TW201528413A - Batch type apparatus for processing substrate - Google Patents

Batch type apparatus for processing substrate Download PDF

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TW201528413A
TW201528413A TW103143285A TW103143285A TW201528413A TW 201528413 A TW201528413 A TW 201528413A TW 103143285 A TW103143285 A TW 103143285A TW 103143285 A TW103143285 A TW 103143285A TW 201528413 A TW201528413 A TW 201528413A
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unit
substrate processing
processing apparatus
batch type
door
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TW103143285A
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Chinese (zh)
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TWI698944B (en
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Jun-Ho Seol
Hyun-Ok Lim
Nam-Kyung Kim
Hyun-Jin Yeom
Kyoung-Wan Park
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Tera Semicon Corp
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Abstract

The present invention discloses a batch type apparatus for processing substrate. The batch type apparatus for processing substrate of the present invention is a batch type apparatus for processing substrate used for processing a plurality of substrates, which is characterized by comprising a main body and a door unit. The main body has a chamber for providing a substrate processing space. The chamber has a plurality of grooves for loading/unloading the plurality of substrates. The door unit is arranged in front of the main body to open/close at least one groove.

Description

批量式基板處理裝置 Batch type substrate processing device 發明領域 Field of invention

本發明是有關於一種批量式基板處理裝置,更詳細言之,其是有關於一種藉透過配置於本體前面之門單元來個別地開關槽而將腔室內部之熱損失最小化而使基板處理製程的效率性提高之批量式基板處理裝置。 The present invention relates to a batch type substrate processing apparatus, and more particularly to a substrate processing by minimizing heat loss inside a chamber by individually opening and closing a groove through a door unit disposed in front of the body. A batch type substrate processing apparatus with improved efficiency of a process.

發明背景 Background of the invention

基板處理裝置用於製造平板顯示器、半導體、太陽電池等時,概分為蒸氣沉積(Vapor Deposition)裝置、及退火(Annealing)裝置。 The substrate processing apparatus is generally classified into a vapor deposition (Vapor Deposition) apparatus and an annealing (Annealing) apparatus when manufacturing a flat panel display, a semiconductor, a solar cell, or the like.

蒸氣沉積裝置為用以形成構成平板顯示器之核心結構之透明傳導層、絕緣層、金屬層或矽層的裝置,有LPCVD(Low Pressure Chemical Vapor Deposition:低壓化學氣相沉積)或PECVD(Plasma-Enhanced Chemical Vapor Deposition:電漿輔助化學氣相沉積)等化學氣相蒸氣沉積裝置、及濺鍍(Sputtering)等物理氣相蒸氣沉積裝置。 The vapor deposition device is a device for forming a transparent conductive layer, an insulating layer, a metal layer or a germanium layer constituting a core structure of a flat panel display, and is LPCVD (Low Pressure Chemical Vapor Deposition) or PECVD (Plasma-Enhanced). Chemical Vapor Deposition: Chemical vapor deposition equipment such as chemical vapor deposition, and physical vapor deposition equipment such as sputtering.

其次,退火裝置為將膜蒸氣沉積於基板後使業經蒸氣沉積之膜之特性提高的裝置,為使業經蒸氣沉積之膜 結晶化或相變化的熱處理裝置。 Secondly, the annealing device is a device for improving the characteristics of the vapor deposited film after vapor deposition of the film on the substrate, in order to form a vapor deposited film. A crystallization or phase change heat treatment device.

一般,基板處理有處理1個基板之單片式(Single Substrate Type)及處理複數個基板之批量式(Batch Type)。單片式基板處理裝置具有結構簡單之優點,但有生產性降低之缺點,故要量產大多使用批量式基板處理裝置。 Generally, the substrate processing has a single-substrate type for processing one substrate and a batch type for processing a plurality of substrates. The monolithic substrate processing apparatus has the advantage of being simple in structure, but has the disadvantage of reduced productivity, and therefore, mass-produced substrate processing apparatuses are often used for mass production.

圖1為顯示習知批量式基板處理裝置10’之結構的立體圖。 Fig. 1 is a perspective view showing the structure of a conventional batch type substrate processing apparatus 10'.

如圖所示,習知之批量式基板處理裝置10’包含有具有提供基板處理空間之腔室105’之本體100’、裝載於腔室105’之複數個基板(圖中未示)及配置於本體100’之前面的門單元110’。門單元110’可一面上下滑動,一面將形成於本體100’之前面之出入口101’開關。 As shown, the conventional batch substrate processing apparatus 10' includes a body 100' having a chamber 105' for providing a substrate processing space, a plurality of substrates (not shown) mounted on the chamber 105', and a plurality of substrates (not shown) The door unit 110' in front of the body 100'. The door unit 110' is slidable up and down, and the inlet and outlet 101' formed in front of the body 100' is opened and closed.

習知之批量式基板處理裝置10’由於1個門單元110’僅開關1個出入口101’,故將出入口101’開啟時,腔室105’之大部分空間露出至外部,而有卸載處理完畢之基板50’時腔室105’內部之熱完全往外部損失之問題點。甚至在基板處理中僅須卸載少數基板時,也必須使門單元110’滑動來開啟出入口101’全體,故為了將已降低之腔室105’之內部之溫度提高至製程所需之溫度,而有浪費電力之問題點。 In the conventional batch type substrate processing apparatus 10', since only one door unit 110' is opened and closed with one inlet and outlet 101', when the inlet and outlet 101' is opened, most of the space of the chamber 105' is exposed to the outside, and the unloading process is completed. The problem that the heat inside the chamber 105' is completely lost to the outside when the substrate 50'. Even when only a few substrates have to be unloaded in the substrate processing, the gate unit 110' must be slid to open the entire inlet and outlet 101', so that the temperature inside the reduced chamber 105' is raised to the temperature required for the process. There is a problem with wasting power.

發明概要 Summary of invention

本發明是為了解決上述習知之諸問題而研究出, 其目的是提供個別地將槽開關以使腔室之熱損失最小化之批量式基板處理裝置。 The present invention has been developed to solve the above-mentioned problems, The purpose is to provide a batch type substrate processing apparatus that individually switches the tank switches to minimize heat loss from the chamber.

