TW201517304A - Pattern substrate with light-cone structures and method for manufacturing the same - Google Patents

Pattern substrate with light-cone structures and method for manufacturing the same Download PDF

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TW201517304A
TW201517304A TW102138913A TW102138913A TW201517304A TW 201517304 A TW201517304 A TW 201517304A TW 102138913 A TW102138913 A TW 102138913A TW 102138913 A TW102138913 A TW 102138913A TW 201517304 A TW201517304 A TW 201517304A
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light
substrate
transmitting
cone
transmissive
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TW102138913A
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TWI511330B (en
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Hsin-Ming Lo
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Aceplux Optotech Inc
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Abstract

The invention relates to a pattern substrate with light-cone structures and a method for manufacturing the same. Primarily, it comprises a substrate, a plurality of light cones, and a thin film of group III nitride. A plurality of conical light cones having lower refractive index than substrate are formed on the substrate with lithography and dry etching process, and then they are uniformly covered with a thin film of group III nitride to form a pattern substrate with light-cone structures suitable for LED. Accordingly, in accordance with the non-planarity of the light cones formed on the substrate and the buffer characteristic of the thin film of group III nitride, a light extraction efficiency of LED and a dislocation caused by lattice mismatch can be improved to effectively increase the yield of subsequent epitaxial process.

Description

具透光錐結構之圖形化基板及其製造方法Graphic substrate with light-transmissive cone structure and manufacturing method thereof

本發明係有關於一種具透光錐結構之圖形化基板及其製造方法,尤其是指一種適用於發光二極體之改良型基板,可藉由基板表面的透光錐結構,改變光行進之方向並收斂出光角度,以增加光之指向性,有效達到提升發光二極體之光萃取效率者。The invention relates to a patterned substrate with a light-transmissive cone structure and a manufacturing method thereof, in particular to an improved substrate suitable for a light-emitting diode, which can change the light traveling by the light-transmissive cone structure on the surface of the substrate. The direction converges the light angle to increase the directivity of the light, and effectively achieves the light extraction efficiency of the light-emitting diode.

近年來,Ⅲ族氮化物(Ⅲ-Nitride)高亮度發光二極體(High Brightness Light Emission Diode,HB-LED)的應用面日趨廣泛而深獲廣大重視,目前已經廣泛應用於交通號誌、液晶顯示器之背光源,以及各種照明等,是日常生活中不可缺的重要元件;由於其具有元件體積小、無汞汙染、發光效率高,以及壽命長等優點,尤其該發光波長幾乎涵蓋了可見光的範圍,使其成為極具發展潛力的發光二極體材料。In recent years, the application of III-Nitride High Brightness Light Emission Diode (HB-LED) has become more and more widely used and has been widely used in traffic signs and LCDs. The backlight of the display, as well as various illuminations, are important components in daily life; because of its small size, no mercury pollution, high luminous efficiency, and long life, especially the wavelength of the light covers almost visible light. The range makes it a highly promising light-emitting diode material.

一般傳統的Ⅲ族氮化物發光二極體結構,係於基板上依序形成一n型半導體層、一主動發光層(active layer),以及一p型半導體層,且為了提高元件之電流散佈效果,以及提高光之萃取效率,一般於p型半導體層上會設置一透明導電層,例如銦錫氧化物(Indium Tin Oxide,簡稱ITO),最後,再於p型半導體層與n型半導體層上分別設置有一p型電極墊與一n型電極墊,且p型電極墊與n型電極墊係分別以歐姆接觸於p型半導體層與n型半導體層上,而在理想的發光二極體中,當主動發光層內的載子複合成光子後,這些光子若能全部輻射至外界,則該發光二極體的發光效率即為100%,然而,發光二極體於實際實施時,主動發光層所產生的光子可能會因為各種損耗機制,而無法以100%的發光效率傳播到外界。A conventional III-nitride light-emitting diode structure is formed by sequentially forming an n-type semiconductor layer, an active light-emitting layer, and a p-type semiconductor layer on a substrate, and in order to improve the current spreading effect of the device. And improving the light extraction efficiency, generally a transparent conductive layer, such as Indium Tin Oxide (ITO), is finally disposed on the p-type semiconductor layer, and finally, on the p-type semiconductor layer and the n-type semiconductor layer. A p-type electrode pad and an n-type electrode pad are respectively disposed, and the p-type electrode pad and the n-type electrode pad are respectively in ohmic contact with the p-type semiconductor layer and the n-type semiconductor layer, and in the ideal light-emitting diode When the carriers in the active light-emitting layer are combined into photons, if the photons are all radiated to the outside, the luminous efficiency of the light-emitting diode is 100%. However, when the light-emitting diode is actually implemented, the active light is emitted. The photons generated by the layer may not be transmitted to the outside world with 100% luminous efficiency due to various loss mechanisms.

舉例而言,一氮化鎵發光二極體(GaN LED)是以磊晶(Epitaxy)方式生長在藍寶石基板(Sapphire Substrate)上,由於磊晶氮化鎵與底部藍寶石基板的晶格常數(Lattice Constant)及熱膨脹係數(Coefficient of Thermal Expansion,CTE)相差極大,因此會引發錯位差排(Misfit Dislocation),部分錯位差排更會延伸至晶體表面,而被稱之為貫穿式差排(Thread Dislocation),其值可達108~1010/cm 2 ,此種高密度差排將導致主動發光層之晶體品質不佳,因而降低GaN LED的內部量子效率,進而降低其發光亮度並產生熱,使GaN LED的溫度上升,影響其發光效率;因此,上述發光二極體存在諸多因素,例如:電流壅塞(current crowding)或差排缺陷(dislocation)等,而影響其發光效率。For example, a gallium nitride light emitting diode (GaN LED) is grown on a sapphire substrate in an epitaxial manner due to the lattice constant of the epitaxial gallium nitride and the bottom sapphire substrate (Lattice Constant) and the coefficient of thermal expansion (CTE) are very different, so it will cause misfit Dislocation. Some of the misalignment will extend to the crystal surface, which is called Thread Dislocation. ), the value can reach 108 ~ 1010 / cm 2 , such high density difference will lead to poor crystal quality of the active light-emitting layer, thus reducing the internal quantum efficiency of the GaN LED, thereby reducing its luminance and generating heat, making GaN The temperature of the LED rises, affecting its luminous efficiency; therefore, the above There is an optical diode on factors such as: a current congestion (current crowding) or dislocation defects (dislocations), etc., affect the luminous efficiency.

