the first inner circuit layer and covering one side of the opening to make the first line The build-up structure covers a portion of the opening as the bottom of the groove structure and extends the opening to the first line build-up structure to form a groove structure.
[17] The package substrate of claim 16, comprising a circuit layer disposed on the second surface of the board.
[Embodiment 18] The package substrate of claim 16 or 17, further comprising a second line build-up structure disposed on the second surface of the board.
[Claim 19] The package substrate of claim 16, wherein the bottom surface of the bottom portion has a height difference from the first surface.
TW103112821A 2014-04-08 2014-04-08 Package substrate and manufacturing method thereof TWI500374B (en)

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Publication number Priority date Publication date Assignee Title
TWI683606B (en) * 2018-09-18 2020-01-21 健鼎科技股份有限公司 Printed circuit board and manufacturing method thereof

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US9609746B1 (en) 2015-12-14 2017-03-28 Unimicron Technology Corp. Circuit board structure and manufacturing method thereof

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JP4940124B2 (en) * 2007-12-27 2012-05-30 京セラSlcテクノロジー株式会社 Wiring board manufacturing method

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI683606B (en) * 2018-09-18 2020-01-21 健鼎科技股份有限公司 Printed circuit board and manufacturing method thereof

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