又,本發明之目的是提供一種縮短用以加熱腔室內部之時間而使基板處理製程之效率性提高的批量式基板處理裝置。 Further, it is an object of the present invention to provide a batch type substrate processing apparatus which is capable of improving the efficiency of a substrate processing process by heating the time inside the chamber.

為達成上述目的,本發明一實施形態之批量式基板處理裝置是用以處理複數個基板之批量式基板處理裝置,其包含有本體及門單元,該本體具有提供基板處理空間之腔室,該腔室具有用以裝載/卸載前述複數個基板之複數個槽;該門單元配置於前述本體之前面以開關至少1個前述槽。 In order to achieve the above object, a batch substrate processing apparatus according to an embodiment of the present invention is a batch substrate processing apparatus for processing a plurality of substrates, comprising a body and a door unit, the body having a chamber for providing a substrate processing space, The chamber has a plurality of slots for loading/unloading the plurality of substrates; the gate unit is disposed in front of the body to switch at least one of the slots.

根據如上述所構成之本發明,可個別地開關槽而使腔室之熱損失最小化。 According to the invention as constituted above, the grooves can be individually and individually switched to minimize heat loss in the chamber.

又,根據本發明,可縮短用以加熱腔室內部之時間而使基板處理製程之效率性提高。 Moreover, according to the present invention, the time for heating the inside of the chamber can be shortened, and the efficiency of the substrate processing process can be improved.

10,10’‧‧‧批量式基板處理裝置 10,10'‧‧‧Batch substrate processing unit

50‧‧‧基板 50‧‧‧Substrate

100,100’‧‧‧本體 100,100’‧‧‧ Ontology

101,101’‧‧‧出入口 101,101’‧‧‧ entrance

105,105’‧‧‧腔室 105,105’‧‧‧室

110,110’,120‧‧‧門單元 110,110’, 120‧‧‧ door unit

111‧‧‧前面出入口 111‧‧‧ Front entrance

112,112’‧‧‧擺動門 112,112’‧‧‧Swing gate

113‧‧‧軸 113‧‧‧Axis

114‧‧‧氣缸 114‧‧‧Cylinder

121‧‧‧主門 121‧‧‧ main door

125‧‧‧副門 125‧‧‧Sub door

125a‧‧‧上部單位副門 125a‧‧‧Upper unit sub-door

125b‧‧‧下部單位副門 125b‧‧‧Second unit sub-door

200‧‧‧加熱器單元 200‧‧‧heater unit

201‧‧‧單位加熱器 201‧‧‧Unit heater

220‧‧‧輔助加熱器單元 220‧‧‧Auxiliary heater unit

220a‧‧‧第1輔助加熱器單元 220a‧‧‧1st auxiliary heater unit

220b‧‧‧第2輔助加熱器單元 220b‧‧‧2nd auxiliary heater unit

300‧‧‧舟皿 300‧‧‧ boat

310‧‧‧承接台 310‧‧‧Receiving station

320‧‧‧支撐台 320‧‧‧Support table

330‧‧‧支撐肋 330‧‧‧Support ribs

400‧‧‧支持器 400‧‧‧Support

410‧‧‧支持器 410‧‧‧Support

420‧‧‧支撐銷 420‧‧‧Support pins

s‧‧‧槽 S‧‧‧ slot

圖1是顯示習知批量式基板處理裝置之結構的立體圖。 1 is a perspective view showing the structure of a conventional batch type substrate processing apparatus.

圖2是顯示本發明一實施形態之批量式基板處理裝置之結構的分解立體圖。 Fig. 2 is an exploded perspective view showing the structure of a batch type substrate processing apparatus according to an embodiment of the present invention.

圖3是顯示積層有本發明一實施形態之基板之結構的立體圖。 Fig. 3 is a perspective view showing a structure in which a substrate according to an embodiment of the present invention is laminated.

圖4是顯示本發明一實施形態之加熱器單元之結構的立體圖。 Fig. 4 is a perspective view showing the structure of a heater unit according to an embodiment of the present invention.

圖5及圖6是顯示本發明一實施形態之門單元之結構的正面圖。 5 and 6 are front elevational views showing the structure of a door unit according to an embodiment of the present invention.

圖7是顯示本發明另一實施形態之門單元之結構的立體圖及側截面圖。 Fig. 7 is a perspective view and a side cross-sectional view showing the structure of a door unit according to another embodiment of the present invention.

圖8是顯示本發明另一實施形態之門單元之動作的側截面圖。 Figure 8 is a side cross-sectional view showing the operation of a door unit according to another embodiment of the present invention.

圖9是測定習知批量式基板處理裝置之腔室內部之溫度變化的資料。 Fig. 9 is a view showing measurement of temperature changes inside a chamber of a conventional batch type substrate processing apparatus.

圖10是應用本發明一實施形態之門單元而測定腔室內部之溫度變化的資料。 Fig. 10 is a view showing measurement of temperature change inside a chamber by applying a door unit according to an embodiment of the present invention.

用以實施發明之形態 Form for implementing the invention

後述之對本發明之詳細說明可參照以可實施本發明之特定實施形態為範例而顯示之附加圖式。為了使該業者可充分實施本發明而詳細說明該等實施形態。務必理解雖然本發明之多種實施形態相互不同,但不必相互排斥。舉例言之,記載於此之特定形狀、構造及特性與一實施形態相關,可在不脫離本發明之精神及範圍下以其他實施形態實現。又,應理解各個所揭示之實施形態內之個別構成要件的位置或配置可在不脫離本發明之精神及範圍下變更。因而,後述之詳細說明並非被採用作為限定之說明,當適當地說明本發明之範圍時,便僅以與該請求項所主張均等 的所有範圍一同添附之請求項限定。在圖示中,類似之參照標號在各方面指相同或類似之功能,長度、面積、厚度、及其形態為了方便說明,亦可誇張呈現。 The detailed description of the present invention will be described with reference to the accompanying drawings. These embodiments will be described in detail in order to enable the practitioner to fully implement the invention. It is to be understood that although the various embodiments of the invention are different from each other, they are not necessarily mutually exclusive. For example, the specific shapes, structures, and characteristics described herein may be realized in other embodiments without departing from the spirit and scope of the invention. Further, it is to be understood that the position or arrangement of the individual constituent elements in the various embodiments disclosed herein can be modified without departing from the spirit and scope of the invention. Therefore, the following detailed description is not to be taken as a limiting description, and the scope of the invention All scopes are accompanied by a request limit. In the figures, like reference numerals refer to the same or similar functions in various aspects, and the length, the area, the thickness, and the shape thereof may be exaggerated for convenience of description.