理論上,發光二極體之發光效率係取決於外部量子效率、內部量子效率,以及光之萃取效率;所謂內部量子效率係由材料特性以及材料品質所決定,至於光萃取效率則是從元件內部發出至周圍空氣的輻射比例,光萃取效率係取決於當輻射離開元件內部時所發生的損耗,造成上述損耗的主要原因之一係由於形成元件表面層的半導體材料具有高折射係數,導致光在該材料表面產生全內反射(Total Internal Reflection)而無法發射出去,例如以高折射係數的半導體而言,其臨界角都非常小,當折射係數為3﹒3時,其全內反射角則約只有17度,所以大部分從主動發光層所發射的光線,將被侷限(Trapped)於半導體內部;若光萃取效率能夠提昇,則半導體發光元件的外部量子效率亦隨之提昇;因此,針對提升內部量子效率以及光萃取效率,近幾年已發展出許多技術,例如使用銦錫氧化物(ITO)當電流傳輸層、採用覆晶結構(Flip-chip)、利用圖形化的藍寶石基板(Pattern Sapphire Substrate,簡稱PSS),以及使用電流阻擋層(Current Block Layer,簡稱CBL)等,使得欲有效達到減少貫穿式差排導致的發光二極體主動發光層之晶體品質不佳,以及發光二極體之指向性不足所導致的發光亮度降低,仍是發光二極體之系統開發業者與研究人員需持續努力克服與解決之課題。Theoretically, the luminous efficiency of a light-emitting diode depends on external quantum efficiency, internal quantum efficiency, and light extraction efficiency; the so-called internal quantum efficiency is determined by material properties and material quality, and the light extraction efficiency is from the inside of the component. The proportion of radiation emitted to the surrounding air, the light extraction efficiency is dependent on the loss that occurs when the radiation leaves the inside of the element, one of the main causes of the above loss is due to the high refractive index of the semiconductor material forming the surface layer of the element, resulting in light The surface of the material produces Total Internal Reflection and cannot be emitted. For example, in the case of a semiconductor with high refractive index, the critical angle is very small. When the refractive index is 3.3, the total internal reflection angle is about Only 17 degrees, so most of the light emitted from the active light-emitting layer will be trapped inside the semiconductor; if the light extraction efficiency can be improved, the external quantum efficiency of the semiconductor light-emitting element will also increase; internal Sub-efficiency and light extraction efficiency have been developed in recent years, such as the use of indium tin oxide (ITO) as a current transport layer, Flip-chip, and a patterned sapphire substrate (Pattern Sapphire Substrate) , referred to as PSS), and the use of Current Block Layer (CBL), etc., so that the crystal quality of the active light-emitting layer of the light-emitting diode caused by the reduction of the through-type difference is effectively achieved, and the light-emitting diode is The decrease in illuminance caused by insufficient directivity is still a problem that system developers and researchers of illuminating diodes need to continuously overcome and solve.

今,發明人即是鑑於上述之發光二極體元件因存在有主動發光層之晶體品質不佳與光的指向性不足所導致發光亮度降低等諸多缺失,於是乃一本孜孜不倦之精神,並藉由其豐富之專業知識及多年之實務經驗所輔佐,而加以改善,並據此研創出本發明。Nowadays, the inventor is in view of the fact that the above-mentioned light-emitting diode element has many defects such as poor crystal quality of the active light-emitting layer and insufficient light directivity, and thus is a tireless spirit and borrows It is improved by its rich professional knowledge and years of practical experience, and the present invention has been developed based on this.

本發明主要目的係為提供一種具透光錐結構之圖形化基板及其製造方法,尤其是指一種適用於發光二極體之改良型基板,可藉由基板表面的透光錐結構,改變光行進之方向並收斂出光角度,以增加光之指向性,有效達到提升發光二極體之光萃取效率。The main object of the present invention is to provide a patterned substrate with a light-transmissive cone structure and a manufacturing method thereof, and more particularly to an improved substrate suitable for a light-emitting diode, which can be changed by a light-transmitting cone structure on the surface of the substrate. The direction of travel and convergence of the light angle to increase the directivity of the light, effectively improving the light extraction efficiency of the light-emitting diode.

為了達到上述實施目的,本發明人提出一種具透光錐結構之圖形化基板,其包括有一基板、複數個透光錐,以及一Ⅲ族氮化物薄膜;基板之材料係選自藍寶石、碳化矽、矽、砷化鎵、氧化鋅,以及具有六方體系結晶材料所構成群組中的一種材料而形成;複數個透光錐係由透光性材料所構成之錐狀體成形於基板表面,其中透光性材料之折射率係低於基板;Ⅲ族氮化物薄膜係以蒸鍍或濺鍍方式對應被覆於透光錐上。In order to achieve the above-mentioned implementation, the inventors have proposed a patterned substrate having a light-transmissive cone structure, comprising a substrate, a plurality of light-transmitting cones, and a group III nitride film; the material of the substrate is selected from the group consisting of sapphire and tantalum carbide , bismuth, gallium arsenide, zinc oxide, and a material having a hexagonal system of crystalline materials; a plurality of light-transmissive cones formed of a light-transmissive material formed on the surface of the substrate, wherein The refractive index of the light transmissive material is lower than that of the substrate; the III nitride film is coated on the light transmitting cone by vapor deposition or sputtering.

在本發明的一個實施例中,其中透光錐之材料係選自氧化矽、氮氧化矽,以及氟化鎂所構成群組中的一種材料而形成,且透光錐之材料耐熱溫度係不小於1000℃。In one embodiment of the present invention, the material of the light-transmitting cone is formed from a material selected from the group consisting of cerium oxide, cerium oxynitride, and magnesium fluoride, and the heat-resistant temperature of the material of the light-transmitting cone is not Less than 1000 ° C.

在本發明的一個實施例中,其中透光錐之材料亦可由下列所構成之群組所組成:一形成於該基板表面之低折射率介電層及一形成於該低折射率介電層表面之高折射率介電層、一形成於該基板表面之低折射率介電層及一形成於該介電層表面之金屬反射層。In one embodiment of the present invention, the material of the light transmitting cone may also be composed of a group consisting of a low refractive index dielectric layer formed on the surface of the substrate and a low refractive index dielectric layer formed on the substrate. a high refractive index dielectric layer on the surface, a low refractive index dielectric layer formed on the surface of the substrate, and a metal reflective layer formed on the surface of the dielectric layer.

在本發明的一個實施例中,其中透光錐係具有一與基板表面連接之底面,以及一由底面至透光錐頂部的高度,其中高度與底面之最大寬度的比值係不小於0﹒6;再者,透光錐係成週期性分佈,兩兩相鄰之透光錐係具有相同之間距,且間距係不大於1微米(micrometer)。In an embodiment of the invention, the light transmission cone has a bottom surface connected to the surface of the substrate, and a height from the bottom surface to the top of the light transmission cone, wherein the ratio of the height to the maximum width of the bottom surface is not less than 0.6. Moreover, the light-transmitting cones are periodically distributed, and the adjacent light-transmitting cones have the same distance, and the pitch is not more than 1 micrometer.

在本發明的一個實施例中,其中Ⅲ族氮化物薄膜係選自氮化鋁,以及氮化鎵所構成群組中的一種材料而形成,其厚度係介於100埃(Angstron)~1000埃。In one embodiment of the present invention, the group III nitride film is formed from a material selected from the group consisting of aluminum nitride and gallium nitride, and has a thickness of between 100 angstroms (Angstron) and 1000 angstroms. .

此外,為了達到具透光錐結構之圖形化基板之實施目的,本發明人乃研擬如下實施技術,首先,於一基板上依序形成一透光層與一光阻層,其中透光層係由折射率低於基板之透光性材料所構成;其次,使用光微影製程,於光阻層顯影出一遮罩圖案;再者,以遮罩圖案為遮罩,使用乾式蝕刻製程於透光層形成複數個彼此週期間隔且呈錐狀體之透光錐;接續,使用光阻去除法移除遮罩圖案之光阻層;之後,以電子鎗真空蒸鍍法(Electron-Gun Evaporation)蒸鍍或濺鍍方式將一Ⅲ族氮化物薄膜對應被覆於透光錐上;最後,使用高溫回火製程加熱該圖形化基板,以完成該具透光錐結構之圖形化基板之製作方法。In addition, in order to achieve the purpose of implementing a patterned substrate having a light-transmissive cone structure, the inventors have studied the following implementation techniques. First, a light-transmitting layer and a photoresist layer are sequentially formed on a substrate, wherein the light-transmitting layer is formed. It is composed of a light transmissive material having a lower refractive index than the substrate; secondly, a mask pattern is developed on the photoresist layer using a photolithography process; further, a mask pattern is used as a mask, and a dry etching process is used. The light transmissive layer forms a plurality of light-transmitting cones which are periodically spaced apart from each other and have a tapered shape; and subsequently, the photoresist layer of the mask pattern is removed by photoresist removal; and then, electron gun vacuum evaporation (Electron-Gun Evaporation) is performed. A group III nitride film is correspondingly coated on the light-transmitting cone by evaporation or sputtering; finally, the patterned substrate is heated by a high-temperature tempering process to complete the method for fabricating the patterned substrate with the light-transmissive cone structure.

