TW201533807A - Sealing sheet attaching method - Google Patents

Sealing sheet attaching method Download PDF

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Publication number
TW201533807A
TW201533807A TW103142531A TW103142531A TW201533807A TW 201533807 A TW201533807 A TW 201533807A TW 103142531 A TW103142531 A TW 103142531A TW 103142531 A TW103142531 A TW 103142531A TW 201533807 A TW201533807 A TW 201533807A
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Taiwan
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sealing sheet
semiconductor substrate
sealing
adhesive tape
attaching
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TW103142531A
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Chinese (zh)
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Takao Matsushita
Atsushi Hashimoto
Shinichirou Mori
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Nitto Denko Corp
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Publication of TW201533807A publication Critical patent/TW201533807A/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • H01L21/561Batch processing

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Abstract

After adhering a sealing sheet having the same shape as a semiconductor substrate to the center of a ring frame to which adhesive tape has been adhered, a semiconductor substrate (W) is positioned on a retaining table situated inside a decompression chamber, the retaining table having a heater embedded therein, the ring frame is positioned on a frame support arranged about the retaining table, and the semiconductor substrate and the adhesive tape are positioned facing one another. In this state, after the decompression chamber interior is decompressed to a vacuum state, the sealing sheet is placed under pressure by a pressing member while the sealing sheet is heated using the heater embedded in the retaining table and a heater embedded in the pressing member, and is adhered to the semiconductor substrate.

Description

密封片貼附方法 Sealing sheet attachment method

本發明係關於在製造半導體裝置的過程中,將形成有由樹脂組成物所構成之密封層的密封片貼附在含有電路基板之半導體基板的電路面,密封該電路面之密封片貼附方法。 The present invention relates to a sealing sheet in which a sealing layer composed of a resin composition is attached to a circuit surface of a semiconductor substrate including a circuit substrate, and a sealing sheet attaching method for sealing the circuit surface in the process of manufacturing a semiconductor device .

以框體圍繞1個半導體晶片的周圍後,利用由含浸有樹脂之預浸材所構成的第一密封用樹脂片和第二密封用樹脂片,分別從該半導體晶片的兩面夾住該半導體晶片,而密封半導體晶片以製造半導體裝置(參照專利文獻1)。 After the periphery of one semiconductor wafer is surrounded by the frame, the first sealing resin sheet and the second sealing resin sheet which are formed of the prepreg impregnated with the resin are respectively sandwiched from both sides of the semiconductor wafer. The semiconductor wafer is sealed to manufacture a semiconductor device (see Patent Document 1).

先行技術文獻Advanced technical literature 專利文獻Patent literature

專利文獻1 日本特開平5-291319號公報 Patent Document 1 Japanese Patent Laid-Open No. Hei 5-291319

然而,上述的習知方法會產生如下的問題。 However, the above conventional methods cause the following problems.

亦即,近年來,因為伴隨著應用程式(application)的急速進步所需求的高密度安裝的關係,半 導體裝置有小型化的傾向。因此,由於是在利用切割處理將半導體晶圓分斷成半導體元件之後,將半導體元件個別地用樹脂密封,所以會有傳輸量低落,進而造成生產效率降低之不良情況產生。 That is, in recent years, due to the high-density installation relationship required for rapid advancement of applications, half The conductor device tends to be miniaturized. Therefore, since the semiconductor wafer is individually sealed with a resin by the dicing process, the semiconductor element is individually sealed with a resin, so that the amount of transfer is lowered, and the production efficiency is lowered.

本發明係有鑒於此種情事而完成者,其主要目的在提供一種可將密封片以良好的效率、且以良好精確度貼附於半導體基板之密封片貼附方法。 The present invention has been made in view of such circumstances, and its main object is to provide a sealing sheet attaching method capable of attaching a sealing sheet to a semiconductor substrate with good efficiency and with good precision.

於是,本發明人等為解決該不良情況,反覆實驗及模擬等努力研究的結果,獲得了以下的見解。 Then, the inventors of the present invention have obtained the following findings in order to solve the problem and to study the results of repeated experiments such as experiments and simulations.

嘗試了於半導體基板的整面貼附形成有由樹脂組成物所構成之密封層的單片密封片並使其硬化後,分斷成該半導體裝置。 It has been attempted to attach and seal a single-piece sealing sheet having a sealing layer made of a resin composition on the entire surface of a semiconductor substrate, and then to form the semiconductor device.

然而,相較於透過切割處理而被分斷的晶片,將和大面積的半導體基板相同形狀的密封片貼附在該半導體基板之該方法的情況,密封片本身係有厚度及剛性。其結果,在貼附過程中密封片與半導體基板的黏著界面容易包含氣泡,於密封層內發生孔隙。特別是,將密封片貼附之後,藉由加熱來促進密封層的聚合反應而完全硬化的情況時,有氣泡係膨脹而半導體裝置變成不良品之新的問題發生。 However, compared with the case where the wafer which is cut by the dicing process is attached to the semiconductor substrate with a sealing sheet having the same shape as the large-area semiconductor substrate, the sealing sheet itself has thickness and rigidity. As a result, in the attaching process, the adhesive interface between the sealing sheet and the semiconductor substrate easily contains air bubbles, and voids are generated in the sealing layer. In particular, when the sealing sheet is attached and the polymerization reaction of the sealing layer is promoted by heating to be completely cured, there is a problem that the bubble expands and the semiconductor device becomes a defective product.