在本說明書中,基板可理解為包含用於LED、LCD等顯示裝置之基板、半導體基板、太陽電池基板等之意思。 In the present specification, a substrate can be understood to include a substrate for a display device such as an LED or an LCD, a semiconductor substrate, a solar cell substrate, and the like.

又,在本說明書中,基板處理製程可理解為包含蒸氣沉積製程、熱處理製程等之意思。惟,在以下,假定為熱處理製程來說明。 Further, in the present specification, the substrate processing process can be understood to include a vapor deposition process, a heat treatment process, and the like. However, in the following, it is assumed to be a heat treatment process.

以下,參照添附圖式,詳細地說明本發明實施形態之批量式基板處理裝置。 Hereinafter, a batch type substrate processing apparatus according to an embodiment of the present invention will be described in detail with reference to the accompanying drawings.

圖2是顯示本發明一實施形態之批量式基板處理裝置10之結構的分解立體圖,圖3是顯示積層有本發明一實施形態之基板50之結構的立體圖,圖4是顯示本發明一實施形態之加熱器單元200之結構的立體圖。 2 is an exploded perspective view showing a configuration of a batch type substrate processing apparatus 10 according to an embodiment of the present invention, FIG. 3 is a perspective view showing a structure in which a substrate 50 according to an embodiment of the present invention is laminated, and FIG. 4 is a view showing an embodiment of the present invention. A perspective view of the structure of the heater unit 200.

首先,裝載於批量式基板處理裝置10之基板50之材質未特別限制,可裝載玻璃、塑膠、聚合物、矽晶圓等多種材質之基板50。在以下,假定最常用於平板顯示裝置之矩形玻璃基板來說明。以批量式基板處理裝置10處理之基板50之個數可考慮本體100之尺寸、基板50之尺寸等,適當地選擇。 First, the material of the substrate 50 mounted on the batch type substrate processing apparatus 10 is not particularly limited, and a substrate 50 of a plurality of materials such as glass, plastic, polymer, or germanium wafer can be mounted. In the following, a rectangular glass substrate most commonly used for a flat panel display device will be described. The number of the substrates 50 processed by the batch type substrate processing apparatus 10 can be appropriately selected in consideration of the size of the main body 100, the size of the substrate 50, and the like.

批量式基板處理裝置10具有形成約平行六面體形狀而構成外觀之本體100,可於本體100之內部形成為用以處理複數個基板50之空間之腔室105。本體100不僅可為 平行六面體形狀,亦可根據基板50之形狀,形成多種形狀,腔室105可設於密閉之空間。可於腔室105配置加熱器單元200、輔助加熱器單元220、舟皿300、支持器400、基板50、氣體供給管(圖中未示)、氣體排出管(圖中未示)等,在圖2中,省略詳細之圖示。 The batch type substrate processing apparatus 10 has a body 100 that is formed into an approximately parallelepiped shape to form an appearance, and can be formed inside the body 100 as a chamber 105 for processing a space of a plurality of substrates 50. The body 100 can be The parallelepiped shape may also be formed in various shapes according to the shape of the substrate 50, and the chamber 105 may be disposed in a sealed space. The heater unit 200, the auxiliary heater unit 220, the boat 300, the holder 400, the substrate 50, the gas supply tube (not shown), the gas discharge tube (not shown), and the like may be disposed in the chamber 105, In Fig. 2, the detailed illustration is omitted.

可於本體100之前面形成可裝載/卸載基板50之出入口101。可於本體100之前面設置可開關出入口101之第1實施形態之門單元110或第2實施形態之門單元120(參照圖7)。 An inlet and outlet 101 for loading/unloading the substrate 50 may be formed on the front side of the body 100. The door unit 110 of the first embodiment that can switch the inlet and outlet 101 or the door unit 120 of the second embodiment (see FIG. 7) can be provided in front of the main body 100.

本發明之批量式基板處理裝置10特徵在於包含有配置於本體100之前面以將至少1個槽s開關之門單元110、120。在此,槽s可定義為可以門單元110、120個別地開關之出入口101或腔室105之一部份區域。更詳細言之,槽s為可配置1組基板50及基板50穩定放置之基板支持器400之區域,可理解為後述加熱器單元200與相鄰之加熱器單元200之間的空間之意思。 The batch type substrate processing apparatus 10 of the present invention is characterized in that it includes gate units 110 and 120 disposed on the front surface of the body 100 to switch at least one groove s. Here, the groove s can be defined as a partial area of the inlet and outlet 101 or the chamber 105 in which the door units 110, 120 can be individually opened and closed. More specifically, the groove s is a region in which the substrate holder 400 in which the one substrate 50 and the substrate 50 are stably placed can be arranged, and can be understood as a space between the heater unit 200 and the adjacent heater unit 200 to be described later.

可於門單元110、120之內側面、即朝向腔室105之內部之側面設置熱反射板(圖中未示)。由於形成有出入口101之門單元110、120基本上有引起往外部之熱損失之情形,故藉設置上述熱反射板,可使往外部之熱損失量減少。除了上述熱反射板,亦可設置其他加熱器(圖中未示),使熱損失量減少。 A heat reflecting plate (not shown) may be disposed on the inner side of the door units 110, 120, that is, the side facing the inside of the chamber 105. Since the door units 110 and 120 in which the inlet and outlet 101 are formed basically cause heat loss to the outside, the amount of heat loss to the outside can be reduced by providing the heat reflecting plate. In addition to the above-mentioned heat reflecting plate, other heaters (not shown) may be provided to reduce the amount of heat loss.