在本發明的一個實施例中,其中電子鎗真空蒸鍍法係以氮氣電漿(plasma)撞擊Ⅲ族元素之靶材,以不低於600℃之溫度,使Ⅲ族氮化物粒子以濺射方式被覆於該透光錐上。In an embodiment of the present invention, the electron gun vacuum evaporation method is to impinge on the target of the group III element with nitrogen plasma, and to cause the group III nitride particles to be sputtered at a temperature of not lower than 600 ° C. Covered on the light-transmitting cone.

在本發明的一個實施例中,其中Ⅲ族氮化物薄膜之厚度係介於100埃~1000埃。In one embodiment of the invention, the Group III nitride film has a thickness between 100 Angstroms and 1000 Angstroms.

在本發明的一個實施例中,其中該高溫回火(Anneal)製程係使用快速高溫處理(Rapid Thermal Processing,簡稱RTP)與高溫爐管(Furnace)製程其中之一種方式,以不低於1000℃之溫度修正該Ⅲ族氮化物薄膜之性質與製程結果。In an embodiment of the invention, the high temperature tempering process uses one of a rapid thermal processing (RTP) and a high temperature furnace (Furnace) process, not less than 1000 ° C. The temperature corrects the properties and process results of the Group III nitride film.

藉此,本發明係藉由在基板表面形成複數個呈圓錐狀且折射率低於基板之透光錐,以達到基板表面之非平整性來降低後續製備的發光二極體之主動發光層出光的全反射角,並利用透光錐與基板間的折射率差,使發光二極體發出的光線於接觸這些透光錐與基板時,經由二次折射及反射作用,有效提升發光二極體的光萃取效率;此外,本發明可藉由控制透光錐呈圓錐狀的設計,讓來自發光二極體之主動發光層發出,朝向基板行進的光,在接觸透光錐及基板後,可經由二次折射及反射後實質向外發出,有效提升發光二極體之光萃取效率,此與習知經由蝕刻基板得到具粗化結構之磊晶基板製得的發光二極體的光萃取效率相較,本發明具有透光錐之發光二極體之光萃取效率可提升約20%;再者,本發明之透光錐係經由非等向性之乾式蝕刻製程蝕刻基板上的透光層所製得,具有製程簡便,且更容易控制透光錐之尺寸、密度與均勻度,有效提升發光二極體的出光均勻性;最後,本發明藉由Ⅲ族氮化物薄膜改善傳統基板和後續發光二極體之磊晶膜間因晶格不匹配所產生的錯位差排現象,可有效降低其差排密度,以避免應力之累積與差排錯位等異常現象,有效增加後續磊晶製程之良率,且具有Ⅲ族氮化物薄膜與透光錐組合之發光二極體,其光萃取效率與僅具有透光錐之發光二極體約可提升15%~20%。Therefore, the present invention reduces the light emission of the active light-emitting layer of the subsequently prepared light-emitting diode by forming a plurality of light-conducting cones having a conical shape and a lower refractive index than the substrate on the surface of the substrate to achieve non-flatness of the surface of the substrate. The total reflection angle, and the difference in refractive index between the light-transmitting cone and the substrate, so that the light emitted by the light-emitting diode contacts the light-transmitting cone and the substrate, and effectively enhances the light-emitting diode through secondary refraction and reflection. In addition, the present invention can control the light-transmitting cone to have a conical shape, so that the active light-emitting layer from the light-emitting diode emits light toward the substrate, after contacting the light-transmitting cone and the substrate, The light extraction efficiency of the light-emitting diode is effectively improved by the secondary refraction and reflection, and the light extraction efficiency of the light-emitting diode obtained by etching the substrate to obtain the epitaxial substrate having the roughened structure is known. In contrast, the light extraction efficiency of the light-emitting diode having the light-transmitting cone of the present invention can be improved by about 20%; further, the light-transmitting cone of the present invention is etched on the substrate via an anisotropic dry etching process. The optical layer is prepared, has a simple process, and is easier to control the size, density and uniformity of the light-transmitting cone, thereby effectively improving the light-emitting uniformity of the light-emitting diode; finally, the present invention improves the conventional substrate by the III-nitride film. And the misalignment phenomenon caused by the lattice mismatch between the epitaxial films of the subsequent light-emitting diodes can effectively reduce the difference density, avoiding the abnormal phenomena such as stress accumulation and misalignment, and effectively increasing the subsequent epitaxy. The luminous efficiency of the process, and the combination of the group III nitride film and the light-transmitting cone, the light extraction efficiency and the light-emitting diode having only the light-transmitting cone can be increased by about 15% to 20%.

(1)‧‧‧基板
(2)‧‧‧透光錐
(1)‧‧‧Substrate (2)‧‧‧Lighting cone

(21)‧‧‧底面
(22)‧‧‧高度
(21) ‧ ‧ bottom (22) ‧ ‧ height

(200)‧‧‧透光層
(3)‧‧‧Ⅲ族氮化物薄膜
(200)‧‧‧Transparent layer (3)‧‧‧III nitride film

(4)‧‧‧光阻層
(41)‧‧‧遮罩圖案
(4) ‧ ‧ photoresist layer (41) ‧ ‧ mask pattern

(400)‧‧‧光罩
(5)‧‧‧n型半導體層
(400) ‧‧‧Photomask (5)‧‧‧n type semiconductor layer

(S1)‧‧‧步驟一
(S2)‧‧‧步驟二
(S1) ‧ ‧ Step 1 (S2) ‧ ‧ Step 2

(S3)‧‧‧步驟三
(S4)‧‧‧步驟四
(S3) ‧ ‧ Step 3 (S4) ‧ ‧ Step 4

(S5)‧‧‧步驟五
(S6)‧‧‧步驟六
(S5) ‧ ‧ Step 5 (S6) ‧ ‧ Step 6

(W)‧‧‧寬度
(H)‧‧‧高度
(W) ‧ ‧ Width (H) ‧ ‧ height

(S)‧‧‧間距
(P)‧‧‧節距
(S) ‧ ‧ spacing (P) ‧ ‧ pitch

第一圖:本發明具透光錐結構之圖形化基板其一較佳實施例之圖形化基板剖面示意圖First: a schematic cross-sectional view of a patterned substrate of a preferred embodiment of the present invention

第二圖:本發明具透光錐結構之圖形化基板其一較佳實施例之透光錐放大示意圖The second figure: a schematic diagram of a light-transmissive cone of a preferred embodiment of the present invention

第三圖(A)、(B):本發明具透光錐結構之圖形化基板其一較佳實施例Ⅲ族氮化物薄膜之掃描式電子顯微鏡照片比較圖FIG. 3(A) and FIG. 3(B) are comparative diagrams of scanning electron micrographs of a nitride nitride film of a preferred embodiment of the present invention.