又,儘管將減壓室內形成真空狀態並一邊在半導體基板上將密封片加熱一邊貼附,但氣泡還是被包含在黏著界面。 Further, although the pressure-reducing chamber is in a vacuum state and the sealing sheet is attached while being heated on the semiconductor substrate, the air bubbles are contained in the adhesion interface.

為了查明該原因而反覆實驗的結果,釐清了在連續地重複貼附處理的情況下包含氣泡的情形頻繁發生。即,得知若在保持台上的半導體基板載置樹脂片的狀態下開始進行減壓室之減壓,則室內在達到真空狀態之前由於保持台的餘溫或是輻射熱之影響會使密封層軟化而包含氣泡。 In order to ascertain the cause and repeat the experiment, it was clarified that the case where bubbles are contained frequently occurs in the case where the attachment process is continuously repeated. In other words, when the decompression of the decompression chamber is started in a state where the resin sheet is placed on the semiconductor substrate on the holding stage, the sealing layer is caused by the residual temperature of the holding stage or the radiant heat before the chamber is brought into a vacuum state. Softens to contain bubbles.

本發明係為達成此目的,採下述之構成。 In order to achieve the object, the present invention has the following constitution.

意即,在製造半導體裝置的過程中,將形成有由樹脂組成物所構成之密封層的密封片貼附於半導體基板的密封片貼附方法,其特徵為具備:第一貼附過程,在貼附著黏著帶之環狀框架的中央貼附與前述半導體基板相同形狀的密封片;載置過程,將前述半導體基板載置於減壓室內之埋設著加熱器的保持台,同時將前述環狀框架載置在配備於該保持台周圍的支持構件,使半導體基板與黏著帶相對向;減壓過程,使前述減壓室內減壓以形成真空狀態;第二貼附過程,在真空狀態之前述減壓室內藉由加熱器一邊加熱密封片一邊以加壓構件加壓並將其貼附於半導體基板。 In the process of manufacturing a semiconductor device, a sealing sheet attaching a sealing sheet formed of a sealing layer composed of a resin composition to a semiconductor substrate, and having a first attaching process, a sealing sheet having the same shape as the semiconductor substrate is attached to the center of the annular frame to which the adhesive tape is attached; during the mounting process, the semiconductor substrate is placed in a holding chamber in which the heater is embedded in the decompression chamber, and the ring is formed at the same time The frame is placed on the support member disposed around the holding table to face the semiconductor substrate and the adhesive tape; the decompression process is performed to decompress the decompression chamber to form a vacuum state; and the second attachment process is in the vacuum state The pressure-reducing chamber is heated by a pressurizing member while heating the sealing sheet by a heater, and is attached to the semiconductor substrate.

根據上述方法,半導體基板與密封片係相對向,至減壓室內達到真空狀態為止。即,半導體基板與密封片乃保持著非接觸之狀態。因此,在達到真空狀態之前抑制密封層因保持台的熱而軟化的同時,避免密封片與半導體基板接觸。結果,空氣從密封片與半導體基 板的黏著界面完全地排出,因而得以回避氣泡被包含在該黏著界面,進而能降低半導體裝置的不良率。 According to the above method, the semiconductor substrate and the sealing sheet are opposed to each other until the vacuum chamber reaches a vacuum state. That is, the semiconductor substrate and the sealing sheet are kept in a non-contact state. Therefore, the sealing sheet is prevented from coming into contact with the semiconductor substrate while suppressing the sealing layer from being softened by the heat of the holding stage before the vacuum state is reached. As a result, air from the sealing sheet and the semiconductor base The adhesive interface of the board is completely discharged, so that it is avoided that bubbles are contained at the adhesive interface, thereby reducing the defective rate of the semiconductor device.

又,在上述方法中於載置過程藉由可進退的支持構件載置保持環狀框架,較佳為,在第二貼附過程中,因應藉由加壓構件的升降對密封片賦予的荷重而使前述支持構件升降。 Further, in the above method, the holding frame is placed by the support member that can be advanced and retracted during the placing process, and preferably, the load applied to the sealing piece by the lifting and lowering of the pressing member is performed in the second attaching process. The aforementioned support member is raised and lowered.

根據此方法,由於支持構件係跟隨著加壓構件的升降,可賦予密封片大致均一的荷重。 According to this method, since the supporting member follows the lifting and lowering of the pressing member, the sealing sheet can be given a substantially uniform load.

又,於上述方法中,加壓構件具備加熱器,亦可在第二貼附過程中,藉由保持台與加壓構件加熱密封片。 Further, in the above method, the pressurizing member is provided with a heater, and the sealing sheet may be heated by the holding stage and the pressing member during the second attaching process.