藉以門單元110、120個別地開關槽s,即使在基板處理過程中,卸載少數基板50,亦不致對在腔室105之內 部之基板50的處理造成大幅影響,而可大為減少從腔室105之內部往外部損失之熱之量。詳細之事項參照圖5至圖8後述。 By individually switching the slots s by the gate units 110, 120, even if a small number of substrates 50 are unloaded during substrate processing, it is not within the chamber 105. The processing of the substrate 50 is greatly affected, and the amount of heat lost from the inside to the outside of the chamber 105 can be greatly reduced. The details will be described later with reference to FIGS. 5 to 8.

蓋(圖中未示)可開關地設置於本體100之後面,俾可修理及更換設置於腔室110之內部之例如舟皿300、氣體供給管(圖中未示)及氣體排出管(圖中未示)等。 A cover (not shown) is switchably disposed behind the body 100, and can be repaired and replaced, for example, in the interior of the chamber 110, such as a boat 300, a gas supply pipe (not shown), and a gas discharge pipe (Fig. Not shown in the middle).

參照圖3,本發明之批量式基板處理裝置10可包含用以支撐裝載於腔室105內之基板50之舟皿300。 Referring to FIG. 3, the batch substrate processing apparatus 10 of the present invention may include a boat 300 for supporting a substrate 50 loaded in the chamber 105.

舟皿300可具有下面接觸本體100之底面之承接台310、從承接台310之一側端部垂直地延長形成之支撐台320、從支撐台320之一側面水平地延長形成並形成為相互具有間隔且上下積層之複數個支撐肋330。舟皿300為一對對向配置而成1組,構成1組之舟皿300可配置成支撐肋330相互對向。 The boat 300 may have a receiving base 310 that is in contact with the bottom surface of the body 100, a support base 320 that is vertically extended from one side end of the receiving base 310, and is horizontally extended from one side of the support base 320 and formed to have each other. A plurality of support ribs 330 are stacked at intervals and above. The boat 300 is disposed in a pair of opposite pairs, and the boat 300 constituting one set may be disposed such that the support ribs 330 oppose each other.

可於舟皿300之各支撐肋330搭載支撐可供基板50穩定放置之支持器400。由於支持器400設置於腔室105之內部,故宜由處理基板50時可耐高溫且幾乎無構造之變化的石英等構成。 A supporter 400 for supporting the substrate 50 to be stably placed can be mounted on each of the support ribs 330 of the boat 300. Since the holder 400 is disposed inside the chamber 105, it is preferably constituted by quartz or the like which can withstand high temperatures and has almost no change in structure when the substrate 50 is processed.

支持器400可具有形成四角板形狀而長邊側下面部位受到支撐肋330支撐之承接板410、設置於承接板410之上面以支撐基板50之下面的複數個支撐銷420。於支撐銷420之上端部支撐基板50,支撐銷420之上端部宜形成為圓化以與基板50點接觸。如此一來,由於基板50之下面亦形成為如上面般大致露出之狀態,故可均一地處理基板50整 體。 The holder 400 may have a receiving plate 410 that forms a square plate shape and a lower side portion is supported by the supporting ribs 330, and a plurality of supporting pins 420 that are disposed on the receiving plate 410 to support the lower surface of the substrate 50. The substrate 50 is supported at the upper end of the support pin 420, and the upper end portion of the support pin 420 is preferably formed to be rounded to be in point contact with the substrate 50. In this way, since the lower surface of the substrate 50 is also formed in a state of being substantially exposed as above, the substrate 50 can be uniformly processed. body.

支撐於舟皿300之各支撐肋330之支持器400上下配置而構成相互平行,複數個基板50可具有一定間隔積層於腔室105內。 The holders 400 supported by the support ribs 330 of the boat 300 are arranged one above the other to form parallel to each other, and the plurality of substrates 50 may be laminated in the chamber 105 with a certain interval.

參照圖4,為直接加熱基板50,可於腔室100之內部設置沿著基板50之積層方向具一定間配置之複數個加熱器單元200。為可加熱基板50之兩面,基板50及支持器400可配置於加熱器單元200與相鄰之加熱器單元200之間。如前述,基板50、支撐器400、及配置於基板50與支持器400之上部及下部的加熱器單元200可構成1個槽s。 Referring to Fig. 4, in order to directly heat the substrate 50, a plurality of heater units 200 disposed along the stacking direction of the substrate 50 may be disposed inside the chamber 100. In order to heat both sides of the substrate 50, the substrate 50 and the holder 400 may be disposed between the heater unit 200 and the adjacent heater unit 200. As described above, the substrate 50, the support 400, and the heater unit 200 disposed on the upper portion and the lower portion of the substrate 50 and the holder 400 may constitute one groove s.

加熱器單元200可包含有與基板50之短邊方向平行地具有一定間隔之複數個單位加熱器201。單位加熱器201為一般長度之長圓筒形加熱器,可稱為構成加熱器單元200之單位體,其於石英管之內部插入有發熱體,透過設置於兩端之端子,承受外部電源之施加而使熱產生。單位加熱器201可從腔室110之一側面貫穿至另一側面配置。單位加熱器201之個數不限於圖4,可依腔室105之尺寸及基板50之尺寸多樣地變更。 The heater unit 200 may include a plurality of unit heaters 201 having a certain interval in parallel with the short side direction of the substrate 50. The unit heater 201 is a long cylindrical heater of a general length, and may be referred to as a unit body constituting the heater unit 200. The heating element is inserted into the quartz tube, and is transmitted through the terminals provided at both ends to withstand the application of an external power source. And let the heat happen. The unit heater 201 may be disposed from one side of the chamber 110 to the other side. The number of unit heaters 201 is not limited to FIG. 4, and can be variously changed depending on the size of the chamber 105 and the size of the substrate 50.

除了加熱器單元200之外,為了防止腔室100之內部之熱損失,還可設置複數個輔助加熱器單元220。輔助加熱器單元220亦可包含具有與加熱器單元200同一形態之複數個單位輔助加熱器201。 In addition to the heater unit 200, in order to prevent heat loss inside the chamber 100, a plurality of auxiliary heater units 220 may be provided. The auxiliary heater unit 220 may also include a plurality of unit auxiliary heaters 201 having the same configuration as the heater unit 200.