第四圖:本發明具透光錐結構之圖形化基板製造方法之步驟流程圖Fourth: Flow chart of steps of a method for manufacturing a patterned substrate with a light-transmissive cone structure of the present invention

第五圖:本發明具透光錐結構之圖形化基板製造方法之步驟流程示意圖Fig. 5 is a flow chart showing the steps of the method for manufacturing a patterned substrate having a light-transmissive cone structure of the present invention

本發明之目的及其結構設計功能上的優點,將依據以下圖面所示之較佳實施例予以說明並清楚呈現,俾使審查委員能對本發明有更深入且具體之瞭解。The object of the present invention and its structural design and advantages will be apparent from the following detailed description of the preferred embodiments.

首先,在以下實施例的描述中,應當理解當指出一層(或膜)或一結構配置在另一個基板、另一層(或膜)、或另一結構「上」或「下」時,其可「直接」位於其他基板、層(或膜)、或另一結構,亦或者兩者間具有一個以上的中間層以「間接」方式配置,審查委員可參照附圖說明每一層所在位置。In the following description of the embodiments, it should be understood that when a layer (or film) or a structure is disposed on another substrate, another layer (or film), or another structure "on" or "down", "Directly" is located on another substrate, layer (or film), or another structure, or more than one intermediate layer between the two is disposed in an "indirect" manner. The reviewer may describe the location of each layer with reference to the drawings.

請參閱第一圖所示,為本發明具透光錐結構之圖形化基板其一較佳實施例之圖形化基板剖面示意圖,係包括有:Referring to the first figure, a schematic cross-sectional view of a patterned substrate of a preferred embodiment of the present invention has a transparent substrate structure, including:

一基板(1);a substrate (1);

複數個透光錐(2),係由透光性材料所構成之錐狀體成形於基板(1)之表面,其中該透光性材料之折射率係低於基板(1);以及a plurality of light-transmitting cones (2) formed by a tapered body made of a light-transmitting material on a surface of the substrate (1), wherein the light-transmitting material has a lower refractive index than the substrate (1);

一Ⅲ族氮化物薄膜(3),係以蒸鍍或濺鍍方式對應被覆於透光錐(2)上。A group III nitride film (3) is coated on the light-transmitting cone (2) by vapor deposition or sputtering.

此外,請參閱第二圖所示,為本發明具透光錐結構之圖形化基板其一較佳實施例之透光錐放大示意圖,其中透光錐(2)之材料係選自氧化矽(SiO x )、氮氧化矽(SiON x ),以及氟化鎂(MgF 2 )所構成群組中的一種材料而形成,且透光錐(2)之材料耐熱溫度係不小於1000℃,以承受後續發光二極體成膜製程中的薄膜沉積高溫;透光錐(2)係具有一與基板(1)之表面連接之底面(21),底面(21)係具有一寬度W,以及一由底面(21)至透光錐(2)頂部的高度(22),係標示為H,當透光錐(2)之高度(22)與底面(21)寬度比值過小時,即因透光錐(2)之高度(22)不足而使光線接觸透光錐(2)時的入射角過大而降低光之萃取效率,因此,本發明較佳實施例之設計為透光錐(2)之高度(22)與底面(21)之最大寬度的比值(H∕W)為不小於0﹒6,最佳的比值為介於0﹒61~0﹒65之間,因此,可藉由控制透光錐(2)呈圓錐狀的設計更容易改變光線於接觸透光錐(2)後的行進路線,進而提升發光二極體之光萃取效率,其主要目的係讓來自發光二極體之主動發光層(圖式未標示)發出,朝向基板(1)行進的光,在接觸透光錐(2)及基板(1)後,可經由二次折射及反射後實質向外發出,有效提升發光二極體之光萃取效率,此與習知之經由蝕刻基板得到具粗化結構之磊晶基板製得的發光二極體的光萃取效率相較,本發明具有透光錐(2)之發光二極體光萃取效率可提升約20%;再者,兩兩相鄰之透光錐(2)彼此不連接並成週期性分佈,藉由透光錐(2)彼此的間距調整,可使基板(1)於單位面積內具有較大的透光錐(2)密度,而達到更佳的反射與折射效果,本發明較佳實施例之兩相鄰的透光錐(2)間距S係不大於1微米,而兩兩透光錐(2)頂部之距離具有相同之節距P(Pitch)為3微米,然而必須注意的是,上述透光錐(2)之節距3微米是為說明方便起見之較佳實施例,而非以本例所舉為限,且熟此技藝者當知道本發明之透光錐(2)節距可以因太陽能電池之特性與製程條件不同而有不同的節距範圍,並不會影響本發明的實際實施。In addition, please refer to the second figure, which is an enlarged schematic view of a light-transmissive cone of a preferred embodiment of the patterned substrate with a light-transmissive cone structure, wherein the material of the light-transmitting cone (2) is selected from the group consisting of yttrium oxide ( a material of a group consisting of SiO x ), yttrium oxynitride (SiON x ), and magnesium fluoride (MgF 2 ), and the heat-resistant temperature of the light-transmitting cone (2) is not less than 1000 ° C to withstand The film deposition high temperature in the subsequent light-emitting diode film forming process; the light-transmitting cone (2) has a bottom surface (21) connected to the surface of the substrate (1), the bottom surface (21) has a width W, and The height (22) from the bottom surface (21) to the top of the light-transmitting cone (2) is denoted by H. When the ratio of the height (22) of the light-transmitting cone (2) to the width of the bottom surface (21) is too small, the light-transmitting cone (2) The height (22) is insufficient to cause the incident angle of the light to contact the light-transmitting cone (2) to be too large to reduce the light extraction efficiency. Therefore, the preferred embodiment of the present invention is designed to have the height of the light-transmitting cone (2). (2 The ratio (H∕W) to the maximum width of the bottom surface (21) is not less than 0.6, and the optimum ratio is between 0.61 and 0.65. Therefore, the light transmission cone can be controlled by 2) The conical design makes it easier to change the path of light after contacting the light-transmitting cone (2), thereby improving the light extraction efficiency of the light-emitting diode. The main purpose is to make the active light-emitting layer from the light-emitting diode ( The light emitted toward the substrate (1), after contacting the light-transmitting cone (2) and the substrate (1), can be substantially emitted outward after secondary refraction and reflection, thereby effectively enhancing the light-emitting diode. The light extraction efficiency is compared with the light extraction efficiency of the light-emitting diode obtained by etching the substrate to obtain the epitaxial substrate having the roughened structure, and the light-emitting diode of the present invention has the light-emitting diode (2) The extraction efficiency can be increased by about 20%; in addition, the two adjacent light-transmitting cones (2) are not connected to each other and are periodically distributed, and the substrate (1) can be adjusted by the distance between the light-transmitting cones (2). Larger in unit area The light-transmitting cone (2) density, to achieve better reflection and refraction effect, the two adjacent light-transmitting cones (2) spacing S of the preferred embodiment of the present invention is no more than 1 micrometer, and two light-transmitting cones ( 2) The distance between the tops has the same pitch P (Pitch) of 3 microns, however, it must be noted that the pitch of the above-mentioned light-transmitting cones (2) is 3 micrometers, which is a preferred embodiment for convenience of description, rather than It is to be understood by the example, and those skilled in the art know that the pitch of the light-transmitting cone (2) of the present invention may have different pitch ranges due to the characteristics of the solar cell and the process conditions, and does not affect the present invention. The actual implementation.