根據此方法,可以良好的效率將熱傳導至由加熱構件與保持台所夾住的密封片。 According to this method, heat can be conducted to the sealing sheet sandwiched by the heating member and the holding table with good efficiency.

根據本發明的密封片貼附方法,可以良好精確度將黏著保持於環狀框架之密封片貼附於半導體基板。 According to the sealing sheet attaching method of the present invention, the sealing sheet adhered to the annular frame can be attached to the semiconductor substrate with good precision.

23‧‧‧保持台 23‧‧‧ Keeping the table

25‧‧‧框架支持部 25‧‧‧Frame Support Department

26‧‧‧彈簧 26‧‧‧ Spring

27‧‧‧支持銷 27‧‧‧Support pins

30‧‧‧減壓室 30‧‧‧Decompression chamber

31‧‧‧按壓構件 31‧‧‧ Pressing members

32‧‧‧加熱器 32‧‧‧heater

33‧‧‧加熱器 33‧‧‧heater

DT‧‧‧黏著帶 DT‧‧‧ adhesive tape

f‧‧‧環狀框架 f‧‧‧Ring frame

T‧‧‧密封片 T‧‧‧ Sealing film

M‧‧‧密封層 M‧‧‧ sealing layer

S1‧‧‧第一剝離襯墊 S1‧‧‧First release liner

S2‧‧‧第二剝離襯墊 S2‧‧‧Second release liner

W‧‧‧半導體基板 W‧‧‧Semiconductor substrate

圖1係密封片之剖面圖。 Figure 1 is a cross-sectional view of a sealing sheet.

圖2係顯示密封片之貼附處理的流程圖。 Fig. 2 is a flow chart showing the attachment process of the sealing sheet.

圖3係顯示基板及密封片之搬運圖。 Fig. 3 is a view showing the conveyance of the substrate and the sealing sheet.

圖4係顯示第一貼附工程之構成的正面圖。 Fig. 4 is a front elevational view showing the constitution of the first attachment work.

圖5係顯示黏著帶之貼附動作的正面圖。 Fig. 5 is a front view showing the attachment action of the adhesive tape.

圖6係顯示黏著帶之貼附動作的正面圖。 Fig. 6 is a front view showing the attachment action of the adhesive tape.

圖7係顯示黏著帶之切斷動作的正面圖。 Fig. 7 is a front view showing the cutting operation of the adhesive tape.

圖8係顯示黏著帶之剝離動作的正面圖。 Fig. 8 is a front view showing the peeling action of the adhesive tape.

圖9係顯示第一剝離襯墊之剝離動作的正面圖。 Fig. 9 is a front elevational view showing the peeling action of the first release liner.

圖10係顯示基板之搬送動作的正面圖。 Fig. 10 is a front elevational view showing the transport operation of the substrate.

圖11係顯示將基板設置於保持台之動作的正面圖。 Fig. 11 is a front elevational view showing the operation of placing a substrate on a holding table.

圖12係顯示將環狀框架設置於框架支持部之動作的正面圖。 Fig. 12 is a front elevational view showing the operation of providing the annular frame to the frame support portion.

圖13係顯示對基板貼附密封片之動作的正面圖。 Fig. 13 is a front elevational view showing the action of attaching a sealing sheet to a substrate.

圖14係顯示對基板貼附密封片之動作的正面圖。 Fig. 14 is a front elevational view showing the action of attaching a sealing sheet to a substrate.

以下,參照圖面來說明本發明之一實施例。以在表面形成有複數個半導體元件的半導體基板貼附形成有由樹脂組成物所構成之密封層的密封片的情形為例來作說明。 Hereinafter, an embodiment of the present invention will be described with reference to the drawings. A case where a sealing sheet having a sealing layer made of a resin composition is attached to a semiconductor substrate having a plurality of semiconductor elements formed on its surface will be described as an example.

<密封片> <sealing sheet>

密封片T係例如圖1所示利用與半導體基板W(以下僅以「基板W」稱之)相同形狀者。又,該密封片T係在密封層M的兩面添設了保護用之第一剝離襯墊S1以及第二剝離襯墊S2。第一剝離襯墊S1及第二剝離襯墊S2可利用相同形狀或為矩形,且也可利用與基板W相同尺寸以上者。 The sealing sheet T is, for example, the same shape as that of the semiconductor substrate W (hereinafter referred to simply as "substrate W") as shown in FIG. Moreover, this sealing sheet T is provided with the first release liner S1 and the second release liner S2 for protection on both surfaces of the sealing layer M. The first release liner S1 and the second release liner S2 may have the same shape or a rectangular shape, and may be the same size or larger than the substrate W.