複數個輔助加熱器單元220可具有與基板50之短邊方向平行地配置之第1輔助加熱器單元220a、及與基板50 之長邊方向平行地配置之第2輔助加熱器單元220b。第1輔助加熱器單元220a可配置於腔室105之前面及後面,為了防止形成於本體100之前面之出入口101及形成於本體100之後面的蓋(圖中未示)引起之腔室105之內部的熱損失,可更稠密地配置單位輔助加熱器201之間隔。 The plurality of auxiliary heater units 220 may have a first auxiliary heater unit 220a disposed in parallel with the short side direction of the substrate 50, and the substrate 50 The second auxiliary heater unit 220b is disposed in parallel with the longitudinal direction. The first auxiliary heater unit 220a may be disposed on the front surface and the rear surface of the chamber 105, in order to prevent the inlet and outlet 101 formed on the front surface of the main body 100 and the chamber 105 (not shown) formed on the rear surface of the main body 100. The internal heat loss allows the spacing of the unit auxiliary heaters 201 to be more densely arranged.

如此,本發明之批量式基板處理裝置10將複數個加熱器單元200配置為可覆蓋收容於腔室105之內部之基板50的總面積,藉此,具有基板50之總面積皆可從單位加熱器201受到熱之施加而可均一地進行熱處理。 As described above, the batch type substrate processing apparatus 10 of the present invention arranges the plurality of heater units 200 so as to cover the total area of the substrate 50 housed inside the chamber 105, whereby the total area of the substrate 50 can be heated from the unit. The device 201 is heat-treated uniformly by application of heat.

為冷卻腔室105,可於各單位加熱器201之間配置冷卻管(圖中未示)。冷卻管之個數可依設置於腔室105之單位加熱器201之個數多樣地變更。又,冷卻管未必各單位加熱器201之間皆需配置,只要可使腔室105之內部適當地冷卻,亦可僅設置於一部份之單位加熱器201之間。另一方面,亦可不另外具備冷卻管,而於棒狀單位加熱器201之內部形成可供冷媒移動之流路(圖中未示),而將單位加熱器201同時用於加熱器及冷卻管。 In order to cool the chamber 105, a cooling pipe (not shown) may be disposed between each unit heater 201. The number of cooling tubes can be varied in accordance with the number of unit heaters 201 provided in the chamber 105. Further, the cooling tubes are not necessarily disposed between the unit heaters 201, and may be disposed only between a part of the unit heaters 201 as long as the inside of the chambers 105 can be appropriately cooled. On the other hand, instead of providing a cooling pipe, a flow path (not shown) through which the refrigerant can be moved is formed inside the rod-shaped unit heater 201, and the unit heater 201 is simultaneously used for the heater and the cooling pipe. .

藉設置冷卻管,腔室110之內部之熱可透過冷卻管傳導至腔室110之外部,而於基板處理結束後,使腔室110之內部迅速地冷卻。由於基板處理結束後,腔室110之內部不冷卻至預定溫度以下,便無法進行基板50之卸載作業,故可以冷卻管之作動,使腔室110之內部迅速地冷卻時,便可使基板處理製程之生產性大為提高。 By providing a cooling tube, the heat inside the chamber 110 can be conducted to the outside of the chamber 110 through the cooling tube, and after the substrate processing is finished, the inside of the chamber 110 is rapidly cooled. Since the inside of the chamber 110 is not cooled to a predetermined temperature or lower after the substrate processing is completed, the unloading operation of the substrate 50 cannot be performed, so that the operation of the cooling tube can be performed, and when the inside of the chamber 110 is rapidly cooled, the substrate can be processed. The productivity of the process is greatly improved.

以下,參照圖5至圖8,說明門單元110、120之結 構與動作。 Hereinafter, the junction of the door units 110 and 120 will be described with reference to FIGS. 5 to 8. Structure and action.

圖5為根據本發明之第1實施形態顯示包含複數個關閉狀態之擺動門112之門單元110的正面圖(圖5(a))、及顯示一部份擺動門112開啟之狀態之正面圖(圖5(b)。 Fig. 5 is a front elevational view showing a door unit 110 including a plurality of swinging doors 112 in a closed state according to the first embodiment of the present invention (Fig. 5(a)), and a front view showing a state in which a part of the swinging doors 112 are opened. (Figure 5 (b).

參照圖5(a),本發明第1實施形態之門單元110可具有形成相當於於複數個槽s之尺寸之前面出入口111且可開關各前面出入口111之複數個擺動門112。 Referring to Fig. 5(a), the door unit 110 according to the first embodiment of the present invention may have a plurality of swing gates 112 which are formed to correspond to the front surface entrance and exit 111 of the plurality of slots s and which can switch the front and front entrances and exits 111.

形成有相當於槽s之尺寸之前面出入口111的門單元110可設置於本體100之前面。由於本體100之出入口101與門單元110之前面出入口111相接,故本體100之出入口101開口之形狀可為與門單元110之前面出入口111實質上相同之形態。本體100之出入口101為了與門單元110更緊密地閉合,更可設置密封構件(圖中未示),槽s之前面出入口111為了與擺動門112緊密地閉合,更可設置密封構件(圖中未示)。本體100及門單元110之材質以不鏽鋼為佳,但不必限於此。 The door unit 110 formed with the front side entrance 111 corresponding to the size of the groove s may be disposed in front of the body 100. Since the inlet and outlet 101 of the body 100 is in contact with the front face inlet and outlet 111 of the door unit 110, the shape of the opening and exit opening 101 of the body 100 may be substantially the same as the front faceway 111 of the door unit 110. In order to close the door 101 more closely, the inlet and outlet 101 of the body 100 may be provided with a sealing member (not shown). The front and rear inlets and outlets 111 of the groove s may be tightly closed with the swinging door 112, and a sealing member may be disposed. Not shown). The material of the body 100 and the door unit 110 is preferably stainless steel, but is not limited thereto.

擺動門112可一面以一定軸113為基準擺動動,一面開關槽s。於本說明書中顯示軸113結合於擺動門112之下部,而結合於擺動門112之上部,以上部軸為基準擺動亦無妨。 The swing gate 112 is swingable with respect to a predetermined axis 113, and the groove s is opened and closed. In the present specification, it is shown that the shaft 113 is coupled to the lower portion of the swinging door 112, and is coupled to the upper portion of the swinging door 112, and the upper shaft is oscillated as a reference.