再者,透光錐(2)之材料亦可由下列所構成之群組所組成:一形成於該基板(1)表面之低折射率介電層(圖中未標示),及一形成於該低折射率介電層表面之高折射率介電層(圖中未標示)、一形成於該基板(1)表面之低折射率介電層(圖中未標示)及一形成於該介電層表面之金屬反射層(圖中未標示),亦即於本發明另一較佳實施例中,透光錐(2)係可由一形成於基板(1)表面之一二氧化矽(SiO 2 )層與一形成於該二氧化矽層之二氧化鋅(TiO 2 )層所構成,該二氧化矽層與二氧化鋅層係扮演分散式布拉格反射鏡(Distributed Bragg Reflector,DBR)的角色,藉以對光子造成反射,有效提升發光二極體之光萃取效率。Furthermore, the material of the light-transmitting cone (2) may also be composed of the following group: a low-refractive-index dielectric layer (not shown) formed on the surface of the substrate (1), and a layer formed thereon a high refractive index dielectric layer (not shown) on the surface of the low refractive index dielectric layer, a low refractive index dielectric layer (not shown) formed on the surface of the substrate (1), and a dielectric layer formed on the substrate a metal reflective layer (not shown) of the surface of the layer, that is, in another preferred embodiment of the present invention, the light-transmitting cone (2) can be formed by a type of cerium oxide (SiO 2 ) formed on the surface of the substrate (1). a layer consisting of a layer of zinc dioxide (TiO 2 ) formed in the ceria layer, the ceria layer and the zinc dioxide layer functioning as a Distributed Bragg Reflector (DBR), In order to cause reflection of photons, the light extraction efficiency of the light-emitting diode is effectively improved.

再者,本發明所使用的基板(1)係選自藍寶石(Sapphire,Al 2 O 3 )、碳化矽(SiC)、矽(Si)、砷化鎵(GaAs)、氧化鋅(ZnO),以及具有六方體系(Hexagonal)結晶材料所構成群組中的一種材料而形成;值得注意的是,當基板(1)由藍寶石所形成,且透光錐(2)係以不同於基板(1)之材質形成,例如透光錐(2)之較佳材料為二氧化矽(SiO 2 )時,其基板(1)與透光錐(2)之接觸面可能形成有孔洞(Void)結構,藉由如此之結構,能增加光之散射程度,進而提升發光二極體元件之光萃取效率。Furthermore, the substrate (1) used in the present invention is selected from the group consisting of sapphire (Al 2 O 3 ), tantalum carbide (SiC), bismuth (Si), gallium arsenide (GaAs), zinc oxide (ZnO), and Formed with one of a group of Hexagonal crystalline materials; it is worth noting that when the substrate (1) is formed of sapphire, and the light-transmitting cone (2) is different from the substrate (1) When the material is formed, for example, the preferred material of the light-transmitting cone (2) is cerium oxide (SiO 2 ), a contact surface of the substrate (1) and the light-transmitting cone (2) may be formed with a void structure. Such a structure can increase the degree of light scattering, thereby improving the light extraction efficiency of the light-emitting diode element.

此外,Ⅲ族氮化物薄膜(3)係選自氮化鋁(AlN),以及氮化鎵(GaN)所構成群組中的一種材料而形成,本發明Ⅲ族氮化物薄膜(3)之較佳實施例係為氮化鋁之薄膜,若氮化鋁之厚度小於100埃,則氮化鋁會呈顆粒狀而無法形成有效的薄膜,倘若氮化鋁之厚度大於1000埃,則在後續之發光二極體成膜製程中容易造成爆裂(crack)之情形,因此,Ⅲ族氮化物薄膜(3)之最佳厚度係介於100埃~1000埃;再者,請參閱第三圖(A)、(B)所示,為本發明具透光錐結構之圖形化基板其一較佳實施例之Ⅲ族氮化物薄膜掃描式電子顯微鏡(Scanning Electron Microscope,SEM)照片比較圖,其中本發明Ⅲ族氮化物薄膜(3)之較佳實施例係為氮化鋁(AlN)之薄膜,透光錐(2)之較佳實施例係為二氧化矽(SiO 2 ),第三圖(A)係為傳統不具Ⅲ族氮化物薄膜(3)氮化鋁之發光二極體局部SEM照片,第三圖(B)則為本發明具有Ⅲ族氮化物薄膜(3)氮化鋁之發光二極體局部SEM照片,由透光錐(2)與發光二極體n型半導體層(5)較佳實施例N-GaN之間的介面顯示,具有氮化鋁薄膜結構的發光二極體有較平整而緻密的介面特性,可有效提升發光二極體之光萃取效率,因此,以本發明具有Ⅲ族氮化物薄膜(3)與透光錐(2)所組成之發光二極體,與僅具有透光錐(2)之發光二極體相較,其光之萃取效率約可提升15%~20%;然而必須注意的是,配置於Ⅲ族氮化物薄膜(3)氮化鋁(AlN)下方之透光錐(2)組成材料為二氧化矽(SiO 2 )是為說明方便起見之較佳實施例,而非以本例所舉為限,且熟此技藝者當知道本發明之透光錐(2)組成材料可以是氮氧化矽(SiON x )或氟化鎂(MgF 2 )所構成群組中的一種材料而形成,亦或是由二氧化矽(SiO 2 )與二氧化鋅(TiO 2 )所組成之分散式布拉格反射鏡(DBR)結構,並不會影響本發明的實際實施。Further, the group III nitride film (3) is formed by one material selected from the group consisting of aluminum nitride (AlN) and gallium nitride (GaN), and the group III nitride film (3) of the present invention is more The preferred embodiment is a film of aluminum nitride. If the thickness of the aluminum nitride is less than 100 angstroms, the aluminum nitride may be in the form of particles and cannot form an effective film. If the thickness of the aluminum nitride is more than 1000 angstroms, then In the case of a light-emitting diode film formation process, cracks are likely to occur. Therefore, the optimum thickness of the group III nitride film (3) is between 100 angstroms and 1000 angstroms; further, please refer to the third figure (A). And (B) is a comparative diagram of a Group III nitride thin film scanning electron microscope (SEM) according to a preferred embodiment of the patterned substrate having a light-transmissive cone structure, wherein the present invention A preferred embodiment of the Group III nitride film (3) is a film of aluminum nitride (AlN), and a light-transmitting cone (2) The embodiment is cerium oxide (SiO 2 ), and the third figure (A) is a partial SEM photograph of a conventional luminescent diode without a group III nitride film (3), and the third figure (B) is Partial SEM photograph of a light-emitting diode of a group III nitride film (3) of aluminum nitride, comprising a light-transmitting cone (2) and a light-emitting diode n-type semiconductor layer (5), a preferred embodiment of N-GaN The interface between the two shows that the light-emitting diode having the aluminum nitride film structure has a flat and dense interface characteristic, which can effectively improve the light extraction efficiency of the light-emitting diode, and therefore, has a group III nitride film according to the present invention (3). The light-emitting diode composed of the light-transmitting cone (2) can increase the light extraction efficiency by about 15% to 20% compared with the light-emitting diode having only the light-transmitting cone (2); The light-transmitting cone (2) disposed under the group III nitride film (3) under aluminum nitride (AlN) is made of cerium oxide (SiO 2 ), which is a preferred embodiment for convenience of description. Not in this case And the skilled artisan knows that the light-transmitting cone (2) constituent material of the present invention may be formed by one of a group consisting of cerium oxynitride (SiON x ) or magnesium fluoride (MgF 2 ), or A decentralized Bragg mirror (DBR) structure composed of cerium oxide (SiO 2 ) and zinc dioxide (TiO 2 ) does not affect the actual implementation of the present invention.