密封層M是從密封材料形成為片狀。以密封材料而言,可列舉例如:熱硬化性矽樹脂、環氧樹脂、熱硬化性聚醯亞胺樹脂、酚樹脂(phenol resin)、脲樹脂 (urea resin)、三聚氰胺樹脂、不飽和聚酯樹脂、酞酸二烯丙酯(diallyl phthalate)樹脂、熱硬化性胺甲酸乙酯樹脂(urethane resin)等的熱硬化性樹脂。又,以密封材料而言,也可列舉:上述熱硬化性樹脂、和以適當的比例含有添加劑的熱硬化性樹脂組成物。 The sealing layer M is formed into a sheet shape from a sealing material. Examples of the sealing material include thermosetting resin, epoxy resin, thermosetting polyimide resin, phenol resin, and urea resin. A thermosetting resin such as a (urea resin), a melamine resin, an unsaturated polyester resin, a diallyl phthalate resin, or a thermosetting urethane resin. Moreover, the thermosetting resin and the thermosetting resin composition containing an additive in an appropriate ratio are also mentioned as a sealing material.

以添加劑而言,可列舉例如:充填劑、螢光體等。以充填劑而言,可列舉例如:矽石(silica)、氧化鈦(titania)、滑石(talc)、氧化鋁、氮化鋁、氮化矽等的無機微粒子,例如:矽氧(silicone)粒子等的有機微粒子等。螢光體具有波長轉換機能,可列舉例如:能將藍色光轉換成黃色光的黃色螢光體、將藍色光變成紅色光的紅色螢光體等。以黃色螢光體而言,可列舉例如:Y3Al5O12:Ce(YAG(釔‧鋁‧石榴石):Ce)等的石榴石型螢光體。以紅色螢光體而言,可列舉例如:CaAlSiN3:Eu、CaSiN2:Eu等的氮化物螢光體等。 Examples of the additive include a filler, a phosphor, and the like. Examples of the filler include inorganic fine particles such as silica, titania, talc, alumina, aluminum nitride, and tantalum nitride, for example, silicone particles. Etc. Organic particles and so on. The phosphor has a wavelength conversion function, and examples thereof include a yellow phosphor that converts blue light into yellow light, a red phosphor that converts blue light into red light, and the like. Examples of the yellow phosphor include a garnet-type phosphor such as Y 3 Al 5 O 12 :Ce (YAG (yttrium aluminum garnet): Ce). Examples of the red phosphor include a nitride phosphor such as CaAlSiN 3 :Eu or CaSiN 2 :Eu.

密封層M在密封半導體元件前,被調整成半固體狀,具體而言,於密封材料含有熱硬化性樹脂的情況,可在例如:完全硬化(C階段化)之前,亦即,在半硬化(B階段)狀態下進行調整。 The sealing layer M is adjusted to be semi-solid before sealing the semiconductor element. Specifically, when the sealing material contains a thermosetting resin, it can be, for example, completely cured (C-staged), that is, in a semi-hardened state. Adjust in the (B phase) state.

密封層M的尺寸係可依半導體元件及基板的尺寸而適當設定。具體而言,在密封片被準備為長條片的情況下,密封層M的左右方向的長度、即寬度為例如100mm以上,較佳為200mm以上,例如為1500mm以下,較佳為700mm以下。又,密封層M的厚度係可因應半導體元件的尺寸而適當設定,例如為30μm以上,較佳 為100μm以上,又,例如為3000μm以下,較佳為1000μm以下。 The size of the sealing layer M can be appropriately set depending on the size of the semiconductor element and the substrate. Specifically, when the sealing sheet is prepared as a long piece, the length of the sealing layer M in the left-right direction, that is, the width is, for example, 100 mm or more, preferably 200 mm or more, for example, 1500 mm or less, preferably 700 mm or less. Further, the thickness of the sealing layer M can be appropriately set in accordance with the size of the semiconductor element, and is, for example, 30 μm or more, preferably. It is 100 μm or more, and is, for example, 3000 μm or less, preferably 1,000 μm or less.

第一剝離襯墊S1及第二剝離襯墊S2可列舉:例如聚乙烯片、聚酯片(PET等)、聚苯乙烯片、聚碳酸酯片、聚醯亞胺片等的聚合物片,例如陶瓷片,例如金屬箔等。在剝離襯墊之與密封層M接觸的接觸面上,亦可實施氟處理等的脫模處理。第一剝離襯墊及第二剝離襯墊的尺寸係可依剝離條件而適當設定,厚度為例如15μm以上,較佳為25μm以上,又,例如為125μm以下,較佳為75μm以下。 The first release liner S1 and the second release liner S2 may, for example, be a polymer sheet such as a polyethylene sheet, a polyester sheet (PET or the like), a polystyrene sheet, a polycarbonate sheet, or a polyimide sheet. For example, a ceramic sheet, such as a metal foil or the like. A release treatment such as fluorine treatment may be performed on the contact surface of the release liner which is in contact with the sealing layer M. The size of the first release liner and the second release liner can be appropriately set depending on the peeling conditions, and the thickness is, for example, 15 μm or more, preferably 25 μm or more, and is, for example, 125 μm or less, or preferably 75 μm or less.