擺動門112之軸113可與配置於門單元110之兩側端之氣缸114固結來執行旋轉運動,而使擺動門112擺動。由於氣缸114只要為傳達動力之眾所皆知之氣缸,可無限制地選擇,故省略詳細說明。又,只要為可將旋轉動力提供 予擺動門112之軸113的機構,則不限氣缸114,可無限制地選擇馬達、鏈條等眾所皆知之動力提供機構。 The shaft 113 of the swing gate 112 is fixed to the cylinder 114 disposed at both side ends of the door unit 110 to perform a rotational motion, and the swing gate 112 is swung. Since the cylinder 114 is a cylinder that is well known for transmitting power, it can be selected without limitation, and detailed description thereof will be omitted. Also, as long as it can provide rotary power The mechanism for the shaft 113 of the swing gate 112 is not limited to the cylinder 114, and a well-known power supply mechanism such as a motor or a chain can be selected without limitation.

參照圖5(b),可開啟門單元110之任一擺動門112,開啟1個槽s。在圖5(b),僅開放1個槽s,但不限於此,亦可將複數個槽s獨立開放。 Referring to FIG. 5(b), any swing gate 112 of the door unit 110 can be opened to open one slot s. In FIG. 5(b), only one slot s is opened, but it is not limited thereto, and a plurality of slots s may be independently opened.

在待機狀態下,可使腔室105之內部上升至基板處理製程所需之溫度,在開放至少1個槽s之狀態下,以基板移送機器手臂(圖中未示)等支撐基板50,透過槽s之前面出入口111而裝載於腔室105。接著,可關閉擺動門112,在封閉槽s之狀態下,處理基板50。在基板處理製程進行中或基板處理製程完畢後,個別地開放槽s來卸載基板50亦同樣地適用。 In the standby state, the interior of the chamber 105 can be raised to the temperature required for the substrate processing process, and the substrate 50 can be transferred to the support substrate 50 (not shown) by the substrate in a state where at least one groove s is opened. The tank s is placed in the chamber 105 before and after the inlet and outlet 111. Next, the swing gate 112 can be closed, and the substrate 50 is processed in a state where the groove s is closed. The same manner is also applied to the unloading of the substrate 50 after the substrate processing process is in progress or after the substrate processing process is completed.

另一方面,參照圖6,當減低擺動門112’之裝備成本,需處理大量基板50時,亦可構造成1個擺動門112’非僅開放1個槽s,而是開啟2個或2個以上之槽s。此時,擺動門112’之尺寸宜設定為可開關2個或2個以上之槽s。此時,出入口111’之尺寸當然亦需設定為與擺動門112’之尺寸一致。 On the other hand, referring to FIG. 6, when the equipment cost of the swing gate 112' is reduced and a large number of substrates 50 need to be processed, it is also possible to configure one swing gate 112' to open only one slot s, but to open two or two. More than one slot s. At this time, the swing gate 112' is preferably sized to switch two or more slots s. At this time, the size of the entrance and exit 111' must of course also be set to coincide with the size of the swing gate 112'.

圖7為根據本發明第2實施形態顯示包含主門121及副門125之門單元120的立體圖(圖7(a))、及顯示門單元120之動作方向之側截面圖(圖7(b))。 Fig. 7 is a perspective view showing a door unit 120 including a main door 121 and a sub door 125 (Fig. 7(a)) and a side sectional view showing an operation direction of the door unit 120 according to a second embodiment of the present invention (Fig. 7(b). )).

參照圖7(a)及圖7(b),本發明第2實施形態之門單元120可包含主門121及副門125。 Referring to FIGS. 7(a) and 7(b), the door unit 120 according to the second embodiment of the present invention may include a main door 121 and a sub door 125.

主門121設置成可於本體100之前後方向及上下 方向滑動,而可將本體100之前面出入口101開關。主門121可形成與出入口101相同或較大,為了使主門121與出入口101緊密地閉合,更可設置密封構件(圖中未示)。 The main door 121 is disposed to be in front and rear directions of the body 100 The direction is slid, and the front and rear entrances and exits 101 of the body 100 can be switched. The main door 121 may be formed the same as or larger than the inlet and outlet 101, and in order to close the main door 121 and the inlet and outlet 101 tightly, a sealing member (not shown) may be provided.

副門125設置成可於本體100之上下方向滑動,可開放至少1個槽s之前面,並且密閉剩餘之槽s之前面。副門125可具有對向且上下配置之上部單位副門125a及下部單位副門125b。上部單位副門125a及下部單位副門125b可一面於上下方向滑動,一面相互拉開間隔,或一面相互抵接,一面開關至少1個槽s之前面。上部單位副門125a與下部單位副門125b拉開間隔時,可透過已拉開間隔之間的空間,開放槽s之前面。上部單位副門125a與下部單位副門125b之拉開間隔的距離為相當於特定1個槽s之高度的程度時,便可開放1個槽s之前面,為相當於特定之複數個槽s之高度時,亦可開放複數個槽s之前面。為了使出入口101、單位副門125a、及下部單位副門體125b緊密閉合,更可設置密封構件(圖中未示)。 The sub-door 125 is disposed to be slidable in the upper and lower directions of the body 100, and can open at least one groove s front surface and seal the remaining groove s. The sub-door 125 may have an upper unit sub-gate 125a and a lower unit sub-gate 125b that are opposed to each other. The upper unit sub-gate 125a and the lower unit sub-gate 125b are slidable in the vertical direction, and are spaced apart from each other or are in contact with each other while switching at least one groove s front surface. When the upper unit sub-gate 125a and the lower unit sub-gate 125b are spaced apart from each other, the space between the spaces can be opened and the front surface of the groove s can be opened. When the distance between the upper unit sub-gate 125a and the lower unit sub-gate 125b is equal to the height of the specific one groove s, the front surface of one groove s can be opened, which is equivalent to a specific number of grooves s. At the height of the height, the front faces of the plurality of slots s can also be opened. In order to tightly close the inlet and outlet 101, the unit sub-gate 125a, and the lower unit sub-door 125b, a sealing member (not shown) may be provided.