而為使審查委員能對本發明有更深入且具體之瞭解,請參閱第四、五圖所示,為本發明具透光錐結構之圖形化基板製造方法之步驟流程圖與步驟流程示意圖,係包括有下述步驟:In order to enable the reviewing committee to have a more in-depth and specific understanding of the present invention, please refer to the fourth and fifth figures, which are schematic flowcharts of the steps and steps of the method for manufacturing the patterned substrate with the light-transmitting cone structure of the present invention. Including the following steps:

步驟一(S1):於一基板(1)上依序形成一透光層(200)與一光阻層(4),其中透光層(200)係由折射率低於基板(1)之透光性材料所構成,例如氧化矽(SiO x )、氮氧化矽(SiON x ),以及氟化鎂(MgF 2 )所構成群組中的一種材料而形成,為配合後續發光二極體的成膜高溫製程,透光層(200)較佳係選自耐熱性不小於1000℃的材料,另外,光阻層(4)可依製程之需求選自正型光阻或負型光阻材料等其中之一種;Step 1 (S1): sequentially forming a light transmissive layer (200) and a photoresist layer (4) on a substrate (1), wherein the light transmissive layer (200) has a lower refractive index than the substrate (1) The light-transmitting material is formed of, for example, one of a group consisting of yttrium oxide (SiO x ), yttrium oxynitride (SiON x ), and magnesium fluoride (MgF 2 ), and is used for the subsequent light-emitting diode. In the film forming high temperature process, the light transmissive layer (200) is preferably selected from materials having a heat resistance of not less than 1000 ° C. In addition, the photoresist layer (4) may be selected from a positive photoresist or a negative photoresist material according to the requirements of the process. Wait for one of them;

步驟二(S2):使用光微影製程,於光阻層(4)顯影出一遮罩圖案(41);其中,光微影製程係配合使用一具有預設圖案之光罩(400),以微影製程方式將光阻層(4)預定部分移除,使殘餘的光阻層(4)形成一遮罩圖案(41),致使無光阻層(4)覆蓋的透光層(200)裸露出;Step 2 (S2): developing a mask pattern (41) on the photoresist layer (4) by using a photolithography process; wherein the photolithography process is combined with a photomask (400) having a predetermined pattern. The predetermined portion of the photoresist layer (4) is removed by a lithography process, so that the residual photoresist layer (4) forms a mask pattern (41), so that the light-transmissive layer (200) covered by the photoresist-free layer (4) is not covered. Naked

步驟三(S3):以遮罩圖案(41)為遮罩,使用乾式蝕刻製程於透光層(200)形成複數個彼此週期間隔且呈錐狀體之透光錐(2);其中乾式蝕刻係為射頻功率介於200瓦~400瓦之間,以含氟的氣體,例如四氟化碳(CF 4 )、六氟化硫(SF 6 ),以及三氟甲烷(CHF 3 )等,以非等向性蝕刻之特性對透光層(200)進行蝕刻,使透光層(200)形成複數個呈圓錐狀的透光錐(2),本發明較佳實施例之乾式蝕刻對基板(1)與透光層(200)之蝕刻選擇比係介於1:0﹒5~1:1﹒5之間;Step 3 (S3): using a mask pattern (41) as a mask, using a dry etching process to form a plurality of light-transmitting cones (2) which are periodically spaced apart from each other and have a tapered shape in the light-transmitting layer (200); wherein the dry etching is performed It is a radio frequency power between 200 watts and 400 watts, and is a fluorine-containing gas such as carbon tetrafluoride (CF 4 ), sulfur hexafluoride (SF 6 ), and trifluoromethane (CHF 3 ). The non-isotropic etching etches the light transmissive layer (200) to form the light transmissive layer (200) into a plurality of conical light-conducting cones (2), which are dry-etched on the substrate in accordance with a preferred embodiment of the present invention ( 1) the etching selectivity ratio of the light transmissive layer (200) is between 1:0.5 and 1:1.5;

步驟四(S4):使用光阻去除法移除該遮罩圖案(41)之光阻層(4);Step 4 (S4): removing the photoresist layer (4) of the mask pattern (41) by using a photoresist removal method;

步驟五(S5):以電子鎗真空蒸鍍法蒸鍍或濺鍍方式將一Ⅲ族氮化物薄膜(3)對應被覆於透光錐(2)上;以及Step 5 (S5): coating a group III nitride film (3) correspondingly on the light-transmitting cone (2) by electron gun vacuum evaporation evaporation or sputtering;

步驟六(S6):使用高溫回火製程加熱該圖形化基板,以完成該具透光錐(2)結構之圖形化基板之製作方法。Step 6 (S6): heating the patterned substrate using a high temperature tempering process to complete the method of fabricating the patterned substrate having the light transmissive cone (2) structure.

此外,於步驟一(S1)形成光阻層(4)之前,可進一步於透光層(200)表面形成一高折射率介電層(圖中未標示)或金屬反射層(圖中未標示)其中之一種以扮演分散式布拉格反射鏡(DBR)的角色,藉以對光子造成反射,有效提升發光二極體之光萃取效率。In addition, before the photoresist layer (4) is formed in the first step (S1), a high refractive index dielectric layer (not shown) or a metal reflective layer may be further formed on the surface of the light transmissive layer (200) (not shown) One of them plays the role of a decentralized Bragg reflector (DBR), which causes reflection of photons, effectively improving the light extraction efficiency of the light-emitting diode.

此外,該電子鎗真空蒸鍍法係以氮氣電漿撞擊Ⅲ族元素之靶材,以不低於600℃之溫度,使Ⅲ族氮化物粒子以濺射方式被覆於透光錐(2)上;本發明之較佳實施例係使用電子鎗真空蒸鍍法在以二氧化矽成分組成的透光錐(2)上沉積100埃~1000埃之氮化鋁薄膜,因為使用電子鎗真空蒸鍍法可使氮化鋁薄膜均勻而完整覆蓋在透光錐(2)上,本發明係藉由薄型的Ⅲ族氮化物薄膜(3),可緩衝透光錐(2)與後續發光二極體之成膜製程中n型半導體層(5)間的晶格差異,有效降低其差排密度,以避免應力之累積與差排錯位(misfit dislocation)等異常現象發生,有效增加後續磊晶製程之良率;此外,上述說明內容提及透光錐(2)之間距S係不大於1微米,在本發明之較佳實施例中,兩兩透光錐(2)之節距P為3微米,當透光錐(2)之寬度為2﹒8微米~2﹒9微米時,該間距S則為0﹒2微米~0﹒1微米,因此,本發明使用電子鎗真空蒸鍍法蒸鍍之Ⅲ族氮化物薄膜(3)具有良好的填洞能力(Gap Filling Ability),可有效填入透光錐(2)之極小間距,以提升光之萃取效率,然而必須注意的是,上述透光錐(2)之節距3微米是為說明方便起見之較佳實施例,而非以本例所舉為限,且熟此技藝者當知道本發明之透光錐(2)節距可以因太陽能電池之特性與製程條件不同而有不同的節距範圍,並不會影響本發明的實際實施。In addition, the electron gun vacuum evaporation method is to impinge the group III nitride particles on the light-transmitting cone (2) by spraying the target of the group III element with nitrogen plasma at a temperature of not lower than 600 ° C; The preferred embodiment of the present invention uses an electron gun vacuum evaporation method to deposit an aluminum nitride film of 100 angstroms to 1000 angstroms on a light-transmitting cone (2) composed of a cerium oxide component, because an electron gun vacuum evaporation method can be used. The aluminum nitride film is evenly and completely covered on the light-transmitting cone (2). The present invention is capable of buffering the light-transmitting cone (2) and the subsequent light-emitting diode film by a thin group III nitride film (3). The lattice difference between the n-type semiconductor layers (5) in the process effectively reduces the difference in the discharge density, so as to avoid the occurrence of abnormalities such as stress accumulation and misfit dislocation, and effectively increase the yield of the subsequent epitaxial process; In addition, the above description refers to the distance S between the light-transmitting cones (2) being no more than 1 micrometer. In the preferred embodiment of the invention, the pitch of the two light-transmitting cones (2) is P. 3 micrometers, when the width of the light-transmitting cone (2) is 2.8 micrometers to 2.9 micrometers, the spacing S is 0.2 micrometers to 0.1 micrometers. Therefore, the present invention uses an electron gun vacuum evaporation method to steam. The plated III nitride film (3) has a good Gap Filling Ability, which can effectively fill the minimum pitch of the light-transmitting cone (2) to improve the extraction efficiency of light, however, it must be noted that The pitch of the light-transmitting cone (2) is 3 micrometers, which is a preferred embodiment for convenience of description, and is not limited to the example, and those skilled in the art will know the light-transmitting cone (2) section of the present invention. The distance may vary depending on the characteristics of the solar cell and the process conditions, and does not affect the actual implementation of the present invention.