<密封片貼附方法> <Sealing sheet attachment method>

依照圖2的流程圖以及圖3至圖14來說明透過黏著帶於環狀框架的中央貼附密封片之後,將該密封片貼附於基板之一連串的動作。 The operation of attaching the sealing sheet to the center of the annular frame after the adhesive tape is attached to the center of the annular frame in accordance with the flow chart of FIG. 2 and FIGS. 3 to 14 will be described.

首先,搬送機構1的吸附環2係將積層收納於儲藏台(stocker)18的環狀框架f自上方吸附保持之後朝密封片供給部移動(步驟S1A)。如圖3所示,使搬送機構1中央的吸附板3之底面以較環狀框架f低的位置之方式下降,吸附保持被積層的密封片T(步驟S2A)。之後,搬送機構1係使吸附板3上升至密封片T的底面與環狀框架f的底面為相同高度,於保持著密封片T與環狀框架f的狀態朝第一貼附工程移動。 First, the adsorption ring 2 of the transport mechanism 1 moves and holds the annular frame f stacked in the stocker 18 from above, and then moves toward the sealing sheet supply unit (step S1A). As shown in Fig. 3, the bottom surface of the suction plate 3 in the center of the conveying mechanism 1 is lowered at a position lower than the annular frame f, and the laminated sealing sheet T is adsorbed and held (step S2A). After that, the conveying mechanism 1 raises the suction plate 3 to the bottom surface of the sealing sheet T at the same height as the bottom surface of the annular frame f, and moves to the first attachment process while holding the sealing sheet T and the annular frame f.

在第一貼附工程中,如圖4及圖5所示,自帶供給部4的原材輥陸續送出黏著帶DT(切割帶),黏著帶DT係在經由剝離輥5、導引輥以及剝離單元6受到適 度的張力之狀態下被捲繞至帶回收部7。該黏著帶DT係在已藉由剝離輥5剝離掉表面的分離帶S之狀態下被供給到貼附位置。以剝離輥8剝離掉的分離帶S乃透過分離帶回收部9捲取回收。抵達貼附位置的搬送機構1係下降至既定的高度,使環狀框架f與密封片T靠近黏著帶DT且與黏著帶DT相對向。 In the first attachment process, as shown in FIGS. 4 and 5, the raw material rolls of the supply unit 4 successively feed the adhesive tape DT (cut tape), and the adhesive tape DT is passed through the peeling roller 5, the guide roller, and The peeling unit 6 is properly adapted The belt tension recovery unit 7 is wound in a state of tension. The adhesive tape DT is supplied to the attaching position in a state where the separation tape S of the surface has been peeled off by the peeling roller 5. The separation tape S peeled off by the peeling roller 8 is taken up and recovered by the separation belt collecting portion 9. The transport mechanism 1 that has arrived at the attaching position is lowered to a predetermined height, and the annular frame f and the sealing sheet T are brought close to the adhesive tape DT and face the adhesive tape DT.

如圖6所示,配備於黏著帶DT下方的貼附單元10係沿著黏著帶DT的輸送方向水平移動。此時,貼附單元10所具備之寬度比黏著帶DT更長的貼附輥11係因上升至既定的高度,故黏著帶DT被該貼附輥11按壓,而被貼附至遍及環狀框架f與密封片T(步驟S3A)。 As shown in FIG. 6, the attaching unit 10 provided under the adhesive tape DT is horizontally moved in the conveying direction of the adhesive tape DT. At this time, since the attaching roller 11 having the width of the attaching unit 10 longer than the adhesive tape DT is raised to a predetermined height, the adhesive tape DT is pressed by the attaching roller 11 and attached to the ring. The frame f and the sealing sheet T (step S3A).

貼附單元10一旦到達終端位置,配備在黏著帶DT下方的切斷單元12就如圖7所示,上升到既定的高度。切斷單元12具備切割器14,其於臂13的前端透過支持器設成將刀刃朝上。切斷單元12係以將切割器14的前端刺入黏著帶DT之狀態,沿著環狀框架f的形狀一邊旋轉,一邊切斷黏著帶DT。此時,被安裝在另一臂15之輥16係自切割器14的後方跟隨。也就是說,輥16係按壓已切斷之黏著帶DT的浮起部位,並將其貼附於環狀框架f。 Once the attaching unit 10 reaches the end position, the cutting unit 12 provided under the adhesive tape DT rises to a predetermined height as shown in FIG. The cutting unit 12 is provided with a cutter 14 that is provided at the front end of the arm 13 through the holder so that the blade is directed upward. The cutting unit 12 cuts the adhesive tape DT while rotating the tip end of the cutter 14 into the adhesive tape DT and rotating along the shape of the annular frame f. At this time, the roller 16 mounted on the other arm 15 follows from the rear of the cutter 14. That is, the roller 16 presses the floating portion of the cut adhesive tape DT and attaches it to the annular frame f.