圖8為顯示本發明第2實施形態之門單元120之動作之側截面圖。圖8為了方便說明,而假定具有2個槽s之批量式基板處理裝置10來說明,具有3個以上之槽s之批量式基板處理裝置10亦可以副門125之動作開關至少1個槽s。 Fig. 8 is a side sectional view showing the operation of the door unit 120 according to the second embodiment of the present invention. 8 is a schematic description of a batch type substrate processing apparatus 10 having two slots s for convenience of explanation. The batch type substrate processing apparatus 10 having three or more slots s may also operate at least one slot s of the sub-gate 125. .

參照圖8(a),首先,門單元120可關閉出入口101而完全密閉2個槽s。主門121可關閉出入口101,而實質地執行槽s之密閉,副門125可位於主門121之上部及下部。 Referring to Fig. 8(a), first, the door unit 120 can close the entrance 101 and completely seal the two slots s. The main door 121 can close the entrance 101 and substantially perform the sealing of the slot s, and the sub-gate 125 can be located above and below the main door 121.

參照圖8(b),主門121於本體100之前後方向滑動, 即於遠離出入口101之方向滑動。同時,位於主門121之上部及下部之副門125一面滑動至下方(上部單位副門125a)及上方(下部單位副門125b)而抵接,一面密閉出入口101。即,為上部單位副門125a時,可密閉上部槽s之前面,為下部單位副門125b時,則可密閉下部槽s之前面。 Referring to FIG. 8(b), the main door 121 slides in the front and rear directions of the body 100. That is, sliding away from the entrance 101. At the same time, the sub-gate 125 located above and below the main door 121 slides to the lower side (the upper unit sub-gate 125a) and the upper side (the lower unit sub-gate 125b) to abut, and closes the inlet and outlet 101. In other words, when the upper unit sub-gate 125a is closed, the front surface of the upper tank s can be sealed, and when the lower unit sub-gate 125b is closed, the front surface of the lower tank s can be sealed.

參照圖8(c),在副門體125密閉出入口101之狀態下,僅上部單位副門125a滑動至上方而僅開放上部槽s。由於下部槽s仍以下部單位副門125b關閉,故可維持密閉。可透過已開放之上部槽s,以基板移送機器手臂(圖中未示)等,支撐基板50,執行裝載/卸載。 Referring to Fig. 8(c), in a state in which the sub-door 125 closes the inlet and outlet 101, only the upper unit sub-gate 125a slides upward and only the upper groove s is opened. Since the lower tank s is still closed by the lower unit sub-gate 125b, the airtightness can be maintained. The loading/unloading can be performed by supporting the substrate 50 by transferring the upper arm slot s, transferring the robot arm (not shown) or the like to the substrate.

另一方面,可省略圖8(b)之過程,主門121於遠離出入口101之方向滑動,同時,僅下部單位副門125b滑動至上方而僅開放上部槽s。由於下部槽s以滑動至上方之下部單位副門125b關閉,故可維持密閉。可透過已開放之上部槽s,以基板移送機器手臂(圖中未示)等支撐基板50,執行裝載/卸載。 On the other hand, the process of FIG. 8(b) can be omitted, and the main door 121 slides in a direction away from the inlet and outlet 101, and at the same time, only the lower unit sub-gate 125b slides upward to open only the upper groove s. Since the lower groove s is closed by sliding to the upper lower unit door 125b, the sealing can be maintained. Loading/unloading can be performed by the support substrate 50 such as a robot arm (not shown) being transferred to the substrate through the upper groove s.

參照圖8(d),上部單位副門125a可滑動至下方而密閉上部槽s,同時,下部單位副門125b可滑動至下方而僅開放下部槽s。可透過已開放之下部槽s,以基板移送機器手臂(圖中未示)等支撐基板50,執行裝載/卸載。 Referring to Fig. 8(d), the upper unit sub-gate 125a is slidable downward to seal the upper groove s, and the lower unit sub-gate 125b is slidable downward to open only the lower groove s. Loading/unloading can be performed by transferring the support substrate 50 such as a robot arm (not shown) through the open lower groove s.

圖9是測定習知批量式基板處理裝置10’之腔室105’之內部的溫度變化之資料,圖10是應用本發明一實施形態之門單元110而測定腔室105之內部之溫度變化的資料。 Fig. 9 is a view showing measurement of temperature change inside the chamber 105' of the conventional batch type substrate processing apparatus 10', and Fig. 10 is a view showing measurement of temperature change inside the chamber 105 by applying the gate unit 110 according to an embodiment of the present invention. data.

在習知技術之批量式基板處理裝置10’中,在將腔室105之內部之溫度維持在380℃之狀態下,開放本體100’之前面,卸載業經處理之基板50,而當裝載要處理之基板50時,腔室105之內部之前後溫度最大有146℃之差。 In the batch type substrate processing apparatus 10' of the prior art, in a state where the temperature inside the chamber 105 is maintained at 380 ° C, the front surface of the body 100' is opened, and the processed substrate 50 is unloaded, and when loaded, it is processed. In the case of the substrate 50, the temperature of the interior of the chamber 105 is at most 146 ° C.

然而,為本發明時,如圖9所示,在將腔室105之內部之溫度維持在400℃之狀態下,依各槽s個別地執行開關,卸載/裝載基板50,結果,確認了腔室105之內部之前後的溫度最大顯現為48℃。結果,確認了具有比習知技術改善近3倍之效果。 However, in the present invention, as shown in FIG. 9, in a state where the temperature inside the chamber 105 is maintained at 400 ° C, the switch is individually performed in accordance with each of the grooves s, and the substrate 50 is unloaded/loaded, and as a result, the cavity is confirmed. The temperature before and after the interior of the chamber 105 appeared to be at most 48 °C. As a result, it was confirmed that the effect was improved by nearly three times that of the prior art.

如此,本發明門單元110、120依各槽s個別地作動,而個別地將各槽s開關,藉此,具有可使腔室105之內部之熱往外部的損失最小化之優點。 As described above, the door units 110 and 120 of the present invention individually operate in the respective grooves s, and individually switch the respective grooves s, thereby having the advantage of minimizing the loss of heat inside the chamber 105 to the outside.