再者,該高溫回火製程係可使用快速高溫處理與高溫爐管製程其中之一種方式,以不低於1000℃之溫度修正由電子鎗真空蒸鍍法蒸鍍或濺鍍方式製備之Ⅲ族氮化物薄膜(3)之薄膜性質與製程結果。Furthermore, the high-temperature tempering process can use one of the methods of rapid high-temperature treatment and high-temperature furnace control to correct the group III nitrogen prepared by vapor deposition or sputtering of the electron gun by vacuum evaporation at a temperature of not less than 1000 ° C. Film properties and process results of the film (3).

由上述之實施說明可知,本發明之具透光錐結構之圖形化基板及其製造方法與現有技術相較之下,本發明具有以下優點:It can be seen from the above description that the patterned substrate with the light-transmitting cone structure of the present invention and the manufacturing method thereof have the following advantages compared with the prior art:

1.本發明具透光錐結構之圖形化基板及其製造方法係藉由在基板表面形成複數個呈圓錐狀且折射率低於基板之透光錐,以達到基板表面之非平整性來降低後續製備的發光二極體之主動發光層出光的全反射角,並利用透光錐與基板間的折射率差,使發光二極體發出的光線於接觸這些透光錐與基板時,經由二次折射及反射作用,有效提升發光二極體的光萃取效率。1. The patterned substrate with a light-transmissive cone structure of the present invention and a method for fabricating the same are characterized in that a plurality of conical cones having a conical shape and a refractive index lower than that of the substrate are formed on the surface of the substrate to achieve non-flatness of the surface of the substrate. The total reflection angle of the light emitted by the active light-emitting layer of the subsequently prepared light-emitting diode, and the difference in refractive index between the light-transmitting cone and the substrate is used to make the light emitted by the light-emitting diode contact the light-transmitting cone and the substrate through the second The secondary refraction and reflection function effectively improve the light extraction efficiency of the light-emitting diode.

2.本發明具透光錐結構之圖形化基板及其製造方法藉由控制透光錐呈圓錐狀的設計,讓來自發光二極體之主動發光層發出,朝向基板行進的光,在接觸透光錐及基板後,可經由二次折射及反射後實質向外發出,有效提升發光二極體之光萃取效率,此與習知之經由蝕刻基板得到具粗化結構之磊晶基板製得的發光二極體的光萃取效率相較,本發明具有透光錐之發光二極體之光萃取效率可提升約20%。2. The patterned substrate with the light-transmissive cone structure of the present invention and the manufacturing method thereof are designed to control the light-transmitting cone to have a conical shape, so that the active light-emitting layer from the light-emitting diode emits light, and the light traveling toward the substrate is in contact with After the light cone and the substrate can be substantially outwardly emitted through the secondary refraction and reflection, the light extraction efficiency of the light-emitting diode is effectively improved, and the light obtained by the epitaxial substrate having the roughened structure is obtained by etching the substrate. Compared with the light extraction efficiency of the diode, the light extraction efficiency of the light-emitting diode having the light-transmitting cone can be improved by about 20%.

3.本發明具透光錐結構之圖形化基板及其製造方法之透光錐係經由非等向性之乾式蝕刻製程蝕刻基板上的透光層所製得,具有製程簡便,且更容易控制透光錐之尺寸、密度與均勻度,有效提升發光二極體的出光均勻性。3. The patterned substrate with a light-transmissive cone structure of the present invention and the light-transmissive cone of the method for manufacturing the same are obtained by etching a light-transmitting layer on a substrate by an anisotropic dry etching process, which has a simple process and is easier to control. The size, density and uniformity of the light-transmitting cone effectively improve the light uniformity of the light-emitting diode.

4.本發明具透光錐結構之圖形化基板及其製造方法係藉由Ⅲ族氮化物薄膜改善傳統基板和後續發光二極體之磊晶膜間因晶格不匹配所產生的錯位差排現象,可有效降低其差排密度,以避免應力之累積與差排錯位等異常現象,有效增加後續磊晶製程之良率,且具有Ⅲ族氮化物薄膜與透光錐組合之發光二極體,其光萃取效率與僅具有透光錐之發光二極體約可提升15%~20%。4. The patterned substrate with the light-transmissive cone structure of the present invention and the method for fabricating the same are used to improve the misalignment caused by lattice mismatch between the epitaxial films of the conventional substrate and the subsequent light-emitting diode by the group III nitride film. Phenomenon, can effectively reduce the difference density, to avoid the accumulation of stress and misalignment, and effectively increase the yield of subsequent epitaxial process, and has a combination of a group III nitride film and a light-emitting cone The light extraction efficiency and the light-emitting diode having only a light-transmitting cone can be increased by about 15% to 20%.

綜上所述,本發明之具透光錐結構之圖形化基板及其製造方法,的確能藉由上述所揭露之實施例,達到所預期之使用功效,且本發明亦未曾公開於申請前,誠已完全符合專利法之規定與要求。爰依法提出發明專利之申請,懇請惠予審查,並賜准專利,則實感德便。In summary, the patterned substrate having the light-transmissive cone structure of the present invention and the method of manufacturing the same can achieve the intended use efficiency by the above-disclosed embodiments, and the present invention has not been disclosed before the application. Cheng has fully complied with the requirements and requirements of the Patent Law.爰Issuing an application for a patent for invention in accordance with the law, and asking for a review, and granting a patent, is truly sensible.

惟,上述所揭之圖示及說明,僅為本發明之較佳實施例,非為限定本發明之保護範圍;大凡熟悉該項技藝之人士,其所依本發明之特徵範疇,所作之其它等效變化或修飾,皆應視為不脫離本發明之設計範疇。The illustrations and descriptions of the present invention are merely preferred embodiments of the present invention, and are not intended to limit the scope of the present invention; those skilled in the art, which are characterized by the scope of the present invention, Equivalent variations or modifications are considered to be within the scope of the design of the invention.