黏著帶DT的切斷結束後,切斷單元12就朝下方的待機位置移動。同時,剝離單元6係解除對黏著帶DT的箝制,如圖8所示,該剝離單元6及貼附單元10係朝貼附開始位置側水平移動。此時,被切下成環狀框架f之形狀的黏著帶DT藉剝離輥17自該環狀框架f 被剝離的同時,被捲取回收到帶回收部4。之後,剝離單元6係回到初期位置。此時,隨著剝離單元6的移動,自帶供給部4陸續送出既定長度的黏著帶DT。 After the cutting of the adhesive tape DT is completed, the cutting unit 12 moves to the lower standby position. At the same time, the peeling unit 6 releases the nip of the adhesive tape DT, and as shown in Fig. 8, the peeling unit 6 and the attaching unit 10 are horizontally moved toward the attachment start position side. At this time, the adhesive tape DT cut into the shape of the annular frame f is taken from the annular frame f by the peeling roller 17 At the same time as being peeled off, it is taken up and recovered in the belt recovery unit 4. Thereafter, the peeling unit 6 is returned to the initial position. At this time, as the peeling unit 6 moves, the self-contained supply unit 4 successively delivers the adhesive tape DT of a predetermined length.

透過黏著帶DT而被環狀框架所保持的密封片T係藉由搬送機構1被搬送到第二貼附工程。在此搬送過程中,環狀框架f被傳遞至另一搬送機構19之吸附板,而如圖9所示上下反轉。 The sealing sheet T held by the annular frame through the adhesive tape DT is transported to the second attachment project by the transport mechanism 1. During this transfer, the annular frame f is transferred to the adsorption plate of the other transfer mechanism 19, and is reversed upside down as shown in FIG.

藉由搬送機構19被搬送的過程中,藉由剝離單元的剝離輥24,剝離帶Ts係被貼附在第一剝離襯墊S1的端部後,透過使搬送機構19水平移動,剝離輥24一邊轉動一邊將剝離帶Ts貼附於第一剝離襯墊S1的同時,藉由將該剝離帶Ts捲起使該第一剝離襯墊S1自密封層M逐漸剝離(步驟S4A)。 In the process of being conveyed by the transport mechanism 19, the peeling tape 24 is attached to the end portion of the first release liner S1 by the peeling roller 24 of the peeling unit, and then the transport mechanism 19 is horizontally moved by the peeling roller 24. While the peeling tape Ts is attached to the first release liner S1 while rotating, the first release liner S1 is gradually peeled off from the seal layer M by rolling up the release tape Ts (step S4A).

另一方面,以既定間隔隔開且多層地收納在載置於可升降的匣盒台之匣盒C中的基板W,係藉由柏努利夾盤(Bernoulli chuck)20以不接觸表面的方式被垂掛保持。如圖10所示,柏努利夾盤20係將從匣盒C取出的基板W傳遞到自對準器21的保持面中央突出的吸附墊22(步驟S1B)。對準器21係基於形成在基板W的凹口等等進行對位(步驟S2B)。之後,基板W再次藉由柏努利夾盤20從對準器21被搬送及載置於保持台23(步驟S3B)。 On the other hand, the substrate W which is housed at a predetermined interval and which is accommodated in a plurality of layers placed in the cassette C of the ejectable cassette table is not covered by a Bernoulli chuck 20 The way is kept hanging. As shown in FIG. 10, the Bernoulli chuck 20 transmits the substrate W taken out from the cassette C to the adsorption pad 22 which protrudes from the center of the holding surface of the self-aligner 21 (step S1B). The aligner 21 performs alignment based on a notch or the like formed on the substrate W (step S2B). Thereafter, the substrate W is again transported from the aligner 21 by the Bernoulli chuck 20 and placed on the holding table 23 (step S3B).

如圖11所示,配備有圍繞保持台23周圍的環狀框架支持部25。框架支持部25藉由複數條可藉由屬彈性體之彈簧26而升降的支持銷27朝向上方彈性偏 壓。因而在框架支持部25載置環狀框架f時,密封片T的底面係以較載置於保持台23之基板W的表面高度還要高的方式設定。框架支持部25的高度係因應使用之密封片T的厚度及基板W的厚度適宜地作設定。又,框架支持部25係相當於本發明的支持構件。 As shown in FIG. 11, an annular frame support portion 25 surrounding the periphery of the holding table 23 is provided. The frame supporting portion 25 is elastically biased upward by a plurality of support pins 27 which can be raised and lowered by the spring 26 which is an elastomer Pressure. Therefore, when the annular frame f is placed on the frame supporting portion 25, the bottom surface of the sealing sheet T is set to be higher than the surface height of the substrate W placed on the holding table 23. The height of the frame supporting portion 25 is appropriately set depending on the thickness of the sealing sheet T to be used and the thickness of the substrate W. Further, the frame support portion 25 corresponds to the support member of the present invention.

因此,如圖12所示,基板W被載置保持在保持台23後,藉由搬送機構19,環狀框架f被載置於框架支持部25(步驟S5)。 Therefore, as shown in FIG. 12, after the substrate W is placed and held by the holding table 23, the annular frame f is placed on the frame supporting portion 25 by the conveying mechanism 19 (step S5).