又,由於本發明腔室105之內部之熱損失量減少,故用以加熱腔室105之內部之電力減低,亦縮短加熱時間,故具有基板處理製程之效率性提高之優點。 Further, since the amount of heat loss inside the chamber 105 of the present invention is reduced, the power for heating the inside of the chamber 105 is reduced, and the heating time is also shortened, so that the efficiency of the substrate processing process is improved.

本發明如前述舉較佳之實施形態為例,進行了圖示及說明,但不限於上述實施形態,在不脫離本發明之精神之範圍內,具有該發明所屬之技術領域之一般知識者可進行多種之變形及變更。該種變形例及變更例應視為屬於本發明與添附之申請專利範圍之範圍內。 The present invention has been described and illustrated by the preferred embodiments of the present invention, but is not limited to the above-described embodiments, and those skilled in the art to which the invention pertains may carry out without departing from the spirit of the invention. A variety of variations and changes. Such modifications and variations are considered to be within the scope of the invention and the scope of the appended claims.

10‧‧‧批量式基板處理裝置 10‧‧‧Batch type substrate processing device

100‧‧‧本體 100‧‧‧ body

101‧‧‧出入口 101‧‧‧ entrances and exits

105‧‧‧腔室 105‧‧‧ chamber

110‧‧‧門單元 110‧‧‧door unit

111‧‧‧前面出入口 111‧‧‧ Front entrance

112‧‧‧擺動門 112‧‧‧Swing gate

113‧‧‧軸 113‧‧‧Axis

114‧‧‧氣缸 114‧‧‧Cylinder

s‧‧‧槽 S‧‧‧ slot

Claims (13)

一種批量式基板處理裝置,用以處理複數個基板,其包含有:本體,具有提供基板處理空間之腔室,該腔室具有用以裝載/卸載前述複數個基板之複數個槽;及門單元,配置於前述本體之前面以開關至少1個前述槽。 A batch substrate processing apparatus for processing a plurality of substrates, comprising: a body having a chamber for providing a substrate processing space, the chamber having a plurality of slots for loading/unloading the plurality of substrates; and a gate unit And disposed on the front surface of the body to switch at least one of the slots. 如請求項1之批量式基板處理裝置,其中前述門單元具有複數個擺動門,各前述擺動門設置於各前述槽之前面出入口,可一面以一定軸為基準擺動一面開關前述槽。 The batch type substrate processing apparatus according to claim 1, wherein the gate unit has a plurality of swing gates, and each of the swing gates is provided at an entrance and exit of each of the grooves, and the groove can be opened and closed while swinging with respect to a predetermined axis. 如請求項1之批量式基板處理裝置,其中前述門單元具有:主門,設置成可於前述本體之前後方向及上下方向滑動而可將前述本體之前面開關;及副門,設置成當前述出入口以前述主門開放時可於上下方向滑動,而可開放至少1個前述槽之前面,並密閉剩餘之前述槽之前面。 The batch type substrate processing apparatus of claim 1, wherein the door unit has a main door that is slidable in a front-back direction and an up-and-down direction of the body, and the front surface switch of the body can be disposed; and the sub-door is set to be as described above The doorway can slide in the up-and-down direction when the main door is opened, and can open at least one of the front faces of the grooves and seal the remaining front faces of the grooves. 如請求項3之批量式基板處理裝置,其中前述副門具有對向且上下配置之上部單位副門及下部單位副門。 The batch type substrate processing apparatus according to claim 3, wherein the sub-door has an upper unit sub-gate and a lower unit sub-gate that are opposed to each other. 如請求項4之批量式基板處理裝置,其中可透過前述上部單位副門及前述下部單位副門之間的空間,開放至少1個前述槽之前面。 The batch type substrate processing apparatus according to claim 4, wherein at least one of the front faces of the grooves is opened through a space between the upper unit sub-door and the lower unit sub-door. 如請求項1之批量式基板處理裝置,其中於前述門單元之內側面設置有熱反射板。 The batch type substrate processing apparatus of claim 1, wherein a heat reflecting plate is disposed on an inner side surface of the door unit. 如請求項1之批量式基板處理裝置,其中可於各前述槽裝載/卸載1個基板。 A batch type substrate processing apparatus according to claim 1, wherein one substrate can be loaded/unloaded in each of said grooves. 如請求項1之批量式基板處理裝置,其包含有沿著前述基板之積層方向具一定間隔配置之複數個加熱器單元(前述加熱器單元包含複數個單位加熱器),前述基板配置於前述複數個主加熱器單元之間。 The batch type substrate processing apparatus according to claim 1, comprising a plurality of heater units (the heater unit including a plurality of unit heaters) disposed at a predetermined interval along a stacking direction of the substrate, wherein the substrate is disposed in the plural Between the main heater units. 如請求項8之批量式基板處理裝置,其更包含有用以防止前述腔室內之熱損失之複數個輔助加熱器單元(前述輔助加熱器單元包含複數個單位輔助加熱器)。 A batch type substrate processing apparatus according to claim 8, further comprising a plurality of auxiliary heater units (the aforementioned auxiliary heater unit including a plurality of unit auxiliary heaters) for preventing heat loss in said chamber. 如請求項9之批量式基板處理裝置,其中前述複數個輔助加熱器單元具有與前述基板之短邊方向平行地配置之第1輔助加熱器單元、及與前述基板之長邊方向平行地配置之第2輔助加熱器單元。 The batch type substrate processing apparatus according to claim 9, wherein the plurality of auxiliary heater units have a first auxiliary heater unit disposed in parallel with a short side direction of the substrate, and are disposed in parallel with a longitudinal direction of the substrate The second auxiliary heater unit. 如請求項8之批量式基板處理裝置,其中於前述複數個單位加熱器之間配置冷卻管。 A batch type substrate processing apparatus according to claim 8, wherein a cooling tube is disposed between the plurality of unit heaters. 如請求項8之批量式基板處理裝置,其中於前述單位加熱器之內部形成有供冷媒移動之流路。 The batch type substrate processing apparatus according to claim 8, wherein a flow path for moving the refrigerant is formed inside the unit heater. 如請求項1之批量式基板處理裝置,其中前述基板可以穩定地放置於基板支持器之狀態裝載於配置在前述本體內之舟皿。 The batch type substrate processing apparatus according to claim 1, wherein the substrate is placed on the substrate holder in a state of being stably placed on the boat disposed in the body.
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