(1)‧‧‧基板 (1) ‧‧‧Substrate

(2)‧‧‧透光錐 (2) ‧ ‧ light cone

(3)‧‧‧Ⅲ族氮化物薄膜 (3) ‧‧‧III nitride film

Claims (13)

一種具透光錐結構之圖形化基板,係至少包括有:
  一基板;
  複數個透光錐,係由透光性材料所構成之錐狀體成形於該基板表面;以及
  一Ⅲ族氮化物薄膜,係以蒸鍍或濺鍍方式對應被覆於該透光錐上。
A patterned substrate having a light-transmissive cone structure includes at least:
a substrate;
A plurality of light-transmitting cones are formed on the surface of the substrate by a cone-shaped body made of a light-transmitting material, and a group III nitride film is coated on the light-transmitting cone by vapor deposition or sputtering.
如申請專利範圍第1項所述之具透光錐結構之圖形化基板,其中該透光錐材料之折射率低於該基板,係選自氧化矽、氮氧化矽,以及氟化鎂所構成之群組。The patterned substrate having a light-transmissive cone structure according to claim 1, wherein the light-transmitting cone material has a lower refractive index than the substrate, and is selected from the group consisting of cerium oxide, cerium oxynitride, and magnesium fluoride. Group of. 如申請專利範圍第1項所述之具透光錐結構之圖形化基板,其中該透光錐之材料係係由下列所構成之群組所組成:一形成於該基板表面之低折射率介電層及一形成於該低折射率介電層表面之高折射率介電層、一形成於該基板表面之低折射率介電層及一形成於該介電層表面之金屬反射層。The patterned substrate with a light-transmissive cone structure according to claim 1, wherein the material of the light-transmitting cone is composed of the following group: a low refractive index medium formed on the surface of the substrate. And an electrical layer and a high refractive index dielectric layer formed on the surface of the low refractive index dielectric layer, a low refractive index dielectric layer formed on the surface of the substrate, and a metal reflective layer formed on the surface of the dielectric layer. 如申請專利範圍第1項所述之具透光錐結構之圖形化基板,其中該透光錐之材料耐熱溫度係不小於1000℃。The patterned substrate with a light-transmissive cone structure according to claim 1, wherein the heat-resistant temperature of the material of the light-transmitting cone is not less than 1000 °C. 如申請專利範圍第1項所述之具透光錐結構之圖形化基板,其中該透光錐係具有一與該基板表面連接之底面,以及一由該底面至該透光錐頂部的高度,其中該高度與該底面之最大寬度的比值係不小於0 ﹒ 6。The patterned substrate with a light-transmissive cone structure according to claim 1, wherein the light-transmitting cone has a bottom surface connected to the surface of the substrate, and a height from the bottom surface to the top of the light-transmitting cone. Wherein the ratio of the height to the maximum width of the bottom surface is not less than zero. 6. 如申請專利範圍第1項所述之具透光錐結構之圖形化基板,其中該透光錐係成週期性分佈,兩兩相鄰之透光錐具有相同之間距,且該間距係不大於1微米。The patterned substrate with a light-transmissive cone structure according to claim 1, wherein the light-transmitting cone is periodically distributed, and two adjacent light-transmitting cones have the same distance, and the spacing is not greater than 1 micron. 如申請專利範圍第1項所述之具透光錐結構之圖形化基板,其中該Ⅲ族氮化物薄膜係選自氮化鋁,以及氮化鎵所構成之群組。The patterned substrate having a light-transmissive cone structure according to claim 1, wherein the group III nitride film is selected from the group consisting of aluminum nitride and gallium nitride. 如申請專利範圍第1項所述之具透光錐結構之圖形化基板,其中該Ⅲ族氮化物薄膜之厚度係介於100埃~1000埃。The patterned substrate having a light-transmitting cone structure according to claim 1, wherein the group III nitride film has a thickness of between 100 angstroms and 1000 angstroms. 一種具透光錐結構之圖形化基板製作方法,其步驟包括有:
  步驟一:於一基板上依序形成一透光層與一光阻層,其中該透光層係由折射率低於該基板之透光性材料所構成;
  步驟二:使用光微影製程,於該光阻層顯影出一遮罩圖案;
  步驟三:以該遮罩圖案為遮罩,使用乾式蝕刻製程於該透光層形成複數個彼此週期間隔且呈錐狀體之透光錐;
  步驟四:使用光阻去除法移除該遮罩圖案之光阻層;
  步驟五:以電子鎗真空蒸鍍法蒸鍍或濺鍍方式將一Ⅲ族氮化物薄膜對應被覆於該透光錐上;以及
  步驟六:使用高溫回火製程加熱該圖形化基板,以完成該具透光錐結構之圖形化基板之製作方法。
A method for fabricating a patterned substrate having a light-transmissive cone structure, the steps of which include:
Step 1: sequentially forming a light transmissive layer and a photoresist layer on a substrate, wherein the light transmissive layer is composed of a light transmissive material having a lower refractive index than the substrate;
Step 2: using a photolithography process to develop a mask pattern on the photoresist layer;
Step 3: using the mask pattern as a mask, using a dry etching process to form a plurality of light-transmitting cones which are periodically spaced apart from each other and have a tapered shape;
Step 4: removing the photoresist layer of the mask pattern by using a photoresist removal method;
Step 5: correspondingly coating a group III nitride film on the light-transmitting cone by electron gun vacuum evaporation evaporation or sputtering; and step 6: heating the patterned substrate using a high-temperature tempering process to complete the tool A method for fabricating a patterned substrate of a light transmissive cone structure.
如申請專利範圍第9項所述之具透光錐結構之圖形化基板製作方法,其中於該步驟一形成光阻層之前,進一步於該透光層表面形成一高折射率介電層或金屬反射層其中之一。The method for fabricating a patterned substrate having a light-transmissive cone structure according to claim 9, wherein a high-refractive-index dielectric layer or metal is further formed on the surface of the light-transmitting layer before the step of forming the photoresist layer. One of the reflective layers. 如申請專利範圍第9項所述之具透光錐結構之圖形化基板製作方法,其中該電子鎗真空蒸鍍法係以氮氣電漿撞擊Ⅲ族元素之靶材,以不低於600℃之溫度,使Ⅲ族氮化物粒子以濺射方式被覆於該透光錐上。The method for fabricating a patterned substrate having a light-transmitting cone structure according to claim 9, wherein the electron gun vacuum evaporation method is to impinge a target of a group III element with a nitrogen plasma to a temperature of not lower than 600 ° C. The group III nitride particles are sputter-coated on the light-transmitting cone. 如申請專利範圍第9項所述之具透光錐結構之圖形化基板製作方法,其中該Ⅲ族氮化物薄膜之厚度係介於100埃~1000埃。The method for fabricating a patterned substrate having a light-transmissive cone structure according to claim 9, wherein the group III nitride film has a thickness of between 100 angstroms and 1000 angstroms. 如申請專利範圍第9項所述之具透光錐結構之圖形化基板製作方法,其中該高溫回火製程係使用快速高溫處理與高溫爐管其中之一,以不低於1000℃之溫度修正該Ⅲ族氮化物薄膜之性質與製程結果。The method for fabricating a patterned substrate having a light-transmitting cone structure according to claim 9, wherein the high-temperature tempering process uses one of a rapid high-temperature treatment and a high-temperature furnace tube, and is corrected at a temperature not lower than 1000 ° C. The properties and process results of the III-nitride film.
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