朝向收納有保持台23與框架支持部25的下殼體30A並在上方待機的上殼體30B係下降至既定的高度。上下殼體30A、30B的上端與下端面對面而形成減壓室30(步驟S6)。之後,減壓室30內部係逐漸減壓至達成真空為止(步驟S7)。 The upper casing 30B that is placed in the upper casing 30A in which the holding table 23 and the frame support portion 25 are housed and is placed on the upper side is lowered to a predetermined height. The upper end of the upper and lower casings 30A and 30B face the lower end surface to form a decompression chamber 30 (step S6). Thereafter, the inside of the decompression chamber 30 is gradually depressurized until a vacuum is reached (step S7).

如圖13所示,若腔室2的內部達到真空狀態,則在上殼體30B內,使可藉由缸體29升降的按壓構件31下降抵接於密封片T。此時,在上殼體30B內,使按壓構件31以及保持台23所具備的加熱器32、33運作且加熱密封片T(步驟S8)。如圖14所示,隨著密封片T因加熱而開始軟化並且將按壓構件31下降到既定的高度按壓密封片T,將密封片T貼附在基板W的表面(步驟S9)。 As shown in FIG. 13, when the inside of the chamber 2 is in a vacuum state, the pressing member 31 which can be raised and lowered by the cylinder 29 is lowered and abutted against the sealing sheet T in the upper casing 30B. At this time, in the upper casing 30B, the pressing members 31 and the heaters 32 and 33 provided in the holding table 23 are operated and the sealing sheet T is heated (step S8). As shown in FIG. 14, as the sealing sheet T starts to soften due to heating and the pressing member 31 is lowered to a predetermined height to press the sealing sheet T, the sealing sheet T is attached to the surface of the substrate W (step S9).

一旦加熱及加壓處理達到既定時間,就會使加熱器32、33停止運作。然後使按壓構件31上升、解除密封片T之加壓(步驟S10)。並且漸漸提升減壓室30內部的氣壓而回復到大氣狀態。 Once the heating and pressurization treatment has reached a predetermined time, the heaters 32, 33 are stopped. Then, the pressing member 31 is raised and the pressing of the sealing sheet T is released (step S10). Further, the air pressure inside the decompression chamber 30 is gradually increased to return to the atmospheric state.

之後,減壓室30內部達到了大氣狀態的時點,使上殼體30B上升後,將基板W以密封片T貼附而成的架設框架(mounting frame)藉由機械臂等的搬送機構保持並搬送到下一工程或是收納至匣盒(步驟S11)。以上結束一系列的動作。之後,在達到既定的處理片數之前,重複此一系列的處理(步驟S12)。又,步驟S3A係相當於本發明的第一貼附過程,步驟S6至步驟S8係相當於本發明的第二貼附過程。 After that, when the inside of the decompression chamber 30 reaches the atmospheric state, the upper casing 30B is raised, and the mounting frame in which the substrate W is attached by the sealing sheet T is held by a transfer mechanism such as a robot arm. Move to the next project or store it in the cassette (step S11). The above ends a series of actions. Thereafter, the series of processing is repeated until the predetermined number of processing sheets is reached (step S12). Further, the step S3A corresponds to the first attaching process of the present invention, and the step S6 to the step S8 corresponds to the second attaching process of the present invention.

根據上述的密封片貼附方法,在減壓室30達到真空狀態之前,由於密封片T與基板W係保持著相互分離的狀態,保持台23之熱傳導被隔斷,並抑制了密封層M因來自保持台23之輻射熱的影響而軟化。因此,可避免在貼附密封片T之前氣泡被包含在密封片T與基板W的黏著界面。也因此,在貼附密封片T後,即使進行使密封片T完全地硬化的正式硬化處理,也不會在密封層M產生孔隙導致製品不良。 According to the above-described sealing sheet attaching method, before the decompression chamber 30 reaches the vacuum state, since the sealing sheet T and the substrate W are kept separated from each other, the heat conduction of the holding stage 23 is blocked, and the sealing layer M is suppressed from coming. It softens by the influence of the radiant heat of the holding table 23. Therefore, it is possible to prevent the air bubbles from being contained in the adhesive interface of the sealing sheet T and the substrate W before the sealing sheet T is attached. Therefore, even after the sealing sheet T is attached, even if the main curing treatment for completely curing the sealing sheet T is performed, voids are not generated in the sealing layer M, resulting in product failure.

又,本發明亦可以下述之形態實施。 Further, the present invention can also be implemented in the following forms.

(1)亦可於上述各實施例中,保持台23與按壓構件31之任一者一方具備加熱器的構成。 (1) In each of the above embodiments, the heater 23 may be provided with one of the holding base 23 and the pressing member 31.

(2)在上述實施例中,雖以圓形的基板W為例進行了說明,但基板形狀亦可是正方形、長方形或者是多角形。 (2) In the above embodiment, the circular substrate W has been described as an example, but the substrate shape may be square, rectangular or polygonal.

(3)於上述實施例中,亦可利用缸體等的致動器使框架支持部25的支持銷27與按壓構件31的升降同步進行升降。 (3) In the above embodiment, the support pin 27 of the frame support portion 25 may be raised and lowered in synchronization with the lifting and lowering of the pressing member 31 by an actuator such as a cylinder.

(4)亦可於上述實施例中,搬送基板W的搬送機構係利用前端為馬蹄形、具有吸附功能的機械臂。在利用機械臂的情況時,以機械臂吸附保持基板W的背面進行搬送即可。又,保持台23係與對準器21相同地,具備自保持面中央進退的吸附墊,該吸附墊以在較框架支持部25更高的位置接收基板W的方式構成即可。 (4) In the above embodiment, the transport mechanism for transporting the substrate W may be a robot arm having a horseshoe shape at the tip end and having an adsorption function. In the case of using the robot arm, the back surface of the substrate W may be suctioned and held by the robot arm to carry it. Further, the holding table 23 is provided with a suction pad that advances and retracts from the center of the holding surface, similarly to the aligner 21, and the adsorption pad is configured to receive the substrate W at a position higher than the frame supporting portion 25.

(5)上述實施例中,亦可在自密封片T剝離掉第一剝離襯墊S1的狀態下貼附於黏著帶DT。 (5) In the above embodiment, the adhesive tape DT may be attached in a state where the first release liner S1 is peeled off from the self-sealing sheet T.

(6)亦可於上述實施例,在第一貼附工程中,使帶供給部4及帶回收部9等的各構成上下反轉,從環狀框架f與密封片T的背面側貼附黏著帶DT之構成。 (6) In the above-described embodiment, in the first attachment process, the respective configurations of the tape supply unit 4, the tape collection unit 9, and the like are reversed upside down, and attached from the annular frame f and the back side of the sealing sheet T. Adhesive tape DT composition.

[產業上的利用可能性][Industry use possibility]

誠如上述,本發明適於將密封片以良好的效率、且以良好的精確度貼附在半導體基板上。 As described above, the present invention is suitable for attaching a sealing sheet to a semiconductor substrate with good efficiency and with good precision.

23‧‧‧保持台 23‧‧‧ Keeping the table

25‧‧‧框架支持部 25‧‧‧Frame Support Department

26‧‧‧彈簧 26‧‧‧ Spring

27‧‧‧支持銷 27‧‧‧Support pins

29‧‧‧缸體 29‧‧‧Cylinder block

31‧‧‧按壓構件 31‧‧‧ Pressing members

32‧‧‧加熱器 32‧‧‧heater

33‧‧‧加熱器 33‧‧‧heater

DT‧‧‧黏著帶 DT‧‧‧ adhesive tape

M‧‧‧密封層 M‧‧‧ sealing layer

W‧‧‧半導體基板 W‧‧‧Semiconductor substrate

Claims (3)

一種密封片貼附方法,其係在製造半導體裝置的過程中,將形成有由樹脂組成物所構成之密封層的密封片貼附於半導體基板的密封片貼附方法,其特徵為具備:第一貼附過程,在貼附著黏著帶之環狀框架的中央貼附與前述半導體基板相同形狀的密封片;載置過程,將前述半導體基板載置於減壓室內之埋設著加熱器的保持台,同時將前述環狀框架載置在配備於該保持台周圍的支持構件,使半導體基板與黏著帶相對向;減壓過程,使前述減壓室內減壓以形成真空狀態;第二貼附過程,在真空狀態之前述減壓室內藉由加熱器一邊加熱密封片一邊以加壓構件加壓並將其貼附於半導體基板。 A sealing sheet attaching method is a sealing sheet attaching method in which a sealing sheet formed with a sealing layer composed of a resin composition is attached to a semiconductor substrate in the process of manufacturing a semiconductor device, and is characterized in that: a bonding process in which a sealing sheet having the same shape as the semiconductor substrate is attached to the center of the annular frame to which the adhesive tape is attached; and a mounting process is performed to mount the semiconductor substrate in a decompression chamber and a heater holding unit At the same time, the annular frame is placed on a support member disposed around the holding table to make the semiconductor substrate and the adhesive tape face each other; during the decompression process, the decompression chamber is depressurized to form a vacuum state; the second attaching process Then, the sealing sheet is heated by the heater while being heated in the vacuum chamber, and is pressed by the pressing member and attached to the semiconductor substrate. 如請求項1之密封片貼附方法,其中前述載置過程係藉可進退的支持構件載置保持環狀框架,前述第二貼附過程係因應藉由加壓構件的升降對密封片賦予的荷重而使前述支持構件升降。 The sealing sheet attaching method of claim 1, wherein the placing process is performed by holding the holding frame by the support member that can advance and retreat, and the second attaching process is applied to the sealing piece by the lifting of the pressing member. The support member is lifted and lowered by the load. 如請求項1或2之密封片貼附方法,其中前述加壓構件係具備加熱器,前述第二貼附過程係藉由保持台與加壓構件加熱密封片。 The sealing sheet attaching method according to claim 1 or 2, wherein the pressing member is provided with a heater, and the second attaching process heats the sealing sheet by the holding table and the pressing member.
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